TWM539698U - 具改良式引腳的導線架預成形體 - Google Patents

具改良式引腳的導線架預成形體 Download PDF

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TWM539698U
TWM539698U TW105219900U TW105219900U TWM539698U TW M539698 U TWM539698 U TW M539698U TW 105219900 U TW105219900 U TW 105219900U TW 105219900 U TW105219900 U TW 105219900U TW M539698 U TWM539698 U TW M539698U
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cutting
top surface
lead frame
wafer holder
pins
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Chia-Neng Huang
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Chang Wah Technology Co Ltd
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Priority to TW105219900U priority Critical patent/TWM539698U/zh
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Priority to US15/676,932 priority patent/US10217699B2/en
Priority to JP2017004307U priority patent/JP3213791U/ja

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49541Geometry of the lead-frame
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
    • H01L21/4814Conductive parts
    • H01L21/4821Flat leads, e.g. lead frames with or without insulating supports
    • H01L21/4828Etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49503Lead-frames or other flat leads characterised by the die pad
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49517Additional leads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49537Plurality of lead frames mounted in one device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49541Geometry of the lead-frame
    • H01L23/49548Cross section geometry
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49579Lead-frames or other flat leads characterised by the materials of the lead frames or layers thereon
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49579Lead-frames or other flat leads characterised by the materials of the lead frames or layers thereon
    • H01L23/49582Metallic layers on lead frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49861Lead-frames fixed on or encapsulated in insulating substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/561Batch processing
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    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
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Description

具改良式引腳的導線架預成形體
本新型是有關於一種導線架預成形體,特別是指一種具改良式引腳的導線架預成形體。
四方扁平無外引腳(QFN,quad flat no-lead)封裝結構,因為沒有向外延伸的引腳,因此,可大幅減小封裝尺寸。然而,也因為沒有向外延伸的引腳,因此,當要將此封裝結構應用於後續焊接時,一般難以直接從外觀得知引腳與銲料的焊接狀況。
因此,為了便於以目視確認引腳與銲料的焊接品質,一般常見的方式是以兩次切割的方式讓引腳於側面呈一斷差結構,能易於得知引腳與銲料的接合狀況,詳細地說,美國第2016/0148877A1早期公開號專利案(下稱前案)揭示一種四方無引腳封裝結構,主要是藉由兩個不同寬度的切割刀對引腳進行兩次切割。首先,以一較寬的切割刀切割各引腳12的上部分而形成一凹槽13,接著,於各引腳12與各凹槽13上形成一層電鍍層14,最後,以另一較窄的切割刀將各引腳12切斷,使各引腳12的側面成一斷差結構。
然而,前述切割步驟是於晶片封裝完成後才進行,換句話說,當後續封裝廠在使用如前案的導線架時,會因為前案的導線架的各引腳12沒有先經過結構的設計改良或預先處理,使得封裝廠需要進行繁複且耗成本的兩次切割,才能將各引腳12的側面形成斷差結構。
因此,藉由先行改良導線架之各引腳的結構,以讓後續封裝廠能以單次切割即能得到具有斷差結構引腳的導線架,是此技術領域的相關人員所待解決的課題。
因此,本新型之目的,即在提供一種具改良式引腳的導線架預成形體。
於是,本新型該具改良式引腳的導線架預成形體包含多個彼此電性獨立且成陣列排列的導線架單元。該每一個導線架單元包括一成型膠層、一晶片座、一切割層,及多條引腳。
該成型膠層由絕緣高分子材料構成並具有一中心區。
該晶片座由金屬材料構成並位於該中心區內,並具有彼此反向的一頂面及一底面,且該頂面及該底面分別自該成型膠層反向的兩個表面裸露。
該切割層環圍該中心區,並包括一切割道及多個第一切割部,該切割道具有彼此反向的一頂面及一底面,且該切割道的該頂面及該底面與該晶片座的該頂面及該底面同向,該等第一切割部彼此間隔地形成於該切割道的該頂面上並與該成型膠層相連。
該等引腳由與該晶片座相同的金屬材料構成,彼此各自獨立地自該切割道的頂面朝該晶片座延伸,並與該晶片座呈一間距,且該每一條引腳於鄰近該切割道的一表面具有一凹槽,且該等凹槽不與該等第一切割部相連。
本新型之功效在於,在每一條引腳之鄰近該切割道的該表面形成該凹槽,以令後續封裝結構以該等引腳對外進行表面黏著(surface mount)於一電路板時,能讓銲料緊密接合於每一條引腳的該凹槽,提高封裝結構與電路板的接著強度,增加封裝的可靠性。
參閱圖2~圖4,圖2是本新型具改良式引腳的導線架預成形體200A的一第一實施例俯視示意圖,圖3是沿圖2中之III-III割面線的剖視圖,圖4是圖2之不完整的局部剖視圖。
具改良式引腳的導線架預成形體200A包含多個彼此電性獨立且成陣列排列的導線架單元20A,且該每一個導線架單元20A包括一成型膠層21、一晶片座22、一切割層23、多條引腳24、一第一導電層25,及一第二導電層26。
該成型膠層21由絕緣高分子材料構成,並具有一中心區211。
該晶片座22由金屬材料構成並位於該中心區211內。該晶片座22具有彼此反向的一頂面221及一底面222,且該頂面221及該底面222分別自該成型膠層21反向的兩個表面裸露。
該切割層23環圍該中心區211,並包括一切割道230及多個第一切割部233,該切割道230由與該晶片座22相同的金屬材料構成,並具有彼此反向的一頂面231及一底面232,其中,該切割道230的該頂面231及該底面232與該晶片座22的該頂面221及該底面222同向,且該切割道230的該頂面231低於該晶片座22的該頂面221。該等第一切割部233是由與該成型膠層21相同的絕緣高分子材料構成,且彼此間隔地形成於該切割道230的該頂面231上並與該成型膠層21相連。
該等引腳24由與該晶片座22相同的金屬材料構成,彼此各自獨立地自該切割道230的頂面231朝該晶片座22延伸,並與該晶片座22呈一間距,該每一條引腳24於鄰近該切割道230的一表面241具有一凹槽242,該等凹槽242不與該等第一切割部233相連,且相鄰的該導線架單元20A的該等引腳24之間沒有形成該等第一切割部233。具體地說,該每一條引腳24具有相反的一頂面243與一底面244,該每一條引腳24是由該切割道230的該頂面231向上地朝該晶片座22延伸,從而使該每一條引腳24的該頂面243與該晶片座22的該頂面221齊平。
該第一導電層25形成於該晶片座22的該頂面221、該等引腳24的該頂面243、該凹槽242的表面與該切割道230的該頂面231,而該第二導電層26形成於該晶片座22的該底面222、該等引腳24的該底面244與該切割道230的該底面232。
參閱圖5,當該第一實例之該每一個導線架單元20A欲應用於後續封裝而成為一導線架封裝結構2A時,會將一晶片3形成於該第二導電層26上,且該晶片3會藉由多條導線4與該等引腳24電連接。
詳細地說,切割後的每一個該導線架封裝結構2A藉由該等引腳24進行表面黏著於一電路板100時,能透過每一條引腳24的該凹槽242,增加該等引腳24與銲料5的接觸面積,以讓銲料5緊密接合於該凹槽242上,進而提高導線架封裝結構2A接著於電路板100上的強度,而增加封裝的可靠性。
參閱圖6~圖8,圖6是本新型具改良式引腳的導線架預成形體200A的一第二實施例俯視示意圖,圖7是沿圖6中之VII-VII割面線的剖視圖,圖8是圖6之不完整的局部剖視圖。該第二實施例的結構大致相同於該第一實施例,其不同處在於,該切割層層23還具有多個形成於該切割道230上而位於相鄰的該導線架單元20A的該等引腳24間的第二切割部234,且該等第二切割部234也是由與該成型膠層21相同的絕緣高分子材料構成,並與該等第一切割部233相連。
值得一提的是,由於該第一實施例與該第二實施例的該等第一切割部233與該等第二切割部234都是由絕緣高分子材料所構成,因此,透過將該第一切割部233與該等第二切割部234形成於切割道23上,能讓切割位置是絕緣高分子材料,當要將該導線架封裝結構2A進行切割時,可藉由切割高分子材料而減少切割刀具的損耗。
為了更清楚的說明具改良式引腳的導線架預成形體200A,茲將以前述該導線架預成形體200A的該第一實施例的製作方法為例簡單說明如下:
配合參閱圖9~圖11,先提供一可導電的材料,例如銅合金或鐵鎳合金等材料構成的基片100。定義多條縱向及橫向排列且彼此相交的第一分隔島101與第二分隔島102,且兩兩相鄰且彼此相交的橫向及縱向排列的第一分隔島101與第二分隔島102共同定義出後續經蝕刻移除後預形成之多數空間301。
進行第一次蝕刻,首先將該基片100不必要的上部分蝕刻移除,而灌入一成型膠。詳細地說,將經第一次蝕刻的該基片100夾設於一模具(圖未示)中,用模注方式灌入該成形膠,其中,該成形膠為選自一般絕緣封裝材料,如環氧樹脂等,讓該成形膠填滿經蝕刻的上部。再進行第二次蝕刻,而將該基片100不必要的下部份蝕刻移除,並再次以前述方式灌入成形膠,以令第一次與第二次灌入的該成形膠固化形成該成形膠層21,使該基片100形成一個導線架預成形體半成品201A。該導線架預成形體半成品201A包括多個導線架單元20A,及多條連接相鄰導線架單元20A的連接部300。
該每一個導線架單元20A具有一個晶片座22、多條自該等連接部300朝向該晶片座22延伸並與該晶片座22呈一間距的引腳24。
參閱圖11,圖11(a)為圖10所示之該導線架201A沿XI-XI割面線的剖視示意圖。
接著,進行第三次蝕刻,先在該導線架預成形體半成品201A上形成一光阻層6而讓該連接部300露出,而將該等連接部300的一上部蝕刻移除,使該連接部300剩餘一下部而構成連接該等引腳24的一切割道230,且在移除該連接部300的該上部時,一併蝕刻各引腳24之鄰近該切割道230的一表面241,以於各引腳24上形成一凹槽242。
最後,以電鍍方式將一第一導電層25形成於該晶片座22的頂面221、該等引腳24的頂面243、該凹槽242的表面與該切割道230的頂面231,及將一第二導電層26形成於該晶片座22的底面222、該等引腳24的底面244與該切割道230的底面232,即可得到如圖11(d)所示之具改良式引腳的導線架預成形體200A的該第一實施例。
綜上所述,在每一條引腳24之鄰近該切割道230的該表面241形成該凹槽242,以增加該等引腳24的接觸面積,使該導線架封裝結構2A透過該等引腳24電連接於電路板100時,能讓銲料5進一步地接合在該等引腳24的該凹槽242,而提高導線架封裝結構2A與電路板100整體的接著強度,增加封裝的可靠性,因此,確實能達成本新型之目的。
惟以上所述者,僅為本新型之實施例而已,當不能以此限定本新型實施之範圍,凡是依本新型申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本新型專利涵蓋之範圍內。
100‧‧‧電路板
232‧‧‧底面
101‧‧‧第一分隔島
233‧‧‧第一切割部
102‧‧‧第二分隔島
234‧‧‧第二切割部
200A‧‧‧導線架預成形體
24‧‧‧引腳
201A‧‧‧導線架預成形體半成品
241‧‧‧表面
20A‧‧‧導線架單元
242‧‧‧凹槽
2A‧‧‧導線架封裝結構
243‧‧‧頂面
21‧‧‧成型膠層
244‧‧‧底面
211‧‧‧中心區
25‧‧‧第一導電層
212‧‧‧切割部
26‧‧‧第二導電層
22‧‧‧晶片座
3‧‧‧晶片
221‧‧‧頂面
300‧‧‧連接部
222‧‧‧底面
4‧‧‧導線
23‧‧‧切割層
5‧‧‧銲料
230‧‧‧切割道
6‧‧‧光阻層
231‧‧‧頂面
本新型之其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中: 圖1是一側視流程示意圖,說明習知QFN封裝結構; 圖2是一俯視示意圖,說明本新型具改良式引腳的導線架預成形體的一第一實施例; 圖3是一沿圖2之割面線III-III的側視示意圖,輔助說明該第一實施例; 圖4是一不完整局部剖視圖,輔助說明該第一實施例的各引腳的一凹槽; 圖5是一側視示意圖,說明一導線架封裝結構設置於一電路板; 圖6是一俯視示意圖,說明本新型具改良式引腳的導線架預成形體的一第二實施例; 圖7是一沿圖6之割面線VII-VII的側視示意圖,輔助說明該第二實施例; 圖8是一不完整局部剖視圖,輔助說明該第二實施例的一切割部與各引腳的一凹槽; 圖9是一製作流程示意圖,說明該第一實施例的製作流程; 圖10是一製作流程示意圖,接續圖10說明該第一實施例的製作流程;及 圖11是一製作流程示意圖,接續圖10說明該第一實施例的製作流程。
21‧‧‧成型膠層
22‧‧‧晶片座
221‧‧‧頂面
222‧‧‧底面
230‧‧‧切割道
231‧‧‧頂面
232‧‧‧底面
233‧‧‧第一切割部
24‧‧‧引腳
241‧‧‧表面
242‧‧‧凹槽
243‧‧‧頂面
244‧‧‧底面
25‧‧‧第一導電層
26‧‧‧第二導電層

Claims (4)

  1. 一種具改良式引腳的導線架預成形體,包含: 多個彼此電性獨立且成陣列排列的導線架單元,該每一個導線架單元,包括: 一成型膠層,由絕緣高分子材料構成,並具有一中心區; 一晶片座,由金屬材料構成並位於該中心區內,該晶片座具有彼此反向的一頂面及一底面,且該頂面及該底面分別自該成型膠層反向的兩個表面裸露; 一切割層,環圍該中心區,並包括一切割道及多個第一切割部,該切割道具有彼此反向的一頂面及一底面,且該切割道的該頂面及該底面與該晶片座的該頂面及該底面同向,該等第一切割部彼此間隔地形成於該切割道的該頂面上並與該成型膠層相連;及 多條引腳,由與該晶片座相同的金屬材料構成,彼此各自獨立地自該切割道的該頂面朝該晶片座延伸,並與該晶片座呈一間距,該每一條引腳於鄰近該切割道的一表面具有一凹槽,且該等凹槽不與該等第一切割部相連。
  2. 如請求項1所述的具改良式引腳的導線架預成形體,其中,該切割道的該頂面低於該晶片座的該頂面,該切割道是由與該晶片座相同的金屬材料構成,該等第一切割部是由與該成型膠層相同的絕緣高分子材料構成,且相鄰的該導線架單元的該等引腳之間沒有形成該等第一切割部。
  3. 如請求項1所述的具改良式引腳的導線架預成形體,其中,該切割層還具有多個位於相鄰的該導線架單元的該等引腳間的第二切割部,且該等第二切割部與該等第一切割部相連。
  4. 如請求項1至3中任一項所述的具改良式引腳的導線架預成形體,其中,該每一個導線架單元還包括一第一導電層與一第二導電層,該第一導電層形成於該晶片座的該頂面、該等引腳的一頂面、該凹槽的表面與該切割道的該頂面,該第二導電層形成於該晶片座的該底面、該等引腳的一底面與該切割道的該底面。
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US10867894B2 (en) * 2018-10-11 2020-12-15 Asahi Kasei Microdevices Corporation Semiconductor element including encapsulated lead frames
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US20070040231A1 (en) * 2005-08-16 2007-02-22 Harney Kieran P Partially etched leadframe packages having different top and bottom topologies
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US8329509B2 (en) * 2010-04-01 2012-12-11 Freescale Semiconductor, Inc. Packaging process to create wettable lead flank during board assembly
US20120306065A1 (en) * 2011-06-02 2012-12-06 Texas Instruments Incorporated Semiconductor package with pre-soldered grooves in leads
US8841758B2 (en) * 2012-06-29 2014-09-23 Freescale Semiconductor, Inc. Semiconductor device package and method of manufacture
DE102013224581A1 (de) * 2013-11-29 2015-06-03 Osram Opto Semiconductors Gmbh Optoelektronisches Bauelement und Verfahren zu seiner Herstellung
US20170301617A1 (en) * 2014-03-07 2017-10-19 Bridge Semiconductor Corporation Leadframe substrate with isolator incorporated therein and semiconductor assembly and manufacturing method thereof
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US20160148877A1 (en) * 2014-11-20 2016-05-26 Microchip Technology Incorporated Qfn package with improved contact pins
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