TWI816772B - 用於光學材料樣本的光學測試的裝置和方法以及控制器 - Google Patents

用於光學材料樣本的光學測試的裝置和方法以及控制器 Download PDF

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TWI816772B
TWI816772B TW108112212A TW108112212A TWI816772B TW I816772 B TWI816772 B TW I816772B TW 108112212 A TW108112212 A TW 108112212A TW 108112212 A TW108112212 A TW 108112212A TW I816772 B TWI816772 B TW I816772B
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cylinder
sample
generalized cylinder
socket
optical
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TW108112212A
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TW202004150A (zh
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查姆 阿爾達格
特佐菲亞 拉維
德羅爾 赫爾莫尼
喬納森 格爾貝格
優素福 拉維安
內塔內爾 戈爾茨坦
埃拉德 沙爾林
埃拉德 拉維
科比 格林斯坦
阿米爾 沙皮拉
莫德沙伊 吉洛
齊翁 艾森菲爾德
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以色列商魯姆斯有限公司
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/30—Collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Control Of Heat Treatment Processes (AREA)
  • Glass Compositions (AREA)
TW108112212A 2018-04-08 2019-04-08 用於光學材料樣本的光學測試的裝置和方法以及控制器 TWI816772B (zh)

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US201862654460P 2018-04-08 2018-04-08
US62/654,460 2018-04-08

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TWI816772B true TWI816772B (zh) 2023-10-01

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US (2) US11221294B2 (ko)
EP (1) EP3775827B1 (ko)
JP (1) JP7389491B2 (ko)
KR (1) KR20200140349A (ko)
CN (1) CN112005091B (ko)
IL (1) IL277715B2 (ko)
TW (1) TWI816772B (ko)
WO (1) WO2019197959A1 (ko)

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