TWI836345B - Thermosetting epoxy resin composition, adhesive film for insulating layer formation, prepreg for insulating layer formation, insulator for printed wiring board, multilayer printed wiring board and semiconductor device - Google Patents

Thermosetting epoxy resin composition, adhesive film for insulating layer formation, prepreg for insulating layer formation, insulator for printed wiring board, multilayer printed wiring board and semiconductor device Download PDF

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TWI836345B
TWI836345B TW111104959A TW111104959A TWI836345B TW I836345 B TWI836345 B TW I836345B TW 111104959 A TW111104959 A TW 111104959A TW 111104959 A TW111104959 A TW 111104959A TW I836345 B TWI836345 B TW I836345B
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epoxy resin
insulating layer
printed wiring
resin composition
wiring board
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TW111104959A
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TW202222889A (en
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川合賢司
山本有希
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日商味之素股份有限公司
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Abstract

本發明提供一種熱硬化性環氧樹脂組成物,其特徵係至少含有環氧樹脂(A)、含萘構造之活性酯化合物(B)、熱可塑性樹脂與無機填充材之熱硬化性環氧樹脂組成物,其中,前述樹脂組成物中的不揮發成分為100質量%時,前述含萘構造之活性酯化合物(B)的含量為0.1~30質量%,前述無機填充材的平均粒徑為0.01μm以上5μm以下。 The present invention provides a thermosetting epoxy resin composition, which is characterized by a thermosetting epoxy resin containing at least an epoxy resin (A), an active ester compound (B) containing a naphthalene structure, a thermoplastic resin and an inorganic filler. A composition, wherein when the non-volatile component in the resin composition is 100% by mass, the content of the naphthalene-containing active ester compound (B) is 0.1 to 30% by mass, and the average particle size of the inorganic filler is 0.01 Above μm and below 5μm.

Description

熱硬化性環氧樹脂組成物、絕緣層形成用接著薄膜、絕緣層形成用預浸體、印刷配線板用絕緣體、多層印刷配線板及半導體裝置 Thermosetting epoxy resin composition, adhesive film for forming an insulating layer, prepreg for forming an insulating layer, insulator for a printed wiring board, multilayer printed wiring board and semiconductor device

本發明係關於介電正切為低的值,且粗糙度低,適於形成具有可提高剝離強度之粗化面之絕緣層的熱硬化性環氧樹脂組成物及其硬化物、及含有具有粗糙度低、可提高剝離強度之粗化面之硬化物層作為絕緣層之多層印刷配線板。 The present invention relates to a thermosetting epoxy resin composition having a low dielectric tangent and low roughness, which is suitable for forming an insulating layer having a roughened surface that can improve peel strength, and a cured product thereof, and a multilayer printed wiring board containing a cured product layer having a roughened surface that has a low roughness and can improve peel strength as an insulating layer.

隨著電子機器之小型化、高性能化,可對應於所使用之多層印刷配線板之增層中之多層化、高密度化的導體形成方法已知有使絕緣層表面經粗化處理後,以無電解鍍敷形成導體層之添加(additive)法,以無電解鍍敷或電解鍍敷形成導體層之半添加法,於該等方法之情況下,絕緣層表面與鍍敷導體層之間之密著性主要藉由使絕緣層表面經粗化處理而成為發揮固定效果之具有微細凹凸之面予以確保。 As electronic devices become smaller and more powerful, the conductor formation methods that can correspond to the multi-layer and high-density increase in the multi-layer printed wiring boards used therein include an additive method in which the surface of the insulating layer is roughened and then the conductive layer is formed by electroless plating, and a semi-additive method in which the conductive layer is formed by electroless plating or electrolytic plating. In these methods, the adhesion between the surface of the insulating layer and the plated conductive layer is mainly ensured by roughening the surface of the insulating layer to form a fine concave-convex surface that exerts a fixing effect.

藉由絕緣層表面所形成之凹凸之固定效果於表面粗糙度愈大則愈大,粗糙度愈大時愈能提高絕緣層與 鍍敷導體層之密著性。然而,絕緣層表面之粗糙度較大時,藉由蝕刻部分地去除粗化面上所形成之薄膜導體層以形成特定配線圖型時,由於絕緣層表面中應去除部位中之進入凹部的導體層部分係難以去除之狀態,故需要蝕刻處理變得需要較長時間,同時因其影響,而侵蝕到應殘留之配線圖型部分而損傷微細配線,造成斷線之危險性變高。因此,為對應於配線之微細化、高密度化,絕緣層之表面狀態被要求為儘可能之微細凹凸且可充分地確保與藉鍍敷形成之薄膜導體層之密著性之粗化面。 The fixing effect of the concave and convex formed on the surface of the insulating layer is greater as the surface roughness increases. The greater the roughness, the better the adhesion between the insulating layer and the plated conductive layer. However, when the surface roughness of the insulating layer is large, when the thin film conductive layer formed on the roughened surface is partially removed by etching to form a specific wiring pattern, the conductive layer portion that enters the concave portion of the insulating layer surface to be removed is difficult to remove, so the etching process requires a longer time. At the same time, due to its influence, the wiring pattern portion that should be retained is etched and the fine wiring is damaged, resulting in a higher risk of disconnection. Therefore, in order to cope with the miniaturization and high density of wiring, the surface state of the insulating layer is required to be a roughened surface with as fine an irregularity as possible and sufficient adhesion to the thin film conductor layer formed by plating.

又,絕緣層亦被要求線熱膨脹率較低以與絕緣層表面上形成之由配線圖型所成之導體層之間不產生線熱膨脹係數差。絕緣層之線熱膨脹率高時,與導體層之線熱膨脹率之差變大,容易產生於絕緣層與導體層之間發生龜裂等之問題。 In addition, the insulating layer is also required to have a low linear thermal expansion coefficient so as not to generate a difference in linear thermal expansion coefficient with the conductor layer formed by the wiring pattern formed on the surface of the insulating layer. When the linear thermal expansion coefficient of the insulating layer is high, the difference in linear thermal expansion coefficient with the conductor layer becomes larger, and problems such as cracking between the insulating layer and the conductor layer are likely to occur.

過去,作為形成如上述之多層印刷配線板之內層電路基板的絕緣層之熱硬化性樹脂組成物所使用之硬化劑已知有「活性酯化合物」,作為此「活性酯化合物」,主要係使用「含二環戊二烯二酚構造之活性酯化合物」。然而,近幾年來之多層印刷配線板之增層中之更多層化、高密度化之進展顯著,亦有許多可形成可對應於該狀況之絕緣層的環氧樹脂組成物之提案。 In the past, "active ester compounds" have been known as curing agents for thermosetting resin compositions used to form the insulating layer of the inner circuit board of the multilayer printed wiring board. As this "active ester compound", mainly Use "active ester compound containing dicyclopentadienyl diphenol structure". However, in recent years, the build-up of layers of multilayer printed wiring boards has significantly progressed toward higher layering and higher density, and there are many proposals for epoxy resin compositions that can form insulating layers that can cope with this situation.

專利文獻1中記載藉由使用使酚醛清漆樹脂中之酚性羥基芳酯化而得之活性酯化合物作為熱硬化性環氧樹脂組成物之硬化劑,可獲得形成展現低介電特性之絕 緣層的硬化物。 Patent document 1 states that by using an active ester compound obtained by esterifying phenolic hydroxy aromatics in a novolac resin as a hardener for a thermosetting epoxy resin composition, a hardened material having an insulating layer exhibiting low dielectric properties can be obtained.

專利文獻2中,作為可形成儘管硬化物表面經粗化處理之粗化面的粗糙度比較小,但該粗化面對於鍍敷導體亦顯示高的密著性、且線熱膨脹率較小之絕緣層的環氧樹脂組成物,記載含有(A)環氧樹脂、(B)活性酯化合物、(C)具有三嗪構造之酚樹脂、(D)馬來醯亞胺化合物、及(E)苯氧樹脂之環氧樹脂組成物。 Patent Document 2 describes an epoxy resin composition containing (A) epoxy resin, (B) active ester compound, (C) phenol resin having a triazine structure, (D) maleimide compound, and (E) phenoxy resin as an epoxy resin composition that can form an insulating layer having a relatively small linear thermal expansion coefficient despite the relatively small roughness of the roughened surface of the hardened surface after roughening treatment.

又,專利文獻3中,作為可賦予展現低介電率、低介電正切,並且兼具優異之耐熱性與難燃性之硬化物的熱硬化性環氧樹脂組成物,記載含有以聚伸芳氧構造作為主骨架,且於該構造之芳香核上具有芳基羰基之活性酯樹脂的環氧樹脂組成物。 Furthermore, Patent Document 3 describes an epoxy resin composition containing an active ester resin having a polyaryloxy structure as a main skeleton and an aromatic carbonyl group on the aromatic nucleus of the structure as a thermosetting epoxy resin composition that can provide a cured product having low dielectric constant and low dielectric tangent and excellent heat resistance and flame retardancy.

如上述,已有許多適於形成內層電路基板之絕緣層的環氧樹脂組成物之提案,但對於可形成低介電正切,並且與導體層之密著性優異之微細粗化面、可形成均衡良好地具備可對應於由多層印刷配線板之增層之更多層化、高密度化之特性的絕緣層之環氧樹脂組成物之期望日益高漲。 As mentioned above, there have been many proposals for epoxy resin compositions suitable for forming the insulating layer of the inner circuit board. However, it is possible to form a finely roughened surface with low dielectric tangent and excellent adhesion to the conductor layer. There is an increasing demand to form an epoxy resin composition having well-balanced insulating layer characteristics that can cope with the increase in layering and density of multilayer printed wiring boards.

[先前技術文獻] [Prior Art Literature]

[專利文獻] [Patent Literature]

[專利文獻1]特開平07-082348號公報 [Patent Document 1] Japanese Patent Application Publication No. 07-082348

[專利文獻2]特開2010-090238號公報 [Patent Document 2] Patent Publication No. 2010-090238

[專利文獻3]特開2012-012534號公報 [Patent Document 3] Japanese Patent Application Publication No. 2012-012534

本發明之目的係提供一種顯示低介電正切且可形成與導體層之密著性、蝕刻性優異之具有微細凹凸之粗化面且可形成均衡良好地具備可對應於多層印刷配線板之增層中之更多層化、高密度化之特性的絕緣層之熱硬化性環氧樹脂組成物,與具有以其硬化物所形成之絕緣層之印刷配線板及由該印刷配線板構成之多層印刷配線板。 The purpose of the present invention is to provide a thermosetting epoxy resin composition that exhibits low dielectric tangent and can form a roughened surface with fine irregularities that has excellent adhesion and etching properties to a conductive layer and can form an insulating layer that has well-balanced properties corresponding to the increased number of layers and high density in the build-up of a multi-layer printed wiring board, a printed wiring board having an insulating layer formed by the cured product thereof, and a multi-layer printed wiring board composed of the printed wiring board.

且,本發明之目的係提供於支撐薄膜上形成由上述熱硬化性環氧樹脂組成物所成之樹脂組成物層的絕緣層形成用接著薄膜,及使上述熱硬化性環氧樹脂組成物含浸於薄片狀補強基材中而成之絕緣層形成用預浸體。 Furthermore, an object of the present invention is to provide an adhesive film for forming an insulating layer in which a resin composition layer composed of the above-mentioned thermosetting epoxy resin composition is formed on a supporting film and impregnated with the above-mentioned thermosetting epoxy resin composition. A prepreg for forming an insulating layer formed in a sheet-like reinforcing base material.

本發明人等針對熱硬化性環氧樹脂組成物中使用之硬化劑或調配樹脂類積極檢討之結果,發現作為調配於環氧樹脂組成物中之樹脂成分而已知之各種樹脂中,將「含萘構造之活性酯化合物」以特定量調配於樹脂組成物中時將成為可解決上述課題之手段,因而完成以下之發明。 As a result of actively examining the hardeners or formulated resins used in thermosetting epoxy resin compositions, the inventors of the present invention have discovered that among various resins known as resin components formulated in epoxy resin compositions, when a "naphthalene-containing active ester compound" is formulated in a specific amount in the resin composition, it will become a means to solve the above-mentioned problem, and thus the following invention has been completed.

[1]一種熱硬化性環氧樹脂組成物,其係至少含有環氧樹脂(A)與含萘構造之活性酯化合物(B)之熱硬化 性環氧樹脂組成物,其中 [1] A thermosetting epoxy resin composition comprising at least an epoxy resin (A) and an active ester compound (B) containing a naphthalene structure, wherein

使前述熱硬化性環氧樹脂組成物中之不揮發成分為100質量%時,前述含萘構造之活性酯化合物(B)的含量為0.1~30質量%。 When the non-volatile components in the aforementioned thermosetting epoxy resin composition are 100% by mass, the content of the aforementioned naphthalene-containing active ester compound (B) is 0.1 to 30% by mass.

[2]如[1]所記載之熱硬化性環氧樹脂組成物,其中前述含萘構造之活性酯化合物(B)係具有聚氧化萘構造與芳基羰氧基之活性酯化合物。 [2] The thermosetting epoxy resin composition as described in [1], wherein the aforementioned active ester compound containing a naphthalene structure (B) is an active ester compound having a polyoxynaphthalene structure and an aromatic carbonyloxy group.

[3]如[1]或[2]所記載之熱硬化性環氧樹脂組成物,其中前述含萘構造之活性酯化合物(B)係於聚氧化萘構造之萘核上已鍵結芳基羰氧基之活性酯化合物。 [3] The thermosetting epoxy resin composition according to [1] or [2], wherein the active ester compound (B) containing a naphthalene structure has an aryl group bonded to the naphthalene core of the polyoxynaphthalene structure. Active ester compound of carbonyloxy group.

[4]如[1]~[3]中任一項所記載之熱硬化性環氧樹脂組成物,其中前述環氧樹脂(A)含有液狀之環氧樹脂。 [4] A thermosetting epoxy resin composition as described in any one of [1] to [3], wherein the epoxy resin (A) contains a liquid epoxy resin.

[5]如[1]~[4]中任一項所記載之熱硬化性環氧樹脂組成物,其係進而含有無機填充材。 [5] The thermosetting epoxy resin composition according to any one of [1] to [4], further containing an inorganic filler.

[6]如[1]~[5]中任一項所記載之熱硬化性環氧樹脂組成物,其係進而含有熱可塑性樹脂。 [6] A thermosetting epoxy resin composition as described in any one of [1] to [5], which further contains a thermoplastic resin.

[7]如[1]~[6]中任一項所記載之熱硬化性環氧樹脂組成物,其係藉由鍍敷而形成導體層之多層印刷配線板之絕緣層用樹脂組成物。 [7] A thermosetting epoxy resin composition as described in any one of [1] to [6], which is a resin composition for an insulating layer of a multi-layer printed wiring board in which a conductive layer is formed by coating.

[8]一種絕緣層形成用接著薄膜,其係於支撐薄膜上設置有由如請[1]~[7]中任一項所記載之熱硬化性環氧樹脂組成物所成之樹脂組成物層而成者。 [8] An adhesive film for forming an insulating layer, in which a resin composition composed of the thermosetting epoxy resin composition as described in any one of [1] to [7] is provided on a supporting film. Made up of layers.

[9]一種絕緣層形成用預浸體,其係將如[1]~[7]中任一項所記載之熱硬化性環氧樹脂組成物含浸於薄片狀纖維 基材中而成者。 [9] A prepreg for forming an insulating layer, which is obtained by impregnating a thermosetting epoxy resin composition as described in any one of [1] to [7] into a sheet-like fiber substrate.

[10]一種印刷配線板用絕緣體,其係由如[8]所記載之絕緣層形成用接著薄膜之樹脂組成物層或如[9]所記載之絕緣層形成用預浸體之任一者之硬化物所成者。 [10] An insulator for a printed wiring board, which is formed by hardening either a resin composition layer with a film for forming an insulating layer as described in [8] or a prepreg for forming an insulating layer as described in [9].

[11]一種印刷配線板用絕緣體,其係於由如[10]所記載之印刷配線板用絕緣體所成之絕緣層上設置有經圖型加工之導體層而成者。 [11] An insulator for a printed wiring board, which is formed by providing a patterned conductive layer on an insulating layer formed by the insulator for a printed wiring board as described in [10].

[12]如[10]或[11]所記載之印刷配線板用絕緣體,其中前述絕緣層之表面粗糙度Ra係10~200nm,Rq係15~250nm,前述絕緣層與前述導體層之剝離強度係0.35kgf/cm以上。 [12] The insulator for printed wiring boards according to [10] or [11], wherein the surface roughness Ra of the insulating layer is 10 to 200 nm, Rq is 15 to 250 nm, and the peeling strength of the insulating layer and the conductor layer is It is above 0.35kgf/cm.

[13]一種多層印刷配線板,其係如[11]或[12]所記載之印刷配線板用絕緣體複數層合而成者。 [13] A multilayer printed wiring board in which a plurality of printed wiring boards according to [11] or [12] are laminated with insulators.

[14]一種半導體裝置,其係包含如[13]所記載之多層印刷配線板。 [14] A semiconductor device including the multilayer printed wiring board according to [13].

前述熱硬化性環氧樹脂組成物係介電正切低、可形成與導體層之密著性優異之粗化面,且可形成成為均衡良好地具備可對應於由多層印刷配線板之增層之更多層化、高密度化之特性的絕緣層之硬化物層之熱硬化性環氧樹脂組成物。 The thermosetting epoxy resin composition has a low dielectric tangent, can form a roughened surface with excellent adhesion to the conductor layer, and can be formed into a well-balanced structure that can be used as a multi-layer printed wiring board with built-up layers. The thermosetting epoxy resin composition of the hardened material layer of the insulating layer with more layered and high-density characteristics.

且,使上述熱硬化性環氧樹脂組成物硬化而成之硬化物,於藉由其表面之粗化處理,形成表面粗糙度Ra為 10~200nm,Rq為15~250nm之微細凹凸時,由於亦成為與導體層之密著性優異之粗化面,故作為多層印刷配線板中之絕緣層形成材料尤其有用。 Furthermore, when the cured product obtained by curing the above-mentioned thermosetting epoxy resin composition is subjected to surface roughening treatment to form fine irregularities with a surface roughness Ra of 10 to 200 nm and Rq of 15 to 250 nm, it also becomes a roughened surface with excellent adhesion to the conductor layer, so it is particularly useful as an insulating layer forming material in a multi-layer printed wiring board.

以下,分別針對本發明之熱硬化性環氧樹脂組成物、絕緣層形成用接著薄膜、絕緣層形成用預浸體、印刷配線板用絕緣體及多層印刷配線板進一步詳述。 The following is a further detailed description of the thermosetting epoxy resin composition, the adhesive film for forming an insulating layer, the prepreg for forming an insulating layer, the insulator for a printed wiring board, and the multi-layer printed wiring board of the present invention.

本發明之熱硬化性環氧樹脂組成物含有環氧樹脂(A)與含萘構造之活性酯化合物(B)作為必要成分,此外,可視需要含有無機填充材、熱可塑性樹脂、環氧樹脂用硬化劑、硬化促進劑、及於形成多層印刷配線板中之絕緣層之樹脂組成物中所使用之添加物。 The thermosetting epoxy resin composition of the present invention contains an epoxy resin (A) and an active ester compound (B) containing a naphthalene structure as essential components. In addition, it may optionally contain an inorganic filler, a thermoplastic resin, and an epoxy resin compound. Hardeners, hardening accelerators, and additives used in resin compositions that form insulating layers in multilayer printed wiring boards.

〈環氧樹脂(A)〉 〈Epoxy resin(A)〉

本發明之熱硬化性環氧樹脂組成物中使用之環氧樹脂(A)為形成多層印刷配線板中之絕緣層的樹脂組成物中通常使用之環氧樹脂,可由以下列舉之例中適當選擇使用。 The epoxy resin (A) used in the thermosetting epoxy resin composition of the present invention is an epoxy resin commonly used in resin compositions for forming insulating layers in multi-layer printed wiring boards, and can be appropriately selected and used from the following examples.

亦即,環氧樹脂(A)列舉為例如雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、酚酚醛清漆型環氧樹脂、第三丁基-兒茶酚型環氧樹脂、萘酚型環氧樹脂、萘型環氧樹脂、萘醚型環氧樹脂、縮水甘油胺型環氧樹脂、縮水甘油酯型環氧樹 脂、甲酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、蒽型環氧樹脂、線狀脂肪族環氧樹脂、具有丁二烯構造之環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含有螺環之環氧樹脂、環己烷二甲醇型環氧樹脂、三羥甲基型環氧樹脂、鹵化環氧樹脂等。 That is, the epoxy resin (A) includes, for example, bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, bisphenol AF type epoxy resin, and phenolic novolak type epoxy resin. Resin, tertiary butyl-catechol type epoxy resin, naphthol type epoxy resin, naphthalene type epoxy resin, naphthyl ether type epoxy resin, glycidyl amine type epoxy resin, glycidyl ester type epoxy resin Grease, cresol novolak type epoxy resin, biphenyl type epoxy resin, anthracene type epoxy resin, linear aliphatic epoxy resin, epoxy resin with butadiene structure, alicyclic epoxy resin, miscellaneous Cyclic epoxy resin, epoxy resin containing spiro rings, cyclohexanedimethanol-type epoxy resin, trimethylol-type epoxy resin, halogenated epoxy resin, etc.

環氧樹脂(A)亦可併用2種以上。環氧樹脂(A)以環氧樹脂(A)之不揮發成分作為100質量%時,較好為至少50質量%以上含有1分子中具有2個以上環氧基之環氧樹脂之樣態。且再者,環氧樹脂(A)較佳之樣態為含有1分子中具有2個以上之環氧基,且在溫度20℃為液狀之芳香族系環氧樹脂(液狀環氧樹脂),更好之樣態為含有該液狀環氧樹脂及1分子中具有3個以上環氧基,且在溫度20℃為固體狀之芳香族系環氧樹脂(固體狀環氧樹脂)。 Two or more types of epoxy resins (A) may be used in combination. When the non-volatile component of the epoxy resin (A) is taken as 100% by mass, the epoxy resin (A) is preferably in a form containing at least 50% by mass or more of an epoxy resin having two or more epoxy groups per molecule. Furthermore, a preferred form of the epoxy resin (A) is an aromatic epoxy resin (liquid epoxy resin) which contains two or more epoxy groups per molecule and is liquid at a temperature of 20°C. , a more preferable aspect is to contain the liquid epoxy resin and an aromatic epoxy resin (solid epoxy resin) that has three or more epoxy groups in one molecule and is solid at a temperature of 20°C.

又,本發明中,所謂芳香族系環氧樹脂意指其分子內具有芳香環骨架之環氧樹脂。且所謂環氧當量(g/eq)意指每1個環氧基之分子量。藉由使用液狀環氧樹脂與固體狀環氧樹脂作為環氧樹脂,於以接著薄膜之形態使用環氧樹脂組成物時,可形成顯示充分可撓性且作業性優異之薄膜,並且提高環氧樹脂組成物之硬化物之斷裂強度,且提高多層印刷配線板之耐久性。 In addition, in the present invention, the so-called aromatic epoxy resin means an epoxy resin having an aromatic cyclic skeleton in its molecule. And the so-called epoxy equivalent (g/eq) means the molecular weight per 1 epoxy group. By using a liquid epoxy resin and a solid epoxy resin as the epoxy resin, when the epoxy resin composition is used in the form of a film, a film showing sufficient flexibility and excellent workability can be formed, and the fracture strength of the cured product of the epoxy resin composition is improved, and the durability of the multi-layer printed wiring board is improved.

另外,併用液狀環氧樹脂與固體狀環氧樹脂作為環氧樹脂時,其等之調配比例(液狀環氧樹脂:固體狀環氧樹脂)以質量比計,較好為1:0.1~1:2之範圍。 藉由以該範圍內使用液狀環氧樹脂,以接著薄膜之形態使用時,可獲得充分之可撓性,提高作業性,且亦可獲得層合時之充分流動性。且,藉由在該範圍內使用固體狀環氧樹脂,於降低環氧樹脂組成物之黏著性,且以接著薄膜之形態使用時,可提高真空層合時之脫氣性。且,真空層合時之保護膜或支撐膜之剝離性良好,亦可提高硬化後之耐熱性。 In addition, when a liquid epoxy resin and a solid epoxy resin are used together as the epoxy resin, the mixing ratio (liquid epoxy resin: solid epoxy resin) is preferably 1:0.1~ in terms of mass ratio. 1:2 range. By using liquid epoxy resin within this range, sufficient flexibility can be obtained when used in the form of a bonded film, workability can be improved, and sufficient fluidity can be obtained during lamination. Furthermore, by using a solid epoxy resin within this range, the adhesiveness of the epoxy resin composition is reduced, and when used in the form of an adherent film, the degassing properties during vacuum lamination can be improved. Moreover, the peelability of the protective film or support film during vacuum lamination is good, and the heat resistance after hardening can also be improved.

本發明之環氧樹脂組成物中,以環氧樹脂組成物之不揮發成分作為100質量%時,環氧樹脂(A)之含量較好為10~50質量%,更好為20~40質量%,又更好為20~35質量%。藉由使環氧樹脂(A)之含量在該範圍內,有提高環氧樹脂組成物之硬化性之傾向。 In the epoxy resin composition of the present invention, when the non-volatile components of the epoxy resin composition are taken as 100% by mass, the content of the epoxy resin (A) is preferably 10-50% by mass, more preferably 20-40% by mass, and even more preferably 20-35% by mass. By making the content of the epoxy resin (A) within this range, there is a tendency to improve the curability of the epoxy resin composition.

〈含萘構造之活性酯化合物(B)〉 〈Active ester compound (B) containing naphthalene structure〉

本發明之熱硬化性環氧樹脂組成物中之「含萘構造之活性酯化合物(B)」(萘型活性酯化合物)具有作為環氧樹脂之硬化劑之功能,並且認為在粗化處理樹脂硬化物表面時,亦有助於形成與導體層之密著性良好之微細凹凸。 The "naphthalene-containing active ester compound (B)" (naphthalene-type active ester compound) in the thermosetting epoxy resin composition of the present invention functions as a hardener for the epoxy resin, and is considered to be effective in roughening the resin. When hardening the surface of the object, it also helps to form fine unevenness with good adhesion to the conductor layer.

含萘構造之活性酯化合物(B)若具有萘構造與芳基羰氧基,則無特別限制,但較好為具有聚氧化萘構造與芳基羰氧基之活性酯化合物,更好為聚氧化萘構造之萘核上鍵結芳基羰氧基之活性酯化合物。至於聚氧化萘構造亦可為經碳數1~4之烷基取代之聚氧化萘構造。如上述 之活性酯化合物可藉由使具有核取代羥基之萘構造之化合物與於萘核或苯核上具有羧基之羧酸化合物之縮合反應而製造。該活性酯化合物為例如專利文獻3中所記載之「以聚伸芳氧基構造作為主骨架,以芳基羧酸予以酯化之活性酯化合物」中所包含之化合物。 The active ester compound (B) containing a naphthalene structure is not particularly limited if it has a naphthalene structure and an aryl carbonyloxy group, but is preferably an active ester compound having a polyoxynaphthalene structure and an aryl carbonyloxy group, and more preferably an active ester compound having an aryl carbonyloxy group bonded to the naphthalene nucleus of the polyoxynaphthalene structure. The polyoxynaphthalene structure may also be a polyoxynaphthalene structure substituted by an alkyl group having 1 to 4 carbon atoms. The active ester compound as described above can be prepared by condensing a naphthalene structure compound having a core-substituted hydroxyl group with a carboxylic acid compound having a carboxyl group on a naphthalene nucleus or a benzene nucleus. The active ester compound is, for example, a compound included in the "active ester compound having a polyoxyaryloxy structure as the main skeleton and esterified with an aryl carboxylic acid" described in Patent Document 3.

含萘構造之活性酯化合物(B)具體列舉為以下述通式(1)表示之化合物。 Specific examples of the active ester compound (B) containing a naphthalene structure include compounds represented by the following general formula (1).

Figure 111104959-A0101-12-0010-1
[式(1)中,R1各獨立為氫原子或碳數1~4之烷基,較好為氫原子,R2各獨立為氫原子或以下述通式(2)表示之1價基,X各獨立為氫原子、苯甲醯基或萘羰基,較好為苯甲醯基,n及m各獨立為0~5之整數,n或m之任一者為1以上之整數]。
Figure 111104959-A0101-12-0010-1
[In formula (1), R 1 is each independently a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, preferably a hydrogen atom, and R 2 is each independently a hydrogen atom or a univalent group represented by the following general formula (2) , each of

Figure 111104959-A0101-12-0010-2
[式(2)中,R1係與上述相同,X係與上述相同,p為1或2之整數,又,上述通式(1)及通式(2)中之X中之至少一者為苯甲醯基或萘羰基]。
Figure 111104959-A0101-12-0010-2
[In formula (2), R 1 is the same as above, X is the same as above, p is an integer of 1 or 2, and at least one of X in the above general formula (1) and general formula (2) It is benzyl or naphthylcarbonyl].

本發明之熱硬化性環氧樹脂組成物中,於將熱硬化性環氧樹脂組成物之不揮發成分作為100質量%時,含萘構造之活性酯化合物(B)之含量為0.1~30質量%。據此,可形成顯示低介電正切並且具有與導體層之密著性、蝕刻性優異之微細凹凸之粗化面。含萘構造之活性酯化合物(B)之含量之更佳範圍為3~30質量%,又更好為5~28質量%。 In the thermosetting epoxy resin composition of the present invention, when the non-volatile components of the thermosetting epoxy resin composition are taken as 100% by mass, the content of the naphthalene structure-containing active ester compound (B) is 0.1 to 30% by mass. %. According to this, a roughened surface showing low dielectric tangent and having fine unevenness with excellent adhesion to the conductor layer and etching property can be formed. The content of the naphthalene structure-containing active ester compound (B) is preferably in the range of 3 to 30 mass %, and more preferably in the range of 5 to 28 mass %.

〈無機填充材〉 〈Inorganic filler〉

藉由使本發明之熱硬化性環氧樹脂組成物進一步含有無機填充材,可降低線熱膨脹率或降低介電正切。無機填充材列舉為例如二氧化矽、氧化鋁、硫酸鋇、滑石、黏土、雲母粉、氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、氧化鎂、氮化硼、硼酸鋁、鈦酸鋇、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、鋯酸鋇、鋯酸鈣等。其中,以無定形二氧化矽、粉碎二氧化矽、熔融二氧化矽、結晶二氧化矽、合成二氧化矽、中空二氧化矽、球狀二氧化矽等之二氧化矽較佳,就進一步降低絕緣層之表面粗糙度而言,更好為熔融二氧化矽、球狀二氧化矽,又更好為球狀熔融二氧化矽。該等可使用1種或組合2種以上使用。市售之球狀熔融二氧化矽之例列舉為ADMATECHS(股)製之 「SOC2」、「SOC1」等。 By further containing an inorganic filler in the thermosetting epoxy resin composition of the present invention, the linear thermal expansion coefficient or the dielectric tangent can be reduced. Examples of inorganic fillers include silica, aluminum oxide, barium sulfate, talc, clay, mica powder, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, boron nitride, aluminum borate, and barium titanate. , strontium titanate, calcium titanate, magnesium titanate, bismuth titanate, titanium oxide, barium zirconate, calcium zirconate, etc. Among them, amorphous silica, pulverized silica, fused silica, crystalline silica, synthetic silica, hollow silica, spherical silica and other silicas are preferred, which further reduces the Regarding the surface roughness of the insulating layer, fused silica, spherical silica, and spherical fused silica are more preferred. These can be used 1 type or in combination of 2 or more types. An example of commercially available spherical fused silica is manufactured by ADMATECH Co., Ltd. "SOC2", "SOC1", etc.

無機填充材之平均粒徑並無特別限制,但就使絕緣層表面成為低粗糙度,可進行微細配線形成之觀點而言,較好為5μm以下,更好為3μm以下,又更好為2μm以下,再更好為1μm以下,又再更好為0.8μm以下,最好為0.6μm以下,又最好為0.4μm以下。另一方面,將樹脂組成物作成樹脂漆料時,就防止漆料之黏度上升、作業性降低之觀點而言,較好為0.01μm以上,更好為0.03μm以上,又更好為0.05μm以上,再更好為0.07μm以上,又再更好為0.1μm以上。上述無機填充材之平均粒徑可利用基於Mie散射理論之雷射繞射.散射法測定。具體而言可藉由雷射繞射散射式粒度分佈測定裝置,以體積基準作成無機填充材之粒度分佈,以其中值徑作為平均粒徑而測定。測定樣品可較好使用利用超音波使無機填充材分散於水中而成者。雷射繞射散射式粒度分佈測定裝置可使用堀場製作所(股)製之LA-950等。無機填充材較好為以胺基矽烷系偶合劑、脲基系烷系偶合劑、環氧基矽烷系偶合劑、巰基矽烷系偶合劑、矽烷系偶合劑、乙烯基矽烷系偶合劑、苯乙烯基矽烷系偶合劑、丙烯酸酯矽烷系偶合劑、異氰酸酯矽烷系偶合劑、硫醚矽烷系偶合劑、有機矽氮烷化合物、鈦酸酯系偶合劑等之表面處理劑予以表面處理而提高其耐濕性、分散性者。該等可使用1種或組合2種以上使用。 The average particle size of the inorganic filler is not particularly limited, but from the viewpoint of making the surface of the insulating layer low in roughness and enabling formation of fine wiring, it is preferably 5 μm or less, more preferably 3 μm or less, and still more preferably 2 μm. below, more preferably 1 μm or below, still more preferably 0.8 μm or below, more preferably 0.6 μm or below, still more preferably 0.4 μm or below. On the other hand, when the resin composition is used as a resin paint, from the viewpoint of preventing the paint from increasing in viscosity and reducing workability, it is preferably 0.01 μm or more, more preferably 0.03 μm or more, and still more preferably 0.05 μm. Above, preferably 0.07 μm or more, further preferably 0.1 μm or more. The average particle size of the above-mentioned inorganic filler material can be determined by laser diffraction based on Mie scattering theory. Determination by scattering method. Specifically, the particle size distribution of the inorganic filler can be prepared on a volume basis using a laser diffraction and scattering particle size distribution measuring device, and the median diameter can be measured as the average particle diameter. As a measurement sample, it is preferable to use one in which an inorganic filler is dispersed in water using ultrasonic waves. As a laser diffraction scattering particle size distribution measuring device, LA-950 manufactured by Horiba Manufacturing Co., Ltd. can be used. The inorganic filler is preferably an aminosilane coupling agent, a ureidoalkyl coupling agent, an epoxysilane coupling agent, a mercaptosilane coupling agent, a silane coupling agent, a vinylsilane coupling agent, or styrene. Surface treatment agents such as silane-based coupling agents, acrylate silane coupling agents, isocyanate silane coupling agents, thioether silane coupling agents, organosilazane compounds, titanate coupling agents, etc. can be used to improve their resistance. Wet and dispersive. These can be used 1 type or in combination of 2 or more types.

調配無機填充材時,其含量雖隨著熱硬化性 環氧樹脂組成物所要求之特性而異,但無機填充材之含量以熱硬化性環氧樹脂組成物中之不揮發成分作為100質量%時,較好為30~90質量%,更好為40~80質量%,又更好為50~70質量%。無機填充材之含量過少時,會有硬化物之線熱膨脹率變高之傾向,含量過多時會有調製接著薄膜時難以薄膜化,使硬化物變脆之傾向。 When preparing inorganic fillers, their content varies with the properties required of the thermosetting epoxy resin composition, but the content of inorganic fillers is preferably 30-90% by mass, more preferably 40-80% by mass, and even more preferably 50-70% by mass, based on the non-volatile components in the thermosetting epoxy resin composition as 100% by mass. If the content of inorganic fillers is too low, the linear thermal expansion rate of the cured product tends to increase. If the content is too high, it will be difficult to form a film when preparing the adhesive film, making the cured product brittle.

〈熱可塑性樹脂〉 〈Thermoplastic resin〉

本發明之熱硬化性環氧樹脂組成物藉由進一步含有熱可塑性樹脂,可提高硬化物之機械強度,進而亦可提高以接著薄膜之形態使用時之薄膜成型能。熱可塑性樹脂可列舉出苯氧樹脂、聚乙烯乙縮醛樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚醯亞胺樹脂、聚碸樹脂、聚醚碸樹脂、聚苯醚樹脂、聚碳酸酯樹脂、聚醚醚酮樹脂、聚酯樹脂,最好為苯氧樹脂、聚乙烯乙縮醛樹脂。該等熱可塑性樹脂可分別單獨使用,亦可組合2種以上使用。熱可塑性樹脂之重量平均分子量較好為8000~200000之範圍,更好為12000~100000之範圍。又本發明中之重量平均分子量係以凝膠滲透層析(GPC)法(聚苯乙烯換算)測定。以GPC法測定之重量平均分子量具體而言可使用島津製作所(股)製之LC-9A/RID-6A作為測定裝置,使用昭和電工(股)製之Shodex K-800P/K-804L/K-804L作為管柱,使用氯仿等作為移動相,以管柱溫度40℃進行測定,使用標準聚苯乙烯之校正線算出。 The thermosetting epoxy resin composition of the present invention can improve the mechanical strength of the cured product by further containing a thermoplastic resin, and can also improve the film forming ability when used in the form of a film. Thermoplastic resins include phenoxy resins, polyvinyl acetal resins, polyimide resins, polyamide imide resins, polyether imide resins, polysulfone resins, polyethersulfone resins, polyphenylene ether resins, polycarbonate resins, polyetheretherketone resins, and polyester resins, preferably phenoxy resins and polyvinyl acetal resins. These thermoplastic resins can be used alone or in combination of two or more. The weight average molecular weight of the thermoplastic resin is preferably in the range of 8000 to 200000, and more preferably in the range of 12000 to 100000. The weight average molecular weight in the present invention is measured by gel permeation chromatography (GPC) (polystyrene conversion). Specifically, the weight average molecular weight measured by GPC can be measured using LC-9A/RID-6A manufactured by Shimadzu Corporation (Co., Ltd.) as a measuring device, Shodex K-800P/K-804L/K-804L manufactured by Showa Denko (Co., Ltd.) as a column, chloroform as a mobile phase, etc., at a column temperature of 40°C, and calculated using a calibration line of standard polystyrene.

調配熱可塑性樹脂時,其調配量以熱硬化性環氧樹脂組成物中之不揮發成分作為100質量%時,較好為0.1~10質量%,更好為0.5~5質量%。在該範圍內時,可發揮薄膜成型能或機械強度提高之效果,進而可降低熔融黏度上升或濕式粗化步驟後之絕緣層表面之粗糙度。 When preparing thermoplastic resin, the mixing amount is preferably 0.1~10 mass%, and more preferably 0.5~5 mass%, based on the non-volatile components in the thermosetting epoxy resin composition as 100 mass%. Within this range, the film forming ability or mechanical strength can be improved, thereby reducing the increase in melt viscosity or the roughness of the insulating layer surface after the wet roughening step.

〈環氧樹脂用硬化劑〉 〈Hardening agent for epoxy resin〉

本發明之熱硬化性環氧樹脂組成物亦可進一步使用一般之環氧樹脂用硬化劑。可使用之環氧樹脂用硬化劑之例列舉為TD2090、TD2131[DIC(股),商品名]、MEH-7600、MEH-7851、MEH-8000H[明和化成(股),商品名)、NHN、CBN、GPH-65、GPH-103[日本化藥(股),商品名]、SN170、SN180、SN190、SN475、SN485、SN495、SN375、SN395[新日鐵化學(股),商品名]、LA7052、LA7054、LA3018、LA1356[DIC(股),商品名]等酚系硬化劑、F-a、P-d[四國化成(股),商品名]、HFB2006M[昭和高分子(股),商品名]等之苯并噁嗪系硬化劑、甲基六氫鄰苯二甲酸酐、甲基納迪克酸酐(methylnadic anhydride)、氫化甲基納迪克酸酐等酸酐系硬化劑、PT30、PT60、BA230S75[日本LONZA(股),商品名]等之氰酸酯系硬化劑等。 The thermosetting epoxy resin composition of the present invention may further use a general hardener for epoxy resins. Examples of hardeners for epoxy resins that can be used are TD2090, TD2131 [DIC Co., Ltd., trade name], MEH-7600, MEH-7851, MEH-8000H [Meiwa Kasei Co., Ltd., trade name], NHN, CBN, GPH-65, GPH-103 [Nippon Chemical Co., Ltd., trade name], SN170, SN180, SN190, SN475, SN485, SN495, SN375, SN395 [Nippon Steel Chemical Co., Ltd., trade name], LA7052 , LA7054, LA3018, LA1356 [DIC Co., Ltd., trade name] and other phenolic hardeners, F-a, P-d [Shikoku Kasei Co., Ltd., trade name], HFB2006M [Showa Polymer Co., Ltd., trade name], etc. Benzoxazine-based hardeners, methylhexahydrophthalic anhydride, methylnadic anhydride (methylnadic anhydride), hydrogenated methylnadic anhydride and other anhydride-based hardeners, PT30, PT60, BA230S75 [Japanese LONZA Co., Ltd. ), trade name] and other cyanate ester hardeners.

〈硬化促進劑〉 〈Hardening accelerator〉

本發明之熱硬化性環氧樹脂組成物藉由進一步含有硬 化促進劑,可有效地調整硬化時間及硬化溫度。硬化促進劑列舉為例如TPP、TPP-K、TPP-S、TPTP-S[北興化學工業(股),商品名]等有機膦化合物、Curezol 2MZ、2E4MZ、C11Z、C11Z-CN、C11Z-CNS、C11Z-A、2MZ-OK、2MA-OK、2PHZ[四國化成工業(股),商品名]等咪唑化合物、Novacure[旭化成工業(股),商品名]、Fujicure[富士化成工業(股),商品名]等之胺加成物化合物、1,8-二氮雜雙環[5,4,0]十一碳烯-7,4-二甲胺基吡啶、苄基二甲基胺、2,4,6-參(二甲胺基甲基)酚、4-二甲胺基吡啶等胺化合物、鈷、銅、鋅、鐵、鎳、錳、錫等有機金屬錯合物或有機金屬鹽等。硬化促進劑亦可併用2種以上。調配硬化促進劑時,以環氧樹脂組成物中所含之環氧樹脂之總量作為100質量%(不揮發成分)時,較好在0.05~1質量%之範圍內使用。 The thermosetting epoxy resin composition of the present invention further contains hard Chemical accelerator can effectively adjust the hardening time and hardening temperature. Examples of curing accelerators include organic phosphine compounds such as TPP, TPP-K, TPP-S, TPTP-S [Hokuko Chemical Industry Co., Ltd., trade name], Curezol 2MZ, 2E4MZ, C11Z, C11Z-CN, C11Z-CNS, Imidazole compounds such as C11Z-A, 2MZ-OK, 2MA-OK, 2PHZ [Shikoku Chemical Industry Co., Ltd., trade name], Novacure [Asahi Kasei Industry Co., Ltd., trade name], Fujicure [Fuji Chemical Industry Co., Ltd., Trade name] and other amine adduct compounds, 1,8-diazabicyclo[5,4,0]undecene-7,4-dimethylaminopyridine, benzyldimethylamine, 2, Amine compounds such as 4,6-gins(dimethylaminomethyl)phenol and 4-dimethylaminopyridine, organic metal complexes or organic metal salts such as cobalt, copper, zinc, iron, nickel, manganese, tin, etc. . Two or more types of hardening accelerators may be used in combination. When formulating a hardening accelerator, when the total amount of epoxy resin contained in the epoxy resin composition is taken as 100 mass % (non-volatile components), it is preferably used in the range of 0.05 to 1 mass %.

本發明之熱硬化性環氧樹脂組成物亦可在發揮本發明效果之範圍內,任意含有上述以外之其他各種樹脂添加物。樹脂添加物可列舉為例如矽粉、尼龍粉、氟粉、橡膠粒子等有機填充劑、Orben、Benton等增黏劑、聚矽氧系、氟系、高分子系消泡劑或平流劑、咪唑系、噻唑系、三唑系、矽烷偶合劑等密著性賦予劑、酞菁藍、酞菁綠、碘綠、雙偶氮黃、碳黑等著色劑、氫氧化金屬物、含磷化合物等難燃劑等。 The thermosetting epoxy resin composition of the present invention may also contain various other resin additives other than those mentioned above within the scope of exerting the effect of the present invention. The resin additives may include, for example, organic fillers such as silicon powder, nylon powder, fluorine powder, rubber particles, thickeners such as Orben and Benton, polysilicone, fluorine, polymer defoamers or leveling agents, imidazole, thiazole, triazole, silane coupling agents and other adhesion agents, colorants such as phthalocyanine blue, phthalocyanine green, iodine green, disazo yellow, carbon black, and flame retardants such as metal hydroxides and phosphorus-containing compounds, etc.

本發明之熱硬化性環氧樹脂組成物可適當地混合上述成分,且可視需要以三軸輥、球磨機、珠粒研磨 機、砂磨機等混練手段、或者超級混練機、行星式混練機等攪拌手段混練或混合而調製。且,藉由進一步添加有機溶劑而調製為樹脂漆料。 The thermosetting epoxy resin composition of the present invention can be appropriately mixed with the above ingredients, and optionally ground with a three-axis roller, a ball mill, or beads. It is prepared by kneading or mixing with mixing means such as machines and sand mills, or with mixing means such as super mixers and planetary mixers. Then, an organic solvent is further added to prepare a resin paint.

本發明之熱硬化性環氧樹脂組成物由於介電正切低,可形成與導體層之密著性優異之粗化面,故可較好地使用作為用於藉鍍敷形成導體層之樹脂組成物(藉鍍敷形成導體層之多層印刷配線板之絕緣層用樹脂組成物),且進而較好地作為多層印刷配線板之增層用樹脂組成物。 Since the thermosetting epoxy resin composition of the present invention has a low dielectric tangent and can form a roughened surface with excellent adhesion to the conductor layer, it can be preferably used as a resin composition for forming a conductor layer by plating. (a resin composition for the insulating layer of a multilayer printed wiring board in which a conductor layer is formed by plating), and furthermore, it is preferably used as a resin composition for a build-up layer of a multilayer printed wiring board.

本發明之熱硬化性環氧樹脂組成物為特別適用作為多層印刷配線板之絕緣層形成材料之組成,可使用於阻焊劑、底部填充材、晶粒黏合材、半導體密封材、埋孔樹脂、零件埋入樹脂等之需要樹脂組成物之用途的廣範圍中。且,本發明之樹脂組成物之形態並無特別限制,但可應用於接著薄膜、預浸體等薄片狀層合材料、電路基板(層合板用途、多層印刷配線板用途等)。本發明之樹脂組成物亦可藉漆料狀態塗佈於電路基板上形成絕緣層,但工業上一般係以接著薄膜、預浸體等薄片狀層合材料之形態用於絕緣層形成中。 The thermosetting epoxy resin composition of the present invention is particularly suitable as an insulating layer forming material for multilayer printed wiring boards, and can be used in solder resists, underfill materials, die bonding materials, semiconductor sealing materials, buried hole resins, There are a wide range of applications requiring resin compositions such as parts embedded in resin. Moreover, the form of the resin composition of the present invention is not particularly limited, but it can be applied to sheet-like laminates such as adhesive films and prepregs, and circuit boards (laminated board applications, multilayer printed wiring board applications, etc.). The resin composition of the present invention can also be coated on a circuit substrate in a paint state to form an insulating layer. However, industrially, it is generally used in the form of a thin laminate such as a film or prepreg to form an insulating layer.

〈薄片狀層合材料〉 〈Laminar laminated material〉

(絕緣層形成用接著薄膜) (Adhesive film for insulating layer formation)

本發明之絕緣層形成用接著薄膜之特徵為於支撐薄膜上設置由熱硬化性環氧樹脂組成物所成之樹脂組成物層。 絕緣層形成用接著薄膜可使用本技藝習知之方法,例如使樹脂組成物溶解於有機溶劑中調至樹脂漆料,使用模嘴塗佈器等將該樹脂漆料塗佈於支撐體上,再藉由加熱、或者吹熱風等使有機溶劑乾燥形成樹脂組成物層而製造。 The adhesive film for forming an insulating layer of the present invention is characterized by providing a resin composition layer made of a thermosetting epoxy resin composition on the supporting film. The adhesive film for forming the insulating layer can be formed using a method known in the art. For example, the resin composition is dissolved in an organic solvent to prepare a resin paint, and a die nozzle coater is used to apply the resin paint on the support, and then It is produced by drying the organic solvent by heating or blowing hot air to form a resin composition layer.

有機溶劑可列舉為例如丙酮、甲基乙基酮、環己酮等酮類、乙酸乙酯、乙酸丁酯、溶纖素乙酸酯、丙二醇單甲醚乙酸酯、卡必醇乙酸酯等乙酸酯類,溶纖素、丁基卡必醇等卡必醇類、甲苯、二甲苯等芳香族烴類、二甲基甲醯胺、二甲基乙醯胺、N-甲基吡咯烷酮等醯胺系溶劑等。有機溶劑亦可組合2種以上使用。 Examples of organic solvents include ketones such as acetone, methyl ethyl ketone, and cyclohexanone, ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate, and carbitol acetate. Acetate esters such as cellosolve, carbitols such as butylcarbitol, aromatic hydrocarbons such as toluene and xylene, dimethylformamide, dimethylacetamide, N-methylpyrrolidone, etc. Amide solvents, etc. Organic solvents can also be used in combination of two or more types.

乾燥條件並無特別限制,但較好對樹脂組成物層乾燥至有機溶劑含量為10質量%以下,較好為5質量%以下。漆料中之有機溶劑量亦隨著有機溶劑之沸點而異,例如藉由使含30~60質量%之有機溶劑之漆料在50~150℃乾燥3~10分鐘左右,可形成樹脂組成物層。 The drying conditions are not particularly limited, but the resin composition layer is preferably dried until the organic solvent content is 10 mass% or less, preferably 5 mass% or less. The amount of organic solvent in the paint also varies with the boiling point of the organic solvent. For example, a resin composition can be formed by drying paint containing 30 to 60% by mass of organic solvent at 50 to 150°C for about 3 to 10 minutes. layer.

絕緣層形成用接著薄膜中形成之樹脂組成物層厚度較好為層合體之厚度以上。電路基板所具有之導體層之厚度通常為5~70μm之範圍,故樹脂組成物層較好具有10~100μm之厚度。就薄膜化之觀點而言,更好為15~80μm。 The thickness of the resin composition layer formed in the film for forming the insulating layer is preferably greater than the thickness of the laminate. The thickness of the conductor layer of the circuit substrate is usually in the range of 5 to 70 μm, so the resin composition layer is preferably 10 to 100 μm thick. From the perspective of thin filmization, 15 to 80 μm is more preferred.

作為支撐體之例,可列舉為聚乙烯、聚丙烯、聚氯化乙稀等聚烯烴之薄膜、聚對苯二甲酸乙二酯(以下有時簡稱為「PET」)、聚萘二甲酸乙二酯等聚酯薄膜、聚碳酸酯薄膜、聚醯亞胺薄膜等各種塑膠膜。且亦 可使用脫模紙或銅箔、鋁箔等金屬箔等。其中,就廣用性方面而言,較好為塑膠膜,更好為聚對苯二甲酸乙二酯膜。亦可對支撐體及後述之保護膜施以表面改質(MAD)處理、電暈處理等表面處理。另外,亦可藉聚矽氧樹脂系脫模劑、醇酸樹脂系脫模劑、氟樹脂脫模劑等脫模劑施以脫膜處理。 Examples of the support include films of polyolefins such as polyethylene, polypropylene, and polyvinyl chloride, polyester films such as polyethylene terephthalate (hereinafter sometimes referred to as "PET") and polyethylene naphthalate, polycarbonate films, polyimide films, and the like. Release paper or metal foils such as copper foil and aluminum foil may also be used. Among them, plastic films are preferred in terms of versatility, and polyethylene terephthalate films are more preferred. The support and the protective film described below may also be subjected to surface treatments such as surface modification (MAD) treatment and corona treatment. In addition, the film can also be removed by using a release agent such as a silicone resin release agent, an alkyd resin release agent, or a fluororesin release agent.

支撐體之厚度並無特別限制,較好為10~150μm,更好為25~50μm。 The thickness of the support is not particularly limited, but is preferably 10 to 150 μm, more preferably 25 to 50 μm.

樹脂組成物層之未密著支撐體之面上可進一步根據支撐體層合保護膜。保護膜之厚度並無特別限制,但為例如1~40μm。藉由層合保護膜,可防止污物等對樹脂組成物層表面之附著。 A protective film may be further laminated on the surface of the resin composition layer that is not in close contact with the support body according to the support body. The thickness of the protective film is not particularly limited, but is, for example, 1 to 40 μm. By laminating the protective film, dirt and the like can be prevented from adhering to the surface of the resin composition layer.

具有上述構成之絕緣層形成用接著薄膜亦可捲成輥狀而儲存。 The insulating layer forming adhesive film having the above-mentioned structure can also be rolled into a roll and stored.

(絕緣層形成用預浸體) (Prepreg for insulating layer formation)

本發明之絕緣層形成用預浸體之特徵為將熱硬化性環氧樹脂組成物含浸在薄片狀纖維基材中。亦即,可藉由利用熱熔融法或溶劑法將本發明之熱硬化性環氧樹脂組成物含浸於薄片狀補強基材中,經加熱並半硬化而製造。薄片狀補強基材可使用例如玻璃布或芳醯胺纖維等常用之纖維所成之預浸體用纖維。而且本發明之絕緣層形成用預浸體較好為設置於支撐體上之構成。 The prepreg for forming an insulating layer of the present invention is characterized by impregnating a sheet-like fiber base material with a thermosetting epoxy resin composition. That is, it can be produced by impregnating a sheet-shaped reinforcing base material with the thermosetting epoxy resin composition of the present invention using a thermal melting method or a solvent method, and then heating and semi-hardening the composition. As the sheet-like reinforcing base material, prepreg fibers made of commonly used fibers such as glass cloth or aramid fiber can be used. Furthermore, the prepreg for forming an insulating layer of the present invention is preferably provided on a support.

熱熔融法係不使樹脂組成物溶解於有機溶劑 中,而暫時塗覆於支撐體上,且將其層合於薄片狀補強基材上,或者以模嘴塗佈器將樹脂組成物直接塗佈於薄片狀補強基材上,製造預浸體之方法。且溶劑法與上述絕緣層形成用接著薄膜之製造方法相同,係使樹脂溶解於有機溶劑中調製樹脂漆料,且將薄片狀補強基材浸漬於該漆料中,使樹脂漆料含浸於薄片狀補強基材中,隨後乾燥之方法。另外,本發明之絕緣層形成用預浸體亦可自薄片狀補強基材之兩面以加熱、加壓條件下連續熱層合絕緣層形成用接著薄膜而調製。亦可與上述絕緣層形成用接著薄膜同樣地使用支撐體或保護膜。 The hot melt method is a method of manufacturing a prepreg by temporarily coating the resin composition on a support without dissolving it in an organic solvent, and then laminating it on a thin sheet-like reinforcing substrate, or directly coating the resin composition on a thin sheet-like reinforcing substrate with a die-mouth coater. The solvent method is the same as the method of manufacturing the bonding film for forming the insulating layer, which is to dissolve the resin in an organic solvent to prepare a resin varnish, immerse the thin sheet-like reinforcing substrate in the varnish, impregnate the resin varnish in the thin sheet-like reinforcing substrate, and then dry it. In addition, the prepreg for forming the insulating layer of the present invention can also be prepared by continuously heat-laminating the insulating layer forming adhesive film from both sides of the sheet-like reinforcing substrate under heating and pressure conditions. A support body or a protective film can also be used in the same manner as the above-mentioned insulating layer forming adhesive film.

如上述,由前述絕緣層形成用接著薄膜之樹脂組成物層之硬化物所成之印刷配線板用絕緣體及由前述絕緣層形成用預浸體之硬化物所成之印刷配線板用絕緣體適合作為多層印刷配線板用之絕緣層。另外,更宜在由該印刷配線板用絕緣體所成之絕緣層上設置經圖型加工之導體層(電路)。又,較好為層合複數個設有該導體層(電路)之印刷配線板用絕緣體而成之多層印刷配線板。 As described above, the insulator for printed wiring boards formed by the cured product of the resin composition layer of the aforementioned insulating layer-forming film and the insulator for printed wiring boards formed by the cured product of the aforementioned insulating layer-forming prepreg are suitable as insulating layers for multi-layer printed wiring boards. In addition, it is more preferable to provide a patterned conductor layer (circuit) on the insulating layer formed by the insulator for printed wiring boards. Moreover, it is preferable to provide a multi-layer printed wiring board formed by laminating a plurality of insulators for printed wiring boards provided with the conductor layer (circuit).

〈使用薄片狀層合材料之多層印刷配線板〉 〈Multilayer printed wiring board using sheet laminate material〉

接著,說明使用如上述製造之薄片狀層合材料製造多層印刷配線板之方法之一例。 Next, an example of a method of manufacturing a multilayer printed wiring board using the sheet-like laminated material manufactured as described above will be described.

首先,使用真空層合機將薄片狀層合材料層合(laminate)於電路基板之單面或兩面上。電路基板所用之基板列舉為例如玻璃環氧基板、金屬基板、聚酯基 板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚苯醚基板等。又,此處所謂電路基板係指於如上述之基板之單面或兩面上形成經圖型加工之導體層(電路)者。且交互層合導體層與絕緣層而成之多層印刷配線板中,該多層印刷配線板之最外層之單面或兩面為經圖型加工而成之導體層(電路)者亦包含於此處所稱之電路基板中。又導體層表面亦可藉由黑化處理、銅蝕刻等施以預先粗化處理。 First, a thin sheet of laminating material is laminated on one or both sides of a circuit substrate using a vacuum laminator. Examples of substrates used for circuit substrates include glass epoxy substrates, metal substrates, polyester substrates, polyimide substrates, BT resin substrates, and thermosetting polyphenylene ether substrates. In addition, the circuit substrate referred to herein refers to a substrate on which a patterned conductor layer (circuit) is formed on one or both sides of the substrate as described above. In addition, a multi-layer printed wiring board formed by alternately laminating conductor layers and insulating layers, where one or both sides of the outermost layer of the multi-layer printed wiring board are patterned conductor layers (circuits) are also included in the circuit substrate referred to herein. The surface of the conductor layer can also be roughened in advance by blackening treatment, copper etching, etc.

上述層合中,薄片狀層合材料具有保護薄膜時,去除該保護薄膜後,可視需要預加熱薄片狀層合材料及電路基板,邊加壓及加熱薄片狀層合材料邊層合於電路基板上。本發明之薄片狀層合材料中,較好利用真空層合法在減壓下層合於電路基板上之方法。層合條件並無特別限制,但較好在例如壓著溫度(層合溫度)較好設為70~140℃,壓著壓力(層合壓力)較好設為1~11kgf/cm2(9.8×104~107.9×104N/m2),壓著時間(層合時間)較好設為5~180秒,空氣壓設為20mmHg(26.7hPa)以下之減壓條件下進行層合。又,層合方法可為批式亦可為使用輥之連續式。真空層合可使用市售之真空層合機進行。市售之真空層合機可列舉為例如Nichigo Morton(股)製造之真空塗佈機、名機製作所(股)製造之真空加壓式層合機、日立工業(股)製造之滾筒式乾式塗佈機、日立AIC(股)製造之真空層合機等。 In the above-mentioned lamination, if the sheet-like laminate material has a protective film, after removing the protective film, the sheet-like laminate material and the circuit substrate may be preheated as necessary, and the sheet-like laminate material may be laminated to the circuit substrate while being pressed and heated. superior. Among the sheet-like laminated materials of the present invention, it is preferable to laminate them on a circuit substrate under reduced pressure using a vacuum lamination method. Lamination conditions are not particularly limited, but for example, the pressing temperature (lamination temperature) is preferably 70 to 140°C, and the pressing pressure (lamination pressure) is preferably 1 to 11 kgf/cm 2 (9.8 ×10 4 ~107.9 × 10 4 N/m 2 ), the pressing time (laminating time) is preferably set to 5 to 180 seconds, and the air pressure is set to 20mmHg (26.7hPa) or less for lamination under reduced pressure conditions. In addition, the lamination method may be a batch type or a continuous type using a roller. Vacuum lamination can be performed using a commercially available vacuum laminator. Commercially available vacuum laminators include, for example, a vacuum coater manufactured by Nichigo Morton Co., Ltd., a vacuum pressurized laminator manufactured by Meiki Seisakusho Co., Ltd., and a drum dry coater manufactured by Hitachi Kogyo Co., Ltd. Fabric machines, vacuum laminators manufactured by Hitachi AIC Co., Ltd., etc.

將薄片狀層合材料層合於電路基板上後,於冷卻至室溫附近後,剝離支撐體時可藉由剝離、使樹脂組 成物熱硬化形成硬化物,而於電路基板上形成絕緣層。熱硬化之條件只要依據樹脂組成物中之樹脂成分種類、含量等適當選擇即可,但較好在150℃~220℃下20分鐘~180分鐘,更好在160℃~210℃下30分鐘~120分鐘之範圍內選擇。形成絕緣層後,於硬化前未剝離支撐體時,亦可視需要在此時進行剝離。 After laminating the sheet-like laminate material on the circuit substrate, after cooling to near room temperature, the support body can be peeled off to form a hardened material by thermally curing the resin composition, thereby forming an insulating layer on the circuit substrate. The thermal curing conditions can be appropriately selected according to the type and content of the resin components in the resin composition, but it is preferably selected within the range of 20 minutes to 180 minutes at 150℃~220℃, and more preferably 30 minutes to 120 minutes at 160℃~210℃. After the insulating layer is formed, if the support body is not peeled off before curing, it can also be peeled off at this time as needed.

另外,亦可使用真空加壓機將薄片狀層合材料層合於電路基板之單面或兩面上。在減壓下進行加熱及加壓之層合步驟可使用一般真空熱壓機進行。例如,可藉由自支撐體層側加壓經加熱之SUS板等金屬板而進行。加壓條件係設為減壓度通常為1×10-2MPa以下,較好為1×10-3MPa以下之減壓條件。加熱及加壓亦可藉1階段進行,但就控制樹脂滲出之觀點而言以分成2階段以上之條件進行較佳。例如,較好以第一階段之加壓係將溫度設為70~150℃,壓力設為1~15kgf/cm2之範圍,第2階段之加壓係將溫度為150~200℃,壓力設為1~40kgf/cm2之範圍下進行。各階段之時間較好進行30~120分鐘。藉由使該樹脂組成物層熱硬化而可於電路基板上形成絕緣層。市售之真空熱加壓機列舉為例如MNPC-V-750-5-200(名機製作所(股)製造)、VH1-1603(北川精機(股)製造)等。 In addition, a vacuum press can be used to laminate the sheet-like laminate material on one or both sides of the circuit board. The lamination step of heating and pressurizing under reduced pressure can be performed using a general vacuum hot press. For example, it can be performed by pressurizing a heated metal plate such as a SUS plate from the support layer side. The pressurizing condition is set to a reduced pressure condition of usually 1× 10-2 MPa or less, preferably 1× 10-3 MPa or less. Heating and pressurizing can also be performed in one stage, but from the perspective of controlling resin seepage, it is better to perform it in two or more stages. For example, it is preferred that the first stage of pressurization is performed at a temperature of 70 to 150°C and a pressure of 1 to 15 kgf/ cm2 , and the second stage of pressurization is performed at a temperature of 150 to 200°C and a pressure of 1 to 40 kgf/ cm2 . Each stage is preferably performed for 30 to 120 minutes. By thermally curing the resin composition layer, an insulating layer can be formed on the circuit board. Examples of commercially available vacuum heat presses include MNPC-V-750-5-200 (manufactured by Meiki Seisakusho Co., Ltd.) and VH1-1603 (manufactured by Kitagawa Seiki Co., Ltd.).

絕緣層之介電正切較好為0.009以下,更好為0.006以下。介電正切愈低愈好,尤其雖無下限值,但設為0.001以上、0.003以上等。 The dielectric tangent of the insulating layer is preferably less than 0.009, and more preferably less than 0.006. The lower the dielectric tangent, the better. Although there is no lower limit, it is set to be greater than 0.001, greater than 0.003, etc.

接著,對電路基板上形成之絕緣層進行開孔加工形成通孔、貫穿孔。穿孔加工可藉由例如鑽孔機、雷射、電漿等習知方法,且視需要組合該等之方法進行,但最常用之方法為利用二氧化碳雷射、YAG雷射等雷射進行穿孔加工。穿孔加工前未剝離支撐體時則在此時剝離。 Then, the insulating layer formed on the circuit substrate is drilled to form through holes and through holes. Perforation processing can be carried out by conventional methods such as drilling machines, lasers, plasmas, etc., and these methods can be combined as needed. However, the most commonly used method is to use lasers such as carbon dioxide laser and YAG laser for perforation processing. . If the support is not peeled off before the perforation process, it will be peeled off at this time.

接著,對絕緣層表面進行粗化處理。乾式粗化處理時列舉為電漿處理等,濕式粗化處理時列舉為依序進行以膨潤液之膨潤處理、以氧化劑之粗化處理及以中和液之中和處理的方法。濕式粗化處理者,就可邊於絕緣層表面形成凹凸之錨定物(anchor),邊去除貫穿孔內之膠渣(smear)方面係較佳。利用膨潤液之膨潤處理係藉由使絕緣層在50~80℃浸漬於膨潤液中5~20分鐘(較好在55~70℃下8~15分鐘)進行。膨潤液之例列舉為鹼溶液、界面活性劑溶液等,較好為鹼溶液,該鹼溶液列舉為例如氫氧化鈉溶液、氫氧化鉀溶液等。市售之膨潤劑可列舉出例如日本ATOTECH(股)製造之Swelling Dip Securiganth P、Swelling Dip Securiganth SBU等。利用氧化劑之粗化處理係使絕緣層在60~80℃下浸漬於氧化劑溶液中10~30分鐘(較好在70~80℃下15~25分鐘)而進行。至於氧化劑可列舉出例如使過錳酸鉀或過錳酸鈉溶解於氫氧化鈉之水溶液中之鹼性過錳酸溶液、重鉻酸鹽、臭氧、過氧化氫/硫酸、硝酸等。且,鹼性過錳酸溶液中之過錳酸鹽濃度較好為5~10重量%。市售之氧化劑列舉為例如日本ATOTECH(股)製造之Concentrate.Compact CP、Dozing Solution Securiganth P等鹼性過錳酸溶液。利用中和液之中和處理係在30~50℃浸漬於中和液中3~10分鐘(較好於35~45℃下3~8分鐘)而進行。至於中和液較好為酸性水溶液,市售品列舉為例如日本ATOTECH(股)製造之Reduction Solution Securiganth P。 Next, the surface of the insulating layer is roughened. The dry roughening treatment is a plasma treatment, etc. The wet roughening treatment is a method of sequentially performing swelling treatment with a swelling liquid, roughening treatment with an oxidizing agent, and neutralization treatment with a neutralizing liquid. Wet roughening treatment is better in that it can form concave and convex anchors on the surface of the insulation layer and remove smear in the through holes. The swelling treatment using the swelling liquid is performed by immersing the insulating layer in the swelling liquid at 50 to 80°C for 5 to 20 minutes (preferably at 55 to 70°C for 8 to 15 minutes). Examples of the swelling solution include an alkaline solution, a surfactant solution, and the like, and an alkaline solution is preferred. Examples of the alkaline solution include a sodium hydroxide solution, a potassium hydroxide solution, and the like. Commercially available swelling agents include, for example, Swelling Dip Securiganth P and Swelling Dip Securiganth SBU manufactured by Japan ATOTECH Co., Ltd. The roughening treatment using an oxidizing agent is performed by immersing the insulating layer in an oxidizing agent solution at 60 to 80° C. for 10 to 30 minutes (preferably at 70 to 80° C. for 15 to 25 minutes). Examples of the oxidizing agent include an alkaline permanganic acid solution in which potassium permanganate or sodium permanganate is dissolved in an aqueous solution of sodium hydroxide, dichromate, ozone, hydrogen peroxide/sulfuric acid, nitric acid, and the like. Moreover, the permanganate concentration in the alkaline permanganic acid solution is preferably 5 to 10% by weight. Commercially available oxidizing agents include, for example, Concentrate. manufactured by Japan ATOTECH Co., Ltd. Compact CP, Dozing Solution Securiganth P and other alkaline permanganic acid solutions. The neutralization treatment using the neutralizing liquid is performed by immersing in the neutralizing liquid at 30 to 50°C for 3 to 10 minutes (preferably 3 to 8 minutes at 35 to 45°C). The neutralizing solution is preferably an acidic aqueous solution, and commercially available products include, for example, Reduction Solution Securiganth P manufactured by Japan ATOTECH Co., Ltd.

絕緣層表面經粗化處理之粗化面的粗糙度,就形成微細配線之觀點而言,Ra值較好為200nm以下,更好為150nm以下,又更好為100nm以下。且為確保粗化面之錨定效果較好為10nm以上。又,所謂Ra值係表示表面粗糙度之數值的一種,且係稱為算術平均粗糙度者,具體而言係在測定區域內測定距平均線的表面之變化高度的絕對值並予以算術平均者。例如,可使用Veeco Instruments公司製造之WYKONT 3300,利用VSI接觸模式,以50倍透鏡,測定範圍為121μm×92μm所得之數值求出。 From the viewpoint of forming fine wiring, the roughness of the roughened surface of the insulating layer surface is preferably 200 nm or less, more preferably 150 nm or less, and still more preferably 100 nm or less. And to ensure the anchoring effect of the roughened surface, it is better to have a thickness of 10nm or more. In addition, the so-called Ra value is a type of numerical value indicating surface roughness, and is called arithmetic mean roughness. Specifically, the absolute value of the change height of the surface from the average line is measured in the measurement area and the arithmetic average is obtained. . For example, WYKONT 3300 manufactured by Veeco Instruments can be used to determine the value using the VSI contact mode with a 50x lens and a measurement range of 121 μm × 92 μm.

另外,均方根粗糙度(Rq值)由於係反映絕緣層表面之局部狀態,故發現可藉由Rq值之掌握確認成為緻密且平滑之絕緣層表面,使剝離強度穩定化。為了成為緻密且平滑之絕緣層表面,Rq值較好為250nm以下,更好為200nm以下,又更好為150nm以下,再更好為100nm以下。另就使剝離強度穩定化之觀點而言,較好為15nm以上,更好為30nm以上。又,所謂Rq值係表示表面粗糙度之數值的一種,係稱為均方根粗糙度者,具體而言係以在測定區域內測定距平均線的表面之變化高度的絕 對值並作為均方根予以表示者。 In addition, since the root mean square roughness (Rq value) reflects the local state of the insulating layer surface, it is found that the peel strength can be stabilized by grasping the Rq value to confirm that the insulating layer surface is dense and smooth. In order to make the insulating layer surface dense and smooth, the Rq value is preferably 250nm or less, more preferably 200nm or less, more preferably 150nm or less, and even more preferably 100nm or less. From the perspective of stabilizing the peel strength, it is preferably 15nm or more, and more preferably 30nm or more. The so-called Rq value is a kind of numerical value that indicates surface roughness, which is called root mean square roughness. Specifically, it is the absolute value of the height variation of the surface from the average line measured in the measurement area and expressed as the root mean square.

接著,藉由乾式鍍敷或濕式鍍敷在絕緣層上形成導體層。乾式鍍敷可使用蒸鍍、濺鍍、離子電鍍等習知方法。濕式鍍敷舉例有組合無電解鍍敷與電解鍍敷形成導體層之方法、形成與導體層相反圖型之鍍敷阻劑,且僅以無電解鍍敷形成導體層之方法等。至於隨後之圖型形成方法可使用例如本技藝者習知之減去(subtractive)法、半添加法等,且可藉由重複複數次之上述一連串步驟,多段地層合增層而製造多層印刷配線板。 Next, a conductive layer is formed on the insulating layer by dry plating or wet plating. Dry plating can use known methods such as evaporation, sputtering, and ion plating. Examples of wet plating include a method of forming a conductive layer by combining electroless plating and electrolytic plating, a method of forming a plating resist with a pattern opposite to that of the conductive layer, and a method of forming a conductive layer only by electroless plating. As for the subsequent pattern formation method, for example, a subtractive method or a semi-additive method known to the artisan can be used, and a multi-layer printed wiring board can be manufactured by repeating the above series of steps several times and layering in multiple stages.

絕緣層與導體層之剝離強度為了使絕緣層與導體層充分密著,較好為0.35kgf/cm以上,更好為0.4kgf/cm以上。剝離強度之上限值越高越好,雖未特別限制,但一般為1.5kgf/cm以下、1.2kgf/cm以下、1.0kgf/cm以下、0.8kgf/cm以下等。本發明之印刷配線板用絕緣體之絕緣層由於粗糙度低,絕緣層與導體層之剝離強度高,故可較好地使用作為多層印刷配線板之增層。 In order to make the insulating layer and the conductive layer fully adhered, the peel strength of the insulating layer and the conductive layer is preferably above 0.35kgf/cm, and more preferably above 0.4kgf/cm. The upper limit of the peel strength is as high as possible, and although there is no special restriction, it is generally below 1.5kgf/cm, below 1.2kgf/cm, below 1.0kgf/cm, below 0.8kgf/cm, etc. The insulating layer of the insulator for the printed wiring board of the present invention has low roughness and high peel strength between the insulating layer and the conductive layer, so it can be used as a multi-layer printed wiring board.

〈半導體裝置〉 〈Semiconductor devices〉

藉由使用本發明之多層印刷配線板可製造半導體裝置。亦即,本發明之半導體裝置包含本發明之多層印刷配線板。可藉由在本發明之多層印刷配線板之導通部位,安裝半導體晶片而製造半導體裝置。所謂「導通部位」係「多層印刷配線板中傳導電訊號之部位」,其位置可為表面,亦可為經埋入之位置均可。且,半導體晶片若為以半 導體為材料之電性電路元件則無特別限制。 Semiconductor devices can be manufactured by using the multilayer printed wiring board of the present invention. That is, the semiconductor device of the present invention includes the multilayer printed wiring board of the present invention. A semiconductor device can be manufactured by mounting a semiconductor chip on the conductive portion of the multilayer printed wiring board of the present invention. The so-called "conducting part" refers to "the part in the multilayer printed wiring board that conducts electrical signals." Its location can be on the surface or in a buried location. Moreover, if the semiconductor wafer is half There are no special restrictions on electrical circuit components whose conductors are made of materials.

製造本發明之半導體裝置時之半導體晶片之安裝方法若為使半導體晶片有效發揮功能,則無特別限制,具體列舉為金屬線黏合安裝方法、覆晶安裝方法、利用作成突塊之增層(BBUL)之安裝方法、利用異向性導電膜(ACF)之安裝方法、利用非導電性膜(NCF)之安裝方法等。 The semiconductor chip mounting method when manufacturing the semiconductor device of the present invention is not particularly limited as long as it enables the semiconductor chip to effectively function. Specific examples include metal wire bonding mounting method, flip chip mounting method, mounting method using bump build-up layer (BBUL), mounting method using anisotropic conductive film (ACF), mounting method using non-conductive film (NCF), etc.

[實施例] [Example]

以下使用實施例及比較例更詳細說明本發明,但本發明並不因該等實施例等而受到限制。又,以下之記載中,「份」及「%」意指「質量份」及「質量%」。 The present invention will be described in more detail below using examples and comparative examples, but the present invention is not limited by these examples and the like. In the following description, "parts" and "%" mean "parts by mass" and "% by mass".

測定方法.評價方法 Measurement method. Evaluation method

〈層合體之剝離強度(peel strength)之測定、算術平均粗糙鍍(Ra)、均方根粗糙度(Rq)之測定〉 〈Measurement of peel strength (peel strength), arithmetic average roughness (Ra), and root mean square roughness (Rq) of the laminate〉

(1)層合板之底層處理 (1) Treatment of the bottom layer of the laminate

將形成有內層電路之玻璃布基材環氧樹脂兩面貼銅層合板(銅箔厚度18μm,殘銅率60%,基板厚0.3mm,松下電工(股)製之R5715ES)之兩面浸漬於Merck(股)製造之CZ8100中,進行銅箔表面之粗化處理。 The glass cloth base material epoxy resin with the inner circuit formed on both sides of the copper-laminated laminate (copper foil thickness 18 μm, residual copper rate 60%, substrate thickness 0.3mm, R5715ES manufactured by Panasonic Electric Co., Ltd.) was immersed in Merck on both sides In CZ8100 manufactured by Co., Ltd., the copper foil surface is roughened.

(2)接著薄膜之層合 (2)Lamination of subsequent films

使用批式真空加壓層合機MVLP-500[名機製作所(股)製,商品名],將下述各實施例及各比較例中作成之接著薄膜層合於上述層合板之兩面。層合係藉由在30秒減壓使氣壓成為13hPa以下,隨後之30秒以100℃、壓力0.74MPa壓著而進行。 The adhesive films prepared in each of the following Examples and Comparative Examples were laminated on both sides of the above-mentioned laminate using a batch-type vacuum pressure laminator MVLP-500 [trade name manufactured by Meiki Seisakusho Co., Ltd.]. Lamination was performed by reducing the pressure to 13 hPa or less for 30 seconds, and then pressing at 100° C. and a pressure of 0.74 MPa for 30 seconds.

(3)樹脂組成物之硬化 (3) Hardening of resin composition

自經層合之接著薄膜剝離PET膜,以170℃、30分鐘之硬化條件使樹脂組成物硬化作成絕緣層。 The PET film is peeled off from the laminated adhesive film, and the resin composition is cured at 170°C for 30 minutes to form an insulating layer.

(4)粗化處理 (4) Roughening treatment

將形成有絕緣層之上述層合板在60℃下浸漬於膨潤液的日本ATOTECH(股)之含有二乙二醇單丁醚之Swelling Dip Securiganth P中10分鐘,接著於80℃浸漬於作為粗化液之日本ATOTECH(股)製造之Concentrate.Compact P(KMnO4:60g/L,NaOH:40g/L之水溶液)中20分鐘,最後在40℃下浸漬於作為中和液之日本ATOTECH(股)製之Reduction Solution Securiganth P中5分鐘。將該粗化處理後之層合板作為樣品A。 The above laminate with the insulating layer formed thereon was immersed in Swelling Dip Securiganth P containing diethylene glycol monobutyl ether of Japan ATOTECH Co., Ltd. as a swelling liquid at 60°C for 10 minutes, and then immersed in roughening solution at 80°C. Concentrate. Liquid manufactured by Japan ATOTECH Co., Ltd. Compact P (KMnO 4 : 60 g/L, NaOH: 40 g/L aqueous solution) for 20 minutes, and finally immersed in Reduction Solution Securiganth P manufactured by Japan ATOTECH Co., Ltd. as a neutralizing solution at 40° C. for 5 minutes. The laminate after roughening treatment was used as sample A.

(5)利用半添加工法之導體層形成 (5) Conductor layer formation using semi-additive process

為了在絕緣層表面上形成電路,而將樣品A之層合板浸漬於含PdCl2之無電解鍍敷用溶液中,接著浸漬於無電解銅鍍敷液中。在150℃加熱30分鐘進行退火後,形成蝕 刻阻劑圖型,且藉由蝕刻形成圖型後,進行硫酸銅電解鍍敷,以30μm厚形成導體層。接著,在180℃進行退火處理60分鐘。將該層合板作為樣品B。 In order to form a circuit on the surface of the insulating layer, the laminate of sample A was immersed in an electroless plating solution containing PdCl 2 and then immersed in an electroless copper plating solution. After heating at 150° C. for 30 minutes and annealing, an etching resist pattern was formed. After the pattern was formed by etching, copper sulfate electrolytic plating was performed to form a conductor layer with a thickness of 30 μm. Next, annealing treatment was performed at 180° C. for 60 minutes. This laminate was designated as sample B.

(6)算術平均粗糙度(Ra值)、均方根粗糙度(Rq值)之測定 (6) Determination of arithmetic mean roughness (Ra value) and root mean square roughness (Rq value)

針對樣品A,由使用非接觸型表面粗糙度計(Veeco Instruments公司製之WYKONT3300),藉由VSI接觸模式,以50倍透鏡,測定範圍設為121μm×92μm所得之數值求出Ra、Rq值。接著,將藉由求出各10點之平均值而得之數值作為測定值。 For sample A, the Ra and Rq values were calculated using a non-contact surface roughness meter (WYKONT3300 manufactured by Veeco Instruments) in VSI contact mode with a 50x lens and a measurement range of 121 μm × 92 μm. Next, the numerical value obtained by calculating the average value of 10 points was used as the measured value.

(7)導體層之剝離強度(peel strength)之測定 (7) Determination of the peel strength of the conductor layer

對樣品B之導體層之一部分作成圍出寬10mm、長100mm之範圍之切口,以剝離治具(TSI股份有限公司,AUTOCOM型試驗機AC-50C-SL)夾住短條狀導體層之一端,在室溫下,測定以50mm/分鐘之速度朝垂直方向剝離35mm時之荷重(kgf/cm)。 An incision was made on part of the conductor layer of sample B to enclose a range of 10 mm in width and 100 mm in length, and one end of the short strip conductor layer was clamped with a peeling jig (TSI Co., Ltd., AUTOCOM type testing machine AC-50C-SL) , at room temperature, measure the load (kgf/cm) when peeling 35mm in the vertical direction at a speed of 50mm/min.

〈介電正切之測定〉 〈Measurement of dielectric tangent〉

使下述各實施例及各比較例所得之接著薄膜在190℃熱硬化90分鐘,剝離PET膜獲得薄片狀之硬化物。將該硬化物切斷成寬2mm、長80mm之試驗片,使用關東應用電子開發(股)製之空洞共振器攝動法介電率測定裝置 CP521及Agilent Technology(股)製之網路分析儀(network analyzer)E8362B,以空洞共振法,以測定頻率5.8GHz進行介電正切(tanδ)之測定。針對2片試驗片進行測定,算出平均值。 The adhesive films obtained in each of the following Examples and Comparative Examples were thermally cured at 190° C. for 90 minutes, and the PET film was peeled off to obtain a sheet-like cured product. The hardened material was cut into a test piece with a width of 2 mm and a length of 80 mm, and a cavity resonator perturbation method dielectric measuring device manufactured by Kanto Applied Electronics Development Co., Ltd. CP521 and network analyzer E8362B manufactured by Agilent Technology Co., Ltd. used the cavity resonance method to measure the dielectric tangent (tanδ) at a measuring frequency of 5.8GHz. Measurement was performed on two test pieces, and the average value was calculated.

實施例1 Implementation Example 1

邊在甲基乙基酮(以下簡稱為「MEK」)15份、環己銅15份中攪拌液狀雙酚A型環氧樹脂(環氧當量180,三菱化學(股)製之「828US」)15份、聯苯型環氧樹脂(環氧當量291,日本化藥(股)製之「NC3000H」)15份,邊加熱溶解。隨後,混合萘型活性酯化合物[DIC(股)製之「EXB9411-65BK」,活性酯當量272,固體成分65%之甲苯溶液]43份、硬化促進劑[廣榮化學工業(股)製,「4-二甲胺基吡啶」]0.15份、球形二氧化矽[平均粒徑0.5μm,經苯基胺基矽烷處理之「SO-C2」,ADMATECHS(股)製,每單位質量之碳量0.18%]100份、苯氧樹脂(YL6954BH30,固體成分30質量%之MEK溶液,重量平均分子量40000)15份,以高速旋轉混練機均勻分散,製作樹脂漆料。接著,以使乾燥後之樹脂厚度成為40μm之方式以模嘴塗佈器將該樹脂漆料塗佈於聚對苯二甲酸乙二酯(厚度38μm,以下簡稱為「PET」)薄膜上,在80~120℃(平均100℃)乾燥6分鐘,獲得薄片狀之接著薄膜。 While stirring 15 parts of methyl ethyl ketone (hereinafter referred to as "MEK") and 15 parts of copper cyclohexane, liquid bisphenol A-type epoxy resin (epoxy equivalent: 180, "828US" manufactured by Mitsubishi Chemical Co., Ltd. ) and 15 parts of biphenyl-type epoxy resin (epoxy equivalent 291, "NC3000H" manufactured by Nippon Kayaku Co., Ltd.), while heating to dissolve. Then, 43 parts of a naphthalene-type active ester compound ["EXB9411-65BK" manufactured by DIC Co., Ltd., active ester equivalent 272, solid content 65% toluene solution] and a hardening accelerator [manufactured by Kwangyoung Chemical Industry Co., Ltd. "4-dimethylaminopyridine"] 0.15 parts, spherical silica [average particle size 0.5 μm, "SO-C2" treated with phenylamine silane, manufactured by ADMATECHS Co., Ltd., amount of carbon per unit mass 0.18%] 100 parts of phenoxy resin (YL6954BH30, MEK solution with solid content of 30% by mass, weight average molecular weight 40000), 15 parts are evenly dispersed with a high-speed rotating kneader to make resin paint. Next, the resin varnish was applied to a polyethylene terephthalate (thickness 38 μm, hereinafter referred to as "PET") film using a die nozzle coater so that the dried resin thickness became 40 μm. Dry at 80~120℃ (average 100℃) for 6 minutes to obtain a flaky adhesive film.

實施例2 Example 2

除了將實施例1之萘型活性酯化合物[DIC(股)製之「EXB9411-65BK」,活性酯當量272,固體成分65%之甲苯溶液]43份變更為80份以外,餘與實施例1完全相同,製作樹脂漆料。接著與實施例1同樣獲得接著薄膜。 The rest are the same as Example 1 except that 43 parts of the naphthalene-type active ester compound ["EXB9411-65BK" manufactured by DIC Co., Ltd., active ester equivalent: 272, solid content 65% toluene solution] in Example 1 was changed to 80 parts. Exactly the same, making resin paint. Then, an adhesive film was obtained in the same manner as in Example 1.

實施例3 Example 3

除了將實施例1之萘型活性酯化合物[DIC(股)製之「EXB9411-65BK」,活性酯當量272,固體成分65%之甲苯溶液]43份變更為20份以外,餘與實施例1完全相同,製作樹脂漆料。接著與實施例1同樣獲得接著薄膜。 The rest were the same as in Example 1, except that 43 parts of the naphthalene-type active ester compound ["EXB9411-65BK" manufactured by DIC Co., Ltd., active ester equivalent: 272, solid content 65% toluene solution] was changed to 20 parts. Exactly the same, making resin paint. Then, an adhesive film was obtained in the same manner as in Example 1.

實施例4 Example 4

除了將實施例1之聯苯型環氧樹脂[環氧當量291,日本化藥(股)製之「NC3000H」]15份變更為萘酚型環氧樹脂[環氧當量332,新日鐵化學(股)製之「ESN475V」]15份,且添加氰酸酯樹脂(LONZA公司製「BA230S75」,固體成分75%之甲基乙基酮溶液)15份與硬化觸媒[環烷酸鋅礦油精溶液(金屬含量8%)之3%環己酮稀釋液]0.03份以外,餘與實施例3完全相同,製作樹脂漆料。接著與實施例1同樣獲得接著薄膜。 The resin varnish was prepared in exactly the same manner as in Example 3, except that 15 parts of the biphenyl epoxy resin [epoxy equivalent 291, "NC3000H" manufactured by Nippon Kayaku Co., Ltd.] in Example 1 was replaced with 15 parts of naphthol epoxy resin [epoxy equivalent 332, "ESN475V" manufactured by Nippon Steel Chemical Co., Ltd.], and 15 parts of cyanate resin ("BA230S75" manufactured by LONZA, 75% solid content methyl ethyl ketone solution) and 0.03 parts of a curing catalyst [3% cyclohexanone dilution of zinc cycloalkanoate mineral oil solution (metal content 8%)] were added. Then, a bonding film was obtained in the same manner as in Example 1.

比較例1 Comparative example 1

除了將實施例1之萘型活性酯化合物[DIC(股)製之 「EXB9411-65BK」,活性酯當量272,固體成分65%之甲苯溶液]43份變更為活性酯化合物[DIC(股)製之「HPC8000-65T」,活性酯當量223,固體成分65%之甲苯溶液]35份,且將球形二氧化矽[平均粒徑0.5μm,經苯基胺基矽烷處理之「SO-C2」,ADMATECHS(股)製,每單位質量之碳量0.18%]100份變更為90份,將硬化促進劑[廣榮化學工業(股)製,「4-二甲胺基吡啶」]0.15份變更為0.1份以外,餘與實施例1完全相同,製作樹脂漆料。接著與實施例1同樣獲得接著薄膜。 The resin paint was prepared in exactly the same manner as in Example 1 except that 43 parts of the naphthalene-type active ester compound [DIC (Co., Ltd.) "EXB9411-65BK", active ester equivalent 272, 65% solid content toluene solution] was replaced with 35 parts of the active ester compound [DIC (Co., Ltd.) "HPC8000-65T", active ester equivalent 223, 65% solid content toluene solution], 100 parts of spherical silica [average particle size 0.5μm, phenylaminosilane treated "SO-C2", ADMATECHS (Co., Ltd.), carbon content per unit mass 0.18%] was changed to 90 parts, and 0.15 parts of the curing accelerator [Guangrong Chemical Industry (Co., Ltd.) "4-dimethylaminopyridine"] was changed to 0.1 parts. Then, the film is obtained in the same manner as in Example 1.

比較例2 Comparison Example 2

除了將實施例1之萘型活性酯化合物[DIC(股)製之「EXB9411-65BK」,活性酯當量272,固體成分65%之甲苯溶液]43份變更為95份以外,餘與實施例1完全相同,製作樹脂漆料。接著與實施例1同樣獲得接著薄膜。 The remaining contents of Example 1 were the same as in Example 1, except that 43 parts of the naphthalene-type active ester compound ["EXB9411-65BK" manufactured by DIC Co., Ltd., active ester equivalent: 272, solid content 65% toluene solution] was changed to 95 parts. Exactly the same, making resin paint. Then, an adhesive film was obtained in the same manner as in Example 1.

使用實施例及比較例中製造之接著薄膜之評價樣品的導體層之剝離強度、粗化處理後之表面粗糙度(Ra值)及(Rq值)、評價樣品之介電正切之各測定結果示於表1。 The measurement results of the conductor layer peeling strength, surface roughness (Ra value) and (Rq value) after roughening treatment, and the dielectric tangent of the evaluation sample using the film-adhered evaluation samples produced in the Examples and Comparative Examples are shown. in Table 1.

Figure 111104959-A0101-12-0031-3
Figure 111104959-A0101-12-0031-3

如表1所示,將實施例1之環氧樹脂組成物中之含萘構造之活性酯化合物變更為本發明範圍外之活性酯化合物之比較例1的環氧樹脂組成物之硬化物,經粗化處理後之Ra、Rq之數值儘管顯示遠比實施例1之環氧樹脂組成物之硬化物之表面上形成之粗化面的Ra、Rq之數值大之數值,但與導體層之密著性(剝離強度)比實施例1者小,且介電正切之數值變大。 As shown in Table 1, the cured product of the epoxy resin composition of Example 1 in which the active ester compound containing a naphthalene structure in the epoxy resin composition of Example 1 is changed to an active ester compound outside the scope of the present invention, although the values of Ra and Rq after roughening treatment are much larger than the values of Ra and Rq of the roughened surface formed on the surface of the cured product of the epoxy resin composition of Example 1, the adhesion (peeling strength) with the conductive layer is smaller than that of Example 1, and the value of the dielectric tangent becomes larger.

另外,比較例2之環氧樹脂組成物由於含萘構造之活性酯化合物之調配量多到超過本發明之範圍,故與導體層之密著性(剝離強度)比實施例1者更小。 In addition, the epoxy resin composition of Comparative Example 2 contains a naphthalene-containing active ester compound in an amount exceeding the scope of the present invention, so the adhesion (peel strength) to the conductor layer is smaller than that of Example 1.

由以上之實施例及比較例之結果可了解,本發明之環氧樹脂組成物係可形成由平衡良好地具備可對應於多層印刷配線板之增層之更多層化、高密度化之特性的硬化物所成之絕緣層的環氧樹脂組成物。 From the results of the above Examples and Comparative Examples, it can be understood that the epoxy resin composition of the present invention can be formed into a well-balanced structure that has the characteristics of more layers and higher density corresponding to the build-up of multilayer printed wiring boards. An epoxy resin composition that is an insulating layer made of hardened material.

Claims (4)

一種多層印刷配線板,為絕緣層上形成有導體層之多層印刷配線板,其特徵係前述絕緣層係將至少含有環氧樹脂(A)與含萘構造之活性酯化合物(B)與無機填充材與熱可塑性樹脂之熱硬化性環氧樹脂組成物予以熱硬化所成的硬化物,前述環氧樹脂(A)包含液狀環氧樹脂與固體狀環氧樹脂,前述無機填充材之平均粒徑為0.01μm以上5μm以下,前述樹脂組成物中的不揮發成分為100質量%時,前述含萘構造之活性酯化合物(B)的含量為0.1~30質量%,前述含萘構造之活性酯化合物(B)為具有聚氧化萘構造之活性酯化合物,前述絕緣層之表面粗糙度Ra係10~200nm,Rq係15~250nm,前述絕緣層與前述導體層之剝離強度係0.35kgf/cm以上。 A multilayer printed wiring board, which is a multilayer printed wiring board with a conductor layer formed on an insulating layer, characterized in that the insulating layer contains at least an epoxy resin (A), an active ester compound (B) containing a naphthalene structure, and an inorganic filler A cured product obtained by thermally curing a thermosetting epoxy resin composition of a material and a thermoplastic resin. The epoxy resin (A) includes a liquid epoxy resin and a solid epoxy resin. The average particle size of the inorganic filler is When the diameter is 0.01 μm or more and 5 μm or less, and the non-volatile component in the resin composition is 100 mass%, the content of the naphthalene-containing active ester compound (B) is 0.1 to 30 mass%. Compound (B) is an active ester compound with a polyoxynaphthalene structure. The surface roughness Ra of the insulating layer is 10~200nm, Rq is 15~250nm, and the peeling strength of the insulating layer and the conductor layer is 0.35kgf/cm or more. . 如請求項1之多層印刷配線板,其中前述含萘構造之活性酯化合物(B)係具有聚氧化萘構造與芳基羰氧基之活性酯化合物。 The multilayer printed wiring board of claim 1, wherein the active ester compound (B) containing a naphthalene structure is an active ester compound having a polyoxynaphthalene structure and an arylcarbonyloxy group. 如請求項1或2之多層印刷配線板,其中前述含萘構造之活性酯化合物(B)係於聚氧化萘構造之萘核上已鍵結芳基羰氧基之活性酯化合物。 The multilayer printed wiring board of claim 1 or 2, wherein the active ester compound (B) containing a naphthalene structure is an active ester compound having an aryl carbonyloxy group bonded to the naphthalene core of the polyoxynaphthalene structure. 一種半導體裝置,其特徵係使用如請求 項1或2之多層印刷配線板者。 A semiconductor device characterized by use as claimed The multi-layer printed wiring board of item 1 or 2.
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