TWI720667B - Pick-up device and mounting device for electronic parts - Google Patents
Pick-up device and mounting device for electronic parts Download PDFInfo
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- TWI720667B TWI720667B TW108138938A TW108138938A TWI720667B TW I720667 B TWI720667 B TW I720667B TW 108138938 A TW108138938 A TW 108138938A TW 108138938 A TW108138938 A TW 108138938A TW I720667 B TWI720667 B TW I720667B
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- 239000000853 adhesive Substances 0.000 claims abstract description 120
- 230000001070 adhesive effect Effects 0.000 claims abstract description 120
- 230000007246 mechanism Effects 0.000 claims abstract description 112
- 238000003825 pressing Methods 0.000 claims abstract description 104
- 230000033001 locomotion Effects 0.000 claims abstract description 33
- 230000009471 action Effects 0.000 claims abstract description 24
- 238000006243 chemical reaction Methods 0.000 claims abstract description 23
- 239000004065 semiconductor Substances 0.000 claims description 44
- 238000001125 extrusion Methods 0.000 claims description 28
- 239000000758 substrate Substances 0.000 claims description 24
- 230000006835 compression Effects 0.000 claims description 4
- 238000007906 compression Methods 0.000 claims description 4
- 238000001179 sorption measurement Methods 0.000 claims description 4
- 235000012431 wafers Nutrition 0.000 description 55
- 239000004820 Pressure-sensitive adhesive Substances 0.000 description 7
- 239000002390 adhesive tape Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 238000009434 installation Methods 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- 230000005484 gravity Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000008602 contraction Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000026058 directional locomotion Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/52—Mounting semiconductor bodies in containers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67712—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrate being handled substantially vertically
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/50—Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Die Bonding (AREA)
- Supply And Installment Of Electrical Components (AREA)
Abstract
本發明提供一種能夠抑制電子零件的破損的拾取裝置以及安裝裝置。實施方式的拾取裝置具有:拾取部,拾取貼附於粘著片的電子零件;以及支承部,與粘著片的和電子零件為相反側的一面相向地設置,支承部具有:吸附面,吸附保持粘著片;擠壓部,與共同的軸呈同軸的嵌套狀地配設有多個擠壓體,所述多個擠壓體設置成在吸附面內沿著共同的軸而可移動,且外形的大小不同;驅動機構,進行擠壓動作及遠離動作,所述擠壓動作使擠壓部移動而利用所有擠壓體擠壓粘著片,所述遠離動作使擠壓體依次向遠離方向移動;以及轉換機構,設於驅動機構,將沿著共同的軸移動的單一的驅動構件的動作轉換為多個擠壓體的遠離動作。The present invention provides a pickup device and a mounting device capable of suppressing damage to electronic components. The pick-up device of the embodiment has: a pick-up part that picks up electronic parts attached to the adhesive sheet; and a support part provided opposite to the side of the adhesive sheet and the electronic part, and the support part has: a suction surface, suction Holding the adhesive sheet; the pressing part is provided with a plurality of extruded bodies in a nested shape coaxially with the common axis, and the plurality of extruded bodies are arranged to be movable along the common axis in the suction surface , And the size of the outer shape is different; the drive mechanism performs a squeezing action and a distance action, the squeezing action moves the squeezing part and uses all the squeezing bodies to squeeze the adhesive sheet, and the distance action causes the squeezing bodies to Move away from the direction; and a conversion mechanism, provided in the drive mechanism, converts the movement of a single drive member that moves along a common axis into the move away from a plurality of extruded bodies.
Description
本發明涉及一種電子零件的拾取(pick up)裝置以及安裝裝置。The invention relates to a pick-up device and an installation device for electronic parts.
在將半導體晶片安裝於導線架(lead frame)或佈線基板、插入式基板(interposer substrate)等基板上時,進行下述操作,即:從晶圓薄片(wafer sheet)將半導體晶片逐一取出,移送至基板上並進行安裝,所述晶圓薄片是將以每個半導體晶片進行切斷而單片化的半導體晶圓貼附於粘著片而成。When mounting semiconductor wafers on a lead frame, wiring substrate, interposer substrate, or other substrates, perform the following operations, namely: take out the semiconductor wafers one by one from the wafer sheet and transfer them The wafer sheet is mounted on a substrate, and the wafer sheet is formed by attaching a semiconductor wafer cut and singulated for each semiconductor wafer to an adhesive sheet.
這樣,為了將貼附於晶圓薄片等粘著片的半導體晶片等電子零件從粘著片剝離並拾取,可使用具有拾取機構及上頂機構的拾取裝置。拾取機構具有吸附電子零件的吸附噴嘴。上頂機構利用上頂銷(pin)將吸附於吸附噴嘴的電子零件從下表面側上頂,輔助電子零件從粘著片的剝離及取出。In this way, in order to peel and pick up electronic components such as a semiconductor wafer attached to an adhesive sheet such as a wafer sheet from the adhesive sheet, a pick-up device having a pick-up mechanism and a top mechanism can be used. The pick-up mechanism has a suction nozzle that sucks electronic parts. The top mechanism uses top pins (pins) to lift up the electronic parts adsorbed on the suction nozzle from the lower surface side, assisting in peeling and taking out the electronic parts from the adhesive sheet.
此外,最近的半導體晶片正以其厚度為小於或等於50 μm的方式推進薄型化。在一邊拉伸粘著片一邊僅利用上頂銷將如此薄的半導體晶片上頂時,半導體晶片損傷的可能性變大。因此,如專利文獻1所示,開發出了下述拾取裝置,此拾取裝置具有使軸線一致而同心地設置的多個上推體,以使貼附於半導體晶片的下表面的粘著片的剝離從半導體晶片的周邊部向中心部緩緩地進行。此種拾取裝置中,多個上推體所形成的上表面形狀通常形成為與供拾取的半導體晶片同等的形狀、例如四方形。In addition, recent semiconductor wafers are being thinned so that their thickness is less than or equal to 50 μm. When such a thin semiconductor wafer is lifted up only by the top pin while the adhesive sheet is stretched, the semiconductor wafer is more likely to be damaged. Therefore, as shown in
所述拾取裝置中,首先使多個上推體同時上升至規定高度,將供拾取的半導體晶片的整個下表面擠壓上推。然後,留下位於最外側的上頂體而使其他上頂體進一步上升至規定高度為止。接著,留下第2個上頂體而使其他上頂體上升。半導體晶片的下表面的由上頂體進行的支撐從周邊部向中心部依次開放,因此半導體晶片容易從粘著帶剝離。進而提出:為了促進粘著帶從半導體晶片的下表面的剝離,至少在位於最外周的上推體的與粘著帶的接觸面(上表面)設置抽吸力在與粘著帶之間發揮作用的凹部。設於上推體的上表面的凹部成為粘著片開始從半導體晶片剝離的部位,因此能夠促進剝離帶從半導體晶片的剝離。In the pickup device, first, a plurality of push-up bodies are raised to a predetermined height at the same time, and the entire lower surface of the semiconductor wafer to be picked up is pressed and pushed up. Then, the upper acrobody located on the outermost side is left, and the other upper acrosomes are further raised to a predetermined height. Then, the second upper acrosome is left and the other upper acrosomes are raised. The support by the upper top body of the lower surface of the semiconductor wafer is sequentially opened from the peripheral portion to the center portion, so the semiconductor wafer is easily peeled from the adhesive tape. It is further proposed that in order to promote the peeling of the adhesive tape from the lower surface of the semiconductor wafer, at least the contact surface (upper surface) of the pusher located at the outermost periphery with the adhesive tape is provided with a suction force to exert a suction force between the adhesive tape and the adhesive tape. The concave part of the function. The concave portion provided on the upper surface of the push-up body serves as a location where the adhesive sheet starts to peel from the semiconductor wafer, and therefore it is possible to promote the peeling of the peeling tape from the semiconductor wafer.
[現有技術文獻] [專利文獻] [專利文獻1]日本專利特開2010-056466號公報[Prior Art Literature] [Patent Literature] [Patent Document 1] Japanese Patent Laid-Open No. 2010-056466
[發明所要解決的問題] 但是,即便在使用如上所述那樣的具有多個上推體並且至少在位於最外周的上推體的上表面設有凹部的拾取裝置時,有時半導體晶片也會產生破損。半導體晶片破損的原因雖不明確,但在將以厚度為例如小於或等於30 μm的方式經薄型化的半導體晶片從粘著片剝離並拾取時,容易產生半導體晶片的破損。另外,形成於半導體晶片的電路也為了實現半導體晶片的高容量化或高功能化等而高密度化,此種電路形狀也可認為是半導體晶片破損的一個原因。[The problem to be solved by the invention] However, even when a pickup device having a plurality of push-up bodies as described above is used and a recess is provided at least on the upper surface of the push-up body located at the outermost periphery, the semiconductor wafer may be damaged. Although the cause of the damage of the semiconductor wafer is not clear, when the semiconductor wafer thinned to a thickness of, for example, 30 μm or less is peeled from the adhesive sheet and picked up, the semiconductor wafer is likely to be damaged. In addition, circuits formed on semiconductor wafers have also been densified in order to achieve higher capacity or higher functionality of the semiconductor wafers. Such a circuit shape can also be considered as a cause of damage to the semiconductor wafer.
例如對於反及(NAND)型快閃記憶體(flash memory)等記憶體晶片而言,其厚度逐年薄型化,如上文所述那樣,正推進具有小於或等於30 μm、進而小於或等於25 μm、小於或等於20 μm那樣的厚度的半導體晶片的實用化。因此,尋求一種即使在拾取此種經薄型化的半導體晶片時,也可更可靠地將半導體晶片從粘著片剝離並拾取而不使半導體晶片產生破損的拾取裝置。For example, for memory chips such as NAND flash memory, the thickness is becoming thinner year by year. As mentioned above, it is advancing to have less than or equal to 30 μm, and then less than or equal to 25 μm. , Practical use of semiconductor wafers with a thickness less than or equal to 20 μm. Therefore, even when picking up such a thinned semiconductor wafer, the semiconductor wafer can be peeled from the adhesive sheet and picked up more reliably without causing damage to the semiconductor wafer.
本發明的目的在於提供一種能夠抑制電子零件的破損的拾取裝置以及安裝裝置。The object of the present invention is to provide a pickup device and a mounting device capable of suppressing breakage of electronic components.
[解決問題的技術手段] 實施方式的電子零件的拾取裝置包括:拾取部,拾取貼附於粘著片的電子零件;以及支承部,與所述粘著片的和所述電子零件為相反側的一面相向地設置,所述支承部包括:吸附面,吸附保持所述粘著片的與供拾取的所述電子零件對應的區域;擠壓部,與共同的軸呈同軸的嵌套狀地配設有多個擠壓體,所述多個擠壓體設置成在所述吸附面內沿著所述共同的軸而可移動,且外形的大小不同;驅動機構,進行擠壓動作及遠離動作,所述擠壓動作使所述擠壓部移動而利用所有擠壓體擠壓所述粘著片,所述遠離動作從任一擠壓體起使鄰接的擠壓體依次向使所述電子零件從粘著片剝離的遠離方向移動;以及轉換機構,設於所述驅動機構,將沿著所述共同的軸移動的單一的驅動構件的動作轉換為所述多個擠壓體的遠離動作。[Technical means to solve the problem] The pick-up device of the electronic component of the embodiment includes: a pick-up part which picks up the electronic part attached to the adhesive sheet; and a support part which is provided facing the surface of the adhesive sheet on the opposite side to the electronic part, so The supporting portion includes: a suction surface that sucks and holds the area of the adhesive sheet corresponding to the electronic component for picking up; the pressing portion is provided with a plurality of pressings in a nested shape coaxial with a common axis The plurality of extruded bodies are arranged to be movable along the common axis in the suction surface, and have different shapes and sizes; the driving mechanism performs an extruding action and a moving away, the extruding action The pressing portion is moved to press the adhesive sheet with all the pressing bodies, and the moving away from any pressing body causes adjacent pressing bodies to peel off the electronic component from the adhesive sheet in sequence. And a conversion mechanism, provided in the drive mechanism, converts the movement of a single drive member that moves along the common axis into the movement of the plurality of extruded bodies.
所述轉換機構也可包括:至少一對伸出部,從各擠壓體的相反的側面向外伸出;施力構件,對各擠壓體的伸出部向所述遠離方向個別地施力;以及第1凸輪機構,由所述驅動構件所驅動,從任一擠壓體起向鄰接的擠壓體依次允許各擠壓體向所述遠離方向移動。The conversion mechanism may also include: at least a pair of protruding parts that protrude outward from opposite sides of each extruded body; and a urging member that individually applies the protruding parts of each extruded body in the away direction Force; and the first cam mechanism, driven by the drive member, from any extrusion body to the adjacent extrusion body sequentially allowing each extrusion body to move in the away direction.
所述第1凸輪機構也可包括:凸輪面,設於各擠壓體的和擠壓於所述粘著片的擠壓面為相反側的一面,沿著與所述共同的軸交叉的方向而在每個所述擠壓體中形狀不同;以及滾輪軸,與各擠壓體的凸輪面接觸,對各擠壓體向抵抗所述施力構件的方向施力,並且在與所述遠離方向交叉的方向移動。The first cam mechanism may include: a cam surface provided on a surface of each pressing body opposite to the pressing surface pressed against the adhesive sheet, along a direction intersecting the common axis In each of the extruded bodies, the shape is different; and the roller shaft is in contact with the cam surface of each extruded body, applies force to each extruded body in the direction resisting the force applying member, and moves away from the Move in the direction that crosses the direction.
所述滾輪軸的移動範圍也可為所述吸附面的外緣的範圍內。也可根據所述凸輪面的形狀,施力構件對所述一對伸出部中的一者與另一者的施加力不同。也可將最外側的所述擠壓體的一對所述伸出部設於最外側,隨著成為內側的所述擠壓體而依次在內側設有所述伸出部。The moving range of the roller shaft may also be within the range of the outer edge of the suction surface. Depending on the shape of the cam surface, the urging member may apply a different force to one of the pair of protrusions and the other. It is also possible to provide a pair of the protruding portions of the outermost extruded body on the outermost side, and sequentially provide the protruding portions on the inner side following the innermost extruded body.
所述轉換機構也可包括:第2凸輪機構,將所述驅動構件的沿著所述共同的軸的方向上的移動轉換為所述滾輪軸的與所述遠離方向交叉的方向上的移動。The conversion mechanism may include a second cam mechanism that converts the movement of the drive member in a direction along the common axis into a movement of the roller shaft in a direction crossing the distance direction.
所述第2凸輪機構也可包括滾輪及與所述滾輪接觸的傾斜面,且所述第2凸輪機構為直動凸輪,所述直動凸輪將所述滾輪及所述傾斜面中的任一者設為沿著所述共同的軸移動的主動凸輪,將另一者設為在與所述共同的軸交叉的方向移動的從動凸輪。The second cam mechanism may also include a roller and an inclined surface in contact with the roller, and the second cam mechanism may be a linear cam that connects any of the roller and the inclined surface One is a driving cam that moves along the common axis, and the other is a driven cam that moves in a direction crossing the common axis.
所述擠壓部也可包括五個或五個以上的擠壓體,最外側的擠壓體形成為擠壓面的大小與供拾取的所述電子零件的貼附於所述粘著片的面的大小相同或略小,最內側的擠壓體形成為擠壓面的面積成為供拾取的所述電子零件的貼附於所述粘著片的面的面積的30%或30%以下的大小。The squeezing part may also include five or more squeezing bodies, and the outermost squeezing body is formed to have the size of the squeezing surface and the surface of the electronic component for picking up attached to the adhesive sheet. The size of the innermost extruded body is the same or slightly smaller, and the area of the extruded surface becomes 30% or less of the area of the surface attached to the adhesive sheet of the electronic component to be picked up.
本發明的電子零件的拾取裝置包括:拾取部,拾取貼附於粘著片的電子零件;以及支承部,與所述粘著片的和所述電子零件為相反側的一面相向地設置,所述支承部包括:吸附面,吸附保持所述粘著片的與供拾取的所述電子零件對應的區域;擠壓部,與共同的軸呈同軸的嵌套狀地配設有多個擠壓體,所述多個擠壓體設置成在所述吸附面內沿著所述共同的軸而可移動,且外形的大小不同;驅動機構,進行擠壓動作及遠離動作,所述擠壓動作使所述擠壓部移動而利用所有擠壓體擠壓所述粘著片,所述遠離動作從任一擠壓體起使鄰接的擠壓體依次向使所述電子零件從粘著片剝離的遠離方向移動;以及轉換機構,設於所述驅動機構,將沿著所述共同的軸移動的單一的驅動構件的動作轉換為所述多個擠壓體的遠離動作,所述轉換機構包括:施力構件,對各擠壓體向所述遠離方向個別地施力;凸輪面,設於各擠壓體的和擠壓於所述粘著片的擠壓面為相反側的一面,沿著與所述共同的軸交叉的方向而在每個所述擠壓體中形狀不同;以及滾輪軸,與各擠壓體的凸輪面接觸,對各擠壓體向抵抗所述施力構件的方向施力,並且在與所述遠離方向交叉的方向移動。The pick-up device for electronic parts of the present invention includes: a pick-up part which picks up electronic parts attached to an adhesive sheet; and a support part which is provided facing the side of the adhesive sheet on the opposite side to the electronic part, so The supporting portion includes: a suction surface that sucks and holds the area of the adhesive sheet corresponding to the electronic component for picking up; the pressing portion is provided with a plurality of pressings in a nested shape coaxial with a common axis The plurality of extruded bodies are arranged to be movable along the common axis in the suction surface, and have different shapes and sizes; the driving mechanism performs an extruding action and a moving away, the extruding action The pressing portion is moved to press the adhesive sheet with all the pressing bodies, and the moving away from any pressing body causes adjacent pressing bodies to peel off the electronic component from the adhesive sheet in sequence. And a conversion mechanism, provided in the drive mechanism, converts the movement of a single drive member moving along the common axis into the movement of the plurality of extruded bodies, and the conversion mechanism includes : A urging member that individually energizes each extruded body in the away direction; a cam surface is provided on the opposite side of the extruded body and the extruded surface pressed against the adhesive sheet, along The shape of each of the extruded bodies is different in the direction intersecting the common axis; and the roller shaft is in contact with the cam surface of each extruded body, and opposes each extruded body against the urging member It applies force in the direction and moves in a direction that intersects the away direction.
本發明的電子零件的拾取裝置包括:拾取部,拾取貼附於粘著片的電子零件;以及支承部,與所述粘著片的和所述電子零件為相反側的一面相向地設置,所述支承部包括:吸附面,吸附保持所述粘著片的與供拾取的所述電子零件對應的區域;擠壓部,呈同軸的嵌套狀地配設有多個擠壓體,所述多個擠壓體設置成在所述吸附面內沿著共同的軸而可移動,且外形的大小不同;以及驅動機構,使所述多個擠壓體沿著所述共同的軸而個別地動作,且包括沿著共同的軸移動的單一的驅動構件及將所述單一的驅動構件的動作轉換為所述多個擠壓體的個別的動作的轉換機構。The pick-up device for electronic parts of the present invention includes: a pick-up part which picks up electronic parts attached to an adhesive sheet; and a support part which is provided facing the side of the adhesive sheet on the opposite side to the electronic part, so The supporting portion includes: a suction surface that suctions and holds the area of the adhesive sheet corresponding to the electronic component for picking up; the pressing portion is provided with a plurality of extrusions in a coaxial nesting shape, the A plurality of extruded bodies are arranged to be movable along a common axis in the suction surface, and the sizes of the outer shapes are different; and a driving mechanism that causes the plurality of extruded bodies to be individually along the common axis The action includes a single drive member that moves along a common axis and a conversion mechanism that converts the action of the single drive member into individual actions of the plurality of extruded bodies.
本發明的安裝裝置包括:供給裝置,保持貼附保持有半導體晶片的粘著片;基板平台,載置基板;拾取裝置,從所述供給裝置所保持的所述粘著片拾取所述半導體晶片;以及安裝機構,將由所述拾取裝置所取出的所述半導體晶片安裝於所述基板,且所述拾取裝置為所述任一拾取裝置。The mounting device of the present invention includes: a supply device that holds and adheres an adhesive sheet holding a semiconductor wafer; a substrate platform that mounts a substrate; and a pickup device that picks up the semiconductor wafer from the adhesive sheet held by the supply device And a mounting mechanism for mounting the semiconductor wafer taken out by the pick-up device on the substrate, and the pick-up device is any one of the pick-up devices.
[發明的效果] 根據本發明,可提供一種能夠抑制電子零件的破損的拾取裝置以及安裝裝置。[Effects of the invention] According to the present invention, it is possible to provide a pickup device and a mounting device capable of suppressing breakage of electronic components.
以下,參照圖式對實施方式的拾取裝置進行說明。以下所示的圖式為示意性,各部的尺寸、形狀、各部的相互的尺寸比率等有時與現實情況不同。Hereinafter, the pickup device of the embodiment will be described with reference to the drawings. The drawings shown below are schematic, and the size, shape, and mutual size ratio of each portion may be different from the actual situation.
[第1實施方式]
[構成]
圖1為表示第1實施方式的拾取裝置1的概略構成的透視正視圖,圖2為表示圖1所示的拾取裝置1的支承部200的吸附面220的平面圖,圖3為表示擠壓部230的平面圖,圖4(A)~圖4(H)為擠壓部230的分解圖。圖4(A)~圖4(H)的左側為正視圖,右側為側面圖。此外,以下的說明中,將與擠壓部230的軸平行的直線設為Z軸,將在與其正交的平面中彼此正交的二軸設為X軸及Y軸。當提及沿著軸的方向時,包含與軸平行的直線上的相反的兩個方向。其中,將擠壓部230移動而擠壓粘著片2的方向設為圖中的箭頭所示的Z方向,將與Z方向正交且滾輪軸82移動的方向設為圖中的箭頭所示的X方向。另外,本實施方式中,設X軸及Y軸為沿著水平的軸,Z軸為垂直的軸。進而,本實施方式中,將沿著重力的方向設為下方,抵抗重力的方向設為上方。此外,擠壓部230的軸為貫穿後述的與粘著片2接觸或遠離的擠壓面31的中心且與徑向的截面正交的直線。所謂擠壓部230的“徑向的截面”,是指正對擠壓面31而觀看擠壓部230時,沿著由擠壓面31的外形線所形成的平面圖形的方向的截面。此外,所謂“擠壓面的中心”,是指正對擠壓面31而觀看擠壓部230時,由擠壓面31的外形線所形成的平面圖形的中心或重心。[First Embodiment]
[constitute]
1 is a perspective front view showing a schematic configuration of a
(電子零件)
電子零件3例如可舉出半導體元件、及半導體元件以外的電阻或電容器等。半導體元件例如可舉出:電晶體(transistor)、二極體、發光二極體(Light Emitting Diode,LED)、電容器及閘流管(thyristor)等離散半導體(discrete semiconductor),積體電路(Integrated Circuit,IC)或大型積體電路(Large Scale Integration,LSI)等積體電路等。本實施方式如圖1所示,使用長方體形狀的半導體晶片作為電子零件3。各半導體晶片是通過將半導體晶圓切斷成小四方塊狀的切割(dicing)而單片化。(Electronic parts)
Examples of the
(粘著片)
電子零件3貼附於被稱為切割帶(dicing tape)的粘著片2。粘著片2保持於未圖示的晶圓環。通過將貼附於粘著片2的粘著面的半導體晶片切斷成小四方塊狀進行單片化,而成為在粘著片2貼附有多個電子零件3的狀態。(Adhesive sheet)
The
貼附有多個電子零件3的粘著片2設置成通過未圖示的驅動機構而可使晶圓環在沿著X軸、Y軸及Z軸的方向移動。由此,設置成相對於後述的支承部200而可將粘著片2在沿著X軸及Y軸的方向定位,並且設置成相對於支承部200的吸附面220而可接觸或遠離。此外,晶圓環與支承部200只要構成為相對地沿著X軸、Y軸及Z軸而受到驅動即可。也就是說,也可使支承部200在Z軸方向移動,相對於在Z軸方向固定的粘著片2而接觸或遠離。The
(拾取裝置)
本實施方式的拾取裝置1為將貼附於粘著片2的多個電子零件3從粘著片2個別地剝離並取出的裝置。拾取裝置1具有拾取機構100、支承部200、控制裝置300。(Pickup device)
The pick-up
拾取機構100拾取貼附於粘著片2的電子零件3。拾取機構100具有個別地吸附保持電子零件3的拾取部4。拾取部4具有主體部5、吸附噴嘴8。主體部5為圓柱形狀的構件,由未圖示的X驅動源、Y驅動源及Z驅動源在沿著X軸、Y軸及Z軸的方向進行驅動。在主體部5的一端面,設有向粘著片2突出的凸部6。在主體部5,在沿著Z軸的方向形成有使前端在凸部6的端面開口的抽吸孔7。所述抽吸孔7連接於包含未圖示的抽吸泵的空氣壓電路。The
吸附噴嘴8為可裝卸地連接於凸部6且直徑向前端變小的圓錐台形狀的構件。吸附噴嘴8是由橡膠或軟質的合成樹脂等彈性材料所形成。在吸附噴嘴8,形成有一端與抽吸孔7連通且另一端在前端的平坦面8a開口的噴嘴孔9。此外,作為將主體部5在沿著Z軸的方向進行驅動的Z驅動源,優選使用音圈馬達(voice coil motor)等,並以拾取部4所給予的擠壓負荷成為一定的方式進行控制。The
支承部200與粘著片2的和粘著面為相反側的一面相向地設置。支承部200具有收容體210、吸附面220、擠壓部230、驅動機構240、轉換機構250。The
收容體210為以與Z軸平行的直線作為軸的圓筒形狀的容器。在收容體210,經由配管等而連接著對內部進行抽吸的抽吸泵211。吸附面220為吸附保持粘著片2的與供拾取的電子零件3對應的區域的面。所謂與電子零件3對應的區域,是指包圍粘著片2的貼附有供拾取的電子零件3的區域且比此區域更大的區域。The
如圖2所示,吸附面220形成為安裝在收容體210的與粘著片2相向的開口的蓋(cap)。在吸附面220設有多個抽吸孔221。抽吸孔221經由支承部200的內部或未圖示的配管而連接於抽吸泵211。通過使抽吸泵211動作,而在吸附面220經由多個抽吸孔221產生抽吸力。因此,若使抽吸泵211動作而使吸附面220與粘著片2的和粘著面為相反側的一面接觸,則吸附保持粘著片2。也就是說,本實施方式中,在吸附面220中,設有抽吸孔221的區域內全體成為與電子零件3對應的區域。此外,抽吸孔221設於吸附面220的大致整個區域,因此也可將包含擠壓部230上的吸附面220內的整個區域設為與電子零件3對應的區域。As shown in FIG. 2, the
擠壓部230為與共同的軸呈同軸的嵌套狀地配設有多個擠壓體30的構件,所述多個擠壓體30設置成在吸附面220內沿著共同的軸而可移動,且外形的大小不同。此處,共同的軸與Z軸平行,也為上文所述的擠壓部230的軸。擠壓部230設置成在設於吸附面220的矩形狀的開口部222內可進退。The squeezing
如圖2及圖3所示,擠壓體30為矩形的筒狀體或柱狀體,其與共同的軸正交的截面和電子零件3形狀相似。最內周的擠壓體30A為與粘著片2相向的端面成為矩形的擠壓面31的柱狀體。比最內周更靠外周的擠壓體30B~擠壓體30H為與粘著片2相向的端面成為矩形框狀的擠壓面32的筒狀體。本實施方式中,通過在擠壓體30內依次插入外形比其更小的擠壓體30,而將8個擠壓體30A~30H配設成同軸的嵌套狀且可滑動。最外周的擠壓體30H的外形大小與成為拾取對象的電子零件3的貼附於粘著片2的面的外形的大小相同或略小。所謂略小,例如是指相較於電子零件3的貼附於粘著片2的面的外形,允許小到由擠壓體30H的側壁厚度所決定的擠壓面32的寬度程度為止。由此,能夠抑制對電子零件3的負載,並且從最外周剝離粘著片2。以下的說明中,在不區分擠壓體30A~擠壓體30H時,有時稱為擠壓體30。As shown in FIGS. 2 and 3, the extruded
此外,從防止電子零件3的破損的觀點來看,優選相對於電子零件3的貼附於粘著片2的面的面積,由最內周的擠壓體30A的擠壓面31殘留而未剝離的粘著片2的面積為30%或30%以下,但本實施方式不限定於此。另外,由各擠壓體30B~擠壓體30H的側壁厚度所決定的擠壓面32的寬度優選設為0.6 mm左右或更小,但本實施方式不限定於此。另外,本實施方式的電子零件3為正方形,但不限定於此,也可為長方形狀。當電子零件3為長方形狀時,擠壓面31、擠壓面32只要設為與電子零件3相似的長方形即可。In addition, from the viewpoint of preventing damage to the
如圖3及圖4(A)~圖4(H)所示,在擠壓體30B~擠壓體30H的擠壓面32,形成有凹凸。也就是說,沿著擠壓面32的矩形的四個側邊部而設有多個第1凸部33,在矩形的四個角部設有第2凸部34。在第1凸部33與第2凸部34之間及第1凸部33間設有凹部35。第1凸部33、第2凸部34的頭頂面擠壓粘著片2。當如此將粘著片2上推時,第1凸部33局部地支撐與電子零件3的四個側邊部平行的方向,第2凸部34局部地支撐從電子零件3的中心朝向四個角部的方向。As shown in FIGS. 3 and 4 (A) to 4 (H), the
經過設於收容體210內的未圖示的配管或擠壓體30A~擠壓體30H間的間隙及缺口36,抽吸泵211的抽吸力傳至凹部35。缺口36為以局部圓形狀地切缺的方式形成於擠壓體30B~擠壓體30H的擠壓面32的一部分的抽吸路徑。另外,在鄰接的擠壓體30中,凹部35設置成交錯。利用這種互不相同的構成,而形成從外周及角朝向中央的抽吸線,因此確保對中央部分的抽吸直至最後為止,粘著片2的吸附性能提高。The suction force of the
驅動機構240為進行擠壓動作及遠離動作的機構,所述擠壓動作使擠壓部230移動而利用所有擠壓體30擠壓粘著片2,所述遠離動作從外側的擠壓體30起使鄰接的內側的擠壓體30依次向使電子零件3從粘著片2剝離的遠離方向移動。此處,本實施方式中,遠離方向為與擠壓的方向相反的方向。轉換機構250設於驅動機構240,將沿著共同的軸移動的單一的第1驅動構件241的動作轉換為多個擠壓體30A~30H的遠離動作。The
驅動機構240具有同軸的圓筒形狀的第1驅動構件241、第2驅動構件242。第1驅動構件241、第2驅動構件242例如是由伺服馬達(servo motor)所驅動的滾珠螺杆機構或凸輪滾輪機構等在沿著共同的軸的方向個別地驅動。第1驅動構件241驅動後述的轉換機構250。第2驅動構件242驅動後述的框架50。The
轉換機構250具有框架50、伸出部60、施力構件70、第1凸輪機構80、第2凸輪機構90。框架50為收容在收容體210內,支撐擠壓部230、第1凸輪機構80、第2凸輪機構90的構件。The
框架50具有支撐塊51、第1支撐板52、線性導件53、第2支撐板54。支撐塊51為設於收容體210內的粘著片2側的長方體形狀,在其內部形成有使擠壓部230沿著Z軸方向可滑動地穿插的長方體形狀的導孔51a。進而,在支撐塊51的粘著片2側,設有向相反的側面的外側突出的突出部51b。此處,所謂相反的側面,是指關於共同的軸而處於相向的位置關係。例如,當如本實施方式那樣支撐塊51為長方體形狀時,四個側面中位於隔著共同的軸的位置(相向)的兩個側面為相反的側面。The
第1支撐板52為安裝有支撐塊51的圓板狀的構件。線性導件53為通過導軌(guide rail)而在X方向可滑動移動地支撐後述的移動體83的構件。第2支撐板54為設於框架50的驅動機構240側的圓板狀的構件。在第2支撐板54,形成有供第1驅動構件241穿插的孔。另外,在第2支撐板54固定著第2驅動構件242的前端。此外,第1支撐板52、線性導件53、第2支撐板54通過未圖示的Z軸方向的支柱而彼此連接固定。The
如圖3及圖4(A)~圖4(H)所示,伸出部60在擠壓體30的相反的側面的外側分別設有各一對。此處,所謂擠壓體30的相反的側面,在如本實施方式那樣擠壓體30為矩形的筒狀時,是指位於隔著共同的軸的位置(相向)的兩個側面。此外,相反的側面在一個擠壓體30中存在兩組,但本實施方式中,將在X軸方向相向的組設為相反的側面。另外,所謂側面的外側,是指從正面觀看側面時成為兩端部的部分。也就是說,從各擠壓體30的相反的兩側面設有合計四個伸出部60。此外,伸出部60設於側面的下端。最外側的擠壓體30H的一對伸出部60設於最外側,隨著成為內側的擠壓體30G~擠壓體30A,而依次在內側設有伸出部60。此外,最內周的擠壓體30A的伸出部60是在相反的側面設有各一個。也就是說,並非所有的擠壓體30A~擠壓體30H必須在相反的側面設有各一對伸出部60。此外,伸出部60也能理解成下述部分,即:使在Y軸方向相向的兩個側壁的下端比在X軸方向相向的兩個側壁的下端更向下側延長規定量,並使此延長部分的兩端在X軸方向伸出的部分。As shown in FIGS. 3 and 4(A) to 4(H), the
如圖1及圖3所示,施力構件70為對各擠壓體30的伸出部60向遠離方向個別地施力的構件。施力構件70可使用板彈簧、線圈彈簧等彈性構件而構成。本實施方式中,使用在內置有壓縮線圈彈簧的筒的前端設有根據壓縮線圈彈簧的伸縮而進退的銷的構件來作為施力構件70。施力構件70設於與Z軸平行的方向,其中一個端部安裝於支撐塊51,作為另一端部的銷的前端與伸出部60接觸。通過此種構成,施力構件70對各擠壓體30進行施力。As shown in FIGS. 1 and 3, the urging
第1凸輪機構80為由第1驅動構件241所驅動,從外側向內側依次允許各擠壓體30向遠離方向移動的機構。第1凸輪機構80具有凸輪面81、滾輪軸82、移動體83。The
凸輪面81設於各擠壓體30的和粘著片2為相反側的一面,且為沿著與共同的軸交叉的方向,具體而言為沿著X軸方向,而在每個擠壓體30中形狀不同的面。本實施方式中,凸輪面81為具有距擠壓面31或擠壓面32的距離在每個擠壓體30中依次不同的部分的面。凸輪面81形成於擠壓體30的在沿著Y軸的方向相向的兩個側面的端面,具體而言為與擠壓面31或擠壓面32為相反側的下端面。如圖4(A)~圖4(H)所示,凸輪面81具備第1一致面84、傾斜面85及第2一致面86。第1一致面84為距擠壓面31或擠壓面32的距離固定為d1的在與其他擠壓體30之間一致的面。傾斜面85為與第1一致面84平緩地連續,距擠壓面31或擠壓面32的距離逐漸減少至d2的面。第2一致面86為距擠壓面31或擠壓面32的距離固定為d2的在與其他擠壓體30之間一致的面。第1一致面84的長度w隨著成為內側的擠壓體30而變長,伴隨於此,傾斜面85的開端的位置p及第2一致面86的開端的位置q沿著X軸偏移。這一情況意味著越成為內側的擠壓體30,後述的滾輪軸82到達傾斜面85的時機越遲。The
滾輪軸82與各擠壓體30的凸輪面81接觸,對各擠壓體30向抵抗施力構件70的方向施力,並且在與遠離方向交叉的方向,具體而言為在X軸方向移動。滾輪軸82具有橫跨形成有凸輪面81的兩側面的長度。當此滾輪軸82未到達傾斜面85時,也就是與第1一致面84接觸時,將所有擠壓體30向抵抗施力構件70的方向上推。若滾輪軸82到達各擠壓體30的傾斜面85,則由於施力構件70的施加力而各擠壓體30依次向遠離方向移動。本實施方式中,越成為內側的擠壓體30則滾輪軸82到達傾斜面85的時機越遲,因此從外側的擠壓體30起依次向遠離方向移動。The
此外,滾輪軸82的移動範圍為吸附面220的外緣的範圍內。本實施方式中,滾輪軸82在收容體210的內徑的範圍內移動。因此,凸輪面81也形成在此範圍內。另外,施力構件70根據凸輪面81的形狀,對一對伸出部60中的一者與另一者的施加力不同。也就是說,理論上當傾斜面85的位置位於各擠壓體30的中央時,若使配置於隔著各擠壓體30的位置的一對施力構件70的施加力同等,則防止各擠壓體30的傾斜。但是,當凸輪面81的位置偏離中央時,必須根據其偏離量而改變施力構件70的施加力。In addition, the moving range of the
例如,在其中一個伸出部60、滾輪軸82及另一個伸出部60之間,與力點、支點及作用點相同的關係成立。也就是說,當由一對施力構件70對兩側的伸出部60賦予同等的施加力,滾輪軸82位於中央時,施加力均等地作用於滾輪軸82的兩側,防止傾斜。相對於此,當滾輪軸82的位置偏向其中任一個伸出部60的位置時,相較於其中一個伸出部60而另一伸出部60距滾輪軸82的距離變遠。由於對兩個伸出部60賦予的施加力相同,因此距滾輪軸82的距離遠的另一伸出部60側的施加力強烈地發揮作用。因此,對於擠壓體30,產生傾斜的力發揮作用。此力的產生在擠壓體30為停止狀態時不成問題,但若在擠壓體30向遠離方向移動時產生,則成為妨礙順暢移動的原因而不佳。因此,使距傾斜面85遠的施力構件70的施加力比靠近傾斜面85的施力構件70的施加力更弱。也就是說,使用按壓力弱的壓縮線圈彈簧。For example, between one of the
施加力的強弱只要根據距傾斜面85的距離而決定即可。例如,可由一對施力構件70彼此之間的距離與距傾斜面85的距離的比率來決定施加力。也就是說,將一對施力構件70彼此之間的距離設為10時,若從其中一個施力構件70至傾斜面85的距離為4,從另一施力構件70至傾斜面85的距離為6,則只要以相對於其中一個施力構件70的施加力而另一施力構件70的施加力成為4/6倍的關係的方式設定即可。The strength of the applied force may be determined according to the distance from the
移動體83具有移動塊83a、軸承83b。移動塊83a為大致長方體形狀的構件,設置成通過線性導件53而在X方向可滑動移動。軸承83b設於移動體83的擠壓體30側,為可轉動地支撐滾輪軸82的沿著Y軸的方向的軸的構件。The moving
第2凸輪機構90為將第1驅動構件241的沿著遠離方向的移動(Z軸方向上的移動)轉換為滾輪軸82的與遠離方向交叉的方向(X軸方向)上的移動的機構。第2凸輪機構90具有滾輪92及與所述滾輪92接觸的傾斜面91,且為直動凸輪,所述直動凸輪將滾輪92及傾斜面91中的一者設為沿著共同的軸,也就是Z軸,移動的主動凸輪,將另一者設為在與Z軸交叉的方向(X軸方向)移動的從動凸輪。The
本實施方式的第2凸輪機構90具有傾斜面91、滾輪92、軸承93。傾斜面91設於移動塊83a的和擠壓體30為相反側的一面,且為相對於Z方向而傾斜的面。滾輪92通過與傾斜面91接觸並向靠近粘著片2的方向移動,而使移動塊83a向沿著X方向的圖示左方向移動(參照圖1)。The
軸承93可轉動地支撐滾輪92的沿著Y軸的方向的軸。軸承93固定於第1驅動構件241的端部。因此,隨著第1驅動構件241的移動,軸承93與滾輪92一併向粘著片2側移動。The bearing 93 rotatably supports the shaft of the
控制裝置300為控制拾取裝置1的各部的裝置。此控制裝置300例如可包含含有處理器(processor)、記憶體等的專用的電子電路或以規定的程式進行動作的電腦(computer)等。關於與由抽吸泵211進行的排氣有關的控制、由驅動機構240進行的驅動的控制、及由拾取機構100進行的拾取的控制等,將其控制內容程式設計,並將各種設定儲存在記憶體等儲存部。控制裝置300通過可程式設計邏輯控制器(Programmable Logic Controller,PLC)或中央處理器(Central Processing Unit,CPU)等處理裝置按照此種設定執行程式。The
[動作]
除了所述圖式以外,參照圖5(A)~圖8對以上那樣的本實施方式的拾取裝置1的動作進行說明。首先,通過驅動晶圓環的驅動機構,供拾取的電子零件3對準擠壓部230的擠壓面32,以粘著片2與吸附面220接觸的方式使粘著片2移動。所述移動是基於預先包含電子零件3的位置座標的地圖資訊而進行。[action]
In addition to the drawings, the operation of the
接著,如圖5(A)所示,通過利用抽吸泵211使抽吸力作用於抽吸孔221,而使粘著片2吸附於吸附面220。由此,粘著片2的與供拾取的電子零件3對應的部分吸附保持於吸附面220,電子零件3的區域也由擠壓體30的擠壓面31、擠壓面32吸附保持。Next, as shown in FIG. 5(A), by applying a suction force to the
這樣,利用吸附面220吸附保持粘著片2後,使拾取部4向電子零件3移動,利用吸附噴嘴8吸附供拾取的電子零件3的上表面。In this way, after the
接著,利用驅動機構240將第2驅動構件242向粘著片2側以預先設定的移動量驅動,由此如圖5(B)所示,將經框架50支撐的擠壓部230,也就是擠壓體30A~擠壓體30H,一起向粘著片2側上推。於是,擠壓體30的擠壓面31、擠壓面32均等地擠壓整個電子零件3,因此粘著片2的貼附有電子零件3的部分被擠出而超過吸附面220。Next, the
然後,利用驅動機構240將第1驅動構件241向粘著片2側驅動,由此如圖7(A)~圖7(C)所示,使滾輪92向粘著片2側移動。也就是說,使滾輪92沿著Z軸方向上升。圖中,以塗白箭頭表示其移動方向。於是,滾輪92對傾斜面91施力,因此移動體83的移動塊83a及軸承83b在X方向移動。圖中,以塗黑箭頭表示其移動方向。由此,滾輪軸82向沿著X方向的圖示左側移動。Then, by driving the first driving
這樣,若滾輪軸82移動,則如圖8所示,滾輪軸82從擠壓體30的第1一致面84沿著凸輪面81移動。於是,如圖5(C)、圖5(D)、圖5(E)、圖6(A)、圖6(B)、圖6(C)、圖6(D)所示,由於施力構件70的施加力,從外側的擠壓體30H起,擠壓體30G、擠壓體30F、擠壓體30E、擠壓體30D、擠壓體30C、擠壓體30B依次向遠離方向移動,也就是逐漸下降。In this way, when the
這樣,若擠壓體30依次移動,則由於抽吸泵211的抽吸力發揮作用,因此粘著片2的剝離從電子零件3的外周側向內周側進行。最終,如圖6(E)所示,僅最內周的擠壓體30A成為擠壓粘著片2的狀態,此擠壓體30A的擠壓面31的區域成為粘著片2的貼附於電子零件3的部分。In this way, when the squeezing
對於最內周的擠壓體30A的擠壓面31而言,其面積設定得非常小。因此,通過使吸附有電子零件3的吸附噴嘴8上升,而電子零件3從粘著片2容易地剝離。也就是說,擠壓體30A的擠壓面31設定為可抑制電子零件3所受的應力並使其剝離的大小。然後,通過使吸附噴嘴8上升,而能夠將電子零件3從粘著片2拾取。The area of the
[作用效果]
(1)本實施方式的拾取裝置1具有:拾取部4,拾取貼附於粘著片2的電子零件3;以及支承部200,與粘著片2的和電子零件3為相反側的一面相向地設置,支承部200具有:吸附面220,吸附保持粘著片2的與供拾取的電子零件3對應的區域;擠壓部230,與共同的軸呈同軸的嵌套狀地配設有多個擠壓體30,所述多個擠壓體30設置成在吸附面220內沿著共同的軸而可移動,且外形的大小不同;驅動機構240,進行擠壓動作及遠離動作,所述擠壓動作使擠壓部230移動而利用所有擠壓體30擠壓粘著片2,所述遠離動作從外側的擠壓體30起使鄰接的內側的擠壓體30向使電子零件3從粘著片2剝離的遠離方向移動;以及轉換機構250,設於驅動機構240,將沿著共同的軸移動的單一的第1驅動構件241的動作轉換為多個擠壓體30的遠離動作。[Effect]
(1) The
因此,能夠利用單一的第1驅動構件241的動作,使多個擠壓體30從外側起依次向遠離方向移動,從粘著片2剝離。因此,能夠防止裝置的複雜化或大型化,並且防止拾取時的電子零件3的破損。Therefore, by the operation of the single
(2)轉換機構250具有:至少一對伸出部60,從各擠壓體30的相反的側面向外伸出;施力構件70,對各擠壓體30的伸出部60向遠離方向個別地施力;以及第1凸輪機構80,由第1驅動構件241所驅動,從外側向內側依次允許各擠壓體30向遠離方向移動。(2) The
因此,利用施力構件70來按壓從擠壓體30的側面向外伸出的伸出部60,故,與以擠壓體30的內部進行按壓的情況相比,按壓位置的間隔變寬,能夠防止擠壓體30的搖晃等,實現移動的穩定化。Therefore, the urging
(3)第1凸輪機構80具有:凸輪面81,設於各擠壓體30的和擠壓於粘著片2的擠壓面31、擠壓面32為相反側的一面,沿著與共同的軸交叉的方向而在每個擠壓體30中形狀不同;以及滾輪軸82,與各擠壓體30的凸輪面81接觸,對各擠壓體30向抵抗施力構件70的方向施力,並且在與遠離方向交叉的方向移動。(3) The
因此,能夠隨著滾輪軸82的移動而使多個擠壓體30依次向遠離方向移動,故,與獨立地驅動各個擠壓體30的情況相比,能夠利用簡單且小型的裝置增加擠壓體30的個數而設為多階段。因此,在從粘著片2剝離相同面積的電子零件3時,能夠減小從外側剝離時的每一次的面積,並且能夠減小最後殘留的中央的擠壓面31的面積。由此,使剝離時對電子零件3施加的負載與剝離的速度的平衡適當,能夠防止電子零件3的破損。例如,即便將擠壓體30設為五個或五個以上,也能夠抑制裝置的複雜化或大型化,並且防止電子零件3的破損。此外,與將平板的板狀的刀片(blade)用作擠壓體的情況相比,同樣地能夠減小最後殘留的中央的擠壓面31的面積。例如,本實施方式中,能夠相對於電子零件3的貼附於粘著片2的面的面積,將由最內周的擠壓體30A的擠壓面31殘留而未剝離的粘著片2的面積設為小於或等於0.5%。Therefore, the plurality of
(4)滾輪軸82的移動範圍為吸附面220的外緣的範圍內。因此,能夠防止拾取裝置1在與多個擠壓體30移動的共同的軸正交的方向即X軸方向大型化。(4) The moving range of the
(5)根據凸輪面81的形狀,施力構件70對一對伸出部60中的一者與另一者的施加力不同。因此,能夠以不產生各擠壓體30的傾斜的方式設定施力構件70的施加力,實現順利的動作。(5) Depending on the shape of the
(6)最外側的擠壓體30的一對伸出部60設於最外側,隨著成為內側的擠壓體30,而依次在內側設有伸出部60。越是外側的擠壓體30則俯視時的大小越變大,因此搖晃時的擠壓面31的位移量也變大。本實施方式中,越是外側的伸出部60則間隔越變寬,因此能夠防止傾斜而使擠壓面31穩定。(6) The pair of
(7)轉換機構250具有:第2凸輪機構90,將第1驅動構件241的沿著共同的軸的方向上的移動轉換為滾輪軸82的與遠離方向交叉的方向上的移動。因此,能夠將驅動機構240的第1驅動構件241的移動設為共同的軸方向即Z軸方向,防止與其正交的方向即X軸方向的空間的擴大。(7) The
(8)第2凸輪機構90具有滾輪92及與所述滾輪92接觸的傾斜面91,且為直動凸輪,所述直動凸輪將滾輪92及傾斜面91中的任一者設為沿著共同的軸移動的主動凸輪,將另一者設為在與所述共同的軸交叉的方向移動的從動凸輪。因此,能夠利用簡單的構成將軸方向的動作轉換為滾輪軸82的動作。此外,也可將傾斜面91設為主動凸輪,將滾輪92設為從動凸輪。(8) The
(9)擠壓部230具備五個或五個以上的擠壓體30A~30H,最外側的擠壓體30H形成為擠壓面32的大小與電子零件3的貼附於粘著片2的面的大小,也就是電子零件3的外形,相同或略小,最內側的擠壓體30A形成為擠壓面31的面積成為電子零件3的貼附於粘著片2的面的面積的30%或30%以下的大小。(9) The
由於如此構成,因而能夠將粘著片2從電子零件3逐次少量地剝離,並且能夠減小最終未從電子零件3剝落而殘留的粘著片2的面積,因此即便是厚度薄的電子零件3也可抑制應力並使其剝離。這種構成對於使一邊的長度超過5 mm那樣的相對較大尺寸且厚度為小於或等於50 μm那樣的薄型的電子零件3的拾取特別有效。此外,若將最內側的擠壓體30A的擠壓面31的面積設定為電子零件3的面積的5%或5%以下,並以使筒狀的擠壓體30的側壁的厚度成為小於或等於0.6 mm的方式設定其個數,則能夠更進一步提高對應力的可靠性。也就是說,能夠更進一步提高電子零件3的破損的抑制效果。Due to this structure, the
[第2實施方式]
參照圖9,作為第2實施方式,對具備第1實施方式的拾取裝置1的安裝裝置400進行說明。以下的說明中,將沿著垂直方向的直線的方向設為Z軸方向,將與Z軸方向正交的水平方向的平面中沿著彼此正交的兩直線的方向設為X軸方向、Y軸方向。[Second Embodiment]
9, as a second embodiment, a mounting
安裝裝置400除了拾取裝置1及控制裝置300以外,具有供給裝置500、中間平台600、基板平台700及安裝機構800。供給裝置500為保持貼附保持有半導體晶片等電子零件3的粘著片2的裝置。供給裝置500具有晶圓環510、晶圓台520及未圖示的驅動機構。晶圓環510為保持貼附有經單片化的電子零件3的粘著片2的構件。晶圓台520為可移動地支撐晶圓環510的裝置。驅動機構在X軸、Y軸及Z軸方向可移動地支撐晶圓台520,使晶圓環510沿著X軸、Y軸及Z軸移動。In addition to the
中間平台600為在將由拾取裝置1的吸附噴嘴8吸附保持的電子零件3交付至安裝機構800時,暫時載置電子零件3的平台。基板平台700為載置基板710的構件。也就是說,為支撐供安裝電子零件3的基板710的構件。基板平台700支撐於未圖示的XYθ方向移動機構,設置成在X軸方向、Y軸方向、θ(水平旋轉)方向可移動。The
安裝機構800為將由拾取裝置1所取出的電子零件3安裝於基板710的機構。安裝機構800從中間平台600上吸附保持電子零件3,並將吸附保持的電子零件3安裝於經基板平台700所支撐的基板710上的規定位置。安裝機構800具有安裝工具810及未圖示的XYZ驅動機構。安裝工具810為吸附保持電子零件3的吸附噴嘴。XYZ驅動機構為使安裝工具810在X軸方向、Y軸方向、Z軸方向移動的機構。The mounting
拾取裝置1為與所述第1實施方式相同的構成。另外,控制裝置300是對第1實施方式的控制裝置300附加了控制供給裝置500、基板平台700、安裝機構800的功能。The
此種安裝裝置400中,拾取裝置1如上文所述那樣,從經供給裝置500的晶圓台520所支撐的晶圓環510上拾取電子零件3。拾取裝置1將所拾取的電子零件3經由中間平台600而交付至安裝機構800的安裝工具810。安裝工具810安裝於基板平台700上的基板710。安裝裝置400依次反復執行此種電子零件3的拾取、交付、向基板710的安裝的動作。In this mounting
此種安裝裝置400中,能夠發揮與所述第1實施方式相同的作用效果。進而,由於所述作用效果,而能夠實現安裝裝置400對電子零件3的安裝品質的提高及安裝可靠性的提高,甚至能夠實現將電子零件3安裝於基板710所製造的半導體封裝等電子零件製品的品質的提高。In this type of mounting
[變形例]
本實施方式也可適用於以下那樣的變形例。例如,粘著片2的支撐方向、拾取機構100的拾取方向、支承部200的第1驅動構件241、第2驅動構件242的驅動方向、擠壓體30的移動方向可為垂直方向,也可為水平方向,也可為相對於這些方向而傾斜的方向。[Modifications]
This embodiment can also be applied to the following modification examples. For example, the support direction of the
另外,所述形態中,利用第1驅動構件241及轉換機構250使擠壓體30從外側的擠壓體30H起向鄰接的內側的擠壓體30G、擠壓體30F……、依次向遠離方向移動,也就是下降,但不限於此。例如,也可從位於內側的擠壓體30A起使鄰接的外側的擠壓體30B、擠壓體30C……、依次下降,也可從中間的擠壓體30起使鄰接的外側的擠壓體30和內側的擠壓體30依次下降。另外,關於使各擠壓體30下降的時機,不限於以均等的時間間隔下降,也可使每個擠壓體30下降的時間間隔不同。例如,也可電子零件3與粘著片2接觸的面積越小,則越縮短使擠壓體30下降的時間間隔。更具體而言,也可越從外側靠近內側,則越縮短使擠壓體30下降的時間間隔。In addition, in the above-mentioned form, the
進而,擠壓體30移動的遠離方向只要為使電子零件3從粘著片2剝離的方向即可,不限定於與擠壓的方向相反的方向。例如,也可使擠壓體30向擠壓方向移動,也就是上升。也就是說,也可設為相對於外側的擠壓體30H而越靠內側的擠壓體30,則依次上升得越高。另外,也可使擠壓體30進行上升與下降。例如,所述形態中,也可在凸輪面81形成使各擠壓體30以相同時機上升規定量的傾斜面,以使各擠壓體30一起上升規定量後,從外側的擠壓體30H起依次下降的方式動作。若這樣構成,則能夠省略第2驅動構件242。Furthermore, the direction in which the extruded
此種擠壓體30的動作方式的變更只要對每個擠壓體30適當變更凸輪面81的形狀,所謂凸輪曲線即可。例如,所述形態中,若欲縮短使各擠壓體30下降的時間間隔,則只要縮短各擠壓體30間的凸輪面81的傾斜面85的相對間隔即可。另外,若欲增大擠壓體30的下降量,則只要增大第2一致面86相對於第1一致面84的高低差即可。這樣,若採用利用凸輪面81來進行控制的構成,則能夠通過各擠壓體30的凸輪面81的凸輪曲線的變更來自由地設定各擠壓體30的上推量或遠離量、上推或遠離的時機。To change the operation mode of the
另外,所述形態中,將擠壓體30形成為矩形的筒狀、或矩形的柱狀,但不限於此,也可形成為圓筒狀或圓柱狀、或者矩形以外的方筒狀或角柱狀。例如,當將擠壓體30設為圓筒狀及圓柱狀時,所謂各擠壓體30的相反的側面,成為位於相對於各擠壓體30的包含共同的軸的平面而垂直相交的直線上的兩個側面。因此,在圓筒狀的擠壓體30中如所述實施方式那樣在擠壓體30的側面的外側設有伸出部60時,伸出部60成為設置成與圓筒的側面接觸。In addition, in the above-mentioned form, the extruded
此外,對本發明的若干實施方式進行了說明,但這些實施方式是作為示例而提示,並非意在限定發明的範圍。這些新穎的實施方式也能以其他各種形態實施,可在不偏離發明主旨的範圍內進行各種省略、替換、變更。這些實施方式或其變形包含在發明的範圍或主旨內,並且也包含在申請專利範圍所記載的發明及其均等範圍內。In addition, although some embodiments of the present invention have been described, these embodiments are presented as examples and are not intended to limit the scope of the invention. These novel embodiments can also be implemented in various other forms, and various omissions, substitutions, and changes can be made without departing from the spirit of the invention. These embodiments or their modifications are included in the scope or gist of the invention, and are also included in the invention described in the scope of patent applications and their equivalent scope.
1:拾取裝置2:粘著片 3:電子零件4:拾取部 5:主體部6:凸部 7、221:抽吸孔8:吸附噴嘴 8a:平坦面9:噴嘴孔 30、30A~30H:擠壓體31、32:擠壓面 33:第1凸部34:第2凸部 35:凹部36:缺口 50:框架51:支撐塊 51a:導孔51b:突出部 52:第1支撐板53:線性導件 54:第2支撐板60:伸出部 70:施力構件80:第1凸輪機構 81:凸輪面82:滾輪軸 83:移動體83a:移動塊 83b、93:軸承84:第1一致面 85、91:傾斜面86:第2一致面 90:第2凸輪機構92:滾輪 100:拾取機構200:支承部 210:收容體211:抽吸泵 220:吸附面222:開口部 230:擠壓部240:驅動機構 241:第1驅動構件242:第2驅動構件 250:轉換機構300:控制裝置 400:安裝裝置500:供給裝置 510:晶圓環520:晶圓台 600:中間平台700:基板平台 710:基板800:安裝機構 810:安裝工具d1、d2:距離 p、q:位置w:長度1: Pickup device 2: Adhesive sheet 3: Electronic parts 4: Pickup part 5: Main body part 6: Convex part 7, 221: Suction hole 8: Adsorption nozzle 8a: flat surface 9: nozzle hole 30, 30A~30H: Extrusion body 31, 32: Extrusion surface 33: The first convex part 34: The second convex part 35: recess 36: notch 50: frame 51: support block 51a: guide hole 51b: protrusion 52: The first support plate 53: Linear guide 54: second support plate 60: extension 70: Force applying member 80: No. 1 cam mechanism 81: Cam surface 82: Roller shaft 83: moving body 83a: moving block 83b, 93: bearing 84: first consistent surface 85, 91: Inclined surface 86: Second consistent surface 90: 2nd cam mechanism 92: Roller 100: Pickup mechanism 200: Support part 210: containment body 211: suction pump 220: suction surface 222: opening 230: Squeeze part 240: Drive mechanism 241: The first drive member 242: The second drive member 250: Conversion mechanism 300: Control device 400: Installation device 500: Supply device 510: Wafer ring 520: Wafer table 600: Intermediate platform 700: Substrate platform 710: base plate 800: mounting mechanism 810: installation tools d1, d2: distance p, q: position w: length
圖1為表示第1實施方式的電子零件的拾取裝置的概略構成的透視正視圖。 圖2為表示第1實施方式的吸附面的平面圖。 圖3為表示第1實施方式的擠壓體的平面圖。 圖4(A)~圖4(H)為表示第1實施方式的擠壓體的分解圖,左側為正視圖,右側為側面圖。 圖5(A)~圖5(E)為表示擠壓體的動作順序的說明圖。 圖6(A)~圖6(E)為表示擠壓體的動作順序的說明圖。 圖7(A)~圖7(C)為表示第1實施方式的第2凸輪機構的動作說明圖。 圖8為表示第1實施方式的第1凸輪機構的動作說明圖。 圖9為表示第2實施方式的安裝裝置的構成圖。FIG. 1 is a perspective front view showing a schematic configuration of a pickup device for electronic components according to the first embodiment. Fig. 2 is a plan view showing the suction surface of the first embodiment. Fig. 3 is a plan view showing the extruded body of the first embodiment. 4(A) to 4(H) are exploded views showing the extruded body of the first embodiment, the left side is a front view, and the right side is a side view. 5(A) to 5(E) are explanatory diagrams showing the operation sequence of the extruded body. 6(A) to 6(E) are explanatory diagrams showing the operation sequence of the extruded body. 7(A) to 7(C) are operation explanatory diagrams showing the second cam mechanism of the first embodiment. Fig. 8 is an explanatory diagram showing the operation of the first cam mechanism of the first embodiment. Fig. 9 is a configuration diagram showing a mounting device according to a second embodiment.
1:拾取裝置 1: Pickup device
2:粘著片 2: Adhesive sheet
3:電子零件 3: electronic parts
4:拾取部 4: Pickup part
5:主體部 5: Main body
6:凸部 6: Convex
7:抽吸孔 7: Suction hole
8:吸附噴嘴 8: Adsorption nozzle
8a:平坦面 8a: flat surface
9:噴嘴孔 9: Nozzle hole
50:框架 50: Frame
51:支撐塊 51: Support block
51a:導孔 51a: pilot hole
51b:突出部 51b: protrusion
52:第1支撐板 52: The first support plate
53:線性導件 53: Linear guide
54:第2支撐板 54: The second support plate
60:伸出部 60: Overhang
70:施力構件 70: force component
80:第1凸輪機構 80: 1st cam mechanism
81:凸輪面 81: cam surface
82:滾輪軸 82: roller shaft
83:移動體 83: moving body
83a:移動塊 83a: Move block
83b、93:軸承 83b, 93: Bearing
84:第1一致面 84: First Consistent Side
85、91:傾斜面 85, 91: Inclined surface
86:第2一致面 86: Second Consistency
90:第2凸輪機構 90: 2nd cam mechanism
92:滾輪 92: scroll wheel
100:拾取機構 100: Pickup mechanism
200:支承部 200: Support
210:收容體 210: Containment
211:抽吸泵 211: Suction Pump
220:吸附面 220: Adsorption surface
230:擠壓部 230: Squeeze part
240:驅動機構 240: drive mechanism
241:第1驅動構件 241: The first drive member
242:第2驅動構件 242: The second drive member
250:轉換機構 250: conversion mechanism
300:控制裝置 300: control device
Claims (12)
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JP5075013B2 (en) | 2008-05-27 | 2012-11-14 | ルネサスエレクトロニクス株式会社 | Manufacturing method of semiconductor integrated circuit device |
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JP2013171996A (en) * | 2012-02-21 | 2013-09-02 | Shibaura Mechatronics Corp | Pickup device and pickup method for semiconductor chip |
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JP6637397B2 (en) * | 2016-09-12 | 2020-01-29 | ファスフォードテクノロジ株式会社 | Semiconductor manufacturing apparatus and semiconductor device manufacturing method |
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JPH06338527A (en) * | 1993-05-28 | 1994-12-06 | Toshiba Corp | Semiconductor chip takeout device |
JP2007220905A (en) * | 2006-02-16 | 2007-08-30 | Shibuya Kogyo Co Ltd | Pickup device of tabular article |
WO2008053673A1 (en) * | 2006-10-31 | 2008-05-08 | Shibaura Mechatronics Corporation | Pickup device for semiconductor chip |
JP2016195233A (en) * | 2015-11-30 | 2016-11-17 | 富士ゼロックス株式会社 | Semiconductor production device and semiconductor chip production method |
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KR102330577B1 (en) | 2021-11-25 |
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