TWI699265B - Cutting device - Google Patents
Cutting device Download PDFInfo
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- TWI699265B TWI699265B TW105107380A TW105107380A TWI699265B TW I699265 B TWI699265 B TW I699265B TW 105107380 A TW105107380 A TW 105107380A TW 105107380 A TW105107380 A TW 105107380A TW I699265 B TWI699265 B TW I699265B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
- B28D5/023—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels with a cutting blade mounted on a carriage
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0076—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for removing dust, e.g. by spraying liquids; for lubricating, cooling or cleaning tool or work
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67706—Mechanical details, e.g. roller, belt
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67715—Changing the direction of the conveying path
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/6773—Conveying cassettes, containers or carriers
Abstract
提供使裝置全體之構成單純而小型化,同時 可以減少零件數量而降低製造成本的切削裝置。 Provides a simple and compact structure of the entire device, while A cutting device that can reduce the number of parts and reduce manufacturing costs.
為一種切削裝置,具備:載置收容有複 數之被加工物的卡匣之卡匣載置機構,和從被載置在卡匣載置機構之卡匣搬岀及搬入被加工物之搬岀、搬入機構,和暫時放置藉由搬岀、搬入機構被搬岀之被加工物的暫時放置機構,和保持被暫時放置在暫時放置機構之被加工物的保持台,和使保持台在加工進給方向移動的加工進給機構,和對被保持在保持台之被加工物施予切削加工之第一切削手段及第二切削手段,和使第一切削手段及第二切削手段分別在分度進給方向移動之分度進給手段,第一切削手段及第二切削手段分別具備:分度移動基台,和分別被配設在分度移動基台且互相被配設在相同軸線上之切削刀,第一切削手段之分度移動基台及第二切削手段之分度移動基台被支撐成能夠在沿著Y軸方向而配設的Y軸導軌上移動,分度進給手段係由沿著Y軸導軌而配設之共同 之Y軸線性軌道,和以能夠移動之方式被嵌插於Y軸線性軌道之且被安裝在第一切削手段之分度移動基台的第一Y軸線圈可動件,和以能夠移動之方式被嵌插於Y軸線性軌道且被安裝於第二切削手段之分度移動基台的第Y軸二線圈可動件所構成。 It is a kind of cutting device, with: The cassette placement mechanism for the cassettes of several workpieces, and the cassette loading mechanism that is placed in the cassette placement mechanism, and the transporting mechanism for the workpiece to be processed, and the temporary placement by transport , The temporary placement mechanism of the workpiece being moved in the loading mechanism, and the holding table that holds the workpiece temporarily placed in the temporary placement mechanism, and the processing feed mechanism that moves the holding table in the processing feed direction, and The first and second cutting means for cutting the workpiece held on the holding table, and the indexing feed means that move the first and second cutting means in the indexing feed direction, respectively, The first cutting means and the second cutting means are provided with an indexing moving base, and cutting tools respectively arranged on the indexing moving base and arranged on the same axis. The indexing movement of the first cutting means The indexing moving base of the base and the second cutting means is supported so as to be movable on the Y-axis guide rail arranged along the Y-axis direction, and the indexing and feeding means are jointly arranged by the Y-axis guide rail. The Y-axis linear rail, and the first Y-axis coil movable member inserted in the Y-axis linear rail in a movable manner and installed on the indexing movable base of the first cutting means, and in a movable manner The Y-axis two-coil movable element is inserted into the Y-axis linear rail and installed on the indexing moving base of the second cutting means.
Description
本發明係關於用以切削半導體晶圓等之被加工物的切削裝置。 The present invention relates to a cutting device for cutting a workpiece such as a semiconductor wafer.
在半導體裝置製造工程中,藉由格子狀地被配列在為略圓板形狀之半導體晶圓之表面上的分割預定線區劃岀複數區域,在該被區劃之區域形成IC、LSI等之裝置。而且,藉由沿著分割預定線切斷半導體晶圓,分割形成有裝置的區域而製造岀各個半導體裝置。 In the semiconductor device manufacturing process, a plurality of regions are divided by predetermined dividing lines arranged in a grid on the surface of a semiconductor wafer having a substantially circular plate shape, and devices such as ICs, LSIs, etc. are formed in the divided regions. Then, each semiconductor device is manufactured by cutting the semiconductor wafer along the planned dividing line to divide the area where the device is formed.
沿著分割預定線切斷半導體晶圓等之被加工物的切削裝置,具備:載置收容有複數之被加工物的卡匣之卡匣載置手段,和從被載置在該卡匣載置手段之卡匣搬岀及搬入被加工物之搬岀、搬入手段,和暫時放置藉由該搬岀、搬入手段被搬岀之被加工物的暫時放置手段,和保持被暫時放置在該暫時放置手段之被加工物的保持台,和對被保持在該保持台之被加工物施予切削加工的第一切削手段及第二切削手段,和使該保持台在加工進給方向進行加工進給的加工進給手段,和使第一切削手段及第二切削 手段在與加工進給方向正交之分度進給方向進行分度進給之第一分度進給手段及第二分度進給手段,可以沿著分割預定線效率佳地切斷半導體晶圓等之被加工物切斷而分割成各個裝置(例如,參照專利文獻1)。 A cutting device that cuts processed objects such as semiconductor wafers along the planned dividing line includes: a cassette mounting means for placing a cassette accommodating a plurality of processed objects, and a cutting device that is mounted on the cassette The means of carrying cassettes and the means of carrying in the object to be processed, and the means of temporarily placing the object to be processed by the means of carrying and carrying in, and the means of keeping the object temporarily placed in the temporary The holding table for the workpiece to be held by the means, and the first cutting means and the second cutting means for cutting the workpiece held on the holding table, and the holding table for machining in the machining feed direction The processing feed means, and the first cutting means and the second cutting The first indexing feed means and the second indexing feed means that perform indexing in the indexing feed direction orthogonal to the processing feed direction can efficiently cut the semiconductor crystal along the planned dividing line The to-be-processed object, such as a circle, is cut|disconnected and divided into each apparatus (for example, refer patent document 1).
[專利文件1]日本特開平11-26402號公報 [Patent Document 1] Japanese Patent Laid-Open No. 11-26402
然而,上述切削裝置中,尤其用以使第一切削手段及第二切削手段在加工進給方向進行加工進給之第一分度進給手段及第二分度進給手段,因藉由滾珠螺桿機構所構成,故有零件數量變多,製造成本變高,同時裝置全體之構成複雜且大型化之問題。 However, in the above-mentioned cutting device, in particular, the first indexing feed means and the second indexing feed means for making the first cutting means and the second cutting means perform processing and feeding in the machining feed direction are due to the use of balls The screw mechanism is constituted, so the number of parts increases, the manufacturing cost increases, and the overall structure of the device is complicated and large-scale.
本發明係鑒於上述情形而創作岀,其主要技術性課題在於提供用以使第一切削手段及第二切削手段在加工進給方向進行加工進給之第一分度進給手段及第二分度進給手段之構成單純化而成為小型化,同時可以減少零件數量,降低製造成本的切削裝置。 The present invention was created in view of the above situation, and its main technical subject is to provide a first indexing feed means and a second indexing feed means for processing the first cutting means and the second cutting means in the machining feed direction. The structure of the high-speed feeding means is simplified to become a cutting device that is miniaturized, while reducing the number of parts and reducing the manufacturing cost.
為了解決上述主要技術課題,若藉由本發明 時,提供一種切削裝置,具備:載置收容有複數之被加工物的卡匣之卡匣載置機構,和從被載置在該卡匣載置機構之卡匣搬岀及搬入被加工物之搬岀、搬入機構,和暫時放置藉由該搬岀、搬入機構被搬岀之被加工物的暫時放置機構,和保持被暫時放置在該暫時放置機構之被加工物的保持台,和使該保持台在加工進給方向(X軸方向)移動的加工進給機構,和對被保持在該保持台之被加工物施予切削加工之第一切削手段及第二切削手段,和使該第一切削手段及第二切削手段分別在與X軸方向正交之分度進給方向(Y軸方向)移動之分度進給手段,該切削裝置之特徵在於:該第一切削手段及第二切削手段分別具備:分度移動基台,和分別被配設在該分部移動基台且互相被配設在相同軸線上之切削刀,該第一切削手段之分度移動基台及該第二切削手段之分度移動基台被支撐成能夠在沿著Y軸方向而配設的Y軸導軌上移動,該分度進給手段係由沿著該Y軸導軌而配設之共同之Y軸線性軌道,和以能夠移動之方式被嵌插於該Y軸線性軌道且被安裝在該第一切削手段之分度移動基台的第一Y軸線圈可動件,和以能夠移動之方式被嵌插於該Y軸線性軌道且被安裝於該第二切削手段之分度移動基台的第二Y軸線圈可動件所構成。 In order to solve the above-mentioned main technical problems, if the present invention At the time, a cutting device is provided, which is provided with: a cassette loading mechanism for loading cassettes containing plural workpieces, and carrying in and from the cassettes placed on the cassette loading mechanism. The moving and moving mechanism, and the temporary placement mechanism for temporarily placing the processed object that is moved by the moving and moving mechanism, and the holding table that holds the processed object temporarily placed in the temporary placement mechanism, and The machining feed mechanism in which the holding table moves in the machining feed direction (X-axis direction), and the first cutting means and the second cutting means that apply cutting to the workpiece held on the holding table, and make the The first cutting means and the second cutting means respectively move in the indexing feed direction (Y-axis direction) orthogonal to the X-axis direction. The cutting device is characterized in that: the first cutting means and the first cutting means The two cutting means respectively include: an indexing moving base, and cutting tools respectively arranged on the divided moving base and mutually arranged on the same axis, the indexing moving base of the first cutting means and the The indexing moving base of the second cutting means is supported so as to be movable on the Y-axis guide rail arranged along the Y-axis direction, and the indexing feed means is shared by the Y-axis guide rail arranged along the Y-axis direction. The Y-axis linear rail, and the first Y-axis coil movable member inserted in the Y-axis linear rail in a movable manner and mounted on the index moving base of the first cutting means, and in a movable manner The second Y-axis coil movable element is inserted into the Y-axis linear rail and is installed on the indexing moving base of the second cutting means.
上述加工進給機構係由在配設有暫時放置機構之被加工物拆裝區域,和配設有該第一切削手段及第二 切削手段之加工區域之間以能夠移動之方式支撐配設有保持台之移動基台的X軸導軌;和沿著該X軸導軌而被配設之X軸線性軌道,和以能夠移動之方式被嵌插於該X軸線性軌道且被安裝於移動基台之X軸線圈可動件所構成。 The above-mentioned processing and feeding mechanism consists of the disassembly and assembly area of the workpiece equipped with a temporary placement mechanism, and the first cutting means and the second Between the processing areas of the cutting means, the X-axis guide rail provided with the movable base of the holding table is supported in a movable manner; and the X-axis linear rail is arranged along the X-axis guide rail, and in a movable manner The X-axis coil movable element is inserted into the X-axis linear rail and is installed on the movable base.
上述卡匣載置機構和暫時放置機構係在Y軸方向相鄰接而被配設,上述搬岀、搬入機構具備:支撐基台;被配設在該支撐基台,把持被收容在卡匣之被加工物的把持構件;將被加工物限制在規定之位置的一對限制銷;及使該支撐基台在Y軸方向移動之搬運移動手段,上述暫時放置機構具備:在Y軸方向延伸並具有支撐被加工物之兩側部的底部和側部,且底部被構成能夠開關之一對支撐軌道;和開關該一對支撐軌道之底部的開關手段;和使一對支撐軌道在上下方向移動之升降手段。 The cassette mounting mechanism and the temporary placement mechanism are arranged adjacent to each other in the Y-axis direction, and the carrying and carrying mechanism includes: a support base; is arranged on the support base and holds the cassette being housed The holding member of the processed object; a pair of restriction pins that restrict the processed object to a predetermined position; and the conveying and moving means for moving the support base in the Y-axis direction. The above-mentioned temporary placement mechanism includes: extending in the Y-axis direction It also has a bottom and side parts that support both sides of the workpiece, and the bottom is configured to be able to open and close a pair of support rails; and a switch means for opening and closing the bottom of the pair of support rails; and make the pair of support rails move up and down Moving lifting means.
上述保持台被定位在被加工物拆裝區域之時,藉由搬岀、搬入機構,搬岀被收容在卡匣之被加工物而暫時放置在構成暫時放置機構之一對支撐軌道,並藉由升降手段使一對支撐軌道下降而將被加工物載置在保持台,且藉由開關手段開啟底部,將被加工物保持在該保持台。 When the above-mentioned holding table is positioned in the disassembly and assembly area of the workpiece, the workpiece is housed in the cassette and temporarily placed on one of the pair of support rails that constitute the temporary placement mechanism by the carrying and carrying mechanism. The pair of supporting rails are lowered by the lifting means to place the workpiece on the holding table, and the bottom is opened by the switch means to hold the workpiece on the holding table.
以與上述暫時放置機構相鄰接之方式,在相對於卡匣載置機構為Y軸方向相反側上具備用以洗淨被加工物之旋轉台的洗淨機構,同時在該洗淨機構之正上方配設有被構成與暫時放置機構連通,且暫時放置被加工物之 輔助暫時放置機構,輔助暫時放置機構具備:在Y軸方向延伸並具有支撐被加工物之兩側部的底部和側部,且底部被構成能夠開關之一對輔助支撐軌道;和開關該一對輔助支撐軌道之底部的開關手段;和使一對輔助支撐軌道在上下方向移動之輔助升降手段。 Adjacent to the above-mentioned temporary placement mechanism, a cleaning mechanism is provided on the opposite side of the Y-axis direction with respect to the cassette placement mechanism to clean the object to be processed. At the same time, in the cleaning mechanism Directly above is equipped with a structure that communicates with the temporary placement mechanism, and temporarily places the processed object Auxiliary temporary placement mechanism. The auxiliary temporary placement mechanism is provided with a bottom and side portions extending in the Y-axis direction and supporting both sides of the workpiece, and the bottom is configured to be capable of opening and closing a pair of auxiliary support rails; and opening and closing the pair The switch means for the bottom of the auxiliary support rail; and the auxiliary lifting means for moving a pair of auxiliary support rails up and down.
上述搬岀、搬入機構具備:被配設在支撐基台且把持在被支撐於一對輔助支撐軌道之被加工物中與藉由把持構件被把持之區域相反側之區域的輔助把持構件,和將被支撐於一對輔助支撐軌道之被加工物限制在規定之位置的一對輔助限制銷。 The above-mentioned carrying and carrying mechanism is provided with an auxiliary holding member arranged on the support base and holding an area on the opposite side of the workpiece supported by a pair of auxiliary support rails from the area held by the holding member, and A pair of auxiliary restriction pins that restrict the workpiece supported on a pair of auxiliary support rails to a specified position.
於保持切削完之被加工物之保持台被定位在被加工物拆裝區域之時,在構成暫時放置機構之一對支撐軌道之底部呈開啟之狀態下,使一對支撐軌道下降而將底部定位在切削完之被加工物之下部之後,在使該底部關閉而支撐切削完之被加工物之狀態下,使該一對支撐軌道上升,接著,將把持藉由搬岀、搬入機構之該把持構件而把持被收容在卡匣之被加工物,同時將被設置在支撐基台之一對輔助限制銷定位在切削完之被加工物中與藉由把持構件被把持之區域相反側之區域的端面,且藉由使支撐基台移動至輔助暫時放置機構側,將被收容在卡匣之被加工物定位在暫時放置機構,同時將切削完之被加工物定位在輔助暫時放置機構,接著,藉由構成輔助暫時放置機構之輔助升降手段暫 時放置在一對輔助支撐軌道,並藉由升降手段使一對輔助支撐軌道下降而將被加工物載置在洗淨機構之旋轉台,且藉由開關手段開啟底部使切削完之被加工物保持在旋轉台。 When the holding table that holds the cut workpiece is positioned in the disassembly area of the workpiece, the bottom of the pair of support rails that constitutes the temporary placement mechanism is opened, and the pair of support rails is lowered to lower the bottom After positioning at the lower part of the cut workpiece, the pair of support rails are raised while the bottom is closed to support the cut workpiece, and then the holding is carried out by the moving and moving mechanism. The holding member is used to hold the workpiece contained in the cassette, and at the same time, a pair of auxiliary restriction pins provided on the support base are positioned in the area opposite to the area held by the holding member from the cut workpiece By moving the support base to the side of the auxiliary temporary placement mechanism, the processed object contained in the cassette is positioned in the temporary placement mechanism, and the cut processed object is positioned in the auxiliary temporary placement mechanism. Then , Temporarily by means of auxiliary lifting means constituting auxiliary temporary placement mechanism When placed on a pair of auxiliary support rails, the pair of auxiliary support rails are lowered by the lifting means to place the processed object on the rotating table of the cleaning mechanism, and the bottom is opened by the switch means to cut the processed object Keep it on the rotating table.
上述洗淨機構具備被配設在旋轉台之上方的噴射洗淨水之噴射噴嘴,噴射噴嘴藉由被配設在構成搬岀、搬入機構之支撐基台且選擇性地進行卡合的卡合手段,隨著支撐基台之移動,在Y軸方向移動,至少對從被加工物之外周至中心的區域噴射洗淨水。 The above-mentioned washing mechanism is equipped with a spray nozzle for spraying washing water arranged above the rotating table. The spray nozzle is arranged on the support base constituting the carrying and carrying mechanism and is selectively engaged with each other. The method moves in the Y-axis direction with the movement of the support base, and sprays washing water to at least the area from the outer periphery to the center of the workpiece.
在上述洗淨機構之噴射噴嘴經滑輪連結一端與錘體連結的接線之另一端,且被構成藉由錘體之重力在Y軸方向移動, 上述卡合手段具備以能夠進退之方式被配設在支撐基台的卡合桿,在卡合桿進出之狀態下從噴射噴嘴中藉由錘體之重力而移動的方向使接觸。 The jet nozzle of the above-mentioned cleaning mechanism is connected to the other end of the wire connecting one end to the hammer body via a pulley, and is configured to move in the Y-axis direction by the weight of the hammer body, The above-mentioned engagement means is provided with an engagement lever arranged on the support base so as to be able to advance and retreat, and contact is made from the spray nozzle in the direction of movement by the weight of the hammer in a state where the engagement lever is moved in and out.
藉由本發明之切削裝置被構成上述般,由於使第一切削手段及第二切削手段分別在與加工進給方向正交之分度進給方向之分度進給手段,係由沿著Y軸導軌而被配設之共同的Y軸線性軌道,和以能夠移動之方式被嵌插於該Y軸線性軌道且被安裝於第一切削手段之分度移動基台之第一Y軸線圈可動件,和以能夠移動之方式被嵌插於Y軸線性軌道且被安裝於第二切削手段之分度移動基台 的第二Y軸線圈可動件所構成,所以不使用滾珠螺桿機構,可以減少零件數量,降低製造成本,可以謀求裝置之小型化。 The cutting device of the present invention is constituted as described above, since the indexing feed means of the first cutting means and the second cutting means respectively in the indexing feed direction orthogonal to the machining feed direction are along the Y axis A common Y-axis linear track on which the guide rail is arranged, and a first Y-axis coil movable member that is inserted into the Y-axis linear track in a movable manner and is mounted on the indexing moving base of the first cutting means , And the indexing moving abutment that is inserted into the Y-axis linear rail in a movable manner and installed on the second cutting means The second Y-axis coil movable element is constructed, so the ball screw mechanism is not used, the number of parts can be reduced, the manufacturing cost can be reduced, and the device can be miniaturized.
2:靜止基台 2: Static abutment
3:保持台機構 3: Keep the Taiwan mechanism
32:移動基台 32: mobile abutment
34:保持台 34: hold the stage
35:加工進給手段 35: Processing feed means
351:X軸線性軌道 351: X axis linear orbit
352:X軸線圈可動件 352: X-axis coil movable part
4:切削機構 4: Cutting mechanism
5a:第一切削手段 5a: The first cutting method
5b:第二切削手段 5b: The second cutting method
54:分度進給手段 54: Indexing feed method
540:共同之Y軸線性軌道 540: Common Y-axis linear orbit
544a:第一Y軸線圈可動件 544a: first Y-axis coil movable part
544b:第二Y軸線圈可動件 544b: second Y-axis coil movable part
6:卡匣載置機構 6: Cassette mounting mechanism
60:卡匣 60: cassette
7:搬出、搬入機構 7: Move out and move into the organization
71:搬運移動手段 71: Carrying and Moving Means
72:支撐基台 72: Support abutment
74:把持構件 74: holding components
75:一對限制銷 75: A pair of restricted pins
76:輔助把持構件 76: Auxiliary control components
77:一對輔助限制銷 77: A pair of auxiliary limit pins
8:暫時放置機構 8: Temporary placement of institutions
80:一對支撐軌道 80: A pair of support rails
9:輔助暫時放置機構 9: auxiliary temporary placement mechanism
90:一對輔助支撐軌道 90: A pair of auxiliary support rails
10:洗淨機構 10: Washing mechanism
11:洗淨殼罩 11: Wash the shell
12:旋轉台 12: Rotating table
13:噴射噴嘴 13: Jet nozzle
14:錘體 14: Hammer
15:接線 15: Wiring
16:滑輪 16: pulley
F:環狀框架 F: ring frame
T:切割膠帶 T: Cutting tape
W:半導體晶圓 W: semiconductor wafer
圖1為依照本發明而構成之切削裝置之斜視圖。 Fig. 1 is a perspective view of a cutting device constructed in accordance with the present invention.
圖2為圖1所示之切削裝置之重要部分斜視圖。 Figure 2 is an oblique view of important parts of the cutting device shown in Figure 1;
圖3為表示被安裝於圖1所示之切削裝置的切削機構的斜視圖。 Fig. 3 is a perspective view showing a cutting mechanism installed in the cutting device shown in Fig. 1.
圖4為圖1中之A-A剖面圖。 Fig. 4 is a cross-sectional view of A-A in Fig. 1.
圖5為構成圖1所示之切削裝置之搬岀、搬入機構的斜視圖。 Fig. 5 is a perspective view of a carrying and carrying mechanism constituting the cutting device shown in Fig. 1;
圖6為圖5所示之搬岀、搬入機構7之重要部分前視圖。
FIG. 6 is a front view of important parts of the carrying and carrying
圖7為構成圖1所示之切削裝置之暫時放置機構及輔助暫時放置機構之斜視圖。 Fig. 7 is a perspective view of a temporary placement mechanism and an auxiliary temporary placement mechanism constituting the cutting device shown in Fig. 1.
圖8為圖7所示之暫時放置機構之側面圖。 Fig. 8 is a side view of the temporary placement mechanism shown in Fig. 7;
圖9為構成圖1所示之切削裝置之洗淨機構的斜視圖。 Fig. 9 is a perspective view of a cleaning mechanism constituting the cutting device shown in Fig. 1;
圖10為表示將搬岀、搬入機構之把持構件及一對限制銷定位在待機位置之狀態的斜視圖。 Fig. 10 is a perspective view showing a state in which the holding member of the carrying and carrying mechanism and a pair of restricting pins are positioned at the standby position.
圖11為表示藉由搬岀、搬入機構之把持構件把持支撐被收容在載置於卡匣載置機構之卡匣的被加工物的環狀 框架之狀態的斜視圖。 Fig. 11 is a ring shape showing that the workpiece contained in the cassette placed on the cassette placement mechanism is gripped and supported by the gripping member of the transport mechanism Oblique view of the state of the frame.
圖12為表示藉由搬岀、搬入機構將被支撐於環狀框架的被加工物搬運至暫時放置機構之一對支撐軌道之狀態的斜視圖。 Fig. 12 is a perspective view showing a state in which the workpiece supported by the ring frame is transported to one of the pair of support rails of the temporary placement mechanism by the carrying and carrying mechanism.
圖13為表示在保持台之上面隔著切割膠帶而載置被支撐在環狀框架之被加工物之狀態的斜視圖。 Fig. 13 is a perspective view showing a state where the workpiece supported by the ring frame is placed on the upper surface of the holding table with the dicing tape interposed therebetween.
圖14為表示使暫時放置機構之一對支撐軌道上升而定位在上部位置之狀態的斜視圖。 Fig. 14 is a perspective view showing a state in which a pair of support rails of the temporary placement mechanism is raised and positioned at an upper position.
圖15為表示將吸引保持被加工物之保持台移動至配設有切削機構之加工區域之狀態的斜視圖。 Fig. 15 is a perspective view showing a state in which a holding table for sucking and holding a workpiece is moved to a processing area equipped with a cutting mechanism.
圖16為表示將切削完之被加工物定位在吸引保持之保持台被加工物拆裝位置之狀態的斜視圖。 Fig. 16 is a perspective view showing a state in which the cut workpiece is positioned at a position where the workpiece is detached and detached from the holding table for suction and holding.
圖17為表示從圖15所示之狀態將暫時放置機構之一對支撐軌道定位在下部位置之狀態的斜視圖。 Fig. 17 is a perspective view showing a state in which a pair of support rails of the temporary placement mechanism is positioned at a lower position from the state shown in Fig. 15;
圖18為表示從圖16所示之狀態將暫時放置機構之一對支撐軌道定位在較上部位置些許下方之中間位置之狀態的斜視圖。 Fig. 18 is a perspective view showing a state in which a pair of support rails of the temporary placement mechanism is positioned at an intermediate position slightly below the upper position from the state shown in Fig. 16.
圖19為表示藉由搬岀、搬入機構之把持部把持被收容在載置於卡匣載置機構之卡匣的被加工物之狀態的斜視圖。 Fig. 19 is a perspective view showing a state in which the workpiece contained in the cassette placed on the cassette placement mechanism is gripped by the gripping portion of the transport mechanism.
圖20為藉由搬岀、搬入機構之把持部將新的被加工物定位在暫時放置機構之一對支撐軌道,同時將切削完之被加工物定位在輔助暫時放置機構之一對輔助支撐軌道之狀態的斜視圖。 Figure 20 shows the positioning of the new workpiece on one of the supporting rails of the temporary placement mechanism by the gripping part of the carrying and loading mechanism, and the positioning of the cut workpiece on one of the auxiliary supporting tracks of the auxiliary temporary placement mechanism at the same time Oblique view of its state.
圖21為表示從圖19之狀態定位在輔助暫時放置機構之一對輔助支撐軌道下部位置之狀態的斜視圖。 Fig. 21 is a perspective view showing the state of being positioned at a lower position of a pair of auxiliary support rails of one of the auxiliary temporary placement mechanisms from the state of Fig. 19;
圖22為表示從圖20之狀態定位在暫時放置機構之一對支撐軌道和輔助暫時放置機構之一對輔助支撐軌道上部位置之狀態的斜視圖及洗淨機構之噴射噴嘴移動之狀態的斜視圖。 Figure 22 is an oblique view showing a state in which the upper part of the supporting rail of one of the temporary placement mechanism and one of the auxiliary temporary placement mechanism is positioned from the state of FIG. 20 and the state of the spray nozzle of the cleaning mechanism moving. .
圖23為表示從圖21所示之狀態將搬岀、搬入機構7定位在待機位置,同時將構成輔助暫時放置機構之一對輔助支撐軌道定位在下部位置之狀態的斜視圖。
Fig. 23 is a perspective view showing a state in which the carrying and carrying
圖24為表示將支撐被支撐於環狀框架之洗淨完的被加工物之輔助暫時放置機構之一對輔助支撐軌道定位在上部位置之狀態的斜視圖。 Fig. 24 is a perspective view showing a state in which one of the auxiliary temporary placement mechanisms for supporting the washed object supported by the ring frame is positioned in the upper position of the auxiliary support rail.
圖25為表示從圖23之狀態將被支撐於環狀框架之洗淨完的被加工物從輔助暫時放置機構之一對輔助支撐軌道移動至暫時放置機構之一對支撐軌道之狀態的斜視圖。 Fig. 25 is a perspective view showing the state in which the washed object supported on the ring frame is moved from one pair of auxiliary support rails of the auxiliary temporary placement mechanism to one pair of support rails of the temporary placement mechanism from the state of Fig. 23 .
圖26為從圖24之狀態將暫時放置機構之一對支撐軌道定位在中間位置,同時將搬岀、搬入機構之把持構件及一對限制銷定位在待機位置之狀態的斜視圖。 Fig. 26 is an oblique view of a state in which a pair of support rails of the temporary placement mechanism are positioned at an intermediate position from the state of Fig. 24, and the holding members of the carrying and carrying mechanism and a pair of restricting pins are positioned at the standby position.
圖27為表示從圖25之狀態使搬岀、搬入機構作動而將被支撐於環狀框架之洗淨完的被加工物收容在卡匣之狀態的斜視圖。 Fig. 27 is a perspective view showing a state in which the carrying and carrying mechanism is actuated from the state of Fig. 25 to house the washed workpiece supported by the ring frame in the cassette.
以下,針對依照本發明構成之切削裝置之較 佳實施型態,參照附件圖面予以詳細說明。 The following is a comparison of the cutting device constructed in accordance with the present invention For the best implementation mode, please refer to the attached drawing for detailed description.
圖1表示依照本發明而構成之切削裝置之一實施型態的斜視圖。 Fig. 1 shows a perspective view of an embodiment of a cutting device constructed in accordance with the present invention.
圖示之實施型態中之切削裝置具備靜止基台2、保持被配設在該靜止基台2上之被加工物的保持台機構3、和切削被保持在該保持台機構3之被加工物的切削機構4。
The cutting device in the embodiment shown in the figure is provided with a
保持台機構3如圖2所示般具備:在靜止基台2上沿著以箭號X表示之加工進給方向(X軸方向)而被配設之兩根X軸導軌31、31;被配設成能夠在該兩根X軸導軌31、31上滑動之移動基台32;保持以能夠旋轉之方式被支撐於配設在該移動基台32上之圓筒狀之支撐構件33之被加工物的保持台34;使配設該保持台34之移動基台32沿著兩根X軸導軌31、31而在加工進給方向(X軸方向)移動之加工進給手段35。保持台34具備:以能夠旋轉之方式被支撐於圓筒狀之支撐構件33之平台本體341,和被配設在該平台本體341之上面的吸附夾具342。平台本體341被形成外徑大於作為後述被加工物之晶圓之外徑,且小於隔著切割膠帶而支撐晶圓之環狀框架之內徑。吸附夾具342係藉由多孔陶磁而形成,且被連接於無圖示之吸引手段,適當地使負壓作用。因此,被載置吸附夾具342上之被加工物藉由使無圖示之吸引手段作動,被吸引保持在吸附夾具342上。再者,保持台34係藉由被配設在圓筒狀之支撐構件33內之無圖示之脈衝馬達使轉動。
The holding
上述加工進給手段35係由被設置在兩根X軸導軌31和31之間,且在X軸方向延伸之X軸線性軌道351,和以能夠移動之方式被嵌插於該X軸線性軌道351,且被安裝於配設保持台34之移動基台32的X軸線圈可動件352所構成。X軸線性軌道351係例如交互接合複數圓柱狀之永久磁鐵之N極和S極而構成軸狀,且將構成該軸狀之複數圓柱狀之永久磁鐵配置在由不鏽鋼等之非磁性材所構成之圓筒狀之殼體而構成。如此構成之X軸線性軌道351係在其兩端部如圖2所示般安裝有支撐構件353、353,經由該支撐構件353、353而被安裝於上述靜止基台2。由X軸線性軌道351和X軸線圈可動件352所構成之加工進給手段35構成所謂的線性傳動軸馬達,當在X軸線圈可動件352流通電流時,重覆磁力所致之吸引力、反作用力而產生推力。因此,藉由改變施加於X軸線圈可動件352之電流的方向,可以變更X軸線圈可動件352沿著X軸線性軌道351移動之方向。如此一來藉由所謂的線性傳動軸馬達所構成之加工進給手段35由於係以能夠在X軸線性軌道351滑動之方式嵌插X軸線圈可動件352之構成,所以構成簡單,因以非接觸進行驅動,故不會磨耗,維修極為簡單。再者,藉由所謂的線性傳動軸馬達所構成之加工進給手段35由於不如以往之進給機構般使用滾珠螺桿機構,故可以減少零件數量,降低製造成本,同時可以謀求裝置之小型化,除此之外,由於藉由後述之切削機構4進行切削加工時,對保持被加工物之保持
台34進行加工進給的時候,橫擺被抑制,故可以提升切削精度。構成如此之加工進給手段35係使配設有保持台34之移動基台32在圖2所示之被加工物拆裝區域和配設切削機構4之加工區域之間移動。
The above-mentioned processing and feeding means 35 is composed of an X-axis
接著,針對上述切削機構4予以說明。
Next, the above-mentioned
切削機構4具備被固定在上述靜止基台2上之門型之支撐框架41。該門型之支撐框架41係由隔著間隔而配設之第一柱部411及第二柱部412,和連結該第一柱部411及第二柱部412之上端,且沿著與以箭頭X所示之加工進給方向正交之箭號Y所示之分度進給方向(Y軸方向)而配設之支撐部413所構成,被配設成橫跨上述兩根X軸導軌31。
The
在構成上述門型之支撐框架41之支撐部413之圖1及圖2中,在背面側配設有第一切削手段5a和第二切削手段5b。針對第一切削手段5a和第二切削手段5b,參照圖3及圖4進行說明。第一切削手段5a及第二切削手段5b分別具備分度移動基台51和切深移動基台52及轉軸單元53。第一切削手段5a之分度移動基台51及第二切削段5b之分度移動基台51設置有與分別在上述支撐部413之圖4中被設置在左方之側面之兩根Y軸導軌413a、413a嵌合之被導引溝511、511,藉由將該被導引溝511、511與兩根Y軸導軌413a、413a嵌合,分度移動基台51被構成能夠沿著兩根Y軸導軌413a、413a移動。另外,在第一切削手段5a之分度移動基台51及第二切削
手段5b之分度移動基台51之一方之表面,分別形成有配設後述分度手段之凹部513。再者,在第一切削手段5a之分度移動基台51及第二切削手段5b之分度移動基台51之另一方之表面,分別如圖4所示般沿著以箭號Z表示所示之分割進給方向設置一對導軌512、512(在圖4中僅表示一方之導軌)。
In FIGS. 1 and 2 of the supporting
上述第一切削手段5a之切深移動基台52及第二切削手段5b之切深移動基台52係由分別在上下方向延伸之被支撐部521,和從該被支撐部521之下端轉直角而水平延伸的安裝部522。如圖4所示般,在被支撐部521中之安裝部522側之面設置有與被設置在上述分度移動基台51之另一方表面的一對Z軸導軌512、512嵌合之被導引溝523、523(在圖4中僅表示一方之被導引溝),藉由將該被導引溝523、523嵌合至兩根之Z軸導軌512、512,切深移動基台52被構成能夠沿著兩根Z軸導軌512、512而在以箭號Z表示之切深進給方向移動。如此一來被安裝於分度移動基台51之切深移動基台52如圖1及圖2所示般,安裝部522被配置成突出至構成門型之支撐框架41之支撐部413的下側。
The depth-of-cut moving
上述轉軸單元53分別被安裝在形成第一切削手段5a和第二切削手段5b之切深移動基台52的安裝部522之下面。該第一切削手段5a之轉軸單元53及第二切削手段5b之轉軸單元53分別如圖3及圖4所示般,具備心軸罩殼531,以能夠旋轉之方式被支撐於該心軸罩殼
531的旋轉心軸532,和被安裝於該旋轉心軸532之一端的切削刀533,和使供給切削水之切削水供給管534及旋轉主軸532旋轉驅動之無圖示伺服馬達,旋轉主軸532之軸線方向係沿著以箭號Y所示之分度進給方向而被配設。而且,構成第一切削手段5a之轉軸單元53之切削刀533,和構成第二切削手段5b之旋轉單元53之切削刀533被配設成互相相向。
The above-mentioned
圖示之實施型態中之第一切削手段5a和第二切削手段5b係如圖3所示般,具備有用以使上述分度移動基台51、51沿著兩根Y軸導軌413a、413a而在以箭號Y所示之分度進給方向(Y軸方向)移動之分度進給手段54。分度進給手段54係由沿著上述兩根之Y軸導軌413a、413a而被配設之共同的Y軸線性軌道540、以能夠移動之方式被嵌插於該共同之Y軸線性軌道540之第一切削手段5a之分度移動基台51的第一Y軸線圈可動件544a,和被安裝於以能夠移動之方式被嵌插於共同之Y軸線性軌道540之第二切削手段5b之分度移動基台51的第二Y軸線圈可動件544b。共同之Y軸線性軌道540係例如交互接合複數圓柱狀之永久磁鐵之N極和S極而構成軸狀,且將構成該軸狀之複數圓柱狀之永久磁鐵配置在由不鏽鋼等之非磁性材所構成之圓筒狀之殼體而構成。如此構成之共同之Y軸線性軌道540係在其兩端部如圖3所示般安裝有支撐構件543、543,經由該支撐構件543、543而被安裝於上述支撐框架41之支撐部413。以能夠移動
之方式被嵌插至該共同之Y軸線性軌道540之第一Y軸線圈可動件544a及第二Y軸線圈可動件544b分別被配設在第一切削手段5a之分度移動基台51及第二切削手段5b之分度移動基台51的凹部513,分別被安裝於分度移動基台51之一方之表面。
The first cutting means 5a and the second cutting means 5b in the embodiment shown in the figure are as shown in FIG. 3, and are equipped with the
如上述般,由共同之Y軸線性軌道540和第一Y軸線圈可動件544a及第二Y軸線圈可動件544b所構成之分度進給手段54,與由上述X軸線性軌道351和X軸線圈可動件352所構成之加工進給手段35相同,構成所謂的傳動軸馬達,當電流流入第一Y軸線圈可動件544a及第二Y軸線圈可動件544b時,重覆磁力所致之吸引力、反作用力而產生推力。因此,藉由改變施加於第一Y軸線圈可動件544a及第二Y軸線圈可動件544b之電流的方向,可以變更第一Y軸線圈可動件544a及第二Y軸線圈可動件544b沿著共同之Y軸線性軌道540而移動之方向。如此一來藉由所謂的傳動軸馬達所構成之分度進給手段54由於係以能夠在共同之Y軸線性軌道540滑動之方式嵌插第一Y軸線圈可動件544a及第二Y軸線圈可動件544b之構成,所以構成簡單,因以非接觸驅動,故不會磨耗,維修極為簡單。再者,藉由所謂的線性傳動軸馬達所構成之分度進給手段54因不如以往進給機構般使用滾珠螺桿機構,故可以減少零件數量,降低製造成本。
As described above, the indexing feed means 54 constituted by the common Y-axis
再者,圖示之實施型態中之第一切削手段5a和第二切削手段5b係如圖3及圖4所示般,具備有用以
使上述分度移動基台52、52沿著兩根Z軸導軌512、512而在以箭號Z所示之切深進給方向(Z軸方向)移動之切深手段55、55。切深進給手段55、55係由被配設成分別與兩根Z軸導軌512、512平行之公螺桿551、以能夠旋轉之方式支撐公螺桿551之一端部的軸承522,和被連結於公螺桿551之另一端,且使該公螺桿551正轉或逆轉驅動之脈衝馬達553所構成。被構成如此之切深進給手段55、55分別係公螺桿551與被形成在上述切深移動基台52之被支撐部521之母螺桿521a螺合。因此,切深進給手段55、55可以分別藉由驅動脈衝馬達553使公螺桿551正轉或逆轉驅動,使切深移動基台52沿著兩根Z軸導軌512、512而在圖3中以箭號Z所示之切深進給方向(Z軸方向)移動。
Furthermore, the first cutting means 5a and the second cutting means 5b in the illustrated embodiment are as shown in Figs. 3 and 4, with useful features
The cutting depth means 55, 55 move the
當參照圖1持續說明時,上述靜止基台2具備載置收容半導體晶圓等之複數加工物之卡匣60的卡匣載置機構6、從被載置於該卡匣載置機構6之卡匣60搬岀被加工物,同時將切削完之被加工物搬入至卡匣60之搬出、搬入機構7、暫時放置藉由該搬出、搬入機構7被搬出之被加工物的暫時放置機構8、與該暫時放置機構8相鄰接而被配設的輔助暫時放置機構9,和洗淨切削後之被加工物的洗淨機構10。卡匣載置機構6使卡匣60被載置於藉由無圖示之升降手段而升降的卡匣台61上。在卡匣60收容有被黏貼於安裝於環狀框架F之切割膠帶T之表面的半導體晶圓W。另外,在環狀框架F之外周,設置
有後述限制銷卡合之溝槽F.1及平面F.2。
When the description is continued with reference to FIG. 1, the
搬出、搬入機構7如圖1所示般係由被配設在構成上述門型之支撐框架41的支撐部413之表面側的搬運移動手段71,和藉由該搬運移動手段71在Y軸方向移動的支撐基台72,和連結該支撐基台72和搬運移動手段71之連結構件73所構成。搬運移動手段71係由使連結支撐基台72之連結構件73在Y軸方向移動之輸送帶機構所構成。當參照圖5及圖6持續說明時,在構成搬出、搬入機構7之支撐基台72,安裝有:把持構件74(參照圖6),其係被設置在下側,用以把持隔著切割膠帶T而支撐被收容在載置於卡匣載置機構6之卡匣60的半導體晶圓W之環狀框架F;汽缸740,其係用以使該把持構件74在上下方向移動;和一對限制銷75,其係被配設在把持構件74之兩側且與被設置在上述環狀框架F之溝槽F.1及平面F.2卡合而將環狀框架F限制在規定之位置。構成如此之搬出、搬入機構7係使支撐基台72朝向被載置在卡匣載置機構6之卡匣60移動,且藉由使一對限制銷75與被設置在隔著切割膠帶T而支撐被收容在卡匣60之半導體晶圓W之環狀框架F的槽溝F.1及平面F.2卡合,將半導體晶圓W位置限制在規定之位置。而且,藉由汽缸740使把持構件74朝上方移動,依此在支撐基台72和把持構件74之間把持環狀框架F。
As shown in FIG. 1, the carry-in and carry-in
再者,在構成搬出、搬入機構7之支撐基台72,安裝有:輔助把持構件76(參照圖6),其係被配設
在下側,用以把持隔著切割膠帶T而支撐後述切削完之半導體晶圓W之環狀框架F;汽缸760,其係用以使該輔助把持構件76在上下方向移動;和一對輔助限制銷77,其係被配設在輔助把持構件76之兩側且與上述環狀框架F卡合而將環狀框架F限制在規定之位置。而且,在構成搬出、搬入機構7之支撐基台72,配設有選擇性地與後述洗淨機構之噴射噴嘴卡合之卡合手段78。該卡合手段78係由以能夠進退之方式被配設在較支撐基台72之下面下方之卡合桿781,和使該卡合桿781進退之汽缸782所構成。
Furthermore, on the
針對上述暫時放置機構8,參照圖1、圖7及圖8進行說明。暫時放置機構8係在Y軸方向與上述卡匣載置機構6相鄰接而被配設在上述保持台34之被加工物拆裝區域之正上方。該暫時放置機構8具備:一對支撐軌道80,其係在Y軸方向延伸,具有支撐環狀框架F之兩側部的底部81a、81b,和側部82a、82b,且被構成底部81a、81b能夠開關;和開關手段85a、85b,其係用以開關該一對支撐軌道80之底部81a、81b;和升降手段86,其係使該一對支撐軌道80在上下方向移動。另外,在構成一對支撐軌道80之側部82a、82b之上端設置有互相設置有突出於內側之凸緣部83a、83b,該凸緣部83a和83b互相藉由連結部84連結一端部。上述開關手段85a、85b係在圖示之實施型態中,由汽缸所構成,使一對支撐軌道80之底部81a、81b分別作動至圖8中以實線表示之水平
位置之關閉位置和以二點鏈線表示之垂直位置的開啟位置。上述升降手段86係由被安裝於無圖示之固定構件之汽缸861所構成,該汽缸861之活塞桿862與上述一對支撐軌道80之連結部84連結。
The
上述輔助暫時放置機構9係在Y軸方向與上述暫時放置機構8相鄰接且在相對於上述卡匣載置機構6為Y軸方向相反側上被配設在後述洗淨機構10之正上方。該輔助暫時放置機構9與上述暫時放置機構8相同之構成,如圖7所示般,具備:一對輔助支撐軌道90,其係在Y軸方向延伸,具有支撐環狀框架F之兩側部的底部91a、91b,和側部92a、92b,且被構成底部91a、91b能夠開關;和開關手段95a、95b,其係用以開關該一對輔助支撐軌道90之底部91a、91b;和升降手段96,其係使該一對輔助支撐軌道90在上下方向移動。而且,在構成一對輔助支撐軌道90之側部92a、92b之上端設置有互相設置有突出於內側之凸緣部93a、93b,該凸緣部93a和93b互相藉由連結部94連結一端部。上述開關手段95a、95b在圖示之實施型態中係由汽缸所構成,使一對輔助支撐導軌90之底部91a、91b分別作動至水平位置之關閉位置和垂直位置之開啟位置。上述升降手段96係由被安裝於無圖示之固定構件之汽缸961所構成,該汽缸961之活塞桿962與上述一對輔助支撐軌道90之連結部94連結。
The auxiliary
接著,針對上述洗淨機構10,參照圖1及圖9進行說明。
Next, the
圖示之實施型態中之洗淨機構10與上述暫時放置機構8相鄰接且被配設在相對於卡匣載置機構6為Y軸方向相反側上。該洗淨機構10具備有洗淨殼罩11。該洗淨殼罩11係由前壁111和後壁112和側壁113及114和底壁(無圖示)所構成,上方被開放。在構成如此的洗淨殼罩11內配設有旋轉台12。旋轉台12係由平台本體121、被配設在該平台本體121之上面的吸附夾具122,和使平台本體121旋轉驅動之伺服馬達123所構成。平台本體121被形成外徑大於上述晶圓W之外徑,且小於隔著切割膠帶T而支撐晶圓W之環狀框架F之內徑。吸附夾具122係藉由多孔陶磁而形成,且被連接於無圖示之吸引手段,適當地使負壓作用。因此,被載置吸附夾具122上之被加工物藉由使無圖示之吸引手段作動,被吸引保持在吸附夾具122上。
The
當參照圖1及圖9持續進行說明時,在洗淨殼罩11之前壁111設置有沿著Y軸方向而形成的導引孔111a,在該導引孔111a以能夠在Y軸方向移動之方式配設有對被保持於上述旋轉台12之被加工物噴射洗淨水之噴射噴嘴13。在該噴射噴嘴13經滑輪16連結一端與錘體14連結的接線15之另一端,且被構成藉由錘體14之重力在以箭號Y1所示之方向上移動。而且,在噴射噴嘴13中,被配設在構成上述搬出、搬入機構7之支撐基台72的卡合手段78,係在以能夠進退之方式被配設在較支撐基台72之下面下方的卡合桿781進岀的狀態下,從藉
由噴射噴嘴13中之錘體14之重力而移動的箭號Y1所示之方向使接觸。而且,噴射噴嘴13被連接於無圖示之洗淨水供給手段。
1 and 9, the
圖示之實施型態中之切削裝置被構成上述般,以下針對其作用進行說明。 The cutting device in the illustrated embodiment is configured as described above, and its function will be described below.
首先,如圖10所示般,使暫時放置機構8之汽缸861作動而將一對支撐軌道80定位在上部位置,同時將配設有搬出、搬入機構7之把持構件74(參照圖6)及一對限制銷75(參照圖5及圖6)的支撐基台72定位在圖示之待機位置上。
First, as shown in FIG. 10, the
接著,使搬出、搬入機構7之搬運移動手段71(參照圖1及圖5)作動,如圖11所示般,使配設有把持構件74及一對限制銷75之支撐基台72移動至卡匣載置機構6側,且使一對限制銷75(參照圖5及圖6)與被設置在隔著切割膠帶T而支撐被收容在卡匣60之半導體晶圓W之環狀框架F的溝槽F.1及平面F.2(參照圖1)卡合,依此將半導體晶圓W位置限制在規定位置上。而且,藉由使汽缸740作動,將環狀框架F把持在支撐基台72和把持構件74(參照圖6)之間。
Next, the carrying and moving means 71 (refer to FIGS. 1 and 5) of the carry-in and carry-in
若藉由支撐基台72和把持構件74把持環狀框架F時,使搬出、搬入機構7之搬運移動手段71作動而將支撐基台72移動至與卡匣載置機構6相反側,且如圖12所示般,將環狀框架F搬運至暫時放置機構8之一對的支撐軌道80,進行暫時放置。
If the ring frame F is gripped by the
若將環狀框架F搬運至暫時放置機構8之一對支撐軌道80時,如圖13所示般,使汽缸861作動而使一對支撐軌道80下降,定位在下部位置上。其結果,被安裝於環狀框架F,且黏貼半導體晶圓W之切割膠帶T被載置在保持平台機構3中被定位在被加工物拆裝位置上的保持台34之上面。而且,使上述開關手段85a、85b(參照圖6及圖8)作動而將一對支撐軌道80之底部81a、81b在圖8中從以實線表示之關閉位置定位在以二點鏈線表示之開啟位置。
When the ring frame F is conveyed to one of the pair of support rails 80 of the
接著,藉由使無圖示之吸引手段作動,如圖14所示般,在保持台34之上面隔著切割膠帶T而吸引保持半導體晶圓W。而且,使暫時放置機構8之汽缸851作動而使一對支撐軌道80上升而定位在上部位置。
Next, by actuating a suction means not shown, as shown in FIG. 14, the semiconductor wafer W is sucked and held on the upper surface of the holding table 34 via the dicing tape T. Then, the cylinder 851 of the
如圖14所示般,一面隔著切割膠帶T而在保持台34之上面吸引保持半導體晶圓W,一面使構成保持台機構3之加工進給手段35作動而將吸引保持半導體晶圓W之保持台34如圖15所示般移動至配設有切削機構4之加工區域。而且,藉由第一切削手段5a和第二切削手段5b對被保持台34保持之半導體晶圓W施予規定之切削加工。另外,保持台34因如上述般被形成其外徑大於半導體晶圓W之外徑且小於環狀框架F之內徑,故環狀框架F藉由自重些許下垂,在切削加工中,不干擾第一切削手段5a和第二切削手腕5b之切削刀533,不需要框架推壓機構,降低成本。
As shown in FIG. 14, the semiconductor wafer W is sucked and held on the holding table 34 with the dicing tape T interposed therebetween, and the processing and feeding means 35 constituting the holding
如上述般,若對被保持於保持台34之半導體晶圓W施予規定之切削加工時,使加工進給手段35作動而將吸引保持切削完之半導體晶圓W之保持台34定位在圖16所示之被加工物拆裝位置。在該狀態下,被保持於保持台34之切削完的半導體晶圓W被定位在暫時放置機構8之正下方。
As described above, when a predetermined cutting process is applied to the semiconductor wafer W held by the holding table 34, the processing feed means 35 is actuated to position the holding table 34 for sucking and holding the cut semiconductor wafer W in the figure. 16 shows the disassembly and assembly position of the processed object. In this state, the cut semiconductor wafer W held by the holding table 34 is positioned directly below the
若將被保持在保持台34之切削完之半導體晶圓W定位在暫時放置機構8之正下方時,在將暫時放置機構8之一對支撐軌道80之底部81a、81b定位在開啟位置之狀態下,使汽缸861作動,如圖17所示般,使一對支撐軌道80下降而定位在下部位置上。而且,將一對支撐軌道80之底部81a、81b定位在關閉位置而支撐環狀框架F,並且解除藉由保持台34進行的半導體晶圓W之吸引保持。
If the cut semiconductor wafer W held on the holding table 34 is positioned directly below the
接著,使暫時放置機構8之汽缸861作動而使支撐環狀框架F之一對支撐軌道80上升,且如圖18所示般,在較上部位置些許下方,搬出、搬入機構7之把持構件74及一對限制銷75將一對支撐軌道80定位在可以在被支撐於一對支撐軌道80之切削完半導體晶圓W之上方移動之中間位置。
Next, the
而且,使搬出、搬入機構7之搬運移動手段71作動,如圖19所示般,將支撐基台72移動至卡匣載置機構6側,且使一對限制銷75(參照圖5及圖6)與被設置在隔著切割膠帶T而支撐被收容在卡匣60之半導體
晶圓W之環狀框架F的溝槽F.1及平面F.2(參照圖1)卡合,依此將半導體晶圓W位置限制在規定位置上。而且,藉由使汽缸740作動,將支撐新的半導體晶圓W之環狀框架F把持在支撐基台72和把持構件74(參照圖6)之間。此時,把持構件74和一對限制銷75係在切削完半導體晶圓W之上方移動。
Furthermore, the carrying and moving
接著,使暫時放置機構8之汽缸851作動而將支撐切削完半導體晶圓W之一對支撐軌道80定位在上部位置,並且將支撐切削完半導體晶圓W之環狀框架F中之卡匣載置機構6側之端面定位在與一對輔助限制銷77相向之位置上。之後,使搬出、搬入機構7之搬運移動手段71作動,如圖20所示般,藉由使支撐基台72移動至與卡匣載置機構6相反側,將支撐藉由支撐基台72和把持構件74所把持之新的半導體晶圓W之環狀框架F搬運至暫時放置機構8之一對支撐軌道80,同時將支撐與一對輔助限制銷77抵接的切削完半導體晶圓W之環狀框架F搬運至輔助暫時放置機構9之一對輔助支撐軌道90。
Next, actuate the cylinder 851 of the
若將支撐切削完半導體晶圓W之環狀框架F搬運至輔助暫時放置機構9之一對輔助支撐軌道90時,如圖21所示般,使汽缸961作動而使一對輔助支撐軌道90下降,定位在下部位置上。在該狀態下,被安裝於環狀框架F,且黏貼有半導體晶圓W之切割膠帶T與洗淨機構10之旋轉台12之上面接觸。而且,藉由使一對輔助
支撐軌道90之底部91a、91b從關閉位置定位在開啟位置,將切削完之半導體晶圓W隔著切割膠帶T而載置在旋轉台12之上面。而且,藉由使無圖示之吸引手段作動,在旋轉台12之上面隔著切割膠帶T而吸引保持切削完之半導體晶圓W。
When the ring frame F supporting the cut semiconductor wafer W is transported to a pair of auxiliary support rails 90 of the auxiliary
接著,將暫時放置機構8之一對支撐軌道80和輔助暫時放置機構9之一對輔助支撐軌道90如圖22(a)所示般定位在上部位置,且使旋轉台12旋轉,同時如圖22(b)所示般,藉由使無圖示之洗淨水供給手段作動,從噴射噴嘴13噴射洗淨水130。此時,定位在被配設在搬出、搬入機構7之支撐基台72的卡合手段78之卡合桿781進岀而與噴射噴嘴13卡合的位置上,使搬運移動手段71作動而使卡合桿781在Y軸方向往返移動。因此,與被連結於噴射噴嘴13之接線15之一端連結的錘體14之重力協同作用而使噴射噴嘴13在Y軸方向往返移動。另外,噴射噴嘴13之往返移動範圍至少從切削完之半導體晶圓W之外周至中心的範圍即可。其結果,隔著切割膠帶T被吸引保持在旋轉膠帶12之切削完之半導體晶圓W被旋轉洗淨。另外,在朝向上述噴射噴嘴13之Y軸方向的往返移動中,因搬出、搬入機構7成為驅動源,故能夠小型化,同時可以謀求降低成本。再者,旋轉台12因如上述般被形成其外徑大於半導體晶圓W之外徑,且小於環狀框架F之內徑,故環狀框架F藉由自重些許下垂,被供給至半導體晶圓W之洗淨水滑順地被排岀,同
時不需要框架推壓機構,降低成本。
Next, a pair of support rails 80 of the
如上述般,若洗淨切削完之半導體晶圓W時,如圖23所示般,將搬出、搬入機構7定位在上述待機位置,同時在將構成輔助暫時放置機構9之一對輔助支撐軌道90之底部91a、91b定位在開啟位置之狀態下定位在下部位置,使底部91a、91b成為關閉位置而支撐用以支撐洗淨完之半導體晶圓W的環狀框架F。而且,解除藉由旋轉台12所進行的半導體晶圓W之吸引保持。
As described above, when the semiconductor wafer W that has been cut is cleaned, the unloading and
接著,如圖24所示般,將支撐洗淨完之半導體晶圓W之環狀框架F的輔助暫時放置機構9之一對輔助支撐軌道90定位在上部位置上。而且,使被配設在搬出、搬入機構7之支撐基台72的輔助把持構件76作動而把持環狀框架F。
Next, as shown in FIG. 24, one pair of auxiliary support rails 90 of the auxiliary
而且,使搬出、搬入機構7之搬運移動手段71作動,如圖25所示般,使支撐洗淨完之半導體晶圓W之環狀框架F從輔助暫時放置機構9之一對輔助支撐軌道90移動至暫時放置機構8之一對支撐軌道80。
Furthermore, the transport and movement means 71 of the carry-in and carry-in
接著,如圖26所示般,將暫時放置機構8之一對支撐軌道80定位在中間位置,同時將被配設在搬出、搬入機構7之支撐基台72的把持構件74及一對限制銷75定位在待機位置。
Next, as shown in FIG. 26, one of the pair of support rails 80 of the
而且,使搬出、搬入機構7之搬運移動手段71作動,如圖27所示般,使支撐基台72移動至卡匣載置機構6側而將把持構件74及一對限制銷75從待機位置
移動至被載置在卡匣載置機構6之卡匣60,依此將支撐洗淨完之半導體晶圓W的環狀框架F收容在卡匣60。
Furthermore, the transport and movement means 71 of the carry-in and carry-in
另外,如上述般,與對洗淨完之半導體晶圓W進行洗淨,同時實施收容至卡匣60之作業之時,從卡匣60被搬出至暫時放置機構8之一對支撐軌道80之新的半導體晶圓W,如上述般被搬運至構成保持台機構3之保持台34且被吸引保持。而且,被吸引保持在保持台34之新的半導體晶圓W藉由加工進給手段35被移動至配設有切削機構4之加工區域,且藉由第一切削手段5a和第二切削手段5b被施予規定之切削加工。
In addition, as described above, when the cleaned semiconductor wafer W is cleaned and stored in the
如上述般,圖示之實施型態中之切削裝置係於保持被加工物之保持台34被定位在被加工物拆裝區域之時,藉由搬出、搬入機構7搬出隔著切割膠帶T支撐被收容在卡匣60之半導體晶圓W之環狀框架F而暫時放置在構成暫時放置機構8之一對支撐軌道80,且藉由升降手段86使一對支撐軌道80下降而將隔著切割膠帶T被支撐於環狀框架F之半導體晶圓W載置於保持台34,且藉由開關手段85a、85b開啟底部81a、81b,依此由於隔著切割膠帶T將半導體晶圓W保持在保持台34,故搬運隔著切割膠帶T支撐作為被加工物之半導體晶圓W的環狀框架F的搬運手段實質上僅有搬出、搬入機構7,所以零件數量減少而降低成本,同時可以謀求裝置之小型化。再者,因搬出、搬入機構7具有也在被配設在洗淨機構10之旋轉台12之正上方的輔助暫時放置機構9搬運隔著切
割膠帶T支撐切削完之半導體晶圓W之環狀框架F之功能,故可以更謀求裝置之小型化。
As mentioned above, the cutting device in the embodiment shown in the figure is supported by the carrying-out and carrying-in
5a:第一切削手段 5a: The first cutting method
5b:第二切削手段 5b: The second cutting method
51:分度移動基台 51: Indexing mobile abutment
511:導引溝 511: Guiding Ditch
513:凹部 513: recess
52:切深移動基台 52: Cut deep mobile abutment
521:被支撐部 521: Supported part
522:安裝部 522: Installation Department
53:轉軸單元 53: shaft unit
531:心軸罩殼 531: Mandrel Cover
532:旋轉心軸 532: Rotating Mandrel
533:切削刀 533: Cutter
534:切削水供給管 534: Cutting Water Supply Pipe
54:分度進給手段 54: Indexing feed method
540:共同之Y軸線性軌道 540: Common Y-axis linear orbit
543:支撐構件 543: support member
544a:第一Y軸線圈可動件 544a: first Y-axis coil movable part
544b:第二線圈可動件 544b: second coil movable part
55:切深手段 55: Depth of Cut
553:脈衝馬達 553: Pulse Motor
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