TW201738311A - Resin sheet having an insulation layer with excellent insulation performance - Google Patents

Resin sheet having an insulation layer with excellent insulation performance Download PDF

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TW201738311A
TW201738311A TW106108365A TW106108365A TW201738311A TW 201738311 A TW201738311 A TW 201738311A TW 106108365 A TW106108365 A TW 106108365A TW 106108365 A TW106108365 A TW 106108365A TW 201738311 A TW201738311 A TW 201738311A
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resin
layer
resin composition
manufactured
epoxy resin
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TWI721130B (en
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中村茂雄
藤島祥平
藤原千尋
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味之素股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/02Physical, chemical or physicochemical properties
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/18Layered products comprising a layer of synthetic resin characterised by the use of special additives
    • B32B27/20Layered products comprising a layer of synthetic resin characterised by the use of special additives using fillers, pigments, thixotroping agents
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/18Layered products comprising a layer of synthetic resin characterised by the use of special additives
    • B32B27/26Layered products comprising a layer of synthetic resin characterised by the use of special additives using curing agents
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/38Layered products comprising a layer of synthetic resin comprising epoxy resins
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/01Use of inorganic substances as compounding ingredients characterized by their specific function
    • C08K3/013Fillers, pigments or reinforcing additives
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/20Properties of the layers or laminate having particular electrical or magnetic properties, e.g. piezoelectric
    • B32B2307/206Insulating
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/08PCBs, i.e. printed circuit boards
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L2203/00Applications
    • C08L2203/20Applications use in electrical or conductive gadgets
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L2205/00Polymer mixtures characterised by other features
    • C08L2205/02Polymer mixtures characterised by other features containing two or more polymers of the same C08L -group
    • C08L2205/025Polymer mixtures characterised by other features containing two or more polymers of the same C08L -group containing two or more polymers of the same hierarchy C08L, and differing only in parameters such as density, comonomer content, molecular weight, structure
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L2205/00Polymer mixtures characterised by other features
    • C08L2205/03Polymer mixtures characterised by other features containing three or more polymers in a blend
    • C08L2205/035Polymer mixtures characterised by other features containing three or more polymers in a blend containing four or more polymers in a blend

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Laminated Bodies (AREA)

Abstract

To provide a resin sheet having a thinner insulation layer with excellent insulation performance. A resin sheet, which comprises a support body, and a resin sheet of a resin composition layer bonded on the support body, the dielectric tangent of the cured product of the resin composition layer measured at a frequency of 10GHz at 23 DEG C is 0.006 or less, the dielectric tangent of the cured product of the resin composition layer measured at a frequency of 10GHz at 150 DEG C is 0.01 or less. Further, the thickness of the resin composition layer is 15[mu]m or less; the most lower melt viscosity of the resin composition layer is 1000 poise or more; and the resin composition layer comprises an inorganic filler and the content of which is 50 mass% or more when the non-volatile components in the resin composition layer is set as 100 mass%.

Description

樹脂薄片 Resin sheet

本發明係關於樹脂薄片。進而係關於包含該樹脂薄片的樹脂組成物層之硬化物、印刷配線板、及半導體裝置。 The present invention relates to a resin sheet. Further, it is a cured product of a resin composition layer containing the resin sheet, a printed wiring board, and a semiconductor device.

近年來,為了達成電子設備的小型化,印刷配線板進一步的薄型化已進展,內層基板或絕緣層的厚度有進一步變薄的傾向。作為變薄內層基板或絕緣層的厚度者,例如已知有專利文獻1所記載之薄型薄膜用樹脂組成物。 In recent years, in order to achieve miniaturization of electronic equipment, the thickness of the printed wiring board has been further reduced, and the thickness of the inner layer substrate or the insulating layer tends to be further thinned. For example, a resin composition for a thin film described in Patent Document 1 is known as a thickness of a thinned inner layer substrate or an insulating layer.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開2014-152309號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2014-152309

在專利文獻1,本發明者們發現,將薄膜適用 在絕緣層時,有粗糙度增大、降低剝離強度的傾向,為了解決此等之課題,提案有將熱塑性樹脂的摻合量定為預定量。然而,在該文獻,對於將絕緣層的厚度變薄時之絕緣性能(以下亦稱為「薄膜絕緣性」)並未有任何研究。 In Patent Document 1, the inventors have found that the film is applied In the case of the insulating layer, the roughness tends to increase and the peel strength tends to decrease. In order to solve such problems, it has been proposed to set the blending amount of the thermoplastic resin to a predetermined amount. However, in this document, there is no research on the insulating property (hereinafter also referred to as "thin film insulating property") when the thickness of the insulating layer is made thin.

絕緣層為薄膜的情況下,無機填充材粒子彼此進行接觸傳導界面,使電流更易流通、或藉由絕緣層的厚度較薄,增大靜電容量導致容易短路等較以往者更難維持絕緣性能。 When the insulating layer is a thin film, the inorganic filler particles are in contact with each other to make the current flow more easily, or the thickness of the insulating layer is thin, and it is more difficult to maintain the insulating performance by increasing the electrostatic capacitance and causing the short circuit.

本發明的課題為提供一種可賦予絕緣性能優異之薄絕緣層的樹脂薄片。 An object of the present invention is to provide a resin sheet which can impart a thin insulating layer excellent in insulating properties.

為了解決上述課題,進行努力研究的結果,本發明者們發現,藉由在包含支持體、與接合於該支持體上之樹脂組成物層的樹脂薄片,樹脂組成物層的硬化物滿足特定之介電正切,儘管厚度單薄亦可賦予優異絕緣性能之(薄膜絕緣性優異)絕緣層。詳細而言,本發明者們發現,藉由不僅降低常溫環境下之樹脂組成物層的硬化物之介電正切,並且亦降低高溫環境下之樹脂組成物層的硬化物之介電正切,可賦予薄膜絕緣性優異之絕緣層,而終至完成本發明。 In order to solve the problem, the present inventors have found that the cured product of the resin composition layer satisfies the specific resin sheet including the support and the resin composition layer bonded to the support. Dielectric tangent, although thin in thickness, imparts excellent insulating properties (excellent film insulation) to the insulating layer. In particular, the present inventors have found that by not only reducing the dielectric tangent of the cured product of the resin composition layer in a normal temperature environment, but also reducing the dielectric tangent of the cured product of the resin composition layer in a high temperature environment, The insulating layer excellent in insulating property of the film is provided, and the present invention is completed.

亦即,本發明係包含以下之內容。 That is, the present invention includes the following contents.

[1]一種樹脂薄片,其係包含支持體、與接合於該支持體上之樹脂組成物層之樹脂薄片,該樹脂組成物層的硬 化物在測定頻率10GHz、23℃之介電正切為0.006以下,該樹脂組成物層的硬化物在測定頻率10GHz、150℃之介電正切為0.01以下。 [1] A resin sheet comprising a support and a resin sheet bonded to a resin composition layer on the support, the resin composition layer being hard The dielectric tangent of the compound at a measurement frequency of 10 GHz and 23 ° C is 0.006 or less, and the dielectric tangent of the cured product of the resin composition layer at a measurement frequency of 10 GHz and 150 ° C is 0.01 or less.

[2]如[1]所記載之樹脂薄片,其中,樹脂組成物層的厚度為15μm以下。 [2] The resin sheet according to [1], wherein the resin composition layer has a thickness of 15 μm or less.

[3]如[1]或[2]所記載之樹脂薄片,其中,樹脂組成物層的最低熔融黏度為1000poise以上。 [3] The resin sheet according to [1] or [2] wherein the resin composition layer has a minimum melt viscosity of 1000 poise or more.

[4]如[1]~[3]中任一項所記載之樹脂薄片,其中,樹脂組成物層係含有環氧樹脂及硬化劑。 [4] The resin sheet according to any one of [1] to [3] wherein the resin composition layer contains an epoxy resin and a curing agent.

[5]如[1]~[4]中任一項所記載之樹脂薄片,其中,樹脂組成物層含有無機填充材,且將樹脂組成物層中之不揮發成分定為100質量%的情況下,該無機填充材的含量為50質量%以上。 [5] The resin sheet according to any one of [1], wherein the resin composition layer contains an inorganic filler and the nonvolatile content in the resin composition layer is 100% by mass. The content of the inorganic filler is 50% by mass or more.

[6]如[1]~[5]中任一項所記載之樹脂薄片,其係印刷配線板之絕緣層形成用。 [6] The resin sheet according to any one of [1] to [5] which is used for forming an insulating layer of a printed wiring board.

[7]如[1]~[5]中任一項所記載之樹脂薄片,其係1GHz以上的高頻率基板之絕緣層形成用。 [7] The resin sheet according to any one of [1] to [5] which is used for forming an insulating layer of a high frequency substrate of 1 GHz or more.

[8]如[1]~[7]中任一項所記載之樹脂薄片,其係包含第1導體層、與第2導體層、與絕緣第1導體層與第2導體層之絕緣層,第1導體層與第2導體層之間的絕緣層的厚度為6μm以下之印刷配線板的該絕緣層形成用。 [8] The resin sheet according to any one of [1] to [7], comprising a first conductor layer, a second conductor layer, and an insulating layer that insulates the first conductor layer and the second conductor layer, The insulating layer of the printed wiring board having a thickness of the insulating layer between the first conductor layer and the second conductor layer of 6 μm or less is formed.

[9]一種印刷配線板,其係包含第1導體層、第2導體層、及絕緣第1導體層與第2導體層之絕緣層,第1導體層與第2導體層之間的絕緣層的厚度為6μm以下之印 刷配線板,該絕緣層係如[1]~[8]中任一項所記載之樹脂薄片的樹脂組成物層之硬化物。 [9] A printed wiring board comprising: a first conductor layer, a second conductor layer, and an insulating layer that insulates the first conductor layer and the second conductor layer, and an insulating layer between the first conductor layer and the second conductor layer The thickness of the print is 6μm or less The cured wiring layer is a cured product of a resin composition layer of the resin sheet according to any one of [1] to [8].

[10]一種半導體裝置,其係包含如[9]所記載之印刷配線板。 [10] A semiconductor device comprising the printed wiring board according to [9].

根據本發明,可提供一種可賦予絕緣性能優異之薄絕緣層的樹脂薄片。 According to the present invention, it is possible to provide a resin sheet which can impart a thin insulating layer excellent in insulating properties.

5‧‧‧第1導體層 5‧‧‧1st conductor layer

51‧‧‧第1導體層之主面 51‧‧‧Main surface of the first conductor layer

6‧‧‧第2導體層 6‧‧‧2nd conductor layer

61‧‧‧第2導體層之主面 61‧‧‧Main surface of the second conductor layer

7‧‧‧絕緣層 7‧‧‧Insulation

[圖1]圖1係示意性表示印刷配線板的一例之一部分截面圖。 Fig. 1 is a partial cross-sectional view schematically showing an example of a printed wiring board.

以下,針對本發明之樹脂薄片、具備該樹脂薄片的樹脂組成物層之硬化物之印刷配線板、及半導體裝置進行詳細說明。 Hereinafter, the resin sheet of the present invention, a printed wiring board including a cured product of the resin composition layer of the resin sheet, and a semiconductor device will be described in detail.

本發明之樹脂薄片係包含支持體、與接合於該支持體上之樹脂組成物層。在本發明,其特徵為該樹脂組成物層的硬化物在測定頻率10GHz、23℃之介電正切為0.006以下,且該樹脂組成物層的硬化物在測定頻率10GHz、150℃之介電正切為0.01以下。 The resin sheet of the present invention comprises a support and a resin composition layer bonded to the support. In the present invention, the cured product of the resin composition layer has a dielectric tangent at a measurement frequency of 10 GHz and 23 ° C of 0.006 or less, and a cured tangent of the resin composition layer at a measurement frequency of 10 GHz and 150 ° C. It is 0.01 or less.

樹脂組成物層係藉由樹脂組成物形成。首 先,針對形成樹脂組成物層之樹脂組成物進行說明。 The resin composition layer is formed by a resin composition. first First, the resin composition forming the resin composition layer will be described.

[樹脂組成物] [Resin composition]

樹脂組成物並未特別限定,藉由樹脂組成物所形成之樹脂組成物層的硬化物,若為滿足上述之介電正切者即可。作為賦予滿足預定之介電正切的硬化物之樹脂組成物,例如可列舉包含硬化性樹脂與其硬化劑之組成物。作為硬化性樹脂,可使用形成印刷配線板之絕緣層時所使用之以往周知的硬化性樹脂,其中較佳為環氧樹脂。據此,在一實施形態,樹脂組成物係含有(A)環氧樹脂及(B)硬化劑。樹脂組成物較佳為含有(C)無機填充材。樹脂組成物進而如有必要可包含熱塑性樹脂、硬化促進劑、難燃劑及有機填充材等之添加劑。 The resin composition is not particularly limited, and the cured product of the resin composition layer formed of the resin composition may be a dielectric tangent that satisfies the above. The resin composition which imparts a cured product satisfying a predetermined dielectric tangent is, for example, a composition comprising a curable resin and a curing agent. As the curable resin, a conventionally known curable resin used in forming an insulating layer of a printed wiring board can be used, and among them, an epoxy resin is preferable. Accordingly, in one embodiment, the resin composition contains (A) an epoxy resin and (B) a curing agent. The resin composition preferably contains (C) an inorganic filler. The resin composition may further contain an additive such as a thermoplastic resin, a hardening accelerator, a flame retardant, and an organic filler, if necessary.

以下,針對可作為樹脂組成物的材料使用之(A)環氧樹脂、(B)硬化劑、(C)無機填充材及添加劑進行說明。 Hereinafter, (A) epoxy resin, (B) hardener, (C) inorganic filler, and an additive which can be used as a material of a resin composition are demonstrated.

<(A)環氧樹脂> <(A) Epoxy Resin>

(A)作為環氧樹脂,例如可列舉雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、二環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚酚醛清漆型環氧樹脂、酚酚醛清漆型環氧樹脂、tert-丁基-兒茶酚型環氧樹脂、萘型環氧樹脂、萘酚型環氧樹脂、蔥型環氧樹脂、環氧丙基胺型環氧樹脂、環氧丙基酯型環氧 樹脂、甲酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、線狀脂肪族環氧樹脂、具有丁二烯構造之環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含有螺環環之環氧樹脂、環己烷二甲醇型環氧樹脂、伸萘基醚型環氧樹脂、三羥甲基型環氧樹脂、四苯基乙烷型環氧樹脂等。環氧樹脂可1種單獨使用,亦可組合2種以上使用。(A)成分較佳為選自雙酚A型環氧樹脂、雙酚F型環氧樹脂、及聯苯型環氧樹脂中之1種以上。 (A) Examples of the epoxy resin include bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, bisphenol AF type epoxy resin, and dicyclopentadiene type ring. Oxygen resin, phenolic epoxy resin, naphthol novolac epoxy resin, phenol novolak epoxy resin, tert-butyl-catechol epoxy resin, naphthalene epoxy resin, naphthol ring Oxygen resin, onion type epoxy resin, epoxy propyl amine type epoxy resin, epoxy propyl ester type epoxy Resin, cresol novolac type epoxy resin, biphenyl type epoxy resin, linear aliphatic epoxy resin, epoxy resin having butadiene structure, alicyclic epoxy resin, heterocyclic epoxy resin, An epoxy resin containing a spiro ring, a cyclohexanedimethanol type epoxy resin, a naphthyl ether type epoxy resin, a trimethylol type epoxy resin, a tetraphenylethane type epoxy resin, or the like. Epoxy resins may be used alone or in combination of two or more. The component (A) is preferably one or more selected from the group consisting of bisphenol A type epoxy resins, bisphenol F type epoxy resins, and biphenyl type epoxy resins.

環氧樹脂較佳為包含於1分子中具有2個以上環氧基之環氧樹脂。將環氧樹脂之不揮發成分定為100質量%的情況,較佳為至少50質量%以上於1分子中具有2個以上環氧基之環氧樹脂。其中,較佳為包含於1分子中具有2個以上環氧基,且於溫度20℃為液狀之環氧樹脂(以下稱為「液狀環氧樹脂」)、與於1分子中具有3個以上環氧基,且於溫度20℃為固體狀之環氧樹脂(以下稱為「固體狀環氧樹脂」)。作為環氧樹脂,藉由併用液狀環氧樹脂與固體狀環氧樹脂,具有優異之可撓性,且亦提昇樹脂組成物層的硬化物之斷裂強度。尤其是固體狀環氧樹脂耐熱性高,即使高溫下亦容易降低樹脂組成物層的硬化物之介電正切。 The epoxy resin is preferably an epoxy resin having two or more epoxy groups in one molecule. When the nonvolatile content of the epoxy resin is 100% by mass, it is preferably at least 50% by mass or more of an epoxy resin having two or more epoxy groups in one molecule. In particular, it is preferably an epoxy resin having two or more epoxy groups in one molecule and having a liquid state at a temperature of 20 ° C (hereinafter referred to as "liquid epoxy resin"), and having 3 molecules in one molecule. One or more epoxy groups and an epoxy resin (hereinafter referred to as "solid epoxy resin") having a solid temperature of 20 ° C. As the epoxy resin, the liquid epoxy resin and the solid epoxy resin are used in combination to have excellent flexibility, and also to improve the breaking strength of the cured product of the resin composition layer. In particular, the solid epoxy resin has high heat resistance, and it is easy to lower the dielectric tangent of the cured product of the resin composition layer even at a high temperature.

作為液狀環氧樹脂,較佳為雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚AF型環氧樹脂、萘型環氧樹脂、環氧丙基酯型環氧樹脂、環氧丙基胺型環氧樹脂、酚酚醛清漆型環氧樹脂、具有酯骨架之脂環式環氧樹脂、 環己烷二甲醇型環氧樹脂、環氧丙基胺型環氧樹脂、及具有丁二烯構造之環氧樹脂,更佳為環氧丙基胺型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚AF型環氧樹脂及萘型環氧樹脂。作為液狀環氧樹脂之具體例,可列舉DIC(股)製之「HP4032」、「HP4032D」、「HP4032SS」(萘型環氧樹脂)、三菱化學(股)製之「828US」、「jER828EL」(雙酚A型環氧樹脂)、「jER807」(雙酚F型環氧樹脂)、「jER152」(酚酚醛清漆型環氧樹脂)、「YL7760」(雙酚AF型環氧樹脂)、「630」、「630LSD」(環氧丙基胺型環氧樹脂)、新日鐵住金化學(股)製之「ZX1059」(雙酚A型環氧樹脂與雙酚F型環氧樹脂的混合品)、新日鐵住金化學(股)製「YD-8125G」(雙酚A型環氧樹脂)長瀨化學(股)製之「EX-721」(環氧丙基酯型環氧樹脂)、(股)Daicel製之「Celoxide2021P」(具有酯骨架之脂環式環氧樹脂)、「PB-3600」(具有丁二烯構造之環氧樹脂)、新日鐵化學(股)製之「ZX1658」、「ZX1658GS」(液狀1,4-環氧丙基環己烷)、三菱化學(股)製之「630LSD」(環氧丙基胺型環氧樹脂)等。此等可1種單獨使用,亦可組合2種以上使用。 As the liquid epoxy resin, a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, a bisphenol AF type epoxy resin, a naphthalene type epoxy resin, a epoxy propyl ester type epoxy resin, or the like is preferable. Epoxypropylamine type epoxy resin, phenol novolac type epoxy resin, alicyclic epoxy resin having an ester skeleton, Cyclohexane dimethanol type epoxy resin, epoxy propyl amine type epoxy resin, and epoxy resin having butadiene structure, more preferably epoxy propyl amine type epoxy resin, bisphenol A type epoxy Resin, bisphenol F epoxy resin, bisphenol AF epoxy resin and naphthalene epoxy resin. Specific examples of the liquid epoxy resin include "HP4032", "HP4032D", "HP4032SS" (naphthalene type epoxy resin) manufactured by DIC Co., Ltd., "828US" manufactured by Mitsubishi Chemical Corporation, and "jER828EL". (bisphenol A epoxy resin), "jER807" (bisphenol F epoxy resin), "jER152" (phenol novolak epoxy resin), "YL7760" (bisphenol AF epoxy resin), "630", "630LSD" (epoxypropylamine type epoxy resin), "ZX1059" made by Nippon Steel & Sumitomo Chemical Co., Ltd. (mixture of bisphenol A type epoxy resin and bisphenol F type epoxy resin) "Y--8125G" (bisphenol A type epoxy resin) manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., "EX-721" (epoxypropyl ester type epoxy resin) manufactured by Nippon Chemical Co., Ltd. "Celoxide 2021P" (an alicyclic epoxy resin having an ester skeleton), "PB-3600" (epoxy resin having a butadiene structure), and "Nippon Steel Chemical Co., Ltd." manufactured by Daicel. ZX1658", "ZX1658GS" (liquid 1,4-epoxypropylcyclohexane), "630LSD" (epoxypropylamine type epoxy resin) manufactured by Mitsubishi Chemical Corporation. These may be used alone or in combination of two or more.

作為固體狀環氧樹脂,較佳為萘型4官能環氧樹脂、甲酚酚醛清漆型環氧樹脂、二環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚型環氧樹脂、聯苯型環氧樹脂、伸萘基醚型環氧樹脂、蔥型環氧樹脂、雙酚A型環氧 樹脂、四苯基乙烷型環氧樹脂,更佳為萘型4官能環氧樹脂、萘酚型環氧樹脂、及聯苯型環氧樹脂。作為固體狀環氧樹脂之具體例,可列舉DIC(股)製之「HP4032H」(萘型環氧樹脂)、「HP-4700」、「HP-4710」(萘型4官能環氧樹脂)、「N-690」(甲酚酚醛清漆型環氧樹脂)、「N-695」(甲酚酚醛清漆型環氧樹脂)、「HP-7200」、「HP-7200HH」、「HP-7200H」(二環戊二烯型環氧樹脂)、「EXA-7311」、「EXA-7311-G3」、「EXA-7311-G4」、「EXA-7311-G4S」、「HP6000」(伸萘基醚型環氧樹脂)、日本化藥(股)製之「EPPN-502H」(參酚型環氧樹脂)、「NC7000L」(萘酚酚醛清漆型環氧樹脂)、「NC3000H」、「NC3000」、「NC3000L」、「NC3100」(聯苯型環氧樹脂)、新日鐵住金化學(股)製之「ESN475V」(萘型環氧樹脂)、「ESN485」(萘酚酚醛清漆型環氧樹脂)、三菱化學(股)製之「YX4000H」、「YL6121」(聯苯型環氧樹脂)、「YX4000HK」(雙二甲酚(Bixylenol)型環氧樹脂)、「YX8800」(蔥型環氧樹脂)、大阪瓦斯化學(股)製之「PG-100」、「CG-500」、三菱化學(股)製之「YL7800」(茀型環氧樹脂)、三菱化學(股)製之「jER1010」(固體狀雙酚A型環氧樹脂)、「jER1031S」(四苯基乙烷型環氧樹脂)等。 As the solid epoxy resin, a naphthalene type tetrafunctional epoxy resin, a cresol novolak type epoxy resin, a dicyclopentadiene type epoxy resin, a phenol type epoxy resin, a naphthol type epoxy resin is preferable. , biphenyl type epoxy resin, naphthyl ether type epoxy resin, onion type epoxy resin, bisphenol A type epoxy The resin and the tetraphenylethane type epoxy resin are more preferably a naphthalene type tetrafunctional epoxy resin, a naphthol type epoxy resin, and a biphenyl type epoxy resin. Specific examples of the solid epoxy resin include "HP4032H" (naphthalene epoxy resin), "HP-4700", and "HP-4710" (naphthalene type tetrafunctional epoxy resin) manufactured by DIC Corporation. "N-690" (cresol novolac type epoxy resin), "N-695" (cresol novolac type epoxy resin), "HP-7200", "HP-7200HH", "HP-7200H" ( Dicyclopentadiene type epoxy resin), "EXA-7311", "EXA-7311-G3", "EXA-7311-G4", "EXA-7311-G4S", "HP6000" (stretching naphthyl ether type) "EPPN-502H" (phenolic epoxy resin), "NC7000L" (naphthol novolak type epoxy resin), "NC3000H", "NC3000", "Nippon Chemical Co., Ltd." NC3000L", "NC3100" (biphenyl type epoxy resin), "ESN475V" (naphthalene type epoxy resin) manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., "ESN485" (naphthol novolac type epoxy resin), "YX4000H", "YL6121" (biphenyl type epoxy resin), "YX4000HK" (Bixylenol type epoxy resin) and "YX8800" (onion type epoxy resin) manufactured by Mitsubishi Chemical Corporation "PG-100" and "CG-" of Osaka Gas Chemical Co., Ltd. 500", "YL7800" (茀-type epoxy resin) manufactured by Mitsubishi Chemical Corporation, "jER1010" (solid bisphenol A epoxy resin) manufactured by Mitsubishi Chemical Corporation, "jER1031S" (tetraphenyl) Ethane type epoxy resin).

從即使高溫下亦可降低樹脂組成物層的硬化物之介電正切的觀點來看,作為環氧樹脂,較佳為純度高之樹脂(例如氯離子等之離子性雜質少之樹脂等)。作為純 度高之環氧樹脂,例如可列舉三菱化學(股)製之「828US」、「YL980」、「1750」、「YL983U」、新日鐵住金化學(股)製「YD-8125G」、「YD-825GS」、「ZX-1658GS」、「YDF-8170G」等。 From the viewpoint of lowering the dielectric tangent of the cured product of the resin composition layer even at a high temperature, the epoxy resin is preferably a resin having a high purity (for example, a resin having a small amount of ionic impurities such as chloride ions). As pure For example, "828US", "YL980", "1750", "YL983U" made by Mitsubishi Chemical Corporation, "YD-8125G" manufactured by Nippon Steel & Co., Ltd., "YD" -825GS", "ZX-1658GS", "YDF-8170G", etc.

作為液狀環氧樹脂,較佳為於1分子中具有2個以上環氧基,且於溫度20℃為液狀之芳香族系環氧樹脂,作為固體狀環氧樹脂,較佳為於1分子中具有3個以上環氧基,且於溫度20℃為固體狀之芳香族系環氧樹脂。尚,於本發明所謂芳香族系環氧樹脂,係意指其分子內具有芳香環構造之環氧樹脂。 The liquid epoxy resin is preferably an aromatic epoxy resin having two or more epoxy groups in one molecule and being liquid at a temperature of 20 ° C, and is preferably a solid epoxy resin. An aromatic epoxy resin having three or more epoxy groups in a molecule and being solid at a temperature of 20 ° C. Further, the term "aromatic epoxy resin" as used in the present invention means an epoxy resin having an aromatic ring structure in its molecule.

作為環氧樹脂,併用液狀環氧樹脂與固體狀環氧樹脂的情況,該等之量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比較佳為1:0.5~1:15的範圍。藉由將液狀環氧樹脂與固體狀環氧樹脂的量比定為該範圍,而得到i)以樹脂薄片的形態使用時帶來適度之黏著性、ii)以樹脂薄片的形態使用時得到充分之可撓性,提昇操作性、以及iii)可得到具有充分斷裂強度之樹脂組成物層的硬化物等之效果。從上述i)~iii)之效果的觀點來看,液狀環氧樹脂與固體狀環氧樹脂的量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比更佳為1:1.0~1:12的範圍,再更佳為1:1.3~1:10的範圍。 In the case of an epoxy resin and a liquid epoxy resin and a solid epoxy resin, the ratio (liquid epoxy resin: solid epoxy resin) is preferably 1:0.5 to 1:15. The scope. By setting the ratio of the amount of the liquid epoxy resin to the solid epoxy resin to be in this range, i) is obtained in the form of a resin sheet to give an appropriate adhesive property, and ii) when used in the form of a resin sheet. The flexibility is sufficient to improve the workability, and iii) the effect of obtaining a cured product of the resin composition layer having sufficient breaking strength. From the viewpoint of the effects of the above i) to iii), the ratio of the liquid epoxy resin to the solid epoxy resin (liquid epoxy resin: solid epoxy resin) is preferably 1:1.0 by mass ratio. The range of ~1:12 is more preferably in the range of 1:1.3 to 1:10.

樹脂組成物中之環氧樹脂的含量,從得到介電正切低,且顯示絕緣信賴性之絕緣層的觀點來看,較佳為5質量%以上,更佳為9質量%以上,再更佳為11質量 %以上。環氧樹脂的含量的上限只要能發揮本發明的效果雖並未特別限定,但較佳為50質量%以下,更佳為40質量%以下。 The content of the epoxy resin in the resin composition is preferably 5% by mass or more, more preferably 9% by mass or more, more preferably from the viewpoint of obtaining an insulating layer having a low dielectric tangent and exhibiting insulating reliability. For 11 quality %the above. The upper limit of the content of the epoxy resin is not particularly limited as long as it exhibits the effects of the present invention, but is preferably 50% by mass or less, and more preferably 40% by mass or less.

尚,在本發明,樹脂組成物中之各成分的含量除另有明文規定,係將樹脂組成物中之不揮發成分定為100質量%時之值。 In the present invention, the content of each component in the resin composition is a value obtained by setting the nonvolatile content in the resin composition to 100% by mass unless otherwise specified.

環氧樹脂的環氧當量較佳為50~5000,更佳為50~3000,再更佳為80~2000,又再更佳為110~1000。藉由成為此範圍,可帶來樹脂組成物層的硬化物之交聯密度變充分表面粗糙度較小之絕緣層。尚,環氧當量可依JIS K7236測定,係包含1當量環氧基之樹脂的質量。 The epoxy equivalent of the epoxy resin is preferably from 50 to 5,000, more preferably from 50 to 3,000, still more preferably from 80 to 2,000, still more preferably from 110 to 1,000. By setting it as such a range, it is possible to provide an insulating layer in which the crosslinking density of the cured product of the resin composition layer is small and the surface roughness is small. Further, the epoxy equivalent can be measured in accordance with JIS K7236 and is a mass of a resin containing 1 equivalent of an epoxy group.

環氧樹脂的重量平均分子量較佳為100~5000,更佳為250~3000,再更佳為400~1500。於此,環氧樹脂的重量平均分子量係藉由凝膠滲透層析(GPC)法所測定之聚苯乙烯換算的重量平均分子量。 The weight average molecular weight of the epoxy resin is preferably from 100 to 5,000, more preferably from 250 to 3,000, still more preferably from 400 to 1,500. Here, the weight average molecular weight of the epoxy resin is a polystyrene-equivalent weight average molecular weight measured by a gel permeation chromatography (GPC) method.

<(B)硬化劑> <(B) hardener>

作為硬化劑,若為具有硬化環氧樹脂之機能者,則並未特別限定,例如可列舉酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑、苯并惡嗪系硬化劑、氰酸酯系硬化劑、及碳二亞胺系硬化劑等。硬化劑可1種單獨使用,亦可併用2種以上。 The curing agent is not particularly limited as long as it has a function of curing the epoxy resin, and examples thereof include a phenol-based curing agent, a naphthol-based curing agent, an active ester-based curing agent, a benzoxazine-based curing agent, and cyanogen. An acid ester curing agent, a carbodiimide curing agent, and the like. The curing agent may be used alone or in combination of two or more.

作為酚系硬化劑及萘酚系硬化劑,從耐熱性 及耐水性的觀點來看,較佳為具有酚醛清漆構造之酚系硬化劑、或具有酚醛清漆構造之萘酚系硬化劑。又,從與導體層之密著性的觀點來看,較佳為含氮酚系硬化劑,更佳為含有三嗪骨架之酚系硬化劑。其中,從高度滿足耐熱性、耐水性、及與導體層之密著性的觀點來看,較佳為含有三嗪骨架之酚酚醛清漆硬化劑。 As a phenolic curing agent and a naphthol-based curing agent, heat resistance From the viewpoint of water resistance, a phenol-based curing agent having a novolac structure or a naphthol-based curing agent having a novolak structure is preferable. Moreover, from the viewpoint of adhesion to the conductor layer, a nitrogen-containing phenol-based curing agent is preferred, and a phenol-based curing agent containing a triazine skeleton is more preferred. Among them, from the viewpoint of satisfying heat resistance, water resistance, and adhesion to a conductor layer, a phenol novolak hardener containing a triazine skeleton is preferable.

作為酚系硬化劑及萘酚系硬化劑之具體例,例如可列舉明和化成(股)製之「MEH-7700」、「MEH-7810」、「MEH-7851」、日本化藥(股)製之「NHN」、「CBN」、「GPH」、新日鐵住金(股)製之「SN170」、「SN180」、「SN190」、「SN475」、「SN485」、「SN495」、「SN-495V」「SN375」、「SN395」、DIC(股)製之「TD-2090」、「LA-7052」、「LA-7054」、「LA-1356」、「LA-3018-50P」、「EXB-9500」等。 Specific examples of the phenolic curing agent and the naphthol-based curing agent include "MEH-7700", "MEH-7810", "MEH-7851", and Nippon Chemical Co., Ltd., manufactured by Megumi Kasei Co., Ltd. "SNN", "CBN", "GPH", Nippon Steel & Living Co., Ltd. "SN170", "SN180", "SN190", "SN475", "SN485", "SN495", "SN-495V" "SN-3090", "SN395", "DIC-7", "LA-7052", "LA-7054", "LA-1356", "LA-3018-50P", "EXB-" 9500" and so on.

作為活性酯系硬化劑,雖並未特別限制,但一般而言優選使用酚酯類、硫酚酯類、N-羥基胺酯類、雜環羥基化合物之酯類等之於1分子中具有2個以上反應活性高之酯基。該活性酯系硬化劑較佳為藉由羧酸化合物及/或硫羧酸化合物與羥基化合物及/或硫醇化合物的縮合反應所獲得者。尤其是從提昇耐熱性的觀點來看,較佳為從羧酸化合物與羥基化合物所得之活性酯系硬化劑,更佳為從羧酸化合物與酚化合物及/或萘酚化合物所得之活性酯系硬化劑。作為羧酸化合物,例如可列舉苯甲酸、乙酸、 琥珀酸、馬來酸、衣康酸、鄰苯二甲酸、間苯二甲酸、對苯二甲酸、苯均四酸等。作為酚化合物或萘酚化合物,例如可列舉對苯二酚、間苯二酚、雙酚A、雙酚F、雙酚S、酚酜(phenolphthalein)、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、酚、o-甲酚、m-甲酚、p-甲酚、兒茶酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚、苯三醇、二環戊二烯型二酚化合物、酚酚醛清漆等。於此,所謂「二環戊二烯型二酚化合物」,係指於二環戊二烯1分子縮合酚2分子所得之二酚化合物。 The active ester-based curing agent is not particularly limited, but generally, it is preferable to use phenol esters, thiophenol esters, N-hydroxylamine esters, esters of heterocyclic hydroxy compounds, etc. in one molecule. More than one ester group with high reactivity. The active ester-based curing agent is preferably obtained by a condensation reaction of a carboxylic acid compound and/or a sulfuric acid compound with a hydroxy compound and/or a thiol compound. In particular, from the viewpoint of improving heat resistance, an active ester-based curing agent derived from a carboxylic acid compound and a hydroxy compound is preferred, and an active ester system derived from a carboxylic acid compound and a phenol compound and/or a naphthol compound is more preferred. hardener. Examples of the carboxylic acid compound include benzoic acid and acetic acid. Succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, pyromellitic acid, and the like. Examples of the phenol compound or naphthol compound include hydroquinone, resorcin, bisphenol A, bisphenol F, bisphenol S, phenolphthalein, methylated bisphenol A, and methylated double. Phenol F, methylated bisphenol S, phenol, o-cresol, m-cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1 ,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, phloroglucinol, benzenetriol, dicyclopentadiene Type diphenol compound, phenol novolak, and the like. Here, the "dicyclopentadiene type diphenol compound" means a diphenol compound obtained by condensing a phenol 2 molecule with a molecule of dicyclopentadiene.

具體而言,較佳為包含二環戊二烯型二酚構造之活性酯化合物、包含萘構造之活性酯化合物、包含酚酚醛清漆之乙醯化物之活性酯化合物、包含酚酚醛清漆之苯甲醯基化物之活性酯化合物,其中,更佳為包含萘構造之活性酯化合物、包含二環戊二烯型二酚構造之活性酯化合物。所謂「二環戊二烯型二酚構造」,係表示由伸苯基-二環伸戊基-伸苯基所構成之2價構造單位。 Specifically, it is preferably an active ester compound comprising a dicyclopentadiene-type diphenol structure, an active ester compound containing a naphthalene structure, an active ester compound containing an acetal of a phenol novolac, and a benzaldehyde containing a phenol novolac. The active ester compound of a mercapto compound is more preferably an active ester compound containing a naphthalene structure or an active ester compound containing a dicyclopentadiene type diphenol structure. The "dicyclopentadiene type diphenol structure" is a divalent structural unit composed of a phenyl-bicyclopentyl-phenylene group.

作為活性酯系硬化劑之市售品,作為包含二環戊二烯型二酚構造之活性酯化合物,可列舉「EXB9451」、「EXB9460」、「EXB9460S」、「HPC-8000-65T」、「HPC-8000H-65TM」、「EXB-8000L-65TM」(DIC(股)製),作為包含萘構造之活性酯化合物,可列舉「EXB9416-70BK」(DIC(股)製),作為包含酚酚醛 清漆之乙醯化物之活性酯化合物,可列舉「DC808」(三菱化學(股)製),作為包含酚酚醛清漆之苯甲醯基化物之活性酯化合物,可列舉「YLH1026」(三菱化學(股)製),作為酚酚醛清漆之乙醯化物之活性酯系硬化劑,可列舉「DC808」(三菱化學(股)製),作為酚酚醛清漆之苯甲醯基化物之活性酯系硬化劑,可列舉「YLH1026」(三菱化學(股)製)、「YLH1030」(三菱化學(股)製)、「YLH1048」(三菱化學(股)製)等。 As a commercial product of the active ester-based curing agent, examples of the active ester compound containing a dicyclopentadiene-type diphenol structure include "EXB9451", "EXB9460", "EXB9460S", "HPC-8000-65T", and " HPC-8000H-65TM and "EXB-8000L-65TM" (manufactured by DIC), as an active ester compound containing a naphthalene structure, "EXB9416-70BK" (manufactured by DIC), as a phenolic phenolic aldehyde "DC808" (manufactured by Mitsubishi Chemical Corporation), and an active ester compound containing a benzoquinone-based phenol novolak, "YLH1026" (Mitsubishi Chemical Co., Ltd.) And the active ester-based curing agent of the acetal phenol varnish, which is an active ester-based curing agent of benzoquinone-based phenol novolac, "YLH1026" (Mitsubishi Chemical Co., Ltd.), "YLH1030" (Mitsubishi Chemical Co., Ltd.), and "YLH1048" (Mitsubishi Chemical Co., Ltd.) can be cited.

作為苯并惡嗪系硬化劑之具體例,可列舉昭和高分子(股)製之「HFB2006M」、四國化成工業(股)製之「P-d」、「F-a」。 Specific examples of the benzoxazine-based curing agent include "HFB2006M" manufactured by Showa Polymer Co., Ltd., and "P-d" and "F-a" manufactured by Shikoku Chemical Industries Co., Ltd.

作為氰酸酯系硬化劑,例如可列舉從雙酚A二氰酸酯、聚酚氰酸酯、寡(3-亞甲基-1,5-伸苯基氰酸酯)、4,4’-亞甲基雙(2,6-二甲基苯基氰酸酯)、4,4’-亞乙基二苯基二氰酸酯、六氟雙酚A二氰酸酯、2,2-雙(4-氰酸酯)苯基丙烷、1,1-雙(4-氰酸酯苯基甲烷)、雙(4-氰酸酯-3,5-二甲基苯基)甲烷、1,3-雙(4-氰酸酯苯基-1-(甲基亞乙基))苯、雙(4-氰酸酯苯基)硫醚、及雙(4-氰酸酯苯基)醚等之2官能氰酸酯樹脂、酚酚醛清漆及甲酚酚醛清漆等所衍生之多官能氰酸酯樹脂、此等氰酸酯樹脂一部分三嗪化之預聚物等。作為氰酸酯系硬化劑之具體例,可列舉Lonza Japan(股)製之「PT30」及「PT60」(酚酚醛清漆型多官能氰酸酯樹脂)、「ULL-950S」(多官能氰酸酯樹脂)、「BA230」、「BA230S75」(雙酚A二氰酸酯的一部分或 全部三嗪化成為三聚物之預聚物)等。 Examples of the cyanate-based curing agent include bisphenol A dicyanate, polyphenol cyanate, oligo(3-methylene-1,5-phenylenecyanate), and 4,4'. -methylenebis(2,6-dimethylphenyl cyanate), 4,4'-ethylenediphenyl dicyanate, hexafluorobisphenol A dicyanate, 2,2- Bis(4-cyanate) phenylpropane, 1,1-bis(4-cyanate phenylmethane), bis(4-cyanate-3,5-dimethylphenyl)methane, 1, 3-bis(4-cyanate phenyl-1-(methylethylidene)) benzene, bis(4-cyanate phenyl) sulfide, and bis(4-cyanate phenyl) ether A polyfunctional cyanate resin derived from a bifunctional cyanate resin, a phenol novolac, a cresol novolak, or the like, and a triazine-based prepolymer such as a cyanate resin. Specific examples of the cyanate-based curing agent include "PT30" and "PT60" (phenol novolac type polyfunctional cyanate resin) manufactured by Lonza Japan Co., Ltd., and "ULL-950S" (polyfunctional cyanic acid). Ester resin), "BA230", "BA230S75" (part of bisphenol A dicyanate or All triazines become prepolymers of terpolymers and the like.

作為碳二亞胺系硬化劑之具體例,可列舉日清紡化工(股)製之「V-03」、「V-07」等。 Specific examples of the carbodiimide-based curing agent include "V-03" and "V-07" manufactured by Nisshinbo Chemical Co., Ltd.

作為(B)成分,較佳為選自酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯系硬化劑中之1種以上。又,從可降低樹脂組成物層的硬化物在高溫下之介電正切的觀點來看,作為硬化劑,較佳為耐熱安定性高者。作為耐熱安定性高之硬化劑,可列舉活性酯系硬化劑、氰酸酯系硬化劑、碳二亞胺系硬化劑等。此等當中,從疏水性高,且可降低樹脂組成物層的硬化物在高溫下之介電正切的觀點來看,更佳為選自活性酯系硬化劑及氰酸酯系硬化劑中之1種以上,再更佳為活性酯系硬化劑。 The component (B) is preferably one or more selected from the group consisting of a phenolic curing agent, a naphthol curing agent, an active ester curing agent, and a cyanate curing agent. Moreover, from the viewpoint of reducing the dielectric tangent of the cured product of the resin composition layer at a high temperature, it is preferred that the curing agent has high heat stability. Examples of the curing agent having high heat stability include an active ester curing agent, a cyanate curing agent, and a carbodiimide curing agent. Among these, from the viewpoint of high hydrophobicity and lowering the dielectric tangent of the cured product of the resin composition layer at a high temperature, it is more preferably selected from the group consisting of an active ester-based hardener and a cyanate-based hardener. One or more kinds are more preferably an active ester-based curing agent.

環氧樹脂與硬化劑的量比以[環氧樹脂之環氧基的合計數]:[硬化劑之反應基的合計數]的比率,較佳為1:0.01~1:2的範圍,更佳為1:0.015~1:1.5,再更佳為1:0.02~1:1。於此,所謂硬化劑之反應基,係活性羥基、活性酯基等,因硬化劑的種類而異。又,所謂環氧樹脂之環氧基的合計數,係針對全部環氧樹脂將各環氧樹脂之固形分質量除以環氧當量之值進行合計之值,所謂硬化劑之反應基的合計數,係針對全部硬化劑將各硬化劑之固形分質量除以反應基當量之值進行合計之值。藉由將環氧樹脂與硬化劑的量比定為該範圍,更加提昇樹脂組成物層之硬化物的耐熱性。 The ratio of the amount of the epoxy resin to the hardener is in the range of [the total number of epoxy groups of the epoxy resin]: [the total number of the reactive groups of the hardener], preferably in the range of 1:0.01 to 1:2, The ratio is 1:0.015~1:1.5, and more preferably 1:0.02~1:1. Here, the reactive group of the curing agent is an active hydroxyl group, an active ester group or the like, and varies depending on the type of the curing agent. Further, the total number of epoxy groups of the epoxy resin is a total value obtained by dividing the solid content of each epoxy resin by the value of the epoxy equivalent for all epoxy resins, and the total number of reactive groups of the curing agent is The value obtained by dividing the solid content of each hardener by the value of the reactive base equivalent for all the hardeners. By setting the amount ratio of the epoxy resin to the hardener to be in this range, the heat resistance of the cured product of the resin composition layer is further enhanced.

在一實施形態,樹脂組成物係包含先述之環 氧樹脂及硬化劑。樹脂組成物較佳為作為(A)環氧樹脂,係包含液狀環氧樹脂與固體狀環氧樹脂的混合物(液狀環氧樹脂:固體狀環氧樹脂的質量比較佳為1:0.1~1:15,更佳為1:0.3~1:12,再更佳為1:0.6~1:10),作為(B)硬化劑係包含選自由酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯系硬化劑所構成之群組中之1種以上(較佳為選自由活性酯系硬化劑及氰酸酯系硬化劑所構成之群組中之1種以上)。 In one embodiment, the resin composition comprises the aforementioned ring Oxygen resin and hardener. The resin composition is preferably used as the (A) epoxy resin, and comprises a mixture of a liquid epoxy resin and a solid epoxy resin (liquid epoxy resin: the quality of the solid epoxy resin is preferably 1:0.1~) 1:15, more preferably 1:0.3 to 1:12, still more preferably 1:0.6 to 1:10), and the (B) hardener is selected from the group consisting of a phenolic hardener, a naphthol hardener, and an active agent. One or more of the group consisting of an ester-based curing agent and a cyanate-based curing agent (preferably one or more selected from the group consisting of an active ester-based curing agent and a cyanate-based curing agent) .

樹脂組成物中之硬化劑的含量雖並未特別限定,但較佳為30質量%以下,更佳為25質量%以下,再更佳為20質量%以下。又,下限雖並未特別限制,但較佳為2質量%以上。 The content of the curing agent in the resin composition is not particularly limited, but is preferably 30% by mass or less, more preferably 25% by mass or less, still more preferably 20% by mass or less. Further, the lower limit is not particularly limited, but is preferably 2% by mass or more.

<(C)無機填充材> <(C) Inorganic filler>

在一實施形態,樹脂組成物可包含無機填充材。無機填充材的材料雖並未特別限定,但例如可列舉二氧化矽、氧化鋁、玻璃、堇青石、矽氧化物、硫酸鋇、碳酸鋇、滑石、黏土、雲母粉、氧化鋅、水滑石、薄水鋁石、氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、氧化鎂、氮化硼、氮化鋁、氮化錳、硼酸鋁、碳酸鍶、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、氧化鋯、鈦酸鋇、鈦酸鋯酸鋇、鋯酸鋇、鋯酸鈣、磷酸鋯、及磷酸鎢酸鋯等。此等當中,特別適合二氧化矽。作為二氧化矽,例如可列舉無定形二氧化矽、熔融二氧化矽、結晶二氧化矽、合成二氧化矽、中 空二氧化矽等。又,作為二氧化矽,較佳為球狀二氧化矽。無機填充材可1種單獨使用,亦可組合2種以上使用。 In one embodiment, the resin composition may comprise an inorganic filler. The material of the inorganic filler is not particularly limited, and examples thereof include cerium oxide, aluminum oxide, glass, cordierite, cerium oxide, barium sulfate, cerium carbonate, talc, clay, mica powder, zinc oxide, and hydrotalcite. Boehmite, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, boron nitride, aluminum nitride, manganese nitride, aluminum borate, barium carbonate, barium titanate, calcium titanate, titanic acid Magnesium, barium titanate, titanium oxide, zirconium oxide, barium titanate, barium zirconate titanate, barium zirconate, calcium zirconate, zirconium phosphate, zirconium tungstate, and the like. Among these, it is especially suitable for cerium oxide. Examples of the cerium oxide include amorphous cerium oxide, molten cerium oxide, crystalline cerium oxide, and synthetic cerium oxide. Empty ruthenium dioxide and the like. Further, as the cerium oxide, spherical cerium oxide is preferred. The inorganic filler may be used singly or in combination of two or more.

無機填充材的平均粒徑,從高填充無機填充材提昇薄膜絕緣性的觀點來看,較佳為1.5μm以下,更佳為1.3μm以下,再更佳為1.0μm以下,又再更佳為0.9μm以下。該平均粒徑的下限,從提昇樹脂組成物層中之分散性的觀點來看,較佳為0.05μm以上,更佳為0.06μm以上,再更佳為0.07μm以上。作為具有如此平均粒徑之無機填充材的市售品,例如可列舉電氣化學工業(股)製「UFP-30」、新日鐵住金材料(股)製「SPH516-05」、新日鐵住金材料(股)製「SP507-05」等。 The average particle diameter of the inorganic filler is preferably 1.5 μm or less, more preferably 1.3 μm or less, still more preferably 1.0 μm or less, from the viewpoint of improving the insulating properties of the high-filled inorganic filler. Below 0.9 μm. The lower limit of the average particle diameter is preferably 0.05 μm or more, more preferably 0.06 μm or more, and still more preferably 0.07 μm or more from the viewpoint of improving the dispersibility in the resin composition layer. As a commercially available product of the inorganic filler having such an average particle diameter, for example, "UFP-30" manufactured by the Electrochemical Industry Co., Ltd., "SPH516-05" manufactured by Nippon Steel & Sumitomo Metal Co., Ltd., and Nippon Steel & Sumitomo Metal Co., Ltd. Material (stock) system "SP507-05" and so on.

無機填充材的平均粒徑可根據米氏(Mie)散射理論藉由雷射繞射暨散射法測定。具體而言,可藉由雷射繞射散射式粒度分布測定裝置,將無機填充材之粒度分布以體積基準作成,藉由將其中位徑定為平均粒徑來測定。測定樣品可優選使用將無機填充材藉由超音波而分散於甲基乙基酮中者。作為雷射繞射散射式粒度分布測定裝置,可使用(股)島津製作所製「SALD-2200」等。 The average particle size of the inorganic filler can be determined by laser diffraction and scattering according to the Mie scattering theory. Specifically, the particle size distribution of the inorganic filler can be prepared on a volume basis by a laser diffraction scattering type particle size distribution measuring apparatus, and the median diameter can be determined by setting the median diameter to an average particle diameter. As the measurement sample, those in which the inorganic filler is dispersed in methyl ethyl ketone by ultrasonic waves can be preferably used. As the laser diffraction scattering type particle size distribution measuring apparatus, "SALD-2200" manufactured by Shimadzu Corporation can be used.

無機填充材之比表面積,從降低後述之樹脂組成物層的最低熔融黏度的觀點來看,較佳為40m2/g以下,更佳為37m2/g以下,再更佳為33m2/g以下。該比表面積的下限,從維持樹脂組成物層之適當黏彈性的觀點來看,較佳為1m2/g以上,更佳為2m2/g以上,再更佳為 5m2/g以上。比表面積例如可使用BET全自動比表面積測定裝置((股)Mountech製、Macsorb HM-1210)測定。 The specific surface area of the inorganic filler, the melt viscosity of the lowest point of view of said resin composition layer is reduced from the point of view, is preferably 40m 2 / g or less, more preferably 37m 2 / g or less, and still more preferably 33m 2 / g the following. The lower limit of the specific surface area is preferably 1 m 2 /g or more, more preferably 2 m 2 /g or more, and still more preferably 5 m 2 /g or more from the viewpoint of maintaining proper viscoelasticity of the resin composition layer. The specific surface area can be measured, for example, using a BET fully automatic specific surface area measuring device (manufactured by Mountech Co., Ltd., Macsorb HM-1210).

無機填充材的真密度,從提昇樹脂組成物層中之分散性的觀點來看,較佳為15g/cm3以下,更佳為10g/cm3以下,再更佳為5g/cm3以下。該真密度的下限較佳為1g/cm3以上,更佳為1.5g/cm3以上,再更佳為2.0g/cm3以上。真密度例如可使用微超比重計(康塔儀器日本製、MUPY-21T)測定。 The true density of the inorganic filler is preferably 15 g/cm 3 or less, more preferably 10 g/cm 3 or less, still more preferably 5 g/cm 3 or less from the viewpoint of improving the dispersibility in the resin composition layer. The lower limit of the true density is preferably 1 g/cm 3 or more, more preferably 1.5 g/cm 3 or more, still more preferably 2.0 g/cm 3 or more. The true density can be measured, for example, using a micro-superdensimeter (Conta Instruments Japan, MUPY-21T).

無機填充材從提高耐濕性及分散性的觀點來看,較佳為以矽烷耦合劑、烷氧基矽烷化合物、及有機矽氮烷化合物等之至少1種的表面處理劑進行表面處理。此等可為寡聚物。作為表面處理劑之例,可列舉胺基矽烷系耦合劑、環氧矽烷系耦合劑、巰基矽烷系耦合劑等之矽烷系耦合劑、烷氧基矽烷化合物、有機矽氮烷化合物、鈦酸酯系耦合劑等。作為表面處理劑之市售品,例如可列舉信越化學工業(股)製「KBM403」(3-環氧丙氧基丙基三甲氧基矽烷)、信越化學工業(股)製「KBM803」(3-巰基丙基三甲氧基矽烷)、信越化學工業(股)製「KBE903」(3-胺基丙基三乙氧基矽烷)、信越化學工業(股)製「KBM573」(N-苯基-3-胺基丙基三甲氧基矽烷)、信越化學工業(股)製「SZ-31」(六甲基二矽氮烷)、信越化學工業(股)製「KBM103」(苯基三甲氧基矽烷)、信越化學工業(股)製「KBM-4803」(長鏈環氧型矽烷耦合劑)等。表面處理劑可1種類單獨使用,亦可組合2種類以上使用。 The inorganic filler is preferably subjected to surface treatment with at least one surface treatment agent such as a decane coupling agent, an alkoxydecane compound, or an organic decazane compound from the viewpoint of improving moisture resistance and dispersibility. These may be oligomers. Examples of the surface treatment agent include a decane-based coupling agent such as an amino decane-based coupling agent, an epoxy decane-based coupling agent, and a mercapto decane-based coupling agent, an alkoxydecane compound, an organic decazane compound, and a titanate. Coupling agent, etc. For example, "KBM403" (3-glycidoxypropyltrimethoxydecane) manufactured by Shin-Etsu Chemical Co., Ltd., and "KBM803" manufactured by Shin-Etsu Chemical Co., Ltd. (3) are commercially available as a surface treatment agent. "Methyl propyl trimethoxy decane", "KBE903" (3-aminopropyltriethoxy decane) manufactured by Shin-Etsu Chemical Co., Ltd., "KBM573" (N-phenyl-based) manufactured by Shin-Etsu Chemical Co., Ltd. "3-Aminopropyltrimethoxydecane", "SZ-31" (hexamethyldioxane) manufactured by Shin-Etsu Chemical Co., Ltd., "KBM103" (phenyltrimethoxy) manufactured by Shin-Etsu Chemical Co., Ltd.矽 )), "KBM-4803" (long-chain epoxy decane coupling agent) manufactured by Shin-Etsu Chemical Co., Ltd. The surface treatment agent may be used alone or in combination of two or more.

藉由表面處理劑之表面處理的程度,可藉由無機填充材之每一單位表面積的碳量評估。無機填充材之每一單位表面積的碳量,從提昇無機填充材之分散性的觀點來看,較佳為0.02mg/m2以上,更佳為0.1mg/m2以上,再更佳為0.2mg/m2以上。另一方面,從抑制樹脂清漆的熔融黏度及於薄片形態之熔融黏度的上昇的觀點來看,較佳為1mg/m2以下,更佳為0.8mg/m2以下,再更佳為0.5mg/m2以下。 The degree of surface treatment by the surface treatment agent can be evaluated by the amount of carbon per unit surface area of the inorganic filler. The amount of carbon per unit surface area of the inorganic filler is preferably 0.02 mg/m 2 or more, more preferably 0.1 mg/m 2 or more, still more preferably 0.2 from the viewpoint of improving the dispersibility of the inorganic filler. Mg/m 2 or more. On the other hand, from the viewpoint of suppressing the melt viscosity of the resin varnish and the increase in the melt viscosity of the sheet form, it is preferably 1 mg/m 2 or less, more preferably 0.8 mg/m 2 or less, still more preferably 0.5 mg. /m 2 or less.

無機填充材之每一單位表面積的碳量,可將表面處理後之無機填充材藉由溶劑(例如甲基乙基酮(MEK))進行洗淨處理後來測定。具體而言,作為溶劑,將足夠量之MEK加在以表面處理劑表面處理之無機填充材,於25℃進行5分鐘超音波洗淨。去除上清液,使固形分乾燥後,可使用碳分析計測定無機填充材之每一單位表面積的碳量。作為碳分析計,可使用(股)堀場製作所製「EMIA-320V」等。 The amount of carbon per unit surface area of the inorganic filler can be measured by washing the surface-treated inorganic filler with a solvent such as methyl ethyl ketone (MEK). Specifically, as a solvent, a sufficient amount of MEK was added to the inorganic filler surface-treated with a surface treatment agent, and ultrasonic cleaning was performed at 25 ° C for 5 minutes. After removing the supernatant and drying the solid portion, the amount of carbon per unit surface area of the inorganic filler can be measured using a carbon analyzer. As the carbon analyzer, "EMIA-320V" manufactured by Horiba Ltd. can be used.

樹脂組成物中之無機填充材的含量(填充量),從提昇樹脂組成物層的厚度安定性、以及降低絕緣層(樹脂組成物層的硬化物)之介電正切的觀點來看,將樹脂組成物中之不揮發成分定為100質量%時為50質量%以上,較佳為55質量%以上,更佳為60質量%以上。樹脂組成物中之無機填充材的含量的上限,從提昇薄膜絕緣性的觀點來看,較佳為85質量%以下,更佳為80質量%以下。 The content (filling amount) of the inorganic filler in the resin composition is from the viewpoint of improving the thickness stability of the resin composition layer and reducing the dielectric tangent of the insulating layer (hardened material of the resin composition layer). When the nonvolatile content in the composition is 100% by mass, it is 50% by mass or more, preferably 55% by mass or more, and more preferably 60% by mass or more. The upper limit of the content of the inorganic filler in the resin composition is preferably 85% by mass or less, and more preferably 80% by mass or less from the viewpoint of improving the insulating properties of the film.

<(D)熱塑性樹脂> <(D) Thermoplastic Resin>

本發明之樹脂組成物可進一步含有(D)熱塑性樹脂。 The resin composition of the present invention may further contain (D) a thermoplastic resin.

作為熱塑性樹脂,例如可列舉苯氧基樹脂、聚乙烯縮醛樹脂、聚烯烴樹脂、聚丁二烯樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚醯亞胺樹脂、聚碸樹脂、聚醚碸樹脂、聚伸苯基醚樹脂、聚碳酸酯樹脂、聚醚醚酮樹脂、聚酯樹脂,較佳為苯氧基樹脂。熱塑性樹脂可1種單獨使用、或組合2種以上使用。 Examples of the thermoplastic resin include a phenoxy resin, a polyvinyl acetal resin, a polyolefin resin, a polybutadiene resin, a polyimine resin, a polyamidimide resin, a polyether phthalimide resin, and a poly An anthracene resin, a polyether oxime resin, a polyphenylene ether resin, a polycarbonate resin, a polyether ether ketone resin, a polyester resin, preferably a phenoxy resin. The thermoplastic resin may be used singly or in combination of two or more.

熱塑性樹脂之聚苯乙烯換算的重量平均分子量較佳為8,000~70,000的範圍,更佳為10,000~60,000的範圍,再更佳為20,000~60,000的範圍。熱塑性樹脂之聚苯乙烯換算的重量平均分子量係以凝膠滲透層析(GPC)法測定。具體而言,熱塑性樹脂之聚苯乙烯換算的重量平均分子量,作為測定裝置,係使用(股)島津製作所製LC-9A/RID-6A,作為管柱,係使用昭和電工(股)製Shodex K-800P/K-804L/K-804L,作為移動相,係使用氯仿等,將管柱溫度在40℃測定,可使用標準聚苯乙烯之檢量線算出。 The polystyrene-equivalent weight average molecular weight of the thermoplastic resin is preferably in the range of 8,000 to 70,000, more preferably in the range of 10,000 to 60,000, still more preferably in the range of 20,000 to 60,000. The polystyrene-equivalent weight average molecular weight of the thermoplastic resin is measured by a gel permeation chromatography (GPC) method. Specifically, the polystyrene-equivalent weight average molecular weight of the thermoplastic resin is used as a measuring device, and LC-9A/RID-6A manufactured by Shimadzu Corporation is used as a column, and Shodex K manufactured by Showa Denko Co., Ltd. is used. -800P/K-804L/K-804L, as a mobile phase, using chloroform or the like, the column temperature is measured at 40 ° C, and can be calculated using a standard polystyrene calibration line.

作為苯氧基樹脂,例如可列舉具有選自由雙酚A骨架、雙酚F骨架、雙酚S骨架、雙酚苯乙酮骨架、酚醛清漆骨架、聯苯骨架、茀骨架、二環戊二烯骨架、降莰烯骨架、萘骨架、蔥骨架、金剛烷骨架、萜烯骨架、及三甲基環己烷骨架所構成之群組中之1種以上骨架的苯氧基樹脂。苯氧基樹脂的末端可為酚性羥基、環氧基 等之任一官能基。苯氧基樹脂可1種單獨使用,亦可組合2種以上使用。作為苯氧基樹脂之具體例,可列舉三菱化學(股)製之「1256」及「4250」(皆為含有雙酚A骨架之苯氧基樹脂)、「YX8100」(含有雙酚S骨架之苯氧基樹脂)、及「YX6954」(含有雙酚苯乙酮骨架之苯氧基樹脂),其他,亦可列舉新日鐵住金化學(股)製之「FX280」及「FX293」、三菱化學(股)製之「YX6954BH30」、「YX7553」、「YX7553BH30」、「YL7769BH30」、「YL6794」、「YL7213」、「YL7290」及「YL7482」等。 The phenoxy resin may, for example, be selected from the group consisting of a bisphenol A skeleton, a bisphenol F skeleton, a bisphenol S skeleton, a bisphenol acetophenone skeleton, a novolak skeleton, a biphenyl skeleton, an anthracene skeleton, and a dicyclopentadiene. a phenoxy resin having one or more skeletons in the group consisting of a skeleton, a norbornene skeleton, a naphthalene skeleton, an onion skeleton, an adamantane skeleton, a terpene skeleton, and a trimethylcyclohexane skeleton. The terminal of the phenoxy resin may be a phenolic hydroxyl group or an epoxy group. Any of the functional groups. The phenoxy resin may be used alone or in combination of two or more. Specific examples of the phenoxy resin include "1256" and "4250" (both phenoxy resins containing a bisphenol A skeleton) and "YX8100" (including a bisphenol S skeleton) manufactured by Mitsubishi Chemical Corporation. "Phenoxy resin", and "YX6954" (phenoxy resin containing bisphenol acetophenone skeleton), and others, "FX280" and "FX293" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., Mitsubishi Chemical Corporation (YX6954BH30), "YX7553", "YX7553BH30", "YL7769BH30", "YL6794", "YL7213", "YL7290" and "YL7482", etc.

作為聚乙烯縮醛樹脂,例如可列舉聚乙烯縮甲醛樹脂、聚乙烯縮丁醛樹脂,較佳為聚乙烯縮丁醛樹脂。作為聚乙烯縮醛樹脂之具體例,例如可列舉電氣化學工業(股)製之「電化縮丁醛4000-2」、「電化縮丁醛5000-A」、「電化縮丁醛6000-C」、「電化縮丁醛6000-EP」、積水化學工業(股)製之S-LEC BH系列、BX系列(例如BX-5Z)、KS系列(例如KS-1)、BL系列、BM系列等。 Examples of the polyvinyl acetal resin include a polyvinyl formal resin and a polyvinyl butyral resin, and a polyvinyl butyral resin is preferable. Specific examples of the polyvinyl acetal resin include "electrodinated butyral 4000-2", "electrodinated butyral 5000-A", and "electrodinated butyral 6000-C" manufactured by Electrochemical Industry Co., Ltd. "S-LEC BH series, BX series (for example, BX-5Z), KS series (for example, KS-1), BL series, BM series, etc., manufactured by Sekisui Chemicals Co., Ltd.".

作為聚醯亞胺樹脂之具體例,可列舉新日本理化(股)製之「RIKACOAT SN20」及「RIKACOAT PN20」。作為聚醯亞胺樹脂之具體例,又,可列舉使2官能性羥基末端聚丁二烯、二異氰酸酯化合物及四元酸酐反應所得之線狀聚醯亞胺(日本特開2006-37083號公報記載之聚醯亞胺)、含有聚矽氧烷骨架之聚醯亞胺(日本特開 2002-12667號公報及日本特開2000-319386號公報等所記載之聚醯亞胺)等之改質聚醯亞胺。 Specific examples of the polyimine resin include "RIKACOAT SN20" and "RIKACOAT PN20" manufactured by Nippon Chemical and Chemical Co., Ltd. Specific examples of the polyimine resin include a linear polyimine obtained by reacting a bifunctional hydroxyl-terminated polybutadiene, a diisocyanate compound, and a tetrabasic acid anhydride (JP-A-2006-37083) Polyimine described), polyimine containing polyoxyalkylene skeleton (Japanese special open A modified polyimine such as polyethylenimine described in JP-A-2000-319386, and the like.

作為聚醯胺醯亞胺樹脂之具體例,可列舉東洋紡績(股)製之「VYLOMAX HR11NN」及「VYLOMAX HR16NN」。作為聚醯胺醯亞胺樹脂之具體例,又,可列舉日立化成工業(股)製之「KS9100」、「KS9300」(含有聚矽氧烷骨架之聚醯胺醯亞胺)等之改質聚醯胺醯亞胺。 Specific examples of the polyamidoximine resin include "VYLOMAX HR11NN" and "VYLOMAX HR16NN" manufactured by Toyobo Co., Ltd. Further, as a specific example of the polyamidoximine resin, a modification of "KS9100" and "KS9300" (polyamide containing a polyoxyalkylene skeleton) manufactured by Hitachi Chemical Co., Ltd. Polyamidoximine.

作為聚醚碸樹脂之具體例,可列舉住友化學(股)製之「PES5003P」等。 Specific examples of the polyether oxime resin include "PES5003P" manufactured by Sumitomo Chemical Co., Ltd., and the like.

作為聚碸樹脂之具體例,可列舉Solvay Advanced Polymers(股)製之聚碸「P1700」、「P3500」等。 Specific examples of the polybenzazole resin include polydiprene "P1700" and "P3500" manufactured by Solvay Advanced Polymers Co., Ltd.

作為聚伸苯基醚樹脂之具體例,可列舉三菱瓦斯化學(股)製之寡伸苯基醚暨苯乙烯樹脂「OPE-2St1200」、「OPE-2St2200」、SABIC製「NORYL SA90」等。 Specific examples of the polyphenylene ether resin include oligophenylene styrene resin and styrene resin "OPE-2St1200", "OPE-2St2200" manufactured by Mitsubishi Gas Chemical Co., Ltd., and "NORYL SA90" manufactured by SABIC.

作為熱塑性樹脂,較佳為苯氧基樹脂、聚伸苯基醚樹脂、聚乙烯縮醛樹脂。據此,在適合之一實施形態,熱塑性樹脂係包含選自由苯氧基樹脂、聚伸苯基醚樹脂及聚乙烯縮醛樹脂所構成之群組中之1種以上。從疏水性高,且可降低在高溫之樹脂組成物層的硬化物之介電正切的觀點來看,更佳為苯氧基樹脂、聚伸苯基醚樹脂。 The thermoplastic resin is preferably a phenoxy resin, a polyphenylene ether resin or a polyvinyl acetal resin. According to one embodiment, the thermoplastic resin is one or more selected from the group consisting of a phenoxy resin, a polyphenylene ether resin, and a polyvinyl acetal resin. From the viewpoint of high hydrophobicity and a reduction in the dielectric tangent of the cured product of the resin composition layer at a high temperature, a phenoxy resin or a polyphenylene ether resin is more preferable.

樹脂組成物含有熱塑性樹脂的情況下,熱塑性樹脂的含量較佳為0.5質量%~10質量%,更佳為0.6 質量%~6質量%,再更佳為0.7質量%~5質量%。 When the resin composition contains a thermoplastic resin, the content of the thermoplastic resin is preferably from 0.5% by mass to 10% by mass, more preferably 0.6% by mass. The mass % to 6 mass%, and more preferably 0.7 mass% to 5 mass%.

<(E)硬化促進劑> <(E) hardening accelerator>

本發明之樹脂組成物可進一步含有(E)硬化促進劑。 The resin composition of the present invention may further contain (E) a hardening accelerator.

作為硬化促進劑,例如可列舉磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑、胍系硬化促進劑、金屬系硬化促進劑、有機過氧化物系硬化促進劑等,較佳為磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑、金屬系硬化促進劑,更佳為胺系硬化促進劑、咪唑系硬化促進劑、金屬系硬化促進劑。硬化促進劑可1種單獨使用,亦可組合2種以上使用。 Examples of the curing accelerator include a phosphorus-based curing accelerator, an amine-based curing accelerator, an imidazole-based curing accelerator, an lanthanum-based curing accelerator, a metal-based curing accelerator, and an organic peroxide-based curing accelerator. The phosphorus-based curing accelerator, the amine-based curing accelerator, the imidazole-based curing accelerator, and the metal-based curing accelerator are more preferably an amine-based curing accelerator, an imidazole-based curing accelerator, or a metal-based curing accelerator. The curing accelerator may be used alone or in combination of two or more.

作為磷系硬化促進劑,例如可列舉三苯基膦、鏻硼酸酯化合物、四苯基鏻四苯基硼酸酯、n-丁基鏻四苯基硼酸酯、四丁基鏻癸酸鹽、(4-甲基苯基)三苯基鏻硫氰酸酯、四苯基鏻硫氰酸酯、丁基三苯基鏻硫氰酸酯等,較佳為三苯基膦、四丁基鏻癸酸鹽。 Examples of the phosphorus-based hardening accelerator include triphenylphosphine, bismuth borate compound, tetraphenylphosphonium tetraphenyl borate, n-butyl phosphotetraphenyl borate, and tetrabutyl decanoic acid. a salt, (4-methylphenyl)triphenylphosphonium thiocyanate, tetraphenylphosphonium thiocyanate, butyltriphenylphosphonium thiocyanate, etc., preferably triphenylphosphine, tetrabutyl Sulfate.

作為胺系硬化促進劑,例如可列舉三乙基胺、三丁基胺等之三烷基胺、4-二甲基胺基吡啶、苄基二甲基胺、2,4,6,-參(二甲基胺基甲基)酚、1,8-二氮雜雙環(5,4,0)-十一碳烯等,較佳為4-二甲基胺基吡啶、1,8-二氮雜雙環(5,4,0)-十一碳烯。 Examples of the amine-based curing accelerator include a trialkylamine such as triethylamine or tributylamine, 4-dimethylaminopyridine, benzyldimethylamine, 2,4,6, and a ginseng. (dimethylaminomethyl) phenol, 1,8-diazabicyclo(5,4,0)-undecene, etc., preferably 4-dimethylaminopyridine, 1,8-di Azabicyclo(5,4,0)-undecene.

作為咪唑系硬化促進劑,例如可列舉2-甲基咪唑、2-十一烷基咪唑、2-十七烷基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基 咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、1-苄基-2-甲基咪唑、1-苄基-2-苯基咪唑、1-氰基乙基-2-甲基咪唑、1-氰基乙基-2-十一烷基咪唑、1-氰基乙基-2-乙基-4-甲基咪唑、1-氰基乙基-2-苯基咪唑、1-氰基乙基-2-十一烷基咪唑鎓偏苯三酸酯、1-氰基乙基-2-苯基咪唑鎓偏苯三酸酯、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-十一烷基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-乙基-4’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪異氰脲酸加成物、2-苯基咪唑異氰脲酸加成物、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑、2,3-二氫-1H-吡咯并[1,2-a]苯并咪唑、1-十二烷基-2-甲基-3-苄基咪唑鎓氯化物、2-甲基咪唑啉、2-苯基咪唑啉等之咪唑化合物及咪唑化合物與環氧樹脂的加成物,較佳為2-乙基-4-甲基咪唑、1-苄基-2-苯基咪唑。 Examples of the imidazole-based hardening accelerator include 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, and 2-ethyl-4-methyl group. Imidazole, 1,2-dimethylimidazole, 2-ethyl-4-methyl Imidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2-methylimidazole, 1-benzyl-2-phenylimidazole, 1-cyanoethyl-2- Methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl-2-ethyl-4-methylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-undecylimidinium trimellitate, 1-cyanoethyl-2-phenylimidazolium trimellitate, 2,4-diamino-6- [2'-Methylimidazolyl-(1')]-ethyl-s-triazine, 2,4-diamino-6-[2'-undecylimidazolyl-(1')]- Ethyl-s-triazine, 2,4-diamino-6-[2'-ethyl-4'-methylimidazolyl-(1')]-ethyl-s-triazine, 2,4 -diamino-6-[2'-methylimidazolyl-(1')]-ethyl-s-triazine isocyanuric acid adduct, 2-phenylimidazole isocyanuric acid adduct, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole, 2,3-dihydro-1H-pyrrolo[1,2-a] Imidazole compound of benzimidazole, 1-dodecyl-2-methyl-3-benzylimidazolium chloride, 2-methylimidazoline, 2-phenylimidazoline, etc., and an imidazole compound and an epoxy resin An adduct, preferably 2-ethyl-4-methylimidazole , 1-benzyl-2-phenylimidazole.

作為咪唑系硬化促進劑,可使用市售品,例如可列舉三菱化學(股)製之「P200-H50」、四國化成工業(股)製之「1B2PZ」等。 As the imidazole-based hardening accelerator, a commercially available product can be used, and examples thereof include "P200-H50" manufactured by Mitsubishi Chemical Corporation and "1B2PZ" manufactured by Shikoku Chemical Industries Co., Ltd.

作為胍系硬化促進劑,例如可列舉雙氰胺、1-甲基胍、1-乙基胍、1-環己基胍、1-苯基胍、1-(o-甲苯基)胍、二甲基胍、二苯基胍、三甲基胍、四甲基胍、五甲基胍、1,5,7-三氮雜雙環[4.4.0]癸-5-烯、7-甲基-1,5,7-三氮雜雙環[4.4.0]癸-5-烯、1-甲基雙胍、1-乙基雙胍、1-n-丁基雙胍、1-n-十八烷基雙胍、1,1-二甲基雙胍、1,1-二 乙基雙胍、1-環己基雙胍、1-烯丙基雙胍、1-苯基雙胍、1-(o-甲苯基)雙胍等,較佳為雙氰胺、1,5,7-三氮雜雙環[4.4.0]癸-5-烯。 Examples of the oxime-based hardening accelerator include dicyandiamide, 1-methyl hydrazine, 1-ethyl hydrazine, 1-cyclohexyl hydrazine, 1-phenyl fluorene, 1-(o-methylphenyl) fluorene, and dimethyl Base, diphenyl hydrazine, trimethyl hydrazine, tetramethyl hydrazine, pentamethyl hydrazine, 1,5,7-triazabicyclo[4.4.0]non-5-ene, 7-methyl-1 , 5,7-triazabicyclo[4.4.0]non-5-ene, 1-methylbiguanide, 1-ethylbiguanide, 1-n-butylbiguanide, 1-n-octadecylbiguanide, 1,1-dimethylbiguanide, 1,1-di Ethyl biguanide, 1-cyclohexyl biguanide, 1-allyl biguanide, 1-phenylbiguanide, 1-(o-methylphenyl)biguanide, etc., preferably dicyandiamide, 1,5,7-triaza Bicyclo [4.4.0] 癸-5-ene.

作為金屬系硬化促進劑,例如可列舉鈷、銅、鋅、鐵、鎳、錳、錫等金屬之有機金屬錯合物或有機金屬鹽。作為有機金屬錯合物之具體例,可列舉乙醯丙酮酸鈷(II)、乙醯丙酮酸鈷(III)等之有機鈷錯合物、乙醯丙酮酸銅(II)等之有機銅錯合物、乙醯丙酮酸鋅(II)等之有機鋅錯合物、乙醯丙酮酸鐵(III)等之有機鐵錯合物、乙醯丙酮酸鎳(II)等之有機鎳錯合物、乙醯丙酮酸錳(II)等之有機錳錯合物等。作為有機金屬鹽,例如可列舉辛酸鋅、辛酸錫、環烷酸鋅、環烷酸鈷、硬脂酸錫、硬脂酸鋅等。 Examples of the metal-based curing accelerator include organic metal complexes or organic metal salts of metals such as cobalt, copper, zinc, iron, nickel, manganese, and tin. Specific examples of the organic metal complex include organic cobalt complexes such as cobalt(II) acetylacetonate, cobalt(III) acetoacetate, and copper (II) such as copper(II) pyruvate. Organic zinc complex such as zinc acetylate (II), organic iron complex such as iron(III) pyruvate, and organic nickel complex of nickel(II) acetate An organic manganese complex such as acetaminophen (II) pyruvate or the like. Examples of the organic metal salt include zinc octoate, tin octylate, zinc naphthenate, cobalt naphthenate, tin stearate, and zinc stearate.

作為有機過氧化物系硬化促進劑,例如可列舉二枯基過氧化物、環己酮過氧化物、tert-丁基過氧苯甲酸酯、甲基乙基酮過氧化物、二枯基過氧化物、tert-丁基枯基過氧化物、二-tert-丁基過氧化物、二異丙基苯過氧化氫、異丙苯過氧化氫、tert-丁基過氧化氫等。作為有機過氧化物系硬化促進劑,可使用市售品,例如可列舉日油公司製之「PERCUMYL D」等。 Examples of the organic peroxide-based hardening accelerator include dicumyl peroxide, cyclohexanone peroxide, tert-butyl peroxybenzoate, methyl ethyl ketone peroxide, and dicumyl. Peroxide, tert-butyl cumyl peroxide, di-tert-butyl peroxide, diisopropylbenzene hydroperoxide, cumene hydroperoxide, tert-butyl hydroperoxide, and the like. A commercially available product can be used as the organic peroxide-based hardening accelerator, and examples thereof include "PERCUMYL D" manufactured by Nippon Oil Co., Ltd., and the like.

樹脂組成物中之硬化促進劑的含量雖並未特別限定,但較佳為將環氧樹脂與硬化劑之不揮發成分定為100質量%時為0.01質量%~3質量%。 The content of the curing accelerator in the resin composition is not particularly limited, but is preferably 0.01% by mass to 3% by mass when the nonvolatile content of the epoxy resin and the curing agent is 100% by mass.

<(F)難燃劑> <(F) flame retardant>

本發明之樹脂組成物可進一步包含(F)難燃劑。作為難燃劑,例如可列舉有機磷系難燃劑、含有有機系氮之磷化合物、氮化合物、矽氧系難燃劑、金屬氫氧化物等。難燃劑可1種單獨使用,亦可併用2種以上。 The resin composition of the present invention may further comprise (F) a flame retardant. Examples of the flame retardant include an organic phosphorus-based flame retardant, a phosphorus compound containing an organic nitrogen, a nitrogen compound, a xenon-based flame retardant, and a metal hydroxide. The flame retardant may be used alone or in combination of two or more.

作為難燃劑,可使用市售品,例如可列舉三光(股)製之「HCA-HQ」、大八化學工業(股)製之「PX-200」等。作為難燃劑,較佳為難以水解者,例如較佳為10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲-10-氧化物等。 As a flame retardant, a commercially available product can be used, and examples thereof include "HCA-HQ" manufactured by Sanko Co., Ltd., and "PX-200" manufactured by Daiha Chemical Industry Co., Ltd., and the like. As the flame retardant, those which are difficult to be hydrolyzed are preferable, and for example, 10-(2,5-dihydroxyphenyl)-10-hydro-9-oxa-10-phosphaphenanthrene-10-oxide or the like is preferable.

樹脂組成物含有難燃劑的情況下,難燃劑的含量雖並未特別限定,但以較佳為0.5質量%~20質量%,更佳為0.5質量%~15質量%,再更佳為0.5質量%~10質量%再更佳。 When the resin composition contains a flame retardant, the content of the flame retardant is not particularly limited, but is preferably 0.5% by mass to 20% by mass, more preferably 0.5% by mass to 15% by mass, even more preferably 0.5% by mass to 10% by mass is more preferable.

<(G)有機填充材> <(G) organic filler>

樹脂組成物從降低樹脂組成物層的硬化物之介電正切的觀點來看,可包含(G)有機填充材。作為有機填充材,可使用形成印刷配線板之絕緣層時所使用之任意有機填充材,例如可列舉橡膠粒子、聚醯胺微粒子、矽氧粒子等。 The resin composition may contain (G) an organic filler from the viewpoint of lowering the dielectric tangent of the cured product of the resin composition layer. As the organic filler, any organic filler used in forming the insulating layer of the printed wiring board can be used, and examples thereof include rubber particles, polyamide fine particles, and xenon particles.

作為橡膠粒子,可使用市售品,例如可列舉陶氏化學日本(股)製之「EXL2655」、AICA工業(股)製之「AC3401N」、「AC3816N」等。 Commercially available products can be used as the rubber particles, and examples thereof include "EXL 2655" manufactured by Dow Chemical Co., Ltd., "AC3401N" manufactured by AICA Industrial Co., Ltd., and "AC3816N".

作為橡膠粒子,從離子性低,可降低樹脂組成物層的硬化物之介電正切的觀點來看,例如較佳為 AICA工業(股)製之「AC3816N」、「AC3401N」等。 The rubber particles are preferably low in ionicity and can reduce the dielectric tangent of the cured product of the resin composition layer. "AC3816N" and "AC3401N" manufactured by AICA Industrial Co., Ltd.

樹脂組成物含有有機填充材的情況下,有機填充材的含量較佳為0.1質量%~20質量%,更佳為0.2質量%~10質量%,再更佳為0.3質量%~5質量%、或0.5質量%~3質量%。 When the resin composition contains an organic filler, the content of the organic filler is preferably from 0.1% by mass to 20% by mass, more preferably from 0.2% by mass to 10% by mass, even more preferably from 0.3% by mass to 5% by mass, Or 0.5% by mass to 3% by mass.

<(H)其他添加劑> <(H) Other additives>

樹脂組成物進而如有必要可包含其他添加劑,作為該其他添加劑,例如可列舉有機銅化合物、有機鋅化合物及有機鈷化合物等之有機金屬化合物、以及增黏劑、消泡劑、整平劑、密著性賦予劑、及著色劑等之樹脂添加劑等。 The resin composition may further contain other additives as necessary, and examples of the other additives include organometallic compounds such as an organic copper compound, an organic zinc compound, and an organic cobalt compound, and an adhesion promoter, an antifoaming agent, and a leveling agent. A resin additive such as a tackifier or a coloring agent.

本發明之樹脂薄片帶來薄膜絕緣性優異之絕緣層(樹脂組成物層的硬化物)。據此,本發明之樹脂薄片可適合作為用以形成印刷配線板之絕緣層的(印刷配線板之絕緣層形成用之)樹脂薄片使用,可更適合作為用以形成印刷配線板之層間絕緣層的樹脂薄片(印刷配線板之層間絕緣層用樹脂薄片)使用。又,例如在具備第1導體層、與第2導體層、與設置於第1導體層及第2導體層之間的絕緣層之印刷配線板,藉由由本發明之樹脂薄片形成絕緣層,可成為第1及第2導體層間之絕緣層的厚度為6μm以下(較佳為5.5μm以下,更佳為5μm以下)並且絕緣性能優異者。在適合之一實施形態,本發明之樹脂薄片係包含第1導體層、與第2導體層、與絕緣第1導體層與第 2導體層之絕緣層,第1導體層與第2導體層之間之絕緣層的厚度為6μm以下之印刷配線板的絕緣層形成用。 The resin sheet of the present invention provides an insulating layer (hardened product of a resin composition layer) excellent in film insulating properties. Accordingly, the resin sheet of the present invention can be suitably used as a resin sheet for forming an insulating layer of a printed wiring board (for forming an insulating layer of a printed wiring board), and can be more suitably used as an interlayer insulating layer for forming a printed wiring board. The resin sheet (resin sheet for the interlayer insulating layer of the printed wiring board) is used. Further, for example, in the printed wiring board including the first conductor layer, the second conductor layer, and the insulating layer provided between the first conductor layer and the second conductor layer, the insulating layer can be formed of the resin sheet of the present invention. The thickness of the insulating layer between the first and second conductor layers is 6 μm or less (preferably 5.5 μm or less, more preferably 5 μm or less) and the insulating property is excellent. In a preferred embodiment, the resin sheet of the present invention comprises a first conductor layer, a second conductor layer, and an insulating first conductor layer and The insulating layer of the two-conductor layer is formed of an insulating layer of a printed wiring board having a thickness of an insulating layer between the first conductor layer and the second conductor layer of 6 μm or less.

[樹脂薄片] [resin sheet]

本發明之樹脂薄片係具備支持體、與設置於該支持體上之樹脂組成物層,樹脂組成物層係由樹脂組成物形成。 The resin sheet of the present invention comprises a support and a resin composition layer provided on the support, and the resin composition layer is formed of a resin composition.

樹脂組成物層的厚度從印刷配線板之薄型化的觀點來看,較佳為15μm以下,更佳為12μm以下,再更佳為10μm以下,又再更佳為8μm以下。樹脂組成物層的厚度的下限雖並未特別限定,但通常可成為1μm以上、1.5μm以上、2μm以上等。 The thickness of the resin composition layer is preferably 15 μm or less, more preferably 12 μm or less, still more preferably 10 μm or less, still more preferably 8 μm or less from the viewpoint of thickness reduction of the printed wiring board. The lower limit of the thickness of the resin composition layer is not particularly limited, but may be usually 1 μm or more, 1.5 μm or more, 2 μm or more.

作為支持體,例如可列舉由塑膠材料所構成之薄膜、金屬箔、脫模紙,較佳為由塑膠材料所構成之薄膜、金屬箔。 Examples of the support include a film made of a plastic material, a metal foil, and a release paper, and a film made of a plastic material or a metal foil is preferable.

作為支持體,使用由塑膠材料所構成之薄膜的情況,作為塑膠材料,例如可列舉聚對苯二甲酸乙二酯(以下有時簡稱為「PET」)、聚萘二甲酸乙二酯(以下有時簡稱為「PEN」)等之聚酯、聚碳酸酯(以下有時簡稱為「PC」)、聚甲基甲基丙烯酸酯(PMMA)等之丙烯醯基、環狀聚烯烴、三乙醯基纖維素(TAC)、聚醚硫化物(PES)、聚醚酮、聚醯亞胺等。其中,較佳為聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯,特佳為便宜之聚對苯二甲酸乙二酯。 When a film made of a plastic material is used as the support, examples of the plastic material include polyethylene terephthalate (hereinafter sometimes abbreviated as "PET") and polyethylene naphthalate (hereinafter, Polyester, polycarbonate (hereinafter sometimes abbreviated as "PC"), polymethyl methacrylate (PMMA), etc., etc. Mercapto cellulose (TAC), polyether sulfide (PES), polyether ketone, polyimine, and the like. Among them, polyethylene terephthalate or polyethylene naphthalate is preferred, and polyethylene terephthalate is particularly preferred.

作為支持體,使用金屬箔的情況,作為金屬箔,例如可列舉銅箔、鋁箔等,較佳為銅箔。作為銅箔, 可使用由銅之單金屬所構成之箔,亦可使用由銅與其他金屬(例如錫、鉻、銀、鎂、鎳、鋯、矽、鈦等)的合金所構成之箔。 In the case of using a metal foil as the support, examples of the metal foil include a copper foil, an aluminum foil, and the like, and a copper foil is preferable. As a copper foil, A foil composed of a single metal of copper may be used, or a foil composed of an alloy of copper and other metals such as tin, chromium, silver, magnesium, nickel, zirconium, hafnium, titanium, or the like may be used.

支持體可於與樹脂組成物層接合的面實施消光處理、電暈處理、抗靜電處理。 The support can be subjected to matting treatment, corona treatment, and antistatic treatment on the surface joined to the resin composition layer.

又,作為支持體,可使用於與樹脂組成物層接合的面具有脫模層之附脫模層之支持體。作為附脫模層之支持體的脫模層所使用之脫模劑,例如可列舉選自由醇酸樹脂、聚烯烴樹脂、胺基甲酸乙酯樹脂、及矽氧樹脂所構成之群組中之1種以上的脫模劑。附脫模層之支持體可使用市售品,例如可列舉具有將醇酸樹脂系脫模劑作為主成分之脫模層的PET薄膜即Lintec(股)製之「SK-1」、「AL-5」、「AL-7」、東麗(股)製「LumilarT6AM」、「LumilarR80」等。 Further, as the support, a support for releasing the release layer having a release layer can be provided on the surface to be bonded to the resin composition layer. The release agent used for the release layer of the support to which the mold release layer is attached may, for example, be selected from the group consisting of an alkyd resin, a polyolefin resin, a urethane resin, and a silicone resin. One or more release agents. A commercially available product can be used as the support for the mold release layer. For example, "SK-1" and "AL" manufactured by Lintec Co., Ltd., which is a release film having a release layer containing an alkyd resin release agent as a main component, can be used. -5", "AL-7", "LumilarT6AM" and "LumilarR80" made by Toray (share).

作為支持體的厚度,雖並未特別限定,但較佳為5μm~75μm的範圍,更佳為10μm~60μm的範圍。尚,使用附脫模層之支持體的情況下,較佳為附脫模層之支持體全體的厚度為上述範圍。 The thickness of the support is not particularly limited, but is preferably in the range of 5 μm to 75 μm, and more preferably in the range of 10 μm to 60 μm. When a support having a release layer is used, the thickness of the entire support having the release layer is preferably in the above range.

樹脂薄片例如可藉由調製溶解樹脂組成物於有機溶劑之樹脂清漆,將此樹脂清漆使用模塗佈機等塗佈在支持體上,進而使其乾燥形成樹脂組成物層來製造。 The resin sheet can be produced, for example, by preparing a resin varnish which dissolves the resin composition in an organic solvent, and applying the resin varnish to a support using a die coater or the like, followed by drying to form a resin composition layer.

作為有機溶劑,例如可列舉丙酮、甲基乙基酮(MEK)及環己酮等之酮類、乙酸乙酯、乙酸丁酯、溶纖劑乙酸酯、丙二醇單甲基醚乙酸酯及卡必醇乙酸酯等之乙 酸酯類、溶纖劑及丁基卡必醇等之卡必醇類、甲苯及二甲苯等之芳香族烴類、二甲基甲醯胺、二甲基乙醯胺(DMAc)及N-甲基吡咯烷酮等之醯胺系溶劑等。有機溶劑可1種單獨使用,亦可組合2種以上使用。 Examples of the organic solvent include ketones such as acetone, methyl ethyl ketone (MEK) and cyclohexanone, ethyl acetate, butyl acetate, cellosolve acetate, and propylene glycol monomethyl ether acetate. B, such as carbitol acetate Carboxyl alcohols such as acid esters, cellosolve and butyl carbitol, aromatic hydrocarbons such as toluene and xylene, dimethylformamide, dimethylacetamide (DMAc) and N- A guanamine-based solvent such as methylpyrrolidone. The organic solvent may be used alone or in combination of two or more.

乾燥可藉由加熱、吹送熱風等之周知方法實施。乾燥條件雖並未特別限定,但以樹脂組成物層中之有機溶劑的含量成為10質量%以下,較佳為成為5質量%以下的方式進行乾燥。雖因樹脂清漆中之有機溶劑的沸點而不同,但例如使用包含30質量%~60質量%有機溶劑之樹脂清漆的情況下,可藉由於50℃~150℃乾燥3分鐘~10分鐘,形成樹脂組成物層。 Drying can be carried out by a known method of heating, blowing hot air or the like. The drying condition is not particularly limited, but the content of the organic solvent in the resin composition layer is 10% by mass or less, preferably 5% by mass or less. Although it is different in the boiling point of the organic solvent in the resin varnish, for example, when a resin varnish containing 30% by mass to 60% by mass of an organic solvent is used, the resin can be formed by drying at 50 ° C to 150 ° C for 3 minutes to 10 minutes. Composition layer.

在樹脂薄片,可於未與樹脂組成物層之支持體接合的面(即,與支持體相反側的面)進一步層合依照支持體之保護薄膜。保護薄膜的厚度雖並非被特別限定,但例如為1μm~40μm。藉由層合保護薄膜,可防止對樹脂組成物層的表面之塵埃等之附著或刮傷。樹脂薄片可捲繞成輥狀來保存。樹脂薄片具有保護薄膜的情況下,變成可藉由剝離保護薄膜來使用。 In the resin sheet, a protective film according to the support may be further laminated on a surface that is not bonded to the support of the resin composition layer (that is, a surface opposite to the support). The thickness of the protective film is not particularly limited, but is, for example, 1 μm to 40 μm. By laminating the protective film, adhesion or scratching of dust or the like on the surface of the resin composition layer can be prevented. The resin sheet can be wound into a roll to be stored. When the resin sheet has a protective film, it can be used by peeling off the protective film.

在樹脂薄片之樹脂組成物層的最低熔融黏度,從得到良好之配線埋入性的觀點來看,較佳為12000poise(1200Pa.s)以下,更佳為10000poise(1000Pa.s)以下,再更佳為8000poise(800Pa.s)以下、5000poise(500Pa.s)以下、或4000poise(400Pa.s)以下。該最低熔融黏度的下限,從樹脂組成物層薄且安定維持厚度的觀點來 看,較佳為1000poise(100Pa.s)以上,更佳為1500poise(150Pa.s)以上,再更佳為2000poise(200Pa.s)以上。 The lowest melt viscosity of the resin composition layer of the resin sheet is preferably 12,000 poise (1200 Pa.s) or less, more preferably 10,000 poise (1000 Pa.s) or less, from the viewpoint of obtaining good wiring embedding property, and further Preferably, it is 8000 poise (800 Pa.s) or less, 5000 poise (500 Pa.s) or less, or 4000 poise (400 Pa.s) or less. The lower limit of the minimum melt viscosity is from the viewpoint that the resin composition layer is thin and the thickness is maintained and maintained. Preferably, it is preferably 1000 poise (100 Pa.s) or more, more preferably 1500 poise (150 Pa.s) or more, and even more preferably 2000 poise (200 Pa.s) or more.

所謂樹脂組成物層的最低熔融黏度,係指熔融樹脂組成物層之樹脂時,樹脂組成物層所呈現之最低的黏度。詳細而言,以一定之昇溫速度加熱樹脂組成物層使樹脂熔融時,初期階段係熔融黏度隨溫度上昇而降低,然後超過某程度時隨溫度上昇熔融黏度一起上昇。所謂最低熔融黏度,係指該極小點之熔融黏度。樹脂組成物層的最低熔融黏度可藉由動態黏彈性法測定,例如可依後述之<最低熔融黏度之測定>所記載之方法測定。 The lowest melt viscosity of the resin composition layer means the lowest viscosity exhibited by the resin composition layer when the resin of the resin composition layer is melted. Specifically, when the resin composition layer is heated at a constant temperature increase rate to melt the resin, the melt viscosity in the initial stage decreases as the temperature rises, and then rises more than a certain degree as the temperature increases the melt viscosity. The lowest melt viscosity refers to the melt viscosity of the minimum point. The lowest melt viscosity of the resin composition layer can be measured by a dynamic viscoelastic method, and can be measured, for example, by the method described in <Measurement of the lowest melt viscosity> described later.

[硬化物] [hardened material]

熱硬化本發明之樹脂薄片的樹脂組成物層所得之硬化物,係在測定頻率10GHz、23℃之介電正切為0.006以下,且在測定頻率10GHz、150℃之介電正切為0.01以下。根據本發明,藉由樹脂組成物層的硬化物滿足如上述之特定介電正切,可帶來薄膜絕緣性優異之絕緣層。 The cured product obtained by thermally curing the resin composition layer of the resin sheet of the present invention has a dielectric tangent at a measurement frequency of 10 GHz and 23 ° C of 0.006 or less, and a dielectric tangent at a measurement frequency of 10 GHz and 150 ° C of 0.01 or less. According to the invention, the cured product of the resin composition layer satisfies the specific dielectric tangent as described above, and the insulating layer excellent in film insulating properties can be obtained.

滿足如上述之特定介電正切的樹脂組成物層之硬化物,作為樹脂組成物中所包含之成分(例如環氧樹脂及硬化劑等),可藉由使用純度高之樹脂、或難以水解之樹脂、或使用耐熱性高之樹脂、或使用疏水性高之樹脂(例如活性酯系硬化劑或寡伸苯基醚等)等實現。 The cured product of the resin composition layer satisfying the specific dielectric tangent as described above, which is contained in the resin composition (for example, an epoxy resin and a hardener), can be used by using a resin having a high purity or being difficult to be hydrolyzed. The resin is used, or a resin having high heat resistance or a resin having high hydrophobicity (for example, an active ester-based curing agent or an oligo-phenylene ether) or the like is used.

本發明之樹脂薄片的樹脂組成物層的熱硬化條件並未特別限定,例如可使用形成後述之印刷配線板的 絕緣層時通常所採用之條件。又,可於熱硬化樹脂組成物層前進行預備加熱,在熱硬化條件之加熱可包含預備加熱進行複數次。作為熱硬化條件之一例,首先將樹脂組成物層於100℃ 30分鐘、其次於180℃ 30分鐘、進而於200℃ 90分鐘使其熱硬化。 The thermosetting condition of the resin composition layer of the resin sheet of the present invention is not particularly limited, and for example, a printed wiring board to be described later can be used. The conditions normally used for insulation. Further, preliminary heating may be performed before the thermosetting resin composition layer, and heating under thermal curing conditions may include preliminary heating for a plurality of times. As an example of the thermosetting condition, the resin composition layer is first thermally cured at 100 ° C for 30 minutes, secondly at 180 ° C for 30 minutes, and further at 200 ° C for 90 minutes.

本發明之樹脂薄片的樹脂組成物層之硬化物(例如將樹脂組成物層於100℃ 30分鐘、其次於180℃ 30分鐘、進而於200℃ 90分鐘使其熱硬化所得之硬化物)在測定頻率10GHz、23℃之介電正切,從可帶來薄膜絕緣性優異之絕緣層的觀點來看,較佳為0.005以下,更佳為0.004以下,再更佳為0.003以下。 The cured product of the resin composition layer of the resin sheet of the present invention (for example, a cured product obtained by thermally curing a resin composition layer at 100 ° C for 30 minutes, followed by 180 ° C for 30 minutes, and further at 200 ° C for 90 minutes) The dielectric tangent at a frequency of 10 GHz and 23 ° C is preferably 0.005 or less, more preferably 0.004 or less, still more preferably 0.003 or less from the viewpoint of an insulating layer which is excellent in film insulating properties.

本發明之樹脂薄片的樹脂組成物層的硬化物(例如將樹脂組成物層於100℃ 30分鐘、其次於180℃ 30分鐘、進而於200℃ 90分鐘使其熱硬化所得之硬化物)在測定頻率10GHz、150℃之介電正切,從可帶來薄膜絕緣性優異之絕緣層的觀點來看,較佳為0.009以下,更佳為0.008以下,再更佳為0.007以下。 The cured product of the resin composition layer of the resin sheet of the present invention (for example, a cured product obtained by thermally curing a resin composition layer at 100 ° C for 30 minutes, followed by 180 ° C for 30 minutes, and further at 200 ° C for 90 minutes) The dielectric tangent at a frequency of 10 GHz and 150 ° C is preferably 0.009 or less, more preferably 0.008 or less, still more preferably 0.007 or less from the viewpoint of an insulating layer which is excellent in film insulating properties.

樹脂組成物層的硬化物在測定頻率10GHz、23℃之介電正切及在測定頻率10GHz、150℃之介電正切,例如可依照後述之<硬化物之介電正切的測定>所記載之方法測定。 The cured product of the resin composition layer has a dielectric tangent at a measurement frequency of 10 GHz and 23 ° C and a dielectric tangent at a measurement frequency of 10 GHz and 150 ° C, and can be, for example, a method described in <Measurement of dielectric tangent of a cured product> which will be described later. Determination.

熱硬化本發明之樹脂薄片的樹脂組成物層所得之硬化物(例如將樹脂組成物層於100℃ 30分鐘、其次於180℃ 30分鐘使其熱硬化所得之硬化物),即使在 130℃、85RH%、3.3V施加環境下經過100小時後亦顯示良好之絕緣電阻值。即,帶來顯示良好之絕緣電阻值的絕緣層。該絕緣電阻值的上限較佳為1012Ω以下,更佳為1011Ω以下,再更佳為1010Ω以下。針對下限雖並未特別限定,但較佳為106Ω以上,更佳為107Ω以上。絕緣電阻值的測定可依照後述之<絕緣信賴性的評估、導體層間之絕緣層的厚度的測定>所記載之方法測定。 A cured product obtained by thermally curing the resin composition layer of the resin sheet of the present invention (for example, a cured product obtained by thermally curing a resin composition layer at 100 ° C for 30 minutes and then at 180 ° C for 30 minutes), even at 130 ° C, A good insulation resistance value was also exhibited after 100 hours in an application environment of 85 RH% and 3.3 V. That is, an insulating layer exhibiting a good insulation resistance value is provided. The upper limit of the insulation resistance value is preferably 10 12 Ω or less, more preferably 10 11 Ω or less, still more preferably 10 10 Ω or less. The lower limit is not particularly limited, but is preferably 10 6 Ω or more, and more preferably 10 7 Ω or more. The measurement of the insulation resistance value can be measured in accordance with the method described in <Evaluation of Insulation Reliability and Measurement of Thickness of Insulating Layer Between Conductive Layers> to be described later.

本發明中,其係樹脂組成物層之硬化物,亦包含在測定頻率10GHz、23℃之介電正切為0.006以下,且在測定頻率10GHz、150℃之介電正切為0.01以下之硬化物。硬化物係與本發明之樹脂薄片的樹脂組成物層之硬化物為相同之構成。又,用以形成硬化物之樹脂組成物的硬化條件係與樹脂薄片之硬化條件相同。本發明之硬化物(例如將樹脂組成物層於100℃ 30分鐘、其次於180℃ 30分鐘、進而於200℃ 90分鐘使其熱硬化所得之硬化物)之測定頻率10GHz、23℃之介電正切的較佳範圍及在測定頻率10GHz、150℃之介電正切的較佳範圍,係與上述之樹脂薄片的硬化物相同。對於硬化物之絕緣電阻值的較佳範圍亦與上述之樹脂薄片的硬化物相同。 In the present invention, the cured product of the resin composition layer also includes a cured product having a dielectric tangent of 10 GHz and 23 ° C at a measurement frequency of 0.006 or less and a dielectric tangent of 10 GHz and 150 ° C at a measurement frequency of 0.01 or less. The cured product has the same constitution as the cured product of the resin composition layer of the resin sheet of the present invention. Further, the curing conditions of the resin composition for forming a cured product are the same as those of the resin sheet. The cured product of the present invention (for example, a cured product obtained by thermally curing a resin composition layer at 100 ° C for 30 minutes, followed by 180 ° C for 30 minutes, and further at 200 ° C for 90 minutes) has a dielectric frequency of 10 GHz and 23 ° C. The preferred range of the tangent and the preferred range of the dielectric tangent at the measurement frequency of 10 GHz and 150 ° C are the same as those of the above-mentioned resin sheet. The preferred range of the insulation resistance value of the cured product is also the same as that of the above-mentioned cured resin sheet.

由於本發明之樹脂薄片可降低在高溫之介電正切,即使於高溫環境下亦可抑制起因於電氣信號之熱或噪音的發生。因此,本發明之樹脂薄片可適合使用在於高頻率帶域使用之印刷配線板的絕緣層用。所謂高頻率帶域,係意指1GHz以上(較佳為1.5GHz以上,更佳為 3GHz以上)之高頻率帶域。 Since the resin sheet of the present invention can reduce the dielectric tangent at a high temperature, the occurrence of heat or noise due to an electrical signal can be suppressed even in a high temperature environment. Therefore, the resin sheet of the present invention can be suitably used for an insulating layer of a printed wiring board used in a high frequency band. The so-called high frequency band means 1 GHz or more (preferably 1.5 GHz or more, more preferably High frequency band of 3 GHz or higher.

[印刷配線板、印刷配線板之製造方法] [Manufacturing method of printed wiring board and printed wiring board]

本發明之印刷配線板係包含藉由本發明之樹脂薄片的樹脂組成物層之硬化物所形成之絕緣層、第1導體層、及第2導體層。本發明之印刷配線基板可為具備將本發明之硬化物作為絕緣層者。絕緣層設置於第1導體層與第2導體層之間,絕緣第1導體層與第2導體層(導體層亦稱為配線層)。藉由本發明之樹脂薄片的樹脂組成物層之硬化物所形成之絕緣層由於薄膜絕緣性優異,故即使第1及第2導體層間之絕緣層的厚度為6μm以下絕緣性亦優異。 The printed wiring board of the present invention includes the insulating layer, the first conductor layer, and the second conductor layer formed of the cured product of the resin composition layer of the resin sheet of the present invention. The printed wiring board of the present invention may be provided with the cured product of the present invention as an insulating layer. The insulating layer is provided between the first conductor layer and the second conductor layer, and insulates the first conductor layer and the second conductor layer (the conductor layer is also referred to as a wiring layer). Since the insulating layer formed of the cured product of the resin composition layer of the resin sheet of the present invention is excellent in film insulating properties, the insulating layer between the first and second conductor layers has a thickness of 6 μm or less and is excellent in insulation properties.

第1及第2導體層間之絕緣層的厚度較佳為6μm以下,更佳為5.5μm以下,再更佳為5μm以下。針對下限雖並未特別限定,但可為0.1μm以上。所謂第1及第2導體層間之絕緣層的厚度,如顯示一例於圖1,係指第1導體層5之主面51與第2導體層6之主面61間之絕緣層7的厚度t1。第1及第2導體層係透過絕緣層而相鄰之導體層,主面51及主面61彼此面對面。第1及第2導體層間之絕緣層的厚度可依照後述之絕緣信賴性的評估、導體層間之絕緣層的厚度的測定>所記載之方法測定。 The thickness of the insulating layer between the first and second conductor layers is preferably 6 μm or less, more preferably 5.5 μm or less, still more preferably 5 μm or less. The lower limit is not particularly limited, but may be 0.1 μm or more. The thickness of the insulating layer between the first and second conductor layers is, as shown in Fig. 1, the thickness t1 of the insulating layer 7 between the main surface 51 of the first conductor layer 5 and the main surface 61 of the second conductor layer 6. . The first and second conductor layers are adjacent to each other through the insulating layer, and the main surface 51 and the main surface 61 face each other. The thickness of the insulating layer between the first and second conductor layers can be measured by the method described in the following section: "Evaluation of insulation reliability and measurement of thickness of insulating layer between conductor layers".

尚,絕緣層全體的厚度t2較佳為20μm以下,更佳為15μm以下,再更佳為12μm以下。針對下限雖並未特別限定但可為1μm以上。 Further, the thickness t2 of the entire insulating layer is preferably 20 μm or less, more preferably 15 μm or less, still more preferably 12 μm or less. The lower limit is not particularly limited, but may be 1 μm or more.

本發明之印刷配線板係使用上述之樹脂薄 片,可藉由包含下述(I)及(II)之步驟之方法製造。 The printed wiring board of the present invention uses the above-mentioned resin thin The sheet can be produced by a method comprising the steps of the following (I) and (II).

(I)於內層基板上,以樹脂薄片之樹脂組成物層與內層基板接合的方式層合之步驟 (I) a step of laminating a resin composition layer of a resin sheet and an inner layer substrate on an inner substrate

(II)熱硬化樹脂組成物層形成絕緣層之步驟 (II) Step of forming a heat insulating resin composition layer to form an insulating layer

所謂於步驟(I)使用之「內層基板」,作為主要,係指玻璃環氧基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚伸苯基醚基板等之基板、或形成圖型加工於該基板的單面或兩面之導體層(電路)的電路基板。又,製造印刷配線板時,進而應形成絕緣層及/或導體層之中間製造物的內層電路基板亦包含在本發明之「內層基板」。印刷配線板為零件內藏電路板的情況下,可使用內藏零件之內層基板。 The "inner substrate" used in the step (I) mainly refers to a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, and a thermosetting polyphenylene ether substrate. A substrate such as a substrate or a circuit board formed by patterning a conductor layer (circuit) on one or both sides of the substrate. Further, when manufacturing a printed wiring board, an inner layer circuit board in which an intermediate layer of an insulating layer and/or a conductor layer is formed is also included in the "inner substrate" of the present invention. When the printed wiring board is a component built-in circuit board, the inner substrate of the built-in component can be used.

內層基板與樹脂薄片的層合,例如可藉由從支持體側將樹脂薄片加熱壓著在內層基板來進行。作為將樹脂薄片加熱壓著在內層基板之構件(以下亦稱為「加熱壓著構件」),例如可列舉加熱之金屬板(SUS鏡板等)或金屬輥(SUS輥)等。尚,較佳為並非將加熱壓著構件直接沖壓在樹脂薄片,而是於內層基板的表面凹凸以樹脂薄片充分追隨的方式,透過耐熱橡膠等之彈性材進行沖壓。 The lamination of the inner layer substrate and the resin sheet can be performed, for example, by heating the resin sheet from the side of the support to the inner layer substrate. As a member for heating the resin sheet to the inner layer substrate (hereinafter also referred to as "heating and pressing member"), for example, a heated metal plate (such as a SUS mirror plate) or a metal roll (SUS roll) may be mentioned. In addition, it is preferable that the heating and pressing member is not directly pressed into the resin sheet, and the surface unevenness of the inner layer substrate is pressed through the elastic material such as heat-resistant rubber so as to sufficiently follow the resin sheet.

內層基板與樹脂薄片的層合可藉由真空層合法實施。在真空層合法,加熱壓著溫度較佳為60℃~160℃,更佳為80℃~140℃的範圍,加熱壓著壓力較佳為0.098MPa~1.77MPa,更佳為0.29MPa~1.47MPa的範圍,加熱壓著時間較佳為20秒~400秒,更佳為30秒~ 300秒的範圍。層合較佳為以壓力26.7hPa以下的減壓條件下實施。 The lamination of the inner substrate and the resin sheet can be carried out by vacuum lamination. In the vacuum lamination, the heating and pressing temperature is preferably in the range of 60 ° C to 160 ° C, more preferably in the range of 80 ° C to 140 ° C, and the heating pressing pressure is preferably 0.098 MPa to 1.77 MPa, more preferably 0.29 MPa to 1.47 MPa. The range of heating and pressing time is preferably 20 seconds to 400 seconds, more preferably 30 seconds. A range of 300 seconds. The lamination is preferably carried out under reduced pressure of 26.7 hPa or less.

層合可藉由市售之真空層合機進行。作為市售之真空層合機,例如可列舉(股)名機製作所製之真空加壓式層合機、日光暨材料(股)製之真空施加器(Vacuum applierator)等。 Lamination can be carried out by means of a commercially available vacuum laminator. Examples of the commercially available vacuum laminator include a vacuum press laminator manufactured by Nihon Seiki Co., Ltd., and a vacuum applicator made of a daylight and material.

於層合之後,常壓下(大氣壓下)例如藉由將加熱壓著構件從支持體側進行沖壓,可進行經層合之樹脂薄片的平滑化處理。平滑化處理的沖壓條件可成為與上述層合的加熱壓著條件相同之條件。平滑化處理可藉由市售之層合機進行。尚,層合與平滑化處理可使用上述之市售真空層合機連續性進行。 After the lamination, the smoothing treatment of the laminated resin sheet can be performed under normal pressure (at atmospheric pressure) by, for example, pressing the heating and pressing member from the support side. The pressing conditions of the smoothing treatment may be the same conditions as the above-described laminated heating and pressing conditions. The smoothing treatment can be carried out by a commercially available laminator. Still, lamination and smoothing can be carried out using the commercially available vacuum laminator continuity described above.

支持體可於步驟(I)與步驟(II)之間去除,亦可於步驟(II)之後去除。 The support may be removed between step (I) and step (II), or may be removed after step (II).

在步驟(II),熱硬化樹脂組成物層形成絕緣層。 In the step (II), the thermosetting resin composition layer forms an insulating layer.

樹脂組成物層的熱硬化條件並未特別限定,可使用形成印刷配線板之絕緣層時通常所採用之條件。 The thermosetting condition of the resin composition layer is not particularly limited, and conditions generally employed in forming an insulating layer of a printed wiring board can be used.

例如樹脂組成物層的熱硬化條件雖亦因樹脂組成物的種類等而不同,但硬化溫度可成為120℃~240℃的範圍(較佳為150℃~220℃的範圍,更佳為170℃~200℃的範圍),硬化時間可成為5分鐘~120分鐘的範圍(較佳為10分鐘~100分鐘,更佳為15分鐘~90分鐘)。 For example, the thermosetting conditions of the resin composition layer differ depending on the type of the resin composition, etc., but the curing temperature may be in the range of 120 ° C to 240 ° C (preferably in the range of 150 ° C to 220 ° C, more preferably 170 ° C). In the range of ~200 ° C), the hardening time may be in the range of 5 minutes to 120 minutes (preferably 10 minutes to 100 minutes, more preferably 15 minutes to 90 minutes).

熱硬化樹脂組成物層之前,可將樹脂組成物層在較硬化溫度更低之溫度進行預備加熱。例如熱硬化樹脂組成物層之前,在50℃以上未滿120℃(較佳為60℃以上110℃以下,更佳為70℃以上100℃以下)之溫度,可將樹脂組成物層進行5分鐘以上(較佳為5分鐘~150分鐘,更佳為15分鐘~120分鐘)預備加熱。 Prior to thermally hardening the resin composition layer, the resin composition layer may be preheated at a temperature lower than the hardening temperature. For example, the resin composition layer may be subjected to a temperature of 50 ° C or more and less than 120 ° C (preferably 60 ° C or more and 110 ° C or less, more preferably 70 ° C or more and 100 ° C or less) before the thermosetting resin composition layer. The above (preferably 5 minutes to 150 minutes, more preferably 15 minutes to 120 minutes) is prepared for heating.

製造印刷配線板時,可進一步實施(III)鑽孔在絕緣層之步驟、(IV)粗糙化處理絕緣層之步驟、(V)形成導體層之步驟。此等之步驟(III)~(V)可依照使用在印刷配線板之製造,本發明領域具有通常知識者所周知之各種方法來實施。尚,將支持體於步驟(II)之後去除的情況,該支持體的去除,可於步驟(II)與步驟(III)之間、步驟(III)與步驟(IV)之間、或步驟(IV)與步驟(V)之間實施。又,如有必要可重複實施步驟(II)~(V)之絕緣層及導體層的形成,而形成多層配線板。此情況下,較佳為個別的導體層間之絕緣層的厚度(圖1之t1)為上述範圍內。 When the printed wiring board is manufactured, the steps of (III) drilling the insulating layer, (IV) roughening the insulating layer, and (V) forming the conductor layer may be further performed. These steps (III) to (V) can be carried out in accordance with various methods well known to those skilled in the art for use in the manufacture of printed wiring boards. Further, in the case where the support body is removed after the step (II), the removal of the support may be between the step (II) and the step (III), between the step (III) and the step (IV), or the step ( Implemented between IV) and step (V). Further, if necessary, the formation of the insulating layer and the conductor layer of the steps (II) to (V) may be repeated to form a multilayer wiring board. In this case, it is preferable that the thickness of the insulating layer between the individual conductor layers (t1 in Fig. 1) is within the above range.

步驟(III)係鑽孔在絕緣層之步驟,藉此可於絕緣層形成通孔、貫穿孔等之孔。步驟(III)因應絕緣層的形成所使用之樹脂組成物的組成等,例如可使用鑽孔、雷射、電漿等實施。孔的尺寸或形狀因應印刷配線板的設計適當決定即可。 The step (III) is a step of drilling a hole in the insulating layer, whereby a hole of a through hole, a through hole or the like can be formed in the insulating layer. The step (III) can be carried out using, for example, drilling, laser, plasma, or the like in accordance with the composition of the resin composition used for the formation of the insulating layer. The size or shape of the hole may be appropriately determined depending on the design of the printed wiring board.

步驟(IV)係粗糙化處理絕緣層之步驟。粗糙化處理的順序、條件並未特別限定,可採用形成印刷配線板的絕緣層時通常所使用之周知的順序、條件。例如可依序 實施藉由膨潤液之膨潤處理、藉由氧化劑之粗糙化處理、藉由中和液之中和處理,來粗糙化處理絕緣層。作為膨潤液,雖並未特別限定,但可列舉鹼溶液、界面活性劑溶液等,較佳為鹼溶液,作為該鹼溶液,更佳為氫氧化鈉溶液、氫氧化鉀溶液。作為市售之膨潤液,例如可列舉Atotek Japan(股)製之「Swelling Dip Securiganth P」、「Swelling Dip Securiganth SBU」等。藉由膨潤液之膨潤處理雖並未特別限定,但例如可藉由於30℃~90℃之膨潤液浸漬絕緣層1分鐘~20分鐘來進行。從將絕緣層之樹脂的膨潤抑制在適度水準的觀點來看,較佳為於40℃~80℃之膨潤液浸漬絕緣層5分鐘~15分鐘。作為氧化劑,雖並未特別限定,但例如可列舉於氫氧化鈉之水溶液溶解過錳酸鉀或過錳酸鈉之鹼性過錳酸溶液。藉由鹼性過錳酸溶液等之氧化劑之粗糙化處理,較佳為於加熱至60℃~80℃之氧化劑溶液浸漬絕緣層10分鐘~30分鐘來進行。又,在鹼性過錳酸溶液之過錳酸鹽的濃度較佳為5質量%~10質量%。作為市售之氧化劑,例如可列舉Atotek Japan(股)製之「Concentrate.Compact CP」、「「Dosing solution.Securiganth P」等之鹼性過錳酸溶液。又,作為中和液,較佳為酸性之水溶液,作為市售品,例如可列舉Atotek Japan(股)製之「Reduction solution Securigant P」。藉由中和液之處理,可藉由將經藉由氧化劑之粗糙化處理的處理面於30℃~80℃之中和液浸漬5分鐘~30分鐘來進行。從作業性等之點來看, 較佳為將經藉由氧化劑之粗糙化處理的對象物於40℃~70℃之中和液浸漬5分鐘~20分鐘之方法。 Step (IV) is a step of roughening the insulating layer. The order and conditions of the roughening treatment are not particularly limited, and well-known procedures and conditions that are generally used when forming an insulating layer of a printed wiring board can be employed. For example, in order The insulating layer is roughened by a swelling treatment of the swelling liquid, a roughening treatment by an oxidizing agent, and a neutralization treatment by a neutralizing liquid. The swelling solution is not particularly limited, and examples thereof include an alkali solution and a surfactant solution, and an alkali solution is preferred. As the alkali solution, a sodium hydroxide solution or a potassium hydroxide solution is more preferred. Examples of the commercially available swelling liquid include "Swelling Dip Securiganth P" manufactured by Atotek Japan Co., Ltd., "Swelling Dip Securiganth SBU", and the like. The swelling treatment by the swelling liquid is not particularly limited. For example, the insulating layer may be immersed in a swelling liquid at 30° C. to 90° C. for 1 minute to 20 minutes. From the viewpoint of suppressing the swelling of the resin of the insulating layer to an appropriate level, it is preferred that the insulating layer is immersed in a swelling liquid at 40 ° C to 80 ° C for 5 minutes to 15 minutes. The oxidizing agent is not particularly limited, and examples thereof include an alkaline permanganic acid solution in which potassium permanganate or sodium permanganate is dissolved in an aqueous solution of sodium hydroxide. The roughening treatment with an oxidizing agent such as an alkaline permanganic acid solution is preferably carried out by immersing the insulating layer in an oxidizing agent solution heated to 60 ° C to 80 ° C for 10 minutes to 30 minutes. Further, the concentration of the permanganate in the alkaline permanganic acid solution is preferably 5% by mass to 10% by mass. Examples of the commercially available oxidizing agent include an alkaline permanganic acid solution such as "Concentrate. Compact CP" manufactured by Atotek Japan Co., Ltd., and "Dosing solution. Securiganth P". In addition, as a neutralizing liquid, an acidic aqueous solution is preferable, and a "Reduction solution Securigant P" by Atotek Japan Co., Ltd. is mentioned as a commercial item, for example. The treatment with the neutralizing solution can be carried out by immersing the treated surface subjected to roughening treatment with an oxidizing agent at 30 ° C to 80 ° C for 5 minutes to 30 minutes. From the point of view of workability, etc. Preferably, the object to be subjected to roughening treatment by an oxidizing agent is immersed in a liquid at 40 ° C to 70 ° C for 5 minutes to 20 minutes.

在一實施形態,粗糙化處理後之絕緣層表面的算術平均粗糙度Ra較佳為400nm以下,更佳為350nm以下,再更佳為300nm以下、250nm以下、200nm以下、150nm以下、或100nm以下。絕緣層表面的算術平均粗糙度(Ra)可使用非接觸型表面粗糙度計測定。作為非接觸型表面粗糙度計之具體例,可列舉威科儀器公司製之「WYKO NT3300」。 In one embodiment, the arithmetic mean roughness Ra of the surface of the insulating layer after the roughening treatment is preferably 400 nm or less, more preferably 350 nm or less, still more preferably 300 nm or less, 250 nm or less, 200 nm or less, 150 nm or less, or 100 nm or less. . The arithmetic mean roughness (Ra) of the surface of the insulating layer can be measured using a non-contact type surface roughness meter. Specific examples of the non-contact surface roughness meter include "WYKO NT3300" manufactured by Wyco Instruments.

步驟(V)係形成導體層之步驟。於內層基板未形成導體層的情況下,步驟(V)係形成第1導體層之步驟,於內層基板形成導體層的情況下,該導體層為第1導體層,步驟(V)為形成第2導體層之步驟。 Step (V) is a step of forming a conductor layer. When the conductor layer is not formed on the inner substrate, the step (V) is a step of forming the first conductor layer. When the conductor layer is formed on the inner substrate, the conductor layer is the first conductor layer, and the step (V) is The step of forming the second conductor layer.

導體層所使用之導體材料並未特別限定。於適合之實施形態,導體層係包含選自由金、鉑、鈀、銀、銅、鋁、鈷、鉻、鋅、鎳、鈦、鎢、鐵、錫及銦所構成之群組中之1種以上的金屬。導體層可為單金屬層亦可為合金層,作為合金層,例如可列舉從選自上述之群組中之2種以上之金屬的合金(例如鎳暨鉻合金、銅暨鎳合金及銅暨鈦合金)所形成之層。其中,從導體層形成之通用性、成本、圖型化之容易性等的觀點來看,較佳為鉻、鎳、鈦、鋁、鋅、金、鈀、銀或銅之單金屬層、或鎳暨鉻合金、銅暨鎳合金、銅暨鈦合金之合金層,更佳為鉻、鎳、鈦、鋁、鋅、金、鈀、銀或銅之單金屬層、或鎳暨鉻合金 之合金層,再更佳為銅之單金屬層。 The conductor material used for the conductor layer is not particularly limited. In a suitable embodiment, the conductor layer comprises one selected from the group consisting of gold, platinum, palladium, silver, copper, aluminum, cobalt, chromium, zinc, nickel, titanium, tungsten, iron, tin, and indium. Above the metal. The conductor layer may be a single metal layer or an alloy layer. Examples of the alloy layer include alloys of two or more metals selected from the group (for example, nickel chrome alloy, copper cum nickel alloy, and copper cum). Titanium alloy). Among them, from the viewpoint of versatility, cost, ease of pattern formation, and the like of the formation of the conductor layer, a single metal layer of chromium, nickel, titanium, aluminum, zinc, gold, palladium, silver or copper, or Alloy layer of nickel and chromium alloy, copper and nickel alloy, copper and titanium alloy, more preferably a single metal layer of chromium, nickel, titanium, aluminum, zinc, gold, palladium, silver or copper, or nickel and chromium alloy The alloy layer is more preferably a single metal layer of copper.

導體層可為單層構造,亦可為層合2層以上由不同種類之金屬或合金所構成之單金屬層或合金層之複層構造。導體層為複層構造的情況下,與絕緣層接觸之層較佳為鉻、鋅或鈦之單金屬層、或鎳暨鉻合金之合金層。 The conductor layer may have a single layer structure, or may be a multi-layer structure in which two or more layers of a single metal layer or an alloy layer composed of different kinds of metals or alloys are laminated. In the case where the conductor layer has a multi-layer structure, the layer in contact with the insulating layer is preferably a single metal layer of chromium, zinc or titanium or an alloy layer of nickel and chromium alloy.

導體層的厚度雖因所期望印刷配線板的設計而異,但一般為3μm~35μm,較佳為5μm~30μm。 Although the thickness of the conductor layer varies depending on the design of the desired printed wiring board, it is generally 3 μm to 35 μm, preferably 5 μm to 30 μm.

在一實施形態,導體層可藉由鍍敷形成。例如可藉由半添加法、全加成法等之以往周知之技術鍍敷在絕緣層的表面,形成具有所期望配線圖型之導體層。以下,表示將導體層藉由半添加法形成之例。 In one embodiment, the conductor layer can be formed by plating. For example, a conductor layer having a desired wiring pattern can be formed by plating on the surface of the insulating layer by a conventional technique such as a semi-additive method or a full additive method. Hereinafter, an example in which the conductor layer is formed by a semi-additive method will be described.

首先,於絕緣層的表面藉由無電解鍍敷形成鍍敷晶種層。其次,於經形成之鍍敷晶種層上,對應所期望之配線圖型形成使鍍敷晶種層的一部分露出之遮罩圖型。於露出之鍍敷晶種層上,藉由電解鍍敷形成金屬層後,去除遮罩圖型。然後,可將不要之鍍敷晶種層藉由蝕刻等去除,形成具有所期望配線圖型之導體層。 First, a plating seed layer is formed on the surface of the insulating layer by electroless plating. Next, a mask pattern for exposing a portion of the plated seed layer to the desired wiring pattern is formed on the formed plating seed layer. After the metal layer is formed by electrolytic plating on the exposed plated seed layer, the mask pattern is removed. Then, the unnecessary plating seed layer can be removed by etching or the like to form a conductor layer having a desired wiring pattern.

本發明之樹脂薄片由於帶來配線埋入性亦佳之絕緣層,即使印刷配線板為零件內藏電路板的情況亦可適合使用。零件內藏電路板可藉由周知之製造方法製作。 The resin sheet of the present invention can be suitably used even when the printed wiring board is a component-embedded circuit board because of an insulating layer which is excellent in wiring embedding property. The built-in circuit board of the part can be produced by a well-known manufacturing method.

使用本發明之樹脂薄片所製造之印刷配線板,可為具備本發明之樹脂薄片之樹脂組成物層的硬化物之絕緣層、與埋入絕緣層之埋入型配線層的態樣。 The printed wiring board produced by using the resin sheet of the present invention may be an insulating layer containing a cured resin composition layer of the resin sheet of the present invention and a buried wiring layer in which the insulating layer is buried.

使用本發明之樹脂薄片所製造之印刷配線 板,係即使第1及第2導體層間之絕緣層的厚度為6μm以下,亦顯示絕緣信賴性優異之特性。於130℃、85RH%、3.3V施加環境下經過100小時後之絕緣電阻值的上限較佳為1012Ω以下,更佳為1011Ω以下,再更佳為1010Ω以下。下限雖並未特別限定,但較佳為106Ω以上,更佳為107Ω以上。絕緣電阻值的測定可依照後述之<絕緣信賴性的評估、導體層間之絕緣層的厚度的測定>所記載之方法測定。 In the printed wiring board manufactured by using the resin sheet of the present invention, even when the thickness of the insulating layer between the first and second conductor layers is 6 μm or less, the insulating reliability is excellent. The upper limit of the insulation resistance value after 100 hours in an application environment of 130 ° C, 85 RH %, and 3.3 V is preferably 10 12 Ω or less, more preferably 10 11 Ω or less, still more preferably 10 10 Ω or less. Although the lower limit is not particularly limited, it is preferably 10 6 Ω or more, and more preferably 10 7 Ω or more. The measurement of the insulation resistance value can be measured in accordance with the method described in <Evaluation of Insulation Reliability and Measurement of Thickness of Insulating Layer Between Conductive Layers> to be described later.

[半導體裝置] [semiconductor device]

本發明之半導體裝置係包含本發明之印刷配線板。本發明之半導體裝置可使用本發明之印刷配線板製造。 The semiconductor device of the present invention comprises the printed wiring board of the present invention. The semiconductor device of the present invention can be fabricated using the printed wiring board of the present invention.

作為半導體裝置,可列舉供於電氣製品(例如電腦、手機、數位相機及電視等)及車輛(例如摩托車、汽車、電車、船舶及飛機等)等之各種半導體裝置。 Examples of the semiconductor device include various semiconductor devices such as electric products (for example, computers, mobile phones, digital cameras, and televisions) and vehicles (for example, motorcycles, automobiles, electric cars, ships, airplanes, etc.).

本發明之半導體裝置可藉由於印刷配線板之傳導點實裝零件(半導體晶片)來製造。所謂「傳導點」,係「傳遞在印刷配線板之電氣信號之點」,該場所可為表面,亦可為埋入點皆無妨。又,半導體晶片若為將半導體作為材料之電氣電路元件則並未特別限定。 The semiconductor device of the present invention can be fabricated by a conductive dot mounting component (semiconductor wafer) of a printed wiring board. The "conducting point" is the "point of transmission of electrical signals to the printed wiring board". The location can be either a surface or a buried point. Further, the semiconductor wafer is not particularly limited as long as it is an electrical circuit element using a semiconductor as a material.

製造本發明之半導體裝置時之半導體晶片的實裝方法,若半導體晶片有效進行機能,雖並未特別限定,但具體而言,可列舉引線接合實裝方法、倒裝晶片實裝方法、藉由無凹凸增層(BBUL)之實裝方法、藉由各向 異性導電薄膜(ACF)之實裝方法、藉由非導電性薄膜(NCF)之實裝方法、等。於此,所謂「藉由無凹凸增層(BBUL)之實裝方法」,係「將半導體晶片直接埋入印刷配線板的凹部,連接半導體晶片與印刷配線板上之配線的實裝方法」。 In the method of mounting a semiconductor wafer in the manufacture of the semiconductor device of the present invention, the semiconductor wafer is not particularly limited as long as it is effective, but specifically, a wire bonding mounting method and a flip chip mounting method are provided. Bump-free layering (BBUL) mounting method, by direction A method for mounting an anisotropic conductive film (ACF), a method for mounting a non-conductive film (NCF), and the like. Here, the "mounting method by the bump-free layer-adding layer (BBUL)" is a method of mounting a semiconductor wafer directly in a concave portion of a printed wiring board, and connecting a semiconductor wafer and a wiring on a printed wiring board.

[實施例] [Examples]

以下,雖將本發明藉由實施例具體說明,但本發明並非被限定於此等之實施例。尚,在以下之記載,「份」及「%」除另有明文規定,分別意指「質量份」及「質量%」。 Hereinafter, the present invention will be specifically described by way of examples, but the present invention is not limited to the examples. In the following, "parts" and "%" mean "parts by mass" and "% by mass" unless otherwise expressly provided.

[無機填充材之物性值的測定方法] [Method for Measuring Physical Property Value of Inorganic Filler]

首先,針對於實施例及比較例使用之無機填充材之物性值的測定方法進行說明。 First, a method of measuring the physical property values of the inorganic filler used in the examples and the comparative examples will be described.

<平均粒徑的測定> <Measurement of average particle size>

於容器瓶秤取無機填充材100mg、分散劑(San Nopco(股)製「SN9228」)0.1g、甲基乙基酮10g,在超音波分散20分鐘。使用雷射折式粒度分布測定裝置((股)島津製作所製「SALD-2200」),以批次槽方式測定粒度分布,算出藉由中位徑之平均粒徑。 Into the container, 100 mg of an inorganic filler, 0.1 g of a dispersant ("S992" manufactured by San Nopco Co., Ltd.), and 10 g of methyl ethyl ketone were weighed and dispersed in an ultrasonic wave for 20 minutes. The particle size distribution was measured by a batch tank method using a laser-type particle size distribution measuring apparatus ("SALD-2200" manufactured by Shimadzu Corporation), and the average particle diameter by the median diameter was calculated.

<比表面積的測定> <Measurement of specific surface area>

使用BET全自動比表面積測定裝置((股)Mountech製「Macsorb HM-1210」),測定無機填充材之比表面積。 The specific surface area of the inorganic filler was measured using a BET fully automatic specific surface area measuring device ("Macsorb HM-1210" manufactured by Mountech Co., Ltd.).

<碳量的測定> <Measurement of carbon amount>

無機填充材之每一單位表面積的碳量係依照以下之順序測定。於調製例調製之無機填充材,作為溶劑加入充分量之MEK,於25℃超音波洗淨5分鐘。其次,去除上清液,使固形分乾燥。對於所得之固體,使用碳分析計((股)堀場製作所製「EMIA-320V」)測定碳量。根據碳量之測定值、與使用之無機填充材的質量及比表面積,算出無機填充材之每一單位表面積的碳量。 The amount of carbon per unit surface area of the inorganic filler was measured in the following order. The inorganic filler prepared in the preparation example was added as a solvent to a sufficient amount of MEK, and ultrasonically washed at 25 ° C for 5 minutes. Next, the supernatant is removed to dry the solids. The amount of carbon was measured using a carbon analyzer ("EMIA-320V" manufactured by Horiba, Ltd.). The amount of carbon per unit surface area of the inorganic filler was calculated from the measured value of the amount of carbon and the mass and specific surface area of the inorganic filler used.

<樹脂薄片之製作(實施例1~3、比較例1~2)> <Production of Resin Sheet (Examples 1 to 3, Comparative Examples 1 and 2)>

使用藉由以下順序調製之樹脂組成物(樹脂清漆),製作實施例及比較例之樹脂薄片。 The resin sheets of the examples and the comparative examples were produced using the resin composition (resin varnish) prepared in the following order.

(樹脂組成物1的調製) (Modulation of Resin Composition 1)

邊於雙酚A型環氧樹脂(新日鐵住金化學(股)製「YD-8125G」、環氧當量約174)3份、雙二甲酚型環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量約185)3份、雙酚AF型環氧樹脂(三菱化學(股)製「YL7760」、環氧當量約238)8份、萘型環氧樹脂(新日鐵住金化學(股)製「ESN475V」、環氧當量約330)12份、苯氧基樹脂(三菱化學(股)製「YX7553BH30」、固形分30質量%之環己 酮:甲基乙基酮(MEK)之1:1溶液)10份、及溶劑油12份及環己酮10份之混合溶劑進行攪拌邊使其加熱溶解。冷卻至室溫後,對其混合活性酯系硬化劑(DIC(股)製「HPC-8000-65T」、活性基當量約225、不揮發成分65質量%之甲苯溶液)20份、寡伸苯基醚暨苯乙烯樹脂(三菱瓦斯化學(股)製「OPE-2St 1200」、固形分72質量%之甲苯溶液)10份、胺系硬化促進劑(4-二甲基胺基吡啶(DMAP)、固形分5質量%之MEK溶液)2份、咪唑系硬化促進劑(四國化成工業(股)製「1B2PZ」1-苄基-2-苯基咪唑、固形分5%之MEK溶液)0.4份、將橡膠粒子(AICA工業(股)製、AC-3401N)2份於溶劑油10份以室溫膨潤12小時者、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)表面處理之球狀二氧化矽(新日鐵住金材料(股)製「SP507-05」、平均粒徑0.91μm、比表面積6.5m2/g、每一單位表面積之碳量0.34mg/m2)160份,以高速旋轉混合機均勻分散後,以筒式過濾器(ROKITECHNO製「SHP030」)過濾,調製樹脂組成物1。 The bisphenol A type epoxy resin (YD-8125G, manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd.), epoxy equivalent (about 174), 3 parts, and bisxylenol type epoxy resin (Mitsubishi Chemical Co., Ltd.) YX4000HK", epoxy equivalent of about 185) 3 parts, bisphenol AF type epoxy resin ("YL7760" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 238) 8 parts, naphthalene type epoxy resin (Nippon Steel & Sumitomo Chemical Co., Ltd. (ESN475V), epoxy equivalent (about 330), 12 parts, phenoxy resin ("XX7553BH30" manufactured by Mitsubishi Chemical Corporation, 30% by mass of cyclohexanone: methyl ethyl ketone (MEK) The 1:1 solution) 10 parts, and a mixed solvent of 12 parts of a solvent oil and 10 parts of cyclohexanone were stirred and heated and dissolved. After cooling to room temperature, an active ester-based curing agent ("HPC-8000-65T" manufactured by DIC Co., Ltd., a toluene solution having a reactive base equivalent of about 225 and a nonvolatile content of 65 mass%) was mixed with 20 parts of phenylene oxide. Base ether and styrene resin ("OPE-2St 1200" manufactured by Mitsubishi Gas Chemical Co., Ltd., toluene solution of 72% by mass solids) 10 parts, amine hardening accelerator (4-dimethylaminopyridine (DMAP)) 2 parts by mass of MEK solution), imidazole-based hardening accelerator ("1B2PZ" 1-benzyl-2-phenylimidazole manufactured by Shikoku Chemical Industry Co., Ltd., solid solution 5% MEK solution) 0.4 2 parts of rubber particles (made by AICA Industrial Co., Ltd., AC-3401N) in 10 parts of solvent oil and swelled at room temperature for 12 hours, and an amine decane-based coupling agent (KBM573, manufactured by Shin-Etsu Chemical Co., Ltd.) ) Surface-treated spheroidal cerium oxide (SP507-05, manufactured by Nippon Steel & Sumitomo Metal Co., Ltd.), average particle diameter of 0.91 μm, specific surface area of 6.5 m 2 /g, and carbon content per unit surface area of 0.34 mg/m 2 ) 160 parts were uniformly dispersed by a high-speed rotary mixer, and then filtered through a cartridge filter ("SHP030" manufactured by ROKITECHNO) to prepare a resin composition 1.

(樹脂組成物2的調製) (Modulation of Resin Composition 2)

將雙酚A型環氧樹脂(新日鐵住金化學(股)製「YD-8125G」、環氧當量約174)2份、雙二甲酚型環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量約185)5份、伸萘基醚型環氧樹脂(DIC(股)製「EXA-7311-G4」、環氧當量約213)5份、聯苯型環氧樹脂(日本化藥(股)製 「NC3000L」、環氧當量約272)15份、環氧化聚丁二烯((股)Daicel製「PB3600」、環氧當量約193)2份、苯氧基樹脂(三菱化學(股)製「YX7553BH30」、固形分30質量%之環己酮:甲基乙基酮(MEK)之1:1溶液)10份邊於溶劑油15份及環己酮10份之混合溶劑攪拌邊使其加熱溶解。冷卻至室溫後,對其混合含有三嗪骨架之甲酚酚醛清漆系硬化劑(DIC(股)製「LA3018-50P」、羥基當量約151、固形分50%之2-甲氧基丙醇溶液)5份、活性酯系硬化劑(DIC(股)製「HPC-8000-65T」、活性基當量約225、不揮發成分65質量%之甲苯溶液)12份、碳二亞胺樹脂(日清紡化工(股)製「V-03」、碳二亞胺當量216、不揮發成分50質量%之甲苯溶液)10份、胺系硬化促進劑(4-二甲基胺基吡啶(DMAP)、固形分5質量%之MEK溶液)1.5份、難燃劑(三光(股)製「HCA-HQ」、10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲-10-氧化物、平均粒徑1.2μm)2份、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)表面處理之球狀二氧化矽(新日鐵住金材料(股)製「SPH516-05」、平均粒徑0.29μm、比表面積16.3m2/g、每一單位表面積之碳量0.43mg/m2)110份,以高速旋轉混合機均勻分散後,以筒式過濾器(ROKITECHNO製「SHP020」過濾,調製樹脂組成物2。 Bisphenol A type epoxy resin (YD-8125G, manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., epoxy resin equivalent: 174) 2 parts, bisxylenol type epoxy resin (Mitsubishi Chemical Co., Ltd. "YX4000HK""Epoxy equivalent: 185) 5 parts, a naphthyl ether type epoxy resin ("EXA-7311-G4" manufactured by DIC Co., Ltd., epoxy equivalent: about 213) 5 parts, biphenyl type epoxy resin (Japan) Chemical plant (stock) "NC3000L", epoxy equivalent of about 272) 15 parts, epoxidized polybutadiene ("PB3600" (made by Daicel), epoxy equivalent of about 193) 2 parts, phenoxy resin (Mitsubishi Chemical (stock) "YX7553BH30", solid content 30% by mass of cyclohexanone: methyl ethyl ketone (MEK) 1:1 solution) 10 parts of solvent oil 15 parts and cyclohexanone 10 parts mixed solvent Stir and heat to dissolve. After cooling to room temperature, a cresol novolak-based hardener containing a triazine skeleton ("LA3018-50P" manufactured by DIC Co., Ltd., 2-hydroxyl group having a hydroxyl equivalent of about 151 and a solid content of 50%) was mixed. Solution) 5 parts, active ester-based curing agent ("HPC-8000-65T" manufactured by DIC Co., Ltd., toluene solution having a reactive base equivalent of about 225 and a nonvolatile content of 65 mass%) 12 parts, carbodiimide resin (Nisshinbo 10 parts of "V-03", carbodiimide equivalent 216, non-volatile content 50% by mass of toluene solution), amine-based hardening accelerator (4-dimethylaminopyridine (DMAP), solid form 1.5 parts by mass of MEK solution) 1.5 parts, flame retardant ("HCA-HQ" manufactured by Sanguang Co., Ltd., 10-(2,5-dihydroxyphenyl)-10-hydro-9-oxa-10- 2 parts of phosphaphenanthrene-10-oxide, an average particle diameter of 1.2 μm), spherical cerium oxide surface treated with an amine decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) "SPH516-05" made of a material (stock), an average particle diameter of 0.29 μm, a specific surface area of 16.3 m 2 /g, and a carbon content of 0.43 mg/m 2 per unit surface area, 110 parts, and uniformly dispersed by a high-speed rotary mixer. Filtered by cartridge filter (SHP020 manufactured by ROKITECHNO) The resin composition 2 was prepared.

(樹脂組成物3的調製) (Modulation of Resin Composition 3)

將萘型環氧樹脂(DIC(股)製「HP4032SS」、環氧當量 約144)4份、伸萘基醚型環氧樹脂(DIC(股)製「EXA-7311-G4」、環氧當量約213)8份、萘型環氧樹脂(新日鐵住金化學(股)製「ESN475V」、環氧當量約330)15份、苯氧基樹脂(三菱化學(股)製「YX7553BH30」、固形分30質量%之環己酮:甲基乙基酮(MEK)之1:1溶液)5份,邊於溶劑油15份及環己酮10份之混合溶劑攪拌邊使其加熱溶解。冷卻至室溫後,對其混合雙酚A二氰酸酯之預聚物(Lonza Japan(股)製「BA230S75」、氰酸酯當量約232、不揮發分75質量%之MEK溶液)20份、多官能氰酸酯樹脂(Lonza Japan(股)製「ULL-950S」、氰酸酯當量約230、不揮發分75質量%之MEK溶液)6份、活性酯系硬化劑(DIC(股)製「HPC-8000-65T」、活性基當量約225、不揮發成分65質量%之甲苯溶液)6份、碳二亞胺樹脂(日清紡化工(股)製「V-03」、碳二亞胺當量216、不揮發成分50質量%之甲苯溶液)5份、胺系硬化促進劑(4-二甲基胺基吡啶(DMAP)、固形分5質量%之MEK溶液)0.4份、硬化促進劑(東京化成(股)製、乙醯丙酮酸鈷(III)(Co(III)Ac)、固形分1質量%之MEK溶液)3份、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)表面處理之球狀二氧化矽(新日鐵住金材料(股)製「SPH516-05」、平均粒徑0.29μm、比表面積16.3m2/g、每一單位表面積之碳量0.43mg/m2)100份,以高速旋轉混合機均勻分散後,以筒式過濾器(ROKITECHNO製「SHP020」)過濾,調製樹脂組成物3。 4 parts of a naphthalene type epoxy resin ("HP4032SS" manufactured by DIC Co., Ltd., epoxy equivalent: 144), and a naphthyl ether type epoxy resin (EXA-7311-G4 manufactured by DIC), epoxy equivalent About 213) 8 parts, naphthalene type epoxy resin ("ESN475V" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., epoxy equivalent: about 330), 15 parts, phenoxy resin ("XX7553BH30" manufactured by Mitsubishi Chemical Corporation), solid form 5 parts by mass of cyclohexanone: a 1:1 solution of methyl ethyl ketone (MEK), 5 parts, and dissolved by heating while stirring a mixture of 15 parts of a solvent oil and 10 parts of cyclohexanone. After cooling to room temperature, 20 parts of a bisphenol A dicyanate prepolymer ("BA230S75" manufactured by Lonza Japan Co., Ltd., a cyanate equivalent of about 232, and a nonvolatile content of 75 mass% of MEK solution) was added thereto. Polyfunctional cyanate resin ("Lon-950S" manufactured by Lonza Japan Co., Ltd., MEK solution having a cyanate equivalent of about 230 and a nonvolatile content of 75% by mass) 6 parts, active ester-based hardener (DIC) 6 parts of "HPC-8000-65T", a reactive base equivalent of about 225, and a non-volatile content of 65 mass% in toluene), a carbodiimide resin ("V-03" manufactured by Nisshinbo Chemical Co., Ltd., carbodiimide) Equivalent 216, 50% by mass of a toluene solution of a nonvolatile content) 5 parts, an amine-based hardening accelerator (4-dimethylaminopyridine (DMAP), a solid content of 5% by mass of MEK solution) 0.4 parts, and a hardening accelerator ( 3 parts of Tokyo Chemical Co., Ltd., acetonitrile (III) (Co(III)Ac), and 1% by mass of MEK solution), and an amine decane-based coupling agent (Shin-Etsu Chemical Co., Ltd.) "KBM573") Spherical cerium oxide (SPH516-05, manufactured by Nippon Steel & Sumitomo Metal Co., Ltd.) with an average particle diameter of 0.29 μm and a specific surface area of 16.3 m 2 /g and a carbon content of 0.43 per unit surface area. mg / m 2) 100 parts, to After uniform dispersion speed rotary mixer to a cartridge filter (ROKITECHNO manufactured "SHP020") filter to prepare the resin composition 3.

(樹脂組成物4的調製) (Modulation of Resin Composition 4)

將雙酚A型環氧樹脂(三菱化學(股)製「828EL」、環氧當量約186)8份、聯苯型環氧樹脂(日本化藥(股)製「NC3000L」、環氧當量約272)15份、環氧化聚丁二烯((股)Daicel製「PB3600」、環氧當量約193)5份、苯氧基樹脂(三菱化學(股)製「YX7553BH30」、固形分30質量%之環己酮:甲基乙基酮(MEK)之1:1溶液)10份,邊於溶劑油10份及環己酮10份之混合溶劑攪拌邊使其加熱溶解。冷卻至室溫後,對其混合含有三嗪骨架之甲酚酚醛清漆系硬化劑(DIC(股)製「LA3018-50P」、羥基當量約151、固形分50%之2-甲氧基丙醇溶液)5份、活性酯系硬化劑(DIC(股)製「HPC-8000-65T」、活性基當量約225、不揮發成分65質量%之甲苯溶液)12份、碳二亞胺樹脂(日清紡化工(股)製「V-03」、碳二亞胺當量216、不揮發成分50質量%之甲苯溶液)10份、胺系硬化促進劑(4-二甲基胺基吡啶(DMAP)、固形分5質量%之MEK溶液)1.5份、難燃劑(三光(股)製「HCA-HQ」、10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲-10-氧化物、平均粒徑1.2μm)2份、將橡膠粒子(AICA工業(股)製、AC-3355)2份於溶劑油8份以室溫膨潤12小時者、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)表面處理之球狀二氧化矽((股)Admatex製「ADMAFINE SO-C1」、平均粒徑0.63μm、比表面積11.2m2/g、每一單位表面積之碳量 0.35mg/m2)110份,以高速旋轉混合機均勻分散後,以筒式過濾器(ROKITECHNO製「SHP030」)過濾,調製樹脂組成物4。 Bisphenol A type epoxy resin ("828EL" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent: 186), 8 parts, biphenyl type epoxy resin ("30003000" manufactured by Nippon Kayaku Co., Ltd., epoxy equivalent) 272) 15 parts, 5 parts of epoxidized polybutadiene ("PB3600" manufactured by Daicel, epoxide equivalent: 193), phenoxy resin ("XX7553BH30" manufactured by Mitsubishi Chemical Corporation, 30% by mass of solid content) 10 parts of cyclohexanone: methyl ethyl ketone (MEK) in a 1:1 solution, and dissolved in a mixed solvent of 10 parts of a solvent oil and 10 parts of cyclohexanone while stirring. After cooling to room temperature, a cresol novolak-based hardener containing a triazine skeleton ("LA3018-50P" manufactured by DIC Co., Ltd., 2-hydroxyl group having a hydroxyl equivalent of about 151 and a solid content of 50%) was mixed. Solution) 5 parts, active ester-based curing agent ("HPC-8000-65T" manufactured by DIC Co., Ltd., toluene solution having a reactive base equivalent of about 225 and a nonvolatile content of 65 mass%) 12 parts, carbodiimide resin (Nisshinbo 10 parts of "V-03", carbodiimide equivalent 216, non-volatile content 50% by mass of toluene solution), amine-based hardening accelerator (4-dimethylaminopyridine (DMAP), solid form 1.5 parts by mass of MEK solution) 1.5 parts, flame retardant ("HCA-HQ" manufactured by Sanguang Co., Ltd., 10-(2,5-dihydroxyphenyl)-10-hydro-9-oxa-10- 2 parts of phosphaphenanthrene-10-oxide, an average particle diameter of 1.2 μm), and 2 parts of rubber particles (AICA Industrial Co., Ltd., AC-3355) were emulsified at room temperature for 8 hours in a solvent oil for 8 hours. A cerium-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) is a spherical cerium oxide ("ADMAFINE SO-C1" manufactured by Admatex, having an average particle diameter of 0.63 μm and a specific surface area of 11.2 m 2 / g, carbon content per unit surface area of 0.35mg / m 2) 110 parts of a high After rotary mixer uniformly dispersed in the filter cartridge (ROKITECHNO manufactured "SHP030") filter to prepare the resin composition 4.

(樹脂組成物5的調製) (Modulation of Resin Composition 5)

將雙酚A型環氧樹脂(三菱化學(股)製「828EL」、環氧當量約186)10份、萘型環氧樹脂(新日鐵住金化學(股)製「ESN475V」、環氧當量約330)15份、環氧化聚丁二烯((股)Daicel製「PB3600」、環氧當量約193)2份、苯氧基樹脂(三菱化學(股)製「YX6954BH30」、固形分30質量%之環己酮:甲基乙基酮(MEK)之1:1溶液)5份,邊於溶劑油12份及環己酮10份之混合溶劑攪拌邊使其加熱溶解。冷卻至室溫後,對其混合雙酚A二氰酸酯之預聚物(Lonza Japan(股)製「BA230S75」、氰酸酯當量約232、不揮發分75質量%之MEK溶液)20份、多官能氰酸酯樹脂(Lonza Japan(股)製「ULL-950S」、氰酸酯當量約230、不揮發分75質量%之MEK溶液)6份、活性酯系硬化劑(DIC(股)製「HPC-8000-65T」、活性基當量約225、不揮發成分65質量%之甲苯溶液)6份、嵌段型異氰酸酯樹脂(DIC(股)製「BURNOCK D-500」、不揮發成分65質量%之乙酸乙酯溶液)5份、胺系硬化促進劑(4-二甲基胺基吡啶(DMAP)、固形分5質量%之MEK溶液)0.4份、硬化促進劑(東京化成(股)製、乙醯丙酮酸鈷(III)(Co(III)Ac)、固形分1質量%之MEK溶液)3份、以胺基矽烷系耦合劑 (信越化學工業(股)製「KBM573」)表面處理之球狀二氧化矽((股)Admatex製「ADMAFINE SO-C1」、平均粒徑0.63μm、比表面積11.2m2/g、每一單位表面積之碳量0.35mg/m2)100份,以高速旋轉混合機均勻分散後,以筒式過濾器(ROKITECHNO製「SHP030」)過濾,調製樹脂組成物5。 Bisphenol A type epoxy resin ("828EL" manufactured by Mitsubishi Chemical Co., Ltd., epoxy equivalent: 186) 10 parts, naphthalene type epoxy resin (ESN475V manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd.), epoxy equivalent About 330 parts, 15 parts, epoxidized polybutadiene ("PB3600" manufactured by Daicel, epoxide equivalent: 193), 2 parts, phenoxy resin ("XX6954BH30" manufactured by Mitsubishi Chemical Corporation, 30 parts of solid content) 5 parts of cyclohexanone: a 1:1 solution of methyl ethyl ketone (MEK), and dissolved in a mixed solvent of 12 parts of a solvent oil and 10 parts of cyclohexanone while stirring. After cooling to room temperature, 20 parts of a bisphenol A dicyanate prepolymer ("BA230S75" manufactured by Lonza Japan Co., Ltd., a cyanate equivalent of about 232, and a nonvolatile content of 75 mass% of MEK solution) was added thereto. Polyfunctional cyanate resin ("Lon-950S" manufactured by Lonza Japan Co., Ltd., MEK solution having a cyanate equivalent of about 230 and a nonvolatile content of 75% by mass) 6 parts, active ester-based hardener (DIC) 6 parts of a "HPC-8000-65T", a toluene solution having a living base equivalent of about 225 and a nonvolatile content of 65% by mass), a block type isocyanate resin ("BURNOCK D-500" manufactured by DIC Co., Ltd., a nonvolatile component 65 5 parts by mass of ethyl acetate solution), an amine-based hardening accelerator (4-dimethylaminopyridine (DMAP), a solid content of 5% by mass of MEK solution) 0.4 parts, and a hardening accelerator (Tokyo Chemical Co., Ltd.) 3 parts of a solution of cobalt (III) pyruvate (III) (Co(III)Ac) and a solid content of 1% by mass of MEK), and an amine decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) The treated spherical cerium oxide ("ADMAFINE SO-C1" manufactured by Admatex, having an average particle diameter of 0.63 μm, a specific surface area of 11.2 m 2 /g, and a carbon content per unit surface area of 0.35 mg/m 2 ) of 100 parts, Rotating mixer at high speed After uniform dispersion, to a cartridge filter (ROKITECHNO manufactured "SHP030") filter to prepare the resin composition 5.

將樹脂組成物1~5的調製所用之成分與其摻合量(不揮發分之質量份)示於下述表1。 The components used for the preparation of the resin compositions 1 to 5 and the blending amounts thereof (parts by mass of nonvolatile matter) are shown in Table 1 below.

(實施例1~3、比較例1~2之樹脂薄片的製作) (Production of Resin Sheets of Examples 1 to 3 and Comparative Examples 1 and 2)

作為支持體,準備以醇酸樹脂系脫模劑(Lintec(股)製「AL-5」)脫模處理之PET薄膜(東麗(股)製「Lumilar R80」、厚度38μm、軟化點130℃、「脫模PET」)。 As a support, a PET film (Lumilar R80, manufactured by Toray Industries, Ltd.) having a mold release treatment of an alkyd resin release agent ("AL-5" manufactured by Lintec Co., Ltd.), a thickness of 38 μm, and a softening point of 130 ° C was prepared. , "Release PET").

將各樹脂組成物於脫模PET上,以乾燥後之樹脂組成物層的厚度成為40μm的方式,在模塗佈機均勻塗佈,藉由於70℃至100℃乾燥4.5分鐘或於60℃至90℃乾燥2分鐘,於脫模PET上形成樹脂組成物層。其次,於不與樹脂薄片之支持體接合的面,作為保護薄膜,將聚丙烯薄膜(王子Ftex(股)製「Alfan MA-411」、厚度15μm)之粗糙面以與樹脂組成物層接合的方式層合。藉此,得到由支持體、樹脂組成物層、及保護薄膜的順序所構成之介電正切測定用的樹脂薄片。 Each of the resin compositions was applied to a release PET, and the resin composition layer after drying was 40 μm, and uniformly coated in a die coater by drying at 70 ° C to 100 ° C for 4.5 minutes or at 60 ° C. After drying at 90 ° C for 2 minutes, a resin composition layer was formed on the release PET. Next, a rough surface of a polypropylene film ("Alfan MA-411" manufactured by Prince Ftex Co., Ltd., thickness: 15 μm) was bonded to the resin composition layer as a protective film on the surface which was not bonded to the support of the resin sheet. Way to laminate. Thereby, a resin sheet for dielectric tangent measurement consisting of a support, a resin composition layer, and a protective film was obtained.

除了將各樹脂組成物於脫模PET上以乾燥後之樹脂組成物層的厚度成為13μm的方式塗佈之外,其他與介電正切測定用之樹脂薄片同樣進行,而得到最低熔融黏度測定用及絕緣信賴性測定用之樹脂薄片。 In the same manner as the resin sheet for dielectric tangential measurement, the resin composition was applied to the release PET so that the thickness of the resin composition layer after drying was 13 μm, and the lowest melt viscosity was measured. And a resin sheet for insulation reliability measurement.

<最低熔融黏度的測定> <Measurement of the lowest melt viscosity>

使用樹脂組成物層的厚度為13μm之樹脂薄片,從脫模PET(支持體)僅剝離樹脂組成物層,藉由以模具壓縮,製作測定用顆粒(直徑18mm、1.2~1.3g)。 A resin sheet having a thickness of 13 μm in the resin composition layer was used, and only the resin composition layer was peeled off from the release PET (support), and the particles for measurement (diameter: 18 mm, 1.2 to 1.3 g) were produced by compression with a mold.

使用動態黏彈性測定裝置((股)UBM製 「Rheosol-G3000」),對於試料樹脂組成物層1g,使用直徑18mm之平行板,從開始溫度60℃至200℃以昇溫速度5℃/分鐘進行昇溫,在測定溫度間隔2.5℃、振動數1Hz、扭曲1deg之測定條件測定動態黏彈性率,算出最低熔融黏度(poise),示於表2。 Dynamic viscoelasticity measuring device (made by UBM) "Rheosol-G3000"), using a parallel plate having a diameter of 18 mm for the sample resin composition layer 1g, the temperature was raised from a starting temperature of 60 ° C to 200 ° C at a temperature increase rate of 5 ° C / min, and the measurement temperature interval was 2.5 ° C and the number of vibrations was 1 Hz. The dynamic viscoelasticity was measured by measuring the distortion of 1 deg, and the lowest melt viscosity (poise) was calculated and shown in Table 2.

<硬化物之介電正切的測定> <Measurement of dielectric tangent of hardened material>

以脫模PET薄膜(Lintec(股)製「501010」、厚度38μm、240mm平方)之未處理面與玻璃布基材環氧樹脂兩面覆銅層合板(松下電工(股)製「R5715ES」、厚度0.7mm、255mm平方)接觸的方式,設置於玻璃布基材環氧樹脂兩面覆銅層合板上,將該脫模PET薄膜的四邊以聚醯亞胺接著膠帶(寬度10mm)固定。 A copper-clad laminate (R5715ES, manufactured by Matsushita Electric Works Co., Ltd.) and a thickness of an untreated surface of a PET film ("501010", a thickness of 38 μm, and a width of 240 mm) and a glass cloth substrate epoxy resin. The contact pattern of 0.7 mm and 255 mm square was set on the copper-clad laminate of the glass cloth substrate epoxy resin, and the four sides of the release PET film were fixed with polyimide and tape (width: 10 mm).

將於實施例及比較例製作之樹脂組成物層的厚度為40μm之樹脂薄片(200mm平方),使用批量式真空加壓層合機(日光暨材料(股)製2階段積聚層合機、CVP700),以樹脂組成物層與脫模PET薄膜(Lintec(股)製「501010」)之脫模面接觸的方式,層合處理於中央。層合處理係藉由進行減壓30秒將氣壓成為13hPa以下後,在100℃、壓力0.74MPa壓著30秒來實施。 A resin sheet (200 mm square) having a thickness of 40 μm in the resin composition layer prepared in the examples and the comparative examples, using a batch type vacuum pressure laminator (two-stage accumulation laminator made of daylight and material), CVP700 In the case where the resin composition layer is in contact with the release surface of the release PET film ("501010" manufactured by Lintec Co., Ltd.), the laminate treatment is performed at the center. The lamination treatment was carried out by subjecting the gas pressure to 13 hPa or less after performing pressure reduction for 30 seconds, and then pressing at 100 ° C and a pressure of 0.74 MPa for 30 seconds.

其次,以100℃之溫度條件投入100℃之烤箱後30分鐘,其次以180℃之溫度條件,轉移至180℃之烤箱後30分鐘,使其熱硬化。然後,將基板從室溫環境下取出,從樹脂薄片剝離脫模PET(支持體)後,進而以投入 200℃之烤箱後90分鐘之硬化條件使其熱硬化。 Next, it was placed in an oven at 100 ° C for 30 minutes at a temperature of 100 ° C, and then transferred to an oven at 180 ° C for 30 minutes at a temperature of 180 ° C to thermally harden it. Then, the substrate is taken out from the room temperature environment, and the release PET (support) is peeled off from the resin sheet, and then the input is further performed. The hardening condition of the oven at 200 ° C for 90 minutes causes it to be thermally hardened.

將上述「評估用硬化物」切斷成寬度1.5mm、長度80mm之試驗片,針對該試驗片使用安捷倫科技公司製「HP8362B」,藉由空腔共振攝動法,在測定頻率10GHz、測定溫度23℃、或150℃測定介電正切(Df)。在測定頻率10GHz、測定溫度23℃、或150℃測定介電正切(Df)。對於3片試驗片進行測定,算出平均值,將結果示於表2。 The "hardened material for evaluation" was cut into a test piece having a width of 1.5 mm and a length of 80 mm, and "HP8362B" manufactured by Agilent Technologies Co., Ltd. was used for the test piece, and the measurement frequency was measured at a frequency of 10 GHz by a cavity resonance perturbation method. Dielectric tangent (Df) was measured at 23 ° C or 150 ° C. The dielectric tangent (Df) was measured at a measurement frequency of 10 GHz, a measurement temperature of 23 ° C, or 150 ° C. Three test pieces were measured, and the average value was calculated, and the result is shown in Table 2.

<絕緣信賴性的評估、導體層間之絕緣層的厚度的測定> <Evaluation of insulation reliability and measurement of thickness of insulating layer between conductor layers> (評估用基板的調製) (modulation of the evaluation substrate) (1)內層電路基板的基底處理 (1) Base processing of the inner layer circuit substrate

作為內層電路基板,準備於兩面具有在1mm平方格子之配線圖型(殘銅率為59%)形成之電路導體(銅)之玻璃布基材環氧樹脂兩面覆銅層合板(銅箔的厚度18μm、基板的厚度0.3mm、Panasonic(股)製「R1515F」)。該內層電路基板的兩面在MEC(股)製「CZ8201」進行銅表面之粗糙化處理(銅蝕刻量0.5μm)。 As an inner layer circuit board, a glass cloth substrate epoxy resin double-sided copper-clad laminate (copper foil) having a circuit conductor (copper) formed on a wiring pattern of 1 mm square grid (residual copper ratio: 59%) is prepared. The thickness is 18 μm, the thickness of the substrate is 0.3 mm, and "R1515F" manufactured by Panasonic Co., Ltd.). The copper surface was roughened (copper etching amount: 0.5 μm) on both sides of the inner layer circuit board by "CZ8201" manufactured by MEC.

(2)樹脂薄片的層合 (2) Lamination of resin sheets

將於實施例及比較例製作之樹脂組成物層的厚度為13μm之樹脂薄片使用批量式真空加壓層合機(日光.材料(股)製、2階段積聚層合機、CVP700),以樹脂組成物層與內層電路基板接觸的方式,層合在內層電路基板的兩 面。層合係藉由進行減壓30秒將氣壓成為13hPa以下後,在130℃、壓力0.74MPa壓著45秒來實施。其次,在120℃、壓力0.5MPa進行75秒熱沖壓。 The resin sheet having a thickness of 13 μm in the resin composition layer prepared in the examples and the comparative examples was subjected to a batch type vacuum pressure laminator (daylight, material, two-stage accumulation laminator, CVP700), and resin. Two layers of the inner layer circuit substrate are laminated in such a manner that the composition layer is in contact with the inner layer circuit substrate surface. The laminating system was carried out by subjecting the pressure to 13 hPa or less after performing pressure reduction for 30 seconds, and then pressing at 130 ° C and a pressure of 0.74 MPa for 45 seconds. Next, hot stamping was performed for 75 seconds at 120 ° C and a pressure of 0.5 MPa.

(3)樹脂組成物層之熱硬化 (3) Thermal hardening of the resin composition layer

將層合樹脂薄片之內層電路基板以100℃之溫度條件投入100℃之烤箱後30分鐘,其次以180℃之溫度條件,轉移至180℃之烤箱後30分鐘,使其熱硬化,而形成絕緣層。 The inner layer circuit board of the laminated resin sheet was placed in an oven at 100 ° C for 30 minutes at a temperature of 100 ° C, and then transferred to an oven at 180 ° C for 30 minutes at a temperature of 180 ° C to thermally harden it. Insulation.

(4)通孔的形成 (4) Formation of through holes

從絕緣層及支持體的上方,使用三菱電機(股)製CO2雷射加工機「605GTWIII(-P)」,從支持體的上方照射雷射,於格子圖型之導體上的絕緣層形成頂徑(70μm)之通孔。雷射的照射條件,係以遮罩徑為2.5mm,脈衝寬度為16μs,能量為0.39mJ/擊(Shot),擊數為2,突衝模式(Burst Mode)(10kHz)進行。 Above the insulating layer and the support, a CO 2 laser processing machine "605GTWIII (-P)" manufactured by Mitsubishi Electric Corporation was used to irradiate the laser from above the support to form an insulating layer on the conductor of the lattice pattern. Through hole with a top diameter (70 μm). The laser irradiation conditions were performed with a mask diameter of 2.5 mm, a pulse width of 16 μs, an energy of 0.39 mJ/shot, a number of shots of 2, and a Burst Mode (10 kHz).

(5)進行粗糙化處理之步驟 (5) Steps of roughening

從設置通孔之電路基板剝離支持體,進行去膠渣(Desmear)處理。尚,作為去膠渣處理,實施下述之濕式去膠渣處理。 The support is peeled off from the circuit board on which the through holes are provided, and desmearing is performed. Further, as the desmear treatment, the following wet desmearing treatment was carried out.

濕式去膠渣處理:於膨潤液(Atotek Japan(股)製「Swelling Dip Securiganth P」、二乙二醇單丁基醚及氫氧化鈉之水溶液)以60℃浸漬5分鐘,其次於氧化劑溶液(Atotek Japan(股)製「Concentrate.Compact CP」、過錳酸鉀濃度約6%、氫氧化鈉濃度約4%之水溶液)以80℃浸漬10分鐘,最後於中和液(Atotek Japan(股)製「Reduction solution Securigant P」、硫酸水溶液)以40℃浸漬5分鐘後,再於80℃乾燥15分鐘。 Wet desmear treatment: in swelling liquid ("Swelling Dip" by Atotek Japan Co., Ltd. Securiganth P", an aqueous solution of diethylene glycol monobutyl ether and sodium hydroxide) was immersed at 60 ° C for 5 minutes, followed by an oxidizing agent solution ("Concentrate. Compact CP" manufactured by Atotek Japan Co., Ltd., potassium permanganate concentration 6%, an aqueous solution having a sodium hydroxide concentration of about 4%) was immersed at 80 ° C for 10 minutes, and finally immersed in a neutralizing solution ("Reduction solution Securigant P" manufactured by Atotek Japan Co., Ltd., aqueous sulfuric acid solution) at 40 ° C for 5 minutes. It was further dried at 80 ° C for 15 minutes.

(6)形成導體層之步驟 (6) Step of forming a conductor layer (6-1)無電解鍍敷步驟 (6-1) Electroless plating step

為了於上述電路基板的表面形成導體層,進行包含下述1~6之步驟之鍍敷步驟(使用Atotek Japan(股)製之藥液之鍍銅步驟)形成導體層。 In order to form a conductor layer on the surface of the circuit board, a conductor layer is formed by a plating step (a copper plating step using a chemical liquid manufactured by Atotek Japan Co., Ltd.) including the following steps 1 to 6.

1.鹼清洗(設置通孔之絕緣層的表面之洗淨與電荷調整) 1. Alkali cleaning (washing and charge adjustment of the surface of the insulating layer of the through hole)

使用商品名:Cleaning Cleaner Securiganth 902(商品名)於60℃洗淨5分鐘。 It was washed at 60 ° C for 5 minutes using a trade name: Cleaning Cleaner Securiganth 902 (trade name).

2.軟蝕刻(通孔內之洗淨) 2. Soft etching (washing in the through hole)

使用硫酸酸性過氧二硫酸鈉水溶液,於30℃處理1分鐘。 The aqueous solution of acidic sodium peroxodisulfate was used and treated at 30 ° C for 1 minute.

3.預浸(用以賦予Pd之絕緣層的表面之電荷的調整) 3. Prepreg (adjustment of the charge applied to the surface of the insulating layer of Pd)

使用Pre.Dip Neoganth B(商品名),於室溫處理1分鐘。 It was treated with Pre.Dip Neoganth B (trade name) for 1 minute at room temperature.

4.活化劑(Activator)賦予(對絕緣層的表面之Pd的賦予) 4. Activator imparted (giving the Pd of the surface of the insulating layer)

使用Activator Neoganth 834(商品名),於35℃處理5分鐘。 The Activator Neoganth 834 (trade name) was used and treated at 35 ° C for 5 minutes.

5.還原(還原絕緣層所賦予之Pd) 5. Reduction (reduction of Pd given by the insulating layer)

使用Reducer Neoganth WA(商品名)與Reducer Acceralator 810 mod.(商品名)的混合液,於30℃處理5分鐘。 A mixture of Reducer Neoganth WA (trade name) and Reducer Acceralator 810 mod. (trade name) was used for 5 minutes at 30 °C.

6.無電解鍍銅步驟(將Cu析出於絕緣層的表面(Pd表面)) 6. Electroless copper plating step (Cu is deposited on the surface of the insulating layer (Pd surface))

使用Basic Solution Printganth MSK-DK(商品名)、與Copper solution Printganth MSK(商品名)、與Stabilizer Printganth MSK-DK(商品名)、與Reducer Cu(商品名)的混合液,於35℃處理20分鐘。所形成之無電解鍍銅層的厚度為0.8μm。 A mixture of Basic Solution Printganth MSK-DK (trade name), Copper solution Printganth MSK (trade name), Stabilizer Printganth MSK-DK (trade name), and Reducer Cu (trade name) was used at 35 ° C for 20 minutes. . The thickness of the electroless copper plating layer formed was 0.8 μm.

(6-2)電解鍍敷步驟 (6-2) Electroplating step

其次,使用Atotek Japan(股)製之藥液,以於通孔內填充銅的條件進行電解鍍銅步驟。然後,作為用以藉由蝕刻之圖型化的抗蝕圖型,使用通孔所導通之直徑1mm之焊盤圖型(Land Pattern)及、未與下層導體連接之直徑10mm之圓形導體圖型,於絕緣層的表面以10μm之厚度形成具有焊盤及導體圖型之導體層。其次,將退火處理在200℃進行90分鐘。將此基板作為評估用基板A。 Next, an electrolytic copper plating step was carried out using a chemical liquid manufactured by Atotek Japan Co., Ltd. under the condition that copper was filled in the through holes. Then, as a resist pattern for patterning by etching, a land pattern of 1 mm in diameter and a circular conductor having a diameter of 10 mm which is not connected to the lower conductor are used. A conductor layer having a pad and a conductor pattern is formed on the surface of the insulating layer by a thickness of 10 μm. Next, the annealing treatment was carried out at 200 ° C for 90 minutes. This substrate was used as the evaluation substrate A.

(7)導體層間之絕緣層的厚度之測定 (7) Determination of the thickness of the insulating layer between the conductor layers

將評估用基板A使用FIB-SEM複合裝置(SII奈米科技(股)製「SMI3050SE」),進行剖面觀察。詳細而言,將在與導體層的表面垂直之方向的剖面藉由FIB(集束離子束)削出,從剖面SEM圖像,測定導體層間之絕緣層厚。對於各樣品,觀察隨機選定5處之剖面SEM圖像,將其平均值作為導體層間之絕緣層的厚度。 The evaluation substrate A was subjected to cross-sectional observation using a FIB-SEM composite device (SMI3050SE, manufactured by SII Nanotech Co., Ltd.). Specifically, the cross section perpendicular to the surface of the conductor layer was cut by FIB (bundled ion beam), and the thickness of the insulating layer between the conductor layers was measured from the cross-sectional SEM image. For each sample, a cross-sectional SEM image of five randomly selected spots was observed, and the average value was taken as the thickness of the insulating layer between the conductor layers.

(8)絕緣層之絕緣信賴性的評估 (8) Evaluation of insulation reliability of insulation layer

將在上述所得之評估用基板A的直徑10mm之圓形導體側定為+電極,將與直徑1mm之焊盤連接之內層電路基板的格子導體(銅)側定為-電極,使用高度加速壽命試驗裝置(ETAC製「PM422」),以130℃、85%相對濕度、3.3V直流電壓施加的條件,將經過200小時時之絕緣電阻值在電化學遷移測試儀(Electrochemical migration tester)(J-RAS(股)製「ECM-100」)測定(n=6)。在6點試驗片(piece)全部,將其絕緣電阻值為107Ω以上的情況定為「○」,1個未滿107Ω的情況定為「×」,將評估結果示於表2。表2所記載之絕緣電阻值係6點試驗片的絕緣電阻值之最低值。 The circular conductor side having a diameter of 10 mm of the evaluation substrate A obtained above was defined as a + electrode, and the lattice conductor (copper) side of the inner layer circuit substrate connected to the pad having a diameter of 1 mm was defined as a -electrode, and the height was accelerated. The life test device ("PM422" manufactured by ETAC) has an insulation resistance value of 200 hours after being applied at 130 ° C, 85% relative humidity, and 3.3 V DC voltage in an electrochemical migration tester (J). - RAS (share) system "ECM-100") measurement (n = 6). In the case of all the 6-point test pieces, the case where the insulation resistance value is 10 7 Ω or more is set to "○", and the case where one is less than 10 7 Ω is set to "x", and the evaluation result is shown in Table 2. . The insulation resistance value shown in Table 2 is the lowest value of the insulation resistance value of the 6-point test piece.

Claims (10)

一種樹脂薄片,其係包含支持體、與接合於該支持體上之樹脂組成物層之樹脂薄片,該樹脂組成物層的硬化物在測定頻率10GHz、23℃之介電正切為0.006以下,該樹脂組成物層的硬化物在測定頻率10GHz、150℃之介電正切為0.01以下。 A resin sheet comprising a support and a resin sheet bonded to the resin composition layer on the support, wherein the cured product of the resin composition layer has a dielectric tangent of 0.006 or less at a measurement frequency of 10 GHz and 23 ° C. The cured product of the resin composition layer has a dielectric tangent of 0.01 or less at a measurement frequency of 10 GHz and 150 °C. 如請求項1之樹脂薄片,其中,樹脂組成物層的厚度為15μm以下。 The resin sheet of claim 1, wherein the resin composition layer has a thickness of 15 μm or less. 如請求項1之樹脂薄片,其中,樹脂組成物層的最低熔融黏度為1000poise以上。 The resin sheet of claim 1, wherein the resin composition layer has a minimum melt viscosity of 1000 poise or more. 如請求項1之樹脂薄片,其中,樹脂組成物層係含有環氧樹脂及硬化劑。 The resin sheet of claim 1, wherein the resin composition layer contains an epoxy resin and a hardener. 如請求項1之樹脂薄片,其中,樹脂組成物層含有無機填充材,且將樹脂組成物層中之不揮發成分定為100質量%的情況下,該無機填充材的含量為50質量%以上。 The resin sheet according to claim 1, wherein the resin composition layer contains an inorganic filler, and when the nonvolatile component in the resin composition layer is 100% by mass, the content of the inorganic filler is 50% by mass or more. . 如請求項1之樹脂薄片,其係印刷配線板之絕緣層形成用。 The resin sheet of claim 1, which is used for forming an insulating layer of a printed wiring board. 如請求項1之樹脂薄片,其係1GHz以上的高頻率基板之絕緣層形成用。 The resin sheet of claim 1, which is used for forming an insulating layer of a high frequency substrate of 1 GHz or more. 如請求項1~7中任一項之樹脂薄片,其係包含第1導體層、與第2導體層、與絕緣第1導體層與第2導體層之絕緣層,第1導體層與第2導體層之間的絕緣層的厚度為6μm以下之印刷配線板的該絕緣層形成用。 The resin sheet according to any one of claims 1 to 7, comprising a first conductor layer, a second conductor layer, and an insulating layer that insulates the first conductor layer and the second conductor layer, the first conductor layer and the second layer The insulating layer of the printed wiring board having a thickness of the insulating layer between the conductor layers of 6 μm or less is formed. 一種印刷配線板,其係包含第1導體層、第2導體 層、及絕緣第1導體層與第2導體層之絕緣層,第1導體層與第2導體層之間的絕緣層的厚度為6μm以下之印刷配線板,該絕緣層係如請求項1~7中任一項之樹脂薄片的樹脂組成物層之硬化物。 A printed wiring board comprising a first conductor layer and a second conductor a printed wiring board having a thickness of 6 μm or less in the insulating layer of the insulating layer between the first conductor layer and the second conductor layer, and the insulating layer is as claimed in claim 1 A cured product of a resin composition layer of the resin sheet of any one of 7. 一種半導體裝置,其係包含如請求項9之印刷配線板。 A semiconductor device comprising the printed wiring board of claim 9.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI820163B (en) * 2018-07-26 2023-11-01 日商味之素股份有限公司 resin composition

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6485672B2 (en) * 2017-01-26 2019-03-20 三菱瓦斯化学株式会社 Resin composition, prepreg, metal foil-clad laminate, resin sheet and printed wiring board
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JP7342358B2 (en) * 2018-12-26 2023-09-12 住友ベークライト株式会社 Resin compositions, resin films with carriers using the same, prepregs, laminates, printed wiring boards, and semiconductor devices
JP7255411B2 (en) * 2019-07-30 2023-04-11 味の素株式会社 resin composition

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58163645A (en) * 1982-03-17 1983-09-28 ユ−オ−ピ−・インコ−ポレイテツド Manufacture of copper lined laminated board
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JP2000230102A (en) 1999-02-12 2000-08-22 Cosmo Research Inst Low-permittivity resin composition
TWI478810B (en) * 2008-03-25 2015-04-01 Ajinomoto Kk An insulating resin sheet, and a multilayer printed circuit board using the same
EP2113534B8 (en) * 2008-04-01 2011-09-21 Mitsubishi Gas Chemical Company, Inc. Resin composition, prepreg and metal-foil-clad laminate
TWI540170B (en) * 2009-12-14 2016-07-01 Ajinomoto Kk Resin composition
WO2012063918A1 (en) * 2010-11-12 2012-05-18 国立大学法人東北大学 Multilayer wiring board
MY164127A (en) * 2011-09-30 2017-11-30 Mitsubishi Gas Chemical Co Resin composition, prepreg and metal foil-clad laminate
KR101505358B1 (en) * 2012-03-19 2015-03-23 아사히 가세이 이-매터리얼즈 가부시키가이샤 Prepreg comprising polyphenylene ether particles
JP5955156B2 (en) * 2012-08-10 2016-07-20 ナミックス株式会社 Resin composition, and adhesive film and coverlay film thereby
JP6136330B2 (en) 2013-02-13 2017-05-31 味の素株式会社 Thin film resin composition, thin film, laminated sheet and multilayer printed wiring board
TWI668269B (en) * 2014-06-30 2019-08-11 日商味之素股份有限公司 Resin composition

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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