TWI789375B - Manufacturing method of light emitting diode wafer - Google Patents

Manufacturing method of light emitting diode wafer Download PDF

Info

Publication number
TWI789375B
TWI789375B TW107104141A TW107104141A TWI789375B TW I789375 B TWI789375 B TW I789375B TW 107104141 A TW107104141 A TW 107104141A TW 107104141 A TW107104141 A TW 107104141A TW I789375 B TWI789375 B TW I789375B
Authority
TW
Taiwan
Prior art keywords
transparent substrate
wafer
transparent
emitting diode
light
Prior art date
Application number
TW107104141A
Other languages
Chinese (zh)
Other versions
TW201838000A (en
Inventor
岡村卓
Original Assignee
日商迪思科股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商迪思科股份有限公司 filed Critical 日商迪思科股份有限公司
Publication of TW201838000A publication Critical patent/TW201838000A/en
Application granted granted Critical
Publication of TWI789375B publication Critical patent/TWI789375B/en

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/58Optical field-shaping elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/20Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/483Containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008Processes
    • H01L2933/0033Processes relating to semiconductor body packages
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008Processes
    • H01L2933/0033Processes relating to semiconductor body packages
    • H01L2933/0058Processes relating to semiconductor body packages relating to optical field-shaping elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Led Devices (AREA)
  • Dicing (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Laser Beam Processing (AREA)

Abstract

提供一種可得到充分的亮度的發光二極體晶片的製造方法及發光二極體晶片。 Provided are a method of manufacturing a light emitting diode wafer capable of obtaining sufficient luminance, and a light emitting diode wafer.

一種發光二極體晶片的製造方法,其特徵在於具備有:晶圓準備步驟,準備晶圓,該晶圓是在結晶成長用之透明基板上具有積層體層,並於該積層體層的正面以相互交叉之複數條分割預定線所區劃出之各區域中各自形成有LED電路,該積層體層形成有包含發光層的複數層半導體層;透明基板加工步驟,在內部形成有複數個氣泡的第1透明基板或內部形成有複數個氣泡的第2透明基板之至少其中任一個的正面或背面,對應於LED電路來形成複數條溝;透明基板貼附步驟,在實施該透明基板加工步驟後,將該第1透明基板的正面貼附在晶圓的背面,並且將該第2透明基板的正面貼附在該第1透明基板的背面以形成一體化晶圓;及分割步驟,在實施該透明基板貼附步驟後,沿著該分割預定線將該晶圓和該第1及第2透明基板一起切斷以將該一體化晶圓分割成一個個的發光二極體晶片。 A method for manufacturing a light-emitting diode chip, characterized in that it includes: a wafer preparation step, preparing a wafer, the wafer has a laminated body layer on a transparent substrate for crystal growth, and the front side of the laminated body layer is connected to each other LED circuits are formed in each area demarcated by the plurality of intersecting dividing lines, and the laminate layer is formed with a plurality of semiconductor layers including a light-emitting layer; a transparent substrate processing step, forming a first transparent substrate with a plurality of air bubbles inside. On the front or back of at least any one of the substrate or the second transparent substrate with a plurality of air bubbles formed therein, a plurality of grooves are formed corresponding to the LED circuit; the step of attaching the transparent substrate is carried out after the step of processing the transparent substrate. The front of the first transparent substrate is attached to the back of the wafer, and the front of the second transparent substrate is attached to the back of the first transparent substrate to form an integrated wafer; After the additional step, the wafer is cut together with the first and second transparent substrates along the planned dividing line to divide the integrated wafer into individual light emitting diode chips.

Description

發光二極體晶片的製造方法 Manufacturing method of light emitting diode wafer 發明領域 field of invention

本發明是有關於一種發光二極體晶片的製造方法及發光二極體晶片。 The invention relates to a manufacturing method of a light emitting diode wafer and the light emitting diode wafer.

發明背景 Background of the invention

在藍寶石基板、GaN基板、SiC基板等的結晶成長用基板的正面上形成有將n型半導體層、發光層、p型半導體層積層複數層而成的積層體層,並且在此積層體層上藉由交叉的複數條分割預定線所區劃出的區域中形成有複數個LED(發光二極體(Light Emitting Diode))等之發光元件的晶圓,是沿著分割預定線切斷而分割成一個個的發光元件晶片,已分割的發光元件晶片可廣泛地應用在手機、個人電腦、照明機器等的各種電氣機器上。 On the front surface of a substrate for crystal growth such as a sapphire substrate, a GaN substrate, or a SiC substrate, a laminate layer in which an n-type semiconductor layer, a light-emitting layer, and a p-type semiconductor layer are laminated is formed. Wafers on which light-emitting elements such as LEDs (Light Emitting Diodes) are formed in the area demarcated by a plurality of intersecting planned dividing lines are cut along the planned dividing lines and divided into individual wafers. Divided light-emitting element wafers can be widely used in various electrical equipment such as mobile phones, personal computers, and lighting equipment.

由於從發光元件晶片的發光層射出的光具有各向同性,所以即使被照射到結晶成長用基板的內部也會使光從基板的背面及側面射出。然而,由於已被照射到基板之內部的光之中在與空氣層之間的界面上的入射角為臨界角以上的光會在界面上進行全反射而被封閉在基板內部,並不會有從基板射出到外部之情形,所以會有導致發光元件晶片的亮度降低的問題。 Since the light emitted from the light-emitting layer of the light-emitting element wafer is isotropic, even if it is irradiated into the inside of the substrate for crystal growth, the light is emitted from the back surface and the side surface of the substrate. However, since the light irradiated to the inside of the substrate has an incident angle above the critical angle on the interface with the air layer, it is totally reflected on the interface and is enclosed inside the substrate, and there is no Since the light is emitted from the substrate to the outside, there is a problem that the brightness of the light-emitting element wafer is lowered.

為了解決此問題,在日本專利特開2014-175354號公報中已記載有下述之發光二極體(LED):為了抑制從發光層射出的光被封閉在基板的內部,而形成為在基板的背面貼附透明構件來謀求亮度的提升。 In order to solve this problem, Japanese Patent Laid-Open No. 2014-175354 has described the following light-emitting diode (LED): In order to prevent the light emitted from the light-emitting layer from being confined inside the substrate, it is formed on the substrate. A transparent member is attached to the back to improve the brightness.

先前技術文獻 prior art literature 專利文獻 patent documents

專利文獻1:日本專利特開2014-175354號公報 Patent Document 1: Japanese Patent Laid-Open No. 2014-175354

發明概要 Summary of the invention

然而,在專利文獻1所揭示的發光二極體中,雖然可藉由在基板的背面貼附透明構件而使亮度稍微提升,但是仍有無法得到充分的亮度的問題。 However, in the light emitting diode disclosed in Patent Document 1, although the luminance can be slightly improved by attaching the transparent member on the back surface of the substrate, there is still a problem that sufficient luminance cannot be obtained.

本發明是有鑒於像這樣的點而作成的發明,其目的在於提供一種能夠得到充分的亮度的發光二極體晶片的製造方法及發光二極體晶片。 The present invention was made in view of such points, and an object of the present invention is to provide a method of manufacturing a light emitting diode wafer and a light emitting diode wafer capable of obtaining sufficient luminance.

依據請求項1記載的發明,可提供一種發光二極體晶片的製造方法,該發光二極體晶片的製造方法之特徵在於具備有:晶圓準備步驟,準備晶圓,該晶圓是在結晶成長用之透明基板上具有積層體層,並於該積層體層的正面以相互 交叉之複數條分割預定線所區劃出之各區域中各自形成有LED電路,該積層體層形成有包含發光層的複數層半導體層;透明基板加工步驟,在內部形成有複數個氣泡的第1透明基板或內部形成有複數個氣泡的第2透明基板之至少其中任一個的正面或背面,對應於LED電路來形成複數條溝;透明基板貼附步驟,在實施該透明基板加工步驟後,將該第1透明基板的正面貼附在晶圓的背面,並且將該第2透明基板的正面貼附在該第1透明基板的背面以形成一體化晶圓;及分割步驟,在實施該透明基板貼附步驟後,沿著該分割預定線將該晶圓和該第1及第2透明基板一起切斷以將該一體化晶圓分割成一個個的發光二極體晶片。 According to the invention described in Claim 1, a method of manufacturing a light emitting diode wafer can be provided, which is characterized in that it has: a wafer preparation step, preparing a wafer, and the wafer is crystallized There is a laminated body layer on the transparent substrate for growth, and the front side of the laminated body layer is mutually LED circuits are formed in each area demarcated by the plurality of intersecting dividing lines, and the laminate layer is formed with a plurality of semiconductor layers including a light-emitting layer; a transparent substrate processing step, forming a first transparent substrate with a plurality of air bubbles inside. On the front or back of at least any one of the substrate or the second transparent substrate with a plurality of air bubbles formed therein, a plurality of grooves are formed corresponding to the LED circuit; the step of attaching the transparent substrate is carried out after the step of processing the transparent substrate. The front of the first transparent substrate is attached to the back of the wafer, and the front of the second transparent substrate is attached to the back of the first transparent substrate to form an integrated wafer; After the additional step, the wafer is cut together with the first and second transparent substrates along the planned dividing line to divide the integrated wafer into individual light emitting diode chips.

較理想的是,在透明基板加工步驟中所形成之溝的截面形狀為三角形、四角形、或半圓形狀的任一種。較理想的是,在透明基板加工步驟中所形成的溝是藉由切削刀、蝕刻、噴砂、雷射的任一種方式而形成。 Preferably, the cross-sectional shape of the groove formed in the transparent substrate processing step is any one of triangular, quadrangular, or semicircular. Preferably, the groove formed in the transparent substrate processing step is formed by cutting knife, etching, sand blasting, or laser.

該第1及第2透明基板是以透明陶瓷、光學玻璃、藍寶石、透明樹脂的任一種所形成,並且在該透明基板貼附步驟中,該第1透明基板是利用透明接著劑來接著於晶圓,該第2透明基板是利用透明接著劑來接著於該第1透明基板。 The first and second transparent substrates are formed of any one of transparent ceramics, optical glass, sapphire, and transparent resin, and in the step of attaching the transparent substrate, the first transparent substrate is bonded to the crystal by using a transparent adhesive. Circle, the second transparent substrate is bonded to the first transparent substrate with a transparent adhesive.

依據請求項5記載的發明,可提供一種發光 二極體晶片,該發光二極體晶片具備於正面形成有LED電路的發光二極體、貼附在該發光二極體的背面之內部形成有複數個氣泡的第1透明構件、及貼附在該第1透明構件的背面之內部形成有複數個氣泡的第2透明構件,且在該第1透明構件或該第2透明構件之至少其中任一個的正面或背面形成有溝。 According to the invention described in Claim 5, a light-emitting A diode chip, the light emitting diode chip is equipped with a light emitting diode with an LED circuit formed on the front surface, a first transparent member with a plurality of air bubbles attached to the back of the light emitting diode, and an attached A second transparent member having a plurality of air cells is formed inside the back of the first transparent member, and a groove is formed on the front or back of at least one of the first transparent member or the second transparent member.

本發明的發光二極體晶片是藉由已形成於至少2層的透明構件的複數個氣泡與溝來使光複雜地折射而使被封閉在第1及第2透明構件內的光減少,且讓從第1及第2透明構件射出之光的量增大並使發光二極體晶片的亮度提升。 The light-emitting diode chip of the present invention reduces the light enclosed in the first and second transparent members by complexly refracting light through the plurality of air bubbles and grooves formed in at least two transparent members, and The amount of light emitted from the first and second transparent members is increased and the brightness of the light-emitting diode chip is improved.

10:切削單元 10: Cutting unit

11:光元件晶圓(晶圓) 11: Optical component wafer (wafer)

11a、21a:正面 11a, 21a: front

11b、21b:背面 11b, 21b: back

12:主軸殼體 12: Spindle housing

13:藍寶石基板 13: Sapphire substrate

13A:LED 13A:LED

14:切削刀 14: Cutter

15:積層體層 15: laminated body layer

16:刀片罩 16: Blade cover

17:分割預定線 17: Split scheduled line

18:冷卻噴嘴 18: Cooling nozzle

19:LED電路 19: LED circuit

20:工作夾台 20: Work clamp table

21:第1透明基板 21: The first transparent substrate

21A:第2透明基板 21A: Second transparent substrate

21’:第1透明構件 21': The first transparent member

21A’:第2透明構件 21A': the second transparent member

23、23A、23B:溝 23, 23A, 23B: ditch

25:第1一體化晶圓 25: The first integrated wafer

25A:第2一體化晶圓 25A: The second integrated wafer

27:切斷溝 27: cut groove

29、29A:氣泡 29, 29A: Bubbles

31、31A、31B、31C:發光二極體晶片 31, 31A, 31B, 31C: light emitting diode chip

R、X1:箭頭 R, X1: Arrow

T:切割膠帶 T: cutting tape

F:環狀框架 F: ring frame

X、Y、Z:方向 X, Y, Z: direction

圖1是光元件晶圓的正面側立體圖。 FIG. 1 is a front perspective view of an optical element wafer.

圖2(A)是顯示透明基板加工步驟的立體圖,圖2(B)~圖2(D)是顯示所形成之溝形狀的截面圖。 FIG. 2(A) is a perspective view showing the processing steps of the transparent substrate, and FIG. 2(B) to FIG. 2(D) are cross-sectional views showing the shape of the groove formed.

圖3(A)是顯示將於正面具有複數條朝第1方向伸長之溝的第1透明基板貼附在晶圓之背面而形成第1一體化晶圓之透明基板貼附步驟的立體圖,圖3(B)是第1一體化晶圓的立體圖。 Fig. 3 (A) is a perspective view showing the transparent substrate attaching step of forming the first integrated wafer by attaching the first transparent substrate having a plurality of grooves extending toward the first direction on the front surface to the back of the wafer. 3(B) is a perspective view of the first integrated wafer.

圖4是顯示將於正面具有朝第1方向及朝與第1方向正交的第2方向伸長之複數條溝的第1透明基板貼附於晶圓之背面來進行一體化之透明基板步驟的立體圖。 Fig. 4 is a diagram showing steps of integrating a first transparent substrate having a plurality of grooves extending in the first direction and in the second direction perpendicular to the first direction on the back surface of the wafer. stereogram.

圖5(A)是顯示將第2透明基板的正面貼附到第1一體 化晶圓之背面而形成第2一體化晶圓之情形的立體圖,圖5(B)是第2一體化晶圓的立體圖。 Fig. 5 (A) shows that the front side of the second transparent substrate is attached to the first body 5(B) is a perspective view of the second integrated wafer.

圖6是顯示透過切割膠帶而以環狀框架支撐第2一體化晶圓的支撐步驟的立體圖。 6 is a perspective view showing a supporting step of supporting a second integrated wafer with a ring frame through a dicing tape.

圖7是顯示將第2一體化晶圓分割成發光二極體晶片的分割步驟的立體圖。 Fig. 7 is a perspective view showing a step of dividing the second integrated wafer into light emitting diode chips.

圖8是分割步驟結束後之第2一體化晶圓的立體圖。 FIG. 8 is a perspective view of the second integrated wafer after the dividing step is completed.

圖9(A)~圖9(D)是本發明實施形態的發光二極體晶片的立體圖。 9(A) to 9(D) are perspective views of a light emitting diode wafer according to an embodiment of the present invention.

用以實施發明之形態 form for carrying out the invention

以下,參照圖式詳細地說明本發明的實施形態。參照圖1,所示為光元件晶圓(以下,有時會簡稱為晶圓)11的正面側立體圖。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Referring to FIG. 1 , there is shown a front perspective view of an optical element wafer (hereinafter, sometimes simply referred to as a wafer) 11 .

光元件晶圓11是在藍寶石基板13上積層氮化鎵(GaN)等的晶膜層(epitaxial layer)(積層體層)15而構成的。光元件晶圓11具有積層有晶膜層15的正面11a、及露出了藍寶石基板13的背面11b。 The optical element wafer 11 is formed by laminating an epitaxial layer (laminate layer) 15 such as gallium nitride (GaN) on a sapphire substrate 13 . The optical element wafer 11 has a front surface 11a on which the crystal film layer 15 is laminated, and a back surface 11b on which the sapphire substrate 13 is exposed.

在此,在本實施形態的光元件晶圓11中,雖然是採用藍寶石基板13作為結晶成長用基板,但是也可以採用GaN基板或SiC基板等來替代藍寶石基板13。 Here, in the optical element wafer 11 of this embodiment, the sapphire substrate 13 is used as the substrate for crystal growth, but a GaN substrate, a SiC substrate, or the like may be used instead of the sapphire substrate 13 .

積層體層(晶膜層)15是藉由依序使電子成為多數載子(carrier)的n型半導體層(例如n型GaN層)、成為發光層的半導體層(例如InGaN層)、電洞成為多數載子的p 型半導體層(例如p型GaN層)進行晶膜生長而形成。 The laminated body layer (crystal film layer) 15 is formed by sequentially making electrons a majority carrier (carrier) n-type semiconductor layer (such as an n-type GaN layer), a semiconductor layer that becomes a light-emitting layer (such as an InGaN layer), and holes that become a majority. Carrier p -type semiconductor layer (for example, p-type GaN layer) is formed by crystal film growth.

藍寶石基板13具有例如100μm的厚度,且積層體層15具有例如5μm的厚度。於積層體層15上以形成為格子狀的複數條分割預定線17來區劃而形成有複數個LED電路19。晶圓11具有形成有LED電路19的正面11a、和露出了藍寶石基板13的背面11b。 Sapphire substrate 13 has a thickness of, for example, 100 μm, and laminate layer 15 has a thickness of, for example, 5 μm. A plurality of LED circuits 19 are formed on the laminated body layer 15 by dividing by a plurality of dividing lines 17 formed in a lattice. Wafer 11 has front surface 11 a on which LED circuit 19 is formed, and back surface 11 b on which sapphire substrate 13 is exposed.

依據本發明實施形態的發光二極體晶片的製造方法,首先會實施準備如圖1所示的光元件晶圓11的晶圓準備步驟。又,還實施準備如圖2(A)及圖5所示之內部形成有複數個氣泡之第1透明基板21及內部形成有複數個氣泡29A之第2透明基板21A的透明基板準備步驟。 According to the manufacturing method of the light emitting diode wafer according to the embodiment of the present invention, the wafer preparation step of preparing the optical element wafer 11 as shown in FIG. 1 will be implemented first. 2 (A) and FIG. 5, the first transparent substrate 21 with a plurality of air bubbles formed therein and the second transparent substrate 21A with a plurality of air bubbles 29A formed therein are also prepared.

已實施晶圓及透明基板準備步驟後,實施透明基板加工步驟,該透明基板加工步驟是在要貼附於晶圓11的背面11b之第1透明基板21的正面或背面、或者在要貼附於第1透明基板21的背面之第2透明基板21A的正面或背面,對應於LED電路19而形成複數條溝。此透明基板加工步驟是使用例如已廣為周知的切削裝置來實施。 After the preparation steps of the wafer and the transparent substrate have been implemented, the transparent substrate processing step is carried out. A plurality of grooves are formed corresponding to the LED circuits 19 on the front or back surface of the second transparent substrate 21A on the back surface of the first transparent substrate 21 . The transparent substrate processing step is implemented using, for example, a well-known cutting device.

如圖2(A)所示,切削裝置的切削單元10包含有主軸殼體12、可旋轉地插入主軸殼體12中的圖未示的主軸、和裝設在主軸的前端的切削刀14。 As shown in FIG. 2(A), the cutting unit 10 of the cutting device includes a spindle housing 12, a spindle (not shown) rotatably inserted into the spindle housing 12, and a cutting blade 14 mounted on the front end of the spindle.

切削刀14的切割刃是以例如用鍍鎳方式來將鑽石磨粒固定而成的電鑄磨石所形成,且其前端形狀是做成三角形、四角形、或半圓形。 The cutting edge of the cutting blade 14 is formed by, for example, an electroformed grindstone with diamond abrasive grains fixed by nickel plating, and its front end is triangular, square, or semicircular.

切削刀14的大致上半部分是被刀片罩 (blade cover)(輪罩(wheel cover))16所覆蓋,在刀片罩16上配設有於切削刀14的裏側及近前側水平地伸長的一對(圖中僅顯示1支)冷卻噴嘴18。 The roughly upper half of the cutting knife 14 is covered by the blade (blade cover) (wheel cover (wheel cover)) 16 is covered, and on the blade cover 16, a pair of (only one is shown in the figure) cooling nozzles 18 extending horizontally on the back side and near front side of the cutting blade 14 is arranged. .

在第1透明基板21的正面21a形成複數條溝23的透明基板加工步驟中,是將第1透明基板21以圖未示的切削裝置的工作夾台來吸引保持。然後,藉由一邊使切削刀14朝箭頭R方向高速旋轉,一邊在第1透明基板21的正面21a切入規定深度,且將保持在圖未示之工作夾台上的第1透明基板21朝箭頭X1方向加工進給,以藉由切削而形成在第1方向上伸長的溝23。 In the transparent substrate processing step of forming the plurality of grooves 23 on the front surface 21a of the first transparent substrate 21, the first transparent substrate 21 is sucked and held by a chuck of a cutting device not shown. Then, by rotating the cutting blade 14 at a high speed in the direction of the arrow R, the front surface 21a of the first transparent substrate 21 is cut to a predetermined depth, and the first transparent substrate 21 held on the work holder (not shown) is moved toward the arrow R direction. Machining feed in the X1 direction forms the groove 23 elongated in the first direction by cutting.

將第1透明基板21朝正交於箭頭X1方向的方向按晶圓11的分割預定線17的每個間距來分度進給,並且切削第1透明基板21的正面21a,以如圖3所示,逐次地形成朝第1方向伸長的複數條溝23。 The first transparent substrate 21 is indexed and fed in a direction perpendicular to the direction of the arrow X1 according to each pitch of the planned dividing line 17 of the wafer 11, and the front surface 21a of the first transparent substrate 21 is cut, so that as shown in FIG. 3 As shown, a plurality of grooves 23 extending in the first direction are sequentially formed.

如圖3(A)所示,形成在第1透明基板21的正面21a的複數條溝23可為僅在一個方向上伸長的形態、或者也可設成如圖4所示,在第1透明基板21的正面21a形成朝第1方向及朝與該第1方向正交的第2方向伸長之複數條溝23。 As shown in FIG. 3(A), the plurality of grooves 23 formed on the front surface 21a of the first transparent substrate 21 may be elongated in only one direction, or may be set as shown in FIG. On the front surface 21a of the substrate 21, a plurality of grooves 23 extending in a first direction and a second direction perpendicular to the first direction are formed.

形成在第1透明基板21的正面21a的溝,為如圖2(B)所示之截面三角形的溝23、或如圖2(C)所示之截面四角形的溝23A、或如圖2(D)所示之截面半圓形的溝23B的任一種皆可。 The groove formed on the front side 21a of the first transparent substrate 21 is a groove 23 with a triangular cross-section as shown in FIG. 2 (B), or a quadrangular groove 23A with a cross-section as shown in FIG. Any of the semicircular cross-sectional grooves 23B shown in D) may be used.

第1透明基板21及第2透明基板21A是由透 明樹脂、光學玻璃、藍寶石、透明陶瓷的任一種所形成。在本實施形態中,是由比光學玻璃更有耐久性之聚碳酸酯、丙烯酸等之透明樹脂來形成第1透明基板21及第2透明基板21A。再者,作為形成溝的方法,亦可使用噴砂(sandblast)、蝕刻、雷射。 The first transparent substrate 21 and the second transparent substrate 21A are made of transparent Any one of bright resin, optical glass, sapphire, and transparent ceramics. In this embodiment, the first transparent substrate 21 and the second transparent substrate 21A are formed of a transparent resin such as polycarbonate or acrylic, which is more durable than optical glass. In addition, as a method of forming the groove, sandblasting (sandblast), etching, or laser can also be used.

雖然在上述之實施形態中,是在第1透明基板21的正面21a形成有複數條溝23、23A、23B,但亦可取代此實施形態,而設成為在第1透明基板21的背面21b形成複數條溝23、23A、23B。 In the above-mentioned embodiment, the plurality of grooves 23, 23A, and 23B are formed on the front surface 21a of the first transparent substrate 21, but instead of this embodiment, it may be formed on the back surface 21b of the first transparent substrate 21. A plurality of grooves 23, 23A, 23B.

或者,亦可設成對第1透明基板21的正面及背面不施行任何加工,而是在第2透明基板21A的正面21a或背面21b對應於晶圓11之各LED電路19來形成複數條溝23、23A、23B。 Alternatively, it is also possible to form a plurality of grooves corresponding to the LED circuits 19 of the wafer 11 on the front surface 21a or the back surface 21b of the second transparent substrate 21A without performing any processing on the front and back surfaces of the first transparent substrate 21. 23, 23A, 23B.

已實施透明基板加工步驟之後,實施透明基板貼附步驟,該透明基板貼附步驟是將第1透明基板21的正面21a貼附到晶圓11的背面11b,並且將第2透明基板21A的正面21a貼附到第1透明基板21的背面21b。 After the transparent substrate processing step has been implemented, a transparent substrate attaching step is implemented. The transparent substrate attaching step is to attach the front surface 21a of the first transparent substrate 21 to the back surface 11b of the wafer 11, and attach the front surface of the second transparent substrate 21A to the back surface 11b of the wafer 11. 21a is attached to the back surface 21b of the first transparent substrate 21 .

在此透明基板貼附步驟中,是如圖3(A)所示,藉由透明接著劑將晶圓11的背面11b接著於已在正面21a形成有朝第1方向伸長的複數條溝23之第1透明基板21的正面,以如圖3(B)所示,將晶圓11和第1透明基板21一體化而形成第1一體化晶圓25。 In this transparent substrate attaching step, as shown in FIG. 3(A), the back side 11b of the wafer 11 is attached to the front side 21a where the plurality of grooves 23 elongated in the first direction are formed with a transparent adhesive. On the front side of the first transparent substrate 21 , as shown in FIG. 3(B) , the wafer 11 and the first transparent substrate 21 are integrated to form a first integrated wafer 25 .

作為替代實施形態,亦可設成藉由透明接著劑將晶圓11的背面11b接著於如圖4所示,在第1透明基板 21的正面21a具有朝第1方向及朝與此第1方向正交的第2方向伸長的複數條溝23之第1透明基板21的正面21a,來將晶圓11和第1透明基板21一體化。在此,已形成在第1透明基板21的正面21a的溝23的間距是對應於晶圓11的分割預定線17的間距。 As an alternative embodiment, it can also be set as that the back surface 11b of the wafer 11 is bonded to the first transparent substrate as shown in FIG. The front side 21a of 21 has the front side 21a of the first transparent substrate 21 of a plurality of grooves 23 extending toward the first direction and the second direction perpendicular to the first direction, so that the wafer 11 and the first transparent substrate 21 are integrated. change. Here, the pitch of the grooves 23 formed on the front surface 21 a of the first transparent substrate 21 corresponds to the pitch of the planned dividing lines 17 of the wafer 11 .

接著,如圖5(A)所示,將內部形成有複數個氣泡29A的第2透明基板21A的正面21a貼附到第1一體化晶圓25的第1透明基板21的背面21b,以形成如圖5(B)所示的第2一體化晶圓25A。 Next, as shown in FIG. 5(A), the front surface 21a of the second transparent substrate 21A with a plurality of bubbles 29A formed therein is attached to the back surface 21b of the first transparent substrate 21 of the first integrated wafer 25 to form The second integrated wafer 25A is shown in FIG. 5(B).

此透明基板貼附步驟並非限定於上述之順序的步驟,亦可設成:於將第2透明基板21A的正面21a貼附在第1透明基板21的背面21b後,再將第1透明基板21的正面21a貼附到晶圓11的背面11b來形成第2一體化晶圓25A。 This transparent substrate attaching step is not limited to the steps of the above-mentioned order, and may also be set as follows: after attaching the front surface 21a of the second transparent substrate 21A to the back surface 21b of the first transparent substrate 21, the first transparent substrate 21 The front side 21a of the wafer 11 is attached to the back side 11b of the wafer 11 to form a second integrated wafer 25A.

已實施透明基板貼附步驟後,實施支撐步驟,該支撐步驟是如圖6所示,將第2一體化晶圓25A的第2透明基板21A貼附到外周部已貼附於環狀框架F上之切割膠帶T來形成框架單元,並透過切割膠帶T以環狀框架F支撐第2一體化晶圓25A。 After the step of attaching the transparent substrate is carried out, the step of supporting is carried out. As shown in FIG. The dicing tape T is used to form a frame unit, and the second integrated wafer 25A is supported by the ring frame F through the dicing tape T.

已實施支撐步驟之後,實施分割步驟,該分割步驟是將框架單元投入切削裝置,並且利用切削裝置來將一體化晶圓25切削以分割成一個個的發光二極體晶片。參照圖7來說明此分割步驟。 After the supporting step is carried out, the dividing step is carried out. In the dividing step, the frame unit is put into the cutting device, and the integrated wafer 25 is cut by the cutting device to be divided into individual LED chips. This dividing step will be described with reference to FIG. 7 .

在分割步驟中,是隔著框架單元的切割膠帶 T而在切削裝置的工作夾台20上吸引保持第2一體化晶圓25A,且環狀框架F是以圖未示的夾具夾持來固定。 During the segmentation step, it is the dicing tape that separates the frame unit T, the second integrated wafer 25A is sucked and held on the chuck table 20 of the cutting device, and the ring frame F is clamped and fixed by a jig not shown in the figure.

然後,使切削刀14一邊朝箭頭R方向高速旋轉一邊切入晶圓11的分割預定線17直到切削刀14的前端到達切割膠帶T為止,並且一邊從冷卻噴嘴18朝向切削刀14及晶圓11的加工點供給切削液一邊將第2一體化晶圓25A朝箭頭X1方向加工進給,藉此形成沿著晶圓11的分割預定線17切斷晶圓11以及第1、第2透明基板21、21A的切斷溝27。 Then, the cutting blade 14 is rotated at high speed in the arrow R direction while cutting into the planned dividing line 17 of the wafer 11 until the front end of the cutting blade 14 reaches the dicing tape T, and the cooling nozzle 18 is directed toward the cutting blade 14 and the wafer 11. While supplying the cutting fluid at the processing point, the second integrated wafer 25A is processed and fed in the direction of the arrow X1, whereby the cut wafer 11 and the first and second transparent substrates 21, Cutting groove 27 of 21A.

將切削單元10在Y軸方向上分度進給,並且沿著朝第1方向伸長的分割預定線17逐次地形成同樣的切斷溝27。其次,將工作夾台20旋轉90°之後,沿著於與第1方向正交的第2方向上伸長之全部的分割預定線17形成同樣的切斷溝27,以形成圖8所示之狀態,藉此將第2一體化晶圓25A分割成如圖9所示的發光二極體晶片31。 The cutting unit 10 is index-feeded in the Y-axis direction, and the same cutting grooves 27 are sequentially formed along the planned dividing line 17 extending in the first direction. Next, after rotating the work clamp table 20 by 90°, the same cutting groove 27 is formed along all the planned dividing lines 17 extending in the second direction perpendicular to the first direction, so as to form the state shown in FIG. 8 , thereby dividing the second integrated wafer 25A into light emitting diode chips 31 as shown in FIG. 9 .

在上述之實施形態中,雖然在將第2一體化晶圓25A分割成一個個的發光二極體晶片31上是使用切削裝置,但是亦可設成:將對晶圓11及透明基板21、21A具有穿透性之波長的雷射光束沿著分割預定線13朝晶圓11照射,並且在晶圓11以及透明基板21、21A的內部於厚度方向上形成複數層的改質層,接著,對第2一體化晶圓25A賦與外力,來以改質層為分割起點將第2一體化晶圓25A分割成一個個的發光二極體晶片31。 In the above-mentioned embodiment, although the cutting device is used on the light-emitting diode chips 31 that divide the second integrated wafer 25A into individual pieces, it may also be set so that the counter wafer 11 and the transparent substrate 21, 21A, a laser beam with a penetrating wavelength is irradiated toward the wafer 11 along the planned dividing line 13, and a plurality of modified layers are formed in the thickness direction inside the wafer 11 and the transparent substrates 21 and 21A, and then, External force is applied to the second integrated wafer 25A, and the second integrated wafer 25A is divided into individual light-emitting diode chips 31 with the modified layer as the starting point for dividing.

圖9(A)所示的發光二極體晶片31是在正面 具有LED電路19之LED13A的背面貼附有第1透明構件21’,且該第1透明構件21’於內部形成有複數個氣泡29。又,在第1透明構件21’的正面形成有溝23B。此外,在第1透明構件21’的背面貼附有內部形成有複數個氣泡的第2透明構件21A’。 The light-emitting diode chip 31 shown in Fig. 9 (A) is on the front side A first transparent member 21' is attached to the back of the LED 13A having the LED circuit 19, and a plurality of air bubbles 29 are formed inside the first transparent member 21'. Also, a groove 23B is formed on the front surface of the first transparent member 21'. In addition, a second transparent member 21A' in which a plurality of air cells are formed is attached to the back surface of the first transparent member 21'.

圖9(B)所示的發光二極體晶片31A是在正面具有LED電路19之LED13A的背面貼附有第1透明構件21’,且該第1透明構件21’於內部形成有複數個氣泡。又,在第1透明構件21’的背面形成有溝23B。此外,將第2透明構件21A’的正面貼附於第1透明構件21’的背面。 The light emitting diode chip 31A shown in FIG. 9(B) has a first transparent member 21' attached to the back of the LED 13A with the LED circuit 19 on the front, and a plurality of air bubbles are formed inside the first transparent member 21'. . Also, a groove 23B is formed on the back surface of the first transparent member 21'. In addition, the front surface of the second transparent member 21A' is attached to the back surface of the first transparent member 21'.

圖9(C)所示的發光二極體晶片31B是在正面具有LED電路19之LED13A的背面貼附有第1透明構件21’,且該第1透明構件21’於內部形成有複數個氣泡。此外,在第1透明構件21’的背面貼附有第2透明構件21A’。又,在第2透明構件21A’的正面形成有溝23B。 The light emitting diode chip 31B shown in FIG. 9(C) has a first transparent member 21' attached to the back of the LED 13A with the LED circuit 19 on the front, and a plurality of air bubbles are formed inside the first transparent member 21'. . In addition, a second transparent member 21A' is attached to the back surface of the first transparent member 21'. Moreover, a groove 23B is formed on the front surface of the second transparent member 21A'.

圖9(D)所示的發光二極體晶片31C是在正面具有LED電路19之LED13A的背面貼附有第1透明構件21’,且該第1透明構件21’於內部形成有複數個氣泡。此外,將第2透明構件21A’的正面貼附於第1透明構件21’的背面。又,在第2透明構件21A’的背面形成有溝23B。 In the light emitting diode chip 31C shown in FIG. 9(D), the first transparent member 21' is attached to the back of the LED 13A with the LED circuit 19 on the front, and a plurality of air bubbles are formed inside the first transparent member 21'. . In addition, the front surface of the second transparent member 21A' is attached to the back surface of the first transparent member 21'. Moreover, a groove 23B is formed on the back surface of the second transparent member 21A'.

從而,在圖9(A)所示之發光二極體晶片31上,由於在第1透明構件21’的正面形成有溝23B,所以會使第1透明構件21’的表面積增大。此外,從發光二極體晶片31的LED電路19射出並朝第1透明構件21’入射之光的 一部分是在溝23B部分進行折射後進入第1透明構件21’內。 Therefore, in the light emitting diode chip 31 shown in FIG. 9(A), since the groove 23B is formed on the front surface of the first transparent member 21', the surface area of the first transparent member 21' is increased. In addition, the light emitted from the LED circuit 19 of the light emitting diode chip 31 and incident on the first transparent member 21' Part of it enters the first transparent member 21' after being refracted in the groove 23B.

據此,在光從第1透明構件21’及第2透明構件21A’朝外部折射而射出之時,在第1及第2透明構件21’、21A’與空氣層之間的界面上之入射角成為臨界角以上之光的比例會減少,而使從第1、第2透明構件21’、21A’射出之光的量增大,並使發光二極體晶片31的亮度提升。 Accordingly, when the light is refracted and emitted from the first transparent member 21' and the second transparent member 21A' toward the outside, the incident light on the interface between the first and second transparent members 21', 21A' and the air layer The ratio of light having an angle equal to or greater than the critical angle decreases, thereby increasing the amount of light emitted from the first and second transparent members 21 ′, 21A′, and improving the brightness of the light emitting diode chip 31 .

關於圖9(B)至圖9(D)所示之發光二極體晶片31A、31B、31C,也是發揮與圖9(A)所示之發光二極體晶片31同樣的作用效果。 The light emitting diode chips 31A, 31B, and 31C shown in FIG. 9(B) to FIG. 9(D) also have the same effect as the light emitting diode chip 31 shown in FIG. 9(A).

13A:LED 13A:LED

19:LED電路 19: LED circuit

21’:第1透明構件 21': The first transparent member

21A’:第2透明構件 21A': the second transparent member

23B:溝 23B: ditch

31、31A、31B、31C:發光二極體晶片 31, 31A, 31B, 31C: light emitting diode chip

Claims (4)

一種發光二極體晶片的製造方法,該發光二極體晶片的製造方法之特徵在於具備有:晶圓準備步驟,準備晶圓,該晶圓是在結晶成長用之透明基板上具有積層體層,並於該積層體層的正面以相互交叉之複數條分割預定線所區劃出之各區域中各自形成有LED電路,該積層體層形成有包含發光層的複數層半導體層;透明基板加工步驟,在內部具有複數個氣泡的第1透明基板或內部具有複數個氣泡的第2透明基板之至少其中任一個的正面或背面,對應於LED電路來形成複數條溝;透明基板貼附步驟,在實施該透明基板加工步驟後,將該第1透明基板的正面貼附在晶圓的背面,並且將該第2透明基板的正面貼附在該第1透明基板的背面以形成一體化晶圓;及分割步驟,在實施該透明基板貼附步驟後,沿著該分割預定線將該晶圓和該第1及第2透明基板一起切斷以將該一體化晶圓分割成一個個的發光二極體晶片。 A method for manufacturing a light-emitting diode chip, characterized in that the method for manufacturing a light-emitting diode chip includes: a wafer preparation step, preparing a wafer, the wafer having a laminate layer on a transparent substrate for crystal growth, In addition, LED circuits are respectively formed in the areas demarcated by a plurality of predetermined division lines crossing each other on the front side of the laminate layer. The laminate layer is formed with a plurality of semiconductor layers including a light-emitting layer; the transparent substrate processing step, in the internal On the front or back of at least any one of the first transparent substrate with a plurality of air bubbles or the second transparent substrate with a plurality of air bubbles inside, a plurality of grooves are formed corresponding to the LED circuit; the step of attaching the transparent substrate, after implementing the transparent After the substrate processing step, attaching the front of the first transparent substrate to the back of the wafer, and attaching the front of the second transparent substrate to the back of the first transparent substrate to form an integrated wafer; and dividing step , after implementing the step of attaching the transparent substrate, cutting the wafer together with the first and second transparent substrates along the planned dividing line so as to divide the integrated wafer into individual light-emitting diode chips . 如請求項1之發光二極體晶片的製造方法,其中在該透明基板加工步驟中所形成之前述溝的截面形狀為三角形、四角形、半圓形的任一種。 The method of manufacturing a light-emitting diode wafer according to claim 1, wherein the cross-sectional shape of the groove formed in the transparent substrate processing step is any one of a triangle, a square, and a semicircle. 如請求項1之發光二極體晶片的製造方法,其中在該透明基板加工步驟中,前述溝是藉由切削刀、蝕刻、噴砂、雷射的任一種方式而形成。 The method for manufacturing a light-emitting diode wafer according to claim 1, wherein in the transparent substrate processing step, the aforementioned grooves are formed by any means of cutting knife, etching, sandblasting, and laser. 如請求項1之發光二極體晶片的製造方法,其中該第1及第2透明基板是以透明陶瓷、光學玻璃、藍寶石、透明樹脂的任一種所形成,並且在該透明基板貼附步驟中該第1透明基板是使用透明接著劑來接著於晶圓,該第2透明基板是使用透明接著劑來貼附於該第1透明基板。 The method of manufacturing a light-emitting diode chip according to claim 1, wherein the first and second transparent substrates are formed of any one of transparent ceramics, optical glass, sapphire, and transparent resin, and in the step of attaching the transparent substrates The first transparent substrate is attached to the wafer using a transparent adhesive, and the second transparent substrate is attached to the first transparent substrate using a transparent adhesive.
TW107104141A 2017-03-06 2018-02-06 Manufacturing method of light emitting diode wafer TWI789375B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-041315 2017-03-06
JP2017041315A JP2018148016A (en) 2017-03-06 2017-03-06 Method for manufacturing light-emitting diode chip and light-emitting diode chip

Publications (2)

Publication Number Publication Date
TW201838000A TW201838000A (en) 2018-10-16
TWI789375B true TWI789375B (en) 2023-01-11

Family

ID=63485903

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107104141A TWI789375B (en) 2017-03-06 2018-02-06 Manufacturing method of light emitting diode wafer

Country Status (4)

Country Link
JP (1) JP2018148016A (en)
KR (1) KR102315305B1 (en)
CN (1) CN108538995A (en)
TW (1) TWI789375B (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013114480A1 (en) * 2012-02-01 2013-08-08 パナソニック株式会社 Semiconductor light-emitting element, method for manufacturing same, and light source device
TW201347242A (en) * 2012-02-27 2013-11-16 Mitsubishi Chem Corp Wavelength conversion unit and semiconductor light-emitting device using the wavelength conversion unit
TW201444120A (en) * 2013-05-08 2014-11-16 Ind Tech Res Inst LED wafer and manufacturing method thereof
TW201511331A (en) * 2013-08-30 2015-03-16 Asahi Kasei E Materials Corp Semiconductor light-emitting element, and optical film
JP2016521463A (en) * 2013-05-15 2016-07-21 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. LED having scattering mechanism in substrate

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4122739B2 (en) * 2001-07-26 2008-07-23 松下電工株式会社 Light emitting device and manufacturing method thereof
JP4232585B2 (en) * 2003-09-17 2009-03-04 豊田合成株式会社 Light emitting device
KR100959079B1 (en) * 2005-06-27 2010-05-20 한빔 주식회사 Light emitting diode device having enhanced heat dissipation and preparation method thereof
JP5495876B2 (en) * 2010-03-23 2014-05-21 株式会社ディスコ Processing method of optical device wafer
KR101726807B1 (en) * 2010-11-01 2017-04-14 삼성전자주식회사 Light Emitting Device
JP5941306B2 (en) * 2012-03-19 2016-06-29 スタンレー電気株式会社 Light emitting device and manufacturing method thereof
TWI581458B (en) * 2012-12-07 2017-05-01 晶元光電股份有限公司 Light-emitting device
JP2014175362A (en) * 2013-03-06 2014-09-22 Toshiba Corp Semiconductor light-emitting element and method of manufacturing the same
JP2014175354A (en) 2013-03-06 2014-09-22 Disco Abrasive Syst Ltd Light-emitting diode
JP2014239123A (en) * 2013-06-06 2014-12-18 株式会社ディスコ Processing method
JP2015018953A (en) * 2013-07-11 2015-01-29 株式会社ディスコ Light emitting chip
KR20150047844A (en) * 2013-10-25 2015-05-06 주식회사 세미콘라이트 Semiconductor light emitting diode
KR101539994B1 (en) * 2013-11-28 2015-07-30 순천대학교 산학협력단 Edge light emitting diode and method of fabricating the same
JP6255235B2 (en) * 2013-12-20 2017-12-27 株式会社ディスコ Light emitting chip
WO2015099084A1 (en) * 2013-12-26 2015-07-02 信越石英株式会社 Silica glass member for wavelength conversion, and production method therefor
JP6255255B2 (en) 2014-01-27 2017-12-27 株式会社ディスコ Optical device processing method
KR101662751B1 (en) * 2015-07-02 2016-10-07 참엔지니어링(주) A substrate processing apparatus and a substrate processing method and a substrate which was produced using the same

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013114480A1 (en) * 2012-02-01 2013-08-08 パナソニック株式会社 Semiconductor light-emitting element, method for manufacturing same, and light source device
TW201347242A (en) * 2012-02-27 2013-11-16 Mitsubishi Chem Corp Wavelength conversion unit and semiconductor light-emitting device using the wavelength conversion unit
TW201444120A (en) * 2013-05-08 2014-11-16 Ind Tech Res Inst LED wafer and manufacturing method thereof
JP2016521463A (en) * 2013-05-15 2016-07-21 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. LED having scattering mechanism in substrate
TW201511331A (en) * 2013-08-30 2015-03-16 Asahi Kasei E Materials Corp Semiconductor light-emitting element, and optical film

Also Published As

Publication number Publication date
JP2018148016A (en) 2018-09-20
KR102315305B1 (en) 2021-10-19
KR20180102010A (en) 2018-09-14
CN108538995A (en) 2018-09-14
TW201838000A (en) 2018-10-16

Similar Documents

Publication Publication Date Title
TWI771358B (en) Manufacturing method of light-emitting diode chip and light-emitting diode chip
TWI789375B (en) Manufacturing method of light emitting diode wafer
TW201836173A (en) Manufacturing method of LED chips and LED chips capable of achieving sufficient brightness
TW201824592A (en) Light-emitting diode chip manufacturing method and light-emitting diode chip
TW201822382A (en) Light-emitting diode chip manufacturing method and light-emitting diode chip
TWI717506B (en) Manufacturing method of light-emitting diode chip
TWI739999B (en) Manufacturing method of light-emitting diode chip
TWI736738B (en) Method for manufacturing light-emitting diode chip and light-emitting diode chip
TWI742238B (en) Method for manufacturing light-emitting diode chip and light-emitting diode chip
TWI732047B (en) Method for manufacturing light-emitting diode chip and light-emitting diode chip
JP2017220479A (en) Method for manufacturing light-emitting diode chip
JP2017220478A (en) Method for manufacturing light-emitting diode chip and light-emitting diode chip
TWI757292B (en) Manufacturing method of light-emitting diode chip
JP6821260B2 (en) Manufacturing method of light emitting diode chip and light emitting diode chip
TW201832375A (en) Manufacturing method of light-emitting diode and light-emitting diode chip to obtain sufficient brightness
TW201814199A (en) Manufacturing method of light emitting diode chip and light emitting diode chip including a wafer preparing step, a transparent substrate preparing step, an integrating step and a cutting step, and the light emitting diode chip is being provided with a sufficient brightness
TW201832380A (en) Manufacturing method of light-emitting diode and light-emitting diode chip by sticking the front surface of a first transparent substrate having bubbles therein, and affixing the front surface of a second transparent substrate having through holes on the whole surface, etc.
TW201812889A (en) Method for manufacturing light-emitting diode chip and light-emitting diode chip
TW201834040A (en) Method for manufacturing light-emitting diode chip and light-emitting diode chip increases the brightness of the LED chip
KR20180091747A (en) Method for manufacturing a light emitting diode chip and a light emitting diode chip
TW201817030A (en) Manufacturing method of light emitting diode chip and light emitting diode chip capable of fabricating light emitting diode chips with a sufficient brightness
TW201826492A (en) Fabricating method of a light-emitting diode chip and light-emitting diode chip which can obtain sufficient luminance
TW201830725A (en) Method for manufacturing light emitting diode chip
JP2018026387A (en) Manufacturing method of light-emitting diode chip
JP2018026384A (en) Manufacturing method of light-emitting diode chip and light-emitting diode chip