US6218851B1 - Method and apparatus for testing a printed circuit - Google Patents

Method and apparatus for testing a printed circuit Download PDF

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Publication number
US6218851B1
US6218851B1 US09/043,565 US4356598A US6218851B1 US 6218851 B1 US6218851 B1 US 6218851B1 US 4356598 A US4356598 A US 4356598A US 6218851 B1 US6218851 B1 US 6218851B1
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US
United States
Prior art keywords
printed circuit
testing
needle bearing
bearing boards
test points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
US09/043,565
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English (en)
Inventor
Jozef Vodopivec
Cesare Fumo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
New System SRL
Original Assignee
New System SRL
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Filing date
Publication date
Application filed by New System SRL filed Critical New System SRL
Assigned to NEW SYSTEM S.R.L. reassignment NEW SYSTEM S.R.L. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: FUMO, CESARE, VODOPIVEC, JOZEF
Application granted granted Critical
Publication of US6218851B1 publication Critical patent/US6218851B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)

Definitions

  • This invention has as object a machine for the opposite control of printed circuits.
  • the invention finds particular even if not exclusive application in the sector of the control of the printed circuit cards.
  • These machines generally consist of a board or bed bearing a plurality of electrically conductive needles, on which must be disposed the card with the printed circuit and by activating properly the electric conductivity among the different needles and by making the respective measurings it is possible to check whether the printed circuit has defects.
  • EP,A,0 164 722 (Black) Dec. 18, 1985 discloses: an automatic test system for testing printed circuit boards (cards) in which:
  • a “bed of nails” (bed or plate or board of needles), in which each nail or needle is fixedly placed in said bed or plate or board.
  • the “bed of nails” has the nail position absolutely fixed and corresponding to the specific pattern of the printed card to be tested.
  • Drawback of this solution is the requirement of as many “beds of nails” as the different printed circuit cards to be tested.
  • the programming being dependant on the pattern of the printed card to be tested.
  • EP,A,0 164 722 discloses its claimed solution, in which there is a magazine for temporarily storing a plurality of probes (nails or needles) and a base receiver member positioned adjacent to the test head (bed or plate) on one side thereof and in a position to contact the base of each probe.
  • the test head (bed or plate) is adapted to receive the probes and position the probes in a pattern matching test points on the printed circuit board.
  • Means are provided for supporting the test head adjacent to the magazine and in a position to receive probes (nails or needles) from the magazine.
  • Means are also provided for transferring selected ones of the probes from the magazine to the test head.
  • the probes are for this purpose, movable axially from inside the said test head to the outside or vice versa and some of these further axially moved in order to allow contact with the printed circuit of the card to be tested.
  • EP,A,0 468 153 (ATG ELECTRONIC) Jan. 29, 1992, discloses a system in which the respective contact needles are not fixed in position on the respective needle bearing board, but are movable both axially and from their position along the coordinate axis.
  • EP-A-0 547 251 discloses a method for testing a micro circuit, where a “wafer holder” and a “test head . . . incorporating a matrix of probes” is provided and wherein said wafer holder is movable on its (X-Y) plane whereas the test head is movable along the orthogonal (Z) direction.
  • This solution is able to test printed circuit cards because it is conceived for testing on one side only.
  • the purpose of the present invention is that to obviate the abovementioned drawbacks, and in particular to allow the making of a universal machine able to control the printed circuits, that is having a system of conductive detection needles that can be adapted to any type of circuit.
  • each needle bearing board supports a plurality of conductive needles said needles being axially movable only in the respective needle bearing board;
  • At least one of said needle bearing boards is movable on its plane, in order that the positioning of the needle concerned to put in contact with the point concerned of the printed circuit of the card to be tested, is obtained.
  • the machine has also the characteristic that the detection needles are axially movable.
  • the needles are made axially movable by electromagnetic means.
  • FIG. 1 is a perspective schematic view of a detection board (bed);
  • FIG. 2 is a cross-sectional schematic view of an axially movable detection needle.
  • FIG. 3 is a cross-sectional view of the preferred embodiment with two opposite detection boards movable one respect to the other and with the card to -be controlled placed between them.
  • the two detection testing boards are indicated with 1 and 1 ′.
  • Each board has a plurality of needles axially movable 10 by electromagnet 11 .
  • Each needle is electrically connected to a known art electric parameters control system 12 .
  • the opposite boards as mentioned are movable one respect to the other for the operative positioning.
  • the card positioned between these is indicated with 2 .
  • the system provides a control by a net list “net-list” with relative positions of single points.
  • connection test is carried out from point to point, so that for testing the connections of a net made of n points, are necessary n ⁇ 1 tests between pairs of points selected in such a way to cover all the connections.
  • the test on short circuits among different nets is made by selecting a point out of each pair of nets.
  • This number can be reduced by selecting only alongside nets, that is the ones close to each other in a pre-determined distance.
  • the positions to be tested are subdivided in sectors corresponding to the number of needles in the movable board (bed), so that the point to be tested is reachable with the position and with one of the testing needles.
  • the machine is made up of a frame on which are fixed two opposite boards and independently, movable respect to the two orthogonal axes.
  • the printed circuit is placed on a bearing frame that transports it between the two boards.
  • Each board is independently controlled and operated, so that the maximum stroke necessary is defined by the distance among the sounds.
  • the electromagnet operates the sound on the surface to be contacted and thus by a pair of sounds simultaneously operated is controlled the functionality of the circuit among the two desired points, the respective continuity and eventual short circuits.
  • the process proceeds by points in repetitive way as desired.
  • the card bearing may be moved respect to one or the other board.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Selective Calling Equipment (AREA)
  • Time-Division Multiplex Systems (AREA)
  • Exchange Systems With Centralized Control (AREA)
  • Control Of Electric Motors In General (AREA)
  • Preparation Of Compounds By Using Micro-Organisms (AREA)
  • Detection And Correction Of Errors (AREA)
  • Dc-Dc Converters (AREA)
  • Facsimiles In General (AREA)
  • Accessory Devices And Overall Control Thereof (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Telephonic Communication Services (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Video Image Reproduction Devices For Color Tv Systems (AREA)
  • Sewing Machines And Sewing (AREA)
  • Preliminary Treatment Of Fibers (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Knitting Machines (AREA)
US09/043,565 1995-09-22 1996-05-03 Method and apparatus for testing a printed circuit Expired - Fee Related US6218851B1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
IT95UD000181A IT1282827B1 (it) 1995-09-22 1995-09-22 Macchina per il controllo contrapposto dei circuiti stampati
ITUD95A0181 1995-09-22
PCT/IT1996/000090 WO1997011377A1 (en) 1995-09-22 1996-05-03 Machine for the opposite control of printed circuits

Publications (1)

Publication Number Publication Date
US6218851B1 true US6218851B1 (en) 2001-04-17

Family

ID=11421917

Family Applications (1)

Application Number Title Priority Date Filing Date
US09/043,565 Expired - Fee Related US6218851B1 (en) 1995-09-22 1996-05-03 Method and apparatus for testing a printed circuit

Country Status (25)

Country Link
US (1) US6218851B1 (no)
EP (1) EP0852014B1 (no)
JP (1) JPH11512530A (no)
KR (1) KR100407068B1 (no)
CN (1) CN1100268C (no)
AT (1) ATE233900T1 (no)
AU (1) AU710084B2 (no)
BR (1) BR9610589A (no)
CA (1) CA2231865A1 (no)
CZ (1) CZ294961B6 (no)
DE (1) DE69626527T2 (no)
DK (1) DK0852014T3 (no)
ES (1) ES2194098T3 (no)
HU (1) HUP9900003A3 (no)
IT (1) IT1282827B1 (no)
MX (1) MX9802287A (no)
NO (1) NO316412B1 (no)
NZ (1) NZ306552A (no)
PL (1) PL190321B1 (no)
PT (1) PT852014E (no)
RO (1) RO119658B1 (no)
RU (1) RU2182748C2 (no)
SI (1) SI9620113B (no)
TR (1) TR199800516T1 (no)
WO (1) WO1997011377A1 (no)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10219618A1 (de) * 2002-05-02 2003-11-27 Scorpion Technologies Ag Vorrichtung zum Testen von Leiterplatten
US20110140709A1 (en) * 2009-12-15 2011-06-16 International Business Machines Corporation Locating short circuits in printed circuit boards
US20110273203A1 (en) * 2009-01-14 2011-11-10 Dtg International Gmbh Method for the testing of circuit boards

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100835182B1 (ko) * 2007-02-12 2008-06-04 주식회사 백승 인쇄회로기판 검사용 지그
DE102007025458A1 (de) * 2007-05-30 2008-12-04 Siemens Ag Codierung, insbesondere für eine Einschubanordnung eines elektrischen Schaltfeldes
DE102016114144A1 (de) * 2016-08-01 2018-02-01 Endress+Hauser Flowtec Ag Testsystem zur Prüfung von elektrischen Verbindungen von Bauteilen mit einer Leiterplatte

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4841241A (en) * 1986-08-07 1989-06-20 Siemens Aktiengesellschaft Testing device for both-sided contacting of component-equipped printed circuit boards
US5068600A (en) * 1986-08-07 1991-11-26 Siemens Aktiengesellschaft Testing device for both-sided two-stage contacting of equipped printed circuit boards
US5818246A (en) * 1996-05-07 1998-10-06 Zhong; George Guozhen Automatic multi-probe PWB tester
US6124722A (en) 1995-12-22 2000-09-26 New System S.R.L. Universal apparatus for testing printed circuit boards utilizing independently movable needle boards

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4774462A (en) * 1984-06-11 1988-09-27 Black Thomas J Automatic test system
GB8700754D0 (en) * 1987-01-14 1987-02-18 Int Computers Ltd Test apparatus for printed circuit boards
EP0468153B1 (de) * 1990-07-25 1995-10-11 atg test systems GmbH Kontaktierungsvorrichtung für Prüfzwecke

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4841241A (en) * 1986-08-07 1989-06-20 Siemens Aktiengesellschaft Testing device for both-sided contacting of component-equipped printed circuit boards
US5068600A (en) * 1986-08-07 1991-11-26 Siemens Aktiengesellschaft Testing device for both-sided two-stage contacting of equipped printed circuit boards
US6124722A (en) 1995-12-22 2000-09-26 New System S.R.L. Universal apparatus for testing printed circuit boards utilizing independently movable needle boards
US5818246A (en) * 1996-05-07 1998-10-06 Zhong; George Guozhen Automatic multi-probe PWB tester

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10219618A1 (de) * 2002-05-02 2003-11-27 Scorpion Technologies Ag Vorrichtung zum Testen von Leiterplatten
US20050237072A1 (en) * 2002-05-02 2005-10-27 Gunther Roska Device for testing printed circuit boards
US7081768B2 (en) 2002-05-02 2006-07-25 Scorpion Technologies Ag Device for testing printed circuit boards
US20110273203A1 (en) * 2009-01-14 2011-11-10 Dtg International Gmbh Method for the testing of circuit boards
US20110140709A1 (en) * 2009-12-15 2011-06-16 International Business Machines Corporation Locating short circuits in printed circuit boards
US8269505B2 (en) * 2009-12-15 2012-09-18 International Business Machines Corporation Locating short circuits in printed circuit boards

Also Published As

Publication number Publication date
BR9610589A (pt) 1999-07-06
IT1282827B1 (it) 1998-03-31
ITUD950181A0 (no) 1995-09-22
DK0852014T3 (da) 2003-06-23
WO1997011377A1 (en) 1997-03-27
ATE233900T1 (de) 2003-03-15
EP0852014A1 (en) 1998-07-08
HUP9900003A3 (en) 1999-11-29
RO119658B1 (ro) 2005-01-28
NO316412B1 (no) 2004-01-19
MX9802287A (es) 1998-08-30
JPH11512530A (ja) 1999-10-26
KR19990063615A (ko) 1999-07-26
DE69626527D1 (de) 2003-04-10
ITUD950181A1 (it) 1997-03-22
NO981179D0 (no) 1998-03-17
CZ74598A3 (cs) 1998-07-15
AU5513496A (en) 1997-04-09
EP0852014B1 (en) 2003-03-05
ES2194098T3 (es) 2003-11-16
NZ306552A (en) 2000-01-28
SI9620113B (en) 2005-08-31
HUP9900003A2 (hu) 1999-04-28
NO981179L (no) 1998-04-23
CN1100268C (zh) 2003-01-29
SI9620113A (sl) 1998-08-31
KR100407068B1 (ko) 2004-01-24
CA2231865A1 (en) 1997-03-27
CZ294961B6 (cs) 2005-04-13
PL325827A1 (en) 1998-08-03
DE69626527T2 (de) 2003-12-24
PT852014E (pt) 2003-07-31
PL190321B1 (pl) 2005-11-30
AU710084B2 (en) 1999-09-16
RU2182748C2 (ru) 2002-05-20
TR199800516T1 (xx) 1998-05-21
CN1196794A (zh) 1998-10-21

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AS Assignment

Owner name: NEW SYSTEM S.R.L., ITALY

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:VODOPIVEC, JOZEF;FUMO, CESARE;REEL/FRAME:009485/0430

Effective date: 19980427

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Free format text: PAT HOLDER CLAIMS SMALL ENTITY STATUS, ENTITY STATUS SET TO SMALL (ORIGINAL EVENT CODE: LTOS); ENTITY STATUS OF PATENT OWNER: SMALL ENTITY

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Year of fee payment: 4

REMI Maintenance fee reminder mailed
LAPS Lapse for failure to pay maintenance fees
STCH Information on status: patent discontinuation

Free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362

FP Lapsed due to failure to pay maintenance fee

Effective date: 20090417