TWI789375B - Manufacturing method of light emitting diode wafer - Google Patents
Manufacturing method of light emitting diode wafer Download PDFInfo
- Publication number
- TWI789375B TWI789375B TW107104141A TW107104141A TWI789375B TW I789375 B TWI789375 B TW I789375B TW 107104141 A TW107104141 A TW 107104141A TW 107104141 A TW107104141 A TW 107104141A TW I789375 B TWI789375 B TW I789375B
- Authority
- TW
- Taiwan
- Prior art keywords
- transparent substrate
- wafer
- transparent
- emitting diode
- light
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 12
- 239000000758 substrate Substances 0.000 claims abstract description 122
- 239000013078 crystal Substances 0.000 claims abstract description 9
- 239000004065 semiconductor Substances 0.000 claims abstract description 8
- 238000000034 method Methods 0.000 claims abstract description 5
- 238000002360 preparation method Methods 0.000 claims abstract description 5
- 238000005520 cutting process Methods 0.000 claims description 28
- 229910052594 sapphire Inorganic materials 0.000 claims description 11
- 239000010980 sapphire Substances 0.000 claims description 11
- 239000000853 adhesive Substances 0.000 claims description 5
- 230000001070 adhesive effect Effects 0.000 claims description 5
- 239000005304 optical glass Substances 0.000 claims description 4
- 239000011347 resin Substances 0.000 claims description 4
- 229920005989 resin Polymers 0.000 claims description 4
- 239000000919 ceramic Substances 0.000 claims description 3
- 238000005530 etching Methods 0.000 claims description 3
- 238000005488 sandblasting Methods 0.000 claims description 3
- 235000012431 wafers Nutrition 0.000 description 70
- 230000003287 optical effect Effects 0.000 description 7
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 5
- 238000001816 cooling Methods 0.000 description 3
- 229910002601 GaN Inorganic materials 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 239000006061 abrasive grain Substances 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 239000002173 cutting fluid Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/58—Optical field-shaping elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/20—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/483—Containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
- H01L2933/0058—Processes relating to semiconductor body packages relating to optical field-shaping elements
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Led Devices (AREA)
- Dicing (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Laser Beam Processing (AREA)
Abstract
提供一種可得到充分的亮度的發光二極體晶片的製造方法及發光二極體晶片。 Provided are a method of manufacturing a light emitting diode wafer capable of obtaining sufficient luminance, and a light emitting diode wafer.
一種發光二極體晶片的製造方法,其特徵在於具備有:晶圓準備步驟,準備晶圓,該晶圓是在結晶成長用之透明基板上具有積層體層,並於該積層體層的正面以相互交叉之複數條分割預定線所區劃出之各區域中各自形成有LED電路,該積層體層形成有包含發光層的複數層半導體層;透明基板加工步驟,在內部形成有複數個氣泡的第1透明基板或內部形成有複數個氣泡的第2透明基板之至少其中任一個的正面或背面,對應於LED電路來形成複數條溝;透明基板貼附步驟,在實施該透明基板加工步驟後,將該第1透明基板的正面貼附在晶圓的背面,並且將該第2透明基板的正面貼附在該第1透明基板的背面以形成一體化晶圓;及分割步驟,在實施該透明基板貼附步驟後,沿著該分割預定線將該晶圓和該第1及第2透明基板一起切斷以將該一體化晶圓分割成一個個的發光二極體晶片。 A method for manufacturing a light-emitting diode chip, characterized in that it includes: a wafer preparation step, preparing a wafer, the wafer has a laminated body layer on a transparent substrate for crystal growth, and the front side of the laminated body layer is connected to each other LED circuits are formed in each area demarcated by the plurality of intersecting dividing lines, and the laminate layer is formed with a plurality of semiconductor layers including a light-emitting layer; a transparent substrate processing step, forming a first transparent substrate with a plurality of air bubbles inside. On the front or back of at least any one of the substrate or the second transparent substrate with a plurality of air bubbles formed therein, a plurality of grooves are formed corresponding to the LED circuit; the step of attaching the transparent substrate is carried out after the step of processing the transparent substrate. The front of the first transparent substrate is attached to the back of the wafer, and the front of the second transparent substrate is attached to the back of the first transparent substrate to form an integrated wafer; After the additional step, the wafer is cut together with the first and second transparent substrates along the planned dividing line to divide the integrated wafer into individual light emitting diode chips.
Description
本發明是有關於一種發光二極體晶片的製造方法及發光二極體晶片。 The invention relates to a manufacturing method of a light emitting diode wafer and the light emitting diode wafer.
在藍寶石基板、GaN基板、SiC基板等的結晶成長用基板的正面上形成有將n型半導體層、發光層、p型半導體層積層複數層而成的積層體層,並且在此積層體層上藉由交叉的複數條分割預定線所區劃出的區域中形成有複數個LED(發光二極體(Light Emitting Diode))等之發光元件的晶圓,是沿著分割預定線切斷而分割成一個個的發光元件晶片,已分割的發光元件晶片可廣泛地應用在手機、個人電腦、照明機器等的各種電氣機器上。 On the front surface of a substrate for crystal growth such as a sapphire substrate, a GaN substrate, or a SiC substrate, a laminate layer in which an n-type semiconductor layer, a light-emitting layer, and a p-type semiconductor layer are laminated is formed. Wafers on which light-emitting elements such as LEDs (Light Emitting Diodes) are formed in the area demarcated by a plurality of intersecting planned dividing lines are cut along the planned dividing lines and divided into individual wafers. Divided light-emitting element wafers can be widely used in various electrical equipment such as mobile phones, personal computers, and lighting equipment.
由於從發光元件晶片的發光層射出的光具有各向同性,所以即使被照射到結晶成長用基板的內部也會使光從基板的背面及側面射出。然而,由於已被照射到基板之內部的光之中在與空氣層之間的界面上的入射角為臨界角以上的光會在界面上進行全反射而被封閉在基板內部,並不會有從基板射出到外部之情形,所以會有導致發光元件晶片的亮度降低的問題。 Since the light emitted from the light-emitting layer of the light-emitting element wafer is isotropic, even if it is irradiated into the inside of the substrate for crystal growth, the light is emitted from the back surface and the side surface of the substrate. However, since the light irradiated to the inside of the substrate has an incident angle above the critical angle on the interface with the air layer, it is totally reflected on the interface and is enclosed inside the substrate, and there is no Since the light is emitted from the substrate to the outside, there is a problem that the brightness of the light-emitting element wafer is lowered.
為了解決此問題,在日本專利特開2014-175354號公報中已記載有下述之發光二極體(LED):為了抑制從發光層射出的光被封閉在基板的內部,而形成為在基板的背面貼附透明構件來謀求亮度的提升。 In order to solve this problem, Japanese Patent Laid-Open No. 2014-175354 has described the following light-emitting diode (LED): In order to prevent the light emitted from the light-emitting layer from being confined inside the substrate, it is formed on the substrate. A transparent member is attached to the back to improve the brightness.
專利文獻1:日本專利特開2014-175354號公報 Patent Document 1: Japanese Patent Laid-Open No. 2014-175354
然而,在專利文獻1所揭示的發光二極體中,雖然可藉由在基板的背面貼附透明構件而使亮度稍微提升,但是仍有無法得到充分的亮度的問題。 However, in the light emitting diode disclosed in Patent Document 1, although the luminance can be slightly improved by attaching the transparent member on the back surface of the substrate, there is still a problem that sufficient luminance cannot be obtained.
本發明是有鑒於像這樣的點而作成的發明,其目的在於提供一種能夠得到充分的亮度的發光二極體晶片的製造方法及發光二極體晶片。 The present invention was made in view of such points, and an object of the present invention is to provide a method of manufacturing a light emitting diode wafer and a light emitting diode wafer capable of obtaining sufficient luminance.
依據請求項1記載的發明,可提供一種發光二極體晶片的製造方法,該發光二極體晶片的製造方法之特徵在於具備有:晶圓準備步驟,準備晶圓,該晶圓是在結晶成長用之透明基板上具有積層體層,並於該積層體層的正面以相互 交叉之複數條分割預定線所區劃出之各區域中各自形成有LED電路,該積層體層形成有包含發光層的複數層半導體層;透明基板加工步驟,在內部形成有複數個氣泡的第1透明基板或內部形成有複數個氣泡的第2透明基板之至少其中任一個的正面或背面,對應於LED電路來形成複數條溝;透明基板貼附步驟,在實施該透明基板加工步驟後,將該第1透明基板的正面貼附在晶圓的背面,並且將該第2透明基板的正面貼附在該第1透明基板的背面以形成一體化晶圓;及分割步驟,在實施該透明基板貼附步驟後,沿著該分割預定線將該晶圓和該第1及第2透明基板一起切斷以將該一體化晶圓分割成一個個的發光二極體晶片。 According to the invention described in Claim 1, a method of manufacturing a light emitting diode wafer can be provided, which is characterized in that it has: a wafer preparation step, preparing a wafer, and the wafer is crystallized There is a laminated body layer on the transparent substrate for growth, and the front side of the laminated body layer is mutually LED circuits are formed in each area demarcated by the plurality of intersecting dividing lines, and the laminate layer is formed with a plurality of semiconductor layers including a light-emitting layer; a transparent substrate processing step, forming a first transparent substrate with a plurality of air bubbles inside. On the front or back of at least any one of the substrate or the second transparent substrate with a plurality of air bubbles formed therein, a plurality of grooves are formed corresponding to the LED circuit; the step of attaching the transparent substrate is carried out after the step of processing the transparent substrate. The front of the first transparent substrate is attached to the back of the wafer, and the front of the second transparent substrate is attached to the back of the first transparent substrate to form an integrated wafer; After the additional step, the wafer is cut together with the first and second transparent substrates along the planned dividing line to divide the integrated wafer into individual light emitting diode chips.
較理想的是,在透明基板加工步驟中所形成之溝的截面形狀為三角形、四角形、或半圓形狀的任一種。較理想的是,在透明基板加工步驟中所形成的溝是藉由切削刀、蝕刻、噴砂、雷射的任一種方式而形成。 Preferably, the cross-sectional shape of the groove formed in the transparent substrate processing step is any one of triangular, quadrangular, or semicircular. Preferably, the groove formed in the transparent substrate processing step is formed by cutting knife, etching, sand blasting, or laser.
該第1及第2透明基板是以透明陶瓷、光學玻璃、藍寶石、透明樹脂的任一種所形成,並且在該透明基板貼附步驟中,該第1透明基板是利用透明接著劑來接著於晶圓,該第2透明基板是利用透明接著劑來接著於該第1透明基板。 The first and second transparent substrates are formed of any one of transparent ceramics, optical glass, sapphire, and transparent resin, and in the step of attaching the transparent substrate, the first transparent substrate is bonded to the crystal by using a transparent adhesive. Circle, the second transparent substrate is bonded to the first transparent substrate with a transparent adhesive.
依據請求項5記載的發明,可提供一種發光 二極體晶片,該發光二極體晶片具備於正面形成有LED電路的發光二極體、貼附在該發光二極體的背面之內部形成有複數個氣泡的第1透明構件、及貼附在該第1透明構件的背面之內部形成有複數個氣泡的第2透明構件,且在該第1透明構件或該第2透明構件之至少其中任一個的正面或背面形成有溝。 According to the invention described in Claim 5, a light-emitting A diode chip, the light emitting diode chip is equipped with a light emitting diode with an LED circuit formed on the front surface, a first transparent member with a plurality of air bubbles attached to the back of the light emitting diode, and an attached A second transparent member having a plurality of air cells is formed inside the back of the first transparent member, and a groove is formed on the front or back of at least one of the first transparent member or the second transparent member.
本發明的發光二極體晶片是藉由已形成於至少2層的透明構件的複數個氣泡與溝來使光複雜地折射而使被封閉在第1及第2透明構件內的光減少,且讓從第1及第2透明構件射出之光的量增大並使發光二極體晶片的亮度提升。 The light-emitting diode chip of the present invention reduces the light enclosed in the first and second transparent members by complexly refracting light through the plurality of air bubbles and grooves formed in at least two transparent members, and The amount of light emitted from the first and second transparent members is increased and the brightness of the light-emitting diode chip is improved.
10:切削單元 10: Cutting unit
11:光元件晶圓(晶圓) 11: Optical component wafer (wafer)
11a、21a:正面 11a, 21a: front
11b、21b:背面 11b, 21b: back
12:主軸殼體 12: Spindle housing
13:藍寶石基板 13: Sapphire substrate
13A:LED 13A:LED
14:切削刀 14: Cutter
15:積層體層 15: laminated body layer
16:刀片罩 16: Blade cover
17:分割預定線 17: Split scheduled line
18:冷卻噴嘴 18: Cooling nozzle
19:LED電路 19: LED circuit
20:工作夾台 20: Work clamp table
21:第1透明基板 21: The first transparent substrate
21A:第2透明基板 21A: Second transparent substrate
21’:第1透明構件 21': The first transparent member
21A’:第2透明構件 21A': the second transparent member
23、23A、23B:溝 23, 23A, 23B: ditch
25:第1一體化晶圓 25: The first integrated wafer
25A:第2一體化晶圓 25A: The second integrated wafer
27:切斷溝 27: cut groove
29、29A:氣泡 29, 29A: Bubbles
31、31A、31B、31C:發光二極體晶片 31, 31A, 31B, 31C: light emitting diode chip
R、X1:箭頭 R, X1: Arrow
T:切割膠帶 T: cutting tape
F:環狀框架 F: ring frame
X、Y、Z:方向 X, Y, Z: direction
圖1是光元件晶圓的正面側立體圖。 FIG. 1 is a front perspective view of an optical element wafer.
圖2(A)是顯示透明基板加工步驟的立體圖,圖2(B)~圖2(D)是顯示所形成之溝形狀的截面圖。 FIG. 2(A) is a perspective view showing the processing steps of the transparent substrate, and FIG. 2(B) to FIG. 2(D) are cross-sectional views showing the shape of the groove formed.
圖3(A)是顯示將於正面具有複數條朝第1方向伸長之溝的第1透明基板貼附在晶圓之背面而形成第1一體化晶圓之透明基板貼附步驟的立體圖,圖3(B)是第1一體化晶圓的立體圖。 Fig. 3 (A) is a perspective view showing the transparent substrate attaching step of forming the first integrated wafer by attaching the first transparent substrate having a plurality of grooves extending toward the first direction on the front surface to the back of the wafer. 3(B) is a perspective view of the first integrated wafer.
圖4是顯示將於正面具有朝第1方向及朝與第1方向正交的第2方向伸長之複數條溝的第1透明基板貼附於晶圓之背面來進行一體化之透明基板步驟的立體圖。 Fig. 4 is a diagram showing steps of integrating a first transparent substrate having a plurality of grooves extending in the first direction and in the second direction perpendicular to the first direction on the back surface of the wafer. stereogram.
圖5(A)是顯示將第2透明基板的正面貼附到第1一體 化晶圓之背面而形成第2一體化晶圓之情形的立體圖,圖5(B)是第2一體化晶圓的立體圖。 Fig. 5 (A) shows that the front side of the second transparent substrate is attached to the first body 5(B) is a perspective view of the second integrated wafer.
圖6是顯示透過切割膠帶而以環狀框架支撐第2一體化晶圓的支撐步驟的立體圖。 6 is a perspective view showing a supporting step of supporting a second integrated wafer with a ring frame through a dicing tape.
圖7是顯示將第2一體化晶圓分割成發光二極體晶片的分割步驟的立體圖。 Fig. 7 is a perspective view showing a step of dividing the second integrated wafer into light emitting diode chips.
圖8是分割步驟結束後之第2一體化晶圓的立體圖。 FIG. 8 is a perspective view of the second integrated wafer after the dividing step is completed.
圖9(A)~圖9(D)是本發明實施形態的發光二極體晶片的立體圖。 9(A) to 9(D) are perspective views of a light emitting diode wafer according to an embodiment of the present invention.
以下,參照圖式詳細地說明本發明的實施形態。參照圖1,所示為光元件晶圓(以下,有時會簡稱為晶圓)11的正面側立體圖。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Referring to FIG. 1 , there is shown a front perspective view of an optical element wafer (hereinafter, sometimes simply referred to as a wafer) 11 .
光元件晶圓11是在藍寶石基板13上積層氮化鎵(GaN)等的晶膜層(epitaxial layer)(積層體層)15而構成的。光元件晶圓11具有積層有晶膜層15的正面11a、及露出了藍寶石基板13的背面11b。
The
在此,在本實施形態的光元件晶圓11中,雖然是採用藍寶石基板13作為結晶成長用基板,但是也可以採用GaN基板或SiC基板等來替代藍寶石基板13。
Here, in the
積層體層(晶膜層)15是藉由依序使電子成為多數載子(carrier)的n型半導體層(例如n型GaN層)、成為發光層的半導體層(例如InGaN層)、電洞成為多數載子的p 型半導體層(例如p型GaN層)進行晶膜生長而形成。 The laminated body layer (crystal film layer) 15 is formed by sequentially making electrons a majority carrier (carrier) n-type semiconductor layer (such as an n-type GaN layer), a semiconductor layer that becomes a light-emitting layer (such as an InGaN layer), and holes that become a majority. Carrier p -type semiconductor layer (for example, p-type GaN layer) is formed by crystal film growth.
藍寶石基板13具有例如100μm的厚度,且積層體層15具有例如5μm的厚度。於積層體層15上以形成為格子狀的複數條分割預定線17來區劃而形成有複數個LED電路19。晶圓11具有形成有LED電路19的正面11a、和露出了藍寶石基板13的背面11b。
依據本發明實施形態的發光二極體晶片的製造方法,首先會實施準備如圖1所示的光元件晶圓11的晶圓準備步驟。又,還實施準備如圖2(A)及圖5所示之內部形成有複數個氣泡之第1透明基板21及內部形成有複數個氣泡29A之第2透明基板21A的透明基板準備步驟。
According to the manufacturing method of the light emitting diode wafer according to the embodiment of the present invention, the wafer preparation step of preparing the
已實施晶圓及透明基板準備步驟後,實施透明基板加工步驟,該透明基板加工步驟是在要貼附於晶圓11的背面11b之第1透明基板21的正面或背面、或者在要貼附於第1透明基板21的背面之第2透明基板21A的正面或背面,對應於LED電路19而形成複數條溝。此透明基板加工步驟是使用例如已廣為周知的切削裝置來實施。
After the preparation steps of the wafer and the transparent substrate have been implemented, the transparent substrate processing step is carried out. A plurality of grooves are formed corresponding to the
如圖2(A)所示,切削裝置的切削單元10包含有主軸殼體12、可旋轉地插入主軸殼體12中的圖未示的主軸、和裝設在主軸的前端的切削刀14。
As shown in FIG. 2(A), the cutting
切削刀14的切割刃是以例如用鍍鎳方式來將鑽石磨粒固定而成的電鑄磨石所形成,且其前端形狀是做成三角形、四角形、或半圓形。
The cutting edge of the
切削刀14的大致上半部分是被刀片罩
(blade cover)(輪罩(wheel cover))16所覆蓋,在刀片罩16上配設有於切削刀14的裏側及近前側水平地伸長的一對(圖中僅顯示1支)冷卻噴嘴18。
The roughly upper half of the cutting
在第1透明基板21的正面21a形成複數條溝23的透明基板加工步驟中,是將第1透明基板21以圖未示的切削裝置的工作夾台來吸引保持。然後,藉由一邊使切削刀14朝箭頭R方向高速旋轉,一邊在第1透明基板21的正面21a切入規定深度,且將保持在圖未示之工作夾台上的第1透明基板21朝箭頭X1方向加工進給,以藉由切削而形成在第1方向上伸長的溝23。
In the transparent substrate processing step of forming the plurality of
將第1透明基板21朝正交於箭頭X1方向的方向按晶圓11的分割預定線17的每個間距來分度進給,並且切削第1透明基板21的正面21a,以如圖3所示,逐次地形成朝第1方向伸長的複數條溝23。
The first
如圖3(A)所示,形成在第1透明基板21的正面21a的複數條溝23可為僅在一個方向上伸長的形態、或者也可設成如圖4所示,在第1透明基板21的正面21a形成朝第1方向及朝與該第1方向正交的第2方向伸長之複數條溝23。
As shown in FIG. 3(A), the plurality of
形成在第1透明基板21的正面21a的溝,為如圖2(B)所示之截面三角形的溝23、或如圖2(C)所示之截面四角形的溝23A、或如圖2(D)所示之截面半圓形的溝23B的任一種皆可。
The groove formed on the
第1透明基板21及第2透明基板21A是由透
明樹脂、光學玻璃、藍寶石、透明陶瓷的任一種所形成。在本實施形態中,是由比光學玻璃更有耐久性之聚碳酸酯、丙烯酸等之透明樹脂來形成第1透明基板21及第2透明基板21A。再者,作為形成溝的方法,亦可使用噴砂(sandblast)、蝕刻、雷射。
The first
雖然在上述之實施形態中,是在第1透明基板21的正面21a形成有複數條溝23、23A、23B,但亦可取代此實施形態,而設成為在第1透明基板21的背面21b形成複數條溝23、23A、23B。
In the above-mentioned embodiment, the plurality of
或者,亦可設成對第1透明基板21的正面及背面不施行任何加工,而是在第2透明基板21A的正面21a或背面21b對應於晶圓11之各LED電路19來形成複數條溝23、23A、23B。
Alternatively, it is also possible to form a plurality of grooves corresponding to the
已實施透明基板加工步驟之後,實施透明基板貼附步驟,該透明基板貼附步驟是將第1透明基板21的正面21a貼附到晶圓11的背面11b,並且將第2透明基板21A的正面21a貼附到第1透明基板21的背面21b。
After the transparent substrate processing step has been implemented, a transparent substrate attaching step is implemented. The transparent substrate attaching step is to attach the
在此透明基板貼附步驟中,是如圖3(A)所示,藉由透明接著劑將晶圓11的背面11b接著於已在正面21a形成有朝第1方向伸長的複數條溝23之第1透明基板21的正面,以如圖3(B)所示,將晶圓11和第1透明基板21一體化而形成第1一體化晶圓25。
In this transparent substrate attaching step, as shown in FIG. 3(A), the
作為替代實施形態,亦可設成藉由透明接著劑將晶圓11的背面11b接著於如圖4所示,在第1透明基板
21的正面21a具有朝第1方向及朝與此第1方向正交的第2方向伸長的複數條溝23之第1透明基板21的正面21a,來將晶圓11和第1透明基板21一體化。在此,已形成在第1透明基板21的正面21a的溝23的間距是對應於晶圓11的分割預定線17的間距。
As an alternative embodiment, it can also be set as that the
接著,如圖5(A)所示,將內部形成有複數個氣泡29A的第2透明基板21A的正面21a貼附到第1一體化晶圓25的第1透明基板21的背面21b,以形成如圖5(B)所示的第2一體化晶圓25A。
Next, as shown in FIG. 5(A), the
此透明基板貼附步驟並非限定於上述之順序的步驟,亦可設成:於將第2透明基板21A的正面21a貼附在第1透明基板21的背面21b後,再將第1透明基板21的正面21a貼附到晶圓11的背面11b來形成第2一體化晶圓25A。
This transparent substrate attaching step is not limited to the steps of the above-mentioned order, and may also be set as follows: after attaching the
已實施透明基板貼附步驟後,實施支撐步驟,該支撐步驟是如圖6所示,將第2一體化晶圓25A的第2透明基板21A貼附到外周部已貼附於環狀框架F上之切割膠帶T來形成框架單元,並透過切割膠帶T以環狀框架F支撐第2一體化晶圓25A。
After the step of attaching the transparent substrate is carried out, the step of supporting is carried out. As shown in FIG. The dicing tape T is used to form a frame unit, and the second
已實施支撐步驟之後,實施分割步驟,該分割步驟是將框架單元投入切削裝置,並且利用切削裝置來將一體化晶圓25切削以分割成一個個的發光二極體晶片。參照圖7來說明此分割步驟。
After the supporting step is carried out, the dividing step is carried out. In the dividing step, the frame unit is put into the cutting device, and the
在分割步驟中,是隔著框架單元的切割膠帶
T而在切削裝置的工作夾台20上吸引保持第2一體化晶圓25A,且環狀框架F是以圖未示的夾具夾持來固定。
During the segmentation step, it is the dicing tape that separates the frame unit
T, the second
然後,使切削刀14一邊朝箭頭R方向高速旋轉一邊切入晶圓11的分割預定線17直到切削刀14的前端到達切割膠帶T為止,並且一邊從冷卻噴嘴18朝向切削刀14及晶圓11的加工點供給切削液一邊將第2一體化晶圓25A朝箭頭X1方向加工進給,藉此形成沿著晶圓11的分割預定線17切斷晶圓11以及第1、第2透明基板21、21A的切斷溝27。
Then, the
將切削單元10在Y軸方向上分度進給,並且沿著朝第1方向伸長的分割預定線17逐次地形成同樣的切斷溝27。其次,將工作夾台20旋轉90°之後,沿著於與第1方向正交的第2方向上伸長之全部的分割預定線17形成同樣的切斷溝27,以形成圖8所示之狀態,藉此將第2一體化晶圓25A分割成如圖9所示的發光二極體晶片31。
The cutting
在上述之實施形態中,雖然在將第2一體化晶圓25A分割成一個個的發光二極體晶片31上是使用切削裝置,但是亦可設成:將對晶圓11及透明基板21、21A具有穿透性之波長的雷射光束沿著分割預定線13朝晶圓11照射,並且在晶圓11以及透明基板21、21A的內部於厚度方向上形成複數層的改質層,接著,對第2一體化晶圓25A賦與外力,來以改質層為分割起點將第2一體化晶圓25A分割成一個個的發光二極體晶片31。
In the above-mentioned embodiment, although the cutting device is used on the light-emitting
圖9(A)所示的發光二極體晶片31是在正面
具有LED電路19之LED13A的背面貼附有第1透明構件21’,且該第1透明構件21’於內部形成有複數個氣泡29。又,在第1透明構件21’的正面形成有溝23B。此外,在第1透明構件21’的背面貼附有內部形成有複數個氣泡的第2透明構件21A’。
The light-emitting
圖9(B)所示的發光二極體晶片31A是在正面具有LED電路19之LED13A的背面貼附有第1透明構件21’,且該第1透明構件21’於內部形成有複數個氣泡。又,在第1透明構件21’的背面形成有溝23B。此外,將第2透明構件21A’的正面貼附於第1透明構件21’的背面。
The light emitting
圖9(C)所示的發光二極體晶片31B是在正面具有LED電路19之LED13A的背面貼附有第1透明構件21’,且該第1透明構件21’於內部形成有複數個氣泡。此外,在第1透明構件21’的背面貼附有第2透明構件21A’。又,在第2透明構件21A’的正面形成有溝23B。
The light emitting
圖9(D)所示的發光二極體晶片31C是在正面具有LED電路19之LED13A的背面貼附有第1透明構件21’,且該第1透明構件21’於內部形成有複數個氣泡。此外,將第2透明構件21A’的正面貼附於第1透明構件21’的背面。又,在第2透明構件21A’的背面形成有溝23B。
In the light emitting
從而,在圖9(A)所示之發光二極體晶片31上,由於在第1透明構件21’的正面形成有溝23B,所以會使第1透明構件21’的表面積增大。此外,從發光二極體晶片31的LED電路19射出並朝第1透明構件21’入射之光的
一部分是在溝23B部分進行折射後進入第1透明構件21’內。
Therefore, in the light emitting
據此,在光從第1透明構件21’及第2透明構件21A’朝外部折射而射出之時,在第1及第2透明構件21’、21A’與空氣層之間的界面上之入射角成為臨界角以上之光的比例會減少,而使從第1、第2透明構件21’、21A’射出之光的量增大,並使發光二極體晶片31的亮度提升。
Accordingly, when the light is refracted and emitted from the first transparent member 21' and the second
關於圖9(B)至圖9(D)所示之發光二極體晶片31A、31B、31C,也是發揮與圖9(A)所示之發光二極體晶片31同樣的作用效果。
The light emitting
13A:LED 13A:LED
19:LED電路 19: LED circuit
21’:第1透明構件 21': The first transparent member
21A’:第2透明構件 21A': the second transparent member
23B:溝 23B: ditch
31、31A、31B、31C:發光二極體晶片 31, 31A, 31B, 31C: light emitting diode chip
Claims (4)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017-041315 | 2017-03-06 | ||
JP2017041315A JP2018148016A (en) | 2017-03-06 | 2017-03-06 | Method for manufacturing light-emitting diode chip and light-emitting diode chip |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201838000A TW201838000A (en) | 2018-10-16 |
TWI789375B true TWI789375B (en) | 2023-01-11 |
Family
ID=63485903
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW107104141A TWI789375B (en) | 2017-03-06 | 2018-02-06 | Manufacturing method of light emitting diode wafer |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2018148016A (en) |
KR (1) | KR102315305B1 (en) |
CN (1) | CN108538995A (en) |
TW (1) | TWI789375B (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013114480A1 (en) * | 2012-02-01 | 2013-08-08 | パナソニック株式会社 | Semiconductor light-emitting element, method for manufacturing same, and light source device |
TW201347242A (en) * | 2012-02-27 | 2013-11-16 | Mitsubishi Chem Corp | Wavelength conversion unit and semiconductor light-emitting device using the wavelength conversion unit |
TW201444120A (en) * | 2013-05-08 | 2014-11-16 | Ind Tech Res Inst | LED wafer and manufacturing method thereof |
TW201511331A (en) * | 2013-08-30 | 2015-03-16 | Asahi Kasei E Materials Corp | Semiconductor light-emitting element, and optical film |
JP2016521463A (en) * | 2013-05-15 | 2016-07-21 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | LED having scattering mechanism in substrate |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4122739B2 (en) * | 2001-07-26 | 2008-07-23 | 松下電工株式会社 | Light emitting device and manufacturing method thereof |
JP4232585B2 (en) * | 2003-09-17 | 2009-03-04 | 豊田合成株式会社 | Light emitting device |
KR100959079B1 (en) * | 2005-06-27 | 2010-05-20 | 한빔 주식회사 | Light emitting diode device having enhanced heat dissipation and preparation method thereof |
JP5495876B2 (en) * | 2010-03-23 | 2014-05-21 | 株式会社ディスコ | Processing method of optical device wafer |
KR101726807B1 (en) * | 2010-11-01 | 2017-04-14 | 삼성전자주식회사 | Light Emitting Device |
JP5941306B2 (en) * | 2012-03-19 | 2016-06-29 | スタンレー電気株式会社 | Light emitting device and manufacturing method thereof |
TWI581458B (en) * | 2012-12-07 | 2017-05-01 | 晶元光電股份有限公司 | Light-emitting device |
JP2014175362A (en) * | 2013-03-06 | 2014-09-22 | Toshiba Corp | Semiconductor light-emitting element and method of manufacturing the same |
JP2014175354A (en) | 2013-03-06 | 2014-09-22 | Disco Abrasive Syst Ltd | Light-emitting diode |
JP2014239123A (en) * | 2013-06-06 | 2014-12-18 | 株式会社ディスコ | Processing method |
JP2015018953A (en) * | 2013-07-11 | 2015-01-29 | 株式会社ディスコ | Light emitting chip |
KR20150047844A (en) * | 2013-10-25 | 2015-05-06 | 주식회사 세미콘라이트 | Semiconductor light emitting diode |
KR101539994B1 (en) * | 2013-11-28 | 2015-07-30 | 순천대학교 산학협력단 | Edge light emitting diode and method of fabricating the same |
JP6255235B2 (en) * | 2013-12-20 | 2017-12-27 | 株式会社ディスコ | Light emitting chip |
WO2015099084A1 (en) * | 2013-12-26 | 2015-07-02 | 信越石英株式会社 | Silica glass member for wavelength conversion, and production method therefor |
JP6255255B2 (en) | 2014-01-27 | 2017-12-27 | 株式会社ディスコ | Optical device processing method |
KR101662751B1 (en) * | 2015-07-02 | 2016-10-07 | 참엔지니어링(주) | A substrate processing apparatus and a substrate processing method and a substrate which was produced using the same |
-
2017
- 2017-03-06 JP JP2017041315A patent/JP2018148016A/en active Pending
-
2018
- 2018-02-06 TW TW107104141A patent/TWI789375B/en active
- 2018-02-27 KR KR1020180023657A patent/KR102315305B1/en active IP Right Grant
- 2018-03-01 CN CN201810171673.1A patent/CN108538995A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013114480A1 (en) * | 2012-02-01 | 2013-08-08 | パナソニック株式会社 | Semiconductor light-emitting element, method for manufacturing same, and light source device |
TW201347242A (en) * | 2012-02-27 | 2013-11-16 | Mitsubishi Chem Corp | Wavelength conversion unit and semiconductor light-emitting device using the wavelength conversion unit |
TW201444120A (en) * | 2013-05-08 | 2014-11-16 | Ind Tech Res Inst | LED wafer and manufacturing method thereof |
JP2016521463A (en) * | 2013-05-15 | 2016-07-21 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | LED having scattering mechanism in substrate |
TW201511331A (en) * | 2013-08-30 | 2015-03-16 | Asahi Kasei E Materials Corp | Semiconductor light-emitting element, and optical film |
Also Published As
Publication number | Publication date |
---|---|
JP2018148016A (en) | 2018-09-20 |
KR102315305B1 (en) | 2021-10-19 |
KR20180102010A (en) | 2018-09-14 |
CN108538995A (en) | 2018-09-14 |
TW201838000A (en) | 2018-10-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI771358B (en) | Manufacturing method of light-emitting diode chip and light-emitting diode chip | |
TWI789375B (en) | Manufacturing method of light emitting diode wafer | |
TW201836173A (en) | Manufacturing method of LED chips and LED chips capable of achieving sufficient brightness | |
TW201824592A (en) | Light-emitting diode chip manufacturing method and light-emitting diode chip | |
TW201822382A (en) | Light-emitting diode chip manufacturing method and light-emitting diode chip | |
TWI717506B (en) | Manufacturing method of light-emitting diode chip | |
TWI739999B (en) | Manufacturing method of light-emitting diode chip | |
TWI736738B (en) | Method for manufacturing light-emitting diode chip and light-emitting diode chip | |
TWI742238B (en) | Method for manufacturing light-emitting diode chip and light-emitting diode chip | |
TWI732047B (en) | Method for manufacturing light-emitting diode chip and light-emitting diode chip | |
JP2017220479A (en) | Method for manufacturing light-emitting diode chip | |
JP2017220478A (en) | Method for manufacturing light-emitting diode chip and light-emitting diode chip | |
TWI757292B (en) | Manufacturing method of light-emitting diode chip | |
JP6821260B2 (en) | Manufacturing method of light emitting diode chip and light emitting diode chip | |
TW201832375A (en) | Manufacturing method of light-emitting diode and light-emitting diode chip to obtain sufficient brightness | |
TW201814199A (en) | Manufacturing method of light emitting diode chip and light emitting diode chip including a wafer preparing step, a transparent substrate preparing step, an integrating step and a cutting step, and the light emitting diode chip is being provided with a sufficient brightness | |
TW201832380A (en) | Manufacturing method of light-emitting diode and light-emitting diode chip by sticking the front surface of a first transparent substrate having bubbles therein, and affixing the front surface of a second transparent substrate having through holes on the whole surface, etc. | |
TW201812889A (en) | Method for manufacturing light-emitting diode chip and light-emitting diode chip | |
TW201834040A (en) | Method for manufacturing light-emitting diode chip and light-emitting diode chip increases the brightness of the LED chip | |
KR20180091747A (en) | Method for manufacturing a light emitting diode chip and a light emitting diode chip | |
TW201817030A (en) | Manufacturing method of light emitting diode chip and light emitting diode chip capable of fabricating light emitting diode chips with a sufficient brightness | |
TW201826492A (en) | Fabricating method of a light-emitting diode chip and light-emitting diode chip which can obtain sufficient luminance | |
TW201830725A (en) | Method for manufacturing light emitting diode chip | |
JP2018026387A (en) | Manufacturing method of light-emitting diode chip | |
JP2018026384A (en) | Manufacturing method of light-emitting diode chip and light-emitting diode chip |