TWI768130B - 用於沉積氧化鉬層之靶材料 - Google Patents
用於沉積氧化鉬層之靶材料 Download PDFInfo
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- TWI768130B TWI768130B TW107134606A TW107134606A TWI768130B TW I768130 B TWI768130 B TW I768130B TW 107134606 A TW107134606 A TW 107134606A TW 107134606 A TW107134606 A TW 107134606A TW I768130 B TWI768130 B TW I768130B
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- molybdenum oxide
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- 239000013077 target material Substances 0.000 title claims abstract description 121
- PQQKPALAQIIWST-UHFFFAOYSA-N oxomolybdenum Chemical group [Mo]=O PQQKPALAQIIWST-UHFFFAOYSA-N 0.000 title claims abstract description 85
- 229910000476 molybdenum oxide Inorganic materials 0.000 title claims abstract description 82
- 230000008021 deposition Effects 0.000 title description 2
- JKQOBWVOAYFWKG-UHFFFAOYSA-N molybdenum trioxide Chemical compound O=[Mo](=O)=O JKQOBWVOAYFWKG-UHFFFAOYSA-N 0.000 claims abstract description 34
- QXYJCZRRLLQGCR-UHFFFAOYSA-N dioxomolybdenum Chemical compound O=[Mo]=O QXYJCZRRLLQGCR-UHFFFAOYSA-N 0.000 claims abstract description 10
- 239000001301 oxygen Substances 0.000 claims description 62
- 229910052760 oxygen Inorganic materials 0.000 claims description 62
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 60
- 238000000034 method Methods 0.000 claims description 53
- 239000000843 powder Substances 0.000 claims description 47
- 230000008569 process Effects 0.000 claims description 43
- 239000000203 mixture Substances 0.000 claims description 41
- 239000002019 doping agent Substances 0.000 claims description 35
- 238000000280 densification Methods 0.000 claims description 18
- 238000004544 sputter deposition Methods 0.000 claims description 18
- 229910052751 metal Inorganic materials 0.000 claims description 17
- 239000002184 metal Substances 0.000 claims description 17
- 238000004519 manufacturing process Methods 0.000 claims description 13
- 239000010955 niobium Substances 0.000 claims description 12
- 239000007789 gas Substances 0.000 claims description 11
- 238000007731 hot pressing Methods 0.000 claims description 11
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 11
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 10
- 229910052750 molybdenum Inorganic materials 0.000 claims description 10
- 239000011733 molybdenum Substances 0.000 claims description 10
- 229910052758 niobium Inorganic materials 0.000 claims description 10
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 10
- 229910052715 tantalum Inorganic materials 0.000 claims description 10
- 238000005245 sintering Methods 0.000 claims description 8
- 238000002490 spark plasma sintering Methods 0.000 claims description 6
- 239000011651 chromium Substances 0.000 claims description 4
- 239000011261 inert gas Substances 0.000 claims description 4
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052804 chromium Inorganic materials 0.000 claims description 3
- 239000011159 matrix material Substances 0.000 claims description 3
- 229910000484 niobium oxide Inorganic materials 0.000 claims description 3
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 claims description 3
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 claims description 3
- 229910001936 tantalum oxide Inorganic materials 0.000 claims description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 3
- 229910052721 tungsten Inorganic materials 0.000 claims description 3
- 239000010937 tungsten Substances 0.000 claims description 3
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 claims description 3
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 2
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims description 2
- 229910052735 hafnium Inorganic materials 0.000 claims description 2
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 claims description 2
- 239000010936 titanium Substances 0.000 claims description 2
- 229910052719 titanium Inorganic materials 0.000 claims description 2
- 229910052720 vanadium Inorganic materials 0.000 claims description 2
- 238000007740 vapor deposition Methods 0.000 claims description 2
- 229910052726 zirconium Inorganic materials 0.000 claims description 2
- 230000003647 oxidation Effects 0.000 claims 1
- 238000007254 oxidation reaction Methods 0.000 claims 1
- 239000012071 phase Substances 0.000 description 96
- 238000005259 measurement Methods 0.000 description 21
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- 239000000523 sample Substances 0.000 description 14
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 12
- 239000011148 porous material Substances 0.000 description 10
- 238000001530 Raman microscopy Methods 0.000 description 9
- 238000001237 Raman spectrum Methods 0.000 description 9
- 229910044991 metal oxide Inorganic materials 0.000 description 8
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- BFWZEXBTOTZOMP-UHFFFAOYSA-N [Mo+4].[O-2].[Ta+5] Chemical compound [Mo+4].[O-2].[Ta+5] BFWZEXBTOTZOMP-UHFFFAOYSA-N 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
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- 238000006243 chemical reaction Methods 0.000 description 3
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- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
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- 238000002356 laser light scattering Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- -1 molybdenum ions Chemical class 0.000 description 2
- ZKATWMILCYLAPD-UHFFFAOYSA-N niobium pentoxide Chemical compound O=[Nb](=O)O[Nb](=O)=O ZKATWMILCYLAPD-UHFFFAOYSA-N 0.000 description 2
- 238000000879 optical micrograph Methods 0.000 description 2
- 229910052574 oxide ceramic Inorganic materials 0.000 description 2
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- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
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- DTSBBUTWIOVIBV-UHFFFAOYSA-N molybdenum niobium Chemical compound [Nb].[Mo] DTSBBUTWIOVIBV-UHFFFAOYSA-N 0.000 description 1
- JZLMRQMUNCKZTP-UHFFFAOYSA-N molybdenum tantalum Chemical compound [Mo].[Ta] JZLMRQMUNCKZTP-UHFFFAOYSA-N 0.000 description 1
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- C04B2235/32—Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP17001644.8 | 2017-10-06 | ||
| EP17001644.8A EP3467140A1 (de) | 2017-10-06 | 2017-10-06 | Targetmaterial zur abscheidung von molybdänoxid-schichten |
| ??17001644.8 | 2017-10-06 |
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| TW201915200A TW201915200A (zh) | 2019-04-16 |
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| WO (1) | WO2019068406A1 (enExample) |
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| JP2022014783A (ja) * | 2020-07-07 | 2022-01-20 | 三菱マテリアル株式会社 | 酸化モリブデンスパッタリングターゲット、および、酸化モリブデンスパッタリングターゲットの製造方法 |
| CN112359336B (zh) * | 2020-10-27 | 2023-05-26 | 金堆城钼业股份有限公司 | 一种高纯、高致密度三氧化钼靶材的制备方法 |
| CN112359333B (zh) * | 2020-10-27 | 2022-11-04 | 金堆城钼业股份有限公司 | 一种制备大尺寸、高纯度、高致密度三氧化钼靶材的方法 |
| WO2022124460A1 (ko) * | 2020-12-10 | 2022-06-16 | 엘티메탈 주식회사 | 몰리브덴 산화물을 주된 성분으로 하는 금속 산화물 소결체 및 이를 포함하는 스퍼터링 타겟{metal oxide sintered body containing molybdenum oxide as the main component and sputtering target comprising the same} |
| KR102315308B1 (ko) * | 2020-12-10 | 2021-10-21 | 엘티메탈 주식회사 | 몰리브덴 산화물을 주된 성분으로 하는 금속 산화물 소결체 및 이를 포함하는 스퍼터링 타겟 |
| KR102315283B1 (ko) * | 2020-12-10 | 2021-10-21 | 엘티메탈 주식회사 | 몰리브덴 산화물을 주된 성분으로 하는 금속 산화물 박막 및 이러한 박막이 형성된 박막트랜지스터와 디스플레이 장치 |
| JP7436409B2 (ja) * | 2021-02-26 | 2024-02-21 | Jx金属株式会社 | 酸化物スパッタリングターゲット及びその製造方法並びに酸化物薄膜 |
| CN115196964B (zh) * | 2021-04-14 | 2023-07-25 | 河南科技大学 | 一种含钠的氧化钼陶瓷溅射靶材制备方法 |
| KR102646917B1 (ko) * | 2021-09-16 | 2024-03-13 | 엘티메탈 주식회사 | 몰리브덴 산화물계 소결체, 상기 소결체를 이용한 박막, 상기 박막을 포함하는 박막트랜지스터 및 디스플레이 장치 |
| TWI839845B (zh) * | 2021-10-06 | 2024-04-21 | 南韓商Lt金屬股份有限公司 | 氧化鉬基燒結體、濺鍍靶材、使用燒結體的氧化物薄膜、包含薄膜的薄膜電晶體及顯示裝置 |
| WO2023059071A1 (ko) * | 2021-10-06 | 2023-04-13 | 엘티메탈 주식회사 | 몰리브덴 산화물계 소결체, 상기 소결체를 이용한 박막, 상기 박막을 포함하는 박막트랜지스터 및 디스플레이 장치 |
| WO2023063774A1 (ko) * | 2021-10-14 | 2023-04-20 | 엘티메탈 주식회사 | 몰리브덴 산화물계 소결체, 이를 포함하는 스퍼터링 타겟 및 산화물 박막 |
| KR20230053774A (ko) | 2021-10-14 | 2023-04-24 | 엘티메탈 주식회사 | 몰리브덴 산화물계 소결체, 이를 포함하는 스퍼터링 타겟 및 산화물 박막 |
| CN118119575A (zh) | 2021-10-14 | 2024-05-31 | Lt金属株式会社 | 钼氧化物基烧结体、包含其的溅射靶材以及氧化物薄膜 |
| KR20240152685A (ko) * | 2023-04-13 | 2024-10-22 | 엘티메탈 주식회사 | 몰리브덴 산화물 소결체, 스퍼터링 타겟 및 산화물 박막 |
| KR20240152686A (ko) | 2023-04-13 | 2024-10-22 | 엘티메탈 주식회사 | 몰리브덴 산화물 소결체, 스퍼터링 타겟 및 산화물 박막 |
| CN116813342A (zh) * | 2023-06-30 | 2023-09-29 | 宁波江丰电子材料股份有限公司 | 一种高致密度氧化钼钽靶材的制备方法 |
| CN117125982B (zh) * | 2023-09-04 | 2025-10-31 | 郑州大学 | 钼氧比可控的非化学计量氧化钼靶材的制备方法 |
| KR20250091830A (ko) * | 2023-12-14 | 2025-06-23 | 엘티메탈 주식회사 | 몰리브덴 산화물계 소결체, 상기 소결체를 이용한 박막, 상기 박막을 포함하는 박막트랜지스터 및 디스플레이 장치 |
| CN119615063B (zh) * | 2024-12-27 | 2025-12-09 | 北京科技大学 | 一种实现稳定化学计量比的金属氧化物薄膜制备方法 |
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| US6193856B1 (en) * | 1995-08-23 | 2001-02-27 | Asahi Glass Company Ltd. | Target and process for its production, and method for forming a film having a highly refractive index |
| CN104919340A (zh) * | 2012-10-23 | 2015-09-16 | 贺利氏德国有限及两合公司 | 光吸收层系统、其生产及适用于其的溅射靶材 |
| TW201608042A (zh) * | 2014-08-20 | 2016-03-01 | 賀利氏德意志公司 | 具有部分吸收層之雙子層式層系統以及用於製造此種層之方法及濺射靶 |
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| CN1826290A (zh) * | 2003-07-22 | 2006-08-30 | H.C.施塔克公司 | 制备MoO2 粉末的方法、由MoO2粉末制备的产品、MoO2薄膜的沉积以及使用这种材料的方法 |
| UA67135A (en) * | 2003-07-25 | 2004-06-15 | Subsidiary Entpr With Foreign | Method for producing lithium battery |
| US7754185B2 (en) | 2004-06-29 | 2010-07-13 | H.C. Starck Inc. | Method of making MoO2 powders, products made from MoO2 powders, deposition of MoO2 thin films, and methods of using such materials |
| JP2013020347A (ja) | 2011-07-08 | 2013-01-31 | Toppan Printing Co Ltd | タッチパネルおよびタッチパネルの製造方法 |
| EP2584062A1 (de) * | 2011-10-19 | 2013-04-24 | Heraeus Materials Technology GmbH & Co. KG | Sputtertarget und seine Verwendung |
| DE102012010803A1 (de) * | 2012-06-01 | 2013-12-05 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Licht absorbierende Schichtstruktur |
| DE102013103679A1 (de) * | 2013-04-11 | 2014-10-30 | Heraeus Materials Technology Gmbh & Co. Kg | Licht absorbierende Schicht und die Schicht enthaltendes Schichtsystem, Verfahren zur dessen Herstellung und dafür geeignetes Sputtertarget |
| CN107162057B (zh) * | 2017-04-25 | 2018-08-24 | 北京交通大学 | 一种具有优异可见光吸收性能的非化学计量钼氧化物材料及其制备方法和应用 |
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2017
- 2017-10-06 EP EP17001644.8A patent/EP3467140A1/de active Pending
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2018
- 2018-09-05 WO PCT/EP2018/073811 patent/WO2019068406A1/de not_active Ceased
- 2018-09-05 KR KR1020207012119A patent/KR102753308B1/ko active Active
- 2018-09-05 CN CN201880064791.0A patent/CN111527234B/zh active Active
- 2018-09-05 US US16/753,898 patent/US11862444B2/en active Active
- 2018-09-05 JP JP2020519381A patent/JP7097437B2/ja active Active
- 2018-10-01 TW TW107134606A patent/TWI768130B/zh active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6193856B1 (en) * | 1995-08-23 | 2001-02-27 | Asahi Glass Company Ltd. | Target and process for its production, and method for forming a film having a highly refractive index |
| CN104919340A (zh) * | 2012-10-23 | 2015-09-16 | 贺利氏德国有限及两合公司 | 光吸收层系统、其生产及适用于其的溅射靶材 |
| TW201608042A (zh) * | 2014-08-20 | 2016-03-01 | 賀利氏德意志公司 | 具有部分吸收層之雙子層式層系統以及用於製造此種層之方法及濺射靶 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3467140A1 (de) | 2019-04-10 |
| KR20200069314A (ko) | 2020-06-16 |
| JP7097437B2 (ja) | 2022-07-07 |
| CN111527234B (zh) | 2022-10-14 |
| KR102753308B1 (ko) | 2025-01-10 |
| US20200255341A1 (en) | 2020-08-13 |
| JP2020536174A (ja) | 2020-12-10 |
| TW201915200A (zh) | 2019-04-16 |
| WO2019068406A1 (de) | 2019-04-11 |
| US11862444B2 (en) | 2024-01-02 |
| CN111527234A (zh) | 2020-08-11 |
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