US20090283674A1 - Efficient Atmospheric Pressure Interface for Mass Spectrometers and Method - Google Patents

Efficient Atmospheric Pressure Interface for Mass Spectrometers and Method Download PDF

Info

Publication number
US20090283674A1
US20090283674A1 US11/833,209 US83320907A US2009283674A1 US 20090283674 A1 US20090283674 A1 US 20090283674A1 US 83320907 A US83320907 A US 83320907A US 2009283674 A1 US2009283674 A1 US 2009283674A1
Authority
US
United States
Prior art keywords
transfer tube
ion transfer
interface
sidewall
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US11/833,209
Other languages
English (en)
Inventor
Reinhold Pesch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Fisher Scientific Bremen GmbH
Original Assignee
Thermo Fisher Scientific Bremen GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thermo Fisher Scientific Bremen GmbH filed Critical Thermo Fisher Scientific Bremen GmbH
Priority to US11/833,209 priority Critical patent/US20090283674A1/en
Assigned to THERMO FISHER SCIENTIFIC (BREMEN) GMBH reassignment THERMO FISHER SCIENTIFIC (BREMEN) GMBH ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: PESCH, REINHOLD
Priority to DE112007002686.3T priority patent/DE112007002686B4/de
Priority to US12/513,954 priority patent/US8148680B2/en
Priority to CA2668829A priority patent/CA2668829C/en
Priority to CA2668763A priority patent/CA2668763C/en
Priority to JP2009535623A priority patent/JP2010508643A/ja
Priority to CN201210111145XA priority patent/CN102768936A/zh
Priority to PCT/EP2007/009642 priority patent/WO2008061628A2/en
Priority to US12/513,939 priority patent/US7982183B2/en
Priority to DE112007002694T priority patent/DE112007002694T5/de
Priority to US12/513,944 priority patent/US8148679B2/en
Priority to PCT/EP2007/009640 priority patent/WO2008055667A2/en
Priority to DE112007002661.8T priority patent/DE112007002661B4/de
Priority to PCT/EP2007/009641 priority patent/WO2008055668A2/en
Priority to CA2668762A priority patent/CA2668762C/en
Priority to GB0909035.8A priority patent/GB2456720B/en
Priority to CN2007800490189A priority patent/CN101606220B/zh
Priority to JP2009535622A priority patent/JP5197618B2/ja
Priority to GB0909032A priority patent/GB2456283B/en
Priority to CN2007800490085A priority patent/CN101606219B/zh
Priority to JP2009535621A priority patent/JP5011393B2/ja
Priority to GB0909034.1A priority patent/GB2456284B/en
Publication of US20090283674A1 publication Critical patent/US20090283674A1/en
Priority to JP2012043734A priority patent/JP5575165B2/ja
Priority to US13/413,568 priority patent/US8642949B2/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
    • H01J3/14—Arrangements for focusing or reflecting ray or beam

Definitions

  • This application is directed to ion inlet sections of mass spectrometers, ion transfer tube assemblies, ion transfer tubes, and methods of transporting ions from an atmospheric pressure ion source into a vacuum chamber of a mass spectrometer.
  • U.S. Pat. No. 4,977,320 to Chowdhury et al. and others have relied upon the strong flow of gas that accompanies the sample spray through the capillary tube from an atmospheric pressure region into the vacuum region to help focus the droplets toward a center of the capillary tube.
  • U.S. Pat. No. 5,157,260 to Mylchreest et al. teaches use of tube lenses at an exit end of the capillary tube for focusing ions.
  • Others have utilized electrodes at various locations to focus and/or urge ions toward an orifice of a skimmer or other ion optical element to cause ions to enter lower pressure regions of mass spectrometers.
  • an interface for a mass spectrometer in accordance with embodiments of the present invention includes an ion transfer tube having an inlet end opening to a high pressure chamber and an outlet end opening to a low pressure chamber.
  • the high and low pressure chambers may be provided by any regions that have respective higher and lower pressures relative to each other.
  • the high pressure chamber may be an ion source chamber and the low pressure chamber may be a first vacuum chamber.
  • the ion transfer tube has at least one sidewall surrounding an interior region and extending along a central axis between the inlet end and the outlet end.
  • the ion transfer tube has a plurality of passageways formed in the sidewall. The passageways permit the flow of gas from the interior region to a reduced-pressure region exterior to the sidewall.
  • embodiments of the present invention include an ion transfer tube for receiving and transporting ions from a source in a high pressure region to ion optics in a reduced pressure region of a mass spectrometer.
  • the ion transfer tube includes an inlet end, an outlet end, and at least one sidewall surrounding an interior region and extending along a central axis between the inlet end and the outlet end.
  • the ion transfer tube may also include an integral vacuum chamber tube at least partially surrounding and connected to the ion transfer tube.
  • the integral vacuum chamber tube isolates a volume immediately surrounding at least a portion of the ion transfer tube at a reduced pressure relative to the interior region.
  • the sidewall has a structure that provides at least one passageway formed in the sidewall.
  • the at least one passageway permits a flow of gas from the interior region to the volume exterior to the sidewall.
  • the structure and passageway are inside the integral vacuum chamber tube.
  • the structure of the sidewall may include a plurality of passageways.
  • embodiments of the present invention include a method of transporting ions from an ion source region to a first vacuum chamber.
  • the method includes admitting from the ion source region, a mixture of ions and gas to an inlet end of an ion transfer tube.
  • the method also includes removing a portion of the gas through a plurality of passageways located intermediate the inlet end and an outlet end of the ion transfer tube.
  • the method further includes causing the ions and the remaining gas to exit the ion transfer tube through the outlet end into the first vacuum chamber.
  • the method may also include sensing a reduction in latent heat in the ion transfer tube due to at least one of removal of the portion of the background gas and an associated evaporation, and increasing an amount of heat applied to the ion transfer tube through a heater under software or firmware control.
  • the embodiments of the present invention have the advantage of reduced flow of gas through an exit end of the ion transfer tube.
  • the reduced flow through the exit end of the ion transfer tube decreases the energy with which the ion bearing gas expands as it leaves the ion transfer tube.
  • the ions have a greater chance of traveling on a straight line through an aperture of a skimmer immediately downstream.
  • reduction of the flow in at least a portion of the ion transfer tube may have the effect of increasing the amount of laminar flow in that portion of the ion transfer tube. Laminar flow is more stable so that the ions can remain focused and travel in a straight line for passage through the relatively small aperture of a skimmer.
  • FIG. 1 is a diagrammatic view of an example mass spectrometer with which the embodiments of the present invention may be incorporated.
  • FIG. 2 is a diagrammatic view of an inlet assembly in accordance with an embodiment of the present invention.
  • FIG. 3 is a diagrammatic view of an inlet assembly in accordance with another embodiment of the present invention.
  • FIG. 4 is a diagrammatic partial perspective view of an ion transfer tube in accordance with the embodiment of FIG. 3 .
  • the ions are energetically moved throughout a volume of the flowing gas. It is postulated that because of this energetic and turbulent flow and the resultant mixing effect on the ions, the ions are not focused to a desirable degree and it is difficult to separate the ions from the neutral gas under these flow conditions. Thus, it is difficult to separate out a majority of the ions and move them downstream while the neutral gas is pumped away. Rather, many of the ions are carried away with the neutral gas and are lost.
  • the hypothesis associated with embodiments of the present invention is that to the extent that the flow can be caused to be laminar along a greater portion of an ion transfer tube, the ions can be kept focused to a greater degree.
  • One way to provide the desired laminar flow is to remove the neutral gas through a sidewall of the ion transfer tube so that the flow in an axial direction and flow out the exit end of the ion transfer tube is reduced. Also, by pumping the neutral gas out of the sidewalls to a moderate degree, the boundary layer of the gas flowing axially inside the ion transfer tube becomes thin, the velocity distribution becomes fuller, and the flow becomes more stable.
  • One way to increase the throughput of ions or transport efficiency in atmospheric pressure ionization interfaces is to increase the conductance by one or more of increasing an inner diameter of the ion transfer tube and decreasing a length of the ion transfer tube.
  • the inner diameter of the ion transfer tube can be made relatively large and at the same time flow out of the exit end of the ion transfer tube can be reduced to improve the flow characteristic for keeping ions focused toward a center of the gas stream.
  • the neutral gas can be more readily separated from the ions, and the ions can be more consistently directed through the orifice of a skimmer into the ion optics and analyzer sections downstream. The result is improved transport efficiency and increased instrument sensitivity.
  • FIG. 1 shows an example mass spectrometer 12 having an ion source 15 in a source chamber 16 and an interface 18 between the high pressure source chamber 16 and a lower pressure first vacuum chamber 19 .
  • the ion source 15 may be, without limitation, an electrospray ionization source, a chemical ionization source, another liquid sample based atmospheric pressure ionization source, or any other source.
  • the interface 18 may include an ion transfer tube portion 21 and an ion guide portion 24 with separate or shared pumping stages. Ions from the source 15 are introduced into the transfer tube portion 21 and move along an ion path generally on a central axis 25 through one or more additional sections to a detector 27 .
  • the sections may include one or more of each of ion guides, filters, collision cells, and analyzers, as indicated by q 0 , Q 1 , q 2 , and Q 3 .
  • the devices in each of these sections may be operated by an electronic controller 30 under software and/or firmware control to perform the needed functions for analysis of sample ions in the mass spectrometer 12 .
  • a skimmer lens 33 separates the ion transfer tube portion 21 from the ion guide portion 24 of the interface 18 .
  • an ion transfer tube 36 may be supported near its entrance end 39 on a chamber wall 42 between the source chamber 16 and the first vacuum chamber 19 . While FIG. 2 shows the ion transfer tube 36 with an inlet or entrance end opening in direct communication with the ion source 15 , it is to be understood that one or more reduced pressure chambers may be placed intermediate the ion source 15 and the ion transfer tube 36 . The one or more reduced pressure chambers may or may not have one or more additional ion transfer tubes therein.
  • sidewall 45 of the ion transfer tube extends axially from the entrance end 39 to an exit end 48 and is surrounded by a heater 51 .
  • the heater 51 may be placed in direct contact or otherwise in any kind of thermal contact with the ion transfer tube 36 .
  • the skimmer lens 33 may have an aperture positioned proximate to the outlet or exit end 48 of the ion transfer tube 36 .
  • a tube lens or other focusing lens 52 may be disposed between the exit end 48 of the ion transfer tube 36 and the skimmer lens 33 .
  • An ion guide 54 may be located in a second vacuum chamber 57 downstream from the first vacuum chamber 19 .
  • vacuum chamber may include any reduced pressure chamber or region that has a pressure that is lower than atmospheric pressure.
  • High pressure and low pressure as used herein denote relative pressures in respective regions and are not to be limited to pressures relative to atmospheric or any other threshold pressure.
  • Each of the first and second vacuum chambers 19 , 57 may be pumped by the same or separate vacuum pumps as indicated by arrows 58 , 59 .
  • an interface 62 in accordance with another embodiment of the invention may include a third vacuum chamber 65 formed integrally as a unit with an ion transfer tube 68 , as shown in FIG. 3 .
  • Walls create an enclosure that forms the third vacuum chamber 65 and at least partially surrounds an inner tube 71 that may be structurally analogous to the ion transfer tube 36 described with regard to the embodiment of FIG. 2 above.
  • a separate pump or a pump in common with pump(s) of one or more of the first and second vacuum chambers 19 , 57 may be operably connected with the third vacuum chamber 65 in order to pump gas from within an interior region 74 inside the ion transfer tube 68 out through a sidewall 77 of the ion transfer tube 68 .
  • the sidewall 77 of the ion transfer tube 68 extends axially from an entrance end 78 to an exit end 79 . Also, the sidewall 77 is surrounded by a heater 51 .
  • the heater 51 may be placed in direct contact or otherwise in any kind of thermal contact with the ion transfer tube, as described with regard to the embodiment of FIG. 2 .
  • FIG. 4 is a diagrammatic partial perspective view of the ion transfer tube 68 of FIG. 3 .
  • the inner tube 71 and the interior region 74 may be substantially the same as the ion transfer tube 36 and an interior region thereof, in accordance with the embodiment of FIG. 2 .
  • the sidewall 77 has one or more passageways 80 for fluid communication between the interior region 74 and an exterior region within the enclosure created by an enclosure sidewall 83 and enclosure end walls 86 , 87 , which walls form the third vacuum chamber 65 .
  • neutral gas is pumped from within the interior region 74 and out through the passageways 80 of the sidewall 77 into the third vacuum chamber 65 where it is pumped away.
  • the third vacuum chamber 65 encompasses a reduced-pressure region that is located within the enclosure and extends around the sidewall 77 .
  • the enclosure is disposed within the first vacuum chamber 19 and communicates with a pump 91 that may be separate or in common with other pumps in the system.
  • the ion transfer tube 36 of the embodiment of FIG. 2 may have similar structure in which the sidewall 45 has passageways 80 , and the neutral gas is pumped away by a pump in fluid communication with the first vacuum chamber 19 .
  • a sensor 93 may be connected to the ion transfer tube 68 and to the controller 30 for sending a signal indicating a temperature of the sidewall 77 or some part of the ion transfer tube 68 back to the controller 30 . It is to be understood that a plurality of sensors may be placed at different positions to obtain a temperature profile.
  • the senor(s) 93 may thus be connected to the ion transfer tube 68 for detecting a reduction in heat as gas is pumped through the plurality of passageways 80 in the sidewall 77 of the ion transfer tube 68 .
  • the sensor(s) 93 may also be connected to the ion transfer tube 36 and controller 51 in the embodiment of FIG. 2 for heat reduction detection and control.
  • the third vacuum chamber 65 may be utilized to introduce a flow of gas through the sidewall 71 and into an interior region 74 of the ion transfer tube 68 instead of removing the background gas, as described above. This may be achieved by adjusting the pressure in the third chamber 65 to be between atmospheric pressure and the pressure in the interior region 74 .
  • By introducing a flow of gas through passageways 80 into the interior region 74 more turbulent flow conditions may be created in which sample droplets are disrupted. The more turbulent flow conditions may thus cause the sample droplets to be broken up into smaller droplets. This disruption of the droplets is an external force disruption, as opposed to a coulomb explosion type disruption which also breaks up the droplets.
  • both removal and addition of gas may be applied in one ion transfer tube.
  • the chamber 65 could be divided into plural regions with respective removal and addition of gas in a series of the plural regions.
  • an alternating series of external force and coulomb explosion disruptions can be implemented to break up the droplets of the sample.
  • the sidewall 45 of the ion transfer tube 36 and the sidewall 77 that forms at least a part of the inner tube 71 in the embodiments of FIGS. 1-4 may be formed from a material that includes one or more of a metal frit, a metal sponge, a permeable ceramic, and a permeable polymer.
  • the passageways 80 may be defined by the pores or interstitial spaces in the material.
  • the pores or interstices in the material of the sidewalls may be small and may form a generally continuous permeable element without discrete apertures.
  • the passageways may take the form of discrete apertures or perforations formed in the sidewalls 45 , 77 of ion transfer tubes 36 , 68 .
  • the passageways may be configured by through openings that have one or more of round, rectilinear, elongate, uniform, and non-uniform configurations.
  • Embodiments of the present invention include a method of transporting ions from a source region into a vacuum region, a method of separating and removing a background gas from a mixture of the background gas and sample ions, and a method of desolvating a sample in an interface.
  • One or more of the methods may include heating the ion transfer tube to promote evaporation of residual liquid solvent admitted into the ion transfer tube.
  • the methods may include the step of removing at least a portion of the gas by providing a reduced-pressure region exterior to an inner tube of the ion transfer tube.
  • the methods may also include sensing a reduction in latent heat in the ion transfer tube due to at least one of removal of the portion of the background gas and an associated evaporation.
  • a subsequent step to sensing may be the step of increasing an amount of heat applied to the ion transfer tube through a heater under software or firmware control.
  • the methods may include reducing a pressure in at least a portion of the ion transfer tube interior region such that desolvation is increased.
  • the methods may include reducing the energy of a free jet expansion of the gas leaving the outlet or exit end of the ion transfer tube.
  • the methods may also include reducing a velocity of a second downstream portion of the background gas that moves axially out an outlet or exit end of the ion transfer tube relative to a velocity of a first upstream portion of the background gas entering the ion transfer tube.
  • the method may also include increasing a proportion of laminar flow along a length of the ion transfer tube.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Sampling And Sample Adjustment (AREA)
US11/833,209 2006-11-07 2007-08-02 Efficient Atmospheric Pressure Interface for Mass Spectrometers and Method Abandoned US20090283674A1 (en)

Priority Applications (24)

Application Number Priority Date Filing Date Title
US11/833,209 US20090283674A1 (en) 2006-11-07 2007-08-02 Efficient Atmospheric Pressure Interface for Mass Spectrometers and Method
GB0909034.1A GB2456284B (en) 2006-11-07 2007-11-07 Ion transfer arrangement
DE112007002661.8T DE112007002661B4 (de) 2006-11-07 2007-11-07 Ionentransferanordnung
CA2668762A CA2668762C (en) 2006-11-07 2007-11-07 Ion transfer arrangement
CA2668829A CA2668829C (en) 2006-11-07 2007-11-07 Ion transfer arrangement
CA2668763A CA2668763C (en) 2006-11-07 2007-11-07 Ion transfer arrangement
JP2009535623A JP2010508643A (ja) 2006-11-07 2007-11-07 イオン移送装置
CN201210111145XA CN102768936A (zh) 2006-11-07 2007-11-07 离子迁移装置
PCT/EP2007/009642 WO2008061628A2 (en) 2006-11-07 2007-11-07 Ion transfer arrangement
US12/513,939 US7982183B2 (en) 2006-11-07 2007-11-07 Ion transfer tube with spatially alternating DC fields
DE112007002694T DE112007002694T5 (de) 2006-11-07 2007-11-07 Ionentransferanordnung
US12/513,944 US8148679B2 (en) 2006-11-07 2007-11-07 Efficient atmospheric pressure interface for mass spectrometers and method
PCT/EP2007/009640 WO2008055667A2 (en) 2006-11-07 2007-11-07 Ion transfer arrangement
DE112007002686.3T DE112007002686B4 (de) 2006-11-07 2007-11-07 Ionentransferanordnung
PCT/EP2007/009641 WO2008055668A2 (en) 2006-11-07 2007-11-07 Ion transfer arrangement
US12/513,954 US8148680B2 (en) 2006-11-07 2007-11-07 Ion transfer arrangement with spatially alternating DC and viscous ion flow
GB0909035.8A GB2456720B (en) 2006-11-07 2007-11-07 Ion transfer arrangement
CN2007800490189A CN101606220B (zh) 2006-11-07 2007-11-07 离子迁移装置
JP2009535622A JP5197618B2 (ja) 2006-11-07 2007-11-07 イオン移送装置及びその方法
GB0909032A GB2456283B (en) 2006-11-07 2007-11-07 Ion transfer arrangement
CN2007800490085A CN101606219B (zh) 2006-11-07 2007-11-07 离子迁移装置
JP2009535621A JP5011393B2 (ja) 2006-11-07 2007-11-07 イオン移送装置
JP2012043734A JP5575165B2 (ja) 2006-11-07 2012-02-29 イオン移送装置及びその方法
US13/413,568 US8642949B2 (en) 2006-11-07 2012-03-06 Efficient atmospheric pressure interface for mass spectrometers and method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US85773706P 2006-11-07 2006-11-07
US11/833,209 US20090283674A1 (en) 2006-11-07 2007-08-02 Efficient Atmospheric Pressure Interface for Mass Spectrometers and Method

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/513,939 Continuation-In-Part US7982183B2 (en) 2006-11-07 2007-11-07 Ion transfer tube with spatially alternating DC fields

Publications (1)

Publication Number Publication Date
US20090283674A1 true US20090283674A1 (en) 2009-11-19

Family

ID=39321490

Family Applications (4)

Application Number Title Priority Date Filing Date
US11/833,209 Abandoned US20090283674A1 (en) 2006-11-07 2007-08-02 Efficient Atmospheric Pressure Interface for Mass Spectrometers and Method
US12/513,944 Active 2028-04-25 US8148679B2 (en) 2006-11-07 2007-11-07 Efficient atmospheric pressure interface for mass spectrometers and method
US12/513,954 Active 2028-04-20 US8148680B2 (en) 2006-11-07 2007-11-07 Ion transfer arrangement with spatially alternating DC and viscous ion flow
US13/413,568 Active US8642949B2 (en) 2006-11-07 2012-03-06 Efficient atmospheric pressure interface for mass spectrometers and method

Family Applications After (3)

Application Number Title Priority Date Filing Date
US12/513,944 Active 2028-04-25 US8148679B2 (en) 2006-11-07 2007-11-07 Efficient atmospheric pressure interface for mass spectrometers and method
US12/513,954 Active 2028-04-20 US8148680B2 (en) 2006-11-07 2007-11-07 Ion transfer arrangement with spatially alternating DC and viscous ion flow
US13/413,568 Active US8642949B2 (en) 2006-11-07 2012-03-06 Efficient atmospheric pressure interface for mass spectrometers and method

Country Status (7)

Country Link
US (4) US20090283674A1 (enrdf_load_stackoverflow)
JP (4) JP5011393B2 (enrdf_load_stackoverflow)
CN (1) CN102768936A (enrdf_load_stackoverflow)
CA (3) CA2668762C (enrdf_load_stackoverflow)
DE (3) DE112007002686B4 (enrdf_load_stackoverflow)
GB (3) GB2456284B (enrdf_load_stackoverflow)
WO (3) WO2008055668A2 (enrdf_load_stackoverflow)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8610054B2 (en) 2009-05-01 2013-12-17 Shimadzu Corporation Ion analysis apparatus and method of use
US9892901B2 (en) 2014-07-07 2018-02-13 Hitachi High-Technologies Corporation Mass spectrometry device
US10337517B2 (en) 2012-01-27 2019-07-02 Edwards Limited Gas transfer vacuum pump
US20190237314A1 (en) * 2015-08-21 2019-08-01 PharmaCadence Analytical Services, LLC Novel methods of evaluating performance of an atmospheric pressure ionization system
DE102014222380B4 (de) 2013-11-04 2019-09-05 Agilent Technologies, Inc. (N.D.Ges.D. Staates Delaware) Luftdruck-schnittstelle mit verbessertem ionentransfer für spektrometrie sowie verwandte systeme
US10557823B2 (en) 2014-10-14 2020-02-11 Smiths Detection-Watford Limited Ion filter for mass spectrometer
US12406823B2 (en) 2020-04-30 2025-09-02 Friedrich-Alexander-Universität Erlangen-Nürnberg Electrode structure for guiding a charged particle beam

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7982183B2 (en) * 2006-11-07 2011-07-19 Thermo Fisher Scientific (Bremen) Gmbh Ion transfer tube with spatially alternating DC fields
US20090283674A1 (en) * 2006-11-07 2009-11-19 Reinhold Pesch Efficient Atmospheric Pressure Interface for Mass Spectrometers and Method
WO2009143623A1 (en) * 2008-05-30 2009-12-03 Mds Analytical Technologies Method and system for vacuum driven differential mobility spectrometer/mass spectrometer interface with adjustable resolution and selectivity
GB0817115D0 (en) 2008-09-18 2008-10-29 Micromass Ltd Mass spectrometer
US8410431B2 (en) * 2008-10-13 2013-04-02 Purdue Research Foundation Systems and methods for transfer of ions for analysis
US7915580B2 (en) * 2008-10-15 2011-03-29 Thermo Finnigan Llc Electro-dynamic or electro-static lens coupled to a stacked ring ion guide
US8389930B2 (en) * 2010-04-30 2013-03-05 Agilent Technologies, Inc. Input port for mass spectrometers that is adapted for use with ion sources that operate at atmospheric pressure
US8710454B2 (en) * 2011-01-04 2014-04-29 Lawrence Livermore National Security, Llc High gradient lens for charged particle beam
GB201109384D0 (en) * 2011-06-03 2011-07-20 Micromass Ltd Sampling with increased efficiency
EP3699950A1 (en) 2011-12-28 2020-08-26 Micromass UK Limited Collision ion generator and separator
US9230790B2 (en) 2011-12-30 2016-01-05 Dh Technologies Development Pte. Ltd. DC ion funnels
US8779353B2 (en) * 2012-01-11 2014-07-15 Bruker Daltonics, Inc. Ion guide and electrode for its assembly
EP2631930B1 (en) * 2012-02-21 2017-03-29 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Device for transferring ions from high to low pressure atmosphere, system and use
US9184038B2 (en) 2012-06-06 2015-11-10 Purdue Research Foundation Ion focusing
GB2517670B (en) * 2013-03-15 2020-04-29 Smiths Detection Watford Ltd Ion modification
CN104282525A (zh) * 2013-07-01 2015-01-14 中国科学院大连化学物理研究所 一种大气压下的离子聚焦传输透镜
CN105247652B (zh) * 2013-08-02 2017-05-31 株式会社日立高新技术 质量分析装置
WO2015101817A1 (en) 2013-12-31 2015-07-09 Dh Technologies Development Pte. Ltd. Jet injector inlet for a differential mobility spectrometer
WO2015101823A1 (en) * 2013-12-31 2015-07-09 Dh Technologies Development Pte. Ltd. Lens pulsing apparatus and method
US9921183B2 (en) 2013-12-31 2018-03-20 Dh Technologies Development Pte. Ltd. Vacuum DMS with high efficiency ion guides
US9558925B2 (en) * 2014-04-18 2017-01-31 Battelle Memorial Institute Device for separating non-ions from ions
US9564305B2 (en) * 2014-07-29 2017-02-07 Smiths Detection Inc. Ion funnel for efficient transmission of low mass-to-charge ratio ions with reduced gas flow at the exit
CN105679636B (zh) 2014-11-19 2018-04-10 株式会社岛津制作所 聚焦离子导引装置及质谱分析装置
CN104599933B (zh) * 2015-01-08 2017-12-15 聚光科技(杭州)股份有限公司 一种电子电离源
US10607826B2 (en) 2015-07-28 2020-03-31 University Of Florida Research Foundation, Incorporated Atmospheric pressure ion guide
EP3359960B1 (en) 2015-10-07 2020-12-23 Battelle Memorial Institute Method and apparatus for ion mobility separations utilizing alternating current waveforms
US10103014B2 (en) * 2016-09-05 2018-10-16 Agilent Technologies, Inc. Ion transfer device for mass spectrometry
US10541122B2 (en) 2017-06-13 2020-01-21 Mks Instruments, Inc. Robust ion source
US10692710B2 (en) * 2017-08-16 2020-06-23 Battelle Memorial Institute Frequency modulated radio frequency electric field for ion manipulation
US10804089B2 (en) 2017-10-04 2020-10-13 Batelle Memorial Institute Methods and systems for integrating ion manipulation devices
GB201810826D0 (en) * 2018-06-01 2018-08-15 Micromass Ltd Ion guide
CN109192648B (zh) * 2018-08-09 2023-09-15 金华职业技术学院 一种自由基光产物测试方法
US11791149B2 (en) 2019-07-31 2023-10-17 Agilent Technologies, Inc. Axially progressive lens for transporting charged particles
CN110957198B (zh) * 2019-12-12 2021-03-05 中国科学院化学研究所 一种逆压梯度传输的离子透镜系统

Citations (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4542293A (en) * 1983-04-20 1985-09-17 Yale University Process and apparatus for changing the energy of charged particles contained in a gaseous medium
US4935624A (en) * 1987-09-30 1990-06-19 Cornell Research Foundation, Inc. Thermal-assisted electrospray interface (TAESI) for LC/MS
US4977320A (en) * 1990-01-22 1990-12-11 The Rockefeller University Electrospray ionization mass spectrometer with new features
US5095206A (en) * 1990-06-01 1992-03-10 Environmental Technologies Group, Inc. Method and apparatus for improving the specificity of an ion mobility spectrometer utillizing sulfur dioxide dopant chemistry
US5157260A (en) * 1991-05-17 1992-10-20 Finnian Corporation Method and apparatus for focusing ions in viscous flow jet expansion region of an electrospray apparatus
US5245186A (en) * 1991-11-18 1993-09-14 The Rockefeller University Electrospray ion source for mass spectrometry
US5736740A (en) * 1995-04-25 1998-04-07 Bruker-Franzen Analytik Gmbh Method and device for transport of ions in gas through a capillary
US5747799A (en) * 1995-06-02 1998-05-05 Bruker-Franzen Analytik Gmbh Method and device for the introduction of ions into the gas stream of an aperture to a mass spectrometer
US5756995A (en) * 1997-07-09 1998-05-26 The United States Of America As Represented By The Secretary Of The Army Ion interface for mass spectrometer
US6271529B1 (en) * 1997-12-01 2001-08-07 Ebara Corporation Ion implantation with charge neutralization
US20020148959A1 (en) * 2001-02-22 2002-10-17 Bruker Daltonik Gmbh Travelling field for packaging ion beams
US6504150B1 (en) * 1999-06-11 2003-01-07 Perseptive Biosystems, Inc. Method and apparatus for determining molecular weight of labile molecules
US20030034452A1 (en) * 1999-10-29 2003-02-20 Fischer Steven M. Dielectric capillary high pass ion filter
US20030136905A1 (en) * 2001-12-06 2003-07-24 Bruker Daltonik Gmbh Ion-guide systems
US20030178564A1 (en) * 2002-03-15 2003-09-25 Kernan Jeffrey T. Apparatus for manipulation of ions and methods of making apparatus
US6781117B1 (en) * 2002-05-30 2004-08-24 Ross C Willoughby Efficient direct current collision and reaction cell
US6906322B2 (en) * 2001-03-29 2005-06-14 Wisconsin Alumni Research Foundation Charged particle source with droplet control for mass spectrometry
US6943347B1 (en) * 2002-10-18 2005-09-13 Ross Clark Willoughby Laminated tube for the transport of charged particles contained in a gaseous medium
US20070040111A1 (en) * 2005-08-22 2007-02-22 Battelle Energy Alliance, Llc Dual mode ion mobility spectrometer and method for ion mobility spectrometry
US20070205362A1 (en) * 2006-03-03 2007-09-06 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
US7391021B2 (en) * 2004-10-05 2008-06-24 Bruker Dalton K Gmbh Ion guides with RF diaphragm stacks
US7405398B2 (en) * 2003-06-09 2008-07-29 Ionics Mass Spectrometry Group, Inc. Mass spectrometer interface

Family Cites Families (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2883568A (en) * 1957-06-25 1959-04-21 Rca Corp Apparatus for producing thermallycool charged particles
NL278803A (enrdf_load_stackoverflow) * 1961-05-25
US4556794A (en) * 1985-01-30 1985-12-03 Hughes Aircraft Company Secondary ion collection and transport system for ion microprobe
US5095208A (en) * 1988-06-24 1992-03-10 Hitachi, Ltd. Charged particle generating device and focusing lens therefor
US5331159A (en) * 1993-01-22 1994-07-19 Hewlett Packard Company Combined electrospray/particle beam liquid chromatography/mass spectrometer
JPH07130325A (ja) 1993-10-29 1995-05-19 Hitachi Ltd 質量分析装置
US5689111A (en) * 1995-08-10 1997-11-18 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
JP2953344B2 (ja) * 1995-04-28 1999-09-27 株式会社島津製作所 液体クロマトグラフ質量分析装置
JPH0943201A (ja) * 1995-07-27 1997-02-14 Shimadzu Corp 液体クロマトグラフ質量分析装置
GB9525507D0 (en) * 1995-12-14 1996-02-14 Fisons Plc Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source
JPH10112280A (ja) * 1996-10-08 1998-04-28 Jeol Ltd イオン源
US5879461A (en) * 1997-04-21 1999-03-09 Brooks Automation, Inc. Metered gas control in a substrate processing apparatus
JPH11307040A (ja) * 1998-04-23 1999-11-05 Jeol Ltd イオンガイド
US6107628A (en) 1998-06-03 2000-08-22 Battelle Memorial Institute Method and apparatus for directing ions and other charged particles generated at near atmospheric pressures into a region under vacuum
JP3571546B2 (ja) * 1998-10-07 2004-09-29 日本電子株式会社 大気圧イオン化質量分析装置
JP2003507874A (ja) * 1999-08-26 2003-02-25 ユニバーシティ オブ ニュー ハンプシャー 多段型の質量分析計
JP3743240B2 (ja) * 1999-12-24 2006-02-08 株式会社日立製作所 液体クロマトグラフ質量分析装置
JP2001343364A (ja) 2000-06-05 2001-12-14 Sumitomo Heavy Ind Ltd 固体中の特定原子の検出装置
JP2001349871A (ja) 2000-06-09 2001-12-21 Sumitomo Heavy Ind Ltd 固体中の特定原子の検出装置
US6417511B1 (en) * 2000-07-17 2002-07-09 Agilent Technologies, Inc. Ring pole ion guide apparatus, systems and method
GB2404784B (en) * 2001-03-23 2005-06-22 Thermo Finnigan Llc Mass spectrometry method and apparatus
US6583408B2 (en) 2001-05-18 2003-06-24 Battelle Memorial Institute Ionization source utilizing a jet disturber in combination with an ion funnel and method of operation
JP3791479B2 (ja) 2002-09-17 2006-06-28 株式会社島津製作所 イオンガイド
US7358504B2 (en) * 2002-09-25 2008-04-15 Thermo Finnigan Llc FAIMS apparatus and method for separating ions
US7084394B2 (en) 2002-09-25 2006-08-01 Ionalytics Corporation FAIMS apparatus and method for separating ions
JP2005085538A (ja) 2003-09-05 2005-03-31 Doshisha 質量分離装置および質量分離方法
ATE507576T1 (de) * 2004-01-09 2011-05-15 Micromass Ltd Ionenextraktionseinrichtungen und verfahren zur selektiven extraktion von ionen
JP2005259477A (ja) * 2004-03-11 2005-09-22 Hitachi High-Technologies Corp エレクトロスプレイイオン化質量分析装置
JP4285283B2 (ja) * 2004-03-11 2009-06-24 株式会社島津製作所 質量分析装置
JP4193734B2 (ja) * 2004-03-11 2008-12-10 株式会社島津製作所 質量分析装置
GB0608470D0 (en) * 2006-04-28 2006-06-07 Micromass Ltd Mass spectrometer
US20090283674A1 (en) * 2006-11-07 2009-11-19 Reinhold Pesch Efficient Atmospheric Pressure Interface for Mass Spectrometers and Method
US7982183B2 (en) * 2006-11-07 2011-07-19 Thermo Fisher Scientific (Bremen) Gmbh Ion transfer tube with spatially alternating DC fields

Patent Citations (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4542293A (en) * 1983-04-20 1985-09-17 Yale University Process and apparatus for changing the energy of charged particles contained in a gaseous medium
US4935624A (en) * 1987-09-30 1990-06-19 Cornell Research Foundation, Inc. Thermal-assisted electrospray interface (TAESI) for LC/MS
US4977320A (en) * 1990-01-22 1990-12-11 The Rockefeller University Electrospray ionization mass spectrometer with new features
US5095206A (en) * 1990-06-01 1992-03-10 Environmental Technologies Group, Inc. Method and apparatus for improving the specificity of an ion mobility spectrometer utillizing sulfur dioxide dopant chemistry
US5157260A (en) * 1991-05-17 1992-10-20 Finnian Corporation Method and apparatus for focusing ions in viscous flow jet expansion region of an electrospray apparatus
US5245186A (en) * 1991-11-18 1993-09-14 The Rockefeller University Electrospray ion source for mass spectrometry
US5736740A (en) * 1995-04-25 1998-04-07 Bruker-Franzen Analytik Gmbh Method and device for transport of ions in gas through a capillary
US5747799A (en) * 1995-06-02 1998-05-05 Bruker-Franzen Analytik Gmbh Method and device for the introduction of ions into the gas stream of an aperture to a mass spectrometer
US5756995A (en) * 1997-07-09 1998-05-26 The United States Of America As Represented By The Secretary Of The Army Ion interface for mass spectrometer
US6271529B1 (en) * 1997-12-01 2001-08-07 Ebara Corporation Ion implantation with charge neutralization
US6504150B1 (en) * 1999-06-11 2003-01-07 Perseptive Biosystems, Inc. Method and apparatus for determining molecular weight of labile molecules
US20030034452A1 (en) * 1999-10-29 2003-02-20 Fischer Steven M. Dielectric capillary high pass ion filter
US20020148959A1 (en) * 2001-02-22 2002-10-17 Bruker Daltonik Gmbh Travelling field for packaging ion beams
US6906322B2 (en) * 2001-03-29 2005-06-14 Wisconsin Alumni Research Foundation Charged particle source with droplet control for mass spectrometry
US20030136905A1 (en) * 2001-12-06 2003-07-24 Bruker Daltonik Gmbh Ion-guide systems
US20030178564A1 (en) * 2002-03-15 2003-09-25 Kernan Jeffrey T. Apparatus for manipulation of ions and methods of making apparatus
US20040178342A1 (en) * 2002-03-15 2004-09-16 Kernan Jeffrey T. Apparatus for manipulation of ions and methods of making apparatus
US20050167584A1 (en) * 2002-03-15 2005-08-04 Kernan Jeffrey T. Apparatus for manipulation of ions and methods of making apparatus
US6781117B1 (en) * 2002-05-30 2004-08-24 Ross C Willoughby Efficient direct current collision and reaction cell
US6943347B1 (en) * 2002-10-18 2005-09-13 Ross Clark Willoughby Laminated tube for the transport of charged particles contained in a gaseous medium
US7405398B2 (en) * 2003-06-09 2008-07-29 Ionics Mass Spectrometry Group, Inc. Mass spectrometer interface
US7391021B2 (en) * 2004-10-05 2008-06-24 Bruker Dalton K Gmbh Ion guides with RF diaphragm stacks
US20070040111A1 (en) * 2005-08-22 2007-02-22 Battelle Energy Alliance, Llc Dual mode ion mobility spectrometer and method for ion mobility spectrometry
US20070205362A1 (en) * 2006-03-03 2007-09-06 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8610054B2 (en) 2009-05-01 2013-12-17 Shimadzu Corporation Ion analysis apparatus and method of use
US10337517B2 (en) 2012-01-27 2019-07-02 Edwards Limited Gas transfer vacuum pump
DE102014222380B4 (de) 2013-11-04 2019-09-05 Agilent Technologies, Inc. (N.D.Ges.D. Staates Delaware) Luftdruck-schnittstelle mit verbessertem ionentransfer für spektrometrie sowie verwandte systeme
US9892901B2 (en) 2014-07-07 2018-02-13 Hitachi High-Technologies Corporation Mass spectrometry device
US10557823B2 (en) 2014-10-14 2020-02-11 Smiths Detection-Watford Limited Ion filter for mass spectrometer
US11215582B2 (en) 2014-10-14 2022-01-04 Smiths Detection-Watford Liited Method and apparatus for an ion filter of a mass spectrometer
US20190237314A1 (en) * 2015-08-21 2019-08-01 PharmaCadence Analytical Services, LLC Novel methods of evaluating performance of an atmospheric pressure ionization system
US11049703B2 (en) * 2015-08-21 2021-06-29 PharmaCadence Analytical Services, LLC Methods of evaluating performance of an atmospheric pressure ionization system
US11610767B2 (en) 2015-08-21 2023-03-21 PharmaCadence Analytical Services, LLC Methods of evaluating performance of an atmospheric pressure ionization system
US12406823B2 (en) 2020-04-30 2025-09-02 Friedrich-Alexander-Universität Erlangen-Nürnberg Electrode structure for guiding a charged particle beam

Also Published As

Publication number Publication date
JP2012114096A (ja) 2012-06-14
WO2008055668A3 (en) 2009-02-05
US20100038532A1 (en) 2010-02-18
US8148680B2 (en) 2012-04-03
CN102768936A (zh) 2012-11-07
JP5197618B2 (ja) 2013-05-15
GB0909034D0 (en) 2009-07-01
DE112007002694T5 (de) 2009-12-03
CA2668763C (en) 2016-02-09
CA2668829C (en) 2016-08-23
JP2010508643A (ja) 2010-03-18
DE112007002686T5 (de) 2009-11-05
CA2668762A1 (en) 2008-05-15
JP5011393B2 (ja) 2012-08-29
GB2456720B (en) 2012-01-11
JP5575165B2 (ja) 2014-08-20
GB0909032D0 (en) 2009-07-01
GB2456283A (en) 2009-07-15
GB2456284A (en) 2009-07-15
WO2008055667A2 (en) 2008-05-15
DE112007002686B4 (de) 2019-10-17
DE112007002661T5 (de) 2010-02-04
WO2008055667A3 (en) 2009-02-05
GB2456283B (en) 2011-10-12
WO2008061628A2 (en) 2008-05-29
US8148679B2 (en) 2012-04-03
JP2010508642A (ja) 2010-03-18
JP2010508535A (ja) 2010-03-18
WO2008061628A3 (en) 2009-01-22
CA2668763A1 (en) 2008-05-15
WO2008055668A2 (en) 2008-05-15
US20100038533A1 (en) 2010-02-18
CA2668829A1 (en) 2008-05-29
CA2668762C (en) 2016-10-25
GB0909035D0 (en) 2009-07-01
DE112007002661B4 (de) 2019-10-10
GB2456284B (en) 2012-10-17
GB2456720A (en) 2009-07-29
US8642949B2 (en) 2014-02-04
US20120161029A1 (en) 2012-06-28

Similar Documents

Publication Publication Date Title
US20090283674A1 (en) Efficient Atmospheric Pressure Interface for Mass Spectrometers and Method
US7351960B2 (en) Enhanced ion desolvation for an ion mobility spectrometry device
US8324565B2 (en) Ion funnel for mass spectrometry
JP7047936B2 (ja) 質量分析装置
JP2010537371A (ja) 真空以上の圧力での試料のイオン化
CN103329241B (zh) 质谱分析方面或相关的改进
CA2858459C (en) Mass spectrometer vacuum interface method and apparatus
KR20080112261A (ko) 표면 이온화 스펙트로스코피에 사용되는 샘플링 시스템
US20090090858A1 (en) Sampling system for use with surface ionization spectroscopy
EP1527475B1 (en) Vortex flow atmospheric pressure chemical ionization source for mass spectrometry
CN107799382B (zh) 用于质谱分析的离子传输装置
JP4454157B2 (ja) 質量分析装置のためのイオン源
CA2345683A1 (en) Vortex gas flow interface for electrospray mass spectrometry
US20140084154A1 (en) Apparatus for providing gaseous sample ions/molecules and a corresponding method
US9455131B2 (en) Gas diffuser ion inlet
US8680460B2 (en) Converging-diverging supersonic shock disruptor for fluid nebulization and drop fragmentation
US12002672B2 (en) Apparatus and methods for reduced neutral contamination in a mass spectrometer
JP6194858B2 (ja) イオン化室
JP3978184B2 (ja) 大気圧イオン化質量分析装置

Legal Events

Date Code Title Description
AS Assignment

Owner name: THERMO FISHER SCIENTIFIC (BREMEN) GMBH, GERMANY

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:PESCH, REINHOLD;REEL/FRAME:019641/0380

Effective date: 20070802

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION