TW201420346A - Resin composition - Google Patents

Resin composition Download PDF

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TW201420346A
TW201420346A TW102135670A TW102135670A TW201420346A TW 201420346 A TW201420346 A TW 201420346A TW 102135670 A TW102135670 A TW 102135670A TW 102135670 A TW102135670 A TW 102135670A TW 201420346 A TW201420346 A TW 201420346A
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resin composition
resin
insulating layer
mass
curing agent
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TW102135670A
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Chinese (zh)
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TWI633011B (en
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Kenji Kawai
Shohei Fujishima
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Ajinomoto Kk
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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/40Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
    • C08G59/42Polycarboxylic acids; Anhydrides, halides or low molecular weight esters thereof
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/38Layered products comprising a layer of synthetic resin comprising epoxy resins
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/34Silicon-containing compounds
    • C08K3/36Silica
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/04Oxygen-containing compounds
    • C08K5/10Esters; Ether-esters
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/16Nitrogen-containing compounds
    • C08K5/29Compounds containing one or more carbon-to-nitrogen double bonds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K9/00Use of pretreated ingredients
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0373Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement containing additives, e.g. fillers
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/005Additives being defined by their particle size in general

Abstract

This invention provides a resin composition, which forms, when being subjected to curing, during a wet type roughening process, an insulated layer having a surface with less arithmetic mean roughness and less root mean square roughness, allowing the formation of a conductor layer with sufficient peel strength on the insulated layer by coating, and achieving low dielectric loss tangent of the cured object. The resin composition of this invention is characterized by comprising one or two of epoxy resin having a naphthyl fluorene structure, an active ester-based curing agent, and an isocyanate-based curing agent.

Description

樹脂組成物 Resin composition

本發明係關於一種樹脂組成物。進而本發明係關於含有該樹脂組成物之薄片狀層合材料、多層印刷配線板、半導體裝置。 The present invention relates to a resin composition. Further, the present invention relates to a sheet-like laminate including the resin composition, a multilayer printed wiring board, and a semiconductor device.

近年來,隨著電子設備之小型化、高性能化進展,多層印刷配線板中要求增層之多層化、配線之微細化及高密度化。 In recent years, with the advancement of miniaturization and high performance of electronic equipment, multi-layer printed wiring boards are required to be multilayered, and the wiring is made finer and higher in density.

對於此而有各種處置。例如,專利文獻1中揭示含有具有烯烴骨架之環氧化合物之硬化性組成物為高耐熱性、低線膨脹性、高折射率,但其性能並非必定充分。 There are various disposals for this. For example, Patent Document 1 discloses that a curable composition containing an epoxy compound having an olefin skeleton has high heat resistance, low linear expansion property, and high refractive index, but its performance is not necessarily sufficient.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]特開2012-102228號公報 [Patent Document 1] JP-A-2012-102228

本發明欲解決之課題係提供一種硬化作成絕緣層後之濕式粗化步驟中不僅使絕緣層表面之算術平均粗糙度之值變小,且絕緣層上之均方根粗糙度(root mean square surface roughness)之值亦小,而可於絕緣層上藉由鍍敷形成具有充分剝離強度之導體層之介電正切較低之樹脂組成物。 The problem to be solved by the present invention is to provide a hardening roughening step after hardening an insulating layer, which not only reduces the value of the arithmetic mean roughness of the surface of the insulating layer but also the root mean square roughness on the insulating layer (root mean square) The value of the surface roughness is also small, and a resin composition having a dielectric tangent of a conductor layer having sufficient peel strength can be formed by plating on the insulating layer.

本發明人等欲解決上述課題而積極檢討之結果,藉由特徵係含有具有萘基茀構造之環氧樹脂、及活性酯系硬化劑及/或氰酸酯系硬化劑之樹脂組成物,因而完成本發明。 As a result of the positive review of the above-mentioned problems, the inventors of the present invention have a resin composition having an epoxy resin having a naphthylquinone structure and an active ester-based curing agent and/or a cyanate-based curing agent. The present invention has been completed.

亦即,本發明為包含以下之內容者。 That is, the present invention is intended to include the following.

[1]一種樹脂組成物,其特徵為含有成分(A)具有萘基茀構造之環氧樹脂,及成分(B)活性酯系硬化劑及氰酸酯系硬化劑中之任一者或二者。 [1] A resin composition characterized by comprising an epoxy resin having a naphthylfluorene structure of component (A), and an active ester curing agent and a cyanate curing agent of component (B) By.

[2]如[1]記載之樹脂組成物,其中前述成分(A)之含量以樹脂組成物中之不揮發成分作為100質量%時,為1~20質量%。 [2] The resin composition according to the above [1], wherein the content of the component (A) is from 1 to 20% by mass based on 100% by mass of the nonvolatile component in the resin composition.

[3]如[1]或[2]記載之樹脂組成物,其中前述成分(B)之含量以樹脂組成物中之不揮發成分作為100質量%時,為1~30質量%。 [3] The resin composition according to [1] or [2], wherein the content of the component (B) is from 1 to 30% by mass based on 100% by mass of the nonvolatile component in the resin composition.

[4]如[1]~[3]中任一項所記載之樹脂組成物,其中前述成分(B)為活性酯系硬化劑。 [4] The resin composition according to any one of [1] to [3] wherein the component (B) is an active ester-based curing agent.

[5]如[1]~[4]中任一項所記載之樹脂組成物,其係進而含有無機填充材。 [5] The resin composition according to any one of [1] to [4] further comprising an inorganic filler.

[6]如[5]所記載之樹脂組成物,其中前述無機填充材之平均粒徑為0.01~5μm。 [6] The resin composition according to [5], wherein the inorganic filler has an average particle diameter of 0.01 to 5 μm.

[7]如[5]或[6]所記載之樹脂組成物,其中前述無機填充材之含量以樹脂組成物中之不揮發成分作為100質量%時,為30~90質量%。 [7] The resin composition according to the above [5], wherein the content of the inorganic filler is 30 to 90% by mass based on 100% by mass of the nonvolatile component in the resin composition.

[8]如[5]~[7]中任一項所記載之樹脂組成物,其中無機填充材係以表面處理劑進行表面處理者。 [8] The resin composition according to any one of [5] to [7] wherein the inorganic filler is surface-treated with a surface treatment agent.

[9]如[5]~[8]中任一項所記載之樹脂組成物,其中前述無機填充材為二氧化矽。 [9] The resin composition according to any one of [5] to [8] wherein the inorganic filler is cerium oxide.

[10]如[1]~[9]中任一項所記載之樹脂組成物,其係進而含有熱可塑性樹脂。 [10] The resin composition according to any one of [1] to [9] further comprising a thermoplastic resin.

[11]如[1]~[10]中任一項所記載之樹脂組成物,其係使樹脂組成物硬化形成絕緣層,且使絕緣層表面進行粗化處理後之絕緣層表面之算術平均粗糙度為10~350nm,均方根粗糙度為20~500nm。 [11] The resin composition according to any one of [1] to [10] wherein the resin composition is cured to form an insulating layer, and the arithmetic mean of the surface of the insulating layer after the surface of the insulating layer is roughened The roughness is 10 to 350 nm, and the root mean square roughness is 20 to 500 nm.

[12]如[1]~[11]中任一項所記載之樹脂組成物,其係多層印刷配線板之絕緣層用樹脂組成物。 [12] The resin composition according to any one of [1] to [11] which is a resin composition for an insulating layer of a multilayer printed wiring board.

[13]如[1]~[12]中任一項所記載之樹脂組成物,其係多層印刷配線板之絕緣層用樹脂組成物,該多層印刷配線板係導體層為藉由鍍敷所形成者。 [13] The resin composition according to any one of [1] to [12] which is a resin composition for an insulating layer of a multilayer printed wiring board, wherein the multilayer printed wiring board-based conductor layer is formed by a plating station Former.

[14]一種片狀層合材料,其特徵為含有如[1]~[13]中任一項所記載之樹脂組成物者。 [14] A sheet-like laminate comprising the resin composition according to any one of [1] to [13].

[15]一種多層印刷配線板,其特徵係含有如[1]~[13]中任一項所記載之樹脂組成物作為絕緣層者。 [15] A multilayer printed wiring board comprising the resin composition according to any one of [1] to [13] as an insulating layer.

[16]一種半導體裝置,其特徵係含有如[15]所記載之多層印刷配線板者。 [16] A semiconductor device comprising the multilayer printed wiring board according to [15].

藉由使用特徵為含有具有萘基茀構造之環氧樹脂、及活性酯系硬化劑及/或氰酸酯系硬化劑之樹脂組成物,可提供在硬化作成絕緣層後之濕式粗化步驟中不僅使絕緣層表面之算術平均粗糙度之值變小,且絕緣層表面之均方根粗糙度之值亦小,可藉鍍敷在絕緣層上形成具有充分剝離強度之導體層之介電正切較低之樹脂組成物。 By using a resin composition characterized by containing an epoxy resin having a naphthylquinone structure and an active ester-based hardener and/or a cyanate-based hardener, a wet roughening step after hardening the insulating layer can be provided In the meantime, not only the value of the arithmetic mean roughness of the surface of the insulating layer is reduced, but also the value of the root mean square roughness of the surface of the insulating layer is small, and the dielectric layer of the conductor layer having sufficient peeling strength can be formed by plating on the insulating layer. Tangerally lower resin composition.

本發明係一種樹脂組成物,其特徵係含有具有萘基茀構造之環氧樹脂、及活性酯系硬化劑及/或氰酸酯系硬化劑,亦即活性酯系硬化劑及氰酸酯系硬化劑中之任一者或二者。以下,針對樹脂組成物之調配成分加以詳述。 The present invention is a resin composition characterized by comprising an epoxy resin having a naphthylquinone structure, an active ester-based curing agent, and/or a cyanate-based curing agent, that is, an active ester-based curing agent and a cyanate ester-based curing agent. Either or both of the hardeners. Hereinafter, the compounding component of the resin composition will be described in detail.

<成分(A)具有萘基茀構造之環氧樹脂> <Component (A) Epoxy resin having naphthyl fluorene structure>

本發明中使用之具有萘基茀構造之環氧樹脂並無特別 限制,只要是具有茀骨架與萘骨架之環氧樹脂即可。列舉為例如具有藉由使茀酮與萘類反應所得之具有萘基茀構造之酚樹脂與表氯醇反應,而具有使該酚樹脂進行縮水甘油醚化之分子構造之環氧樹脂等。亦可使用特開2012-102228號公報中揭示之具有萘基茀構造之環氧樹脂。尤其,較好使用含有以下述通式(1)表示之構造之環氧樹脂。 The epoxy resin having a naphthylquinone structure used in the present invention is not particularly The restriction is as long as it is an epoxy resin having an anthracene skeleton and a naphthalene skeleton. For example, an epoxy resin having a molecular structure in which glycidyl etherification of the phenol resin is carried out by reacting a phenol resin having a naphthylquinone structure obtained by reacting an anthrone with a naphthalene with epichlorohydrin is exemplified. An epoxy resin having a naphthylquinone structure disclosed in JP-A-2012-102228 can also be used. In particular, an epoxy resin having a structure represented by the following formula (1) is preferably used.

[式中,R1及R2各獨立列舉為氫原子、碳數1~10之烷基,較好為氫原子、碳數1~5之烷基,更好為氫原子。a為0~3。b為0~3]。 In the formula, R 1 and R 2 each independently represent a hydrogen atom and an alkyl group having 1 to 10 carbon atoms, preferably a hydrogen atom or an alkyl group having 1 to 5 carbon atoms, more preferably a hydrogen atom. a is 0~3. b is 0~3].

市售之具有萘基茀構造之環氧樹脂列舉為CG-500(大阪氣體化學(股)製,具有以上述通式(1)表示之構造)等。 The commercially available epoxy resin having a naphthylfluorene structure is exemplified by CG-500 (manufactured by Osaka Gas Chemical Co., Ltd., having the structure represented by the above formula (1)).

樹脂組成物中之具有萘基茀構造之環氧樹脂之含量並無特別限制,但就濕式粗化步驟中兼顧絕緣層表 面之低粗糙度化與由鍍敷形成之導體層之高剝離強度之觀點而言,以樹脂組成物中之不揮發成分作為100質量%時,較好為1~20質量%,更好為3~15質量%,又更好為5~10質量%。 The content of the epoxy resin having a naphthylquinone structure in the resin composition is not particularly limited, but the insulating layer table is considered in the wet roughening step. When the non-volatile content in the resin composition is 100% by mass, the content of the low-roughness of the surface is preferably from 1 to 20% by mass, more preferably from 1 to 20% by mass. 3 to 15% by mass, and more preferably 5 to 10% by mass.

本發明之樹脂組成物中,在能發揮本發明效果之範圍內,亦可視需要併用具有萘基茀構造之環氧樹脂與其他環氧樹脂。該等其他環氧樹脂列舉為例如雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、酚酚醛氫漆型環氧樹脂、第三丁基兒茶酚型環氧樹脂、萘酚型環氧樹脂、萘型環氧樹脂、萘醚型環氧樹脂、縮水甘油基胺型環氧樹脂、縮水甘油酯型環氧樹脂、甲酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、蒽型環氧樹脂、線狀脂肪族環氧樹脂、具有丁二烯構造之環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含有螺環之環氧樹脂、環己烷二甲醇型環氧樹脂、三羥甲基型環氧樹脂、鹵化環氧樹脂等。該等可以1種或組合2種以上作為其他環氧樹脂使用。 In the resin composition of the present invention, an epoxy resin having a naphthylquinone structure and another epoxy resin may be used in combination as needed within the range in which the effects of the present invention can be exerted. These other epoxy resins are exemplified by, for example, bisphenol A epoxy resin, bisphenol F epoxy resin, bisphenol S epoxy resin, bisphenol AF epoxy resin, phenol novolac hydrogenated epoxy resin, Third butyl catechol type epoxy resin, naphthol type epoxy resin, naphthalene type epoxy resin, naphthalene ether type epoxy resin, glycidyl amine type epoxy resin, glycidyl ester type epoxy resin, A Phenolic novolak type epoxy resin, biphenyl type epoxy resin, bismuth type epoxy resin, linear aliphatic epoxy resin, epoxy resin having butadiene structure, alicyclic epoxy resin, heterocyclic ring Oxygen resin, epoxy resin containing a spiro ring, cyclohexane dimethanol type epoxy resin, trimethylol type epoxy resin, halogenated epoxy resin, and the like. These may be used alone or in combination of two or more kinds as other epoxy resins.

併用具有萘基茀構造之環氧樹脂與其他環氧樹脂作為環氧樹脂時,濕式粗化步驟中就兼顧絕緣層表面之低粗度化與藉鍍敷形成之導體層之高剝離強度之觀點而言,以環氧樹脂整體之固體成分作為100質量份時,具有萘基茀構造之環氧樹脂較好為30~90質量份,更好為35~80質量份,又更好為40~70質量份。 When an epoxy resin having a naphthylfluorene structure and another epoxy resin are used as the epoxy resin, the wet roughening step takes into consideration the low thickness of the surface of the insulating layer and the high peel strength of the conductor layer formed by plating. When the solid content of the entire epoxy resin is 100 parts by mass, the epoxy resin having a naphthylquinone structure is preferably 30 to 90 parts by mass, more preferably 35 to 80 parts by mass, and still more preferably 40. ~70 parts by mass.

<成分(B)活性酯系硬化劑及/或氰酸酯系硬化劑> <Component (B) Active ester-based curing agent and/or cyanate-based curing agent>

本發明之樹脂組成物中使用之活性酯系硬化劑及/或氰酸酯系硬化劑並無特別限制,但就實現低介電正切之觀點而言較好使用活性酯系硬化劑。至於活性酯系硬化劑及/或氰酸酯系硬化劑可使用該等之1種或組合2種以上使用。 The active ester-based curing agent and/or the cyanate-based curing agent used in the resin composition of the present invention are not particularly limited, but an active ester-based curing agent is preferably used from the viewpoint of achieving low dielectric tangent. The active ester-based curing agent and/or the cyanate-based curing agent may be used alone or in combination of two or more.

活性酯系硬化劑並無特別限制,一般較好使用酚酯類、噻吩酯類、N-羥基胺酯類、雜環羥基化合物之酯類等之一分子中具有2個以上反應活性高之酯基之化合物。該活性酯系硬化劑較好為藉由以羧酸化合物及/或硫代羧酸化合物與羥基化合物及/或硫醇化合物之縮合反應獲得者。尤其就提高耐熱性之觀點而言,較好為由羧酸化合物與羥基化合物獲得之活性酯系硬化劑,更好為由羧酸化合物與酚化合物及/或萘酚化合物獲得之活性酯系硬化劑。至於羧酸化合物列舉為例如苯甲酸、乙酸、琥珀酸、馬來酸、衣康酸、鄰苯二甲酸、間苯二甲酸、對苯二甲酸、均苯四酸等。至於酚化合物或萘酚化合物列舉為氫醌、間苯二甲酚、雙酚A、雙酚F、雙酚S、酚酞(phenolphthalin)、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、酚、鄰-甲酚、間-甲酚、對-甲酚、兒茶酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚(phloroglucin)、苯三醇、二環戊二烯基二苯酚、酚酚醛清漆樹脂等。本發明中之活性酯系硬化劑 可使用1種或2種以上。至於活性酯系硬化劑具體而言較好為含二環戊二烯基型二苯酚縮合構造之活性酯系硬化劑、含萘構造之活性酯系硬化劑、酚酚醛清漆樹脂之乙醯基化物之活性酯系硬化劑、酚酚醛清漆樹脂之苯甲醯基化物之活性酯系硬化劑等,其中就提高剝離強度優異之觀點而言,更好為含二環戊二烯基型二酚縮合構造之活性酯系硬化劑、含萘構造之活性酯系硬化劑。至於活性酯系硬化劑亦可使用特開2004-277460號公報中揭示之活性酯系硬化劑,另亦可使用市售者。至於市售品,含二環戊二烯基型二苯酚縮合構造者列舉為EXB9451、EXB9460、EXB9460S-65T、HPC-8000-65T(DIC(股)製,活性基當量約223),酚酚醛清漆樹脂之乙醯化物之活性酯系硬化劑列舉為DC808(三菱化學(股)製,活性基當量約149),酚酚醛清漆樹脂之苯甲醯化物之活性酯系硬化劑列舉為YLH1026(三菱化學(股)製,活性基當量約200)、YLH1030(三菱化學(股)製,活性基當量約201)、YLH1048(三菱化學(股)製,活性基當量約245)等。 The active ester-based curing agent is not particularly limited, and it is generally preferred to use two or more reactive esters in a molecule such as a phenol ester, a thiophene ester, an N-hydroxylamine, or an ester of a heterocyclic hydroxy compound. Base compound. The active ester-based curing agent is preferably obtained by a condensation reaction of a carboxylic acid compound and/or a thiocarboxylic acid compound with a hydroxy compound and/or a thiol compound. Particularly, from the viewpoint of improving heat resistance, an active ester-based curing agent obtained from a carboxylic acid compound and a hydroxy compound is preferred, and an active ester-based curing agent obtained from a carboxylic acid compound and a phenol compound and/or a naphthol compound is more preferred. Agent. The carboxylic acid compound is exemplified by, for example, benzoic acid, acetic acid, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, pyromellitic acid or the like. The phenol compound or naphthol compound is exemplified by hydroquinone, meta-xyl phenol, bisphenol A, bisphenol F, bisphenol S, phenolphthalin, methylated bisphenol A, methylated bisphenol F, and Bisphenol bisphenol, phenol, o-cresol, m-cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-di Hydroxynaphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, phloroglucin, benzenetriol, dicyclopentadienyl Diphenol, phenol novolak resin, and the like. Active ester-based hardener in the present invention One type or two or more types can be used. The active ester-based hardener is preferably an active ester-based hardener containing a dicyclopentadienyl-type diphenol condensation structure, an active ester-based hardener containing a naphthalene structure, and an acetylated phenol novolac resin. The active ester-based curing agent, the active ester-based curing agent of the benzoquinone-based phenol novolac resin, and the like, and the dicyclopentadienyl-based diphenol condensation is more preferable from the viewpoint of improving the peel strength. An active ester-based curing agent and an active ester-based curing agent containing a naphthalene structure. As the active ester-based curing agent, an active ester-based curing agent disclosed in JP-A-2004-277460 may be used, and a commercially available one may also be used. As a commercial product, the dicyclopentadienyl type diphenol condensation structure is exemplified as EXB9451, EXB9460, EXB9460S-65T, HPC-8000-65T (made by DIC (shares, active base equivalent: about 223), phenol novolac The active ester-based hardener of the acetal of the resin is exemplified by DC808 (manufactured by Mitsubishi Chemical Corporation, active base equivalent of about 149), and the active ester-based hardener of the benzoic acid phenolic phenolic resin is listed as YLH1026 (Mitsubishi Chemical) (Stock) system, active base equivalent of about 200), YLH1030 (manufactured by Mitsubishi Chemical Corporation, active base equivalent of about 201), YLH1048 (manufactured by Mitsubishi Chemical Corporation, active base equivalent of about 245), and the like.

含有二環戊二烯基型二苯酚縮合構造之活性酯系硬化劑更具體而言列舉為以下述通式(2)表示之化合物。 More specifically, the active ester-based curing agent containing a dicyclopentadienyl diphenol condensation structure is a compound represented by the following formula (2).

[式中,R為苯基或萘基,k表示0或1,n為重複單位之平均,為0.05~2.5]。 Wherein R is a phenyl or naphthyl group, k represents 0 or 1, and n is an average of repeating units, and is 0.05 to 2.5].

就降低樹脂組成物之硬化物的介電正切、提高耐熱性之觀點而言,R較好為萘基,k較好為0,且,n較好為0.25~1.5。 From the viewpoint of lowering the dielectric tangent of the cured product of the resin composition and improving the heat resistance, R is preferably a naphthyl group, k is preferably 0, and n is preferably 0.25 to 1.5.

氰酸酯系硬化劑並無特別限制,列舉為酚醛清漆型(酚酚醛清漆型、烷基酚酚醛清漆型等)氰酸酯系硬化劑、二環戊二烯型氰酸酯系硬化劑、雙酚型(雙酚A型、雙酚F型、雙酚S型等)氰酸酯系硬化劑,及該等之一部分經三嗪化之預聚物等。氰酸酯系硬化劑之重量平均分子量並無特別限制,較好為500~4500,更好為600~3000。氰酸酯系硬化劑之具體例列舉為例如雙酚A二氰酸酯、聚酚氰酸酯(寡聚(3-亞甲基-1,5-伸苯基氰酸酯)、4,4’-亞甲基雙(2,6-二甲基苯基氰酸酯)、4,4’-亞乙基二苯基二氰酸酯、六氟雙酚A二氰酸酯、2,2-雙(4-氰酸酯基)苯基丙烷、1,1-雙(4-氰酸酯基苯基甲烷)、雙(4-氰酸酯基-3,5-二甲基苯基)甲烷、1,3-雙(4-氰酸酯基苯基-1-(甲基亞乙基))苯、雙(4-氰酸酯基苯基)硫醚、雙(4-氰酸酯基苯基)醚等二官能氰酸酯樹脂,由酚酚醛清漆、甲酚酚醛清漆、含有二環戊二烯型構造之酚樹脂等衍生之多官能氰酸酯樹脂,該等氰酸酯樹脂一部分經三嗪 化之預聚物等。該等可使用1種或組合2種以上使用。市售之氰酸酯樹脂列舉為以下式(3)表示之酚酚醛清漆型多官能氰酸酯樹脂(日本LONZA(股)製,PT30S,氰酸酯當量124),以下式(4)表示之雙酚A二氰酸酯之一部分或全部經三嗪化成為三聚物之預聚物(日本LONZA(股)製,BA230S,氰酸酯當量232),以下式(5)表示之含有二環戊二烯型構造之氰酸酯樹脂(日本LONZA(股)製,DT-4000、DT-7000)等。 The cyanate-based curing agent is not particularly limited, and examples thereof include a novolak type (phenol novolak type, alkylphenol novolak type, etc.) cyanate-based curing agent, a dicyclopentadiene type cyanate-based curing agent, and A bisphenol type (bisphenol A type, bisphenol F type, bisphenol S type, etc.) cyanate type curing agent, and a part of the triazine-based prepolymer. The weight average molecular weight of the cyanate-based curing agent is not particularly limited, but is preferably from 500 to 4,500, more preferably from 600 to 3,000. Specific examples of the cyanate-based curing agent are, for example, bisphenol A dicyanate and polyphenol cyanate (oligo(3-methylene-1,5-phenylene), 4,4 '-Methylene bis(2,6-dimethylphenyl cyanate), 4,4'-ethylene diphenyl dicyanate, hexafluorobisphenol A dicyanate, 2,2 - bis(4-cyanate)phenylpropane, 1,1-bis(4-cyanate phenylmethane), bis(4-cyanate-3,5-dimethylphenyl) Methane, 1,3-bis(4-cyanatephenyl-1-(methylethylidene))benzene, bis(4-cyanatephenyl) sulfide, bis(4-cyanate) A difunctional cyanate resin such as phenyl phenol acetal, a polyfunctional cyanate resin derived from a phenol novolak, a cresol novolak, a phenol resin having a dicyclopentadiene type structure, or the like, and the cyanate resin Triazine Prepolymers and the like. These may be used alone or in combination of two or more. The commercially available cyanate resin is a phenol novolac type polyfunctional cyanate resin (manufactured by LONZA Co., Ltd., PT30S, cyanate equivalent 124) represented by the following formula (3), and is represented by the following formula (4). A part or all of the bisphenol A dicyanate is triazine-formed into a prepolymer of a terpolymer (manufactured by LONZA Co., Ltd., BA230S, cyanate equivalent 232), and the following formula (5) contains a bicyclic ring. Cyanate resin of pentadiene type structure (manufactured by LONZA Co., Ltd., DT-4000, DT-7000).

[式中,n以平均值表示為任意之數(較好為0~20)]。 [In the formula, n is represented by an average value (preferably 0 to 20)].

[式中,n以平均值表示為0~5之數]。 [where n is represented by an average value of 0 to 5].

樹脂組成物中之活性酯系硬化劑及/或氰酸酯系硬化劑之含量並無特別限制,但就兼顧濕式粗化步驟中絕緣層表面之低粗度化與藉鍍敷形成之導體層之高剝離強度之觀點而言,以樹脂組成物中之不揮發成分作為100質量%時,較好為1~30質量%,更好為3~25質量%,又更好為5~20質量%。 The content of the active ester-based curing agent and/or the cyanate-based curing agent in the resin composition is not particularly limited, but the low-thickness of the surface of the insulating layer and the conductor formed by plating are considered in the wet roughening step. When the non-volatile content in the resin composition is 100% by mass, the content is preferably from 1 to 30% by mass, more preferably from 3 to 25% by mass, even more preferably from 5 to 20. quality%.

本發明之樹脂組成物中在能發揮本發明效果之範圍內,亦可視需要併用活性酯系硬化劑及/或氰酸酯系硬化劑與其他硬化劑。該其他硬化劑列舉為例如酚系硬化劑、苯并噁嗪系硬化劑等。酚系硬化劑並無特別限制,較好使用選自聯苯型硬化劑、萘型硬化劑、酚酚醛清漆樹脂型硬化劑、萘醚型硬化劑、含有三嗪骨架之酚系硬化劑之1種以上。至於苯并噁嗪系硬化劑並無特別限制,具體而言列舉為F-a、P-d(四國化成(股)製)、HFB2006M(昭和高分子(股)製)等。該等可使用1種或併用2種以上使用。 In the resin composition of the present invention, an active ester-based curing agent and/or a cyanate-based curing agent and other curing agents may be used in combination as needed within the range in which the effects of the present invention can be exerted. The other curing agent is exemplified by, for example, a phenolic curing agent, a benzoxazine-based curing agent, and the like. The phenolic curing agent is not particularly limited, and one selected from the group consisting of a biphenyl type curing agent, a naphthalene type curing agent, a phenol novolac resin type curing agent, a naphthyl ether type curing agent, and a triazine skeleton-containing phenol type curing agent is preferably used. More than one species. The benzoxazine-based curing agent is not particularly limited, and specific examples thereof include F-a, P-d (manufactured by Shikoku Kasei Co., Ltd.), and HFB2006M (manufactured by Showa Polymer Co., Ltd.). These may be used alone or in combination of two or more.

併用活性酯系硬化劑及/或氰酸酯系硬化劑與其他硬化劑作為硬化劑時,就兼顧濕式粗化步驟中絕緣層 表面之低粗度化與藉鍍敷形成之導體層之高剝離強度之觀點而言,以硬化劑整體之固體成分作為100質量份時,活性酯系硬化劑及/或氰酸酯系硬化劑較好為30~100質量份,更好為40~95質量份,又更好為50~90質量份。 When an active ester-based curing agent and/or a cyanate-based curing agent and other curing agents are used as a curing agent, the insulating layer in the wet roughening step is also considered. From the viewpoint of the low-thickness of the surface and the high peel strength of the conductor layer formed by plating, when the solid content of the entire curing agent is 100 parts by mass, the active ester-based curing agent and/or the cyanate-based curing agent It is preferably from 30 to 100 parts by mass, more preferably from 40 to 95 parts by mass, even more preferably from 50 to 90 parts by mass.

又,本發明之樹脂組成物中,就提高樹脂組成物之硬化物之機械強度或耐水性之觀點而言,全部環氧樹脂中之環氧基之合計數與全部硬化劑中之反應基之合計數之比,較好為1:0.2~1:2,更好為1:0.3~1:1.5,又更好為1:0.4~1:1。又樹脂組成物中存在之全部環氧樹脂中之環氧基之合計數係針對全部環氧樹脂,將各環氧樹脂之固體成分質量除以環氧當量之值合計而得之值,所謂全部硬化劑中之反應基之合計數係針對所有硬化劑,將各硬化劑之固體成分質量除以反應基當量之值合計而得之值。 Further, in the resin composition of the present invention, the total number of epoxy groups in the entire epoxy resin and the reactive groups in all the hardeners are from the viewpoint of improving the mechanical strength or water resistance of the cured product of the resin composition. The ratio of the total count is preferably 1:0.2 to 1:2, more preferably 1:0.3 to 1:1.5, and even more preferably 1:0.4 to 1:1. Further, the total number of epoxy groups in all the epoxy resins present in the resin composition is a value obtained by dividing the solid content of each epoxy resin by the total value of the epoxy equivalent for all the epoxy resins, so-called all The total number of the reactive groups in the hardener is a value obtained by dividing the solid content of each hardener by the total value of the reactive base equivalents for all the hardeners.

<無機填充材> <Inorganic filler>

本發明之樹脂組成物藉由進一步含有無機填充材,可降低樹脂組成物之硬化物之介電正切或熱膨脹係數。無機填充材並無特別限制,列舉為例如二氧化矽、氧化鋁、硫酸鋇、滑石、黏土、雲母粉、氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、氧化鎂、氮化硼、硼酸鋁、鈦酸鋇、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、鋯酸鋇、鋯酸鈣等。其中,以無定形二氧化矽、粉碎二氧化矽、熔融二氧化矽、結晶二氧化矽、合成二氧化矽、中空二氧化矽等二 氧化矽較佳,就進一步降低絕緣層之表面粗糙度之觀點而言更好為熔融二氧化矽、球狀二氧化矽,又更好為球狀熔融二氧化矽。該等可使用1種或組合2種以上使用。市售之球狀熔融二氧化矽列舉為Advantex(股)製之「SOC2」、「SOC1」等。 The resin composition of the present invention can further reduce the dielectric tangent or thermal expansion coefficient of the cured product of the resin composition by further containing an inorganic filler. The inorganic filler is not particularly limited and is exemplified by, for example, cerium oxide, aluminum oxide, barium sulfate, talc, clay, mica powder, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, boron nitride, boric acid. Aluminum, barium titanate, barium titanate, calcium titanate, magnesium titanate, barium titanate, titanium oxide, barium zirconate, calcium zirconate, and the like. Among them, amorphous cerium oxide, pulverized cerium oxide, molten cerium oxide, crystalline cerium oxide, synthetic cerium oxide, hollow cerium oxide, etc. The cerium oxide is preferably a molten cerium oxide, a spherical cerium oxide, and more preferably a spherical molten cerium oxide from the viewpoint of further reducing the surface roughness of the insulating layer. These may be used alone or in combination of two or more. Commercially available spherical molten cerium oxide is exemplified by "SOC2" and "SOC1" manufactured by Advantex Co., Ltd.

無機填充材之平均粒徑並無特別限制,但就可使絕緣層表面成為低粗度,且可於絕緣層表面上進行微細配線形成之觀點而言,較好為5μm以下,更好為3μm以下,又更好為2μm以下,再更好為1μm以下,又再更好為0.8μm以下,最好為0.6μm以下。另一方面,樹脂組成物為樹脂漆料時,就防止因漆料之黏度上升,使作業性降低之觀點而言,無機填充材之平均粒徑較好為0.01μm以上,更好為0.03μm以上,又更好為0.05μm以上,再更好為0.07μm以上,最好為0.1μm以上。上述無機填充材之平均粒徑可依據米氏(Mie)散射理論,以雷射繞射‧散射法測定。具體而言可藉雷射繞射散射式粒度分佈測定裝置,以體積基準作成無機填充材之粒度分佈,以其中值直徑作為平均粒徑而測定。測定樣品可較好地使用以超音波使無機填充材分散於水中而成者。至於雷射繞射散射式粒度分佈測定裝置可使用堀場製作所(股)製之LA-950等。 The average particle diameter of the inorganic filler is not particularly limited, but the surface of the insulating layer may have a low thickness and may be formed by fine wiring on the surface of the insulating layer, preferably 5 μm or less, more preferably 3 μm. Hereinafter, it is more preferably 2 μm or less, still more preferably 1 μm or less, still more preferably 0.8 μm or less, and most preferably 0.6 μm or less. On the other hand, when the resin composition is a resin paint, the average particle diameter of the inorganic filler is preferably 0.01 μm or more, more preferably 0.03 μm, from the viewpoint of improving the viscosity of the paint and reducing the workability. The above is more preferably 0.05 μm or more, still more preferably 0.07 μm or more, and most preferably 0.1 μm or more. The average particle diameter of the above inorganic filler can be measured by a laser diffraction ‧ scattering method in accordance with the Mie scattering theory. Specifically, the laser diffraction scattering type particle size distribution measuring apparatus can be used to determine the particle size distribution of the inorganic filler on a volume basis, and the median diameter is used as the average particle diameter. The measurement sample can be preferably used by dispersing an inorganic filler in water by ultrasonic waves. As for the laser diffraction scattering type particle size distribution measuring apparatus, LA-950 or the like manufactured by Horiba, Ltd. can be used.

無機填充材之含量,就降低線熱膨脹係數方面或抑制多層印刷配線板產生龜裂之方面而言,以樹脂組成物中之不揮發成分作為100質量%時,較好為30質量% 以上,更好為40質量%以上,又更好為50質量%以上,再更好為60質量%以上。另一方面,就防止硬化物變脆方面或防止剝離強度降低方面而言,無機填充材之含量較好為90質量%以下,更好為85質量%以下,又更好為80質量%以下。 The content of the inorganic filler is preferably 30% by mass in terms of reducing the linear thermal expansion coefficient or suppressing the occurrence of cracks in the multilayer printed wiring board, and when the nonvolatile content in the resin composition is 100% by mass. The above is more preferably 40% by mass or more, still more preferably 50% by mass or more, and still more preferably 60% by mass or more. On the other hand, the content of the inorganic filler is preferably 90% by mass or less, more preferably 85% by mass or less, and still more preferably 80% by mass or less in terms of preventing the cured material from becoming brittle or preventing the peeling strength from being lowered.

無機填充材較好以表面處理劑進行表面處理,具體而言更好以自胺基矽烷系偶合劑、環氧基矽烷系偶合劑、巰基矽烷系偶合劑、苯乙烯基矽烷系偶合劑、丙烯酸酯矽烷係偶合劑、異氰酸酯矽烷系偶合劑、硫醚矽烷系偶合劑、乙烯基矽烷系偶合劑、矽烷系偶合劑、有機矽氮烷化合物及鈦酸酯系偶合劑選出之1種以上之表面處理劑進行表面處理。藉此,可提高無機填充材之分散性或耐濕性。 The inorganic filler is preferably surface-treated with a surface treatment agent, and more preferably from an amino decane coupling agent, an epoxy decane coupling agent, a mercapto decane coupling agent, a styryl decane coupling agent, or acrylic acid. One or more surfaces selected from an ester decane coupling agent, an isocyanate decane coupling agent, a thioether decane coupling agent, a vinyl decane coupling agent, a decane coupling agent, an organic decazane compound, and a titanate coupling agent The treatment agent is surface treated. Thereby, the dispersibility or moisture resistance of the inorganic filler can be improved.

具體而言,作為表面處理劑列舉為3-胺基丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-胺基丙基二乙氧基甲基矽烷、N-苯基-3-胺基丙基三甲氧基矽烷、N-甲基胺基丙基三甲氧基矽烷、N-(2-胺基乙基)-3-胺基丙基三甲氧基矽烷、N-(2-胺基乙基)-3-胺基丙基二甲氧基甲基矽烷等胺基矽烷系偶合劑,3-縮水甘油氧基丙基三甲氧基矽烷、3-縮水甘油氧基丙基三乙氧基矽烷、3-縮水甘油氧基丙基甲基二乙氧基矽烷、3-縮水甘油氧基丙基(二甲氧基)甲基矽烷、縮水甘油基丁基三甲氧基矽烷、2-(3,4-環氧基環己基)乙基三甲氧基矽烷等環氧基矽烷系偶合劑,3-巰基丙基三甲氧基矽烷、3-巰基丙基三乙氧 基矽烷、3-巰基丙基甲基二甲氧基矽烷、11-巰基十一烷基三甲氧基矽烷等巰基矽烷系偶合劑,對-苯乙烯基三甲氧基矽烷等之苯乙烯基矽烷系偶合劑,3-丙烯醯氧基丙基三甲氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-甲基丙烯醯氧基丙基二甲氧基矽烷、3-甲基丙烯醯氧基丙基三乙氧基矽烷、3-甲基丙烯醯氧基丙基二乙氧基矽烷等之丙烯酸酯矽烷系偶合劑,3-異氰酸酯基丙基三甲氧基矽烷等之異氰酸酯矽烷系偶合劑,雙(三乙氧基矽烷基丙基)二硫醚、雙(三乙氧基矽烷基丙基)四硫醚等之硫醚矽烷系偶合劑,甲基三甲氧基矽烷、十八烷基三甲氧基矽烷、苯基三甲氧基矽烷、甲基丙烯醯基氧基丙基三甲氧基矽烷、咪唑基矽烷、三嗪矽烷、第三丁基三甲氧基矽烷等之矽烷系偶合劑,六甲基二矽氮烷、1,3-二乙烯基-1,1,3,3-四甲基二矽氮烷、六苯基二矽氮烷、三矽氮烷、環三矽氮烷、2,2,4,4,6,6-六甲基環三矽氮烷、八甲基環四矽氮烷、六丁基二矽氮烷、六辛基二矽氮烷、1,3-二乙基四甲基二矽氮烷、1,3-二正辛基四甲基二矽氮烷、1,3-二苯基四甲基二矽氮烷、1,3-二甲基四苯基二矽氮烷、1,3-二乙基四甲基二矽氮烷、1,1,3,3-四苯基-1,3-二甲基二矽氮烷、1,3-二丙基四甲基二矽氮烷、六甲基環三矽氮烷、二甲胺基三甲基矽氮烷、四甲基二矽氮烷等之有機矽氮烷化合物,鈦酸四正丁酯二聚物、異丙氧化鈦辛二醇、鈦酸四正丁酯、辛二醇酸鈦、二異丙氧化鈦雙(三乙醇鋁酸鹽)、二羥基鈦雙乳酸酯、二羥基雙(乳酸銨)鈦、雙 (二辛基焦磷酸酯)乙烯鈦酸酯、雙(二辛基焦磷酸酯)氧基乙酸酯鈦酸酯、三正丁氧化鈦單硬脂酸酯、鈦酸四正丁酯、鈦酸四(2-乙基己基)酯、四異丙基雙(二辛基亞磷酸酯)鈦酸酯、四辛基雙(二-十三烷基亞磷酸酯)鈦酸酯、四(2,2-二烯丙氧基甲基-1-丁基)雙(二-十三烷基)亞磷酸酯鈦酸酯、異丙基三辛醯基鈦酸酯、異丙基三枯基苯基鈦酸酯、異丙基三異硬脂醯基鈦酸酯、異丙基異硬脂醯基二丙烯酸鈦酸酯、異丙基二甲基丙烯醯基異硬脂醯基鈦酸酯、異丙基三(二辛基亞磷酸酯)鈦酸酯、異丙基十三烷基苯磺醯基鈦酸酯、異丙基參(二辛基焦磷酸酯)鈦酸酯、異丙基三(N-醯胺基乙基‧胺基乙基)鈦酸酯等之鈦酸酯系偶合劑等。該等中以胺基矽烷系偶合劑、環氧基矽烷系偶合劑、巰基矽烷系偶合劑、有機矽氮烷化合物較佳。市售品列舉為信越化學工業(股)製之「KBM403」(3-縮水甘油氧基丙基三甲氧基矽烷)、信越化學工業(股)製之「KBM803」(3-巰基丙基三甲氧基矽烷)、信越化學工業(股)製之「KBE903」(3-胺基丙基三乙氧基矽烷)、信越化學工業(股)製之「KBM573」(N-苯基-3-胺基丙基三甲氧基矽烷)、信越化學工業(股)製之「SZ-31」(六甲基二矽氮烷)等。 Specifically, as a surface treatment agent, 3-aminopropyltrimethoxydecane, 3-aminopropyltriethoxydecane, 3-aminopropyldiethoxymethyldecane, and N-benzene are listed. 3-aminopropyltrimethoxydecane, N-methylaminopropyltrimethoxydecane, N-(2-aminoethyl)-3-aminopropyltrimethoxydecane, N- Amino decane coupling agent such as (2-aminoethyl)-3-aminopropyldimethoxymethyl decane, 3-glycidoxypropyltrimethoxydecane, 3-glycidoxypropyl Triethoxy decane, 3-glycidoxypropylmethyldiethoxy decane, 3-glycidoxypropyl (dimethoxy)methyl decane, glycidyl butyl trimethoxy decane Epoxy decane coupling agent such as 2-(3,4-epoxycyclohexyl)ethyltrimethoxydecane, 3-mercaptopropyltrimethoxydecane, 3-mercaptopropyltriethoxy A mercapto decane coupling agent such as decane, 3-mercaptopropylmethyldimethoxydecane or 11-decylundecyltrimethoxydecane, or a styryl decane system such as p-styryltrimethoxydecane Coupling agent, 3-propenyloxypropyltrimethoxydecane, 3-methylpropenyloxypropyltrimethoxydecane, 3-methylpropenyloxypropyldimethoxydecane, 3-methyl An acrylate decane coupling agent such as a propylene methoxy propyl triethoxy decane, a 3-methyl propylene oxy propyl diethoxy decane, or an isocyanate such as 3-isocyanate propyl trimethoxy decane a decane coupling agent, a thioether decane coupling agent such as bis(triethoxydecylpropyl)disulfide or bis(triethoxydecylpropyl)tetrasulfide, methyltrimethoxydecane, a decane system such as octadecyltrimethoxydecane, phenyltrimethoxydecane, methacryloxypropyltrimethoxydecane, imidazolyl decane, triazine decane or tert-butyltrimethoxy decane a coupling agent, hexamethyldioxane, 1,3-divinyl-1,1,3,3-tetramethyldiazepine, hexaphenyldioxane, Indole, cyclotriazane, 2,2,4,4,6,6-hexamethylcyclotriazane, octamethylcyclotetraazane, hexabutyldioxane, hexa Dioxazane, 1,3-diethyltetramethyldiazepine, 1,3-di-n-octyltetramethyldiazepine, 1,3-diphenyltetramethyldiazoxide Alkane, 1,3-dimethyltetraphenyldiazepine, 1,3-diethyltetramethyldiazide, 1,1,3,3-tetraphenyl-1,3-dimethyl Dioxazane, 1,3-dipropyltetramethyldiazepine, hexamethylcyclotriazane, dimethylaminotrimethylguanidine, tetramethyldiazane, etc. Organic decazane compound, tetra-n-butyl titanate dimer, isopropyl isopropoxide octanediol, tetra-n-butyl titanate, titanium octoate, diisopropoxide bis(triethanol aluminate) , dihydroxy titanium dilactate, dihydroxy bis(ammonium lactate) titanium, double (dioctyl pyrophosphate) ethylene titanate, bis(dioctylpyrophosphate)oxyacetate titanate, tri-n-butoxytitanium monostearate, tetra-n-butyl titanate, titanium Tetrakis(2-ethylhexyl) acid, tetraisopropylbis(dioctylphosphite) titanate, tetraoctylbis(di-tridecylphosphite) titanate, tetra (2) ,2-diallyloxymethyl-1-butyl)bis(di-tridecyl)phosphite titanate, isopropyl trioctadecyl titanate, isopropyl tricumylphenyl titanium Acid ester, isopropyl triisostearyl decyl titanate, isopropyl isostearyl decyl diacrylate titanate, isopropyl dimethyl propylene decyl isostearyl decyl titanate, isopropyl Tris(dioctylphosphite) titanate, isopropyltridecylbenzenesulfonate titanate, isopropyl cis (dioctyl pyrophosphate) titanate, isopropyl tri A titanate coupling agent such as N-nonylaminoethylaminoethyl titanate or the like. Among these, an amino decane coupling agent, an epoxy decane coupling agent, a mercapto decane coupling agent, and an organic decazane compound are preferable. Commercially available products are "KBM403" (3-glycidoxypropyltrimethoxydecane) manufactured by Shin-Etsu Chemical Co., Ltd., and "KBM803" (3-mercaptopropyltrimethoxy) manufactured by Shin-Etsu Chemical Co., Ltd. "KBE903" (3-aminopropyltriethoxydecane) manufactured by Shin-Etsu Chemical Co., Ltd., "KBM573" manufactured by Shin-Etsu Chemical Co., Ltd. (N-phenyl-3-amino group) "propyl trimethoxy decane", "SZ-31" (hexamethyldioxane) manufactured by Shin-Etsu Chemical Co., Ltd., etc.

以表面處理劑表面處理無機填充材時之該表面處理劑之量並無特別限制,但相對於無機填充材100質量份,較好以0.05~5質量份之表面處理劑進行表面處理,更好以0.1~4質量份進行表面處理,又更好以0.2~3 質量份進行表面處理,再更好以0.3~2質量份進行表面處理。 The amount of the surface treatment agent when the inorganic filler is surface-treated with a surface treatment agent is not particularly limited, but it is preferably surface-treated with 0.05 to 5 parts by mass of the surface treatment agent per 100 parts by mass of the inorganic filler. Surface treatment with 0.1~4 parts by mass, and better 0.2~3 The parts are subjected to surface treatment, and more preferably 0.3 to 2 parts by mass.

且,以表面處理劑進行表面處理之無機填充材可測定以溶劑(例如甲基乙基酮:簡稱為MEK)洗淨處理後之無機填充材之每單位重量之碳量。此處,「無機填充材之每單位重量之碳量」係以百分率表示鍵結於無機填充材1g上之碳量(g)者。具體而言,於以表面處理劑進行表面處理之無機填充材中添加足量之MEK作為溶劑,在25℃進行5分鐘超音波洗淨。去除上澄液,使固體成分乾燥後,使用碳分析計分析固體成分,藉此可測定無機填充材之每單位重量之碳量。至於碳分析計可使用堀場製作所製之「EMIA-320V」等。 Further, the inorganic filler which has been surface-treated with a surface treatment agent can measure the amount of carbon per unit weight of the inorganic filler after washing with a solvent (for example, methyl ethyl ketone: MEK for short). Here, the "carbon amount per unit weight of the inorganic filler" means the amount (g) of carbon bonded to the inorganic filler 1g in percentage. Specifically, a sufficient amount of MEK was added as a solvent to the inorganic filler surface-treated with the surface treatment agent, and ultrasonic cleaning was performed at 25 ° C for 5 minutes. After removing the supernatant liquid and drying the solid component, the solid component is analyzed using a carbon analyzer, whereby the amount of carbon per unit weight of the inorganic filler can be measured. As for the carbon analyzer, "EMIA-320V" manufactured by Horiba, Ltd. can be used.

無機填充材之每單位重量之碳量就提高無機填充材之分散性或硬化物之濕式粗化步驟後之均方根粗糙度安定化之觀點而言,較好為0.02%以上,更好為0.05%以上,又更好為0.1%以上。另一方面,就防止樹脂漆料之熔融黏度或接著薄膜形態中之熔融黏度上升之觀點而言,較好為3%以下,更好為2%以下,又更好為1%以下。 The amount of carbon per unit weight of the inorganic filler is preferably 0.02% or more, more preferably from the viewpoint of improving the dispersibility of the inorganic filler or the root mean square roughness after the wet roughening step of the cured product. It is 0.05% or more, and more preferably 0.1% or more. On the other hand, from the viewpoint of preventing the melt viscosity of the resin paint or the melt viscosity in the film form from increasing, it is preferably 3% or less, more preferably 2% or less, still more preferably 1% or less.

樹脂組成物中含有以表面處理劑進行表面處理之無機填充材時,較好利用表面處理劑表面處理無機填充材後,添加於樹脂組成物中。該情況下,可更進一步提高無機填充材之分散性。 When the resin composition contains an inorganic filler which is surface-treated with a surface treatment agent, it is preferably added to the resin composition after surface treatment of the inorganic filler with a surface treatment agent. In this case, the dispersibility of the inorganic filler can be further improved.

以表面處理劑表面處理無機填充材時之表面 處理方法並無特別限制,列舉為乾式法或濕式法。至於乾式法係將無機填充材饋入旋轉混練機中,邊攪拌邊滴加或噴霧表面處理劑之醇溶液或水溶液後,再經攪拌,且藉由篩網進行分級。隨後,進行加熱處理使表面處理劑與無機填充材脫水縮合,藉此可獲得經表面處理之無機填充材。至於濕式法係邊攪拌無機填充材與有機溶劑之漿液邊添加表面處理劑,攪拌後,進行過濾、乾燥且以篩網進行分級。隨後,進行加熱處理使表面處理劑與無機填充材脫水縮合,藉使可獲得經表面處理之無機填充材。再者,亦可以將表面處理劑添加於樹脂組成物中之整體摻合法進行表面處理。 Surface treated with surface treatment agent for inorganic filler The treatment method is not particularly limited and is exemplified by a dry method or a wet method. As for the dry method, the inorganic filler is fed into a rotary kneading machine, and an alcohol solution or an aqueous solution of the surface treatment agent is added dropwise or sprayed with stirring, stirred, and classified by a sieve. Subsequently, heat treatment is performed to dehydrate the surface treatment agent with the inorganic filler, whereby the surface-treated inorganic filler can be obtained. As for the wet method, a surface treatment agent is added while stirring the slurry of the inorganic filler and the organic solvent, and after stirring, it is filtered, dried, and classified by a sieve. Subsequently, heat treatment is performed to dehydrate the surface treatment agent with the inorganic filler, whereby a surface-treated inorganic filler can be obtained. Further, it is also possible to carry out surface treatment by adding a surface treatment agent to the resin composition as a whole.

<硬化促進劑> <hardening accelerator>

本發明之樹脂組成物中,可藉由進一步含有硬化促進劑,而使環氧樹脂與硬化劑有效地硬化。至於硬化促進劑並無特別限制,列舉為胺系硬化促進劑、胍系硬化促進劑、咪唑系硬化促進劑、鏻系硬化促進劑等。該等可以1種使用或亦可組合2種以上使用。 In the resin composition of the present invention, the epoxy resin and the curing agent can be effectively cured by further containing a curing accelerator. The curing accelerator is not particularly limited, and examples thereof include an amine-based curing accelerator, an lanthanum-based curing accelerator, an imidazole-based curing accelerator, and an lanthanum-based curing accelerator. These may be used alone or in combination of two or more.

胺系硬化促進劑並無特別限制,列舉為三乙基胺、三丁基胺等三烷基胺,4-二甲胺基吡啶、苄基二甲基胺、2,4,6-參(二甲胺基甲基)酚、1,8-二氮雜雙環(5,4,0)-十一碳烯(以下簡稱為DBU)等胺化合物等。該等可以1種使用或亦可組合2種以上使用。 The amine-based hardening accelerator is not particularly limited, and examples thereof include trialkylamines such as triethylamine and tributylamine, 4-dimethylaminopyridine, benzyldimethylamine, and 2,4,6-gin ( An amine compound such as dimethylaminomethyl)phenol or 1,8-diazabicyclo(5,4,0)-undecene (hereinafter abbreviated as DBU). These may be used alone or in combination of two or more.

胍系硬化促進劑並無特別限制,列舉為例如 二氰二醯胺、1-甲基胍、1-乙基胍、1-環己基胍、1-苯基胍、1-(鄰-甲苯基)胍、二甲基胍、二苯基胍、三甲基胍、四甲基胍、五甲基胍、1,5,7-三氮雜雙環[4.4.0]癸-5-烯、7-甲基-1,5,7-三氮雜雙環[4.4.0]癸-5-烯、1-甲基雙胍、1-乙基雙胍、1-正丁基雙胍、1-正十八烷基雙胍、1,1-二甲基雙胍、1,1-二乙基雙胍、1-環己基雙胍、1-烯丙基雙胍、1-苯基雙胍、1-(鄰-甲苯基)雙胍等。該等可使用1種或亦可組合2種以上使用。 The lanthanide hardening accelerator is not particularly limited and is listed, for example, as Dicyanoguanamine, 1-methyl hydrazine, 1-ethyl hydrazine, 1-cyclohexyl hydrazine, 1-phenyl hydrazine, 1-(o-tolyl) fluorene, dimethyl hydrazine, diphenyl hydrazine, Trimethyl hydrazine, tetramethyl hydrazine, pentamethyl hydrazine, 1,5,7-triazabicyclo[4.4.0]non-5-ene, 7-methyl-1,5,7-triaza Bicyclo[4.4.0]non-5-ene, 1-methylbiguanide, 1-ethylbiguanide, 1-n-butylbiguanide, 1-n-octadecylbiguanide, 1,1-dimethylbiguanide, 1 , 1-diethyl biguanide, 1-cyclohexyl biguanide, 1-allyl biguanide, 1-phenylbiguanide, 1-(o-tolyl)biguanide, and the like. These may be used alone or in combination of two or more.

咪唑系硬化促進劑並無特別限制,但可列舉為2-甲基咪唑、2-十一烷基咪唑、2-十七烷基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、1-苄基-2-甲基咪唑、1-苄基-2-苯基咪唑、1-氰乙基-2-甲基咪唑、1-氰乙基-2-十一烷基咪唑、1-氰乙基-2-乙基-4-甲基咪唑、1-氰乙基-2-苯基咪唑、1-氰乙基-2-十一烷基咪唑鎓偏苯三酸鹽、1-氰乙基-2-苯基咪唑鎓偏苯三酸鹽、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-十一烷基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-乙基-4’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪異氰尿酸加成物、2-苯基咪唑異氰尿酸加成物、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑、2,3-二氫-1H-吡咯并[1,2-a]苯并咪唑、1-十二烷基-2-甲基-3-苯并咪唑鎓氯化物、2-甲基咪唑啉、2-苯基咪唑啉等咪唑化合物、及 咪唑化合物與環氧樹脂之加成物。該等可使用1種或組合2種以上使用。 The imidazole-based hardening accelerator is not particularly limited, but may be exemplified by 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, 2-ethyl- 4-methylimidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2- Methylimidazole, 1-benzyl-2-phenylimidazole, 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl-2-ethyl 4-methylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-undecylimidazolium trimellitate, 1-cyanoethyl-2-phenyl Imidazolium trimellitate, 2,4-diamino-6-[2'-methylimidazolyl-(1')]-ethyl-s-triazine, 2,4-diamino-6 -[2'-undecyl imidazolyl-(1')]-ethyl-s-triazine, 2,4-diamino-6-[2'-ethyl-4'-methylimidazolyl -(1')]-ethyl-s-triazine, 2,4-diamino-6-[2'-methylimidazolyl-(1')]-ethyl-s-triazine isocyanuric acid Adduct, 2-phenylimidazolium isocyanurate adduct, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole, 2, 3-dihydro-1H-pyrrolo[1,2-a]benzimidazole 2-methyl-1-dodecyl benzimidazolium chloride, 2-imidazoline, 2-phenyl imidazole and imidazoline compounds, and An adduct of an imidazole compound and an epoxy resin. These may be used alone or in combination of two or more.

鏻系硬化促進劑並無特別限制,列舉為三苯基膦、硼酸鏻化合物、四苯基鏻四苯基硼酸鹽、正丁基鏻四苯基硼酸鹽、四丁基鏻癸酸鹽、(4-甲基苯基)三苯基鏻硫代氰酸鹽、四苯基鏻硫代氰酸鹽、丁基三苯基鏻硫代氰酸鹽等。該等可使用1種或組合2種以上使用。 The lanthanum hardening accelerator is not particularly limited, and examples thereof include triphenylphosphine, lanthanum borate, tetraphenylphosphonium tetraphenylborate, n-butyl fluorene tetraphenylborate, tetrabutyl citrate, 4-methylphenyl)triphenylsulfonium thiocyanate, tetraphenylphosphonium thiocyanate, butyltriphenylphosphonium thiocyanate, and the like. These may be used alone or in combination of two or more.

本發明之樹脂組成物中調配硬化促進劑時,硬化促進劑以環氧樹脂與硬化劑之合計作為100質量份時,較好為0.005~1質量份之範圍,更好為0.01~0.5質量份之範圍。硬化促進劑落在該範圍內時,可更有效率地熱硬化,且亦可提高樹脂漆料之儲存安定性。 In the resin composition of the present invention, when the curing accelerator is used in an amount of 100 parts by mass in total of the epoxy resin and the curing agent, the curing accelerator is preferably in the range of 0.005 to 1 part by mass, more preferably 0.01 to 0.5 part by mass. The scope. When the hardening accelerator falls within this range, it can be thermally cured more efficiently, and the storage stability of the resin paint can also be improved.

<熱可塑性樹脂> <Thermoplastic resin>

本發明之樹脂組成物中,可藉由進而含有熱可塑性樹脂而提高硬化物之機械強度,另外亦可提高以接著薄膜之形態使用樹脂組成物時之樹脂組成物之薄膜成型能。至於熱可塑性樹脂可列舉為苯氧樹脂、聚乙烯基乙縮醛樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚醯亞胺樹脂、聚碸樹脂、聚醚碸樹脂、聚苯醚樹脂、聚碳酸酯樹脂、聚醚醚酮樹脂、聚酯樹脂,最好為苯氧樹脂、聚乙烯乙縮醛樹脂。該等熱可塑性樹脂可各別單獨使用,亦可組合2種以上使用。熱可塑性樹脂之重量平均分子量較好為8000~200000之範圍,更好為12000~100000之範圍。又本發明 中之重量平均分子量係以凝膠滲透層析(GPC)法(聚苯乙烯換算)測定。以GPC法測定之重量平均分子量具體而言可使用島津製作所(股)製之LC-9A/RID-6A作為測定裝置,使用昭和電工(股)公司製造之Shpdex K-800P/K-804L/K-804L作為管柱,使用氯仿作為移動相,在管柱溫度40℃下測定,使用標準聚苯乙烯之校正線算出。 In the resin composition of the present invention, the mechanical strength of the cured product can be improved by further containing a thermoplastic resin, and the film forming ability of the resin composition when the resin composition is used in the form of a film can be improved. The thermoplastic resin may be exemplified by a phenoxy resin, a polyvinyl acetal resin, a polyimine resin, a polyamidimide resin, a polyether quinone resin, a polyfluorene resin, a polyether oxime resin, and a poly The phenyl ether resin, the polycarbonate resin, the polyether ether ketone resin, and the polyester resin are preferably a phenoxy resin or a polyethylene acetal resin. These thermoplastic resins may be used singly or in combination of two or more. The weight average molecular weight of the thermoplastic resin is preferably in the range of 8,000 to 200,000, more preferably in the range of 12,000 to 100,000. Further invention The weight average molecular weight in the medium is measured by a gel permeation chromatography (GPC) method (in terms of polystyrene). For the weight average molecular weight measured by the GPC method, LC-9A/RID-6A manufactured by Shimadzu Corporation can be used as a measuring device, and Shpdex K-800P/K-804L/K manufactured by Showa Denko Co., Ltd. can be used. -804L was used as a column, and chloroform was used as a mobile phase, and it was measured at a column temperature of 40 ° C, and was calculated using a calibration line of standard polystyrene.

本發明之樹脂組成物中調配熱可塑性樹脂時,熱可塑性樹脂之調配率以樹脂組成物中之不揮發分作為100質量%時,較好為0.1~10質量%,更好為0.5~5質量%。熱可塑性樹脂之調配率在該範圍內時,可發揮提高樹脂組成物之薄膜成型能或硬化物之機械強度之效果,進一步抑制熔融黏度之上升,且降低濕式粗化步驟後之絕緣層表面之粗糙度。 When the thermoplastic resin is blended in the resin composition of the present invention, the blending ratio of the thermoplastic resin is preferably from 0.1 to 10% by mass, more preferably from 0.5 to 5% by mass based on the nonvolatile content of the resin composition. %. When the blending ratio of the thermoplastic resin is within this range, the film forming ability of the resin composition or the mechanical strength of the cured product can be improved, the increase in the melt viscosity can be further suppressed, and the surface of the insulating layer after the wet roughening step can be lowered. Roughness.

<其他成分> <Other ingredients>

本發明之樹脂組成物在不妨礙本發明效果之範圍內,可視需要調配其他成分。至於其他成分可列舉為如乙烯基苄基化合物、丙烯酸化合物、馬來醯亞胺化合物、嵌段異氰酸酯化合物之熱硬化性樹脂,矽粉、尼龍粉、氟化合物粉、橡膠粒子等有機填充劑,Oluben、Benton等增黏劑,聚矽氧系、氟系、高分子系消泡劑或調平劑,咪唑系、噻唑系、三唑系、矽烷偶合劑等之密著性賦予劑,酞菁‧藍、酞菁‧綠、碘‧綠、雙偶氮黃(disazo yellow)、碳黑等著色劑、氫氧化鋁、磷系化合物等難燃劑等。 The resin composition of the present invention may be blended with other components as needed within the range not impairing the effects of the present invention. The other components may, for example, be a vinyl benzyl compound, an acrylic compound, a maleic imine compound, a thermosetting resin of a blocked isocyanate compound, an organic filler such as a cerium powder, a nylon powder, a fluorine compound powder or a rubber particle. Oluben, Benton and other tackifiers, polyfluorene-based, fluorine-based, polymer-based antifoaming agents or leveling agents, imidazole-based, thiazole-based, triazole-based, decane coupling agents, etc., phthalocyanine ‧ Blue, phthalocyanine ‧ green, iodine ‧ green, disazo yellow, carbon black and other colorants, aluminum hydroxide, phosphorus compounds and other flame retardants

本發明之樹脂組成物可藉由適當混合上述成分,且視需要藉由三輥、球磨機、珠粒研磨機、砂磨機等混練手段,或者超級混練機、行星式混練機等攪拌手段混練或混合而調製。且,亦可藉由進一步將有機溶劑添加於樹脂組成物中而調製為樹脂漆料。 The resin composition of the present invention may be mixed by appropriately mixing the above components, and if necessary, by a mixing means such as a three-roller, a ball mill, a bead mill, a sand mill, or a mixing means such as a super-kneader or a planetary kneader or Mix and modulate. Further, a resin paint may be prepared by further adding an organic solvent to the resin composition.

本發明之樹脂組成物經硬化形成絕緣層時,不僅使經粗化處理(濕式粗化)後之絕緣層表面之算術平均粗糙度之值變小,亦使絕緣層表面之均方根粗糙度之值變小,可藉由鍍敷在絕緣層表面上形成具有充分剝離強度之導體層,降低硬化物之介電正切,故在多層印刷配線板之製造中,可適用作為多層印刷配線板之絕緣層用樹脂組成物。另外,本發明之樹脂組成物可適用作為用以藉鍍敷形成導體層之樹脂組成物(藉鍍敷形成導體層之多層印刷配線板之絕緣層用樹脂組成物),且更適用作為多層印刷配線板之增層用樹脂組成物。 When the resin composition of the present invention is hardened to form an insulating layer, not only the value of the arithmetic mean roughness of the surface of the insulating layer after the roughening treatment (wet roughening) is made small, but also the root mean square roughness of the surface of the insulating layer is made. The value of the degree is small, and a conductor layer having sufficient peeling strength can be formed on the surface of the insulating layer by plating to reduce the dielectric tangent of the cured product. Therefore, in the manufacture of the multilayer printed wiring board, it can be suitably used as a multilayer printed wiring board. A resin composition for the insulating layer. Further, the resin composition of the present invention can be suitably used as a resin composition for forming a conductor layer by plating (a resin composition for an insulating layer of a multilayer printed wiring board formed by plating a conductor layer), and is more suitable as a multilayer printing layer. A resin composition for layering of a wiring board.

使本發明之樹脂組成物硬化形成絕緣層,對其絕緣層表面進行粗化處理後之絕緣層表面之算術平均粗糙度(Ra值)、均方根粗糙度(Rq值)可利用後述之[藉鍍敷形成之導體層之撕離強度(剝離強度)之測定、算術平均粗糙度(Ra值)、均方根粗糙度(Rq值)之測定]中所記載之測定方法掌握。 The resin composition of the present invention is cured to form an insulating layer, and the arithmetic mean roughness (Ra value) and root mean square roughness (Rq value) of the surface of the insulating layer after roughening the surface of the insulating layer can be utilized as described later [ The measurement method described in the measurement of the tear strength (peel strength), the arithmetic mean roughness (Ra value), and the root mean square roughness (Rq value) of the conductor layer formed by plating is grasped.

絕緣層表面之算術平均粗糙度(Ra值)之上限值就形成微細配線之觀點而言,較好為350nm以下,更好為300nm以下,又更好為250nm以下,再更好為 200nm以下,又再更好為150nm以下,最好為100nm以下。絕緣層表面之算術平均粗糙度(Ra值)之下限值並無特別限制,設為10nm以上等。 The upper limit of the arithmetic mean roughness (Ra value) of the surface of the insulating layer is preferably 350 nm or less, more preferably 300 nm or less, still more preferably 250 nm or less, from the viewpoint of forming fine wiring. Below 200 nm, it is more preferably 150 nm or less, and most preferably 100 nm or less. The lower limit of the arithmetic mean roughness (Ra value) of the surface of the insulating layer is not particularly limited, and is set to 10 nm or more.

絕緣層表面之均方根粗糙度(Rq值)由於反映了絕緣層表面之局部狀態,故藉由Rq值之掌握,可確認是否為緻密且平滑之絕緣層表面,成為緻密且平滑之絕緣層表面時,展現出安定剝離強度。絕緣層表面之均方根粗糙度(Rq值)之上限值為了成為緻密且平滑之絕緣層表面,較好為500nm以下,更好為400nm以下,又更好為300nm以下,再更好為200nm以下。絕緣層表面之均方根粗糙度(Rq值)之下限值就使剝離強度安定之觀點而言,較好為20nm以上,更好為40nm以上。 Since the root mean square roughness (Rq value) of the surface of the insulating layer reflects the local state of the surface of the insulating layer, it is confirmed by the Rq value whether it is a dense and smooth insulating layer surface, and becomes a dense and smooth insulating layer. On the surface, it exhibits a stable peel strength. The upper limit of the root mean square roughness (Rq value) of the surface of the insulating layer is preferably 500 nm or less, more preferably 400 nm or less, still more preferably 300 nm or less, in order to obtain a dense and smooth insulating layer surface. Below 200 nm. The lower limit of the root mean square roughness (Rq value) of the surface of the insulating layer is preferably 20 nm or more, and more preferably 40 nm or more from the viewpoint of stability of the peeling strength.

使本發明之樹脂組成物硬化形成絕緣層,使絕緣層表面經粗化處理,再藉鍍敷形成之導體層與絕緣層之剝離強度可利用後述之[鍍敷導體層之撕離強度(剝離強度)之測定、算術平均粗糙度(Ra值)、均方根粗糙度(Rq值)之測定]中所記載之測定方法掌握。 The resin composition of the present invention is cured to form an insulating layer, and the surface of the insulating layer is roughened, and the peeling strength of the conductor layer and the insulating layer formed by plating can be utilized as described later [Tear strength of the plated conductor layer (peeling off) The measurement method described in the measurement of the strength, the arithmetic mean roughness (Ra value), and the root mean square roughness (Rq value) is grasped.

剝離強度為使絕緣層與導體層充分密著,較好為0.37kgf/cm以上,更好為0.4kgf/cm以上,又更好為0.43kgf/cm以上。剝離強度之上限值愈高愈好,並無特別限制,一般成為1.5kgf/cm以下、1.2kgf/cm以下、1.0kgf/cm以下、0.8kgf/cm以下等。 The peeling strength is such that the insulating layer and the conductor layer are sufficiently adhered, and is preferably 0.37 kgf/cm or more, more preferably 0.4 kgf/cm or more, and still more preferably 0.43 kgf/cm or more. The upper limit of the peel strength is preferably as high as possible, and is not particularly limited, and is generally 1.5 kgf/cm or less, 1.2 kgf/cm or less, 1.0 kgf/cm or less, and 0.8 kgf/cm or less.

本發明之樹脂組成物之硬化物之介電正切可藉由後述之[介電正切之測定]中所記載之測定方法掌握。 介電正切就減輕電訊號損失之觀點而言,較好為0.007以下,更好為0.006以下。介電正切以愈高愈好,並無特別之下限值,但一般為0.001以上,0.002以上等。 The dielectric tangent of the cured product of the resin composition of the present invention can be grasped by the measurement method described in [Measurement of Dielectric Tangent] which will be described later. The dielectric tangent is preferably 0.007 or less, more preferably 0.006 or less, from the viewpoint of reducing the loss of the electric signal. The dielectric tangent is as high as possible, and there is no particular lower limit, but it is generally 0.001 or more, 0.002 or more, and the like.

本發明之樹脂組成物之形態並無特別限制,可以接著薄膜、預浸片等之片狀層合材料、電路基板(層合板用途、多層印刷配線板用途等)加以應用。本發明之樹脂組成物亦可作為樹脂漆料塗佈於電路基板上形成絕緣層,但工業上一般較好以接著薄膜、預浸體等片狀層合材料之形態使用。樹脂組成物之軟化點就片狀層合材料之層合性之觀點而言較好為40~150℃。 The form of the resin composition of the present invention is not particularly limited, and can be applied to a sheet-like laminate such as a film or a prepreg, or a circuit board (for laminate use, multilayer printed wiring board use, etc.). The resin composition of the present invention may be applied as a resin paint to a circuit board to form an insulating layer. However, it is generally industrially used in the form of a sheet-like laminate such as a film or a prepreg. The softening point of the resin composition is preferably from 40 to 150 ° C from the viewpoint of the lamination property of the sheet-like laminate.

<片狀層合材料> <Sheet laminate> (接著薄膜) (following the film)

本發明之接著薄膜可藉本技藝者公知之方法,例如,將樹脂組成物溶解於有機溶劑中調製樹脂漆料,使用模嘴塗佈器等,將該樹脂漆料塗佈於支撐體上,再經加熱,或者以熱風吹拂等將有機溶劑乾燥,形成樹脂組成物層之方法而製造。 The adhesive film of the present invention can be prepared by dissolving a resin composition in an organic solvent to prepare a resin paint, and applying the resin paint to a support using a die coater or the like, for example, by a method known to those skilled in the art. It is produced by heating or drying the organic solvent by hot air blowing or the like to form a resin composition layer.

有機溶劑列舉為例如丙酮、甲基乙基酮、環己酮等酮類,乙酸乙酯、乙酸丁酯、溶纖素乙酸酯、丙二醇單甲基醚乙酸酯、卡必醇乙酸酯等乙酸酯類,溶纖素、丁基卡必醇等卡必醇類,甲苯、二甲苯等芳香族烴類,二甲基甲醯胺、二甲基乙醯胺、N-甲基吡咯啶酮等醯胺系溶劑等。有機溶劑亦可組合2種以上使用。 The organic solvent is exemplified by a ketone such as acetone, methyl ethyl ketone or cyclohexanone, ethyl acetate, butyl acetate, fibrin acetate, propylene glycol monomethyl ether acetate, carbitol acetate. Acetate, cellulase, butyl carbitol, etc., aromatic hydrocarbons such as toluene and xylene, dimethylformamide, dimethylacetamide, N-methylpyrrolidine A guanamine-based solvent such as a ketone. The organic solvent may be used in combination of two or more kinds.

乾燥條件並無特別限制。例如,以使有機溶劑對樹脂組成物層之含量成為10質量%以下,較好成為5質量%以下之方式使樹脂漆料乾燥。樹脂漆料中之有機溶劑量雖因有機溶劑之沸點而有不同,但例如藉由使含有30~60質量%之有機溶劑之樹脂漆料在50~150℃乾燥3~10分鐘左右,可形成樹脂組成物層。 The drying conditions are not particularly limited. For example, the resin paint is dried so that the content of the organic solvent to the resin composition layer is 10% by mass or less, preferably 5% by mass or less. Although the amount of the organic solvent in the resin paint varies depending on the boiling point of the organic solvent, for example, by drying the resin paint containing 30 to 60% by mass of the organic solvent at 50 to 150 ° C for about 3 to 10 minutes, it can be formed. Resin composition layer.

接著薄膜中形成之樹脂組成物層之厚度較好為導體層之厚度以上。電路基板所具有之導體層之厚度通常為5~70μm之範圍,故樹脂組成物層較好具有10~100μm之厚度。就薄膜化之觀點而言,更好為15~80μm。 The thickness of the resin composition layer formed in the film is preferably more than the thickness of the conductor layer. The thickness of the conductor layer of the circuit board is usually in the range of 5 to 70 μm, so the resin composition layer preferably has a thickness of 10 to 100 μm. From the viewpoint of film formation, it is preferably from 15 to 80 μm.

支撐體列舉為聚乙烯、聚丙烯、聚氯化乙烯等聚烯烴之薄膜、聚對苯二甲酸乙二酯(以下有時簡稱為「PET」)、聚萘二甲酸乙二酯等聚酯之薄膜,聚碳酸酯薄膜、聚醯亞胺薄膜等各種塑膠薄膜。且亦可使用脫模紙或銅箔、鋁箔等之金屬箔等作為支撐體。其中,支撐體就泛用性之觀點而言,以塑膠膜較佳,更好為聚對苯二甲酸乙二酯薄膜。支撐體及後述之保護薄膜亦可施以消光處理、電暈處理等表面處理。且,亦可藉聚矽氧樹脂系脫模劑、醇酸樹脂系脫模劑、氟樹脂系脫模劑等脫模劑對支撐體及後述之保護薄膜施以脫模處理。 The support is exemplified by a film of a polyolefin such as polyethylene, polypropylene or polyvinyl chloride, a polyethylene terephthalate (hereinafter sometimes abbreviated as "PET"), or a polyester such as polyethylene naphthalate. Film, polycarbonate film, polyimide film and other plastic film. Further, a metal foil such as release paper, copper foil, or aluminum foil may be used as the support. Among them, the support is preferably a plastic film from the viewpoint of versatility, and more preferably a polyethylene terephthalate film. The support and the protective film described later may be subjected to a surface treatment such as matting treatment or corona treatment. Further, the support and a protective film to be described later may be subjected to a release treatment by a release agent such as a polyoxymethylene resin release agent, an alkyd resin release agent, or a fluororesin release agent.

支撐體之厚度並無特別限制,較好為10~150μm,更好為25~50μm。 The thickness of the support is not particularly limited, and is preferably from 10 to 150 μm, more preferably from 25 to 50 μm.

樹脂組成物層之未密著支撐體之面可進一步層合與支撐體相同之保護薄膜。保護薄膜之厚度並無特別 限制,但可為例如1~40μm。藉由層合保護薄膜,可防止於樹脂組成物層表面附著塵埃或傷痕。如上述般形成之接著薄膜亦可捲繞成輥狀貯存。 The surface of the resin composition layer which is not adhered to the support may be further laminated with the same protective film as the support. The thickness of the protective film is not special Limit, but can be, for example, 1 to 40 μm. By laminating the protective film, it is possible to prevent dust or scratches from adhering to the surface of the resin composition layer. The film formed as described above may also be wound into a roll for storage.

(預浸片) (prepreg)

本發明之預浸片可利用熱熔融法或溶劑法將本發明之樹脂組成物含浸於薄片狀補強基材中,藉由加熱半硬化而製造。亦即,可成為使本發明之樹脂組成物含浸於薄片狀補強基材中之狀態之預浸片。薄片狀補強基材可使用例如由玻璃布或芳醯胺纖維等之作為預浸片用纖維常用之纖維所成者。該預浸片較好為設置於支撐體上之構成。 The prepreg of the present invention can be produced by impregnating the resin composition of the present invention into a sheet-like reinforcing substrate by a hot melt method or a solvent method, and heating and semi-curing. In other words, it can be a prepreg sheet in a state in which the resin composition of the present invention is impregnated into a sheet-like reinforcing substrate. As the sheet-like reinforcing substrate, for example, a glass cloth or an arylamine fiber or the like which is commonly used as a fiber for prepreg sheets can be used. The prepreg is preferably configured to be disposed on a support.

熱熔融法為不使樹脂組成物溶解於有機溶劑中,而是暫時塗佈於支撐體上,或者將其層合於薄片狀補強基材上、或以模嘴塗佈直接塗佈於薄片狀補強基材上,而製造預浸片之方法。溶劑法係與接著薄膜同樣使樹脂溶解於有機溶劑中,調製樹脂漆料,將薄片狀補強基材浸漬於該樹脂漆料中,使樹脂漆料含浸於薄片狀補強基材中,隨後乾燥之方法。另外,可藉由在加熱、加壓條件下,將接著薄膜連續地熱層合於薄片狀補強基材之兩面而調製。支撐體或保護薄膜亦可與接著薄膜同樣使用。 The hot melt method is not applied to the organic solvent in the organic solvent, but is temporarily applied to the support, or laminated on the sheet-like reinforcing substrate, or directly coated on the sheet by the nozzle coating. A method of making a prepreg by reinforcing the substrate. The solvent method dissolves the resin in an organic solvent in the same manner as the adhesive film, prepares a resin paint, immerses the flaky reinforcing substrate in the resin paint, and impregnates the resin paint in the flaky reinforcing substrate, followed by drying. method. Further, it can be prepared by continuously laminating the subsequent film on both sides of the sheet-like reinforcing substrate under heating and pressurization conditions. The support or protective film can also be used in the same manner as the adhesive film.

<使用薄片狀層合材料之多層印刷配線板> <Multilayer Printed Wiring Board Using Sheet Laminates>

接著,說明使用如上述製造之薄片狀層合材料製造多層印刷配線板方法之一例。 Next, an example of a method of manufacturing a multilayer printed wiring board using the sheet-like laminate produced as described above will be described.

首先,使用真空層合機將薄片狀層合材料層合(laminate)於電路基板之一面或兩面上(層合步驟)。電路基板中所用之基板列舉為例如玻璃環氧基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚苯醚基板等。又,此處所謂電路基板係指於如上述基板之一面或兩面上形成經圖型加工之導體層(電路)者。且在交互層合導體層與絕緣層而成之多層印刷配線板中,使該多層印刷配線板之最外層之一面或兩面成為經圖型加工之導體層(電路)者亦包含於此處所稱之電路基板中。且導體層表面亦可預先施以黑化處理、銅蝕刻等粗化處理。 First, a sheet laminate is laminated on one or both sides of a circuit board using a vacuum laminator (laminating step). The substrate used in the circuit board is exemplified by, for example, a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, a thermosetting polyphenylene ether substrate, or the like. Here, the circuit board refers to a conductor layer (circuit) formed by patterning on one surface or both surfaces of the substrate. In the multilayer printed wiring board in which the conductor layer and the insulating layer are alternately laminated, the one or both sides of the outermost layer of the multilayer printed wiring board are referred to as a patterned conductor layer (circuit). In the circuit board. Further, the surface of the conductor layer may be subjected to a roughening treatment such as blackening treatment or copper etching.

上述層合步驟中,薄片狀層合材料具有保護膜時,在去除該保護薄膜後,視需要預加熱薄片狀層合材料及電路基板,且邊加壓及加熱薄片狀層合材料邊層合電路基板。本發明之薄片狀層合材料中,較好使用以真空層合法在減壓下層合於電路基板上之方法。層合之條件並無特別限制,較好壓著溫度(層合溫度)設為較好之70~140℃、壓著壓力(層合壓力)較好設為1~11kgf/cm2(9.8×104~107.9×104N/m2),壓著時間(層合時間)較好設為5~180秒,在空氣壓20mmHg(26.7hPa)以下之減壓下層合。另外,層合方法可為批式亦可為使用輥之連續式。真空層合可使用市售之真空層合機進行。市售之真空層合機可列舉出例如Nichigo Morton(股)製之真空塗佈機、名機製作所(股)製之真空加壓式層合機、日立工業 (股)製之滾筒式乾式塗佈機、日立AIC(股)製之真空層合機等。 In the laminating step, when the sheet-like laminate material has a protective film, after removing the protective film, the sheet-like laminate material and the circuit substrate are preheated as needed, and the laminate is laminated while pressing and heating the sheet-like laminate material. Circuit board. In the sheet-like laminate of the present invention, a method of laminating on a circuit board under reduced pressure by vacuum lamination is preferably used. The conditions for lamination are not particularly limited, and the pressing temperature (laminating temperature) is preferably 70 to 140 ° C, and the pressing pressure (laminating pressure) is preferably 1 to 11 kgf/cm 2 (9.8 ×). 10 4 to 107.9 × 10 4 N/m 2 ), the pressing time (lamination time) is preferably 5 to 180 seconds, and the pressure is laminated under a reduced pressure of 20 mmHg (26.7 hPa) or less. In addition, the lamination method may be a batch type or a continuous type using a roll. Vacuum lamination can be carried out using a commercially available vacuum laminator. Commercially available vacuum laminating machines include, for example, a vacuum coating machine manufactured by Nichigo Morton Co., Ltd., a vacuum pressure laminating machine manufactured by a famous machine manufacturer, and a drum type dry coating manufactured by Hitachi Industrial Co., Ltd. Cloth machine, vacuum laminator made by Hitachi AIC (share).

將薄片狀層合材料層合於電路基板上後,冷卻至室溫左右後,於應剝離支撐體時,剝離支撐體,且使樹脂組成物熱硬化形成硬化物,藉此於電路基板上形成絕緣層。熱硬化條件只要依據樹脂組成物中之樹脂成分之種類、含量適當選擇即可,但較好在150℃~220℃歷時20分鐘~180分鐘,更好在160℃~210℃歷時30~120分鐘之範圍內選擇。形成絕緣層後,在硬化前不剝離支撐體之情況下,亦可視需要於硬化後剝離支撐體。 After laminating the sheet-like laminate material on the circuit board, after cooling to room temperature, when the support is peeled off, the support is peeled off, and the resin composition is thermally cured to form a cured product, thereby forming on the circuit board. Insulation. The heat curing condition may be appropriately selected depending on the type and content of the resin component in the resin composition, but it is preferably from 150 ° C to 220 ° C for 20 minutes to 180 minutes, more preferably from 160 ° C to 210 ° C for 30 to 120 minutes. Choose within the range. After the insulating layer is formed, in the case where the support is not peeled off before the hardening, the support may be peeled off after hardening as necessary.

此外,亦可使用真空加壓機將薄片狀層合材料層合於電路基板之一面或兩面上。減壓下進行加熱及加壓之層合步驟可使用一般之真空熱壓機進行。例如,可藉由自支撐體側加壓經加熱之SUS板等金屬板而進行。加壓條件通常係使減壓度成為1×10-2MPa以下,較好成為1×10-3MPa以下之減壓下。加熱及加壓可藉1階段進行,但就抑制樹脂滲出之觀點而言較好分成2階段以上之條件進行。例如,較好在溫度設為70~150℃,壓力設為1~15kgf/cm2之範圍進行第1階段之加壓,在溫度設為150~200℃,壓力設為1~40kgf/cm2之範圍進行第2階段之加壓。各階段較好將時間設為30~120分鐘而進行。藉由如此使樹脂組成物熱硬化可於電路基板上形成絕緣層。市售之真空熱壓機列舉為例如MNPC-V-750-5-200(名機製作所(股)製)、VH1-1603(北川精機(股)製)等。 Further, the sheet-like laminate may be laminated on one or both sides of the circuit board using a vacuum press. The laminating step of heating and pressurizing under reduced pressure can be carried out using a general vacuum hot press. For example, it can be performed by pressurizing a metal plate such as a heated SUS plate from the side of the support. The pressurization condition is usually such that the degree of pressure reduction is 1 × 10 -2 MPa or less, and preferably under reduced pressure of 1 × 10 -3 MPa or less. Heating and pressurization can be carried out in one stage, but it is preferably carried out in two or more stages from the viewpoint of suppressing resin bleeding. For example, it is preferred to carry out the first-stage pressurization in a range of a temperature of 70 to 150 ° C and a pressure of 1 to 15 kgf/cm 2 , and the temperature is set to 150 to 200 ° C, and the pressure is set to 1 to 40 kgf / cm 2 . The range is pressurized in the second stage. It is preferable to set the time to 30 to 120 minutes in each stage. The insulating layer can be formed on the circuit substrate by thermally hardening the resin composition in this manner. Commercially available vacuum hot presses are exemplified by, for example, MNPC-V-750-5-200 (manufactured by Nago Seiki Co., Ltd.), VH1-1603 (manufactured by Kitagawa Seiki Co., Ltd.), and the like.

接著,對電路基板上形成之絕緣層進行開孔加工,形成穿孔、通孔。開孔加工可藉例如鑽孔機、雷射、電漿等習知手段,且視需要可組合該等手段進行,但最一般之方法係以二氧化碳氣體雷射、YAG雷射等雷射進行之開孔加工。開孔加工前未剝離支撐體之情況,亦可在開孔加工後剝離支撐體。 Next, the insulating layer formed on the circuit substrate is subjected to a hole drilling process to form a through hole and a through hole. The drilling process can be carried out by conventional means such as drilling machine, laser, plasma, etc., and can be combined as needed, but the most common method is to perform lasers such as carbon dioxide gas laser and YAG laser. Hole processing. In the case where the support is not peeled off before the hole processing, the support may be peeled off after the hole processing.

接著,對絕緣層表面進行粗化處理。乾式粗化處理之方法列舉為電漿處理等,濕式粗化處理之方法列舉為依序以膨潤液之膨潤處理、以氧化劑之粗化處理及以中和液之中和處理之順序進行之方法。濕式粗化處理時,基於可一面在絕緣層表面形成凹凸之投錨,一面去除穿孔內之膠渣而言係較佳。利用膨潤液之膨潤處理係在50~80℃將絕緣層浸漬於膨潤液中5~20分鐘(較好於55~70℃浸漬8~15分鐘)而進行。至於膨潤液列舉為鹼性溶液、界面活性劑溶液等,較好為鹼性溶液,該鹼性溶液列舉為例如氫氧化鈉溶液、氫氧化鉀溶液等。市售之膨潤液可列舉出例如日本ATOTECH(股)製之Swelling Dip Securiganth P、Swelling Dip Securiganth SBU等。利用氧化劑之粗化處理係在60~80℃使絕緣層浸漬於氧化劑溶液中10~30分鐘(較好在70~80℃浸漬15~25分鐘)而進行。至於氧化劑可列舉出例如將過錳酸鉀或過錳酸鈉溶解於氫氧化鈉之水溶液中而成之鹼性過錳酸溶液、重鉻酸鹽、臭氧、過氧化氫/硫酸、硝酸等。此外,鹼性過錳酸溶液中之過錳酸鹽濃度較好設為5~10重量%。市售之氧 化劑列舉為例如日本ATOTECH(股)製之Concentrate Compact CP、Doesing Solution Securiganth P等鹼性過錳酸溶液。利用中和液之中和處理係在30~50℃下浸漬於中和液中3~10分鐘(較好在35~45℃浸漬3~8分鐘)而進行。中和液較好為酸性水溶液,市售品列舉為日本ATOTECH(股)製之Reduction Solution Securiganth P。 Next, the surface of the insulating layer is roughened. The method of dry roughening treatment is exemplified by plasma treatment, etc., and the method of wet roughening treatment is exemplified by sequential swelling treatment of swelling liquid, roughening treatment with oxidizing agent, and neutralization treatment in the order of neutralization liquid. method. In the wet roughening treatment, it is preferable to remove the slag in the perforation based on the anchoring which can form irregularities on the surface of the insulating layer. The swelling treatment by the swelling liquid is carried out by immersing the insulating layer in the swelling liquid at 50 to 80 ° C for 5 to 20 minutes (preferably, immersion for 8 to 15 minutes at 55 to 70 ° C). The swelling liquid is exemplified by an alkaline solution, a surfactant solution, etc., and is preferably an alkaline solution, which is exemplified by, for example, a sodium hydroxide solution, a potassium hydroxide solution or the like. Commercially available swellable liquids include, for example, Swelling Dip Securiganth P, Swelling Dip Securiganth SBU, etc., manufactured by ATOTECH Co., Ltd., Japan. The roughening treatment by the oxidizing agent is carried out by immersing the insulating layer in the oxidizing agent solution at 60 to 80 ° C for 10 to 30 minutes (preferably, immersing at 70 to 80 ° C for 15 to 25 minutes). The oxidizing agent may, for example, be an alkaline permanganic acid solution, dichromate, ozone, hydrogen peroxide/sulfuric acid, nitric acid or the like obtained by dissolving potassium permanganate or sodium permanganate in an aqueous solution of sodium hydroxide. Further, the permanganate concentration in the alkaline permanganic acid solution is preferably set to 5 to 10% by weight. Commercial oxygen The chemical agent is exemplified by an alkaline permanganic acid solution such as Concentrate Compact CP or Doesing Solution Securiganth P manufactured by ATOTECH Co., Ltd., Japan. The neutralization solution and the treatment system are immersed in the neutralization solution at 30 to 50 ° C for 3 to 10 minutes (preferably at 35 to 45 ° C for 3 to 8 minutes). The neutralizing liquid is preferably an acidic aqueous solution, and the commercial product is listed as Reduction Solution Securiganth P manufactured by ATOTECH Co., Ltd., Japan.

接著,利用乾式鍍敷或濕式鍍敷於絕緣層上形成導體層。乾式鍍敷可使用蒸鍍、濺鍍、離子電鍍等習知方法。濕式鍍敷列舉為組合無電解鍍敷與電解鍍敷形成導體層之方法,形成與導體層相反圖型之鍍敷阻劑,且僅以無電解鍍敷形成導體層之方法等。隨後之形成圖型之方法可使用例如本技藝者習知之減去法、半加成法等,重複複數次之上述一連串步驟,多段層合增層而形成多層印刷配線板。本發明之樹脂組成物經硬化、粗化處理後,由於為低粗度、高剝離強度,故可適用作為多層印刷配線板之增層。 Next, a conductor layer is formed on the insulating layer by dry plating or wet plating. Dry plating can be carried out by a conventional method such as vapor deposition, sputtering, or ion plating. The wet plating is a method in which a conductor layer is formed by combining electroless plating and electrolytic plating, a plating resist having a pattern opposite to that of the conductor layer is formed, and a conductor layer is formed only by electroless plating. Subsequent methods of forming the pattern may be carried out by repeating the above-described series of steps, for example, by a subtractive method, a semi-additive method, or the like as known to those skilled in the art, and multi-layer lamination is performed to form a multilayer printed wiring board. Since the resin composition of the present invention is subjected to curing and roughening treatment, it has a low thickness and a high peel strength, and thus can be suitably used as a build-up layer of a multilayer printed wiring board.

<半導體裝置> <semiconductor device>

藉由使用本發明之多層印刷配線板可製造半導體裝置。亦即,該半導體裝置包含本發明之多層印刷配線板。藉由將半導體晶片安裝於本發明之多層印刷配線板之導通部位,可製造半導體裝置。所謂「導通部位」為「多層印刷配線板中傳導電訊號之部位」,其位置可為表面,亦可為埋入之部位均無妨。且,半導體晶片只要是以半導體為 材料之電性電路元件即無特別限制。 A semiconductor device can be manufactured by using the multilayer printed wiring board of the present invention. That is, the semiconductor device comprises the multilayer printed wiring board of the present invention. A semiconductor device can be manufactured by mounting a semiconductor wafer on a conduction portion of the multilayer printed wiring board of the present invention. The "conduction portion" is "a portion where a conductive signal is transmitted in a multilayer printed wiring board", and the position thereof may be a surface or a buried portion. Moreover, the semiconductor wafer is only a semiconductor The electrical circuit component of the material is not particularly limited.

製造本發明之半導體裝置時之半導體晶片之安裝方法只要可使半導體晶片發揮有效功能即無特別限制。具體而言,為打線黏合安裝方法、覆晶安裝方法、利用無凸塊式增層(Bumpless Build Up Layer,BBUL)之安裝方法、利用異向性導電薄膜(ACF)之安裝方法、利用非導電性薄膜(NCF)之安裝方法等。 The method of mounting the semiconductor wafer in the manufacture of the semiconductor device of the present invention is not particularly limited as long as the semiconductor wafer can function effectively. Specifically, it is a wire bonding mounting method, a flip chip mounting method, a bumpless Build Up Layer (BBUL) mounting method, an anisotropic conductive film (ACF) mounting method, and a non-conductive method. Installation method of the film (NCF), etc.

[實施例] [Examples]

以下,使用實施例及比較例更詳細說明本發明,但該等並不意指限制本發明。又,以下之記載中,「份」意指「質量份」。 Hereinafter, the present invention will be described in more detail by way of examples and comparative examples, but these are not intended to limit the invention. In the following description, "parts" means "parts by mass".

<測定方法‧評價方法> <Measurement method ‧ Evaluation method>

首先針對測定方法‧評價方法加以說明。 First, the measurement method and evaluation method will be described.

[藉鍍敷形成之導體層之撕離強度(剝離強度)之測定、算術平均粗糙度(Ra值)、均方根粗糙度(Rq值)測定] [Measurement of tear strength (peel strength) of conductor layer formed by plating, arithmetic mean roughness (Ra value), root mean square roughness (Rq value)] (1)層合板之底層處理 (1) Underlayer treatment of laminate

將形成內層電路之玻璃布基材環氧樹脂兩面貼銅層合板(銅箔厚度18μm,殘銅率60%,基板厚0.3mm,松下電工(股)製R5715ES)之兩面浸漬於MEC(股)製之CZ8100中,進行銅箔表面之粗化處理。 The glass cloth substrate on which the inner layer circuit is formed is immersed in the MEC on both sides of the copper-clad laminate (copper foil thickness 18 μm, residual copper ratio 60%, substrate thickness 0.3 mm, Matsushita Electric Co., Ltd. R5715ES) In the CZ8100 manufactured by the method, the surface of the copper foil is roughened.

(2)接著薄膜之層合步驟 (2) subsequent lamination step of the film

使用批式真空加壓層合機MVLP-500(名機製作所(股)製之商品名),將各實施例及比較例中製作之接著薄膜層合於層合板之兩面上。層合步驟係減壓30秒使氣壓成為13hPa以下,隨後30秒中,在100℃、壓力0.74MP下予以壓製而進行。 The adhesive film produced in each of the examples and the comparative examples was laminated on both faces of the laminate using a batch vacuum pressure laminator MVLP-500 (trade name manufactured by Nikko Seisakusho Co., Ltd.). The laminating step was carried out under reduced pressure for 30 seconds to bring the gas pressure to 13 hPa or less, followed by pressing at 100 ° C and a pressure of 0.74 MP for 30 seconds.

(3)樹脂組成物之硬化 (3) Hardening of resin composition

自經層合之接著薄膜剝離PET膜,在170℃、30分鐘之硬化條件下使樹脂組成物硬化而形成絕緣層。 The PET film was peeled off from the laminated film, and the resin composition was cured at 170 ° C for 30 minutes to form an insulating layer.

(4)粗化處理 (4) roughening treatment

將形成絕緣層之層合板在60℃下浸漬於膨潤液的日本ATOTECH(股)製之含有二乙二醇單丁基醚之Swelling Dip Securiganth P中10分鐘,接著在80℃下浸漬於作為粗化液之日本ATOTECH(股)之CONCENTRATE COMPACT P(KMnO4:60g/L,NaOH:40g/L之水溶液)中20分鐘,最後在40℃下浸漬於作為中和液之日本ATOTECH(股)製之REDUCTION SOLUTION SECURIGANTH P中5分鐘。以該粗化處理後之層合板作為樣品A。 The laminate in which the insulating layer was formed was immersed in Swelling Dip Securiganth P containing diethylene glycol monobutyl ether manufactured by Atotech Co., Ltd., Japan, at 60 ° C for 10 minutes, and then immersed at 80 ° C as a coarse layer. Chemical solution of Japan ATOTECH Co., Ltd., CONCENTRATE COMPACT P (KMnO 4 : 60 g / L, NaOH: 40 g / L aqueous solution) for 20 minutes, and finally immersed in 40 ° C as a neutralizing liquid in Japan ATOTECH (share) system 5 minutes in REDUCTION SOLUTION SECURIGANTH P. The laminate after the roughening treatment was used as the sample A.

(5)利用半加成製程進行之鍍敷 (5) Plating using a semi-additive process

將樣品A浸漬於含有PdCl2之無電解鍍敷用溶液中,接著浸漬於無電解銅鍍敷液中。在150℃加熱30分鐘進 行退火處理後,形成蝕刻阻劑,利用蝕刻形成圖型後,進行硫酸銅電解鍍敷,形成30μm厚之導體層。接著,在180℃進行退火處理60分鐘。以該層合板作為樣品B。 Sample A was immersed in a solution for electroless plating containing PdCl 2 and then immersed in an electroless copper plating solution. After annealing at 150 ° C for 30 minutes, an etching resist was formed, and a pattern was formed by etching, and then copper sulfate electrolytic plating was performed to form a conductor layer having a thickness of 30 μm. Next, annealing treatment was performed at 180 ° C for 60 minutes. The laminate was used as sample B.

(6)算術平均粗糙度(Ra值)、均方根粗糙度(Rq值)之測定 (6) Determination of arithmetic mean roughness (Ra value) and root mean square roughness (Rq value)

針對樣品A,使用非接觸型表面粗糙度計(VEECO儀器公司製造之WYKO NT3300),利用VSI接觸模式、50倍透鏡,將測定範圍設為121μm×92μm所得之數值求得Ra值、Rq值。接著,分別求得10點之平均值,以其作為測定值。 For the sample A, a non-contact surface roughness meter (WYKO NT3300 manufactured by VEECO Instruments Co., Ltd.) was used, and the Ra value and the Rq value were determined using a VSI contact mode and a 50-fold lens, and the measurement range was set to 121 μm × 92 μm. Next, an average value of 10 points was obtained and used as a measured value.

(7)藉鍍敷形成之導體層之撕離強度(剝離強度)之測定 (7) Determination of tear strength (peel strength) of a conductor layer formed by plating

針對樣品B之導體層,於包圍寬度10mm、長度100mm之部分切出切口,剝離其一端且夾具(TSI股份有限公司之AUTOCOM型試驗機AC-50C-SL)捏住,在室溫中,測定以50mm/分鐘之速度朝垂直方向撕離35mm時之荷重(kgf/cm)。 For the conductor layer of sample B, a slit was cut out at a portion surrounded by a width of 10 mm and a length of 100 mm, and one end thereof was peeled off, and a jig (AUTOCOM type test machine AC-50C-SL of TSI Co., Ltd.) was pinched and measured at room temperature. The load (kgf/cm) when peeling 35 mm in the vertical direction at a speed of 50 mm/min.

[介電正切之測定] [Measurement of dielectric tangent]

在190℃使各實施例及各比較例中獲得之接著薄膜熱硬化90分鐘,剝離PET膜獲得薄片狀之硬化物。將其硬化物切斷成寬2mm、長80mm之試驗片,使用關東應用電 子開發(股)製之空洞共振器振動法介電率測定裝置CP521及Agilent Technology(股)製之網路分析儀E8362B,以空洞共振法藉測定頻率5.8HGz進行介電正切(tanδ)之測定。針對2片試驗片進行測定,算出平均值。 The film obtained in each of the examples and the comparative examples was thermally cured at 190 ° C for 90 minutes, and the PET film was peeled off to obtain a flaky cured product. The cured product was cut into test pieces of 2 mm in width and 80 mm in length, and used in Kanto. Sub-development (share) cavity resonator vibrating method dielectric ratio measuring device CP521 and Agilent Technology (share) network analyzer E8362B, using dielectric resonance method to measure dielectric tangent (tan δ) by measuring frequency 5.8HGz . The measurement was performed on two test pieces, and the average value was calculated.

(實施例1) (Example 1)

使液狀雙酚A型環氧樹脂(環氧當量165,新日鐵化學(股)製之「ZX1059」)10份、萘基茀型環氧樹脂(環氧當量300,大阪氣體化學(股)製之「CG-500」)10份於甲基乙基酮(以下簡稱為「MEK」)5份、環己酮5份中邊攪拌邊加熱溶解。於其中,混合活性酯化合物(DIC(股)製之「HPC8000-65T」,活性酯當量223,固體成分65%之甲苯溶液)30份、硬化促進劑(廣榮化學工業(股)製之「4-二甲胺基吡啶」)0.3份、球形二氧化矽(平均粒徑0.5μm,經苯基胺基矽烷處理之「SO-C2」,Adventex(股)製,每單位重量之碳量0.18%)130份、苯氧樹脂(YL7553BH30,固體成分30質量%之MEK溶液,重量平均分子量35000)5份,以高速旋轉混練機均勻分散,調製樹脂漆料。接著,以使乾燥後之樹脂厚度成為40μm之方式,以模嘴塗佈器將該樹脂漆料塗佈於PET膜(厚度38μm)上,且在80~120℃(平均100℃)下乾燥6分鐘,獲得薄片狀之接著薄膜。 10 parts of liquid bisphenol A type epoxy resin (epoxy equivalent 165, "ZX1059" manufactured by Nippon Steel Chemical Co., Ltd.), naphthyl fluorene type epoxy resin (epoxy equivalent 300, Osaka Gas Chemistry) 10 parts of "CG-500"), 5 parts of methyl ethyl ketone (hereinafter referred to as "MEK"), and 5 parts of cyclohexanone were heated and dissolved while stirring. Among them, 30 parts of an active ester compound ("HPC8000-65T" manufactured by DIC Co., Ltd., an active ester equivalent of 223, a toluene solution of 65% solid content), and a hardening accelerator ("Golden Chemical Industry Co., Ltd.") were mixed. 4-dimethylaminopyridine" 0.3 parts, spherical cerium oxide (average particle size 0.5 μm, "SO-C2" treated with phenylamino decane, manufactured by Adventex, with a carbon content per unit weight of 0.18 %) 130 parts of phenoxy resin (YL7553BH30, MEK solution of solid content 30% by mass, weight average molecular weight 35000) 5 parts, uniformly dispersed by a high-speed rotary kneading machine to prepare a resin paint. Next, the resin paint was applied onto a PET film (thickness: 38 μm) by a die coater so that the thickness of the resin after drying became 40 μm, and dried at 80 to 120 ° C (average 100 ° C). In minutes, a flaky subsequent film was obtained.

(實施例2) (Example 2)

使液狀雙酚A型環氧樹脂(環氧當量165,新日鐵化學(股)製之「ZX1059」)10份、萘基茀型環氧樹脂(環氧當量300,大阪氣體化學(股)製之「CG-500」)10份於MEK 5份、環己酮5份中邊攪拌邊加熱溶解。於其中,混合活性酯化合物(DIC(股)製之「HPC8000-65T」,活性酯當量223,固體成分65%之甲苯溶液)15份、酚化合物(DIC(股)製之「LA3018-50P」,酚當量151,固體成分50%之2-甲氧基丙醇溶液)10份、硬化促進劑(廣榮化學工業(股)製之「4-二甲胺基吡啶」)0.1份、球形二氧化矽(平均粒徑0.5μm,經苯基胺基矽烷處理之「SO-C2」,Adventex(股)製,每單位重量之碳量0.18%)130份、苯氧樹脂(YL7553BH30,固體成分30質量%之MEK溶液,重量平均分子量35000)5份,以高速旋轉混練機均勻分散,調製樹脂漆料。接著與實施例1同樣獲得接著薄膜。 10 parts of liquid bisphenol A type epoxy resin (epoxy equivalent 165, "ZX1059" manufactured by Nippon Steel Chemical Co., Ltd.), naphthyl fluorene type epoxy resin (epoxy equivalent 300, Osaka Gas Chemistry) 10 parts of "CG-500" manufactured by the method of heating and dissolving in 5 parts of MEK and 5 parts of cyclohexanone while stirring. In this case, an active ester compound ("HPC8000-65T" manufactured by DIC Co., Ltd., an active ester equivalent of 223, and a toluene solution of 65% solid content) was mixed with a phenol compound ("LA3018-50P" manufactured by DIC Corporation). 10 parts of phenol equivalent 151, 50% solid solution of 2-methoxypropanol), hardening accelerator ("4-dimethylaminopyridine" manufactured by Kwong Wing Chemical Industry Co., Ltd.) 0.1 part, spherical Cerium oxide ("SO-C2" having an average particle diameter of 0.5 μm, treated with phenylamino decane, 0.18% by weight of Adventex), and phenoxy resin (YL7553BH30, solid content 30) The mass% of the MEK solution, the weight average molecular weight of 35,000) was 5 parts, and was uniformly dispersed by a high-speed rotary kneading machine to prepare a resin paint. Next, a film was obtained in the same manner as in Example 1.

(比較例1) (Comparative Example 1)

除了將實施例2之萘基茀型環氧樹脂(環氧當量300,大阪氣體化學(股)製之「CG-500」)10份變更為萘型環氧樹脂(DIC(股)製之「HP4710」,環氧當量171)10份以外,餘與實施例2完全相同製作樹脂漆料。接著與實施例1同樣獲得接著薄膜。 In addition, 10 parts of the naphthyl fluorene type epoxy resin (epoxy equivalent 300, "CG-500" manufactured by Osaka Gas Chemical Co., Ltd.) of Example 2 was changed to a naphthalene type epoxy resin ("DIC") A resin paint was prepared in the same manner as in Example 2 except that HP4710", an epoxy equivalent of 171) was 10 parts. Next, a film was obtained in the same manner as in Example 1.

(比較例2) (Comparative Example 2)

除了未添加實施例2之活性酯化合物(DIC(股)製之「HPC-800-65T」,活性酯當量223,固體成分65%之甲苯溶液)15份,將酚化合物(DIC(股)製之「LA3018-50P」,酚當量151,固體成分50%之2-甲氧基丙醇溶液)變更為20份,進而將球形二氧化矽(平均粒徑0.5μm,經苯基胺基矽烷處理之「SO-C2」,Adventex(股)製,每單位重量之碳量0.18%)變更為115份以外,餘與實施例2完全相同調製樹脂漆料。接著與實施例1同樣獲得接著薄膜。 In addition to the addition of the active ester compound of Example 2 ("HPC-800-65T" manufactured by DIC), 15 parts of active ester equivalent 223, 65% solids in toluene solution, phenol compound (DIC) "LA3018-50P", phenol equivalent 151, 50% solid solution of 2-methoxypropanol) was changed to 20 parts, and further spherical cerium oxide (average particle diameter 0.5 μm, treated with phenylamino decane) The resin paint was prepared in the same manner as in Example 2 except that "SO-C2" and "Adventex (share) system, 0.18% by weight of carbon per unit weight) were changed to 115 parts. Next, a film was obtained in the same manner as in Example 1.

結果示於表1。 The results are shown in Table 1.

由表1之結果可知,實施例1及2在經硬化作成絕緣層時,算術平均粗糙度之值及均方根粗糙度之值均小,至於剝離強度係獲得充分之值,且介電正切低。另一方面,以比較例1及2之樹脂組成物,算數平均粗糙度、均方根粗糙度之值變大,且剝離強度小,介電正切高。 As can be seen from the results of Table 1, in Examples 1 and 2, when the insulating layer was hardened, the values of the arithmetic mean roughness and the root mean square roughness were small, and the peel strength was sufficient, and the dielectric tangent was obtained. low. On the other hand, in the resin compositions of Comparative Examples 1 and 2, the values of the arithmetic mean roughness and the root mean square roughness were large, and the peel strength was small and the dielectric tangent was high.

(實施例3) (Example 3)

使半固體狀萘型環氧樹脂(環氧當量144,DIC(股)製之「HP4032」)9份與萘基茀型環氧樹脂(環氧當量300,大阪氣體化學(股)製之「CG-500」)10份於 MEK 5份、環己酮5份中邊攪拌邊加熱溶解。於其中,混合氰酸酯化合物(氰酸酯當量124,日本LONZA(股)製之「PT30S」)7.65份、硬化促進劑(廣榮化學工業(股)製之「4-二甲胺基吡啶」)0.02份、球形二氧化矽(平均粒徑0.5μm,經苯基胺基矽烷處理之「SO-C2」,Adventex(股)製,每單位重量之碳量0.18%)190份、苯氧樹脂(YL7553BH30,固體成分30質量%之MEK溶液,重量平均分子量35000)5份,以高速旋轉混練機均勻分散,調製樹脂漆料。接著,與實施例1同樣獲得接著薄膜。 9 parts of a semi-solid naphthalene type epoxy resin (epoxy equivalent 144, "HP4032" manufactured by DIC Co., Ltd.) and naphthyl fluorene type epoxy resin (epoxy equivalent 300, manufactured by Osaka Gas Chemical Co., Ltd.) CG-500") 10 parts in 5 parts of MEK and 5 parts of cyclohexanone were heated and dissolved while stirring. Among them, 7.65 parts of a cyanate ester compound (cyanate ester equivalent 124, "PT30S" manufactured by LONZA Co., Ltd.), and a hardening accelerator (4-dimethylaminopyridine manufactured by Kwong Wing Chemical Industry Co., Ltd.) ” 0.02 parts of spherical cerium oxide (average particle size 0.5 μm, “SO-C2” treated with phenylamino decane, made by Adventex (stock), 0.18% by weight of carbon) 190 parts, phenoxy 5 parts of a resin (YL7553BH30, a MEK solution having a solid content of 30% by mass, a weight average molecular weight of 35,000) was uniformly dispersed by a high-speed rotary kneader to prepare a resin paint. Next, a film of the following film was obtained in the same manner as in Example 1.

(比較例3) (Comparative Example 3)

除了將實施例3之萘基茀型環氧樹脂(環氧當量300,大阪氣體化學(股)製之「CG-500」)10份變更為聯苯型環氧樹脂(環氧當量185,三菱化學(股)製之「YX4000H」)6份以外,餘與實施例3同樣調製樹脂漆料。接著與實施例1同樣獲得接著薄膜。 In addition, 10 parts of the naphthyl fluorene type epoxy resin (epoxy equivalent 300, "CG-500" manufactured by Osaka Gas Chemical Co., Ltd.) of Example 3 was changed to a biphenyl type epoxy resin (epoxy equivalent 185, Mitsubishi) A resin paint was prepared in the same manner as in Example 3 except for 6 parts of "YX4000H" manufactured by Chemical Co., Ltd.). Next, a film was obtained in the same manner as in Example 1.

結果示於表2。 The results are shown in Table 2.

由表2之結果可知,實施例3之算術平均粗糙度、均方根粗糙度之值均小,作為剝離強度係獲得充分之值,且介電正切低。另一方面,比較例3之算數平均粗糙度、均方根粗糙度之值均變大,剝離強度小,且介電正切高。 As is clear from the results of Table 2, the values of the arithmetic mean roughness and the root mean square roughness of Example 3 were small, and sufficient values were obtained as the peel strength, and the dielectric tangent was low. On the other hand, in Comparative Example 3, the values of the arithmetic mean roughness and the root mean square roughness were both large, the peel strength was small, and the dielectric tangent was high.

[產業上之可利用性] [Industrial availability]

可提供經硬化作成絕緣層時,不僅濕式粗化步驟中絕緣層表面之算術平均粗糙度之值小,且絕緣層表面之均方根粗糙度之值也小,可藉鍍敷在絕緣層上形成具有充分剝離強度之導體層,且硬化物之介電正切低之樹脂組成物。另外可提供使用其之薄片狀層合材料、多層印刷 配線板、半導體裝置。進而亦可提供搭載該等之電腦、行動電話、數位相機、電視等電氣製品、或電動機車、汽車、電車、船舶、飛機等乘載工具。 When the hardened insulating layer is provided, not only the value of the arithmetic mean roughness of the surface of the insulating layer in the wet roughening step is small, but also the value of the root mean square roughness of the surface of the insulating layer is small, and plating can be applied to the insulating layer. A conductor composition having a sufficient peel strength and a resin composition having a low dielectric tangent of the cured product is formed thereon. In addition, it can provide sheet-like laminates and multi-layer printing Wiring board, semiconductor device. Further, it is also possible to provide a portable tool such as a computer, a mobile phone, a digital camera, a television, or the like, or an electric motor vehicle, a car, a train, a ship, or an airplane.

Claims (16)

一種樹脂組成物,其特徵為含有成分(A)具有萘基茀構造之環氧樹脂,及成分(B)活性酯系硬化劑及氰酸酯系硬化劑中之任一者或二者。 A resin composition comprising either or both of the epoxy resin having a naphthylquinone structure of the component (A) and the active ester-based curing agent and the cyanate-based curing agent of the component (B). 如請求項1之樹脂組成物,其中前述成分(A)之含量以樹脂組成物中之不揮發成分作為100質量%時,為1~20質量%。 The resin composition of claim 1, wherein the content of the component (A) is from 1 to 20% by mass based on 100% by mass of the nonvolatile component in the resin composition. 如請求項1之樹脂組成物,其中前述成分(B)之含量以樹脂組成物中之不揮發成分作為100質量%時,為1~30質量%。 The resin composition of claim 1, wherein the content of the component (B) is from 1 to 30% by mass based on 100% by mass of the nonvolatile component in the resin composition. 如請求項1之樹脂組成物,其中前述成分(B)為活性酯系硬化劑。 The resin composition of claim 1, wherein the component (B) is an active ester-based hardener. 如請求項1之樹脂組成物,其係進而含有無機填充材。 The resin composition of claim 1, which further contains an inorganic filler. 如請求項5之樹脂組成物,其中前述無機填充材之平均粒徑為0.01~5μm。 The resin composition of claim 5, wherein the inorganic filler has an average particle diameter of 0.01 to 5 μm. 如請求項5之樹脂組成物,其中前述無機填充材之含量以樹脂組成物中之不揮發成分作為100質量%時,為30~90質量%。 The resin composition of claim 5, wherein the content of the inorganic filler is 30 to 90% by mass based on 100% by mass of the nonvolatile component in the resin composition. 如請求項5之樹脂組成物,其中前述無機填充材係以表面處理劑進行表面處理者。 The resin composition of claim 5, wherein the inorganic filler is surface-treated with a surface treatment agent. 如請求項5之樹脂組成物,其中前述無機填充材為二氧化矽。 The resin composition of claim 5, wherein the inorganic filler is cerium oxide. 如請求項1之樹脂組成物,其係進而含有熱可塑性樹脂。 The resin composition of claim 1, which further contains a thermoplastic resin. 如請求項1之樹脂組成物,其係使樹脂組成物硬化形成絕緣層,且使絕緣層表面進行粗化處理後之絕緣層表面之算術平均粗糙度為10~350nm,均方根粗糙度為20~500nm。 The resin composition of claim 1, wherein the resin composition is cured to form an insulating layer, and the surface of the insulating layer is subjected to roughening treatment, and the arithmetic mean roughness of the surface of the insulating layer is 10 to 350 nm, and the root mean square roughness is 20~500nm. 如請求項1之樹脂組成物,其係多層印刷配線板之絕緣層用樹脂組成物。 The resin composition of claim 1, which is a resin composition for an insulating layer of a multilayer printed wiring board. 如請求項1之樹脂組成物,其係多層印刷配線板之絕緣層用樹脂組成物,該多層印刷配線板係導體層為藉由鍍敷所形成者。 The resin composition of claim 1, which is a resin composition for an insulating layer of a multilayer printed wiring board, wherein the multilayer printed wiring board-based conductor layer is formed by plating. 一種片狀層合材料,其特徵為含有如請求項1~13中任一項之樹脂組成物者。 A sheet-like laminate material comprising the resin composition according to any one of claims 1 to 13. 一種多層印刷配線板,其特徵係含有如請求項1~13中任一項之樹脂組成物之硬化物作為絕緣層者。 A multilayer printed wiring board characterized by containing a cured product of the resin composition according to any one of claims 1 to 13 as an insulating layer. 一種半導體裝置,其特徵係含有如請求項15之多層印刷配線板者。 A semiconductor device characterized by comprising the multilayer printed wiring board of claim 15.
TW102135670A 2012-10-15 2013-10-02 Resin composition TWI633011B (en)

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