TW201728456A - Resin sheet capable of reducing the bending of the substrate and having excellent part embedding property - Google Patents

Resin sheet capable of reducing the bending of the substrate and having excellent part embedding property Download PDF

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TW201728456A
TW201728456A TW105138435A TW105138435A TW201728456A TW 201728456 A TW201728456 A TW 201728456A TW 105138435 A TW105138435 A TW 105138435A TW 105138435 A TW105138435 A TW 105138435A TW 201728456 A TW201728456 A TW 201728456A
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resin
resin composition
epoxy resin
curable resin
composition layer
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TW105138435A
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TWI748969B (en
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Shigeo Nakamura
Kota Torii
Makoto Yunoki
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Ajinomoto Kk
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/386Improvement of the adhesion between the insulating substrate and the metal by the use of an organic polymeric bonding layer, e.g. adhesive
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/34Silicon-containing compounds
    • C08K3/36Silica
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/18Layered products comprising a layer of synthetic resin characterised by the use of special additives
    • B32B27/20Layered products comprising a layer of synthetic resin characterised by the use of special additives using fillers, pigments, thixotroping agents
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/38Layered products comprising a layer of synthetic resin comprising epoxy resins
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/003Additives being defined by their diameter
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/006Additives being defined by their surface area

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

To provide a resin sheet capable of reducing the bending of the substrate and excellent in the parts embedding property is excellent. A resin sheet having a support and a hardened resin composition layer arranged on the support. The hardened resin composition layer comprises inorganic fillers. The hardened resin composition layer includes 74mass% or more of inorganic filler. The average particle diameter of the inorganic filler is 1.6 micrometers or less. The product of the specific surface area [m2/g] and the true density [g/cm3] of the inorganic filler is 6 to 8. The minimum melt viscosity of the hardened resin composition layer is lower than 12000 poise.

Description

樹脂薄片 Resin sheet

本發明係關於樹脂薄片、配線板、及半導體裝置。 The present invention relates to a resin sheet, a wiring board, and a semiconductor device.

近年來,正增大智慧型手機、平板PC之小型高性能電子器件的需求。伴隨此,正尋求此等小型電子器件所使用之印刷配線板的進一步高功能化及小型化。 In recent years, there is a growing demand for small high-performance electronic devices for smart phones and tablet PCs. Along with this, further improvement in the functionality and miniaturization of printed wiring boards used in such small electronic devices is being sought.

印刷配線板中,實裝裸晶片、晶片狀電容器、晶片狀電感器等之零件。以往如此之零件,雖僅實裝在印刷配線板的表面電路,但該實裝量有限,對應近年來之印刷配線板的進一步高功能化、小型化的要求有困難。 In the printed wiring board, components such as a bare chip, a wafer capacitor, and a wafer inductor are mounted. In the past, such a component is only mounted on the surface circuit of the printed wiring board, but the mounting amount is limited, and it is difficult to further increase the functionality and size of the printed wiring board in recent years.

作為解決上述問題者,提案有藉由將零件內藏在內層電路基板,增加零件之搭載量並且實現小型化(薄型化)之零件內藏電路板(例如參照專利文獻1)。 In order to solve the problem, it is proposed to incorporate a circuit board in which a component is housed in an inner layer circuit board, and to increase the number of components to be mounted, and to reduce the size (thin-thickness) of the component (see, for example, Patent Document 1).

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本專利第4114629號公報 [Patent Document 1] Japanese Patent No. 4114629

然而,將在配置零件內藏電路板之零件的凹部(孔洞(Cavity))之零件嵌入性成為優異者,重視樹脂流動,抑制零件嵌入所使用之樹脂組成物中之無機填充材的含量,並且雖考慮使用分子量比較小之樹脂,但熱膨脹率提高基板彎曲易增大。另一方面,為了減低零件內藏電路板之基板彎曲,雖考慮增多樹脂組成物中之無機填充材的含量,但藉此有提高熔融黏度易降低在孔洞之零件嵌入性的問題。 However, the component embedding property of the concave portion (cavity) of the component in which the component board is placed is excellent, and the resin flow is emphasized, and the content of the inorganic filler in the resin composition used for the component embedding is suppressed, and Although it is considered to use a resin having a relatively small molecular weight, the thermal expansion rate increases the bending of the substrate easily. On the other hand, in order to reduce the bending of the substrate of the component-embedded circuit board, it is considered that the content of the inorganic filler in the resin composition is increased, but there is a problem in that the melt viscosity is improved to easily reduce the embedding property of the hole.

因此,本發明欲解決之課題係提供一種減低基板的彎曲,且零件嵌入性優異之樹脂薄片。 Therefore, the problem to be solved by the present invention is to provide a resin sheet which is excellent in part embedding property while reducing the curvature of the substrate.

本發明者們針對上述之課題努力研究的結果,發現藉由將於形成硬化性樹脂組成物層之硬化性樹脂組成物中,平均粒徑為1.6μm以下,同時比表面積[m2/g]與真密度[g/cm3]的乘積為6~8之無機填充材作為包含74質量%以上之構成,將硬化性樹脂組成物層之最低熔融黏度定為12000poise以下,可解決上述課題,而終至完成本發明。本發明係根據該新穎之卓見而完成者。 As a result of intensive studies on the above-mentioned problems, the present inventors have found that the average particle diameter is 1.6 μm or less and the specific surface area [m 2 /g] by the curable resin composition in which the curable resin composition layer is to be formed. The inorganic filler having a product of 6 to 8 in the true density [g/cm 3 ] is contained in an amount of 74% by mass or more, and the lowest melt viscosity of the curable resin composition layer is set to 12,000 poise or less. The invention is finally completed. The present invention has been completed in accordance with the novel teachings.

亦即,本發明係包含以下之內容。 That is, the present invention includes the following contents.

[1]一種樹脂薄片,其係具備支持體、與設置在支持體上之硬化性樹脂組成物層之樹脂薄片,其特徵為硬化性 樹脂組成物層係包含無機填充材,硬化性樹脂組成物層中之無機填充材的含量為74質量%以上,無機填充材之平均粒徑為1.6μm以下,無機填充材之比表面積[m2/g]與真密度[g/cm3]的乘積為6~8,硬化性樹脂組成物層之最低熔融黏度為12000poise以下。 [1] A resin sheet comprising a support and a resin sheet of a curable resin composition layer provided on a support, wherein the curable resin composition layer contains an inorganic filler, and the curable resin composition The content of the inorganic filler in the layer is 74% by mass or more, and the average particle diameter of the inorganic filler is 1.6 μm or less, and the product of the specific surface area [m 2 /g] of the inorganic filler and the true density [g/cm 3 ] is 6 to 8, the lowest melt viscosity of the curable resin composition layer is 12,000 poise or less.

[2]如[1]之樹脂薄片,其中,無機填充材為二氧化矽。 [2] The resin sheet according to [1], wherein the inorganic filler is cerium oxide.

[3]如[1]或[2]之樹脂薄片,其中,硬化性樹脂組成物層係包含(a)環氧樹脂,該環氧樹脂係包含液狀環氧樹脂,硬化性樹脂組成物層中之液狀環氧樹脂的含量為1質量%以上。 [3] The resin sheet according to [1] or [2], wherein the curable resin composition layer comprises (a) an epoxy resin comprising a liquid epoxy resin, and a curable resin composition layer The content of the liquid epoxy resin is 1% by mass or more.

[4]如[3]之樹脂薄片,其中,(a)環氧樹脂係進一步包含固體狀環氧樹脂,固體狀環氧樹脂之質量MS相對於硬化性樹脂組成物層中之液狀環氧樹脂之質量ML的比(MS/ML)為0.6~10。 [4] The resin sheet according to [3], wherein (a) the epoxy resin further comprises a solid epoxy resin, and the mass M S of the solid epoxy resin is relative to the liquid ring in the curable resin composition layer The ratio (M S /M L ) of the mass M L of the oxygen resin is 0.6 to 10.

[5]如[3]或[4]之樹脂薄片,其中,(a)環氧樹脂為具有(a’)芳香族構造之環氧樹脂。 [5] The resin sheet according to [3] or [4] wherein (a) the epoxy resin is an epoxy resin having an (a') aromatic structure.

[6]如[3]~[5]中任一項之樹脂薄片,其中,硬化性樹脂組成物層係進一步包含(d)成分:選自具有玻璃轉移溫度為25℃以下之官能基的樹脂、及具有於25℃為液狀之官能基的樹脂中之1種以上的樹脂。 [6] The resin sheet according to any one of [3], wherein the curable resin composition layer further comprises (d) a component selected from the group consisting of a resin having a functional group having a glass transition temperature of 25 ° C or lower. And one or more resins having a resin having a functional group at 25 ° C.

[7]如[6]之樹脂薄片,其中,(d)成分具有選自羥基、酸酐基、酚性羥基、環氧基、異氰酸酯基及胺基甲酸乙酯基中之1種以上的官能基,同時具有選自伸烷基構造 單位、伸烷氧基構造單位、丁二烯構造單位、異戊二烯構造單位、異丁烯構造單位、氯丁二烯構造單位、胺基甲酸乙酯構造單位、聚碳酸酯構造單位、(甲基)丙烯酸酯構造單位、及聚矽氧烷構造單位中之1個以上的構造單位。 [7] The resin sheet according to [6], wherein the component (d) has one or more functional groups selected from the group consisting of a hydroxyl group, an acid anhydride group, a phenolic hydroxyl group, an epoxy group, an isocyanate group, and an urethane group. And having an alkyl group structure selected from Unit, alkoxy structural unit, butadiene structural unit, isoprene structural unit, isobutylene structural unit, chloroprene structural unit, urethane structural unit, polycarbonate structural unit, (methyl And one or more structural units of the acrylate structural unit and the polyoxyalkylene structural unit.

[8]如[1]~[7]中任一項之樹脂薄片,其係零件內藏電路板用。 [8] The resin sheet according to any one of [1] to [7], which is for use in a circuit board.

[9]一種配線板,其係具備使如[1]~[8]中任一項之樹脂薄片的硬化性樹脂組成物層硬化而成之絕緣層、與導體層。 [9] A wiring board comprising an insulating layer and a conductor layer obtained by curing a layer of a curable resin composition of the resin sheet according to any one of [1] to [8].

[10]一種半導體裝置,其係具備如[9]之配線板。 [10] A semiconductor device comprising the wiring board of [9].

根據本發明,可提供一種減低基板的彎曲,且零件嵌入性優異之樹脂薄片。 According to the present invention, it is possible to provide a resin sheet which is excellent in part embedding while reducing the curvature of the substrate.

1‧‧‧電路基板 1‧‧‧ circuit substrate

2‧‧‧基板 2‧‧‧Substrate

2a‧‧‧孔洞 2a‧‧‧ Hole

3‧‧‧導體層(電路配線) 3‧‧‧Conductor layer (circuit wiring)

4‧‧‧暫時配附之材料 4‧‧‧Materials temporarily attached

5‧‧‧零件 5‧‧‧ parts

10‧‧‧樹脂薄片(第1樹脂薄片) 10‧‧‧Resin sheet (first resin sheet)

11‧‧‧支持體(第1支持體) 11‧‧‧Support (1st support)

12‧‧‧硬化性樹脂組成物層 12‧‧‧ hardened resin composition layer

12’‧‧‧硬化性樹脂組成物層(加熱處理體) 12'‧‧‧ hardened resin composition layer (heat treatment body)

12”‧‧‧絕緣層 12"‧‧‧Insulation

20‧‧‧第2樹脂薄片 20‧‧‧2nd resin sheet

21‧‧‧第2支持體 21‧‧‧2nd support

22‧‧‧第2硬化性樹脂組成物層 22‧‧‧2nd hardened resin composition layer

22’‧‧‧第2硬化性樹脂組成物層(加熱處理體) 22'‧‧‧Second hardening resin composition layer (heat treatment body)

22”‧‧‧絕緣層 22"‧‧‧Insulation

100‧‧‧配線板(零件內藏電路板) 100‧‧‧Wiring board (with built-in circuit board)

[圖1A]圖1A係表示在使用本發明之樹脂薄片之零件內藏電路板之製造方法,準備所使用之暫時配附零件之電路基板的一個製程之示意圖(1)。 1A] Fig. 1A is a schematic view (1) showing a process of preparing a circuit board for temporarily attaching a component to be used in a method of manufacturing a circuit board in which a resin sheet of the present invention is used.

[圖1B]圖1B係表示在使用本發明之樹脂薄片之零件內藏電路板之製造方法,準備所使用之暫時配附零件之電路基板的一個製程之示意圖(2)。 1B] Fig. 1B is a schematic view (2) showing a process of preparing a circuit board for temporarily attaching a component to be used in a method of manufacturing a circuit board in which a resin sheet of the present invention is used.

[圖1C]圖1C係表示在使用本發明之樹脂薄片之零 件內藏電路板之製造方法,準備所使用之暫時配附零件之電路基板的一個製程之示意圖(3)。 [Fig. 1C] Fig. 1C shows the zero of the resin sheet used in the present invention. A method of manufacturing a built-in circuit board, and a schematic diagram (3) of a process for preparing a circuit board for temporarily attaching a component.

[圖1D]圖1D係表示在使用本發明之樹脂薄片之零件內藏電路板之製造方法,準備所使用之暫時配附零件之電路基板的一個製程之示意圖(4)。 [Fig. 1D] Fig. 1D is a schematic view (4) showing a process of preparing a circuit board for temporarily attaching a component to be used in a method of manufacturing a circuit board in which a resin sheet of the present invention is used.

[圖2]圖2係表示本發明之樹脂薄片的一態樣之示意圖。 Fig. 2 is a schematic view showing an aspect of a resin sheet of the present invention.

[圖3A]圖3A係用以說明使用本發明之樹脂薄片之零件內藏電路板之製造方法的示意圖(1)。 3A] Fig. 3A is a schematic view (1) for explaining a method of manufacturing a built-in circuit board using a resin sheet of the present invention.

[圖3B]圖3B係用以說明使用本發明之樹脂薄片之零件內藏電路板之製造方法的示意圖(2)。 3B] Fig. 3B is a schematic view (2) for explaining a method of manufacturing a built-in circuit board using a resin sheet of the present invention.

[圖3C]圖3C係用以說明使用本發明之樹脂薄片之零件內藏電路板之製造方法的示意圖(3)。 3C] Fig. 3C is a schematic view (3) for explaining a method of manufacturing a built-in circuit board using a resin sheet of the present invention.

[圖3D]圖3D係用以說明使用本發明之樹脂薄片之零件內藏電路板之製造方法的示意圖(4)。 3D] Fig. 3D is a schematic view (4) for explaining a method of manufacturing a built-in circuit board using the resin sheet of the present invention.

[圖3E]圖3E係用以說明使用本發明之樹脂薄片之零件內藏電路板之製造方法的示意圖(5)。 3E] Fig. 3E is a schematic view (5) for explaining a method of manufacturing a built-in circuit board using a resin sheet of the present invention.

[圖3F]圖3F係用以說明使用本發明之樹脂薄片之零件內藏電路板之製造方法的示意圖(6)。 3F] Fig. 3F is a schematic view (6) for explaining a method of manufacturing a built-in circuit board using a resin sheet of the present invention.

[圖3G]圖3G係用以說明使用本發明之樹脂薄片之零件內藏電路板之製造方法的示意圖(7)。 3G] Fig. 3G is a schematic view (7) for explaining a method of manufacturing a built-in circuit board using a resin sheet of the present invention.

針對本發明之樹脂薄片進行詳細說明之前, 在本發明之樹脂薄片,針對形成硬化性樹脂組成物層(亦稱為「樹脂組成物層」)時所使用之硬化性樹脂組成物(亦稱為「樹脂組成物」)進行說明。 Before the detailed description of the resin sheet of the present invention, In the resin sheet of the present invention, a curable resin composition (also referred to as a "resin composition") used for forming a curable resin composition layer (also referred to as a "resin composition layer") will be described.

<硬化性樹脂組成物> <Curable resin composition>

形成硬化性樹脂組成物層之硬化性樹脂組成物,若為包含平均粒徑為1.6μm以下,同時比表面積[m2/g]與真密度[g/cm3]的乘積為6~8之無機填充材,則並未特別限定,該硬化物(絕緣層)若為具有充分之硬度與絕緣性者即可。作為硬化性樹脂組成物,例如可列舉與無機填充材一起包含硬化性樹脂與其硬化劑之組成物。作為硬化性樹脂,可使用形成印刷配線板之絕緣層時所使用之以往周知之硬化性樹脂,其中較佳為環氧樹脂。據此,在一實施形態,硬化性樹脂組成物係包含(a)環氧樹脂、(b)硬化劑及(c)無機填充材。又,在適合之一實施形態,硬化性樹脂組成物係包含:(a’)具有芳香族構造之環氧樹脂、(b)硬化劑、(c)無機填充材、以及(d)選自具有玻璃轉移溫度為25℃以下之官能基的樹脂、及具有於25℃為液狀之官能基的樹脂中之1種以上的樹脂。在本發明,硬化性樹脂組成物如有必要,可進一步包含熱塑性樹脂、硬化促進劑、阻燃劑及橡膠粒子等之添加劑。 The curable resin composition forming the curable resin composition layer has an average particle diameter of 1.6 μm or less, and the product of the specific surface area [m 2 /g] and the true density [g/cm 3 ] is 6-8. The inorganic filler is not particularly limited, and the cured product (insulating layer) may have sufficient hardness and insulation properties. Examples of the curable resin composition include a composition containing a curable resin and a curing agent together with the inorganic filler. As the curable resin, a conventionally known curable resin used in forming an insulating layer of a printed wiring board can be used, and among them, an epoxy resin is preferable. Accordingly, in one embodiment, the curable resin composition includes (a) an epoxy resin, (b) a curing agent, and (c) an inorganic filler. Further, in a preferred embodiment, the curable resin composition comprises: (a') an epoxy resin having an aromatic structure, (b) a curing agent, (c) an inorganic filler, and (d) selected from the group consisting of One or more resins selected from the group consisting of a resin having a functional group of a glass transition temperature of 25° C. or lower and a resin having a functional group having a liquidity at 25° C. In the present invention, the curable resin composition may further contain an additive such as a thermoplastic resin, a curing accelerator, a flame retardant, and rubber particles, if necessary.

以下,針對可作為硬化性樹脂組成物的材料使用之(a)環氧樹脂、(b)硬化劑、(c)無機填充材、(d)選自具有玻璃轉移溫度為25℃以下之官能基的樹脂、及具有 於25℃為液狀之官能基的樹脂中之1種以上的樹脂、以及(e)添加劑進行說明。 In the following, (a) an epoxy resin, (b) a curing agent, (c) an inorganic filler, and (d) are used as a material which can be used as a material of a curable resin composition, and are selected from functional groups having a glass transition temperature of 25 ° C or lower. Resin, and have One or more resins and (e) additives of a resin having a liquid functional group at 25 ° C will be described.

(a)環氧樹脂 (a) Epoxy resin

作為環氧樹脂,例如可列舉雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、雙環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚酚醛清漆型環氧樹脂、酚酚醛清漆型環氧樹脂、tert-丁基-鄰苯二酚型環氧樹脂、萘型環氧樹脂、萘酚型環氧樹脂、蔥型環氧樹脂、聯二甲酚型環氧樹脂、縮水甘油胺型環氧樹脂、縮水甘油酯型環氧樹脂、甲酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、線狀脂肪族環氧樹脂、具有丁二烯構造之環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含有螺環之環氧樹脂、環己烷二甲醇型環氧樹脂、萘醚型環氧樹脂、三羥甲基型環氧樹脂、四苯基乙烷型環氧樹脂等。環氧樹脂可1種單獨使用、或亦可組合2種以上使用。 Examples of the epoxy resin include bisphenol A epoxy resin, bisphenol F epoxy resin, bisphenol S epoxy resin, bisphenol AF epoxy resin, dicyclopentadiene epoxy resin, and ginseng. Phenolic epoxy resin, naphthol novolak epoxy resin, phenol novolak epoxy resin, tert-butyl-catechol epoxy resin, naphthalene epoxy resin, naphthol epoxy resin, Onion type epoxy resin, bisphenol type epoxy resin, glycidylamine type epoxy resin, glycidyl ester type epoxy resin, cresol novolak type epoxy resin, biphenyl type epoxy resin, linear fat Group epoxy resin, epoxy resin with butadiene structure, alicyclic epoxy resin, heterocyclic epoxy resin, epoxy resin with spiral ring, cyclohexane dimethanol epoxy resin, naphthalene ether type Epoxy resin, trimethylol epoxy resin, tetraphenylethane epoxy resin, and the like. Epoxy resins may be used alone or in combination of two or more.

作為環氧樹脂,較佳為使用選自由雙酚型環氧樹脂、氟系環氧樹脂(例如雙酚AF型環氧樹脂)、雙環戊二烯型環氧樹脂、萘型環氧樹脂、聯苯型環氧樹脂及此等之環氧樹脂之混合物所構成之群組中之一種或二種以上的環氧樹脂。 As the epoxy resin, it is preferably selected from the group consisting of a bisphenol type epoxy resin, a fluorine type epoxy resin (for example, a bisphenol AF type epoxy resin), a dicyclopentadiene type epoxy resin, a naphthalene type epoxy resin, and a combination. One or more epoxy resins of the group consisting of a benzene type epoxy resin and a mixture of such epoxy resins.

在適合之一實施形態,作為(a)環氧樹脂,較佳為具有芳香族構造之環氧樹脂(a’)。作為具有芳香族構造之環氧樹脂(a’),若具有芳香族構造雖並未特別限定, 但例如可列舉雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂等之雙酚型環氧樹脂、雙環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚酚醛清漆型環氧樹脂、酚酚醛清漆型環氧樹脂、tert-丁基-鄰苯二酚型環氧樹脂、萘型環氧樹脂、萘酚型環氧樹脂、蔥型環氧樹脂、甲酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、萘醚型環氧樹脂、四苯基乙烷型環氧樹脂、聯二甲酚型環氧樹脂等。 In a preferred embodiment, the (a) epoxy resin is preferably an epoxy resin (a') having an aromatic structure. The epoxy resin (a') having an aromatic structure is not particularly limited as long as it has an aromatic structure. Examples thereof include bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, bisphenol type epoxy resin, bisphenol type epoxy resin, and dicyclopentadiene type ring. Oxygen resin, phenolic epoxy resin, naphthol novolac epoxy resin, phenol novolak epoxy resin, tert-butyl-catechol epoxy resin, naphthalene epoxy resin, naphthol type Epoxy resin, onion type epoxy resin, cresol novolak type epoxy resin, biphenyl type epoxy resin, naphthalene ether type epoxy resin, tetraphenylethane type epoxy resin, bisphenol type epoxy Resin, etc.

從可降低硬化性樹脂組成物層之最低熔融黏度的觀點來看,作為環氧樹脂,較佳為包含於常溫為液狀之環氧樹脂(以下稱為「液狀環氧樹脂」)。尚,在本說明書,所謂「常溫」係意指25℃。 The epoxy resin is preferably contained in a liquid-like epoxy resin (hereinafter referred to as "liquid epoxy resin") from the viewpoint of reducing the minimum melt viscosity of the curable resin composition layer. Further, in the present specification, the term "normal temperature" means 25 ° C.

又,環氧樹脂較佳為於1分子中包含具有2個以上環氧基之環氧樹脂。將環氧樹脂之不揮發成分定為100質量%的情況下,較佳為至少50質量%以上為於1分子中具有2個以上環氧基之環氧樹脂。其中,較佳為包含於1分子中具有2個以上環氧基之液狀環氧樹脂、與於1分子中具有3個以上環氧基,且於常溫為固體狀之環氧樹脂(以下稱為「固體狀環氧樹脂」)。作為環氧樹脂,藉由併用液狀環氧樹脂與固體狀環氧樹脂,而得到具有優異可撓性之樹脂組成物。又,亦提昇硬化性樹脂組成物之硬化物(絕緣層)的斷裂強度。 Further, the epoxy resin preferably contains an epoxy resin having two or more epoxy groups in one molecule. When the non-volatile content of the epoxy resin is 100% by mass, it is preferably at least 50% by mass or more of an epoxy resin having two or more epoxy groups in one molecule. In particular, it is preferably a liquid epoxy resin having two or more epoxy groups in one molecule, and an epoxy resin having three or more epoxy groups in one molecule and being solid at room temperature (hereinafter referred to as It is a "solid epoxy resin"). As the epoxy resin, a liquid epoxy resin and a solid epoxy resin are used in combination to obtain a resin composition having excellent flexibility. Further, the breaking strength of the cured product (insulating layer) of the curable resin composition is also increased.

作為液狀環氧樹脂(a1),較佳為雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚AF型環氧樹脂、萘型 環氧樹脂、縮水甘油酯型環氧樹脂、酚酚醛清漆型環氧樹脂、具有酯骨架之脂環式環氧樹脂、及具有丁二烯構造之環氧樹脂,更佳為雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚AF型環氧樹脂及萘型環氧樹脂。尤其是含有芳香族骨架之環氧樹脂尚可降低平均線熱膨脹率故較佳。作為液狀環氧樹脂之具體例,可列舉DIC(股)製之「HP4032」、「HP4032D」、「HP4032SS」(萘型環氧樹脂)、三菱化學(股)製之「828US」、「jER828EL」(雙酚A型環氧樹脂)、「jER807」(雙酚F型環氧樹脂)、「jER152」(酚酚醛清漆型環氧樹脂)、新日鐵住金化學(股)製之「ZX1059」(雙酚A型環氧樹脂與雙酚F型環氧樹脂的混合品)、Nagase ChemteX(股)製之「EX-721」(縮水甘油酯型環氧樹脂)、(股)Daicel製之「Celoxide2021P」(具有酯骨架之脂環式環氧樹脂)、「PB-3600」(具有丁二烯構造之環氧樹脂)。此等可1種單獨使用,亦可組合2種以上使用。 As the liquid epoxy resin (a1), a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, a bisphenol AF type epoxy resin, a naphthalene type is preferable. Epoxy resin, glycidyl ester type epoxy resin, phenol novolak type epoxy resin, alicyclic epoxy resin having an ester skeleton, and epoxy resin having a butadiene structure, more preferably bisphenol A type ring Oxygen resin, bisphenol F type epoxy resin, bisphenol AF type epoxy resin and naphthalene type epoxy resin. In particular, an epoxy resin containing an aromatic skeleton is preferred because it can lower the average linear thermal expansion rate. Specific examples of the liquid epoxy resin include "HP4032", "HP4032D", "HP4032SS" (naphthalene type epoxy resin) manufactured by DIC Co., Ltd., "828US" manufactured by Mitsubishi Chemical Corporation, and "jER828EL". "(Bisphenol A type epoxy resin), "jER807" (bisphenol F type epoxy resin), "jER152" (phenol novolak type epoxy resin), "ZX1059" made by Nippon Steel & Sumitomo Chemical Co., Ltd. (A mixture of bisphenol A epoxy resin and bisphenol F epoxy resin), "EX-721" (glycidyl ester epoxy resin) manufactured by Nagase ChemteX Co., Ltd., and "Daicel" Celoxide 2021P" (alicyclic epoxy resin having an ester skeleton) and "PB-3600" (epoxy resin having a butadiene structure). These may be used alone or in combination of two or more.

作為固體狀環氧樹脂(a2),較佳為萘型4官能環氧樹脂、甲酚酚醛清漆型環氧樹脂、雙環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚型環氧樹脂、聯苯型環氧樹脂、萘醚型環氧樹脂、蔥型環氧樹脂、雙酚A型環氧樹脂、四苯基乙烷型環氧樹脂,更佳為萘型4官能環氧樹脂、萘酚型環氧樹脂、及聯苯型環氧樹脂。尤其是多官能環氧樹脂,交聯點增多,尚降低平均線熱膨脹率故較佳。作為固體狀環氧樹脂之具體例,可列舉DIC(股)製之 「HP4032H」(萘型環氧樹脂)、「HP-4700」、「HP-4710」(萘型4官能環氧樹脂)、「N-690」(甲酚酚醛清漆型環氧樹脂)、「N-695」(甲酚酚醛清漆型環氧樹脂)、「HP-7200」、「HP-7200HH」「HP-7200L」、(雙環戊二烯型環氧樹脂)、「EXA7311」、「EXA7311-G3」、「EXA7311-G4」、「EXA7311-G4S」、「HP6000」(萘醚型環氧樹脂)、日本化藥(股)製之「EPPN-502H」(參酚環氧樹脂)、「NC7000L」(萘酚酚醛清漆環氧樹脂)、「NC3000H」、「NC3000」、「NC3000L」、「NC3100」(聯苯型環氧樹脂)、新日鐵住金化學(股)製之「ESN475V」(萘酚型環氧樹脂)、「ESN485」(萘酚酚醛清漆型環氧樹脂)、三菱化學(股)製之「YX4000H」、「YL6121」(聯苯型環氧樹脂)、「YX4000HK」(聯二甲酚型環氧樹脂)、「YX8800」(蔥型環氧樹脂)、大阪瓦斯化學(股)製之「PG-100」、「CG-500」、三菱化學(股)製之「YL7800」(茀型環氧樹脂)、三菱化學(股)製之「jER1010」(固體狀雙酚A型環氧樹脂)、「jER1031S」(四苯基乙烷型環氧樹脂)、「YL7760」(雙酚AF型環氧樹脂)等。 The solid epoxy resin (a2) is preferably a naphthalene type tetrafunctional epoxy resin, a cresol novolak type epoxy resin, a dicyclopentadiene type epoxy resin, a phenol type epoxy resin, or a naphthol type ring. Oxygen resin, biphenyl type epoxy resin, naphthalene ether type epoxy resin, onion type epoxy resin, bisphenol A type epoxy resin, tetraphenylethane type epoxy resin, more preferably naphthalene type 4 functional epoxy Resin, naphthol type epoxy resin, and biphenyl type epoxy resin. In particular, a polyfunctional epoxy resin has an increased cross-linking point and is preferred because it lowers the average linear thermal expansion rate. Specific examples of the solid epoxy resin include DIC (shares). "HP4032H" (naphthalene type epoxy resin), "HP-4700", "HP-4710" (naphthalene type 4-functional epoxy resin), "N-690" (cresol novolac type epoxy resin), "N -695" (cresol novolac type epoxy resin), "HP-7200", "HP-7200HH", "HP-7200L", (dicyclopentadiene type epoxy resin), "EXA7311", "EXA7311-G3" "EXA7311-G4", "EXA7311-G4S", "HP6000" (naphthyl ether type epoxy resin), "EPPN-502H" (phenolic epoxy resin) made by Nippon Kayaku Co., Ltd., "NC7000L" (naphthol novolac epoxy resin), "NC3000H", "NC3000", "NC3000L", "NC3100" (biphenyl type epoxy resin), "ESN475V" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd. (naphthol) Epoxy resin), "ESN485" (naphthol novolac type epoxy resin), "YX4000H" manufactured by Mitsubishi Chemical Corporation, "YL6121" (biphenyl type epoxy resin), "YX4000HK" (dimethyl) "Phenol type epoxy resin", "YX8800" (onion type epoxy resin), "PG-100" made by Osaka Gas Chemical Co., Ltd., "CG-500", "YL7800" made by Mitsubishi Chemical Corporation (茀) Type epoxy resin), Mitsubishi Chemical Co., Ltd. "JER1010" (bisphenol A type solid epoxy resin), "jER1031S" (tetraphenyl ethane epoxy resin), "YL7760" (bisphenol AF type epoxy resin) and the like.

環氧樹脂併用液狀環氧樹脂與固體狀環氧樹脂時,固體狀環氧樹脂的質量MS相對於液狀環氧樹脂的質量ML的比(MS/ML),較佳為0.6~10的範圍。藉由將MS/ML定於該範圍,而得到i)以樹脂薄片之形態使用時帶來適度之黏著性、ii)以樹脂薄片之形態使用時得到充分之 可撓性,提昇操作性、以及iii)可得到具有充分斷裂強度之硬化物(絕緣層)等之效果。 When the epoxy resin and the solid epoxy resin are used together, the ratio (M S /M L ) of the mass M S of the solid epoxy resin to the mass M L of the liquid epoxy resin is preferably The range of 0.6~10. By setting M S /M L in this range, i) gives a moderate adhesiveness when used in the form of a resin sheet, and ii) sufficient flexibility when used in the form of a resin sheet, and improves workability. And iii) an effect of obtaining a cured product (insulating layer) having sufficient breaking strength.

硬化性樹脂組成物中之(a)環氧樹脂的含量,從得到良好機械強度、顯示絕緣信賴性之絕緣層的觀點來看,較佳為0.1質量%以上,更佳為1質量%以上,再更佳為5質量%以上。環氧樹脂的含量的上限,只要能發揮本發明的效果下,雖並未特別限定,但較佳為40質量%以下,更佳為35質量%以下,再更佳為30質量%以下。 The content of the (a) epoxy resin in the curable resin composition is preferably 0.1% by mass or more, and more preferably 1% by mass or more from the viewpoint of obtaining an insulating layer having good mechanical strength and exhibiting insulating reliability. More preferably, it is 5% by mass or more. The upper limit of the content of the epoxy resin is not particularly limited as long as the effect of the present invention is exerted, but is preferably 40% by mass or less, more preferably 35% by mass or less, still more preferably 30% by mass or less.

據此,硬化性樹脂組成物中之(a)環氧樹脂的含量較佳為0.1~50質量%,更佳為10~45質量%,再更佳為20~42質量%。尚,在本發明,硬化性樹脂組成物中之各成分的含量除非另有明文規定,將硬化性樹脂組成物中之不揮發成分定為100質量%時之值。 Accordingly, the content of the (a) epoxy resin in the curable resin composition is preferably from 0.1 to 50% by mass, more preferably from 10 to 45% by mass, still more preferably from 20 to 42% by mass. In the present invention, the content of each component in the curable resin composition is a value at which the nonvolatile content in the curable resin composition is 100% by mass unless otherwise specified.

環氧樹脂的環氧當量較佳為50~5000,更佳為50~3000,再更佳為80~2000,又再更佳為110~1000。藉由成為此範圍,可提供硬化物之交聯密度變充分且表面粗糙度小之絕緣層。尚,環氧當量可依JIS K7236測定,係包含1當量環氧基之樹脂的質量。 The epoxy equivalent of the epoxy resin is preferably from 50 to 5,000, more preferably from 50 to 3,000, still more preferably from 80 to 2,000, still more preferably from 110 to 1,000. By setting it as such a range, it is possible to provide an insulating layer in which the crosslinking density of the cured product is sufficient and the surface roughness is small. Further, the epoxy equivalent can be measured in accordance with JIS K7236 and is a mass of a resin containing 1 equivalent of an epoxy group.

環氧樹脂的重量平均分子量較佳為100~5000,更佳為250~3000,再更佳為400~1500。於此,環氧樹脂的重量平均分子量係藉由凝膠滲透層析(GPC)法所測定之聚苯乙烯換算的重量平均分子量。 The weight average molecular weight of the epoxy resin is preferably from 100 to 5,000, more preferably from 250 to 3,000, still more preferably from 400 to 1,500. Here, the weight average molecular weight of the epoxy resin is a polystyrene-equivalent weight average molecular weight measured by a gel permeation chromatography (GPC) method.

(b)硬化劑 (b) hardener

作為硬化劑,只要是具有硬化環氧樹脂功能雖並未特別限定,但例如可列舉酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑、苯并噁嗪系硬化劑、氰酸酯系硬化劑、及碳二醯亞胺系硬化劑等。硬化劑可1種單獨使用、或亦可併用2種以上。 The curing agent is not particularly limited as long as it has a function of curing the epoxy resin, and examples thereof include a phenol curing agent, a naphthol curing agent, an active ester curing agent, a benzoxazine curing agent, and a cyanate ester. A hardener, a carbodiimide-based hardener, and the like. The curing agent may be used alone or in combination of two or more.

作為酚系硬化劑及萘酚系硬化劑,從耐熱性及耐水性的觀點來看,較佳為具有酚醛清漆構造之酚系硬化劑、或具有酚醛清漆構造之萘酚系硬化劑。又,從與導體層(電路配線)之密著性的觀點來看,較佳為含氮酚系硬化劑,更佳為含有三嗪構造之酚樹脂及含有三嗪構造之烷基酚樹脂。其中,從高度滿足耐熱性、耐水性、及與導體層之密著性(剝離強度)的觀點來看,較佳為使用含有三嗪構造之酚系硬化劑。 The phenolic curing agent and the naphthol-based curing agent are preferably a phenolic curing agent having a novolak structure or a naphthol-based curing agent having a novolac structure from the viewpoint of heat resistance and water resistance. Moreover, from the viewpoint of adhesion to the conductor layer (circuit wiring), a nitrogen-containing phenol-based curing agent is preferable, and a phenol resin having a triazine structure and an alkylphenol resin having a triazine structure are more preferable. Among them, from the viewpoint of satisfying heat resistance, water resistance, and adhesion to the conductor layer (peeling strength), it is preferred to use a phenol-based curing agent containing a triazine structure.

作為酚系硬化劑及萘酚系硬化劑之具體例,例如可列舉明和化成(股)製之「MEH-7700」、「MEH-7810」、「MEH-7851」、日本化藥(股)製之「NHN」、「CBN」、「GPH」、東都化成(股)製之「SN170」、「SN180」、「SN190」、「SN475」、「SN485」、「SN495」、「SN375」、「SN395」、DIC(股)製之「LA7052」、「LA7054」、「LA3018」等。 Specific examples of the phenolic curing agent and the naphthol-based curing agent include "MEH-7700", "MEH-7810", "MEH-7851", and Nippon Chemical Co., Ltd., manufactured by Megumi Kasei Co., Ltd. "SNN", "SNH", "SN190", "SN190", "SN485", "SN495", "SN375", "SN395", "NHN", "CBN", "GPH", and Dongdu Chemicals Co., Ltd. "LA7052", "LA7054", "LA3018", etc. by DIC (share) system.

作為活性酯系硬化劑雖並未特別限制,但一般而言較佳為使用於1分子中具有2個以上化合物之酚酯類、硫酚酯類、N-羥基胺酯類、雜環羥基化合物之酯類等之反應活性高之酯基。該活性酯系硬化劑較佳為藉由羧酸 化合物及/或硫代羧酸化合物與羥基化合物及/或硫醇化合物的縮合反應所得者。尤其是從提昇耐熱性的觀點來看,較佳為從羧酸化合物與羥基化合物所得之活性酯系硬化劑,更佳為從羧酸化合物與酚化合物及/或萘酚化合物所得之活性酯系硬化劑。作為羧酸化合物,例如可列舉苯甲酸、乙酸、琥珀酸、馬來酸、衣康酸、鄰苯二甲酸、間苯二甲酸、對苯二甲酸、苯均四酸等。作為酚化合物或萘酚化合物,例如可列舉對苯二酚、間苯二酚、雙酚A、雙酚F、雙酚S、酚酞(Phenolphthalein)、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、酚、o-甲酚、m-甲酚、p-甲酚、鄰苯二酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚、苯三酚、雙環戊二烯型二酚化合物、酚酚醛清漆等。 The active ester-based curing agent is not particularly limited, but is generally preferably a phenolic ester having two or more compounds in one molecule, a thiophenol ester, an N-hydroxyamine ester, or a heterocyclic hydroxy compound. An ester group having a high reactivity such as an ester. The active ester-based hardener is preferably a carboxylic acid A condensation reaction of a compound and/or a thiocarboxylic acid compound with a hydroxy compound and/or a thiol compound. In particular, from the viewpoint of improving heat resistance, an active ester-based curing agent derived from a carboxylic acid compound and a hydroxy compound is preferred, and an active ester system derived from a carboxylic acid compound and a phenol compound and/or a naphthol compound is more preferred. hardener. Examples of the carboxylic acid compound include benzoic acid, acetic acid, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, and pyromellitic acid. Examples of the phenol compound or the naphthol compound include hydroquinone, resorcin, bisphenol A, bisphenol F, bisphenol S, phenolphthalein, methylated bisphenol A, and methylated bisphenol. F, methylated bisphenol S, phenol, o-cresol, m-cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1 ,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, phloroglucinol, benzenetriol, dicyclopentadiene Diphenol compounds, phenol novolacs, and the like.

具體而言,較佳為包含雙環戊二烯二酚構造之活性酯化合物、包含萘構造之活性酯化合物、包含酚酚醛清漆之乙醯化物之活性酯化合物、包含酚酚醛清漆之苯甲醯基化物之活性酯化合物,其中更佳為包含萘構造之活性酯化合物、包含雙環戊二烯型二酚構造之活性酯化合物。 Specifically, it is preferably an active ester compound containing a dicyclopentadiene diphenol structure, an active ester compound containing a naphthalene structure, an active ester compound containing an acetal of a phenol novolak, and a benzamidine group containing a phenol novolak. The active ester compound of the compound is more preferably an active ester compound containing a naphthalene structure or an active ester compound containing a dicyclopentadiene type diphenol structure.

作為活性酯系硬化劑之市售品,作為包含雙環戊二烯二酚構造之活性酯化合物,可列舉「EXB9451」、「EXB9460」、「EXB9460S」、「HPC-8000-65T」(DIC(股)製),作為包含萘構造之活性酯化合 物,可列舉「EXB9416-70BK」(DIC(股)製),作為包含酚酚醛清漆之乙醯化物之活性酯化合物,可列舉「DC808」(三菱化學(股)製),作為包含酚酚醛清漆之苯甲醯基化物之活性酯化合物,可列舉「YLH1026」(三菱化學(股)製)等。 As a commercial product of the active ester-based curing agent, examples of the active ester compound containing a dicyclopentadiene diphenol structure include "EXB9451", "EXB9460", "EXB9460S", and "HPC-8000-65T" (DIC). )) as an active ester compound containing a naphthalene structure The "EXB9416-70BK" (manufactured by DIC Co., Ltd.), and the active ester compound containing the acetal of the phenol novolak, "DC808" (manufactured by Mitsubishi Chemical Corporation) can be used as the phenol novolac. Examples of the active ester compound of the benzamidine compound include "YLH1026" (manufactured by Mitsubishi Chemical Corporation).

作為苯并噁嗪系硬化劑之具體例,可列舉昭和高分子(股)製之「HFB2006M」、四國化成工業(股)製之「P-d」、「F-a」。 Specific examples of the benzoxazine-based curing agent include "HFB2006M" manufactured by Showa Polymer Co., Ltd., and "P-d" and "F-a" manufactured by Shikoku Chemical Industries Co., Ltd.

作為氰酸酯系硬化劑,例如可列舉雙酚A二氰酸酯、聚酚氰酸酯、寡(3-亞甲基-1,5-伸苯基氰酸酯)、4,4’-亞甲基雙(2,6-二甲基苯基氰酸酯)、4,4’-亞乙基二苯基二氰酸酯、六氟雙酚A二氰酸酯、2,2-雙(4-氰酸酯)苯基丙烷、1,1-雙(4-氰酸酯苯基甲烷)、雙(4-氰酸酯-3,5-二甲基苯基)甲烷、1,3-雙(4-氰酸酯苯基-1-(甲基亞乙基))苯、雙(4-氰酸酯苯基)硫醚、及雙(4-氰酸酯苯基)醚等之由2官能氰酸酯樹脂、酚酚醛清漆及甲酚酚醛清漆等所衍生之多官能氰酸酯樹脂、此等氰酸酯樹脂經一部分三嗪化之預聚物等。作為氰酸酯系硬化劑之具體例,可列舉Lonza Japan(股)製之「PT30」及「PT60」(皆酚酚醛清漆型多官能氰酸酯樹脂)、「BA230」(成為雙酚A二氰酸酯之一部分或全部經三嗪化之三聚物之預聚物)等。 Examples of the cyanate-based curing agent include bisphenol A dicyanate, polyphenol cyanate, oligo(3-methylene-1,5-phenylenecyanate), and 4,4'- Methylene bis(2,6-dimethylphenyl cyanate), 4,4'-ethylene diphenyl dicyanate, hexafluorobisphenol A dicyanate, 2,2-double (4-cyanate) phenylpropane, 1,1-bis(4-cyanate phenylmethane), bis(4-cyanate-3,5-dimethylphenyl)methane, 1,3 - bis(4-cyanate phenyl-1-(methylethylidene)) benzene, bis(4-cyanate phenyl) sulfide, and bis(4-cyanate phenyl) ether A polyfunctional cyanate resin derived from a bifunctional cyanate resin, a phenol novolac, a cresol novolak or the like, a prepolymer which is partially triazineated with such a cyanate resin, and the like. Specific examples of the cyanate-based curing agent include "PT30" and "PT60" (all phenol novolac type polyfunctional cyanate resins) manufactured by Lonza Japan Co., Ltd., and "BA230" (becoming bisphenol A II) a prepolymer of a partially or fully triazineated trimer of a cyanate ester or the like.

作為碳二醯亞胺系硬化劑之具體例,可列舉日清紡化工(股)製之「V-03」、「V-07」等。 Specific examples of the carbodiimide-based curing agent include "V-03" and "V-07" manufactured by Nisshinbo Chemical Co., Ltd.

在本發明,(b)硬化劑較佳為包含選自由酚系 硬化劑氰酸酯系硬化劑及活性酯系硬化劑中之1種以上,更佳為包含含有三嗪構造之酚系樹脂、含有三嗪構造之烷基酚系樹脂、氰酸酯系硬化劑及活性酯系硬化劑中之1種以上。 In the present invention, (b) the hardener preferably comprises a phenolic group selected from the group consisting of One or more of a curing agent cyanate-based curing agent and an active ester-based curing agent, more preferably a phenol-based resin containing a triazine structure, an alkylphenol-based resin containing a triazine structure, or a cyanate-based curing agent. And one or more of the active ester-based curing agents.

硬化性樹脂組成物中之(b)硬化劑的含量雖並未特別限定,但從得到剝離強度高,且低介電正切之絕緣層的觀點來看,較佳為0.1質量%以上,更佳為0.5質量%以上,再更佳為1質量%以上。(b)硬化劑的含量的上限,只要能發揮本發明的效果,並未特別限制,較佳為30質量%以下,更佳為25質量%以下,再更佳為20質量%以下。 The content of the (b) curing agent in the curable resin composition is not particularly limited, but is preferably 0.1% by mass or more, more preferably from the viewpoint of obtaining an insulating layer having high peel strength and low dielectric tangent. It is 0.5% by mass or more, and more preferably 1% by mass or more. (b) The upper limit of the content of the curing agent is not particularly limited as long as the effect of the present invention is exerted, and is preferably 30% by mass or less, more preferably 25% by mass or less, still more preferably 20% by mass or less.

據此,硬化性樹脂組成物中之(b)硬化劑的含量較佳為0.1~30質量%,更佳為0.5~25質量%,再更佳為1~20質量%。 Accordingly, the content of the (b) hardener in the curable resin composition is preferably from 0.1 to 30% by mass, more preferably from 0.5 to 25% by mass, still more preferably from 1 to 20% by mass.

(a)環氧樹脂與(b)硬化劑的量比,以[(a)環氧樹脂之環氧基的合計數]:[(b)硬化劑之反應基的合計數]的比率,較佳為1:0.2~1:2的範圍,更佳為1:0.3~1:1.5,再更佳為1:0.4~1:1。於此,所謂硬化劑之反應基,有活性羥基、活性酯基等,因硬化劑的種類而不同。又,所謂環氧樹脂之環氧基的合計數,係將各環氧樹脂之固形分質量除以環氧當量之值針對全部環氧樹脂進行合計之值,所謂硬化劑之反應基的合計數,係指將各硬化劑之固形分質量除以反應基當量之值,針對全部硬化劑進行合計之值。藉由將環氧樹脂與硬化劑的量比定為該範圍,可 更加提昇硬化性樹脂組成物之硬化物(絕緣層)的耐熱性。 (a) the ratio of the epoxy resin to the (b) hardener, in the ratio of [(a) the total number of epoxy groups of the epoxy resin]: [(b) the total number of reactive groups of the hardener] Preferably, the range is 1:0.2 to 1:2, more preferably 1:0.3 to 1:1.5, and even more preferably 1:0.4 to 1:1. Here, the reactive group of the curing agent includes an active hydroxyl group, an active ester group, and the like, and differs depending on the type of the curing agent. Further, the total number of epoxy groups of the epoxy resin is a value obtained by dividing the solid content of each epoxy resin by the value of the epoxy equivalent for all the epoxy resins, and the total number of reactive groups of the curing agent is Is the total value of all the hardeners by dividing the solid content of each hardener by the value of the reactive base equivalent. By setting the ratio of the epoxy resin to the hardener to the range, The heat resistance of the cured product (insulating layer) of the curable resin composition is further improved.

(c)無機填充材 (c) Inorganic filler

作為無機填充材,若平均粒徑為1.6μm以下,同時比表面積[m2/g]與真密度[g/cm3]的乘積(比表面積×真密度)為6~8,雖並未特別限定,但具體而言,可列舉二氧化矽、氧化鋁、玻璃、堇青石、矽氧化物、硫酸鋇、碳酸鋇、滑石、黏土、雲母粉、氧化鋅、水滑石、薄水鋁石、氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、氧化鎂、氮化硼、氮化鋁、氮化錳、硼酸鋁、碳酸鍶、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、氧化鋯、鈦酸鋇、鈦酸鋯酸鋇、鋯酸鋇、鋯酸鈣、磷酸鋯、及磷酸鎢酸鋯等。此等當中二氧化矽特別適合。又,作為二氧化矽,較佳為球形二氧化矽。無機填充材可1種單獨使用,亦可組合2種以上使用。作為無機填充材使用之二氧化矽的市售品,例如可列舉(股)Admatechs製「ADMAFINE」、電氣化學工業(股)製「SFP系列」、新日鐵住金Materials(股)製「SP(H)系列」、堺化學工業(股)製「Sciqas系列」、(股)日本觸媒製「Sea Hoster系列」等,作為氧化鋁之市售品,可列舉新日鐵住金Materials(股)製之「AZ、AX系列」等。 When the average particle diameter is 1.6 μm or less, the product of the specific surface area [m 2 /g] and the true density [g/cm 3 ] (specific surface area × true density) is 6 to 8 as an inorganic filler, although it is not particularly Qualified, but specifically, cerium oxide, aluminum oxide, glass, cordierite, cerium oxide, barium sulfate, barium carbonate, talc, clay, mica powder, zinc oxide, hydrotalcite, boehmite, hydrogen Alumina, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, boron nitride, aluminum nitride, manganese nitride, aluminum borate, barium carbonate, barium titanate, calcium titanate, magnesium titanate, barium titanate, Titanium oxide, zirconium oxide, barium titanate, barium zirconate titanate, barium zirconate, calcium zirconate, zirconium phosphate, zirconium tungstate, and the like. Among these, cerium oxide is particularly suitable. Further, as the cerium oxide, spherical cerium oxide is preferred. The inorganic filler may be used singly or in combination of two or more. As a commercial item of the cerium oxide used as the inorganic filler, for example, "ADMAFINE" manufactured by Admatechs, "SFP series" manufactured by Electrochemical Industry Co., Ltd., and "SP" manufactured by Nippon Steel & Metals Materials Co., Ltd. H) Series, "Sciqas Series" by the Chemical Industry Co., Ltd., "Sea Hoster Series" by the Japanese catalyst system, etc. As a commercial item of alumina, the company is listed in the Nippon Steel & Metals Material Co., Ltd. "AZ, AX series" and so on.

在本發明,無機填充材的平均粒徑為1.6μm以下。無機填充材的平均粒徑較佳為1.5μm以下,再更佳為1.4μm以下。另一方面,使用硬化性樹脂組成物,形成樹脂清漆時,得到具有適當之黏度,且操作性良好之樹脂 清漆的觀點、防止硬化性樹脂組成物層之熔融黏度的上昇的觀點等來看,無機填充材的平均粒徑較佳為0.5μm以上,更佳為0.6μm以上,再更佳為0.7μm以上。 In the present invention, the inorganic filler has an average particle diameter of 1.6 μm or less. The average particle diameter of the inorganic filler is preferably 1.5 μm or less, and more preferably 1.4 μm or less. On the other hand, when a resin varnish is formed using a curable resin composition, a resin having an appropriate viscosity and good handleability is obtained. The average particle diameter of the inorganic filler is preferably 0.5 μm or more, more preferably 0.6 μm or more, and still more preferably 0.7 μm or more, from the viewpoint of the varnish and the viewpoint of preventing the increase in the melt viscosity of the curable resin composition layer. .

無機填充材的平均粒徑可根據米氏(Mie)散射理論藉由雷射繞射暨散射法測定。具體而言,藉由雷射繞射散射式粒度分布測定裝置,將無機填充材之粒度分布以體積基準作成,可藉由將其中位徑作為平均粒徑來測定。測定樣品較佳可使用將無機填充材藉由超音波而使其分散於水中者。作為雷射繞射散射式粒度分布測定裝置,可使用(股)島津製作所製「SALD-2200」等。 The average particle size of the inorganic filler can be determined by laser diffraction and scattering according to the Mie scattering theory. Specifically, the particle size distribution of the inorganic filler is prepared on a volume basis by a laser diffraction scattering type particle size distribution measuring apparatus, and can be measured by using the median diameter as an average particle diameter. It is preferable to use a sample in which the inorganic filler is dispersed in water by ultrasonic waves. As the laser diffraction scattering type particle size distribution measuring apparatus, "SALD-2200" manufactured by Shimadzu Corporation can be used.

無機填充材之比表面積可藉由BET法測定。比表面積的測定中,可使用BET全自動比表面積測定裝置((股)Mountech製Macsorb HM-1210)等。無機填充材之真密度可使用微.超比重瓶(Kanta Chrome Instruments Japan(同)製MUPY-21T)測定。 The specific surface area of the inorganic filler can be determined by the BET method. For the measurement of the specific surface area, a BET fully automatic specific surface area measuring device (manufactured by Mountech, Macsorb HM-1210) or the like can be used. The true density of inorganic fillers can be used micro. Super pycnometer (MUPY-21T manufactured by Kanta Chrome Instruments Japan).

根據本發明,藉由將無機填充材之比表面積[m2/g]與真密度[g/cm3]的乘積定為6以上,將對硬化性樹脂組成物之孔洞的流入成為良好者,藉由將該積定為8以下,可降低平均線熱膨脹率。無機填充材之比表面積與真密度的乘積之下限值較佳為6.1以上,更佳為6.3以上。又,無機填充材之比表面積與真密度的乘積較佳為7.7以下,更佳為7.5以下。 According to the present invention, when the product of the specific surface area [m 2 /g] of the inorganic filler and the true density [g/cm 3 ] is 6 or more, the inflow of the pores of the curable resin composition is good. By setting the total to 8 or less, the average linear thermal expansion rate can be lowered. The lower limit of the product of the specific surface area to the true density of the inorganic filler is preferably 6.1 or more, more preferably 6.3 or more. Further, the product of the specific surface area of the inorganic filler and the true density is preferably 7.7 or less, more preferably 7.5 or less.

無機填充材從提高耐濕性及分散性的觀點來看,較佳為以胺基矽烷系偶合劑、環氧矽烷系偶合劑、巰 基矽烷系偶合劑、矽烷系偶合劑、烷氧基矽烷化合物、有機矽氮烷化合物、鈦酸酯系偶合劑等之1種以上的表面處理劑處理。作為表面處理劑之市售品,例如可列舉信越化學工業(股)製「KBM403」(3-環氧丙氧基丙基三甲氧基矽烷)、信越化學工業(股)製「KBM803」(3-巰基丙基三甲氧基矽烷)、信越化學工業(股)製「KBE903」(3-胺基丙基三乙氧基矽烷)、信越化學工業(股)製「KBM573」(N-苯基-3-胺基丙基三甲氧基矽烷)、信越化學工業(股)製「SZ-31」(六甲基二矽氮烷)、信越化學工業(股)製「KBM103」(苯基三甲氧基矽烷)、信越化學工業(股)製「KBM-4803」(長鏈環氧型矽烷偶合劑)等。 The inorganic filler is preferably an amine-based decane coupling agent, an epoxy decane coupling agent, or a hydrazine from the viewpoint of improving moisture resistance and dispersibility. One or more kinds of surface treatment agents such as a quinone-based coupling agent, a decane-based coupling agent, an alkoxy decane compound, an organic decazane compound, and a titanate coupling agent are treated. For example, "KBM403" (3-glycidoxypropyltrimethoxydecane) manufactured by Shin-Etsu Chemical Co., Ltd., and "KBM803" manufactured by Shin-Etsu Chemical Co., Ltd. (3) are commercially available as a surface treatment agent. "Methyl propyl trimethoxy decane", "KBE903" (3-aminopropyltriethoxy decane) manufactured by Shin-Etsu Chemical Co., Ltd., "KBM573" (N-phenyl-based) manufactured by Shin-Etsu Chemical Co., Ltd. "3-Aminopropyltrimethoxydecane", "SZ-31" (hexamethyldioxane) manufactured by Shin-Etsu Chemical Co., Ltd., "KBM103" (phenyltrimethoxy) manufactured by Shin-Etsu Chemical Co., Ltd.矽 )), "KBM-4803" (long-chain epoxy type decane coupling agent) manufactured by Shin-Etsu Chemical Co., Ltd.

藉由表面處理劑之表面處理的程度,可藉由相對於無機填充材之單位表面積的碳量來進行評估。相對於無機填充材之單位表面積的碳量,從提昇無機填充材之分散性的觀點來看,較佳為0.02mg/m2以上,更佳為0.1mg/m2以上,再更佳為0.2mg/m2以上。另外,從防止樹脂清漆之熔融黏度或於薄片形態之熔融黏度的上昇的觀點來看,較佳為1mg/m2以下,更佳為0.8mg/m2以下,再更佳為0.5mg/m2以下。 The degree of surface treatment by the surface treatment agent can be evaluated by the amount of carbon per unit surface area of the inorganic filler. The amount of carbon per unit surface area of the inorganic filler is preferably 0.02 mg/m 2 or more, more preferably 0.1 mg/m 2 or more, and still more preferably 0.2 from the viewpoint of improving the dispersibility of the inorganic filler. Mg/m 2 or more. In addition, from the viewpoint of preventing the melt viscosity of the resin varnish or the increase in the melt viscosity of the sheet form, it is preferably 1 mg/m 2 or less, more preferably 0.8 mg/m 2 or less, still more preferably 0.5 mg/m. 2 or less.

相對於無機填充材之單位表面積的碳量,可將表面處理後之無機填充材藉由溶劑(例如甲基乙基酮(MEK))進行洗淨處理後來進行測定。具體而言,作為溶劑,除了將充分量之MEK以表面處理劑經表面處理之無機填充材之外,於25℃進行5分鐘超音波洗淨。去除上 清液,乾燥固形分後,可使用碳分析計測定相對於無機填充材之單位表面積的碳量。作為碳分析計,可使用(股)堀場製作所製「EMIA-320V」等。 The surface-treated inorganic filler can be measured by washing with a solvent (for example, methyl ethyl ketone (MEK)) with respect to the amount of carbon per unit surface area of the inorganic filler. Specifically, as a solvent, ultrasonic cleaning was performed at 25 ° C for 5 minutes, except that a sufficient amount of MEK was surface-treated with an inorganic filler. Removed After the clear liquid is dried, the amount of carbon per unit surface area relative to the inorganic filler can be measured using a carbon analyzer. As the carbon analyzer, "EMIA-320V" manufactured by Horiba Ltd. can be used.

硬化性樹脂組成物中之(c)無機填充材的含量為74質量%以上,較佳為76質量%以上,更佳為78質量%以上。(c)無機填充材的含量的上限,從於其上可形成微細之配線而得到絕緣層的觀點來看,較佳為90質量%以下,更佳為85質量%以下。 The content of the (c) inorganic filler in the curable resin composition is 74% by mass or more, preferably 76% by mass or more, and more preferably 78% by mass or more. (c) The upper limit of the content of the inorganic filler is preferably 90% by mass or less, and more preferably 85% by mass or less from the viewpoint of forming a fine wiring to obtain an insulating layer.

(d)選自具有玻璃轉移溫度為25℃以下之官能基的樹脂、及具有於25℃為液狀之官能基的樹脂中之1種以上的樹脂((d)成分)。 (d) One or more resins ((d) component) selected from the group consisting of a resin having a functional group having a glass transition temperature of 25 ° C or lower and a resin having a functional group at 25 ° C.

在適合之一實施形態,硬化性樹脂組成物係與具有芳香族構造之環氧樹脂(a’)((a’)成分)一起包含(d)成分。藉由包含如(d)成分之柔軟樹脂,可使熱硬化性樹脂組成物層的硬化物(絕緣層)之彈性率及熱膨脹率降低,且可抑制使用本發明之樹脂薄片所製得之配線板之彎曲的發生。 In a preferred embodiment, the curable resin composition contains the component (d) together with the epoxy resin (a') ((a') component) having an aromatic structure. By the soft resin containing the component (d), the elastic modulus and the thermal expansion coefficient of the cured product (insulating layer) of the thermosetting resin composition layer can be lowered, and the wiring obtained by using the resin sheet of the present invention can be suppressed. The bending of the board occurs.

(d)成分之具有玻璃轉移溫度(Tg)為25℃以下之官能基的樹脂之玻璃轉移溫度,較佳為20℃以下,更佳為15℃以下。(d)成分之玻璃轉移溫度的下限雖並未特別限定,但通常可成為-15℃以上。 The glass transition temperature of the resin having a functional group having a glass transition temperature (Tg) of 25 ° C or less (d) is preferably 20 ° C or lower, more preferably 15 ° C or lower. Although the lower limit of the glass transition temperature of the component (d) is not particularly limited, it is usually -15 ° C or higher.

在具有於25℃為液狀之官能基的樹脂,若於25℃為液狀,認為該樹脂之Tg當然為25℃以下。 When the resin having a functional group which is liquid at 25 ° C is liquid at 25 ° C, the Tg of the resin is of course 25 ° C or less.

作為(d)成分所具有之官能基,較佳為具有可與(a)或(a’)成分反應之官能基。在適合之一實施形態,(d) 成分所具有之官能基,係選自由羥基、酸酐基、酚性羥基、環氧基、異氰酸酯基及胺基甲酸乙酯基所構成之群組中之至少一種以上的官能基。其中,作為該官能基,較佳為羥基、酸酐基、環氧基、酚性羥基,更佳為羥基、酸酐基、環氧基。惟,作為官能基,包含環氧基的情況下,(d)成分不具有芳香族構造。 The functional group which the (d) component has is preferably a functional group which can react with the component (a) or (a'). In a suitable embodiment, (d) The functional group of the component is at least one selected from the group consisting of a hydroxyl group, an acid anhydride group, a phenolic hydroxyl group, an epoxy group, an isocyanate group, and an aminocarboxylate group. In particular, the functional group is preferably a hydroxyl group, an acid anhydride group, an epoxy group or a phenolic hydroxyl group, and more preferably a hydroxyl group, an acid anhydride group or an epoxy group. However, when the functional group contains an epoxy group, the component (d) does not have an aromatic structure.

(d)成分從得到彈性率低之硬化性樹脂組成物層的觀點來看,較佳為具有選自碳原子數2~15之伸烷基構造單位(較佳為碳原子數3~10,更佳為碳原子數5~6)、碳原子數2~15之伸烷氧基構造單位(較佳為碳原子數3~10,更佳為碳原子數5~6)、丁二烯構造單位、異戊二烯構造單位、異丁烯構造單位、氯丁二烯構造單位、胺基甲酸乙酯構造單位、聚碳酸酯構造單位、(甲基)丙烯酸酯構造單位、及聚矽氧烷構造單位中之一個以上的構造單位,更佳為具有選自丁二烯構造單位、胺基甲酸乙酯構造單位、(甲基)丙烯酸酯構造單位中之一個以上的構造單位。尚,所謂「(甲基)丙烯酸酯」,係指甲基丙烯酸酯及丙烯酸酯。 The component (d) preferably has an alkylene structural unit selected from the group consisting of carbon atoms of 2 to 15 (preferably having a carbon number of 3 to 10, from the viewpoint of obtaining a curable resin composition layer having a low modulus of elasticity. More preferably, it is a structural unit of alkoxy groups having 5 to 6 carbon atoms and 2 to 15 carbon atoms (preferably having 3 to 10 carbon atoms, more preferably 5 to 6 carbon atoms), butadiene structure. Unit, isoprene structural unit, isobutylene structural unit, chloroprene structural unit, urethane structural unit, polycarbonate structural unit, (meth) acrylate structural unit, and polyoxyalkylene structural unit More preferably, one or more structural units have one or more structural units selected from the group consisting of a butadiene structural unit, an urethane structural unit, and a (meth) acrylate structural unit. In addition, "(meth) acrylate" means methacrylate and acrylate.

(d)成分之適合的一實施形態係含有於25℃為液狀之官能基的飽和及/或不飽和丁二烯樹脂。作為含有於25℃為液狀之官能基的飽和及/或不飽和丁二烯樹脂,較佳為選自由含有於25℃為液狀之酸酐基的飽和及/或丁二烯樹脂、含有於25℃為液狀之酚性羥基的飽和及/或丁二烯樹脂、含有於25℃為液狀之環氧基的飽和及/或丁二 烯樹脂、含有於25℃為液狀之異氰酸酯基的飽和及/或丁二烯樹脂、及含有於25℃為液狀之胺基甲酸乙酯基的飽和及/或丁二烯樹脂所構成之群組中之一種以上的樹脂。於此,所謂「飽和及/或不飽和丁二烯樹脂」,係指含有飽和丁二烯骨架及/或不飽和丁二烯骨架之樹脂,在此等之樹脂中,飽和丁二烯骨架及/或不飽和丁二烯骨架可包含在主鏈亦可包含在側鏈。 A suitable embodiment of the component (d) is a saturated and/or unsaturated butadiene resin containing a functional group which is liquid at 25 °C. The saturated and/or unsaturated butadiene resin containing a functional group which is liquid at 25 ° C is preferably selected from the group consisting of saturated and/or butadiene resins containing an acid anhydride group which is liquid at 25 ° C. 25 ° C is a saturated phenolic hydroxyl group and / or butadiene resin, saturated and / or butyl containing liquid epoxy at 25 ° C An olefin resin, a saturated and/or butadiene resin containing a liquid isocyanate group at 25 ° C, and a saturated and/or butadiene resin containing a liquid urethane group at 25 ° C. More than one resin in the group. Here, the term "saturated and/or unsaturated butadiene resin" means a resin containing a saturated butadiene skeleton and/or an unsaturated butadiene skeleton, and among these resins, a saturated butadiene skeleton and The unsaturated butadiene skeleton may be included in the main chain or may be included in the side chain.

含有於25℃為液狀之官能基的飽和及/或不飽和丁二烯樹脂之數平均分子量(Mn)較佳為500~50000,更佳為1000~10000。於此,樹脂之數平均分子量(Mn)係使用GPC(凝膠滲透層析)所測定之聚苯乙烯換算的數平均分子量。 The number average molecular weight (Mn) of the saturated and/or unsaturated butadiene resin containing a functional group which is liquid at 25 ° C is preferably from 500 to 50,000, more preferably from 1,000 to 10,000. Here, the number average molecular weight (Mn) of the resin is a polystyrene-equivalent number average molecular weight measured by GPC (gel permeation chromatography).

含有於25℃為液狀之官能基的飽和及/或不飽和丁二烯樹脂之官能基當量較佳為100~10000,更佳為200~5000。尚,所謂官能基當量,係包含1當量之官能基的樹脂之質量。例如,樹脂之環氧基當量可依JIS K7236測定。 The functional group equivalent of the saturated and/or unsaturated butadiene resin containing a functional group which is liquid at 25 ° C is preferably from 100 to 10,000, more preferably from 200 to 5,000. Further, the functional group equivalent is a mass of a resin containing 1 equivalent of a functional group. For example, the epoxy equivalent of the resin can be measured in accordance with JIS K7236.

作為含有於25℃為液狀之環氧基的飽和及/或不飽和丁二烯樹脂,較佳為含有於25℃為液狀之飽和及/或丁二烯骨架的環氧樹脂,更佳為含有於25℃為液狀之聚丁二烯骨架的環氧樹脂、含有於25℃為液狀之氫化聚丁二烯骨架的環氧樹脂,再更佳為含有於25℃為液狀之聚丁二烯骨架的環氧樹脂、含有於25℃為液狀之氫化聚丁二烯骨架的環氧樹脂。於此,所謂「含有氫化聚丁二烯 骨架的環氧樹脂」,係指聚丁二烯骨架之至少一部分經氫化之環氧樹脂,不需要聚丁二烯骨架必須完全氫化之環氧樹脂。作為含有於25℃為液狀之聚丁二烯骨架的樹脂及含有於25℃為液狀之氫化聚丁二烯骨架的樹脂之具體例,可列舉(股)Daicel製之「PB3600」、「PB4700」(聚丁二烯骨架環氧樹脂)、長瀨化學(股)製之「FCA-061L」(氫化聚丁二烯骨架環氧樹脂)等。 The saturated and/or unsaturated butadiene resin containing a liquid epoxy group at 25 ° C is preferably an epoxy resin containing a saturated and/or butadiene skeleton at 25 ° C, more preferably It is an epoxy resin containing a polybutadiene skeleton which is liquid at 25 ° C, an epoxy resin containing a hydrogenated polybutadiene skeleton which is liquid at 25 ° C, and more preferably contains a liquid at 25 ° C. An epoxy resin having a polybutadiene skeleton and an epoxy resin containing a hydrogenated polybutadiene skeleton which is liquid at 25 ° C. Here, the so-called "hydrogenated polybutadiene" The epoxy resin of the skeleton refers to an epoxy resin in which at least a part of the polybutadiene skeleton is hydrogenated, and an epoxy resin which does not require a complete hydrogenation of the polybutadiene skeleton. Specific examples of the resin containing a polybutadiene skeleton which is liquid at 25 ° C and a hydrogenated polybutadiene skeleton which is liquid at 25 ° C include "PB3600" manufactured by Daicel. PB4700" (polybutadiene skeleton epoxy resin), "FCA-061L" (hydrogenated polybutadiene skeleton epoxy resin) manufactured by Nagase Chemical Co., Ltd.

作為含有於25℃為液狀之酸酐基的飽和及/或不飽和丁二烯樹脂,較佳為於25℃為液狀之含有飽和及/或不飽和丁二烯骨架的酸酐樹脂。作為含有於25℃為液狀之酚性羥基的飽和及/或不飽和丁二烯樹脂,較佳為於25℃為液狀之含有飽和及/或不飽和丁二烯骨架的酚樹脂。作為含有於25℃為液狀之異氰酸酯基的飽和及/或不飽和丁二烯樹脂,較佳為於25℃為液狀之含有飽和及/或不飽和丁二烯骨架的異氰酸酯樹脂。作為含有於25℃為液狀之胺基甲酸乙酯基的飽和及/或不飽和丁二烯樹脂,較佳為於25℃為液狀之含有飽和及/或不飽和丁二烯骨架的胺基甲酸乙酯樹脂。 The saturated and/or unsaturated butadiene resin containing an acid anhydride group in a liquid state at 25 ° C is preferably an acid anhydride resin containing a saturated and/or unsaturated butadiene skeleton at 25 ° C in a liquid state. The saturated and/or unsaturated butadiene resin containing a phenolic hydroxyl group which is liquid at 25 ° C is preferably a phenol resin containing a saturated and/or unsaturated butadiene skeleton at 25 ° C in a liquid state. The saturated and/or unsaturated butadiene resin containing a liquid isocyanate group at 25 ° C is preferably an isocyanate resin containing a saturated and/or unsaturated butadiene skeleton at 25 ° C in a liquid state. As the saturated and/or unsaturated butadiene resin containing a urethane group which is liquid at 25 ° C, an amine having a saturated and/or unsaturated butadiene skeleton which is liquid at 25 ° C is preferred. Ethyl carbamate resin.

(d)成分之另一適合的一實施形態為含有Tg為25℃以下之官能基的丙烯酸樹脂。作為含有Tg為25℃以下之官能基的丙烯酸樹脂,較佳為選自由含有Tg為25℃以下之酸酐基的丙烯酸樹脂、含有Tg為25℃以下之酚性羥基的丙烯酸樹脂、含有Tg為25℃以下之羧基的丙烯酸樹脂、含有Tg為25℃以下之異氰酸酯基的丙烯酸樹脂、 含有Tg為25℃以下之胺基甲酸乙酯基的丙烯酸樹脂、及含有Tg為25℃以下之環氧基的丙烯酸樹脂所構成之群組中之至少一種以上的樹脂。 Another suitable embodiment of the component (d) is an acrylic resin containing a functional group having a Tg of 25 ° C or lower. The acrylic resin containing a functional group having a Tg of 25 ° C or lower is preferably selected from an acrylic resin containing an acid anhydride group having a Tg of 25 ° C or lower, an acrylic resin containing a phenolic hydroxyl group having a Tg of 25 ° C or less, and a Tg of 25 An acrylic resin having a carboxyl group of lower than ° C, an acrylic resin containing an isocyanate group having a Tg of 25 ° C or lower, At least one or more of the group consisting of an acrylic resin having a Tg of 25 ° C or less and an acrylic resin containing an epoxy group having a Tg of 25 ° C or less.

含有Tg為25℃以下之官能基的丙烯酸樹脂之數平均分子量(Mn)較佳為10000~1000000,更佳為30000~900000。於此,樹脂之數平均分子量(Mn)係使用GPC(凝膠滲透層析)所測定之聚苯乙烯換算的數平均分子量。 The number average molecular weight (Mn) of the acrylic resin containing a functional group having a Tg of 25 ° C or less is preferably 10,000 to 1,000,000, more preferably 30,000 to 900,000. Here, the number average molecular weight (Mn) of the resin is a polystyrene-equivalent number average molecular weight measured by GPC (gel permeation chromatography).

含有Tg為25℃以下之官能基的丙烯酸樹脂之官能基當量較佳為1000~50000,更佳為2500~30000。 The functional group equivalent of the acrylic resin having a functional group having a Tg of 25 ° C or less is preferably from 1,000 to 50,000, more preferably from 2,500 to 30,000.

作為含有Tg為25℃以下之環氧基的丙烯酸樹脂,較佳為含有Tg為25℃以下之環氧基的丙烯酸酯共聚物樹脂,作為其具體例,可列舉長瀨化學公司製之「SG-80H」(含有環氧基之丙烯酸酯共聚物樹脂(數平均分子量Mn:350000g/mol、環氧價0.07eq/kg、Tg11℃))、長瀨化學(股)製之「SG-P3」(含有環氧基之丙烯酸酯共聚物樹脂(數平均分子量Mn:850000g/mol、環氧價0.21eq/kg、Tg12℃))。 The acryl resin containing an epoxy group having a Tg of 25 ° C or less is preferably an acrylate copolymer resin containing an epoxy group having a Tg of 25 ° C or lower. Specific examples thereof include "SG" manufactured by Nagase Chemical Co., Ltd. -80H" (epoxy group-containing acrylate copolymer resin (number average molecular weight Mn: 350,000 g/mol, epoxy price: 0.07 eq/kg, Tg11 °C)), "SG-P3" manufactured by Nagase Chemical Co., Ltd. (Epoxy group-containing acrylate copolymer resin (number average molecular weight Mn: 850,000 g/mol, epoxy price 0.21 eq/kg, Tg 12 ° C)).

作為含有Tg為25℃以下之酸酐基的丙烯酸樹脂,較佳為含有Tg為25℃以下之酸酐基的丙烯酸酯共聚物樹脂。 The acrylic resin containing an acid anhydride group having a Tg of 25 ° C or less is preferably an acrylate copolymer resin containing an acid anhydride group having a Tg of 25 ° C or less.

作為含有Tg為25℃以下之酚性羥基的丙烯酸樹脂,較佳為含有Tg為25℃以下之酚性羥基的丙烯酸酯共聚物樹脂,作為其具體例,可列舉長瀨化學(股)製之 「SG-790」(含有環氧基之丙烯酸酯共聚物樹脂(數平均分子量Mn:500000g/mol、羥基價40mgKOH/kg、Tg-32℃))。 The acrylic resin containing a phenolic hydroxyl group having a Tg of 25 ° C or less is preferably an acrylate copolymer resin containing a phenolic hydroxyl group having a Tg of 25 ° C or less, and specific examples thereof include a product of Nippon Chemical Co., Ltd. "SG-790" (epoxy group-containing acrylate copolymer resin (number average molecular weight Mn: 500,000 g/mol, hydroxyl value: 40 mgKOH/kg, Tg-32 ° C)).

又,(d)成分之適合的一實施形態,係於分子內具有丁二烯構造單位、胺基甲酸乙酯構造單位、及醯亞胺構造單位之聚醯亞胺樹脂,該聚醯亞胺樹脂較佳為於分子末端具有酚構造。 Further, a suitable embodiment of the component (d) is a polyimine resin having a butadiene structural unit, an urethane structural unit, and a quinone imine structural unit in the molecule, and the polyimine. The resin preferably has a phenolic structure at the molecular end.

該聚醯亞胺樹脂之數平均分子量(Mn)較佳為1000~100000,更佳為10000~15000。於此,樹脂之數平均分子量(Mn)係使用GPC(凝膠滲透層析)測定之聚苯乙烯換算的數平均分子量。 The number average molecular weight (Mn) of the polyimide resin is preferably from 1,000 to 100,000, more preferably from 10,000 to 15,000. Here, the number average molecular weight (Mn) of the resin is a polystyrene-equivalent number average molecular weight measured by GPC (gel permeation chromatography).

該聚醯亞胺樹脂的酸價較佳為1KOH/g~30KOH/g,更佳為10KOH/g~20KOH/g。 The acid value of the polyimine resin is preferably from 1 KOH/g to 30 KOH/g, more preferably from 10 KOH/g to 20 KOH/g.

該聚醯亞胺樹脂之丁二烯構造的含有率較佳為60質量%~95質量%,更佳為75質量%~85質量%。 The content of the butadiene structure of the polyimide resin is preferably 60% by mass to 95% by mass, and more preferably 75% by mass to 85% by mass.

該聚醯亞胺樹脂的細節可參酌國際公開2008/153208號之記載,將此內容納入本說明書。 The details of the polyimine resin can be incorporated into the present specification by reference to International Publication No. 2008/153208.

從提昇斷裂強度的觀點來看,(d)成分較佳為與(d)成分以外之成分的相溶性較高。亦即,較佳為分散(d)成分於硬化性樹脂組成物層中。 From the viewpoint of enhancing the breaking strength, the component (d) preferably has a higher compatibility with components other than the component (d). That is, it is preferred to disperse the component (d) in the curable resin composition layer.

硬化性樹脂組成物中之(d)成分的含量雖並未特別限定,但較佳為14質量%以下,更佳為13質量%以下,再更佳為12質量%以下。又,下限較佳為2質量%以上,更佳為3質量%以上,再更佳為4質量%以上。 The content of the component (d) in the curable resin composition is not particularly limited, but is preferably 14% by mass or less, more preferably 13% by mass or less, still more preferably 12% by mass or less. Further, the lower limit is preferably 2% by mass or more, more preferably 3% by mass or more, and still more preferably 4% by mass or more.

硬化性樹脂組成物可於上述(a)、(b)、(c)、(d)之外,包含熱塑性樹脂、硬化促進劑、阻燃劑及橡膠粒子等之添加劑(e)。 The curable resin composition may contain an additive (e) such as a thermoplastic resin, a curing accelerator, a flame retardant, and rubber particles in addition to the above (a), (b), (c), and (d).

(e)添加劑 (e) Additives

-熱塑性樹脂- - thermoplastic resin -

作為熱塑性樹脂,例如可列舉苯氧基樹脂、聚乙烯縮醛樹脂、聚烯烴樹脂、聚丁二烯樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚醯亞胺樹脂、聚碸樹脂、聚醚碸樹脂、聚苯醚樹脂、聚碳酸酯樹脂、聚醚醚酮樹脂、聚酯樹脂等之熱塑性樹脂,此等當中,較佳為苯氧基樹脂。熱塑性樹脂可1種單獨使用、或亦可組合2種以上使用。 Examples of the thermoplastic resin include a phenoxy resin, a polyvinyl acetal resin, a polyolefin resin, a polybutadiene resin, a polyimine resin, a polyamidimide resin, a polyether phthalimide resin, and a poly A thermoplastic resin such as an anthracene resin, a polyether oxime resin, a polyphenylene ether resin, a polycarbonate resin, a polyether ether ketone resin or a polyester resin, among these, a phenoxy resin is preferred. One type of the thermoplastic resin may be used alone or two or more types may be used in combination.

熱塑性樹脂之聚苯乙烯換算之重量平均分子量較佳為5,000~100,000的範圍,更佳為10,000~60,000的範圍,再更佳為20,000~60,000的範圍。熱塑性樹脂之聚苯乙烯換算之重量平均分子量係以凝膠滲透層析(GPC)法測定。具體而言,熱塑性樹脂之聚苯乙烯換算之重量平均分子量,係使用(股)島津製作所製LC-9A/RID-6A作為測定裝置,使用昭和電工(股)製Shodex K-800P/K-804L/K-804L作為管柱,使用氯仿作為移動相等,在管柱溫度40℃測定,可使用標準聚苯乙烯之檢量線算出。 The polystyrene-equivalent weight average molecular weight of the thermoplastic resin is preferably in the range of 5,000 to 100,000, more preferably in the range of 10,000 to 60,000, still more preferably in the range of 20,000 to 60,000. The polystyrene-equivalent weight average molecular weight of the thermoplastic resin is measured by a gel permeation chromatography (GPC) method. Specifically, the weight average molecular weight of the thermoplastic resin in terms of polystyrene is determined by using LC-9A/RID-6A manufactured by Shimadzu Corporation as a measuring device, and Shodex K-800P/K-804L manufactured by Showa Denko Co., Ltd. /K-804L is used as a column, and chloroform is used as the movement equivalent. The column temperature is measured at 40 ° C, and can be calculated using a standard polystyrene calibration line.

作為苯氧基樹脂,例如可列舉具有選自由雙酚A骨架、雙酚F骨架、雙酚S骨架、雙酚苯乙酮骨架、酚醛清漆骨架、聯苯骨架、茀骨架、雙環戊二烯骨 架、降莰烯骨架、萘骨架、蔥骨架、金剛烷骨架、萜烯骨架、及三甲基環己烷骨架所構成之群組中之1種以上骨架的苯氧基樹脂。苯氧基樹脂之末端可為酚性羥基、環氧基等任一種之官能基。苯氧基樹脂可1種單獨使用,亦可組合2種以上使用。作為苯氧基樹脂之具體例,可列舉三菱化學(股)製之「1256」及「4250」(皆為含有雙酚A骨架之苯氧基樹脂)、「YX8100」(含有雙酚S骨架之苯氧基樹脂)、及「YX6954」(含有雙酚苯乙酮骨架之苯氧基樹脂),其他當中,亦可列舉新日鐵住金化學(股)製之「FX280」及「FX293」、三菱化學(股)製之「YX6954BH30」、「YX7553」、「YL7769BH30」、「YL6794」、「YL7213」、「YL7290」及「YL7482」等。 The phenoxy resin may, for example, be selected from the group consisting of a bisphenol A skeleton, a bisphenol F skeleton, a bisphenol S skeleton, a bisphenol acetophenone skeleton, a novolac skeleton, a biphenyl skeleton, an anthracene skeleton, and a dicyclopentadiene bone. A phenoxy resin having one or more kinds of skeletons in the group consisting of a shelf, a norbornene skeleton, a naphthalene skeleton, an onion skeleton, an adamantane skeleton, a terpene skeleton, and a trimethylcyclohexane skeleton. The terminal of the phenoxy resin may be a functional group of any one of a phenolic hydroxyl group and an epoxy group. The phenoxy resin may be used alone or in combination of two or more. Specific examples of the phenoxy resin include "1256" and "4250" (both phenoxy resins containing a bisphenol A skeleton) and "YX8100" (including a bisphenol S skeleton) manufactured by Mitsubishi Chemical Corporation. "Phenoxy resin" and "YX6954" (phenoxy resin containing bisphenol acetophenone skeleton), among others, "FX280" and "FX293" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., Mitsubishi "YX6954BH30", "YX7553", "YL7769BH30", "YL6794", "YL7213", "YL7290" and "YL7482", etc., which are produced by the company.

作為聚乙烯縮醛樹脂,例如可列舉聚乙烯縮甲醛樹脂、聚乙烯縮丁醛樹脂,較佳為聚乙烯縮丁醛樹脂。作為聚乙烯縮醛樹脂之具體例,可列舉電氣化學工業(股)製之「電化縮丁醛4000-2」、「電化縮丁醛5000-A」、「電化縮丁醛6000-C」、「電化縮丁醛6000-EP」、積水化學工業(股)製之S-LEC BH系列、BX系列、KS系列、BL系列、BM系列等。 Examples of the polyvinyl acetal resin include a polyvinyl formal resin and a polyvinyl butyral resin, and a polyvinyl butyral resin is preferable. Specific examples of the polyvinyl acetal resin include "electrodinated butyral 4000-2", "electricated butyral 5000-A", and "electrodinated butyral 6000-C" manufactured by the Electrochemical Industry Co., Ltd. "Electrified butyral 6000-EP", S-LEC BH series, BX series, KS series, BL series, BM series, etc., manufactured by Sekisui Chemical Industry Co., Ltd.

作為聚醯亞胺樹脂之具體例,可列舉新日本理化(股)製之「RIKACOAT SN20」及「RIKACOAT PN20」。 Specific examples of the polyimine resin include "RIKACOAT SN20" and "RIKACOAT PN20" manufactured by Nippon Chemical and Chemical Co., Ltd.

作為聚醯胺醯亞胺樹脂之具體例,可列舉東 洋紡績(股)製之「VYLOMAX HR11NN」及「VYLOMAX HR16NN」。 Specific examples of the polyamidoximine resin include the east "VYLOMAX HR11NN" and "VYLOMAX HR16NN" manufactured by Yangfang Performance Co., Ltd.

作為聚醚碸樹脂之具體例,可列舉住友化學(股)製之「PES5003P」等。 Specific examples of the polyether oxime resin include "PES5003P" manufactured by Sumitomo Chemical Co., Ltd., and the like.

作為聚碸樹脂之具體例,可列舉Solvay Advanced Polymers(股)製之聚碸「P1700」、「P3500」等。 Specific examples of the polybenzazole resin include polydiprene "P1700" and "P3500" manufactured by Solvay Advanced Polymers Co., Ltd.

作為聚苯醚樹脂之具體例,可列舉三菱瓦斯化學(股)製之寡苯醚.苯乙烯樹脂「OPE-2St 1200」等。 Specific examples of the polyphenylene ether resin include oligophenyl ether manufactured by Mitsubishi Gas Chemical Co., Ltd. Styrene resin "OPE-2St 1200" and the like.

其中,在與其他成分的組合,從得到進一步降低表面粗糙度,且與導體層的密著性更為優異之絕緣層的觀點來看,作為熱塑性樹脂,較佳為苯氧基樹脂、聚乙烯縮醛樹脂。據此,在適合之一實施形態,熱塑性樹脂成分係包含由苯氧基樹脂及聚乙烯縮醛樹脂所構成之群組中之1種以上。 In the combination with other components, from the viewpoint of obtaining an insulating layer which further reduces the surface roughness and is more excellent in adhesion to the conductor layer, the thermoplastic resin is preferably a phenoxy resin or a polyethylene. Acetal resin. According to one embodiment, the thermoplastic resin component contains one or more selected from the group consisting of a phenoxy resin and a polyvinyl acetal resin.

硬化性樹脂組成物中之熱塑性樹脂的含量,從適度調整硬化性樹脂組成物層之熔融黏度的觀點來看,較佳為0質量%~20質量%,更佳為0.5質量%~10質量%,再更佳為0.6質量%~8質量%。 The content of the thermoplastic resin in the curable resin composition is preferably from 0% by mass to 20% by mass, more preferably from 0.5% by mass to 10% by mass, from the viewpoint of appropriately adjusting the melt viscosity of the curable resin composition layer. More preferably, it is 0.6% by mass to 8% by mass.

-硬化促進劑- - hardening accelerator -

作為硬化促進劑,例如可列舉磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑、胍系硬化促進劑等,較佳為磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進 劑,更佳為胺系硬化促進劑、咪唑系硬化促進劑。硬化促進劑可1種單獨使用,亦可組合2種以上使用。 Examples of the curing accelerator include a phosphorus-based curing accelerator, an amine-based curing accelerator, an imidazole-based curing accelerator, and an oxime-based curing accelerator. Preferred examples are a phosphorus-based curing accelerator, an amine-based curing accelerator, and an imidazole-based curing agent. Hardening promotion The agent is more preferably an amine-based hardening accelerator or an imidazole-based hardening accelerator. The curing accelerator may be used alone or in combination of two or more.

作為磷系硬化促進劑,例如可列舉三苯基膦、鏻硼酸酯化合物、四苯基鏻四苯基硼酸酯、n-丁基鏻四苯基硼酸酯、四丁基鏻癸酸鹽、(4-甲基苯基)三苯基鏻硫氰酸酯、四苯基鏻硫氰酸酯、丁基三苯基鏻硫氰酸酯等,較佳為三苯基膦、四丁基鏻癸酸鹽。 Examples of the phosphorus-based hardening accelerator include triphenylphosphine, bismuth borate compound, tetraphenylphosphonium tetraphenyl borate, n-butyl phosphotetraphenyl borate, and tetrabutyl decanoic acid. a salt, (4-methylphenyl)triphenylphosphonium thiocyanate, tetraphenylphosphonium thiocyanate, butyltriphenylphosphonium thiocyanate, etc., preferably triphenylphosphine, tetrabutyl Sulfate.

作為胺系硬化促進劑,例如可列舉三乙基胺、三丁基胺等之三烷基胺、4-二甲基胺基吡啶、苄基二甲基胺、2,4,6,-參(二甲基胺基甲基)酚、1,8-二氮雜聯環(5,4,0)-十一碳烯等,較佳為4-二甲基胺基吡啶、1,8-二氮雜聯環(5,4,0)-十一碳烯。 Examples of the amine-based curing accelerator include a trialkylamine such as triethylamine or tributylamine, 4-dimethylaminopyridine, benzyldimethylamine, 2,4,6, and a ginseng. (dimethylaminomethyl) phenol, 1,8-diazabicyclo(5,4,0)-undecene, etc., preferably 4-dimethylaminopyridine, 1,8- Diaza-heterocyclic (5,4,0)-undecene.

作為咪唑系硬化促進劑,例如可列舉2-甲基咪唑、2-十一烷基咪唑、2-十七烷基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、1-苄基-2-甲基咪唑、1-苄基-2-苯基咪唑、1-氰乙基-2-甲基咪唑、1-氰乙基-2-十一烷基咪唑、1-氰乙基-2-乙基-4-甲基咪唑、1-氰乙基-2-苯基咪唑、1-氰乙基-2-十一烷基咪唑鎓偏苯三酸酯、1-氰乙基-2-苯基咪唑鎓偏苯三酸酯、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-十一烷基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-乙基-4’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪異氰脲酸加成物、2-苯基咪唑異氰 脲酸加成物、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑、2,3-二氫-1H-吡咯[1,2-a]苯并咪唑、1-十二烷基-2-甲基-3-苄基咪唑鎓氯化物、2-甲基咪唑啉、2-苯基咪唑啉等之咪唑化合物及咪唑化合物與環氧樹脂之加合物,較佳為2-乙基-4-甲基咪唑、1-苄基-2-苯基咪唑。 Examples of the imidazole-based hardening accelerator include 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, and 2-ethyl-4-methyl group. Imidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2-methylimidazole, 1-benzyl-2-phenylimidazole, 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl-2-ethyl-4- Methylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-undecylimidazolium trimellitate, 1-cyanoethyl-2-phenylimidazolium benzene Triester, 2,4-diamino-6-[2'-methylimidazolyl-(1')]-ethyl-s-triazine, 2,4-diamino-6-[2' -undecyl imidazolyl-(1')]-ethyl-s-triazine, 2,4-diamino-6-[2'-ethyl-4'-methylimidazolyl-(1' )]-ethyl-s-triazine, 2,4-diamino-6-[2'-methylimidazolyl-(1')]-ethyl-s-triazine isocyanuric acid adduct 2-phenylimidazolium isocyanide Urea acid adduct, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole, 2,3-dihydro-1H-pyrrole [1 , 2-a] imidazolium, 1-dodecyl-2-methyl-3-benzylimidazolium chloride, 2-methylimidazoline, 2-phenylimidazoline, etc., imidazole compounds and imidazole compounds The adduct with epoxy resin is preferably 2-ethyl-4-methylimidazole or 1-benzyl-2-phenylimidazole.

作為咪唑系硬化促進劑可使用市售品,例如可列舉三菱化學公司製之「P200-H50」等。 A commercially available product can be used as the imidazole-based hardening accelerator, and examples thereof include "P200-H50" manufactured by Mitsubishi Chemical Corporation.

作為胍系硬化促進劑,例如可列舉雙氰胺、1-甲基胍、1-乙基胍、1-環己基胍、1-苯基胍、1-(o-甲苯基)胍、二甲基胍、二苯基胍、三甲基胍、四甲基胍、五甲基胍、1,5,7-三氮雜雙環[4.4.0]癸-5-烯、7-甲基-1,5,7-三氮雜雙環[4.4.0]癸-5-烯、1-甲基雙胍、1-乙基雙胍、1-n-丁基雙胍、1-n-十八烷基雙胍、1,1-二甲基雙胍、1,1-二乙基雙胍、1-環己基雙胍、1-烯丙基雙胍、1-苯基雙胍、1-(o-甲苯基)雙胍等,較佳為雙氰胺、1,5,7-三氮雜雙環[4.4.0]癸-5-烯。 Examples of the oxime-based hardening accelerator include dicyandiamide, 1-methyl hydrazine, 1-ethyl hydrazine, 1-cyclohexyl hydrazine, 1-phenyl fluorene, 1-(o-methylphenyl) fluorene, and dimethyl Base, diphenyl hydrazine, trimethyl hydrazine, tetramethyl hydrazine, pentamethyl hydrazine, 1,5,7-triazabicyclo[4.4.0]non-5-ene, 7-methyl-1 , 5,7-triazabicyclo[4.4.0]non-5-ene, 1-methylbiguanide, 1-ethylbiguanide, 1-n-butylbiguanide, 1-n-octadecylbiguanide, 1,1-dimethylbiguanide, 1,1-diethylbiguanide, 1-cyclohexylbiguanide, 1-allyl biguanide, 1-phenylbiguanide, 1-(o-methylphenyl)biguanide, etc., preferably It is dicyandiamide, 1,5,7-triazabicyclo[4.4.0]non-5-ene.

硬化性樹脂組成物中之硬化促進劑的含量雖並未特別限定,但較佳為以0.05質量%~3質量%的範圍使用。 The content of the curing accelerator in the curable resin composition is not particularly limited, but is preferably in the range of 0.05% by mass to 3% by mass.

-阻燃劑- - Flame retardant -

硬化性樹脂組成物可包含阻燃劑。作為阻燃劑,例如可列舉有機磷系阻燃劑、含有有機系氮之磷化合物、氮化 合物、矽氧系阻燃劑、金屬氫氧化物等。阻燃劑可1種單獨使用、或亦可併用2種以上。 The curable resin composition may contain a flame retardant. Examples of the flame retardant include an organic phosphorus-based flame retardant, a phosphorus compound containing organic nitrogen, and nitridation. Compound, antimony-based flame retardant, metal hydroxide, and the like. One type of the flame retardant may be used alone or two or more types may be used in combination.

作為阻燃劑可使用市售品,例如可列舉三光公司製之「HCA-HQ」、大八化學工業(股)製之「PX-200」等。 Commercially available products can be used as the flame retardant, and examples thereof include "HCA-HQ" manufactured by Sanko Corporation and "PX-200" manufactured by Daiba Chemical Industry Co., Ltd.

硬化性樹脂組成物中之阻燃劑的含量雖並未特別限定,但以較佳為0.5質量%~20質量%,更佳為1質量%~15質量%,再更佳為1.5質量%~10質量%更佳。 The content of the flame retardant in the curable resin composition is not particularly limited, but is preferably 0.5% by mass to 20% by mass, more preferably 1% by mass to 15% by mass, even more preferably 1.5% by mass. 10% by mass is better.

-有機填充材- -Organic filler -

硬化性樹脂組成物可進一步包含有機填充材。作為有機填充材,可使用形成印刷配線板之絕緣層時可使用之任意有機填充材,例如可列舉橡膠粒子、聚醯胺微粒子、矽氧粒子等,較佳為橡膠粒子。 The curable resin composition may further comprise an organic filler. As the organic filler, any organic filler which can be used in forming the insulating layer of the printed wiring board can be used, and examples thereof include rubber particles, polyamide fine particles, and xenon particles, and rubber particles are preferable.

作為橡膠粒子可使用市售品,例如可列舉陶氏化學日本(股)製之「EXL2655」、AICA工業(股)製之「AC3816N」等。 Commercially available products can be used as the rubber particles, and examples thereof include "EXL 2655" manufactured by Dow Chemical Co., Ltd., and "AC3816N" manufactured by AICA Industries Co., Ltd., and the like.

硬化性樹脂組成物中之有機填充材的含量較佳為0.5質量%~20質量%,更佳為0.7質量%~10質量%。 The content of the organic filler in the curable resin composition is preferably from 0.5% by mass to 20% by mass, more preferably from 0.7% by mass to 10% by mass.

硬化性樹脂組成物如有必要可包含阻燃劑、及有機填充材之外之其他添加劑,作為該其他添加劑,例如可列舉有機銅化合物、有機鋅化合物及有機鈷化合物等 之有機金屬化合物、以及有機填料、增黏劑、消泡劑、整平劑、密著性賦予劑、及著色劑等之樹脂添加劑等。 The curable resin composition may contain a flame retardant and other additives other than the organic filler, and examples of the other additives include an organic copper compound, an organic zinc compound, and an organic cobalt compound. The organometallic compound, and an organic filler, a tackifier, an antifoaming agent, a leveling agent, a tackifier, and a resin additive such as a coloring agent.

-液狀之胺基樹脂- - Liquid amino resin -

從將硬化性樹脂組成物層之最低熔融黏度定為12000poise以下的觀點來看,硬化性樹脂組成物可進一步包含於常溫為液狀之胺基樹脂(液狀胺基樹脂)。液狀胺基樹脂取代液狀環氧樹脂、或可與液狀環氧樹脂一起使用。作為液狀胺基樹脂,可列舉甲基三聚氰胺等之烷基化三聚氰胺樹脂。烷基化三聚氰胺樹脂,例如使三聚氰胺與甲醛進行反應,將胺基之氫原子的一部分或全部以羥甲基取代後,進而與醇化合物進行反應,而將羥甲基之一部分或全部轉化成烷氧基甲基而得到。 The curable resin composition can be further contained in a liquid-like amine-based resin (liquid amine-based resin) from the viewpoint of setting the minimum melt viscosity of the curable resin composition layer to 12,000 poise or less. The liquid amino resin is substituted for the liquid epoxy resin or may be used together with the liquid epoxy resin. The liquid amine-based resin may, for example, be an alkylated melamine resin such as methyl melamine. The alkylated melamine resin, for example, reacts melamine with formaldehyde, and after a part or all of the hydrogen atom of the amine group is substituted with a methylol group, and then reacts with the alcohol compound to convert a part or all of the methylol group into an alkane. Obtained from oxymethyl.

[樹脂薄片] [resin sheet]

以下,針對本發明之樹脂薄片進行說明。 Hereinafter, the resin sheet of the present invention will be described.

本發明之樹脂薄片係具備支持體、與藉由硬化性樹脂組成物所形成之硬化性樹脂組成物層,其特徵為硬化性樹脂組成物層之最低熔融黏度為12000poise以下。進而較佳為使前述硬化性樹脂組成物層硬化而成之絕緣層(硬化物)從25℃至150℃之間的平均線熱膨脹率為17ppm/℃以下。 The resin sheet of the present invention comprises a support and a curable resin composition layer formed of a curable resin composition, and the curable resin composition layer has a minimum melt viscosity of 12,000 poise or less. Further, it is preferable that the insulating layer (cured material) obtained by curing the curable resin composition layer has an average linear thermal expansion coefficient of from 25 ° C to 150 ° C of 17 ppm / ° C or less.

將本發明之樹脂薄片之一例示於圖2。在圖2,樹脂薄片10係具備支持體11、與設置在支持體11之 上的硬化性樹脂組成物層12。 One of the resin sheets of the present invention is illustrated in Fig. 2 . In FIG. 2, the resin sheet 10 is provided with a support 11 and a support body 11 The upper curable resin composition layer 12.

<支持體> <Support>

作為支持體,例如可列舉由塑膠材料所構成之薄膜、金屬箔、脫模紙,較佳為由塑膠材料所構成之薄膜、金屬箔。 Examples of the support include a film made of a plastic material, a metal foil, and a release paper, and a film made of a plastic material or a metal foil is preferable.

使用由塑膠材料所構成之薄膜作為支持體的情況下,作為塑膠材料,例如可列舉聚對苯二甲酸乙二酯(以下有時簡稱為「PET」)、聚萘二甲酸乙二酯(以下有時簡稱為「PEN」)等之聚酯、聚碳酸酯(以下有時簡稱為「PC」)、聚甲基甲基丙烯酸酯(PMMA)等之丙烯醯基、環狀聚烯烴類、三乙醯基纖維素(TAC)、聚醚硫化物(PES)、聚醚酮、聚醯亞胺等。其中,較佳為聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯,特佳為便宜之聚對苯二甲酸乙二酯。 When a film made of a plastic material is used as the support, examples of the plastic material include polyethylene terephthalate (hereinafter sometimes abbreviated as "PET") and polyethylene naphthalate (hereinafter, Polyester, polycarbonate (hereinafter sometimes abbreviated as "PC"), polymethyl methacrylate (PMMA), etc., etc., may be referred to as "PEN", etc. Ethyl phthalocyanine (TAC), polyether sulfide (PES), polyether ketone, polyimide, and the like. Among them, polyethylene terephthalate or polyethylene naphthalate is preferred, and polyethylene terephthalate is particularly preferred.

使用金屬箔作為支持體的情況下,作為金屬箔,例如可列舉銅箔、鋁箔等,較佳為銅箔。作為銅箔,可使用由銅之單金屬所構成之箔,亦可使用由銅與其他金屬(例如錫、鉻、銀、鎂、鎳、鋯、矽、鈦等)的合金所構成之箔。 When a metal foil is used as the support, examples of the metal foil include a copper foil, an aluminum foil, and the like, and a copper foil is preferable. As the copper foil, a foil composed of a single metal of copper may be used, and a foil composed of an alloy of copper and another metal (for example, tin, chromium, silver, magnesium, nickel, zirconium, hafnium, titanium, or the like) may be used.

支持體可於與硬化性樹脂組成物層接合的面實施無光澤處理、電暈處理。 The support can be subjected to a matte treatment or a corona treatment on the surface joined to the curable resin composition layer.

又,作為支持體,可於與硬化性樹脂組成物層接合的面,使用具有脫模層之附脫模層的支持體。作為 使用在附脫模層之支持體的脫模層之脫模劑,例如可列舉選自由醇酸樹脂、聚烯烴樹脂、胺基甲酸乙酯樹脂、及矽氧樹脂所構成之群組中之一種以上的脫模劑。附脫模層之支持體可使用市售品,例如可列舉具有將醇酸樹脂系脫模劑作為主成分之脫模層的PET薄膜,即東麗(股)製之「Lumilar T6AM」、Lintec(股)製之「SK-1」、「AL-5」、「AL-7」等。 Further, as the support, a support having a release layer having a release layer can be used on the surface to be bonded to the curable resin composition layer. As The release agent to be used in the release layer of the support to which the release layer is attached may, for example, be one selected from the group consisting of an alkyd resin, a polyolefin resin, a urethane resin, and a silicone resin. The above release agent. A commercially available product can be used as the support for the mold release layer, and for example, a PET film having a release layer containing an alkyd resin release agent as a main component, that is, "Lumilar T6AM" manufactured by Toray Industries Co., Ltd., Lintec "Stock" system "SK-1", "AL-5", "AL-7", etc.

作為支持體的厚度,雖並未特別限定,但較佳為5μm~75μm的範圍,更佳為10μm~60μm的範圍。尚,使用附脫模層之支持體的情況下,以附脫模層之支持體全體的厚度為上述範圍較佳。 The thickness of the support is not particularly limited, but is preferably in the range of 5 μm to 75 μm, and more preferably in the range of 10 μm to 60 μm. When the support having the release layer is used, the thickness of the entire support having the release layer is preferably in the above range.

<硬化性樹脂組成物層> <Curable resin composition layer>

在本發明,硬化性樹脂組成物層之最低熔融黏度,從製造零件內藏電路板時,實現孔洞內部之零件之良好的嵌入性的觀點來看,為較佳為12000poise以下,較佳為10000poise以下,更佳為8000poise以下。硬化性樹脂組成物層之最低熔融黏度的下限並未特別限定,通常可成為500poise以上、1000poise以上等。 In the present invention, the lowest melt viscosity of the curable resin composition layer is preferably 12,000 poise or less, preferably 10,000 poise from the viewpoint of achieving good embedding property of the inside of the hole when manufacturing the circuit board in the component. Below, it is better to be 8000 poise or less. The lower limit of the minimum melt viscosity of the curable resin composition layer is not particularly limited, and may be usually 500 poise or more, 1000 poise or more.

於此,所謂硬化性樹脂組成物層之「最低熔融黏度」,係指熔融硬化性樹脂組成物層之樹脂時,硬化性樹脂組成物層呈現最低的黏度。詳細而言,係以一定之昇溫速度加熱硬化性樹脂組成物層使樹脂熔融時,初期階段熔融黏度伴隨溫度上昇而下降,然後當溫度超過某種程 度時,與溫度上昇一起提昇熔融黏度。所謂「最低熔融黏度」,係指該極小點之熔融黏度。硬化性樹脂組成物層之最低熔融黏度,可使用動態黏彈法測定。具體而言,硬化性樹脂組成物層之最低熔融黏度可藉由以測定開始溫度60℃、昇溫速度5℃/分鐘、振動數1Hz、扭曲1deg的測定條件進行動態黏彈性測定而得到。作為動態黏彈性測定裝置例如可列舉((股)UBM製「Rheosol-G3000」)。 Here, the "minimum melt viscosity" of the curable resin composition layer means a resin having a melt-hardenable resin composition layer, and the curable resin composition layer exhibits the lowest viscosity. Specifically, when the resin is melted by heating the curable resin composition layer at a constant temperature increase rate, the initial stage melt viscosity decreases with temperature rise, and then when the temperature exceeds a certain course When the degree is increased, the melt viscosity is increased together with the temperature rise. The term "minimum melt viscosity" refers to the melt viscosity of the minimum point. The lowest melt viscosity of the curable resin composition layer can be measured by a dynamic viscoelastic method. Specifically, the lowest melt viscosity of the curable resin composition layer can be obtained by dynamic viscoelasticity measurement at a measurement start temperature of 60 ° C, a temperature increase rate of 5 ° C / min, a vibration number of 1 Hz, and a distortion of 1 deg. Examples of the dynamic viscoelasticity measuring device include ("Rheosol-G3000" manufactured by UBM).

在本發明,使硬化性樹脂組成物層硬化而成之絕緣層從25℃至150℃之間的平均線熱膨脹率,從實現抑制彎曲問題之零件內藏電路板的觀點來看,為17ppm/℃以下,較佳為16ppm/℃以下,更佳為15ppm/℃以下。該平均線熱膨脹率的下限雖並未特別限定,但通常可為1ppm/℃以上、2ppm/℃以上、3ppm/℃以上等。平均線熱膨脹率,例如可藉由熱機械分析等之周知的方法測定。作為熱機械分析裝置,例如可列舉(股)理學製之「Thermo Plus TMA8310」。在本發明,絕緣層之平均線熱膨脹率係以拉伸加重法進行熱機械分析時之平面方向之25~150℃的平均線熱膨脹率。 In the present invention, the average linear thermal expansion coefficient of the insulating layer obtained by hardening the curable resin composition layer from 25 ° C to 150 ° C is 17 ppm / from the viewpoint of realizing the built-in circuit board for the part which suppresses the bending problem. Below °C, it is preferably 16 ppm/° C. or less, more preferably 15 ppm/° C. or less. The lower limit of the average linear thermal expansion coefficient is not particularly limited, but may be usually 1 ppm/° C. or higher, 2 ppm/° C. or higher, or 3 ppm/° C. or higher. The average linear thermal expansion coefficient can be measured, for example, by a known method such as thermomechanical analysis. As the thermomechanical analysis device, for example, "Thermo Plus TMA8310" manufactured by Rigaku Corporation can be cited. In the present invention, the average linear thermal expansion coefficient of the insulating layer is an average linear thermal expansion coefficient of 25 to 150 ° C in the plane direction at the time of thermomechanical analysis by the tensile weighting method.

在本發明,由硬化性樹脂組成物所構成之硬化性樹脂組成物層的厚度較佳為300μm以下,再更佳為200μm以下。硬化性樹脂組成物層之厚度的下限雖並未特別限定,但從於粗糙化處理後得到對於導體層呈現優異之剝離強度之絕緣層的觀點、樹脂薄片之製造容易性的觀點來看,通常可為10μm以上、20μm以上等。 In the present invention, the thickness of the curable resin composition layer composed of the curable resin composition is preferably 300 μm or less, and more preferably 200 μm or less. The lower limit of the thickness of the curable resin composition layer is not particularly limited, but from the viewpoint of obtaining an insulating layer which exhibits excellent peel strength for the conductor layer after the roughening treatment, and the ease of production of the resin sheet, usually It may be 10 μm or more, 20 μm or more, or the like.

本發明之樹脂薄片10,在未與硬化性樹脂組成物層12之支持體11接合的面(亦即,與支持體相反側的面)中,可進一步包含保護薄膜。保護薄膜,有助於對硬化性樹脂組成物層12的表面之垃圾等之附著或傷痕的防止。作為保護薄膜的材料,可使用與針對支持體11所說明之材料相同者。保護薄膜的厚度雖並非被特別限定,但例如為1μm~40μm。樹脂薄片10於製造印刷配線板時,變成可藉由剝離保護薄膜來使用。 The resin sheet 10 of the present invention may further include a protective film on a surface that is not bonded to the support 11 of the curable resin composition layer 12 (that is, a surface opposite to the support). The protective film contributes to the prevention of adhesion or scratches to the surface of the curable resin composition layer 12, such as garbage. As the material of the protective film, the same material as that described for the support 11 can be used. The thickness of the protective film is not particularly limited, but is, for example, 1 μm to 40 μm. When the printed wiring board 10 is manufactured, the resin sheet 10 can be used by peeling off a protective film.

本發明之樹脂薄片係於零件內藏電路板之製造時,可實現孔洞內部之零件的良好之嵌入性,同時可實現抑制彎曲問題之零件內藏電路板。據此,本發明之樹脂薄片可特別適合使用在於零件內藏電路板之製造時,用以嵌入孔洞內部的零件(孔洞嵌入用),即使在封模底部填膠(Mold underfill)(密封)的用途亦可適合使用。本發明之樹脂薄片,又可使用在用以形成印刷配線板的絕緣層(印刷配線板之絕緣層用)。本發明之樹脂薄片由於於其上帶來可形成微細之配線的絕緣層,在藉由積聚(Build up)方式之印刷配線板的製造,可適合使用在用以形成絕緣層(印刷配線板之積聚絕緣層用),可更適合使用在藉由鍍敷用以形成導體層(藉由鍍敷形成導體層之印刷配線板的積聚絕緣層用)。 The resin sheet of the present invention is capable of realizing good embedding of parts inside the hole while manufacturing the circuit board built in the part, and at the same time, realizing the built-in circuit board of the part which suppresses the bending problem. Accordingly, the resin sheet of the present invention is particularly suitable for use in a part for embedding a hole (for hole embedding) in the manufacture of a built-in circuit board of a part, even if it is Mold underfill (sealed) at the bottom of the mold. The use can also be used. The resin sheet of the present invention can be used also for an insulating layer (for an insulating layer of a printed wiring board) for forming a printed wiring board. The resin sheet of the present invention can be suitably used for forming an insulating layer (printed wiring board) because it produces an insulating layer capable of forming fine wiring thereon, and is manufactured by a build-up printed wiring board. For the accumulation of the insulating layer, it is more suitably used for forming a conductor layer by plating (a conductive insulating layer for a printed wiring board in which a conductor layer is formed by plating).

<樹脂薄片之製造方法> <Method for Producing Resin Sheet>

以下,說明本發明之樹脂薄片之製造方法之一例。於 支持體上形成由硬化性樹脂組成物所構成之硬化性樹脂組成物層。 Hereinafter, an example of a method for producing a resin sheet of the present invention will be described. to A curable resin composition layer composed of a curable resin composition is formed on the support.

作為形成硬化性樹脂組成物層之方法,例如可列舉於支持體塗佈硬化性樹脂組成物,乾燥塗佈膜,以設置硬化性樹脂組成物層之方法。 The method of forming the curable resin composition layer is, for example, a method in which a support is applied to a curable resin composition, and a coating film is dried to provide a curable resin composition layer.

在此方法,硬化性樹脂組成物層可藉由調製溶解硬化性樹脂組成物於有機溶劑之樹脂清漆,將此樹脂清漆使用模塗佈機等,塗佈於支持體上,並使樹脂清漆乾燥來製作。 In this method, the curable resin composition layer can be prepared by applying a resin varnish which dissolves the curable resin composition to an organic solvent, and the resin varnish is applied onto a support by a die coater or the like, and the resin varnish is dried. To make.

作為有機溶劑,例如可列舉丙酮、甲基乙基酮及環己酮等之酮類、乙酸乙酯、乙酸丁酯、溶纖劑乙酸酯、丙二醇單甲基醚乙酸酯及卡必醇乙酸酯等之乙酸酯類、溶纖劑及丁基卡必醇等之卡必醇類、甲苯及二甲苯等之芳香族烴類、二甲基甲醯胺、二甲基乙醯胺及N-甲基吡咯啶酮等之醯胺系溶劑等。有機溶劑可1種單獨使用,亦可併用2種以上。 Examples of the organic solvent include ketones such as acetone, methyl ethyl ketone and cyclohexanone, ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate, and carbitol. Acetate such as acetate, cellosolve, carbitol such as butyl carbitol, aromatic hydrocarbon such as toluene and xylene, dimethylformamide, dimethylacetamide, and A guanamine-based solvent such as N-methylpyrrolidone. The organic solvent may be used alone or in combination of two or more.

樹脂清漆乾燥可藉由加熱、吹送熱風等之周知的乾燥方法實施。雖因樹脂清漆中之有機溶劑的沸點而有所不同,但例如使用包含30質量%~60質量%之有機溶劑的樹脂清漆時,藉由使其於50℃~150℃乾燥3分鐘~10分鐘,可於支持體上形成硬化性樹脂組成物層。 The resin varnish drying can be carried out by a known drying method such as heating, blowing hot air or the like. Although it varies depending on the boiling point of the organic solvent in the resin varnish, for example, when a resin varnish containing 30% by mass to 60% by mass of an organic solvent is used, it is dried at 50 ° C to 150 ° C for 3 minutes to 10 minutes. A layer of a curable resin composition can be formed on the support.

又,在本發明,例如可於保護薄膜上形成硬化性樹脂組成物層後,層合支持體於硬化性樹脂組成物層上,來製作樹脂薄片。 Further, in the present invention, for example, a curable resin composition layer can be formed on the protective film, and then the laminate can be laminated on the curable resin composition layer to form a resin sheet.

<配線板> <Wiring board>

本發明之配線板係具備使本發明之樹脂薄片之硬化性樹脂組成物層硬化而成之絕緣層、與導體層。以下,針對本發明之配線板之一實施形態即零件內藏電路板進行說明。 The wiring board of the present invention includes an insulating layer and a conductor layer obtained by curing a layer of a curable resin composition of the resin sheet of the present invention. Hereinafter, a component-embedded circuit board which is one embodiment of the wiring board of the present invention will be described.

零件內藏電路板係包含(A)具有第1及第2主面,形成貫通該第1及第2主面間之孔洞的電路基板、與和該電路基板之第2主面接合而成之暫時配附之材料、與在前述電路基板之孔洞的內部藉由前述暫時配附之材料暫時配附之零件,於暫時配附零件之電路基板,可藉由包含下述順序之製造方法製得:將本發明之樹脂薄片以硬化性樹脂組成物層與電路基板之第1主面接合的方式,進行真空層合之第1層合步驟、與(B)加熱處理層合前述樹脂薄片之電路基板的加熱處理步驟、與(C)從電路基板之第2主面剝離暫時配附之材料後,將第2樹脂薄片以該硬化性樹脂組成物層與電路基板之第2主面接合的方式,進行真空層合之第2層合步驟、與D)熱硬化前述樹脂薄片之硬化性樹脂組成物層及第2樹脂薄片之硬化性樹脂組成物層的步驟。在各步驟的說明之前,先針對使用本發明之樹脂薄片10之「暫時配附零件之電路基板」進行說明。 The component-embedded circuit board includes (A) a circuit board having first and second main faces, a hole penetrating through the first and second main faces, and a second main surface joined to the circuit board. The temporarily attached material and the component temporarily attached to the inside of the hole of the circuit board by the temporarily attached material, the circuit board temporarily attached to the component can be obtained by a manufacturing method including the following sequence a circuit in which the resin sheet of the present invention is laminated to the first main surface of the circuit board, and the first lamination step of vacuum lamination is performed, and (B) heat treatment is performed to laminate the resin sheet. After the step of heat-treating the substrate and (C) peeling off the temporarily-attached material from the second main surface of the circuit board, the second resin sheet is bonded to the second main surface of the circuit board by the curable resin composition layer And a step of performing a second lamination step of vacuum lamination, and D) thermally curing the curable resin composition layer of the resin sheet and the curable resin composition layer of the second resin sheet. Before the description of each step, a description will be given of a "circuit board for temporarily attaching a component" using the resin sheet 10 of the present invention.

(暫時配附零件之電路基板) (The circuit board with the parts temporarily attached)

暫時配附零件之電路基板(以下,亦稱為「暫時配附 零件之電路基板」、「孔洞基板」)係包含具有第1及第2主面,形成貫通該第1及第2主面間之孔洞的電路基板、與和該電路基板之第2主面接合而成之暫時配附之材料、與在前述電路基板之孔洞的內部藉由前述暫時配附之材料暫時配附之零件。 Circuit board with temporary parts attached (hereinafter, also referred to as "temporary attachment" The circuit board and the "hole substrate" of the component include a circuit board having first and second main faces and forming a hole penetrating between the first and second main faces, and bonding to the second main surface of the circuit board The temporarily attached material and the part temporarily attached to the inside of the hole of the circuit board by the temporarily attached material.

暫時配附零件之電路基板於零件內藏電路板之製造時,可依照以往周知之任意順序準備。以下,參照圖1A~圖1D,雖說明準備暫時配附零件之電路基板的順序之一例,但並非被限定於下述順序。 The circuit board on which the parts are temporarily attached can be prepared in any order known in the art when manufacturing the circuit board built in the parts. Hereinafter, an example of the procedure for preparing a circuit board for temporarily attaching components will be described with reference to FIGS. 1A to 1D, but the present invention is not limited to the following procedure.

首先,準備電路基板(圖1A)。所謂「電路基板」,係指具有對向之第1及第2主面,具有圖型加工在該第1及第2主面的單側或雙側之電路配線的板狀基板。在圖1A,已示意性表示電路基板1之端面,電路基板1係包含基板2、與貫孔(Via)配線、表面配線等之電路配線3。在以下之說明,為便於說明所謂電路基板之第1主面,係表示圖示之電路基板的上側主面,所謂電路基板之第2主面,係表示圖示之電路基板的下側主面。 First, a circuit board is prepared (Fig. 1A). The "circuit board" refers to a plate-like substrate having a first or second main surface facing the first and second main surfaces of the first and second main surfaces. In FIG. 1A, the end surface of the circuit board 1 is schematically shown, and the circuit board 1 includes a circuit board 3 including a substrate 2, a via wiring, and a surface wiring. In the following description, for convenience of explanation, the first main surface of the circuit board is shown as the upper main surface of the circuit board shown in the drawing, and the second main surface of the circuit board is the lower main surface of the circuit board shown in the drawing. .

作為電路基板1所使用之基板2,例如可列舉玻璃環氧基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚苯醚基板等,較佳為玻璃環氧基板。又,製造印刷配線板時,進而應形成絕緣層及/或導體層之中間製造物的內層電路基板亦包含在「電路基板」。 Examples of the substrate 2 used for the circuit board 1 include a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, a thermosetting polyphenylene ether substrate, and the like, and preferably a glass epoxy. Substrate. Further, when the printed wiring board is manufactured, the inner layer circuit board in which the intermediate layer of the insulating layer and/or the conductor layer is formed is also included in the "circuit board".

電路基板1之基板2的厚度,從零件內藏電 路板之薄型化的觀點來看,適合較薄者,較佳為未滿400μm,更佳為350μm以下,再更佳為300μm以下,又再更佳為250μm以下,特佳為200μm以下,180μm以下,170μm以下,160μm以下,或150μm以下。基板2之厚度的下限雖並未特別限制,但從搬送時提昇操作性的觀點來看,較佳為50μm以上,更佳為80μm以上,再更佳為100μm以上。 The thickness of the substrate 2 of the circuit substrate 1 is built in from the parts From the viewpoint of thinning of the road plate, it is preferably less than 400 μm, more preferably 350 μm or less, still more preferably 300 μm or less, still more preferably 250 μm or less, and particularly preferably 200 μm or less, 180 μm. Hereinafter, it is 170 μm or less, 160 μm or less, or 150 μm or less. The lower limit of the thickness of the substrate 2 is not particularly limited, but is preferably 50 μm or more, more preferably 80 μm or more, and still more preferably 100 μm or more from the viewpoint of improving workability during transportation.

電路基板1所具備之電路配線3的尺寸可因應所期望特性決定。例如表面配線的厚度,從零件內藏電路板之薄型化的觀點來看,較佳為40μm以下,更佳為35μm以下,再更佳為30μm以下,又再更佳為25μm以下,特佳為20μm以下,19μm以下,或18μm以下。表面配線之厚度的下限雖並未特別限制,但通常為1μm以上、3μm以上、5μm以上等。 The size of the circuit wiring 3 included in the circuit board 1 can be determined in accordance with desired characteristics. For example, the thickness of the surface wiring is preferably 40 μm or less, more preferably 35 μm or less, still more preferably 30 μm or less, and still more preferably 25 μm or less, from the viewpoint of reducing the thickness of the component-embedded circuit board. 20 μm or less, 19 μm or less, or 18 μm or less. The lower limit of the thickness of the surface wiring is not particularly limited, but is usually 1 μm or more, 3 μm or more, and 5 μm or more.

其次,將用以收容零件之孔洞(凹部)設置在電路基板(圖1B)。如圖1B示意性表示,可於基板2之預定位置設置貫通電路基板之第1及第2主面間的孔洞2a。孔洞2a考量基板2之特性,例如可藉由使用鑽孔機、雷射、電漿、蝕刻媒體等之周知的方法形成。 Next, a hole (recess) for accommodating the component is placed on the circuit board (Fig. 1B). As schematically shown in FIG. 1B, a hole 2a penetrating between the first and second main faces of the circuit board can be provided at a predetermined position of the substrate 2. The hole 2a can be formed by considering a characteristic of the substrate 2 by, for example, a well-known method using a drill, a laser, a plasma, an etching medium, or the like.

圖1B中雖僅顯示1個孔洞2a,但孔洞2a可彼此以預定間隔複數設置。孔洞2a間之間距,從零件內藏電路板之小型化的觀點來看,適合較短。孔洞2a間之間距,雖因孔洞2a本身之開口尺寸而異,但較佳為10mm以下,更佳為9mm以下,再更佳為8mm以下,又再更佳 為7mm以下,特佳為6mm以下。根據本發明之方法,即使在將孔洞設置在該較短之間距的情況下,亦可抑制基板彎曲的發生。孔洞2a間之間距的下限,雖亦因孔洞2a本身之開口尺寸而異,但通常為1mm以上、2mm以上等。孔洞2a間之各間距不需要整個電路基板相同,亦可為相異。 Although only one hole 2a is shown in Fig. 1B, the holes 2a may be plurally arranged at a predetermined interval from each other. The distance between the holes 2a is suitable for a short period of view from the viewpoint of miniaturization of the built-in circuit board. The distance between the holes 2a varies depending on the opening size of the hole 2a itself, but is preferably 10 mm or less, more preferably 9 mm or less, still more preferably 8 mm or less, and even better. It is 7 mm or less, and particularly preferably 6 mm or less. According to the method of the present invention, even in the case where the holes are provided at the shorter interval, the occurrence of the bending of the substrate can be suppressed. The lower limit of the distance between the holes 2a varies depending on the opening size of the hole 2a itself, but is usually 1 mm or more and 2 mm or more. The pitch between the holes 2a does not need to be the same for the entire circuit board, and may be different.

孔洞2a之開口形狀並未特別限制,可為矩形、圓形、略矩形、略圓形等之任意形狀。又,孔洞2a之開口尺寸雖因電路配線的設計而異,但例如孔洞2a之開口形狀為矩形的情況下,較佳為5mm×5mm以下,更佳為3mm×3mm以下、或2mm×2mm以下。該開口尺寸的下限,雖因收容之零件的尺寸而異,但通常為0.5mm×0.5mm以上。孔洞2a之開口形狀及開口尺寸不需要整個電路基板相同,亦可為相異。 The shape of the opening of the hole 2a is not particularly limited, and may be any shape such as a rectangle, a circle, a rectangle, or a circle. Further, although the opening size of the hole 2a varies depending on the design of the circuit wiring, for example, when the opening shape of the hole 2a is rectangular, it is preferably 5 mm × 5 mm or less, more preferably 3 mm × 3 mm or less, or 2 mm × 2 mm or less. . The lower limit of the opening size varies depending on the size of the components to be housed, but is usually 0.5 mm × 0.5 mm or more. The opening shape and the opening size of the hole 2a need not be the same as the entire circuit board, and may be different.

其次,於設置孔洞之電路基板的第2主面層合暫時配附之材料(圖1C)。作為暫時配附之材料,為了暫時配附零件,只要具有表示充分黏著性之黏著面則並未特別限制,於零件內藏電路板之製造時,可使用以往周知的任意暫時配附之材料。於示意性表示圖1C之態樣,將薄膜狀之暫時配附之材料4以該暫時配附之材料4之黏著面與電路基板之第2主面接合的方式進行層合。藉此,透過孔洞2a變成使暫時配附之材料4之黏著面露出。 Next, a material temporarily attached to the second main surface of the circuit board on which the holes are provided is laminated (FIG. 1C). The material to be temporarily attached is not particularly limited as long as it has an adhesive surface indicating sufficient adhesion, and any conventionally-prepared material that has been conventionally known can be used for the production of the built-in circuit board. In the aspect schematically shown in Fig. 1C, the material 4 temporarily attached in a film form is laminated such that the adhesive surface of the temporarily attached material 4 is joined to the second main surface of the circuit board. Thereby, the through-hole 2a becomes the adhesive surface of the material 4 temporarily attached.

作為薄膜狀之暫時配附之材料,例如可列舉古河電氣工業(股)製之UC系列(晶圓切割用UV膠帶)。 For example, the UC series (UV tape for wafer cutting) manufactured by Furukawa Electric Co., Ltd. can be cited as a material to be temporarily attached to the film.

其次,於透過孔洞露出之暫時配附之材料的黏著面暫時配附零件(圖1D)。於示意性表示圖1D之態樣,透過孔洞2a於露出之暫時配附之材料4的黏著面暫時配附零件5。 Next, the adhesive surface of the temporarily attached material exposed through the hole is temporarily attached to the part (Fig. 1D). In the aspect schematically shown in Fig. 1D, the component 5 is temporarily attached to the adhesive surface of the temporarily attached material 4 through the hole 2a.

作為零件5,因應所期望特性選擇適當之電氣零件即可,例如可列舉電容器、電感器、電阻等之受動零件、半導體裸晶片等之現用零件。於全部孔洞可使用相同零件5,於每一孔洞可使用不同之零件5。 As the component 5, an appropriate electric component may be selected in accordance with desired characteristics, and examples thereof include a passive component such as a capacitor, an inductor, and a resistor, and a current component such as a semiconductor bare wafer. The same part 5 can be used for all holes, and different parts 5 can be used for each hole.

製造暫時配附零件之電路基板時,上述方法以外,例如可於基板2形成孔洞2a後,設置電路配線3,且可將暫時配附之材料4層合在電路基板之第2主面後,形成孔洞2a。 When the circuit board for temporarily attaching the component is manufactured, in addition to the above method, for example, after the hole 2a is formed in the substrate 2, the circuit wiring 3 can be provided, and the temporarily attached material 4 can be laminated on the second main surface of the circuit board. A hole 2a is formed.

針對使用本發明之樹脂薄片,製造零件內藏電路板之方法進行說明。在以下之說明,有將層合在零件內藏電路板之第1主面及第2主面之本發明的樹脂薄片分別記載為「第1樹脂薄片10」及「第2樹脂薄片20」的情況。作為第1樹脂薄片10與第2樹脂薄片20,可使用相同者,亦可使用相異者。在以下之說明,為了區別第1樹脂薄片10與第2樹脂薄片20,有時將第1樹脂薄片10之支持體11記載為第1支持體11。 A method of manufacturing a circuit board in a part will be described using the resin sheet of the present invention. In the following description, the resin sheets of the present invention which are laminated on the first main surface and the second main surface of the component-embedded circuit board are described as "first resin sheet 10" and "second resin sheet 20", respectively. Happening. The same may be used as the first resin sheet 10 and the second resin sheet 20, and a different one may be used. In the following description, in order to distinguish the first resin sheet 10 from the second resin sheet 20, the support 11 of the first resin sheet 10 may be referred to as the first support 11.

<(A)第1層合步驟(第1樹脂薄片之層合)> <(A) First Lamination Step (Lamination of First Resin Sheet)>

首先,於暫時配附零件之電路基板層合本發明之樹脂薄片(第1樹脂薄片10)(第1層合步驟)。詳細而言,於暫 時配附零件之電路基板1’,將第1樹脂薄片10以硬化性樹脂組成物層12與電路基板之第1主面接合的方式進行真空層合(參照圖3A)。於此,有具備第1樹脂薄片10被覆硬化性樹脂組成物層12之保護薄膜之構成的情況,剝離保護薄膜後,進行對電路基板的層合。 First, the resin sheet (first resin sheet 10) of the present invention is laminated on a circuit board on which components are temporarily attached (first lamination step). In detail, for the time being In the circuit board 1' to which the component is attached, the first resin sheet 10 is vacuum-laminated so that the curable resin composition layer 12 is bonded to the first main surface of the circuit board (see FIG. 3A). In the case where the protective film of the first resin sheet 10 is coated with the curable resin composition layer 12, the protective film is peeled off, and then the circuit board is laminated.

對暫時配附零件之電路基板1’之第1樹脂薄片10的真空層合,例如於減壓條件下從支持體11側,可藉由將第1樹脂薄片10加熱壓著在暫時配附零件之電路基板1’來進行。作為將第1樹脂薄片10加熱壓著在暫時配附零件之電路基板1’的構件(未圖示;以下,亦稱為「加熱壓著構件」),例如可列舉經加熱之金屬板(SUS鏡板等)或金屬輥(SUS輥)等。尚,較佳為並非將加熱壓著構件直接沖壓在第1樹脂薄片10,而是於起因於暫時配附零件之電路基板1’之電路配線3或孔洞2a的凹凸以第1樹脂薄片10充分追隨的方式,透過耐熱橡膠等之彈性材進行沖壓。 The vacuum lamination of the first resin sheet 10 of the circuit board 1' to which the components are temporarily attached is, for example, under the reduced pressure, from the side of the support 11, by heating the first resin sheet 10 to the temporarily attached parts. The circuit board 1' is performed. A member (not shown; hereinafter also referred to as "heating and pressing member") for heating and pressing the first resin sheet 10 on the circuit board 1' to which the components are temporarily attached is, for example, a heated metal plate (SUS) Mirror plate, etc.) or metal roll (SUS roll). In addition, it is preferable that the heating and pressing member is not directly pressed into the first resin sheet 10, but the unevenness of the circuit wiring 3 or the hole 2a of the circuit board 1' due to the temporary attachment of the component is preferably sufficient for the first resin sheet 10. In the following way, it is punched through an elastic material such as heat-resistant rubber.

加熱壓著溫度較佳為80℃~160℃,更佳為100℃~140℃的範圍,加熱壓著壓力較佳為0.098MPa~1.77MPa,更佳為0.29MPa~1.47MPa的範圍,加熱壓著時間較佳為20秒~400秒,更佳為30秒~300秒的範圍。真空層合較佳為以壓力26.7hPa以下之減壓條件下實施。 The heating and pressing temperature is preferably from 80 ° C to 160 ° C, more preferably from 100 ° C to 140 ° C, and the heating pressing pressure is preferably from 0.098 MPa to 1.77 MPa, more preferably from 0.29 MPa to 1.47 MPa, and heating pressure. The time is preferably from 20 seconds to 400 seconds, more preferably from 30 seconds to 300 seconds. The vacuum lamination is preferably carried out under reduced pressure of 26.7 hPa or less.

真空層合可藉由市售之真空層合機進行。作為市售之真空層合機,例如可列舉(股)名機製作所製之真 空加壓式層合機、Nichigo-Morton(股)製之真空敷料器、Nichigo-Morton(股)製2階段積聚層合機等。 Vacuum lamination can be carried out by means of a commercially available vacuum laminator. As a commercially available vacuum laminator, for example, the true name of the machine can be listed. An air pressure laminator, a vacuum applicator manufactured by Nichigo-Morton Co., Ltd., a two-stage accumulation laminator made of Nichigo-Morton Co., Ltd., and the like.

於第1層合步驟之後,於常壓(大氣壓)下,例如以藉由將加熱壓著構件從第1支持體11側進行沖壓,進行經層合之第1樹脂薄片10的平滑化處理較佳。平滑化處理的沖壓條件可成為與上述真空層合之加熱壓著條件相同的條件。 After the first laminating step, the smoothing treatment of the laminated first resin sheet 10 is performed by, for example, pressing the heating and pressing member from the side of the first support 11 under normal pressure (atmospheric pressure). good. The pressing conditions of the smoothing treatment may be the same conditions as the heating and pressing conditions of the vacuum lamination described above.

平滑化步驟可藉由市售之層合機實行。尚,第1層合步驟與平滑化步驟可使用上述之市售之真空層合機連續性進行。 The smoothing step can be carried out by a commercially available laminator. Still, the first lamination step and the smoothing step can be carried out using the commercially available vacuum laminator continuity described above.

經過第1層合步驟後,硬化性樹脂組成物層12填充在孔洞2a內,暫時配附在孔洞2a內之零件5嵌入硬化性樹脂組成物層12(參照圖3B)。 After the first lamination step, the curable resin composition layer 12 is filled in the hole 2a, and the component 5 temporarily attached to the hole 2a is fitted into the curable resin composition layer 12 (see FIG. 3B).

<(B)加熱處理步驟> <(B) Heat treatment step>

其次,加熱處理層合第1樹脂薄片10之電路基板(加熱處理步驟)。在該步驟之加熱溫度較佳為155℃以下,更佳為150℃以下,再更佳為145℃以下,又再更佳為140℃以下。加熱溫度之下限較佳為110℃以上,更佳為115℃以上,再更佳為120℃以上,又再更佳為125℃以上。 Next, the circuit board of the first resin sheet 10 is laminated by heat treatment (heat treatment step). The heating temperature in this step is preferably 155 ° C or lower, more preferably 150 ° C or lower, still more preferably 145 ° C or lower, and still more preferably 140 ° C or lower. The lower limit of the heating temperature is preferably 110 ° C or more, more preferably 115 ° C or more, still more preferably 120 ° C or more, and still more preferably 125 ° C or more.

在加熱處理步驟之加熱時間雖因加熱溫度而異,但較佳為10分鐘以上,更佳為15分鐘以上,再更佳為20分鐘以上。加熱時間的上限雖並未特別限制,但通常可為60分鐘以下。 Although the heating time in the heat treatment step varies depending on the heating temperature, it is preferably 10 minutes or longer, more preferably 15 minutes or longer, and still more preferably 20 minutes or longer. Although the upper limit of the heating time is not particularly limited, it is usually 60 minutes or less.

在加熱處理步驟之硬化性樹脂組成物層12的加熱處理較佳為在大氣壓下(常壓下)進行。 The heat treatment of the curable resin composition layer 12 in the heat treatment step is preferably carried out under atmospheric pressure (at normal pressure).

在加熱處理步驟之硬化性樹脂組成物層12的加熱處理,可用第1支持體11附在硬化性樹脂組成物層12之狀態實施,亦可剝離第1支持體11使硬化性樹脂組成物層12露出後實施。在適合之一實施形態,硬化性樹脂組成物層12之加熱處理,以第1支持體11附在第1硬化性樹脂組成物層12之狀態實施。藉此,從防止異物附著、防止硬化性樹脂組成物層之損害的點來看變有利。 The heat treatment of the curable resin composition layer 12 in the heat treatment step may be carried out in a state where the first support 11 is attached to the curable resin composition layer 12, or the first support 11 may be peeled off to form a curable resin composition layer. 12 is implemented after exposure. In a preferred embodiment, the heat treatment of the curable resin composition layer 12 is carried out in a state in which the first support 11 is attached to the first curable resin composition layer 12. Thereby, it is advantageous from the viewpoint of preventing adhesion of foreign matter and preventing damage of the curable resin composition layer.

將在加熱處理步驟之硬化性樹脂組成物層12的加熱處理,以附第1支持體11之狀態實施的情況下,第1支持體11於使硬化性樹脂組成物層12硬化所得之絕緣層(硬化物)設置導體層(電路配線)之步驟前剝離即可,例如可於第1加熱處理步驟與後述之第2層合步驟之間剝離,亦可於第2層合步驟與熱硬化步驟(後述之)之間剝離,亦可於熱硬化步驟之後剝離。在適合之一實施形態,第1支持體11係於熱硬化步驟之後剝離。尚,作為第1支持體11,使用銅箔等之金屬箔的情況下,如後述,由於可使用該金屬箔設置導體層(電路配線),第1支持體11亦可不剝離。 In the case where the heat treatment of the curable resin composition layer 12 in the heat treatment step is performed in the state in which the first support 11 is attached, the first support 11 is an insulating layer obtained by curing the curable resin composition layer 12. (The cured product) may be peeled off before the step of providing the conductor layer (circuit wiring), for example, may be peeled off between the first heat treatment step and the second lamination step described later, or may be in the second lamination step and the thermal hardening step. Peeling between (described later) may also be performed after the thermal hardening step. In a preferred embodiment, the first support 11 is peeled off after the thermal curing step. When a metal foil such as a copper foil is used as the first support 11, as will be described later, since the conductor layer (circuit wiring) can be provided using the metal foil, the first support 11 may not be peeled off.

在適合之一實施形態,於第1層合步驟與加熱處理步驟之間,可將電路基板實施冷卻至常溫(室溫)之處理。 In a preferred embodiment, the circuit substrate can be cooled to room temperature (room temperature) between the first lamination step and the heat treatment step.

在適合之一實施形態,藉由經過加熱處理步 驟,硬化性樹脂組成物層12成為硬化性樹脂組成物層(加熱處理體)12’(參照圖3C)。尚,於圖3C,表示以附第1支持體11之狀態進行加熱處理而得到硬化性樹脂組成物層(加熱處理體)12’之態樣。 In a suitable embodiment, by heating the step The curable resin composition layer 12 is a curable resin composition layer (heat treatment body) 12' (see Fig. 3C). In addition, Fig. 3C shows a state in which the curable resin composition layer (heat treatment body) 12' is obtained by heat treatment in a state in which the first support 11 is attached.

<(C)第2層合步驟(第2樹脂薄片之層合)> <(C) Second Lamination Step (Lamination of Second Resin Sheet)>

加熱處理步驟之後,從電路基板之第2主面剝離暫時配附之材料4,使電路基板2之第2主面露出。而且將第2樹脂薄片20以硬化性樹脂組成物層22與電路基板2之第2主面(圖示下側面)接合的方式,進行真空層合(參照圖3D)。於此,第2樹脂薄片係包含支持體21(亦稱為第2支持體)及與該支持體接合之硬化性樹脂組成物層22(亦稱為第2硬化性樹脂組成物層)。作為第2樹脂薄片,較佳為使用本發明之樹脂薄片。第2支持體或第2硬化性樹脂組成物層之構成係與上述之本發明之樹脂薄片的支持體及硬化性樹脂組成物層相同。尚,作為第2樹脂薄片,可使用與第1樹脂薄片不同構成之樹脂薄片(例如複數具備不同組成之硬化性樹脂組成物層的樹脂薄片、或具備不滿足在本發明之所期望之最低熔融黏度條件、平均線熱膨脹率條件之硬化性樹脂組成物層者)。 After the heat treatment step, the temporarily attached material 4 is peeled off from the second main surface of the circuit board, and the second main surface of the circuit board 2 is exposed. Further, the second resin sheet 20 is vacuum-laminated so that the curable resin composition layer 22 is bonded to the second main surface (lower side surface) of the circuit board 2 (see FIG. 3D). Here, the second resin sheet includes a support 21 (also referred to as a second support) and a curable resin composition layer 22 (also referred to as a second curable resin composition layer) bonded to the support. As the second resin sheet, the resin sheet of the present invention is preferably used. The structure of the second support or the second curable resin composition layer is the same as that of the above-described support sheet of the resin sheet of the present invention and the curable resin composition layer. Further, as the second resin sheet, a resin sheet having a different constitution from the first resin sheet (for example, a resin sheet having a plurality of curable resin composition layers having different compositions or having a minimum melting ratio which is not satisfactory in the present invention) can be used. Viscosity condition, the average linear thermal expansion rate of the curable resin composition layer).

暫時配附之材料4之剝離可因應暫時配附之材料4的種類,依照以往周知之方法進行。例如,作為暫時配附之材料4,使用河電氣工業股份有限公司製之UC系列等之晶圓切割用UV膠帶時,UV照射暫時配附之材 料4後,可剝離暫時配附之材料4。UV照射量等之條件,可為零件內藏電路板之製造時通常所採用之周知的條件。 The peeling of the temporarily attached material 4 can be carried out according to a conventionally known method depending on the type of the material 4 to be temporarily attached. For example, when the UV tape for wafer cutting such as the UC series manufactured by Kawasaki Electric Co., Ltd. is used as the material 4 to be temporarily attached, the UV irradiation temporarily supplies the material. After the material 4, the temporarily attached material 4 can be peeled off. The conditions such as the amount of UV irradiation can be well-known conditions generally used in the manufacture of a circuit board in which a part is built.

藉由經過加熱處理步驟,即使在使用孔洞密度較高之電路基板或厚度較薄之電路基板的情況等,由於可抑制基板彎曲的發生,不會干擾從加熱處理步驟至第2層合步驟為止之基板搬送,可圓滑地實施第2層合步驟。進而,由於將硬化性樹脂組成物層在特定條件進行加熱處理,伴隨第2層合步驟之真空層合,亦可抑制零件之位置變化(偏移),可產生率良好地實現零件之配置精度優異之零件內藏電路板。 By the heat treatment step, even when a circuit board having a high hole density or a circuit board having a small thickness is used, the occurrence of bending of the substrate can be suppressed, and the step from the heat treatment step to the second lamination step is not disturbed. The substrate is conveyed, and the second lamination step can be smoothly performed. Further, since the curable resin composition layer is subjected to heat treatment under specific conditions, the vacuum lamination in the second lamination step can suppress the positional change (offset) of the component, and the placement accuracy of the component can be achieved with good yield. Excellent parts contain built-in boards.

在第2層合步驟之第2樹脂薄片20的真空層合,可採用與在第1層合步驟之第1樹脂薄片10的真空層合相同之方法、條件。 In the vacuum lamination of the second resin sheet 20 in the second lamination step, the same method and conditions as in the vacuum lamination of the first resin sheet 10 in the first lamination step can be employed.

在適合之一實施形態,可於加熱處理步驟與第2層合步驟之間,實施將電路基板冷卻至常溫(室溫)之處理。 In a preferred embodiment, the circuit substrate can be cooled to room temperature (room temperature) between the heat treatment step and the second lamination step.

在第2層合步驟,係於電路基板2之第2主面層合第2硬化性樹脂組成物層22及第2支持體21(參照圖3E)。 In the second laminating step, the second curable resin composition layer 22 and the second support 21 are laminated on the second main surface of the circuit board 2 (see FIG. 3E).

第2支持體21,若於使第2硬化性樹脂組成物層22硬化所得之絕緣層,設置導體層(電路配線)之步驟前進行剝離即可,例如可於第2層合步驟與後述之硬化步驟之間剝離,亦可於硬化步驟之後剝離。在適合之一實 施形態,第2支持體21係於硬化步驟後剝離。尚,作為第2支持體21,使用銅箔等之金屬箔的情況下,係如後述,由於可使用該金屬箔,設置導體層(電路配線),第2支持體21不剝離亦可。 The second support 21 may be peeled off before the step of providing the conductor layer (circuit wiring) in the insulating layer obtained by curing the second curable resin composition layer 22, and may be, for example, a second lamination step and a later description. Peeling between the hardening steps may also be performed after the hardening step. In a suitable In the embodiment, the second support 21 is peeled off after the hardening step. In the case where a metal foil such as a copper foil is used as the second support 21, a conductor layer (circuit wiring) may be provided by using the metal foil, and the second support 21 may not be peeled off.

<(D)硬化步驟> <(D) hardening step>

在硬化步驟,係熱硬化第1樹脂薄片10之硬化性樹脂組成物層12及第2樹脂薄片20之第2硬化性樹脂組成物層22。藉此,於電路基板2之第1主面,硬化性樹脂組成物層(加熱處理體)12’形成絕緣層12”(硬化物),於電路基板2之第2主面,第2硬化性樹脂組成物層22形成絕緣層22”(硬化物)(參照圖3F)。 In the curing step, the curable resin composition layer 12 of the first resin sheet 10 and the second curable resin composition layer 22 of the second resin sheet 20 are thermally cured. Thereby, on the first main surface of the circuit board 2, the curable resin composition layer (heat treatment body) 12' forms the insulating layer 12" (cured material) on the second main surface of the circuit board 2, and the second hardening property The resin composition layer 22 forms an insulating layer 22" (cured material) (refer to FIG. 3F).

熱硬化的條件並未特別限定,可使用形成零件內藏電路板之絕緣層時通常所採用之條件。 The conditions of the thermosetting are not particularly limited, and the conditions generally employed in forming the insulating layer of the circuit board built in the part can be used.

第1及第2樹脂薄片10、20之硬化性樹脂組成物層12、22之熱硬化條件,雖因各硬化性樹脂組成物層所使用之硬化性樹脂組成物的組成等而有所不同,但硬化溫度可成為120℃~240℃的範圍(較佳為150℃~210℃的範圍,更佳為170℃~190℃的範圍),硬化時間可成為5分鐘~90分鐘的範圍(較佳為10分鐘~75分鐘,更佳為15分鐘~60分鐘)。 The thermosetting conditions of the curable resin composition layers 12 and 22 of the first and second resin sheets 10 and 20 are different depending on the composition of the curable resin composition used for each curable resin composition layer, and the like. However, the hardening temperature may be in the range of 120 ° C to 240 ° C (preferably in the range of 150 ° C to 210 ° C, more preferably in the range of 170 ° C to 190 ° C), and the hardening time may be in the range of 5 minutes to 90 minutes (preferably) It is 10 minutes to 75 minutes, more preferably 15 minutes to 60 minutes).

熱硬化之前,可將硬化性樹脂組成物層12及第2硬化性樹脂組成物層12、22在較硬化溫度更低之溫度進行預備加熱。例如,於熱硬化之前,可在50℃以上 未滿120℃(較佳為60℃以上110℃以下,更佳為70℃以上100℃以下)的溫度,將硬化性樹脂組成物層12、22預備加熱5分鐘以上(較佳為5分鐘~150分鐘,更佳為15分鐘~120分鐘)。進行預備加熱的情況下,該預備加熱亦包含在硬化步驟。 Before the thermosetting, the curable resin composition layer 12 and the second curable resin composition layers 12 and 22 may be preheated at a temperature lower than the curing temperature. For example, before thermal hardening, it can be above 50 °C The curable resin composition layers 12 and 22 are preheated for 5 minutes or longer (preferably 5 minutes) at a temperature of less than 120 ° C (preferably 60 ° C or more and 110 ° C or less, more preferably 70 ° C or more and 100 ° C or less). 150 minutes, more preferably 15 minutes to 120 minutes). In the case of preliminary heating, the preliminary heating is also included in the hardening step.

在硬化步驟之各硬化性樹脂組成物層的熱硬化較佳為在大氣壓下(常壓下)進行。 The thermal hardening of each of the curable resin composition layers in the hardening step is preferably carried out under atmospheric pressure (at normal pressure).

在適合之一實施形態,可於第2層合步驟與硬化步驟之間,實施將電路基板冷卻至常溫(室溫)之處理。 In a preferred embodiment, the circuit substrate can be cooled to room temperature (room temperature) between the second lamination step and the hardening step.

在本發明,使硬化性樹脂組成物層12及第2硬化性樹脂組成物層22硬化而成之絕緣層12”、22”從25℃至150℃之間的平均線熱膨脹率,從減低基板彎曲的觀點來看,較佳為17ppm/℃以下,更佳為15ppm/℃以下。 In the present invention, the insulating layer 12", 22" obtained by curing the curable resin composition layer 12 and the second curable resin composition layer 22 has an average linear thermal expansion coefficient from 25 ° C to 150 ° C, and the substrate is lowered. From the viewpoint of bending, it is preferably 17 ppm/° C. or less, more preferably 15 ppm/° C. or less.

以上,雖針對使用暫時配附之材料之實施形態進行詳細說明,但可取代暫時配附之材料,改使用樹脂薄片來製造零件內藏電路板。可取代暫時配附之材料改使用之樹脂薄片,可與上述之第2樹脂薄片同樣進行,可為本發明之樹脂薄片,亦可為其他樹脂薄片。取代暫時配附之材料改使用樹脂薄片的情況下,不需要暫時配附之材料之剝離步驟。 Although the embodiment using the temporarily attached material has been described in detail above, the resin-made sheet can be used instead of the temporarily-attached material to manufacture the component-embedded circuit board. The resin sheet which can be used instead of the temporarily attached material can be similar to the above-mentioned second resin sheet, and can be the resin sheet of the present invention or another resin sheet. In the case where the material to be temporarily attached is used instead of the resin sheet, the peeling step of the material to be temporarily attached is not required.

<其他步驟> <other steps>

製造零件內藏電路板時,可進一步包含進而鑽孔在絕 緣層之步驟(鑽孔步驟)、粗糙化處理絕緣層的表面之步驟(粗糙化步驟)、於經粗糙化之絕緣層表面形成導體層之步驟(導體層形成步驟)。此等之步驟可依照零件內藏電路板之製造所使用之本發明領域具有通常知識者所周知之各種方法實施。尚,將各樹脂薄片10、20之支持體11、21硬化步驟之後進行剝離的情況下,支持體11、21之剝離,可於硬化步驟與鑽孔步驟之間、鑽孔步驟與粗糙化步驟之間、或粗糙化步驟與導體層形成步驟之間實施。 When manufacturing a built-in circuit board for a part, it can be further included and then drilled a step of the edge layer (drilling step), a step of roughening the surface of the insulating layer (roughening step), a step of forming a conductor layer on the surface of the roughened insulating layer (conductor layer forming step). These steps can be carried out in accordance with various methods well known to those skilled in the art for the manufacture of the built-in circuit boards of the parts. When the support sheets 11 and 21 of the resin sheets 10 and 20 are peeled off after the hardening step, the peeling of the supports 11 and 21 can be performed between the hardening step and the drilling step, the drilling step and the roughening step. Interposed between, or between the roughening step and the conductor layer forming step.

鑽孔步驟係鑽孔於絕緣層12”、22”(硬化物)之步驟,藉此,可於絕緣層12”、22”形成通孔、貫穿孔等之孔。例如可使用鑽孔機、雷射(碳酸氣體雷射、YAG雷射等)、電漿等於絕緣層12”、22”形成孔。在零件內藏電路板,絕緣層12”、22”一般藉由通孔進行導通。 The drilling step is a step of drilling the insulating layers 12", 22" (hardened), whereby holes such as through holes, through holes, and the like can be formed in the insulating layers 12", 22". For example, a hole can be formed using a drill, a laser (carbon gas laser, a YAG laser, etc.), and a plasma equal to the insulating layers 12", 22". In the built-in circuit board of the part, the insulating layers 12", 22" are generally turned on by the through holes.

粗糙化步驟係粗糙化處理絕緣層12”、22”之步驟。粗糙化處理的順序、條件並未特別限定,可採用形成零件內藏電路板之絕緣層12”、22”時通常所使用之周知順序、條件。例如,絕緣層12”、22”之粗糙化處理可依藉由膨潤液之膨潤處理、藉由氧化劑之粗糙化處理、藉由中和液之中和處理此順序實施,可粗糙化處理絕緣層12”、22”。作為膨潤液雖並未特別限定,但可列舉鹼溶液、界面活性劑溶液等,較佳為鹼溶液,作為該鹼溶液,更佳為氫氧化鈉溶液、氫氧化鉀溶液。作為市售之膨潤液,例如可列舉Atotech Japan(股)製之Swelling Dip Securiganth P、Swelling Dip Securiganth SBU等。藉由膨潤液之膨潤 處理雖並未特別限定,但例如可藉由於30℃~90℃之膨潤液浸漬1分鐘~20分鐘絕緣層12”、22”來進行。從將絕緣層12”、22”之樹脂的膨潤抑制在適當之水準的觀點來看,較佳為於40℃~80℃之膨潤液浸漬絕緣層12”、22”5秒~15分鐘。作為氧化劑,雖並未特別限定,但例如可列舉於氫氧化鈉之水溶液溶解過錳酸鉀或過錳酸鈉之鹼性過錳酸溶液。藉由鹼性過錳酸溶液等氧化劑之粗糙化處理,較佳為於加熱至60℃~80℃之氧化劑溶液浸漬10分鐘~30分鐘第1及第2絕緣層來進行。又,在鹼性過錳酸溶液之過錳酸鹽的濃度較佳為5質量%~10質量%。作為市售之氧化劑,例如可列舉Atotech Japan(股)製之Concentrate Compact P」、Dozing Solusion Securiganth P等之鹼性過錳酸溶液。又,作為中和液,較佳為酸性之水溶液,作為市售品,例如可列舉Atotech Japan(股)製之Reduction solution Securiganth P。藉由中和液之處理,可藉由未進行藉由氧化劑溶液之粗糙化處理的處理面於30℃~80℃之中和液浸漬5分鐘~30分鐘來進行。從作業性等之點來看,較佳為將成為藉由氧化劑溶液之粗糙化處理的對象物於40℃~70℃之中和液浸漬5分鐘~20分鐘之方法。 The roughening step is a step of roughening the insulating layers 12", 22". The order and conditions of the roughening treatment are not particularly limited, and a well-known sequence and conditions which are generally used when forming the insulating layers 12" and 22" of the circuit board in the component can be employed. For example, the roughening treatment of the insulating layers 12", 22" can be performed by the swelling treatment of the swelling liquid, the roughening treatment by the oxidizing agent, and the neutralization treatment by the neutralization liquid, and the insulating layer can be roughened. 12", 22". The swelling solution is not particularly limited, and examples thereof include an alkali solution and a surfactant solution, and an alkali solution is preferred. The alkali solution is more preferably a sodium hydroxide solution or a potassium hydroxide solution. Examples of the commercially available swelling liquid include Swelling Dip Securiganth P, Swelling Dip Securiganth SBU, and the like manufactured by Atotech Japan Co., Ltd. Swelling by swelling liquid Although the treatment is not particularly limited, it can be carried out, for example, by immersing the insulating layer 12" and 22" for 1 minute to 20 minutes by a swelling liquid at 30 ° C to 90 ° C. From the viewpoint of suppressing the swelling of the resin of the insulating layers 12" and 22" at an appropriate level, it is preferable that the insulating layer 12" and 22" are immersed in the swelling liquid at 40 ° C to 80 ° C for 5 seconds to 15 minutes. The oxidizing agent is not particularly limited, and examples thereof include an alkaline permanganic acid solution in which potassium permanganate or sodium permanganate is dissolved in an aqueous solution of sodium hydroxide. The roughening treatment with an oxidizing agent such as an alkaline permanganic acid solution is preferably carried out by immersing the first and second insulating layers in an oxidizing agent solution heated to 60 to 80 ° C for 10 minutes to 30 minutes. Further, the concentration of the permanganate in the alkaline permanganic acid solution is preferably 5% by mass to 10% by mass. Examples of the commercially available oxidizing agent include an alkaline permanganic acid solution such as Concentrate Compact P manufactured by Atotech Japan Co., Ltd., and Dozing Solusion Securiganth P. In addition, as a neutralizing liquid, an acidic aqueous solution is preferable, and as a commercial item, the reduction solution Securiganth P by Atotech Japan Co., Ltd. is mentioned, for example. The treatment with the neutralizing solution can be carried out by immersing the surface of the treatment with the roughening treatment of the oxidizing agent solution at 30 ° C to 80 ° C for 5 minutes to 30 minutes. From the viewpoint of workability and the like, it is preferred that the object to be roughened by the oxidizing agent is immersed in a liquid at 40 ° C to 70 ° C for 5 minutes to 20 minutes.

導體層形成步驟係於經粗糙化之絕緣層表面形成導體層(電路配線)之步驟。 The conductor layer forming step is a step of forming a conductor layer (circuit wiring) on the surface of the roughened insulating layer.

導體層所使用之導體材料並未特別限定。於適合之實施形態,導體層係包含選自由金、鉑、鈀、銀、 銅、鋁、鈷、鉻、鋅、鎳、鈦、鎢、鐵、錫及銦所構成之群組中之1種以上的金屬。導體層可為單金屬層亦可為合金層,作為合金層,例如可列舉選自由上述之群組中之2種以上的金屬之合金(例如鎳.鉻合金、銅.鎳合金及銅.鈦合金)所形成之層。其中,從導體層形成之泛用性、成本、圖型化之容易性等之觀點來看,較佳為鉻、鎳、鈦、鋁、鋅、金、鈀、銀或銅之單金屬層、或鎳.鉻合金、銅.鎳合金、銅.鈦合金之合金層,更佳為鉻、鎳、鈦、鋁、鋅、金、鈀、銀或銅之單金屬層、或鎳.鉻合金之合金層,再更佳為銅之單金屬層。 The conductor material used for the conductor layer is not particularly limited. In a suitable embodiment, the conductor layer comprises a layer selected from the group consisting of gold, platinum, palladium, silver, One or more metals selected from the group consisting of copper, aluminum, cobalt, chromium, zinc, nickel, titanium, tungsten, iron, tin, and indium. The conductor layer may be a single metal layer or an alloy layer. Examples of the alloy layer include alloys of two or more metals selected from the group (for example, nickel, chromium alloy, copper, nickel alloy, copper, titanium). The layer formed by the alloy). Among them, a single metal layer of chromium, nickel, titanium, aluminum, zinc, gold, palladium, silver or copper is preferred from the viewpoints of versatility, cost, and ease of pattern formation of the conductor layer. Or nickel. Chrome alloy, copper. Nickel alloy, copper. The alloy layer of titanium alloy is more preferably a single metal layer of chromium, nickel, titanium, aluminum, zinc, gold, palladium, silver or copper, or nickel. The alloy layer of chrome alloy is more preferably a single metal layer of copper.

導體層可為單層構造,亦可為由不同種類之金屬或合金所成之單金屬層或層合2層以上合金層之複層構造。導體層為複層構造的情況下,與絕緣層接觸之層較佳為鉻、鋅或鈦之單金屬層、或鎳.鉻合金之合金層。 The conductor layer may have a single layer structure, or may be a single metal layer formed of different kinds of metals or alloys or a laminated structure of two or more alloy layers laminated. When the conductor layer is a multi-layer structure, the layer in contact with the insulating layer is preferably a single metal layer of chromium, zinc or titanium, or nickel. Alloy layer of chrome alloy.

導體層的厚度雖因所期望之零件內藏電路板的設計而異,但一般為3μm~35μm,較佳為5μm~30μm。 Although the thickness of the conductor layer varies depending on the desired design of the built-in circuit board, it is generally 3 μm to 35 μm, preferably 5 μm to 30 μm.

導體層之形成方法只要可形成具有所期望圖型之導體層(電路配線),則並未特別限定。在適合之一實施形態中,導體層可藉由鍍敷形成。例如,藉由半加成法、全加成法等之以往周知之技術鍍敷於第1及第2絕緣層之表面,可形成具有所期望圖型之導體層(電路配線)。以下,表示將導體層藉由半加成法形成之例。 The method of forming the conductor layer is not particularly limited as long as it can form a conductor layer (circuit wiring) having a desired pattern. In a suitable embodiment, the conductor layer can be formed by plating. For example, a conductor layer (circuit wiring) having a desired pattern can be formed by plating on the surfaces of the first and second insulating layers by a conventional technique such as a semi-additive method or a full-addition method. Hereinafter, an example in which the conductor layer is formed by a semi-additive method will be described.

首先,於2個絕緣層12”、22”的表面,藉由 無電解鍍敷形成鍍敷種晶層(seed layer)。其次,於所形成之鍍敷種晶層上,對應所期望之配線圖型,形成使鍍敷種晶層之一部分露出之遮罩圖型。於露出之鍍敷種晶層上,藉由電解鍍敷形成金屬層後,去除遮罩圖型。然後,將不要之鍍敷種晶層藉由蝕刻等去除,可形成具有所期望圖型之導體層。 First, on the surface of the two insulating layers 12", 22" Electroless plating forms a plating seed layer. Next, a mask pattern for exposing a portion of the plating seed layer to the desired wiring pattern is formed on the formed plating seed layer. After the metal layer is formed by electrolytic plating on the exposed plated seed layer, the mask pattern is removed. Then, the unnecessary seed plating layer is removed by etching or the like to form a conductor layer having a desired pattern.

藉由此等之步驟於通孔內亦形成導體(貫孔配線),電氣連接絕緣層12”及22”的表面所設置之電路配線3與電路基板之電路配線,而得到零件內藏電路板100(參照圖3G)。 By this step, a conductor (through-hole wiring) is also formed in the through hole, and the circuit wiring 3 provided on the surface of the insulating layers 12" and 22" and the circuit wiring of the circuit substrate are electrically connected to obtain a built-in circuit board of the component. 100 (refer to Fig. 3G).

作為第1支持體11及第2支持體21,使用銅箔等之金屬箔的情況下,可藉由利用此金屬箔之減去法等形成導體層。又,將金屬箔作為鍍敷種晶層,可藉由電解鍍敷形成導體層。 When a metal foil such as a copper foil is used as the first support 11 and the second support 21, the conductor layer can be formed by subtracting the metal foil or the like. Further, by using a metal foil as a plating seed layer, a conductor layer can be formed by electrolytic plating.

零件內藏電路板之製造方法,又,可包含將零件內藏電路板個片化之步驟。 The manufacturing method of the built-in circuit board of the part may further include the step of singulating the built-in circuit board of the part.

在個片化步驟,例如可藉由具備回轉刃之以往周知之切割裝置進行研削,將所得之構造體對各個零件內藏電路板單元進行個片化。 In the singulation step, for example, it can be ground by a conventionally known cutting device having a rotary blade, and the obtained structure is formed into individual pieces of the built-in circuit board unit.

[半導體裝置] [semiconductor device]

本發明之半導體裝置係具備本發明之配線板(例如上述零件內藏電路板)。 The semiconductor device of the present invention includes the wiring board of the present invention (for example, the component-embedded circuit board described above).

作為該半導體裝置,可列舉供於電氣製品(例 如電腦、手機、數位相機及電視等)及車輛(例如摩托車、汽車、電車、船舶及飛機等)等之各種半導體裝置。 As the semiconductor device, an electrical product can be cited (for example) Various semiconductor devices such as computers, mobile phones, digital cameras, and televisions, and vehicles (such as motorcycles, automobiles, trams, ships, and airplanes).

[實施例] [Examples]

以下,雖將本發明由實施例具體說明,但本發明並非被限定於此等之實施例。尚,在以下之記載,「份」及「%」除非另有規定分別意指「質量份」及「質量%」。 Hereinafter, the present invention will be specifically described by way of examples, but the present invention is not limited to the examples. In the following, "parts" and "%" mean "parts by mass" and "% by mass" unless otherwise specified.

<樹脂薄片的製作> <Production of Resin Sheet>

使用藉由以下之順序所調製之樹脂清漆(硬化性樹脂組成物),製作實施例及比較例之樹脂薄片。 The resin varnish of the examples and the comparative examples was produced using the resin varnish (curable resin composition) prepared by the following procedure.

(無機填充材的準備) (Preparation of inorganic filler)

作為二氧化矽1~6,單獨或組合(股)Admatechs製「ADMAFINE」、電氣化學工業(股)製「SFP系列」、新日鐵住金Materials(股)製「SP(H)系列」、堺化學工業(股)製「Sciqas系列」、(股)日本觸媒製「Sea Hoster系列」進行表面處理後,藉由以下之方法,測定粒度分布、比表面積,使用在實施例及比較例。 As the cerium oxide 1~6, "ADMAFINE" made by Admatechs, "SFP series" made by Electrochemical Industry Co., Ltd., "SP(H) series" made by Nippon Steel & Metals Materials Co., Ltd., 堺After the surface treatment of the "Sciqas series" manufactured by the Chemical Industry Co., Ltd. and the "Sea Hoster series" manufactured by Nippon Shokubai Co., Ltd., the particle size distribution and specific surface area were measured by the following methods, and used in Examples and Comparative Examples.

作為氧化鋁,使用新日鐵住金Materials(股)製「AZ系列」及「AX系列」進行表面處理後,藉由以下之方法,測定粒度分布、比表面積,使用在實施例4。 The aluminum oxide was subjected to surface treatment using "AZ series" and "AX series" manufactured by Nippon Steel & Co., Ltd., and the particle size distribution and specific surface area were measured by the following methods, and used in Example 4.

(1)平均粒徑的測定 (1) Determination of average particle size

將二氧化矽1~6之粉體100mg或氧化鋁紛體100mg、分散劑(San Nopco(股)製「SN9228」)0.1g、甲基乙基酮10g於容器瓶稱重,在超音波分散20分鐘。使用雷射繞射式粒度分布測定裝置((股)島津製作所製SALD-2200,以間歇式小槽(batch cell)方式測定粒度分布,算出平均粒徑並示於表2。 100 mg of powder of cerium oxide 1 to 6 or 100 mg of alumina, 0.1 g of a dispersing agent ("SN9228" manufactured by San Nopco Co., Ltd.), and 10 g of methyl ethyl ketone were weighed in a container bottle, and dispersed in ultrasonic waves. 20 minutes. The particle size distribution was measured by a batch type of SALD-2200 manufactured by Shimadzu Corporation using a laser diffraction type particle size distribution measuring apparatus (batch cell), and the average particle diameter was calculated and shown in Table 2.

(2)比表面積的測定 (2) Determination of specific surface area

將二氧化矽1~6及氧化鋁之比表面積使用BET全自動比表面積測定裝置((股)Mountech製Macsorb HM-1210)測定並示於表2。 The specific surface area of cerium oxide 1 to 6 and alumina was measured using a BET fully automatic specific surface area measuring apparatus (Macsorb HM-1210 manufactured by Mountech Co., Ltd.) and shown in Table 2.

(3)真密度的測定 (3) Determination of true density

將二氧化矽1~6及氧化鋁之真密度藉由微.超比重瓶(Kanta Chrome Instruments Japan(同)製MUPY-21T)測定並示於表2。 The true density of cerium oxide 1~6 and alumina is reduced by micro. A super pycnometer (MUPY-21T manufactured by Kanta Chrome Instruments Japan) was measured and shown in Table 2.

(樹脂清漆1的調製) (Modulation of Resin Varnish 1)

將雙酚型環氧樹脂(新日鐵住金化學(股)製「ZX1059」、環氧當量約169、雙酚A型與雙酚F型之1:1混合品)4份、萘醚型環氧樹脂(DIC(股)製「EXA-7311-G4」、環氧當量約213)10份、聯二甲酚型環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量約185)6份、 聯苯型環氧樹脂(日本化藥(股)製「NC3000L」、環氧當量約272)10份、及阻燃劑(大八化學工業(股)製「PX-200」)4份,邊於溶劑石腦油20份及環己酮10份的混合溶劑攪拌邊使其加熱溶解。冷卻至室溫後,對其混合含有三嗪骨架之甲酚酚醛清漆系硬化劑(DIC(股)製「LA-3018-50P」、羥基當量約151、固形分50%之2-甲氧基丙醇溶液)10份、含有三嗪骨架之酚酚醛清漆系硬化劑(DIC(股)製「LA-7054」、羥基當量約125、固形分60%之MEK溶液)4份、萘酚系硬化劑(新日鐵住金化學(股)製「SN-495V」、羥基當量約231、固形分60%之MEK溶液)10份、胺系硬化促進劑(4-二甲基胺基吡啶(DMAP)、固形分5質量%之MEK溶液)1份、胺基矽烷系偶合劑(以信越化學工業(股)製「KBM573」)表面處理之球狀二氧化矽1(平均粒徑1.47μm、比表面積3.07m2/g、每一單位表面積的碳量為0.30mg/m2)220份,以高速回轉攪拌機均勻分散後,再以筒式過濾器(ROKITECHNO公司製「SHP050」)過濾,調製樹脂清漆1。 A bisphenol type epoxy resin (ZX1059, manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., an epoxy equivalent of about 169, a 1:1 mixture of bisphenol A and bisphenol F), and a naphthalene ether ring. Oxygen resin ("EXA-7311-G4" manufactured by DIC Co., Ltd., epoxy equivalent: 213) 10 parts, bisphenol type epoxy resin ("XX4000HK" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent: 185) 6 parts, biphenyl type epoxy resin ("NC3000L" manufactured by Nippon Kayaku Co., Ltd., epoxy equivalent: 272), 10 parts, and flame retardant ("PX-200" manufactured by Daiwa Chemical Industry Co., Ltd.) 4 The mixture was heated and dissolved while stirring in a solvent mixture of 20 parts of solvent naphtha and 10 parts of cyclohexanone. After cooling to room temperature, a cresol novolak-based hardener containing a triazine skeleton ("LA-3018-50P" manufactured by DIC Co., Ltd., 2-hydroxyl group having a hydroxyl equivalent of about 151 and a solid content of 50%) was mixed. Propanol solution) 10 parts, phenol novolac-based curing agent containing triazine skeleton ("LA-7054" manufactured by DIC Co., Ltd., MEK solution having a hydroxyl equivalent of about 125 and a solid content of 60%) 4 parts, naphthol-based hardening 10 parts of "SN-495V" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., MEK solution with a hydroxyl equivalent of about 231 and a solid content of 60%), and an amine hardening accelerator (4-dimethylaminopyridine (DMAP)) 1 part, a solid quinone-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.), spherical cerium oxide 1 (average particle diameter 1.47 μm, specific surface area) 3.07 m 2 /g, the amount of carbon per unit surface area is 0.30 mg/m 2 ), 220 parts, and uniformly dispersed by a high-speed rotary mixer, and then filtered with a cartridge filter ("SHP050" manufactured by ROKITECHNO Co., Ltd.) to prepare a resin varnish. 1.

(樹脂清漆2的調製) (modulation of resin varnish 2)

將縮水甘油胺型液狀環氧樹脂(三菱化學(股)製「630LSD」、環氧當量約95)6份、聯二甲酚型環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量約185)6份、雙酚AF型環氧樹脂(三菱化學(股)製「YL7760」、環氧當量約238)6份、萘型環氧樹脂(新日鐵住金化學(股)製 「ESN475V」、環氧當量約330)15份、及苯氧基樹脂(三菱化學(股)製「YX7553BH30」、固形分30質量%之環己酮:甲基乙基酮(MEK)之1:1溶液)8份,邊於溶劑石腦油20份及環己酮5份的混合溶劑攪拌邊使其加熱溶解。冷卻至室溫後,對其混合含有三嗪骨架之甲酚酚醛清漆系硬化劑(DIC(股)製「LA-3018-50P」、羥基當量約151、固形分50%之2-甲氧基丙醇溶液)12份、活性酯系硬化劑(DIC(股)製「EXB-8000L-65M」、活性基當量約220、不揮發成分65質量%之MEK溶液)12份、胺系硬化促進劑(4-二甲基胺基吡啶(DMAP)、固形分5質量%之MEK溶液)1份、阻燃劑(三光(股)製「HCA-HQ」、10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲(Phosphaphenanthrene)-10-氧化物、平均粒徑2μm)2份、橡膠粒子(陶氏化學日本(股)製、EXL2655)2份、苯基三甲氧基矽烷(以信越化學工業(股)製「KBM103」)表面處理之球狀二氧化矽2(平均粒徑1.33μm、比表面積3.38m2/g、每一單位表面積的碳量0.28mg/m2)190份,以高速回轉攪拌機均勻分散,再以筒式過濾器(ROKITECHNO公司製「SHP050」)過濾,調製樹脂清漆2。 Glycidylamine type liquid epoxy resin ("630LSD" manufactured by Mitsubishi Chemical Co., Ltd., epoxy equivalent: 95), 6 parts, and bisphenol type epoxy resin ("XX4000HK" manufactured by Mitsubishi Chemical Corporation) Oxygen equivalent: 185) 6 parts, bisphenol AF type epoxy resin (Mitsubishi Chemical Co., Ltd. "YL7760", epoxy equivalent of about 238) 6 parts, naphthalene type epoxy resin (Nippon Steel & Sumitomo Chemical Co., Ltd. "ESN475V", epoxy equivalent of about 330 parts, 15 parts, and phenoxy resin ("XX7553BH30" manufactured by Mitsubishi Chemical Corporation, 30% by mass of cyclohexanone: methyl ethyl ketone (MEK) 1: (1 solution) 8 parts, and dissolved by heating while stirring a solvent mixture of 20 parts of solvent naphtha and 5 parts of cyclohexanone. After cooling to room temperature, a cresol novolak-based hardener containing a triazine skeleton ("LA-3018-50P" manufactured by DIC Co., Ltd., 2-hydroxyl group having a hydroxyl equivalent of about 151 and a solid content of 50%) was mixed. 12 parts of propanol solution, active ester-based curing agent ("EXB-8000L-65M" manufactured by DIC Co., Ltd., MEK solution having an active base equivalent of about 220 and a nonvolatile content of 65 mass%) 12 parts, an amine-based hardening accelerator (4-dimethylaminopyridine (DMAP), solid content of 5% by mass of MEK solution) 1 part, flame retardant (Sanko (HQ-HQ), 10-(2,5-dihydroxybenzene) Base) 10-hydrogen-9-oxa-10-phosphonium phenanthrene (Phosphaphenanthrene-10-oxide, average particle size 2 μm) 2 parts, rubber particles (Dow Chemical Co., Ltd., EXL 2655) 2 parts Phenyltrimethoxydecane ("KBM103" manufactured by Shin-Etsu Chemical Co., Ltd.)) spherical cerium oxide 2 (average particle diameter 1.33 μm, specific surface area 3.38 m 2 /g, carbon per unit surface area) 190 parts of the amount of 0.28 mg/m 2 ) was uniformly dispersed in a high-speed rotary mixer, and then filtered through a cartridge filter ("SHP050" manufactured by ROKITECHNO Co., Ltd.) to prepare a resin varnish 2.

(樹脂清漆3的調製) (Modulation of Resin Varnish 3)

將雙酚型液狀環氧樹脂(新日鐵住金化學(股)製「ZX1059」、環氧當量約169、雙酚A型與雙酚F型之1:1混合品)8份、萘型液狀環氧樹脂(DIC(股)製 「HP4032SS」、環氧當量約144)4份、萘型環氧樹脂(DIC(股)製「HP-4710」、環氧當量約170)3份、聯苯型環氧樹脂(日本化藥(股)製「NC3000L」、環氧當量約272)12份、及苯氧基樹脂(三菱化學(股)製「YX7553BH30」、固形分30質量%之環己酮:甲基乙基酮(MEK)之1:1溶液)5份,邊於溶劑石腦油20份及環己酮5份之混合溶液攪拌邊使其加熱溶解。冷卻至室溫後,對其混合含有三嗪骨架之酚酚醛清漆系硬化劑(DIC(股)製「LA-7054」、羥基當量約125、固形分60%之MEK溶液)8份、萘酚系硬化劑(新日鐵住金化學(股)製「SN-485」、羥基當量約212、固形分60%之MEK溶液)12份、咪唑系硬化促進劑(四國化成工業(股)製「1B2PZ」1-苄基-2-苯基咪唑、固形分5%之MEK溶液)1份、阻燃劑(三光(股)製「HCA-HQ」、10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲-10-氧化物、平均粒徑2μm)4份、胺基矽烷系偶合劑(以信越化學工業(股)製「KBM573」)表面處理之球狀二氧化矽3(平均粒徑1.06μm、比表面積3.01m2/g、每一單位表面積的碳量0.31mg/m2)140份,以高速回轉攪拌機均勻分散後,再以筒式過濾器(ROKITECHNO公司製「SHP050」)過濾,調製樹脂清漆3。 A bisphenol type liquid epoxy resin (ZX1059, manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., an epoxy equivalent of about 169, a 1:1 mixture of bisphenol A and bisphenol F), and a naphthalene type. 4 parts of liquid epoxy resin ("HP4032SS" manufactured by DIC Co., Ltd., epoxy equivalent: 144), and 3 parts of naphthalene type epoxy resin ("HP-4710" manufactured by DIC Co., Ltd., epoxy equivalent: about 170). Biphenyl type epoxy resin ("NC3000L" manufactured by Nippon Kayaku Co., Ltd., epoxy equivalent: 272) 12 parts, and phenoxy resin ("XX7553BH30" manufactured by Mitsubishi Chemical Corporation, 30% by mass of solid content) Hexanone: a 1:1 solution of methyl ethyl ketone (MEK), 5 parts, and dissolved by heating while stirring a mixture of 20 parts of solvent naphtha and 5 parts of cyclohexanone. After cooling to room temperature, a phenol novolak-based curing agent containing a triazine skeleton ("LA-7054" manufactured by DIC Co., Ltd., a MEK solution having a hydroxyl equivalent of about 125 and a solid content of 60%) was mixed with 8 parts of naphthol. A sclerosing agent ("SN-485" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., a MEK solution with a hydroxyl equivalent of about 212 and a solid content of 60%), 12 parts, and an imidazole-based hardening accelerator (manufactured by Shikoku Chemicals Co., Ltd.) 1B2PZ"1-benzyl-2-phenylimidazole, 5% MEK solution in solid form) 1 part, flame retardant ("HCA-HQ", 10-(2,5-dihydroxyphenyl) manufactured by Sanguang Co., Ltd. )-10-hydrogen-9-oxa-10-phosphaphenanthrene-10-oxide, average particle size 2 μm) 4 parts, amine decane coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) 140 parts of spherical cerium oxide 3 (having an average particle diameter of 1.06 μm, a specific surface area of 3.01 m 2 /g, and a carbon content per unit surface area of 0.31 mg/m 2 ), and uniformly dispersed in a high-speed rotary mixer, followed by a tube A filter ("SHP050" manufactured by ROKITECHNO Co., Ltd.) was filtered to prepare a resin varnish 3.

(樹脂清漆4的調製) (Modulation of Resin Varnish 4)

將如下述般調製之(d)成分50份、雙酚型環氧樹脂(新 日鐵化學(股)製「ZX1059」、雙酚A型與雙酚F型之1:1混合品、環氧當量169)3份、雙酚AF型環氧樹脂(三菱化學(股)製「YL7760」、環氧當量約238)2份、及阻燃劑(三光(股)製「HCA-HQ」、10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲-10-氧化物、平均粒徑2μm)2份,邊於溶劑石腦油15份及環己酮5份之混合溶劑邊攪拌邊使其加熱溶解。對其混合活性酯系硬化劑(DIC(股)製「EXB-8000L-65M」、活性基當量約220、不揮發成分65質量%之MEK溶液)2份、咪唑系硬化促進劑(四國化成工業(股)製「1B2PZ」1-苄基-2-苯基咪唑、固形分5%之MEK溶液)1份、及苯基胺基矽烷系偶合劑(以信越化學工業(股)製、「KBM573」)表面處理之球形氧化鋁(平均粒徑1.52μm、比表面積1.70m2/g、每一單位表面積的碳量0.11mg/m2)190份,以高速回轉攪拌機均勻分散,再以筒式過濾器(ROKITECHNO公司製「SHP050」)過濾,製作樹脂清漆4。 50 parts of component (d) prepared as follows, bisphenol epoxy resin (ZX1059 manufactured by Nippon Steel Chemical Co., Ltd.), 1:1 mixture of bisphenol A and bisphenol F, epoxy Equivalent 169) 3 parts, bisphenol AF type epoxy resin ("YL7760" manufactured by Mitsubishi Chemical Corporation, epoxide equivalent: 238) 2 parts, and flame retardant ("H-HQ-HQ", 10" -(2,5-dihydroxyphenyl)-10-hydro-9-oxa-10-phosphaphenanthrene-10-oxide, average particle size 2 μm) 2 parts, 15 parts of solvent naphtha and ring A mixed solvent of 5 parts of ketone was dissolved by heating while stirring. 2 parts of an active ester-based curing agent ("EXB-8000L-65M" manufactured by DIC Co., Ltd., a MEK solution having an active base equivalent of about 220 and a nonvolatile content of 65 mass%), and an imidazole-based hardening accelerator (Four Nations) Industrial (stock) "1B2PZ" 1-benzyl-2-phenylimidazole, solid solution 5% MEK solution) 1 part, and phenylamino decane coupling agent (made by Shin-Etsu Chemical Co., Ltd., " spherical alumina KBM573 ") surface treatment (average particle diameter 1.52 m, specific surface area 1.70m 2 / g, carbon content per unit surface area of 0.11mg / m 2) 190 parts of a high speed rotary stirrer uniformly dispersed, and then to tube A filter ("SHP050" manufactured by ROKITECHNO Co., Ltd.) was filtered to prepare a resin varnish 4.

[(d)成分之製造] [Manufacture of component (d)]

於反應容器混合G-3000(2官能性羥基末端聚丁二烯、數平均分子量=5047(GPC法)、羥基當量=1798g/eq.、固形分100質量%、日本曹達(股)製)50g、與Ipsol150(芳香族烴系混合溶劑:出光石油化學(股)製)23.5g、月桂酸二丁錫0.005g使其均勻溶解。成為均勻時昇溫至50℃,進而邊攪拌邊添加甲苯-2,4-二異氰酸酯(異氰酸酯基當量 =87.08g/eq.)4.8g,進行約3小時反應。其次,將此反應物冷卻至室溫後,於此添加二苯甲酮四羧酸二酐(酸酐當量=161.1g/eq.)8.96g、與三乙烯二胺0.07g、與乙基二甘醇乙酸酯((股)Daicel製)40.4g,邊攪拌邊昇溫至130℃,進行約4小時反應。由FT-IR進行2250cm-1之NCO峰值消失的確認。具有NCO峰值消失的確認視為反應的終點,將反應物降溫至室溫後,以100篩目之濾布過濾,而得到具有醯亞胺骨架、胺基甲酸乙酯骨架、丁二烯骨架之高分子樹脂A。 Mixing G-3000 (bifunctional hydroxyl terminated polybutadiene, number average molecular weight = 5047 (GPC method), hydroxyl equivalent = 1798 g/eq., solid content 100% by mass, manufactured by Nippon Soda Co., Ltd.) 50 g in a reaction vessel 23.5 g of Ipsol 150 (aromatic hydrocarbon-based mixed solvent: manufactured by Idemitsu Petrochemical Co., Ltd.) and 0.005 g of dibutyltin laurate were uniformly dissolved. When the temperature was uniform, the temperature was raised to 50 ° C, and 4.8 g of toluene-2,4-diisocyanate (isocyanate group equivalent = 87.08 g/eq.) was added while stirring, and the reaction was carried out for about 3 hours. Next, after cooling the reaction mixture to room temperature, benzophenonetetracarboxylic dianhydride (anhydride equivalent = 161.1 g/eq.) of 8.96 g, triethylenediamine 0.07 g, and ethyl diangan were added thereto. 40.4 g of an alcohol acetate (manufactured by Daicel) was heated to 130 ° C while stirring, and the reaction was carried out for about 4 hours. Confirmation of disappearance of the NCO peak at 2250 cm -1 was performed by FT-IR. The confirmation that the NCO peak disappeared was regarded as the end point of the reaction, and after the reaction product was cooled to room temperature, it was filtered through a 100-mesh filter cloth to obtain a quinone imine skeleton, a urethane skeleton, and a butadiene skeleton. Polymer resin A.

黏度:7.5Pa.s(25℃、E型黏度計) Viscosity: 7.5Pa. s (25 ° C, E-type viscometer)

酸價:16.9mgKOH/g Acid value: 16.9 mgKOH/g

固形分:50質量% Solid content: 50% by mass

數平均分子量:13723 Number average molecular weight: 13723

玻璃轉移溫度:-10℃ Glass transfer temperature: -10 ° C

聚丁二烯構造部分之含有率:50/(50+4.8+8.96)×100=78.4質量% The content of the polybutadiene structural part: 50 / (50 + 4.8 + 8.96) × 100 = 78.4% by mass

(樹脂清漆5之調製) (Modulation of Resin Varnish 5)

除了取代樹脂清漆1之二氧化矽1、220份,改使用二氧化矽4(平均粒徑1.73μm、比表面積2.71m2/g、每一單位表面積的碳量0.26mg/m2)220份,作為筒式過濾器(ROKITECHNO公司製「SHP100」之外,其他與樹脂清漆1同樣進行,來調製樹脂清漆5。 In addition to replacing the cerium oxide 1 , 220 parts of the resin varnish 1, 220 parts of cerium oxide 4 (average particle diameter of 1.73 μm, specific surface area of 2.71 m 2 /g, and carbon content per unit surface area of 0.26 mg/m 2 ) were used. The resin varnish 5 was prepared in the same manner as the resin varnish 1 except for the cartridge filter ("SHP100" manufactured by ROKITECHNO Co., Ltd.).

(樹脂清漆6的調製) (modulation of resin varnish 6)

除了取代樹脂清漆2之二氧化矽2、190份,改使用二氧化矽5(平均粒徑1.11μm、比表面積2.66m2/g、每一單位表面積的碳量0.22mg/m2)190份之外,其他與樹脂清漆2同樣進行,來調製樹脂清漆6。 In addition to replacing 2,190 parts of cerium oxide 2 of resin varnish 2, 190 parts of cerium oxide 5 (average particle diameter 1.11 μm, specific surface area 2.66 m 2 /g, carbon amount per unit surface area 0.22 mg/m 2 ) were used instead. Other than the resin varnish 2, the resin varnish 6 was prepared.

(樹脂清漆7的調製) (Modulation of Resin Varnish 7)

除了取代樹脂清漆3之二氧化矽3、140份,改使用二氧化矽6(平均粒徑0.77μm、比表面積5.76m2/g、每一單位表面積的碳量0.35mg/m2)120份之外,其他與樹脂清漆3同樣進行,來調製樹脂清漆7。 In addition to replacing 3,140 parts of cerium oxide of resin varnish 3, cerium oxide 6 (average particle diameter 0.77 μm, specific surface area 5.76 m 2 /g, carbon content per unit surface area 0.35 mg/m 2 ) was used instead of 120 parts. Other than the resin varnish 3, the resin varnish 7 was prepared.

(樹脂清漆8的調製) (modulation of resin varnish 8)

將萘型環氧樹脂(新日鐵住金化學(股)製「ESN475V」、環氧當量約330)10份、萘型環氧樹脂(DIC(股)製「HP-4710」、環氧當量約170)5份、聯苯型環氧樹脂(日本化藥(股)製「NC3000L」、環氧當量約272)12份、及苯氧基樹脂(三菱化學(股)製「YX7553BH30」、固形分30質量%之環己酮:甲基乙基酮(MEK)之1:1溶液)5份邊於溶劑石腦油20份及環己酮10份的混合溶劑攪拌邊使其加熱溶解。冷卻至室溫後,對其混合含有三嗪骨架之酚酚醛清漆系硬化劑(DIC(股)製「LA-7054」、羥基當量約125、固形分60重量%之MEK溶液)8份、萘酚系硬化劑(新日鐵住金化學(股)製「SN- 485」、羥基當量約212、固形分60%之MEK溶液)12份、咪唑系硬化促進劑(四國化成工業(股)製「1B2PZ」1-苄基-2-苯基咪唑、固形分5%之MEK溶液)1份、阻燃劑(三光(股)製「HCA-HQ」、10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲-10-氧化物、平均粒徑2μm)4份、胺基矽烷系偶合劑(以信越化學工業(股)製「KBM573」)表面處理之球狀二氧化矽3(平均粒徑1.06μm、比表面積3.01m2/g、每一單位表面積的碳量0.31mg/m2)140份,以高速回轉攪拌機均勻分散,以筒式過濾器(ROKITECHNO公司製「SHP050」)過濾,製作樹脂清漆8。 A naphthalene type epoxy resin ("ESN475V" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., an epoxy equivalent of about 330) of 10 parts, a naphthalene type epoxy resin ("HP-4710" manufactured by DIC), and an epoxy equivalent. 170) 5 parts, biphenyl type epoxy resin ("NC3000L" manufactured by Nippon Kayaku Co., Ltd., epoxy equivalent: 272) 12 parts, and phenoxy resin ("XX7553BH30" manufactured by Mitsubishi Chemical Corporation), solid content 30% by mass of cyclohexanone: a 1:1 solution of methyl ethyl ketone (MEK)) 5 parts of a mixed solvent of 20 parts of solvent naphtha and 10 parts of cyclohexanone were heated and dissolved while stirring. After cooling to room temperature, a phenol novolak-based curing agent containing a triazine skeleton ("LA-7054" manufactured by DIC Co., Ltd., a MEK solution having a hydroxyl equivalent of about 125 and a solid content of 60% by weight) was mixed with 8 parts of naphthalene. Phenolic curing agent ("SN-485" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., MEK solution with a hydroxyl equivalent of about 212 and a solid content of 60%) 12 parts, and an imidazole-based hardening accelerator (Shikoku Chemical Industry Co., Ltd.) "1B2PZ" 1-benzyl-2-phenylimidazole, solid solution 5% MEK solution) 1 part, flame retardant (Sanguang (share) "HCA-HQ", 10-(2,5-dihydroxybenzene Base) 10-hydrogen-9-oxa-10-phosphaphenanthrene-10-oxide, average particle size 2 μm) 4 parts, amino decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) Surface-treated spherical cerium oxide 3 (average particle diameter 1.06 μm, specific surface area 3.01 m 2 /g, carbon content per unit surface area 0.31 mg/m 2 ) 140 parts, uniformly dispersed in a high-speed rotary mixer, in a barrel type A filter ("SHP050" manufactured by ROKITECHNO Co., Ltd.) was filtered to prepare a resin varnish 8.

將各樹脂清漆的製作所使用之材料與其摻合量(不揮發分之質量份)示於表1。針對(a1)液狀環氧樹脂與(c)無機填充材,不揮發成分中之含量(質量%)亦一併示於表1。 The materials used for the production of each resin varnish and the blending amount thereof (parts by mass of nonvolatile matter) are shown in Table 1. With respect to (a1) liquid epoxy resin and (c) inorganic filler, the content (% by mass) of the nonvolatile matter is also shown in Table 1.

[表1] [Table 1]

(實施例1~4及比較例1~4:樹脂薄片之製作) (Examples 1 to 4 and Comparative Examples 1 to 4: Production of Resin Sheet)

作為支持體,準備以醇酸樹脂系脫模劑(Lintec(股)製「AL-5」)脫模處理之PET薄膜(東麗(股)製「LumilarT6AM」、厚度38μm、軟化點130℃、「脫模 PET」)。 A PET film (Lumilar T6AM, manufactured by Toray Industries, Ltd.) having a thickness of 38 μm and a softening point of 130 ° C, which was released from an alcohol resin-based release agent ("AL-5" manufactured by Lintec Co., Ltd.), was prepared as a support. Demoulding PET").

將各樹脂清漆於脫模PET上,以乾燥後之硬化性樹脂組成物層的厚度成為25μm的方式在模塗佈機均勻塗佈,藉由從80℃至110℃乾燥4分鐘,而於脫模PET上得到硬化性樹脂組成物層。其次,於未與硬化性樹脂組成物層之支持體接合的面,作為保護薄膜,將聚丙烯薄膜(Prince Ftex(股)製「Alfan MA-430」、厚度20μm)以與硬化性樹脂組成物層接合的方式進行層合。藉此,得到依支持體、硬化性樹脂組成物層、及保護薄膜順序所構成之樹脂薄片。 Each of the resin varnishes was varnished on the release PET, and uniformly coated in a die coater so that the thickness of the cured curable resin composition layer was 25 μm, and dried by drying at 80 ° C to 110 ° C for 4 minutes. A layer of a curable resin composition was obtained on the mold PET. Next, a polypropylene film ("Alfan MA-430" manufactured by Prince Ftex, thickness: 20 μm) and a curable resin composition were used as a protective film on the surface which was not bonded to the support of the curable resin composition layer. Lamination is carried out in the form of layer bonding. Thereby, a resin sheet composed of a support, a curable resin composition layer, and a protective film in this order is obtained.

(硬化性樹脂組成物層之最低熔融黏度的測定) (Measurement of the lowest melt viscosity of the curable resin composition layer)

(1)最低熔融黏度的測定 (1) Determination of the lowest melt viscosity

藉由僅從脫模PET剝離硬化性樹脂組成物層,以模具進行壓縮,來製作測定用顆粒(直徑18mm、1.2g~1.3g)。 The particles for measurement (diameter: 18 mm, 1.2 g to 1.3 g) were produced by peeling only the curable resin composition layer from the release PET and compressing it with a mold.

使用測定用顆粒,使用動態黏彈性測定裝置((股)UBM製「Rheosol-G3000」),針對試料樹脂組成物1g,使用直徑18mm之平行板,在昇溫速度5℃/分鐘從開始溫度60℃昇溫至200℃,在測定溫度間隔2.5℃、振動數1Hz、扭曲1deg的測定條件測定動態黏彈性率,算出最低熔融黏度(poise),示於表2。 Using a pellet for measurement, a dynamic viscoelasticity measuring apparatus ("Rheosol-G3000" manufactured by UBM) was used, and a parallel plate having a diameter of 18 mm was used for 1 g of the sample resin composition, and the temperature was raised at a temperature of 5 ° C / min from the starting temperature of 60 ° C. The temperature was raised to 200 ° C, and the dynamic viscoelasticity was measured under the measurement conditions of a measurement temperature interval of 2.5 ° C, a vibration number of 1 Hz, and a twist of 1 deg, and the lowest melt viscosity was calculated, which is shown in Table 2.

(硬化性樹脂組成物層之硬化物(絕緣層)之平均線熱膨 脹率的測定) (The average line thermal expansion of the cured product (insulating layer) of the curable resin composition layer Determination of the expansion ratio)

以脫模PET薄膜(Lintec(股)製「501010」、厚度38μm、240mm平方)的未處理面與玻璃布基材環氧樹脂兩面覆銅層合板(松下電工(股)製「R5715ES」、厚度0.7mm、255mm平方)接觸的方式,設置在玻璃布基材環氧樹脂兩面覆銅層合板上,將該脫模PET薄膜的四邊以聚醯亞胺接著膠帶(寬10mm)固定。 A copper-clad laminate (R5715ES, manufactured by Matsushita Electric Works Co., Ltd.) and a thickness of an untreated surface of a release film of a PET film ("501010", a thickness of 38 μm, and a width of 240 mm) and a glass cloth base material epoxy resin. The contact pattern of 0.7 mm, 255 mm square) was set on the copper-clad laminate of the glass cloth substrate epoxy resin, and the four sides of the release PET film were fixed with polyimide and tape (width: 10 mm).

將於實施例及比較例製作之各接著薄膜(200mm平方)使用分批式真空加壓貼合機((股)Nichigo-Morton製2階段積聚層合機CVP700),以硬化性樹脂組成物層與脫模PET薄膜的脫模面接觸的方式,層合處理於中央。層合處理係減壓30秒將氣壓降為13hPa以下後,藉由在100℃、壓力0.74MPa進行30秒壓著來實施。 Each of the adhesive films (200 mm square) prepared in the examples and the comparative examples was a batch type vacuum press laminator (manufactured by Nichigo-Morton, a two-stage accumulation laminator CVP700) to form a curable resin composition layer. The lamination treatment is carried out at the center in such a manner as to be in contact with the release surface of the release PET film. In the lamination treatment, the pressure was reduced to 13 hPa or less after depressurizing for 30 seconds, and then it was carried out by pressing at 100 ° C and a pressure of 0.74 MPa for 30 seconds.

其次,以100℃之溫度條件,投入100℃之烤箱後30分鐘,其次以175℃之溫度條件,轉移到175℃之烤箱後30分鐘,使其熱硬化。然後,將基板於室溫環境下取出,從樹脂薄片剝離脫模PET(支持體)後,進而以投入190℃之烤箱後90分鐘的硬化條件使硬化性樹脂組成物層熱硬化。 Next, it was placed in an oven at 100 ° C for 30 minutes at a temperature of 100 ° C, and then transferred to an oven at 175 ° C for 30 minutes at a temperature of 175 ° C to thermally harden it. Then, the substrate was taken out at room temperature, and the release PET (support) was peeled off from the resin sheet, and then the curable resin composition layer was thermally cured by a curing condition of 90 minutes after the 190 ° C oven was placed.

熱硬化後,剝離聚醯亞胺接著膠帶,將硬化性樹脂組成物層從玻璃布基材環氧樹脂兩面覆銅層合板取出。進而剝離層合硬化性樹脂組成物層之脫模PET薄膜(Lintec(股)製「501010」),而得到薄片狀的硬化物。將所 得之硬化物切成寬5mm、長度15mm之試驗片,使用熱機械分析裝置((股)理學製「Thermo Plus TMA8310」),在拉伸加重法進行熱機械分析。詳細而言係將試驗片安裝在前述熱機械分析裝置後,在荷重1g、昇溫速度5℃/分鐘的測定條件連續測定2次。而且在第2次的測定,算出在從30℃至150℃的範圍之平面方向的平均線熱膨脹率(ppm/℃)並示於表2。 After the heat curing, the polyimide and the tape were peeled off, and the curable resin composition layer was taken out from the glass cloth substrate epoxy double-sided copper-clad laminate. Further, a release PET film ("501010" manufactured by Lintec Co., Ltd.) of the laminate-hardenable resin composition layer was peeled off to obtain a flaky cured product. Will The obtained cured product was cut into a test piece having a width of 5 mm and a length of 15 mm, and subjected to thermomechanical analysis by a tensile weighting method using a thermomechanical analyzer ("Thermo Plus TMA8310"). Specifically, after the test piece was attached to the above-described thermomechanical analysis device, the test piece was continuously measured twice under the measurement conditions of a load of 1 g and a temperature increase rate of 5 ° C /min. Further, in the second measurement, the average linear thermal expansion coefficient (ppm/° C.) in the plane direction from 30 ° C to 150 ° C was calculated and shown in Table 2.

<評估試驗> <evaluation test>

1.零件嵌入性之評估 1. Evaluation of part embedding

使用於實施例及比較例製作之樹脂薄片,沿著以下之順序,製作暫時配附零件之電路基板評估零件嵌入性。 Using the resin sheets produced in the examples and the comparative examples, the circuit board of the temporarily attached parts was produced in the following order to evaluate the component embedding property.

(1)暫時配附零件之電路基板(孔洞基板)之準備 (1) Preparation of circuit board (hole substrate) for temporarily attaching parts

於玻璃布基材BT樹脂兩面銅包層層合板(銅箔之厚度18μm、基板厚度0.15mm、三菱瓦斯化學(股)製「HL832NSF LCA」)255*340mm尺寸的全面,將0.7mm×1.1mm之孔洞及導體圖型以附件的設計形成。其次,將兩面在微蝕刻劑(MEC(股)製「CZ8100」)進行1μm蝕刻,進行銅表面的粗糙化處理,進而實施防鏽處理(MEC(股)製「CL8300」),於180℃乾燥30分鐘。 On the glass cloth substrate BT resin double-sided copper clad laminate (copper foil thickness 18μm, substrate thickness 0.15mm, Mitsubishi Gas Chemical Co., Ltd. "HL832NSF LCA") 255*340mm size, 0.7mm × 1.1mm The holes and conductor patterns are formed by the design of the attachment. Then, the surface of the microetching agent ("CZ8100" manufactured by MEC Co., Ltd.) was etched at 1 μm to roughen the copper surface, and further rust-proof treatment ("CL8300" manufactured by MEC Co., Ltd.) was carried out, and dried at 180 ° C. 30 minutes.

(2)暫時配附零件之電路基板的製作 (2) Production of circuit board with temporary attached parts

於(1)所得之基板的單面,將25μm厚之附黏著劑的聚 醯亞胺薄膜(聚醯亞胺38μm厚、(股)有澤製作所製、「PFDKE-1525TT」)使用批次式真空加壓層合機((股)Nichigo-Morton製2階段積聚層合機「CVP700」),以黏著劑與基板接合的方式配置,層合在單面。層合係進行30秒減壓將氣壓降為13hPa以下後,藉由在80℃、壓力0.74MPa使其壓著30秒來實施。其次,將層合陶瓷電容器零件(1005=1*0.5mm尺寸、厚度0.14mm)一個一個暫時配附在孔洞內,製作暫時配附零件之電路基板(孔洞基板)。 On the single side of the substrate obtained in (1), a 25 μm thick adhesive is deposited. A bismuth imide film (polyimide 38 μm thick, manufactured by Azawa Seisakusho Co., Ltd., "PFDKE-1525TT") using a batch type vacuum pressure laminator (a 2-phase accumulation laminator made by Nichigo-Morton) The CVP700") is disposed such that the adhesive is bonded to the substrate and laminated on one side. The laminating system was subjected to a pressure reduction of 30 seconds to reduce the gas pressure to 13 hPa or less, and then it was pressed at 80 ° C and a pressure of 0.74 MPa for 30 seconds. Next, laminated ceramic capacitor parts (1005=1*0.5 mm size, thickness 0.14 mm) were temporarily attached to the holes one by one, and a circuit board (hole substrate) for temporarily attaching the parts was produced.

(3)零件嵌入性之評估試驗 (3) Evaluation test of part embedding

使用批次式真空加壓層合機((股)Nichigo-Morton製2階段積聚層合機「CVP700」),以接合從於實施例及比較例製作之樹脂薄片剝離保護薄膜而露出之硬化性樹脂組成物層、與和於(2)製作之暫時配附零件之電路基板(孔洞基板)之附黏著劑之聚醯亞胺薄膜配置面相反側的面的方式層合。層合係進行30秒減壓將氣壓降為13hPa以下後,藉由在120℃、壓力0.74MPa使其壓著30秒來實施。其次,將經層合之樹脂薄片在大氣壓下、120℃、壓力0.5MPa進行60秒熱沖壓而平滑化。藉由從冷卻至室溫之暫時配附零件之電路基板剝離附黏著劑之聚醯亞胺薄膜,來製作評估用基板A。從剝離評估用基板A之聚醯亞胺薄膜的面,將孔洞內之樹脂流動以光學顯微鏡(150倍)觀察(10個孔洞),藉由下述基準評估零件嵌入性,將結果示於 表2。 The batch type vacuum pressure laminator ("CVP700" manufactured by Nichigo-Morton Co., Ltd.) was used to bond the cured film exposed from the resin sheets produced in the examples and the comparative examples to reveal the curability. The resin composition layer is laminated so as to face the surface of the circuit board (hole substrate) of the temporarily attached component produced in (2) on the side opposite to the surface on which the polyimide film is disposed. The laminating system was subjected to a pressure reduction of 30 seconds to reduce the gas pressure to 13 hPa or less, and then pressed at 120 ° C under a pressure of 0.74 MPa for 30 seconds. Next, the laminated resin sheet was subjected to hot stamping under normal pressure at 120 ° C and a pressure of 0.5 MPa for 60 seconds to be smoothed. The evaluation substrate A was produced by peeling off the adhesive polyimide-based polyimide film from the circuit board on which the components were temporarily cooled to room temperature. The surface of the polyimine film of the substrate A for evaluation was peeled off, and the resin in the hole was observed by an optical microscope (150 times) (10 holes), and the part embedding property was evaluated by the following criteria, and the results were shown in Table 2.

判斷為 Judged as

○:在全部孔洞,層合陶瓷電容器零件之外周邊以樹脂被覆。 ○: The periphery of the laminated ceramic capacitor component was covered with a resin in all the holes.

×:即使一個孔洞,發生孔隙(Void)或於層合陶瓷電容器零件之外周邊未嵌入樹脂者。 ×: Even if a hole is formed, voids or voids are not embedded in the periphery of the laminated ceramic capacitor component.

2.彎曲量之評估 2. Evaluation of the amount of bending

(1)樹脂薄片之硬化 (1) Hardening of resin sheets

將於1.(3)製作之評估用基板A以100℃之溫度條件,投入100℃之烤箱後進行30分鐘熱處理,冷卻至室溫後,於剝離附黏著劑之聚醯亞胺薄膜的面,同樣將樹脂薄片以與1.(3)相同之條件貼合。然後,以100℃之溫度條件,投入100℃之烤箱30分鐘後,其次以175℃之溫度條件,轉移至175℃之烤箱後進行30分鐘熱硬化,於基板的兩面形成絕緣層。然後,將於兩面形成絕緣層之基板於室溫環境下取出,剝離兩面之脫模PET,進而藉由於190℃,以投入190℃之烤箱後90分鐘的硬化條件使硬化性樹脂組成物層熱硬化,製作零件內藏電路板,作為評估基板B。 The evaluation substrate A prepared in 1. (3) was placed in an oven at 100 ° C under a temperature of 100 ° C, and then heat-treated for 30 minutes. After cooling to room temperature, the surface of the polyimide film was peeled off from the adhesive. The resin sheet was also bonded under the same conditions as in 1. (3). Then, it was placed in an oven at 100 ° C for 30 minutes at a temperature of 100 ° C, and then transferred to an oven at 175 ° C under a temperature of 175 ° C for 30 minutes and then thermally cured to form an insulating layer on both surfaces of the substrate. Then, the substrate on which the insulating layer is formed on both sides is taken out at room temperature, and the release PET on both sides is peeled off, and the hardened resin composition layer is heated by the hardening condition of 90 minutes after the 190 ° C oven is put into the oven at 190 ° C. Hardening, making the built-in circuit board of the part as the evaluation substrate B.

(2)彎曲量之評估試驗 (2) Evaluation test of bending amount

將評估基板B切出45mm平方之個片後(n=5),一次通過再現峰值溫度260℃之回流焊接溫度之回流裝置(日本 ANTOM(股)製「HAS-6116」)(回流溫度檔案係依照IPC/JEDEC J-STD-020C)。其次,使用陰影疊紋(shadow Moire)裝置(Akrometrix公司製「TherMoire AXP」),在依照IPC/JEDEC J-STD-020C(峰值溫度260℃)之回流溫度檔案,加熱基板下面,測定基板中央之10mm平方部分的變位(μm),將結果示於表2。 After the evaluation substrate B is cut out of a piece of 45 mm square (n=5), the reflow device that reproduces the reflow soldering temperature at a peak temperature of 260 ° C at one time (Japan) ANTOM (shares) "HAS-6116") (reflow temperature file according to IPC/JEDEC J-STD-020C). Next, using a shadow moire apparatus ("TherMoire AXP" manufactured by Akrometrix Co., Ltd.), the substrate was heated under the substrate according to the reflow temperature profile of IPC/JEDEC J-STD-020C (peak temperature: 260 ° C), and the center of the substrate was measured. The displacement (μm) of the square portion of 10 mm is shown in Table 2.

表2中與評估結果一起,合併表示在實施例及比較例之樹脂薄片之各硬化性樹脂組成物層之形成所使用之樹脂清漆的種類、無機填充材的種類、含量(質量%)、平均粒徑(μm)、比表面積(m2/g)、真密度(g/cm3)、真密度與比表面積的乘積、硬化性樹脂組成物層之最低熔融黏度(poise)、絕緣層之平均線熱膨脹率(ppm/℃)。 In the same manner as in the evaluation results, the types of the resin varnish used in the formation of the respective curable resin composition layers of the resin sheets of the examples and the comparative examples, the types and contents (% by mass) of the inorganic filler, and the average are shown in Table 2 Particle size (μm), specific surface area (m 2 /g), true density (g/cm 3 ), product of true density and specific surface area, lowest melt viscosity of the curable resin composition layer, average of the insulating layer Line thermal expansion rate (ppm / ° C).

[表2] [Table 2]

10‧‧‧樹脂薄片(第1樹脂薄片) 10‧‧‧Resin sheet (first resin sheet)

11‧‧‧支持體(第1支持體) 11‧‧‧Support (1st support)

12‧‧‧硬化性樹脂組成物層 12‧‧‧ hardened resin composition layer

Claims (10)

一種樹脂薄片,其係具備支持體、與設置在支持體上之硬化性樹脂組成物層之樹脂薄片,其特徵為硬化性樹脂組成物層係包含無機填充材,硬化性樹脂組成物層中之無機填充材的含量為74質量%以上,無機填充材之平均粒徑為1.6μm以下,無機填充材之比表面積[m2/g]與真密度[g/cm3]的乘積為6~8,硬化性樹脂組成物層之最低熔融黏度為12000poise以下。 A resin sheet comprising a support and a resin sheet of a curable resin composition layer provided on a support, wherein the curable resin composition layer contains an inorganic filler, and the curable resin composition layer The content of the inorganic filler is 74% by mass or more, the average particle diameter of the inorganic filler is 1.6 μm or less, and the product of the specific surface area [m 2 /g] of the inorganic filler and the true density [g/cm 3 ] is 6-8. The curable resin composition layer has a minimum melt viscosity of 12,000 poise or less. 如請求項1之樹脂薄片,其中,無機填充材為二氧化矽。 The resin sheet of claim 1, wherein the inorganic filler is cerium oxide. 如請求項1之樹脂薄片,其中,硬化性樹脂組成物層係包含(a)環氧樹脂,該環氧樹脂係包含液狀環氧樹脂,硬化性樹脂組成物層中之液狀環氧樹脂的含量為1質量%以上。 The resin sheet according to claim 1, wherein the curable resin composition layer comprises (a) an epoxy resin comprising a liquid epoxy resin, and a liquid epoxy resin in the curable resin composition layer The content is 1% by mass or more. 如請求項3之樹脂薄片,其中,(a)環氧樹脂係進一步包含固體狀環氧樹脂,固體狀環氧樹脂之質量MS相對於硬化性樹脂組成物層中之液狀環氧樹脂之質量ML的比(MS/ML)為0.6~10。 The resin sheet of claim 3, wherein (a) the epoxy resin further comprises a solid epoxy resin, and the mass M S of the solid epoxy resin is relative to the liquid epoxy resin in the curable resin composition layer. The ratio of mass M L (M S /M L ) is 0.6-10. 如請求項3之樹脂薄片,其中,(a)環氧樹脂為具有(a’)芳香族構造之環氧樹脂。 The resin sheet of claim 3, wherein (a) the epoxy resin is an epoxy resin having an (a') aromatic structure. 如請求項3之樹脂薄片,其中,硬化性樹脂組成 物層係進一步包含(d)成分:選自具有玻璃轉移溫度為25℃以下之官能基的樹脂、及具有於25℃為液狀之官能基的樹脂中之1種以上的樹脂。 The resin sheet of claim 3, wherein the curable resin is composed The material layer further contains the component (d): one or more resins selected from the group consisting of a resin having a functional group having a glass transition temperature of 25 ° C or lower and a resin having a functional group at 25 ° C. 如請求項6之樹脂薄片,其中,(d)成分具有選自羥基、酸酐基、酚性羥基、環氧基、異氰酸酯基及胺基甲酸乙酯基中之1種以上的官能基,同時具有選自伸烷基構造單位、伸烷氧基構造單位、丁二烯構造單位、異戊二烯構造單位、異丁烯構造單位、氯丁二烯構造單位、胺基甲酸乙酯構造單位、聚碳酸酯構造單位、(甲基)丙烯酸酯構造單位、及聚矽氧烷構造單位中之1個以上的構造單位。 The resin sheet of claim 6, wherein the component (d) has one or more functional groups selected from the group consisting of a hydroxyl group, an acid anhydride group, a phenolic hydroxyl group, an epoxy group, an isocyanate group, and an urethane group, and has Selected from alkylene structural unit, alkylene structural unit, butadiene structural unit, isoprene structural unit, isobutylene structural unit, chloroprene structural unit, urethane structural unit, polycarbonate One or more structural units of a structural unit, a (meth) acrylate structural unit, and a polyoxyalkylene structural unit. 如請求項1之樹脂薄片,其係零件內藏電路板用。 The resin sheet of claim 1 is for use in a circuit board. 一種配線板,其係具備使如請求項1~8中任一項之樹脂薄片的硬化性樹脂組成物層硬化而成之絕緣層、與導體層。 A wiring board comprising an insulating layer and a conductor layer obtained by curing a layer of a curable resin composition of the resin sheet according to any one of claims 1 to 8. 一種半導體裝置,其係具備如請求項9之配線板。 A semiconductor device comprising the wiring board of claim 9.
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