WO2000037985A2 - Anordnung zur separierung von anregungs- und emissionslicht in einem mikroskop - Google Patents

Anordnung zur separierung von anregungs- und emissionslicht in einem mikroskop Download PDF

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Publication number
WO2000037985A2
WO2000037985A2 PCT/EP1999/010262 EP9910262W WO0037985A2 WO 2000037985 A2 WO2000037985 A2 WO 2000037985A2 EP 9910262 W EP9910262 W EP 9910262W WO 0037985 A2 WO0037985 A2 WO 0037985A2
Authority
WO
WIPO (PCT)
Prior art keywords
light
excitation
arrangement according
arrangement
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP1999/010262
Other languages
German (de)
English (en)
French (fr)
Other versions
WO2000037985A3 (de
Inventor
Ralf Wolleschensky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik AG
Carl Zeiss Jena GmbH
Original Assignee
VEB Carl Zeiss Jena GmbH
Carl Zeiss Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=26050938&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=WO2000037985(A2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from DE1998159314 external-priority patent/DE19859314A1/de
Application filed by VEB Carl Zeiss Jena GmbH, Carl Zeiss Jena GmbH filed Critical VEB Carl Zeiss Jena GmbH
Priority to EP99964647A priority Critical patent/EP1141763B2/de
Priority to HK01108690.5A priority patent/HK1038797B/xx
Priority to US09/857,205 priority patent/US7009763B1/en
Priority to DE59912534T priority patent/DE59912534D1/de
Priority to JP2000589988A priority patent/JP4532745B2/ja
Publication of WO2000037985A2 publication Critical patent/WO2000037985A2/de
Publication of WO2000037985A3 publication Critical patent/WO2000037985A3/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10Beam splitting or combining systems
    • G02B27/14Beam splitting or combining systems operating by reflection only
    • G02B27/145Beam splitting or combining systems operating by reflection only having sequential partially reflecting surfaces
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10Beam splitting or combining systems
    • G02B27/1086Beam splitting or combining systems operating by diffraction only

Definitions

  • the light (excitation light) of two lasers L1, L2 with different wavelengths is coupled into a common beam path via a mirror SP and a beam splitter ST, which on the side S1 of a mirrored prism in the direction of an AOTF (Acousto-OpticalTunable Filter ) is reflected.
  • AOTF Acoustic-OpticalTunable Filter
  • the excitation light is introduced into the AOTF, with light diffracted in the first order being deflected for the wavelength set via the control frequency of the AOTF exactly in the direction of a pinhole PH with upstream and downstream pinhole optics PHO for setting the beam profiles, while other possible wavelengths are undeflected in zero-order cross the AOTF and do not reach the pinhole.
  • the pinhole PH serves here as an excitation and detection pinhole at the same time.
  • the excitation light is imaged in the direction of a microscopic beam path MI in the direction of a sample via scanning units SC1, SC2 and a scanning optics SCO.
  • the light emitted by the sample consisting of parts of the
  • Excitation light and wavelength-shifted fluorescence components pass through the light path in the opposite direction to the AOTF.
  • the wavelength components of the excitation light reach the mirror side S1 of the prism PS again via first-order diffraction, while the fluorescence components reach the AOTF cross undeflected in zero order and thereby take an angle to the reflected excitation light.
  • the tip between prism surfaces S1 and S2 is now arranged between the returning zeroth and first order rays, as a result of which the fluorescent light strikes side S2 and from there in the direction of a detection unit, here consisting for example of a line filter LF, a color divider NFT and two Detectors for different wavelengths, is reflected.
  • a detection unit here consisting for example of a line filter LF, a color divider NFT and two Detectors for different wavelengths, is reflected.
  • the AOTF Due to the low bandwidth of the AOTF of approx. 2 nm bandwidth for the excitation light, it acts as an extreme edge filter with clear advantages, for example, against dichroic filters with bandwidths greater than 10 nm. This is particularly important because the distance between the excitation wavelength and fluorescence wavelengths is less than 10 nm can be and a wavelength-dependent separation is still possible due to the arrangement according to the invention.
  • the AOTF can be switched from the wavelength of the laser L1 to the wavelength of the laser L2 and in turn the excitation light can be separated from the fluorescent light.
  • FIG. 2 shows a similar arrangement with only one scanner SC.
  • a mirror S is provided, which deflects the excitation light in the direction of the AOTF analogously to FIG. 1, here the fluorescence light returning in zero order runs through the AOTF next to the mirror S and in this way in the direction of one here detection, not shown.
  • the AOTF can serve solely as a separation unit between excitation light and fluorescent light, by the laser light entering the AOTF in the direction of the first order without an upstream element and the detection light leaving the AOTF at an angle to the excitation light and directly entering a detection unit, which only has an effect on the overall length, since the angle of four degrees, for example, is right turns out small and overlaps of the wavelength components should be avoided.
  • a separating mirror can also be provided only for the fluorescent light.
  • a further advantageous embodiment in the form of an unmirrored prism is provided, which by refraction the light of an excitation laser in the first
  • the invention is particularly advantageously applicable in a laser scanning ' microscope with an AOTF.
  • AOTF and AOM are advantageously provided in the laser beam path for coupling the laser radiation.
  • Several laser lines L1-L3 such as UV / VIS or IR can be coupled in simultaneously with independently adjustable excitation power or individually.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
PCT/EP1999/010262 1998-12-22 1999-12-22 Anordnung zur separierung von anregungs- und emissionslicht in einem mikroskop Ceased WO2000037985A2 (de)

Priority Applications (5)

Application Number Priority Date Filing Date Title
EP99964647A EP1141763B2 (de) 1998-12-22 1999-12-22 Anordnung zur separierung von anregungs- und emissionslicht in einem mikroskop
HK01108690.5A HK1038797B (en) 1998-12-22 1999-12-22 Arrangement for separation excitation light and emission light in a microscope
US09/857,205 US7009763B1 (en) 1998-12-22 1999-12-22 Arrangement for separating excitation light and emission light in a microscope
DE59912534T DE59912534D1 (de) 1998-12-22 1999-12-22 Anordnung zur separierung von anregungs- und emissionslicht in einem mikroskop
JP2000589988A JP4532745B2 (ja) 1998-12-22 1999-12-22 顕微鏡における励起光と放出光との分離構造

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE1998159314 DE19859314A1 (de) 1998-12-22 1998-12-22 Anordnung zur Separierung von Anregungs- und Emissionslicht in einem Mikroskop
DE19859314.7 1998-12-22
DE19936573.3 1999-08-03
DE19936573A DE19936573A1 (de) 1998-12-22 1999-08-03 Anordnung zur Separierung von Anregungs- und Emissionslicht in einem Mikroskop

Publications (2)

Publication Number Publication Date
WO2000037985A2 true WO2000037985A2 (de) 2000-06-29
WO2000037985A3 WO2000037985A3 (de) 2001-04-12

Family

ID=26050938

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP1999/010262 Ceased WO2000037985A2 (de) 1998-12-22 1999-12-22 Anordnung zur separierung von anregungs- und emissionslicht in einem mikroskop

Country Status (5)

Country Link
US (1) US7009763B1 (https=)
EP (2) EP1141763B2 (https=)
JP (1) JP4532745B2 (https=)
DE (3) DE19936573A1 (https=)
WO (1) WO2000037985A2 (https=)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1421367A1 (de) * 2001-08-28 2004-05-26 Gnothis Holding SA Einkanal-mehrfarben-korrelationsanalyse
GB2416445A (en) * 2004-07-16 2006-01-25 Zeiss Carl Jena Gmbh Microscope with increased resolution
GB2416446A (en) * 2004-07-16 2006-01-25 Zeiss Carl Jena Gmbh Laser scanning microscope
US10564412B2 (en) 2010-12-10 2020-02-18 Nkt Photonics A/S Tunable filter including an angular dispersive element for a broad band source
EP3042233B1 (de) * 2013-09-03 2025-03-12 Leica Microsystems CMS GmbH Mikroskop mit einer akustooptischen vorrichtung

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DE102004031048A1 (de) * 2004-06-25 2006-01-12 Leica Microsystems Cms Gmbh Mikroskop
DE102004054262B4 (de) * 2004-11-09 2016-08-18 Leica Microsystems Cms Gmbh Vorrichtung zur Untersuchung und Manipulation von mikroskopischen Objekten
DE102005020543A1 (de) 2005-05-03 2006-11-09 Carl Zeiss Jena Gmbh Verfahren und Vorrichtung zur einstellbaren Veränderung von Licht
DE102005020545A1 (de) * 2005-05-03 2006-11-09 Carl Zeiss Jena Gmbh Vorrichtung zur Steuerung von Lichtstrahlung
TWI364889B (en) * 2005-11-11 2012-05-21 Hon Hai Prec Ind Co Ltd Laser device and laser system using the same
DE102005059338A1 (de) * 2005-12-08 2007-06-14 Carl Zeiss Jena Gmbh Verfahren und Anordnung zur Untersuchung von Proben
DE102006034915A1 (de) * 2006-07-28 2008-01-31 Carl Zeiss Microimaging Gmbh Laser-Scanning-Mikroskop
DE102007024075B4 (de) 2007-05-22 2022-06-09 Leica Microsystems Cms Gmbh Durchstimmbares akusto-optisches Filterelement, einstellbare Lichtquelle, Mikroskop und akusto-optischer Strahlteiler
DE102007053199A1 (de) * 2007-11-06 2009-05-14 Leica Microsystems Cms Gmbh Vorrichtung und Verfahren zur Ansteuerung eines akustooptischen Bauteils
US9229294B2 (en) 2010-05-06 2016-01-05 Leica Microsystems Cms Gmbh Apparatus and method for operating an acousto-optical component
DE102010033722A1 (de) 2010-08-07 2012-02-09 Carl Zeiss Microimaging Gmbh Anordnung und/oder Verfahren zur Eliminierung unerwünschter Strahlungsanteile aus detektiertem Licht von einer beleuchteten Probe
JP6313211B2 (ja) 2011-10-25 2018-04-18 デイライト ソリューションズ、インコーポレイテッド 赤外撮像顕微鏡
JP6525161B2 (ja) 2013-04-12 2019-06-05 デイライト ソリューションズ、インコーポレイテッド 赤外光用屈折対物レンズ・アセンブリ
DE102013010731A1 (de) * 2013-06-24 2014-12-24 Carl Zeiss Microscopy Gmbh Schnell und genau schaltende Lichtweiche und Strahlstabilisierungsvorrichtung
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees

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US4631416A (en) * 1983-12-19 1986-12-23 Hewlett-Packard Company Wafer/mask alignment system using diffraction gratings
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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1421367A1 (de) * 2001-08-28 2004-05-26 Gnothis Holding SA Einkanal-mehrfarben-korrelationsanalyse
GB2416445A (en) * 2004-07-16 2006-01-25 Zeiss Carl Jena Gmbh Microscope with increased resolution
GB2416446A (en) * 2004-07-16 2006-01-25 Zeiss Carl Jena Gmbh Laser scanning microscope
US7468834B2 (en) 2004-07-16 2008-12-23 Carl Zeiss Microimaging Gmbh Microscope with heightened resolution and linear scanning
US10564412B2 (en) 2010-12-10 2020-02-18 Nkt Photonics A/S Tunable filter including an angular dispersive element for a broad band source
EP3042233B1 (de) * 2013-09-03 2025-03-12 Leica Microsystems CMS GmbH Mikroskop mit einer akustooptischen vorrichtung

Also Published As

Publication number Publication date
EP1141763B2 (de) 2011-09-07
US7009763B1 (en) 2006-03-07
JP2002533747A (ja) 2002-10-08
EP1141763B1 (de) 2005-09-07
EP1591825B1 (de) 2009-09-02
JP4532745B2 (ja) 2010-08-25
EP1591825A3 (de) 2006-04-12
DE59912534D1 (de) 2005-10-13
HK1038797A1 (en) 2002-03-28
EP1591825A2 (de) 2005-11-02
WO2000037985A3 (de) 2001-04-12
DE19936573A1 (de) 2001-02-08
EP1591825B2 (de) 2016-01-13
EP1591825B8 (de) 2009-10-14
DE59915074D1 (de) 2009-10-15
EP1141763A1 (de) 2001-10-10

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