TWI781213B - 異向性導電膜、連接結構體及彼等之製造方法 - Google Patents
異向性導電膜、連接結構體及彼等之製造方法 Download PDFInfo
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- TWI781213B TWI781213B TW107128572A TW107128572A TWI781213B TW I781213 B TWI781213 B TW I781213B TW 107128572 A TW107128572 A TW 107128572A TW 107128572 A TW107128572 A TW 107128572A TW I781213 B TWI781213 B TW I781213B
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- conductive particles
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- insulating resin
- conductive film
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- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H01L2224/293—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29338—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
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- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
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- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
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- H01L2224/293—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29338—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
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- H01L2224/293—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29363—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than 1550°C
- H01L2224/29364—Palladium [Pd] as principal constituent
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29298—Fillers
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- H01L2224/29386—Base material with a principal constituent of the material being a non metallic, non metalloid inorganic material
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29298—Fillers
- H01L2224/29399—Coating material
- H01L2224/294—Coating material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
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- H01L2224/29298—Fillers
- H01L2224/29499—Shape or distribution of the fillers
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7525—Means for applying energy, e.g. heating means
- H01L2224/75261—Laser
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7525—Means for applying energy, e.g. heating means
- H01L2224/753—Means for applying energy, e.g. heating means by means of pressure
- H01L2224/75301—Bonding head
- H01L2224/75314—Auxiliary members on the pressing surface
- H01L2224/75315—Elastomer inlay
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/832—Applying energy for connecting
- H01L2224/83201—Compression bonding
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/832—Applying energy for connecting
- H01L2224/83201—Compression bonding
- H01L2224/83203—Thermocompression bonding, e.g. diffusion bonding, pressure joining, thermocompression welding or solid-state welding
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/832—Applying energy for connecting
- H01L2224/8322—Applying energy for connecting with energy being in the form of electromagnetic radiation
- H01L2224/83224—Applying energy for connecting with energy being in the form of electromagnetic radiation using a laser
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Wood Science & Technology (AREA)
- Materials Engineering (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Health & Medical Sciences (AREA)
- Non-Insulated Conductors (AREA)
- Manufacturing Of Electrical Connectors (AREA)
- Laminated Bodies (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
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| JP2017-160630 | 2017-08-23 | ||
| JP2017160630A JP7062389B2 (ja) | 2017-08-23 | 2017-08-23 | 異方性導電フィルム |
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| TW201921803A TW201921803A (zh) | 2019-06-01 |
| TWI781213B true TWI781213B (zh) | 2022-10-21 |
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| TW111136753A TWI855387B (zh) | 2017-08-23 | 2018-08-16 | 異向性導電膜、連接結構體及彼等之製造方法 |
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| WO (1) | WO2019039210A1 (cg-RX-API-DMAC7.html) |
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| KR20230092943A (ko) * | 2020-10-22 | 2023-06-26 | 가부시끼가이샤 레조낙 | 회로 접속용 접착제 필름, 접속 구조체, 및 접속 구조체의 제조 방법 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003064324A (ja) * | 2001-06-11 | 2003-03-05 | Hitachi Chem Co Ltd | 異方導電性接着フィルム及びそれを用いた回路基板の接続方法、回路基板接続体 |
| JP2014044947A (ja) * | 2012-08-01 | 2014-03-13 | Dexerials Corp | 異方性導電フィルムの製造方法、異方性導電フィルム、及び接続構造体 |
| JP2015165490A (ja) * | 2014-02-04 | 2015-09-17 | デクセリアルズ株式会社 | 異方性導電フィルム及びその製造方法 |
| US9585247B2 (en) * | 2012-08-03 | 2017-02-28 | Dexerials Corporation | Anisotropic conductive film and method of producing the same |
| TW201719682A (zh) * | 2015-07-13 | 2017-06-01 | Dexerials Corp | 異向性導電膜及連接構造體 |
| EP2221926B1 (en) * | 2007-12-10 | 2017-07-19 | FUJIFILM Corporation | Anisotropic conductive joint package |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20010008169A1 (en) | 1998-06-30 | 2001-07-19 | 3M Innovative Properties Company | Fine pitch anisotropic conductive adhesive |
| JP2003045236A (ja) * | 2001-08-03 | 2003-02-14 | Nec Kagoshima Ltd | 異方性導電フイルムおよびこれを用いた集積回路デバイスの接続方法 |
| JP2006032335A (ja) * | 2005-07-06 | 2006-02-02 | Hitachi Chem Co Ltd | 異方導電性接着フィルム |
| JP5388572B2 (ja) * | 2006-04-27 | 2014-01-15 | デクセリアルズ株式会社 | 導電粒子配置シート及び異方導電性フィルム |
| KR102018558B1 (ko) * | 2012-08-24 | 2019-09-05 | 데쿠세리아루즈 가부시키가이샤 | 이방성 도전 필름의 제조 방법 및 이방성 도전 필름 |
| WO2014030744A1 (ja) | 2012-08-24 | 2014-02-27 | デクセリアルズ株式会社 | 異方性導電フィルム及びその製造方法 |
| JP5972844B2 (ja) * | 2012-09-18 | 2016-08-17 | デクセリアルズ株式会社 | 異方性導電フィルム、異方性導電フィルムの製造方法、接続体の製造方法、及び接続方法 |
| JP6217422B2 (ja) * | 2014-02-04 | 2017-10-25 | デクセリアルズ株式会社 | 異方性導電フィルム及びその製造方法 |
| JP6409281B2 (ja) * | 2014-02-04 | 2018-10-24 | デクセリアルズ株式会社 | 異方性導電フィルム及びその製造方法 |
| JP6260312B2 (ja) * | 2014-02-04 | 2018-01-17 | デクセリアルズ株式会社 | 異方性導電フィルム及びその製造方法 |
| CN105940564B (zh) * | 2014-02-04 | 2020-03-24 | 迪睿合株式会社 | 各向异性导电膜及其制造方法 |
| TWI787601B (zh) * | 2015-01-13 | 2022-12-21 | 日商迪睿合股份有限公司 | 異向導電性膜 |
| CN108475558B (zh) * | 2016-02-15 | 2021-11-09 | 迪睿合株式会社 | 各向异性导电膜、其制造方法和连接结构体 |
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2017
- 2017-08-23 JP JP2017160630A patent/JP7062389B2/ja active Active
-
2018
- 2018-07-31 CN CN201880054523.0A patent/CN110945720B/zh active Active
- 2018-07-31 WO PCT/JP2018/028623 patent/WO2019039210A1/ja not_active Ceased
- 2018-07-31 US US16/640,461 patent/US20200215785A1/en not_active Abandoned
- 2018-07-31 KR KR1020227044578A patent/KR102675438B1/ko active Active
- 2018-07-31 KR KR1020207004220A patent/KR20200022510A/ko not_active Ceased
- 2018-08-16 TW TW107128572A patent/TWI781213B/zh active
- 2018-08-16 TW TW111136753A patent/TWI855387B/zh active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003064324A (ja) * | 2001-06-11 | 2003-03-05 | Hitachi Chem Co Ltd | 異方導電性接着フィルム及びそれを用いた回路基板の接続方法、回路基板接続体 |
| EP2221926B1 (en) * | 2007-12-10 | 2017-07-19 | FUJIFILM Corporation | Anisotropic conductive joint package |
| JP2014044947A (ja) * | 2012-08-01 | 2014-03-13 | Dexerials Corp | 異方性導電フィルムの製造方法、異方性導電フィルム、及び接続構造体 |
| US9585247B2 (en) * | 2012-08-03 | 2017-02-28 | Dexerials Corporation | Anisotropic conductive film and method of producing the same |
| JP2015165490A (ja) * | 2014-02-04 | 2015-09-17 | デクセリアルズ株式会社 | 異方性導電フィルム及びその製造方法 |
| TW201719682A (zh) * | 2015-07-13 | 2017-06-01 | Dexerials Corp | 異向性導電膜及連接構造體 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR102675438B1 (ko) | 2024-06-17 |
| WO2019039210A1 (ja) | 2019-02-28 |
| KR20200022510A (ko) | 2020-03-03 |
| TW202318726A (zh) | 2023-05-01 |
| JP7062389B2 (ja) | 2022-05-06 |
| US20200215785A1 (en) | 2020-07-09 |
| TW201921803A (zh) | 2019-06-01 |
| JP2019040703A (ja) | 2019-03-14 |
| CN110945720A (zh) | 2020-03-31 |
| CN110945720B (zh) | 2021-11-30 |
| TWI855387B (zh) | 2024-09-11 |
| KR20230008230A (ko) | 2023-01-13 |
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