TWI720667B - 電子零件的拾取裝置以及安裝裝置 - Google Patents
電子零件的拾取裝置以及安裝裝置 Download PDFInfo
- Publication number
- TWI720667B TWI720667B TW108138938A TW108138938A TWI720667B TW I720667 B TWI720667 B TW I720667B TW 108138938 A TW108138938 A TW 108138938A TW 108138938 A TW108138938 A TW 108138938A TW I720667 B TWI720667 B TW I720667B
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- adhesive sheet
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- 230000009471 action Effects 0.000 claims abstract description 24
- 238000006243 chemical reaction Methods 0.000 claims abstract description 23
- 239000004065 semiconductor Substances 0.000 claims description 44
- 238000001125 extrusion Methods 0.000 claims description 28
- 239000000758 substrate Substances 0.000 claims description 24
- 230000006835 compression Effects 0.000 claims description 4
- 238000007906 compression Methods 0.000 claims description 4
- 238000001179 sorption measurement Methods 0.000 claims description 4
- 235000012431 wafers Nutrition 0.000 description 55
- 239000004820 Pressure-sensitive adhesive Substances 0.000 description 7
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
- H01L21/52—Mounting semiconductor bodies in containers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67712—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrate being handled substantially vertically
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/50—Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Die Bonding (AREA)
- Supply And Installment Of Electrical Components (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018-203187 | 2018-10-29 | ||
JP2018203187A JP7154106B2 (ja) | 2018-10-29 | 2018-10-29 | 電子部品のピックアップ装置及び実装装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW202017082A TW202017082A (zh) | 2020-05-01 |
TWI720667B true TWI720667B (zh) | 2021-03-01 |
Family
ID=70421023
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW108138938A TWI720667B (zh) | 2018-10-29 | 2019-10-29 | 電子零件的拾取裝置以及安裝裝置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP7154106B2 (enrdf_load_stackoverflow) |
KR (1) | KR102330577B1 (enrdf_load_stackoverflow) |
CN (1) | CN111106037B (enrdf_load_stackoverflow) |
TW (1) | TWI720667B (enrdf_load_stackoverflow) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI743870B (zh) * | 2020-07-06 | 2021-10-21 | 友達光電股份有限公司 | 排片機構 |
KR102819884B1 (ko) * | 2020-07-20 | 2025-06-12 | 한화세미텍 주식회사 | 다이 박리 장치 및 이를 이용한 다이 박리 방법 |
JP7607462B2 (ja) * | 2021-01-26 | 2024-12-27 | ファスフォードテクノロジ株式会社 | ダイボンディング装置および半導体装置の製造方法 |
JP7465859B2 (ja) * | 2021-11-25 | 2024-04-11 | キヤノントッキ株式会社 | 基板キャリア、基板剥離装置、成膜装置、及び基板剥離方法 |
CN116884908B (zh) * | 2023-09-06 | 2023-11-10 | 深圳华太芯创有限公司 | 一种芯片加工用吸附转移机构及其使用方法 |
CN117810129A (zh) * | 2023-12-29 | 2024-04-02 | 中科长光精拓智能装备(苏州)有限公司 | 一种芯片分离装置及芯片分离方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06338527A (ja) * | 1993-05-28 | 1994-12-06 | Toshiba Corp | 半導体チップ取出装置 |
JP2007220905A (ja) * | 2006-02-16 | 2007-08-30 | Shibuya Kogyo Co Ltd | 板状物品のピックアップ装置 |
WO2008053673A1 (fr) * | 2006-10-31 | 2008-05-08 | Shibaura Mechatronics Corporation | Dispositif de collecte de puce à semiconducteur |
JP2016195233A (ja) * | 2015-11-30 | 2016-11-17 | 富士ゼロックス株式会社 | 半導体製造装置および半導体片の製造方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20070120319A (ko) * | 2006-06-19 | 2007-12-24 | 삼성전자주식회사 | 한 쌍의 이젝터들을 구비하는 반도체 칩의 탈착 장치 및이를 이용한 반도체 칩의 탈착 방법 |
JP5054949B2 (ja) * | 2006-09-06 | 2012-10-24 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
JP5075013B2 (ja) | 2008-05-27 | 2012-11-14 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置の製造方法 |
JP5227117B2 (ja) * | 2008-08-29 | 2013-07-03 | 芝浦メカトロニクス株式会社 | 半導体チップのピックアップ装置及びピックアップ方法 |
JP2011082379A (ja) * | 2009-10-08 | 2011-04-21 | Hitachi High-Technologies Corp | 本圧着装置及び本圧着方法 |
JP5123357B2 (ja) * | 2010-06-17 | 2013-01-23 | 株式会社日立ハイテクインスツルメンツ | ダイボンダ及びピックアップ装置 |
JP2013033850A (ja) * | 2011-08-02 | 2013-02-14 | Shibaura Mechatronics Corp | 半導体チップのピックアップ装置及びピックアップ方法 |
JP2013171996A (ja) | 2012-02-21 | 2013-09-02 | Shibaura Mechatronics Corp | 半導体チップのピックアップ装置及びピックアップ方法 |
JP5717910B1 (ja) * | 2014-02-26 | 2015-05-13 | 株式会社新川 | 半導体ダイのピックアップ装置及びピックアップ方法 |
JP6637397B2 (ja) * | 2016-09-12 | 2020-01-29 | ファスフォードテクノロジ株式会社 | 半導体製造装置および半導体装置の製造方法 |
-
2018
- 2018-10-29 JP JP2018203187A patent/JP7154106B2/ja active Active
-
2019
- 2019-10-28 KR KR1020190134538A patent/KR102330577B1/ko active Active
- 2019-10-28 CN CN201911028600.8A patent/CN111106037B/zh active Active
- 2019-10-29 TW TW108138938A patent/TWI720667B/zh active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06338527A (ja) * | 1993-05-28 | 1994-12-06 | Toshiba Corp | 半導体チップ取出装置 |
JP2007220905A (ja) * | 2006-02-16 | 2007-08-30 | Shibuya Kogyo Co Ltd | 板状物品のピックアップ装置 |
WO2008053673A1 (fr) * | 2006-10-31 | 2008-05-08 | Shibaura Mechatronics Corporation | Dispositif de collecte de puce à semiconducteur |
JP2016195233A (ja) * | 2015-11-30 | 2016-11-17 | 富士ゼロックス株式会社 | 半導体製造装置および半導体片の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2020072125A (ja) | 2020-05-07 |
CN111106037B (zh) | 2023-10-24 |
TW202017082A (zh) | 2020-05-01 |
KR102330577B1 (ko) | 2021-11-25 |
JP7154106B2 (ja) | 2022-10-17 |
KR20200049625A (ko) | 2020-05-08 |
CN111106037A (zh) | 2020-05-05 |
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