US11041874B2 - Automatic analyzer - Google Patents

Automatic analyzer Download PDF

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Publication number
US11041874B2
US11041874B2 US16/086,085 US201716086085A US11041874B2 US 11041874 B2 US11041874 B2 US 11041874B2 US 201716086085 A US201716086085 A US 201716086085A US 11041874 B2 US11041874 B2 US 11041874B2
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US
United States
Prior art keywords
reagent
probe
washed
sample
reaction cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active, expires
Application number
US16/086,085
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English (en)
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US20200096529A1 (en
Inventor
Saori CHIDA
Yoichi ARUGA
Akihiro Yasui
Yoshiki MURAMATSU
Yoko Inoue
Hideto Tamezane
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Tech Corp filed Critical Hitachi High Tech Corp
Assigned to HITACHI HIGH-TECHNOLOGIES CORPORATION reassignment HITACHI HIGH-TECHNOLOGIES CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ARUGA, YOICHI, INOUE, YOKO, MURAMATSU, YOSHIKI, TAMEZANE, HIDETO, YASUI, AKIHIRO, CHIDA, SAORI
Publication of US20200096529A1 publication Critical patent/US20200096529A1/en
Assigned to HITACHI HIGH-TECH CORPORATION reassignment HITACHI HIGH-TECH CORPORATION CHANGE OF NAME AND ADDRESS Assignors: HITACHI HIGH-TECHNOLOGIES CORPORATION
Application granted granted Critical
Publication of US11041874B2 publication Critical patent/US11041874B2/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1004—Cleaning sample transfer devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00465—Separating and mixing arrangements
    • G01N2035/00534—Mixing by a special element, e.g. stirrer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0439—Rotary sample carriers, i.e. carousels
    • G01N2035/0443—Rotary sample carriers, i.e. carousels for reagents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0439—Rotary sample carriers, i.e. carousels
    • G01N2035/0444—Rotary sample carriers, i.e. carousels for cuvettes or reaction vessels
US16/086,085 2016-03-25 2017-01-31 Automatic analyzer Active 2037-09-20 US11041874B2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2016-061085 2016-03-25
JPJP2016-061085 2016-03-25
JP2016061085 2016-03-25
PCT/JP2017/003256 WO2017163613A1 (ja) 2016-03-25 2017-01-31 自動分析装置

Publications (2)

Publication Number Publication Date
US20200096529A1 US20200096529A1 (en) 2020-03-26
US11041874B2 true US11041874B2 (en) 2021-06-22

Family

ID=59901164

Family Applications (1)

Application Number Title Priority Date Filing Date
US16/086,085 Active 2037-09-20 US11041874B2 (en) 2016-03-25 2017-01-31 Automatic analyzer

Country Status (5)

Country Link
US (1) US11041874B2 (de)
EP (1) EP3415921B1 (de)
JP (1) JP6800953B2 (de)
CN (1) CN108780102B (de)
WO (1) WO2017163613A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6999527B2 (ja) * 2018-09-25 2022-01-18 株式会社日立ハイテク 試験方法、分注装置
US20220034918A1 (en) * 2018-10-31 2022-02-03 Hitachi High-Tech Corporation Automatic analyzer
CN111484921B (zh) * 2020-04-26 2023-07-28 广东康盾创新产业集团股份公司 一种细胞质控装置
JP7475953B2 (ja) * 2020-05-01 2024-04-30 キヤノンメディカルシステムズ株式会社 自動分析装置
CN113275342B (zh) * 2021-06-22 2023-11-14 宙斯生命科技(常州)有限公司 反应杯洗涤机构、反应杯洗涤方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030092185A1 (en) * 2001-03-16 2003-05-15 Humayun Qureshi Method and system for automated immunochemistry analysis
US20080099057A1 (en) * 2006-10-27 2008-05-01 Dade Behring Inc. Method and Device for Cleaning a Liquid Aspiration and Dispense Probe
JP2009222453A (ja) 2008-03-14 2009-10-01 Hitachi High-Technologies Corp 自動分析装置
JP2010019746A (ja) 2008-07-11 2010-01-28 Hitachi High-Technologies Corp 自動分析装置
JP2012220436A (ja) 2011-04-13 2012-11-12 Toshiba Corp 自動分析装置
JP2015200527A (ja) 2014-04-04 2015-11-12 株式会社東芝 臨床検査装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4354376A (en) * 1980-03-03 1982-10-19 Medical Laboratory Automation, Inc. Kit for calibrating pipettes
US5061639A (en) * 1989-12-06 1991-10-29 E. I. Dupont De Nemours And Company Liquid dispenser accuracy verification method
JP3641408B2 (ja) * 2000-02-18 2005-04-20 株式会社日立製作所 自動分析装置および自動分析方法
WO2007124346A2 (en) * 2006-04-19 2007-11-01 Archivex Llc Micro-drop detection and detachment
JP5836195B2 (ja) * 2011-06-14 2015-12-24 日本電子株式会社 臨床検査用分析装置および臨床検査用分析装置における洗浄方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030092185A1 (en) * 2001-03-16 2003-05-15 Humayun Qureshi Method and system for automated immunochemistry analysis
US20080099057A1 (en) * 2006-10-27 2008-05-01 Dade Behring Inc. Method and Device for Cleaning a Liquid Aspiration and Dispense Probe
JP2009222453A (ja) 2008-03-14 2009-10-01 Hitachi High-Technologies Corp 自動分析装置
JP2010019746A (ja) 2008-07-11 2010-01-28 Hitachi High-Technologies Corp 自動分析装置
JP2012220436A (ja) 2011-04-13 2012-11-12 Toshiba Corp 自動分析装置
JP2015200527A (ja) 2014-04-04 2015-11-12 株式会社東芝 臨床検査装置

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
English translation of JP-2010019746-A. (Year: 2020). *
International Search Report of PCT/JP2017/003256 dated May 9, 2017.

Also Published As

Publication number Publication date
EP3415921B1 (de) 2021-11-10
US20200096529A1 (en) 2020-03-26
EP3415921A4 (de) 2019-09-04
JPWO2017163613A1 (ja) 2019-01-31
EP3415921A1 (de) 2018-12-19
CN108780102B (zh) 2022-05-17
CN108780102A (zh) 2018-11-09
WO2017163613A1 (ja) 2017-09-28
JP6800953B2 (ja) 2020-12-16

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