WO2000037985A2 - Anordnung zur separierung von anregungs- und emissionslicht in einem mikroskop - Google Patents
Anordnung zur separierung von anregungs- und emissionslicht in einem mikroskop Download PDFInfo
- Publication number
- WO2000037985A2 WO2000037985A2 PCT/EP1999/010262 EP9910262W WO0037985A2 WO 2000037985 A2 WO2000037985 A2 WO 2000037985A2 EP 9910262 W EP9910262 W EP 9910262W WO 0037985 A2 WO0037985 A2 WO 0037985A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- light
- excitation
- arrangement according
- arrangement
- microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/14—Beam splitting or combining systems operating by reflection only
- G02B27/145—Beam splitting or combining systems operating by reflection only having sequential partially reflecting surfaces
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/1086—Beam splitting or combining systems operating by diffraction only
Definitions
- the light (excitation light) of two lasers L1, L2 with different wavelengths is coupled into a common beam path via a mirror SP and a beam splitter ST, which on the side S1 of a mirrored prism in the direction of an AOTF (Acousto-OpticalTunable Filter ) is reflected.
- AOTF Acoustic-OpticalTunable Filter
- the excitation light is introduced into the AOTF, with light diffracted in the first order being deflected for the wavelength set via the control frequency of the AOTF exactly in the direction of a pinhole PH with upstream and downstream pinhole optics PHO for setting the beam profiles, while other possible wavelengths are undeflected in zero-order cross the AOTF and do not reach the pinhole.
- the pinhole PH serves here as an excitation and detection pinhole at the same time.
- the excitation light is imaged in the direction of a microscopic beam path MI in the direction of a sample via scanning units SC1, SC2 and a scanning optics SCO.
- the light emitted by the sample consisting of parts of the
- Excitation light and wavelength-shifted fluorescence components pass through the light path in the opposite direction to the AOTF.
- the wavelength components of the excitation light reach the mirror side S1 of the prism PS again via first-order diffraction, while the fluorescence components reach the AOTF cross undeflected in zero order and thereby take an angle to the reflected excitation light.
- the tip between prism surfaces S1 and S2 is now arranged between the returning zeroth and first order rays, as a result of which the fluorescent light strikes side S2 and from there in the direction of a detection unit, here consisting for example of a line filter LF, a color divider NFT and two Detectors for different wavelengths, is reflected.
- a detection unit here consisting for example of a line filter LF, a color divider NFT and two Detectors for different wavelengths, is reflected.
- the AOTF Due to the low bandwidth of the AOTF of approx. 2 nm bandwidth for the excitation light, it acts as an extreme edge filter with clear advantages, for example, against dichroic filters with bandwidths greater than 10 nm. This is particularly important because the distance between the excitation wavelength and fluorescence wavelengths is less than 10 nm can be and a wavelength-dependent separation is still possible due to the arrangement according to the invention.
- the AOTF can be switched from the wavelength of the laser L1 to the wavelength of the laser L2 and in turn the excitation light can be separated from the fluorescent light.
- FIG. 2 shows a similar arrangement with only one scanner SC.
- a mirror S is provided, which deflects the excitation light in the direction of the AOTF analogously to FIG. 1, here the fluorescence light returning in zero order runs through the AOTF next to the mirror S and in this way in the direction of one here detection, not shown.
- the AOTF can serve solely as a separation unit between excitation light and fluorescent light, by the laser light entering the AOTF in the direction of the first order without an upstream element and the detection light leaving the AOTF at an angle to the excitation light and directly entering a detection unit, which only has an effect on the overall length, since the angle of four degrees, for example, is right turns out small and overlaps of the wavelength components should be avoided.
- a separating mirror can also be provided only for the fluorescent light.
- a further advantageous embodiment in the form of an unmirrored prism is provided, which by refraction the light of an excitation laser in the first
- the invention is particularly advantageously applicable in a laser scanning ' microscope with an AOTF.
- AOTF and AOM are advantageously provided in the laser beam path for coupling the laser radiation.
- Several laser lines L1-L3 such as UV / VIS or IR can be coupled in simultaneously with independently adjustable excitation power or individually.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Microscoopes, Condenser (AREA)
- Diffracting Gratings Or Hologram Optical Elements (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP99964647A EP1141763B2 (de) | 1998-12-22 | 1999-12-22 | Anordnung zur separierung von anregungs- und emissionslicht in einem mikroskop |
| HK01108690.5A HK1038797B (en) | 1998-12-22 | 1999-12-22 | Arrangement for separation excitation light and emission light in a microscope |
| US09/857,205 US7009763B1 (en) | 1998-12-22 | 1999-12-22 | Arrangement for separating excitation light and emission light in a microscope |
| DE59912534T DE59912534D1 (de) | 1998-12-22 | 1999-12-22 | Anordnung zur separierung von anregungs- und emissionslicht in einem mikroskop |
| JP2000589988A JP4532745B2 (ja) | 1998-12-22 | 1999-12-22 | 顕微鏡における励起光と放出光との分離構造 |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE1998159314 DE19859314A1 (de) | 1998-12-22 | 1998-12-22 | Anordnung zur Separierung von Anregungs- und Emissionslicht in einem Mikroskop |
| DE19859314.7 | 1998-12-22 | ||
| DE19936573.3 | 1999-08-03 | ||
| DE19936573A DE19936573A1 (de) | 1998-12-22 | 1999-08-03 | Anordnung zur Separierung von Anregungs- und Emissionslicht in einem Mikroskop |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2000037985A2 true WO2000037985A2 (de) | 2000-06-29 |
| WO2000037985A3 WO2000037985A3 (de) | 2001-04-12 |
Family
ID=26050938
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP1999/010262 Ceased WO2000037985A2 (de) | 1998-12-22 | 1999-12-22 | Anordnung zur separierung von anregungs- und emissionslicht in einem mikroskop |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7009763B1 (https=) |
| EP (2) | EP1141763B2 (https=) |
| JP (1) | JP4532745B2 (https=) |
| DE (3) | DE19936573A1 (https=) |
| WO (1) | WO2000037985A2 (https=) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1421367A1 (de) * | 2001-08-28 | 2004-05-26 | Gnothis Holding SA | Einkanal-mehrfarben-korrelationsanalyse |
| GB2416445A (en) * | 2004-07-16 | 2006-01-25 | Zeiss Carl Jena Gmbh | Microscope with increased resolution |
| GB2416446A (en) * | 2004-07-16 | 2006-01-25 | Zeiss Carl Jena Gmbh | Laser scanning microscope |
| US10564412B2 (en) | 2010-12-10 | 2020-02-18 | Nkt Photonics A/S | Tunable filter including an angular dispersive element for a broad band source |
| EP3042233B1 (de) * | 2013-09-03 | 2025-03-12 | Leica Microsystems CMS GmbH | Mikroskop mit einer akustooptischen vorrichtung |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102004031048A1 (de) * | 2004-06-25 | 2006-01-12 | Leica Microsystems Cms Gmbh | Mikroskop |
| DE102004054262B4 (de) * | 2004-11-09 | 2016-08-18 | Leica Microsystems Cms Gmbh | Vorrichtung zur Untersuchung und Manipulation von mikroskopischen Objekten |
| DE102005020543A1 (de) | 2005-05-03 | 2006-11-09 | Carl Zeiss Jena Gmbh | Verfahren und Vorrichtung zur einstellbaren Veränderung von Licht |
| DE102005020545A1 (de) * | 2005-05-03 | 2006-11-09 | Carl Zeiss Jena Gmbh | Vorrichtung zur Steuerung von Lichtstrahlung |
| TWI364889B (en) * | 2005-11-11 | 2012-05-21 | Hon Hai Prec Ind Co Ltd | Laser device and laser system using the same |
| DE102005059338A1 (de) * | 2005-12-08 | 2007-06-14 | Carl Zeiss Jena Gmbh | Verfahren und Anordnung zur Untersuchung von Proben |
| DE102006034915A1 (de) * | 2006-07-28 | 2008-01-31 | Carl Zeiss Microimaging Gmbh | Laser-Scanning-Mikroskop |
| DE102007024075B4 (de) | 2007-05-22 | 2022-06-09 | Leica Microsystems Cms Gmbh | Durchstimmbares akusto-optisches Filterelement, einstellbare Lichtquelle, Mikroskop und akusto-optischer Strahlteiler |
| DE102007053199A1 (de) * | 2007-11-06 | 2009-05-14 | Leica Microsystems Cms Gmbh | Vorrichtung und Verfahren zur Ansteuerung eines akustooptischen Bauteils |
| US9229294B2 (en) | 2010-05-06 | 2016-01-05 | Leica Microsystems Cms Gmbh | Apparatus and method for operating an acousto-optical component |
| DE102010033722A1 (de) | 2010-08-07 | 2012-02-09 | Carl Zeiss Microimaging Gmbh | Anordnung und/oder Verfahren zur Eliminierung unerwünschter Strahlungsanteile aus detektiertem Licht von einer beleuchteten Probe |
| JP6313211B2 (ja) | 2011-10-25 | 2018-04-18 | デイライト ソリューションズ、インコーポレイテッド | 赤外撮像顕微鏡 |
| JP6525161B2 (ja) | 2013-04-12 | 2019-06-05 | デイライト ソリューションズ、インコーポレイテッド | 赤外光用屈折対物レンズ・アセンブリ |
| DE102013010731A1 (de) * | 2013-06-24 | 2014-12-24 | Carl Zeiss Microscopy Gmbh | Schnell und genau schaltende Lichtweiche und Strahlstabilisierungsvorrichtung |
| US11506877B2 (en) | 2016-11-10 | 2022-11-22 | The Trustees Of Columbia University In The City Of New York | Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees |
Family Cites Families (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DD159819A1 (de) * | 1981-06-22 | 1983-04-06 | Bernd Walter | Steuerschaltung fuer elektronische modulatoren eines akustooptischen zweistrahlmodulationssystems |
| US4631416A (en) * | 1983-12-19 | 1986-12-23 | Hewlett-Packard Company | Wafer/mask alignment system using diffraction gratings |
| FR2557985B1 (fr) † | 1984-01-10 | 1987-04-24 | Sfena | Deflecteur acousto-optique polychromatique |
| JPS60252246A (ja) * | 1984-05-29 | 1985-12-12 | Hamamatsu Photonics Kk | 顕微鏡像の分光イメ−ジング装置 |
| US4627730A (en) | 1984-07-06 | 1986-12-09 | The Board Of Trustees Of The Leland Stanford Junior University | Optical scanning microscope |
| JPH01145621A (ja) * | 1987-12-02 | 1989-06-07 | Nikon Corp | 多波長光ビーム光学系 |
| JPH0195648U (https=) * | 1987-12-17 | 1989-06-23 | ||
| FR2626383B1 (fr) | 1988-01-27 | 1991-10-25 | Commissariat Energie Atomique | Procede de microscopie optique confocale a balayage et en profondeur de champ etendue et dispositifs pour la mise en oeuvre du procede |
| JPH01282515A (ja) | 1988-05-10 | 1989-11-14 | Tokyo Electron Ltd | ビーム走査型光学顕微鏡 |
| JPH04157413A (ja) * | 1990-10-20 | 1992-05-29 | Fuji Photo Film Co Ltd | 走査型顕微鏡 |
| US5208648A (en) * | 1991-03-11 | 1993-05-04 | International Business Machines Corporation | Apparatus and a method for high numerical aperture microscopic examination of materials |
| JPH04350816A (ja) * | 1991-05-29 | 1992-12-04 | Olympus Optical Co Ltd | 共焦点蛍光顕微鏡 |
| JPH0580366A (ja) * | 1991-09-20 | 1993-04-02 | Asahi Glass Co Ltd | 音響光学光スイツチ |
| JPH0695038A (ja) | 1992-03-19 | 1994-04-08 | Matsushita Electric Ind Co Ltd | 超解像走査光学装置、光学装置の超解像用光源装置及び光学装置の超解像用フィルター |
| US5422712A (en) * | 1992-04-01 | 1995-06-06 | Toa Medical Electronics Co., Ltd. | Apparatus for measuring fluorescent spectra of particles in a flow |
| EP0620458A4 (en) * | 1992-09-07 | 1995-02-01 | Nippon Kogaku Kk | OPTICAL WAVEGUIDE AND OPTICAL INSTRUMENT USING THE SAME. |
| US5418371A (en) * | 1993-02-01 | 1995-05-23 | Aslund; Nils R. D. | Apparatus for quantitative imaging of multiple fluorophores using dual detectors |
| JP3343276B2 (ja) * | 1993-04-15 | 2002-11-11 | 興和株式会社 | レーザー走査型光学顕微鏡 |
| DE4433753A1 (de) * | 1993-11-15 | 1995-05-24 | Hoffmann La Roche | Anordnung zur Analyse von Substanzen an der Oberfläche eines optischen Sensors |
| JPH0829692A (ja) * | 1994-07-11 | 1996-02-02 | Nikon Corp | 蛍光顕微鏡 |
| DE19510102C1 (de) * | 1995-03-20 | 1996-10-02 | Rainer Dr Uhl | Konfokales Fluoreszenzmikroskop |
| US5841577A (en) † | 1996-02-16 | 1998-11-24 | Carnegie Mellon University | Light microscope having acousto-optic tunable filters |
| DE19633185C2 (de) * | 1996-04-16 | 2000-06-15 | Leica Microsystems | Mehrfarbige Punktlichtquelle für ein Laserscanmikroskop |
| EP0894278B1 (de) | 1996-04-16 | 2004-11-03 | Leica Microsystems Heidelberg GmbH | Punktlichtquelle für ein laserscanmikroskop und verfahren zum einkoppeln von mindestens zwei lasern unterschiedlicher wellenlänge in ein laserscanmikroskop |
| DE19627568A1 (de) * | 1996-07-09 | 1998-01-15 | Zeiss Carl Jena Gmbh | Anordnung und Verfahren zur konfokalen Mikroskopie |
| DE19758744C2 (de) | 1997-01-27 | 2003-08-07 | Zeiss Carl Jena Gmbh | Laser-Scanning-Mikroskop |
| WO1999042884A1 (de) † | 1998-02-19 | 1999-08-26 | Leica Microsystems Heidelberg Gmbh | Optische anordnung mit spektral selektivem element |
-
1999
- 1999-08-03 DE DE19936573A patent/DE19936573A1/de active Pending
- 1999-12-22 JP JP2000589988A patent/JP4532745B2/ja not_active Expired - Fee Related
- 1999-12-22 EP EP99964647A patent/EP1141763B2/de not_active Expired - Lifetime
- 1999-12-22 WO PCT/EP1999/010262 patent/WO2000037985A2/de not_active Ceased
- 1999-12-22 DE DE59912534T patent/DE59912534D1/de not_active Expired - Lifetime
- 1999-12-22 EP EP05012775.2A patent/EP1591825B2/de not_active Expired - Lifetime
- 1999-12-22 DE DE59915074T patent/DE59915074D1/de not_active Expired - Lifetime
- 1999-12-22 US US09/857,205 patent/US7009763B1/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1421367A1 (de) * | 2001-08-28 | 2004-05-26 | Gnothis Holding SA | Einkanal-mehrfarben-korrelationsanalyse |
| GB2416445A (en) * | 2004-07-16 | 2006-01-25 | Zeiss Carl Jena Gmbh | Microscope with increased resolution |
| GB2416446A (en) * | 2004-07-16 | 2006-01-25 | Zeiss Carl Jena Gmbh | Laser scanning microscope |
| US7468834B2 (en) | 2004-07-16 | 2008-12-23 | Carl Zeiss Microimaging Gmbh | Microscope with heightened resolution and linear scanning |
| US10564412B2 (en) | 2010-12-10 | 2020-02-18 | Nkt Photonics A/S | Tunable filter including an angular dispersive element for a broad band source |
| EP3042233B1 (de) * | 2013-09-03 | 2025-03-12 | Leica Microsystems CMS GmbH | Mikroskop mit einer akustooptischen vorrichtung |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1141763B2 (de) | 2011-09-07 |
| US7009763B1 (en) | 2006-03-07 |
| JP2002533747A (ja) | 2002-10-08 |
| EP1141763B1 (de) | 2005-09-07 |
| EP1591825B1 (de) | 2009-09-02 |
| JP4532745B2 (ja) | 2010-08-25 |
| EP1591825A3 (de) | 2006-04-12 |
| DE59912534D1 (de) | 2005-10-13 |
| HK1038797A1 (en) | 2002-03-28 |
| EP1591825A2 (de) | 2005-11-02 |
| WO2000037985A3 (de) | 2001-04-12 |
| DE19936573A1 (de) | 2001-02-08 |
| EP1591825B2 (de) | 2016-01-13 |
| EP1591825B8 (de) | 2009-10-14 |
| DE59915074D1 (de) | 2009-10-15 |
| EP1141763A1 (de) | 2001-10-10 |
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