Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N21/55—Specular reflectivity
  • G01N21/552—Attenuated total reflection
  • G01N21/553—Attenuated total reflection and using surface plasmons
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
  • Y10T436/00—Chemistry: analytical and immunological testing
  • Y10T436/17—Nitrogen containing
  • Y10T436/173845—Amine and quaternary ammonium
  • Y10T436/175383—Ammonia
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
  • Y10T436/00—Chemistry: analytical and immunological testing
  • Y10T436/18—Sulfur containing
  • Y10T436/182—Organic or sulfhydryl containing [e.g., mercaptan, hydrogen, sulfide, etc.]
  • Y10T436/184—Only hydrogen sulfide
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
  • Y10T436/00—Chemistry: analytical and immunological testing
  • Y10T436/20—Oxygen containing
  • Y10T436/203332—Hydroxyl containing
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
  • Y10T436/00—Chemistry: analytical and immunological testing
  • Y10T436/21—Hydrocarbon
• • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
  • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
  • Y10T436/00—Chemistry: analytical and immunological testing
  • Y10T436/22—Hydrogen, per se

Definitions

• the invention relates to a method utilizing surface plasmon resonance phenomenon for analyzing various substances, being presented in the preamble portion of claim 1, as well as to a sensor for carrying out the method, being presented in preamble portion of claim 5.
• the surface plasmon is a particular kind of electromag ⁇ netic wave which propagates along the surface of a metal (H. Raether, "Surface plas ons on smooth and rough surfaces and on gratings", Springer-Verlag, Berlin, 1988) .
• Optical excitation of the surface plasmon can be achieved if a p-polarized, collimated light beam undergoes total reflection on the surface of glass substrate coated with a thin metal film (so- called Kretschmann configuration) .
• the momentum of photons should match the surface plasmons on the opposite surface of the metal film in order to make this possible. This occurs for a given wavelength at a given critical angle of incidence of light.
• the phenomenon is observed as a sharp minimum in the intensity of the reflected light when the angle of incidence is varied.
• the angle or wavelength at which this dip occurs depends decisively on the properties of the surface layer on top of the metal film, and therefore the phenomenon can be used to monitor changes on this surface layer caused e.g. by a specific chemical or biological reaction or by the change of concentration of some substance in the immediate vicinity of this surface.
• any material having a negative dielectric function can be used for the excitation of plasmons.
• Most metals fulfil this requirement in the range of visible wavelengths.
• An ideal material SPR-material
• SPR-material should have a negative coefficient of the real part of the dielectric constant and as large an absolute value of this coefficient as possible and at the same time as small an absolute value of the coefficient of the imaginary part as possible.
• the choice of metals and their thicknesses has been made usually to satisfy the criterion for the sharpest peak with as total an extinction of the intensity of reflected light as possible. For this reason the metals most used are silver and gold, silver giving the sharpest peaks.
• the SPR-material is in addition coated with a specific surface layer having certain affinity towards the test material to attain desired sensitivity.
• the changes occurring in this layer form the basis for the measure ⁇ ment.
• the purpose of the invention is to present an improve- ent for the above-mentioned methods and to present a method and sensor making it possible to widen the field of use of the SPR-method.
• the method according to the invention is mainly characterized by what is disclosed in the characterizing portion of claim 1, and the sensor is characterized by what is disclosed in the charac ⁇ terizing portion of claim 5.
• the catalytically active material is used as the material, the catalytic properties and the SPR-properties of the material can be combined in a way that creates new possibilities of analysis.
• the method and sensor can also make use of materials having a relatively large optical absorption. This kind of material, even if it creates a broad peak, can be used in SPR-sensors on the prerequisite that the analyses are carried out at an angle of incidence and wavelength that are properly chosen.
• Fig. 1 shows a typical resonance curve obtained using the sensor material of the invention
• Fig. 2 illustrates the principle of the method in accordance with the invention.
• Fig. 3 shows a test carried out with a sensor in accordance with the invention
• Fig. 4 shows a test carried out with a traditional sensor
• Fig. 5 shows a sensor in accordance with the invention and the auxiliary equipment associated therewith.
• the material of the material layer must be SPR- compatible as such, that is, it must possess some predetermined dielectric properties discussed hereinabove.
• the curve illustrating the intensity as a function of the angle of incidence must have at least one portion that is steep enough so that at this point a small shift of the curve which takes place owing to the changes on the opposite surface of the material layer would cause a change of intensity that is as large as possible.
• test material On the other surface of the material layer the test material must effect a change to cause a sufficient ⁇ ly large change of intensity.
• This kind of change can be caused by a change in the dielectric proper ⁇ ties of the surface resulting from the change of concentration of a substance in the vicinity thereof.
• the material layer for the measurement is so chosen that it on one hand is SPR-compatible material as such, and on the other hand its opposite surface facing away from the radia ⁇ tion constitutes an area in which changes in properties influenced by the test material take place owing to the fact that the material layer is of catalytic material being capable to act as a catalyst for some chemical reaction in which the test material takes part. Even if the reaction did not happen on said surface, the catalytic properties of the material towards the test substance will cause the accumulation of the test material on the surface of the material layer in a concentration being sufficiently high to make it possible to detect the change in the SPR- conditions using measurement techniques.
• SPR-ratio the real part of the dielectric constant provided with an opposite sign divided by the coefficient of the imaginary part
• the wavelength and the angle of incidence of the electromagnetic radiation used in the measurement can be chosen according to the SPR-material and the test material. Light is as a rule mentioned in connection with SPR-methods, but it should be noted that some suitable wavelengths can be situated outside the visible light within the IR-range.
• the metals having such a broad SPR-response are useful in SPR-measure- ments if advantage is taken of the catalytic properties of the metals. Consequently, the measurement can always be carried out with a good sensitivity at such an angle of incidence for which the curves illustrating the intensity as a function of the angle of incidence are as distinctly separated from each other as pos ⁇ sible in the measurement range for the test material.
• the down-way slope of the resonance curve can be used, said slope being effected most by the changes in the resonance conditions.
• the determination of the shape of the whole curve and the location of the minimum point is not necessary if the measurement is performed within a defined concentration range.
• the speed of change of the intensity value can be determined instead of the concentration determinations by means of the absolute intensity values, that is, the time derivative of the intensity starting from the moment when the surface came into contact with the test material is determined. This will indicate the concentration of the material even if at the final stage of the measurement the flat portion of the curve had shifted to the range of the used angle of incidence.
• Fig. 2 shows an experiment conducted with one of the materials of the invention, palladium.
• a 13,4 nm thick palladium layer was coated with monomolecular Cd-behenate layers in such a fashion that the number of the layers was increased from 2 to 8.
• a SPR-measu- re ent was conducted after the addition of each pair of layers and the curves representing the intensity as a function of the angle of incidence were regis ⁇ tered.
• the thickness of one Cd-behenate layer was 3 nm.
• a curve obtained with a bare palladium surface is denoted by letter A, the curve of two layers by letter B, the curve of four layers by letter C, and the curve of eight layers by letter D. It can be clearly seen in Fig.
• palladium can be used as SPR-material it brings some new possibilities for SPR-analysis.
• the catalytic properties of palladium towards substances containing hydrogen make it very interesting conside ⁇ ring the analysis of these substances.
• Palladium dissociates hydrogen on its surface and it has good affinity to some substances containing hydrogen. This feature has been utilized previously in semiconductor sensors measuring the concentrations of hydrogen- containing molecules.
• Substances that can be measured by means of palladium in these types of sensors are hydrogen sulphide, alcohols, ethylene etc. (J. Lund- str ⁇ m, M. Armgarth, A. Spetz, F. Windquist, "Gas sensors based on catalytic metal-gate field-effect devices", Sensors and Actuators, 1Q., 399-421 (1986)).
• Fig. 3 shows a SPR-test conducted with palladium.
• hydrogen gas air and helium were led to the surface of palladium in succession.
• the curve of Fig. 3 indicates the intensity value obtained by means of the method of the invention as a function of time.
• the sensitivity of palladium to hydrogen is clear and in addition the phenomenon is reversible.
• a special phenomenon is the rise of the intensity value caused by hydrogen. Because hydrogen has a smaller reflective index than air, the intensity values should decrease owing to the gaseous hydrogen led to the vicinity of the palladium surface. However, the intensity values raise considerably, which indicates the fact that hydrogen changes the properties of the surface layer of palladium itself owing to the catalytic properties of palladium. Moreover, only a minor pit caused by helium can be observed in the curve, which illustrates well the selectivity of palladium towards hydrogen.
• Fig. 4 shows in the scale of Fig. 3 the SPR-test conducted with gold, the conventional material.
• Fig. 5 shows a sensor that is particularly well suitable in the method according to the invention.
• the sensor comprises a monochromatic light source 1 and collimating optics 2 provided for making the light beam emanating from the light source 1 parallel and for directing it through a polarizer 3 to meet the surface 5a of the metal layer in a predetermined angle of incidence ⁇ .
• the metal surface is constituted of the inner surface of a metal film fixed on trans- parent dielectric material 4, a glass prism.
• the total reflection taking place on this surface leads the light beam to a detector 6.
• the light beam 1, the optics 2 and the prism 4 are so disposed that the collimated light beam strikes the interface 5 of the prism and the metal layer at an optimum angle of incidence ⁇ , which is within the measurement range of the test material in such a fashion that the steep portions of all the curves corresponding to the con ⁇ centration values essential for a successful measu- rement are situated at the angle of incidence. In this way it is possible to obtain an intensity value or a time derivative of the intensity value that is proportional to the concentration.
• the material to be analyzed On the other side 5b of the metal layer 5 is situated the material to be analyzed.
• the material is some substance containing hydrogen.
• a through flow cell can be used at this area and this area can be also isolated from the surroundings by means of a selective isolating layer 8, such as a membrane that passes only the substance to be analyzed through if the surroundings which are examined contain other sub ⁇ stances towards which the material of the material layer shows catalytic properties.
• a radiation heater preventing the condensing of water molecules on the surface of the metal layer, known as such, is denoted by reference numeral 7 in the Figure.
• An exact value for the angle of incidence ⁇ can be calculated on the basis of several factors such as the thickness of the metal layer, the wavelength of light and the dielectric constants of the dielectric material 4 and metal 5 at this wavelength.
• the thickness of the palladium layer should be 13 nm and the angle of incidence 42,7°.
• the accuracy and selectivity can be improved by using also a so-called differential measurement having two light beams emanating from the same light source, one of them directed to an active part of the SPR-surface and the other of them to an inactive part of the same surface.
• the intensity difference of the reflected light beams is used as the measurement data rather than the absolute intensity.
• the so-called fixed-angle-method has been described hereinabove (only one angle of incidence) , which can be realized with a sensitive and inexpensive sensor.
• the invention can also be applied in a method that utilizes several angles of incidence simultaneous ⁇ ly for a better measurement dynamics.
• the invention can also be applied for example in the sensor types disclosed in a previous patent application 901186 by the Applicant.
• All the measurement data obtained in the above methods can be processed by means of a microprocessor 9 connected to the detector and being also capable of modulating the light sources and synchronizing the detector.
• sensor can be easily minia ⁇ turized by using available electro-optical components (LED:s, detectors, heaters) and fibre optical connec ⁇ tions.
• the method according to the invention makes it possible to use new sensor material and to analyze new sub ⁇ stances by means of measurements based on the SPR- pheno enon.
• the invention can be applied in a very wide range, such as medical diagnosis, wood industry, process control, monitoring the condition of the environment, detecting leaks etc.

Landscapes

• Physics & Mathematics (AREA)
• Health & Medical Sciences (AREA)
• Life Sciences & Earth Sciences (AREA)
• Chemical & Material Sciences (AREA)
• Analytical Chemistry (AREA)
• Biochemistry (AREA)
• General Health & Medical Sciences (AREA)
• General Physics & Mathematics (AREA)
• Immunology (AREA)
• Pathology (AREA)
• Investigating Or Analysing Materials By Optical Means (AREA)
• Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)

Priority Applications (4)

Applications Claiming Priority (2)

Publications (1)

Family

ID=8530741

Family Applications (1)

Country Status (7)

Cited By (6)

Families Citing this family (64)

Citations (4)

Family Cites Families (3)

• 1990
  • 1990-07-04 FI FI903357A patent/FI85768C/fi not_active IP Right Cessation
• 1991
  • 1991-07-04 EP EP91912624A patent/EP0537252B1/en not_active Expired - Lifetime
  • 1991-07-04 US US07/962,786 patent/US5322798A/en not_active Expired - Fee Related
  • 1991-07-04 AU AU81831/91A patent/AU8183191A/en not_active Abandoned
  • 1991-07-04 JP JP3511656A patent/JP3051166B2/ja not_active Expired - Fee Related
  • 1991-07-04 WO PCT/FI1991/000210 patent/WO1992001217A1/en active IP Right Grant
  • 1991-07-04 DE DE69116366T patent/DE69116366T2/de not_active Expired - Fee Related

Patent Citations (4)

Also Published As

Similar Documents

Legal Events