TWI781609B - 基板處理方法及基板處理裝置 - Google Patents
基板處理方法及基板處理裝置 Download PDFInfo
- Publication number
- TWI781609B TWI781609B TW110116724A TW110116724A TWI781609B TW I781609 B TWI781609 B TW I781609B TW 110116724 A TW110116724 A TW 110116724A TW 110116724 A TW110116724 A TW 110116724A TW I781609 B TWI781609 B TW I781609B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- gas
- sublimation
- solidified body
- flow rate
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B21/00—Arrangements or duct systems, e.g. in combination with pallet boxes, for supplying and controlling air or gases for drying solid materials or objects
- F26B21/06—Controlling, e.g. regulating, parameters of gas supply
- F26B21/12—Velocity of flow; Quantity of flow, e.g. by varying fan speed, by modifying cross flow area
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B5/00—Drying solid materials or objects by processes not involving the application of heat
- F26B5/04—Drying solid materials or objects by processes not involving the application of heat by evaporation or sublimation of moisture under reduced pressure, e.g. in a vacuum
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/67034—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Molecular Biology (AREA)
- Health & Medical Sciences (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Drying Of Solid Materials (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020-139221 | 2020-08-20 | ||
JP2020139221A JP7446181B2 (ja) | 2020-08-20 | 2020-08-20 | 基板処理方法および基板処理装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW202209419A TW202209419A (zh) | 2022-03-01 |
TWI781609B true TWI781609B (zh) | 2022-10-21 |
Family
ID=80283006
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW110116724A TWI781609B (zh) | 2020-08-20 | 2021-05-10 | 基板處理方法及基板處理裝置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP7446181B2 (ko) |
KR (1) | KR102585601B1 (ko) |
CN (1) | CN114076504B (ko) |
TW (1) | TWI781609B (ko) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201923298A (zh) * | 2017-09-15 | 2019-06-16 | 日商斯庫林集團股份有限公司 | 基板乾燥方法及基板乾燥裝置 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000021869A (ja) * | 1998-06-30 | 2000-01-21 | Tokyo Electron Ltd | 真空処理装置 |
JP3905784B2 (ja) * | 2002-03-26 | 2007-04-18 | 大日本スクリーン製造株式会社 | 基板処理装置 |
JP4853536B2 (ja) * | 2009-03-13 | 2012-01-11 | 東京エレクトロン株式会社 | 塗布、現像装置、塗布、現像方法及び記憶媒体 |
JP5681560B2 (ja) | 2011-05-17 | 2015-03-11 | 東京エレクトロン株式会社 | 基板乾燥方法及び基板処理装置 |
JP5486708B2 (ja) | 2013-02-28 | 2014-05-07 | 大日本スクリーン製造株式会社 | 基板処理装置および基板処理方法 |
JP2015185713A (ja) | 2014-03-25 | 2015-10-22 | 株式会社東芝 | 基板処理装置及び基板処理方法 |
KR20160065226A (ko) | 2014-11-07 | 2016-06-09 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
JP6709555B2 (ja) * | 2015-03-05 | 2020-06-17 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
JP7107754B2 (ja) * | 2017-09-22 | 2022-07-27 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
JP7286359B2 (ja) | 2018-06-22 | 2023-06-05 | 株式会社Screenホールディングス | 基板処理方法、基板処理装置、および乾燥前処理液 |
JP7122911B2 (ja) | 2018-08-31 | 2022-08-22 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
JP7198618B2 (ja) | 2018-09-21 | 2023-01-04 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
JP7100564B2 (ja) | 2018-11-09 | 2022-07-13 | 株式会社Screenホールディングス | 基板乾燥方法および基板処理装置 |
-
2020
- 2020-08-20 JP JP2020139221A patent/JP7446181B2/ja active Active
-
2021
- 2021-05-10 TW TW110116724A patent/TWI781609B/zh active
- 2021-06-11 CN CN202110651722.3A patent/CN114076504B/zh active Active
- 2021-06-29 KR KR1020210084674A patent/KR102585601B1/ko active IP Right Grant
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201923298A (zh) * | 2017-09-15 | 2019-06-16 | 日商斯庫林集團股份有限公司 | 基板乾燥方法及基板乾燥裝置 |
Also Published As
Publication number | Publication date |
---|---|
TW202209419A (zh) | 2022-03-01 |
JP7446181B2 (ja) | 2024-03-08 |
KR20220023287A (ko) | 2022-03-02 |
JP2022035121A (ja) | 2022-03-04 |
CN114076504B (zh) | 2022-11-22 |
CN114076504A (zh) | 2022-02-22 |
KR102585601B1 (ko) | 2023-10-10 |
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