US9905607B2 - Radiation detector fabrication - Google Patents

Radiation detector fabrication Download PDF

Info

Publication number
US9905607B2
US9905607B2 US14/811,566 US201514811566A US9905607B2 US 9905607 B2 US9905607 B2 US 9905607B2 US 201514811566 A US201514811566 A US 201514811566A US 9905607 B2 US9905607 B2 US 9905607B2
Authority
US
United States
Prior art keywords
printing
substrate
light imager
detector
scintillator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US14/811,566
Other languages
English (en)
Other versions
US20170033148A1 (en
Inventor
James Zhengshe Liu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Assigned to GENERAL ELECTRIC COMPANY reassignment GENERAL ELECTRIC COMPANY ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: LIU, JAMES ZHENGSHE
Priority to US14/811,566 priority Critical patent/US9905607B2/en
Priority to JP2018504140A priority patent/JP7237582B2/ja
Priority to CN201680044181.5A priority patent/CN107924926B/zh
Priority to PCT/US2016/044044 priority patent/WO2017019686A1/fr
Priority to EP16831237.9A priority patent/EP3329514B1/fr
Priority to US15/351,690 priority patent/US9997557B2/en
Publication of US20170033148A1 publication Critical patent/US20170033148A1/en
Publication of US9905607B2 publication Critical patent/US9905607B2/en
Application granted granted Critical
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • H01L27/14663—Indirect radiation imagers, e.g. using luminescent members
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02367—Substrates
    • H01L21/0237—Materials
    • H01L21/02373—Group 14 semiconducting materials
    • H01L21/02381—Silicon, silicon germanium, germanium
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02518—Deposited layers
    • H01L21/02521—Materials
    • H01L21/02524—Group 14 semiconducting materials
    • H01L21/02532—Silicon, silicon germanium, germanium
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02656—Special treatments
    • H01L21/02664—Aftertreatments
    • H01L21/02667—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
    • H01L27/14612—Pixel-elements with integrated switching, control, storage or amplification elements involving a transistor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14625—Optical elements or arrangements associated with the device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14625—Optical elements or arrangements associated with the device
    • H01L27/14629—Reflectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
    • H01L27/14685—Process for coatings or optical elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
    • H01L27/14689—MOS based technologies
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
    • H01L27/14692—Thin film technologies, e.g. amorphous, poly, micro- or nanocrystalline silicon

Definitions

  • the subject matter disclosed herein relates to X-ray imaging systems, and more specifically, to X-ray imaging systems utilizing a digital X-ray detector having pixels fabricated with crystalline silicon.
  • Digital X-ray imaging systems are used to generate digital data in a non-invasive manner and to reconstruct such digital data into useful radiographic images.
  • radiation from a source is directed toward a subject or object, typically a patient in a medical diagnostic application, a package or baggage in a security screening application, or a fabricated component in an industrial quality control or inspection application.
  • a portion of the radiation passes through the subject or object and impacts a detector.
  • the scintillator of the detector converts the higher-energy X-ray radiation to lower-energy light photons that are sensed using photo-sensitive components (e.g., photodiodes or other suitable photodetectors).
  • the detector is typically divided into a matrix of discrete picture elements or pixels, and encodes output signals based upon the quantity or intensity of the radiation impacting each pixel region. The signals may then be processed to generate an image that may be displayed for review.
  • the detector features may be based on or formed from a silicon semiconductor substrate.
  • a silicon substrate may be provided as crystalline silicon (c-Si), which consists of an ordered silicon matrix (e.g., a well ordered crystal lattice), or amorphous silicon (a-Si), which does not have an ordered matrix (e.g., a random crystal lattice).
  • c-Si crystalline silicon
  • a-Si amorphous silicon
  • the random crystal lattice of a-Si allows an electron mobility of ⁇ 1 cm 2 /((v ⁇ s)) while the ordered crystal lattice of c-Si allows an electron mobility of approximately 1,400 cm 2 /((v ⁇ s)).
  • the size of features that can be formed using c-Si can be much smaller than those formed from the a-Si, enabling multiple gate active pixel designs with charge amplifier inside the pixel as well as the in-panel readout circuitry including analog to digital converter (A/D).
  • A/D analog to digital converter
  • X-ray detectors based on c-Si technology such as those employing complementary metal-oxide-semiconductors (CMOS) formed from c-Si, have been demonstrated to outperform traditional a-Si based X-ray detector in various ways, including, but not limited to: relative immunity to electromagnetic interference (EMI), reduced electronic noise, reduced image lag, higher spatial resolution, higher frame rate, broader scintillating material selection, and so forth.
  • EMI electromagnetic interference
  • disadvantages of using c-Si include: higher cost, lower dynamic range due to lower voltage swings, and smaller panel size (due to limitations in the practical size of silicon wafers used to fabricate c-Si devices) that may require tiling multiple, smaller panels together to form a larger detector panel. Such tiling arrangements also introduce complexities in the electrical interconnection arrangements needed to operate such a detector panel.
  • crystalline silicon is not intended to exclude embodiments of a particular form of crystalline silicon. Rather it broadly refers to any form of crystalline silicon, including, but not limited to: the monocrystalline silicon, the polycrystalline silicon, the microcrystalline silicon, the protocrystalline silicon, and so forth.
  • amorphous silicon (a-Si) is disposed on a substrate.
  • the a-Si is melted.
  • the a-Si is subsequently solidified to form crystalline silicon (c-Si) circuits on the substrate.
  • the c-Si circuits comprise at least a plurality of detector pixels each comprising at least a field effect transistor, a photodiode, and a charge amplifier.
  • a method for fabricating a scintillator of a radiation detector is provided.
  • a light imager panel is provided.
  • a layer of scintillator material is printed on the light imager panel.
  • a light imager panel of a radiation detector includes a non-silicon substrate and a plurality of pixels printed on the non-silicon substrate.
  • Each pixel comprises crystalline silicon (c-Si) circuitry corresponding to at least one field effect transistor, at least one photodiode, and at least one charge amplifier.
  • FIG. 1 depicts a block-diagram of an embodiment of a digital X-ray imaging system, in accordance with aspects of the present disclosure
  • FIG. 2 depicts a schematic view of conventional X-ray detector pixels made using a-Si technology
  • FIG. 3 depicts a schematic view of X-ray detector pixels made using c-Si technology, in accordance with aspects of the present disclosure
  • FIG. 4 depicts an exploded view of certain layers of a detector panel, in accordance with aspects of the present disclosure
  • FIG. 5 depicts a schematic view of the use of a metallic printing technique to fabricate c-Si circuits on a substrate, in accordance with aspects of the present disclosure
  • FIG. 6 depicts a schematic view of the use of a metallic printing technique to fabricate a scintillator layer of a radiation detector, in accordance with aspects of the present disclosure
  • FIG. 7 depicts a schematic view of the use of a pixilated scintillator layer of a radiation detector, in accordance with aspects of the present disclosure
  • FIG. 8 depicts a cross sectional view of a pixel of a scintillator, in accordance with aspects of the present disclosure.
  • FIG. 9 depicts a process flow diagram illustrating one implementation of the fabrication of a radiation detector, in accordance with aspects of the present disclosure.
  • the present approaches relate to the fabrication of active pixel X-ray detector panels using techniques that reduce cost, increase dynamic range, and build large, single-piece (i.e., not tiled construction) light imager panels.
  • aspects of the present approach overcome the disadvantages of c-Si based X-ray detector while maintaining the benefits of such detector.
  • the present approach utilizes a substrate, such as a glass or aluminum substrate similar to the a-Si light imager deposition process.
  • the c-Si structure (i.e., an ordered crystal lattice) is achieved by melting a-Si silicon lines and traces with a focused laser beam in a directed manner.
  • deposition of silicon having a crystalline matrix may be accomplished using multi-photon photopolymerisation, such as may be used in three-dimensional (3D) micro-fabrication. That is, a-Si silicon may initially be applied in a suitable deposition or printing approach and subsequently crystallized to c-Si using thermal energy, such as may be applied using one or more lasers associated with a 3D metallic printer, e.g., selective laser melting (SLM) microfabrication or two-photon absorption (TPA) microfabrication. Alternatively, the silicon may be melted prior to application such that c-Si is directly applied to the substrate in the printing process.
  • SLM selective laser melting
  • TPA two-photon absorption
  • FIG. 1 illustrates diagrammatically an imaging system 10 for acquiring and processing discrete pixel image data using a detector fabricated as discussed herein.
  • system 10 is a digital X-ray system designed both to acquire original image data and to process the image data for display in accordance with the present technique.
  • the imaging system 10 may be a stationary or mobile X-ray system.
  • imaging system 10 includes a source of X-ray radiation 12 that emits a stream of radiation 16 into a region in which an object or subject 18 is positioned.
  • a portion of the radiation 20 passes through or around the subject and impacts a digital X-ray detector (e.g., a CMOS detector), represented generally at reference numeral 22 .
  • the detector 22 may be portable or permanently mounted to the system 10 .
  • the detector 22 may convert the incident X-ray photons to lower energy photons which are detected. Electrical signals are generated in response to the detected photons and these signals are processed to reconstruct an image of the features within the object or subject.
  • Source 12 is controlled by a power supply/control circuit 24 which furnishes both power and control signals for examination sequences.
  • detector 22 includes a detector controller 26 (e.g., control circuitry) which commands acquisition of the signals generated in the detector 22 .
  • Detector controller 26 may also execute various signal processing and filtration functions, such as for initial adjustment of dynamic ranges, interleaving of digital image data, and so forth.
  • Both power supply/control circuit 24 and detector controller 26 are responsive to signals from a system controller 28 .
  • system controller 28 commands operation of the imaging system to execute examination protocols and to process acquired image data.
  • system controller 28 may also include signal processing circuitry and one or more data storage structures, such as optical memory devices, magnetic memory devices, or solid-state memory devices, for storing programs and routines executed by a processor of the system 10 to carry out various functionalities.
  • a programmed computer system may be provided with hardware, circuitry, firmware, and/or software for performing the functions attributed to one or more of the power supply/control circuit 24 , the detector controller 26 , and/or the system controller 28 .
  • system controller 28 is linked to at least one output device, such as a display or printer as indicated at reference numeral 30 .
  • the output device may include standard or special purpose monitors and associated processing circuitry.
  • One or more operator workstations 32 may be further linked in the system for outputting system parameters, requesting examinations, viewing images, and so forth.
  • displays, printers, workstations, and similar devices supplied within the system may be local to the data acquisition components, or may be remote from these components, such as elsewhere within an institution or hospital, or in an entirely different location, linked to the image acquisition system via one or more configurable networks, such as the Internet, virtual private networks, cloud-based network, and so forth.
  • an imaging system 10 To facilitate and simplify explanation, only certain of the components that may be present in an imaging system 10 are described. Other components or functionalities may be present however.
  • structural components such as a gantry or C-arm, may be present on which one or both of the source 12 or detector 22 may be mounted.
  • Such mounting structures may allow data to be acquired over an angular range during an examination, such as in the case of a computed tomography (CT), tomosynthesis, or C-arm angiography system.
  • CT computed tomography
  • tomosynthesis tomosynthesis
  • C-arm angiography system C-arm angiography system
  • the imaging system 10 may be any suitable X-ray based imaging system, including, but not limited to, conventional radiography systems, CT imaging systems, tomosynthesis systems, C-arm systems, fluoroscopy systems, mammography systems, dual- or multiple-energy systems, navigational or interventional imaging systems, and so forth.
  • FIG. 2 a schematic diagram of components (here a light imager panel (shown by dashed lines 56 ) and related readout circuitry) of a typical X-ray detector 22 made based on a-Si technology is depicted.
  • the depicted example is of passive 1T pixels. Due to the limitations associated with a-Si, the conductive paths are relatively wide (compared to what is possible with c-Si), which imposes limits of the sizes of features that may be associated with the pixels.
  • a-Si based pixels may generally include only two electronic components: a field effect transistor (FET) switch and a photodiode.
  • FET field effect transistor
  • the depicted example there is no space to include column readout electronics 54 or the row readout selection circuitry 52 on the physical panel 56 itself. Instead, the column readout electronics 54 and the row selection circuitries 52 are typically built as separate modules and connected to the column data lines 60 and row select scan lines 58 on the panel 56 through flex circuitry. Thus the various readout circuitries are formed “off-panel” relative to the fabricated light imager and are connected to the panel via additional conductive components, e.g., flex circuits.
  • the number of components inside a pixel formed on the panel 56 in an a-Si fabrication is relatively minimal in order to leave sufficient surface space for the photodiode 62 to sense the incident light photons.
  • the pixel consists of a single readout selection gate 64 and a photodiode 62 .
  • FIG. 3 a schematic diagram of a light imager panel 56 made using c-Si, such as in accordance with the present approaches, is shown. Unlike the pixels of FIG. 2 , those shown in FIG. 3 are active 3T or 4T pixels.
  • a detector pixel as discussed herein may have lateral side dimensions (i.e., length and/or width) in a range from 50 microns to 200 microns.
  • the feature size in a c-Si fabrication can be much smaller, which allows more components (e.g., charge amplification circuitry) to be formed within a pixel in addition to the FET switch and photodiode.
  • the column readout electronics 54 and the row readout selection circuitry 52 can be fabricated on the physical panel 56 itself, without requiring external modules and connections.
  • a c-Si pixel may have three, four, or more gates.
  • the pixels shown have three gates: a charge amplifier gate 70 , a row readout selection gate 64 , and a charge reset gate 72 .
  • Moving the charge amplifier onto the panel 56 offers certain advantages, such as lowering electronic noise and higher EMI immunity.
  • CMOS based X-ray detector While these benefits of c-Si fabrication are useful, as noted above, there are typically associated disadvantages.
  • the diameters of commercially available silicon wafers include 1′′ (25 mm), 2′′ (51 mm), 3′′ (76 mm), 4′′ (100 mm), 5′′ (130 mm), 6′′ (150 mm), 8′′ (200 mm), 12′′ (300 mm), 17′′ (450 mm).
  • CMOS based X-ray detectors typically have a lower dynamic range compared to a-Si based X-ray detector.
  • the a-Si based X-ray detector technically does not have any limitation on the panel size as long as the equipment can handle it.
  • the a-Si has a random (i.e., non-ordered) lattice structure yielding very low electron mobility.
  • electronic components cannot be built as small as in a c-Si fabrication.
  • FIG. 4 an example of a present embodiment is described.
  • an exploded view of an X-ray detector panel 22 is shown which includes a scintillator layer 90 and a light imager panel 56 that includes a two-dimensional sensing array of active pixels built on a substrate 92 , such as a glass plate.
  • the materials used in the fabrication of a pixel of an X-ray light imager panel 56 include electrically conductive, nonconductive, and semi-conductive materials.
  • the conductive materials may include aluminum (Al), molybdenum (Mo), indium tin oxide (ITO), and so forth.
  • Al aluminum
  • Mo molybdenum
  • ITO indium tin oxide
  • the electron mobility in these materials typically does not present issues in the present context.
  • the nonconductive materials serve as insulators and do not need electron mobility and, indeed, such mobility would be inconsistent with such an insulating function.
  • the semi-conductive materials such as P + Si and N + Si
  • the silicon layer is usually deposited through, for instance, a plasma-enhanced chemical vapor deposition.
  • the source materials are ionized by an electrical field and the ionized particles are deposited onto a substrate. Since the particles in this deposition process never go to liquid state, the lattice structure is random. Thus the resulting silicon is called amorphous silicon or a-Si in short.
  • a-Si features are formed on a substrate (e.g., a glass substrate) using deposition or other additive fabrication techniques.
  • the a-Si is then crystallized by melting (such as by addition of thermal energy in the form of one or more directed lasers) the a-Si in place, without damaging the substrate or neighboring features.
  • a three-dimensional (3D) metallic printer suitable for fabrication of small features (e.g., ⁇ 65 nm or smaller) can be used to fabricate (e.g., “print”) c-Si features on a substrate by crystallizing (i.e., melting and setting in an ordered state) a-Si on the substrate.
  • An example of a suitable printer may be a 3D metallic printer employing selective laser melting (SLM) microfabrication or two-photon absorption (TPA) microfabrication.
  • SLM selective laser melting
  • TPA two-photon absorption
  • the detector 22 includes a substrate 92 (e.g., a glass substrate), a light imager panel 56 in the form of an active pixel sensing array, and a scintillator 90 formed over the light imager panel 56 opposite the substrate 92 .
  • the substrate 92 can be formed using a range of non-silicon materials including but not limited to, glass, metal, ceramic, carbon, plastic, and so forth. This flexibility with respect to the substrate material allows the detector 22 to be formed at a suitable weight and/or ruggedness for respective applications, including portable applications.
  • the flexibility with respect to the substrate allows the light imager panel (and corresponding detector) to be formed at any clinically desirable single-panel (e.g., 22 cm ⁇ 22 cm, 40 cm ⁇ 40 cm, 43 cm ⁇ 36 cm, and so forth) without paneling or tiling of smaller panels sizes to achieve the overall desired aggregate size).
  • c-Si is deposited on the substrate 92 directly using metallic printing or other techniques to form the desired active pixel circuitry discussed above, such as for a c-Si active pixel light imager panel.
  • a-Si is deposited on the substrate 92 and subsequently converted to c-Si by the application of thermal energy.
  • the a-Si may be deposited so as to closely conform to the desired circuit designs (so as to minimize waste) or may be more generally applied to the substrate surface, with the subsequent laser activity transforming the a-Si to c-Si at the desired circuitry locations, and with the untransformed a-Si being subsequently removed.
  • a laser 102 which may be generated by a suitable 3D metallic printer 100 may be used to heat the deposited a-Si above its melting point along the desired circuit paths. Once cooled, the circuit paths will be composed of c-Si instead of a-Si, and thus the circuitry of the light imager panel 56 will be c-Si in composition, i.e., c-Si circuitry 98 .
  • the scintillator 90 may be formed using a scintillating material (such as CsI or Lu 2 O 3 ) on the light imager panel 56 .
  • the scintillator 90 may be printed, such as using printer 100 or another additive fabrication printer, on the light imager panel 56 directly.
  • using printing techniques can avoid the waste of the raw scintillator material that occurs when using conventional scintillator deposition processes. The avoidance of such losses may be desirable in view of the use of expensive rare earth elements, such as Lu 2 O 3 , used in certain scintillators.
  • the printed scintillator makes it possible to accurately align respective cell of the scintillator onto corresponding pixels of the light imager.
  • the scintillator layer 90 can be printed in a pixelated form to correspond to the pixilation of the light imager panel 56 . That is discrete portions (e.g., “needles”) of the scintillator material 90 spatially correspond to the active pixels of the light imager panel 56 and which, between pixels, are separated from one another to avoid crosstalk between pixels.
  • the core material 108 of the scintillator layer 90 is the actual scintillation material, i.e., the material that generates lower energy (e.g., optical) photons in the presence of X-ray photons).
  • the cladding 110 FIG.
  • the cladding 110 may be a suitable light reflective or light absorptive material.
  • the core dimension of the scintillator material plus the thickness of the clad wall is equal to the dimension of the pixel of the light imager.
  • the thickness of the clad wall can be, for instance, from several hundred nanometers to several micrometers.
  • the scintillator material i.e., core material 108
  • the scintillator material may consist of an aggregation of separate and discrete “needles” of scintillation material which may be separated from one another by air.
  • the present scintillator printing approaches may allow certain benefits with respect to these materials, including being able to print or orient the needles of material so as to avoid, minimize, or reduce lateral light reflection (which might prevent light photons from reaching the light detector elements) and/or to avoid needle orientations being parallel to the X-ray beam (which reduces the number of X-ray photons going through the air separating the needles.
  • scintillator printing approaches may allow optimization of scintillator needle and air gap sizes.
  • the scintillator core material 108 can be printed as curved (i.e., non-linear) “pipes” or structures 116 , as opposed to straight needles, as long as the total internal light reflection condition is met.
  • FIG. 8 is the cross section view of the printed scintillator 90 with curved pipes 116 formed within the core material 108 using printing techniques. Note that the shape and the curvature of the pipes 116 are for the purpose of illustration only and that, in practice, the pipes 116 can be any suitable size, shape, and/or curvature.
  • an optical light reflector typically made, for instance, using a layer of silver
  • a cover typically made, for instance, using carbon graphite, may also be printed above and around the scintillator, such as over the reflector, if present.
  • the light imager panel 56 , scintillator 90 , reflector, and cover may all be printed as a single piece, allowing for an ultra-thin detector package.
  • a rugged panel substrate may also be employed so as to form a thin but rugged detector.
  • a flow diagram showing certain of these steps is provided in FIG. 9 .
  • some or all of these steps may be performed using 3D or metallic printing techniques, as discussed herein.
  • a substrate 92 is initially provided and a-Si 140 is printed (block 160 ) onto the substrate 92 in the patterns and traces of the desired circuitry.
  • the a-Si traces 140 are heated past melting to crystallize (block 162 ) the a-Si, forming c-Si circuitry 142 .
  • these steps may be combined into a single step. In which case, the a-Si material is melted by the 3D printer and the c-Si circuitries are printed directly onto the substrate.
  • a scintillator layer 90 is printed (block 164 ) onto the light imager panel formed from the c-Si circuitry 142 .
  • the scintillator 90 may be fabricated using different techniques, including conventional deposition techniques.
  • the scintillator layer 90 may be printed so as to include core scintillation elements 108 and cladding elements 110 so as define pixilation of the scintillator layer 90 .
  • the scintillator layer 90 may be printed so as to include light pipes 116 , such as curved light pipes, so as to minimize or reduce X-rays interacting with the cladding material, which would effectively reduce the available signal.
  • a reflector 144 is printed (block 166 ) on the scintillator layer 90 .
  • the reflector 144 when present, is reflective of optical light photons in the wavelength range generated by the scintillator 90 and acts to redirect photons generated by the scintillator 90 to the light imager panel.
  • a cover 146 may also be printed (block 168 ). When present, the cover 146 may help seal the scintillator 90 and other sensitive detector components from the ambient environment and/or may provide ruggedized protection. Additionally other detector components, such as an anti-scatter grid, may be printed onto the detector during fabrication.
  • an anti-scatter grid this may take the form of printing a pixelated grid of X-ray attenuating material on or over the scintillator (such as above the reflector but beneath the cover) so as to prevent scattered X-rays from reaching the scintillator.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Toxicology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Light Receiving Elements (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
US14/811,566 2015-07-28 2015-07-28 Radiation detector fabrication Active US9905607B2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
US14/811,566 US9905607B2 (en) 2015-07-28 2015-07-28 Radiation detector fabrication
EP16831237.9A EP3329514B1 (fr) 2015-07-28 2016-07-26 Fabrication de détecteur de rayonnement
CN201680044181.5A CN107924926B (zh) 2015-07-28 2016-07-26 辐射检测器制造
PCT/US2016/044044 WO2017019686A1 (fr) 2015-07-28 2016-07-26 Fabrication de détecteur de rayonnement
JP2018504140A JP7237582B2 (ja) 2015-07-28 2016-07-26 放射線検出器の製造
US15/351,690 US9997557B2 (en) 2015-07-28 2016-11-15 Radiation detector fabrication

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US14/811,566 US9905607B2 (en) 2015-07-28 2015-07-28 Radiation detector fabrication

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US15/351,690 Division US9997557B2 (en) 2015-07-28 2016-11-15 Radiation detector fabrication

Publications (2)

Publication Number Publication Date
US20170033148A1 US20170033148A1 (en) 2017-02-02
US9905607B2 true US9905607B2 (en) 2018-02-27

Family

ID=57882996

Family Applications (2)

Application Number Title Priority Date Filing Date
US14/811,566 Active US9905607B2 (en) 2015-07-28 2015-07-28 Radiation detector fabrication
US15/351,690 Active US9997557B2 (en) 2015-07-28 2016-11-15 Radiation detector fabrication

Family Applications After (1)

Application Number Title Priority Date Filing Date
US15/351,690 Active US9997557B2 (en) 2015-07-28 2016-11-15 Radiation detector fabrication

Country Status (5)

Country Link
US (2) US9905607B2 (fr)
EP (1) EP3329514B1 (fr)
JP (1) JP7237582B2 (fr)
CN (1) CN107924926B (fr)
WO (1) WO2017019686A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4292537A3 (fr) * 2017-07-04 2024-02-28 EOS Imaging Procédé de radiographie d'un organe d'un patient
CN114026464A (zh) * 2019-06-17 2022-02-08 检测技术公司 辐射检测器和用于制造辐射检测器的方法
US11194063B2 (en) * 2019-12-30 2021-12-07 Rayence Co., Ltd. X-ray detector having driver micro integrated chips printed on photodiode layer
KR20210101360A (ko) * 2020-02-07 2021-08-19 삼성디스플레이 주식회사 제조 장치 및 이를 이용하는 제조 방법

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070158572A1 (en) 2004-02-11 2007-07-12 Koninklijke Philips Electronic, N.V. Method, a system for generating a spatial roadmap for an interventional device and a quality control system for guarding the spatial accuracy thereof
US20080063138A1 (en) * 2004-10-29 2008-03-13 Koninklijke Philips Electronics N.V. Gos Ceramic Scintillating Fiber Optics X-Ray Imaging Plate for Use In Medical Df and Rf Imaging and in Ct
US20090141224A1 (en) * 2007-11-29 2009-06-04 Sony Corporation Photosensor and display device
US20100116995A1 (en) 2007-04-25 2010-05-13 Koninklijke Philips Electronics N.V. Radiation detector having a split laminate optical coupling
US20120256095A1 (en) 2011-04-06 2012-10-11 Fujifilm Corporation Radiographic device and manufacturing method thereof
US20130058452A1 (en) 2010-05-24 2013-03-07 Koninklijke Philips Electronics N.V. Ct detector including multi-layer fluorescent tape scintillator with switchable spectral sensitivity
US20130099290A1 (en) 2010-04-16 2013-04-25 Sharp Kabushiki Kaisha Semiconductor device and method for manufacturing same
US20150210079A1 (en) * 2014-01-27 2015-07-30 National Chiao Tung University Cleaning apparatus for inkjet print head
US20160154120A1 (en) * 2013-04-29 2016-06-02 "Stc-Mt" Llc Scintillation Detector and Method for Forming a Structured Scintillator

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2624318B2 (ja) * 1988-11-25 1997-06-25 三菱電機株式会社 イメージセンサおよびその製造方法
JP3339285B2 (ja) * 1996-02-02 2002-10-28 松下電器産業株式会社 Ｘ線撮像装置
JPH09325185A (ja) * 1996-06-03 1997-12-16 Toshiba Fa Syst Eng Kk 放射線検出器とその製造方法と透視検査装置とｃｔスキャナ
JP3618973B2 (ja) * 1997-10-01 2005-02-09 キヤノン株式会社 半導体装置及び光検出装置の製造方法
JP4255527B2 (ja) * 1997-10-20 2009-04-15 株式会社半導体エネルギー研究所 半導体装置
JPH11307756A (ja) * 1998-02-20 1999-11-05 Canon Inc 光電変換装置および放射線読取装置
WO2000019500A1 (fr) * 1998-09-25 2000-04-06 Asahi Kasei Kabushiki Kaisha Substrat a semi-conducteur et son procede de fabrication, dispositif a semi-conducteur comprenant un tel substrat et son procede de fabrication
JP3865106B2 (ja) 2000-03-31 2007-01-10 セイコーエプソン株式会社 シリコン膜パターンの形成方法
US7030551B2 (en) 2000-08-10 2006-04-18 Semiconductor Energy Laboratory Co., Ltd. Area sensor and display apparatus provided with an area sensor
JP4449749B2 (ja) * 2005-01-05 2010-04-14 コニカミノルタホールディングス株式会社 放射線検出装置およびその製造方法
FR2891401B1 (fr) * 2005-09-23 2007-10-26 Thales Sa Realisation d'un detecteur de rayonnement.
JP5022805B2 (ja) * 2007-07-26 2012-09-12 東芝電子管デバイス株式会社 放射線検出器
CA2701412C (fr) 2007-10-01 2017-06-20 Kovio, Inc. Structures et dispositifs a film mince et a profil modifie
JP4434253B2 (ja) * 2007-10-16 2010-03-17 ソニー株式会社 クロック信号生成回路、表示パネルモジュール、撮像デバイス及び電子機器
KR101000941B1 (ko) 2008-10-27 2010-12-13 한국전자통신연구원 게르마늄 광 검출기 및 그 형성방법
JP5317675B2 (ja) * 2008-12-22 2013-10-16 株式会社東芝 放射線検出器およびその製造方法
JP2010258012A (ja) 2009-04-21 2010-11-11 Seiko Epson Corp シリコン膜製造装置及び電子デバイス製造装置
JP2011133395A (ja) 2009-12-25 2011-07-07 Ge Medical Systems Global Technology Co Llc 放射線検出器および放射線撮影装置
US8390089B2 (en) * 2010-07-27 2013-03-05 Taiwan Semiconductor Manufacturing Company, Ltd. Image sensor with deep trench isolation structure
JP2012052965A (ja) * 2010-09-02 2012-03-15 Toshiba Corp 放射線検出器及びその製造方法
JP2012078137A (ja) * 2010-09-30 2012-04-19 Toshiba Corp 放射線検出器およびその製造方法
JP5581235B2 (ja) 2011-01-17 2014-08-27 浜松ホトニクス株式会社 固体撮像装置および固体撮像装置の駆動方法
US9993982B2 (en) * 2011-07-13 2018-06-12 Nuvotronics, Inc. Methods of fabricating electronic and mechanical structures
JP2014044200A (ja) 2012-07-31 2014-03-13 Canon Inc 放射線検出装置、その製造方法及び放射線検出システム
JP5581436B2 (ja) 2013-12-19 2014-08-27 株式会社半導体エネルギー研究所 Ｘ線カメラ

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070158572A1 (en) 2004-02-11 2007-07-12 Koninklijke Philips Electronic, N.V. Method, a system for generating a spatial roadmap for an interventional device and a quality control system for guarding the spatial accuracy thereof
US20080063138A1 (en) * 2004-10-29 2008-03-13 Koninklijke Philips Electronics N.V. Gos Ceramic Scintillating Fiber Optics X-Ray Imaging Plate for Use In Medical Df and Rf Imaging and in Ct
US20100116995A1 (en) 2007-04-25 2010-05-13 Koninklijke Philips Electronics N.V. Radiation detector having a split laminate optical coupling
US20090141224A1 (en) * 2007-11-29 2009-06-04 Sony Corporation Photosensor and display device
US20130099290A1 (en) 2010-04-16 2013-04-25 Sharp Kabushiki Kaisha Semiconductor device and method for manufacturing same
US20130058452A1 (en) 2010-05-24 2013-03-07 Koninklijke Philips Electronics N.V. Ct detector including multi-layer fluorescent tape scintillator with switchable spectral sensitivity
US20120256095A1 (en) 2011-04-06 2012-10-11 Fujifilm Corporation Radiographic device and manufacturing method thereof
US20160154120A1 (en) * 2013-04-29 2016-06-02 "Stc-Mt" Llc Scintillation Detector and Method for Forming a Structured Scintillator
US20150210079A1 (en) * 2014-01-27 2015-07-30 National Chiao Tung University Cleaning apparatus for inkjet print head

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
International Search Report and Written Opinion for International Application No. PCT/US2016/044044 dated Oct. 31, 2016. 15 pages.

Also Published As

Publication number Publication date
JP2018530906A (ja) 2018-10-18
CN107924926B (zh) 2022-05-10
EP3329514A1 (fr) 2018-06-06
JP7237582B2 (ja) 2023-03-13
US20170062510A1 (en) 2017-03-02
US9997557B2 (en) 2018-06-12
US20170033148A1 (en) 2017-02-02
EP3329514B1 (fr) 2023-12-20
CN107924926A (zh) 2018-04-17
WO2017019686A1 (fr) 2017-02-02
EP3329514A4 (fr) 2019-10-23

Similar Documents

Publication Publication Date Title
US9997557B2 (en) Radiation detector fabrication
US10032813B2 (en) Active pixel radiation detector array and use thereof
JP5043374B2 (ja) 変換装置、放射線検出装置、及び放射線検出システム
US10283557B2 (en) Radiation detector assembly
JP2016524152A (ja) Ｔｆｔフラットパネルにｃｍｏｓセンサを埋設したｘ線イメージャ
JP2005114731A (ja) 後方照射を有する半導体放射線撮像装置
JP6670313B2 (ja) Ｘ線検出器アセンブリ
US9620256B2 (en) X-ray imaging device including anti-scatter grid
WO2013140444A1 (fr) Scintillateur, procédé de fabrication de celui-ci, détecteur de radiation, et procédé de fabrication de celui-ci
JP2015025665A (ja) 放射線撮像装置および放射線撮像表示システム
US10686003B2 (en) Radiation detector assembly
Scheuermann et al. Solid-state flat panel imager with avalanche amorphous selenium
US20150164447A1 (en) Method and system for integrated medical transport backboard digital x-ray imaging detector
US20120223238A1 (en) X-Ray Detector And Medical X-Ray Device
JP2007535125A (ja) マルチエネルギーｘ線撮像装置
JP4449749B2 (ja) 放射線検出装置およびその製造方法
WO2016021416A1 (fr) Élément fonctionnel et dispositif électronique
US20110012020A1 (en) X-ray detector and method for fabricating the same
US11137504B2 (en) Tiled radiation detector
JP2007103846A (ja) 放射線検出器
JP2016072340A (ja) 放射線検出器用アレイ基板、および放射線検出器
WO2013180078A1 (fr) Équipement, système, procédé et programme d'imagerie radiographique
KR101864963B1 (ko) 방사선 디텍터 및 그 제조 방법
JP2007103847A (ja) 放射線検出器
JP2016173267A (ja) 放射線検出装置、放射線検出システム並びにシンチレータ層の形成方法及び放射線検出装置の製造方法

Legal Events

Date Code Title Description
AS Assignment

Owner name: GENERAL ELECTRIC COMPANY, NEW YORK

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:LIU, JAMES ZHENGSHE;REEL/FRAME:036199/0565

Effective date: 20150722

STCF Information on status: patent grant

Free format text: PATENTED CASE

MAFP Maintenance fee payment

Free format text: PAYMENT OF MAINTENANCE FEE, 4TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1551); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Year of fee payment: 4