TWI838755B - 混合嵌埋封裝結構及其製作方法 - Google Patents
混合嵌埋封裝結構及其製作方法 Download PDFInfo
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- TWI838755B TWI838755B TW111119574A TW111119574A TWI838755B TW I838755 B TWI838755 B TW I838755B TW 111119574 A TW111119574 A TW 111119574A TW 111119574 A TW111119574 A TW 111119574A TW I838755 B TWI838755 B TW I838755B
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Abstract
本發明公開了一種混合嵌埋封裝結構及其製作方法,該結構包括:基板,基板設置有第一絕緣層、導通銅柱、埋芯空腔和第一線路層;第一電子器件,設置在埋芯空腔內部,端子面朝向基板底面;第二電子器件,設置在第一電子器件的背面,端子面朝基板頂面;第二絕緣層,覆蓋填充所述埋芯空腔和所述基板的上層,並露出局部第一線路層以及局部第二電子器件或者局部第一電子器件背面;第二線路層,電性連接導通銅柱和第一電子器件的端子;導線,電性連接第一線路層和第二電子器件的端子;保護罩,設置在基板的頂面。
Description
本發明涉及半導體封裝技術領域,尤其涉及一種混合嵌埋封裝結構及其製作方法。
隨著電子技術的發展與進步,電子產品朝著短小輕薄的方向演進,而電子產品的功能要求越來越強大,促進了電子產品的封裝結構朝著高度集成化、小型化的方向發展,電子器件等元器件嵌埋封裝應運而生,呈逐步替代WB封裝(引線鍵合封裝)的趨勢。但相對而言,對於I/O數較少的電子器件,與嵌埋封裝後做RDL(redistribution layer重新佈線層)相比,WB封裝的成本和加工週期更有優勢;而且部分器件的特殊應用,很難通過嵌埋封裝的方式來實現,例如LED、光電二極體等涉及光源發光或者接收光的器件,傳統方式嵌埋封裝後,器件的發光、接收光都受到影響。因此在短時間內,WB封裝仍將扮演重要的角色。
現有技術中,傳統的WB封裝方式是將電子器件等元器件通過貼裝的方式,固定於基板的表面,然後進行打線,將電子器件等元器件與基板進行電性連接,最後注塑封裝。該方法的缺點在於:電子器件等元器件貼裝於基板表面以及打線的方式都使封裝體積變大,無法滿足高密度集成、小型化的發展需求。
傳統的電子器件嵌埋封裝方法,是電子器件等元器件貼裝於預設空腔的聚合物框架或者Core材,使用塑封材料封裝後,製作RDL(redistribution layer重新佈線層)。該方法的缺點在於:對於I/O數較少的電子器件,嵌埋封裝後再做RDL,與WB封裝相比,成本更高、加工週期更長;而且由於部分器件的特殊應用,很難通過嵌埋封裝的方式來實現,例如LED、光電二極體等涉及光源發光或者接收光的器件,傳統方式嵌埋封裝後,器件的發光、接收光都受到影響。
本發明旨在至少在一定程度上解決相關技術中的技術問題之一。為此,本發明提出一種混合嵌埋封裝結構及其製作方法,通過將嵌埋封裝和WB封裝相結合的混合嵌埋封裝,使封裝體在實現高度集成化、小型化的同時,可以滿足特殊器件的特殊封裝需求,以下是對本文詳細描述的主題的概述。本概述並非是為了限制請求項的保護範圍。所述技術方案如下:
第一方面,本發明實施例提供一種混合嵌埋封裝結構製作方法,包括以下步驟:
製作基板,所述基板包括第一絕緣層,貫穿所述第一絕緣層的導通銅柱,開設在所述第一絕緣層上的埋芯空腔和與所述導通銅柱電性連接的第一線路層;
在所述基板的底部設置支撐件,所述支撐件用於預固定電子器件組件;
在所述埋芯空腔對應的所述支撐件內側預固定所述電子器件組件,所述電子器件組件包括第一電子器件和第二電子器件,所述第二電子器件設置在所述第一電子器件的背面,且所述第一電子器件的端子面朝向所述支撐件,所述第二電子器件的端子面背向所述第一電子器件;
對所述電子器件組件進行封裝,並露出局部所述第一線路層以及第二電子器件的端子,形成第二絕緣層;
去除所述支撐件;
在所述基板的底部製作第二線路層;
打線,將所述第二電子器件的端子和所述第一線路層連接。
根據本發明第一方面實施例的混合嵌埋封裝結構製作方法,至少具有以下有益效果:第一方面,本發明提出的混合嵌埋封裝結構製作方法,將嵌埋封裝與WB封裝相結合,對封裝的電子器件等元器件選擇性進行嵌埋封裝或者WB封裝(引線鍵合)的方式,可以降低生產成本、縮短加工週期;第二方面,可以將傳感、光感器件(LED、PD等)集成於基板內部,並可實現將傳感、光感器件外露,縮小封裝體積的同時,不影響傳感、光感器件發送/接收信號;第三方面,將要進行WB的第二電子器件固定於嵌埋的第一電子器件的背面,然後打線將WB第二電子器件與基板電性連接。
可選地,在本發明的一些實施例中,在所述基板的底部及至少部分所述第二線路層表面製作阻焊層;在所述第一線路層和所述第二線路層表面進行處理形成表面處理層。
可選地,在本發明的一些實施例中,還包括在所述基板的頂面施加保護罩。
可選地,在本發明的一些實施例中,所述製作基板的具體步驟包括:
準備一承載板,所述承載板從下往上依次包含核心層、第一金屬層、第二金屬層、蝕刻阻擋層和第一金屬種子層;
在所述第一金屬種子層的表面製作第一光阻層,所述第一光阻層設置有導通銅柱開窗和犧牲銅柱開窗;
在所述導通銅柱開窗和犧牲銅柱開窗位置分別製作導通銅柱和犧牲銅柱;
去除所述第一光阻層;
層壓絕緣層,覆蓋銅柱,減薄絕緣層,露出所述導通銅柱和所述犧牲銅柱端部,形成所述第一絕緣層;
在露出銅柱的表面製作第二金屬種子層;
在所述第二金屬種子層表面施加光阻材料,對光阻材料進行曝光及顯影,製作第一線路層圖形,形成第二光阻層。
線路電鍍,去除第二光阻層及外露的第二金屬種子層,形成所述第一線路層。
將所述第一金屬層和所述第二金屬層之間進行分離;
去除所述第二金屬層、蝕刻阻擋層和第一金屬種子層;
雙面施加光阻材料,對光阻材料進行曝光及顯影,覆蓋所述第一線路層及所述導通銅柱,露出所述犧牲銅柱;
去除所述犧牲銅柱,形成所述埋芯空腔。
可選地,所述第一電子器件和所述第二電子器件之間通過黏性材料連接。
可選地,所述第二電子器件的端子板還設置有感測器。
可選地,所述對所述電子器件組件進行封裝,並露出局部所述第一線路層以及第二電子器件的端子,形成第二絕緣層的具體步驟為:
使用絕緣材料對電子器件進行封裝;
對絕緣材料進行處理,露出局部所述第一線路層、所述第二電子器件的端子及所述感測器,形成第二絕緣層。
可選地,所述第二絕緣層採用的絕緣材料為感光型絕緣材料,通過對感光型絕緣材料進行曝光及顯影處理,露出局部第所述第一線路層、所述第二電子器件的端子及所述感測器,形成第二絕緣層。
可選地,所述在所述基板的底部製作第二線路層的具體步驟為:
在所述基板底面製作第三金屬種子層;
採用貼膜或者塗覆的方式在雙面施加光阻材料;
對光阻材料進行曝光及顯影,頂面整版遮蔽,底面製作第二線路層圖形,形成第五光阻層和第六光阻層;
電鍍第二線路;
去除第五光阻層和第六光阻層;
蝕刻金屬種子層,去除外露的所述第三金屬種子層,形成第二線路層。
可選地,所述第一絕緣層為純樹脂或者包含樹脂和玻纖的有機絕緣材料。
第二方面,本發明實施例提供了一種混合嵌埋封裝結構製作方法,包括以下步驟:
製作基板,所述基板包括第一絕緣層,貫穿所述第一絕緣層的導通銅柱,開設在所述第一絕緣層上的埋芯空腔和與所述導通銅柱電性連接的第一線路層;
在所述基板的底部設置支撐件;
在所述埋芯空腔對應的所述支撐件內側預固定第一電子器件,所述第一電子器件的端子面朝向所述支撐件;
對所述第一電子器件進行封裝,並露出局部所述第一線路層以及第一電子器件的背面,形成第二絕緣層,其中所述第二絕緣層在所述第一電子器件的背面形成至少兩個開窗;
去除所述支撐件;
在所述基板的底部製作第二線路層;
在所述第一電子器件背面、所述第二絕緣層的所述開窗處設置第二電子器件,所述第二電子器件的端子面背向所述第一電子器件;
打線,將所述第二電子器件的端子和所述第一線路層連接。
可選地,在本發明的一些實施例中,在所述基板的底部及至少部分所述第二線路層表面製作阻焊層;在所述第一線路層和所述第二線路層表面進行處理形成表面處理層。
可選地,在本發明的一些實施例中,還包括在所述基板的頂面施加保護罩。
根據本發明第二方面實施例的混合嵌埋封裝結構製作方法,至少具有以下有益效果:第一方面,本發明提出的混合嵌埋封裝結構製作方法,將嵌埋封裝與WB封裝相結合,對封裝的電子器件等元器件選擇性進行嵌埋封裝或者WB封裝(引線鍵合)的方式,可以降低生產成本、縮短加工週期;第二方面,可以將傳感、光感器件(LED、PD等)集成於基板內部,並可實現將傳感、光感器件外露,縮小封裝體積的同時,不影響傳感、光感器件發送/接收信號;第三方面,將要進行WB的第二電子器件固定於嵌埋的第一電子器件的背面,然後打線將WB第二電子器件與基板電性連接;第四方面,將要進行WB的第二電子器件根據需要可設置多個,每個電子元器件的類型也可以任意搭配,可相同或者不同,設計非常靈活。
第三方面,本發明實施例提供了一種混合嵌埋封裝結構,包括:
基板,所述基板包括第一絕緣層,貫穿所述第一絕緣層的導通銅柱,開設在所述第一絕緣層上的埋芯空腔和與所述導通銅柱電性連接的第一線路層;
第一電子器件,設置在所述埋芯空腔內部,且所述第一電子器件的端子面朝向基板底面;
第二電子器件,設置在所述第一電子器件的背面,且所述第二電子器件的端子面朝向基板頂面;
第二絕緣層,覆蓋填充所述埋芯空腔和所述基板的上層,並露出局部所述第一線路層以及局部所述第二電子器件或者局部第一電子器件背面;
第二線路層,設置在所述基板的底面,所述第二線路層電性連接所述導通銅柱和所述第一電子器件的端子;
導線,電性連接所述第一線路層和所述第二電子器件的端子。
根據本發明第三方面實施例的混合嵌埋封裝結構,至少具有以下有益效果:第一方面,本發明提出的混合嵌埋封裝結構製作方法,將嵌埋封裝與WB封裝相結合,對封裝的電子器件等元器件選擇性進行嵌埋封裝或者WB封裝(引線鍵合)的方式,可以降低生產成本、縮短加工週期;第二方面,可以將傳感、光感器件(LED、PD等)集成於基板內部,並可實現將傳感、光感器件外露,縮小封裝體積的同時,不影響傳感、光感器件發送/接收信號;第三方面,將要進行WB的第二電子器件固定於嵌埋的第一電子器件的背面,然後打線將WB第二電子器件與基板電性連接;第四方面,將要進行WB的第二電子器件根據需要可設置多個,每個電子元器件的類型也可以任意搭配,可相同或者不同,設計非常靈活。
可選地,所述第二電子器件設置有一個,所述第二絕緣層覆蓋填充所述埋芯空腔和所述基板的上層,並露出局部所述第一線路層以及所述第二電子器件的端子。
可選地,所述第二電子器件的端子面還設置有感測器,所述第二絕緣層覆蓋填充所述埋芯空腔和所述基板的上層,並露出局部所述第一線路層以及所述第二電子器件的端子和所述感測器。
可選地,所述第二電子器件設置有至少兩個,所述第二絕緣層覆蓋填充所述埋芯空腔和所述基板的上層,並露出局部所述第一線路層以及局部所述第一電子器件的背面,且所述第二絕緣層在第一電子器件背面形成至少兩個開窗,每個所述第二電子器件設置在對應一個開窗內。
可選地,當所述第二電子器件設置有至少兩個時,所述至少兩個的所述第二電子器件可以採用相同的電子元器件也可以採用不同的電子元器件。
可選地,所述第二電子器件通過黏性材料設置在所述第一電子器件的背面。
可選地,還包括阻焊層,所述阻焊層至少局部覆蓋所述第二線路層。
可選地,還包括保護罩,所述保護罩設置在所述基板的頂面。
可選地,所述保護罩採用透光罩。
本發明的其它特徵和優點將在隨後的說明書中闡述,並且,部分地從說明書中變得顯而易見,或者通過實施本發明而瞭解。本發明的目的和其他優點可通過在說明書、請求項以及附圖中所特別指出的結構來實現和獲得。
為了使本發明的目的、技術方案及優點更加清楚明白,以下結合附圖及實施例,對本發明進行進一步詳細說明。應當理解,此處所描述的具體實施例僅用以解釋本發明,並不用於限定本發明,故不具技術上的實質意義,任何結構的修飾、比例關係的改變或大小的調整,在不影響本發明所能產生的功效及所能達成的目的下,均應仍落在本發明所揭示的技術內容得能涵蓋的範圍內。
本部分將詳細描述本發明的具體實施例,本發明之較佳實施例在附圖中示出,附圖的作用在於用圖形補充說明書文字部分的描述,使人能夠直觀地、形象地理解本發明的每個技術特徵和整體技術方案,但其不能理解為對本發明保護範圍的限制。
在本發明的描述中,若干的含義是一個或者多個,多個的含義是兩個及兩個以上,大於、小於、超過等理解為不包括本數,以上、以下、以內等理解為包括本數。如果有描述到第一、第二只是用於區分技術特徵為目的,而不能理解為指示或暗示相對重要性或者隱含指明所指示的技術特徵的數量或者隱含指明所指示的技術特徵的先後關係。
參照圖1,本發明的一個實施例提供的一種混合嵌埋封裝結構製作方法包括以下步驟:
步驟S100,製作基板500,所述基板500包括第一絕緣層502、貫穿第一絕緣層502的導通銅柱501、開設在第一絕緣層502上的埋芯空腔504和與導通銅柱501電性連接的第一線路層503;具體地,如圖2至11所示。
進一步參照圖2,準備一承載板100,所述承載板100從下往上依次包含核心層101、第一金屬層102、第二金屬層103、蝕刻阻擋層104和第一金屬種子層105;在一些實施例中,第一金屬層102、第二金屬層103可以採用金屬銅層,兩者之間通過物理方式結合,可進行分離;後續將第一、第二金屬層102、103進行分離後,對第二金屬層103進行蝕刻時,蝕刻阻擋層104可以對基板500的線路和銅柱進行保護,防止過度蝕刻,蝕刻阻擋層104可選擇金屬鎳;第一金屬種子層105可選擇銅,厚度為1-3 um,作為後續電鍍的導通基礎。
進一步參照圖3,在第一金屬種子層105的表面製作第一光阻層201,第一光阻層201設置有導通銅柱開窗202和犧牲銅柱開窗203;具體的,在第一金屬種子層105的表面施加光阻材料,可選擇貼膜或者塗覆的方式,對光阻材料進行曝光及顯影,製作銅柱圖形,形成第一光阻層201,第一光阻層201包含導通銅柱開窗202、犧牲銅柱開窗203,銅柱不局限於圓柱體,可以為立方體、長方體等。
進一步參照圖4,銅柱電鍍,在導通銅柱開窗202和犧牲銅柱開窗203位置分別製作導通銅柱501和犧牲銅柱302,導通銅柱501和犧牲銅柱302的厚度根據實際需求定義,通常低於第一光阻層201的厚度。
進一步參照圖5,去除第一光阻層201,可以通過退膜的方式去除;層壓絕緣層,覆蓋銅柱,可以通過退膜的方式去除;減薄絕緣層,可以選擇等離子蝕刻或者磨板的方式,露出導通銅柱501和犧牲銅柱302端部,形成第一絕緣層502。
進一步參照圖6,在露出銅柱的表面製作第二金屬種子層401,在一些實施例中可以選擇化銅或者離子濺射的方式,第二金屬種子層401可以為Cu或者Ti+ Cu。
進一步參照圖7,在第二金屬種子層401表面施加光阻材料,在一些實施例中可選擇貼膜或者塗覆的方式,對光阻材料進行曝光及顯影,製作第一線路層圖形,形成第二光阻層402。
進一步參照圖8,線路電鍍,厚度根據實際需求定義,通常低於第二光阻層402厚度,去除第二光阻層402及外露的第二金屬種子層401,形成第一線路層503;在一些實施例中可以選擇退膜方式去除第二光阻層402,通過蝕刻去除外露的第二金屬種子層401。
進一步參照圖9,將第一金屬層102和第二金屬層103之間進行分離;去除第二金屬層103、蝕刻阻擋層104和第一金屬種子層105;在一些實施例中,分板面的第一金屬層102去除,通常採用蝕刻的方式,蝕刻阻擋層104去除,通常採用特定藥水蝕刻的方式,優先採用蝕刻鎳藥水,第一金屬種子層105去除,通常採用蝕刻的方式。
進一步參照圖10,雙面施加光阻材料,可選擇貼膜或者塗覆的方式,對光阻材料進行曝光及顯影,覆蓋第一線路層503及導通銅柱501,露出犧牲銅柱302,形成第三光阻層404、第四光阻層405;
進一步參照圖11,去除犧牲銅柱302,形成埋芯空腔504,得到包含導通銅柱501、第一絕緣層502、第一線路層503及埋芯空腔504的基板500,在一些實施例中,採用蝕刻方式犧牲銅柱302,可以通過退膜的方式去除第三光阻層404、第四光阻層405。
步驟S200,參照附圖12,在基板500的底部設置支撐件505,支撐件505用於預固定電子器件組件,在一些實施例中,支撐件505可以採用膠帶,膠帶的黏性面有助於電子器件的預固定;
步驟S300,在埋芯空腔504對應的支撐件505內側預固定電子器件組件,電子器件組件包括第一電子器件601和第二電子器件602,第二電子器件602設置在第一電子器件601的背面,且第一電子器件601的端子面朝向支撐件505,第二電子器件602的端子面背向第一電子器件601;
在一些實施例中,第一電子器件601和第二電子器件602之間可以通過黏性材料603黏合,電子器件的貼合可以是依次貼第一電子器件601、黏性材料603、第二電子器件602,也可以是直接貼第一電子器件601和黏性材料603和第二電子器件602結合的整體,即事先把第一電子器件601和黏性材料603和第二電子器件602結合成為一個整體,然後將該整體貼於膠帶505上。
步驟S400,參照附圖13,對電子器件組件進行封裝,並露出局部第一線路層503以及第二電子器件602的端子,形成第二絕緣層701;在一些實施例中,可採用感光型絕緣材料對晶片進行封裝,然後對感光型絕緣材料進行曝光及顯影,露出局部第一線路層503以及第二電子器件602的端子,形成第二絕緣層701;當然也可以採用普通非感光絕緣材料通過真空壓合、層壓、塗覆的方式封裝,再通過鐳射、等離子蝕刻等方式去除絕緣材料形成開窗;還可以通過局部注塑的方式進行封裝並形成開窗露出局部端子。
步驟S500,參照附圖14,去除支撐件505;在一些實施例中,去除支撐件505之後,先在基板500的底面製作第三金屬種子層702,為第二線路層705的製作做準備,第三金屬種子層702,可以選擇化銅或者離子濺射的方式,第三金屬種子層702可以為Cu或者Ti+ Cu。
步驟S600,參照附圖15、16和17,在基板500的底部製作第二線路層705、阻焊層706,具體步驟為:
在雙面施加光阻材料,可選擇貼膜或者塗覆的方式;
對光阻材料進行曝光及顯影,頂面整版遮蔽,底面製作第二線路層705圖形,形成第五光阻層703、第六光阻層704;
第二線路電鍍,厚度根據實際需求定義,通常低於第六光阻層704的厚度;
去除第五、第六光阻層703和704,通常可以選擇退膜方式;
金屬種子層蝕刻,去除外露的第三金屬種子層702,形成第二線路層705;
底面製作阻焊層706。其中,阻焊層706的製作可以根據需要製作。
步驟S700,在第一線路層503和第二線路層705表面進行處理形成表面處理層707,可以選擇抗氧化、化鎳鈀金、鍍錫、化銀等;對表面進行處理時,通常需要對晶片區域的開窗位置進行遮蔽;
步驟S800,參照附圖17,打線,將第二電子器件602的端子6021和第一線路層503連接,可以選擇打金線、打銅線等;
步驟S900,施加保護罩708,打線後在頂面施加保護罩708,在一些實施例中可以選擇透光的玻璃材質,當第二電子器件602具有感測器6022或者為LED等發光器件時,在進行保護封裝體的同時,不影響感測器6022、LED等的運作。
本發明第一方面實施例的混合嵌埋封裝結構製作方法,將嵌埋封裝與WB封裝相結合,對封裝的晶片等元器件選擇性進行嵌埋封裝或者WB封裝(引線鍵合)的方式。對於I/O數較多的晶片,WB封裝難度及成本較高,可以選擇嵌埋封裝的方式;對於I/O數較少的晶片,嵌埋封裝加工週期較長、成本較高,可以選擇WB的方式;對於特殊器件的特殊應用,例如LED、光電二極體等設計光源發光或者接收光的器件,可以選擇WB的方式,使器件外露實現光電感應。同時本發明技術方案中的WB封裝結構,是將要進行WB的晶片等電子器件固定於嵌埋晶片等電子器件的背面,然後打線將WB晶片等電子器件與基板電性連接。此結構與傳統的將WB器件貼裝於基板表面,再打線的方式相比,封裝體積得到縮小,可滿足封裝體高密度集成、小型化的發展需求。
在一些實施例中,第二電子器件602的端子板還設置有感測器6022,對電子器件組件進行封裝處理後還需要露出感測器6022。
在一些實施例中,第一絕緣層502可採用純樹脂或者包含樹脂和玻纖的有機絕緣材料。
參照圖18,本發明的另一個實施例提供的一種混合嵌埋封裝結構製作方法,前2個步驟與第一個實施例相同,具體包括以下步驟:
步驟S100b,製作基板500,所述基板500包括第一絕緣層502、貫穿第一絕緣層502的導通銅柱501、開設在第一絕緣層502上的埋芯空腔504和與導通銅柱501電性連接的第一線路層503;
步驟S200b,在基板500的底部設置支撐件505;
步驟S300b,進一步參考圖19,在埋芯空腔504對應的支撐件505內側預固定第一電子器件601,第一電子器件601的端子面6011朝向支撐件505;
步驟S400b,進一步參考圖20,對第一電子器件601進行封裝,並露出局部第一線路層503以及第一電子器件601的背面,形成第二絕緣層701,其中,第二絕緣層701在第一電子器件601的背面形成至少兩個開窗;在本實施例中,具體使用感光型絕緣材料對晶片進行封裝,對感光型絕緣材料進行曝光及顯影,露出局部第一線路層503以及局部第一電子器件601的背面,形成第二絕緣層701,第二絕緣層701在第一電子器件601的背面形成兩個開窗,分別為開窗902、開窗903,需要說明的是,開窗的數量可以不局限於兩個,可以為多個,根據實際需要定義,本實施案例以兩個為例;當然也可以採用普通非感光絕緣材料通過真空壓合、層壓、塗覆的方式封裝,再通過鐳射、等離子蝕刻等方式去除絕緣材料形成開窗;還可以通過局部注塑的方式進行封裝並形成開窗露出局部端子。
步驟S500b,進一步參考圖21,去除支撐件505,在基板500的底面製作第三金屬種子層702,可以選擇化銅或者離子濺射的方式,第三金屬種子層702可以為Cu或者Ti+ Cu;
步驟S600b,進一步參考圖22、23和24,在基板500的底部製作第二線路層705、阻焊層706,具體為:
雙面施加光阻材料,可選擇貼膜或者塗覆的方式;
對光阻材料進行曝光及顯影,頂面整版遮蔽,底面製作第二線路層705圖形,形成第五光阻層703、第六光阻層704;
第二線路電鍍,厚度根據實際需求定義,通常低於第六光阻層704的厚度;
去除第五、第六光阻層703和704,通常可以選擇退膜方式;
金屬種子層蝕刻,去除外露的第三金屬種子層702,形成第二線路層705;
底面製作阻焊層706;
步驟S700b,在第一線路層503和第二線路層705表面進行處理形成表面處理層707,即雙面進行選擇性表面處理,形成表面處理層707,可以選擇抗氧化、化鎳鈀金、鍍錫、化銀等,對表面進行處理時,通常需要對晶片區域開窗位置進行遮蔽;
步驟S800b,進一步參考圖25,在第一電子器件601背面的第二絕緣層701的開窗處設置第二電子器件602,第二電子器件602的端子面背向第一電子器件601;具體包括:在第一電子器件601背面的第二絕緣層701每一個開窗處,施加黏性材料603,並分別貼第二電子器件602,各個第二電子器件602根據實際情況可以選擇相同的電子器件,也可以選擇不同的電子器件,本實施例設置2個不同的電子器件,一個為LED晶片,另一個為光電二極體PD,兩個不同第二電子器件的背面通過黏性材料603與第一電子器件601的背面緊密結合 ;
步驟S900b,打線,將第二電子器件602的端子6021和第一線路層503連接;
步驟S1000b,施加保護罩708。
參照圖26,本發明的一個實施例提供了一種混合嵌埋封裝結構,包括:
基板500,所述基板500包括第一絕緣層502,貫穿第一絕緣層502的導通銅柱501,開設在第一絕緣層502上的埋芯空腔504和與導通銅柱501電性連接的第一線路層503;
第一電子器件601,設置在埋芯空腔504內部,且第一電子器件601的端子面6011朝向基板500的底面;
第二電子器件602,設置在第一電子器件601的背面,且第二電子器件602的端子面朝向基板500的頂面;
第二絕緣層701,覆蓋填充埋芯空腔504和基板500的上層,並露出局部第一線路層503以及局部第二電子器件602或者局部第一電子器件601的背面;
第二線路層705,設置在基板500的底面,第二線路層705電性連接導通銅柱501和第一電子器件601的端子6011;
導線,電性連接第一線路層503和第二電子器件602的端子6021。
根據本發明實施例的混合嵌埋封裝結構,將嵌埋封裝與WB封裝相結合,對封裝的電子器件等元器件選擇性進行嵌埋封裝或者WB封裝(引線鍵合)的方式,可以降低生產成本、縮短加工週期;可以將傳感、光感器件(LED、PD等)集成於基板內部,並可實現將傳感、光感器件外露,縮小封裝體積的同時,不影響傳感、光感器件發送/接收信號;將要進行WB的第二電子器件固定於嵌埋的第一電子器件的背面,然後打線將WB的第二電子器件與基板電性連接。
在一些實施例中,第二電子器件602設置有一個,第二絕緣層701覆蓋填充埋芯空腔504和基板500的上層,並露出局部第一線路層503以及第二電子器件602的端子6021。
在一些實施例中,第二電子器件602的端子面還設置有感測器6022,第二絕緣層701覆蓋填充埋芯空腔504和基板500的上層,並露出局部第一線路層503以及第二電子器件602的端子6021和感測器6022。
在一些實施例中,還包括第二金屬種子層401和第三金屬種子層702,第二金屬種子層401設置在導通銅柱501與第一線路層503之間,第三金屬種子層702設置在導通銅柱501與第二線路層705之間。
在一些實施例中,進一步參考圖27,第二電子器件602設置有至少兩個,第二絕緣層701覆蓋填充埋芯空腔504和基板500的上層,並露出局部第一線路層503以及局部第一電子器件601的背面,且第二絕緣層701在第一電子器件601的背面形成至少兩個開窗,每個第二電子器件602設置在對應一個開窗內。將要進行WB的第二電子器件602根據需要可設置多個,每個電子元器件的類型也可以任意搭配,可相同或者不同,設計非常靈活。
在一些實施例中,當第二電子器件602設置有至少兩個時,至少兩個的第二電子器件602可以採用相同的電子元器件也可以採用不同的電子元器件。
在一些實施例中,第二電子器件602通過黏性材料603設置在第一電子器件601的背面。
在一些實施例中,還包括阻焊層706,阻焊層706至少局部覆蓋第二線路層705;
在一些實施例中,還包括保護罩708,設置在基板500的頂面,進一步保護封裝體;為了不影響LED、PD等電子器件的運作,保護罩708還可以採用透光罩,如玻璃透光罩、塑膠透光罩等。
以上是對本發明的較佳實施進行了具體說明,但本發明並不局限於上述實施方式,熟悉本領域的技術人員在不違背本發明精神的前提下還可作出種種的等同變形或替換,這些等同的變形或替換均包含在本發明權利要求所限定的範圍內。
100:承載板
101:核心層
102:第一金屬層
103:第二金屬層
104:蝕刻阻擋層
105:第一金屬種子層
201:第一光阻層
202:導通銅柱開窗
203:犧牲銅柱開窗
302:犧牲銅柱
401:第二金屬種子層
402:第二光阻層
404:第三光阻層
405:第四光阻層
500:基板
501:導通銅柱
502:第一絕緣層
503:第一線路層
504:埋芯空腔
505:支撐件/膠帶
601:第一電子器件
6011:端子/端子面
602:第二電子器件
6021:端子
6022:感測器
603:黏性材料
701:第二絕緣層
702:第三金屬種子層
703:第五光阻層
704:第六光阻層
705:第二線路層
706:阻焊層
707:表面處理層
708:保護罩
902:開窗
903:開窗
S100~S900:步驟
S100b~S1000b:步驟
附圖用來提供對本發明技術方案的進一步理解,並且構成說明書的一部分,與本發明的實施例一起用於解釋本發明的技術方案,並不構成對本發明技術方案的限制。
[圖1]是本發明第一個實施例提供的混合嵌埋封裝結構製作方法的步驟流程圖;
[圖2]至[圖17]是本發明第一個實施例提供的封裝基板製作方法步驟對應的截面圖;
[圖18]是本發明第二個實施例提供的混合嵌埋封裝結構製作方法的步驟流程圖;
[圖19]至[圖25]是本發明第二個實施例提供的封裝基板製作方法步驟對應的截面圖;
[圖26]是本發明第一個實施例提供的封裝基板的截面圖;
[圖27]是本發明第二個實施例提供的封裝基板的截面圖。
401:第二金屬種子層
501:導通銅柱
502:第一絕緣層
503:第一線路層
601:第一電子器件
6011:端子/端子面
602:第二電子器件
6021:端子
603:黏性材料
701:第二絕緣層
702:第三金屬種子層
705:第二線路層
706:阻焊層
707:表面處理層
708:保護罩
Claims (19)
- 一種混合嵌埋封裝結構製作方法,其包括以下步驟:製作基板,所述基板包括第一絕緣層,貫穿所述第一絕緣層的導通銅柱,開設在所述第一絕緣層上的埋芯空腔和與所述導通銅柱電性連接的第一線路層;在所述基板的底部設置支撐件,所述支撐件用於預固定電子器件組件;在所述埋芯空腔對應的所述支撐件內側預固定所述電子器件組件,所述電子器件組件包括第一電子器件和第二電子器件,所述第二電子器件設置在所述第一電子器件的背面,且所述第一電子器件的端子面朝向所述支撐件,所述第二電子器件的端子面背向所述第一電子器件;對所述電子器件組件進行封裝,並露出局部所述第一線路層以及第二電子器件的端子,形成第二絕緣層;去除所述支撐件;在所述基板的底部製作第二線路層;打線,將所述第二電子器件的端子和所述第一線路層連接。
- 如請求項1所述的混合嵌埋封裝結構製作方法,其中,所述第二線路層製作完之後還包括以下步驟:在所述基板的底部及至少部分所述第二線路層表面製作阻焊層;對所述第一線路層和所述第二線路層表面進行處理形成表面處理層。
- 如請求項1所述的混合嵌埋封裝結構製作方法,其中,還包括在所述基板的頂面施加保護罩。
- 如請求項1至3中任一項所述的混合嵌埋封裝結構製作方法,其 中,所述製作基板的具體步驟包括:準備一承載板,所述承載板從下往上依次包含核心層、第一金屬層、第二金屬層、蝕刻阻擋層和第一金屬種子層;在所述第一金屬種子層的表面製作第一光阻層,所述第一光阻層設置有導通銅柱開窗和犧牲銅柱開窗;在所述導通銅柱開窗和犧牲銅柱開窗位置分別製作導通銅柱和犧牲銅柱;去除所述第一光阻層;層壓絕緣層,覆蓋銅柱,減薄絕緣層,露出所述導通銅柱和所述犧牲銅柱端部,形成所述第一絕緣層;在露出銅柱的表面製作第二金屬種子層;在所述第二金屬種子層表面施加光阻材料,對光阻材料進行曝光及顯影,製作第一線路層圖形,形成第二光阻層。線路電鍍,去除第二光阻層及外露的第二金屬種子層,形成所述第一線路層。將所述第一金屬層和所述第二金屬層之間進行分離;去除所述第二金屬層、蝕刻阻擋層和第一金屬種子層;雙面施加光阻材料,對光阻材料進行曝光及顯影,覆蓋所述第一線路層及所述導通銅柱,露出所述犧牲銅柱;去除所述犧牲銅柱,形成所述埋芯空腔。
- 如請求項1至3中任一項所述的混合嵌埋封裝結構製作方法,其中,所述第一電子器件和所述第二電子器件之間通過黏性材料連接。
- 如請求項1至3中任一項所述的混合嵌埋封裝結構製作方法,其 中,所述第二電子器件的端子板還設置有感測器。
- 如請求項6所述的混合嵌埋封裝結構製作方法,其中,所述對所述電子器件組件進行封裝,並露出局部所述第一線路層以及第二電子器件的端子,形成第二絕緣層的具體步驟為:使用絕緣材料對電子器件進行封裝;對絕緣材料進行處理,露出局部第所述第一線路層、所述第二電子器件的端子及所述感測器,形成第二絕緣層。
- 如請求項7所述的混合嵌埋封裝結構製作方法,其中,所述第二絕緣層採用的絕緣材料為感光型絕緣材料,通過對感光型絕緣材料進行曝光及顯影處理,露出局部第所述第一線路層、所述第二電子器件的端子及所述感測器,形成第二絕緣層。
- 如請求項1至3中任一項所述的混合嵌埋封裝結構製作方法,其中,所述在所述基板的底部製作第二線路層的具體步驟為:在所述基板底面製作第三金屬種子層;採用貼膜或者塗覆的方式在雙面施加光阻材料;對光阻材料進行曝光及顯影,頂面整版遮蔽,底面製作第二線路層圖形,形成第五光阻層和第六光阻層;電鍍第二線路;去除第五光阻層和第六光阻層;蝕刻金屬種子層,去除外露的所述第三金屬種子層,形成第二線路層。
- 如請求項4所述的混合嵌埋封裝結構製作方法,其中,所述第一絕緣層為純樹脂或者包含樹脂和玻纖的有機絕緣材料。
- 一種混合嵌埋封裝結構製作方法,其包括以下步驟:製作基板,所述基板包括第一絕緣層,貫穿所述第一絕緣層的導通銅柱,開設在所述第一絕緣層上的埋芯空腔和與所述導通銅柱電性連接的第一線路層;在所述基板的底部設置支撐件;在所述埋芯空腔對應的所述支撐件內側預固定第一電子器件,所述第一電子器件的端子面朝向所述支撐件;對所述第一電子器件進行封裝,並露出局部所述第一線路層以及第一電子器件的背面,形成第二絕緣層,其中,所述第二絕緣層在所述第一電子器件的背面形成至少兩個開窗;去除所述支撐件;在所述基板的底部製作第二線路層;在所述第一電子器件背面、所述第二絕緣層的所述開窗處設置第二電子器件,所述第二電子器件的端子面背向所述第一電子器件;打線,將所述第二電子器件的端子和所述第一線路層連接。
- 一種混合嵌埋封裝結構,其包括:基板,所述基板包括第一絕緣層,貫穿所述第一絕緣層的導通銅柱,開設在所述第一絕緣層上的埋芯空腔和與所述導通銅柱電性連接的第一線路層;第一電子器件,設置在所述埋芯空腔內部,且所述第一電子器件的端子面朝向基板底面;第二電子器件,設置在所述第一電子器件的背面,且所述第二電子器件的端子面朝向基板頂面; 第二絕緣層,覆蓋填充所述埋芯空腔和所述基板的上層,並露出局部所述第一線路層以及局部所述第二電子器件或者局部第一電子器件背面;第二線路層,設置在所述基板的底面,所述第二線路層電性連接所述導通銅柱和所述第一電子器件的端子;導線,電性連接所述第一線路層和所述第二電子器件的端子;其中,所述第二電子器件設置有一個,所述第二絕緣層覆蓋填充所述埋芯空腔和所述基板的上層,並露出局部所述第一線路層以及所述第二電子器件的端子。
- 如請求項12所述的混合嵌埋封裝結構,其中,所述第二電子器件的端子面還設置有感測器,所述第二絕緣層覆蓋填充所述埋芯空腔和所述基板的上層,並露出局部所述第一線路層以及所述第二電子器件的端子和所述感測器。
- 如請求項12所述的混合嵌埋封裝結構,其中,所述第二電子器件設置有至少兩個,所述第二絕緣層覆蓋填充所述埋芯空腔和所述基板的上層,並露出局部所述第一線路層以及局部所述第一電子器件的背面,且所述第二絕緣層在第一電子器件背面形成至少兩個開窗,每個所述第二電子器件設置在對應一個開窗內。
- 如請求項14所述的混合嵌埋封裝結構,其中,所述第二電子器件設置有至少兩個,且所述至少兩個的所述第二電子器件採用相同的電子元器件,或採用不同的電子元器件。
- 如請求項12所述的混合嵌埋封裝結構,其中,所述第二電子器件通過黏性材料設置在所述第一電子器件的背面。
- 如請求項12所述的混合嵌埋封裝結構,其中,還包括阻焊 層,所述阻焊層至少局部覆蓋所述第二線路層,
- 如請求項12所述的混合嵌埋封裝結構,其中,還包括保護罩,所述保護罩設置在所述基板的頂面。
- 如請求項18所述的混合嵌埋封裝結構,其中,所述保護罩採用透光罩。
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US20190237382A1 (en) * | 2018-01-29 | 2019-08-01 | Samsung Electronics Co., Ltd. | Semiconductor package including a thermal conductive layer and method of manufacturing the same |
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