TW201842046A - Resin composition layer capable of obtaining a cured product excellent in base layer adhesion and anti-reflow properties - Google Patents

Resin composition layer capable of obtaining a cured product excellent in base layer adhesion and anti-reflow properties Download PDF

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TW201842046A
TW201842046A TW107107388A TW107107388A TW201842046A TW 201842046 A TW201842046 A TW 201842046A TW 107107388 A TW107107388 A TW 107107388A TW 107107388 A TW107107388 A TW 107107388A TW 201842046 A TW201842046 A TW 201842046A
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resin composition
resin
composition layer
layer
epoxy resin
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TW107107388A
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TWI820018B (en
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鶴井一彦
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日商味之素股份有限公司
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K9/00Use of pretreated ingredients
    • C08K9/04Ingredients treated with organic substances
    • C08K9/06Ingredients treated with organic substances with silicon-containing compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/40Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
    • C08G59/42Polycarboxylic acids; Anhydrides, halides or low molecular weight esters thereof
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/18Manufacture of films or sheets
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/01Use of inorganic substances as compounding ingredients characterized by their specific function
    • C08K3/013Fillers, pigments or reinforcing additives
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/34Silicon-containing compounds
    • C08K3/36Silica
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0373Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement containing additives, e.g. fillers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/386Improvement of the adhesion between the insulating substrate and the metal by the use of an organic polymeric bonding layer, e.g. adhesive
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/003Additives being defined by their diameter
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/005Additives being defined by their particle size in general

Abstract

An object of the present invention is to provide a resin composition layer or the like, which is capable of obtaining a cured product excellent in base layer adhesion and anti-reflow properties even when its thickness is small. To solve the problem, the resin composition layer of the present invention comprises a resin composition containing (A) an epoxy resin and (B) a curing agent, which is characterized in that the resin composition layer has a thickness of 15 micrometers or less, and when the resin composition layer is thermally cured at 100 DEG C for 30 minutes and is further thermally cured at 180 DEG C for 30 minutes, a cured product obtained therefrom has a permeability coefficient P of 1.2 cc/m2·mm<SP>-1</SP>·day·atom or more and 5 cc/m2mm<SP>-1</SP>·day·atom or less.

Description

樹脂組成物層Resin composition layer

本發明係關於樹脂組成物層。進而係關於包含該樹脂組成物層之樹脂薄片;含有以樹脂組成物層之硬化物所形成之絕緣層的印刷電路板及半導體裝置。The present invention relates to a resin composition layer. Furthermore, it relates to a resin sheet including the resin composition layer; a printed circuit board and a semiconductor device including an insulating layer formed of a cured product of the resin composition layer.

近年來,為了達成電子機器之小型化,已進行印刷電路板之進一步薄型化,伴隨此,正進行在內層基板之配線電路的微細化。例如,專利文獻1中記載有包含支持體及樹脂組成物層之可對應在微細配線之樹脂薄片(接著薄膜)。 [先前技術文獻] [專利文獻]In recent years, in order to achieve miniaturization of electronic devices, further reductions in the thickness of printed circuit boards have been made, and in accordance with this, miniaturization of wiring circuits in inner substrates is being performed. For example, Patent Document 1 describes a resin sheet (adhesive film) including a support and a resin composition layer that can be used for fine wiring. [Prior Art Literature] [Patent Literature]

[專利文獻1] 日本特開2014-36051號公報[Patent Document 1] Japanese Patent Laid-Open No. 2014-36051

[發明欲解決之課題][Questions to be Solved by the Invention]

本發明者們為了達成電子機器之進一步小型化、薄型化,雖研究薄化樹脂薄片之樹脂組成物層,但瞭解薄的樹脂組成物層適用在堆積(Build-up)用途時,受到半導體晶片之實裝時之高溫環境的影響,有無法充分確保密著力的可能性。In order to achieve further miniaturization and thickness reduction of electronic devices, the inventors of the present invention have studied the resin composition layer of a thin resin sheet, but understand that the thin resin composition layer is suitable for use in build-up applications and is subject to semiconductor wafers. Due to the influence of the high temperature environment during installation, there is a possibility that sufficient adhesion cannot be ensured.

本發明的課題為提供即使厚度薄,亦可得到基底密著性及耐回流性優異之硬化物的樹脂組成物層;包含該樹脂組成物層之樹脂薄片;具備使用該樹脂組成物層所形成之絕緣層的印刷電路板及半導體裝置。 [用以解決課題之手段]An object of the present invention is to provide a resin composition layer that can obtain a hardened material having excellent substrate adhesion and reflow resistance even with a small thickness; a resin sheet including the resin composition layer; and a structure formed by using the resin composition layer Printed circuit boards and semiconductor devices with insulating layers. [Means to solve the problem]

為了達成本發明之課題,本發明者們經努力研究的結果,瞭解樹脂組成物層的厚度薄時,樹脂組成物層之硬化物中氧容易透過,其結果,使密著性劣化。因此,藉由將樹脂組成物層之硬化物的透過係數P以成為指定的範圍內的方式進行調整,發現即使樹脂組成物層的厚度變薄,亦可得到基底密著性及耐回流性優異之樹脂組成物層的硬化物,而終至完成本發明。In order to achieve the subject of the present invention, the present inventors have conducted research and found that when the thickness of the resin composition layer is thin, oxygen in the hardened material of the resin composition layer is easily transmitted, and as a result, the adhesion is deteriorated. Therefore, by adjusting the transmission coefficient P of the hardened material of the resin composition layer to be within a specified range, it was found that even if the thickness of the resin composition layer is reduced, excellent substrate adhesion and reflow resistance can be obtained. The hardened product of the resin composition layer finally completes the present invention.

亦即,本發明係包含以下之內容。   [1] 一種樹脂組成物層,其係包含含有(A)環氧樹脂及(B)硬化劑之樹脂組成物的樹脂組成物層,其特徵為   樹脂組成物層的厚度為15μm以下,   將樹脂組成物層於100℃熱硬化30分鐘,進而於180℃熱硬化30分鐘所得之硬化物的透過係數P為1.2cc/m2 ・mm-1 ・day・atom以上5cc/m2 ・mm-1 ・day・atom以下。   [2] 如[1]所記載之樹脂組成物層,其係藉由半添加工法之配線形成用。   [3] 如[1]或[2]所記載之樹脂組成物層,其係含有(C)無機填充材。   [4] 如[3]所記載之樹脂組成物層,其中,將樹脂組成物中之不揮發成分定為100質量%時,(C)成分的含量為40質量%以上80質量%以下。   [5] 如[3]或[4]所記載之樹脂組成物層,其中,(C)成分之平均粒徑為0.05μm以上0.35μm以下。   [6] 如[1]~[5]中任一項記載之樹脂組成物層,其中,將樹脂成分定為100質量%時,(B)成分的含量為20質量%以下。   [7] 如[1]~[6]中任一項記載之樹脂組成物層,其中,(B)成分係含有活性酯系硬化劑。   [8] 如[7]所記載之樹脂組成物層,其中,將樹脂成分定為100質量%時,活性酯系硬化劑的含量為15質量%以下。   [9] 如[1]~[8]中任一項記載之樹脂組成物層,其係含有(D)熱塑性樹脂。   [10] 如[9]所記載之樹脂組成物層,其中,(D)成分的重量平均分子量為38000以上。   [11] 如[1]~[10]中任一項記載之樹脂組成物層,其中,透過係數P為2cc/m2 ・mm-1 ・day・atom以上4cc/m2 ・mm-1 ・day・atom以下。   [12] 如[1]~[11]中任一項記載之樹脂組成物層,其係印刷電路板之絕緣層形成用。   [13] 如[1]~[12]中任一項記載之之樹脂組成物層,其係印刷電路板之層間絕緣層形成用。   [14] 一種樹脂薄片,其係包含支持體、與設置在該支持體上之如[1]~[13]中任一項記載之樹脂組成物層。   [15] 一種印刷電路板,其係包含第1導體層、第2導體層及形成在第1導體層與第2導體層之間的絕緣層之印刷電路板,其特徵為該絕緣層為如[1]~[13]中任一項記載之樹脂組成物層的硬化物。   [16] 一種半導體裝置,其係包含如[15]記載之印刷電路板。 [發明的效果]That is, the present invention includes the following. [1] A resin composition layer, which is a resin composition layer containing a resin composition containing (A) an epoxy resin and (B) a hardener, and is characterized in that the thickness of the resin composition layer is 15 μm or less. The transmittance coefficient P of the hardened material obtained by thermally curing the composition layer at 100 ° C for 30 minutes and further at 180 ° C for 30 minutes is 1.2cc / m 2 · mm -1 · day · atom 5cc / m 2 · mm -1 or more・ Day ・ atom or less. [2] The resin composition layer according to [1], which is used for wiring formation by a semi-additive method. [3] The resin composition layer according to [1] or [2], which contains (C) an inorganic filler. [4] The resin composition layer according to [3], wherein when the non-volatile content in the resin composition is 100% by mass, the content of the component (C) is 40% by mass or more and 80% by mass or less. [5] The resin composition layer according to [3] or [4], wherein the average particle diameter of the component (C) is 0.05 μm or more and 0.35 μm or less. [6] The resin composition layer according to any one of [1] to [5], wherein when the resin component is 100% by mass, the content of the component (B) is 20% by mass or less. [7] The resin composition layer according to any one of [1] to [6], wherein the component (B) contains an active ester-based hardener. [8] The resin composition layer according to [7], wherein when the resin component is 100% by mass, the content of the active ester-based hardener is 15% by mass or less. [9] The resin composition layer according to any one of [1] to [8], which contains (D) a thermoplastic resin. [10] The resin composition layer according to [9], wherein the weight average molecular weight of the component (D) is 38,000 or more. [11] The resin composition layer according to any one of [1] to [10], wherein the transmission coefficient P is 2cc / m 2 · mm -1 · day · atom or more than 4cc / m 2 · mm -1 · day ・ atom or less. [12] The resin composition layer according to any one of [1] to [11], which is used for forming an insulating layer of a printed circuit board. [13] The resin composition layer according to any one of [1] to [12], which is used for forming an interlayer insulating layer of a printed circuit board. [14] A resin sheet comprising a support and a resin composition layer according to any one of [1] to [13] provided on the support. [15] A printed circuit board comprising a first conductor layer, a second conductor layer, and an insulation layer formed between the first conductor layer and the second conductor layer, wherein the insulation layer is as follows The hardened | cured material of the resin composition layer in any one of [1]-[13]. [16] A semiconductor device comprising the printed circuit board according to [15]. [Effect of the invention]

根據本發明,可提供一種即使厚度薄,亦可得到基底密著性及耐回流性優異之硬化物的樹脂組成物層;包含該樹脂組成物層之樹脂薄片;具備使用該樹脂組成物層所形成之絕緣層的印刷電路板及半導體裝置。According to the present invention, it is possible to provide a resin composition layer that can obtain a cured product having excellent substrate adhesion and reflow resistance even with a small thickness; a resin sheet including the resin composition layer; A printed circuit board and a semiconductor device with the formed insulating layer.

以下,針對本發明之樹脂組成物層、樹脂薄片、印刷電路板及半導體裝置進行詳細說明。Hereinafter, the resin composition layer, the resin sheet, the printed circuit board, and the semiconductor device of the present invention will be described in detail.

所謂「樹脂成分」,係指構成樹脂組成物之不揮發成分當中,去除後述之(C)無機填充材的成分。The "resin component" refers to a component that removes the (C) inorganic filler described later among the non-volatile components constituting the resin composition.

[樹脂組成物層]   本發明之樹脂組成物層係包含含有(A)環氧樹脂及(B)硬化劑之樹脂組成物的樹脂組成物層,其特徵為樹脂組成物層的厚度為15μm以下,將樹脂組成物層以100℃熱硬化30分鐘,進而以180℃熱硬化30分鐘所得之硬化物的透過係數P為1.2cc/m2 ・mm-1 ・day・atom以上5cc/m2 ・mm-1 ・day・atom以下。藉由將透過係數P以成為上述範圍內的方式進行調整,即使樹脂組成物層的厚度為15μm以下,亦可成為賦予基底密著性及耐回流性優異之硬化物。[Resin composition layer] The resin composition layer of the present invention is a resin composition layer containing a resin composition containing (A) an epoxy resin and (B) a hardener, and is characterized in that the thickness of the resin composition layer is 15 μm or less The transmittance coefficient P of the cured product obtained by thermally curing the resin composition layer at 100 ° C for 30 minutes and further at 180 ° C for 30 minutes is 1.2cc / m 2 · mm -1 · day · attom 5cc / m 2 or more · Below mm -1・ day ・ atom. By adjusting the transmission coefficient P so that it is in the said range, even if the thickness of a resin composition layer is 15 micrometers or less, it can become a hardened | cured material excellent in the adhesiveness and reflow resistance of a substrate.

樹脂組成物層的厚度從小型化、薄型化的觀點來看,為15μm以下,較佳為13μm以下,更佳為10μm以下,再更佳為8μm以下。樹脂組成物層的厚度的下限雖並未特別限定,但通常可成為1μm以上、1.5μm以上、2μm以上等。From the viewpoint of miniaturization and thinning, the thickness of the resin composition layer is 15 μm or less, preferably 13 μm or less, more preferably 10 μm or less, and even more preferably 8 μm or less. Although the lower limit of the thickness of the resin composition layer is not particularly limited, it may be generally 1 μm or more, 1.5 μm or more, 2 μm or more, and the like.

樹脂組成物層係由含有(A)環氧樹脂及(B)硬化劑之樹脂組成物所形成。將透過係數P定為上述範圍內,可藉由調整樹脂組成物中所含有之各成分實現。樹脂組成物如有必要,可進一步包含(C)無機填充材、(D)熱塑性樹脂、(E)硬化促進劑、(F)阻燃劑及(G)有機填充材等之添加劑。以下,針對本發明之樹脂組成物所包含之各成分進行詳細說明。The resin composition layer is formed of a resin composition containing (A) an epoxy resin and (B) a hardener. Setting the transmission coefficient P within the above range can be achieved by adjusting each component contained in the resin composition. The resin composition may further contain additives such as (C) an inorganic filler, (D) a thermoplastic resin, (E) a hardening accelerator, (F) a flame retardant, and (G) an organic filler, if necessary. Hereinafter, each component contained in the resin composition of this invention is demonstrated in detail.

-(A)環氧樹脂-   樹脂組成物係包含(A)環氧樹脂。作為環氧樹脂,例如可列舉聯二甲酚型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、雙環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚酚醛清漆型環氧樹脂、酚酚醛清漆型環氧樹脂、tert-丁基-鄰苯二酚型環氧樹脂、萘型環氧樹脂、萘酚型環氧樹脂、蔥型環氧樹脂、縮水甘油基胺型環氧樹脂、縮水甘油基酯型環氧樹脂、甲酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、線狀脂肪族環氧樹脂、具有丁二烯構造之環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含有螺環之環氧樹脂、環己烷型環氧樹脂、環己烷二甲醇型環氧樹脂、伸萘基醚型環氧樹脂、三羥甲基型環氧樹脂、四苯基乙烷型環氧樹脂等。環氧樹脂可1種單獨使用,亦可組合2種以上使用。-(A) Epoxy resin-The fluorene resin composition system contains (A) an epoxy resin. Examples of the epoxy resin include bixylenol type epoxy resin, bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, bisphenol AF type epoxy resin, and bicyclic Pentadiene epoxy resin, phenol novolac epoxy resin, naphthol novolac epoxy resin, novolac epoxy resin, tert-butyl-catechol epoxy resin, naphthalene epoxy resin Resin, Naphthol type epoxy resin, Onion type epoxy resin, Glycidylamine type epoxy resin, Glycidyl ester type epoxy resin, Cresol novolac type epoxy resin, Biphenyl type epoxy resin, Wire Aliphatic epoxy resin, epoxy resin with butadiene structure, alicyclic epoxy resin, heterocyclic epoxy resin, epoxy resin containing spiral ring, cyclohexane epoxy resin, cyclohexane Dimethyl alcohol type epoxy resin, dnaphthyl ether type epoxy resin, trimethylol type epoxy resin, tetraphenylethane type epoxy resin and the like. The epoxy resin may be used singly or in combination of two or more kinds.

環氧樹脂較佳為包含於1分子中具有2個以上環氧基之環氧樹脂。將環氧樹脂之不揮發成分定為100質量%時,較佳為至少50質量%以上為於1分子中具有2個以上環氧基之環氧樹脂。其中,樹脂組成物較佳為組合包含於溫度20℃為液狀之環氧樹脂(以下稱為「液狀環氧樹脂」)、與於溫度20℃為固體狀之環氧樹脂(亦稱為「固體狀環氧樹脂」)。作為液狀環氧樹脂,較佳為於1分子中具有2個以上環氧基之液狀環氧樹脂,更佳為於1分子中具有2個以上環氧基之芳香族系液狀環氧樹脂。作為固體狀環氧樹脂,較佳為於1分子中具有3個以上環氧基之固體狀環氧樹脂,更佳為於1分子中具有3個以上環氧基之芳香族系固體狀環氧樹脂。在本發明,所謂芳香族系之環氧樹脂,係意指其分子內具有芳香環之環氧樹脂。The epoxy resin is preferably an epoxy resin having two or more epoxy groups in one molecule. When the non-volatile content of the epoxy resin is 100% by mass, at least 50% by mass or more is preferably an epoxy resin having two or more epoxy groups in one molecule. Among them, the resin composition is preferably a combination of an epoxy resin that is liquid at a temperature of 20 ° C (hereinafter referred to as "liquid epoxy resin") and an epoxy resin that is solid at a temperature of 20 ° C (also referred to as a "epoxy resin") "Solid epoxy resin"). The liquid epoxy resin is preferably a liquid epoxy resin having two or more epoxy groups in one molecule, and more preferably an aromatic liquid epoxy resin having two or more epoxy groups in one molecule. Resin. The solid epoxy resin is preferably a solid epoxy resin having three or more epoxy groups in one molecule, and more preferably an aromatic solid epoxy resin having three or more epoxy groups in one molecule. Resin. In the present invention, an aromatic epoxy resin means an epoxy resin having an aromatic ring in its molecule.

作為液狀環氧樹脂,較佳為雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚AF型環氧樹脂、萘型環氧樹脂、縮水甘油基酯型環氧樹脂、縮水甘油基胺型環氧樹脂、酚酚醛清漆型環氧樹脂、具有酯骨架之脂環式環氧樹脂、環己烷型環氧樹脂、環己烷二甲醇型環氧樹脂、縮水甘油基胺型環氧樹脂及具有丁二烯構造之環氧樹脂,更佳為雙酚A型環氧樹脂、雙酚F型環氧樹脂及環己烷型環氧樹脂。作為液狀環氧樹脂之具體例,可列舉DIC公司製之「HP4032」、「HP4032D」、「HP4032SS」(萘型環氧樹脂)、三菱化學公司製之「828US」、「jER828EL」、「825」、「EPIKOTE828EL」(雙酚A型環氧樹脂)、「jER807」、「1750」(雙酚F型環氧樹脂)、「jER152」(酚酚醛清漆型環氧樹脂)、「630」、「630LSD」(縮水甘油基胺型環氧樹脂)、新日鐵住金化學公司製之「ZX1059」(雙酚A型環氧樹脂與雙酚F型環氧樹脂之混合品)、Nagase ChemteX公司製之「EX-721」(縮水甘油基酯型環氧樹脂)、Daicel公司製之「Celloxide 2021P」(具有酯骨架之脂環式環氧樹脂)、「PB-3600」(具有丁二烯構造之環氧樹脂)、新日鐵化學公司製之「ZX1658」、「ZX1658GS」(液狀1,4-縮水甘油基環己烷型環氧樹脂)、三菱化學公司製之「630LSD」(縮水甘油基胺型環氧樹脂)等。此等可1種單獨使用,亦可組合2種以上使用。The liquid epoxy resin is preferably a bisphenol A epoxy resin, a bisphenol F epoxy resin, a bisphenol AF epoxy resin, a naphthalene epoxy resin, a glycidyl ester epoxy resin, or a shrinking epoxy resin. Glycerylamine epoxy resin, phenol novolac epoxy resin, alicyclic epoxy resin with ester skeleton, cyclohexane epoxy resin, cyclohexanedimethanol epoxy resin, glycidylamine epoxy resin The epoxy resin and the epoxy resin having a butadiene structure are more preferably a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, and a cyclohexane type epoxy resin. Specific examples of the liquid epoxy resin include "HP4032", "HP4032D", "HP4032SS" (naphthalene-type epoxy resin) manufactured by DIC Corporation, "828US", "jER828EL", and "825" manufactured by Mitsubishi Chemical Corporation. "," EPIKOTE828EL "(bisphenol A epoxy resin)," jER807 "," 1750 "(bisphenol F epoxy resin)," jER152 "(phenol novolac epoxy resin)," 630 "," 630 " "630LSD" (glycidylamine type epoxy resin), "ZX1059" (mixture of bisphenol A type epoxy resin and bisphenol F type epoxy resin) manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., and manufactured by Nagase ChemteX Corporation "EX-721" (glycidyl ester type epoxy resin), "Celloxide 2021P" (alicyclic epoxy resin with ester skeleton) manufactured by Daicel, "PB-3600" (ring with butadiene structure) Oxygen resin), "ZX1658", "ZX1658GS" (liquid 1,4-glycidyl cyclohexane type epoxy resin) manufactured by Nippon Steel Chemical Co., Ltd., "630LSD" (glycidylamine) manufactured by Mitsubishi Chemical Corporation Type epoxy resin) and so on. These may be used alone or in combination of two or more.

作為固體狀環氧樹脂,較佳為聯二甲酚型環氧樹脂、萘型環氧樹脂、萘型4官能環氧樹脂、甲酚酚醛清漆型環氧樹脂、雙環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚型環氧樹脂、聯苯型環氧樹脂、伸萘基醚型環氧樹脂、蔥型環氧樹脂、雙酚A型環氧樹脂、雙酚AF型環氧樹脂、四苯基乙烷型環氧樹脂,更佳為聯二甲酚型環氧樹脂、萘型環氧樹脂、雙酚AF型環氧樹脂及伸萘基醚型環氧樹脂。作為固體狀環氧樹脂之具體例,可列舉DIC公司製之「HP4032H」(萘型環氧樹脂)、「HP-4700」、「HP-4710」(萘型4官能環氧樹脂)、「N-690」(甲酚酚醛清漆型環氧樹脂)、「N-695」(甲酚酚醛清漆型環氧樹脂)、「HP-7200」(雙環戊二烯型環氧樹脂)、「HP-7200HH」、「HP-7200H」、「EXA-7311」、「EXA-7311-G3」、「EXA-7311-G4」、「EXA-7311-G4S」、「HP6000」(伸萘基醚型環氧樹脂)、日本化藥公司製之「EPPN-502H」(參酚型環氧樹脂)、「NC7000L」(萘酚酚醛清漆型環氧樹脂)、「NC3000H」、「NC3000」、「NC3000L」、「NC3100」(聯苯型環氧樹脂)、新日鐵住金化學公司製之「ESN475V」(萘型環氧樹脂)、「ESN485」(萘酚酚醛清漆型環氧樹脂)、三菱化學公司製之「YX4000H」、「YX4000」、「YL6121」(聯苯型環氧樹脂)、「YX4000HK」(聯二甲酚型環氧樹脂)、「YX8800」(蔥型環氧樹脂)、大阪Gas Chemicals公司製之「PG-100」、「CG-500」、三菱化學公司製之「YL7760」(雙酚AF型環氧樹脂)、「YL7800」(茀型環氧樹脂)、三菱化學公司製之「jER1010」(固體狀雙酚A型環氧樹脂)、「jER1031S」(四苯基乙烷型環氧樹脂)等。此等可1種單獨使用,亦可組合2種以上使用。As the solid epoxy resin, bixylenol type epoxy resin, naphthalene type epoxy resin, naphthalene type 4-functional epoxy resin, cresol novolac type epoxy resin, and dicyclopentadiene type epoxy resin are preferable. Ginseng epoxy resin, naphthol epoxy resin, biphenyl epoxy resin, naphthyl ether epoxy resin, onion epoxy resin, bisphenol A epoxy resin, bisphenol AF ring Oxygen resin, tetraphenylethane type epoxy resin, more preferably bixylenol type epoxy resin, naphthalene type epoxy resin, bisphenol AF type epoxy resin, and naphthyl ether type epoxy resin. Specific examples of the solid epoxy resin include "HP4032H" (naphthalene-type epoxy resin), "HP-4700", "HP-4710" (naphthalene-type 4-functional epoxy resin), and "N" manufactured by DIC Corporation. -690 "(cresol novolac type epoxy resin)," N-695 "(cresol novolac type epoxy resin)," HP-7200 "(dicyclopentadiene type epoxy resin)," HP-7200HH "," HP-7200H "," EXA-7311 "," EXA-7311-G3 "," EXA-7311-G4 "," EXA-7311-G4S "," HP6000 "(dnaphthyl ether type epoxy resin ), "EPPN-502H" (ginseng phenol type epoxy resin), "NC7000L" (naphthol novolac type epoxy resin), "NC3000H", "NC3000", "NC3000L", "NC3100" manufactured by Nippon Kayaku Co., Ltd. "(Biphenyl type epoxy resin)," ESN475V "(naphthalene type epoxy resin) manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd.," ESN485 "(naphthol novolac type epoxy resin)," YX4000H manufactured by Mitsubishi Chemical "," YX4000 "," YL6121 "(biphenyl epoxy resin)," YX4000HK "(bixylenol epoxy resin)," YX8800 "(green onion epoxy resin), Osaka Gas Chemicals Corporation" PG-100 "CG-500", "YL7760" (bisphenol AF type epoxy resin), "YL7800" (type epoxy resin) manufactured by Mitsubishi Chemical Corporation, "jER1010" (solid bisphenol A) manufactured by Mitsubishi Chemical Corporation Type epoxy resin), "jER1031S" (tetraphenylethane type epoxy resin), etc. These may be used alone or in combination of two or more.

作為(A)成分,併用液狀環氧樹脂與固體狀環氧樹脂時,該等之量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比較佳為1:1~1:20的範圍。藉由將液狀環氧樹脂與固體狀環氧樹脂的量比定為該範圍,得到i)於以樹脂薄片的形態使用時帶來適度之黏著性、ii)以樹脂薄片的形態使用時得到充分之可撓性,提昇操作性、以及iii)可得到具有充分之破斷強度的硬化物等之效果。從上述i)~iii)之效果的觀點來看,液狀環氧樹脂與固體狀環氧樹脂的量比(液狀環氧樹脂:固體狀環氧樹脂),以質量比更佳為1:2~1:10的範圍,再更佳為1:5~1:10的範圍。When the liquid epoxy resin and the solid epoxy resin are used as the component (A), the quantity ratio (liquid epoxy resin: solid epoxy resin) is preferably 1: 1 to 1:20 in terms of quality. Range. By setting the ratio of the amount of the liquid epoxy resin to the solid epoxy resin within this range, i) is obtained when it is used in the form of a resin sheet to impart moderate adhesion, ii) it is obtained when used in the form of a resin sheet Sufficient flexibility, improved operability, and iii) the effect of obtaining a hardened product having sufficient breaking strength and the like. From the viewpoint of the effects of i) to iii), the mass ratio of the liquid epoxy resin to the solid epoxy resin (liquid epoxy resin: solid epoxy resin) is more preferably 1: The range is from 2 to 1:10, and more preferably from 1: 5 to 1:10.

樹脂組成物中之(A)成分的含量,從得到顯示良好之機械強度、絕緣信賴性之絕緣層的觀點來看,將樹脂成分定為100質量%時,較佳為10質量%以上,更佳為20質量%以上,再更佳為30質量%以上。環氧樹脂的含量之上限,只要能發揮本發明的效果,雖並未特別限定,但較佳為60質量%以下,更佳為55質量%以下、50質量%以下或45質量%以下。The content of the component (A) in the resin composition is preferably 10% by mass or more when the resin component is set to 100% by mass from the viewpoint of obtaining an insulating layer exhibiting good mechanical strength and insulation reliability. It is preferably at least 20% by mass, and even more preferably at least 30% by mass. Although the upper limit of the content of the epoxy resin is not particularly limited as long as the effects of the present invention can be exhibited, it is preferably 60% by mass or less, more preferably 55% by mass or less, 50% by mass or less, or 45% by mass.

(A)成分之環氧基當量較佳為50~5000,更佳為50~3000,再更佳為80~2000,又再更佳為110~1000。藉由成為此範圍,硬化物之交聯密度變充分可帶來表面粗糙度小之絕緣層。尚,環氧基當量可依JIS K7236測定,係包含1當量之環氧基的樹脂的質量。The epoxy group equivalent of the component (A) is preferably 50 to 5000, more preferably 50 to 3000, even more preferably 80 to 2000, and still more preferably 110 to 1,000. By setting it as this range, the crosslinking density of hardened | cured material becomes sufficient, and the insulating layer with small surface roughness can be brought. The epoxy equivalent can be measured in accordance with JIS K7236, and is the mass of a resin containing one equivalent of an epoxy group.

(A)成分之重量平均分子量較佳為100~5000,更佳為250~3000,再更佳為400~1500。於此,環氧樹脂之重量平均分子量係藉由凝膠滲透層析(GPC)法所測定之聚苯乙烯換算的重量平均分子量。The weight average molecular weight of the component (A) is preferably 100 to 5000, more preferably 250 to 3000, and even more preferably 400 to 1500. Here, the weight average molecular weight of an epoxy resin is the weight average molecular weight of polystyrene conversion measured by the gel permeation chromatography (GPC) method.

-(B)硬化劑-   樹脂組成物係含有(B)硬化劑。作為(B)成分,若為具有硬化(A)成分之機能者,則並未特別限定,例如可列舉酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑、苯并噁嗪系硬化劑、氰酸酯系硬化劑及碳二醯亞胺系硬化劑等。硬化劑可1種單獨使用,或併用2種以上。-(B) Hardener- The resin composition system contains (B) a hardener. The component (B) is not particularly limited as long as it has a function of curing the component (A). Examples include a phenol-based hardener, a naphthol-based hardener, an active ester-based hardener, and a benzoxazine-based hardener. Agents, cyanate-based hardeners and carbodiimide-based hardeners. The hardener can be used alone or in combination of two or more.

作為酚系硬化劑及萘酚系硬化劑,從耐熱性及耐水性的觀點來看,較佳為具有酚醛清漆構造之酚系硬化劑,或具有酚醛清漆構造之萘酚系硬化劑。又,從與導體層的密著性的觀點來看,較佳為含氮酚系硬化劑,更佳為含有三嗪骨架之酚系硬化劑。As the phenol-based hardener and naphthol-based hardener, from the viewpoints of heat resistance and water resistance, a phenol-based hardener having a novolac structure or a naphthol-based hardener having a novolac structure is preferred. From the standpoint of adhesion with the conductor layer, a nitrogen-containing phenol-based hardener is preferred, and a phenol-based hardener containing a triazine skeleton is more preferred.

作為酚系硬化劑及萘酚系硬化劑之具體例,例如可列舉明和化成公司製之「MEH-7700」、「MEH-7810」、「MEH-7851」、日本化藥公司製之「NHN」、「CBN」、「GPH」、新日鐵住金公司製之「SN170」、「SN180」、「SN190」、「SN475」、「SN485」、「SN495」、「SN-495V」「SN375」、「SN395」、DIC公司製之「TD-2090」、「LA-7052」、「LA-7054」、「LA-1356」、「LA-3018-50P」、「EXB-9500」等。Specific examples of the phenol-based hardener and naphthol-based hardener include, for example, "MEH-7700", "MEH-7810", "MEH-7851", and "NHN" manufactured by Nippon Kayakusei Corporation. , "CBN", "GPH", "SN170", "SN180", "SN190", "SN475", "SN485", "SN495", "SN-495V", "SN375", " "SN395", "TD-2090", "LA-7052", "LA-7054", "LA-1356", "LA-3018-50P", "EXB-9500", etc. manufactured by DIC Corporation.

作為活性酯系硬化劑,雖並未特別限制,但一般而言較佳為使用酚酯類、硫酚酯類、N-羥基胺酯類、雜環羥基化合物之酯類等之於1分子中具有2個以上反應活性高之酯基的化合物。該活性酯系硬化劑較佳為藉由羧酸化合物及/或硫羧酸化合物與羥基化合物及/或硫醇化合物的縮合反應獲得。尤其是從提昇耐熱性的觀點來看,較佳為由羧酸化合物與羥基化合物所得之活性酯系硬化劑,更佳為由羧酸化合物與酚化合物及/或萘酚化合物所得之活性酯系硬化劑。作為羧酸化合物,例如可列舉苯甲酸、乙酸、琥珀酸、馬來酸、衣康酸、苯二甲酸、間苯二甲酸、對苯二甲酸、均苯四甲酸等。作為酚化合物或萘酚化合物,例如可列舉氫醌、間苯二酚、雙酚A、雙酚F、雙酚S、酚酞、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、酚、o-甲酚、m-甲酚、p-甲酚、鄰苯二酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚、苯三醇、雙環戊二烯型二酚化合物、酚酚醛清漆等。於此,所謂「雙環戊二烯型二酚化合物」,係指於雙環戊二烯1分子縮合酚2分子所得之二酚化合物。Although the active ester-based hardener is not particularly limited, it is generally preferred to use phenol esters, thiophenol esters, N-hydroxyamine esters, heterocyclic hydroxy esters, etc. in one molecule. A compound having two or more highly reactive ester groups. The active ester-based hardener is preferably obtained by a condensation reaction between a carboxylic acid compound and / or a thiocarboxylic acid compound and a hydroxy compound and / or a thiol compound. Especially from the viewpoint of improving heat resistance, an active ester-based hardener obtained from a carboxylic acid compound and a hydroxy compound is preferable, and an active ester-based hardener obtained from a carboxylic acid compound and a phenol compound and / or a naphthol compound is more preferable. hardener. Examples of the carboxylic acid compound include benzoic acid, acetic acid, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, and pyromellitic acid. Examples of the phenol compound or naphthol compound include hydroquinone, resorcinol, bisphenol A, bisphenol F, bisphenol S, phenolphthalein, methylated bisphenol A, methylated bisphenol F, and methylation. Bisphenol S, phenol, o-cresol, m-cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-dihydroxy Naphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, resorcinol, benzenetriol, dicyclopentadiene-type diphenol compound, phenol Novolac, etc. Here, the "dicyclopentadiene-type diphenol compound" refers to a diphenol compound obtained by condensing two molecules of phenol into one molecule of dicyclopentadiene.

具體而言,較佳為包含雙環戊二烯型二酚構造之活性酯化合物、包含萘構造之活性酯化合物、包含酚酚醛清漆之乙醯化物之活性酯化合物、包含酚酚醛清漆之苯甲醯基化物之活性酯化合物,其中,更佳為包含萘構造之活性酯化合物、包含雙環戊二烯型二酚構造之活性酯化合物。所謂「雙環戊二烯型二酚構造」,係表示由伸苯基-二伸環戊基-伸苯基所構成之2價構造單元。Specifically, an active ester compound containing a dicyclopentadiene-type diphenol structure, an active ester compound containing a naphthalene structure, an active ester compound containing an acetophenate of a novolac, and a benzamidine containing a novolac Among the active ester compounds of the base compound, an active ester compound containing a naphthalene structure and an active ester compound containing a dicyclopentadiene-type diphenol structure are more preferred. The "dicyclopentadiene-type diphenol structure" refers to a divalent structural unit composed of phenylene-dicyclopentyl-phenylene.

作為活性酯系硬化劑之市售品,作為包含雙環戊二烯型二酚構造之活性酯化合物,可列舉「EXB9451」、「EXB9460」、「EXB9460S」、「HPC-8000-65T」、「HPC-8000H-65TM」、「EXB-8000L-65TM」、「EXB-8150-65T」(DIC公司製),作為包含萘構造之活性酯化合物,可列舉「EXB9416-70BK」(DIC公司製),作為包含酚酚醛清漆之乙醯化物之活性酯化合物,可列舉「DC808」(三菱化學公司製),作為包含酚酚醛清漆之苯甲醯基化物之活性酯化合物,可列舉「YLH1026」(三菱化學公司製),作為酚酚醛清漆之乙醯化物即活性酯系硬化劑,可列舉「DC808」(三菱化學公司製),作為酚酚醛清漆之苯甲醯基化物即活性酯系硬化劑,可列舉「YLH1026」(三菱化學公司製)、「YLH1030」(三菱化學公司製)、「YLH1048」(三菱化學公司製)等。As a commercially available product of the active ester-based hardener, examples of the active ester compound containing a dicyclopentadiene-type diphenol structure include "EXB9451", "EXB9460", "EXB9460S", "HPC-8000-65T", "HPC -8000H-65TM "," EXB-8000L-65TM "," EXB-8150-65T "(manufactured by DIC Corporation), as the active ester compound containing a naphthalene structure," EXB9416-70BK "(manufactured by DIC Corporation) can be cited as As an active ester compound containing an acetic acid compound of a phenol novolac, "DC808" (manufactured by Mitsubishi Chemical Corporation), and as an active ester compound containing a benzoic acid compound of a phenol novolac, "YLH1026" (Mitsubishi Chemical Corporation) (Manufactured), as the active ester-based hardener that is the acetic acid compound of phenol novolac, "DC808" (manufactured by Mitsubishi Chemical Corporation), and as the active ester-based hardener that is the benzoyl compound of phenol novolac, " "YLH1026" (manufactured by Mitsubishi Chemical Corporation), "YLH1030" (manufactured by Mitsubishi Chemical Corporation), "YLH1048" (manufactured by Mitsubishi Chemical Corporation), and the like.

作為苯并噁嗪系硬化劑之具體例,可列舉昭和高分子公司製之「HFB2006M」、四國化成工業公司製之「P-d」、「F-a」。Specific examples of the benzoxazine-based hardener include "HFB2006M" manufactured by Showa Polymer Co., Ltd., and "P-d" and "F-a" manufactured by Shikoku Chemical Industry Co., Ltd.

作為氰酸酯系硬化劑,例如可列舉由雙酚A二氰酸酯、聚酚氰酸酯、寡(3-亞甲基-1,5-伸苯基氰酸酯)、4,4’-亞甲基雙(2,6-二甲基苯基氰酸酯)、4,4’-亞乙基二苯基二氰酸酯、六氟雙酚A二氰酸酯、2,2-雙(4-氰酸酯)苯基丙烷、1,1-雙(4-氰酸酯苯基甲烷)、雙(4-氰酸酯-3,5-二甲基苯基)甲烷、1,3-雙(4-氰酸酯苯基-1-(甲基亞乙基))苯、雙(4-氰酸酯苯基)硫醚及雙(4-氰酸酯苯基)醚等之2官能氰酸酯樹脂、酚酚醛清漆及甲酚酚醛清漆等所衍生之多官能氰酸酯樹脂、此等氰酸酯樹脂一部分經三嗪化之預聚物等。作為氰酸酯系硬化劑之具體例,可列舉Lonza Japan 公司製之「PT30」及「PT60」(酚酚醛清漆型多官能氰酸酯樹脂)、「ULL-950S」(多官能氰酸酯樹脂)、「BA230」、「BA230S75」(雙酚A二氰酸酯的一部分或全部成為經三嗪化之三聚物的預聚物)等。Examples of the cyanate-based curing agent include bisphenol A dicyanate, polyphenol cyanate, oligo (3-methylene-1,5-phenylene cyanate), and 4,4 ' -Methylenebis (2,6-dimethylphenylcyanate), 4,4'-ethylenediphenyldicyanate, hexafluorobisphenol A dicyanate, 2,2- Bis (4-cyanate) phenylpropane, 1,1-bis (4-cyanatephenylmethane), bis (4-cyanate-3,5-dimethylphenyl) methane, 1, 3-bis (4-cyanatephenyl-1- (methylethylene)) benzene, bis (4-cyanatephenyl) sulfide, and bis (4-cyanatephenyl) ether Polyfunctional cyanate resins derived from bifunctional cyanate resins, phenol novolacs, cresol novolacs, etc., and prepolymers of which some of these cyanate resins are triazinated. Specific examples of the cyanate-based curing agent include "PT30" and "PT60" (phenol novolac-type polyfunctional cyanate resin) and "ULL-950S" (polyfunctional cyanate resin) manufactured by Lonza Japan. ), "BA230", "BA230S75" (prepolymers in which part or all of the bisphenol A dicyanate becomes a triazinated terpolymer) and the like.

作為碳二醯亞胺系硬化劑之具體例,可列舉日清紡化學公司製之「V-03」、「V-07」等。Specific examples of the carbodiimide-based hardener include "V-03" and "V-07" manufactured by Nisshinbo Chemical Co., Ltd.

環氧樹脂與硬化劑的量比以[環氧樹脂之環氧基的合計數]:[硬化劑之反應基的合計數]的比率,較佳為1:0.01~1:2的範圍,更佳為1:0.05~1:1.5,再更佳為1:0.1~1:1。於此,所謂硬化劑之反應基,係活性羥基、活性酯基等,因硬化劑的種類而異。又,所謂環氧樹脂之環氧基的合計數,係針對全部之環氧樹脂將各環氧樹脂之固形分質量除以環氧基當量之值進行合計之值,所謂硬化劑之反應基的合計數,係針對全部之硬化劑將各硬化劑之固形分質量除以反應基當量之值進行合計之值。藉由將環氧樹脂與硬化劑的量比定為該範圍,更加提昇樹脂組成物層之硬化物的耐熱性。The ratio of the amount of the epoxy resin to the hardener is a ratio of [total number of epoxy groups of the epoxy resin]: [total number of reactive groups of the hardener], preferably in a range of 1: 0.01 to 1: 2, and more It is preferably 1: 0.05 to 1: 1.5, and even more preferably 1: 0.1 to 1: 1. Here, the reactive group of the hardener is an active hydroxyl group, an active ester group, and the like, and varies depending on the type of the hardener. In addition, the total number of epoxy groups of an epoxy resin is a total value obtained by dividing the solid content of each epoxy resin by an epoxy group equivalent value for all epoxy resins. The total count is a value obtained by dividing the solid content of each hardener by the value of the reactive group equivalent for all the hardeners. By setting the amount ratio of the epoxy resin to the hardener within this range, the heat resistance of the hardened product of the resin composition layer is further improved.

在一實施形態,樹脂組成物係包含先述之環氧樹脂及硬化劑。樹脂組成物較佳為分別包含作為(A)環氧樹脂之液狀環氧樹脂與固體狀環氧樹脂的混合物、作為(B)硬化劑之選自由酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯系硬化劑所構成之群組中之1種以上。作為(A)環氧樹脂,液狀環氧樹脂與固體狀環氧樹脂的混合物(液狀環氧樹脂:固體狀環氧樹脂)之質量比較佳為1:0.1~1:20,更佳為1:1~1:10,再更佳為1:5~1:8。作為(B)硬化劑,較佳為包含選自由酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯系硬化劑所構成之群組中之1種以上,更佳為包含選自由酚系硬化劑及活性酯系硬化劑所構成之群組中之1種以上。In one embodiment, the resin composition includes the aforementioned epoxy resin and hardener. The resin composition preferably comprises a mixture of a liquid epoxy resin and a solid epoxy resin as (A) an epoxy resin, and (B) a hardener selected from a phenol-based hardener, a naphthol-based hardener, One or more of the group consisting of an active ester-based hardener and a cyanate-based hardener. As the (A) epoxy resin, the quality of the mixture of the liquid epoxy resin and the solid epoxy resin (liquid epoxy resin: solid epoxy resin) is preferably 1: 0.1 to 1:20, and more preferably 1: 1 to 1:10, and more preferably 1: 5 to 1: 8. (B) The hardener is preferably one or more selected from the group consisting of a phenol-based hardener, a naphthol-based hardener, an active ester-based hardener, and a cyanate-based hardener, and more preferably One or more selected from the group consisting of a phenol-based hardener and an active ester-based hardener.

作為(B)成分,從提昇耐藥品性的觀點來看,較佳為含有活性酯系硬化劑。活性酯系硬化劑的含量,從將透過係數P調整在指定的範圍內變容易的觀點來看,將樹脂成分定為100質量%時,較佳為15質量%以下,更佳為14質量%以下,再更佳為13質量%以下。下限較佳為1質量%以上,更佳為5質量%以上,再更佳為8質量%以上。As (B) component, it is preferable to contain an active ester hardening | curing agent from a viewpoint of improving chemical resistance. The content of the active ester-based hardener is from the viewpoint of making it easy to adjust the transmission coefficient P within a specified range. When the resin component is 100% by mass, it is preferably 15% by mass or less, and more preferably 14% by mass. Hereinafter, it is more preferably 13% by mass or less. The lower limit is preferably 1% by mass or more, more preferably 5% by mass or more, and even more preferably 8% by mass or more.

相對於(B)成分全體之活性酯系硬化劑的含有比率,係相對於(B)成分100質量%,較佳為40質量%以上,更佳為50質量%以上,再更佳為60質量%以上。上限較佳為75質量%以下,更佳為73質量%以下,再更佳為70質量%以下。藉由成為該範圍內的方式含有活性酯系硬化劑,變容易將透過係數P調整在指定的範圍內。The content ratio of the active ester hardener based on the entire (B) component is 100% by mass, preferably 40% by mass or more, more preferably 50% by mass or more, and still more preferably 60% by mass relative to the (B) component. %the above. The upper limit is preferably 75% by mass or less, more preferably 73% by mass or less, and even more preferably 70% by mass or less. By including the active ester hardener in such a range, it becomes easy to adjust the transmission coefficient P within a predetermined range.

(B)成分的含量將樹脂成分定為100質量%時,較佳為20質量%以下,更佳為19質量%以下,再更佳為18質量%以下。又,下限較佳為1質量%以上,再更佳為5質量%以上,更佳為8質量%以上。藉由將(B)成分的含量定為該範圍內,可有效果地提昇基底密著性。When the content of the component (B) is 100% by mass, the content is preferably 20% by mass or less, more preferably 19% by mass or less, and still more preferably 18% by mass or less. The lower limit is preferably 1% by mass or more, even more preferably 5% by mass or more, and even more preferably 8% by mass or more. By setting the content of the component (B) within this range, the adhesion of the substrate can be effectively improved.

-(C)無機填充材-   在一實施形態,樹脂組成物可含有無機填充材。無機填充材之材料雖並未特別限定,但例如可列舉二氧化矽、氧化鋁、玻璃、堇青石、矽氧化物、硫酸鋇、碳酸鋇、滑石、黏土、雲母粉、氧化鋅、水滑石、水鋁石、氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、氧化鎂、氮化硼、氮化鋁、氮化錳、硼酸鋁、碳酸鍶、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、氧化鋯、鈦酸鋇、鈦酸鋯酸鋇、鋯酸鋇、鋯酸鈣、磷酸鋯及磷酸鎢酸鋯等。此等當中,特別適合二氧化矽。作為二氧化矽,例如可列舉無定形二氧化矽、熔融二氧化矽、結晶二氧化矽、合成二氧化矽、中空二氧化矽等。又,作為二氧化矽,較佳為球狀二氧化矽。無機填充材可1種單獨使用,亦可組合2種以上使用。-(C) Inorganic Filler-(1) In one embodiment, the resin composition may contain an inorganic filler. Although the material of the inorganic filler is not particularly limited, examples thereof include silicon dioxide, aluminum oxide, glass, cordierite, silicon oxide, barium sulfate, barium carbonate, talc, clay, mica powder, zinc oxide, hydrotalcite, Gibbsite, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, boron nitride, aluminum nitride, manganese nitride, aluminum borate, strontium carbonate, strontium titanate, calcium titanate, magnesium titanate , Bismuth titanate, titanium oxide, zirconia, barium titanate, barium zirconate titanate, barium zirconate, calcium zirconate, zirconium phosphate, zirconium phosphate and zirconium phosphate. Among these, it is particularly suitable for silicon dioxide. Examples of the silicon dioxide include amorphous silicon dioxide, fused silicon dioxide, crystalline silicon dioxide, synthetic silicon dioxide, and hollow silicon dioxide. The silicon dioxide is preferably spherical silicon dioxide. The inorganic fillers may be used alone or in combination of two or more.

無機填充材之平均粒徑,從增大無機填充材的表面積,將透過係數P調整在指定的範圍內的觀點來看,較佳為0.35μm以下,更佳為0.3μm以下,再更佳為0.25μm以下、0.2μm以下、1.5μm以下或1μm以下。平均粒徑的下限較佳為0.05μm以上,更佳為0.06μm以上,再更佳為0.07μm以上。該平均粒徑的上限,作為具有如此之平均粒徑之無機填充材的市售品,例如可列舉電氣化學工業公司製「UFP-30」等。The average particle diameter of the inorganic filler is preferably 0.35 μm or less, more preferably 0.3 μm or less, and even more preferably from the viewpoint of increasing the surface area of the inorganic filler and adjusting the transmission coefficient P within a specified range. 0.25 μm or less, 0.2 μm or less, 1.5 μm or less, or 1 μm or less. The lower limit of the average particle diameter is preferably 0.05 μm or more, more preferably 0.06 μm or more, and still more preferably 0.07 μm or more. The upper limit of the average particle diameter is a commercially available product of an inorganic filler having such an average particle diameter, and examples thereof include "UFP-30" manufactured by Denki Kagaku Kogyo.

無機填充材之平均粒徑可根據米氏(Mie)散射理論藉由雷射繞射・散射法進行測定。具體而言,可藉由由雷射繞射散射式粒度分布測定裝置,將無機填充材之粒度分布以體積基準作成,將其中位徑定為平均粒徑進行測定。測定樣品可優選使用將無機填充材藉由超音波而分散在甲基乙基酮中者。作為雷射繞射散射式粒度分布測定裝置,可使用堀場製作所公司製「LA-500」、島津製作所公司製「SALD-2200」等。The average particle diameter of the inorganic filler can be measured by a laser diffraction / scattering method based on the Mie scattering theory. Specifically, the particle size distribution of the inorganic filler can be prepared on a volume basis by a laser diffraction scattering particle size distribution measurement device, and the median diameter can be determined as the average particle diameter. As the measurement sample, an inorganic filler is preferably dispersed in methyl ethyl ketone by ultrasonic waves. As the laser diffraction scattering type particle size distribution measuring device, "LA-500" manufactured by Horiba, Ltd., and "SALD-2200" manufactured by Shimadzu Corporation can be used.

無機填充材之比表面積,從將透過係數P調整在指定的範圍內的觀點來看,較佳為15m2 /g以上,更佳為20m2 /g以上,再更佳為25m2 /g以上。該比表面積的上限較佳為60m2 /g以下,更佳為50m2 /g以下,再更佳為40m2 /g以下。無機填充材之比表面積,例如可使用BET全自動比表面積測定裝置等進行測定。更具體而言,比表面積係藉由依BET法,使用比表面積測定裝置(Mountech公司製Macsorb HM-1210),使氮氣吸附在試料表面,使用BET多點法算出比表面積而獲得。The specific surface area of the inorganic filler is preferably 15 m 2 / g or more, more preferably 20 m 2 / g or more, and even more preferably 25 m 2 / g or more from the viewpoint of adjusting the transmission coefficient P within a specified range. . The upper limit of the specific surface area is preferably 60 m 2 / g or less, more preferably 50 m 2 / g or less, and even more preferably 40 m 2 / g or less. The specific surface area of the inorganic filler can be measured using, for example, a BET automatic specific surface area measuring device. More specifically, the specific surface area is obtained by using a specific surface area measuring device (Macsorb HM-1210, manufactured by Mountech Co., Ltd.) to adsorb nitrogen on the surface of a sample according to the BET method, and calculate the specific surface area using the BET multipoint method.

無機填充材從提高耐濕性及分散性的觀點來看,較佳為以含氟之矽烷偶合劑、胺基矽烷系偶合劑、環氧基矽烷系偶合劑、巰基矽烷系偶合劑、矽烷系偶合劑、烷氧基矽烷化合物、有機矽氮烷化合物、鈦酸酯系偶合劑等之1種以上之表面處理劑處理,特佳為以胺基矽烷偶合劑處理。作為表面處理劑之市售品,例如可列舉信越化學工業公司製「KBM403」(3-縮水甘油氧基丙基三甲氧基矽烷)、信越化學工業公司製「KBM803」(3-巰基丙基三甲氧基矽烷)、信越化學工業公司製「KBE903」(3-胺基丙基三乙氧基矽烷)、信越化學工業公司製「KBM573」(N-苯基-3-胺基丙基三甲氧基矽烷)、信越化學工業公司製「SZ-31」(六甲基二矽氮烷)、信越化學工業公司製「KBM103」(苯基三甲氧基矽烷)、信越化學工業公司製「KBM-4803」(長鏈環氧基型矽烷偶合劑)、信越化學工業公司製「KBM-7103」(3,3,3-三氟丙基三甲氧基矽烷)等。From the viewpoint of improving moisture resistance and dispersibility, the inorganic filler is preferably a fluorine-containing silane coupling agent, an amine-based silane coupling agent, an epoxy-based silane coupling agent, a mercaptosilane-based coupling agent, or a silane-based coupling agent. One or more surface treatment agents such as a coupling agent, an alkoxysilane compound, an organic silazane compound, and a titanate-based coupling agent are particularly preferably treated with an aminosilane coupling agent. Examples of commercially available surface treatment agents include "KBM403" (3-glycidyloxypropyltrimethoxysilane) manufactured by Shin-Etsu Chemical Industry Co., Ltd. and "KBM803" (3-mercaptopropyltrimethyl) manufactured by Shin-Etsu Chemical Industry Co., Ltd. Oxysilane), "KBE903" (3-aminopropyltriethoxysilane) manufactured by Shin-Etsu Chemical Industry Co., Ltd., "KBM573" (N-phenyl-3-aminopropyltrimethoxy) manufactured by Shin-Etsu Chemical Industry Co., Ltd. Silane), Shin-Etsu Chemical Industry Co., Ltd. "SZ-31" (hexamethyldisilazane), Shin-Etsu Chemical Industry Co., Ltd. "KBM103" (phenyltrimethoxysilane), Shin-Etsu Chemical Industry Co., Ltd. "KBM-4803" (Long-chain epoxy-based silane coupling agent), "KBM-7103" (3,3,3-trifluoropropyltrimethoxysilane) manufactured by Shin-Etsu Chemical Co., Ltd., and the like.

藉由表面處理劑之表面處理的程度,從提昇無機填充材之分散性的觀點來看,相對於(C)成分100質量份,以0.2質量份~5質量份的表面處理劑表面處理較佳,以0.2質量份~3質量份表面處理更佳,以0.3質量份~2質量份表面處理再更佳。According to the degree of surface treatment of the surface treatment agent, from the viewpoint of improving the dispersibility of the inorganic filler, the surface treatment of 0.2 to 5 parts by mass of the surface treatment agent is better than 100 parts by mass of the component (C) The surface treatment is more preferably 0.2 to 3 parts by mass, and the surface treatment is more preferably 0.3 to 2 parts by mass.

藉由表面處理劑之表面處理的程度,可藉由無機填充材每一單元表面積之碳量進行評估。無機填充材每一單元表面積之碳量從提昇無機填充材之分散性的觀點來看,較佳為0.02mg/m2 以上,更佳為0.1mg/m2 以上,再更佳為0.2mg/m2 以上。另一方面,從抑制樹脂清漆之熔融黏度及於薄片形態之熔融黏度的上昇的觀點來看,較佳為1mg/m2 以下,更佳為0.8mg/m2 以下,再更佳為0.5mg/m2 以下。The degree of surface treatment by the surface treatment agent can be evaluated by the amount of carbon per unit surface area of the inorganic filler. From the viewpoint of improving the dispersibility of the inorganic filler, the carbon content per unit surface area of the inorganic filler is preferably 0.02 mg / m 2 or more, more preferably 0.1 mg / m 2 or more, and still more preferably 0.2 mg / m 2 . m 2 or more. On the other hand, from the viewpoint of suppressing an increase in the melt viscosity of the resin varnish and the melt viscosity in the form of a sheet, it is preferably 1 mg / m 2 or less, more preferably 0.8 mg / m 2 or less, and still more preferably 0.5 mg. / m 2 or less.

無機填充材每一單元表面積之碳量,可將表面處理後之無機填充材藉由溶劑(例如甲基乙基酮(MEK))進行洗淨處理後測定。具體而言,作為溶劑,將充分量之MEK加入以表面處理劑表面處理之無機填充材,於25℃進行5分鐘超音波洗淨。去除上清液,使固形分乾燥後,可使用碳分析計測定無機填充材每一單元表面積之碳量。作為碳分析計,可使用堀場製作所公司製「EMIA-320V」等。The carbon content of each unit surface area of the inorganic filler can be measured after the surface-treated inorganic filler is washed with a solvent such as methyl ethyl ketone (MEK). Specifically, as a solvent, a sufficient amount of MEK was added to an inorganic filler surface-treated with a surface treatment agent, and ultrasonic cleaning was performed at 25 ° C for 5 minutes. After removing the supernatant and drying the solids, a carbon analyzer can be used to measure the carbon content of each unit surface area of the inorganic filler. As a carbon analyzer, "EMIA-320V" manufactured by Horiba, Ltd. can be used.

樹脂組成物含有(C)成分時,無機填充材的含量,從將透過係數P調整在指定的範圍內的觀點來看,將樹脂組成物中之不揮發成分定為100質量%時,較佳為40質量%以上,更佳為45質量%以上,再更佳為50質量%以上。上限從提昇絕緣性能的觀點及調整樹脂組成物層之物性平衡,提昇基底密著性的觀點來看,較佳為80質量%以下,更佳為70質量%以下,再更佳為60質量%以下或55質量%以下。When the resin composition contains the (C) component, the content of the inorganic filler is preferably from the viewpoint of adjusting the transmission coefficient P within a specified range. When the nonvolatile content in the resin composition is set to 100% by mass, it is preferable. It is 40% by mass or more, more preferably 45% by mass or more, and even more preferably 50% by mass or more. The upper limit is preferably 80% by mass or less, more preferably 70% by mass or less, and still more preferably 60% by mass from the viewpoint of improving the insulation performance, adjusting the physical property balance of the resin composition layer, and improving the adhesion of the substrate. Or less than 55% by mass.

-(D)熱塑性樹脂-   在一實施形態,樹脂組成物可含有(D)熱塑性樹脂。作為熱塑性樹脂,例如可列舉苯氧基樹脂、聚乙烯縮醛樹脂、聚烯烴樹脂、聚丁二烯樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚醯亞胺樹脂、聚碸樹脂、聚醚碸樹脂、聚伸苯基醚樹脂、聚碳酸酯樹脂、聚醚醚酮樹脂、聚酯樹脂等,較佳為苯氧基樹脂。熱塑性樹脂可1種單獨使用,或組合2種以上使用。-(D) Thermoplastic resin-(1) In one embodiment, the resin composition may contain (D) a thermoplastic resin. Examples of the thermoplastic resin include a phenoxy resin, a polyvinyl acetal resin, a polyolefin resin, a polybutadiene resin, a polyimide resin, a polyimide resin, a polyetherimide resin, and a polyimide resin. A fluorene resin, a polyether fluorene resin, a polyphenylene ether resin, a polycarbonate resin, a polyetheretherketone resin, a polyester resin, and the like are preferably a phenoxy resin. The thermoplastic resin may be used singly or in combination of two or more kinds.

熱塑性樹脂之聚苯乙烯換算的重量平均分子量,從降低透過係數P的觀點來看,較佳為38000以上,更佳為40000以上,再更佳為42000以上。上限較佳為100000以下,更佳為70000以下,再更佳為60000以下。熱塑性樹脂之聚苯乙烯換算的重量平均分子量係以凝膠滲透層析(GPC)法測定。具體而言,熱塑性樹脂之聚苯乙烯換算的重量平均分子量,可使用島津製作所公司製LC-9A/RID-6A作為測定裝置,使用昭和電工公司製Shodex K-800P/K-804L/K-804L作為管柱,使用氯仿作為移動相等,將管柱溫度在40℃進行測定,使用標準聚苯乙烯之檢量線算出。From the viewpoint of reducing the transmission coefficient P, the weight average molecular weight in terms of polystyrene of the thermoplastic resin is preferably 38,000 or more, more preferably 40,000 or more, and even more preferably 42,000 or more. The upper limit is preferably 100,000 or less, more preferably 70,000 or less, and even more preferably 60,000 or less. The polystyrene equivalent weight average molecular weight of the thermoplastic resin is measured by a gel permeation chromatography (GPC) method. Specifically, as a weight average molecular weight of a polystyrene conversion of a thermoplastic resin, LC-9A / RID-6A manufactured by Shimadzu Corporation can be used as a measuring device, and Shodex K-800P / K-804L / K-804L manufactured by Showa Denko Corporation can be used. As the column, chloroform was used as the movement equalizer. The column temperature was measured at 40 ° C and calculated using a calibration curve of standard polystyrene.

作為苯氧基樹脂,例如可列舉具有選自由雙酚A骨架、雙酚F骨架、雙酚S骨架、雙酚苯乙酮骨架、酚醛清漆骨架、聯苯骨架、茀骨架、雙環戊二烯骨架、降莰烯骨架、萘骨架、蔥骨架、金剛烷骨架、萜烯骨架及三甲基環己烷骨架所構成之群組中之1種以上骨架的苯氧基樹脂。苯氧基樹脂的末端可為酚性羥基、環氧基等之任一種官能基。苯氧基樹脂可1種單獨使用,亦可組合2種以上使用。作為苯氧基樹脂之具體例,可列舉三菱化學公司製之「1256」及「4250」(皆為含有雙酚A骨架之苯氧基樹脂)、「YX8100」(含有雙酚S骨架之苯氧基樹脂)及「YX6954」(含有雙酚苯乙酮骨架之苯氧基樹脂),其他亦可列舉新日鐵住金化學公司製之「FX280」及「FX293」、三菱化學公司製之「YL7500BH30」、「YX6954BH30」、「YX7553」、「YX7553BH30」、「YL7769BH30」、「YL6794」、「YL7213」、「YL7290」及「YL7482」等。Examples of the phenoxy resin include those selected from the group consisting of a bisphenol A skeleton, a bisphenol F skeleton, a bisphenol S skeleton, a bisphenol acetophenone skeleton, a novolac skeleton, a biphenyl skeleton, a fluorene skeleton, and a dicyclopentadiene skeleton. Phenoxy resin with one or more skeletons in the group consisting of norbornene skeleton, naphthalene skeleton, onion skeleton, adamantane skeleton, terpene skeleton, and trimethylcyclohexane skeleton. The terminal of the phenoxy resin may be any functional group such as a phenolic hydroxyl group or an epoxy group. The phenoxy resin may be used alone or in combination of two or more. Specific examples of the phenoxy resin include "1256" and "4250" (both are phenoxy resins containing a bisphenol A skeleton) and "YX8100" (phenoxy containing bisphenol S skeletons) manufactured by Mitsubishi Chemical Corporation. Base resin) and "YX6954" (phenoxy resin containing a bisphenol acetophenone skeleton). Other examples include "FX280" and "FX293" manufactured by Nippon Steel & Sumitomo Chemical Corporation, and "YL7500BH30" manufactured by Mitsubishi Chemical Corporation. , "YX6954BH30", "YX7553", "YX7553BH30", "YL7769BH30", "YL6794", "YL7213", "YL7290", "YL7482", etc.

作為聚乙烯縮醛樹脂,例如可列舉聚乙烯甲縮醛樹脂、聚乙烯縮丁醛樹脂,較佳為聚乙烯縮丁醛樹脂。作為聚乙烯縮醛樹脂之具體例,例如可列舉電氣化學工業公司製之「電化butyral 4000-2」、「電化butyral 5000-A」、「電化butyral 6000-C」、「電化butyral 6000-EP」、積水化學工業公司製之S-Lec BH系列、BX系列(例如BX-5Z)、KS系列(例如KS-1)、BL系列、BM系列等。Examples of the polyvinyl acetal resin include a polyethylene methylal resin and a polyethylene butyral resin, and a polyvinyl butyral resin is preferred. Specific examples of the polyvinyl acetal resin include, for example, "Electrochemical butyral 4000-2", "Electrochemical butyral 5000-A", "Electrochemical butyral 6000-C", and "Electrochemical butyral 6000-EP" manufactured by Denka Kogyo Co., Ltd. , S-Lec BH series, BX series (such as BX-5Z), KS series (such as KS-1), BL series, BM series, etc. manufactured by Sekisui Chemical Industry Company.

作為聚醯亞胺樹脂之具體例,可列舉新日本理化公司製之「RIKACOAT SN20」及「RIKACOAT PN20」。作為聚醯亞胺樹脂之具體例,又,可列舉使2官能性羥基末端聚丁二烯、二異氰酸酯化合物及四元酸酐進行反應所得之線狀聚醯亞胺(日本特開2006-37083號公報記載之聚醯亞胺)、含有聚矽氧烷骨架之聚醯亞胺(日本特開2002-12667號公報及日本特開2000-319386號公報等所記載之聚醯亞胺)等之改質聚醯亞胺。Specific examples of the polyimide resin include "RIKACOAT SN20" and "RIKACOAT PN20" manufactured by Nippon Rika Chemical Co., Ltd. Specific examples of the polyfluorene imine resin include linear polyfluorene imide obtained by reacting a bifunctional hydroxyl-terminated polybutadiene, a diisocyanate compound, and a quaternary acid anhydride (Japanese Patent Laid-Open No. 2006-37083). Polyimide described in the publication), polyimide containing a polysiloxane skeleton (polyimide described in JP 2002-12667 and JP 2000-319386, etc.) Quality polyimide.

作為聚醯胺醯亞胺樹脂之具體例,可列舉東洋紡績公司製之「Vylomax HR11NN」及「Vylomax HR16NN」。作為聚醯胺醯亞胺樹脂之具體例,又,可列舉日立化成工業公司製之「KS9100」、「KS9300」(含有聚矽氧烷骨架之聚醯胺醯亞胺)等之改質聚醯胺醯亞胺。Specific examples of the polyamidamine / imide resin include "Vylomax HR11NN" and "Vylomax HR16NN" manufactured by Toyobo Corporation. Specific examples of the polyimide resin include modified polyimide resins such as "KS9100" and "KS9300" (polysiloxane imine containing a polysiloxane skeleton) manufactured by Hitachi Chemical Industries, Ltd. Amine imine.

作為聚醚碸樹脂之具體例,可列舉住友化學公司製之「PES5003P」等。   作為聚伸苯基醚樹脂之具體例,可列舉三菱瓦斯化學公司製之寡伸苯基醚・苯乙烯樹脂「OPE-2St 1200」等。Specific examples of the polyether fluorene resin include "PES5003P" manufactured by Sumitomo Chemical Co., and the like. As a specific example of the polyphenylene ether resin, oligophenylene ether / styrene resin "OPE-2St 1200" manufactured by Mitsubishi Gas Chemical Co., Ltd. can be cited.

作為聚碸樹脂之具體例,可列舉Solvay Advanced Polymers公司製之聚碸「P1700」、「P3500」等。Specific examples of the polymer resin include polymer "P1700" and "P3500" manufactured by Solvay Advanced Polymers.

其中,作為熱塑性樹脂,較佳為苯氧基樹脂、聚乙烯縮醛樹脂。據此,在適合之一實施形態,熱塑性樹脂係包含選自由苯氧基樹脂及聚乙烯縮醛樹脂所構成之群組中之1種以上。其中,作為熱塑性樹脂,較佳為苯氧基樹脂,特佳為重量平均分子量為40,000以上之苯氧基樹脂。藉由使用重量平均分子量為40,000以上之苯氧基樹脂,降低透過係數P,並且變成絕緣層即使變薄亦可安定形成表面的粗糙度。Among these, as the thermoplastic resin, a phenoxy resin and a polyvinyl acetal resin are preferable. Accordingly, in a suitable embodiment, the thermoplastic resin includes one or more members selected from the group consisting of a phenoxy resin and a polyvinyl acetal resin. Among them, as the thermoplastic resin, a phenoxy resin is preferred, and a phenoxy resin having a weight average molecular weight of 40,000 or more is particularly preferred. By using a phenoxy resin having a weight average molecular weight of 40,000 or more, the transmission coefficient P is reduced, and the surface roughness can be stably formed even if the insulating layer is thinned.

樹脂組成物含有熱塑性樹脂時,熱塑性樹脂的含量將樹脂成分定為100質量%時,較佳為0.1質量%以上,更佳為0.5質量%以上,再更佳為1質量%以上。上限較佳為5質量%以下,更佳為3質量%以下,再更佳為2質量%以下。藉由將(D)成分的含量定為該範圍內,降低透過係數P,並且變成絕緣層即使變薄,亦可安定形成表面的粗糙度。When the resin composition contains a thermoplastic resin, when the content of the thermoplastic resin is 100% by mass, the content is preferably 0.1% by mass or more, more preferably 0.5% by mass or more, and even more preferably 1% by mass or more. The upper limit is preferably 5 mass% or less, more preferably 3 mass% or less, and even more preferably 2 mass% or less. By setting the content of the (D) component within this range, the transmission coefficient P is reduced, and even if the insulating layer becomes thin, the surface roughness can be formed stably.

-(E)硬化促進劑-   在一實施形態,樹脂組成物可含有(E)硬化促進劑。作為硬化促進劑,例如可列舉磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑、胍系硬化促進劑、金屬系硬化促進劑等,較佳為磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑、金屬系硬化促進劑,更佳為胺系硬化促進劑、咪唑系硬化促進劑、金屬系硬化促進劑。硬化促進劑可1種單獨使用,或組合2種以上使用。-(E) Hardening accelerator-(1) In one embodiment, the resin composition may contain (E) a hardening accelerator. Examples of the hardening accelerator include phosphorus-based hardening accelerators, amine-based hardening accelerators, imidazole-based hardening accelerators, guanidine-based hardening accelerators, and metal-based hardening accelerators, and phosphorus-based hardening accelerators and amine-based hardening accelerators are preferred Hardening accelerator, imidazole-based hardening accelerator, metal-based hardening accelerator, more preferably amine-based hardening accelerator, imidazole-based hardening accelerator, and metal-based hardening accelerator. A hardening accelerator can be used individually by 1 type or in combination of 2 or more types.

作為磷系硬化促進劑,例如可列舉三苯基膦、鏻硼酸鹽化合物、四苯基鏻四苯基硼酸鹽、n-丁基鏻四苯基硼酸鹽、四丁基鏻癸烷酸鹽、(4-甲基苯基)三苯基鏻硫氰酸酯、四苯基鏻硫氰酸酯、丁基三苯基鏻硫氰酸酯等,較佳為三苯基膦、四丁基鏻癸烷酸鹽。Examples of the phosphorus-based hardening accelerator include triphenylphosphine, osmium borate compounds, tetraphenylphosphonium tetraphenylborate, n-butylphosphonium tetraphenylborate, tetrabutylphosphonium decanoate, (4-methylphenyl) triphenylphosphonium thiocyanate, tetraphenylphosphonium thiocyanate, butyltriphenylphosphonium thiocyanate, etc., preferably triphenylphosphine, tetrabutylphosphonium Decanoate.

作為胺系硬化促進劑,例如可列舉三乙基胺、三丁基胺等之三烷基胺、4-二甲基胺基吡啶、苄基二甲基胺、2,4,6,-參(二甲基胺基甲基)酚、1,8-二氮雜雙環(5,4,0)-十一碳烯等,較佳為4-二甲基胺基吡啶、1,8-二氮雜雙環(5,4,0)-十一碳烯。Examples of the amine-based hardening accelerator include trialkylamines such as triethylamine and tributylamine, 4-dimethylaminopyridine, benzyldimethylamine, and 2,4,6-, (Dimethylaminomethyl) phenol, 1,8-diazabicyclo (5,4,0) -undecene, etc., preferably 4-dimethylaminopyridine, 1,8-bis Azabicyclo (5,4,0) -undecene.

作為咪唑系硬化促進劑,例如可列舉2-甲基咪唑、2-十一烷基咪唑、2-十七烷基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、1-苄基-2-甲基咪唑、1-苄基-2-苯基咪唑、1-氰基乙基-2-甲基咪唑、1-氰基乙基-2-十一烷基咪唑、1-氰基乙基-2-乙基-4-甲基咪唑、1-氰基乙基-2-苯基咪唑、1-氰基乙基-2-十一烷基咪唑鎓偏苯三酸酯、1-氰基乙基-2-苯基咪唑鎓偏苯三酸酯、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-十一烷基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-乙基-4’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪異氰脲酸加成物、2-苯基咪唑異氰脲酸加成物、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑、2,3-二氫-1H-吡咯并[1,2-a]苯并咪唑、1-十二烷基-2-甲基-3-苄基咪唑鎓氯化物、2-甲基咪唑啉、2-苯基咪唑啉等之咪唑化合物及咪唑化合物與環氧樹脂之加成體,較佳為2-乙基-4-甲基咪唑、1-苄基-2-苯基咪唑。Examples of the imidazole-based hardening accelerator include 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, and 2-ethyl-4-methyl Imidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2-methylimidazole, 1-benzyl-2-phenylimidazole, 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl-2-ethyl 4-methylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-undecylimidazolium trimellitate, 1-cyanoethyl-2- Phenylimidazolium trimellitate, 2,4-diamino-6- [2'-methylimidazolyl- (1 ')]-ethyl-s-triazine, 2,4-diamine -6- [2'-undecylimidazolyl- (1 ')]-ethyl-s-triazine, 2,4-diamino-6- [2'-ethyl-4'-methyl Imidazolyl- (1 ')]-ethyl-s-triazine, 2,4-diamino-6- [2'-methylimidazolyl- (1')]-ethyl-s-triazine Cyanuric acid adduct, 2-phenylimidazole isocyanuric acid adduct, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxymethyl Imidazole, 2,3-dihydro-1H-pyrrolo [1,2-a] benzo Addition of imidazole compounds such as azole, 1-dodecyl-2-methyl-3-benzylimidazolium chloride, 2-methylimidazoline, 2-phenylimidazoline, and the addition of an imidazole compound to an epoxy resin Is preferably 2-ethyl-4-methylimidazole or 1-benzyl-2-phenylimidazole.

作為咪唑系硬化促進劑可使用市售品,例如可列舉三菱化學公司製之「P200-H50」等。A commercially available product can be used as the imidazole-based hardening accelerator, and examples thereof include "P200-H50" manufactured by Mitsubishi Chemical Corporation.

作為胍系硬化促進劑,例如可列舉雙氰胺、1-甲基胍、1-乙基胍、1-環己基胍、1-苯基胍、1-(o-甲苯基)胍、二甲基胍、二苯基胍、三甲基胍、四甲基胍、五甲基胍、1,5,7-三氮雜雙環[4.4.0]癸-5-烯、7-甲基-1,5,7-三氮雜雙環[4.4.0]癸-5-烯、1-甲基雙胍、1-乙基雙胍、1-n-丁基雙胍、1-n-十八烷基雙胍、1,1-二甲基雙胍、1,1-二乙基雙胍、1-環己基雙胍、1-烯丙基雙胍、1-苯基雙胍、1-(o-甲苯基)雙胍等,較佳為雙氰胺、1,5,7-三氮雜雙環[4.4.0]癸-5-烯。Examples of the guanidine-based hardening accelerator include dicyandiamide, 1-methylguanidine, 1-ethylguanidine, 1-cyclohexylguanidine, 1-phenylguanidine, 1- (o-tolyl) guanidine, and dimethyl Guanidine, diphenylguanidine, trimethylguanidine, tetramethylguanidine, pentamethylguanidine, 1,5,7-triazabicyclo [4.4.0] dec-5-ene, 7-methyl-1 , 5,7-triazabicyclo [4.4.0] dec-5-ene, 1-methyl biguanide, 1-ethyl biguanide, 1-n-butyl biguanide, 1-n-octadecyl biguanide, 1,1-dimethyl biguanide, 1,1-diethyl biguanide, 1-cyclohexyl biguanide, 1-allyl biguanide, 1-phenyl biguanide, 1- (o-tolyl) biguanide, etc., preferably It is dicyandiamide, 1,5,7-triazabicyclo [4.4.0] dec-5-ene.

作為金屬系硬化促進劑,例如可列舉鈷、銅、鋅、鐵、鎳、錳、錫等之金屬之有機金屬錯合物或有機金屬鹽。作為有機金屬錯合物之具體例,可列舉乙醯丙酮酸鈷(II)、乙醯丙酮酸鈷(III)等之有機鈷錯合物、乙醯丙酮酸銅(II)等之有機銅錯合物、乙醯丙酮酸鋅(II)等之有機鋅錯合物、乙醯丙酮酸鐵(III)等之有機鐵錯合物、乙醯丙酮酸鎳(II)等之有機鎳錯合物、乙醯丙酮酸錳(II)等之有機錳錯合物等。作為有機金屬鹽,例如可列舉辛酸鋅、辛酸錫、環烷酸鋅、環烷酸鈷、硬脂酸錫、硬脂酸鋅等。Examples of the metal-based hardening accelerator include organometallic complexes or organometallic salts of metals such as cobalt, copper, zinc, iron, nickel, manganese, and tin. Specific examples of the organometallic complex include organocobalt complexes such as cobalt (II) acetopyruvate, cobalt (III) ethidium pyruvate, and organocopper complexes such as copper (II) acetopyruvate. Compounds, organic zinc complexes such as zinc (II) acetonate, organic iron complexes such as iron (III) acetonate, nickel organic complexes of nickel (II) acetonate , Organic manganese complexes such as manganese (II) acetamidine pyruvate and the like. Examples of the organic metal salt include zinc octoate, tin octoate, zinc naphthenate, cobalt naphthenate, tin stearate, and zinc stearate.

樹脂組成物含有硬化促進劑時,硬化促進劑的含量將樹脂成分定為100質量%時,較佳為0.01質量%以上,更佳為0.05質量%以上,再更佳為0.1質量%以上。上限較佳為3質量%以下,更佳為2質量%以下,再更佳為1質量%以下。藉由將硬化促進劑的含量定為該範圍內,使得提昇基底密著性變容易。When the resin composition contains a hardening accelerator, when the content of the hardening accelerator is 100% by mass of the resin component, it is preferably 0.01% by mass or more, more preferably 0.05% by mass or more, and still more preferably 0.1% by mass or more. The upper limit is preferably 3% by mass or less, more preferably 2% by mass or less, and even more preferably 1% by mass or less. By setting the content of the hardening accelerator within this range, it becomes easy to improve the adhesion of the substrate.

-(F)阻燃劑-   在一實施形態,樹脂組成物可含有(F)阻燃劑。作為阻燃劑,例如可列舉有機磷系阻燃劑、有機系氮含有磷化合物、氮化合物、聚矽氧系阻燃劑、金屬氫氧化物等。阻燃劑可1種單獨使用,或併用2種以上。-(F) Flame Retardant-(1) In one embodiment, the resin composition may contain (F) a flame retardant. Examples of the flame retardant include an organic phosphorus-based flame retardant, an organic nitrogen-containing phosphorus compound, a nitrogen compound, a polysiloxane flame retardant, and a metal hydroxide. The flame retardant can be used alone or in combination of two or more.

作為阻燃劑,可使用市售品,例如可列舉三光公司製之「HCA-HQ」、大八化學工業公司製之「PX-200」等。作為阻燃劑,較佳為難以水解者,例如較佳為10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲(Phosphaphenanthrene)-10-氧化物等。As the flame retardant, a commercially available product can be used, and examples thereof include "HCA-HQ" manufactured by Sanko Corporation, and "PX-200" manufactured by Daiba Chemical Industries. As the flame retardant, those which are difficult to hydrolyze are preferred, for example, 10- (2,5-dihydroxyphenyl) -10-hydro-9-oxa-10-phosphaphenanthrene-10-oxidation is preferred. Things.

樹脂組成物含有阻燃劑時,將樹脂組成物中之不揮發成分定為100質量%時,阻燃劑的含量較佳為0.5質量%~20質量%,更佳為0.5質量%~15質量%,再更佳為0.5質量%~10質量%。When the resin composition contains a flame retardant, when the nonvolatile content in the resin composition is set to 100% by mass, the content of the flame retardant is preferably 0.5% to 20% by mass, and more preferably 0.5% to 15% by mass. %, More preferably 0.5% to 10% by mass.

-(G)有機填充材-   在一實施形態,樹脂組成物可含有(G)有機填充材。藉由含有(G)成分,可提昇樹脂薄片之樹脂組成物層的硬化物之拉伸破壞強度。作為有機填充材,可使用形成印刷電路板之絕緣層時所使用之任意有機填充材,例如可列舉橡膠粒子、聚醯胺微粒子、聚矽氧粒子等。-(G) Organic Filler-(1) In one embodiment, the resin composition may contain (G) an organic filler. By containing (G) component, the tensile fracture strength of the hardened | cured material of the resin composition layer of a resin sheet can be improved. As the organic filler, any organic filler used when forming an insulating layer of a printed circuit board can be used, and examples thereof include rubber particles, polyamide fine particles, and polysiloxane particles.

作為橡膠粒子,可使用市售品,例如可列舉陶氏化學日本公司製之「EXL2655」、Aika工業公司製之「AC3401N」、「AC3816N」等。Commercially available rubber particles can be used, and examples thereof include "EXL2655" manufactured by Dow Chemical Japan, "AC3401N" manufactured by Aika Industries, and "AC3816N".

樹脂組成物含有有機填充材時,將樹脂組成物中之不揮發成分定為100質量%時,有機填充材的含量較佳為0.1質量%~20質量%,更佳為0.2質量%~10質量%,再更佳為0.3質量%~5質量%或0.5質量%~3質量%。When the resin composition contains an organic filler, when the non-volatile content in the resin composition is set to 100% by mass, the content of the organic filler is preferably 0.1% to 20% by mass, and more preferably 0.2% to 10% by mass. %, More preferably 0.3 to 5 mass% or 0.5 to 3 mass%.

-(H)任意之添加劑-   在一實施形態,樹脂組成物進而如有必要可包含其他添加劑,作為該其他添加劑,例如可列舉有機銅化合物、有機鋅化合物及有機鈷化合物等之有機金屬化合物、以及增黏劑、消泡劑、整平劑、密著性賦予劑及著色劑等之樹脂添加劑等。-(H) Any Additive- (1) In one embodiment, the resin composition may further include other additives if necessary. Examples of the other additives include organic metal compounds such as organic copper compounds, organic zinc compounds, and organic cobalt compounds. And resin additives such as tackifiers, defoamers, leveling agents, adhesion-imparting agents, and coloring agents.

<樹脂組成物層之物性、用途>   將樹脂組成物層於100℃熱硬化30分鐘,進而於180℃熱硬化30分鐘所得之硬化物的透過係數P,從樹脂組成物之物性的平衡易變良好,提昇基底密著性的觀點來看,為1.2cc/m2 ・mm-1 ・day・atom以上,較佳為1.5cc/m2 ・mm-1 ・day・atom以上,更佳為2cc/m2 ・mm-1 ・day・atom以上。該透過係數P的上限,於絕緣層中氧難以透過,其結果,從抑制絕緣層之基底即銅箔等之金屬的氧化,提昇基底密著性的觀點來看,為5cc/m2 ・mm-1 ・day・atom以下,較佳為4.5cc/m2 ・mm-1 ・day・atom以下,更佳為4cc/m2 ・mm-1 ・day・atom以下。透過係數P例如可藉由調整硬化劑、無機填充材及熱塑性樹脂等之含量,可成為該範圍內。透過係數P可依後述之<氧透過率及透過係數的測定>之記載進行測定。<Physical properties and uses of the resin composition layer> The transmission coefficient P of the cured product obtained by thermally curing the resin composition layer at 100 ° C for 30 minutes and further at 180 ° C for 30 minutes is easily changed from the balance of the physical properties of the resin composition. Good, from the viewpoint of improving substrate adhesion, it is 1.2cc / m 2 · mm -1 · day · atom or more, preferably 1.5cc / m 2 · mm -1 · day · atom or more, more preferably 2cc / m 2・ mm -1・ day ・ atom or more. The upper limit of this transmission coefficient P makes it difficult for oxygen to pass through the insulating layer. As a result, from the viewpoint of suppressing oxidation of metals such as copper foil, which is the base of the insulating layer, and improving the adhesion of the base, it is 5cc / m 2 · mm -1 · day · atom or less, preferably 4.5cc / m 2 · mm -1 · day · atom or less, and more preferably 4cc / m 2 · mm -1 · day · atom or less. The transmission coefficient P can be within this range by adjusting the content of a hardener, an inorganic filler, a thermoplastic resin, and the like. The transmission coefficient P can be measured as described in "Measurement of oxygen transmission rate and transmission coefficient" described later.

將樹脂組成物層於100℃熱硬化30分鐘,進而於180℃熱硬化30分鐘所得之硬化物的氧透過率,硬化物的厚度作為60μm進行測定時,從樹脂組成物之物性的平衡易變良好,藉此提昇基底密著性的觀點來看,較佳為20cc/m2 ・day・atom以上,更佳為25cc/m2 ・day・atom以上,再更佳為30cc/m2 ・day・atom以上。氧透過率的上限,於絕緣層中氧難以透過,其結果,從抑制絕緣層之基底即銅箔等之金屬的氧化,提昇基底密著性的觀點來看,較佳為80cc/m2 ・day・atom以下,更佳為75cc/m2 ・day・atom以下,再更佳為70cc/m2 ・day・atom以下。氧透過率可依後述之<氧透過率及透過係數的測定>之記載進行測定。When the resin composition layer is thermally cured at 100 ° C. for 30 minutes, and further cured at 180 ° C. for 30 minutes, the oxygen permeability of the cured product is measured, and the thickness of the cured product is measured as 60 μm. The balance of the physical properties of the resin composition is likely to change. Good, from the viewpoint of improving the adhesion of the substrate, it is preferably 20cc / m 2 · day · atom or more, more preferably 25cc / m 2 · day · atom or more, and even more preferably 30cc / m 2 · day・ Atom or more. The upper limit of the oxygen transmission rate makes it difficult for oxygen to pass through the insulating layer. As a result, from the viewpoint of suppressing the oxidation of metals such as copper foil, which is the base of the insulating layer, and improving the adhesion of the base, it is preferably 80cc / m 2 · Below day ・ atom, more preferably 75cc / m 2・ day ・ atom or less, and even more preferably 70cc / m 2・ day ・ atom or less. The oxygen transmission rate can be measured as described in "Measurement of oxygen transmission rate and transmission coefficient" described later.

將樹脂組成物層於100℃熱硬化30分鐘,進而於180℃熱硬化30分鐘所得之硬化物,由於透過係數P為1.2cc/m2 ・mm-1 ・day・atom以上5cc/m2 ・mm-1 ・day・atom以下,顯示與銅箔之剝離強度(基底密著性)優異的特性。即,帶來基底密著性優異之絕緣層。作為基底密著性,為了剝離寬10mm之小片所需要的荷重,較佳為0.2kgf以上,更佳為0.25kgf以上,再更佳為0.3kgf以上。上限較佳可成為1kgf以下、10kgf以下等。基底密著性可依後述之<基底密著性的測定>之記載進行測定。The cured product obtained by thermally curing the resin composition layer at 100 ° C for 30 minutes and further at 180 ° C for 30 minutes has a transmission coefficient P of 1.2cc / m 2 · mm -1 · day · atom 5cc / m 2 or more · Below mm -1 · day · atom, it exhibits excellent peel strength (copper adhesion) with copper foil. That is, an insulating layer having excellent substrate adhesion is provided. As the substrate adhesion, the load required for peeling a small piece with a width of 10 mm is preferably 0.2 kgf or more, more preferably 0.25 kgf or more, and still more preferably 0.3 kgf or more. The upper limit is preferably 1 kgf or less, 10 kgf or less. The adhesion of the substrate can be measured as described in "Measurement of the adhesion of the substrate" described later.

將樹脂組成物層於100℃熱硬化30分鐘,進而於180℃熱硬化30分鐘所得之硬化物,顯示耐回流性優異之特性。即,帶來耐回流性優異之絕緣層。較佳為即使將使用樹脂組成物層所形成之絕緣層,進行20次以上再現峰值溫度260℃之回流溫度的回流步驟,絕緣層與導體層間之剝離為2處以下,更佳為無絕緣層與導體層間之剝離。耐回流性可依後述之<耐回流性的評估>所記載之方法進行評估。The cured product obtained by thermally curing the resin composition layer at 100 ° C. for 30 minutes and further at 180 ° C. for 30 minutes exhibits excellent characteristics of reflow resistance. That is, an insulating layer having excellent reflow resistance is provided. Even if the insulating layer formed using the resin composition layer is subjected to a reflow step of reproducing the reflow temperature at a peak temperature of 260 ° C more than 20 times, the peeling between the insulating layer and the conductor layer is preferably 2 or less, more preferably, there is no insulating layer. Delamination from the conductor layer. The reflow resistance can be evaluated by a method described in "Evaluation of Reflow Resistance" described later.

本發明之樹脂組成物層即使厚度薄至15μm以下,亦可帶來基底密著性及耐回流性優異之絕緣層(樹脂組成物層之硬化物)。據此,本發明之樹脂組成物層可適合作為用以形成電子零件所包含之絕緣層的樹脂組成物使用,例如可適合作為藉由半添加工法用以形成配線之(藉由半添加工法之配線形成用之)樹脂組成物使用。又,該樹脂組成物層可適合作為用以形成印刷電路板之絕緣層之(印刷電路板之絕緣層形成用之)樹脂組成物層使用,可更適合作為用以形成印刷電路板之層間絕緣層的樹脂組成物層(印刷電路板之層間絕緣層用樹脂組成物層)使用。Even if the thickness of the resin composition layer of the present invention is as thin as 15 μm or less, it can bring an insulating layer (hardened product of the resin composition layer) having excellent substrate adhesion and reflow resistance. Accordingly, the resin composition layer of the present invention can be suitably used as a resin composition for forming an insulating layer included in an electronic part. For example, the resin composition layer can be suitably used for forming wiring by a semi-additive method (a method using the semi-additive method). Used for wiring formation) resin composition. The resin composition layer can be suitably used as a resin composition layer for forming an insulating layer of a printed circuit board (for forming an insulating layer of a printed circuit board), and can be more suitable as an interlayer insulation for forming a printed circuit board. A resin composition layer (a resin composition layer for an interlayer insulating layer of a printed wiring board) is used.

又,本發明之樹脂組成物,亦可適合作為用以形成導體層之樹脂組成物(用以形成導體層之絕緣層形成用樹脂組成物)使用。進而,亦可適合使用用以密封電子構件之樹脂組成物,例如,亦可適合作為用以密封半導體晶片之樹脂組成物(半導體晶片之密封層形成用樹脂組成物)使用。The resin composition of the present invention can also be suitably used as a resin composition for forming a conductor layer (a resin composition for forming an insulating layer for forming a conductor layer). Furthermore, a resin composition for sealing electronic components can be suitably used, for example, it can also be suitably used as a resin composition for sealing a semiconductor wafer (resin composition for forming a sealing layer of a semiconductor wafer).

[樹脂薄片]   本發明之樹脂薄片係包含支持體、與設置在該支持體上之本發明之樹脂組成物層。關於樹脂組成物層,係如在[樹脂組成物層]所說明。[Resin sheet] The resin sheet of the present invention includes a support and a resin composition layer of the present invention provided on the support. The resin composition layer is as described in [Resin composition layer].

作為支持體,例如可列舉由塑膠材料所構成之薄膜、金屬箔、脫模紙,較佳為由塑膠材料所構成之薄膜、金屬箔。Examples of the support include a film made of a plastic material, a metal foil, and a release paper, and preferably a film made of a plastic material and a metal foil.

作為支持體,使用由塑膠材料所構成之薄膜時,作為塑膠材料,例如可列舉聚對苯二甲酸乙二酯(以下有時簡稱為「PET」)、聚萘二甲酸乙二酯(以下有時簡稱為「PEN」)等之聚酯、聚碳酸酯(以下有時簡稱為「PC」)、聚甲基甲基丙烯酸酯(PMMA)等之丙烯酸、環狀聚烯烴、三乙醯基纖維素(TAC)、聚醚硫化物(PES)、聚醚酮、聚醯亞胺等。其中,較佳為聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯,特佳為便宜之聚對苯二甲酸乙二酯。When a film made of a plastic material is used as a support, examples of the plastic material include polyethylene terephthalate (hereinafter sometimes referred to as "PET"), polyethylene naphthalate (hereinafter referred to as "PET") (Hereinafter referred to as "PEN"), polyester, polycarbonate (hereinafter sometimes referred to as "PC"), acrylic acid such as polymethylmethacrylate (PMMA), cyclic polyolefin, and triethylfluorene-based fiber (TAC), polyether sulfide (PES), polyetherketone, polyimide and the like. Among them, polyethylene terephthalate and polyethylene naphthalate are preferred, and cheap polyethylene terephthalate is particularly preferred.

作為支持體使用金屬箔時,作為金屬箔,例如可列舉銅箔、鋁箔等,較佳為銅箔。作為銅箔,可使用由銅之單金屬所構成之箔,亦可使用由銅與其他金屬(例如錫、鉻、銀、鎂、鎳、鋯、矽、鈦等)的合金所構成之箔。When a metal foil is used as a support, examples of the metal foil include copper foil and aluminum foil, and copper foil is preferred. As the copper foil, a foil composed of a single metal of copper may be used, or a foil composed of an alloy of copper and other metals (for example, tin, chromium, silver, magnesium, nickel, zirconium, silicon, titanium, etc.) may be used.

支持體可於與樹脂組成物層接合的面實施消光處理、電暈處理、防靜電處理。The support may be subjected to a matting treatment, a corona treatment, or an antistatic treatment on the surface bonded to the resin composition layer.

又,作為支持體,可於與樹脂組成物層接合的面使用具有脫模層之附脫模層之支持體。作為使用在附脫模層之支持體的脫模層之脫模劑,例如可列舉選自由醇酸樹脂、聚烯烴樹脂、胺基甲酸酯樹脂及聚矽氧樹脂所構成之群組中之1種以上的脫模劑。附脫模層之支持體可使用市售品,例如可列舉具有將醇酸樹脂系脫模劑作為主成分之脫模層的PET薄膜即琳得科公司製之「SK-1」、「AL-5」、「AL-7」、東麗公司製之「Lumirror T60」、帝人公司製之「Purex」、Unitika 公司製之「Unipiel」等。Moreover, as a support body, the support body with a mold release layer which has a mold release layer can be used for the surface joined to a resin composition layer. Examples of the release agent used in the release layer of a support with a release layer include a resin selected from the group consisting of alkyd resin, polyolefin resin, urethane resin, and silicone resin. 1 or more release agents. Commercially available products can be used as the support with a release layer. Examples of the PET film having a release layer containing an alkyd resin-based release agent as a main component are "SK-1" and "AL" manufactured by Lindec Corporation. -5 "," AL-7 "," Lumirror T60 "made by Toray," Purex "made by Teijin," Unipiel "made by Unitika, etc.

作為支持體的厚度,雖並未特別限定,但較佳為5μm~75μm的範圍,更佳為10μm~60μm的範圍。尚,使用附脫模層之支持體時,較佳為附脫模層之支持體全體的厚度為上述範圍。The thickness of the support is not particularly limited, but it is preferably in the range of 5 to 75 μm, and more preferably in the range of 10 to 60 μm. When a support with a release layer is used, the thickness of the entire support with a release layer is preferably in the above range.

在一實施形態,樹脂薄片進而如有必要可包含其他層。作為該其他層,例如可列舉設置在未與樹脂組成物層之支持體接合的面(即,與支持體相反側的面),根據支持體之保護薄膜等。保護薄膜的厚度雖並非被特別限定者,但例如為1μm~40μm。藉由層合保護薄膜,可抑制對樹脂組成物層的表面之髒污等之附著或傷痕。In one embodiment, the resin sheet may further include other layers if necessary. Examples of the other layer include a surface provided on a surface of the resin composition layer that is not bonded to the support (that is, a surface opposite to the support), a protective film based on the support, and the like. Although the thickness of the protective film is not particularly limited, it is, for example, 1 μm to 40 μm. By laminating the protective film, it is possible to suppress adhesion or scratches on the surface of the resin composition layer from dirt and the like.

樹脂薄片,例如可藉由調製於有機溶劑溶解樹脂組成物之樹脂清漆,將此樹脂清漆使用模塗機等塗佈在支持體上,進而進行乾燥而形成樹脂組成物層來製造。The resin sheet can be produced, for example, by preparing a resin varnish dissolved in an organic solvent to dissolve the resin composition, applying the resin varnish to a support using a die coater or the like, and drying the resin varnish to form a resin composition layer.

作為有機溶劑,例如可列舉丙酮、甲基乙基酮(MEK)及環己酮等之酮類、乙酸乙酯、乙酸丁酯、溶纖劑乙酸酯、丙二醇單甲基醚乙酸酯及卡必醇乙酸酯等之乙酸酯類、溶纖劑及丁基卡必醇等之卡必醇類、甲苯及二甲苯等之芳香族烴類、二甲基甲醯胺、二甲基乙醯胺(DMAc)及N-甲基吡咯烷酮等之醯胺系溶劑等。有機溶劑可1種單獨使用,亦可組合2種以上使用。Examples of the organic solvent include ketones such as acetone, methyl ethyl ketone (MEK), cyclohexanone, ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate, and Acetates such as carbitol acetate, cellulosics and carbitol such as butyl carbitol, aromatic hydrocarbons such as toluene and xylene, dimethylformamide, dimethylethyl Amidamine-based solvents such as fluorenamine (DMAc) and N-methylpyrrolidone. The organic solvents may be used singly or in combination of two or more kinds.

乾燥可藉由加熱、熱風吹附等之周知方法實施。乾燥條件雖並未特別限定,但以樹脂組成物層中之有機溶劑的含量成為10質量%以下,較佳為成為5質量%以下的方式進行乾燥。雖因樹脂清漆中之有機溶劑的沸點而異,但例如使用包含30質量%~60質量%之有機溶劑的樹脂清漆時,可藉由於50℃~150℃進行3分鐘~10分鐘乾燥,形成樹脂組成物層。Drying can be performed by a known method such as heating, hot air blowing, and the like. Although the drying conditions are not particularly limited, drying is performed so that the content of the organic solvent in the resin composition layer becomes 10% by mass or less, and preferably 5% by mass or less. Although it varies depending on the boiling point of the organic solvent in the resin varnish, for example, when a resin varnish containing an organic solvent of 30% to 60% by mass is used, the resin can be formed by drying at 50 ° C to 150 ° C for 3 to 10 minutes. Composition layer.

樹脂薄片可捲成輥狀保存。樹脂薄片具有保護薄膜時,藉由剝離保護薄膜變可使用。The resin sheet can be rolled into a roll and stored. When the resin sheet has a protective film, it can be used by peeling the protective film.

[印刷電路板]   本發明之印刷電路板係包含第1導體層、第2導體層及絕緣層。絕緣層係包含含有(A)環氧樹脂及(B)硬化劑之樹脂組成物,厚度為15μm以下,於100℃熱硬化30分鐘,進而於180℃熱硬化30分鐘所得之硬化物的透過係數P為1.2cc/m2 ・mm-1 ・day・atom以上5cc/m2 ・mm-1 ・day・atom以下之樹脂組成物層的硬化物。絕緣層係設置在第1導體層與第2導體層之間,絕緣第1導體層與第2導體層(導體層有時稱為配線層)。   作為適合之實施形態,絕緣層係藉由在本發明之樹脂薄片之樹脂組成物層的硬化物形成。[Printed Circuit Board] The printed circuit board of the present invention includes a first conductor layer, a second conductor layer, and an insulating layer. The insulating layer contains a resin composition containing (A) an epoxy resin and (B) a hardener, and has a thickness of 15 μm or less, and a heat transfer coefficient of a hardened product obtained by heat curing at 100 ° C. for 30 minutes and further at 180 ° C. for 30 minutes P is a cured product of a resin composition layer of 1.2 cc / m 2 · mm -1 · day · atom or more and 5 cc / m 2 · mm -1 · day · atom or less. The insulating layer is provided between the first conductor layer and the second conductor layer, and insulates the first conductor layer and the second conductor layer (the conductor layer is sometimes referred to as a wiring layer). As a suitable embodiment, the insulating layer is formed of a cured product of the resin composition layer of the resin sheet of the present invention.

第1及第2導體層間之絕緣層的厚度較佳為6μm以下,更佳為5.5μm以下,再更佳為5μm以下。針對下限雖並未特別限定,但可成為0.1μm以上。所謂第1導體層與第2導體層之間隔(第1及第2導體層間之絕緣層的厚度),係指如示一例於圖1,第1導體層1之主面11與第2導體層2之主面21間之絕緣層3的厚度t1。第1及第2導體層係透過絕緣層相鄰之導體層,主面11及主面21彼此面向對方。The thickness of the insulating layer between the first and second conductor layers is preferably 6 μm or less, more preferably 5.5 μm or less, and even more preferably 5 μm or less. Although the lower limit is not particularly limited, it may be 0.1 μm or more. The distance between the first conductor layer and the second conductor layer (the thickness of the insulating layer between the first and second conductor layers) refers to an example shown in FIG. 1, and the main surface 11 of the first conductor layer 1 and the second conductor layer The thickness t1 of the insulating layer 3 between the main surfaces 21 of 2. The first and second conductor layers are conductor layers adjacent to each other through the insulating layer, and the main surface 11 and the main surface 21 face each other.

尚,絕緣層全體的厚度t2較佳為15μm以下,更佳為13μm以下,再更佳為10μm以下。針對下限雖並未特別限定,但通常可成為1μm以上、1.5μm以上、2μm以上等。The thickness t2 of the entire insulating layer is preferably 15 μm or less, more preferably 13 μm or less, and even more preferably 10 μm or less. Although the lower limit is not particularly limited, it may be generally 1 μm or more, 1.5 μm or more, 2 μm or more, and the like.

印刷電路板可藉由使用上述之樹脂薄片,包含下述(I)及(II)之步驟之方法製造。   (I)於內層基板上以樹脂薄片之樹脂組成物層與內層基板接合的方式進行層合之步驟   (II)熱硬化樹脂組成物層形成絕緣層之步驟A printed circuit board can be manufactured by using the above-mentioned resin sheet and including the following steps (I) and (II). (I) a step of laminating the resin composition layer of the resin sheet and the inner layer substrate on the inner substrate (II) a step of forming an insulating layer of the thermosetting resin composition layer

所謂於步驟(I)使用之「內層基板」,係成為印刷電路板之基板之構件,例如可列舉玻璃環氧基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚伸苯基醚基板等。又,該基板可於其單面或兩面具有導體層,此導體層可進行圖型加工。基板之單面或兩面形成導體層(電路)之內層基板有時稱為「內層電路基板」。又,製造印刷電路板時,進而應形成絕緣層及/或導體層之中間製造物亦包含在本發明之所謂「內層基板」。印刷電路板為零件內藏電路板時,可使用內藏零件之內層基板。The "inner substrate" used in step (I) refers to a member that becomes a substrate of a printed circuit board. Examples include glass epoxy substrates, metal substrates, polyester substrates, polyimide substrates, BT resin substrates, and thermal substrates. Hardened polyphenylene ether substrate, etc. In addition, the substrate may have a conductor layer on one or both sides, and the conductor layer may be patterned. An inner layer substrate on which one or both sides of the substrate form a conductor layer (circuit) is sometimes referred to as an "inner layer circuit substrate." In addition, when manufacturing a printed circuit board, an intermediate manufactured product that further forms an insulating layer and / or a conductor layer is also included in the so-called "inner substrate" of the present invention. When the printed circuit board is a part-embedded circuit board, the inner substrate of the built-in part can be used.

內層基板與樹脂薄片的層合,例如可藉由從支持體側將樹脂薄片加熱壓接在內層基板來進行。作為將樹脂薄片加熱壓接在內層基板之構件(以下,亦稱為「加熱壓接構件」),例如可列舉加熱之金屬板(SUS鏡板等)或金屬輥(SUS輥)等。尚,較佳為並非將加熱壓接構件直接沖壓在樹脂薄片,而是於內層基板之表面凹凸以樹脂薄片充分跟隨的方式,透過耐熱橡膠等之彈性材進行沖壓。Lamination of the inner substrate and the resin sheet can be performed, for example, by heat-pressing the resin sheet from the support side to the inner substrate. Examples of a member (hereinafter, also referred to as a "heat-compression-bonding member") for heat-pressing a resin sheet on an inner substrate include a heated metal plate (SUS mirror plate, etc.), a metal roller (SUS roller), and the like. Still, it is preferable not to press the thermocompression-bonding member directly on the resin sheet, but to press the unevenness on the surface of the inner-layer substrate so that the resin sheet fully follows, and press it through an elastic material such as heat-resistant rubber.

內層基板與樹脂薄片的層合可藉由真空層合法實施。在真空層合法,加熱壓接溫度較佳為60℃~160℃,更佳為80℃~140℃的範圍,加熱壓接壓力較佳為0.098MPa~1.77MPa,更佳為0.29MPa~1.47MPa的範圍,加熱壓接時間較佳為20秒~400秒,更佳為30秒~300秒的範圍。層合較佳為以壓力26.7hPa以下的減壓條件下實施。The lamination of the inner substrate and the resin sheet can be performed by a vacuum layer method. In the vacuum layer method, the heating and crimping temperature is preferably 60 ° C to 160 ° C, more preferably in the range of 80 ° C to 140 ° C, and the heating and crimping pressure is preferably 0.098MPa to 1.77MPa, and more preferably 0.29MPa to 1.47MPa. The range of the thermal compression bonding time is preferably 20 seconds to 400 seconds, and more preferably 30 seconds to 300 seconds. The lamination is preferably performed under a reduced pressure of a pressure of 26.7 hPa or less.

層合可藉由市售之真空層壓機進行。作為市售之真空層壓機,例如可列舉名機製作所公司製之真空加壓式層壓機、日光材料公司製之真空施加器、批量式真空加壓層壓機等。Lamination can be performed by a commercially available vacuum laminator. Examples of commercially available vacuum laminators include vacuum pressure laminators made by Meiki Seisakusho, vacuum applicators made by Nikko Materials Co., Ltd., and batch vacuum pressure laminators.

於層合後,常壓下(大氣壓下),例如可藉由將加熱壓接構件從支持體側進行沖壓,進行經層合之樹脂薄片的平滑化處理。平滑化處理之沖壓條件可定為與上述層合之加熱壓接條件相同的條件。平滑化處理可藉由市售之層壓機進行。尚,層合與平滑化處理可使用上述之市售真空層壓機連續進行。After lamination, under normal pressure (atmospheric pressure), for example, the laminated resin sheet can be smoothed by pressing the heat-pressed member from the support side. The pressing conditions for the smoothing treatment can be set to the same conditions as those of the above-mentioned laminated thermocompression bonding conditions. The smoothing treatment can be performed by a commercially available laminator. The lamination and smoothing treatment can be continuously performed using the above-mentioned commercially available vacuum laminator.

支持體可於步驟(I)與步驟(II)之間去除,亦可於步驟(II)之後去除。The support may be removed between step (I) and step (II), or may be removed after step (II).

在步驟(II),熱硬化樹脂組成物層形成絕緣層。In step (II), the thermosetting resin composition layer forms an insulating layer.

樹脂組成物層之熱硬化條件並未特別限定,可使用形成印刷電路板之絕緣層時通常所採用之條件。The conditions for the thermosetting of the resin composition layer are not particularly limited, and conditions generally used when forming an insulating layer of a printed circuit board can be used.

例如,樹脂組成物層之熱硬化條件雖因樹脂組成物的種類等而有所不同,但硬化溫度可定為120℃~240℃的範圍(較佳為150℃~220℃的範圍,更佳為170℃~200℃的範圍),硬化時間可定為5分鐘~120分鐘的範圍(較佳為10分鐘~100分鐘,更佳為15分鐘~90分鐘)。For example, although the thermal curing conditions of the resin composition layer vary depending on the type of the resin composition, etc., the curing temperature may be set in a range of 120 ° C to 240 ° C (preferably in a range of 150 ° C to 220 ° C, more preferably). The range is 170 ° C to 200 ° C), and the curing time can be set to a range of 5 minutes to 120 minutes (preferably 10 minutes to 100 minutes, and more preferably 15 minutes to 90 minutes).

熱硬化樹脂組成物層之前,可將樹脂組成物層以較硬化溫度更低之溫度進行預備加熱。例如熱硬化樹脂組成物層之前,可在50℃以上未滿120℃(較佳為60℃以上115℃以下,更佳為70℃以上110℃以下)的溫度,將樹脂組成物層預備加熱5分鐘以上(較佳為5分鐘~150分鐘,更佳為15分鐘~120分鐘,再更佳為15分鐘~100分鐘)。Before the resin composition layer is thermally cured, the resin composition layer may be pre-heated at a temperature lower than the curing temperature. For example, before the thermosetting resin composition layer, the resin composition layer may be preheated at a temperature of 50 ° C to 120 ° C (preferably 60 ° C to 115 ° C, more preferably 70 ° C to 110 ° C). More than minutes (preferably 5 minutes to 150 minutes, more preferably 15 minutes to 120 minutes, even more preferably 15 minutes to 100 minutes).

製造印刷電路板時,可進一步實施(III)鑽孔在絕緣層之步驟、(IV)粗糙化處理絕緣層之步驟、(V)形成導體層之步驟。此等之步驟(III)至步驟(V),對使用在印刷電路板的製造之本發明領域具有通常知識者而言,可依周知之各種方法實施。尚,將支持體於步驟(II)之後去除時,該支持體的去除,可於步驟(II)與步驟(III)之間、步驟(III)與步驟(IV)之間或步驟(IV)與步驟(V)之間實施。又,如有必要可重複實施步驟(II)~步驟(V)之絕緣層及導體層的形成,形成多層配線板。此情況下,較佳為個別的導體層間之絕緣層的厚度(圖1之t1)為上述範圍內。When manufacturing a printed circuit board, (III) a step of drilling an insulating layer, (IV) a step of roughening the insulating layer, and (V) a step of forming a conductive layer may be further performed. These steps (III) to (V) can be carried out by various methods known to those having ordinary knowledge in the field of the present invention used in the manufacture of printed circuit boards. Moreover, when the support is removed after step (II), the support may be removed between step (II) and step (III), between step (III) and step (IV), or step (IV). And step (V). In addition, if necessary, the formation of the insulating layer and the conductor layer in steps (II) to (V) can be repeatedly performed to form a multilayer wiring board. In this case, it is preferable that the thickness of the insulating layer between the individual conductor layers (t1 in FIG. 1) is within the above range.

步驟(III)係鑽孔在絕緣層之步驟,藉此可於絕緣層形成通孔、貫通孔等之孔。步驟(III)因應絕緣層之形成所使用之樹脂組成物的組成等,例如可使用鑽孔機、雷射、電漿等實施。孔之尺寸或形狀可因應印刷電路板之設計適當決定。Step (III) is a step of drilling holes in the insulating layer, thereby forming holes such as through holes, through holes, and the like in the insulating layer. Step (III) can be performed using, for example, a drill, a laser, a plasma, or the like according to the composition of the resin composition used for forming the insulating layer. The size or shape of the hole can be appropriately determined according to the design of the printed circuit board.

步驟(IV)係粗糙化處理絕緣層之步驟。粗糙化處理之順序、條件並未特別限定,可採用形成印刷電路板之絕緣層時通常所使用之周知的順序、條件。例如可依藉由膨潤液之膨潤處理、藉由氧化劑之粗糙化處理、藉由中和液之中和處理之順序實施,粗糙化處理絕緣層。作為粗糙化處理所使用之膨潤液,雖並未特別限定,但可列舉鹼溶液、界面活性劑溶液等,較佳為鹼溶液,作為該鹼溶液,更佳為氫氧化鈉溶液、氫氧化鉀溶液。作為市售之膨潤液,例如可列舉Atotech Japan公司製之「Swelling Dip Securiganth P」、「Swelling Dip Securiganth SBU」等。藉由膨潤液之膨潤處理雖並未特別限定,但例如可藉由於30℃~90℃之膨潤液浸漬絕緣層1分鐘~20分鐘來進行。從將絕緣層之樹脂的膨潤抑制在適當之水準的觀點來看,較佳為於40℃~80℃之膨潤液浸漬絕緣層5分鐘~15分鐘。作為粗糙化處理所使用之氧化劑,雖並未特別限定,但例如可列舉於氫氧化鈉之水溶液溶解過錳酸鉀或過錳酸鈉之鹼性過錳酸溶液。藉由鹼性過錳酸溶液等之氧化劑之粗糙化處理,較佳為於加熱至60℃~80℃之氧化劑溶液浸漬絕緣層10分鐘~30分鐘來進行。又,在鹼性過錳酸溶液之過錳酸鹽的濃度較佳為5質量%~10質量%。作為市售之氧化劑,例如可列舉Atotech Japan公司製之「Concentrate ・Compact CP」、「Dosing solution・Securiganth P」等之鹼性過錳酸溶液。又,作為粗糙化處理所使用之中和液,較佳為酸性之水溶液,作為市售品,例如可列舉Atotech Japan公司製之「Reduction solution・Securigant P」。藉由中和液之處理可藉由將經藉由氧化劑之粗糙化處理的處理面於30℃~80℃之中和液浸漬5分鐘~30分鐘來進行。從作業性等之點來看,較佳為將經藉由氧化劑之粗糙化處理的對象物於40℃~70℃之中和液浸漬5分鐘~20分鐘之方法。Step (IV) is a step of roughening the insulating layer. The order and conditions of the roughening treatment are not particularly limited, and a well-known order and conditions generally used when forming an insulating layer of a printed circuit board can be adopted. For example, the insulating layer may be roughened in the order of swelling treatment with a swelling solution, roughening treatment with an oxidizing agent, and neutralization treatment with a neutralizing solution. The swelling liquid used for the roughening treatment is not particularly limited, but examples thereof include an alkali solution and a surfactant solution. An alkali solution is preferred, and as the alkali solution, a sodium hydroxide solution and potassium hydroxide are more preferred. Solution. Examples of commercially available swelling liquids include "Swelling Dip Securiganth P" and "Swelling Dip Securiganth SBU" manufactured by Atotech Japan. Although the swelling treatment with the swelling liquid is not particularly limited, it can be performed, for example, by impregnating the insulating layer with the swelling liquid at 30 ° C. to 90 ° C. for 1 to 20 minutes. From the viewpoint of suppressing the swelling of the resin of the insulating layer to an appropriate level, it is preferable to immerse the insulating layer in a swelling liquid at 40 ° C to 80 ° C for 5 to 15 minutes. Although it does not specifically limit as an oxidizing agent used for a roughening process, For example, the alkaline permanganic acid solution which melt | dissolved potassium permanganate or sodium permanganate in the aqueous solution of sodium hydroxide is mentioned. The roughening treatment of an oxidant such as an alkaline permanganic acid solution is preferably performed by immersing the insulating layer in the oxidant solution heated to 60 ° C to 80 ° C for 10 to 30 minutes. The concentration of the permanganate in the alkaline permanganate solution is preferably 5 to 10% by mass. Examples of commercially available oxidants include alkaline permanganic acid solutions such as "Concentrate Compact CP" and "Dosing solution Securiganth P" manufactured by Atotech Japan. The neutralizing solution used for the roughening treatment is preferably an acidic aqueous solution. As a commercially available product, for example, "Reduction solution Securigant P" manufactured by Atotech Japan is mentioned. The treatment with the neutralization solution can be performed by immersing the treated surface subjected to the roughening treatment with an oxidizing agent at a neutralization solution at 30 ° C to 80 ° C for 5 minutes to 30 minutes. From the viewpoint of workability and the like, a method of immersing the object subjected to the roughening treatment with an oxidizing agent in a neutralizing solution at 40 ° C to 70 ° C for 5 to 20 minutes is preferred.

在一實施形態,粗糙化處理後之絕緣層表面的算術平均粗糙度(Ra)較佳為400nm以下,更佳為350nm以下,再更佳為300nm以下。針對下限雖並未特別限定,但較佳為可成為0.5nm以上,更佳為1nm以上等。又,粗糙化處理後之絕緣層表面的均方根粗糙度(Rq)較佳為400nm以下,更佳為350nm以下,再更佳為300nm以下。針對下限雖並未特別限定,但較佳可成為0.5nm以上,更佳為1nm以上等。絕緣層表面之算術平均粗糙度(Ra)及均方根粗糙度(Rq)可使用非接觸型表面粗糙度計測定。In one embodiment, the arithmetic average roughness (Ra) of the surface of the insulating layer after the roughening treatment is preferably 400 nm or less, more preferably 350 nm or less, and still more preferably 300 nm or less. Although the lower limit is not particularly limited, it is preferably 0.5 nm or more, more preferably 1 nm or more. The root mean square roughness (Rq) of the surface of the insulating layer after the roughening treatment is preferably 400 nm or less, more preferably 350 nm or less, and still more preferably 300 nm or less. Although the lower limit is not particularly limited, it is preferably 0.5 nm or more, more preferably 1 nm or more. The arithmetic average roughness (Ra) and root mean square roughness (Rq) of the surface of the insulating layer can be measured using a non-contact surface roughness meter.

步驟(V)係形成導體層之步驟。於內層基板未形成導體層時,步驟(V)為形成第1導體層之步驟,於內層基板形成導體層時,該導體層為第1導體層,步驟(V)為形成第2導體層之步驟。Step (V) is a step of forming a conductor layer. When a conductor layer is not formed on the inner substrate, step (V) is a step of forming a first conductor layer. When a conductor layer is formed on the inner substrate, the conductor layer is a first conductor layer, and step (V) is a second conductor. Layer of steps.

導體層所使用之導體材料並未特別限定。適合之實施形態中,導體層係包含選自由金、鉑、鈀、銀、銅、鋁、鈷、鉻、鋅、鎳、鈦、鎢、鐵、錫及銦所構成之群組中之1種以上的金屬。導體層可為單金屬層亦可為合金層,作為合金層,例如可列舉選自由上述之群組中之2種以上金屬的合金(例如鎳・鉻合金、銅・鎳合金及銅・鈦合金)所形成之層。其中,從導體層形成之通用性、成本、圖型化之容易性等之觀點來看,較佳為鉻、鎳、鈦、鋁、鋅、金、鈀、銀或銅之單金屬層或鎳・鉻合金、銅・鎳合金、銅・鈦合金之合金層,更佳為鉻、鎳、鈦、鋁、鋅、金、鈀、銀或銅之單金屬層或鎳・鉻合金之合金層,再更佳為銅之單金屬層。The conductive material used for the conductive layer is not particularly limited. In a suitable embodiment, the conductor layer includes one selected from the group consisting of gold, platinum, palladium, silver, copper, aluminum, cobalt, chromium, zinc, nickel, titanium, tungsten, iron, tin, and indium. Above the metal. The conductor layer may be a single metal layer or an alloy layer. Examples of the alloy layer include an alloy of two or more metals selected from the above group (for example, nickel-chromium alloy, copper-nickel alloy, and copper-titanium alloy). ). Among them, from the viewpoints of versatility of forming the conductor layer, cost, and ease of patterning, a single metal layer of chromium, nickel, titanium, aluminum, zinc, gold, palladium, silver, or copper, or nickel is preferred.・ An alloy layer of chromium alloy, copper, nickel alloy, copper, titanium alloy, more preferably a single metal layer of chromium, nickel, titanium, aluminum, zinc, gold, palladium, silver or copper, or an alloy layer of nickel and chromium alloy, Even more preferred is a single metal layer of copper.

導體層可為單層構造,亦可為層合2層以上由不同種類之金屬或合金所構成之單金屬層或合金層之複層構造。導體層為複層構造時,與絕緣層接合之層較佳為鉻、鋅或鈦之單金屬層或鎳・鉻合金之合金層。The conductor layer may have a single-layer structure, or a multi-layer structure in which two or more single metal layers or alloy layers composed of different kinds of metals or alloys are laminated. When the conductor layer has a multi-layer structure, the layer bonded to the insulating layer is preferably a single metal layer of chromium, zinc, or titanium or an alloy layer of a nickel-chromium alloy.

導體層的厚度雖因所期望之印刷電路板之設計而不同,但一般為3μm~35μm,較佳為5μm~30μm。Although the thickness of the conductive layer varies depending on the desired design of the printed circuit board, it is generally 3 μm to 35 μm, and preferably 5 μm to 30 μm.

在一實施形態,導體層可藉由鍍敷形成。例如可藉由半添加法、全加成法等之以往周知之技術鍍敷在絕緣層的表面,形成具有所期望配線圖型之導體層,從製造之簡便性的觀點來看,較佳為藉由半添加法形成。以下,表示將導體層藉由半添加法形成之例。In one embodiment, the conductive layer can be formed by plating. For example, a conventionally known technique such as a semi-additive method and a full-additive method can be used to plate the surface of an insulating layer to form a conductive layer having a desired wiring pattern. From the viewpoint of simplicity of manufacturing, it is preferably Formed by semi-additive method. Hereinafter, an example in which a conductor layer is formed by a semi-additive method is shown.

首先,於絕緣層的表面藉由無電解鍍敷形成鍍敷種晶層。接著,於經形成之鍍敷種晶層上,對應所期望之配線圖型形成露出鍍敷種晶層的一部分之遮罩圖型。於露出之鍍敷種晶層上,藉由電解鍍敷形成金屬層後,去除遮罩圖型。然後,可藉由蝕刻等去除不要之鍍敷種晶層,形成具有所期望之配線圖型的導體層。First, a plating seed layer is formed on the surface of the insulating layer by electroless plating. Next, on the formed plating seed layer, a mask pattern that exposes a part of the plating seed layer is formed corresponding to a desired wiring pattern. After forming a metal layer on the exposed plating seed layer by electrolytic plating, the mask pattern is removed. Then, the unnecessary plating seed layer can be removed by etching or the like to form a conductor layer having a desired wiring pattern.

本發明之樹脂薄片由於帶來零件嵌入性亦良好之絕緣層,亦可適合使用在印刷電路板為零件內藏電路板的情況。零件內藏電路板可藉由周知之製造方法製作。The resin sheet of the present invention can be suitably used when the printed circuit board is a built-in circuit board because the insulating layer also has a good part embedding property. The component-embedded circuit board can be manufactured by a well-known manufacturing method.

使用本發明之樹脂薄片所製造之印刷電路板,可為具備樹脂薄片之樹脂組成物層的硬化物即絕緣層、與嵌入絕緣層之嵌入型配線層的態樣。The printed circuit board manufactured using the resin sheet of the present invention can be in the form of an insulating layer that is a cured product of the resin composition layer of the resin sheet and an embedded wiring layer embedded in the insulating layer.

[半導體裝置]   本發明之半導體裝置係包含本發明之印刷電路板。本發明之半導體裝置可使用本發明之印刷電路板製造。[Semiconductor Device] The semiconductor device of the present invention includes the printed circuit board of the present invention. The semiconductor device of the present invention can be manufactured using the printed circuit board of the present invention.

作為半導體裝置,可列舉供於電氣製品(例如電腦、手機、數位相機及電視等)及交通工具(例如摩托車、汽車,火車、船舶及航空機等)等之各種半導體裝置。Examples of the semiconductor device include various semiconductor devices used in electrical products (such as computers, mobile phones, digital cameras, and televisions) and vehicles (such as motorcycles, automobiles, trains, ships, and aircraft).

本發明之半導體裝置可藉由於印刷電路板之導通處實裝零件(半導體晶片)製造。所謂「導通處」,係「傳達在印刷電路板之電信號之處」,該場所可為表面,亦可為嵌入之處皆無妨。又,半導體晶片若為將半導體作為材料之電氣電路元件,則並未特別限定。The semiconductor device of the present invention can be manufactured by mounting a component (semiconductor wafer) due to a conductive portion of a printed circuit board. The so-called "conducting place" means "a place where the electric signal is transmitted on the printed circuit board". The place may be a surface or an embedded place. The semiconductor wafer is not particularly limited as long as it is an electric circuit element using a semiconductor as a material.

製造半導體裝置時之半導體晶片的實裝方法,半導體晶片只要有效進行機能,雖並未特別限定,但具體而言,可列舉引線鍵合實裝方法、倒裝晶片實裝方法、藉由無凹凸堆積層(BBUL)之實裝方法、藉由各向異性導電薄膜(ACF)之實裝方法、藉由非導電性薄膜(NCF)之實裝方法、等。於此,所謂「藉由無凹凸堆積層(BBUL)之實裝方法」,係「將半導體晶片直接嵌入印刷電路板之凹部,連接半導體晶片與印刷電路板上之配線的實裝方法」。 [實施例]The method of mounting a semiconductor wafer when manufacturing a semiconductor device is not particularly limited as long as the semiconductor wafer functions effectively. Specific examples include a wire bonding mounting method, a flip chip mounting method, and a bump-free method. A method for mounting a stacked layer (BBUL), a method for mounting an anisotropic conductive film (ACF), a method for mounting a non-conductive film (NCF), and the like. Here, the so-called "mounting method by a bumpless layer (BBUL)" is a "mounting method of directly embedding a semiconductor wafer into a recessed portion of a printed circuit board and connecting the semiconductor wafer to the wiring on the printed circuit board." [Example]

以下,藉由實施例具體說明本發明。本發明並非被限定於此等之實施例者。尚,在以下,表示量之「份」及「%」除非另有明確說明,係分別意指「質量份」及「質量%」。Hereinafter, the present invention will be specifically described by way of examples. The invention is not limited to these examples. In the following, the "parts" and "%" of the quantities, unless otherwise specified, mean "parts by mass" and "% by mass", respectively.

<無機填充材之平均粒徑的測定>   在小玻璃瓶稱重無機填充材100mg、分散劑(Sannopco公司製「SN9228」)0.1g、甲基乙基酮10g,在超音波分散20分鐘。使用雷射繞射式粒度分布測定裝置(島津製作所公司製「SALD-2200」),以間歇式小槽(Batch cell)方式測定粒度分布,算出藉由中位徑之平均粒徑。<Measurement of the average particle diameter of the inorganic filler> (1) Weigh 100 mg of the inorganic filler, 0.1 g of a dispersant ("SN9228" manufactured by Sannopco), and 10 g of methyl ethyl ketone in a vial, and disperse it in ultrasonic waves for 20 minutes. A laser diffraction type particle size distribution measuring device ("SALD-2200" manufactured by Shimadzu Corporation) was used to measure the particle size distribution in a batch cell method to calculate the average particle diameter by the median diameter.

<無機填充材之比表面積的測定>   藉由使用BET全自動比表面積測定裝置(Mountech公司製Macsorb HM-1210),使氮氣吸附在試料表面,使用BET多點法算出比表面積,測定無機填充材之比表面積。<Measurement of Specific Surface Area of Inorganic Filling Materials> The BET automatic specific surface area measuring device (Macsorb HM-1210 manufactured by Mountech) was used to adsorb nitrogen on the sample surface, and the specific surface area was calculated using the BET multi-point method to measure the inorganic filling materials. Of specific surface area.

<經使用之無機填充材>   無機填充材1:相對於球狀二氧化矽(電氣化學工業公司製「UFP-30」、平均粒徑0.078μm、比表面積30.7m2 /g)100份,以N-苯基-3-胺基丙基三甲氧基矽烷(信越化學工業公司製、KBM573)2份表面處理者。   無機填充材2:相對於球形二氧化矽(Admatex公司製「SC2500SQ」、平均粒徑0.77μm、比表面積11.2m2 /g)100份,以N-苯基-3-胺基丙基三甲氧基矽烷(信越化學工業公司製、KBM573)1份表面處理者。<Inorganic filler used> Inorganic filler 1: 100 parts with respect to spherical silica ("UFP-30" manufactured by Denki Kogyo Co., Ltd., with an average particle diameter of 0.078 μm and a specific surface area of 30.7 m 2 / g). N-phenyl-3-aminopropyltrimethoxysilane (Shin-Etsu Chemical Industry Co., Ltd., KBM573) 2 parts surface treatment. Inorganic filler 2: 100 parts of spherical silica ("SC2500SQ" manufactured by Admatex, average particle size 0.77 μm, specific surface area 11.2 m 2 / g), N-phenyl-3-aminopropyltrimethoxy 1 part of a surface treatment based on silane (manufactured by Shin-Etsu Chemical Industry Co., Ltd., KBM573).

<樹脂組成物1之調製>   邊將聯二甲酚型環氧樹脂(三菱化學公司製「YX4000HK」、環氧基當量約185)6份、萘型環氧樹脂(新日鐵住金化學公司製「ESN475V」、環氧基當量約332)5份、雙酚AF型環氧樹脂(三菱化學公司製「YL7760」、環氧基當量約238)15份、環己烷型環氧樹脂(三菱化學公司製「ZX1658GS」、環氧基當量約135)2份、苯氧基樹脂(三菱化學公司製「YX7553BH30」、固形分30質量%之環己酮:甲基乙基酮(MEK)之1:1溶液、Mw=35000)2份,於溶劑石腦油20份及環己酮10份之混合溶劑進行攪拌,邊使其加熱溶解。冷卻至室溫後,對其混合含有三嗪骨架之甲酚酚醛清漆系硬化劑(DIC公司製「LA-3018-50P」、羥基當量約151、固形分50%之2-甲氧基丙醇溶液)4份、活性酯系硬化劑(DIC公司製「EXB-8150-65T」、活性基當量約229、不揮發成分65質量%之甲苯溶液)6份、無機填充材1 50份、胺系硬化促進劑(4-二甲基胺基吡啶(DMAP))0.05份,以高速回轉混合機均勻分散後,以濾筒(ROKITECHNO公司製「SHP020」)進行過濾,調製樹脂組成物1。<Preparation of Resin Composition 1> 6 parts of Bisphenol-type xylenol type epoxy resin ("YX4000HK" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent approximately 185), naphthalene type epoxy resin (manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd.) "ESN475V", 5 parts epoxy equivalent 332), 15 parts bisphenol AF epoxy resin ("YL7760" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent 238), cyclohexane epoxy resin (Mitsubishi Chemical 2 parts of "ZX1658GS" manufactured by the company, epoxy equivalent weight of about 135), phenoxy resin ("YX7553BH30" manufactured by Mitsubishi Chemical Corporation, 30% by mass of cyclohexanone: methyl ethyl ketone (MEK): 1: (1 solution, Mw = 35000) 2 parts, stirred in a mixed solvent of 20 parts of solvent naphtha and 10 parts of cyclohexanone, and dissolved by heating. After cooling to room temperature, a cresol novolac-based hardener containing a triazine skeleton ("LA-3018-50P" manufactured by DIC Corporation), a hydroxyl equivalent of about 151, and 2-methoxypropanol at a solid content of 50% were mixed thereto. Solution) 4 parts, active ester-based hardener ("EXB-8150-65T" manufactured by DIC Corporation, approximately 229 active group equivalent, toluene solution with 65% by mass of non-volatile content) 6 parts, inorganic filler 150 parts, amine-based 0.05 parts of a hardening accelerator (4-dimethylaminopyridine (DMAP)) was uniformly dispersed in a high-speed rotary mixer, and then filtered through a filter cartridge ("SHP020" manufactured by ROKITECHNO) to prepare a resin composition 1.

<樹脂組成物2之調製>   邊將聯二甲酚型環氧樹脂(三菱化學公司製「YX4000HK」、環氧基當量約185)6份、萘型環氧樹脂(新日鐵住金化學公司製「ESN475V」、環氧基當量約332)5份、雙酚AF型環氧樹脂(三菱化學公司製「YL7760」、環氧基當量約238)15份、雙酚型環氧樹脂(新日鐵住金化學公司製「ZX1059」、環氧基當量約169、雙酚A型與雙酚F型之1:1混合品)4份、伸萘基醚型環氧樹脂(DIC公司製「EXA-7311-G4」、環氧基當量約213)2份、苯氧基樹脂(三菱化學公司製「YL7500BH30」、固形分30質量%之環己酮:甲基乙基酮(MEK)之1:1溶液、Mw=44000)2份,於溶劑石腦油20份及環己酮10份之混合溶劑進行攪拌邊使其加熱溶解。冷卻至室溫後,對其混合含有三嗪骨架之甲酚酚醛清漆系硬化劑(DIC公司製「LA-3018-50P」、羥基當量約151、固形分50%之2-甲氧基丙醇溶液)4份、活性酯系硬化劑(DIC公司製「EXB-8000L-65M」、活性基當量約220、不揮發成分65質量%之MEK溶液)6份、無機填充材1 40份、胺系硬化促進劑(4-二甲基胺基吡啶(DMAP))0.05份,以高速回轉混合機均勻分散後,以濾筒(ROKITECHNO公司製「SHP020」)進行過濾,調製樹脂組成物2。<Preparation of Resin Composition 2> 6 parts of Biben cresol-type epoxy resin ("YX4000HK" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 185), naphthalene-type epoxy resin (manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd.) "ESN475V", 5 parts epoxy equivalent, about 332), 15 parts bisphenol AF type epoxy resin ("YL7760" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent about 238), bisphenol type epoxy resin (Nippon Steel) "ZX1059" manufactured by Sumikin Chemical Co., Ltd., epoxy equivalent equivalent of about 169, 4 parts of bisphenol A type and bisphenol F type 1: 1 mixed product, naphthyl ether type epoxy resin ("EXA-7311 manufactured by DIC Corporation" -G4 ", 2 parts epoxy equivalent, about 213, phenoxy resin (" YL7500BH30 "manufactured by Mitsubishi Chemical Corporation), 30% by mass solid solution of cyclohexanone: methyl ethyl ketone (MEK) in a 1: 1 solution (Mw = 44000) 2 parts, mixed in a solvent mixture of 20 parts of solvent naphtha and 10 parts of cyclohexanone while stirring to make it heat-dissolve. After cooling to room temperature, a cresol novolac-based hardener containing a triazine skeleton ("LA-3018-50P" manufactured by DIC Corporation), a hydroxyl equivalent of about 151, and 2-methoxypropanol at a solid content of 50% were mixed thereto. Solution) 4 parts, active ester-based hardener ("EXB-8000L-65M" manufactured by DIC Corporation, active group equivalent of about 220, non-volatile content 65% by mass MEK solution) 6 parts, inorganic filler 1 40 parts, amine-based 0.05 parts of a hardening accelerator (4-dimethylaminopyridine (DMAP)) was uniformly dispersed in a high-speed rotary mixer, and then filtered through a filter cartridge ("SHP020" manufactured by ROKITECHNO) to prepare a resin composition 2.

<樹脂組成物3之調製>   邊將聯二甲酚型環氧樹脂(三菱化學公司製「YX4000HK」、環氧基當量約185)6份、萘型環氧樹脂(新日鐵住金化學公司製「ESN475V」、環氧基當量約332)5份、雙酚AF型環氧樹脂(三菱化學公司製「YL7760」、環氧基當量約238)15份、雙酚型環氧樹脂(新日鐵住金化學公司製「ZX1059」、環氧基當量約169、雙酚A型與雙酚F型之1:1混合品)4份、伸萘基醚型環氧樹脂(DIC公司製「EXA-7311-G4」、環氧基當量約213)2份、苯氧基樹脂(三菱化學公司製「YL7500BH30」、固形分30質量%之環己酮:甲基乙基酮(MEK)之1:1溶液、Mw=44000)2份,於溶劑石腦油20份及環己酮10份之混合溶劑進行攪拌邊使其加熱溶解。冷卻至室溫後,對其混合含有三嗪骨架之甲酚酚醛清漆系硬化劑(DIC公司製「LA-3018-50P」、羥基當量約151、固形分50%之2-甲氧基丙醇溶液)4份、活性酯系硬化劑(DIC公司製「EXB-8000L-65M」、活性基當量約220、不揮發成分65質量%之MEK溶液)12份、無機填充材1 40份、胺系硬化促進劑(4-二甲基胺基吡啶(DMAP))0.05份,以高速回轉混合機均勻分散後,以濾筒(ROKITECHNO公司製「SHP020」)進行過濾,調製樹脂組成物3。<Preparation of Resin Composition 3> 6 parts of Biben cresol-type epoxy resin ("YX4000HK" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 185), naphthalene-type epoxy resin (manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd.) "ESN475V", 5 parts epoxy equivalent, about 332), 15 parts bisphenol AF type epoxy resin ("YL7760" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent about 238), bisphenol type epoxy resin (Nippon Steel) "ZX1059" manufactured by Sumikin Chemical Co., Ltd., epoxy equivalent equivalent of about 169, 4 parts of bisphenol A type and bisphenol F type 1: 1 mixed product, naphthyl ether type epoxy resin ("EXA-7311 manufactured by DIC Corporation" -G4 ", 2 parts epoxy equivalent, about 213, phenoxy resin (" YL7500BH30 "manufactured by Mitsubishi Chemical Corporation), 30% by mass solid solution of cyclohexanone: methyl ethyl ketone (MEK) in a 1: 1 solution (Mw = 44000) 2 parts, mixed in a solvent mixture of 20 parts of solvent naphtha and 10 parts of cyclohexanone while stirring to make it heat-dissolve. After cooling to room temperature, a cresol novolac-based hardener containing a triazine skeleton ("LA-3018-50P" manufactured by DIC Corporation), a hydroxyl equivalent of about 151, and 2-methoxypropanol at a solid content of 50% were mixed thereto. Solution) 4 parts, active ester-based hardener ("EXB-8000L-65M" manufactured by DIC Corporation, active group equivalent of about 220, MEK solution with 65% by mass of non-volatile content), 1 40 parts of inorganic filler, amine-based 0.05 parts of a hardening accelerator (4-dimethylaminopyridine (DMAP)) was uniformly dispersed in a high-speed rotary mixer, and then filtered through a filter cartridge ("SHP020" manufactured by ROKITECHNO) to prepare a resin composition 3.

<樹脂組成物4之調製>   邊將聯二甲酚型環氧樹脂(三菱化學公司製「YX4000HK」、環氧基當量約185)6份、萘型環氧樹脂(新日鐵住金化學公司製「ESN475V」、環氧基當量約332)5份、雙酚AF型環氧樹脂(三菱化學公司製「YL7760」、環氧基當量約238)15份、環己烷型環氧樹脂(三菱化學公司製「ZX1658GS」、環氧基當量約135)2份、苯氧基樹脂(三菱化學公司製「YX7553BH30」、固形分30質量%之環己酮:甲基乙基酮(MEK)之1:1溶液)2份,於溶劑石腦油20份及環己酮10份之混合溶劑進行攪拌邊使其加熱溶解。冷卻至室溫後,對其混合含有三嗪骨架之甲酚酚醛清漆系硬化劑(DIC公司製「LA-3018-50P」、羥基當量約151、固形分50%之2-甲氧基丙醇溶液)4份、活性酯系硬化劑(DIC公司製「EXB-8000L-65M」、活性基當量約220、不揮發成分65質量%之MEK溶液)6份、無機填充材2 160份、胺系硬化促進劑(4-二甲基胺基吡啶(DMAP))0.05份,以高速回轉混合機均勻分散後,以濾筒(ROKITECHNO公司製「SHP020」)進行過濾,調製樹脂組成物4。<Preparation of Resin Composition 4> 6 parts of Bibian xylenol type epoxy resin ("YX4000HK" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 185), naphthalene type epoxy resin (manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd.) "ESN475V", 5 parts epoxy equivalent 332), 15 parts bisphenol AF epoxy resin ("YL7760" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent 238), cyclohexane epoxy resin (Mitsubishi Chemical 2 parts of "ZX1658GS" manufactured by the company, epoxy equivalent weight of about 135), phenoxy resin ("YX7553BH30" manufactured by Mitsubishi Chemical Corporation, 30% by mass of cyclohexanone: methyl ethyl ketone (MEK): 1: 1 solution) 2 parts, and mixed by heating in a mixed solvent of 20 parts of solvent naphtha and 10 parts of cyclohexanone to heat and dissolve. After cooling to room temperature, a cresol novolac-based hardener containing a triazine skeleton ("LA-3018-50P" manufactured by DIC Corporation), a hydroxyl equivalent of about 151, and 2-methoxypropanol at a solid content of 50% were mixed thereto. Solution) 4 parts, active ester-based hardener ("EXB-8000L-65M" manufactured by DIC Corporation, active group equivalent of about 220, MEK solution with 65% by mass of non-volatile content), 2 160 parts of inorganic filler, amine-based 0.05 parts of a hardening accelerator (4-dimethylaminopyridine (DMAP)) was uniformly dispersed in a high-speed rotary mixer, and then filtered through a filter cartridge ("SHP020" manufactured by ROKITECHNO) to prepare a resin composition 4.

將樹脂組成物1~4之調製所使用之成分與其摻合量(不揮發分之質量份)示於下述表。尚,下述表中之簡稱等係如以下。   硬化劑的含量:樹脂組成物中之將樹脂成分定為100質量%時之硬化劑的含量   活性酯系硬化劑的含量:樹脂組成物中之將樹脂成分定為100質量%時之活性酯系硬化劑的含量   無機填充材的含量:將樹脂組成物中之不揮發成分定為100質量%時之無機填充材的含量The components used for the preparation of the resin compositions 1 to 4 and their blending amounts (parts by mass of nonvolatile matter) are shown in the following table. The abbreviations and the like in the following tables are as follows. Content of hardener: content of the hardener when the resin component is set to 100% by mass in the resin composition Active ester-based hardener content: active ester when the resin component is set to 100% by mass in the resin composition Content of hardener Content of inorganic filler: Content of inorganic filler when the non-volatile content in the resin composition is set to 100% by mass

<樹脂薄片之製作>   作為支持體,準備以醇酸樹脂系脫模劑(琳得科公司製「AL-5」)脫模處理之PET薄膜(東麗公司製「Lumirror R80」、厚度38μm、軟化點130℃、「脫模PET」)。<Production of Resin Sheets> As a support, a PET film ("Lumirror R80" manufactured by Toray Co., Ltd.) with a mold release treatment ("AL-5" manufactured by Lindec Corporation) is prepared. Softening point: 130 ° C, "Release PET").

藉由將各樹脂組成物於脫模PET上,以乾燥後之樹脂組成物層的厚度成為10μm的方式,在模塗機均勻塗佈,以70℃至95℃乾燥2分鐘,而於脫模PET上得到樹脂組成物層。接著,於未與樹脂薄片之支持體接合的面,作為保護薄膜,將聚丙烯薄膜(王子Ftex公司製「Alfan MA-411」、厚度15μm)的粗糙面,以與樹脂組成物層接合的方式進行層合。藉此,得到由脫模PET(支持體)、樹脂組成物層及保護薄膜之順序所構成之樹脂薄片A。   又,除了以乾燥後之樹脂組成物層的厚度成為30μm的方式,在模塗機均勻塗佈各樹脂組成物之外,其他與樹脂薄片A同樣進行,而得到樹脂薄片B。Each resin composition was coated on a release PET so that the thickness of the dried resin composition layer became 10 μm, and then uniformly coated on a mold coater, and dried at 70 ° C. to 95 ° C. for 2 minutes, and then released from the mold. A resin composition layer was obtained on PET. Next, a rough surface of a polypropylene film ("Alfan MA-411" manufactured by Oji Ftex Co., Ltd., thickness 15 µm) was bonded to the resin composition layer as a protective film on the surface not bonded to the support of the resin sheet. Laminate. Thereby, the resin sheet A which consists of the order of a release PET (support body), a resin composition layer, and a protective film was obtained. The resin sheet B was obtained in the same manner as the resin sheet A except that each resin composition was uniformly applied to a die coater so that the thickness of the dried resin composition layer became 30 μm.

<樹脂組成物層等之厚度的測定>   厚度係使用接觸式膜厚計(三豐公司製、MCD-25MJ)測定。<Measurement of thickness of resin composition layer and the like> > The thickness is measured using a contact film thickness meter (manufactured by Mitutoyo Corporation, MCD-25MJ).

<耐回流性之評估> -評估基板A之製作- (1)覆銅層合板   作為覆銅層合板,係準備於兩面層合銅箔層之玻璃布基材環氧樹脂兩面覆銅層合板(銅箔的厚度3μm、基板厚度0.15mm、三菱瓦斯化學公司製「HL832NSF LCA」、255×340mm尺寸)。<Evaluation of reflow resistance>-Production of evaluation substrate A- (1) Copper-clad laminates are copper-clad laminates, which are prepared on both sides of a glass cloth substrate with epoxy resin on both sides and copper-clad laminates ( The thickness of the copper foil is 3 μm, the thickness of the substrate is 0.15 mm, and “HL832NSF LCA” manufactured by Mitsubishi Gas Chemical Co., Ltd. (255 × 340 mm size).

(2)樹脂薄片之層合   從於實施例及比較例製作之各樹脂薄片A剝離保護薄膜,使用批量式真空加壓層壓機(日光材料公司製、2階段堆積層壓機、CVP700),以樹脂組成物層與覆銅層合板接合的方式,層合在覆銅層合板之兩面。層合係藉由進行30秒減壓將氣壓成為13hPa以下,在130℃、壓力0.74MPa壓接45秒來實施。接著,在120℃、壓力0.5MPa進行75秒熱沖壓。(2) Lamination of resin sheets The protective films were peeled from each resin sheet A produced in the examples and comparative examples, and a batch vacuum pressure laminator (manufactured by Nikko Material Co., Ltd., 2-stage stacking laminator, CVP700) was used. The resin composition layer and the copper-clad laminate are bonded together, and laminated on both sides of the copper-clad laminate. The lamination system was carried out by depressurizing for 30 seconds to reduce the air pressure to 13 hPa or less, and performing pressure bonding at 130 ° C and a pressure of 0.74 MPa for 45 seconds. Next, hot stamping was performed at 120 ° C. and a pressure of 0.5 MPa for 75 seconds.

(3)樹脂組成物層之熱硬化   將層合樹脂薄片之覆銅層合板投入100℃之烤箱後熱硬化30分鐘,接著轉移至180℃之烤箱後熱硬化30分鐘,形成絕緣層,剝離脫模PET。將此定為硬化基板A。(3) Thermal hardening of the resin composition layer The copper-clad laminate of the laminated resin sheet was put into an oven at 100 ° C for 30 minutes, and then transferred to an oven at 180 ° C for 30 minutes to form an insulating layer. Mold PET. This is referred to as a cured substrate A.

(4)進行粗糙化處理之步驟   於硬化基板A之絕緣層進行作為粗糙化處理之除膠渣處理。尚,作為除膠渣處理,實施下述之濕式除膠渣處理。(4) Step for roughening treatment (1) The insulation layer of the hardened substrate A is subjected to a slag removing treatment as a roughening treatment. As the desmearing treatment, the following wet desmearing treatment was performed.

濕式除膠渣處理:   於膨潤液(Atotech Japan公司製「Swelling dip・Securigant P」、二乙二醇單丁基醚及氫氧化鈉之水溶液)以60℃浸漬10分鐘,接著於氧化劑溶液(Atotech Japan公司製「Concentrate ・Compact CP」、過錳酸鉀濃度約6%、氫氧化鈉濃度約4%之水溶液)以80℃浸漬20分鐘,最後於中和液(Atotech Japan公司製「Reduction solution・Securigant P」、硫酸水溶液)以40℃浸漬5分鐘後,於80℃乾燥15分鐘。將此定為粗糙化基板A。Wet deslagging treatment: immerse in a swelling solution ("Swelling dip · Securigant P" manufactured by Atotech Japan, an aqueous solution of diethylene glycol monobutyl ether and sodium hydroxide) at 60 ° C for 10 minutes, and then immerse in an oxidant solution ( "Concentrate Compact CP" manufactured by Atotech Japan, an aqueous solution with a potassium permanganate concentration of about 6% and a sodium hydroxide concentration of about 4%, was immersed at 80 ° C for 20 minutes, and finally neutralized with a solution ("Reduction solution" manufactured by Atotech Japan)・ Securigant P ", sulfuric acid aqueous solution) was immersed at 40 ° C for 5 minutes, and then dried at 80 ° C for 15 minutes. This was designated as roughened substrate A.

(5)形成導體層之步驟 (5-1)無電解鍍敷步驟   由於在粗糙化基板A之絕緣層表面形成導體層,進行包含下述1~6之步驟之鍍敷步驟(使用Atotech Japan公司製之藥液之鍍銅步驟)而形成導體層。(5) Step of forming conductor layer (5-1) Electroless plating step Since a conductor layer is formed on the surface of the insulating layer of roughened substrate A, a plating step including the following steps 1 to 6 is performed (using Atotech Japan) Copper plating step of the prepared chemical solution) to form a conductor layer.

1.鹼清洗(設置通孔之絕緣層的表面之洗淨與電荷調整)   將粗糙化基板A的表面使用Cleaning Cleaner Securiganth 902(商品名),於60℃洗淨5分鐘。 2.軟蝕刻(通孔內之洗淨)   將粗糙化基板A的表面使用硫酸酸性過氧二硫酸鈉水溶液,於30℃處理1分鐘。 3.預浸(用以賦予Pd之絕緣層的表面之電荷的調整)   將粗糙化基板A的表面使用Pre. Dip Neoganth B(商品名),於室溫處理1分鐘。 4.促進劑賦予(對絕緣層的表面之Pd的賦予)   將粗糙化基板A的表面使用Activator Neoganth 834(商品名),於35℃處理5分鐘。 5.還原(還原絕緣層所賦予之Pd)   將粗糙化基板A的表面使用Reducer Neoganth WA(商品名)與Reducer Acceralator 810 mod.(商品名)的混合液,於30℃處理5分鐘。 6.無電解鍍銅步驟(將Cu於絕緣層的表面(Pd表面)析出)   將粗糙化基板A的表面使用Basic Solution Printganth MSK-DK(商品名)、與Copper solution Printganth MSK(商品名)、與Stabilizer Printganth MSK-DK(商品名)、與Reducer Cu(商品名)的混合液,於35℃處理15分鐘。經形成之無電解鍍銅層的厚度為1μm。1. Alkali cleaning (cleaning and charge adjustment of the surface of the insulating layer provided with through holes) The surface of the roughened substrate A was cleaned with Cleaning Cleaner Securiganth 902 (trade name) for 5 minutes at 60 ° C. 2. Soft etching (cleaning in the through hole) The surface of the roughened substrate A is treated with a sulfuric acid acid sodium peroxodisulfate aqueous solution at 30 ° C for 1 minute. 3. Pre-dip (adjustment of charge on the surface of the insulating layer imparted to Pd) Pre The surface of the roughened substrate A was treated with Pre. Dip Neoganth B (trade name) at room temperature for 1 minute. 4. Accelerator application (application of Pd to the surface of the insulating layer) Activ The surface of the roughened substrate A was treated with Activator Neoganth 834 (trade name) for 5 minutes at 35 ° C. 5. Reduction (reduction of Pd imparted by the insulating layer) The surface of the roughened substrate A was treated with a mixture of Reducer Neoganth WA (trade name) and Reducer Acceralator 810 mod. (Trade name) at 30 ° C for 5 minutes. 6. Electroless copper plating step (Cu is deposited on the surface of the insulating layer (Pd surface)) The surface of the roughened substrate A is Basic Solution Printganth MSK-DK (trade name), Copper Solution Printganth MSK (trade name), The mixed solution with Stabilizer Printganth MSK-DK (trade name) and Reducer Cu (trade name) was treated at 35 ° C for 15 minutes. The thickness of the formed electroless copper-plated layer was 1 μm.

無電解鍍銅步驟後,進行電解鍍銅,形成厚度14μm之電解鍍銅層(導體層)(與無電解鍍銅層的合計厚度約為15μm)。將此定為評估基板A。After the electroless copper plating step, electrolytic copper plating is performed to form an electrolytic copper plating layer (conductor layer) with a thickness of 14 μm (the total thickness with the electroless copper plating layer is about 15 μm). This was designated as evaluation substrate A.

-耐回流性之評估-   將評估基板A切成100mm×100mm之試驗片。針對所得之試驗片,使用回流裝置(Anton公司製「HAS6116」),在IPC/JEDEC J-STD-020C(「Moisture/Reflow Sensitivity Classification For Nonhermetic Solid State Surface Mount Devices」、2004年7月)所記載之回流溫度檔案(無鉛組裝用檔案;峰值溫度260℃),重複20次模擬之回流步驟。而且依下述評估基準,評估耐回流性。   評估基準:   ○:絕緣層與導體層間的剝離為2處以下   ×:絕緣層與導體層間的剝離為3處以上-Evaluation of reflow resistance--The evaluation substrate A was cut into a test piece of 100 mm × 100 mm. The obtained test piece was described in IPC / JEDEC J-STD-020C ("Moisture / Reflow Sensitivity Classification For Nonhermetic Solid State Surface Mount Devices", July 2004) using a reflow device ("HAS6116" manufactured by Anton). Reflow temperature file (lead-free assembly file; peak temperature 260 ° C), repeat the simulated reflow step 20 times. Furthermore, the reflow resistance was evaluated according to the following evaluation criteria. Evaluation criteria: ○: The peeling between the insulating layer and the conductor layer is 2 or less ×: The peeling between the insulating layer and the conductor layer is 3 or more

<基底密著性之測定> (1)銅箔之基底處理   將三井金屬礦山公司製「3EC-III」(電界銅箔、35μm)之光澤面浸漬在Mec公司製Mec etch bond「CZ-8101」,於銅表面進行粗糙化處理(Ra值=1μm),實施防銹處理(CL8300)。將此銅箔稱為CZ銅箔。進而,以130℃之烤箱加熱處理30分鐘。<Measurement of substrate adhesion> (1) Substrate treatment of copper foil The glossy surface of "3EC-III" (electrical copper foil, 35 μm) manufactured by Mitsui Metal Mining Corporation was dipped in Mec etch bond "CZ-8101" manufactured by Mec Corporation Roughening treatment (Ra value = 1 μm) was performed on the copper surface, and rust prevention treatment (CL8300) was performed. This copper foil is called a CZ copper foil. Furthermore, it heat-processed in the oven at 130 degreeC for 30 minutes.

(2)銅箔之層合與絕緣層形成   從於實施例及比較例製作之各樹脂薄片A剝離保護薄膜,使用批量式真空加壓層壓機(名機公司製「MVLP-500」),以樹脂組成物層與內層電路基板接合的方式,對內層電路基板之兩面進行層合處理。層合處理係藉由進行30秒減壓將氣壓成為13hPa以下,在100℃、壓力0.74MPa壓接30秒來進行。層合後,剝離支持體之脫模PET。於剝離支持體之樹脂組成物層上,將「3EC-III」之CZ銅箔的處理面以與上述相同的條件進行層合。而且,藉由以190℃、90分鐘之硬化條件硬化樹脂組成物層,形成絕緣層,製作樣品。(2) Lamination of copper foil and formation of an insulating layer A protective film was peeled from each resin sheet A produced in the examples and comparative examples, and a batch type vacuum pressure laminator ("MVLP-500" manufactured by Meiki Co., Ltd.) was used. The two sides of the inner-layer circuit board are laminated so that the resin composition layer is bonded to the inner-layer circuit board. The lamination treatment was performed by depressurizing for 30 seconds to reduce the air pressure to 13 hPa or less, and performing pressure bonding at 100 ° C and a pressure of 0.74 MPa for 30 seconds. After lamination, the release PET of the support was peeled. The treated surface of the CZ copper foil of "3EC-III" was laminated on the resin composition layer of the release support under the same conditions as described above. Then, the resin composition layer was cured under a curing condition of 190 ° C and 90 minutes to form an insulating layer, and a sample was produced.

(3)銅箔剝離強度(基底密著性)之測定   將經製作之樣品切成150×30mm之小片。於小片之銅箔部分使用切刀,放入寬10mm、長度100mm之部分的切片,剝離銅箔之一端,以挾具(T.S.Y公司製、Autocom型試驗機、「AC-50C-SL」)挾住,使用Instron 萬能試驗機,在室溫中,將以50mm/分鐘之速度往垂直方向剝離35mm時之荷重依照JIS C6481測定,用以下之基準評估。   評估基準   ○:基底密著性的測定結果為0.2kgf以上   ×:基底密著性的測定結果未滿0.2kgf(3) Measurement of copper foil peeling strength (base adhesion) 基底 Cut the produced sample into small pieces of 150 × 30 mm. Using a cutter on the small piece of copper foil, insert a slice of 10 mm wide and 100 mm in length, and peel off one end of the copper foil. Using an Instron universal testing machine, the load when peeling 35 mm in a vertical direction at a speed of 50 mm / min at room temperature was measured in accordance with JIS C6481 and evaluated using the following criteria. Evaluation criteria ○: The measurement result of the substrate adhesion is 0.2 kgf or more ×: The measurement result of the substrate adhesion is less than 0.2 kgf

<氧透過率及透過係數之測定> -硬化薄片之製作-   從於實施例及比較例製作之各樹脂薄片B剝離保護薄膜,使用批量式真空加壓層壓機(日光材料公司製、2階段堆積層壓機、CVP700),以樹脂組成物層接合的方式層合2枚樹脂薄片B。層合係藉由進行30秒減壓將氣壓成為13hPa以下,在130℃、壓力0.74MPa壓接45秒來實施。而且,剝離一側的面之脫模PET,以90℃、90分鐘之硬化條件硬化樹脂組成物層後,剝離另一側的面之脫模PET,製作硬化薄片B。<Measurement of oxygen transmission rate and transmission coefficient> -Production of hardened sheet- 硬化 Remove the protective film from each resin sheet B produced in the examples and comparative examples, and use a batch type vacuum pressure laminator (manufactured by Nikko Material Co., 2 steps) Stack laminator, CVP700), and two resin sheets B were laminated so that the resin composition layers were bonded together. The lamination system was carried out by depressurizing for 30 seconds to reduce the air pressure to 13 hPa or less, and performing pressure bonding at 130 ° C and a pressure of 0.74 MPa for 45 seconds. Then, the release PET on one side was peeled off, and the resin composition layer was cured under a curing condition of 90 ° C. for 90 minutes, and then the release PET on the other side was peeled off to produce a cured sheet B.

-氧透過率及透過係數之測定-   使用氧透過率測定裝置(MOCON公司製、OX-TRAN2/21),依照JIS-K7126(等壓法),於23℃、0%RH之環境下及23℃、90%RH之環境下,測定硬化薄片B之氧透過率。尚,所謂RH係表示相對濕度。又,藉由將硬化薄片B之氧透過率為基準,以厚度去除,算出透過係數P(氧透過係數P)。   將透過係數P為5.0cc/m2 ・mm-1 ・day・atom以下的情況評估為「○」,將透過係數P超過5.0cc/m2 ・mm-1 ・day・atom的情況評估為「×」。又,將透過係數P為1.2cc/m2 ・mm-1 ・day・atom以上的情況評估為「○」,將透過係數P未滿1.2cc/m2 ・mm-1 ・day・atom的情況評估為「×」。-Measurement of oxygen transmission rate and transmission coefficient- Using an oxygen transmission rate measuring device (manufactured by MOCON, OX-TRAN2 / 21), in accordance with JIS-K7126 (isobaric method), at 23 ° C, 0% RH and 23 The oxygen transmission rate of the cured sheet B was measured under an environment of ℃ and 90% RH. In addition, the RH system means relative humidity. The transmission coefficient P (oxygen transmission coefficient P) was calculated by taking the oxygen transmission rate of the cured sheet B as a reference and removing the thickness. The case where the transmission coefficient P is 5.0 cc / m 2 · mm -1 · day · atom or less is evaluated as "○", and the case where the transmission coefficient P exceeds 5.0 cc / m 2 · mm -1 · day · atom is evaluated as "○" × ". Also, a case where the transmission coefficient P is 1.2 cc / m 2 · mm -1 · day · atom or more is evaluated as "○", and a case where the transmission coefficient P is less than 1.2 cc / m 2 · mm -1 · day · atom is evaluated. Evaluation was "×".

在實施例1~2,確認即使未含有(C)~(E)成分的情況,儘管程度有差,但有與上述實施例相同的結果。In Examples 1 to 2, it was confirmed that even when the components (C) to (E) were not contained, the results were the same as those of the above examples, although the degree was poor.

1‧‧‧第1導體層1‧‧‧ the first conductor layer

11‧‧‧第1導體層之主面11‧‧‧ the main surface of the first conductor layer

2‧‧‧第2導體層2‧‧‧ 2nd conductor layer

21‧‧‧第2導體層之主面21‧‧‧ the main surface of the second conductor layer

3‧‧‧絕緣層3‧‧‧ Insulation

t1‧‧‧第1導體層與第2導體層之間隔(第1及第2導體層間之絕緣層的厚度)t1‧‧‧The distance between the first conductor layer and the second conductor layer (thickness of the insulating layer between the first and second conductor layers)

t2‧‧‧絕緣層全體的厚度t2‧‧‧Thickness of the entire insulation layer

[圖1]圖1係示意性表示印刷電路板之一例的一部分截面圖。[FIG. 1] FIG. 1 is a partial cross-sectional view schematically showing an example of a printed circuit board.

Claims (16)

一種樹脂組成物層,其係包含含有(A)環氧樹脂及(B)硬化劑之樹脂組成物的樹脂組成物層,其特徵為   樹脂組成物層的厚度為15μm以下,   將樹脂組成物層於100℃熱硬化30分鐘,進而於180℃熱硬化30分鐘所得之硬化物的透過係數P為1.2cc/m2 ・mm-1 ・day・atom以上5cc/m2 ・mm-1 ・day・atom以下。A resin composition layer is a resin composition layer containing a resin composition containing (A) an epoxy resin and (B) a hardener, and is characterized in that the thickness of the resin composition layer is 15 μm or less, and the resin composition layer is The transmittance P of the hardened material obtained by thermally curing at 100 ° C for 30 minutes and further at 180 ° C for 30 minutes is 1.2cc / m 2 · mm -1 · day · atom 5cc / m 2 · mm -1 · day or more below atom. 如請求項1之樹脂組成物層,其係藉由半添加工法之配線形成用。For example, the resin composition layer of claim 1 is used for wiring formation by a semi-additive method. 如請求項1之樹脂組成物層,其係含有(C)無機填充材。The resin composition layer according to claim 1, which contains (C) an inorganic filler. 如請求項3之樹脂組成物層,其中,將樹脂組成物中之不揮發成分定為100質量%時,(C)成分的含量為40質量%以上80質量%以下。The resin composition layer of claim 3, wherein when the non-volatile content in the resin composition is 100% by mass, the content of the component (C) is 40% by mass or more and 80% by mass or less. 如請求項3之樹脂組成物層,其中,(C)成分之平均粒徑為0.05μm以上0.35μm以下。The resin composition layer according to claim 3, wherein the average particle diameter of the component (C) is 0.05 μm or more and 0.35 μm or less. 如請求項1之樹脂組成物層,其中,將樹脂成分定為100質量%時,(B)成分的含量為20質量%以下。The resin composition layer according to claim 1, wherein when the resin component is set to 100% by mass, the content of the (B) component is 20% by mass or less. 如請求項1之樹脂組成物層,其中,(B)成分係含有活性酯系硬化劑。The resin composition layer according to claim 1, wherein the component (B) contains an active ester-based hardener. 如請求項7之樹脂組成物層,其中,將樹脂成分定為100質量%時,活性酯系硬化劑的含量為15質量%以下。The resin composition layer according to claim 7, wherein when the resin component is set to 100% by mass, the content of the active ester-based hardener is 15% by mass or less. 如請求項1之樹脂組成物層,其係含有(D)熱塑性樹脂。The resin composition layer according to claim 1, which contains (D) a thermoplastic resin. 如請求項9之樹脂組成物層,其中,(D)成分的重量平均分子量為38000以上。The resin composition layer according to claim 9, wherein the weight average molecular weight of the component (D) is 38,000 or more. 如請求項1之樹脂組成物層,其中,透過係數P為2cc/m2 ・mm-1 ・day・atom以上4cc/m2 ・mm-1 ・day・atom以下。For example, the resin composition layer of claim 1, wherein the transmission coefficient P is 2cc / m 2 · mm -1 · day · atom or more and 4cc / m 2 · mm -1 · day · atom or less. 如請求項1之樹脂組成物層,其係印刷電路板之絕緣層形成用。The resin composition layer of claim 1 is for forming an insulating layer of a printed circuit board. 如請求項1之樹脂組成物層,其係印刷電路板之層間絕緣層形成用。For example, the resin composition layer of claim 1 is for forming an interlayer insulating layer of a printed circuit board. 一種樹脂薄片,其係包含支持體、與設置在該支持體上之如請求項1~13中任一項之樹脂組成物層。A resin sheet comprising a support and a resin composition layer according to any one of claims 1 to 13 provided on the support. 一種印刷電路板,其係包含第1導體層、第2導體層及形成在第1導體層與第2導體層之間的絕緣層之印刷電路板,其特徵為該絕緣層為如請求項1~13中任一項之樹脂組成物層的硬化物。A printed circuit board is a printed circuit board comprising a first conductor layer, a second conductor layer, and an insulation layer formed between the first conductor layer and the second conductor layer, characterized in that the insulation layer is as in claim 1 The hardened | cured material of the resin composition layer in any one of -13. 一種半導體裝置,其係包含如請求項15之印刷電路板。A semiconductor device comprising a printed circuit board as claimed in claim 15.
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