TWI839503B - Sputtering apparatus, thin-film forming method - Google Patents
Sputtering apparatus, thin-film forming method Download PDFInfo
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- TWI839503B TWI839503B TW109111712A TW109111712A TWI839503B TW I839503 B TWI839503 B TW I839503B TW 109111712 A TW109111712 A TW 109111712A TW 109111712 A TW109111712 A TW 109111712A TW I839503 B TWI839503 B TW I839503B
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- 238000004544 sputter deposition Methods 0.000 title claims abstract description 96
- 239000010409 thin film Substances 0.000 title claims description 34
- 238000000034 method Methods 0.000 title claims description 5
- 238000005477 sputtering target Methods 0.000 claims abstract description 71
- 230000005284 excitation Effects 0.000 claims description 30
- 239000010408 film Substances 0.000 claims description 17
- 238000004519 manufacturing process Methods 0.000 claims description 11
- 239000002826 coolant Substances 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 8
- 239000003507 refrigerant Substances 0.000 description 8
- 230000015572 biosynthetic process Effects 0.000 description 7
- 230000003628 erosive effect Effects 0.000 description 6
- 230000002093 peripheral effect Effects 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- 230000035699 permeability Effects 0.000 description 4
- 238000001816 cooling Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000001755 magnetron sputter deposition Methods 0.000 description 2
- 101100012902 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) FIG2 gene Proteins 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
- C23C14/352—Sputtering by application of a magnetic field, e.g. magnetron sputtering using more than one target
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/3423—Shape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/345—Magnet arrangements in particular for cathodic sputtering apparatus
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/345—Magnet arrangements in particular for cathodic sputtering apparatus
- H01J37/3455—Movable magnets
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
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- Spectroscopy & Molecular Physics (AREA)
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Abstract
將濺射標靶(14)均一地濺射。 在陰極電極(21)的一面配置濺射標靶(14),在相反側的面平行地配置複數個的磁石裝置(301 、311 ~314 、302 )。在磁石裝置(301 、311 ~314 、302 )的兩端配置具有磁場的可變磁石(47),該磁場是合成基礎磁力部(71)所形成的磁場及電磁石部(73)所形成的磁場,藉由控制流至電磁石部(73)的激磁電流的方向與大小來控制被形成於電磁石部(73)的磁極的極性及磁場強度,依據濺射的成膜對象物(13)的增加,縮小可變磁石(47)所形成的磁場強度來使濺射面(24)上的磁場強度形成一定。The sputtering target (14) is uniformly sputtered. The sputtering target (14) is arranged on one surface of the cathode electrode (21), and a plurality of magnet devices (30 1 , 31 1 to 31 4 , 30 2 ) are arranged in parallel on the surface of the opposite side. A variable magnet (47) having a magnetic field is arranged at both ends of the magnet device (30 1 , 31 1 ~ 31 4 , 30 2 ). The magnetic field is a magnetic field formed by a synthetic base magnetic force portion (71) and an electromagnetic portion (73). The polarity and magnetic field strength of the magnetic pole formed in the electromagnetic portion (73) are controlled by controlling the direction and magnitude of the exciting current flowing to the electromagnetic portion (73). According to the increase of the film-forming object (13) to be sputtered, the magnetic field strength formed by the variable magnet (47) is reduced to make the magnetic field strength on the sputtering surface (24) constant.
Description
本發明是有關濺射裝置與薄膜製造方法。The present invention relates to a sputtering device and a thin film manufacturing method.
磁控管濺射方法是在濺射標靶表面形成磁場,使電子在磁場中移動,效率佳地將濺射氣體電漿化的裝置,廣泛用在薄膜的形成。The magnetron sputtering method is a device that forms a magnetic field on the surface of the sputtering target, causing electrons to move in the magnetic field, and efficiently converts the sputtering gas into plasma. It is widely used in the formation of thin films.
圖8(a)、(b)的符號130是被用在磁控管濺射裝置的標靶裝置,在陰極電極121的一面配置有濺射標靶114,在相反側的面配置有複數的磁石裝置131。
各磁石裝置131是具有環狀的外側磁石136、及被配置於以外側磁石136所包圍的區域之直線狀的內側磁石134,各磁石裝置131的外側磁石136的二個的磁極之中,相同極性的磁極會朝向陰極電極121,內側磁石134的二個的磁極之中,與朝向陰極電極121的外側磁石136的磁極相反極性的磁極會朝向陰極電極121。Each
在陰極電極121施加濺射電壓,從濺射標靶114表面放出的電子是被藉由外側磁石136及內側磁石134來形成於濺射標靶114的表面的磁場所捕捉,在濺射標靶114的表面形成濺射氣體的高密度的電漿,濺射濺射標靶114的表面。A sputtering voltage is applied to the
以高密度形成電漿的場所是外側磁石136與內側磁石134之間的上的區域,為了擴大濺射濺射標靶114的表面,使設有各磁石裝置131的移動板145移動於與磁石裝置131的長度方向垂直的方向,高密度的電漿會在濺射標靶114的表面移動。The place where plasma is formed at a high density is the upper area between the
然而在磁石裝置131的兩端的位置上是磁場強度容易變強,被形成於該場所的電漿是特別高密度,濺射標靶114會被多量地濺射。However, the magnetic field strength is likely to be strong at the positions of both ends of the
而且,在磁石裝置131的兩端位置,若被形成於標靶的侵蝕的深度比其他的區域更深,則濺射標靶114的表面與磁石裝置131之間的距離會比其他的場所短,濺射標靶114會被更多量地濺射。
[先前技術文獻]
[專利文獻]Furthermore, if the depth of the erosion formed on the target at both ends of the
[專利文獻1]日本特開平5-214527號公報 [專利文獻2]日本特開平8-81769號公報 [專利文獻3]日本特開2012-241250號公報 [專利文獻4]日本特開2004-115841號公報 [專利文獻5]日本特開2015-1734號公報 [專利文獻6]KR101885123 [專利文獻7]KR101924143[Patent Document 1] Japanese Patent Publication No. 5-214527 [Patent Document 2] Japanese Patent Publication No. 8-81769 [Patent Document 3] Japanese Patent Publication No. 2012-241250 [Patent Document 4] Japanese Patent Publication No. 2004-115841 [Patent Document 5] Japanese Patent Publication No. 2015-1734 [Patent Document 6] KR101885123 [Patent Document 7] KR101924143
(發明所欲解決的課題)(The problem that the invention is trying to solve)
本案發明是為了解決上述以往技術的課題而創作者,使組合永久磁石與電磁石的可變磁石的磁場強度減少來使濺射面上的磁場強度不會變化,使可均一地濺射於濺射面上。 (用以解決課題的手段)This invention is created to solve the above-mentioned problems of the previous technology. The magnetic field strength of the variable magnet, which is a combination of permanent magnet and electromagnetic magnet, is reduced so that the magnetic field strength on the sputtering surface does not change, so that it can be evenly sputtered on the sputtering surface. (Means for solving the problem)
為了達成上述目的而研發的本發明為一種濺射裝置,係具有標靶裝置,該標靶裝置係設有: 陰極電極; 濺射標靶,其係被配置於前述陰極電極的一面,露出於真空槽內的濺射面會被濺射;及 磁石裝置,其係被配置於前述陰極電極的面之中與前述一面相反側的面,在前述濺射面上形成磁場, 若前述濺射標靶被濺射,則在位於前述真空槽內的成膜對象物的成膜面形成薄膜, 前述磁石裝置,係細長且具有長度方向,在前述長度方向的兩端係分別配置有可變磁力部,在前述可變磁力部之間係配置有固定磁力部, 前述固定磁力部,係具有: 由沿著前述長度方向來配置的細長的永久磁石所成的第一、第二中央外側部; 及由沿著前述長度方向來配置於前述第一、第二中央外側部之間的細長的永久磁石所成的中央內側部, 前述可變磁力部,係具有: 由沿著前述長度方向來配置的細長的永久磁石所成的第一、第二端外側部; 由沿著前述長度方向來配置於前述第一、第二端外側部之間的複數個的可變磁石所成的端內側部;及 位於前述磁石裝置的前述長度方向的兩端,連接前述第一、第二端外側部的端部彼此間之細長且彎曲的永久磁石所成的連接部, N極與S極之中,若將任一方的極性的磁極設為第一極,將另一方的極性的磁極設為第二極,則前述第一、第二中央外側部,前述第一、第二端外側部,及前述連接部,係前述第一極的磁極會朝向前述陰極電極, 前述中央內側部及前述端內側部係前述第二極的磁極會朝向前述陰極電極, 前述可變磁石係具有:磁芯部,及具有被捲繞於前述磁芯部的周圍的線圈,若激磁電流流動,則形成磁場的電磁石部, 前述可變磁石所形成的磁場的方向與強度,係被構成可依據前述激磁電流的流動的方向與大小來變更。 在本發明的濺射裝置中,前述可變磁石之中,至少一個的前述可變磁石的前述磁芯部係具有由永久磁石所成的基礎磁力部,前述可變磁石所形成的磁場的強度係形成合成前述基礎磁力部的磁場與前述電磁石部的磁場之磁場的強度。 在本發明的濺射裝置中,前述基礎磁力部的前述第一極的磁極係朝向前述陰極電極。 在本發明的濺射裝置中,前述基礎磁力部的前述第二極的磁極係朝向前述陰極電極。 在本發明的濺射裝置中,前述可變磁石所形成的磁場的強度,係可被變更於前述濺射標靶被濺射的期間。 在本發明的濺射裝置中,前述濺射標靶與前述磁石裝置,係被構成為相對地往復移動。 在本發明的濺射裝置中,前述標靶裝置係具有: 一片的前述陰極電極; 被配置於一片的前述陰極電極的前述濺射標靶;及 彼此平行地配置的複數個的前述磁石裝置。 本發明為具有複數個的前述磁石裝置的濺射裝置,其中,複數個的前述磁石裝置係彼此平行地配置而排列成一列, 被排列的前述磁石裝置之中,位於兩端的前述磁石裝置的前述可變磁石的個數,係比其他位置的前述磁石裝置的前述可變磁石的個數更多數個。 本發明為具有複數個前述標靶裝置的濺射裝置。 在本發明的濺射裝置中,前述標靶裝置,係具有: 被形成圓筒形形狀的前述陰極電極; 被配置於前述陰極電極的外周之圓筒形形狀的前述濺射標靶;及 被配置於以前述陰極電極所包圍的區域之前述磁石裝置。 在本發明的濺射裝置中,前述可變磁石係配置於盒內,在被設於前述盒的冷媒路流動冷卻媒體,冷卻前述可變磁石。 本發明為一種薄膜製造方法,係控制濺射裝置,在成膜對象物形成薄膜的薄膜製造方法,前述濺射裝置,係具有標靶裝置,該標靶裝置係設有: 陰極電極; 濺射標靶,其係被配置於前述陰極電極的一面,露出於真空槽內的濺射面會被濺射;及 磁石裝置,其係被配置於前述陰極電極的面之中與前述一面相反側的面,在前述濺射面上形成磁場, 若前述濺射標靶被濺射,則在位於前述真空槽內的成膜對象物的成膜面形成薄膜, 前述磁石裝置,係細長且具有長度方向,在前述長度方向的兩端係分別配置有可變磁力部,在前述可變磁力部之間係配置有固定磁力部, 前述固定磁力部,係具有: 由沿著前述長度方向來配置的細長的永久磁石所成的第一、第二中央外側部; 及由沿著前述長度方向來配置於前述第一、第二中央外側部之間的細長的永久磁石所成的中央內側部, 前述可變磁力部,係具有: 由沿著前述長度方向來配置的細長的永久磁石所成的第一、第二端外側部; 由沿著前述長度方向來配置於前述第一、第二端外側部之間的複數個的可變磁石所成的端內側部;及 位於前述磁石裝置的前述長度方向的兩端,連接前述第一、第二端外側部的端部彼此間之細長且彎曲的永久磁石所成的連接部, N極與S極之中,若將任一方的極性的磁極設為第一極,將另一方的極性的磁極設為第二極,則前述第一、第二中央外側部,前述第一、第二端外側部,及前述連接部,係前述第一極的磁極會朝向前述陰極電極, 前述中央內側部及前述端內側部係前述第二極的磁極會朝向前述陰極電極, 前述可變磁石係具有:磁芯部,及具有被捲繞於前述磁芯部的周圍的線圈,若激磁電流流動,則形成磁場的電磁石部, 前述可變磁石所形成的磁場的方向與強度,係被構成可依據前述激磁電流的流動的方向與大小來變更, 若形成前述薄膜的前述成膜對象物的片數增加,則使前述可變磁石所形成的磁場的強度減少。 本發明為一種薄膜製造方法,係控制濺射裝置,在成膜對象物形成薄膜的薄膜製造方法,前述濺射裝置,係具有標靶裝置,該標靶裝置係設有: 陰極電極; 濺射標靶,其係被配置於前述陰極電極的一面,露出於真空槽內的濺射面會被濺射;及 磁石裝置,其係被配置於前述陰極電極的面之中與前述一面相反側的面,在前述濺射面上形成磁場, 若前述濺射標靶被濺射,則在位於前述真空槽內的成膜對象物的成膜面形成薄膜, 前述磁石裝置,係細長且具有長度方向,在前述長度方向的兩端係分別配置有可變磁力部,在前述可變磁力部之間係配置有固定磁力部, 前述固定磁力部,係具有: 由沿著前述長度方向來配置的細長的永久磁石所成的第一、第二中央外側部; 及由沿著前述長度方向來配置於前述第一、第二中央外側部之間的細長的永久磁石所成的中央內側部, 前述可變磁力部,係具有: 由沿著前述長度方向來配置的細長的永久磁石所成的第一、第二端外側部; 由沿著前述長度方向來配置於前述第一、第二端外側部之間的複數個的可變磁石所成的端內側部;及 位於前述磁石裝置的前述長度方向的兩端,連接前述第一、第二端外側部的端部彼此間之細長且彎曲的永久磁石所成的連接部, N極與S極之中,若將任一方的極性的磁極設為第一極,將另一方的極性的磁極設為第二極,則前述第一、第二中央外側部,前述第一、第二端外側部,及前述連接部,係前述第一極的磁極會朝向前述陰極電極, 前述中央內側部及前述端內側部係前述第二極的磁極會朝向前述陰極電極, 前述可變磁石係具有:磁芯部,及具有被捲繞於前述磁芯部的周圍的線圈,若激磁電流流動,則形成磁場的電磁石部, 前述可變磁石所形成的磁場的方向與強度,係被構成可依據前述激磁電流的流動的方向與大小來變更, 若形成前述薄膜的前述成膜對象物的片數增加,則使前述可變磁石所形成的磁場的強度增加。 本發明為一種薄膜製造方法,係利用標靶裝置,該標靶裝置係設有: 陰極電極; 濺射標靶,其係被配置於前述陰極電極的一面,露出於真空槽內的濺射面會被濺射;及 複數的細長的磁石裝置,其係被配置於前述陰極電極的面之中與前述一面相反側的面,在前述濺射面上形成磁場, 將前述濺射標靶濺射,在位於前述真空槽內的成膜對象物的成膜面形成薄膜, 在各前述磁石裝置的兩端部,配置可變磁石,該可變磁石係具有永久磁石及電磁石,形成合成前述永久磁石所形成的磁場與激磁電流流動而前述電磁石所形成的磁場之磁場, 控制流至前述電磁石的前述激磁電流的方向及大小,依據形成前述薄膜的前述成膜對象物的片數的增加來縮小前述可變磁石所形成的磁場強度。 [發明的效果]The present invention developed to achieve the above-mentioned purpose is a sputtering device having a target device, which is provided with: a cathode electrode; a sputtering target, which is arranged on one side of the cathode electrode, and the sputtering surface exposed in the vacuum tank will be sputtered; and a magnet device, which is arranged on the surface of the cathode electrode opposite to the one side, and forms a magnetic field on the sputtering surface. If the sputtering target is sputtered, a thin film is formed on the film forming surface of the film forming object located in the vacuum tank. The magnet device , is thin and long and has a length direction, and variable magnetic parts are respectively arranged at both ends of the aforementioned length direction, and a fixed magnetic part is arranged between the aforementioned variable magnetic parts. The aforementioned fixed magnetic part has: a first and a second central outer part formed by thin and long permanent magnets arranged along the aforementioned length direction; and a central inner part formed by thin and long permanent magnets arranged between the aforementioned first and second central outer parts along the aforementioned length direction. The aforementioned variable magnetic part has: The first and second end outer parts are formed by a thin and long permanent magnet; the end inner part is formed by a plurality of variable magnets arranged between the first and second end outer parts along the aforementioned length direction; and the connecting part is formed by the thin and long and curved permanent magnets connecting the ends of the first and second end outer parts at both ends of the aforementioned length direction of the aforementioned magnet device. If the magnetic pole of the polarity of either N pole or S pole is set as the first pole and the magnetic pole of the polarity of the other pole is set as the second pole, then the first and second center outer parts are The side, the first and second end outer parts, and the connecting part are such that the magnetic pole of the first pole will face the cathode electrode. The central inner part and the end inner part are such that the magnetic pole of the second pole will face the cathode electrode. The variable magnet has: a core part, and a coil wound around the core part. If the excitation current flows, the electromagnetic part forms a magnetic field. The direction and strength of the magnetic field formed by the variable magnet are configured to be variable according to the direction and magnitude of the flow of the excitation current. In the sputtering device of the present invention, the magnetic core of at least one of the variable magnets has a base magnetic portion formed by a permanent magnet, and the strength of the magnetic field formed by the variable magnet is the strength of the magnetic field formed by synthesizing the magnetic field of the base magnetic portion and the magnetic field of the electromagnetic portion. In the sputtering device of the present invention, the magnetic pole of the first pole of the base magnetic portion faces the cathode electrode. In the sputtering device of the present invention, the magnetic pole of the second pole of the base magnetic portion faces the cathode electrode. In the sputtering device of the present invention, the strength of the magnetic field formed by the variable magnet can be changed during the period when the sputtering target is sputtered. In the sputtering device of the present invention, the sputtering target and the magnet device are configured to reciprocate relative to each other. In the sputtering device of the present invention, the target device has: One cathode electrode; The sputtering target disposed on one cathode electrode; and A plurality of magnet devices disposed parallel to each other. The present invention is a sputtering device having a plurality of magnet devices, wherein the plurality of magnet devices are disposed parallel to each other and arranged in a row, and Among the arranged magnet devices, the number of variable magnets of the magnet devices at both ends is greater than the number of variable magnets of the magnet devices at other positions. The present invention is a sputtering device having a plurality of target devices. In the sputtering device of the present invention, the target device comprises: The cathode electrode formed into a cylindrical shape; The cylindrical sputtering target arranged on the outer periphery of the cathode electrode; and The magnet device arranged in the area surrounded by the cathode electrode. In the sputtering device of the present invention, the variable magnet is arranged in a box, and a cooling medium flows in a cooling medium path provided in the box to cool the variable magnet. The present invention is a thin film manufacturing method, which is a thin film manufacturing method for controlling a sputtering device to form a thin film on a film-forming object. The sputtering device has a target device, which is provided with: a cathode electrode; a sputtering target, which is arranged on one side of the cathode electrode, and the sputtering surface exposed in the vacuum tank will be sputtered; and a magnet device, which is arranged on the surface of the cathode electrode on the opposite side of the surface, and forms a magnetic field on the sputtering surface. If the sputtering target is sputtered, a thin film is formed on the film-forming surface of the film-forming object located in the vacuum tank. The aforementioned magnet device is thin and long and has a length direction. The variable magnetic force parts are respectively arranged at both ends of the aforementioned length direction, and the fixed magnetic force part is arranged between the aforementioned variable magnetic force parts. The aforementioned fixed magnetic force part has: the first and second central outer parts formed by the thin and long permanent magnets arranged along the aforementioned length direction; and the central inner part formed by the thin and long permanent magnets arranged between the first and second central outer parts along the aforementioned length direction. The aforementioned variable magnetic force part has: the thin and long permanent magnets arranged along the aforementioned length direction. The first and second end outer parts; The end inner parts formed by a plurality of variable magnets arranged between the first and second end outer parts along the aforementioned length direction; and The connecting parts formed by the elongated and curved permanent magnets connecting the ends of the first and second end outer parts at both ends of the aforementioned length direction of the aforementioned magnet device, If the magnetic pole of the polarity of either N pole or S pole is set as the first pole and the magnetic pole of the polarity of the other pole is set as the second pole, then the first and second central outer parts, the first and second end outer parts, and the connecting parts are the aforementioned first and second central outer parts. The magnetic pole of one pole will face the cathode electrode, The magnetic pole of the central inner part and the end inner part is the second pole and will face the cathode electrode, The variable magnet has: a core part, and a coil wound around the core part, and if the excitation current flows, the electromagnetic magnet part forms a magnetic field, The direction and strength of the magnetic field formed by the variable magnet are configured to be variable according to the direction and magnitude of the flow of the excitation current, If the number of the film-forming objects forming the thin film increases, the strength of the magnetic field formed by the variable magnet is reduced. The present invention is a thin film manufacturing method, which is a thin film manufacturing method for controlling a sputtering device to form a thin film on a film-forming object. The sputtering device has a target device, which is provided with: a cathode electrode; a sputtering target, which is arranged on one side of the cathode electrode, and the sputtering surface exposed in the vacuum tank will be sputtered; and a magnet device, which is arranged on the surface of the cathode electrode on the opposite side of the surface, and forms a magnetic field on the sputtering surface. If the sputtering target is sputtered, a thin film is formed on the film-forming surface of the film-forming object located in the vacuum tank. The aforementioned magnet device is thin and long and has a length direction. The variable magnetic force parts are respectively arranged at both ends of the aforementioned length direction, and the fixed magnetic force part is arranged between the aforementioned variable magnetic force parts. The aforementioned fixed magnetic force part has: the first and second central outer parts formed by the thin and long permanent magnets arranged along the aforementioned length direction; and the central inner part formed by the thin and long permanent magnets arranged between the first and second central outer parts along the aforementioned length direction. The aforementioned variable magnetic force part has: the thin and long permanent magnets arranged along the aforementioned length direction. The first and second end outer parts; The end inner parts formed by a plurality of variable magnets arranged between the first and second end outer parts along the aforementioned length direction; and The connecting parts formed by the thin and curved permanent magnets located at both ends of the aforementioned length direction of the aforementioned magnet device, connecting the ends of the aforementioned first and second end outer parts. Among the N pole and the S pole, if the magnetic pole of the polarity of either side is set as the first pole and the magnetic pole of the polarity of the other side is set as the second pole, then the aforementioned first and second central outer parts, the aforementioned first and second end outer parts, and the aforementioned connecting parts are the aforementioned first and second central outer parts. The magnetic pole of one pole will face the cathode electrode, The magnetic pole of the central inner part and the end inner part is the second pole and faces the cathode electrode, The variable magnet has: a core part, and a coil wound around the core part, and if the excitation current flows, the electromagnetic magnet part forms a magnetic field, The direction and strength of the magnetic field formed by the variable magnet are configured to be variable according to the direction and magnitude of the flow of the excitation current, If the number of the film-forming objects forming the thin film increases, the strength of the magnetic field formed by the variable magnet increases. The present invention is a method for manufacturing a thin film, which utilizes a target device, and the target device is provided with: a cathode electrode; a sputtering target, which is arranged on one side of the cathode electrode, and the sputtering surface exposed in the vacuum chamber will be sputtered; and a plurality of elongated magnet devices, which are arranged on the surface of the cathode electrode opposite to the one side, and form a magnetic field on the sputtering surface, sputter the sputtering target, and sputter the film forming object in the vacuum chamber. A film is formed on the film-forming surface of the object. At both ends of each of the aforementioned magnetic devices, a variable magnet is arranged. The variable magnet has a permanent magnet and an electromagnetic magnet, and forms a magnetic field that synthesizes the magnetic field formed by the aforementioned permanent magnet and the magnetic field formed by the aforementioned electromagnetic magnet when the excitation current flows. Control the direction and magnitude of the aforementioned excitation current flowing to the aforementioned electromagnetic magnet, and reduce the magnetic field intensity formed by the aforementioned variable magnet according to the increase in the number of sheets of the aforementioned film-forming object forming the aforementioned film. [Effect of the invention]
根據濺射標靶或個別標靶的成膜面內的場所之濺射量的差變小。The difference in the sputtering amount at each location within the film formation surface of the sputtering target or each target becomes smaller.
可變磁石具有電磁石部及基礎磁力部時,即使激磁電流不流動至電磁石部時,也可繼續進行濺射。When the variable magnet has an electromagnetic part and a base magnetic part, sputtering can continue even when the exciting current does not flow to the electromagnetic part.
<濺射裝置>
參照圖1及圖2,圖1的符號2是表示本發明的濺射裝置。<Sputtering device>
Referring to Fig. 1 and Fig. 2,
此濺射裝置2是具有真空槽25及標靶裝置5。The
標靶裝置5是具有:板狀的一片的陰極電極21,被配置於陰極電極21的一面的一片的濺射標靶14,及被配置於陰極電極21的與濺射標靶14相反側的面的一個乃至複數個的磁石裝置301
、311
~314
、302
(圖3(a)~(c))。The
在真空槽25的內部是配置有成膜對象物13,濺射標靶14的被濺射的濺射面24與成膜對象物13的形成薄膜的成膜面22是相對面。The
成膜對象物13在此是被配置於載置台23上,對於濺射標靶14而言是靜止,但亦可為成膜對象物13或濺射標靶14的任一方或雙方移動於真空槽25的內部。The
真空槽25是連接氣體源26及真空排氣裝置29,使真空排氣裝置29動作,將真空槽25的內部真空排氣而於真空槽25的內部形成真空環境之後,從氣體源26導入濺射氣體至真空槽25的內部。The
陰極電極21是被連接至濺射電源28,可從濺射電源28施加濺射電壓。濺射標靶14是緊貼於陰極電極21而配置。後述的其他的陰極電極161
~166
也被連接至濺射電源28,可施加濺射電壓。The
一片的陰極電極21的兩面之中,在與配置有濺射標靶14的面相反側的面,如圖3(a)所示般,配置有一乃至複數個的磁石裝置301
、311
~314
、302
。圖3(b)是同圖(a)的A1
-A1
線截斷剖面圖,圖3(c)是同圖(a)的B1
-B1
線截斷剖面圖。As shown in Fig. 3(a), one or more magnet devices 30 1 , 31 1 to 31 4 , 30 2 are arranged on the opposite side of the surface where the
圖3(a)~(c)的濺射標靶14是形成長方形形狀或正方形形狀的直角四邊形形狀。The
後述的圖6(a)、(b)的標靶裝置60是具有:
圓筒形形狀的陰極電極61;及
被配置於圓筒形形狀的陰極電極61的外周面的圓筒形形狀的濺射標靶64,
圓筒形形狀的陰極電極61會位於圓筒形形狀的濺射標靶64的內周側的區域內,在圓筒形形狀的陰極電極61的內周側,以圓筒形形狀的陰極電極61所包圍的區域,配置有圖5(b)、(c)所示的磁石裝置32。The
在此,被配置於上述的直角四邊形形狀的濺射標靶14的磁石裝置301
、311
~314
、302
及被配置於圓筒形形狀的陰極電極61內的磁石裝置32是分別為細長,具有長度方向,若將各磁石裝置301
、311
~314
、302
、32的長度方向稱為主方向,則各磁石裝置301
、311
~314
、302
、32是配置為主方向會與平板形形狀的濺射標靶14的二邊、或圓筒形形狀的濺射標靶64的中心軸線平行。Here, the magnet devices 30 1 , 31 1 ~31 4 , 30 2 arranged in the above-mentioned
因此,具有複數的磁石裝置301
、311
~314
、302
時,各磁石裝置301
、311
~314
、302
是互相平行配置。平板形形狀的濺射標靶14是與主方向平行的邊的長度會比和主方向呈直角的邊的長度更長。Therefore, when there are a plurality of magnet devices 30 1 , 31 1 -31 4 , 30 2 , the magnet devices 30 1 , 31 1 -31 4 , 30 2 are arranged parallel to each other. The length of the side of the
<磁石裝置>
各磁石裝置301
、311
~314
、302
、32是分別具有:長度方向會沿著主方向來配置的細長的薄板的軛39、40。軛39、40是以高透磁率材料所形成。具有複數的磁石裝置301
、311
~314
、302
時,各軛39是可配置於同一平面,又,可配置於不同的平面上。<Magnetic Device> Each magnetic device 30 1 , 31 1 to 31 4 , 30 2 , 32 has a
各磁石裝置301
、311
~314
、302
、32是具有:分別具有長度方向的可變磁力部53a、53b、54a、54b,及固定磁力部51、52。Each of the magnet devices 30 1 , 31 1 to 31 4 , 30 2 , and 32 includes variable
可變磁力部53a、53b、54a、54b為細長,具有長度方向,其長度方向會沿著主方向來配置於各磁石裝置301
、311
~314
、302
、32的兩端。The variable
固定磁力部51、52是其長度方向會沿著主方向來配置於兩端的二個的可變磁力部53a、53b、54a、54b之間。可變磁力部53a、53b、54a、54b與固定磁力部51、52是被配置於一直線上。The fixed
固定磁力部51、52是具有分別由細長的永久磁石所成的第一中央外側部35a、36a,第二中央外側部35b、36b及中央內側部33、34。The fixed
第一中央外側部35a、36a及第二中央外側部35b、36b是其長度方向會沿著主方向來配置,第一中央外側部35a、36a及第二中央外側部35b、36b的兩端是以一方不會比另一方更突出的方式使一致。The first central
中央內側部33、34是其長度方向會沿著主方向來配置於第一中央外側部35a、36a與第二中央外側部35b、36b之間。The central
可變磁力部53a、53b、54a、54b是分別具有:由細長的永久磁石所成的第一端外側部37a、38a與第二端外側部37b、38b,及由細長彎曲形形狀或折線形形狀的永久磁石所成的連接部37c、38c,以及由被配置於一直線上的複數個的可變磁石47所成的端內側部43、44。The variable
第一端外側部37a、38a及第二端外側部37b、38b是其長度方向會沿著主方向來配置,一方的端部是一致朝向固定磁力部51、52,另一方的端部是分別連接連接部37c、38c的端部。因此,第一端外側部37a、38a與第二端外側部37b、38b是藉由連接部37c、38c來連接,形成U字形形狀的永久磁石部材37、38。The first end
端內側部43、44是其長度方向會沿著主方向來配置於第一端外側部37a、38a與第二端外側部37b、38b之間。The
<可變磁石>
參照圖2(a)、(b),可變磁石47是具有:由永久磁石所成的基礎磁力部71、及由絕緣被覆配線被捲繞成螺旋狀的線圈所成的電磁石部73。<Variable magnet>
Referring to Fig. 2 (a) and (b), the
在真空槽25的外部是配置有激磁電源18,電磁石部73是藉由配線75來連接至激磁電源18,激磁電源18所輸出的激磁電流會流動而在電磁石部73的兩端產生彼此相反極性的磁極。An
圖2(a)的可變磁石47是被配置為基礎磁力部71會被插通於電磁石部73的內部,電磁石部73會捲繞基礎磁力部71,被配置為連結基礎磁力部71的彼此相反極性的磁極的中心之直線與連結電磁石部73所使產生的彼此相反極性的磁極的中心之直線會一致。其結果,基礎磁力部71所形成的磁場與電磁石部73所形成的磁場會互相重疊。符號70是連結彼此相反極性的磁極的中心之直線。The
電磁石部73的磁極的極性是依據流至電磁石部73的激磁電流的方向而變。The polarity of the magnetic pole of the
另外,具有複數的軛39時,各軛39是按各磁石裝置301
、311
~314
、302
個別地彼此分離配置,軛39的長度方向是沿著主方向而配置為長度方向兩端會一致。When there are a plurality of
各磁石裝置301
、311
~314
、302
、32的永久磁石及電磁石是被配置於軛39、40與陰極電極21、61之間。The permanent magnets and electromagnetic magnets of the magnet devices 30 1 , 31 1 - 31 4 , 30 2 , 32 are disposed between the
可變磁石47是被固定於軛39、40上,若將被固定於可變磁石47的軛39、40的面設為底面,且將與底面相反側的面設為上端面,則基礎磁力部71的磁極是N極與S極的二個的極性之中,一方的極性的磁極會位於底面側,另一方的極性的磁極會位於上端面側。
有關電磁石部73所使產生的磁極也是一方的極性的磁極會被形成於軛39、40側,另一方的極性的磁極會被形成於陰極電極21、61側。
在與軛39、40的位置相反側是位有陰極電極21、61。The
因此,將基礎磁力部71所形成的磁場與電磁石部73所使產生的磁場合成後的磁場的方向和強度會成為可變磁石47所形成的磁場的方向和強度。Therefore, the direction and intensity of the magnetic field formed by the basic
激磁電源18是被連接至控制裝置12,激磁電源18所供給至電磁石部73的激磁電流是流動的方向與大小會藉由控制裝置12來控制。The
雖激磁電流的方向有二方向,但流動於哪個的方向的情況皆流動電磁石部73所形成的磁場強度不會比基礎磁力部71所形成的磁場強度更強的大小的激磁電流。Although the excitation current flows in two directions, no matter which direction the excitation current flows, the magnetic field strength formed by the flowing
一方向的方向的激磁電流流至電磁石部73,在電磁石部73產生的磁極之中,朝向軛39、40的磁極的極性與朝向基礎磁力部71的軛39、40的磁極的極性一致時,在電磁石部73產生的磁極之中,朝向與軛39、40的位置相反側的陰極電極21、61之磁極的極性會與朝向與基礎磁力部71的軛39、40的位置相反側的陰極電極21、61之磁極的極性一致。When an excitation current in one direction flows to the
此情況是基礎磁力部71所形成的磁場強度與電磁石部73所形成的磁場強度會被加算,可變磁石47的磁場強度是比基礎磁力部71的磁場強度更大。In this case, the magnetic field strength formed by the basic
相反的,相反方向的方向的激磁電流流至電磁石部73,在電磁石部73產生的磁極之中,朝向軛39、40的磁極的極性與朝向基礎磁力部71的軛39、40的磁極的極性形成相反極性時,在電磁石部73產生的磁極之中,朝向與軛39、40的位置相反側的磁極的極性也與朝向與基礎磁力部71的軛39、40的位置相反側的磁極的極性形成相反極性。On the contrary, when the excitation current in the opposite direction flows to the
此情況是從基礎磁力部71所形成的磁場強度減算電磁石部73所形成的磁場強度,可變磁石47的磁場強度是比基礎磁力部71的磁場強度更小。In this case, the magnetic field strength formed by the
另外,作為可變磁石47的磁芯,亦可取代永久磁石,使用高透磁率的材料。並且,在基礎磁力部71使用永久磁石時,亦可將永久磁石的哪個的磁極朝向標靶方向。而且,藉由控制激磁電流的方向或電流値,可加強或可減弱基礎磁力部71的磁場強度。In addition, as the core of the
圖2(b)是在電磁石部73之中,插入以高透磁率且不易形成永久磁石的材料所形成的磁芯72,藉由電磁石部73的配線來捲繞磁芯72,在電磁石部73的外部配置基礎磁力部71而形成可變磁石47者。FIG2(b) shows a
圖2(a)、(b)的哪個的情況皆是以連結電磁石部73所形成的磁極的中心彼此間的直線70會通過基礎磁力部71的二個的磁極的中心之方式配置電磁石部73及基礎磁力部71。In both the cases of FIG. 2( a ) and ( b ), the
被配置於可變磁力部53a、53b、54a、54b的複數的可變磁石47之中、亦可將幾個的磁芯設為永久磁石,將其他的磁芯形成高透磁率的材料。而且,可變磁力部53a、53b、54a、54b是只要具有至少一個的可變磁石47即可,亦可為可變磁石47與永久磁石的組合。而且,不被限定於最端部為可變磁石47的情況。Among the plurality of
<永久磁石>
在各磁石裝置301
、311
~314
、302
、32中所含的永久磁石是分別被固定於按各磁石裝置301
、311
~314
、302
、32所設的軛39、40上,若將被固定於永久磁石的軛39、40的面設為底面,將位於底面的相反側的面設為上端面,則磁極會分別位於底面與上端面。<Permanent magnet> The permanent magnet included in each magnet device 30 1 , 31 1 to 31 4 , 30 2 , 32 is fixed to the
S極與N極之中,若將任一方的極性設為第一極,將另一方的極性設為第二極,則各磁石裝置301
、311
~314
、302
、32之中,第一中央外側部35a、36a,第二中央外側部35b、36b,第一端外側部37a、38a,第二端外側部37b、38b,及連接部37c、38c之中的永久磁石是相同的極性之第一極的磁極會朝向軛39、40側,與該第一極相反極性的第二極的磁極會朝向陰極電極21、61。If the polarity of one of the S pole and the N pole is set as the first pole and the polarity of the other is set as the second pole, then in each of the magnetic devices 30 1 , 31 1 ~ 31 4 , 30 2 , 32 , the permanent magnets in the first central
端內側部43、44的可變磁石47,中央內側部33、34,及端內側部43、44之中的永久磁石是與第一中央外側部35a、36a,第二中央外側部35b、36b,第一端外側部37a、38a,第二端外側部37b、38b,及連接部37c、38c相反極性的磁極會分別朝向軛39、40及陰極電極21。The
因此,第一極的磁極及第二極的磁極會朝向陰極電極21、61,在濺射標靶14、64的濺射面24、66上形成拱形形狀的磁力線,捕捉電子。Therefore, the magnetic poles of the first pole and the second pole face the
真空槽25的內部會藉由真空排氣裝置29來真空排氣,形成真空環境之後,從氣體源26導入濺射氣體至真空槽25的內部,電壓會被施加於陰極電極21、61而從濺射面24、66放出電子。The interior of the
磁石裝置301 、311 ~314 、302 、32會藉由被形成於濺射面24、66上的磁場來捕捉電子而濺射氣體的電漿會高效率地形成於濺射面24、66的附近。The magnet devices 30 1 , 31 1 to 31 4 , 30 2 , and 32 capture electrons by the magnetic field formed on the sputtering surfaces 24 and 66 , and plasma of the sputtering gas is efficiently formed near the sputtering surfaces 24 and 66 .
第一中央外側部35a、36a,第二中央外側部35b、36b,第一端外側部37a、38a,第二端外側部37b、38b,及連接部37c、38c是被配置成環狀,藉由第一中央外側部35a、36a,第二中央外側部35b、36b,第一端外側部37a、38a,第二端外側部37b、38b,及連接部37c、38c來形成環狀的磁石部,又,若中央內側部33、34與端內側部43、44是被配置於同一直線上,形成直線狀的磁石部,則直線狀的磁石部是被配置於環狀的磁石部的內側。The first central
<侵蝕區域(erosion area)>
濺射面24、66上的電漿是在環狀的磁石部與直線狀的磁石部之間的環狀的區域,強度變大,在濺射面24上大量地被濺射的部分是按各磁石裝置301
、311
~314
、302
、32,電漿強度大的環狀的區域。此區域是被稱為侵蝕區域。<Erosion area> The plasma on the sputtering
尤其平板形形狀的濺射標靶14是外周附近的區域會容易多量地被濺射,在圓筒形形狀的濺射標靶64是長度方向兩端的區域會容易多量地被濺射。
濺射面24的區域之中、多量地被濺射的區域與磁石裝置301
、311
~314
、302
、32之間的距離是比只少量被濺射的區域與磁石裝置301
、311
~314
、302
、32之間的距離更短,因為多量地被濺射的區域的濺射面24上的磁場強度變強,所以更多量地被濺射。In particular, the area near the outer periphery of the flat-plate-shaped
在平板形形狀的濺射標靶14中,可變磁石47是被配置於磁極朝向濺射標靶14的外周附近的配置,在圓筒形形狀的濺射標靶64中,可變磁石47是被配置於磁極朝向濺射標靶64的兩端附近的場所。
因此,侵蝕區域是外周附近或兩端附近比濺射標靶14、64的中央附近更深。In the
形成薄膜的成膜對象物13的片數是藉由控制裝置12來計數,若形成薄膜的成膜對象物13的片數增加,則控制裝置12會控制激磁電流的方向與大小,使可變磁石47所形成的磁場強度變小,即使侵蝕區域的深度比中央更深,可變磁石47形成於濺射面24的磁場強度也是形成一定,外周附近的濺射量不會變多。The number of sheets of the film-forming
此情況,例如,在可變磁石47之中,電磁石部73的磁極與基礎磁力部71的磁極之中,將朝向陰極電極21的磁極設為同極性來增強可變磁石47所形成的磁場強度,按照在濺射裝置2形成薄膜的成膜對象物13的片數的增加來使激磁電流減少,按照片數的增加來使可變磁石47所形成的磁場強度減少。In this case, for example, in the
激磁電流的大小形成零之後,使激磁電流的流動的方向反轉,將電磁石部73與基礎磁力部71的朝向陰極電極21的磁極設為相反極性,按照片數的增加,依據電磁石部73所形成的磁場強度來減弱基礎磁力部71所形成的磁場強度,若可變磁石47所形成的磁場強度按照片數的增加而減少,則多量地被濺射的部分會隨著接近磁石裝置301
、311
~314
、302
、32而磁場強度變小,因此在接近濺射面24的外周的區域與其內側的區域之間的濺射量會形成均一。After the magnitude of the exciting current becomes zero, the direction of the flow of the exciting current is reversed, and the magnetic poles of the
因此,基礎磁力部71所形成的磁場強度是電磁石部73所不形成地完成,因此激磁電流小而完成,可變磁石47的發熱會減少。其結果,電流消費量會減少,發熱會減少。並且,即使發生激磁電流不流動的事故時,基礎磁力部71所形成的磁場也不消滅,所以可繼續進行濺射,因此裝置的可靠度會提升。Therefore, the magnetic field strength formed by the base
但,亦可從一開始就使電磁石部73的磁場形成於使基礎磁力部71的磁場減少的方向,不使方向變化地使激磁電流增加,按照薄膜形成的片數增加來增大電磁石部73的磁場強度,藉此縮小可變磁石47的磁場強度。However, it is also possible to form the magnetic field of the
本發明不是被限定於縮小全部的可變磁石47的磁場強度的情況,考慮在濺射面內的侵蝕區域的分佈的情況等,在複數的可變磁石47之中,設有使磁場強度減少的可變磁石47及使磁場強度增加的可變磁石47的雙方的情況也含在本發明中。The present invention is not limited to the case of reducing the magnetic field strength of all
各磁石裝置301
、311
~314
、302
、32是彼此平行地排列成一列。被配置於平面上的各磁石裝置301
、311
~314
、302
的兩端是分別被整齊為排列於一直線上。另一方,被配置於圓筒的陰極電極61內的磁石裝置32是沿著與陰極電極61剖面的圓同心且半徑比該圓更小的圓來排列。Each magnet device 30 1 , 31 1 to 31 4 , 30 2 , 32 is arranged in parallel to each other in a row. Both ends of each magnet device 30 1 , 31 1 to 31 4 , 30 2 arranged on a plane are aligned to be arranged in a straight line. On the other hand, the
當複數的磁石裝置301
、311
~314
、302
彼此平行地排列成一列時,排列成一列的磁石裝置301
、311
~314
、302
之中,位於兩端的二個的磁石裝置301
、302
的可變磁力部53a、53b的可變磁石47的個數是比位於其他的場所的磁石裝置311
~314
的可變磁力部54a、54b的可變磁石47的個數更多,濺射面24之中,在與主方向平行的邊附近的區域的濺射量會被調整。When a plurality of magnet devices 30 1 , 31 1 ~ 31 4 , 30 2 are arranged in a row parallel to each other, the number of
<磁石裝置的移動>
另外,複數的磁石裝置301
、311
~314
、302
是被固定於移動板45。在真空槽25的外部是配置有馬達等的驅動裝置19,若移動板45藉由驅動裝置19來移動,則各磁石裝置301
、311
~314
、302
會彼此一起地移動。<Movement of Magnetic Devices> The plurality of magnetic devices 30 1 , 31 1 to 31 4 , and 30 2 are fixed to the moving
有關被配置於圓筒形形狀的陰極電極61之中的磁石裝置32的移動是後述。The movement of the
平板形形狀的濺射標靶14的情況,若將對於主方向垂直,對於濺射面24平行的方向設為垂直方向(此情況的濺射面24是未被濺射,未形成有侵蝕區域的狀態的情況),如圖3(a)~(c)所示般配置的濺射標靶14的垂直方向的長度是比排列磁石裝置301
、311
~314
、302
的區域的垂直方向的長度更長,移動板45是藉由驅動裝置19來往復移動於沿著垂直方向的方向,電漿強的區域會被移動由濺射面24上。In the case of a flat-plate-shaped
<其他的例子>
圖3(a)的濺射標靶14是由成膜材料所成的一片的板,陰極電極21是一片的電極板,但本發明的濺射裝置2的其他的例子是如圖4(a)般,具有複數的標靶裝置101
、111
~114
、102
。各標靶裝置101
、111
~114
、102
是分別具有個別的細長的陰極電極161
~166
,在各陰極電極161
~166
的一面是分別配置有濺射標靶151
~156
,在相反側的面是分別配置有上述的磁石裝置301
、311
~314
、302
。<Other Examples> The sputtering
複數的各陰極電極161 ~166 是在相同的平面上彼此平行地分離而配置。The plurality of cathode electrodes 16 1 to 16 6 are arranged separately and parallel to each other on the same plane.
圖4(b)是同圖(a)的A2
-A2
線截斷剖面圖,圖4(c)是同圖(a)的B2
-B2
線截斷剖面圖。在圖3(a)與圖4(a)中,移動板45,陰極電極21、161
~166
及軛39會被省略。Fig. 4(b) is a cross-sectional view taken along line A2 - A2 of Fig. 4(a), and Fig. 4(c) is a cross-sectional view taken along line B2 - B2 of Fig. 4(a). In Fig. 3(a) and Fig. 4(a), the moving
<圓筒形形狀> 圖5(a)的符號60是其他的構造的標靶裝置,將其A3 -A3 線截斷剖面圖顯示於圖6(a),將B3 -B3 線截斷剖面圖顯示於同圖(b)。<Cylindrical Shape> Reference numeral 60 in FIG. 5( a ) denotes a target device of another structure, and a cross-sectional view thereof taken along line A 3 -A 3 is shown in FIG. 6( a ), and a cross-sectional view taken along line B 3 -B 3 is shown in FIG. 6( b ).
此標靶裝置60是如上述般具有:
圓筒形形狀的陰極電極61;及
被配置於陰極電極61的外周面的圓筒形形狀的濺射標靶64,
陰極電極61會位於濺射標靶64的內周側的區域內。As described above, the
在圓筒形形狀的陰極電極61的內周側,以陰極電極61所包圍的區域是配置有圖5(b)所示的磁石裝置32。同圖(c)是同圖(b)的C-C線截斷剖面圖。The
此磁石裝置32是具有軛40,在軛40上是配置有上述的固定磁力部52及可變磁力部54a、54b。固定磁力部52及可變磁力部54a、54b是如上述般構成,但磁石裝置32內的磁極是以和陰極電極61的內周面對面的方式,在軛40設有傾斜面或連接面。This
軛40是被設於台座58,台座58是被安裝於支持軸56,該支持軸56是被安裝於旋轉軸57。The
圓筒形形狀的陰極電極61的中心軸線與圓筒形形狀的濺射標靶64的中心軸線是一致,圖5(a)的符號74是表示其中心軸線,中心軸線74所延伸的方向會形成主方向。The central axis of the
旋轉軸57的旋轉軸線是與陰極電極61的中心軸線74和濺射標靶64的中心軸線74一致,若旋轉軸57藉由驅動裝置來旋轉,則磁石裝置32是以中心軸線74為中心旋轉。The rotation axis of the
此時,磁石裝置32內的磁極與陰極電極61之間的距離是不變化,磁場強度為一定的情況,可變磁力部54a、54b上的濺射量會增加。本發明是控制可變磁石47所形成的磁場強度,按照處理對象物的處理片數來使可變磁力部54a、54b所形成的磁場強度減少,藉由磁場強度的變更來彌補濺射標靶64的濺射面66與磁石裝置32之間的距離的不均一,濺射標靶64的表面會被均一地濺射。At this time, the distance between the magnetic pole and the
上述可變磁石47是被配置於設有圖7所示的冷媒路69a、69b的盒67的內部而作為單元68,從供給管63a、63b供給冷卻媒體至冷媒路69a、69b而將冷卻媒體流動於冷媒路69a、69b之中,使吸收熱的冷卻媒體從排出管65a、65b排出至盒67的外部,藉由配置於真空槽25的外部的冷卻裝置20來冷卻,若藉由從供給管63a、63b回到盒67的冷媒路69a、69b來使冷卻媒體循環,則可使激磁電流增加。The
雖亦可按每個可變磁石47配置於不同的盒67,但將複數個的可變磁石47配置於相同的盒67的內部,較可減少供給管63a、63b或排出管65a、65b。Although each
2:濺射裝置
5,101,111~114,102,60:標靶裝置
13:成膜對象物
14,151~156,64:濺射標靶
161~166,21,61:陰極電極
18:激磁電源
22:成膜面
24,66:濺射面
25:真空槽
301,311~314,302,32:磁石裝置
33,34:中央內側部
35a,36a:第一中央外側部
35b,36b:第二中央外側部
37a,38a:第一端外側部
37b,38b:第二端外側部
37c,38c:連接部
43,44:端內側部
47:可變磁石
51,52:固定磁力部
53a,53b,54a,54b:可變磁力部
67:盒
71:基礎磁力部
73:電磁石部2: Sputtering
[圖1]是用以說明本發明的濺射裝置的圖面。 [圖2(a)、(b)]是用以說明本發明的可變磁石的圖面。 [圖3(a)~(c)]是用以說明本發明之一例的標靶裝置的圖面。 [圖4(a)~(c)]是用以說明本發明的其他的例子的標靶裝置的圖面。 [圖5(a)]是用以說明本發明的其他的例子的標靶裝置的圖面,(b)、(c)是用以說明被用在該標靶裝置的磁石裝置的圖面。 [圖6(a)、(b)]是用以說明本發明的其他的例子的標靶裝置的剖面圖。 [圖7]是用以說明供以冷卻可變磁石的盒的圖面。 [圖8(a)、(b)]是用以說明被用在以往技術的濺射裝置的標靶裝置的圖面。[Figure 1] is a diagram for explaining the spitting device of the present invention. [Figure 2 (a), (b)] is a diagram for explaining the variable magnet of the present invention. [Figure 3 (a) ~ (c)] is a diagram for explaining a target device of one example of the present invention. [Figure 4 (a) ~ (c)] is a diagram for explaining another example of the target device of the present invention. [Figure 5 (a)] is a diagram for explaining another example of the target device of the present invention, (b), (c) are diagrams for explaining the magnet device used in the target device. [Figure 6 (a), (b)] is a cross-sectional view for explaining another example of the target device of the present invention. [Figure 7] is a diagram for explaining a box for cooling the variable magnet. [FIG. 8(a), (b)] are diagrams for explaining a target device used in a sputtering device of the prior art.
5:標靶裝置 5: Target device
14:濺射標靶 14: Splash target
21:陰極電極 21: Cathode electrode
301,311:314,302:磁石裝置 30 1 ,31 1 :31 4 ,30 2 :Magnetic device
33,34:中央內側部 33,34: Central inner part
35a,36a:第一中央外側部 35a,36a: First central outer part
35b,36b:第二中央外側部 35b,36b: Second central outer part
37a,38a:第一端外側部 37a, 38a: Outer side of the first end
37b,38b:第二端外側部 37b, 38b: Outer side of the second end
37c,38c:連接部 37c,38c: Connection part
39:軛 39: yoke
43,44:端內側部 43,44: medial end
45:移動板 45:Moving board
47:可變磁石 47: Variable magnet
51,52:固定磁力部 51,52: Fixed magnetic part
53a,53b,54a,54b:可變磁力部 53a,53b,54a,54b: variable magnetic part
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09125242A (en) * | 1995-10-27 | 1997-05-13 | Anelva Corp | Cathode electrode for magnetron sputtering |
TW201104002A (en) * | 2009-07-16 | 2011-02-01 | Univ Nat Sun Yat Sen | Magnetron sputter |
US20130213805A1 (en) * | 2010-04-02 | 2013-08-22 | Dennis R. Hollars | Target utilization improvement for rotatable magnetrons |
CN107083537A (en) * | 2017-05-02 | 2017-08-22 | 霍尔果斯迅奇信息科技有限公司 | New high target utilization ratio planar magnetic control sputtering cathode |
TW201805462A (en) * | 2016-04-21 | 2018-02-16 | 應用材料股份有限公司 | Methods for coating a substrate and coater |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2907620B2 (en) | 1992-02-04 | 1999-06-21 | 株式会社日立製作所 | Magnetron electrode |
JPH0881769A (en) | 1994-09-16 | 1996-03-26 | Fujitsu Ltd | Sputtering device |
JP3934709B2 (en) * | 1996-09-11 | 2007-06-20 | キヤノンアネルバ株式会社 | Low pressure discharge sputtering apparatus and sputtering control method |
JPH1192927A (en) * | 1997-09-17 | 1999-04-06 | Hitachi Ltd | Magnetron sputtering device |
JPH11172431A (en) * | 1997-12-10 | 1999-06-29 | Sony Corp | Magnetron sputter film formation and device therefor |
JP3649933B2 (en) * | 1999-03-01 | 2005-05-18 | シャープ株式会社 | Magnetron sputtering equipment |
JP2004115841A (en) * | 2002-09-25 | 2004-04-15 | Shin Meiwa Ind Co Ltd | Magnetron sputtering electrode, film deposition system, and film deposition method |
JP2007224343A (en) * | 2006-02-22 | 2007-09-06 | Victor Co Of Japan Ltd | Magnetron sputtering device |
WO2009139434A1 (en) * | 2008-05-15 | 2009-11-19 | 国立大学法人山口大学 | Sputtering system for depositing thin film and method for depositing thin film |
JP5004931B2 (en) * | 2008-11-25 | 2012-08-22 | 株式会社アルバック | Sputtering source, sputtering apparatus, and sputtering method |
JP2012241250A (en) | 2011-05-21 | 2012-12-10 | Promatic Kk | Plasma source and method for forming thin film using the same |
JP2015001734A (en) | 2013-06-14 | 2015-01-05 | 吉村 徹三 | Method of manufacturing self-alignment optical coupling self-organization waveguide |
KR101885123B1 (en) | 2017-03-31 | 2018-08-03 | 한국알박(주) | Magnet control system of magnetron sputtering apparatus |
KR101924143B1 (en) | 2017-03-31 | 2018-11-30 | 한국알박(주) | Magnet structure, magent unit and sputtering apparatus having the same |
-
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Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09125242A (en) * | 1995-10-27 | 1997-05-13 | Anelva Corp | Cathode electrode for magnetron sputtering |
TW201104002A (en) * | 2009-07-16 | 2011-02-01 | Univ Nat Sun Yat Sen | Magnetron sputter |
US20130213805A1 (en) * | 2010-04-02 | 2013-08-22 | Dennis R. Hollars | Target utilization improvement for rotatable magnetrons |
TW201805462A (en) * | 2016-04-21 | 2018-02-16 | 應用材料股份有限公司 | Methods for coating a substrate and coater |
CN107083537A (en) * | 2017-05-02 | 2017-08-22 | 霍尔果斯迅奇信息科技有限公司 | New high target utilization ratio planar magnetic control sputtering cathode |
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