TWI620474B - Hardened body, method of manufacturing cured body, laminated body, printed wiring board, and semiconductor device - Google Patents

Hardened body, method of manufacturing cured body, laminated body, printed wiring board, and semiconductor device Download PDF

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TWI620474B
TWI620474B TW102145127A TW102145127A TWI620474B TW I620474 B TWI620474 B TW I620474B TW 102145127 A TW102145127 A TW 102145127A TW 102145127 A TW102145127 A TW 102145127A TW I620474 B TWI620474 B TW I620474B
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resin composition
hardened body
composition layer
layer
resin
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TW102145127A
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Chinese (zh)
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TW201436661A (en
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中村茂雄
奈良橋弘久
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味之素股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B17/00Layered products essentially comprising sheet glass, or glass, slag, or like fibres
    • B32B17/06Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
    • B32B17/10Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/389Improvement of the adhesion between the insulating substrate and the metal by the use of a coupling agent, e.g. silane
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B38/00Ancillary operations in connection with laminating processes
    • B32B2038/0052Other operations not otherwise provided for
    • B32B2038/0076Curing, vulcanising, cross-linking
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2305/00Condition, form or state of the layers or laminate
    • B32B2305/72Cured, e.g. vulcanised, cross-linked
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/08PCBs, i.e. printed circuit boards

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Laminated Bodies (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

本發明提供一種在印刷配線板之製造中,即使是為了使層薄型化而使用薄的樹脂組成物層時,仍可實現保有充分之乾膜密著性的表面起伏小之硬化體,並且可抑制粗糙度不均發生之技術。 According to the present invention, in the production of a printed wiring board, even when a thin resin composition layer is used in order to reduce the thickness of the layer, a hardened body having a small surface relief which maintains sufficient dry film adhesion can be realized. A technique for suppressing uneven roughness.

本發明提供一種硬化體,其係將樹脂組成物層積層於電路基板上且使該樹脂組成物層熱硬化而得之設置於電路基板上之硬化體,其中將樹脂組成物層之最低熔融黏度溫度設為Tv(℃)時,樹脂組成物層之積層溫度為Tv-35℃~Tv+35℃,且將樹脂組成物層之厚度設為x(μm),將電路基板之位於電路配線上之硬化體厚度設為y(μm)時,為0.3<y/x≦1且y≦15。 The present invention provides a hardened body obtained by laminating a resin composition on a circuit board and thermally hardening the resin composition layer to obtain a hardened body provided on a circuit substrate, wherein a minimum melt viscosity of the resin composition layer is obtained. When the temperature is Tv (° C.), the lamination temperature of the resin composition layer is Tv-35° C. to Tv + 35° C., and the thickness of the resin composition layer is set to x (μm), and the circuit board is placed on the circuit wiring. When the thickness of the hardened body is y (μm), it is 0.3 < y / x ≦ 1 and y ≦ 15.

Description

硬化體、硬化體之製造方法、積層體、印刷配線板及半導體裝置 Hardened body, method of manufacturing cured body, laminated body, printed wiring board, and semiconductor device

本發明係關於硬化體、硬化體之製造方法、積層體、印刷配線板及半導體裝置。 The present invention relates to a cured body, a method of producing a cured body, a laminate, a printed wiring board, and a semiconductor device.

於各種電子設備中廣泛使用之多層印刷配線板、可撓性印刷配線板等印刷配線板,為了電子設備之小型化、高功能化,而要求層之薄型化或電路之微細配線化。 A printed wiring board such as a multilayer printed wiring board or a flexible printed wiring board which is widely used in various electronic devices requires thinning of the layer or fine wiring of the circuit in order to reduce the size and function of the electronic device.

作為印刷配線板之製造技術已知有利用交互層合重疊絕緣層與導體層之增層(build up)方式之製造方法。利用增層方式之製造方法中,一般係使樹脂組成物熱硬化而形成絕緣層。例如,專利文獻1中揭示使用含樹脂組成物之接著薄片將樹脂組成物層積層於電路基板上,並使該樹脂組成物層熱硬化獲得硬化體後,使該硬化體進行粗化處理而形成絕緣層之技術。 As a manufacturing technique of a printed wiring board, a manufacturing method using a build-up method in which an overlapping insulating layer and a conductor layer are alternately laminated is known. In the production method using the build-up method, the resin composition is generally thermally cured to form an insulating layer. For example, Patent Document 1 discloses that a resin composition is laminated on a circuit board using a bonding sheet containing a resin composition, and the resin composition layer is thermally cured to obtain a cured body, and then the cured body is subjected to a roughening treatment to form a cured body. The technology of the insulation layer.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開2008-37957號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2008-37957

形成絕緣層後,可藉由半加成法(semi additive method)或全加成法等技術形成具有期望圖型之導體層(配線層)。一般,於絕緣層上配置圖型形成用乾膜並顯像期望之圖型後,藉由鍍敷而形成具有期望圖型之導體層。此時,就微細配線形成性之觀點而言,形成圖型之乾膜較好充分密著於絕緣層上。 After the insulating layer is formed, a conductor layer (wiring layer) having a desired pattern can be formed by a technique such as a semi-additive method or a full additive method. Generally, after a dry film for pattern formation is placed on an insulating layer and a desired pattern is developed, a conductor layer having a desired pattern is formed by plating. At this time, from the viewpoint of the fine wiring formation property, the dry film forming the pattern is preferably sufficiently adhered to the insulating layer.

然而,本發明人等發現為了使層薄型化而使用薄的樹脂組成物層形成絕緣層時,藉由樹脂組成物層之硬化而形成之硬化體表面會有成為與底層的電路基板之表面起伏(起因於有無電路配線)對應之起伏的傾向,而有因該起伏使圖型形成用乾膜之密著性下降之情況。該硬化體表面之起伏可藉由操作樹脂組成物層之積層條件等而變得稍減小,但本發明人發現於該情況下起伏的凸部(亦即,電路基板之電路配線上之絕緣層表面)與凹部(亦即,電路基板之無電路配線的部分上之絕緣層表面)在粗化處理後會有呈現大為不同的表面粗糙度之情況(以下,亦稱該現象為「粗糙度不均」)。該粗糙度不均有時係歸結於絕緣層表面之局部微細配線形成不良。 However, the present inventors have found that when a thin resin composition layer is used to form an insulating layer in order to reduce the thickness of the layer, the surface of the hardened body formed by the hardening of the resin composition layer may become a surface undulation of the circuit substrate with the underlayer. (There is a tendency due to the presence or absence of the circuit wiring), and the adhesion of the dry film for pattern formation is lowered by the undulation. The undulation of the surface of the hardened body can be slightly reduced by operating the laminated condition of the resin composition layer, etc., but the inventors have found the undulating convex portion (that is, the insulation on the circuit wiring of the circuit substrate) in this case. The surface of the layer and the recess (that is, the surface of the insulating layer on the portion of the circuit board where the circuit is not wired) may have a greatly different surface roughness after the roughening process (hereinafter, the phenomenon is also referred to as "roughness" Unevenness"). When the roughness is not uniform, the local fine wiring which is attributed to the surface of the insulating layer is poorly formed.

因此,印刷配線板之製造中,對於兼具層的 薄型化與電路的微細配線化尚有改善之餘地。 Therefore, in the manufacture of printed wiring boards, for both layers There is still room for improvement in thinning and fine wiring of circuits.

本發明之課題係提供一種印刷配線板之製造中,即使為了使層薄型化而使用薄的樹脂組成物層時,仍可實現保有充分之乾膜密著性且表面起伏小之硬化體,並且可抑制粗糙度不均發生之技術。 In the production of a printed wiring board, even when a thin resin composition layer is used in order to reduce the thickness of the layer, a hardened body having sufficient dry film adhesion and small surface undulation can be realized, and A technique that suppresses uneven roughness.

本發明人等針對上述課題而積極檢討之結果,發現藉由將樹脂組成物層之最低熔融黏度溫度設為Tv(℃)時,樹脂組成物層之積層溫度為Tv-35℃~Tv+35℃之範圍,同時將樹脂組成物層之厚度設為x(μm),將電路基板之位於電路配線上之硬化體厚度設為y(μm)時,x與y滿足0.3<y/x≦1且y≦15之關係可解決上述課題,因而完成本發明。 As a result of a review of the above-mentioned problems, the present inventors have found that the laminate temperature of the resin composition layer is Tv-35 ° C to Tv + 35 when the lowest melt viscosity temperature of the resin composition layer is Tv (° C.). In the range of °C, the thickness of the resin composition layer is set to x (μm), and when the thickness of the hardened body on the circuit board of the circuit board is y (μm), x and y satisfy 0.3 < y / x ≦ 1 Further, the relationship between y≦15 can solve the above problems, and thus the present invention has been completed.

亦即,本發明包含以下之內容。 That is, the present invention includes the following contents.

[1]一種硬化體,其係將樹脂組成物層積層於電路基板上且使該樹脂組成物層熱硬化而得之設置於電路基板上之硬化體,其中將樹脂組成物層之最低熔融黏度溫度設為Tv(℃)時,樹脂組成物層之積層溫度為Tv-35℃~Tv+35℃,將樹脂組成物層之厚度設為x(μm),將電路基板之位於電路配線上之硬化體厚度設為y(μm)時,為0.3<y/x≦1且y≦15。 [1] A hardened body obtained by laminating a resin composition on a circuit board and thermally hardening the resin composition layer to obtain a hardened body provided on a circuit substrate, wherein a minimum melt viscosity of the resin composition layer is obtained. When the temperature is Tv (° C.), the lamination temperature of the resin composition layer is Tv-35 ° C to Tv + 35 ° C, and the thickness of the resin composition layer is set to x (μm), and the circuit board is placed on the circuit wiring. When the thickness of the hardened body is y (μm), it is 0.3 < y / x ≦ 1 and y ≦ 15.

[2]如[1]所記載之硬化體,其中x≦25。 [2] The hardened body according to [1], wherein x≦25.

[3]如[1]或[2]所記載之硬化體,其中硬化體表面之最大剖面高度Rt為3.5μm以下。 [3] The hardened body according to [1] or [2], wherein a maximum cross-sectional height Rt of the surface of the hardened body is 3.5 μm or less.

[4]如[1]~[3]中任一項所記載之硬化體,其係使樹脂組成物層在未達Tv之溫度保持10分鐘以上後,在Tv以上之溫度保持10分鐘以上進行熱硬化而得。 [4] The hardened body according to any one of [1] to [3], wherein the resin composition layer is maintained at a temperature not exceeding Tv for 10 minutes or more, and then maintained at a temperature of Tv or higher for 10 minutes or longer. Heat hardened.

[5]一種粗化硬化體,其係將如[1]~[4]中任一項所記載之硬化體進行粗化處理所得。 [5] A roughened body obtained by subjecting the hardened body according to any one of [1] to [4] to a roughening treatment.

[6]如[5]所記載之粗化硬化體,其中電路基板之位於電路配線上之粗化硬化體表面的算術平均粗糙度,與電路基板之無電路配線之部分上之粗化硬化體表面的算術平均粗糙度之差為160nm以下。 [6] The roughened hardened body according to [5], wherein the arithmetic mean roughness of the surface of the roughened hardened body on the circuit wiring of the circuit substrate, and the roughened hardened body on the portion of the circuit board having no circuit wiring The difference in arithmetic mean roughness of the surface is 160 nm or less.

[7]一種積層體,其係具備如[5]或[6]所記載之粗化硬化體、與形成於該粗化硬化體表面之導體層。 [7] A laminated body comprising the roughened hardened body according to [5] or [6] and a conductor layer formed on the surface of the roughened hardened body.

[8]一種硬化體之製造方法,其包含下列步驟:(A)將樹脂組成物層積層於電路基板上之步驟,及(B)使樹脂組成物層熱硬化而於電路基板上設置硬化體之步驟,且將樹脂組成物層之最低熔融黏度溫度設為Tv(℃)時,樹脂組成物層之積層溫度為Tv-35℃~Tv+35℃,將樹脂組成物層之厚度設為x(μm),將電路基板之位於電路配線上之硬化體厚度設為y(μm)時,為0.3<y/x≦1且y≦15。 [8] A method for producing a hardened body, comprising the steps of: (A) laminating a resin composition on a circuit substrate, and (B) thermally curing the resin composition layer to provide a hardened body on the circuit substrate. In the step of setting the lowest melt viscosity temperature of the resin composition layer to Tv (° C.), the laminate temperature of the resin composition layer is Tv-35° C. to Tv + 35° C., and the thickness of the resin composition layer is set to x. (μm), when the thickness of the hardened body on the circuit wiring of the circuit board is y (μm), it is 0.3 < y / x ≦ 1 and y ≦ 15.

[9]如[8]所記載之硬化體之製造方法,其中x≦25。 [9] The method for producing a hardened body according to [8], wherein x ≦ 25.

[10]如[8]或[9]所記載之硬化體之製造方法,其中硬 化體表面之最大剖面高度Rt為3.5μm以下。 [10] The method for producing a hardened body according to [8] or [9], wherein The maximum cross-sectional height Rt of the surface of the chemical body is 3.5 μm or less.

[11]如[8]~[10]中任一項所記載之硬化體之製造方法,其中步驟(B)中,使樹脂組成物層在未達Tv之溫度保持10分鐘以上後,在Tv以上之溫度保持10分鐘以上而進行熱硬化。 [11] The method for producing a hardened body according to any one of [8], wherein in the step (B), the resin composition layer is maintained at a temperature less than Tv for 10 minutes or more, in Tv The above temperature is maintained for 10 minutes or more to perform thermal hardening.

[12]一種印刷配線板,其係藉由如[1]~[4]中任一項所記載之硬化體形成有絕緣層者。 [12] A printed wiring board in which an insulating layer is formed by the hardened body according to any one of [1] to [4].

[13]一種半導體裝置,其係包含如[12]所記載之印刷配線板。 [13] A semiconductor device comprising the printed wiring board according to [12].

依據本發明,在印刷配線板之製造中,即使為了使層薄型化而使用薄的樹脂組成物層時,仍可實現保有充分之乾膜密著性且表面起伏小的硬化體,同時可抑制粗糙度不均之發生。 According to the present invention, in the production of a printed wiring board, even when a thin resin composition layer is used in order to reduce the thickness of the layer, a hardened body which retains sufficient dry film adhesion and has a small surface undulation can be realized while suppressing Uneven roughness occurs.

1‧‧‧樹脂組成物層 1‧‧‧ resin composition layer

2‧‧‧硬化體 2‧‧‧hardened body

3‧‧‧電路基板 3‧‧‧ circuit board

4‧‧‧電路配線 4‧‧‧Circuit wiring

5‧‧‧基板 5‧‧‧Substrate

圖1係概略顯示樹脂組成物層剖面之圖。 Fig. 1 is a view schematically showing a cross section of a resin composition layer.

圖2係概略顯示本發明之一實施形態中之設置於電路基板上之硬化體剖面之圖。 Fig. 2 is a view schematically showing a cross section of a hardened body provided on a circuit board in an embodiment of the present invention.

以下,就本發明之較佳實施形態詳細說明本 發明。 Hereinafter, the present invention will be described in detail with reference to preferred embodiments of the present invention. invention.

[硬化體] [hardened body]

本發明之硬化體係將樹脂組成物層積層於電路基板上且使該樹脂組成物層熱硬化而得之設置於電路基板上之硬化體,其特徵為將樹脂組成物層之最低熔融黏度溫度設為Tv(℃)時,樹脂組成物層之積層溫度為Tv-35℃~Tv+35℃,且將樹脂組成物層之厚度設為x(μm),將電路基板之電路配線上之硬化體厚度設為y(μm)時,為0.3<y/x≦1且y≦15。 The hardening system of the present invention is characterized in that a resin composition is laminated on a circuit board and the resin composition layer is thermally cured to obtain a hardened body provided on the circuit substrate, which is characterized in that the lowest melt viscosity temperature of the resin composition layer is set. In the case of Tv (°C), the laminate temperature of the resin composition layer is Tv-35° C. to Tv+35° C., and the thickness of the resin composition layer is set to x (μm), and the hardened body on the circuit wiring of the circuit board is used. When the thickness is y (μm), it is 0.3 < y / x ≦ 1 and y ≦ 15.

其上設置本發明的硬化體之所謂「電路基板」係指單面或兩面上具有經圖型加工之電路配線之基板。電路基板所使用之基板列舉為例如玻璃環氧樹脂基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚苯醚基板等。且製造印刷配線板時,進一步欲形成絕緣層及/或導體層之中間製造物的內層電路基板亦包含於本發明之「電路基板」中。 The "circuit board" on which the hardened body of the present invention is provided refers to a substrate having circuit patterns processed on one or both sides. The substrate used for the circuit board is exemplified by, for example, a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, a thermosetting polyphenylene ether substrate, or the like. Further, when a printed wiring board is manufactured, an inner layer circuit board in which an intermediate layer of an insulating layer and/or a conductor layer is further formed is also included in the "circuit board" of the present invention.

基板之單面或兩面上之經圖型加工之電路配線之厚度並無特別限制,但就層之薄型化之觀點而言,較好為70μm以下,更好為30μm以下,又更好為20μm以下。電路配線厚度下限並無特別限制,但較好為1μm以上,更好為3μm以上,又更好為5μm以上。 The thickness of the circuit wiring to be patterned on one side or both sides of the substrate is not particularly limited, but from the viewpoint of thinning the layer, it is preferably 70 μm or less, more preferably 30 μm or less, and still more preferably 20 μm. the following. The lower limit of the thickness of the circuit wiring is not particularly limited, but is preferably 1 μm or more, more preferably 3 μm or more, and still more preferably 5 μm or more.

基板之單面或兩面上之經圖型加工之電路配線之線/間隔比並無特別限制,但為抑制硬化體表面之起 伏,故較好為200/200μm以下,更好為100/100μm以下,又更好為40/40μm以下,再更好為20/20μm以下,最好為8/8μm。電路配線之線/間隔比之下限並無特別限制,但為了使樹脂良好地埋入於間隔間,較好為0.5/0.5μm以上,更好為1/1μm以上。 The line/space ratio of the circuit wiring of the pattern processing on one side or both sides of the substrate is not particularly limited, but the surface of the hardened body is suppressed. The volt is preferably 200/200 μm or less, more preferably 100/100 μm or less, still more preferably 40/40 μm or less, still more preferably 20/20 μm or less, and most preferably 8/8 μm. The lower limit of the line/space ratio of the circuit wiring is not particularly limited, but is preferably 0.5/0.5 μm or more, more preferably 1/1 μm or more, in order to allow the resin to be well embedded in the space.

本發明之硬化體係將樹脂組成物層積層於該電路基板上,使該樹脂組成物層熱硬化而得。 In the curing system of the present invention, a resin composition is laminated on the circuit board, and the resin composition layer is thermally cured.

就印刷配線板之層薄型化之觀點而言,期望使用薄的樹脂組成物層。然而,使用薄的樹脂組成物層時,所形成之硬化體表面會有成為與底層的電路基板之電路配線圖型對應之較大起伏之傾向。該種硬化體表面之較大起伏係歸結於圖型形成用乾膜之密著性降低之微細配線形成性惡化。 From the viewpoint of thinning the layer of the printed wiring board, it is desirable to use a thin resin composition layer. However, when a thin resin composition layer is used, the surface of the formed hardened body tends to have a large undulation corresponding to the circuit wiring pattern of the underlying circuit substrate. The large undulation of the surface of the hardened body is attributed to the deterioration of the fine wiring formation property of the dry film of the pattern forming.

就抑制該硬化體表面起伏之觀點而言,將樹脂組成物層之最低熔融黏度溫度設為Tv(℃)時,將樹脂組成物層積層於電路基板上時之溫度(以下亦稱為「積層溫度」)為Tv-35℃~Tv+35℃之範圍,較好為Tv-30℃~Tv+30℃之範圍,更好為Tv-25℃~Tv+25℃之範圍,又更好為Tv-20℃~Tv+20℃之範圍,再更好為Tv-15℃~Tv+15℃之範圍。 From the viewpoint of suppressing the surface undulation of the hardened body, when the lowest melt viscosity temperature of the resin composition layer is Tv (° C.), the temperature at which the resin composition is laminated on the circuit board (hereinafter also referred to as "layering" The temperature ") is in the range of Tv-35 ° C ~ Tv + 35 ° C, preferably in the range of Tv-30 ° C ~ Tv + 30 ° C, more preferably in the range of Tv - 25 ° C ~ Tv + 25 ° C, and better The range of Tv-20 ° C ~ Tv + 20 ° C, and more preferably Tv-15 ° C ~ Tv + 15 ° C range.

此處,樹脂組成物層之所謂「最低熔融黏度溫度」係指樹脂組成物層顯示最低熔融黏度時之溫度。且,樹脂組成物層之所謂「最低熔融黏度」係指使樹脂組成物層之樹脂熔融時樹脂組成物層所呈現之最低黏度。詳 言之,以一定之升溫速度加熱樹脂組成物層使樹脂熔融時,初期階段熔融黏度隨著溫度上升而下降,隨後,超過某一溫度時隨著溫度上升熔融黏度上升時,所謂「最低熔融黏度」係指該極小點之熔融黏度。樹脂組成物層之最低熔融黏度溫度可藉動態黏彈性法測定。具體而言,樹脂組成物層之最低熔融黏度溫度可藉由在測定開始溫度60℃、升溫速度5℃/分鐘及震動數1Hz、應變(strain)1度之條件進行動態黏彈性測定而得。至於動態黏彈性測定裝置列舉為例如UBM(股)公司製之「Rheosol-G3000」。 Here, the "lowest melt viscosity temperature" of the resin composition layer means the temperature at which the resin composition layer exhibits the lowest melt viscosity. Further, the term "minimum melt viscosity" of the resin composition layer means the lowest viscosity exhibited by the resin composition layer when the resin of the resin composition layer is melted. detailed In other words, when the resin composition layer is heated at a certain heating rate to melt the resin, the melt viscosity in the initial stage decreases as the temperature rises, and then, when the temperature exceeds a certain temperature, the melt viscosity increases as the temperature rises, and the so-called "minimum melt viscosity" "" refers to the melt viscosity of this very small point. The lowest melt viscosity temperature of the resin composition layer can be determined by dynamic viscoelasticity. Specifically, the lowest melt viscosity temperature of the resin composition layer can be obtained by dynamic viscoelasticity measurement at a measurement start temperature of 60 ° C, a temperature increase rate of 5 ° C / min, a vibration number of 1 Hz, and a strain of 1 degree. The dynamic viscoelasticity measuring device is exemplified by "Rheosol-G3000" manufactured by UBM Co., Ltd.

硬化體表面之起伏可利用硬化體表面之最大剖面高度Rt進行評價。硬化體表面之最大剖面高度Rt超過4μm時,會有圖型形成用乾膜之密著性顯著下降之傾向。就實現圖型形成用乾膜之充分密著性之觀點而言,本發明之硬化體之表面最大剖面高度Rt較好為3.5μm以下,更好為3.3μm以下,又更好為3.1μm以下,再更好為2.9μm以下、2.7μm以下、2.5μm以下、2.3μm以下、2.1μm以下、或1.9μm以下。 The undulation of the surface of the hardened body can be evaluated by the maximum cross-sectional height Rt of the surface of the hardened body. When the maximum cross-sectional height Rt of the surface of the hardened body exceeds 4 μm, the adhesion of the dry film for pattern formation tends to be remarkably lowered. The surface maximum cross-sectional height Rt of the cured body of the present invention is preferably 3.5 μm or less, more preferably 3.3 μm or less, and still more preferably 3.1 μm or less from the viewpoint of achieving sufficient adhesion of the dry film for pattern formation. Further, it is more preferably 2.9 μm or less, 2.7 μm or less, 2.5 μm or less, 2.3 μm or less, 2.1 μm or less, or 1.9 μm or less.

硬化體表面之最大剖面高度Rt可使用非接觸型表面粗糙度計測定。非接觸型表面粗糙度計之具體例列舉為Veeco Instruments製之「WYKO NT3300」。 The maximum cross-sectional height Rt of the surface of the hardened body can be measured using a non-contact type surface roughness meter. A specific example of the non-contact type surface roughness meter is "WYKO NT3300" manufactured by Veeco Instruments.

藉由抑制硬化體表面之起伏而提高圖型形成用乾膜之密著性。然而,使用薄的樹脂組成物層形成硬化體時,需要注意粗糙度不均之發生。亦即,使用薄的樹脂組成物層於電路基板上設置表面起伏小的硬化體時,會有 起伏之凸部(亦即,電路基板之位於電路配線上之硬化體表面)與凹部(亦即,電路基板之無電路配線部分上之硬化體表面)在粗化處理後呈現大為不同之表面粗糙度之情況。該粗糙度不均可藉由粗化處理後之硬化體表面中之起伏之凸部的算術平均粗糙度(Ra1)與起伏之凹部的算術平均粗糙度(Ra2)之差(|Ra1-Ra2|)予以評價。|Ra1-Ra2|之值高到超過160nm時,在形成導體層(電路配線)時會有歸結於局部微細配線形成不良之傾向。該粗糙度不均容易發生於使用薄的樹脂組成物層於電路基板上設置表面起伏小之硬化體時,其中,本發明人等發現在下述情況等時特別容易引起粗糙度不均:i)使用無機填充材含量高的樹脂組成物層時,ii)使用具有樹脂組成物層/支撐體層之層構成之接著薄片形成硬化體時,在使附有支撐體之狀態使樹脂組成物層熱硬化時等。 The adhesion of the dry film for pattern formation is improved by suppressing the undulation of the surface of the hardened body. However, when a thin resin composition layer is used to form a hardened body, it is necessary to pay attention to the occurrence of roughness unevenness. In other words, when a thin resin composition layer is used to provide a hard surface having a small surface relief on the circuit substrate, there is a convex portion of the undulation (that is, a surface of the hard surface of the circuit substrate on the circuit wiring) and a concave portion (that is, The surface of the hardened body on the circuit-free wiring portion of the circuit board exhibits a greatly different surface roughness after the roughening treatment. This roughness can not by arithmetic average roughness (Ra 1) of the convex portion of the rear surface roughening and hardening of the relief and the arithmetic mean roughness of the relief recess (Ra 2) the difference (| Ra 1 -Ra 2 |) to be evaluated. When the value of |Ra 1 -Ra 2 | is higher than 160 nm, the formation of the conductor layer (circuit wiring) tends to be due to the formation of local fine wiring. In the case where a thin resin composition layer is used to form a hardened body having a small surface undulation on a circuit board, the inventors have found that roughness unevenness is particularly likely to occur in the following cases: i) When a resin composition layer having a high inorganic filler content is used, ii) when a cured product is formed using a subsequent sheet having a layer composed of a resin composition layer/support layer, the resin composition layer is thermally hardened in a state in which the support is attached. Wait.

又,硬化體表面之算術平均粗糙度Ra可使用非接觸型表面粗糙度計測定。非接觸型表面粗糙度計之具體例列舉為Veeco Instruments製之「WYKO NT3300」。 Further, the arithmetic mean roughness Ra of the surface of the hardened body can be measured using a non-contact type surface roughness meter. A specific example of the non-contact type surface roughness meter is "WYKO NT3300" manufactured by Veeco Instruments.

就一面實現層之薄型化一面抑制粗糙度不均發生之觀點而言,重要的是將樹脂組成物層之厚度設為x(μm),將電路基板之位於電路配線上之硬化體厚度設為y(μm)時,以使x及y滿足0.3<y/x≦1且y≦15之方式,進行樹脂組成物層之積層及熱硬化。又,樹脂組成物層之厚度x係指積層於電路基板前之樹脂組成物層之厚度,電路基板之位於電路配線上之硬化體厚度y係指電路基板之 位於電路配線正上方之硬化體之厚度。 From the viewpoint of suppressing occurrence of roughness unevenness while achieving thinning of the layer, it is important to set the thickness of the resin composition layer to x (μm) and to set the thickness of the hardened body on the circuit wiring of the circuit board. In the case of y (μm), the resin composition layer is laminated and thermally cured so that x and y satisfy 0.3<y/x≦1 and y≦15. Further, the thickness x of the resin composition layer refers to the thickness of the resin composition layer laminated on the circuit substrate, and the thickness y of the hardened body on the circuit wiring of the circuit substrate means the circuit substrate. The thickness of the hardened body located directly above the circuit wiring.

x及y滿足上述關係時,即使使用薄的樹脂組成物層形成硬化體時,仍可有利地抑制粗糙度不均發生。例如,樹脂組成物層之厚度x可設為未達50μm。再者使用具有40μm以下、35μm以下、30μm以下、或25μm以下之厚度x之樹脂組成物層時,亦可有利地抑制粗糙度不均之發生。樹脂組成物層之厚度x之下限並無特別限制,但較好為1μm以上,更好為2μm以上,又更好為5μm以上。 When x and y satisfy the above relationship, even when a thin resin composition layer is used to form a hardened body, unevenness in roughness can be favorably suppressed. For example, the thickness x of the resin composition layer can be set to less than 50 μm. Further, when a resin composition layer having a thickness x of 40 μm or less, 35 μm or less, 30 μm or less, or 25 μm or less is used, occurrence of roughness unevenness can be favorably suppressed. The lower limit of the thickness x of the resin composition layer is not particularly limited, but is preferably 1 μm or more, more preferably 2 μm or more, and still more preferably 5 μm or more.

就一面實現層之薄型化一面抑制粗糙度不均發生之觀點而言,y≦15時,較好為0.35≦y/x≦1,更好為0.4≦y/x≦1,又更好為0.5≦y/x≦1,最好為0.6≦y/x≦1。 From the viewpoint of suppressing occurrence of roughness unevenness while achieving thinning of the layer, when y ≦ 15 , it is preferably 0.35 ≦ y / x ≦ 1, more preferably 0.4 ≦ y / x ≦ 1, and even more preferably 0.5 ≦ y / x ≦ 1, preferably 0.6 ≦ y / x ≦ 1.

就層之薄型化之觀點而言,較好為y≦14,更好為y≦12,又更好為y≦10,最好為y≦9、y≦8、y≦7或y≦6。y為該範圍時,且y/x比處於上述範圍時亦可有利地抑制粗糙度不均之發生。y之下限只要能發揮使本發明之硬化體作為絕緣層之功能即無特別限制,但通常為0.5≦y,較好為1≦y。又,y/x比之上限亦可未達1。 From the viewpoint of thinning of the layer, it is preferably y≦14, more preferably y≦12, and more preferably y≦10, preferably y≦9, y≦8, y≦7 or y≦6. . When y is in the range, and the y/x ratio is in the above range, the occurrence of roughness unevenness can be favorably suppressed. The lower limit of y is not particularly limited as long as it can function as the insulating layer of the present invention, but is usually 0.5 ≦y, preferably 1 ≦y. Also, the upper limit of the y/x ratio may not be up to one.

就減小硬化體表面之起伏並且抑制粗糙度不均發生之觀點而言,積層於電路基板上之樹脂組成物層較好在未達該樹脂組成物層之最低熔融黏度溫度Tv之溫度保持10分鐘後,在Tv以上之溫度保持10分鐘進行熱硬化。針對樹脂組成物層之熱硬化之細節敘述於後。 The resin composition layer laminated on the circuit substrate is preferably maintained at a temperature not lower than the lowest melt viscosity temperature Tv of the resin composition layer from the viewpoint of reducing the undulation of the surface of the hardened body and suppressing occurrence of roughness unevenness. After a minute, the temperature was maintained at a temperature above Tv for 10 minutes for thermal hardening. The details of the thermal hardening of the resin composition layer are described later.

本發明之硬化體,如上述,有助於在電路配線上之厚度薄如15μm以下之層的薄型化,並且具有起伏小之表面亦可抑制粗糙度不均之發生,故而亦有助於電路之微細配線化。因此,本發明之硬化體係在印刷配線板之製造中,明顯有助於層的薄型化與電路之微細配線化二者。 As described above, the hardened body of the present invention contributes to thinning of a layer having a thickness as thin as 15 μm or less on a circuit wiring, and having a surface having a small undulation can also suppress unevenness of roughness, thereby contributing to the circuit. Fine wiring. Therefore, in the production of the printed wiring board, the hardening system of the present invention contributes significantly to both the thinning of the layer and the fine wiring of the circuit.

又,圖1係概略顯示用於形成本發明之硬化體所使用之樹脂組成物層之剖面。上述x係指積層於電路基板上之前的樹脂組成物層1之厚度。 Further, Fig. 1 schematically shows a cross section of a resin composition layer used for forming the cured body of the present invention. The above x is the thickness of the resin composition layer 1 before being laminated on the circuit board.

又,圖2係概略顯示本發明之一實施形態中之設置於電路基板上之硬化體之剖面。圖2中,電路基板3係於基板5上具備經圖型加工之配線電路4,硬化體2係設置於該電路基板3上。上述y係指電路基板之電路配線4上之硬化體2的厚度。 Further, Fig. 2 is a schematic cross-sectional view showing a cured body provided on a circuit board in an embodiment of the present invention. In FIG. 2, the circuit board 3 is provided with the wiring circuit 4 processed by the pattern on the board|substrate 5, and the hardening body 2 is provided in this circuit board 3. The above y refers to the thickness of the hardened body 2 on the circuit wiring 4 of the circuit board.

以下,針對用以形成本發明之硬化體所使用之樹脂組成物層加以說明。 Hereinafter, the resin composition layer used to form the cured body of the present invention will be described.

〈樹脂組成物層〉 <Resin composition layer>

樹脂組成物層中所用之樹脂組成物並無特別限制,只要使形成之硬化體具有充分硬度與絕緣性者即可。就降低所得之硬化體(絕緣層)之熱膨脹率,且防止因絕緣層與導體層之熱膨脹差所致之龜裂或電路變形發生之觀點而言,樹脂組成物層中所用之樹脂組成物較好含有無機填充材。 The resin composition used in the resin composition layer is not particularly limited as long as the formed hardened body has sufficient hardness and insulation properties. The resin composition used in the resin composition layer is lowered from the viewpoint of lowering the thermal expansion coefficient of the obtained hardened body (insulating layer) and preventing cracking or circuit deformation due to a difference in thermal expansion between the insulating layer and the conductor layer. It contains inorganic fillers.

如前述,本發明人等發現使用無機填充材含 量高的樹脂組成物層形成硬化體時特別容易引起粗糙度不均,但依據本發明,即使使用無機填充材含量高的樹脂組成物時仍可有利地抑制粗糙度不均之發生。 As described above, the present inventors have found that the use of an inorganic filler is included. When the resin composition layer having a high amount forms a hardened body, it is particularly likely to cause roughness unevenness. However, according to the present invention, occurrence of unevenness in roughness can be favorably suppressed even when a resin composition having a high content of the inorganic filler is used.

樹脂組成物中之無機填充材之含量,就充分地降低所得硬化體之熱膨脹率之觀點而言,較好為50質量%以上,更好為60質量%以上,又更好為65質量%以上。 The content of the inorganic filler in the resin composition is preferably 50% by mass or more, more preferably 60% by mass or more, and still more preferably 65% by mass or more from the viewpoint of sufficiently lowering the thermal expansion coefficient of the obtained cured body. .

又,本發明中,樹脂組成物中之各成分之含量係以樹脂組成物中之不揮發成分之合計作為100質量%時之值。 In the present invention, the content of each component in the resin composition is a value when the total amount of nonvolatile components in the resin composition is 100% by mass.

本發明中,可一面抑制粗糙度不均之發生,一面進而提高樹脂組成物中之無機填充材含量。例如,樹脂組成物中之無機填充材之含量亦可高至66質量%以上、68質量%以上、或70質量%以上。 In the present invention, the content of the inorganic filler in the resin composition can be further improved while suppressing the occurrence of roughness unevenness. For example, the content of the inorganic filler in the resin composition may be as high as 66% by mass or more, 68% by mass or more, or 70% by mass or more.

樹脂組成物中之無機填充材之含量上限,就藉由樹脂組成物層之熱硬化所得之硬化體之機械強度之觀點而言,較好為95質量%以下,更好為90質量%以下。 The upper limit of the content of the inorganic filler in the resin composition is preferably 95% by mass or less, more preferably 90% by mass or less, from the viewpoint of mechanical strength of the cured body obtained by thermal curing of the resin composition layer.

無機填充材列舉為例如二氧化矽、氧化鋁、硫酸鋇、滑石、黏土、雲母粉、氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、氧化鎂、氮化硼、硼酸鋁、鈦酸鋇、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、鋯酸鋇、及鋯酸鈣等。該等中以無定形二氧化矽、熔融二氧化矽、結晶二氧化矽、合成二氧化矽、中空二氧化矽等二氧化矽最佳。且二氧化矽較好為球狀二氧化矽。無機填充材可單獨使用1種,亦可組合2種以上使用。市售之球狀熔融二氧化矽 列舉為Admatechs(股)製之「SOC2」、「SOC1」。 The inorganic filler is exemplified by, for example, cerium oxide, aluminum oxide, barium sulfate, talc, clay, mica powder, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, boron nitride, aluminum borate, barium titanate. , barium titanate, calcium titanate, magnesium titanate, barium titanate, titanium oxide, barium zirconate, and calcium zirconate. Among these, cerium oxide such as amorphous cerium oxide, molten cerium oxide, crystalline cerium oxide, synthetic cerium oxide, and hollow cerium oxide is preferred. Further, the cerium oxide is preferably spherical cerium oxide. The inorganic filler may be used singly or in combination of two or more. Commercially available spherical molten cerium oxide Listed as "SOC2" and "SOC1" by Admatechs.

無機填充材之平均粒徑較好為0.01μm~2μm之範圍,更好為0.05μm~1.5μm之範圍,又更好為0.07μm~1μm之範圍,再更好為0.1μm~0.8μm。無機填充材之平均粒徑可基於Mie散射理論,藉由雷射繞射.散射法測定。具體而言,可藉由雷射繞射散射式粒度分佈測定裝置,以體積基準作成無機填充材之粒度分佈,以其中值直徑作為平均粒徑而測定。測定樣品可較好地使用以超音波將無機填充材分散於水中者。雷射繞射散射式粒度分佈測定裝置可使用堀場製作所股份有限公司製之LA-500等。 The average particle diameter of the inorganic filler is preferably in the range of 0.01 μm to 2 μm, more preferably in the range of 0.05 μm to 1.5 μm, still more preferably in the range of 0.07 μm to 1 μm, still more preferably in the range of 0.1 μm to 0.8 μm. The average particle size of the inorganic filler can be based on the Mie scattering theory, by laser diffraction. Determined by scattering method. Specifically, the particle size distribution of the inorganic filler can be determined on a volume basis by a laser diffraction scattering type particle size distribution measuring apparatus, and the median diameter can be measured as an average particle diameter. The measurement sample can be preferably used in which the inorganic filler is dispersed in water by ultrasonic waves. The laser diffraction scattering type particle size distribution measuring apparatus can use LA-500 manufactured by Horiba, Ltd., and the like.

為提高耐濕性,無機填充材較好以胺基矽烷系偶合劑、環氧矽烷系偶合劑、巰基矽烷系偶合劑、矽烷系偶合劑、有機矽氮烷化合物、鈦酸酯系偶合劑等之1種以上之表面處理劑予以處理。表面處理劑之市售品列舉為例如信越化學工業(股)製之「KBM403」(3-縮水甘油氧基丙基三甲氧基矽烷)、信越化學工業(股)製之「KBM803」(3-巰基丙基三甲氧基矽烷)、信越化學工業(股)製之「KBE903」(3-胺基丙基三乙氧基矽烷)、信越化學工業(股)製之「KBM573」(N-苯基-3-胺基丙基三甲氧基矽烷)、信越化學工業(股)製之「SZ-31」(六甲基二矽氮烷)等。 In order to improve moisture resistance, the inorganic filler is preferably an amine decane coupling agent, an epoxy decane coupling agent, a decyl decane coupling agent, a decane coupling agent, an organic decazane compound, a titanate coupling agent, or the like. One or more kinds of surface treatment agents are treated. The commercially available product of the surface treatment agent is, for example, "KBM403" (3-glycidoxypropyltrimethoxydecane) manufactured by Shin-Etsu Chemical Co., Ltd., and "KBM803" manufactured by Shin-Etsu Chemical Co., Ltd. (3- "Methyl propyl trimethoxy decane", "KBE903" (3-aminopropyl triethoxy decane) manufactured by Shin-Etsu Chemical Co., Ltd., "KBM573" (N-phenyl) manufactured by Shin-Etsu Chemical Co., Ltd. 3-Aminopropyltrimethoxydecane), "SZ-31" (hexamethyldioxane) manufactured by Shin-Etsu Chemical Co., Ltd., etc.

又,以表面處理劑進行表面處理之無機填充材可在以溶劑(例如,甲基乙基酮(MEK))洗淨處理後,測定無機填充材之每單位表面積之碳量。具體而言,將作為 溶劑之充分量的MEK添加於以表面處理劑進行表面處理之無機填充材中,在25℃進行超音波洗淨5分鐘。去除上澄液,使固體成分乾燥後,可使用碳分析計測定無機填充材之每單位表面積之碳量。至於碳分析計可使用堀場製作所製之「EMIA-320V」等。 Further, the inorganic filler which has been surface-treated with a surface treatment agent can be measured by washing with a solvent (for example, methyl ethyl ketone (MEK)), and then the amount of carbon per unit surface area of the inorganic filler can be measured. Specifically, it will act as A sufficient amount of MEK of the solvent was added to the inorganic filler surface-treated with the surface treatment agent, and ultrasonic cleaning was performed at 25 ° C for 5 minutes. After removing the supernatant liquid and drying the solid component, the amount of carbon per unit surface area of the inorganic filler can be measured using a carbon analyzer. As for the carbon analyzer, "EMIA-320V" manufactured by Horiba, Ltd. can be used.

無機填充材之每單位表面積之碳量,就提高無機填充材之分散性之觀點而言,較好為0.02mg/m2以上,更好為0.1mg/m2以上,又更好為0.2mg/m2以上。另一方面,就防止樹脂漆料之熔融黏度或於薄片形態之熔融黏度上升之觀點而言,較好為1mg/m2以下,更好為0.8mg/m2以下,又更好為0.5mg/m2以下。 The amount of carbon per unit surface area of the inorganic filler is preferably 0.02 mg/m 2 or more, more preferably 0.1 mg/m 2 or more, and still more preferably 0.2 mg, from the viewpoint of improving the dispersibility of the inorganic filler. /m 2 or more. On the other hand, from the viewpoint of preventing the melt viscosity of the resin paint or the melt viscosity of the sheet form from increasing, it is preferably 1 mg/m 2 or less, more preferably 0.8 mg/m 2 or less, and still more preferably 0.5 mg. /m 2 or less.

樹脂組成物層中所用之樹脂組成物包含熱硬化性樹脂作為樹脂。至於熱硬化性樹脂可使用形成印刷配線板之絕緣層時所使用之以往習知之熱硬化性樹脂,其中以環氧樹脂較佳。樹脂組成物另亦可視需要含硬化劑。於一實施形態中,可使用含無機填充材、環氧樹脂及硬化劑之樹脂組成物。樹脂組成物層中所用之樹脂組成物亦可進一步含有熱可塑性樹脂、硬化促進劑、難燃劑及橡膠粒子等添加劑。 The resin composition used in the resin composition layer contains a thermosetting resin as a resin. As the thermosetting resin, a conventional thermosetting resin which is used in forming an insulating layer of a printed wiring board can be used, and an epoxy resin is preferable. The resin composition may also contain a hardener as needed. In one embodiment, a resin composition containing an inorganic filler, an epoxy resin, and a curing agent can be used. The resin composition used in the resin composition layer may further contain an additive such as a thermoplastic resin, a hardening accelerator, a flame retardant, and rubber particles.

以下,針對可作為樹脂組成物之材料使用之環氧樹脂、硬化劑及添加劑加以說明。 Hereinafter, an epoxy resin, a curing agent, and an additive which can be used as a material of the resin composition will be described.

(環氧樹脂) (epoxy resin)

作為環氧樹脂列舉為例如雙酚A型環氧樹脂、雙酚F 型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、二環戊二烯型環氧樹脂、三酚環氧樹脂、萘酚酚醛清漆環氧樹脂、酚酚醛清漆型環氧樹脂、第三丁基-兒茶酚型環氧樹脂、萘型環氧樹脂、萘酚型環氧樹脂、蒽型環氧樹脂、縮水甘油胺型環氧樹脂、縮水甘油酯型環氧樹脂、甲酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、鏈狀脂肪族環氧樹脂、具有丁二烯構造之環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含螺環之環氧樹脂、環己烷二甲醇型環氧樹脂、萘醚型環氧樹脂及三羥甲基型環氧樹脂等。環氧樹脂可單獨使用1種,亦可併用2種以上。 As the epoxy resin, for example, bisphenol A type epoxy resin, bisphenol F Type epoxy resin, bisphenol S type epoxy resin, bisphenol AF type epoxy resin, dicyclopentadiene type epoxy resin, trisphenol epoxy resin, naphthol novolac epoxy resin, phenol novolak type ring Oxygen resin, t-butyl-catechol epoxy resin, naphthalene epoxy resin, naphthol epoxy resin, fluorene epoxy resin, glycidylamine epoxy resin, glycidyl ester epoxy resin , cresol novolak type epoxy resin, biphenyl type epoxy resin, chain aliphatic epoxy resin, epoxy resin with butadiene structure, alicyclic epoxy resin, heterocyclic epoxy resin, Spiro epoxy resin, cyclohexane dimethanol epoxy resin, naphthalene ether epoxy resin and trimethylol epoxy resin. The epoxy resin may be used alone or in combination of two or more.

環氧樹脂較好為1分子中具有2個以上環氧基之環氧樹脂。以環氧樹脂之不揮發成分作為100質量%時,較好至少50質量%以上為1分子中具有2個以上之環氧基之環氧樹脂。其中,較好包含1分子中具有2個以上環氧基且於溫度20℃為液狀之環氧樹脂(以下稱為「液狀環氧樹脂」)、與1分子中具有3個以上環氧基且於溫度20℃為固體狀之環氧樹脂(以下稱為「固體狀環氧樹脂」)。藉由併用液狀環氧樹脂與固體狀環氧樹脂作為環氧樹脂,獲得了具有優異可撓性之樹脂組成物。且,亦提高使樹脂組成物硬化形成之硬化體之破裂強度。 The epoxy resin is preferably an epoxy resin having two or more epoxy groups in one molecule. When the non-volatile component of the epoxy resin is 100% by mass, it is preferably at least 50% by mass or more of an epoxy resin having two or more epoxy groups in one molecule. Among them, an epoxy resin having two or more epoxy groups in one molecule and having a liquid at a temperature of 20 ° C (hereinafter referred to as "liquid epoxy resin") and three or more epoxy resins in one molecule are preferable. An epoxy resin (hereinafter referred to as "solid epoxy resin") having a solid content at a temperature of 20 ° C. By using a liquid epoxy resin and a solid epoxy resin as an epoxy resin together, a resin composition having excellent flexibility is obtained. Further, the breaking strength of the hardened body formed by hardening the resin composition is also improved.

至於液狀環氧樹脂,較好為雙酚A型環氧樹脂、雙酚F型環氧樹脂、酚酚醛清漆型環氧樹脂、或萘型環氧樹脂,更好為雙酚A型環氧樹脂或萘型環氧樹脂。液狀環氧樹脂之具體例列舉為DIC(股)製之「HP4032」、 「HP4032D」、「EXA4032SS」、「HP4032SS」(萘型環氧樹脂)、三菱化學(股)製之「jER828EL」(雙酚A型環氧樹脂)、「jER807」(雙酚F型環氧樹脂)、「jER152」(酚酚醛清漆型環氧樹脂)等。該等可單獨使用1種,或亦可併用2種以上。 As for the liquid epoxy resin, it is preferably a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, a phenol novolak type epoxy resin, or a naphthalene type epoxy resin, more preferably a bisphenol A type epoxy resin. Resin or naphthalene epoxy resin. Specific examples of the liquid epoxy resin are "HP4032" manufactured by DIC Co., Ltd. "HP4032D", "EXA4032SS", "HP4032SS" (naphthalene epoxy resin), "jER828EL" (bisphenol A type epoxy resin) manufactured by Mitsubishi Chemical Corporation, "jER807" (bisphenol F type epoxy resin) ), "jER152" (phenol novolak type epoxy resin). These may be used alone or in combination of two or more.

至於固體狀環氧樹脂較好為4官能萘型環氧樹脂、甲酚酚醛清漆型環氧樹脂、二環戊二烯型環氧樹脂、三酚型環氧樹脂、萘酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、或萘醚型環氧樹脂,更好為4官能萘型環氧樹脂、聯苯型環氧樹脂、或萘醚型環氧樹脂。固體狀環氧樹脂之具體例列舉為DIC(股)製之「HP-4700」、「HP-4710」(4官能萘型環氧樹脂)、「N-690」(甲酚酚醛清漆型環氧樹脂)、「N-695」(甲酚酚醛清漆型環氧樹脂)、「HP-7200」(二環戊二烯型環氧樹脂)、「EXA7311」、「EXA7311-G3」、「EXA7311-G4」、「EXA7311-G4S」、「HP6000」(萘醚型環氧樹脂)、日本化藥(股)製之「EPPN-502H」(三酚環氧樹脂)、「NC7000L」(萘酚酚醛清漆環氧樹脂)、「NC3000H」、「NC3000」、「NC3000L」、「NC3100」(聯苯型環氧樹脂)、新日鐵化學(股)製之「ESN475V」(萘酚酚醛清漆型環氧樹脂)、「ESN485」(萘酚酚醛清漆型環氧樹脂)、三菱化學(股)製之「YX4000H」、「YX4000HK」、「YL6121」(聯苯型環氧樹脂)、大阪氣體化學(股)製之「PG-100」、「CG-500」、三菱化學(股)製造之「YL7800」(茀型環氧樹脂)等。 The solid epoxy resin is preferably a 4-functional naphthalene epoxy resin, a cresol novolak epoxy resin, a dicyclopentadiene epoxy resin, a trisphenol epoxy resin, a naphthol novolac epoxy. The resin, the biphenyl type epoxy resin, or the naphthene ether type epoxy resin is more preferably a tetrafunctional naphthalene type epoxy resin, a biphenyl type epoxy resin, or a naphthene ether type epoxy resin. Specific examples of the solid epoxy resin are "HP-4700", "HP-4710" (4-functional naphthalene type epoxy resin), and "N-690" ("phenol novolac type epoxy" manufactured by DIC Co., Ltd. Resin), "N-695" (cresol novolac type epoxy resin), "HP-7200" (dicyclopentadiene type epoxy resin), "EXA7311", "EXA7311-G3", "EXA7311-G4" "EXA7311-G4S", "HP6000" (naphthyl ether type epoxy resin), "EPPN-502H" (trisphenol epoxy resin) made by Nippon Kayaku Co., Ltd., "NC7000L" (naphthol novolac ring) Oxygen resin, "NC3000H", "NC3000", "NC3000L", "NC3100" (biphenyl type epoxy resin), "ESN475V" manufactured by Nippon Steel Chemical Co., Ltd. (naphthol novolac type epoxy resin) "ESN485" (naphthol novolak type epoxy resin), "YX4000H", "YX4000HK", "YL6121" (biphenyl type epoxy resin) manufactured by Mitsubishi Chemical Corporation, and Osaka Gas Chemical Co., Ltd. "PG-100", "CG-500", "YL7800" (茀-type epoxy resin) manufactured by Mitsubishi Chemical Corporation.

併用液狀環氧樹脂與固體狀環氧樹脂作為環氧樹脂時,該等之量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比計較好為1:0.1~1:4之範圍。藉由使液狀環氧樹脂與固體狀環氧樹脂之量比成為該範圍,可獲得下述效果:i)以後述之接著薄片之形態使用時保有適度之黏著性,ii)以接著薄片之形態使用時獲得充分之可撓性,提高了作業性,以及iii)可獲得具有充分破裂強度之硬化體等。就上述i)~iii)的效果之觀點而言,液狀環氧樹脂與固體狀環氧樹脂之量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比計,更好為1:0.3~1:3.5之範圍,又更好為1:0.6~1:3之範圍,最好為1:0.8~1:2.8之範圍。 When a liquid epoxy resin and a solid epoxy resin are used as the epoxy resin, the ratio (liquid epoxy resin: solid epoxy resin) is preferably from 1:0.1 to 1:4 by mass ratio. range. When the ratio of the amount of the liquid epoxy resin to the solid epoxy resin is in this range, the following effects can be obtained: i) maintaining a proper adhesion when used in the form of a subsequent sheet, and ii) followed by sheeting. When the form is used, sufficient flexibility is obtained, workability is improved, and iii) a hardened body having sufficient fracture strength or the like can be obtained. From the viewpoint of the effects of the above i) to iii), the ratio of the liquid epoxy resin to the solid epoxy resin (liquid epoxy resin: solid epoxy resin) is preferably 1 in terms of mass ratio. The range of 0.3~1:3.5 is preferably in the range of 1:0.6~1:3, preferably in the range of 1:0.8~1:2.8.

樹脂組成物中之環氧樹脂含量較好為3質量%~50質量%,更好為5質量%~45質量%,又更好為5質量%~40質量%,最好為7質量%~35質量%。 The epoxy resin content in the resin composition is preferably from 3% by mass to 50% by mass, more preferably from 5% by mass to 45% by mass, even more preferably from 5% by mass to 40% by mass, most preferably 7% by mass. 35 mass%.

環氧樹脂之環氧當量較好為50~3000,更好為80~2000,又更好為110~1000。藉由成為該範圍,而保有硬化物之交聯密度充分之表面粗糙度低的絕緣層。又,環氧當量可根據JIS K7236測定,係含1當量環氧基之樹脂質量。 The epoxy equivalent of the epoxy resin is preferably from 50 to 3,000, more preferably from 80 to 2,000, still more preferably from 110 to 1,000. By this range, an insulating layer having a low cross-linking density of a cured product and a low surface roughness is obtained. Further, the epoxy equivalent can be measured in accordance with JIS K7236 and is a resin containing 1 equivalent of an epoxy group.

(硬化劑) (hardener)

硬化劑只要具有使環氧樹脂硬化之功能即無特別限制,列舉為例如酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑、苯并噁嗪系硬化劑及氰醛酯系硬化劑。硬化劑可單 獨使用1種,或亦可併用2種以上。 The curing agent is not particularly limited as long as it has a function of curing the epoxy resin, and examples thereof include a phenol curing agent, a naphthol curing agent, an active ester curing agent, a benzoxazine curing agent, and a cyanurate curing agent. . Hardener can be single One type may be used alone or two or more types may be used in combination.

就耐熱性及耐水性之觀點而言,酚系硬化劑及萘酚系硬化劑較好為具有酚醛清漆構造之酚系硬化劑,或具有酚醛清漆構造之萘酚系硬化劑。且,就與導體層之密著性(剝離強度)之觀點而言,以含氮酚系硬化劑較佳,更好為含有三嗪骨架之酚系硬化劑。其中,就高度滿足耐熱性、耐水性及與導體層之密著性(剝離強度)之觀點而言,較好使用含有三嗪骨架之酚酚醛清漆樹脂作為硬化劑。 The phenolic curing agent and the naphthol-based curing agent are preferably a phenolic curing agent having a novolak structure or a naphthol-based curing agent having a novolak structure. Further, from the viewpoint of adhesion to the conductor layer (peeling strength), a nitrogen-containing phenol-based curing agent is preferred, and a benzene-based curing agent containing a triazine skeleton is more preferred. Among them, from the viewpoint of highly satisfying heat resistance, water resistance, and adhesion to a conductor layer (peeling strength), a phenol novolak resin containing a triazine skeleton is preferably used as a curing agent.

酚系硬化劑及萘酚系硬化劑之具體例列舉為例如明和化成(股)製之「MEH-7700」、「MEH-7810」、「MEH-7851」、日本化藥(股)製之「NHN」、「CBN」、「GPH」、東都化成(股)製之「SN170」、「SN180」、「SN190」、「SN475」、「SN485」、「SN495」、「SN375」、「SN395」、DIC(股)製之「LA7052」、「LA7054」、「LA3018」等。 Specific examples of the phenolic curing agent and the naphthol-based curing agent are, for example, "MEH-7700", "MEH-7810", "MEH-7851", and "Nippon Chemical Co., Ltd." manufactured by Mingwa Kasei Co., Ltd. "SN170", "SN180", "SN190", "SN475", "SN485", "SN495", "SN375", "SN395", "NHN", "CBN", "GPH", and Dongdu Chemicals Co., Ltd. "LA7052", "LA7054", "LA3018", etc. of DIC (share) system.

就與導體層之密著性(剝離強度)之觀點而言,亦較好為活性酯系硬化劑。至於活性酯系硬化劑雖無特別限制,但較好使用一般之酚酯類、硫酚酯類、N-羥基胺酯類、雜環羥基化合物之酯類等之1分子中具有2個以上反應活性高的酯基之化合物。該活性酯系硬化劑較好係藉由使羧酸化合物及/或硫代羧酸化合物與羥基化合物及/或硫醇化合物之縮合反應而得者。尤其就提高耐熱性之觀點而言,較好為由羧酸化合物與羥基化合物獲得之活性酯系硬 化劑,更好為由羧酸化合物與酚化合物及/或萘酚化合物獲得之活性酯系硬化劑。至於羧酸化合物列舉為例如苯甲酸、乙酸、琥珀酸、馬來酸、衣康酸、鄰苯二甲酸、間苯二甲酸、對苯二甲酸、連苯四酸等。酚化合物或萘酚化合物列舉為例如氫醌、間苯二酚、雙酚A、雙酚F、雙酚S、酚酞、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、苯酚、鄰-甲酚、間-甲酚、對-甲酚、兒茶酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、均苯三酚(phloroglucin)、苯三酚、二環戊二烯二酚化合物、酚酚醛清漆等。此處,所謂「二環戊二烯二酚化合物」係指於1分子之二環戊二烯中縮合2分子酚而得之二酚化合物。 From the viewpoint of adhesion to the conductor layer (peel strength), an active ester-based curing agent is also preferred. The active ester-based curing agent is not particularly limited, but preferably has two or more reactions in one molecule such as a general phenolic ester, a thiophenolic ester, an N-hydroxylamine ester, or an ester of a heterocyclic hydroxy compound. A compound having a high activity of an ester group. The active ester-based curing agent is preferably obtained by a condensation reaction of a carboxylic acid compound and/or a thiocarboxylic acid compound with a hydroxy compound and/or a thiol compound. Particularly, from the viewpoint of improving heat resistance, it is preferred that the active ester obtained from the carboxylic acid compound and the hydroxy compound is hard. The agent is more preferably an active ester-based hardener obtained from a carboxylic acid compound and a phenol compound and/or a naphthol compound. The carboxylic acid compound is exemplified by, for example, benzoic acid, acetic acid, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, pyromellitic acid and the like. Phenolic compounds or naphthol compounds are exemplified by, for example, hydroquinone, resorcinol, bisphenol A, bisphenol F, bisphenol S, phenolphthalein, methylated bisphenol A, methylated bisphenol F, methylated bisphenol S, phenol, o-cresol, m-cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2 ,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, phloroglucin, benzenetriol, dicyclopentadiene diphenol compound, phenol Novolac and the like. Here, the "dicyclopentadiene diphenol compound" means a diphenol compound obtained by condensing two molecules of phenol in one molecule of dicyclopentadiene.

具體而言,較好為含二環戊二烯二酚構造之活性酯化合物、含萘構造之活性酯化合物、含酚酚醛清漆之乙醯化物之活性酯化合物、含酚酚醛清漆之苯甲醯化物之活性酯化合物,其中更好為含萘構造之活性酯化合物、含二環戊二烯二酚構造之活性酯化合物。 Specifically, it is preferably an active ester compound containing a dicyclopentadiene diphenol structure, an active ester compound containing a naphthalene structure, an active ester compound of an acetal containing phenol novolac, and benzamidine containing a phenol novolac. The active ester compound of the compound, more preferably an active ester compound having a naphthalene structure or an active ester compound having a dicyclopentadiene diphenol structure.

至於活性酯系硬化劑之市售品,作為含二環戊二烯二酚構造之活性酯化合物列舉為「EXB9451」、「EXB9460」、「EXB9460S」、「HPC-8000-65T」(DIC(股)製),作為含萘構造之活性酯化合物列舉為「EXB9416-70BK」(DIC(股)製),作為含酚酚醛清漆之乙醯化物之活性酯化合物列舉為「DC808」(三菱化學(股)製),作為酚酚醛清漆之苯甲醯化物之活性酯化合物列舉 為「YLH1026」(三菱化學(股)製)等。 As a commercial product of an active ester-based curing agent, as an active ester compound containing a dicyclopentadiene diphenol structure, it is exemplified as "EXB9451", "EXB9460", "EXB9460S", "HPC-8000-65T" (DIC) (manufactured by the company), the active ester compound containing a naphthalene structure is exemplified as "EXB9416-70BK" (manufactured by DIC Co., Ltd.), and the active ester compound of the acetal containing phenol novolac is exemplified as "DC808" (Mitsubishi Chemical Co., Ltd.) )), as an active ester compound of a benzamidine compound of a phenol novolak It is "YLH1026" (Mitsubishi Chemical Co., Ltd.).

至於苯并噁嗪系硬化劑之具體例列舉為昭和高分子(股)製之「HFB2006M」、四國化成工業(股)製之「P-d」、「F-a」。 Specific examples of the benzoxazine-based hardener are "HFB2006M" manufactured by Showa Polymer Co., Ltd., and "P-d" and "F-a" manufactured by Shikoku Chemical Industries Co., Ltd.

至於氰酸酯系硬化劑列舉為例如雙酚A二氰酸酯、多酚氰酸酯(寡聚(3-亞甲基-1,5-伸苯基氰酸酯)、4,4’-亞甲基雙(2,6-二甲基苯基氰酸酯)、4,4’-亞乙基二苯基二氰酸酯、六氟雙酚A二氰酸酯、2,2-雙(4-氰酸酯基)苯基丙烷、1,1-雙(4-氰酸酯基苯基甲烷)、雙(4-氰酸酯基-3,5-二甲基苯基)甲烷、1,3-雙(4-氰酸酯基苯基-1-(甲基亞乙基))苯、雙(4-氰酸酯基苯基)硫醚、及雙(4-氰酸酯基苯基)醚等之2官能氰酸酯樹脂,由酚酚醛清漆及甲酚酚醛清漆等衍生之多官能氰酸酯樹脂,該等氰酸酯樹脂一部分經三嗪化而成之預聚物等。至於氰酸酯系硬化劑之具體例列舉為日本LONZA(股)製之「PT30」及「PT60」(均為酚酚醛清漆型多官能氰酸酯樹脂)、「BA230」(雙酚A二氰酸酯之一部分或全部經三嗪化成三聚物之預聚物)等。 The cyanate-based curing agent is exemplified by, for example, bisphenol A dicyanate, polyphenol cyanate (oligo(3-methylene-1,5-phenylene), 4,4'- Methylene bis(2,6-dimethylphenyl cyanate), 4,4'-ethylene diphenyl dicyanate, hexafluorobisphenol A dicyanate, 2,2-double (4-cyanate group) phenylpropane, 1,1-bis(4-cyanate phenylmethane), bis(4-cyanate-3,5-dimethylphenyl)methane, 1,3-bis(4-cyanatephenyl-1-(methylethylidene))benzene, bis(4-cyanatephenyl) sulfide, and bis(4-cyanate) a bifunctional cyanate resin such as phenyl)ether, a polyfunctional cyanate resin derived from a phenol novolac and a cresol novolak, or a prepolymer obtained by triazine-forming a part of the cyanate resin. Specific examples of the cyanate-based curing agent are "PT30" and "PT60" manufactured by Japan LONZA Co., Ltd. (all are phenol novolac type polyfunctional cyanate resins), and "BA230" (bisphenol A II). A part or all of a cyanate ester is triazine-formed into a prepolymer of a trimer) and the like.

環氧樹脂與硬化劑之量比以[環氧樹脂之環氧基合計數]:[硬化劑之反應基合計數]之比率計,較好為1:0.2~1:2之範圍,更好為1:0.3~1:1.5,又更好為1:0.4~1:1。此處,所謂硬化劑之反應基為活性羥基、活性酯基等,係隨各硬化劑之種類而異。且,所謂環氧樹脂之環氧基合計數係針對所有環氧樹脂將各環氧樹脂之固體成分質量除以環氧當量之值合計而得之值,所謂硬化劑 之反應基合計數係針對所有硬化劑合計各硬化劑之固體成分質量除以反應基當量之值所得之值。藉由使環氧樹脂與硬化劑之量比成為該範圍,而進一步提高樹脂組成物之硬化物的耐熱性。 The ratio of the epoxy resin to the hardener is preferably in the range of 1:0.2 to 1:2, preferably in the ratio of [epoxy group of epoxy resin]: [counting ratio of reactive groups of hardener]. It is 1:0.3~1:1.5, and more preferably 1:0.4~1:1. Here, the reactive group of the curing agent is an active hydroxyl group, an active ester group or the like, which varies depending on the type of each curing agent. Further, the epoxy group count of the epoxy resin is a value obtained by dividing the solid content of each epoxy resin by the value of the epoxy equivalent for all the epoxy resins, so-called hardener. The total number of reaction groups is a value obtained by dividing the solid component mass of each of the hardeners by the value of the reaction group equivalent for all the hardeners. When the ratio of the amount of the epoxy resin to the curing agent is in this range, the heat resistance of the cured product of the resin composition is further improved.

於一實施形態中,用以形成本發明之硬化體所使用之樹脂組成物包含上述無機填充材、環氧樹脂及硬化劑。樹脂組成物較好分別含有二氧化矽作為無機填充材,含有液狀環氧樹脂與固體狀環氧樹脂之混合物(液狀環氧樹脂:固體狀環氧樹脂之質量比較好為1:0.1~1:4之範圍,更好為1:0.3~1:3.5之範圍,又更好為1:0.6~1:3之範圍,最好為1:0.8~1:2.8之範圍)作為環氧樹脂,含有由酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯系硬化劑所組成群組選出之1種以上作為硬化劑。關於組合含有該特定成分之樹脂組成物層,無機填充材、環氧樹脂及硬化劑之較佳含量亦如上述,但其中,較好無機填充材之含量為50質量%~95質量%,環氧樹脂含量為3質量%~50質量%,更好無機填充材含量為50質量%~90質量%,環氧樹脂含量為5質量%~45質量%。關於硬化劑之含量,係以使環氧樹脂之環氧基之合計數與硬化劑之反應基之合計數之比,較好為1:0.2~1:2之範圍,更好為1:0.3~1:1.5之範圍,又更好為1:0.4~1:1之範圍之方式含有。 In one embodiment, the resin composition used to form the cured body of the present invention comprises the inorganic filler, the epoxy resin, and the curing agent. The resin composition preferably contains cerium oxide as an inorganic filler, and contains a mixture of a liquid epoxy resin and a solid epoxy resin (liquid epoxy resin: the quality of the solid epoxy resin is preferably 1:0.1~ The range of 1:4, preferably in the range of 1:0.3 to 1:3.5, more preferably in the range of 1:0.6 to 1:3, preferably in the range of 1:0.8 to 1:2.8) as epoxy resin One or more selected from the group consisting of a phenolic curing agent, a naphthol curing agent, an active ester curing agent, and a cyanate curing agent are used as a curing agent. The resin composition layer containing the specific component is preferably a content of the inorganic filler, the epoxy resin, and the hardener as described above, but among them, the content of the inorganic filler is preferably 50% by mass to 95% by mass. The content of the oxygen resin is 3% by mass to 50% by mass, the content of the inorganic filler is preferably 50% by mass to 90% by mass, and the content of the epoxy resin is 5% by mass to 45% by mass. The content of the hardener is preferably a ratio of the total number of epoxy groups of the epoxy resin to the total of the reactive groups of the hardener, preferably in the range of 1:0.2 to 1:2, more preferably 1:0.3. The range of ~1:1.5 is better included in the range of 1:0.4 to 1:1.

樹脂組成物亦可視需要進一步含熱可塑性樹脂、硬化促進劑、難燃劑及橡膠粒子等添加劑。 The resin composition may further contain an additive such as a thermoplastic resin, a hardening accelerator, a flame retardant, and rubber particles as needed.

(熱可塑性樹脂) (thermoplastic resin)

熱可塑性樹脂列舉為例如苯氧樹脂、聚乙烯乙縮醛樹脂、聚烯烴樹脂、聚丁二烯樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚碸樹脂、聚苯醚樹脂及聚碸樹脂等。熱可塑性樹脂可單獨使用1種,或亦可併用2種以上。 The thermoplastic resin is exemplified by, for example, a phenoxy resin, a polyvinyl acetal resin, a polyolefin resin, a polybutadiene resin, a polyimide resin, a polyamidoximine resin, a polyether oxime resin, a polyphenylene ether resin. And polyanthrene resin and the like. The thermoplastic resin may be used singly or in combination of two or more.

熱可塑性樹脂之聚苯乙烯換算之重量平均分子量較好為8,000~70,000之範圍,更好為10,000~60,000之範圍,又更好為20,000~60,000之範圍。熱可塑性樹脂之聚苯乙烯換算之重量平均分子量係以凝膠滲透層析(GPC)法測定。具體而言,熱可塑性樹脂之聚苯乙烯換算之重量平均分子量可使用島津製作所(股)製之LC-9A/RID-6A作為測定裝置,使用昭和電工(股)製之Shodex K-800P/K-804L/K-804L作為管柱,使用氯仿作為移動相,以管柱溫度40℃進行測定,且使用標準聚苯乙烯之校正線算出。 The polystyrene-equivalent weight average molecular weight of the thermoplastic resin is preferably in the range of 8,000 to 70,000, more preferably in the range of 10,000 to 60,000, still more preferably in the range of 20,000 to 60,000. The polystyrene-equivalent weight average molecular weight of the thermoplastic resin is measured by a gel permeation chromatography (GPC) method. Specifically, the weight average molecular weight of the thermoplastic resin in terms of polystyrene is LC-9A/RID-6A manufactured by Shimadzu Corporation, and the Shodex K-800P/K manufactured by Showa Denko Co., Ltd. is used. -804L/K-804L was used as a column, and chloroform was used as a mobile phase, and the column temperature was measured at 40 ° C, and was calculated using a calibration line of standard polystyrene.

至於苯氧樹脂列舉為例如具有由雙酚A骨架、雙酚F骨架、雙酚S骨架、雙酚苯乙酮骨架、酚醛清漆骨架、聯苯骨架、茀骨架、二環戊二烯骨架、降冰片烯骨架、萘骨架、蒽骨架、金剛烷骨架、萜烯骨架、及三甲基環己烷骨架所組成群組選出之1種以上之骨架的苯氧樹脂。苯氧樹脂之末端可為酚性羥基、環氧基等之任一官能基。苯氧樹脂可單獨使用1種,或亦可併用2種以上。苯氧樹脂之具體例列舉為三菱化學(股)製之「1256」及 「4250」(均為含雙酚A骨架之苯氧樹脂)、「YX8100」(含雙酚S骨架之苯氧樹脂)、及「YX6954」(含雙酚苯乙酮骨架之苯氧樹脂),此外列舉為東都化成(股)製之「FX280」及「FX293」、三菱化學(股)製之「YL7553」、「YL6794」、「YL7213」、「YL7290」及「YL7482」等。 The phenoxy resin is exemplified by, for example, having a bisphenol A skeleton, a bisphenol F skeleton, a bisphenol S skeleton, a bisphenol acetophenone skeleton, a novolak skeleton, a biphenyl skeleton, an anthracene skeleton, a dicyclopentadiene skeleton, and a descending A phenoxy resin having one or more kinds of skeletons selected from the group consisting of a borneol skeleton, a naphthalene skeleton, an anthracene skeleton, an adamantane skeleton, a terpene skeleton, and a trimethylcyclohexane skeleton. The terminal of the phenoxy resin may be any one of a phenolic hydroxyl group, an epoxy group and the like. The phenoxy resin may be used singly or in combination of two or more. Specific examples of the phenoxy resin are listed as "1256" by Mitsubishi Chemical Corporation. "4250" (all phenoxy resins containing bisphenol A skeleton), "YX8100" (phenoxy resin containing bisphenol S skeleton), and "YX6954" (phenoxy resin containing bisphenol acetophenone skeleton), In addition, "FX280" and "FX293" manufactured by Dongdu Chemicals Co., Ltd., "YL7553", "YL6794", "YL7213", "YL7290" and "YL7482" manufactured by Mitsubishi Chemical Corporation are listed.

聚乙烯乙縮醛樹脂之具體例列舉為電化學工業(股)製之電化丁醛4000-2、5000-A、6000-C、6000-EP,積水化學工業(股)製之S-LEC BH系列、BX系列、KS系列、BL系列、BM系列等。 Specific examples of the polyethylene acetal resin are electro-chemical butyraldehyde 4000-2, 5000-A, 6000-C, 6000-EP manufactured by Electrochemical Industry Co., Ltd., S-LEC BH manufactured by Sekisui Chemical Industry Co., Ltd. Series, BX series, KS series, BL series, BM series, etc.

聚醯亞胺樹脂之具體例列舉為新日本理化(股)製之「RIKACOAT SN20」及「RIKACOAT PN20」。聚醯亞胺樹脂之具體例又列舉為使2官能性羥基末端聚丁二烯、二異氰酸酯化合物及四元酸酐反應獲得之直鏈狀聚醯亞胺(日本特開2006-37083號公報記載者)、含聚矽氧烷骨架之聚醯亞胺(日本特開2002-12667號公報及日本特開2000-319386號公報等所記載者)等之改質聚醯亞胺。 Specific examples of the polyimine resin are "RIKACOAT SN20" and "RIKACOAT PN20" manufactured by Nippon Chemical and Chemical Co., Ltd. Specific examples of the polyimine resin include a linear polyimine obtained by reacting a bifunctional hydroxyl-terminated polybutadiene, a diisocyanate compound, and a tetrabasic acid anhydride (Japanese Patent Publication No. 2006-37083) The modified polyimine, such as those which are described in JP-A-2002-12667 and JP-A-2000-319386, and the like.

聚醯胺醯亞胺樹脂之具體例列舉為東洋紡績(股)製之「VYLOMAX HR11NN」及「VYLOMAX HR16NN」。聚醯胺醯亞胺樹脂之具體例且列舉為日立化成工業(股)製之含有聚矽氧烷骨架之聚醯胺醯亞胺「KS9100」、「KS9300」等之改質聚醯胺醯亞胺。 Specific examples of the polyamidoximine resin are "VYLOMAX HR11NN" and "VYLOMAX HR16NN" manufactured by Toyobo Co., Ltd. Specific examples of the polyamidoximine resin are modified polyamines such as polyacrylamide skeletons "KS9100" and "KS9300" manufactured by Hitachi Chemical Co., Ltd. amine.

聚醚碸樹脂之具體例列舉為住友化學(股)製之「PES5003P」等。 Specific examples of the polyether oxime resin are "PES5003P" manufactured by Sumitomo Chemical Co., Ltd., and the like.

聚碸樹脂之具體例列舉為Solvay Advanced Polymers(股)製之聚碸「P1700」、「P3500」等。 Specific examples of the polyanthracene resin are those of the "P1700" and "P3500" manufactured by Solvay Advanced Polymers Co., Ltd.

樹脂組成物中之熱可塑性樹脂之含量較好為0.1質量%~20質量%。藉由使熱可塑性樹脂之含量成為該範圍,可使樹脂組成物之黏度適度,可形成厚度或塊性狀之均一樹脂組成物。樹脂組成物中之熱可塑性樹脂含量更好為0.5質量%~10質量%。 The content of the thermoplastic resin in the resin composition is preferably from 0.1% by mass to 20% by mass. By setting the content of the thermoplastic resin to such a range, the viscosity of the resin composition can be made moderate, and a uniform resin composition having a thickness or a bulk property can be formed. The content of the thermoplastic resin in the resin composition is more preferably from 0.5% by mass to 10% by mass.

作為硬化促進劑,列舉為例如磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑、胍系硬化促進劑等,較好為磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑,更好為胺系硬化促進劑、咪唑系硬化促進劑。 Examples of the curing accelerator include a phosphorus-based curing accelerator, an amine-based curing accelerator, an imidazole-based curing accelerator, and an lanthanum-based curing accelerator. Among them, a phosphorus-based curing accelerator, an amine-based curing accelerator, and an imidazole-based system are preferable. The hardening accelerator is more preferably an amine hardening accelerator or an imidazole hardening accelerator.

磷系硬化促進劑列舉為例如三苯膦、硼酸鏻化合物、四苯基鏻四苯基硼酸鹽、正丁基鏻四苯基硼酸鹽、四丁基鏻癸酸鹽、(4-甲基苯基)三苯基鏻硫代氰酸鹽、四苯基鏻硫代氰酸鹽、丁基三苯基鏻硫代氰酸鹽等,較好為三苯膦、四丁基鏻癸酸鹽。 Phosphorus-based hardening accelerators are exemplified by, for example, triphenylphosphine, bismuth borate, tetraphenylphosphonium tetraphenylborate, n-butylphosphonium tetraphenylborate, tetrabutylphosphonate, (4-methylbenzene) The group is triphenylsulfonium thiocyanate, tetraphenylphosphonium thiocyanate, butyltriphenylphosphonium thiocyanate or the like, preferably triphenylphosphine or tetrabutylphosphonate.

胺系硬化促進劑列舉為例如三乙胺、三丁胺等之三烷胺、4-二甲胺基吡啶、苄基二甲胺、2,4,6-參(二甲胺基甲基)苯酚、1,8-二氮雜雙環(5,4,0)-十一碳烯等,較好為4-二甲胺基吡啶、1,8-二氮雜雙環(5,4,0)-十一碳烯。 The amine-based hardening accelerator is exemplified by a trialkylamine such as triethylamine or tributylamine, 4-dimethylaminopyridine, benzyldimethylamine or 2,4,6-gin(dimethylaminomethyl). Phenol, 1,8-diazabicyclo(5,4,0)-undecene, etc., preferably 4-dimethylaminopyridine, 1,8-diazabicyclo(5,4,0) - undecene.

咪唑系硬化促進劑列舉為例如2-甲基咪唑、2-十一烷基咪唑、2-十七烷基咪唑、1,2-二甲基咪唑、2- 乙基-4-甲基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、1-苄基-2-甲基咪唑、1-苄基-2-苯基咪唑、1-氰乙基-2-甲基咪唑、1-氰乙基-2-十一烷基咪唑、1-氰乙基-2-乙基-4-甲基咪唑、1-氰乙基-2-苯基咪唑、1-氰乙基-2-十一烷基咪唑鎓偏苯三酸鹽、1-氰乙基-2-苯基咪唑鎓偏苯三酸鹽、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-十一烷基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-乙基-4’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪異氰尿酸加成物、2-苯基咪唑異氰尿酸加成物、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑、2,3-二氫-1H-吡咯并[1,2-a]苯并咪唑、1-十二烷基-2-甲基-3-苄基咪唑鎓氯化物、2-甲基咪唑啉、2-苯基咪唑啉等咪唑化合物及咪唑化合物與環氧樹脂之加成物,較好為2-乙基-4-甲基咪唑、1-苄基-2-苯基咪唑。 The imidazole-based hardening accelerator is exemplified by, for example, 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, 2- Ethyl-4-methylimidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl -2-methylimidazole, 1-benzyl-2-phenylimidazole, 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl- 2-ethyl-4-methylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-undecylimidazolium trimellitate, 1-cyanoethyl-2 -Phenylimidazolium trimellitate, 2,4-diamino-6-[2'-methylimidazolyl-(1')]-ethyl-s-triazine, 2,4-diamine -6-[2'-undecyl imidazolyl-(1')]-ethyl-s-triazine, 2,4-diamino-6-[2'-ethyl-4'- Imidazolyl-(1')]-ethyl-s-triazine, 2,4-diamino-6-[2'-methylimidazolyl-(1')]-ethyl-s-triazine Isocyanuric acid adduct, 2-phenylimidazolium isocyanurate adduct, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole , 2,3-Dihydro-1H-pyrrolo[1,2-a]benzimidazole, 1-dodecyl-2-methyl-3-benzylimidazolium chloride, 2-methylimidazoline Imidazole compound such as 2-phenylimidazoline and imidazole compound and epoxy resin Into the composition, preferably 2-ethyl-4-methylimidazole, 1-benzyl-2-phenylimidazole.

胍系硬化促進劑列舉為例如二氰二醯胺、1-甲基胍、1-乙基胍、1-環己基胍、1-苯基胍、1-(鄰-甲苯基)胍、二甲基胍、二苯基胍、三甲基胍、四甲基胍、五甲基胍、1,5,7-三氮雜雙環[4.4.0]癸-5-烯、7-甲基-1,5,7-三氮雜雙環[4.4.0]癸-5-烯、1-甲基雙胍、1-乙基雙胍、1-正丁基雙胍、1-正十八烷基雙胍、1,1-二甲基雙胍、1,1-二乙基雙胍、1-環己基雙胍、1-烯丙基雙胍、1-苯基雙胍、1-(鄰-甲苯基)雙胍等,較好為二氰二醯胺、1,5,7-三氮雜雙環[4.4.0]癸-5-烯。 The lanthanide hardening accelerator is exemplified by, for example, dicyandiamide, 1-methyl hydrazine, 1-ethyl hydrazine, 1-cyclohexyl hydrazine, 1-phenyl fluorene, 1-(o-tolyl) fluorene, and dimethyl Base, diphenyl hydrazine, trimethyl hydrazine, tetramethyl hydrazine, pentamethyl hydrazine, 1,5,7-triazabicyclo[4.4.0]non-5-ene, 7-methyl-1 ,5,7-triazabicyclo[4.4.0]non-5-ene, 1-methylbiguanide, 1-ethylbiguanide, 1-n-butylbiguanide, 1-n-octadecylbiguanide, 1, 1-dimethylbiguanide, 1,1-diethylbiguanide, 1-cyclohexylbiguanide, 1-allyl biguanide, 1-phenylbiguanide, 1-(o-tolyl)biguanide, etc., preferably two Cyanamide, 1,5,7-triazabicyclo[4.4.0]non-5-ene.

硬化促進劑可單獨使用1種,亦可組合2種以上使用。較佳之一實施形態中,樹脂組成物中所含有之硬化促進劑為選自由磷系硬化促進劑、胺系硬化促進劑及咪唑系硬化促進劑所組成群組選出之1種以上。樹脂組成物中之硬化促進劑含量,以環氧樹脂與硬化劑之不揮發成分合計量作為100質量%時,較好在0.05質量%~3質量%之範圍使用。 The curing accelerator may be used singly or in combination of two or more. In a preferred embodiment, the curing accelerator contained in the resin composition is one or more selected from the group consisting of a phosphorus-based curing accelerator, an amine-based curing accelerator, and an imidazole-based curing accelerator. The content of the hardening accelerator in the resin composition is preferably from 0.05% by mass to 3% by mass based on the total amount of the non-volatile components of the epoxy resin and the curing agent as 100% by mass.

難燃劑列舉為例如有機磷系難燃劑、有機系含氮磷化合物、氮化合物、聚矽氧系難燃劑、金屬氫氧化物等。難燃劑可單獨使用1種,或亦可併用2種以上。樹脂組成物層中之難燃劑之含量並無特別限制,但較好為0.5質量%~10質量%,更好為1質量%~9質量%,又更好為1.5質量%~8質量%。 The flame retardant is exemplified by, for example, an organic phosphorus-based flame retardant, an organic nitrogen-containing phosphorus compound, a nitrogen compound, a polyoxygenated flame retardant, a metal hydroxide, or the like. The flame retardant may be used singly or in combination of two or more. The content of the flame retardant in the resin composition layer is not particularly limited, but is preferably from 0.5% by mass to 10% by mass, more preferably from 1% by mass to 9% by mass, even more preferably from 1.5% by mass to 8% by mass. .

作為橡膠粒子係使用例如不溶解於後述有機溶劑中,且與上述環氧樹脂、硬化劑及熱可塑性樹脂等不相溶者。該橡膠粒子一般係以橡膠成分之分子量大到不溶解於有機溶劑或樹脂中之程度,成為粒狀而調製。 For example, the rubber particles are not dissolved in an organic solvent to be described later, and are incompatible with the above-mentioned epoxy resin, curing agent, thermoplastic resin, or the like. The rubber particles are generally prepared in a granular form such that the molecular weight of the rubber component is so large that it is not dissolved in the organic solvent or the resin.

作為橡膠粒子列舉為例如芯殼型橡膠粒子、交聯丙烯腈丁二烯橡膠粒子、交聯苯乙烯丁二烯橡膠粒子、丙烯酸橡膠粒子等。芯殼型橡膠粒子為具有芯層與殼層之橡膠粒子,列舉為例如外層之殼層以玻璃狀聚合物構成,內層之芯層以橡膠狀聚合物構成之2層構造,或外層之殼層以玻璃狀聚合物構成,中間層以橡膠狀聚合物構成,芯層以玻璃狀聚合物構成之3層構造者等。玻璃狀聚 合物層以例如甲基丙烯酸甲酯聚合物等構成,橡膠狀聚合物層以例如丙烯酸丁酯聚合物(丁基橡膠)等構成。橡膠粒子可單獨使用1種,或亦可併用2種以上。 Examples of the rubber particles include core-shell type rubber particles, crosslinked acrylonitrile butadiene rubber particles, crosslinked styrene butadiene rubber particles, and acrylic rubber particles. The core-shell type rubber particles are rubber particles having a core layer and a shell layer, and are exemplified by a two-layer structure in which a shell layer of an outer layer is a glassy polymer, a core layer of an inner layer is a rubbery polymer, or a shell of an outer layer. The layer is composed of a glassy polymer, the intermediate layer is composed of a rubbery polymer, and the core layer is a three-layer structure composed of a glassy polymer. Glassy poly The layer is composed of, for example, a methyl methacrylate polymer, and the rubber-like polymer layer is composed of, for example, a butyl acrylate polymer (butyl rubber) or the like. The rubber particles may be used singly or in combination of two or more.

橡膠粒子之平均粒徑較好為0.005μm~1μm之範圍,更好為0.2μm~0.6μm之範圍。橡膠粒子之平均粒徑可使用動態光散射法測定。例如,可利用超音波等將橡膠粒子均一分散於適當有機溶劑中,且使用濃厚系粒徑分析儀(FPAR-1000;大塚電子(股)製),以質量基準作成橡膠粒子之粒度分佈,以其中值直徑作為平均粒徑而測定。樹脂組成物中之橡膠粒子含量較好為1質量%~10質量%,更好為2質量%~5質量%。 The average particle diameter of the rubber particles is preferably in the range of 0.005 μm to 1 μm, more preferably in the range of 0.2 μm to 0.6 μm. The average particle diameter of the rubber particles can be measured by dynamic light scattering. For example, the rubber particles may be uniformly dispersed in a suitable organic solvent by ultrasonic waves or the like, and a particle size distribution of the rubber particles may be prepared on a mass basis using a thick particle size analyzer (FPAR-1000; manufactured by Otsuka Electronics Co., Ltd.). The value diameter is determined as the average particle diameter. The content of the rubber particles in the resin composition is preferably from 1% by mass to 10% by mass, more preferably from 2% by mass to 5% by mass.

用以形成本發明之硬化體所使用之樹脂組成物亦可視需要含其他添加劑,該其他添加劑列舉為例如有機銅化合物、有機鋅化合物及有機鈷化合物等有機金屬化合物,以及有機填料、增黏劑、消泡劑、勻化劑、密著性賦予劑、著色劑及硬化性樹脂等之樹脂添加劑等。 The resin composition used to form the hardened body of the present invention may optionally contain other additives, such as organic metal compounds such as organic copper compounds, organic zinc compounds and organic cobalt compounds, and organic fillers and tackifiers. A resin additive such as an antifoaming agent, a leveling agent, an adhesion imparting agent, a coloring agent, and a curable resin.

本發明之硬化體可使用作為用以形成印刷配線板之絕緣層的硬化體(印刷配線板之絕緣層用硬化體)。其中,可較好地使用作為利用增層方式之印刷配線板之製造中,用以形成絕緣層之硬化體(印刷配線板之增層絕緣層用硬化體),且可進一步使用作為使用圖型形成用乾膜以形成經圖型加工之導體層之硬化體(使用圖型形成用乾膜形成經圖型加工之導體層之印刷配線板的增層絕緣層用硬化體)。 As the hardened body of the present invention, a hardened body (hardened body for an insulating layer of a printed wiring board) for forming an insulating layer of a printed wiring board can be used. Among them, a cured body (hardened body for a build-up insulating layer of a printed wiring board) for forming an insulating layer in the production of a printed wiring board using a build-up method can be preferably used as a use pattern. A hardened body (a hardened body for a build-up insulating layer of a printed wiring board in which a pattern-processed conductor layer is formed by using a dry film for pattern formation) is formed by using a dry film to form a patterned conductor layer.

用以形成本發明之硬化體所使用之樹脂組成物層就可簡便且有效地進行對電路基板之積層之觀點而言,較好以接著薄片之形態使用該樹脂組成物層。 The resin composition layer can be used in the form of a subsequent sheet in order to easily and efficiently form a resin composition layer for forming a cured body of the present invention.

於一實施形態中,該接著薄片包含支撐體、與該支撐體接合之樹脂組成物層(接著層)。 In one embodiment, the succeeding sheet comprises a support and a resin composition layer (adjacent layer) joined to the support.

支撐體可較好地使用由塑膠材料所成之薄膜。至於塑膠材料列舉為例如聚對苯二甲酸乙二酯(以下有時簡稱為「PET」)、聚萘二甲酸乙二酯(以下有時簡稱為「PEN」)等聚酯,聚碳酸酯(以下有時簡稱為「PC」)、聚甲基丙烯酸甲酯(PMMA)等之丙烯酸、環狀聚烯烴、三乙醯基纖維素(TAC)、聚醚硫醚(PES)、聚醚酮、聚醯亞胺等。其中,較好為聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯,最好為便宜之聚對苯二甲酸乙二酯。較佳之一實施形態中,支撐體為聚對苯二甲酸乙二酯薄膜。 The support can preferably use a film made of a plastic material. The plastic material is exemplified by polyester such as polyethylene terephthalate (hereinafter sometimes abbreviated as "PET") or polyethylene naphthalate (hereinafter sometimes abbreviated as "PEN"), and polycarbonate ( Hereinafter, it may be simply referred to as "PC"), acrylic acid such as polymethyl methacrylate (PMMA), cyclic polyolefin, triethyl fluorenyl cellulose (TAC), polyether thioether (PES), polyether ketone, Polyimine and the like. Among them, polyethylene terephthalate or polyethylene naphthalate is preferred, and polyethylene terephthalate is preferably inexpensive. In a preferred embodiment, the support is a polyethylene terephthalate film.

支撐體亦可對與樹脂組成物層接合之側的表面施以霧面處理、電暈處理。且,作為支撐體,亦可使用與樹脂組成物層接合之側的表面具有脫模層之附脫模層之支撐體。 The support may also be subjected to a matte treatment or a corona treatment on the surface on the side joined to the resin composition layer. Further, as the support, a support having a release layer with a release layer on the surface on the side joined to the resin composition layer may be used.

支撐體之厚度並無特別限制,但較好為5μm~75μm之範圍,更好為10μm~60μm之範圍。又,支撐體為附脫模層之支撐體時,附脫模層之支撐體整體之厚度較好在上述範圍。 The thickness of the support is not particularly limited, but is preferably in the range of 5 μm to 75 μm, more preferably in the range of 10 μm to 60 μm. Further, when the support is a support having a release layer, the thickness of the entire support having the release layer is preferably in the above range.

接著薄片可藉由使樹脂組成物溶解於有機溶劑中調製樹脂漆料,使用模嘴塗佈器等將該樹脂漆料塗佈 於支撐體上,再經加熱,或者吹以熱風等使有機溶劑乾燥而形成樹脂組成物層加以製造。 Then, the sheet can be prepared by dissolving the resin composition in an organic solvent to prepare a resin paint, and coating the resin paint using a die coater or the like. The organic solvent is dried on the support by heating or by blowing with hot air to form a resin composition layer.

有機溶劑可列舉為例如丙酮、甲基乙基酮及環己酮等酮類,乙酸乙酯、乙酸丁酯、溶纖素乙酸酯、丙二醇單甲基醚乙酸酯及卡必醇乙酸酯等乙酸酯類,溶纖素及丁基卡必醇等卡必醇類、甲苯及二甲苯等芳香族烴類、二甲基甲醯胺、二甲基乙醯胺及N-甲基吡咯啶酮等之醯胺系溶劑等。有機溶劑可單獨使用1種,或亦可併用2種以上。 The organic solvent may, for example, be a ketone such as acetone, methyl ethyl ketone or cyclohexanone, ethyl acetate, butyl acetate, fibrin acetate, propylene glycol monomethyl ether acetate, and carbitol acetic acid. Acetates such as esters, carbitols such as cellosolve and butyl carbitol, aromatic hydrocarbons such as toluene and xylene, dimethylformamide, dimethylacetamide and N-methylpyrrole A guanamine-based solvent such as ketone or the like. The organic solvent may be used singly or in combination of two or more.

乾燥條件並無特別限制,但較好乾燥至樹脂組成物層中之有機溶劑含量(殘留溶劑量)成為10質量%以下,較好成為5質量%以下。殘留溶劑量之下限並無特別限制,但就樹脂組成物層之作業性或防止以薄片形態之熔融黏度上升之觀點而言,較好為0.5質量%以上,更好為1質量%以上。雖亦隨著樹脂漆料中之有機溶劑之沸點而異,但使用例如含30質量%~60質量%的有機溶劑之樹脂組成物時,可藉由在50℃~150℃乾燥3~10分鐘,而形成樹脂組成物。 The drying conditions are not particularly limited, but the organic solvent content (residual solvent amount) in the resin composition layer is preferably 10% by mass or less, preferably 5% by mass or less. The lower limit of the amount of the residual solvent is not particularly limited, but is preferably 0.5% by mass or more, and more preferably 1% by mass or more from the viewpoint of workability of the resin composition layer or prevention of increase in melt viscosity in the form of a sheet. Although it varies depending on the boiling point of the organic solvent in the resin paint, when a resin composition containing, for example, 30% by mass to 60% by mass of an organic solvent is used, it can be dried at 50 ° C to 150 ° C for 3 to 10 minutes. And a resin composition is formed.

接著薄片中,樹脂組成物層之未與支撐體接合之面(亦即,與支撐體相反之面)上可進一步根據支撐體而積層保護薄膜。保護薄膜之厚度並無特別限制,但可為例如1μm~40μm。藉由積層保護薄膜,可防止污垢等附著於樹脂組成物層之表面或防止傷痕。接著薄片可捲成滾筒狀保存,且於製造本發明之硬化體時,可藉由剝離保護 薄膜而使用。 Next, in the sheet, the surface of the resin composition layer which is not bonded to the support (that is, the surface opposite to the support) may be further laminated with a protective film according to the support. The thickness of the protective film is not particularly limited, but may be, for example, 1 μm to 40 μm. By laminating the protective film, it is possible to prevent dirt or the like from adhering to the surface of the resin composition layer or to prevent scratches. Then, the sheet can be wound up in a roll shape, and can be protected by peeling when manufacturing the hardened body of the present invention. Use as a film.

[硬化體之製造方法] [Method of Manufacturing Hardened Body]

本發明之硬化體之製造方法,其特徵為包含(A)將樹脂組成物層積層於電路基板上之步驟,及(B)使樹脂組成物層熱硬化,於電路基板上形成硬化體之步驟,且將樹脂組成物層之最低熔融黏度溫度設為Tv(℃)時,樹脂組成物層之積層溫度為Tv-35℃~Tv+35℃,將樹脂組成物層之厚度設為x(μm),將電路基板的電路配線上之硬化體厚度設為y(μm)時,為0.3<y/x≦1且y≦15。 A method for producing a cured body of the present invention, comprising the steps of: (A) laminating a resin composition on a circuit board, and (B) thermally curing the resin composition layer to form a hardened body on the circuit board; When the lowest melt viscosity temperature of the resin composition layer is Tv (° C.), the laminate temperature of the resin composition layer is Tv-35° C. to Tv + 35° C., and the thickness of the resin composition layer is set to x (μm). When the thickness of the hardened body on the circuit wiring of the circuit board is y (μm), it is 0.3 < y / x ≦ 1 and y ≦ 15.

步驟(A)中,將樹脂組成物層積層於電路基板上。步驟(A)中使用之電路基板及樹脂組成物層之構成係如上述。 In the step (A), the resin composition is laminated on the circuit board. The circuit board and the resin composition layer used in the step (A) are as described above.

本發明之硬化體之製造方法中,就抑制電路基板上形成之硬化體表面起伏之觀點而言,係在Tv-35℃~Tv+35℃之溫度範圍將樹脂組成物層積層於電路基板上。就抑制電路基板上形成之硬化體表面起伏之觀點而言,步驟(A)中之樹脂組成物層之積層溫度較好為Tv-30℃~Tv+30℃之範圍,更好為Tv-25℃~Tv+25℃之範圍,又更好為Tv-20℃~Tv+25℃之範圍,最好為Tv-15℃~Tv+15℃之範圍。 In the method for producing a cured body of the present invention, the resin composition is laminated on the circuit substrate in a temperature range of Tv-35 ° C to Tv + 35 ° C from the viewpoint of suppressing the surface roughness of the hardened body formed on the circuit board. . The layer temperature of the resin composition layer in the step (A) is preferably in the range of Tv-30 ° C to Tv + 30 ° C, more preferably Tv - 25 , from the viewpoint of suppressing the surface undulation of the hardened body formed on the circuit substrate. The range of °C~Tv+25°C is preferably in the range of Tv-20°C~Tv+25°C, preferably in the range of Tv-15°C~Tv+15°C.

樹脂組成物層對電路基板之積層較好在上述 積層溫度條件下,以輥壓著或加壓壓著等,以使樹脂組成物層與電路基板接合之方式進行層合處理。其中,更好為在減壓下進行層合或真空層合法。 The resin composition layer is preferably laminated on the circuit substrate in the above The laminate treatment is carried out by laminating or pressing under pressure at a laminate temperature to bond the resin composition layer to the circuit board. Among them, it is more preferable to carry out lamination or vacuum lamination under reduced pressure.

較佳之一實施形態中,樹脂組成物層對電路基板之積層可使用上述接著薄片進行。詳言之,可進行層合處理以使接著薄片之樹脂組成物層與電路基板接合。接著薄片具有保護薄膜時,可在去除保護薄膜後供給於步驟(A)中。又,支撐體之剝離可在步驟(A)與步驟(B)之間實施,亦可在步驟(B)之後實施,但就抑制粗糙度不均之觀點而言,較好在步驟(A)與步驟(B)之間實施。 In a preferred embodiment, the laminate of the resin composition layer on the circuit board can be carried out using the above-mentioned succeeding sheet. In detail, a lamination process may be performed to bond the resin composition layer of the subsequent sheet to the circuit substrate. When the sheet has a protective film, it can be supplied to the step (A) after the protective film is removed. Further, the peeling of the support may be carried out between the step (A) and the step (B), or may be carried out after the step (B), but it is preferably in the step (A) from the viewpoint of suppressing unevenness in roughness. Implemented with step (B).

層合處理較好一面考慮前述之x及y之關係,一面將壓著壓力設在1kgf/cm2~11kgf/cm2(0.098MPa~1.078MPa)之範圍,將壓著時間設為5秒~180秒之範圍,空氣壓力設為20mmHg(26.7hPa)以下之減壓下實施。 Laminating process is preferably the one side to consider the relationship of x and y is, one side of the pressing pressure was set in the range of 1kgf / cm 2 ~ 11kgf / cm 2 (0.098MPa ~ 1.078MPa) , the pressing time is set to 5 seconds to In the range of 180 seconds, the air pressure was set to 20 mmHg (26.7 hPa) or less under reduced pressure.

層合處理後,亦可藉由金屬板之熱加壓,進行經層合處理之接著薄片之平滑化處理。該平滑化處理可在常壓下(大氣壓下),以經加熱之SUS鏡板等金屬板,藉由加熱或加壓接著薄片而實施。加熱及加壓條件可為與上述層合處理相同之條件。 After the lamination treatment, the smoothing treatment of the subsequent sheet by the lamination treatment may be performed by hot pressing of a metal plate. This smoothing treatment can be carried out under normal pressure (at atmospheric pressure) with a metal plate such as a heated SUS mirror plate by heating or pressurizing the sheet. The heating and pressurizing conditions may be the same conditions as the above lamination treatment.

層合處理(及平滑化處理)可使用市售之真空層合機實施。市售之真空層合機列舉為例如名機製作所(股)製之真空加壓式層合機、Nichigo Morton(股)製之真空塗佈機等。 The lamination treatment (and smoothing treatment) can be carried out using a commercially available vacuum laminator. Commercially available vacuum laminating machines are, for example, vacuum press laminators manufactured by Nippon Seisakusho Co., Ltd., vacuum coaters manufactured by Nichigo Morton Co., Ltd., and the like.

步驟(B)中,使樹脂組成物層熱硬化,於電路 基板上形成硬化體。 In the step (B), the resin composition layer is thermally hardened in the circuit A hardened body is formed on the substrate.

就減小所形成之硬化體表面起伏並且抑制粗糙度不均發生之觀點而言,步驟(B)中,較好使樹脂組成物層在溫度T1保持一定時間後,在比溫度T1高之溫度T2下保持一定時間進行熱硬化。 In the step (B), it is preferred that the resin composition layer is kept at a temperature T 1 for a certain period of time and is higher than the temperature T 1 from the viewpoint of reducing the surface roughness of the formed hardened body and suppressing occurrence of roughness unevenness. The temperature is maintained at a temperature T 2 for a certain period of time.

溫度T1較好為未達Tv之溫度(℃),更好為Tv-10℃以下,又更好為Tv-20℃以下,最好為Tv-25℃以下。溫度T1之下限較好為Tv-60℃以上,更好為Tv-50℃以上,又更好為Tv-40℃以上。 The temperature T 1 is preferably a temperature (° C.) which is less than Tv, more preferably Tv - 10 ° C or less, more preferably Tv - 20 ° C or less, and most preferably Tv - 25 ° C or less. The lower limit of the temperature T 1 is preferably Tv-60 ° C or higher, more preferably Tv - 50 ° C or higher, and even more preferably Tv - 40 ° C or higher.

在溫度T1保持之時間係隨溫度T1之值而定,但較好為10分鐘以上,更好為10分鐘~150分鐘,又更好為15分鐘~120分鐘。 The time during which the temperature T 1 is maintained depends on the value of the temperature T 1 , but is preferably 10 minutes or longer, more preferably 10 minutes to 150 minutes, and even more preferably 15 minutes to 120 minutes.

溫度T2較好為Tv以上之溫度(℃),更好為Tv+10℃以上,又更好為Tv+20℃以上,再更好為Tv+30℃,最好為Tv+40℃以上。溫度T2之上限較好為Tv+100℃以下,更好為Tv+90℃以下,又更好為Tv+80℃以下,再更好為Tv+70℃以下,最好為Tv+60℃以下。 The temperature T 2 is preferably a temperature above Tv (° C.), more preferably Tv+10° C. or more, more preferably Tv+20° C., and even more preferably Tv+30° C., preferably Tv+40° C. or higher. . The upper limit of the temperature T 2 is preferably less Tv + 100 ℃, more preferably less Tv + 90 ℃, and more preferably less Tv + 80 ℃, further more preferably less Tv + 70 ℃, preferably Tv + 60 ℃ the following.

在溫度T2保持之時間係隨溫度T2之值而定,但較好為10分鐘以上,更好為10分鐘~100分鐘,又更好為10分鐘~80分鐘。 Holding at the temperature T 2 of the system over time of the value of temperature T 2 may be, but is preferably 10 minutes or more, more preferably 10 minutes to 100 minutes, and more preferably from 10 minutes to 80 minutes.

就減小所形成之硬化體表面起伏並且抑制粗糙度不均發生之觀點而言,步驟(B)中之樹脂組成物層之熱硬化較好在未達Tv之溫度保持10分鐘以上後,在Tv以上之溫度保持10分鐘以上而實施,更好在Tv-60℃以上 且未達Tv之溫度保持10分鐘以上後,在Tv以上且Tv+100℃以下之溫度保持10分鐘而實施,又更好在Tv-60℃以上且未達Tv之溫度保持10分鐘以上後,在Tv+10℃以上且Tv+100℃以下之溫度保持10分鐘而實施,再更好在Tv-50℃以上且在Tv-10℃以下之溫度保持10分鐘以上後,在Tv+10℃以上且Tv+90℃以下之溫度保持10分鐘而實施,又再更好在Tv-40℃以上且在Tv-20℃以下之溫度保持10分鐘以上後,在Tv+20℃以上且在Tv+80℃以下之溫度保持10分鐘而實施。 The thermal hardening of the resin composition layer in the step (B) is preferably carried out at a temperature less than Tv for more than 10 minutes from the viewpoint of reducing the surface roughness of the formed hardened body and suppressing occurrence of roughness unevenness. The temperature above Tv is maintained for more than 10 minutes, preferably above Tv-60 °C. And after the temperature of Tv is not maintained for 10 minutes or more, it is carried out at a temperature of Tv or more and Tv+100 ° C or lower for 10 minutes, and more preferably after Tv-60 ° C or more and the temperature of Tv is not maintained for 10 minutes or more. It is carried out at a temperature of Tv + 10 ° C or higher and Tv + 100 ° C or lower for 10 minutes, and more preferably at a temperature of Tv - 50 ° C or higher and at a temperature of Tv - 10 ° C or lower for 10 minutes or more, and then at Tv + 10 ° C or higher. And the temperature below Tv+90 ° C is maintained for 10 minutes, and it is better to maintain the temperature above Tv-40 ° C and above Tv -20 ° C for more than 10 minutes, after Tv + 20 ° C and above and at Tv + 80 The temperature below °C was maintained for 10 minutes.

步驟(B)可在加壓下實施、可在常壓下實施或亦可在減壓下實施,但就減小所形成之硬化體表面起伏並且抑制粗糙度不均發生之觀點而言,較好以0.075mmHg~3751mmHg(0.1hPa~5000hPa)之範圍,更好為1mmHg~1875mmHg(1.3hPa~2500hPa)之範圍之空氣壓實施。其中,步驟(B)較好在常壓下實施。 Step (B) may be carried out under pressure, may be carried out under normal pressure or may be carried out under reduced pressure, but in terms of reducing the surface roughness of the formed hardened body and suppressing occurrence of roughness unevenness, It is preferably carried out in the range of 0.075 mmHg to 3751 mmHg (0.1 hPa to 5000 hPa), more preferably in the range of 1 mmHg to 1875 mmHg (1.3 hPa to 2500 hPa). Among them, the step (B) is preferably carried out under normal pressure.

自溫度T1到溫度T2之升溫速度並無特別限制,但較好為1.5℃/分鐘~30℃/分鐘,更好為2℃/分鐘~30℃/分鐘,又更好為4℃/分鐘~20℃/分鐘,再更好為4℃/分鐘~10℃/分鐘。 The temperature increase rate from the temperature T 1 to the temperature T 2 is not particularly limited, but is preferably from 1.5 ° C / min to 30 ° C / min, more preferably from 2 ° C / min to 30 ° C / min, and even more preferably 4 ° C / Minutes ~ 20 ° C / min, and more preferably 4 ° C / min ~ 10 ° C / min.

如先前所述,就一面實現層之薄型化一面抑制粗糙度不均發生之觀點而言,重要的是於將樹脂組成物層之厚度設為x(μm),將電路基板的電路配線上之硬化體厚度設為y(μm)時,以使x及y滿足0.3<y/x≦1且y≦15之方式,實施樹脂組成物層之積層及熱硬化。x、y及y/x 比之較佳範圍如上述。 As described above, from the viewpoint of suppressing occurrence of roughness unevenness while achieving thinning of the layer, it is important to set the thickness of the resin composition layer to x (μm) to circuit the circuit board. When the thickness of the hardened body is y (μm), the resin composition layer is laminated and thermally cured so that x and y satisfy 0.3<y/x≦1 and y≦15. x, y, and y/x The preferred range is as described above.

[粗化硬化體] [roughened hardened body]

本發明之粗化硬化體可使本發明之硬化進行粗化處理而形成。 The roughened and hardened body of the present invention can be formed by subjecting the hardening of the present invention to a roughening treatment.

粗化處理之順序、條件並無特別限制,可採用形成印刷配線板之絕緣層時通常使用之習知順序、條件。例如,可依序實施以膨潤液之膨潤處理、以氧化劑之粗化處理、以中和液之中和處理,使硬化體表面進行粗化處理。至於膨潤液並無特別限制,但可列舉為鹼溶液、界面活性劑溶液等,較佳為鹼溶液,至於該鹼溶液更好為氫氧化鈉溶液、氫氧化鉀溶液。市售之膨潤液列舉為例如日本ATOTECH(股)製之Sweeling Dip Securiganth P、Sweeling Dip Securiganth SBU等。以膨潤液之膨潤處理並無特別限制,可藉由例如將硬化體浸漬在30~90℃之膨潤液中1分鐘~20分鐘而進行。就將硬化體之樹脂之膨潤抑制至適度程度之觀點而言,較好使硬化體浸漬在40~80℃之膨潤液中5秒~15分鐘。至於氧化劑並無特別限制,列舉為例如將過錳酸鉀或過錳酸鈉溶解於氫氧化鈉之水溶液中而成之鹼性過錳酸溶液。利用鹼性過錳酸溶液等氧化劑之粗化處理較好將硬化體浸漬在加熱至60℃~80℃之氧化劑溶液中10分鐘~30分鐘而進行。且,鹼性過錳酸溶液中之過錳酸鹽之濃度較好為5質量%~10質量%。市售之氧化劑列舉為例如日本ATOTECH(股)製之Concentrate. Compact CP、Doesing Solution Securiganth P等之鹼性過錳酸溶液。且,中和液較好為酸性水溶液,市售品列舉為例如日本ATOTECH(股)製之Reduction Solution Securigant P。利用中和液之處理可藉由將經氧化劑溶液施以粗化處理之處理面浸漬在30~80℃之中和液中5分鐘~30分鐘而進行。就作業性之觀點而言,較好為將以氧化劑溶液施以粗化處理之對象物浸漬在40~70℃之中和液中5分鐘~20分鐘之方法。 The order and conditions of the roughening treatment are not particularly limited, and conventional sequences and conditions which are generally used when forming an insulating layer of a printed wiring board can be employed. For example, the surface of the hardened body may be subjected to a roughening treatment by a swelling treatment of the swelling liquid, a roughening treatment with an oxidizing agent, and a neutralization treatment with a neutralizing liquid. The swelling liquid is not particularly limited, and examples thereof include an alkali solution, a surfactant solution, and the like, and an alkali solution is preferred. The alkali solution is preferably a sodium hydroxide solution or a potassium hydroxide solution. Commercially available swelling liquids are exemplified by, for example, Sweering Dip Securiganth P, Sweering Dip Securiganth SBU, etc., manufactured by ATOTECH Co., Ltd., Japan. The swelling treatment of the swelling liquid is not particularly limited, and it can be carried out, for example, by immersing the hardened body in a swelling liquid at 30 to 90 ° C for 1 minute to 20 minutes. From the viewpoint of suppressing the swelling of the resin of the hardened body to an appropriate degree, the cured body is preferably immersed in a swelling liquid at 40 to 80 ° C for 5 seconds to 15 minutes. The oxidizing agent is not particularly limited, and examples thereof include an alkaline permanganic acid solution obtained by dissolving potassium permanganate or sodium permanganate in an aqueous solution of sodium hydroxide. The roughening treatment using an oxidizing agent such as an alkaline permanganic acid solution is preferably carried out by immersing the hardened body in an oxidizing agent solution heated to 60 ° C to 80 ° C for 10 minutes to 30 minutes. Further, the concentration of the permanganate in the alkaline permanganic acid solution is preferably from 5% by mass to 10% by mass. Commercially available oxidizing agents are listed, for example, as Concentrate manufactured by ATOTECH Co., Ltd. of Japan. Alkaline permanganic acid solution such as Compact CP, Doesing Solution Securiganth P, etc. Further, the neutralizing liquid is preferably an acidic aqueous solution, and a commercially available product is, for example, a Reduction Solution Securigant P manufactured by ATOTECH Co., Ltd., Japan. The treatment with the neutralizing solution can be carried out by immersing the treated surface subjected to the roughening treatment with the oxidizing agent solution in 30 to 80 ° C and in the liquid for 5 minutes to 30 minutes. From the viewpoint of workability, the object to be subjected to the roughening treatment with the oxidizing agent solution is preferably immersed in 40 to 70 ° C and in the liquid for 5 minutes to 20 minutes.

過去,使用薄的樹脂組成物層且將表面起伏小的硬化體設置在電路基板上時,起伏之凸部(亦即,電路基板之電路配線上之硬化體表面)與凹部(亦即,電路基板之無電路配線之部分上之硬化體表面)會有因粗化處理後呈現大為不同之表面粗糙度而發生粗糙度不均問題之情況。相對於此,本發明之硬化體經粗化處理所得之本發明之粗化硬化體之粗糙度不均發生受到抑制。亦即,本發明之粗化硬化體之特徵為電路基板之電路配線上之粗化硬化體表面之算術平均粗糙度(Ra1)與電路基板之無電路配線部分之上之粗化硬化體表面之算術平均粗糙度(Ra2)之差(|Ra1-Ra2|)較小。本發明之粗化硬化體中,|Ra1-Ra2|之值,就微細配線形成性之觀點而言,較好為160nm以下,更好為140nm以下,又更好為120nm以下,最好為100nm以下、90nm以下、80nm以下、70nm以下、60nm以下、或50nm以下。|Ra1-Ra2|之值愈低愈好,其下限可為0nm。 In the past, when a thin resin composition layer was used and a hard surface having a small surface relief was placed on a circuit substrate, the convex portion of the undulation (that is, the surface of the hardened body on the circuit wiring of the circuit substrate) and the concave portion (that is, the circuit) The surface of the hardened body on the portion of the substrate having no circuit wiring may have a problem of unevenness in roughness due to a surface roughness which is greatly different after the roughening treatment. On the other hand, the roughness unevenness of the roughened hardened body of the present invention obtained by the roughening treatment of the cured body of the present invention is suppressed. That is, the roughened hardened body of the present invention is characterized by the arithmetic mean roughness (Ra 1 ) of the surface of the roughened hardened body on the circuit wiring of the circuit substrate and the roughened hardened surface on the circuit-free wiring portion of the circuit substrate. The difference in arithmetic mean roughness (Ra 2 ) (|Ra 1 -Ra 2 |) is small. In the roughened and hardened body of the present invention, the value of |Ra 1 -Ra 2 | is preferably 160 nm or less, more preferably 140 nm or less, still more preferably 120 nm or less, from the viewpoint of fine wiring formation properties. It is 100 nm or less, 90 nm or less, 80 nm or less, 70 nm or less, 60 nm or less, or 50 nm or less. The lower the value of |Ra 1 -Ra 2 |, the lower the lower limit can be 0 nm.

將使用薄的樹脂組成物層將表面起伏小的硬化體設置於電路基板上時,電路基板之電路配線上之粗化硬化體表面之算術平均粗糙度(Ra1)會有比電路基板之無電路配線部分上之粗化硬化體表面之算術平均粗糙度(Ra2)高之傾向。就微細配線形成性之觀點而言,本發明之粗化硬化體中,Ra1較好為300nm以下,更好為270nm以下,又更好為240nm以下,最好為210nm以下、200nm以下、190nm以下、180nm以下、170nm以下、或160nm以下。本發明之粗化硬化體中,Ra2與Ra1之關係中,較好|Ra1-Ra2|之值係成為上述範圍之值。又,本發明之粗化硬化體中,Ra1及Ra2之下限並無特別限制,但為了使該粗化硬化體與於其上形成之導體層之剝離強度安定,而設為10nm以上、30nm以上等。 When a thin resin composition layer is used to mount a hard surface having a small surface relief on a circuit board, the arithmetic mean roughness (Ra 1 ) of the surface of the roughened hard surface on the circuit wiring of the circuit substrate may be lower than that of the circuit substrate. The arithmetic mean roughness (Ra 2 ) of the surface of the roughened hardened body on the circuit wiring portion tends to be high. In the roughened and cured body of the present invention, Ra 1 is preferably 300 nm or less, more preferably 270 nm or less, still more preferably 240 nm or less, and most preferably 210 nm or less, 200 nm or less, and 190 nm. Hereinafter, it is 180 nm or less, 170 nm or less, or 160 nm or less. In the roughened and hardened body of the present invention, in the relationship between Ra 2 and Ra 1 , the value of |Ra 1 -Ra 2 | is preferably a value within the above range. Further, roughening of the cured body of the present invention, Ra Ra 1 and 2, as the lower limit is not particularly limited, but in order to make the peeling of the conductor layer on the roughened hardened strength and stability of formed thereon, and is set to 10nm or more, 30nm or more.

本發明之粗化硬化體係將本發明之硬化體進行粗化處理而得,其表面之最大剖面高度Rt或厚度等物性值係依據本發明之硬化體之該等。例如,本發明之粗化硬化體之特徵為表面最大剖面高度Rt為3.5μm以下,且表面起伏小。本發明之粗化硬化體之表面最大剖面高度Rt較好為3.3μm以下,更好為3.1μm以下,又更好為2.9μm以下、2.7μm以下、2.5μm以下、2.3μm以下、2.1μm以下、或1.9μm以下。又,本發明之粗化硬化體中,電路基板之電路配線上之粗化硬化體之厚度為15μm以下,較好為14μm以下,更好為12μm以下,又更好為10μm以下,再更好為9μm以下、8μm以下、7μm以下或6 μm以下。電路基板之電路配線上之粗化硬化體之厚度下限通常為0.5μm以上,較好為1μm以上。 The roughening and hardening system of the present invention is obtained by subjecting the hardened body of the present invention to a roughening treatment, and the physical property values such as the maximum cross-sectional height Rt or the thickness of the surface are in accordance with the hardened body of the present invention. For example, the roughened hardened body of the present invention is characterized in that the surface maximum cross-sectional height Rt is 3.5 μm or less and the surface undulation is small. The surface maximum cross-sectional height Rt of the roughened and hardened body of the present invention is preferably 3.3 μm or less, more preferably 3.1 μm or less, still more preferably 2.9 μm or less, 2.7 μm or less, 2.5 μm or less, 2.3 μm or less, or 2.1 μm or less. , or 1.9μm or less. Further, in the roughened and cured body of the present invention, the thickness of the roughened and hardened body on the circuit wiring of the circuit board is 15 μm or less, preferably 14 μm or less, more preferably 12 μm or less, still more preferably 10 μm or less, and even better. 9 μm or less, 8 μm or less, 7 μm or less, or 6 Below μm. The lower limit of the thickness of the roughened and hardened body on the circuit wiring of the circuit board is usually 0.5 μm or more, preferably 1 μm or more.

[積層體] [layered body]

本發明之積層體具備本發明之粗化硬化體及於該粗化硬化體之表面形成之導體層。 The laminate of the present invention comprises the roughened and hardened body of the present invention and a conductor layer formed on the surface of the roughened and hardened body.

導體層係由金屬層所成,導體層中使用之金屬並無特別限制,但較佳之一實施形態中,導體層包含由金、鉑、銀、銅、鋁、鈷、鉻、鋅、鎳、鈦、鉭、鐵、錫及銦所組成群中選出之1種以上之金屬。導體層可為單金屬層亦可為合金層,合金層列舉為例如由上述之群中選出之2種以上之金屬的合金(例如,鎳.鉻合金、銅.鎳合金及銅.鈦合金)所形成之層。其中,就金屬層形成之泛用性、成本、利用蝕刻去除之容易性等之觀點而言,較好為鉻、鎳、鈦、鋁、鋅、金、銀或銅之單金屬層,或鎳.鉻合金、銅.鎳合金、銅.鈦合金之合金層,更好為鉻、鎳、鈦、鋁、鋅、金、銀或銅之單金屬層,或鎳.鉻合金之合金層,又更好為銅之單金屬層。 The conductor layer is made of a metal layer, and the metal used in the conductor layer is not particularly limited. However, in a preferred embodiment, the conductor layer comprises gold, platinum, silver, copper, aluminum, cobalt, chromium, zinc, nickel, One or more metals selected from the group consisting of titanium, tantalum, iron, tin, and indium. The conductor layer may be a single metal layer or an alloy layer, and the alloy layer is exemplified by an alloy of two or more metals selected from the above group (for example, nickel, chromium alloy, copper, nickel alloy, copper, titanium alloy). The layer formed. Among them, a single metal layer of chromium, nickel, titanium, aluminum, zinc, gold, silver or copper, or nickel is preferable from the viewpoints of generality of metal layer formation, cost, ease of etching removal, and the like. . Chrome alloy, copper. Nickel alloy, copper. The alloy layer of titanium alloy is preferably a single metal layer of chromium, nickel, titanium, aluminum, zinc, gold, silver or copper, or nickel. The alloy layer of chrome alloy is better as a single metal layer of copper.

導體層可為單層構造,亦可為積層2層以上之由不同種類之金屬或合金所成之單金屬層或合金層所成之多層構造。導體層為多層構造時,與粗化硬化體鄰接之層較好為鉻、鋅或鈦之單金屬層,或鎳.鉻合金之合金層。 The conductor layer may have a single layer structure, or may be a multilayer structure in which two or more layers of a single metal layer or an alloy layer made of different kinds of metals or alloys are laminated. When the conductor layer has a multilayer structure, the layer adjacent to the roughened hardened body is preferably a single metal layer of chromium, zinc or titanium, or nickel. Alloy layer of chrome alloy.

導體層之厚度,就印刷配線板之微細配線化 之觀點而言,較好為40μm以下,更好為1~35μm,又更好為3~20μm。金屬層為多層構造時,金屬層整體之厚度亦較好為上述範圍。 The thickness of the conductor layer is finely wired to the printed wiring board From the viewpoint of the above, it is preferably 40 μm or less, more preferably 1 to 35 μm, still more preferably 3 to 20 μm. When the metal layer has a multilayer structure, the thickness of the entire metal layer is also preferably in the above range.

導體層可藉由半加成法、全加成法等習知技術,以期望之配線圖型而形成。一般可將圖型形成用乾膜配置於粗化硬化體(絕緣層)上且顯像期望圖型後,藉由鍍敷而形成具有期望圖型之導體層。 The conductor layer can be formed by a desired wiring pattern by a conventional technique such as a semi-additive method or a full additive method. Generally, a dry film for pattern formation is disposed on a roughened hardened body (insulating layer) and a desired pattern is developed, and then a conductor layer having a desired pattern is formed by plating.

過去之技術中,使用薄的樹脂組成物層於電路基板上形成硬化體時,所得硬化體之表面會有具有與底層的電路基板之電路配線圖型對應之較大起伏之傾向,而導致圖型形成用乾膜之密著性降低之問題。且過去之技術中,使用薄的樹脂組成物層將表面起伏小的硬化體設置於電路基板上時,會有發生粗糙度不均問題之情況。相對於此,本發明之技術中,如前所述,由於不會發生圖型形成用乾膜之密著性降低問題也不會發生粗糙度不均之問題,故可於粗化硬化體表面有利地形成具有微細配線圖型之導體層。 In the prior art, when a thin resin composition layer is used to form a hardened body on a circuit board, the surface of the obtained hardened body tends to have a large undulation corresponding to the circuit wiring pattern of the underlying circuit substrate, resulting in a pattern. The problem of the adhesion of the dry film for forming a type is lowered. In the prior art, when a thin resin composition layer is used to provide a hard surface having a small surface roughness on a circuit board, unevenness in roughness may occur. On the other hand, in the technique of the present invention, as described above, since the problem that the adhesion of the dry film for pattern formation is not lowered and the roughness unevenness does not occur, the surface of the hardened body can be roughened. It is advantageous to form a conductor layer having a fine wiring pattern.

本發明之積層體中,粗化硬化體之表面上形成之導體層之線/間隔比較好為20/20μm以下,更好為15/15μm以下,又更好為10/10μm以下,最好為8/8μm以下。 In the laminate of the present invention, the line/interval of the conductor layer formed on the surface of the roughened and hardened body is preferably 20/20 μm or less, more preferably 15/15 μm or less, still more preferably 10/10 μm or less, and most preferably 8/8 μm or less.

[印刷配線板] [Printed wiring board]

本發明之印刷配線板之特徵係利用本發明之硬化體形 成絕緣層。 The printed wiring board of the present invention is characterized by using the hardened body shape of the present invention. Into the insulation layer.

一實施形態中,本發明之印刷配線板可使用上述之接著薄片而製造。該實施形態中,可實施如使接著薄片之樹脂組成物層與電路基板接合之上述「步驟(A)」及「步驟(B)」,於電路基板上形成本發明之硬化體。又,接著薄片具有保護薄膜時,可於去除保護薄膜後供於製造。 In one embodiment, the printed wiring board of the present invention can be produced by using the above-described succeeding sheet. In this embodiment, the above-mentioned "Step (A)" and "Step (B)" for bonding the resin composition layer of the sheet to the circuit board can be performed to form the cured body of the present invention on the circuit board. Further, when the sheet has a protective film, the protective film can be removed and then produced.

接著,對於在電路基板上形成之硬化體,實施上述之「粗化處理」形成粗化硬化體後,於該粗化硬化體之表面形成導體層。又,印刷配線板之製造中,亦可進而包含於絕緣層上形成通孔(via)之步驟、去除通孔內部之樹脂殘渣(膠渣)之步驟等。該等步驟係業界所習知且可依據印刷配線板之製造所用之各種方法進行。 Next, the hardened body formed on the circuit board is subjected to the above-described "roughening treatment" to form a roughened and hardened body, and then a conductor layer is formed on the surface of the roughened and hardened body. Further, in the production of the printed wiring board, a step of forming a via on the insulating layer, a step of removing the resin residue (slag) inside the via hole, and the like may be further included. These steps are well known in the art and can be carried out in accordance with various methods used in the manufacture of printed wiring boards.

本發明之印刷配線板係高度兼具層的薄型化與電路之微細配線化者。 The printed wiring board of the present invention has a high degree of thickness reduction and a fine wiring of a circuit.

[半導體裝置] [semiconductor device]

使用上述之印刷配線板,可製造半導體裝置。 A semiconductor device can be manufactured using the above printed wiring board.

該半導體裝置列舉為提供於電氣製品(例如電腦、行動電話、數位相機及電視等)及載具(例如機車、汽車、電車、船舶及飛機等)等之各種半導體裝置。 The semiconductor device is exemplified by various semiconductor devices such as electric products (for example, computers, mobile phones, digital cameras, and televisions) and vehicles (for example, locomotives, automobiles, electric cars, ships, airplanes, etc.).

[實施例] [Examples]

以下,以實施例具體說明本發明,但本發明 並不受限於該等實施例。又,以下之記載中,「份」及「%」只要沒有另外說明,則分別意指「質量份」及「質量%」。 Hereinafter, the present invention will be specifically described by way of examples, but the present invention It is not limited to the embodiments. In the following description, "parts" and "%" mean "parts by mass" and "% by mass" unless otherwise stated.

首先針對各種測定方法.評價方法加以說明。 First of all, for various measurement methods. The evaluation method will be explained.

[測定.評價用樣品之調製] [Measurement. Preparation of sample for evaluation] (1)電路基板之底層處理 (1) Underlying processing of circuit board

於玻璃布基材環氧樹脂兩面貼銅積層板(銅箔厚度18μm,基板厚度0.3mm,松下電工(股)製之「R5715ES」之兩面上,依據IPC MULTI-PURPOSE TEST BOARD NO.IPC B-25之圖型(線/間隔比=175/175μm之梳齒圖型(殘銅率50%)形成電路。將所得之電路基板之兩面浸漬於Merck(股)製之「CZ8100」中進行銅表面之粗化處理。 On the two sides of the glass cloth substrate epoxy resin laminated copper plate (copper foil thickness 18μm, substrate thickness 0.3mm, "R5715ES" made by Matsushita Electric Works), according to IPC MULTI-PURPOSE TEST BOARD NO.IPC B- The pattern of 25 (line/space ratio = 175/175 μm comb pattern (50% residual copper ratio) forms a circuit. Both sides of the obtained circuit board are immersed in "CZ8100" manufactured by Merck Co., Ltd. for copper surface The roughening process.

(2)樹脂組成物層之積層 (2) Lamination of the resin composition layer

使用批式真空加壓層合機(名機製作所(股)製之「MVLP-500」),以使樹脂組成物層與電路基板鄰接之方式,將實施例及比較例中製作之接著薄片積層於電路基板之兩面。樹脂組成物層之積層,關於實施例1~3及比較例2,係藉由30秒減壓使氣壓成為13hPa以下後,在120℃、壓力0.74MPa下層合處理30秒而進行。接著,在120℃、壓力0.5MPa熱加壓60秒而進行平滑化處理。 A batch vacuum laminate laminator ("MVLP-500" manufactured by Nihon Seisakusho Co., Ltd.) was used to laminate the resin composition layer and the circuit substrate, and the laminate sheets produced in the examples and the comparative examples were laminated. On both sides of the circuit board. The laminates of the resin composition layers were subjected to a lamination treatment at 120 ° C and a pressure of 0.74 MPa for 30 seconds by subjecting the gas pressure to 13 hPa or less under reduced pressure for 30 seconds in Examples 1 to 3 and Comparative Example 2. Subsequently, the mixture was heat-pressed at 120 ° C and a pressure of 0.5 MPa for 60 seconds to carry out a smoothing treatment.

關於比較例1,除將層合處理及平滑化處理之溫度變 更為90℃以外,餘以與實施例1~3及比較例2同樣之條件進行層合處理及平滑化處理。 Regarding Comparative Example 1, the temperature of the laminating treatment and the smoothing treatment was changed. The lamination treatment and the smoothing treatment were carried out under the same conditions as in Examples 1 to 3 and Comparative Example 2 except for 90 °C.

(3)樹脂組成物層之熱硬化 (3) Thermal hardening of the resin composition layer

樹脂組成物層積層後,剝離支撐體的PET薄膜。隨後,使樹脂組成物層在100℃保持30分鐘後,在180℃保持30分鐘進行熱硬化,而於電路基板上形成硬化體。 After the resin composition was laminated, the PET film of the support was peeled off. Subsequently, the resin composition layer was held at 100 ° C for 30 minutes, and then heat-hardened at 180 ° C for 30 minutes to form a hardened body on the circuit board.

關於所得硬化體,針對硬化體表面之最大剖面高度Rt、電路配線上之硬化體厚度、及樹脂埋入性進行評價。 The obtained cured body was evaluated for the maximum cross-sectional height Rt of the surface of the cured body, the thickness of the hardened body on the circuit wiring, and the resin embedding property.

(4)通孔之形成 (4) Formation of through holes

使用日立VIA MECHANICS(股)製之CO2雷射加工機「LC-2E21B/1C」,對硬化體進行穿孔加工,形成通孔。硬化體表面之通孔之頂端直徑(直徑)為50μm。又,穿孔加工之條件為遮罩直徑1.60mm,偏焦(focus offset)值0.050,脈衝寬25μs,能量0.33mJ/發射(輸出0.66W,頻率2000Hz)、光圈(aperture)13,發射數2,爆發模式(burst mode)。 Hitachi VIA MECHANICS (shares) manufactured by CO 2 laser processing machine of the "LC-2E21B / 1C ', of the cured body is punched to form the through hole. The diameter (diameter) of the tip end of the through hole on the surface of the hardened body was 50 μm. Moreover, the conditions of the perforation processing are a mask diameter of 1.60 mm, a focus offset value of 0.050, a pulse width of 25 μs, an energy of 0.33 mJ/emission (output of 0.66 W, frequency of 2000 Hz), aperture 13 and number of shots 2, Burst mode.

(5)粗化處理 (5) roughening treatment

形成通孔後,依據下述順序使形成硬化體之電路基板進行粗化處理獲得粗化硬化體。亦即,將形成硬化體之電路基板浸漬於60℃之膨潤液(日本ATOTECH(股)製之「Sweeling Dip Securiganth P」、二乙二醇單丁基醚及氫 氧化鈉之水溶液)中5分鐘,接著浸漬於80℃之氧化劑溶液(日本ATOTECH(股)製之「Concentrate.Compact CP」,過錳酸鉀濃度約6%,氫氧化鈉濃度約4%之水溶液)中15分鐘,最後浸漬於40℃之中和液(日本ATOTECH(股)製之「Reduction Solution Securigant P」,硫酸水溶液)中5分鐘,浸漬後,在130℃乾燥15分鐘。 After the via holes are formed, the circuit board on which the hardened body is formed is subjected to a roughening treatment in the following order to obtain a roughened and hardened body. In other words, the circuit board on which the hardened body is formed is immersed in a swelling liquid at 60 ° C (Sweeling Dip Securiganth P, manufactured by ATOTECH Co., Ltd., diethylene glycol monobutyl ether, and hydrogen). 5 minutes in an aqueous solution of sodium oxide, followed by immersion in an oxidizing agent solution (Concentrate. Compact CP) manufactured by ATOTECH Co., Ltd., an aqueous solution having a potassium permanganate concentration of about 6% and a sodium hydroxide concentration of about 4%. The mixture was immersed in a solution (Reduction Solution Securigant P, manufactured by ATOTECH Co., Ltd., Aqueous Sulfate, Japan) for 5 minutes, and after immersion, it was dried at 130 ° C for 15 minutes.

針對所得粗化硬化體評價粗糙度不均。 The roughness unevenness was evaluated about the obtained roughened hardened body.

(6)導體層之形成 (6) Formation of conductor layer

根據半加成法於粗化硬化體表面形成導體層。 A conductor layer is formed on the surface of the roughened hardened body according to a semi-additive method.

亦即,將形成粗化硬化體之電路基板浸漬於含PdCl2之無電解銅鍍敷液中之後,在150℃加熱30分鐘進行退火處理。藉此,於粗化硬化體表面形成鍍敷晶種層。 That is, the circuit board on which the roughened and hardened body was formed was immersed in an electroless copper plating solution containing PdCl 2 , and then annealed at 150 ° C for 30 minutes. Thereby, a plating seed layer is formed on the surface of the roughened hardened body.

所得鍍敷晶種層之表面以5%硫酸水溶液處理30秒後,將圖型形成用乾膜(Nichigo Morton(股)製之「ALPHO 20A263」、厚度20μm)積層於鍍敷晶種層上。圖型形成用乾膜之積層係使用批式真空加壓層合機(名機製作所(股)製之「MVLP-500」,減壓30秒使氣壓成為13hPa以下後,在70℃、壓力0.1MPa層合處理20秒而進行。接著,將形成L(乾膜線)/S(間隔)=8/8μm之16μm間距之梳齒圖型(配線長15mm,16條線)之玻璃遮罩配置於乾膜之保護層的PET膜上,藉UV燈以照射強度150mJ/cm2進行UV照射。UV照射後,使用30℃之1%碳酸鈉水溶液,以噴射壓0.15MPa進行噴霧處理30秒。隨後,進行水洗,進行 乾膜之顯像(形成圖型)。乾膜顯像後,評價乾膜之密著性。 The surface of the obtained plating seed layer was treated with a 5% sulfuric acid aqueous solution for 30 seconds, and then a dry film for pattern formation ("ALPHO 20A263" manufactured by Nichigo Morton Co., Ltd., thickness: 20 μm) was laminated on the plating seed layer. For the lamination of the dry film for pattern formation, a batch vacuum lamination machine ("MVLP-500" manufactured by Nihon Seisakusho Co., Ltd.) was used, and the pressure was reduced to 13 hPa or less after 30 seconds of decompression, and the pressure was changed to 70 ° C and 0.1 at 70 ° C. MPa lamination treatment was carried out for 20 seconds. Next, a glass mask configuration of a comb pattern (wire length 15 mm, 16 lines) of 16 μm pitch of L (dry film line) / S (interval) = 8 / 8 μm was formed. On the PET film of the protective layer of the dry film, UV irradiation was performed by a UV lamp at an irradiation intensity of 150 mJ/cm 2 , and after UV irradiation, a 1% sodium carbonate aqueous solution at 30 ° C was used, and a spray treatment was performed at a spray pressure of 0.15 MPa for 30 seconds. Subsequently, washing with water was carried out to develop a dry film (formation pattern). After dry film development, the adhesion of the dry film was evaluated.

對於乾膜密著性良好之基板進行電解銅鍍敷,形成厚度15μm之導體層。接著,使用50℃之3%氫氧化鈉溶液以噴射壓0.2MPa進行噴霧處理,且剝離乾膜。隨後,以荏原電產(股)製之SAC製程去除多餘之鍍敷晶種層,形成印刷配線板。 Electrolytic copper plating was performed on the substrate having good dry film adhesion to form a conductor layer having a thickness of 15 μm. Next, a spray treatment was carried out using a 3% sodium hydroxide solution at 50 ° C at a spray pressure of 0.2 MPa, and the dry film was peeled off. Subsequently, the excess plating plating layer was removed by a SAC process manufactured by Ebara Electric Co., Ltd. to form a printed wiring board.

針對所得印刷配線板評價微細配線形成性。 The fine wiring formation property was evaluated about the obtained printed wiring board.

〈樹脂組成物層之最低熔融黏度溫度Tv之測定〉 <Measurement of the lowest melt viscosity temperature Tv of the resin composition layer>

實施例及比較例中製作之接著薄片之樹脂組成物層的最低熔融黏度溫度Tv係使用動態黏彈性測定裝置(UBM(股)公司製之「Rheosol-G3000」測定。針對試料樹脂組成物量1g,使用直徑18mm之平行板(parallel plate),以升溫速度5℃/分鐘自開始溫度60℃升溫至200℃,且以測定溫度間隔2.5℃、振動數1Hz、應變1度之條件測定最低熔融黏度時之溫度。 The lowest melt viscosity temperature Tv of the resin composition layer of the succeeding sheet produced in the examples and the comparative examples was measured by a dynamic viscoelasticity measuring apparatus ("Rheosol-G3000" manufactured by UBM Co., Ltd.), and the amount of the resin composition sample was 1 g. Using a parallel plate having a diameter of 18 mm, the temperature was raised from the start temperature of 60 ° C to 200 ° C at a temperature increase rate of 5 ° C / min, and the lowest melt viscosity was measured at a temperature interval of 2.5 ° C, a vibration number of 1 Hz, and a strain of 1 degree. The temperature.

〈硬化體表面之最大剖面高度Rt之測定〉 <Measurement of the maximum profile height Rt of the surface of the hardened body>

電路基板上之硬化體表面之最大剖面高度Rt係自使用非接觸型表面粗糙度計(Veeco Instruments公司製之「WYKO NT3300」),藉由利用VSI接觸模式、10倍透鏡,將測定範圍設為0.82mm×1.1mm而得之數值求得。又,測定係針對設置有線/間隔比=175/175μm之梳齒圖型 (殘銅率50%)之電路配線之區域,以跨及具有電路配線之部分與無電路配線之部分之方式,求出3部位之平均值而實施。 The maximum cross-sectional height Rt of the surface of the hardened body on the circuit board is a non-contact type surface roughness meter ("WYKO NT3300" manufactured by Veeco Instruments Co., Ltd.), and the measurement range is set by using a VSI contact mode and a 10x lens. The value obtained by 0.82 mm × 1.1 mm was obtained. In addition, the measurement system is for a comb pattern with a wire/space ratio ratio of 175/175 μm. The area of the circuit wiring (the residual copper ratio is 50%) is obtained by calculating the average value of the three parts so as to cross the part having the circuit wiring and the portion having no circuit wiring.

又,表1中,以最大剖面高度Rt為3.5μm以下之情況記為「○」,超過3.5μm之情況記為「×」。 In addition, in Table 1, the case where the maximum profile height Rt is 3.5 μm or less is referred to as "○", and the case where the maximum profile height Rt exceeds 3.5 μm is referred to as "x".

〈電路基板之位於電路配線上之硬化體厚度之測定〉 <Measurement of Thickness of Hardened Body on Circuit Board of Circuit Board>

電路基板之位於電路配線上之硬化體厚度(y)係將設置有線/間隔比=175/175μm之梳齒圖型之電路配線之區域切斷成邊長1cm之正方形,以透明密封樹脂(Marumoto Struers(股)製之不飽和聚酯樹脂)密封,研磨剖面後,以掃描型電子顯微鏡(日立高科技(股)製之「S4800」)觀察而測定。測定係以求出5點之平均值進行。 The thickness (y) of the hardened body on the circuit board of the circuit board is a square of a circuit pattern of a comb-tooth pattern having a wire/space ratio ratio of 175/175 μm, and is cut into a square having a side length of 1 cm to form a transparent sealing resin (Marumoto). The unsaturated polyester resin manufactured by Struers Co., Ltd. was sealed, and after the cross section was polished, it was measured by a scanning electron microscope ("S4800" manufactured by Hitachi High-Tech Co., Ltd.). The measurement was performed by calculating the average value of 5 points.

〈樹脂之埋入性評價〉 <Evaluation of the embedding property of resin>

樹脂之埋入性係以掃描型電子顯微鏡(日立高科技(股)製之「S4800」)觀察硬化體表面予以評價。 The embedding property of the resin was evaluated by observing the surface of the hardened body with a scanning electron microscope ("S4800" manufactured by Hitachi High-Tech Co., Ltd.).

又,表1中,埋入成未發生孔洞或樹脂滲出者記為「○」,有孔洞發生或樹脂滲出者記為「×」。 In addition, in Table 1, the case where the hole was not formed or the resin was oozing out was marked as "○", and the case where the hole occurred or the resin bleed out was recorded as "x".

〈粗糙度不均之評價〉 <Evaluation of roughness unevenness>

粗化硬化體之表面粗糙度不均係測定電路基板之位於電路配線上之粗化硬化體表面之算術平均粗糙度(Ra1),與電路基板之無電路配線部分上之粗化硬化體表面之算術平 均粗糙度(Ra2),且求出|Ra1-Ra2|之值而進行。粗化硬化體表面之算術平均粗糙度(Ra1及Ra2)係自使用非接觸型表面粗糙度計(Veeco Instruments公司製之「WYKO NT3300」,藉由VSI接觸模式、50倍透鏡,將測定範圍設為92×123μm所得之數值求得。分別針對Ra1及Ra2求出3點之平均值。 The unevenness of the surface roughness of the roughened hardened body is the arithmetic mean roughness (Ra 1 ) of the surface of the roughened hardened body on the circuit wiring of the circuit board, and the surface of the roughened hardened body on the circuit-free wiring portion of the circuit board The arithmetic mean roughness (Ra 2 ) is calculated by finding the value of |Ra 1 -Ra 2 |. The arithmetic mean roughness (Ra 1 and Ra 2 ) of the surface of the roughened hardened body is measured by using a non-contact type surface roughness meter ("WYKO NT3300" manufactured by Veeco Instruments Co., Ltd., by VSI contact mode, 50-fold lens). The value obtained by the range of 92 × 123 μm was obtained, and the average of three points was obtained for Ra 1 and Ra 2 , respectively.

又,表1中,|Ra1-Ra2|之值為160nm以下時記為「○」,超過160nm時記為「×」。 In addition, in Table 1, when the value of |Ra 1 -Ra 2 | is 160 nm or less, it is indicated as "○", and when it exceeds 160 nm, it is indicated as "X".

〈圖型形成用乾膜之密著性評價〉 <Evaluation of adhesion of dry film for pattern formation>

圖型形成用乾膜之密著性係針對設有線/間隔比=175/175μm之梳齒圖型之電路配線之區域,以掃描型電子顯微鏡(日立高科技(股)製之「S4800」)觀察粗化硬化體(鍍敷晶種層)與乾膜之密著狀態而評價。 The adhesion of the dry film for pattern formation is directed to a region of a circuit wiring having a comb-tooth pattern of a line/space ratio ratio of 175/175 μm, and a scanning electron microscope ("S4800" manufactured by Hitachi High-Tech Co., Ltd.). The state in which the roughened hardened body (plated seed layer) and the dry film were adhered was observed.

又,表1中,乾膜上膜無剝離.隆起之情況記為「○」,有剝離.隆起之情況記為「×」。 In addition, in Table 1, the film on the dry film is not peeled off. The situation of the uplift is recorded as "○" and there is stripping. The situation of the uplift is recorded as "X".

〈微細配線形成性之評價〉 <Evaluation of the formation of fine wiring>

微細配線形成性係以光學顯微鏡確認有無導體層之剝離,且測定梳齒圖型之絕緣電阻以確認有無不必要之鍍敷晶種層殘留。 The fine wiring formation property was confirmed by an optical microscope to confirm the presence or absence of peeling of the conductor layer, and the insulation resistance of the comb pattern was measured to confirm the presence or absence of unnecessary plating seed layer.

表1中,導體層未剝離且未殘留鍍敷晶種層者記為「○」,有導體層剝離及/或殘留鍍敷晶種層者記為「×」。 In Table 1, those in which the conductor layer is not peeled off and the plating seed layer is not left are referred to as "○", and those in which the conductor layer is peeled off and/or the residual plating layer is left are referred to as "x".

[製作例1] [Production Example 1] (1)樹脂漆料之調製 (1) Modification of resin paint

將液狀雙酚A型環氧樹脂(環氧當量180,三菱化學(股)製之「jER828EL」)10份、聯苯型環氧樹脂(環氧當量269,日本化藥(股)製之「NC3000L」)20份、4官能萘型環氧樹脂(環氧當量163,DIC(股)製之「HP4700」)6份、及苯氧樹脂(三菱化學(股)製之「YL7553BH30」、固體成分30質量%之MEK與環己酮之1:1溶液)10份於MEK 5份、環己酮5份及溶劑石油腦(solvent naphtha)15份之混合溶劑中邊攪拌邊加熱溶解。冷卻至室溫後,於其中混合含三嗪之酚酚醛清漆系硬化劑(羥基當量125、DIC(股)製之「LA7054」、固體成分60質量%之MEK溶液)15份、萘酚系硬化劑(羥基當量215、東都化成(股)製之「SN-485」、固體成分60%之MEK溶液)15份、胺系硬化促進劑(4-二甲胺基吡啶(DMAP)、固體成分5質量%之MEK溶液)1份、咪唑系硬化促進劑(1-苄基-2-苯基咪唑,四國化成工業(股)製之「1B2PZ」、固體成分5質量%之MEK溶液)0.3份、難燃劑(三光(股)製之「HCA-HQ」、10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲-10-氧化物、平均粒徑2μm)5份、以胺基矽烷系偶合劑(信越化學工業(股)製之「KBM573」)進行表面處理之球形二氧化矽(平均粒徑0.5μm,ADMATECHS製之「SOC2」,每單位面積之碳量為0.39mg/m2)140份、聚乙烯基縮丁醛樹脂(積水化學工業 (股)製之「KS-1」,固體成分15重量%之乙醇與甲苯之1:1溶液)15份,以高速旋轉混練機均勻分散,調製樹脂漆料。 10 parts of liquid bisphenol A type epoxy resin (epoxy equivalent weight 180, "jER828EL" by Mitsubishi Chemical Co., Ltd.) and biphenyl type epoxy resin (epoxy equivalent 269, manufactured by Nippon Kayaku Co., Ltd.) "NC3000L") 20 parts, 4 parts of a naphthalene type epoxy resin (epoxy equivalent 163, "HP4700" manufactured by DIC), and phenoxy resin ("LM7553BH30" manufactured by Mitsubishi Chemical Corporation), solid 10 parts by mass of a 1:1 solution of MEK and cyclohexanone) 10 parts of a mixed solvent of 5 parts of MEK, 5 parts of cyclohexanone and 15 parts of solvent naphtha were heated and dissolved while stirring. After cooling to room temperature, 15 parts of a triazine-containing phenol novolak-based curing agent (hydroxyl equivalent of 125, "LA7054" by DIC (manufactured by DIC), and 60% by mass of MEK solution of solid content) was mixed therein, and naphthol-based hardening was carried out. 15 parts of a reagent (hydroxyl equivalent 215, "SN-485" manufactured by Tohto Kasei Co., Ltd., 60% solid solution of MEK), an amine-based hardening accelerator (4-dimethylaminopyridine (DMAP), solid component 5) 1 part by mass of MEK solution), an imidazole-based hardening accelerator (1-benzyl-2-phenylimidazole, "1B2PZ" manufactured by Shikoku Chemicals Co., Ltd., and a solid content of 5% by mass of MEK solution) 0.3 parts , a flame retardant ("HCA-HQ", 10-(2,5-dihydroxyphenyl)-10-hydro-9-oxa-10-phosphaphenanthrene-10-oxide, manufactured by Sanguang Co., Ltd., Spherical cerium oxide (average particle diameter: 0.5 μm, "SOC2" manufactured by ADMATECHS), which is surface-treated with an amine decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.), having an average particle diameter of 2 μm. The amount of carbon per unit area is 0.39 mg/m 2 ) 140 parts, polyvinyl butyral resin ("KS-1" manufactured by Sekisui Chemical Co., Ltd.), solid content 15% by weight of ethanol and toluene 1: 1 solution) 15 parts, rotating at high speed Uniformly dispersed to prepare a resin varnish.

(2)接著薄片1之調製 (2) followed by modulation of sheet 1

準備附脫模層之PET薄膜(LINTEC(股)製,附醇酸型脫模劑(AL-5)之聚對苯二甲酸乙二醇薄膜))作為支撐體。以使乾燥後之樹脂組成物層厚度成為15μm之方式,利用模嘴塗佈器將上述(1)獲得之樹脂漆料均一塗佈於該支撐體之脫模面上,在80~110℃(平均100℃)乾燥2~4分鐘,形成接著薄片1。接著薄片1之樹脂組成物層之最低熔融黏度溫度Tv為130℃。 A PET film (manufactured by LINTEC Co., Ltd., a polyethylene terephthalate film with an alkyd type release agent (AL-5)) having a release layer was prepared as a support. The resin paint obtained in the above (1) is uniformly applied to the release surface of the support by a die coater so as to have a thickness of the resin composition layer after drying to 15 μm, at 80 to 110 ° C ( Drying for an average of 100 to 4 minutes for 2 to 4 minutes to form a subsequent sheet 1. Next, the lowest melt viscosity temperature Tv of the resin composition layer of the sheet 1 was 130 °C.

[製作例2] [Production Example 2]

除了以使乾燥後之樹脂組成物層厚度成為20μm之方式,以模嘴塗佈器均一塗佈樹脂漆料以外,餘與製作例1同樣製作接著薄片2。接著薄片2之樹脂組成物層之最低熔融黏度溫度Tv為127℃。 The subsequent sheet 2 was produced in the same manner as in Production Example 1, except that the resin coating material was uniformly applied to the die coater so that the thickness of the resin composition layer after drying was 20 μm. Next, the lowest melt viscosity temperature Tv of the resin composition layer of the sheet 2 was 127 °C.

[製作例3] [Production Example 3]

除了以使乾燥後之樹脂組成物層厚度成為25μm之方式,以模嘴塗佈器均一塗佈樹脂漆料以外,餘與製作例1同樣製作接著薄片3。接著薄片3之樹脂組成物層之最低熔融黏度溫度Tv為127℃。 The subsequent sheet 3 was produced in the same manner as in Production Example 1, except that the resin coating material was uniformly applied to the die coater so that the thickness of the resin composition layer after drying was 25 μm. Next, the lowest melt viscosity temperature Tv of the resin composition layer of the sheet 3 was 127 °C.

[製作例4] [Production Example 4]

除了以使乾燥後之樹脂組成物層厚度成為15μm之方式,以模嘴塗佈器均一塗佈樹脂漆料以外,餘與製作例1同樣製作接著薄片4。接著薄片4之樹脂組成物層之最低熔融黏度溫度Tv為130℃。 The subsequent sheet 4 was produced in the same manner as in Production Example 1, except that the resin coating material was uniformly applied to the die coater so that the thickness of the resin composition layer after drying was 15 μm. Next, the lowest melt viscosity temperature Tv of the resin composition layer of the sheet 4 was 130 °C.

[製作例5] [Production Example 5]

除了以使乾燥後之樹脂組成物層厚度成為10μm之方式,以模嘴塗佈器均一塗佈樹脂漆料以外,餘與製作例1同樣製作接著薄片5。接著薄片5之樹脂組成物層之最低熔融黏度溫度Tv為140℃。 The subsequent sheet 5 was produced in the same manner as in Production Example 1, except that the resin coating material was uniformly applied to the die coater so that the thickness of the resin composition layer after drying was 10 μm. Next, the lowest melt viscosity temperature Tv of the resin composition layer of the sheet 5 was 140 °C.

〈實施例1〉 <Example 1>

使用接著薄片1,根據上述[測定.評價用樣品之調製]之順序,製造印刷配線板。各評價結果示於表1。 Use the following sheet 1, according to the above [Measurement. A printed wiring board was produced in the order of the preparation of the sample for evaluation. The results of each evaluation are shown in Table 1.

〈實施例2〉 <Example 2>

使用接著薄片2,根據上述[測定.評價用樣品之調製]之順序,製造印刷配線板。各評價結果示於表1。 Use the following sheet 2, according to the above [Measurement. A printed wiring board was produced in the order of the preparation of the sample for evaluation. The results of each evaluation are shown in Table 1.

〈實施例3〉 <Example 3>

使用接著薄片3,根據上述[測定.評價用樣品之調製]之順序,製造印刷配線板。 Use the following sheet 3, according to the above [Measurement. A printed wiring board was produced in the order of the preparation of the sample for evaluation.

各評價結果示於表1。 The results of each evaluation are shown in Table 1.

〈比較例1〉 <Comparative Example 1>

使用接著薄片4,根據上述[測定.評價用樣品之調製]之順序,製造印刷配線板。又,如上述[測定A評價用樣品之調製]所示,比較例1之樹脂組成物層之積層溫度為90℃。各評價結果示於表1。 Use the following sheet 4, according to the above [Measurement. A printed wiring board was produced in the order of the preparation of the sample for evaluation. Further, as shown in the above [Preparation of Sample for Evaluation A Evaluation], the laminate temperature of the resin composition layer of Comparative Example 1 was 90 °C. The results of each evaluation are shown in Table 1.

〈比較例2〉 <Comparative Example 2>

使用接著薄片5,根據上述[測定.評價用樣品之調製]之順序,製造印刷配線板。各評價結果示於表1。 Use the following sheet 5, according to the above [Measurement. A printed wiring board was produced in the order of the preparation of the sample for evaluation. The results of each evaluation are shown in Table 1.

為使層之薄型化而使用薄的樹脂組成物層 時,確認若使樹脂組成物層之積層溫度在Tv-35℃~ Tv+35℃之範圍進行時,則歸結於表面起伏大之硬化體而使乾膜之密著性差(比較例1)。且確認藉由使樹脂組成物層之積層溫度成為Tv-35℃~Tv+35℃之範圍雖可抑制硬化體表面之起伏,但若x與y未滿足0.3<y/x≦1且y≦15之關係,則顯著發生粗糙度不均(比較例2)。 A thin resin composition layer is used to make the layer thinner When confirming that the laminate temperature of the resin composition layer is Tv-35 ° C~ When the range of Tv + 35 ° C is carried out, it is attributed to a hardened body having a large surface undulation and poor adhesion of the dry film (Comparative Example 1). It is also confirmed that the surface temperature of the resin composition layer is in the range of Tv - 35 ° C to Tv + 35 ° C, although the surface of the hardened body can be suppressed from fluctuating, but if x and y do not satisfy 0.3 < y / x ≦ 1 and y ≦ In the relationship of 15, significant roughness unevenness occurred (Comparative Example 2).

另一方面,樹脂組成物層之積層溫度在Tv-35℃~Tv+35℃之範圍,並且x與y滿足0.3<y/x≦1且y≦15之關係之實施例1~3,即使為了層之薄型化而使用薄的樹脂組成物層時,仍可實現保有充分之乾膜密著性且表面起伏小的硬化體,同時可抑制粗糙度不均之發生。 On the other hand, the laminate temperature of the resin composition layer is in the range of Tv - 35 ° C - Tv + 35 ° C, and x and y satisfy the relationship of 0.3 < y / x ≦ 1 and y ≦ 15 in Examples 1 to 3, even if When a thin resin composition layer is used for the thinning of the layer, a hardened body which retains sufficient dry film adhesion and has a small surface undulation can be realized, and occurrence of roughness unevenness can be suppressed.

Claims (15)

一種硬化體,其係將樹脂組成物層積層於電路基板上且使該樹脂組成物層熱硬化而得之設置於電路基板上之硬化體,其中將樹脂組成物層之最低熔融黏度溫度設為Tv(℃)時,樹脂組成物層之積層溫度為Tv-35℃~Tv+35℃,將樹脂組成物層之厚度設為x(μm),將電路基板之位於電路配線上之硬化體厚度設為y(μm)時,為0.3<y/x≦1且y≦15。 A hardened body obtained by laminating a resin composition on a circuit board and thermally curing the resin composition layer to obtain a hardened body provided on a circuit board, wherein a minimum melt viscosity temperature of the resin composition layer is set to In Tv (°C), the lamination temperature of the resin composition layer is Tv-35° C. to Tv+35° C., the thickness of the resin composition layer is set to x (μm), and the thickness of the hardened body on the circuit board of the circuit board is set. When it is set to y (μm), it is 0.3 < y / x ≦ 1 and y ≦ 15. 如請求項1之硬化體,其中x≦25。 The hardened body of claim 1, wherein x ≦ 25. 如請求項1之硬化體,其中硬化體表面之最大剖面高度Rt為3.5μm以下。 The hardened body of claim 1, wherein the surface of the hardened body has a maximum cross-sectional height Rt of 3.5 μm or less. 如請求項1之硬化體,其中樹脂組成物層含有無機填充材,樹脂組成物層中之無機填充材的含量為50質量%以上。 The hardened body of claim 1, wherein the resin composition layer contains an inorganic filler, and the content of the inorganic filler in the resin composition layer is 50% by mass or more. 如請求項1之硬化體,其係使樹脂組成物層在未達Tv之溫度保持10分鐘以上後,在Tv以上之溫度保持10分鐘以上進行熱硬化而得。 The hardened body according to claim 1, wherein the resin composition layer is maintained at a temperature less than Tv for 10 minutes or more, and then thermally cured at a temperature of Tv or higher for 10 minutes or longer. 一種粗化硬化體,其係將如請求項1之硬化體進行粗化處理所得。 A roughened hardened body obtained by subjecting a hardened body of claim 1 to a roughening treatment. 如請求項6之粗化硬化體,其中電路基板之位於電路配線上之粗化硬化體表面的算術平均粗糙度,與電路基板之無電路配線之部分上之粗化硬化體表面的算術平均粗糙度之差為160nm以下。 The roughened hardened body of claim 6, wherein the arithmetic mean roughness of the surface of the roughened hardened body on the circuit wiring of the circuit substrate and the arithmetic mean roughness of the roughened hardened surface on the portion of the circuit board without the circuit wiring The difference between the degrees is 160 nm or less. 一種積層體,其係具備如請求項6或7之粗化硬化體、與形成於該粗化硬化體表面之導體層。 A laminated body comprising the roughened hardened body according to claim 6 or 7, and a conductor layer formed on the surface of the roughened hardened body. 一種硬化體之製造方法,其包含下列步驟:(A)將樹脂組成物層積層於電路基板上之步驟,及(B)使樹脂組成物層熱硬化而於電路基板上形成硬化體之步驟,且將樹脂組成物層之最低熔融黏度溫度設為Tv(℃)時,樹脂組成物層之積層溫度為Tv-35℃~Tv+35℃,將樹脂組成物層之厚度設為x(μm),將電路基板之位於電路配線上之硬化體厚度設為y(μm)時,為0.3<y/x≦1且y≦15。 A method for producing a hardened body, comprising the steps of: (A) laminating a resin composition on a circuit substrate, and (B) thermally curing the resin composition layer to form a hardened body on the circuit substrate, When the lowest melt viscosity temperature of the resin composition layer is Tv (° C.), the laminate temperature of the resin composition layer is Tv-35 ° C to Tv + 35 ° C, and the thickness of the resin composition layer is set to x (μm). When the thickness of the hardened body on the circuit wiring of the circuit board is y (μm), it is 0.3 < y / x ≦ 1 and y ≦ 15. 如請求項9之硬化體之製造方法,其中x≦25。 A method of producing a hardened body according to claim 9, wherein x ≦ 25. 如請求項9之硬化體之製造方法,其中硬化體表面之最大剖面高度Rt為3.5μm以下。 The method for producing a hardened body according to claim 9, wherein the maximum cross-sectional height Rt of the surface of the hardened body is 3.5 μm or less. 如請求項9之硬化體之製造方法,其中樹脂組成物層含有無機填充材,樹脂組成物層中之無機填充材的含量為50質量%以上。 The method for producing a cured body according to claim 9, wherein the resin composition layer contains an inorganic filler, and the content of the inorganic filler in the resin composition layer is 50% by mass or more. 如請求項9~12中任一項之硬化體之製造方法,其中步驟(B)中,使樹脂組成物層在未達Tv之溫度保持10分鐘以上後,在Tv以上之溫度保持10分鐘以上而進行熱硬化。 The method for producing a cured body according to any one of claims 9 to 12, wherein in the step (B), the resin composition layer is maintained at a temperature not higher than Tv for 10 minutes or more, and then maintained at a temperature of Tv or higher for 10 minutes or longer. And it is thermally hardened. 一種印刷配線板,其係藉由如請求項1~5中任一項之硬化體形成有絕緣層者。 A printed wiring board in which an insulating layer is formed by the hardened body according to any one of claims 1 to 5. 一種半導體裝置,其係包含如請求項14之印刷配 線板。 A semiconductor device comprising a printing package as claimed in claim 14 Wire board.
TW102145127A 2012-12-27 2013-12-09 Hardened body, method of manufacturing cured body, laminated body, printed wiring board, and semiconductor device TWI620474B (en)

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