TWI756552B - Thermosetting epoxy resin composition, adhesive film for insulating layer formation, prepreg for insulating layer formation, insulator for printed wiring board, multilayer printed wiring board, and semiconductor device - Google Patents

Thermosetting epoxy resin composition, adhesive film for insulating layer formation, prepreg for insulating layer formation, insulator for printed wiring board, multilayer printed wiring board, and semiconductor device Download PDF

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TWI756552B
TWI756552B TW108126982A TW108126982A TWI756552B TW I756552 B TWI756552 B TW I756552B TW 108126982 A TW108126982 A TW 108126982A TW 108126982 A TW108126982 A TW 108126982A TW I756552 B TWI756552 B TW I756552B
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epoxy resin
resin composition
insulating layer
printed wiring
wiring board
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TW201942246A (en
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川合賢司
山本有希
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日商味之素股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/24Impregnating materials with prepolymers which can be polymerised in situ, e.g. manufacture of prepregs
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/01Use of inorganic substances as compounding ingredients characterized by their specific function
    • C08K3/013Fillers, pigments or reinforcing additives
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/04Oxygen-containing compounds
    • C08K5/10Esters; Ether-esters
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0366Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement reinforced, e.g. by fibres, fabrics
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0373Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement containing additives, e.g. fillers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J2363/00Characterised by the use of epoxy resins; Derivatives of epoxy resins

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  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
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  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Epoxy Resins (AREA)
  • Manufacture Of Macromolecular Shaped Articles (AREA)
  • Reinforced Plastic Materials (AREA)
  • Laminated Bodies (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Adhesives Or Adhesive Processes (AREA)

Abstract

本發明提供一種熱硬化性環氧樹脂組成物,其特徵係於至少含有環氧樹脂(A)、含萘構造之活性酯化合物(B)、熱可塑性樹脂與無機填充材之樹脂組成物中的不揮發成分為100質量%時,前述含萘構造之活性酯化合物(B)的含量為0.1~30質量%,前述無機填充材的平均粒徑為0.01μm以上5μm以下。 The present invention provides a thermosetting epoxy resin composition, which is characterized by comprising at least an epoxy resin (A), an active ester compound containing a naphthalene structure (B), a thermoplastic resin and an inorganic filler in the resin composition. The content of the naphthalene structure-containing active ester compound (B) is 0.1 to 30 mass % when the nonvolatile content is 100 mass %, and the average particle diameter of the inorganic filler is 0.01 μm or more and 5 μm or less.

Description

熱硬化性環氧樹脂組成物、絕緣層形成用接著薄膜、絕緣層形成用預浸體、印刷配線板用絕緣體、多層印刷配線板及半導體裝置 Thermosetting epoxy resin composition, adhesive film for insulating layer formation, prepreg for insulating layer formation, insulator for printed wiring board, multilayer printed wiring board, and semiconductor device

本發明係關於介電正切為低的值,且粗糙度低,適於形成具有可提高剝離強度之粗化面之絕緣層的熱硬化性環氧樹脂組成物及其硬化物、及含有具有粗糙度低、可提高剝離強度之粗化面之硬化物層作為絕緣層之多層印刷配線板。 The present invention relates to a thermosetting epoxy resin composition having a low value of dielectric tangent and low roughness, suitable for forming an insulating layer having a roughened surface capable of improving peel strength, a thermosetting epoxy resin composition and a cured product thereof, and a thermosetting epoxy resin composition having a roughened surface A multilayer printed wiring board with a low degree of hardness and a roughened surface that can improve peel strength as an insulating layer.

隨著電子機器之小型化、高性能化,可對應於所使用之多層印刷配線板之增層中之多層化、高密度化的導體形成方法已知有使絕緣層表面經粗化處理後,以無電解鍍敷形成導體層之添加(additive)法,以無電解鍍敷或電解鍍敷形成導體層之半添加法,於該等方法之情況下,絕緣層表面與鍍敷導體層之間之密著性主要藉由使絕緣層表面經粗化處理而成為發揮固定效果之具有微細凹凸之面予以確保。 With the miniaturization and high performance of electronic equipment, it is known that a method of forming conductors corresponding to the multi-layer and high-density in the build-up layer of the multi-layer printed wiring board used is to roughen the surface of the insulating layer, An additive method for forming a conductor layer by electroless plating, a semi-additive method for forming a conductor layer by electroless plating or electrolytic plating, and in the case of these methods, between the surface of the insulating layer and the plated conductor layer Adhesion is mainly ensured by roughening the surface of the insulating layer to have a fine unevenness that exerts a fixing effect.

藉由絕緣層表面所形成之凹凸之固定效果於 表面粗糙度愈大則愈大,粗糙度愈大時愈能提高絕緣層與鍍敷導體層之密著性。然而,絕緣層表面之粗糙度較大時,藉由蝕刻部分地去除粗化面上所形成之薄膜導體層以形成特定配線圖型時,由於絕緣層表面中應去除部位中之進入凹部的導體層部分係難以去除之狀態,故需要蝕刻處理變得需要較長時間,同時因其影響,而侵蝕到應殘留之配線圖型部分而損傷微細配線,造成斷線之危險性變高。因此,為對應於配線之微細化、高密度化,絕緣層之表面狀態被要求為儘可能之微細凹凸且可充分地確保與藉鍍敷形成之薄膜導體層之密著性之粗化面。 The fixing effect of the unevenness formed on the surface of the insulating layer is greater when the surface roughness is greater, and the greater the roughness is, the better the adhesion between the insulating layer and the plated conductor layer is. However, when the roughness of the surface of the insulating layer is large, when the thin-film conductor layer formed on the roughened surface is partially removed by etching to form a specific wiring pattern, the conductors entering the recesses in the parts on the surface of the insulating layer that should be removed Since the layer portion is difficult to remove, it takes a long time for the etching process. At the same time, due to its influence, the portion of the wiring pattern that should be left is eroded to damage the fine wiring, and the risk of disconnection increases. Therefore, in order to correspond to the miniaturization and high density of wiring, the surface state of the insulating layer is required to be as fine as possible asperities and roughened surfaces that can sufficiently ensure adhesion with the thin-film conductor layer formed by plating.

又,絕緣層亦被要求線熱膨脹率較低以與絕緣層表面上形成之由配線圖型所成之導體層之間不產生線熱膨脹係數差。絕緣層之線熱膨脹率高時,與導體層之線熱膨脹率之差變大,容易產生於絕緣層與導體層之間發生龜裂等之問題。 Furthermore, the insulating layer is also required to have a low coefficient of linear thermal expansion so that there is no difference in the coefficient of linear thermal expansion between the insulating layer and the conductor layer formed by the wiring pattern formed on the surface of the insulating layer. When the coefficient of linear thermal expansion of the insulating layer is high, the difference between the coefficient of linear thermal expansion of the insulating layer and that of the conductor layer becomes large, and problems such as cracks easily occur between the insulating layer and the conductor layer.

過去,作為形成如上述之多層印刷配線板之內層電路基板的絕緣層之熱硬化性樹脂組成物所使用之硬化劑已知有「活性酯化合物」,作為此「活性酯化合物」,主要係使用「含二環戊二烯二酚構造之活性酯化合物」。然而,近幾年來之多層印刷配線板之增層中之更多層化、高密度化之進展顯著,亦有許多可形成可對應於該狀況之絕緣層的環氧樹脂組成物之提案。 In the past, "active ester compounds" have been known as curing agents used in thermosetting resin compositions for forming the insulating layers of inner-layer circuit boards of multilayer printed wiring boards. "Active ester compound containing dicyclopentadiene diphenol structure" was used. However, in recent years, there has been a remarkable progress in increasing the number of layers and increasing the density in the build-up of multilayer printed wiring boards, and there are also many proposals for epoxy resin compositions that can form insulating layers that can respond to these conditions.

專利文獻1中記載藉由使用使酚醛清漆樹脂中之酚性羥基芳酯化而得之活性酯化合物作為熱硬化性環 氧樹脂組成物之硬化劑,可獲得形成展現低介電特性之絕緣層的硬化物。 Patent Document 1 describes that an insulating layer exhibiting low dielectric properties can be formed by using an active ester compound obtained by arylating a phenolic hydroxyl group in a novolak resin as a curing agent for a thermosetting epoxy resin composition of hardening.

專利文獻2中,作為可形成儘管硬化物表面經粗化處理之粗化面的粗糙度比較小,但該粗化面對於鍍敷導體亦顯示高的密著性、且線熱膨脹率較小之絕緣層的環氧樹脂組成物,記載含有(A)環氧樹脂、(B)活性酯化合物、(C)具有三嗪構造之酚樹脂、(D)馬來醯亞胺化合物、及(E)苯氧樹脂之環氧樹脂組成物。 In Patent Document 2, although the roughened surface of the hardened product surface roughened has a relatively small roughness, the roughened surface shows high adhesion to the plated conductor and has a small coefficient of linear thermal expansion. The epoxy resin composition of the insulating layer is described as containing (A) an epoxy resin, (B) an active ester compound, (C) a phenol resin having a triazine structure, (D) a maleimide compound, and (E) Epoxy resin composition of phenoxy resin.

又,專利文獻3中,作為可賦予展現低介電率、低介電正切,並且兼具優異之耐熱性與難燃性之硬化物的熱硬化性環氧樹脂組成物,記載含有以聚伸芳氧構造作為主骨架,且於該構造之芳香核上具有芳基羰基之活性酯樹脂的環氧樹脂組成物。 In addition, in Patent Document 3, as a thermosetting epoxy resin composition capable of imparting a cured product exhibiting low dielectric constant and low dielectric tangent, and having both excellent heat resistance and flame retardancy, it is described that it contains a polymer An epoxy resin composition of an active ester resin having an aryloxy structure as the main skeleton and having an aryl carbonyl group on the aromatic nucleus of the structure.

如上述,已有許多適於形成內層電路基板之絕緣層的環氧樹脂組成物之提案,但對於可形成低介電正切,並且與導體層之密著性優異之微細粗化面、可形成均衡良好地具備可對應於由多層印刷配線板之增層之更多層化、高密度化之特性的絕緣層之環氧樹脂組成物之期望日益高漲。 As mentioned above, there have been many proposals for epoxy resin compositions suitable for forming the insulating layer of inner-layer circuit boards. There is a growing desire to form an epoxy resin composition having a well-balanced insulating layer that can respond to the characteristics of increasing the number of layers and increasing the density by building up layers of a multilayer printed wiring board.

[先前技術文獻] [Prior Art Literature] [專利文獻] [Patent Literature]

[專利文獻1]特開平07-082348號公報 [Patent Document 1] Japanese Patent Laid-Open No. 07-082348

[專利文獻2]特開2010-090238號公報 [Patent Document 2] Japanese Patent Laid-Open No. 2010-090238

[專利文獻3]特開2012-012534號公報 [Patent Document 3] Japanese Patent Laid-Open No. 2012-012534

本發明之目的係提供一種顯示低介電正切且可形成與導體層之密著性、蝕刻性優異之具有微細凹凸之粗化面且可形成均衡良好地具備可對應於多層印刷配線板之增層中之更多層化、高密度化之特性的絕緣層之熱硬化性環氧樹脂組成物,與具有以其硬化物所形成之絕緣層之印刷配線板及由該印刷配線板構成之多層印刷配線板。 An object of the present invention is to provide a roughened surface with fine unevenness that exhibits a low dielectric tangent, is excellent in adhesion to a conductor layer, and is excellent in etching properties, and is capable of forming a well-balanced increase in thickness that is compatible with a multilayer printed wiring board. Thermosetting epoxy resin composition of insulating layer with the characteristics of more layers and higher density in layers, printed wiring board having insulating layer formed by hardened material, and multilayer composed of the printed wiring board printed wiring board.

且,本發明之目的係提供於支撐薄膜上形成由上述熱硬化性環氧樹脂組成物所成之樹脂組成物層的絕緣層形成用接著薄膜,及使上述熱硬化性環氧樹脂組成物含浸於薄片狀補強基材中而成之絕緣層形成用預浸體。 Furthermore, an object of the present invention is to provide an adhesive film for forming an insulating layer in which a resin composition layer composed of the above-mentioned thermosetting epoxy resin composition is formed on a support film, and to impregnate the above-mentioned thermosetting epoxy resin composition A prepreg for forming an insulating layer in a sheet-like reinforcing base material.

本發明人等針對熱硬化性環氧樹脂組成物中使用之硬化劑或調配樹脂類積極檢討之結果,發現作為調配於環氧樹脂組成物中之樹脂成分而已知之各種樹脂中,將「含萘構造之活性酯化合物」以特定量調配於樹脂組成物中時將成為可解決上述課題之手段,因而完成以下之發明。 The inventors of the present invention, as a result of an active review of hardeners used in thermosetting epoxy resin compositions or compounded resins, found that among various resins known as resin components compounded in epoxy resin compositions, "naphthalene-containing" When the active ester compound of the structure" is blended in a resin composition in a specific amount, it becomes a means for solving the above-mentioned problems, and thus the following inventions have been completed.

[1]一種熱硬化性環氧樹脂組成物,其係至少含有環 氧樹脂(A)與含萘構造之活性酯化合物(B)之熱硬化性環氧樹脂組成物,其中 使前述熱硬化性環氧樹脂組成物中之不揮發成分為100質量%時,前述含萘構造之活性酯化合物(B)的含量為0.1~30質量%。 [1] A thermosetting epoxy resin composition comprising at least an epoxy resin (A) and a naphthalene structure-containing active ester compound (B), wherein the thermosetting epoxy resin composition is Content of the said naphthalene structure containing active ester compound (B) is 0.1-30 mass % when the non-volatile matter in an epoxy resin composition is 100 mass %.

[2]如[1]所記載之熱硬化性環氧樹脂組成物,其中前述含萘構造之活性酯化合物(B)係具有聚氧化萘構造與芳基羰氧基之活性酯化合物。 [2] The thermosetting epoxy resin composition according to [1], wherein the naphthalene structure-containing active ester compound (B) is an active ester compound having a polyoxynaphthalene structure and an arylcarbonyloxy group.

[3]如[1]或[2]所記載之熱硬化性環氧樹脂組成物,其中前述含萘構造之活性酯化合物(B)係於聚氧化萘構造之萘核上已鍵結芳基羰氧基之活性酯化合物。 [3] The thermosetting epoxy resin composition according to [1] or [2], wherein the naphthalene structure-containing active ester compound (B) is an aryl group bonded to the naphthalene nucleus of the polyoxynaphthalene structure Active ester compound of carbonyloxy group.

[4]如[1]~[3]中任一項所記載之熱硬化性環氧樹脂組成物,其中前述環氧樹脂(A)含有液狀之環氧樹脂。 [4] The thermosetting epoxy resin composition according to any one of [1] to [3], wherein the epoxy resin (A) contains a liquid epoxy resin.

[5]如[1]~[4]中任一項所記載之熱硬化性環氧樹脂組成物,其係進而含有無機填充材。 [5] The thermosetting epoxy resin composition according to any one of [1] to [4], which further contains an inorganic filler.

[6]如[1]~[5]中任一項所記載之熱硬化性環氧樹脂組成物,其係進而含有熱可塑性樹脂。 [6] The thermosetting epoxy resin composition according to any one of [1] to [5], which further contains a thermoplastic resin.

[7]如[1]~[6]中任一項所記載之熱硬化性環氧樹脂組成物,其係藉由鍍敷而形成導體層之多層印刷配線板之絕緣層用樹脂組成物。 [7] The thermosetting epoxy resin composition according to any one of [1] to [6], which is a resin composition for an insulating layer of a multilayer printed wiring board in which a conductor layer is formed by plating.

[8]一種絕緣層形成用接著薄膜,其係於支撐薄膜上設置有由如請[1]~[7]中任一項所記載之熱硬化性環氧樹脂組成物所成之樹脂組成物層而成者。 [8] An adhesive film for forming an insulating layer, wherein a resin composition comprising the thermosetting epoxy resin composition according to any one of [1] to [7] is provided on a support film layered.

[9]一種絕緣層形成用預浸體,其係將如[1]~[7]中任 一項所記載之熱硬化性環氧樹脂組成物含浸於薄片狀纖維基材中而成者。 [9] A prepreg for forming an insulating layer, obtained by impregnating a sheet-like fiber base material with the thermosetting epoxy resin composition according to any one of [1] to [7].

[10]一種印刷配線板用絕緣體,其係由如[8]所記載之絕緣層形成用接著薄膜之樹脂組成物層或如[9]所記載之絕緣層形成用預浸體之任一者之硬化物所成者。 [10] An insulator for a printed wiring board comprising either the resin composition layer of the adhesive film for forming an insulating layer as described in [8] or the prepreg for forming an insulating layer as described in [9] of hardened matter.

[11]一種印刷配線板用絕緣體,其係於由如[10]所記載之印刷配線板用絕緣體所成之絕緣層上設置有經圖型加工之導體層而成者。 [11] An insulator for a printed wiring board, wherein a patterned conductor layer is provided on an insulating layer made of the insulator for a printed wiring board as described in [10].

[12]如[10]或[11]所記載之印刷配線板用絕緣體,其中前述絕緣層之表面粗糙度Ra係10~200nm,Rq係15~250nm,前述絕緣層與前述導體層之剝離強度係0.35kgf/cm以上。 [12] The insulator for a printed wiring board according to [10] or [11], wherein the surface roughness Ra of the insulating layer is 10 to 200 nm, Rq is 15 to 250 nm, and the peel strength between the insulating layer and the conductor layer is Department of 0.35kgf/cm or more.

[13]一種多層印刷配線板,其係如[11]或[12]所記載之印刷配線板用絕緣體複數層合而成者。 [13] A multilayer printed wiring board obtained by laminating a plurality of insulators for a printed wiring board as described in [11] or [12].

[14]一種半導體裝置,其係包含如[13]所記載之多層印刷配線板。 [14] A semiconductor device comprising the multilayer printed wiring board as described in [13].

前述熱硬化性環氧樹脂組成物係介電正切低、可形成與導體層之密著性優異之粗化面,且可形成成為均衡良好地具備可對應於由多層印刷配線板之增層之更多層化、高密度化之特性的絕緣層之硬化物層之熱硬化性環氧樹脂組成物。 The above-mentioned thermosetting epoxy resin composition has a low dielectric tangent, can form a roughened surface with excellent adhesion to the conductor layer, and can be formed to have a well-balanced structure that can correspond to the build-up of a multilayer printed wiring board. The thermosetting epoxy resin composition of the hardened layer of the insulating layer with the characteristics of more layers and high density.

且,使上述熱硬化性環氧樹脂組成物硬化而成之硬化 物,於藉由其表面之粗化處理,形成表面粗糙度Ra為10~200nm,Rq為15~250nm之微細凹凸時,由於亦成為與導體層之密著性優異之粗化面,故作為多層印刷配線板中之絕緣層形成材料尤其有用。 In addition, when the cured product obtained by curing the thermosetting epoxy resin composition is subjected to surface roughening treatment to form fine irregularities with surface roughness Ra of 10 to 200 nm and Rq of 15 to 250 nm, due to It also becomes a roughened surface which is excellent in adhesion to the conductor layer, so it is particularly useful as a material for forming an insulating layer in a multilayer printed wiring board.

以下,分別針對本發明之熱硬化性環氧樹脂組成物、絕緣層形成用接著薄膜、絕緣層形成用預浸體、印刷配線板用絕緣體及多層印刷配線板進一步詳述。 Hereinafter, the thermosetting epoxy resin composition, the adhesive film for insulating layer formation, the prepreg for insulating layer formation, the insulator for printed wiring boards, and the multilayer printed wiring board of the present invention will be described in detail.

本發明之熱硬化性環氧樹脂組成物含有環氧樹脂(A)與含萘構造之活性酯化合物(B)作為必要成分,此外,可視需要含有無機填充材、熱可塑性樹脂、環氧樹脂用硬化劑、硬化促進劑、及於形成多層印刷配線板中之絕緣層之樹脂組成物中所使用之添加物。 The thermosetting epoxy resin composition of the present invention contains an epoxy resin (A) and a naphthalene structure-containing active ester compound (B) as essential components, and may also contain an inorganic filler, a thermoplastic resin, and an epoxy resin as necessary. Hardeners, hardening accelerators, and additives used in resin compositions for forming insulating layers in multilayer printed wiring boards.

〈環氧樹脂(A)〉 <Epoxy resin (A)>

本發明之熱硬化性環氧樹脂組成物中使用之環氧樹脂(A)為形成多層印刷配線板中之絕緣層的樹脂組成物中通常使用之環氧樹脂,可由以下列舉之例中適當選擇使用。 The epoxy resin (A) used in the thermosetting epoxy resin composition of the present invention is an epoxy resin commonly used in a resin composition for forming an insulating layer in a multilayer printed wiring board, and can be appropriately selected from the following examples use.

亦即,環氧樹脂(A)列舉為例如雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、酚酚醛清漆型環氧樹脂、第三丁基-兒茶酚型環氧樹脂、萘酚型環氧樹脂、萘型環氧樹脂、萘醚型 環氧樹脂、縮水甘油胺型環氧樹脂、縮水甘油酯型環氧樹脂、甲酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、蒽型環氧樹脂、線狀脂肪族環氧樹脂、具有丁二烯構造之環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含有螺環之環氧樹脂、環己烷二甲醇型環氧樹脂、三羥甲基型環氧樹脂、鹵化環氧樹脂等。 That is, the epoxy resin (A) is exemplified by, for example, bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, bisphenol AF type epoxy resin, and novolak type epoxy resin. Resin, tertiary butyl-catechol type epoxy resin, naphthol type epoxy resin, naphthalene type epoxy resin, naphthyl ether type epoxy resin, glycidyl amine type epoxy resin, glycidyl ester type epoxy resin , cresol novolac epoxy resin, biphenyl epoxy resin, anthracene epoxy resin, linear aliphatic epoxy resin, epoxy resin with butadiene structure, alicyclic epoxy resin, heterocyclic epoxy resin Formula epoxy resin, epoxy resin containing spiro ring, cyclohexane dimethanol type epoxy resin, trimethylol type epoxy resin, halogenated epoxy resin, etc.

環氧樹脂(A)亦可併用2種以上。環氧樹脂(A)以環氧樹脂(A)之不揮發成分作為100質量%時,較好為至少50質量%以上含有1分子中具有2個以上環氧基之環氧樹脂之樣態。且再者,環氧樹脂(A)較佳之樣態為含有1分子中具有2個以上之環氧基,且在溫度20℃為液狀之芳香族系環氧樹脂(液狀環氧樹脂),更好之樣態為含有該液狀環氧樹脂及1分子中具有3個以上環氧基,且在溫度20℃為固體狀之芳香族系環氧樹脂(固體狀環氧樹脂)。 An epoxy resin (A) may use 2 or more types together. The epoxy resin (A) preferably contains at least 50 mass % or more of the epoxy resin having two or more epoxy groups in one molecule when the nonvolatile content of the epoxy resin (A) is 100 mass %. Furthermore, it is preferable that the epoxy resin (A) contains two or more epoxy groups in 1 molecule, and is a liquid aromatic epoxy resin (liquid epoxy resin) at a temperature of 20° C. , and more preferably, it contains the liquid epoxy resin and an aromatic epoxy resin (solid epoxy resin) which has three or more epoxy groups in one molecule and is solid at a temperature of 20°C.

又,本發明中,所謂芳香族系環氧樹脂意指其分子內具有芳香環骨架之環氧樹脂。且所謂環氧當量(g/eq)意指每1個環氧基之分子量。藉由使用液狀環氧樹脂與固體狀環氧樹脂作為環氧樹脂,於以接著薄膜之形態使用環氧樹脂組成物時,可形成顯示充分可撓性且作業性優異之薄膜,並且提高環氧樹脂組成物之硬化物之斷裂強度,且提高多層印刷配線板之耐久性。 Moreover, in this invention, an aromatic epoxy resin means the epoxy resin which has an aromatic ring skeleton in the molecule|numerator. In addition, the epoxy equivalent (g/eq) means the molecular weight per one epoxy group. By using a liquid epoxy resin and a solid epoxy resin as the epoxy resin, when the epoxy resin composition is used in the form of an adhesive film, a film showing sufficient flexibility and excellent workability can be formed, and the ring can be improved. The fracture strength of the cured product of the oxy-resin composition is improved, and the durability of the multilayer printed wiring board is improved.

另外,併用液狀環氧樹脂與固體狀環氧樹脂作為環氧樹脂時,其等之調配比例(液狀環氧樹脂:固體 狀環氧樹脂)以質量比計,較好為1:0.1~1:2之範圍。藉由以該範圍內使用液狀環氧樹脂,以接著薄膜之形態使用時,可獲得充分之可撓性,提高作業性,且亦可獲得層合時之充分流動性。且,藉由在該範圍內使用固體狀環氧樹脂,於降低環氧樹脂組成物之黏著性,且以接著薄膜之形態使用時,可提高真空層合時之脫氣性。且,真空層合時之保護膜或支撐膜之剝離性良好,亦可提高硬化後之耐熱性。 In addition, when using together a liquid epoxy resin and a solid epoxy resin as the epoxy resin, the mixing ratio (liquid epoxy resin: solid epoxy resin) of the same is preferably 1:0.1~ by mass ratio. 1:2 range. By using the liquid epoxy resin within this range, sufficient flexibility can be obtained when used in the form of an adhesive film, workability can be improved, and sufficient fluidity at the time of lamination can also be obtained. In addition, by using a solid epoxy resin within this range, the adhesiveness of the epoxy resin composition can be reduced, and when it is used in the form of an adhesive film, the degassing property during vacuum lamination can be improved. In addition, the peelability of the protective film or the support film during vacuum lamination is good, and the heat resistance after curing can also be improved.

本發明之環氧樹脂組成物中,以環氧樹脂組成物之不揮發成分作為100質量%時,環氧樹脂(A)之含量較好為10~50質量%,更好為20~40質量%,又更好為20~35質量%。藉由使環氧樹脂(A)之含量在該範圍內,有提高環氧樹脂組成物之硬化性之傾向。 In the epoxy resin composition of the present invention, the content of the epoxy resin (A) is preferably 10 to 50 mass %, more preferably 20 to 40 mass %, when the nonvolatile content of the epoxy resin composition is taken as 100 mass %. %, and more preferably 20 to 35% by mass. By making content of an epoxy resin (A) into this range, there exists a tendency for the curability of an epoxy resin composition to improve.

〈含萘構造之活性酯化合物(B)〉 <Activated ester compound (B) containing naphthalene structure>

本發明之熱硬化性環氧樹脂組成物中之「含萘構造之活性酯化合物(B)」(萘型活性酯化合物)具有作為環氧樹脂之硬化劑之功能,並且認為在粗化處理樹脂硬化物表面時,亦有助於形成與導體層之密著性良好之微細凹凸。 The "naphthalene structure-containing active ester compound (B)" (naphthalene-type active ester compound) in the thermosetting epoxy resin composition of the present invention functions as a hardener for epoxy resins, and it is considered that in roughening the resin On the surface of the cured product, it also contributes to the formation of fine irregularities with good adhesion to the conductor layer.

含萘構造之活性酯化合物(B)若具有萘構造與芳基羰氧基,則無特別限制,但較好為具有聚氧化萘構造與芳基羰氧基之活性酯化合物,更好為聚氧化萘構造之萘核上鍵結芳基羰氧基之活性酯化合物。至於聚氧化萘構 造亦可為經碳數1~4之烷基取代之聚氧化萘構造。如上述之活性酯化合物可藉由使具有核取代羥基之萘構造之化合物與於萘核或苯核上具有羧基之羧酸化合物之縮合反應而製造。該活性酯化合物為例如專利文獻3中所記載之「以聚伸芳氧基構造作為主骨架,以芳基羧酸予以酯化之活性酯化合物」中所包含之化合物。 The naphthalene structure-containing active ester compound (B) is not particularly limited as long as it has a naphthalene structure and an arylcarbonyloxy group, but is preferably an active ester compound having a polyoxynaphthalene structure and an arylcarbonyloxy group, more preferably a polyoxynaphthalene structure and an arylcarbonyloxy group. An active ester compound in which an arylcarbonyloxy group is bonded to the naphthalene nucleus of the naphthalene oxide structure. As for the polyoxynaphthalene structure, it can also be a polyoxynaphthalene structure substituted with an alkyl group having 1 to 4 carbon atoms. The above-mentioned active ester compound can be produced by the condensation reaction of a compound having a naphthalene structure having a nucleus-substituted hydroxyl group and a carboxylic acid compound having a carboxyl group on a naphthalene nucleus or a benzene nucleus. The active ester compound is, for example, a compound included in the "active ester compound esterified with an arylcarboxylic acid using a polyaryloxy group structure as a main skeleton" described in Patent Document 3.

含萘構造之活性酯化合物(B)具體列舉為以下述通式(1)表示之化合物。 Specific examples of the naphthalene structure-containing active ester compound (B) are compounds represented by the following general formula (1).

Figure 108126982-A0202-12-0010-1
[式(1)中,R1各獨立為氫原子或碳數1~4之烷基,較好為氫原子,R2各獨立為氫原子或以下述通式(2)表示之1價基,X各獨立為氫原子、苯甲醯基或萘羰基,較好為苯甲醯基,n及m各獨立為0~5之整數,n或m之任一者為1以上之整數]。
Figure 108126982-A0202-12-0010-1
[In formula (1), R 1 is each independently a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, preferably a hydrogen atom, and R 2 is each independently a hydrogen atom or a monovalent group represented by the following general formula (2) , X is each independently a hydrogen atom, a benzyl group or a naphthylcarbonyl group, preferably a benzyl group, n and m are each independently an integer of 0 to 5, and either n or m is an integer of 1 or more].

Figure 108126982-A0202-12-0011-2
[式(2)中,R1係與上述相同,X係與上述相同,p為1或2之整數,又,上述通式(1)及通式(2)中之X中之至少一者為苯甲醯基或萘羰基]。
Figure 108126982-A0202-12-0011-2
[In formula (2), R 1 is the same as above, X is the same as above, p is an integer of 1 or 2, and at least one of X in the above general formula (1) and general formula (2) be benzyl or naphthyl carbonyl].

本發明之熱硬化性環氧樹脂組成物中,於將熱硬化性環氧樹脂組成物之不揮發成分作為100質量%時,含萘構造之活性酯化合物(B)之含量為0.1~30質量%。據此,可形成顯示低介電正切並且具有與導體層之密著性、蝕刻性優異之微細凹凸之粗化面。含萘構造之活性酯化合物(B)之含量之更佳範圍為3~30質量%,又更好為5~28質量%。 In the thermosetting epoxy resin composition of the present invention, the content of the naphthalene structure-containing active ester compound (B) is 0.1 to 30 mass % when the nonvolatile content of the thermosetting epoxy resin composition is taken as 100 mass % %. According to this, a roughened surface can be formed that exhibits a low dielectric tangent and has fine irregularities excellent in adhesion to the conductor layer and etching properties. The more preferable range of content of the active ester compound (B) containing a naphthalene structure is 3-30 mass %, and it is still more preferable that it is 5-28 mass %.

〈無機填充材〉 <Inorganic filler>

藉由使本發明之熱硬化性環氧樹脂組成物進一步含有無機填充材,可降低線熱膨脹率或降低介電正切。無機填充材列舉為例如二氧化矽、氧化鋁、硫酸鋇、滑石、黏土、雲母粉、氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、氧化鎂、氮化硼、硼酸鋁、鈦酸鋇、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、鋯酸鋇、鋯酸鈣等。其中,以無定 形二氧化矽、粉碎二氧化矽、熔融二氧化矽、結晶二氧化矽、合成二氧化矽、中空二氧化矽、球狀二氧化矽等之二氧化矽較佳,就進一步降低絕緣層之表面粗糙度而言,更好為熔融二氧化矽、球狀二氧化矽,又更好為球狀熔融二氧化矽。該等可使用1種或組合2種以上使用。市售之球狀熔融二氧化矽之例列舉為ADMATECHS(股)製之「SOC2」、「SOC1」等。 By further containing an inorganic filler in the thermosetting epoxy resin composition of the present invention, the coefficient of linear thermal expansion and the dielectric tangent can be reduced. Examples of inorganic fillers include silica, alumina, barium sulfate, talc, clay, mica powder, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, boron nitride, aluminum borate, barium titanate , strontium titanate, calcium titanate, magnesium titanate, bismuth titanate, titanium oxide, barium zirconate, calcium zirconate, etc. Among them, silicon dioxide such as amorphous silicon dioxide, pulverized silicon dioxide, fused silicon dioxide, crystalline silicon dioxide, synthetic silicon dioxide, hollow silicon dioxide, spherical silicon dioxide, etc. is preferred, and the reduction is further reduced. The surface roughness of the insulating layer is more preferably fused silica, spherical silica, and more preferably spherical fused silica. These can be used alone or in combination of two or more. Examples of commercially available spherical fused silica include "SOC2" and "SOC1" manufactured by ADMATECHS Co., Ltd.

無機填充材之平均粒徑並無特別限制,但就使絕緣層表面成為低粗糙度,可進行微細配線形成之觀點而言,較好為5μm以下,更好為3μm以下,又更好為2μm以下,再更好為1μm以下,又再更好為0.8μm以下,最好為0.6μm以下,又最好為0.4μm以下。另一方面,將樹脂組成物作成樹脂漆料時,就防止漆料之黏度上升、作業性降低之觀點而言,較好為0.01μm以上,更好為0.03μm以上,又更好為0.05μm以上,再更好為0.07μm以上,又再更好為0.1μm以上。上述無機填充材之平均粒徑可利用基於Mie散射理論之雷射繞射.散射法測定。具體而言可藉由雷射繞射散射式粒度分佈測定裝置,以體積基準作成無機填充材之粒度分佈,以其中值徑作為平均粒徑而測定。測定樣品可較好使用利用超音波使無機填充材分散於水中而成者。雷射繞射散射式粒度分佈測定裝置可使用堀場製作所(股)製之LA-950等。無機填充材較好為以胺基矽烷系偶合劑、脲基系烷系偶合劑、環氧基矽烷系偶合劑、巰基矽烷系偶合劑、矽烷系偶合 劑、乙烯基矽烷系偶合劑、苯乙烯基矽烷系偶合劑、丙烯酸酯矽烷系偶合劑、異氰酸酯矽烷系偶合劑、硫醚矽烷系偶合劑、有機矽氮烷化合物、鈦酸酯系偶合劑等之表面處理劑予以表面處理而提高其耐濕性、分散性者。該等可使用1種或組合2種以上使用。 The average particle size of the inorganic filler is not particularly limited, but is preferably 5 μm or less, more preferably 3 μm or less, and more preferably 2 μm from the viewpoint of making the surface of the insulating layer low in roughness and enabling fine wiring formation Hereinafter, it is still more preferably 1 μm or less, still more preferably 0.8 μm or less, more preferably 0.6 μm or less, and still more preferably 0.4 μm or less. On the other hand, when the resin composition is used as a resin paint, from the viewpoint of preventing an increase in the viscosity of the paint and a decrease in workability, it is preferably 0.01 μm or more, more preferably 0.03 μm or more, and still more preferably 0.05 μm The above, more preferably 0.07 μm or more, and still more preferably 0.1 μm or more. The average particle size of the above-mentioned inorganic filler can be measured by the laser diffraction and scattering method based on the Mie scattering theory. Specifically, the particle size distribution of the inorganic filler can be made on a volume basis by a laser diffraction scattering particle size distribution analyzer, and the median diameter can be used as the average particle size to measure. As a measurement sample, what disperse|distributed the inorganic filler in water by ultrasonic wave can be preferably used. As the laser diffraction scattering particle size distribution analyzer, LA-950 manufactured by Horiba, Ltd., etc. can be used. The inorganic filler is preferably an aminosilane-based coupling agent, a ureido-based alkane-based coupling agent, an epoxysilane-based coupling agent, a mercaptosilane-based coupling agent, a silane-based coupling agent, a vinylsilane-based coupling agent, and a styrene-based coupling agent. Surface treatment agents such as base silane coupling agents, acrylate silane coupling agents, isocyanate silane coupling agents, thioether silane coupling agents, organosilazane compounds, titanate coupling agents, etc. are surface-treated to improve their resistance. Wet and dispersive. These can be used alone or in combination of two or more.

調配無機填充材時,其含量雖隨著熱硬化性環氧樹脂組成物所要求之特性而異,但無機填充材之含量以熱硬化性環氧樹脂組成物中之不揮發成分作為100質量%時,較好為30~90質量%,更好為40~80質量%,又更好為50~70質量%。無機填充材之含量過少時,會有硬化物之線熱膨脹率變高之傾向,含量過多時會有調製接著薄膜時難以薄膜化,使硬化物變脆之傾向。 When formulating inorganic fillers, the content of the inorganic fillers varies according to the required properties of the thermosetting epoxy resin composition, but the content of the inorganic fillers is 100% by mass of the nonvolatile components in the thermosetting epoxy resin composition. In this case, it is preferably 30 to 90 mass %, more preferably 40 to 80 mass %, and still more preferably 50 to 70 mass %. When the content of the inorganic filler is too small, the linear thermal expansion coefficient of the cured product tends to be high, and when the content is too large, it is difficult to form a thin film during preparation of the adhesive film, and the cured product tends to become brittle.

〈熱可塑性樹脂〉 <Thermoplastic resin>

本發明之熱硬化性環氧樹脂組成物藉由進一步含有熱可塑性樹脂,可提高硬化物之機械強度,進而亦可提高以接著薄膜之形態使用時之薄膜成型能。熱可塑性樹脂可列舉出苯氧樹脂、聚乙烯乙縮醛樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚醯亞胺樹脂、聚碸樹脂、聚醚碸樹脂、聚苯醚樹脂、聚碳酸酯樹脂、聚醚醚酮樹脂、聚酯樹脂,最好為苯氧樹脂、聚乙烯乙縮醛樹脂。該等熱可塑性樹脂可分別單獨使用,亦可組合2種以上使用。熱可塑性樹脂之重量平均分子量較好為8000~200000之範圍,更好為12000~100000之範圍。又本發明中之重量平均分子量 係以凝膠滲透層析(GPC)法(聚苯乙烯換算)測定。以GPC法測定之重量平均分子量具體而言可使用島津製作所(股)製之LC-9A/RID-6A作為測定裝置,使用昭和電工(股)製之Shodex K-800P/K-804L/K-804L作為管柱,使用氯仿等作為移動相,以管柱溫度40℃進行測定,使用標準聚苯乙烯之校正線算出。 By further containing a thermoplastic resin, the thermosetting epoxy resin composition of the present invention can improve the mechanical strength of the cured product, and can also improve the film formability when used in the form of an adhesive film. The thermoplastic resins include phenoxy resins, polyvinyl acetal resins, polyimide resins, polyimide resins, polyetherimide resins, polysiloxane resins, polyethersiloxane resins, and polyphenylene ethers. Resin, polycarbonate resin, polyether ether ketone resin, polyester resin, preferably phenoxy resin and polyvinyl acetal resin. These thermoplastic resins may be used alone or in combination of two or more. The weight average molecular weight of the thermoplastic resin is preferably in the range of 8,000 to 200,000, more preferably in the range of 12,000 to 100,000. The weight average molecular weight in the present invention is measured by gel permeation chromatography (GPC) method (in terms of polystyrene). Specifically, LC-9A/RID-6A manufactured by Shimadzu Corporation can be used as the measuring device for the weight average molecular weight measured by the GPC method, and Shodex K-800P/K-804L/K- manufactured by Showa Denko Co., Ltd. 804L was used as a column, chloroform or the like was used as a mobile phase, the measurement was performed at a column temperature of 40°C, and the calibration line was calculated using standard polystyrene.

調配熱可塑性樹脂時,其調配量以熱硬化性環氧樹脂組成物中之不揮發成分作為100質量%時,較好為0.1~10質量%,更好為0.5~5質量%。在該範圍內時,可發揮薄膜成型能或機械強度提高之效果,進而可降低熔融黏度上升或濕式粗化步驟後之絕緣層表面之粗糙度。 When blending a thermoplastic resin, when the blending amount is 100% by mass of the nonvolatile content in the thermosetting epoxy resin composition, it is preferably 0.1 to 10% by mass, more preferably 0.5 to 5% by mass. Within this range, the film forming ability or mechanical strength can be improved, and the increase in melt viscosity or the surface roughness of the insulating layer after the wet roughening step can be reduced.

〈環氧樹脂用硬化劑〉 <hardener for epoxy resin>

本發明之熱硬化性環氧樹脂組成物亦可進一步使用一般之環氧樹脂用硬化劑。可使用之環氧樹脂用硬化劑之例列舉為TD2090、TD2131[DIC(股),商品名]、MEH-7600、MEH-7851、MEH-8000H[明和化成(股),商品名)、NHN、CBN、GPH-65、GPH-103[日本化藥(股),商品名]、SN170、SN180、SN190、SN475、SN485、SN495、SN375、SN395[新日鐵化學(股),商品名]、LA7052、LA7054、LA3018、LA1356[DIC(股),商品名]等酚系硬化劑、F-a、P-d[四國化成(股),商品名]、HFB2006M[昭和高分子(股),商品名]等之苯并噁嗪系硬化劑、甲基六氫鄰苯二甲酸酐、甲基納迪克酸酐( methylnadic anhydride)、氫化甲基納迪克酸酐等酸酐系硬化劑、PT30、PT60、BA230S75[日本LONZA(股),商品名]等之氰酸酯系硬化劑等。 The thermosetting epoxy resin composition of the present invention may further use a general curing agent for epoxy resins. Examples of epoxy resin curing agents that can be used are TD2090, TD2131 [DIC (stock), trade name], MEH-7600, MEH-7851, MEH-8000H [Meiwa Chemicals (stock), trade name), NHN, CBN, GPH-65, GPH-103 [Nihon Kayaku Co., Ltd., trade name], SN170, SN180, SN190, SN475, SN485, SN495, SN375, SN395 [Nippon Steel Chemical Co., Ltd., trade name], LA7052 , LA7054, LA3018, LA1356 [DIC (stock), trade name] and other phenolic hardeners, Fa, Pd [Shikoku Chemicals (stock), trade name], HFB2006M [Showa Polymer (stock), trade name] etc. Benzoxazine-based hardener, methylhexahydrophthalic anhydride, methylnadic anhydride, hydrogenated methylnadic anhydride and other acid anhydride-based hardeners, PT30, PT60, BA230S75 [Japan LONZA (stock) ), trade name] and other cyanate ester-based hardeners.

〈硬化促進劑〉 <hardening accelerator>

本發明之熱硬化性環氧樹脂組成物藉由進一步含有硬化促進劑,可有效地調整硬化時間及硬化溫度。硬化促進劑列舉為例如TPP、TPP-K、TPP-S、TPTP-S[北興化學工業(股),商品名]等有機膦化合物、Curezol 2MZ、2E4MZ、C11Z、C11Z-CN、C11Z-CNS、C11Z-A、2MZ-OK、2MA-OK、2PHZ[四國化成工業(股),商品名]等咪唑化合物、Novacure[旭化成工業(股),商品名]、Fujicure[富士化成工業(股),商品名]等之胺加成物化合物、1,8-二氮雜雙環[5,4,0]十一碳烯-7,4-二甲胺基吡啶、苄基二甲基胺、2,4,6-參(二甲胺基甲基)酚、4-二甲胺基吡啶等胺化合物、鈷、銅、鋅、鐵、鎳、錳、錫等有機金屬錯合物或有機金屬鹽等。硬化促進劑亦可併用2種以上。調配硬化促進劑時,以環氧樹脂組成物中所含之環氧樹脂之總量作為100質量%(不揮發成分)時,較好在0.05~1質量%之範圍內使用。 By further containing a hardening accelerator, the thermosetting epoxy resin composition of this invention can adjust hardening time and hardening temperature effectively. Examples of hardening accelerators include organic phosphine compounds such as TPP, TPP-K, TPP-S, TPTP-S [Beixing Chemical Industry Co., Ltd., trade name], Curezol 2MZ, 2E4MZ, C11Z, C11Z-CN, C11Z-CNS, C11Z-A, 2MZ-OK, 2MA-OK, 2PHZ [Shikoku Chemical Industry (stock), trade name] and other imidazole compounds, Novacure [Asahi Kasei Industry (stock), trade name], Fujicure [Fuji Chemical Industry (stock), Amine adduct compounds such as trade names], 1,8-diazabicyclo[5,4,0]undecene-7,4-dimethylaminopyridine, benzyldimethylamine, 2, Amine compounds such as 4,6-paraffin (dimethylaminomethyl)phenol and 4-dimethylaminopyridine, organometallic complexes such as cobalt, copper, zinc, iron, nickel, manganese, and tin, or organometallic salts, etc. . A hardening accelerator may use 2 or more types together. When preparing a hardening accelerator, it is preferable to use it within the range of 0.05-1 mass %, when the total amount of the epoxy resin contained in an epoxy resin composition is 100 mass % (non-volatile matter).

本發明之熱硬化性環氧樹脂組成物亦可在發揮本發明效果之範圍內,任意含有上述以外之其他各種樹脂添加物。樹脂添加物可列舉為例如矽粉、尼龍粉、氟粉、橡膠粒子等有機填充劑、Orben、Benton等增黏劑、 聚矽氧系、氟系、高分子系消泡劑或平流劑、咪唑系、噻唑系、三唑系、矽烷偶合劑等密著性賦予劑、酞菁藍、酞菁綠、碘綠、雙偶氮黃、碳黑等著色劑、氫氧化金屬物、含磷化合物等難燃劑等。 The thermosetting epoxy resin composition of the present invention may optionally contain various resin additives other than those described above within the range in which the effects of the present invention are exhibited. Resin additives include, for example, organic fillers such as silicon powder, nylon powder, fluorine powder, and rubber particles, tackifiers such as Orben and Benton, polysiloxane-based, fluorine-based, and polymer-based defoaming agents or leveling agents, and imidazole. Adhesion imparting agents such as phthalocyanine blue, phthalocyanine green, iodine green, disazo yellow, carbon black, etc., metal hydroxides, phosphorus-containing compounds, etc. flame retardant, etc.

本發明之熱硬化性環氧樹脂組成物可適當地混合上述成分,且可視需要以三軸輥、球磨機、珠粒研磨機、砂磨機等混練手段、或者超級混練機、行星式混練機等攪拌手段混練或混合而調製。且,藉由進一步添加有機溶劑而調製為樹脂漆料。 The thermosetting epoxy resin composition of the present invention can be appropriately mixed with the above-mentioned components, and can be kneaded by means of triaxial rollers, ball mills, bead mills, sand mills, etc., or super kneaders, planetary kneaders, etc. as necessary Stirring means kneading or mixing to prepare. And it prepares as a resin paint by further adding an organic solvent.

本發明之熱硬化性環氧樹脂組成物由於介電正切低,可形成與導體層之密著性優異之粗化面,故可較好地使用作為用於藉鍍敷形成導體層之樹脂組成物(藉鍍敷形成導體層之多層印刷配線板之絕緣層用樹脂組成物),且進而較好地作為多層印刷配線板之增層用樹脂組成物。 Since the thermosetting epoxy resin composition of the present invention has a low dielectric tangent and can form a roughened surface with excellent adhesion to the conductor layer, it can be preferably used as a resin composition for forming a conductor layer by plating (a resin composition for an insulating layer of a multilayer printed wiring board in which a conductor layer is formed by plating), and is further preferably used as a build-up resin composition for a multilayer printed wiring board.

本發明之熱硬化性環氧樹脂組成物為特別適用作為多層印刷配線板之絕緣層形成材料之組成,可使用於阻焊劑、底部填充材、晶粒黏合材、半導體密封材、埋孔樹脂、零件埋入樹脂等之需要樹脂組成物之用途的廣範圍中。且,本發明之樹脂組成物之形態並無特別限制,但可應用於接著薄膜、預浸體等薄片狀層合材料、電路基板(層合板用途、多層印刷配線板用途等)。本發明之樹脂組成物亦可藉漆料狀態塗佈於電路基板上形成絕緣層,但工業上一般係以接著薄膜、預浸體等薄片狀層合材料之形 態用於絕緣層形成中。 The thermosetting epoxy resin composition of the present invention is particularly suitable as a material for forming an insulating layer of a multilayer printed wiring board, and can be used for solder resist, underfill material, die bonding material, semiconductor sealing material, buried hole resin, Parts are embedded in resin, etc., in a wide range of applications that require a resin composition. In addition, the form of the resin composition of the present invention is not particularly limited, but can be applied to sheet-like laminates such as adhesive films and prepregs, and circuit boards (for laminates, multilayer printed wiring boards, etc.). The resin composition of the present invention can also be coated on a circuit substrate in a lacquer state to form an insulating layer, but industrially, it is generally used in the formation of an insulating layer in the form of a laminated material such as an adhesive film and a prepreg.

〈薄片狀層合材料〉 <Laminated sheet material>

(絕緣層形成用接著薄膜) (Adhesive film for insulating layer formation)

本發明之絕緣層形成用接著薄膜之特徵為於支撐薄膜上設置由熱硬化性環氧樹脂組成物所成之樹脂組成物層。絕緣層形成用接著薄膜可使用本技藝習知之方法,例如使樹脂組成物溶解於有機溶劑中調至樹脂漆料,使用模嘴塗佈器等將該樹脂漆料塗佈於支撐體上,再藉由加熱、或者吹熱風等使有機溶劑乾燥形成樹脂組成物層而製造。 The adhesive film for forming an insulating layer of the present invention is characterized in that a resin composition layer made of a thermosetting epoxy resin composition is provided on the support film. The adhesive film for forming the insulating layer can be formed by a method known in the art, such as dissolving the resin composition in an organic solvent to adjust the resin paint, using a die coater or the like to coat the resin paint on the support, and then It is manufactured by drying an organic solvent by heating, blowing hot air, etc. to form a resin composition layer.

有機溶劑可列舉為例如丙酮、甲基乙基酮、環己酮等酮類、乙酸乙酯、乙酸丁酯、溶纖素乙酸酯、丙二醇單甲醚乙酸酯、卡必醇乙酸酯等乙酸酯類,溶纖素、丁基卡必醇等卡必醇類、甲苯、二甲苯等芳香族烴類、二甲基甲醯胺、二甲基乙醯胺、N-甲基吡咯烷酮等醯胺系溶劑等。有機溶劑亦可組合2種以上使用。 Examples of the organic solvent include ketones such as acetone, methyl ethyl ketone, and cyclohexanone, ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate, and carbitol acetate. Acetate such as cellosolve, carbitol such as butyl carbitol, aromatic hydrocarbons such as toluene and xylene, dimethylformamide, dimethylacetamide, N-methylpyrrolidone, etc. amide-based solvents, etc. The organic solvent may be used in combination of two or more.

乾燥條件並無特別限制,但較好對樹脂組成物層乾燥至有機溶劑含量為10質量%以下,較好為5質量%以下。漆料中之有機溶劑量亦隨著有機溶劑之沸點而異,例如藉由使含30~60質量%之有機溶劑之漆料在50~150℃乾燥3~10分鐘左右,可形成樹脂組成物層。 The drying conditions are not particularly limited, but the resin composition layer is preferably dried to an organic solvent content of 10% by mass or less, preferably 5% by mass or less. The amount of organic solvent in the paint also varies with the boiling point of the organic solvent. For example, by drying the paint containing 30 to 60% by mass of the organic solvent at 50 to 150°C for about 3 to 10 minutes, a resin composition can be formed. Floor.

絕緣層形成用接著薄膜中形成之樹脂組成物層厚度較好為層合體之厚度以上。電路基板所具有之導體層之厚度通常為5~70μm之範圍,故樹脂組成物層較好具 有10~100μm之厚度。就薄膜化之觀點而言,更好為15~80μm。 It is preferable that the thickness of the resin composition layer formed in the adhesive film for insulating layer formation is more than the thickness of a laminated body. The thickness of the conductor layer included in the circuit board is usually in the range of 5 to 70 µm, so the resin composition layer preferably has a thickness of 10 to 100 µm. From the viewpoint of thinning, it is more preferably 15 to 80 μm.

作為支撐體之例,可列舉為聚乙烯、聚丙烯、聚氯化乙稀等聚烯烴之薄膜、聚對苯二甲酸乙二酯(以下有時簡稱為「PET」)、聚萘二甲酸乙二酯等聚酯薄膜、聚碳酸酯薄膜、聚醯亞胺薄膜等各種塑膠膜。且亦可使用脫模紙或銅箔、鋁箔等金屬箔等。其中,就廣用性方面而言,較好為塑膠膜,更好為聚對苯二甲酸乙二酯膜。亦可對支撐體及後述之保護膜施以表面改質(MAD)處理、電暈處理等表面處理。另外,亦可藉聚矽氧樹脂系脫模劑、醇酸樹脂系脫模劑、氟樹脂脫模劑等脫模劑施以脫膜處理。 Examples of the support include films of polyolefins such as polyethylene, polypropylene, and polyvinyl chloride, polyethylene terephthalate (hereinafter sometimes abbreviated as "PET"), polyethylene naphthalate Polyester film such as diester, polycarbonate film, polyimide film and other plastic films. Furthermore, release paper, metal foils, such as copper foil and aluminum foil, etc. can also be used. Among them, in terms of versatility, a plastic film is preferable, and a polyethylene terephthalate film is more preferable. Surface treatments such as surface modification (MAD) treatment and corona treatment may also be applied to the support and the protective film described later. In addition, film release treatment can also be applied by release agents such as silicone resin-based mold release agents, alkyd resin-based mold release agents, and fluororesin mold release agents.

支撐體之厚度並無特別限制,較好為10~150μm,更好為25~50μm。 The thickness of the support is not particularly limited, but is preferably 10 to 150 μm, more preferably 25 to 50 μm.

樹脂組成物層之未密著支撐體之面上可進一步根據支撐體層合保護膜。保護膜之厚度並無特別限制,但為例如1~40μm。藉由層合保護膜,可防止污物等對樹脂組成物層表面之附著。 On the surface of the resin composition layer which is not adhered to the support, a protective film may be further laminated on the support. The thickness of the protective film is not particularly limited, but is, for example, 1 to 40 μm. By laminating the protective film, it is possible to prevent the adhesion of dirt and the like to the surface of the resin composition layer.

具有上述構成之絕緣層形成用接著薄膜亦可捲成輥狀而儲存。 The adhesive film for insulating layer formation which has the said structure can also be wound up in a roll shape, and can be stored.

(絕緣層形成用預浸體) (Prepreg for forming insulating layer)

本發明之絕緣層形成用預浸體之特徵為將熱硬化性環氧樹脂組成物含浸在薄片狀纖維基材中。亦即,可藉由利 用熱熔融法或溶劑法將本發明之熱硬化性環氧樹脂組成物含浸於薄片狀補強基材中,經加熱並半硬化而製造。薄片狀補強基材可使用例如玻璃布或芳醯胺纖維等常用之纖維所成之預浸體用纖維。而且本發明之絕緣層形成用預浸體較好為設置於支撐體上之構成。 The prepreg for forming an insulating layer of the present invention is characterized in that a sheet-like fiber base material is impregnated with a thermosetting epoxy resin composition. That is, it can be produced by impregnating the thermosetting epoxy resin composition of the present invention in a sheet-like reinforcing base material by a hot melt method or a solvent method, and heating and semi-hardening. As the sheet-like reinforcing base material, fibers for prepregs made of common fibers such as glass cloth and aramid fibers can be used. Further, the prepreg for forming an insulating layer of the present invention is preferably configured to be provided on a support.

熱熔融法係不使樹脂組成物溶解於有機溶劑中,而暫時塗覆於支撐體上,且將其層合於薄片狀補強基材上,或者以模嘴塗佈器將樹脂組成物直接塗佈於薄片狀補強基材上,製造預浸體之方法。且溶劑法與上述絕緣層形成用接著薄膜之製造方法相同,係使樹脂溶解於有機溶劑中調製樹脂漆料,且將薄片狀補強基材浸漬於該漆料中,使樹脂漆料含浸於薄片狀補強基材中,隨後乾燥之方法。另外,本發明之絕緣層形成用預浸體亦可自薄片狀補強基材之兩面以加熱、加壓條件下連續熱層合絕緣層形成用接著薄膜而調製。亦可與上述絕緣層形成用接著薄膜同樣地使用支撐體或保護膜。 The hot-melt method does not dissolve the resin composition in the organic solvent, but temporarily coats it on the support, and laminates it on the sheet-like reinforcing substrate, or directly coats the resin composition with a die coater. A method of fabricating a prepreg on a sheet-like reinforcing substrate. The solvent method is the same as the above-mentioned manufacturing method of the adhesive film for forming an insulating layer. The resin is dissolved in an organic solvent to prepare a resin varnish, and the sheet-like reinforcing substrate is dipped in the varnish to impregnate the resin varnish into the sheet. in the form of a reinforced substrate, followed by drying. In addition, the prepreg for forming an insulating layer of the present invention may be prepared by continuously thermally laminating the adhesive film for forming an insulating layer from both sides of a sheet-like reinforcing base material under heating and pressurizing conditions. A support or a protective film can also be used similarly to the adhesive film for insulating layer formation mentioned above.

如上述,由前述絕緣層形成用接著薄膜之樹脂組成物層之硬化物所成之印刷配線板用絕緣體及由前述絕緣層形成用預浸體之硬化物所成之印刷配線板用絕緣體適合作為多層印刷配線板用之絕緣層。另外,更宜在由該印刷配線板用絕緣體所成之絕緣層上設置經圖型加工之導體層(電路)。又,較好為層合複數個設有該導體層(電路)之印刷配線板用絕緣體而成之多層印刷配線板。 As described above, an insulator for a printed wiring board made of a cured product of the resin composition layer of the adhesive film for forming an insulating layer and an insulator for a printed wiring board made of a cured product of the prepreg for forming an insulating layer are suitable as Insulation layer for multilayer printed wiring boards. In addition, it is more preferable to provide a patterned conductor layer (circuit) on the insulating layer made of the printed wiring board insulator. Moreover, a multilayer printed wiring board in which a plurality of insulators for printed wiring boards provided with the conductor layers (circuits) are laminated is preferable.

〈使用薄片狀層合材料之多層印刷配線板〉 <Multilayer Printed Wiring Board Using Laminated Sheets>

接著,說明使用如上述製造之薄片狀層合材料製造多層印刷配線板之方法之一例。 Next, an example of a method for producing a multilayer printed wiring board using the sheet-like laminate produced as described above will be described.

首先,使用真空層合機將薄片狀層合材料層合(laminate)於電路基板之單面或兩面上。電路基板所用之基板列舉為例如玻璃環氧基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚苯醚基板等。又,此處所謂電路基板係指於如上述之基板之單面或兩面上形成經圖型加工之導體層(電路)者。且交互層合導體層與絕緣層而成之多層印刷配線板中,該多層印刷配線板之最外層之單面或兩面為經圖型加工而成之導體層(電路)者亦包含於此處所稱之電路基板中。又導體層表面亦可藉由黑化處理、銅蝕刻等施以預先粗化處理。 First, a sheet-like laminate is laminated on one side or both sides of a circuit substrate using a vacuum laminator. Examples of substrates used for the circuit substrate include glass epoxy substrates, metal substrates, polyester substrates, polyimide substrates, BT resin substrates, thermosetting polyphenylene ether substrates, and the like. In addition, the term "circuit board" here refers to a patterned conductor layer (circuit) formed on one side or both sides of the above-mentioned board. And in the multilayer printed wiring board formed by alternately laminating conductor layers and insulating layers, one or both sides of the outermost layer of the multilayer printed wiring board are patterned conductor layers (circuits) are also included here. It is called the circuit board. In addition, the surface of the conductor layer can also be subjected to pre-roughening treatment by blackening treatment, copper etching, or the like.

上述層合中,薄片狀層合材料具有保護薄膜時,去除該保護薄膜後,可視需要預加熱薄片狀層合材料及電路基板,邊加壓及加熱薄片狀層合材料邊層合於電路基板上。本發明之薄片狀層合材料中,較好利用真空層合法在減壓下層合於電路基板上之方法。層合條件並無特別限制,但較好在例如壓著溫度(層合溫度)較好設為70~140℃,壓著壓力(層合壓力)較好設為1~11kgf/cm2(9.8×104~107.9×104N/m2),壓著時間(層合時間)較好設為5~180秒,空氣壓設為20mmHg(26.7hPa)以下之減壓條件下進行層合。又,層合方法可為批式亦可為使用輥之連續式。真空層合可使用市售之真空層合機進行。市售 之真空層合機可列舉為例如Nichigo Morton(股)製造之真空塗佈機、名機製作所(股)製造之真空加壓式層合機、日立工業(股)製造之滾筒式乾式塗佈機、日立AIC(股)製造之真空層合機等。 In the above lamination, when the sheet-like laminated material has a protective film, after removing the protective film, the sheet-like laminated material and the circuit substrate may be preheated as needed, and the sheet-like laminated material is laminated on the circuit substrate while pressing and heating the sheet-like laminated material. superior. In the sheet-like laminate of the present invention, a method of laminating on a circuit board under reduced pressure by a vacuum lamination method is preferable. The lamination conditions are not particularly limited, but, for example, the pressing temperature (lamination temperature) is preferably 70 to 140° C., and the pressing pressure (lamination pressure) is preferably 1 to 11 kgf/cm 2 (9.8 ×10 4 to 107.9 × 10 4 N/m 2 ), the pressing time (lamination time) is preferably 5 to 180 seconds, and the lamination is performed under a reduced pressure condition where the air pressure is 20 mmHg (26.7 hPa) or less. In addition, the lamination method may be a batch type or a continuous type using a roll. Vacuum lamination can be performed using a commercially available vacuum laminator. Commercially available vacuum laminators include, for example, a vacuum coater manufactured by Nichigo Morton Co., Ltd., a vacuum pressurized laminator manufactured by Meiji Co., Ltd., and a roll-type dry coater manufactured by Hitachi Kogyo Co., Ltd. Cloth machine, vacuum laminator manufactured by Hitachi AIC (stock), etc.

將薄片狀層合材料層合於電路基板上後,於冷卻至室溫附近後,剝離支撐體時可藉由剝離、使樹脂組成物熱硬化形成硬化物,而於電路基板上形成絕緣層。熱硬化之條件只要依據樹脂組成物中之樹脂成分種類、含量等適當選擇即可,但較好在150℃~220℃下20分鐘~180分鐘,更好在160℃~210℃下30分鐘~120分鐘之範圍內選擇。形成絕緣層後,於硬化前未剝離支撐體時,亦可視需要在此時進行剝離。 After laminating the sheet-like laminate material on the circuit board, after cooling to around room temperature, when peeling off the support body, the resin composition can be peeled off to thermally harden the resin composition to form a cured product, and an insulating layer can be formed on the circuit board. The thermal curing conditions can be appropriately selected according to the type and content of the resin components in the resin composition, but it is preferably 20 minutes to 180 minutes at 150°C to 220°C, and more preferably 30 minutes to 160°C to 210°C. Choose within 120 minutes. After the insulating layer is formed, when the support body is not peeled off before curing, it can be peeled off at this time as needed.

另外,亦可使用真空加壓機將薄片狀層合材料層合於電路基板之單面或兩面上。在減壓下進行加熱及加壓之層合步驟可使用一般真空熱壓機進行。例如,可藉由自支撐體層側加壓經加熱之SUS板等金屬板而進行。加壓條件係設為減壓度通常為1×10-2MPa以下,較好為1×10-3MPa以下之減壓條件。加熱及加壓亦可藉1階段進行,但就控制樹脂滲出之觀點而言以分成2階段以上之條件進行較佳。例如,較好以第一階段之加壓係將溫度設為70~150℃,壓力設為1~15kgf/cm2之範圍,第2階段之加壓係將溫度為150~200℃,壓力設為1~40kgf/cm2之範圍下進行。各階段之時間較好進行30~120分鐘。藉由使該樹脂組成物層熱硬化而可於電路基板上形成絕緣層。市售 之真空熱加壓機列舉為例如MNPC-V-750-5-200(名機製作所(股)製造)、VH1-1603(北川精機(股)製造)等。 In addition, the sheet-like laminate material may be laminated on one side or both sides of the circuit board using a vacuum press. The lamination step of heating and pressurizing under reduced pressure can be performed using a general vacuum heat press. For example, it can be performed by pressing a metal plate such as a heated SUS plate from the support layer side. The pressure condition is a reduced pressure condition in which the degree of reduced pressure is usually 1×10 -2 MPa or less, preferably 1×10 -3 MPa or less. Heating and pressurization may be performed in one stage, but from the viewpoint of controlling resin exudation, it is preferable to perform the conditions in two or more stages. For example, it is preferable to set the temperature to 70~150°C and the pressure to 1~15kgf/cm 2 in the pressurizing system of the first stage, and set the temperature to 150~200°C and the pressure to set the pressure of the second stage to 150~200°C. It is carried out in the range of 1~40kgf/cm 2 . The time for each stage is preferably 30 to 120 minutes. An insulating layer can be formed on the circuit board by thermally curing the resin composition layer. Commercially available vacuum heat presses include, for example, MNPC-V-750-5-200 (manufactured by Meiki Seiki Co., Ltd.), VH1-1603 (manufactured by Kitagawa Seiki Co., Ltd.).

絕緣層之介電正切較好為0.009以下,更好為0.006以下。介電正切愈低愈好,尤其雖無下限值,但設為0.001以上、0.003以上等。 The dielectric tangent of the insulating layer is preferably at most 0.009, more preferably at most 0.006. The lower the dielectric tangent, the better. In particular, although there is no lower limit, it is set to 0.001 or more, 0.003 or more, or the like.

接著,對電路基板上形成之絕緣層進行開孔加工形成通孔、貫穿孔。穿孔加工可藉由例如鑽孔機、雷射、電漿等習知方法,且視需要組合該等之方法進行,但最常用之方法為利用二氧化碳雷射、YAG雷射等雷射進行穿孔加工。穿孔加工前未剝離支撐體時則在此時剝離。 Next, the insulating layer formed on the circuit board is subjected to drilling processing to form through holes and through holes. The perforation process can be performed by conventional methods such as drilling machine, laser, plasma, etc., and these methods can be combined as needed, but the most commonly used method is to use carbon dioxide laser, YAG laser and other lasers for perforation processing . When the support body is not peeled off before the punching process, it is peeled off at this time.

接著,對絕緣層表面進行粗化處理。乾式粗化處理時列舉為電漿處理等,濕式粗化處理時列舉為依序進行以膨潤液之膨潤處理、以氧化劑之粗化處理及以中和液之中和處理的方法。濕式粗化處理者,就可邊於絕緣層表面形成凹凸之錨定物(anchor),邊去除貫穿孔內之膠渣(smear)方面係較佳。利用膨潤液之膨潤處理係藉由使絕緣層在50~80℃浸漬於膨潤液中5~20分鐘(較好在55~70℃下8~15分鐘)進行。膨潤液之例列舉為鹼溶液、界面活性劑溶液等,較好為鹼溶液,該鹼溶液列舉為例如氫氧化鈉溶液、氫氧化鉀溶液等。市售之膨潤劑可列舉出例如日本ATOTECH(股)製造之Swelling Dip Securiganth P、Swelling Dip Securiganth SBU等。利用氧化劑之粗化處理係使絕緣層在60~80℃下浸漬於氧化劑溶液中10~30 分鐘(較好在70~80℃下15~25分鐘)而進行。至於氧化劑可列舉出例如使過錳酸鉀或過錳酸鈉溶解於氫氧化鈉之水溶液中之鹼性過錳酸溶液、重鉻酸鹽、臭氧、過氧化氫/硫酸、硝酸等。且,鹼性過錳酸溶液中之過錳酸鹽濃度較好為5~10重量%。市售之氧化劑列舉為例如日本ATOTECH(股)製造之Concentrate.Compact CP、Dozing Solution Securiganth P等鹼性過錳酸溶液。利用中和液之中和處理係在30~50℃浸漬於中和液中3~10分鐘(較好於35~45℃下3~8分鐘)而進行。至於中和液較好為酸性水溶液,市售品列舉為例如日本ATOTECH(股)製造之Reduction Solution Securiganth P。 Next, the surface of the insulating layer is roughened. In the case of the dry roughening treatment, plasma treatment and the like are mentioned, and in the case of the wet roughening treatment, a method of sequentially performing a swelling treatment with a swelling liquid, a roughening treatment with an oxidizing agent, and a neutralization treatment with a neutralizing liquid. The wet roughening treatment is preferable in terms of removing the smear in the through holes while forming the uneven anchor on the surface of the insulating layer. The swelling treatment with the swelling liquid is performed by immersing the insulating layer in the swelling liquid at 50 to 80° C. for 5 to 20 minutes (preferably at 55 to 70° C. for 8 to 15 minutes). Examples of the swelling liquid include an alkaline solution, a surfactant solution, and the like, preferably an alkaline solution, and the alkaline solution includes, for example, a sodium hydroxide solution, a potassium hydroxide solution, and the like. Commercially available swelling agents include, for example, Swelling Dip Securiganth P, Swelling Dip Securiganth SBU, and the like by Japan ATOTECH Co., Ltd. The roughening treatment by the oxidizing agent is performed by immersing the insulating layer in the oxidizing agent solution at 60 to 80° C. for 10 to 30 minutes (preferably at 70 to 80° C. for 15 to 25 minutes). Examples of the oxidizing agent include an alkaline permanganic acid solution obtained by dissolving potassium permanganate or sodium permanganate in an aqueous solution of sodium hydroxide, dichromate, ozone, hydrogen peroxide/sulfuric acid, and nitric acid. Furthermore, the permanganate concentration in the alkaline permanganic acid solution is preferably 5 to 10% by weight. Commercially available oxidants are listed as, for example, Concentrate manufactured by ATOTECH (stock) in Japan. Alkaline permanganic acid solutions such as Compact CP and Dozing Solution Securiganth P. The neutralization treatment by the neutralization solution is performed by immersing in the neutralization solution at 30 to 50°C for 3 to 10 minutes (preferably at 35 to 45°C for 3 to 8 minutes). The neutralizing solution is preferably an acidic aqueous solution, and a commercially available product is, for example, Reduction Solution Securiganth P manufactured by ATOTECH Co., Ltd., Japan.

絕緣層表面經粗化處理之粗化面的粗糙度,就形成微細配線之觀點而言,Ra值較好為200nm以下,更好為150nm以下,又更好為100nm以下。且為確保粗化面之錨定效果較好為10nm以上。又,所謂Ra值係表示表面粗糙度之數值的一種,且係稱為算術平均粗糙度者,具體而言係在測定區域內測定距平均線的表面之變化高度的絕對值並予以算術平均者。例如,可使用Veeco Instruments公司製造之WYKONT 3300,利用VSI接觸模式,以50倍透鏡,測定範圍為121μm×92μm所得之數值求出。 The roughness of the roughened surface of the insulating layer surface roughened is preferably 200 nm or less, more preferably 150 nm or less, and still more preferably 100 nm or less, from the viewpoint of forming fine wiring. In addition, in order to ensure the anchoring effect of the roughened surface, the thickness is preferably 10 nm or more. In addition, the so-called Ra value is a kind of numerical value representing the surface roughness, and it is called the arithmetic mean roughness. Specifically, the absolute value of the change height of the surface from the mean line is measured in the measurement area and the arithmetic mean is obtained. . For example, WYKONT 3300 manufactured by Veeco Instruments can be used to obtain the value obtained by using a VSI contact mode with a 50-fold lens and a measurement range of 121 μm×92 μm.

另外,均方根粗糙度(Rq值)由於係反映絕緣層表面之局部狀態,故發現可藉由Rq值之掌握確認成為緻密且平滑之絕緣層表面,使剝離強度穩定化。為了成 為緻密且平滑之絕緣層表面,Rq值較好為250nm以下,更好為200nm以下,又更好為150nm以下,再更好為100nm以下。另就使剝離強度穩定化之觀點而言,較好為15nm以上,更好為30nm以上。又,所謂Rq值係表示表面粗糙度之數值的一種,係稱為均方根粗糙度者,具體而言係以在測定區域內測定距平均線的表面之變化高度的絕對值並作為均方根予以表示者。 In addition, since the root mean square roughness (Rq value) reflects the local state of the surface of the insulating layer, it was found that the surface of the insulating layer can be confirmed to be dense and smooth by grasping the Rq value, thereby stabilizing the peel strength. In order to obtain a dense and smooth surface of the insulating layer, the Rq value is preferably 250 nm or less, more preferably 200 nm or less, still more preferably 150 nm or less, still more preferably 100 nm or less. In addition, from the viewpoint of stabilizing the peel strength, it is preferably at least 15 nm, more preferably at least 30 nm. In addition, the Rq value is a kind of numerical value representing the surface roughness, which is called the root mean square roughness. Specifically, the absolute value of the change height of the surface from the mean line is measured in the measurement area and used as the mean square. root to represent.

接著,藉由乾式鍍敷或濕式鍍敷在絕緣層上形成導體層。乾式鍍敷可使用蒸鍍、濺鍍、離子電鍍等習知方法。濕式鍍敷舉例有組合無電解鍍敷與電解鍍敷形成導體層之方法、形成與導體層相反圖型之鍍敷阻劑,且僅以無電解鍍敷形成導體層之方法等。至於隨後之圖型形成方法可使用例如本技藝者習知之減去(subtractive)法、半添加法等,且可藉由重複複數次之上述一連串步驟,多段地層合增層而製造多層印刷配線板。 Next, a conductor layer is formed on the insulating layer by dry plating or wet plating. For dry plating, conventional methods such as vapor deposition, sputtering, and ion plating can be used. Examples of wet plating include a method of forming a conductor layer by combining electroless plating and electrolytic plating, a method of forming a plating resist of a pattern opposite to that of the conductor layer, and a method of forming the conductor layer only by electroless plating. As for the subsequent pattern formation method, for example, a subtractive method, a semi-additive method, etc. known to those skilled in the art can be used, and a multi-layer printed wiring board can be manufactured by repeating the above-mentioned series of steps several times, and laminating layers in multiple stages. .

絕緣層與導體層之剝離強度為了使絕緣層與導體層充分密著,較好為0.35kgf/cm以上,更好為0.4kgf/cm以上。剝離強度之上限值越高越好,雖未特別限制,但一般為1.5kgf/cm以下、1.2kgf/cm以下、1.0kgf/cm以下、0.8kgf/cm以下等。本發明之印刷配線板用絕緣體之絕緣層由於粗糙度低,絕緣層與導體層之剝離強度高,故可較好地使用作為多層印刷配線板之增層。 The peel strength between the insulating layer and the conductor layer is preferably at least 0.35 kgf/cm, more preferably at least 0.4 kgf/cm, in order to sufficiently adhere the insulating layer and the conductor layer. The upper limit of peel strength is preferably as high as possible, and although it is not particularly limited, it is generally 1.5 kgf/cm or less, 1.2 kgf/cm or less, 1.0 kgf/cm or less, 0.8 kgf/cm or less, and the like. Since the insulating layer of the insulator for a printed wiring board of the present invention has low roughness and high peel strength between the insulating layer and the conductor layer, it can be preferably used as a build-up layer of a multilayer printed wiring board.

〈半導體裝置〉 <Semiconductor device>

藉由使用本發明之多層印刷配線板可製造半導體裝置。亦即,本發明之半導體裝置包含本發明之多層印刷配線板。可藉由在本發明之多層印刷配線板之導通部位,安裝半導體晶片而製造半導體裝置。所謂「導通部位」係「多層印刷配線板中傳導電訊號之部位」,其位置可為表面,亦可為經埋入之位置均可。且,半導體晶片若為以半導體為材料之電性電路元件則無特別限制。 A semiconductor device can be manufactured by using the multilayer printed wiring board of the present invention. That is, the semiconductor device of the present invention includes the multilayer printed wiring board of the present invention. A semiconductor device can be manufactured by mounting a semiconductor chip on the conductive portion of the multilayer printed wiring board of the present invention. The so-called "conducting part" refers to "the part that conducts electrical signals in the multilayer printed wiring board", and its position may be the surface or the embedded position. In addition, the semiconductor wafer is not particularly limited as long as it is an electrical circuit element using a semiconductor as a material.

製造本發明之半導體裝置時之半導體晶片之安裝方法若為使半導體晶片有效發揮功能,則無特別限制,具體列舉為金屬線黏合安裝方法、覆晶安裝方法、利用作成突塊之增層(BBUL)之安裝方法、利用異向性導電膜(ACF)之安裝方法、利用非導電性膜(NCF)之安裝方法等。 The mounting method of the semiconductor chip in the manufacture of the semiconductor device of the present invention is not particularly limited as long as the semiconductor chip can effectively function, but specifically include a wire bonding mounting method, a flip-chip mounting method, and a build-up layer (BBUL) using a bump. ) installation method, installation method using anisotropic conductive film (ACF), installation method using non-conductive film (NCF), etc.

[實施例] [Example]

以下使用實施例及比較例更詳細說明本發明,但本發明並不因該等實施例等而受到限制。又,以下之記載中,「份」及「%」意指「質量份」及「質量%」。 Hereinafter, the present invention will be described in more detail using Examples and Comparative Examples, but the present invention is not limited by these Examples and the like. In addition, in the following description, "part" and "%" mean "mass part" and "mass %".

測定方法.評價方法 test methods. Evaluation method

〈層合體之剝離強度(peel strength)之測定、算術平均粗糙鍍(Ra)、均方根粗糙度(Rq)之測定〉 <Determination of peel strength (peel strength) of laminate, measurement of arithmetic mean roughness (Ra), and root mean square roughness (Rq)>

(1)層合板之底層處理 (1) Bottom layer treatment of laminates

將形成有內層電路之玻璃布基材環氧樹脂兩面貼銅層合板(銅箔厚度18μm,殘銅率60%,基板厚0.3mm,松下電工(股)製之R5715ES)之兩面浸漬於Merck(股)製造之CZ8100中,進行銅箔表面之粗化處理。 Immerse both sides of the glass cloth substrate epoxy resin double-sided copper-clad laminate with the inner layer circuit formed (copper foil thickness 18μm, residual copper rate 60%, substrate thickness 0.3mm, R5715ES manufactured by Matsushita Electric Co., Ltd.) in Merck. In the CZ8100 manufactured by (stock), the roughening treatment of the copper foil surface was performed.

(2)接著薄膜之層合 (2) Lamination of the next film

使用批式真空加壓層合機MVLP-500[名機製作所(股)製,商品名],將下述各實施例及各比較例中作成之接著薄膜層合於上述層合板之兩面。層合係藉由在30秒減壓使氣壓成為13hPa以下,隨後之30秒以100℃、壓力0.74MPa壓著而進行。 Using a batch vacuum pressure laminator MVLP-500 [Miki Seisakusho Co., Ltd., trade name], the adhesive films prepared in the following Examples and Comparative Examples were laminated on both sides of the above-mentioned laminate. The lamination was performed by reducing the pressure for 30 seconds to make the air pressure 13 hPa or less, and then pressing at 100° C. and a pressure of 0.74 MPa for 30 seconds.

(3)樹脂組成物之硬化 (3) Hardening of resin composition

自經層合之接著薄膜剝離PET膜,以170℃、30分鐘之硬化條件使樹脂組成物硬化作成絕緣層。 The PET film was peeled off from the laminated adhesive film, and the resin composition was cured under curing conditions of 170° C. and 30 minutes to form an insulating layer.

(4)粗化處理 (4) Coarsening treatment

將形成有絕緣層之上述層合板在60℃下浸漬於膨潤液的日本ATOTECH(股)之含有二乙二醇單丁醚之Swelling Dip Securiganth P中10分鐘,接著於80℃浸漬於作為粗化液之日本ATOTECH(股)製造之Concentrate.Compact P(KMnO4:60g/L,NaOH:40g/L之水溶液)中20分鐘,最後在40℃下浸漬於作為中和液之日本ATOTECH(股)製之Reduction Solution Securiganth P中 5分鐘。將該粗化處理後之層合板作為樣品A。 The above-mentioned laminate with the insulating layer formed thereon was immersed in Swelling Dip Securiganth P containing diethylene glycol monobutyl ether of Japan ATOTECH Co., Ltd. of a swelling solution at 60°C for 10 minutes, and then immersed at 80°C as a roughening solution. Liquid Concentrate made by ATOTECH (stock) in Japan. Compact P (KMnO 4 : 60 g/L, NaOH: 40 g/L aqueous solution) for 20 minutes, and finally immersed in Reduction Solution Securiganth P manufactured by Japan ATOTECH Co., Ltd. as a neutralizing solution at 40° C. for 5 minutes. This roughened laminate was designated as sample A.

(5)利用半添加工法之導體層形成 (5) Formation of conductor layer by semi-additive process

為了在絕緣層表面上形成電路,而將樣品A之層合板浸漬於含PdCl2之無電解鍍敷用溶液中,接著浸漬於無電解銅鍍敷液中。在150℃加熱30分鐘進行退火後,形成蝕刻阻劑圖型,且藉由蝕刻形成圖型後,進行硫酸銅電解鍍敷,以30μm厚形成導體層。接著,在180℃進行退火處理60分鐘。將該層合板作為樣品B。 In order to form a circuit on the surface of the insulating layer, the laminate of Sample A was dipped in a solution for electroless plating containing PdCl 2 , and then dipped in an electroless copper plating solution. After heating and annealing at 150° C. for 30 minutes, an etching resist pattern was formed, and after the pattern was formed by etching, copper sulfate electroplating was performed to form a conductor layer with a thickness of 30 μm. Next, annealing treatment was performed at 180° C. for 60 minutes. This laminate was designated as sample B.

(6)算術平均粗糙度(Ra值)、均方根粗糙度(Rq值)之測定 (6) Determination of arithmetic mean roughness (Ra value) and root mean square roughness (Rq value)

針對樣品A,由使用非接觸型表面粗糙度計(Veeco Instruments公司製之WYKONT3300),藉由VSI接觸模式,以50倍透鏡,測定範圍設為121μm×92μm所得之數值求出Ra、Rq值。接著,將藉由求出各10點之平均值而得之數值作為測定值。 For sample A, the Ra and Rq values were obtained from the values obtained by using a non-contact surface roughness meter (WYKONT3300 manufactured by Veeco Instruments) in the VSI contact mode with a 50x lens and a measurement range of 121 μm×92 μm. Next, the numerical value obtained by calculating the average value of each 10 points was used as a measurement value.

(7)導體層之剝離強度(peel strength)之測定 (7) Determination of the peel strength of the conductor layer

對樣品B之導體層之一部分作成圍出寬10mm、長100mm之範圍之切口,以剝離治具(TSI股份有限公司,AUTOCOM型試驗機AC-50C-SL)夾住短條狀導體層之一端,在室溫下,測定以50mm/分鐘之速度朝垂直方向剝離35mm時之荷重(kgf/cm)。 Make an incision with a width of 10mm and a length of 100mm on a part of the conductor layer of sample B, and clamp one end of the short strip conductor layer with a stripping jig (TSI Co., Ltd., AUTOCOM type testing machine AC-50C-SL). , at room temperature, measure the load (kgf/cm) when peeling off 35mm in the vertical direction at a speed of 50mm/min.

〈介電正切之測定〉 <Determination of Dielectric Tangent>

使下述各實施例及各比較例所得之接著薄膜在190℃熱硬化90分鐘,剝離PET膜獲得薄片狀之硬化物。將該硬化物切斷成寬2mm、長80mm之試驗片,使用關東應用電子開發(股)製之空洞共振器攝動法介電率測定裝置CP521及Agilent Technology(股)製之網路分析儀(network analyzer)E8362B,以空洞共振法,以測定頻率5.8GHz進行介電正切(tanδ)之測定。針對2片試驗片進行測定,算出平均值。 The adhesive films obtained in the following Examples and Comparative Examples were thermally cured at 190° C. for 90 minutes, and the PET film was peeled off to obtain a sheet-like cured product. The cured product was cut into test pieces with a width of 2 mm and a length of 80 mm, and a cavity resonator perturbation method permittivity measuring device CP521 manufactured by Kanto Applied Electronics Development Co., Ltd. and a network analyzer manufactured by Agilent Technology Co., Ltd. were used. (network analyzer) E8362B, the dielectric tangent (tan δ) was measured by the cavity resonance method at a measurement frequency of 5.8 GHz. The measurement was performed on two test pieces, and the average value was calculated.

實施例1 Example 1

邊在甲基乙基酮(以下簡稱為「MEK」)15份、環己銅15份中攪拌液狀雙酚A型環氧樹脂(環氧當量180,三菱化學(股)製之「828US」)15份、聯苯型環氧樹脂(環氧當量291,日本化藥(股)製之「NC3000H」)15份,邊加熱溶解。隨後,混合萘型活性酯化合物[DIC(股)製之「EXB9411-65BK」,活性酯當量272,固體成分65%之甲苯溶液]43份、硬化促進劑[廣榮化學工業(股)製,「4-二甲胺基吡啶」]0.15份、球形二氧化矽[平均粒徑0.5μm,經苯基胺基矽烷處理之「SO-C2」,ADMATECHS(股)製,每單位質量之碳量0.18%]100份、苯氧樹脂(YL6954BH30,固體成分30質量%之MEK溶液,重量平均分子量40000)15份,以高速旋轉混練機 均勻分散,製作樹脂漆料。接著,以使乾燥後之樹脂厚度成為40μm之方式以模嘴塗佈器將該樹脂漆料塗佈於聚對苯二甲酸乙二酯(厚度38μm,以下簡稱為「PET」)薄膜上,在80~120℃(平均100℃)乾燥6分鐘,獲得薄片狀之接著薄膜。 Liquid bisphenol A epoxy resin (epoxy equivalent 180, "828US" manufactured by Mitsubishi Chemical Corporation) was stirred in 15 parts of methyl ethyl ketone (hereinafter abbreviated as "MEK") and 15 parts of cyclohexanone. ) 15 parts, and 15 parts of biphenyl epoxy resin (epoxy equivalent 291, "NC3000H" manufactured by Nippon Kayaku Co., Ltd.), which were dissolved by heating. Subsequently, 43 parts of a naphthalene-type active ester compound [“EXB9411-65BK” manufactured by DIC Corporation, active ester equivalent 272, toluene solution with a solid content of 65%], and a hardening accelerator (manufactured by Koei Chemical Industry Co., Ltd.) were mixed. "4-Dimethylaminopyridine"] 0.15 part, spherical silica [average particle size 0.5μm, "SO-C2" treated with phenylaminosilane, manufactured by ADMATECHS Co., Ltd., carbon content per unit mass 0.18%] 100 parts, 15 parts of phenoxy resin (YL6954BH30, MEK solution with solid content of 30% by mass, weight average molecular weight 40,000), uniformly dispersed with a high-speed rotary kneader to make resin paint. Next, the resin paint was coated on a polyethylene terephthalate (thickness 38 μm, hereinafter abbreviated as “PET”) film with a die coater so that the thickness of the resin after drying was 40 μm. 80-120 degreeC (average 100 degreeC) was dried for 6 minutes, and the sheet-like adhesive film was obtained.

實施例2 Example 2

除了將實施例1之萘型活性酯化合物[DIC(股)製之「EXB9411-65BK」,活性酯當量272,固體成分65%之甲苯溶液]43份變更為80份以外,餘與實施例1完全相同,製作樹脂漆料。接著與實施例1同樣獲得接著薄膜。 Except for changing the naphthalene-type active ester compound of Example 1 [“EXB9411-65BK” manufactured by DIC Corporation, active ester equivalent 272, toluene solution of 65% solid content] from 43 parts to 80 parts, the rest is the same as that of Example 1. Exactly the same, making resin paint. Next, in the same manner as in Example 1, an adhesive film was obtained.

實施例3 Example 3

除了將實施例1之萘型活性酯化合物[DIC(股)製之「EXB9411-65BK」,活性酯當量272,固體成分65%之甲苯溶液]43份變更為20份以外,餘與實施例1完全相同,製作樹脂漆料。接著與實施例1同樣獲得接著薄膜。 Except for changing the naphthalene-type active ester compound of Example 1 [“EXB9411-65BK” manufactured by DIC Corporation, active ester equivalent 272, toluene solution of 65% solid content] from 43 parts to 20 parts, the rest is the same as that of Example 1. Exactly the same, making resin paint. Next, in the same manner as in Example 1, an adhesive film was obtained.

實施例4 Example 4

除了將實施例1之聯苯型環氧樹脂[環氧當量291,日本化藥(股)製之「NC3000H」]15份變更為萘酚型環氧樹脂[環氧當量332,新日鐵化學(股)製之「ESN475V」]15份,且添加氰酸酯樹脂(LONZA公司製「BA230S75」,固體成分75%之甲基乙基酮溶液)15份與硬化觸媒[ 環烷酸鋅礦油精溶液(金屬含量8%)之3%環己酮稀釋液]0.03份以外,餘與實施例3完全相同,製作樹脂漆料。接著與實施例1同樣獲得接著薄膜。 Except that 15 parts of biphenyl type epoxy resin [epoxy equivalent 291, "NC3000H" manufactured by Nippon Kayaku Co., Ltd.] of Example 1 were changed to naphthol type epoxy resin [epoxy equivalent 332, Nippon Steel Chemicals] (stock) "ESN475V"] 15 parts, and add cyanate resin (LONZA company "BA230S75", solid content of 75% methyl ethyl ketone solution) 15 parts and hardening catalyst [zinc naphthenate Except for 0.03 part of 3% cyclohexanone diluent of olein solution (metal content 8%), the rest was exactly the same as in Example 3, and resin paint was produced. Next, in the same manner as in Example 1, an adhesive film was obtained.

比較例1 Comparative Example 1

除了將實施例1之萘型活性酯化合物[DIC(股)製之「EXB9411-65BK」,活性酯當量272,固體成分65%之甲苯溶液]43份變更為活性酯化合物[DIC(股)製之「HPC8000-65T」,活性酯當量223,固體成分65%之甲苯溶液]35份,且將球形二氧化矽[平均粒徑0.5μm,經苯基胺基矽烷處理之「SO-C2」,ADMATECHS(股)製,每單位質量之碳量0.18%]100份變更為90份,將硬化促進劑[廣榮化學工業(股)製,「4-二甲胺基吡啶」]0.15份變更為0.1份以外,餘與實施例1完全相同,製作樹脂漆料。接著與實施例1同樣獲得接著薄膜。 Except that the naphthalene-type active ester compound of Example 1 ["EXB9411-65BK" manufactured by DIC Corporation, active ester equivalent 272, toluene solution with solid content of 65%] was changed to an active ester compound [manufactured by DIC Corporation] 43 parts "HPC8000-65T", active ester equivalent 223, toluene solution of 65% solid content] 35 parts, and spherical silica [average particle size 0.5μm, "SO-C2" treated with phenylamino silane, ADMATECHS Co., Ltd., carbon content per unit mass: 0.18%] was changed from 100 parts to 90 parts, and hardening accelerator [Koei Chemical Industry Co., Ltd., "4-dimethylaminopyridine"] 0.15 parts was changed to Except for 0.1 part, it was exactly the same as in Example 1, and a resin paint was produced. Next, in the same manner as in Example 1, an adhesive film was obtained.

比較例2 Comparative Example 2

除了將實施例1之萘型活性酯化合物[DIC(股)製之「EXB9411-65BK」,活性酯當量272,固體成分65%之甲苯溶液]43份變更為95份以外,餘與實施例1完全相同,製作樹脂漆料。接著與實施例1同樣獲得接著薄膜。 Except for changing the naphthalene-type active ester compound of Example 1 [“EXB9411-65BK” manufactured by DIC Corporation, active ester equivalent 272, toluene solution of 65% solid content] from 43 parts to 95 parts, the rest is the same as that of Example 1. Exactly the same, making resin paint. Next, in the same manner as in Example 1, an adhesive film was obtained.

使用實施例及比較例中製造之接著薄膜之評價樣品的導體層之剝離強度、粗化處理後之表面粗糙度(Ra值)及(Rq值)、評價樣品之介電正切之各測定結 果示於表1。 The peel strength of the conductor layer, the surface roughness (Ra value) and (Rq value) after roughening treatment, and the dielectric tangent of the evaluation samples of the evaluation samples using the adhesive films produced in the Examples and Comparative Examples are shown in the respective measurement results. in Table 1.

Figure 108126982-A0202-12-0031-3
Figure 108126982-A0202-12-0031-3

如表1所示,將實施例1之環氧樹脂組成物中之含萘構造之活性酯化合物變更為本發明範圍外之活性酯化合物之比較例1的環氧樹脂組成物之硬化物,經粗化處理後之Ra、Rq之數值儘管顯示遠比實施例1之環氧樹脂組成物之硬化物之表面上形成之粗化面的Ra、Rq之數值大之數值,但與導體層之密著性(剝離強度)比實施例1者小,且介電正切之數值變大。 As shown in Table 1, the hardened product of the epoxy resin composition of Comparative Example 1 was obtained by changing the active ester compound containing a naphthalene structure in the epoxy resin composition of Example 1 to an active ester compound outside the scope of the present invention. Although the values of Ra and Rq after the roughening treatment are far larger than the values of Ra and Rq of the roughened surface formed on the surface of the hardened product of the epoxy resin composition of Example 1, they are not close to the conductor layer. The adhesion (peel strength) was smaller than that of Example 1, and the value of the dielectric tangent became larger.

另外,比較例2之環氧樹脂組成物由於含萘構造之活 性酯化合物之調配量多到超過本發明之範圍,故與導體層之密著性(剝離強度)比實施例1者更小。 In addition, the epoxy resin composition of Comparative Example 2 had a lower adhesiveness (peel strength) with the conductor layer than that of Example 1 because the amount of the active ester compound containing a naphthalene structure was larger than the scope of the present invention.

由以上之實施例及比較例之結果可了解,本發明之環氧樹脂組成物係可形成由平衡良好地具備可對應於多層印刷配線板之增層之更多層化、高密度化之特性的硬化物所成之絕緣層的環氧樹脂組成物。 From the results of the above examples and comparative examples, it can be understood that the epoxy resin composition of the present invention can be formed to have the characteristics of more layers and high density corresponding to the build-up of multilayer printed wiring boards in a well-balanced manner. The epoxy resin composition of the insulating layer formed by the hardened material.

Claims (12)

一種熱硬化性環氧樹脂組成物,其特徵係至少含有環氧樹脂(A)、含萘構造之活性酯化合物(B)、熱可塑性樹脂與無機填充材之熱硬化性環氧樹脂組成物,其中,前述樹脂組成物中的不揮發成分為100質量%時,前述含萘構造之活性酯化合物(B)的含量為0.1~30質量%,且前述含萘構造之活性酯化合物(B)係含以下述通式(1)表示之化合物,前述無機填充材的平均粒徑為0.01μm以上5μm以下,
Figure 108126982-A0305-02-0035-1
[式(1)中,R1各獨立為氫原子或碳數1~4之烷基,R2各獨立為氫原子或以下述通式(2)表示之1價基,X各獨立為氫原子、苯甲醯基或萘羰基,n及m各獨立為0~5之整數,n或m之任一者為1以上之整數]
Figure 108126982-A0305-02-0035-2
[式(2)中,R1係與上述相同,X係與上述相同,p為1或2之整數,又,上述通式(1)及通式(2)中之X中之至少一者為苯甲醯基或萘羰基]。
A thermosetting epoxy resin composition, which is characterized by a thermosetting epoxy resin composition comprising at least an epoxy resin (A), an active ester compound containing a naphthalene structure (B), a thermoplastic resin and an inorganic filler, Wherein, when the non-volatile matter in the resin composition is 100% by mass, the content of the active ester compound (B) containing a naphthalene structure is 0.1 to 30% by mass, and the active ester compound (B) containing a naphthalene structure is a Contains a compound represented by the following general formula (1), wherein the average particle size of the inorganic filler is 0.01 μm or more and 5 μm or less,
Figure 108126982-A0305-02-0035-1
[In formula (1), each of R 1 is independently a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, each of R 2 is independently a hydrogen atom or a monovalent group represented by the following general formula (2), and each of X is independently a hydrogen Atom, benzyl group or naphthylcarbonyl group, n and m are each independently an integer of 0 to 5, and either n or m is an integer of 1 or more]
Figure 108126982-A0305-02-0035-2
[In formula (2), R 1 is the same as above, X is the same as above, p is an integer of 1 or 2, and at least one of X in the above general formula (1) and general formula (2) be benzyl or naphthyl carbonyl].
如請求項1之熱硬化性環氧樹脂組成物,其中前述環氧樹脂(A)於溫度20℃含有液狀之環氧樹脂。 The thermosetting epoxy resin composition according to claim 1, wherein the epoxy resin (A) contains a liquid epoxy resin at a temperature of 20°C. 如請求項1之熱硬化性環氧樹脂組成物,其中前述樹脂組成物中的不揮發成分為100質量%時,前述無機填充材的含量為30~90質量%。 The thermosetting epoxy resin composition according to claim 1, wherein the content of the inorganic filler is 30 to 90 mass % when the nonvolatile content in the resin composition is 100 mass %. 如請求項1之熱硬化性環氧樹脂組成物,其中前述樹脂組成物中的不揮發成分為100質量%時,前述環氧樹脂(A)的含量為10~50質量%。 The thermosetting epoxy resin composition according to claim 1, wherein the content of the epoxy resin (A) is 10 to 50 mass % when the nonvolatile content in the resin composition is 100 mass %. 如請求項1之熱硬化性環氧樹脂組成物,其係藉由鍍敷而形成導體層之多層印刷配線板之絕緣層用樹脂組成物。 The thermosetting epoxy resin composition of claim 1, which is a resin composition for an insulating layer of a multilayer printed wiring board in which a conductor layer is formed by plating. 一種絕緣層形成用接著薄膜,其特徵係於支撐薄膜上具有由如請求項1~5中任一項之熱硬化性環氧樹脂組成物所成之樹脂組成物層而成者。 An adhesive film for forming an insulating layer, characterized by having a resin composition layer made of the thermosetting epoxy resin composition according to any one of claims 1 to 5 on a support film. 一種絕緣層形成用預浸體,其特徵係將如請求項1~5中任一項之熱硬化性環氧樹脂組成物含浸於薄片狀纖維基材中而成者。 A prepreg for forming an insulating layer, characterized by impregnating a sheet-like fiber base material with the thermosetting epoxy resin composition according to any one of claims 1 to 5. 一種印刷配線板用絕緣體,其特徵係由如請求項6之絕緣層形成用接著薄膜之樹脂組成物層或如請求項7之絕緣層形成用預浸體的任一者之硬化物所成者。 An insulator for a printed wiring board, characterized by being formed of a resin composition layer of a bonding film for forming an insulating layer as claimed in claim 6 or a cured product of either a prepreg for forming an insulating layer as claimed in claim 7 . 一種印刷配線板用絕緣體,其特徵係於由如請求項8之印刷配線板用絕緣體所成之絕緣層上具有經圖型加工之導體層電路者。 An insulator for a printed wiring board, characterized by having a patterned conductor layer circuit on an insulating layer formed of the insulator for a printed wiring board as claimed in claim 8. 如請求項8或9之印刷配線板用絕緣體,其中前述絕緣層之表面粗糙度Ra係10~200nm,Rq係15~250nm,前述絕緣層與前述導體層之剝離強度係 0.35kgf/cm以上。 The insulator for a printed wiring board according to claim 8 or 9, wherein the surface roughness Ra of the insulating layer is 10 to 200 nm, Rq is 15 to 250 nm, and the peel strength between the insulating layer and the conductor layer is 0.35kgf/cm or more. 一種多層印刷配線板,其特徵係多層層合如請求項9或10之印刷配線板用絕緣體所形成者。 A multilayer printed wiring board, which is characterized by laminating a plurality of layers such as the insulator for a printed wiring board of claim 9 or 10. 一種半導體裝置,其特徵係使用如請求項11之多層印刷配線板者。 A semiconductor device characterized by using the multilayer printed wiring board as claimed in claim 11.
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