TWI673817B - Component packaging device, component packaging method, and component package substrate manufacturing method - Google Patents

Component packaging device, component packaging method, and component package substrate manufacturing method Download PDF

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Publication number
TWI673817B
TWI673817B TW107133739A TW107133739A TWI673817B TW I673817 B TWI673817 B TW I673817B TW 107133739 A TW107133739 A TW 107133739A TW 107133739 A TW107133739 A TW 107133739A TW I673817 B TWI673817 B TW I673817B
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substrate
columns
component
sheet
rows
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TW107133739A
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TW201916225A (en
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橋本正規
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日商芝浦機械電子裝置股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector

Abstract

本發明提供一種可容易且更確實地拾取多行多列的元件,並可統一封裝至基板的元件封裝裝置以及元件封裝方法。移送部5在載置有儲存元件E的載體C的載台3、與載置有基板S的封裝台4之間移動,並且從載體C統一拾取多行多列的元件E,以將所拾取的多行多列的元件E統一移交至基板S。該移送部5保持與包含多行多列的元件E的區域相同或稍寬的黏接片材A。並且,移送部5將黏接片材A按壓至載體C而將多行多列的元件E貼附於黏接片材A,藉此,從載體C統一拾取多行多列的元件E。The present invention provides a component packaging device and a component packaging method that can easily and more reliably pick components in multiple rows and columns and can be uniformly packaged to a substrate. The transfer unit 5 moves between the stage 3 on which the carrier C on which the storage element E is placed and the package stage 4 on which the substrate S is placed, and collectively picks up the elements E in a plurality of rows and columns from the carrier C to pick up The elements E of multiple rows and columns are uniformly handed over to the substrate S. The transfer unit 5 holds the adhesive sheet A that is the same as or slightly wider than the area including the elements E in a plurality of rows and columns. Then, the transfer unit 5 presses the adhesive sheet A to the carrier C and attaches the components E of the plurality of rows and columns to the adhesive sheet A, thereby collectively picking up the components E of the plurality of rows and columns from the carrier C.

Description

元件封裝裝置、元件封裝方法以及元件封裝基板製造方法Component packaging device, component packaging method, and component packaging substrate manufacturing method

本發明是有關於一種元件封裝裝置、元件封裝方法以及元件封裝基板製造方法。The invention relates to a component packaging device, a component packaging method and a component packaging substrate manufacturing method.

在形成有電路圖案(pattern)的基板上封裝半導體元件、電阻及電容器(condenser)等元件的元件封裝裝置正在普及。元件封裝裝置具有元件移送部,所述元件移送部在儲存(stock)有元件的元件供給體與封裝元件的基板之間往復。移送部從元件供給體逐個地拾取元件,將元件保持並搬送至基板為止,使元件脫離至基板上。在基板上,形成有異向導電膜(Anisotropic Conductive Film,ACF)、異向導電膏(Anisotropic Conductive Paste,ACP)、非導電膜(Non Conductive Film,NCF)、非導電膏(Non Conductive Paste,NCP)或均質共晶焊料等導電性接合材料,將元件配置於基板後進行加熱加壓,藉此,將元件封裝至基板。Device packaging devices that package components such as semiconductor elements, resistors, and capacitors on a substrate on which a circuit pattern is formed are spreading. The component packaging device includes a component transfer unit that reciprocates between a component supply body in which components are stored and a substrate on which the components are packaged. The transfer unit picks up the components one by one from the component supply body, holds and transports the components to the substrate, and releases the components onto the substrate. Anisotropic Conductive Film (ACF), Anisotropic Conductive Paste (ACP), Non Conductive Film (NCF), and Non Conductive Paste (NCP) are formed on the substrate. ) Or a conductive bonding material such as a homogeneous eutectic solder, the element is placed on the substrate, and then heated and pressurized to package the element on the substrate.

作為移送部對元件的保持方法,多採用真空吸附或靜電吸附等吸附。在採用真空吸附的情況下,在元件封裝裝置的移送部形成抽吸孔。在抽吸孔連接於具有壓縮機(compressor)或噴射器(ejector)的空氣壓迴路,在抽吸孔中產生負壓。移送部藉由負壓將元件吸附於抽吸孔,藉此來從元件供給體拾取元件並搬送至基板為止,藉由借助真空破壞或大氣開放等的負壓解除而將元件脫離至基板上。在採用靜電吸附的情況下,在基底(base)基板上形成多個凸(mesa)形結構體,在凸形結構體上設置電極及介電質層。具有該凸形結構體的靜電產生部成為針對元件的局部吸附點,藉由電壓施加產生的靜電而在各靜電產生部吸附元件。As a method for holding the component by the transfer unit, vacuum adsorption or electrostatic adsorption is often used. When vacuum suction is used, a suction hole is formed in the transfer section of the component packaging device. The suction hole is connected to an air pressure circuit having a compressor or an ejector, and a negative pressure is generated in the suction hole. The transfer unit sucks the component into the suction hole by negative pressure, thereby picking up the component from the component supply body and transporting the component to the substrate, and releases the component onto the substrate by releasing the negative pressure such as vacuum destruction or atmospheric release. When electrostatic adsorption is used, a plurality of mesa-shaped structures are formed on a base substrate, and electrodes and a dielectric layer are provided on the convex structures. The static electricity generating portion having the convex structure serves as a local adsorption point for the element, and the static electricity generated by the voltage application attracts the element to each static electricity generating portion.

近年來,元件的微小化正以非常快的速度(pace)發展。亦提出有一邊的尺寸為50 μm或10 μm等200 μm以下的元件。該些元件例如為50 μm或10 μm的迷你發光二極體(Light Emitting Diode,LED)或微型(micro)LED,作為RGB的各畫素而呈多行多列地排列於顯示器(display)用的顯示基板上,而且,作為背光(backlight)的發光體而排列於照明基板上。 [現有技術文獻] [專利文獻]In recent years, miniaturization of components is progressing at a very fast pace. Devices with a size of 200 μm or less such as 50 μm or 10 μm on one side have also been proposed. These elements are, for example, 50 μm or 10 μm light emitting diodes (LEDs) or micro LEDs, which are arranged in rows and columns as display elements for RGB pixels for display. The display substrate is arranged on a lighting substrate as a light emitter for backlight. [Prior Art Literature] [Patent Literature]

專利文獻1:日本專利特表2015-505736號公報Patent Document 1: Japanese Patent Publication No. 2015-505736

[發明所欲解決之問題] 在藉由移送部來吸附保持微小元件的情況下,必須準備比微小化的元件更小的抽吸孔或凸形結構體,難以使微小的元件與該些吸附部精度良好地彼此對位。例如,在以3 μm的抽吸孔來吸附10 μm的元件的情況下,元件與抽吸孔只要發生4 μm的位置偏離,元件便無法堵塞抽吸孔,從而導致抽吸力下降,或者元件落入抽吸孔中而傾斜,導致拾取失敗,或者元件在向基板的移送中脫落。[Problems to be Solved by the Invention] When a micro-component is sucked and held by a transfer unit, it is necessary to prepare a suction hole or a convex structure which is smaller than a mini-sized component, and it is difficult to attract the micro-component and these components. The parts are aligned with each other with good accuracy. For example, when a 10 μm component is suctioned by a 3 μm suction hole, as long as the component is 4 μm away from the suction hole, the component cannot block the suction hole, which causes the suction force to decrease, or the component Dropping into the suction hole and tilting it may cause pick-up failure, or the component may fall off during the transfer to the substrate.

在元件與抽吸孔或凸形結構體等吸附部各為一個的情況下,藉由高精度地管理吸附部的位置,或者使吸附部與元件相對移動以高精度地修正彼此的位置,從而對於微小化的吸附部與元件,亦可使彼此的位置一致。然而,基於生產效率的觀點,亦有時迫切需要統一拾取多行多列的元件,並統一封裝至基板上。例如,在將LED作為畫素而搭載於顯示基板的情況下,若顯示基板支援4K,則對於RGB中的一色必須將至少800萬個以上的LED封裝至顯示基板,基於生產效率的觀點,必須統一拾取多行多列的LED,並統一封裝至基板。When there is one suction part such as a component and a suction hole or a convex structure, the position of the suction part can be managed with high accuracy, or the position of the suction part and the component can be relatively moved to correct each other's position, so that It is also possible to match the positions of the miniaturized suction portion and the device to each other. However, from the viewpoint of production efficiency, it is sometimes urgent to uniformly pick up components in multiple rows and columns and uniformly package them on a substrate. For example, when an LED is mounted on a display substrate as a pixel, if the display substrate supports 4K, at least 8 million or more LEDs must be packaged into the display substrate for one color in RGB. From the viewpoint of production efficiency, it must be Pick up multiple rows and columns of LEDs and package them to the substrate.

在統一對多行多列的微小元件進行處理的情況下,多行多列的元件與多行多列的吸附部必須全部精度良好地分別一致。然而,與元件和吸附部各為一個的情況相比,要以可使多行多列的元件與多行多列的吸附部全部精度良好地對位的方式進行管理,難度很大。並且,要各別地修正所有元件與吸附部的位置近乎不可能,因此若多行多列元件的一部分與吸附部發生位置偏離,則難以解決此問題。When uniform processing is performed on the micro-elements in a plurality of rows and columns, all of the elements in the rows and columns and the adsorption portions in the rows and columns must all agree with each other with good accuracy. However, compared with a case where there are only one element and one suction section, it is difficult to manage the components with multiple rows and columns and the suction sections with multiple rows and columns all with high accuracy. In addition, it is almost impossible to individually correct the positions of all the components and the suction portion. Therefore, it is difficult to solve this problem if a part of the elements in a plurality of rows and columns deviates from the position of the suction portion.

於是,因從元件供給體漏取元件,或者因吸附不充分地保持而在搬送中發生元件脫落,從而造成存在未封裝元件的區域的基板。即,導致製品的良率下降,或者需要逐個地利用元件來填補未封裝區域的後作業,從而導致生產效率下降。As a result, a component is leaked from the component supply body, or the component is detached during transportation due to insufficient holding, which results in a substrate in a region where the component is not encapsulated. That is, the yield of the product is reduced, or the post-operation of using the components one by one to fill the unpackaged area is caused, which results in the reduction of production efficiency.

本發明是為了解決如上所述的問題而提出,其目的在於提供一種可容易且更確實地統一拾取多行多列的元件並可統一封裝至基板的元件封裝裝置、元件封裝方法以及元件封裝基板製造方法。 [解決問題之手段]The present invention has been made in order to solve the problems described above, and an object thereof is to provide a component packaging device, a component packaging method, and a component packaging substrate that can easily and more surely uniformly pick up components in multiple rows and columns and can be uniformly packaged to a substrate. Production method. [Means for solving problems]

為了達成所述目的,本發明的元件封裝裝置的特徵在於包括:供給台,載置呈陣列狀排列有元件的元件供給體;封裝台,載置呈陣列狀配置所述元件的基板;以及移送部,在所述供給台與所述封裝台之間多次往復移,每當返回所述供給台時,從所述元件供給體一次多行多列地拾取所述元件,每當到達所述封裝台時,將所拾取的所述多行多列的所述元件轉移至所述基板, 所述移送部包括:保持部,保持黏接片材,所述黏接片材是與包含所述多行多列的元件的區域相同或稍寬的片材,且黏接力因規定溫度而喪失或下降;以及加熱器(heater),當使所述多行多列的元件接觸至所述基板時,將所述保持部加熱至所述規定溫度以上,將所述黏接片材按壓至所述元件供給體而使所述多行多列的元件貼附於所述黏接片材,藉此,從所述元件供給體一次拾取所述多行多列的元件,藉由加熱至所述規定溫度以上,使所拾取的所述元件從所述黏接片材剝離而統一轉移至所述基板。In order to achieve the object, the component packaging device of the present invention is characterized by including: a supply stage on which component supply bodies in which elements are arranged in an array are mounted; a packaging stage on which substrates on which the elements are arranged in an array are mounted; Part, moving back and forth between the supply station and the packaging station multiple times, whenever returning to the supply station, picking up the components from the component supply body in multiple rows and columns at a time, whenever it reaches the When the table is packaged, the picked up elements of the multiple rows and columns are transferred to the substrate, and the transfer section includes a holding section for holding an adhesive sheet, and the adhesive sheet is formed with the containing sheet. Sheets with the same or slightly wider area of the elements in multiple rows and columns, and the adhesion force is lost or decreased due to the prescribed temperature; and a heater, when the elements in the multiple rows and columns are brought into contact with the substrate Heating the holding portion to the predetermined temperature or more, pressing the adhesive sheet to the component supply body, and attaching the components of the multiple rows and columns to the adhesive sheet, thereby , Picking up the multiple from the component supplier at one time The elements in a plurality of rows are uniformly transferred to the substrate by heating the elements above the predetermined temperature to peel the picked-up elements from the adhesive sheet.

亦可為,所述黏接片材是黏接力因規定溫度而喪失或下降的熱剝離片材,所述移送部具有:保持部,保持所述黏接片材;以及加熱器,當使所述多行多列的元件接觸至所述基板時,將所述保持部加熱至所述規定溫度以上。The adhesive sheet may be a thermally peelable sheet whose adhesive force is lost or decreased due to a predetermined temperature, and the transfer section may include a holding section that holds the adhesive sheet, and a heater that When the plurality of rows and columns of elements are in contact with the substrate, the holding portion is heated to the predetermined temperature or more.

亦可為,所述保持部的所述黏接片材的保持面具有矩形形狀,且一邊的長度為120 mm以下。The holding surface of the adhesive sheet of the holding portion may have a rectangular shape, and a length of one side is 120 mm or less.

亦可為,所述保持部包含熱膨脹係數為18×10-6 /K以下的原料。The holding portion may include a raw material having a thermal expansion coefficient of 18 × 10 -6 / K or less.

亦可為,所述元件供給體包括另一黏接片材,所述另一黏接片材的黏接力在比所述保持部的所述黏接片材低的溫度下喪失或下降,將所述元件呈陣列狀地貼附於所述另一黏接片材,所述加熱器在所述保持部拾取所述元件時,將所述保持部加熱至比所述保持部所保持的所述黏接片材的黏接力喪失或下降的溫度低,且為所述元件供給體所具備的所述另一黏接片材的黏接力喪失或下降的溫度以上的溫度。Alternatively, the component supply body includes another adhesive sheet, and the adhesive force of the another adhesive sheet is lost or decreased at a temperature lower than that of the adhesive sheet of the holding portion, so that The elements are affixed to the other adhesive sheet in an array, and the heater heats the holding portion to a position higher than that held by the holding portion when the holding portion picks up the component. The temperature at which the adhesive force of the adhesive sheet is lost or decreased is low, and is a temperature equal to or higher than the temperature at which the adhesive force of the another adhesive sheet provided by the component supply is lost or decreased.

亦可為,所述加熱器對所述保持部進行加熱而使其熱膨脹,直至經由所述黏接片材而由所述保持部所保持的所述多行多列的元件的配置位置適合於對所述基板的配置位置為止。The heater may heat the holding portion and cause it to thermally expand until the arrangement position of the multiple rows and columns of elements held by the holding portion via the adhesive sheet is suitable. Up to the placement position of the substrate.

亦可為,在所述基板上,形成有藉由紫外線而固化的導電性接合材料,所述封裝台具有對所述基板的紫外線照射部,所述加熱器在所述紫外線照射部對所述基板照射紫外線,利用所述導電性接合材料將所述基板與所述多行多列的元件予以接合後,對所述頭部(head)進行加熱。A conductive bonding material cured by ultraviolet rays may be formed on the substrate, the package base may have an ultraviolet irradiation portion for the substrate, and the heater may face the ultraviolet rays at the ultraviolet irradiation portion. The substrate is irradiated with ultraviolet rays, the substrate is bonded to the elements in the plurality of rows and columns using the conductive bonding material, and then the head is heated.

亦可包括:片材供給部,使帶狀的所述黏接片材行走,將黏接力未喪失或下降的區域供給至所述保持部。It may also include a sheet material supply section that moves the adhesive sheet in the shape of a band and supplies an area in which the adhesion force is not lost or decreased to the holding section.

亦可為,所述片材供給部包括切刀(cutter),所述切刀在所述帶狀的黏接片材的行走路徑中途,對所述保持部所保持的所述黏接片材進行沖切。The sheet supply unit may include a cutter, which cuts the adhesive sheet held by the holding portion in the middle of the running path of the band-shaped adhesive sheet. Perform die cutting.

而且,為了達成所述目的,本發明的元件封裝方法是從呈陣列狀地排列有元件的元件供給體一次拾取多行多列的元件,並將所拾取的所述多行多列的元件統一轉移至基板,所述元件封裝方法的特徵在於包括:拾取步驟,將與包含所述多行多列的元件的區域相同或稍寬的黏接片材按壓至所述元件供給體,以將所述多行多列的元件貼附至所述黏接片材;以及封裝步驟,當使所述多行多列的元件接觸至所述基板時,將所述黏接片材加熱至所述黏接片材的黏接力喪失或下降的規定溫度以上,以使所述多行多列的元件從所述黏接片材剝離,多次重複所述拾取步驟與所述封裝步驟,從所述元件供給體逐次多行多列地拾取所述元件,並逐次多行多列地將所述元件轉移至所述基板。In order to achieve the object, the component packaging method of the present invention is to pick up multiple rows and columns of components at a time from a component supplier in which the components are arranged in an array, and unify the picked up components of the multiple rows and columns. The component packaging method is transferred to a substrate. The component packaging method includes a pick-up step of pressing an adhesive sheet that is the same as or slightly wider than an area containing the components in the plurality of rows and columns to the component supply body to press the component supply body. The multiple rows and columns of components are attached to the adhesive sheet; and a packaging step, when the multiple rows and columns of components are brought into contact with the substrate, the adhesive sheets are heated to the adhesive The adhesive force of the bonding sheet is lost or decreased above a predetermined temperature, so that the multiple rows and columns of components are peeled from the adhesive sheet, and the pickup step and the packaging step are repeated multiple times from the component. The supply body sequentially picks up the components in multiple rows and columns, and sequentially transfers the components to the substrate.

而且,為了達成所述目的,本發明的元件封裝基板製造方法是從呈陣列狀地排列有元件的元件供給體一次拾取多行多列的元件,將所拾取的所述多行多列的元件統一封裝至基板,從而製造呈陣列狀地封裝有所述元件的元件封裝基板,所述元件封裝基板製造方法的特徵在於包括:拾取步驟,將與包含所述多行多列的元件的區域相同或稍寬的黏接片材按壓至所述元件供給體,以將所述多行多列的元件貼附至所述黏接片材;封裝步驟,當使所述多行多列的元件接觸至所述基板時,將所述黏接片材加熱至所述黏接片材的黏接力喪失或下降的規定溫度以上,以使所述多行多列的元件從所述黏接片材剝離;以及反覆步驟,多次重複所述拾取步驟與所述封裝步驟,從所述元件供給體逐次多行多列地拾取所述元件,並逐次多行多列地將所述元件轉移至所述基板,藉此來製造在所述基板上呈陣列狀地封裝有所述元件的元件封裝基板。 [發明的效果]Further, in order to achieve the above-mentioned object, the method for manufacturing a component package substrate of the present invention is to pick up multiple rows and columns of components at a time from a component supplier in which the components are arranged in an array, and pick up the picked up components of the multiple rows and columns. The device package substrate is uniformly packaged to the substrate, thereby manufacturing the component package substrate in which the components are packaged in an array. The method for manufacturing the component package substrate includes a picking step, which will be the same as an area including the components in the multiple rows and columns. Or a slightly wider adhesive sheet is pressed to the component supply body to attach the components in the multiple rows and columns to the adhesive sheet; in the packaging step, the components in the multiple rows and columns are brought into contact When it reaches the substrate, the adhesive sheet is heated to a temperature above a predetermined temperature at which the adhesive force of the adhesive sheet is lost or decreased, so that the elements of the multiple rows and columns are peeled from the adhesive sheet. ; And iterative steps, repeating the picking step and the packaging step multiple times, picking up the components from the component supplier one by one in multiple rows and columns, and transferring the components one by one in multiple rows and columns. Substrate, borrow It was fabricated on the substrate in an array shape of the encapsulated element package substrate element. [Effect of the invention]

根據本發明,將移送部對元件的保持方法設為借助黏接片材的貼附,因此即便不使多行多列的元件全部各自對位至接腳點(pin point),亦可簡便且更確實地拾取多行多列的元件,並可統一封裝至基板。According to the present invention, the method of holding the components by the transfer unit is to attach the components by means of an adhesive sheet. Therefore, even if the components of a plurality of rows and columns are not aligned to the pin points, it is simple and convenient. Pick up multiple rows and columns of components more reliably and package them to the substrate uniformly.

對於本發明的元件封裝裝置及封裝方法的實施形態,參照圖式來進行詳細說明。Embodiments of the device packaging device and the packaging method of the present invention will be described in detail with reference to the drawings.

(第1實施形態) (概略結構) 圖1是表示元件封裝裝置的概略結構的示意圖。如圖1所示,載體C與基板S被搬入元件封裝裝置1內。載體C是呈陣列狀地儲存有元件E的元件供給體。所謂陣列狀,是指依照規定的圖案將元件E排列成多行多列的狀態,行方向與列方向的間隔相同或不同,例如為棋盤的格子狀配置、蜂巢圖形之類的鋸齒狀配置等。元件E是被用於電子電路的零件,包含微機電系統(Micro Electro Mechanical System,MEMS)與半導體元件、電阻及電容器等晶片(chip),半導體元件包含電晶體(transistor)、二極體(diode)、LED及閘流體(thyristor)等離散半導體與積體電路(Integrated Circuit,IC)或大規模積體電路(Large Scale Integration,LSI)等積體電路。LED包含所謂的迷你LED及微型LED。尤其,元件E包含一邊為200 μm以下的所謂微小零件。基板S是形成有電路圖案而成,例如為使迷你LED排列的背光用的照明基板、使RGB的各微型LED作為畫素而排列的顯示基板。First Embodiment (Schematic Structure) FIG. 1 is a schematic diagram showing a schematic structure of a component packaging device. As shown in FIG. 1, the carrier C and the substrate S are carried into the component packaging device 1. The carrier C is a component supplier in which the components E are stored in an array. The array refers to a state in which the elements E are arranged in a plurality of rows and columns according to a predetermined pattern. The interval between the row direction and the column direction is the same or different. For example, it is a checkerboard arrangement, a honeycomb pattern, or the like . Element E is a component used in electronic circuits, including micro electro mechanical system (MEMS) and semiconductor elements, chips such as resistors and capacitors. Semiconductor elements include transistors, diodes, and diodes. ), Discrete semiconductors such as LEDs and thyristors, and integrated circuits such as integrated circuits (ICs) or large scale integrated circuits (LSIs). LEDs include so-called mini LEDs and micro LEDs. In particular, the element E includes so-called micro-components having a side of 200 μm or less. The substrate S is formed by forming a circuit pattern, and is, for example, a lighting substrate for a backlight in which mini-LEDs are arranged, and a display substrate in which micro-LEDs of RGB are arranged as pixels.

該元件封裝裝置1是將載體C上的元件E封裝於基板S的裝置。元件封裝裝置1從載體C一次拾取多行多列的元件E,並將所拾取的多行多列的元件E統一轉移至基板S。並且,該元件封裝裝置1藉由多次反覆拾取步驟與封裝步驟,從而製造呈陣列狀地排列有元件E的元件封裝基板,所述拾取步驟是指從載體C逐次多行多列地拾取元件E,並逐次多行多列地將元件E轉移至基板S。而且,該元件封裝裝置1將所轉移的元件E電性及機械地接合至基板S。此種元件封裝裝置1也被稱作晶粒接合(die bonding)裝置或晶片接合(chip bonding)裝置。This component packaging device 1 is a device for packaging a component E on a carrier C on a substrate S. The component packaging device 1 picks up components E of a plurality of rows and columns from the carrier C at a time, and collectively transfers the picked components E of the plurality of rows and columns to the substrate S. In addition, the component packaging device 1 manufactures a component packaging substrate in which elements E are arranged in an array by repeating a plurality of picking steps and packaging steps. The picking step refers to picking up components from the carrier C one by one in multiple rows and columns. E, and the elements E are sequentially transferred to the substrate S in rows and columns. The component packaging device 1 electrically and mechanically bonds the transferred component E to the substrate S. Such a device package device 1 is also referred to as a die bonding device or a chip bonding device.

元件封裝裝置1具備載台3、封裝台4及移送部5。載台3是具有載置載體C的載置面的、載體C的供給台,在拾取位置(pickup position)21處停止。即,載台3使在載體C上以陣列狀的排列儲存的元件E中的成為拾取對象的多行多列的元件E群以其中央位置位於拾取位置21的方式而停止。封裝台4是具有載置基板S的載置面的、基板S的供給台,在封裝位置22處停止。即,封裝台4使基板S上的電路圖案中藉由移送部5來封裝多行多列的元件E群的電路圖案以其中央位置位於封裝位置22的方式而停止。The component packaging device 1 includes a stage 3, a packaging stage 4, and a transfer unit 5. The stage 3 is a supply stage of the carrier C having a mounting surface on which the carrier C is placed, and is stopped at a pickup position 21. That is, the stage 3 stops the plurality of rows and columns of the component E group among the components E stored on the carrier C in an array arrangement so that the center position thereof is located at the pickup position 21. The package table 4 is a supply table for the substrate S having a mounting surface on which the substrate S is mounted, and is stopped at the package position 22. That is, the packaging stage 4 stops the circuit pattern on the circuit pattern S on the substrate S that encapsulates the elements E group in a plurality of rows and columns by the transfer unit 5 so that its center position is located at the packaging position 22.

移送部5將元件E從載體C轉移至基板S。該移送部5在拾取位置21與封裝位置22之間多次往復移動。並且,移送部5每當返回載體C時,在拾取位置21處與載置於載台3的載體C對置,從載體C統一拾取多行多列的元件E。而且,移送部5每當到達封裝台4時,在封裝位置22處與載置於封裝台4的基板S對置,將所保持的多行多列的元件E統一移交至基板S。再者,將在拾取位置21處統一拾取多行多列的元件E的一連串動作稱作拾取步驟S1,將在封裝位置處將多行多列的元件E統一移交至基板S的一連串動作稱作封裝步驟S2。The transfer unit 5 transfers the component E from the carrier C to the substrate S. This transfer section 5 is reciprocated between the pickup position 21 and the packaging position 22 a plurality of times. In addition, each time the transfer unit 5 returns to the carrier C, it faces the carrier C placed on the stage 3 at the pick-up position 21 and collectively picks up the elements E of the rows and columns from the carrier C. When the transfer unit 5 reaches the packaging stage 4, the transfer unit 5 opposes the substrate S placed on the packaging stage 4 at the packaging position 22, and transfers the elements E held in the multiple rows and columns to the substrate S in a unified manner. In addition, a series of operations for collectively picking up multiple rows and columns of components E at the picking position 21 is referred to as a picking step S1, and a series of operations for collectively handing over multiple rows and columns of components E to the substrate S at a packaging position is called Packaging step S2.

移送部5對元件E的拾取方法為貼附。在移送部5上安裝有黏接片材A。黏接片材A如圖2所示,在單面具備與排列有多行多列的元件E的區域相同或稍寬的黏接區域A1。黏接區域A1內全部具有黏接力。換言之,不需要使多行多列的元件E全部各自對位至接腳點,只要各元件E接觸至黏接片材A的任何區域,黏接片材A便發揮黏接力來貼附各元件E。所謂稍寬的黏接區域A1,是指達到拾取預定元件E群與在該元件E群的一個外側鄰接的元件E之間的空間(space),但未達到該鄰接的元件E的範圍。The pick-up method of the component E by the transfer part 5 is attaching. An adhesive sheet A is attached to the transfer section 5. As shown in FIG. 2, the adhesive sheet A includes, on one side, an adhesive region A1 that is the same as or slightly wider than the region where the elements E are arranged in multiple rows and columns. All of the adhesion areas A1 have adhesion force. In other words, there is no need to align the components E of multiple rows and columns to the pin points, as long as each component E contacts any area of the adhesive sheet A, the adhesive sheet A exerts the adhesive force to attach each component. E. The slightly wider bonding area A1 refers to the space between the element E group to be picked up and the element E adjacent to the outside of the element E group, but not to the extent of the adjacent element E.

移送部5以下述方式來安裝該黏接片材A,即,在拾取位置21處黏接區域A1面向元件E,而在封裝位置22處黏接區域A1面向基板S。移送部5將黏接片材A按壓至載體C上的元件E,藉此,將元件E從載體C轉移至黏接片材A。而且,移送部5在使元件E接觸至基板S後,使黏接片材A的黏接力喪失或下降,從而使元件E從黏接片材A脫離至基板S。作為一例,此種黏接片材A為黏接力藉由規定溫度的熱而喪失或下降的熱剝離片材。The transfer section 5 mounts the adhesive sheet A in such a manner that the adhesive region A1 faces the component E at the pickup position 21 and the adhesive region A1 faces the substrate S at the packaging position 22. The transfer section 5 presses the adhesive sheet A to the component E on the carrier C, thereby transferring the component E from the carrier C to the adhesive sheet A. Furthermore, after the transfer unit 5 contacts the element E to the substrate S, the adhesion force of the adhesive sheet A is lost or decreased, so that the element E is detached from the adhesive sheet A to the substrate S. As an example, such an adhesive sheet A is a thermal peeling sheet whose adhesive force is lost or decreased by heat at a predetermined temperature.

圖3(a)及圖3(b)表示熱剝離片材的一例。如圖3(a)及圖3(b)所示,黏接片材A具有基材A2與黏接層A3的雙層結構。黏接層A3包含黏著劑及發泡填料(filler)A4。發泡填料A4是在具有彈性的殼內填充藉由熱而氣化膨脹的物質而成。該黏接片材A中,發泡填料A4的體積藉由熱而膨脹,與元件E的黏著面積減少,藉此,對元件E的黏接力喪失或下降。即,移送部5在使元件E接觸至基板S後,對黏接片材A進行加熱,藉此,使元件E從黏接片材A剝離而移交至基板S。而且,作為熱剝離片材的示例,亦可為在黏著層內產生從固態向液態的相轉移者,只要可藉由熱來控制黏接力即可。3 (a) and 3 (b) show an example of a thermal peeling sheet. As shown in FIGS. 3 (a) and 3 (b), the adhesive sheet A has a two-layer structure of a substrate A2 and an adhesive layer A3. The adhesive layer A3 includes an adhesive and a foamer filler A4. The foaming filler A4 is filled with a substance that expands due to heat and gasification in a shell having elasticity. In the adhesive sheet A, the volume of the foamed filler A4 is expanded by heat, and the adhesion area with the element E is reduced, whereby the adhesion force to the element E is lost or decreased. That is, after the component E contacts the substrate S, the transfer unit 5 heats the adhesive sheet A, thereby peeling the component E from the adhesive sheet A and transferring the component E to the substrate S. In addition, as an example of the thermal peeling sheet, a phase transition from a solid state to a liquid state may be generated in the adhesive layer, as long as the adhesion force can be controlled by heat.

作為載體C保持元件E的形態,亦可使用該熱剝離性的黏接片材A。以下,在稱呼移送部5所具有的黏接片材A與載體C所具有的黏接片材A這兩者時,稱作黏接片材A,移送部5所具有的黏接片材A稱作支持片Ah,載體C所具有的黏接片材A稱作載體片材Ac。As the form of the carrier C holding element E, this heat-peelable adhesive sheet A can also be used. Hereinafter, when both the adhesive sheet A included in the transfer section 5 and the adhesive sheet A included in the carrier C are referred to, the adhesive sheet A is referred to as the adhesive sheet A included in the transfer section 5. This is called a support sheet Ah, and the adhesive sheet A of the carrier C is called a carrier sheet Ac.

例如,載體C是將玻璃板設為基底。在該玻璃板的表面黏著有載體片材Ac。載體片材Ac是以基材A2與玻璃板的表面對置的方式,使用黏著劑等而黏著。元件E被貼附於該載體片材Ac的黏接面。如圖4所示,載體片材Ac的黏接力喪失或下降的載體側剝離溫度T1比支持片Ah的黏接力喪失或下降的支持側剝離溫度T2低。例如,藉由借助發泡填料A4的填充率、發泡填料A4的大小、發泡填料A4內的物質選定而進行的氣化溫度的調整、借助選定發泡填料A4的殼的種類而進行的殼的彈性調整,可分別設定載體片材Ac與支持片Ah喪失黏接力的規定溫度。For example, the carrier C has a glass plate as a substrate. A carrier sheet Ac is adhered to the surface of this glass plate. The carrier sheet Ac is adhered using an adhesive or the like so that the substrate A2 faces the surface of the glass plate. The element E is attached to the adhesive surface of the carrier sheet Ac. As shown in FIG. 4, the carrier-side peeling temperature T1 at which the adhesive strength of the carrier sheet Ac is lost or decreased is lower than the support-side peeling temperature T2 at which the adhesive strength of the support sheet Ah is lost or decreased. For example, by adjusting the gasification temperature based on the filling rate of the foamed filler A4, the size of the foamed filler A4, and the selection of the substance in the foamed filler A4, and by selecting the type of the shell of the foamed filler A4 The elasticity of the shell can be adjusted to set a predetermined temperature at which the carrier sheet Ac and the support sheet Ah lose adhesion.

移送部5在拾取步驟S1中,將支持片Ah按壓至載體片材Ac上的元件E,並且使載體片材Ac以載體側剝離溫度T1以上且小於支持側剝離溫度T2的溫度Te而發熱。藉此,移送部5維持支持片Ah的黏接力,且使載體片材Ac的黏接力喪失或下降,從而將元件E從載體片材Ac轉印至支持片Ah。In the picking step S1, the transfer unit 5 presses the support sheet Ah onto the element E on the carrier sheet Ac, and causes the carrier sheet Ac to generate heat at a temperature Te above the carrier-side peeling temperature T1 and lower than the support-side peeling temperature T2. Thereby, the transfer portion 5 maintains the adhesive force of the support sheet Ah and loses or decreases the adhesive force of the carrier sheet Ac, thereby transferring the element E from the carrier sheet Ac to the support sheet Ah.

而且,為了元件E向基板S的接合,在基板S上預先形成有導電性接合材料。導電性接合材料是藉由合金接合、導電粒子壓接、凸塊壓接等,將基板S與元件E電性及機械地連接,並藉由加熱而固化。例如,作為導電性接合材料,在基板S上形成有ACF、ACP、NCF、NCP或均質共晶焊料。In order to bond the element E to the substrate S, a conductive bonding material is formed on the substrate S in advance. The conductive bonding material electrically and mechanically connects the substrate S and the element E by alloy bonding, conductive particle compression bonding, bump compression bonding, and the like, and is cured by heating. For example, as the conductive bonding material, ACF, ACP, NCF, NCP, or a homogeneous eutectic solder is formed on the substrate S.

對該導電性接合材料給予的製程(process)溫度T3被設定為比使支持片Ah的黏接力喪失或下降的支持側剝離溫度T2高。因此,移送部5在封裝步驟S2中,使元件E壓接至基板S上,而且,加熱至比支持側剝離溫度T2高的製程溫度T3為止,藉此,使支持片Ah的黏接力喪失或下降而使元件E剝離,且藉由導電性接合材料來將元件E電性及機械地連接至基板S。The process temperature T3 given to the conductive bonding material is set to be higher than the support-side peeling temperature T2 that causes the adhesive strength of the support sheet Ah to be lost or decreased. Therefore, in the packaging step S2, the transfer unit 5 press-bonds the element E to the substrate S and heats it to a process temperature T3 that is higher than the support-side peeling temperature T2, thereby depriving the adhesive force of the support sheet Ah or The element E is peeled off by falling, and the element E is electrically and mechanically connected to the substrate S by a conductive bonding material.

(詳細結構) 進一步詳細說明以上的元件封裝裝置1。圖5是表示元件封裝裝置1的詳細結構的正面圖,圖6是表示元件封裝裝置1的詳細結構的側面圖。(Detailed Structure) The above component packaging device 1 will be described in more detail. FIG. 5 is a front view showing a detailed structure of the component packaging device 1, and FIG. 6 is a side view showing a detailed structure of the component packaging device 1.

如圖5及圖6所示,元件封裝裝置1除了載台3、封裝台4及移送部5以外,還具備基座6、片材供給部7、片材排出部8及升降部9。以下,將與基座6的上表面平行的1軸方向稱作X軸方向。Y軸方向是與基座6上表面平行且與X軸正交的方向,Z軸方向是與X軸及Y軸方向正交的高度方向,θ旋轉是指繞Z軸的旋轉。而且,將從基座6的上表面沿著Z軸方向朝基座6的外側離開的方向稱作上方,將從基座6的上表面沿著Z軸方向朝向基座6的內部方向的方向稱作下方。As shown in FIGS. 5 and 6, the component packaging device 1 includes a base 6, a sheet supply section 7, a sheet discharge section 8, and a lifting section 9 in addition to the stage 3, the packaging table 4, and the transfer section 5. Hereinafter, the one-axis direction parallel to the upper surface of the base 6 is referred to as the X-axis direction. The Y-axis direction is a direction parallel to the upper surface of the base 6 and orthogonal to the X-axis, the Z-axis direction is a height direction orthogonal to the X-axis and Y-axis directions, and θ rotation refers to rotation around the Z-axis. The direction from the upper surface of the base 6 to the outside of the base 6 along the Z-axis direction is referred to as upward, and the direction from the upper surface of the base 6 to the inner direction of the base 6 along the Z-axis direction. Called below.

基座6是上表面平坦的平台(table),設置載台3、封裝台4、移送部5、片材供給部7、片材排出部8及升降部9。在基座6內部,收容著具有對元件封裝裝置1的各部進行控制的中央處理單元(Central Processing Unit,CPU)、唯讀記憶體(Read Only Memory,ROM)、隨機存取記憶體(Random Access Memory,RAM)及信號發送電路的電腦(computer)或微電腦(micro computer)等控制部件11。而且,移送部5是藉由吸附來保持支持片Ah,在基座6中,收容有將成為抽吸力的負壓供給至移送部5的空氣壓迴路12,控制部件11設有信號發送電路,所述信號發送電路控制空氣壓迴路12內的電磁閥以切換負壓產生及負壓解除。The base 6 is a table having a flat upper surface, and is provided with a stage 3, a packaging stage 4, a transfer section 5, a sheet supply section 7, a sheet discharge section 8, and a lifting section 9. Inside the base 6 is housed a Central Processing Unit (CPU), a Read Only Memory (ROM), and a Random Access Memory (Random Access Memory) which control each part of the component packaging device 1 Memory, RAM) and computer or micro computer control components 11 of the signal transmission circuit. In addition, the transfer unit 5 holds the support sheet Ah by suction. The base 6 houses an air pressure circuit 12 that supplies a negative pressure that becomes a suction force to the transfer unit 5. The control unit 11 is provided with a signal transmission circuit. The signal transmitting circuit controls a solenoid valve in the air pressure circuit 12 to switch the generation of the negative pressure and the release of the negative pressure.

載台3具有沿X軸及Y軸方向呈二次元狀展開的載置面。該載台3具備X軸驅動機構31與Y軸驅動機構32,且在X軸方向及Y軸方向上可動。X軸方向的可動範圍包含拾取位置21與相對於載台3來搬入及排出載體C的搬入/排出位置。該X軸驅動機構31被用於載體C與移送部5的X軸方向的對位。而且,Y軸驅動機構32被用於載體C與移送部5的Y軸方向的對位。The stage 3 has a mounting surface that is developed in a two-dimensional manner along the X-axis and Y-axis directions. The stage 3 includes an X-axis driving mechanism 31 and a Y-axis driving mechanism 32 and is movable in the X-axis direction and the Y-axis direction. The movable range in the X-axis direction includes a pickup position 21 and a loading / unloading position for loading and unloading the carrier C with respect to the stage 3. This X-axis driving mechanism 31 is used for the alignment of the carrier C and the X-axis direction of the transfer unit 5. The Y-axis driving mechanism 32 is used to align the carrier C with the Y-axis direction of the transfer unit 5.

作為該些X軸驅動機構31與Y軸驅動機構32,例如可採用滾珠螺桿機構。即,使導軌(rail)與滾珠螺桿沿著各可動方向延伸。滾珠螺桿包含旋轉馬達(motor)、螺桿及滑塊(slider),使滑塊螺合於螺桿,利用旋轉馬達來使螺桿軸旋轉。X軸驅動機構31是固定於Y軸驅動機構32的滑塊,且載於Y軸驅動機構32的導軌。載台3是固定於X軸驅動機構31的滑塊,且載於X軸驅動機構31的導軌。As the X-axis driving mechanism 31 and the Y-axis driving mechanism 32, for example, a ball screw mechanism can be adopted. That is, a rail and a ball screw are extended in each movable direction. The ball screw includes a rotary motor (motor), a screw, and a slider. The slider is screwed to the screw, and the screw shaft is rotated by the rotary motor. The X-axis drive mechanism 31 is a slider fixed to the Y-axis drive mechanism 32 and is mounted on a guide rail of the Y-axis drive mechanism 32. The stage 3 is a slider fixed to the X-axis drive mechanism 31 and is mounted on a guide rail of the X-axis drive mechanism 31.

封裝台4具有沿X軸及Y軸方向呈二次元狀展開的載置面。該封裝台4亦在X軸方向及Y軸方向上可動,且具備包含滾珠螺桿機構的X軸驅動機構41與Y軸驅動機構42。Y軸驅動機構42主要被用於載置於封裝台4的基板S的搬入及排出,而且被用於基板S與移送部5的Y軸方向的對位。而且,X軸驅動機構41被用於移送部5與基板S的X軸方向的對位。The packaging stage 4 has a mounting surface that is developed in a two-dimensional manner along the X-axis and Y-axis directions. The package table 4 is also movable in the X-axis direction and the Y-axis direction, and includes an X-axis drive mechanism 41 and a Y-axis drive mechanism 42 including a ball screw mechanism. The Y-axis driving mechanism 42 is mainly used for carrying in and discharging the substrate S placed on the packaging stage 4, and is also used for positioning the substrate S and the Y-axis direction of the transfer unit 5. The X-axis drive mechanism 41 is used for positioning the transfer unit 5 and the substrate S in the X-axis direction.

拾取位置21與封裝位置22是在X軸方向上隔開間隔而設。在基座6上,設置有增高台61,所述增高台61比基座6上表面高一階,且沿著拾取位置21與封裝位置22的排列而延伸。移送部5被設置於增高台61,沿著連接拾取位置21與封裝位置22的直線而自走,而且,可朝向位於拾取位置21與封裝位置22的載台3與封裝台4而沿Z軸方向下降。The pickup position 21 and the package position 22 are provided at intervals in the X-axis direction. On the base 6, a booster stage 61 is provided, which is one step higher than the upper surface of the base 6 and extends along the arrangement of the pickup position 21 and the packaging position 22. The transfer unit 5 is provided on the elevated stage 61 and travels along a straight line connecting the pickup position 21 and the packaging position 22. The transfer unit 5 can move along the Z axis toward the stage 3 and the packaging stage 4 located at the pickup position 21 and the packaging position 22. Direction down.

即,在增高台61上,沿著X軸方向而鋪設有導軌63。導軌63是在拾取位置21與封裝位置22之間移動的移送部5的導引部(guide)。導軌63具有到達位於拾取位置21的載台3與位於封裝位置22的封裝台4的長度。導軌63是由支持部64予以抓持。支持部64是支持移送部5的塊(block)體,進而,由包含旋轉馬達及利用旋轉馬達來軸旋轉的螺桿的滾珠螺桿65予以驅動。That is, a guide rail 63 is laid on the elevation table 61 along the X-axis direction. The guide rail 63 is a guide of the transfer unit 5 that moves between the pickup position 21 and the packaging position 22. The guide rail 63 has a length to reach the stage 3 located at the pickup position 21 and the packaging stage 4 located at the packaging position 22. The guide rail 63 is held by the support portion 64. The support portion 64 is a block body that supports the transfer portion 5 and is further driven by a ball screw 65 including a rotary motor and a screw that is rotated by the rotary motor.

支持部64朝向連接拾取位置21與封裝位置22的直線上而沿Y軸方向延伸。移送部5被安裝於該支持體64的延伸前端面67。在該延伸前端面67上,鋪設有沿Z軸方向延伸的導軌66。移送部5藉由抓持該導軌66而安裝於支持體64,且可沿Z軸方向滑動。The support portion 64 extends in the Y-axis direction toward a straight line connecting the pickup position 21 and the packaging position 22. The transfer unit 5 is attached to the extended front end surface 67 of the support 64. A guide rail 66 extending in the Z-axis direction is laid on the extended front end surface 67. The transfer unit 5 is mounted on the support 64 by grasping the guide rail 66 and is slidable in the Z-axis direction.

升降部9藉由下推可沿Z軸方向滑動的移送部5,從而使位於拾取位置21的移送部5朝向載台3下降,而且,使位於封裝位置22的移送部5朝向封裝台4下降。首先,在基座6上,豎立設置有支柱62,該支柱62位於增高台61的後方,且延伸得比移送部5高。該支柱62的上端朝Y軸方向彎曲,且推進至移送部5的移動軌跡正上方為止。升降部9被設置於該支柱62的延伸前端面69。The lifting section 9 lowers the transfer section 5 that can slide in the Z-axis direction, thereby lowering the transfer section 5 at the pickup position 21 toward the stage 3 and lowering the transfer section 5 at the packaging position 22 toward the packaging table 4 . First, a support pillar 62 is erected on the base 6. The support pillar 62 is located behind the raising platform 61 and extends higher than the transfer unit 5. The upper end of the pillar 62 is bent in the Y-axis direction, and is advanced until the movement trajectory of the transfer unit 5 is just above. The lifting portion 9 is provided on the extended front end surface 69 of the pillar 62.

即,在支柱62的延伸前端面69上,鋪設有沿Z軸方向延伸的導軌91。而且,在支柱62的延伸前端面69上,與導軌91平行地設置有藉由旋轉馬達92而軸旋轉的螺桿93。進而,抓持該導軌91,而且螺合於螺桿93,而安裝有抵接塊94。該抵接塊94藉由旋轉馬達92的驅動而朝向移送部5下降,抵接於移送部5的上端,進而下推移送部5。移送部5藉由以未圖示的彈簧等為例的施力部件而朝上方受到施力,抵接塊94克服該施力部件而下推移送部5。當藉由抵接塊94離開移送部5,而抵接塊94的按壓力被解除時,移送部5將藉由施力部件而返回圖5及圖6所示的上升位置。That is, a guide rail 91 extending in the Z-axis direction is laid on the extended front end surface 69 of the pillar 62. Further, on the extended front end surface 69 of the pillar 62, a screw 93 which is pivoted by a rotation motor 92 is provided in parallel with the guide rail 91. Further, the guide rail 91 is grasped and screwed to the screw 93, and a contact block 94 is attached. The abutment block 94 is lowered toward the transfer unit 5 by driving of the rotary motor 92, and abuts against the upper end of the transfer unit 5, and further moves the transfer unit 5 downward. The transfer unit 5 is biased upward by a biasing member such as a spring (not shown) as an example, and the contact block 94 overcomes the biasing member and pushes the transporting unit 5 downward. When the contact block 94 leaves the transfer unit 5 and the pressing force of the contact block 94 is released, the transfer unit 5 will return to the raised position shown in FIGS. 5 and 6 by the urging member.

再者,移送部5可沿著導軌63而移動至拾取位置21與封裝位置22的正上方為止。因此,抵接塊94以至少將拾取位置21及封裝位置22這兩者收斂於範圍內的方式而在X軸方向上較長,無論移送部5位於何處位置,均可與移送部5抵接而下推。而且,移送部5亦可以沿X軸方向移動的狀態而連結至抵接塊94。In addition, the transfer unit 5 can be moved along the guide rail 63 to a position directly above the pickup position 21 and the packaging position 22. Therefore, the abutment block 94 is longer in the X-axis direction so that both the picking position 21 and the packaging position 22 are within the range, and the abutting block 94 can abut the conveying section 5 regardless of the position of the conveying section 5. Push down. Further, the transfer unit 5 may be connected to the contact block 94 in a state of being moved in the X-axis direction.

圖7是表示移送部5的詳細結構的方塊圖。移送部5是從靠近載台3或封裝台4的方向開始,在Z軸方向上,將頭部51、缸體(cylinder)52、θ旋轉部53及抵接塊支承部54沿Z軸方向予以連結而構成。而且,移送部5在頭部51與缸體52的列的旁邊,具備攝影機(camera)55。FIG. 7 is a block diagram showing a detailed configuration of the transfer unit 5. The transfer unit 5 starts from the direction close to the stage 3 or the packaging stage 4 and moves the head 51, the cylinder 52, the θ rotation portion 53, and the abutment block support portion 54 in the Z-axis direction in the Z-axis direction. They are connected together. The transfer unit 5 includes a camera 55 next to the row of the head 51 and the cylinder 52.

頭部51是保持支持片Ah的保持部,而且,藉由發熱,從而對載體片材Ac、支持片Ah及基板S上形成的導電性接合材料進行加熱。缸體52例如為氣缸(air cylinder)等加壓源,藉由對頭部51施加負載,從而在拾取位置21處經由頭部51來將支持片Ah按壓至元件E,而且,在封裝位置22處經由頭部51來將元件E按壓至基板S。θ旋轉部53使頭部51繞Z軸旋轉,使載體C上的元件E與基板S上的電路圖案對位。抵接塊支承部54是與抵接塊94接觸的構件。攝影機55對移送部5與載體C、以及移送部5與基板S的相對位置偏離進行檢測。The head portion 51 is a holding portion that holds the supporting sheet Ah, and heats the conductive bonding material formed on the carrier sheet Ac, the supporting sheet Ah, and the substrate S by generating heat. The cylinder 52 is, for example, a pressure source such as an air cylinder. By applying a load to the head 51, the support sheet Ah is pressed to the component E via the head 51 at the pickup position 21, and at the packaging position 22 The component E is pressed onto the substrate S via the head 51. The θ rotation unit 53 rotates the head 51 about the Z axis, and aligns the element E on the carrier C with the circuit pattern on the substrate S. The abutment block support portion 54 is a member that comes into contact with the abutment block 94. The camera 55 detects the relative positional deviation between the transfer unit 5 and the carrier C, and the transfer unit 5 and the substrate S.

該頭部51將支持片Ah的保持面51a朝向載台3及封裝台4。保持面51a是與載台3及封裝台4平行地展開的矩形,且平坦。該頭部51具有多孔質結構,或者具有吸附孔51b,或者具有多孔質結構與吸附孔51b這兩者。例如,頭部51是將具有多孔質結構的氮化鋁或氮化矽作為主材料的陶瓷(ceramic)。除此以外,頭部51例如亦可為不鏽鋼(stainless)製。在不鏽鋼製的頭部51的情況下,吸附孔51b是必要的。吸附孔51b避開元件E的正背面,例如貫設於支持片Ah的緣區域、或者元件E與元件E之間的空間。The head 51 faces the holding surface 51 a of the support sheet Ah toward the stage 3 and the packaging stage 4. The holding surface 51 a is a rectangular shape that is developed in parallel with the stage 3 and the package stage 4 and is flat. The head 51 has a porous structure, or has an adsorption hole 51b, or has both a porous structure and an adsorption hole 51b. For example, the head 51 is a ceramic using aluminum nitride or silicon nitride having a porous structure as a main material. In addition, the head 51 may be made of stainless, for example. In the case of the stainless steel head 51, the suction hole 51b is necessary. The suction hole 51b avoids the front and back surfaces of the element E, and is provided, for example, in an edge region of the support sheet Ah or a space between the element E and the element E.

對該頭部51施加負壓,頭部51藉由負壓,利用保持面51a來吸附保持支持片Ah。即,頭部51的多孔質結構內部或吸附孔51b與空氣壓迴路12連接,通過頭部51的多孔質結構,而且通過設於頭部51的貫穿孔51b,於保持面51a產生負壓,以吸附保持支持片Ah。另一方面,當關閉空氣壓迴路12而使施加至頭部51的負壓消失時,頭部51失去支持片Ah的保持力,支持片Ah脫離。控制部件11僅在移送部5位於片材排出部8時使負壓消失。藉此,支持片Ah朝向片材排出部8被排出。A negative pressure is applied to the head 51, and the head 51 absorbs and holds the support sheet Ah by the holding surface 51a by the negative pressure. That is, the inside of the porous structure of the head portion 51 or the adsorption hole 51 b is connected to the air pressure circuit 12. A negative pressure is generated on the holding surface 51 a through the porous structure of the head portion 51 and through the through-hole 51 b provided in the head portion 51. The support sheet Ah is held by adsorption. On the other hand, when the air pressure circuit 12 is closed and the negative pressure applied to the head 51 disappears, the head 51 loses the holding force of the support sheet Ah, and the support sheet Ah is detached. The control member 11 causes the negative pressure to disappear only when the transfer section 5 is positioned in the sheet discharge section 8. Thereby, the support sheet Ah is discharged toward the sheet discharge portion 8.

進而,在該頭部51內,設置有加熱器56及鼓風機(blower)57。加熱器56例如為脈波加熱器等加熱源,對頭部51進行加熱,鼓風機57藉由空氣的噴出來對頭部51進行空氣冷卻。該加熱器56是由控制部件11予以控制。加熱器56在控制部件11的控制下,在元件E接觸基板S的期間,超過支持側剝離溫度T2而將頭部51加熱至製程溫度T3為止。而且,加熱器56在元件E接觸基板S之時以外,中斷或減弱加熱,鼓風機57在元件E接觸基板S之時以外,將頭部51冷卻至達到超過載體側剝離溫度T1而不足支持側剝離溫度T2的溫度段為止。Further, a heater 56 and a blower 57 are provided in the head portion 51. The heater 56 is, for example, a heating source such as a pulse wave heater, etc., and heats the head 51, and the blower 57 air-cools the head 51 by ejecting air. The heater 56 is controlled by the control unit 11. Under the control of the control unit 11, the heater 56 heats the head 51 to the process temperature T3 while exceeding the support-side peeling temperature T2 while the element E contacts the substrate S. In addition, the heater 56 interrupts or weakens the heating except when the element E contacts the substrate S, and the blower 57 cools the head 51 to a temperature exceeding the carrier-side peeling temperature T1 and the support side peeling except when the element E contacts the substrate S. Up to the temperature section of temperature T2.

此處,頭部51依照與該材質相應的熱膨脹係數而膨脹。頭部51的膨脹使統一保持的多行多列的各元件E的位置分別位移。於是,元件E的電極與基板S的電極對不准,元件E與基板S有時會變得接觸不良。因此,理想的是,頭部51在元件E的尺寸為10 μm以上且200 μm以下、及從保持元件E開始直至封裝至基板S為止的頭部51的溫度變化為100℃以上且300℃以下,並且包含熱膨脹係數為18×10-6 /K以下的原料時,保持面51a的一邊為50 mm以下。SUS304的熱膨脹係數為17.3×10-6 /K,SUS430的熱膨脹係數為10.4×10-6 /K,陶瓷的熱膨脹係數為2.6~10.5×10-6 /K,因此此類材料較佳。Here, the head portion 51 expands in accordance with a thermal expansion coefficient corresponding to the material. The expansion of the head 51 shifts the positions of the elements E that are held in a plurality of rows and columns, respectively. As a result, the electrode of the element E and the electrode of the substrate S are misaligned, and the element E and the substrate S may have poor contact. Therefore, it is desirable that the head 51 has a size of the element E of 10 μm or more and 200 μm or less, and the temperature change of the head 51 from the holding of the element E to the packaging to the substrate S is 100 ° C. or more and 300 ° C. or less. When a material having a thermal expansion coefficient of 18 × 10 -6 / K or less is included, one side of the holding surface 51 a is 50 mm or less. The thermal expansion coefficient of SUS304 is 17.3 × 10 -6 / K, the thermal expansion coefficient of SUS430 is 10.4 × 10 -6 / K, and the thermal expansion coefficient of ceramics is 2.6 ~ 10.5 × 10 -6 / K, so these materials are preferred.

但是,即使為所述條件範圍,根據所要求的封裝精度、從保持元件E開始直至封裝至基板S為止的頭部51的溫度變化的大小、頭部51的熱膨脹係數的大小,亦可將保持面51a的一邊的大小設定為大於50 mm。即,封裝精度越低,頭部51的溫度變化越小,而且,熱膨脹係數越小,則保持面51a的大小可設定為越大。例如,當從保持元件E開始直至封裝至基板S為止的頭部51的溫度變化為100℃且熱膨脹係數為5×10-6 /K以下時,針對尺寸為10 μm以上且200 μm以下的元件E,可將保持面51a的一邊設定為120 mm。換言之,當元件E的尺寸為10 μm以上且200 μm以下、及從保持元件E開始直至封裝至基板S為止的頭部51的溫度變化為100℃以下,並且頭部51包含熱膨脹係數為5×10-6 /K以下的原料時,較佳為將保持面51a的一邊設為120 mm。However, even within the above-mentioned condition range, it is possible to keep the temperature of the head 51 and the thermal expansion coefficient of the head 51 according to the required package accuracy, the temperature change of the head 51 from the holding element E to the package S, and the like. The size of one side of the surface 51a is set to be larger than 50 mm. That is, the lower the package accuracy, the smaller the temperature change of the head portion 51, and the smaller the thermal expansion coefficient, the larger the size of the holding surface 51a can be set. For example, when the temperature change of the head portion 51 from the holding element E to the package S to the substrate S is 100 ° C. and the thermal expansion coefficient is 5 × 10 -6 / K or less, the device has a size of 10 μm or more and 200 μm or less. E, one side of the holding surface 51a can be set to 120 mm. In other words, when the size of the element E is greater than or equal to 10 μm and less than or equal to 200 μm, and the temperature change of the head 51 from the holding of the element E to the package S is 100 ° C. or lower, and the head 51 includes a thermal expansion coefficient of 5 × For raw materials of 10 -6 / K or less, it is preferable to set one side of the holding surface 51a to 120 mm.

如圖8所示,片材供給部7準備支持片Ah。片材排出部8為容器,供丟棄黏接力喪失或下降的已使用的支持片Ah。片材供給部7與片材排出部8並設於拾取位置21與封裝位置22之間。As shown in FIG. 8, the sheet supply unit 7 prepares a support sheet Ah. The sheet discharge portion 8 is a container for discarding the used support sheet Ah that has lost or decreased its adhesion. The sheet supply section 7 and the sheet discharge section 8 are provided between the pickup position 21 and the packaging position 22.

片材供給部7包含切刀收容體71、切刀72、供給捲軸(reel)73及收容捲軸74,將支持片Ah供給至移送部5的頭部51。在切刀收容體71的上表面穿設有矩形的槽。切刀72具有框形狀,被收容在該槽內。供給捲軸73與收容捲軸74被分開配置在切刀收容體71的兩旁。在供給捲軸73上,捲繞有帶狀的支持片Ah。支持片Ah在供給捲軸73與收容捲軸74之間,在行走路徑中途經由切刀收容體71而行走。即,支持片Ah是從供給捲軸73拉出,掛於切刀收容體71的上表面,並捲繞至收容捲軸74。框狀的切刀72的形狀及尺寸是與移送部5所具備的頭部51的保持面51a一致,即,與統一拾取的多行多列的元件E所排列的區域一致。The sheet supply unit 7 includes a cutter housing 71, a cutter 72, a supply reel 73, and a storage reel 74, and supplies the support sheet Ah to the head 51 of the transfer unit 5. A rectangular groove is formed in the upper surface of the cutter housing 71. The cutter 72 has a frame shape and is accommodated in the groove. The supply reel 73 and the storage reel 74 are disposed separately on both sides of the cutter storage body 71. A belt-shaped support sheet Ah is wound on the supply reel 73. The support sheet Ah travels between the supply reel 73 and the storage reel 74 through the cutter accommodating body 71 in the middle of the travel path. That is, the support sheet Ah is pulled out from the supply reel 73, is hung on the upper surface of the cutter housing 71, and is wound around the storage reel 74. The shape and size of the frame-shaped cutter 72 are the same as those of the holding surface 51 a of the head portion 51 provided in the transfer unit 5, that is, the area in which the elements E arranged in a plurality of rows and columns are uniformly picked up.

該片材供給部7使帶狀的支持片Ah行走,使黏接力未喪失或下降的區域對準切刀收容體71。並且,切刀收容體71使切刀72從槽出現,從帶狀的支持片Ah沖切出與頭部51相符的尺寸及形狀的支持片Ah。移送部5朝向片材供給部7下降,而且,藉由對頭部51供給負壓,從而抽吸保持經沖切的支持片Ah。The sheet supply unit 7 moves the belt-shaped support sheet Ah, and aligns the area where the adhesive force is not lost or decreased toward the cutter housing 71. In addition, the cutter accommodating body 71 causes the cutter 72 to emerge from the groove, and punches out a support sheet Ah having a size and shape corresponding to the head 51 from the belt-shaped support sheet Ah. The transfer unit 5 is lowered toward the sheet supply unit 7 and, by supplying negative pressure to the head portion 51, the punched support sheet Ah is sucked and held.

(詳細動作) 對此種元件封裝裝置1的動作進行說明。圖9是表示元件封裝裝置1的動作的流程圖。首先,在移送部5的頭部51安裝支持片Ah(步驟S01)。片材供給部7使切刀72從切刀收容體71出現。切刀72從掛於切刀收容體71的支持片Ah的帶,沖切出安裝至移送部5的支持片Ah。與沖切一前一後地,移送部5移動至片材供給部7的正上方。升降部9使移送部5朝向經沖切的支持片Ah下降。在移送部5的頭部51產生有負壓。移送部5抽吸支持片Ah的基材A2以保持支持片Ah。支持片Ah的黏接層A3露出於下表面。(Detailed Operation) The operation of such a component packaging device 1 will be described. FIG. 9 is a flowchart showing the operation of the component packaging device 1. First, a support sheet Ah is attached to the head 51 of the transfer unit 5 (step S01). The sheet supply unit 7 causes the cutter 72 to emerge from the cutter housing 71. The cutter 72 punches out a support sheet Ah attached to the transfer unit 5 from a belt of the support sheet Ah hung on the cutter housing 71. Following the die-cutting, the transfer section 5 moves directly above the sheet supply section 7. The lifting portion 9 lowers the transfer portion 5 toward the punched support sheet Ah. A negative pressure is generated in the head 51 of the transfer unit 5. The transfer unit 5 sucks the substrate A2 of the support sheet Ah to hold the support sheet Ah. The adhesive layer A3 of the support sheet Ah is exposed on the lower surface.

保持有支持片Ah的移送部5移動至拾取位置21(步驟S02)。在拾取位置21處,載台3載著載體C而待機。即,在載體C上呈陣列狀儲存的元件E中的此次由移送部5拾取的多行多列的元件E群(以下稱作「拾取預定元件E群」)的中央位置被定位於拾取位置21的狀態下待機。當移送部5到達拾取位置21時,進行移送部5與載體C即拾取預定元件E群的對位(步驟S03)。The transfer unit 5 holding the support sheet Ah moves to the pickup position 21 (step S02). At the pick-up position 21, the stage 3 carries the carrier C and stands by. That is, among the components E stored in an array on the carrier C, the center position of the multiple component E group (hereinafter referred to as the "pickup component E group") picked up by the transfer unit 5 at this time is positioned at the picking position. Standby at position 21. When the transfer unit 5 reaches the pick-up position 21, the transfer unit 5 is aligned with the carrier C, that is, the group E of pick-up scheduled components (step S03).

在步驟S03中,攝影機55對拾取預定元件E群進行拍攝。藉由控制部件11來分析攝影機55的圖像,當檢測出移送部5與拾取預定元件E群在X軸方向及Y軸方向的位置偏離以及繞Z軸的方向的偏離時,移送部5與載台3相對地移動,以消除該些偏離。在X軸方向的偏離中,移送部5及載台3均可沿X軸方向移動,因此其中一者或兩者運轉。In step S03, the camera 55 captures an image of the group E of pick-up plans. When the image of the camera 55 is analyzed by the control unit 11, when the position deviation of the transfer unit 5 and the pickup group E group in the X-axis direction and the Y-axis direction and the deviation around the Z-axis direction are detected, the transfer unit 5 and The stage 3 moves relatively to eliminate these deviations. During the deviation in the X-axis direction, both the transfer unit 5 and the stage 3 can be moved in the X-axis direction, and therefore one or both of them are operated.

在偏離的檢測中,是藉由下述操作來進行,即,藉由圖像處理,對映照在圖像內的元件E群中的位於一個對角上的二個元件E的位置進行檢測。在圖像處理中,亦可進行二值化或輪廓加強,以使元件E群的對角變得明瞭。並且,運算對角的中點,取得運算結果與圖像內的基準點的差值。該差值為移送部5與拾取預定元件E群在X軸方向及Y軸方向的位置偏離。而且,關於繞Z軸的方向的偏離,藉由下述操作來消除,即,使θ旋轉部53運行,以使映照在圖像內的元件E群中的一個對角與基準線一致。The detection of the deviation is performed by the operation of detecting the positions of two elements E located on one diagonal among the element E group reflected in the image by image processing. In image processing, binarization or contour enhancement may be performed to make the diagonals of the element E group clear. Then, the diagonal midpoint is calculated to obtain the difference between the calculation result and the reference point in the image. The difference is that the positions of the transfer unit 5 and the pickup group E group deviate in the X-axis direction and the Y-axis direction. The deviation in the direction around the Z axis is eliminated by operating the θ rotation unit 53 so that one diagonal of the element E group reflected in the image coincides with the reference line.

當移送部5與拾取預定元件E群的對位完成時,藉由移送部5從載體C拾取拾取預定元件E群(步驟S04)。如圖10所示,升降部9使移送部5朝向載台3的載體C下降,將所安裝的支持片Ah按壓至拾取預定元件E群。支持片Ah的黏接區域A1全部具有黏接力。因此,收斂在支持片Ah的投影區域內的元件E全部,即,拾取預定元件E群全部貼附於支持片Ah。此處,所述步驟S02~步驟S04相當於拾取步驟S1。When the alignment of the transfer unit 5 and the group of pick-up scheduled components E is completed, the transfer unit 5 picks up and picks up the scheduled component E group from the carrier C (step S04). As shown in FIG. 10, the elevating unit 9 lowers the transfer unit 5 toward the carrier C of the stage 3, and presses the mounted support sheet Ah to the group E of picking-up elements. All the adhesive regions A1 of the support sheet Ah have adhesive force. Therefore, all of the elements E converged in the projection area of the support sheet Ah, that is, all of the group E of pick-up scheduled elements are attached to the support sheet Ah. Here, the steps S02 to S04 correspond to the picking step S1.

而且,如圖11所示,頭部51藉由基於加熱器56的加熱與鼓風機57的冷卻的溫度調整,被加熱至載體片材Ac的剝離溫度T1以上、且小於支持片Ah的剝離溫度T2的溫度Te。頭部51的熱經由載體片材Ac及元件E而傳導至載體片材Ac,或者作為來自頭部51的輻射熱而到達載體片材Ac。藉此,載體片材Ac中的頭部51的投影區域內被加熱至剝離溫度T1以上。載體片材Ac的該投影區域的黏接力喪失或下降,貼附於支持片Ah的元件E群從載體C側剝離。即,貼附於支持片Ah的元件E群不殘存於載體片材Ac而從載體片材Ac轉印至支持片Ah。以下,將貼附於支持片Ah後的拾取預定元件E群簡稱作「元件E群」。As shown in FIG. 11, the head 51 is heated to a temperature higher than the peeling temperature T1 of the carrier sheet Ac and lower than the peeling temperature T2 of the support sheet Ah by temperature adjustment based on heating by the heater 56 and cooling by the blower 57. Temperature Te. The heat of the head 51 is transmitted to the carrier sheet Ac via the carrier sheet Ac and the element E, or reaches the carrier sheet Ac as radiant heat from the head 51. Thereby, the projection area of the head part 51 in the carrier sheet Ac is heated to the peeling temperature T1 or more. The adhesive force of the projection region of the carrier sheet Ac is lost or decreased, and the element E group attached to the support sheet Ah is peeled from the carrier C side. That is, the element E group attached to the support sheet Ah does not remain on the carrier sheet Ac and is transferred from the carrier sheet Ac to the support sheet Ah. Hereinafter, the group E of the pick-up scheduled components after being attached to the support sheet Ah is simply referred to as a “component E group”.

當元件E群轉移至支持片Ah時,移送部5從拾取位置21向封裝位置22移動(步驟S05)。此時,封裝台4載著基板S而在封裝位置22處待機。即,在形成於基板S上的電路圖案中的此次要由移送部5封裝多行多列的元件E群的區域(以下稱作「封裝預定區域」)的中央位置被定位至封裝位置22的狀態下待機。當移送部5到達封裝位置22時,進行移送部5與基板S上的封裝預定區域的對位(步驟S06)。攝影機55對封裝預定區域的電路圖案進行拍攝。並且,控制部件11對移送部5與封裝預定區域在X軸方向及Y軸方向的位置偏離及繞Z軸的方向的偏離進行檢測,並使移送部5與封裝台4相對移動,以消除該些偏離。在偏離檢測中,例如只要以位於封裝預定區域的對角處的電路圖案上的電極墊(pad)為基準來算出位置偏離及方向的偏離即可。When the component E group is transferred to the supporting sheet Ah, the transfer unit 5 moves from the pickup position 21 to the packaging position 22 (step S05). At this time, the packaging stage 4 carries the substrate S and stands by at the packaging position 22. That is, in the circuit pattern formed on the substrate S, the center position of the region (hereinafter, referred to as the “pre-packaged region”) where the components E group in which rows and columns are to be packaged by the transfer unit 5 is positioned to the package position 22 Standby. When the transfer unit 5 reaches the packaging position 22, the transfer unit 5 is aligned with the package-scheduled area on the substrate S (step S06). The camera 55 captures a circuit pattern in a predetermined area. In addition, the control unit 11 detects the positional deviation of the transfer unit 5 from the planned packaging area in the X-axis direction and the Y-axis direction and the deviation around the Z-axis direction, and moves the transfer unit 5 and the packaging stage 4 relatively to eliminate the Some deviations. In the deviation detection, for example, it is only necessary to calculate the position deviation and the direction deviation based on the electrode pads on the circuit pattern located at the diagonal corners of the predetermined region of the package.

當移送部5與基板S的對位完成時,藉由移送部5將元件E群封裝至基板S上(步驟S07)。如圖12所示,升降部9使移送部5下降,移送部5將元件E群統一按壓至基板S。即,旋轉馬達92運行,抵接塊94朝向移送部5下降。抵接塊94抵接於移送部5的抵接塊支承部54,將移送部5整體朝向基板S下推,使元件E群抵接於基板S。此時,對缸體52供給有按壓所需的壓力,因此元件E群以規定壓力被按壓至基板S。When the alignment of the transfer unit 5 and the substrate S is completed, the component E group is packaged on the substrate S by the transfer unit 5 (step S07). As shown in FIG. 12, the lifting unit 9 lowers the transfer unit 5, and the transfer unit 5 collectively presses the component E group to the substrate S. That is, the rotation motor 92 is operated, and the abutment block 94 is lowered toward the transfer unit 5. The abutment block 94 abuts the abutment block support portion 54 of the transfer unit 5, pushes the entire transfer unit 5 down toward the substrate S, and abuts the component E group on the substrate S. At this time, since the pressure required for pressing is supplied to the cylinder 52, the element E group is pressed to the substrate S at a predetermined pressure.

如圖12所示,當元件E群抵接於基板S時,加熱器56將頭部51加熱至比支持片Ah的剝離溫度T2高的、用於利用導電性接合材料來將元件E群接合至基板S的製程溫度T3為止。亦可從元件E群接觸至基板S之前開始加熱,在元件E群剛剛接觸至基板S之後,頭部51的溫度通過剝離溫度T2。頭部51的熱傳導至支持片Ah,進而從支持片Ah經由元件E群而傳導至導電性接合材料。因此,如圖13所示,支持片Ah的黏接力喪失或下降,元件E群從支持片Ah剝離,從而元件E群被載置於基板S側。即,貼附於支持片Ah的元件E群不殘留於支持片Ah,而全部從支持片Ah轉印至基板S。As shown in FIG. 12, when the element E group is in contact with the substrate S, the heater 56 heats the head 51 to a temperature higher than the peeling temperature T2 of the support sheet Ah, and is used to bond the element E group with a conductive bonding material. Until the process temperature T3 of the substrate S. It is also possible to start heating before the element E group contacts the substrate S. Immediately after the element E group contacts the substrate S, the temperature of the head 51 passes the peeling temperature T2. The heat of the head portion 51 is conducted to the support sheet Ah, and is further conducted from the support sheet Ah to the conductive bonding material through the element E group. Therefore, as shown in FIG. 13, the adhesive force of the supporting sheet Ah is lost or decreased, and the element E group is separated from the supporting sheet Ah, so that the element E group is placed on the substrate S side. That is, the element E group attached to the support sheet Ah does not remain on the support sheet Ah, and all of the elements E are transferred from the support sheet Ah to the substrate S.

進而,頭部51達到製程溫度T3,藉此,利用導電性接合材料來將元件E群接合至基板S。此時,頭部51的溫度從拾取元件E群時的剝離溫度T1上升至製程溫度T3為止,且伴隨該溫度上升而熱膨脹。其中,頭部51的尺寸為50 mm以下,或者頭部51包含陶瓷或不鏽鋼等熱膨脹係數為18×10-6 /K以下的原料。因此,伴隨頭部51的熱膨脹的、各元件E的位置偏離收斂在容許範圍內,各元件E與基板S電性連接。此處,所述步驟S06~步驟S07相當於封裝步驟S2。Furthermore, the head 51 reaches the process temperature T3, whereby the element E group is bonded to the substrate S using a conductive bonding material. At this time, the temperature of the head portion 51 rises from the peeling temperature T1 when the element E group is picked up to the process temperature T3, and thermal expansion occurs as the temperature rises. Among them, the size of the head 51 is 50 mm or less, or the head 51 includes a material having a thermal expansion coefficient of 18 × 10 -6 / K or less such as ceramics or stainless steel. Therefore, with the thermal expansion of the head portion 51, the position deviation of each element E converges within an allowable range, and each element E is electrically connected to the substrate S. Here, the steps S06 to S07 correspond to the packaging step S2.

當元件E向基板S側的封裝完成時,移送部5丟棄已使用的支持片Ah(步驟S08)。移送部5向片材排出部8移動,供給至頭部51的負壓被解除。當對頭部51的負壓被解除時,安裝於移送部5的支持片Ah從頭部51脫落,並掉落至片材排出部8。When the packaging of the element E to the substrate S side is completed, the transfer unit 5 discards the used support sheet Ah (step S08). The transfer unit 5 moves to the sheet discharge unit 8, and the negative pressure supplied to the head 51 is released. When the negative pressure to the head portion 51 is released, the support sheet Ah attached to the transfer portion 5 falls off from the head portion 51 and falls to the sheet discharge portion 8.

假設移送部5所保持的支持片Ah具有包含m行n列的元件E的尺寸及形狀。假設在載體C上儲存有a×m行b×n列的元件E。而且,假設在基板S上存在封裝c×m行d×n列的元件E的餘地。a、b、c及d為正的實數,理想的是為自然數。此時,移送部5在拾取位置21與封裝位置22之間往復,反覆進行支持片Ah的封裝、元件E的拾取、元件E的封裝及支持片Ah的丟棄,直至從載體C拾取完所有元件E為止,或者直至在基板S的封裝餘地上配置完所有元件E為止。即,反覆執行圖9所示的步驟S02~步驟S08。再者,若考慮移送部5從載體C無剩餘地取盡元件E,且將元件E無剩餘地全部封裝至基板S的電路圖案,則a、b、c及d較佳為設為自然數。It is assumed that the support sheet Ah held by the transfer unit 5 has a size and a shape including the elements E of m rows and n columns. Assume that the component C having a × m rows and b × n columns is stored on the carrier C. Furthermore, it is assumed that there is room for packaging the element E of c × m rows and d × n columns on the substrate S. a, b, c and d are positive real numbers, ideally natural numbers. At this time, the transfer unit 5 reciprocates between the picking position 21 and the packaging position 22, and repeatedly performs the packaging of the supporting sheet Ah, the pickup of the component E, the packaging of the component E, and the discarding of the supporting sheet Ah until all components are picked up from the carrier C E, or until all components E are arranged on the package margin of the substrate S. That is, steps S02 to S08 shown in FIG. 9 are repeatedly executed. Furthermore, if it is considered that the transfer unit 5 completely removes the component E from the carrier C and completely packages the component E to the circuit pattern of the substrate S, then a, b, c, and d are preferably set to natural numbers. .

在移送部5反覆拾取與封裝的期間內,在片材供給部7中,供給捲軸73與收容捲軸74運行,支持片Ah的帶間歇地行走。已沖切的區域移向收容捲軸74側,未沖切的區域掛於切刀收容體71的上表面。切刀72從切刀收容體71出現,再次沖切支持片Ah。移送部5將新的支持片Ah再次安裝於頭部51,反覆進行拾取位置21處的新的m行n列元件E的拾取、與封裝位置22處的新拾取的m行n列元件E的封裝。藉此,元件封裝裝置1依序拾取載體C上的a×m行、b×n列的元件E群,並封裝至基板S上。While the transfer unit 5 is repeatedly picking up and packaging, in the sheet supply unit 7, the supply reel 73 and the storage reel 74 run, and the belt supporting the sheet Ah intermittently walks. The punched area is moved to the storage reel 74 side, and the uncut area is hung on the upper surface of the cutter housing 71. The cutter 72 emerges from the cutter accommodating body 71, and punches the support sheet Ah again. The transfer unit 5 mounts the new supporting sheet Ah on the head 51 again, and repeatedly picks up the new m rows and n columns of elements E at the picking position 21 and the newly picked m rows and n columns of elements E at the packaging position 22 Package. Thereby, the component packaging device 1 sequentially picks up the component E group in the a × m rows and b × n columns on the carrier C, and packages the component E on the substrate S.

(效果) 如上所述,該元件封裝裝置1具備載台3、封裝台4及移送部5。載台3載置呈陣列狀地排列有元件E的載體C。封裝台4載置呈陣列狀地配置元件E的基板S。移送部5在載台3與封裝台4之間移動,並且從載體C統一拾取多行多列的元件E,並將所拾取的多行多列的元件E統一轉移至基板S。該移送部5保持與包含多行多列的元件E的區域相同或稍寬的支持片Ah。並且,移送部5將支持片Ah按壓至載體C而將多行多列的元件E貼附於支持片Ah,藉此,從載體C統一拾取多行多列的元件E。(Effect) As described above, the component packaging device 1 includes the stage 3, the packaging stage 4, and the transfer unit 5. The stage 3 mounts the carriers C on which the elements E are arranged in an array. The package stage 4 mounts the substrates S on which the elements E are arranged in an array. The transfer unit 5 moves between the stage 3 and the packaging stage 4, and collectively picks up the components E in a plurality of rows and columns from the carrier C, and transfers the picked-up components E in the plurality of rows and columns to the substrate S in a unified manner. The transfer unit 5 holds a support sheet Ah that is the same as or slightly wider than the region including the elements E in a plurality of rows and columns. Then, the transfer unit 5 presses the support sheet Ah on the carrier C and attaches the elements E of the plurality of rows and columns to the support sheet Ah, thereby picking up the elements E of the plurality of rows and columns from the carrier C in a unified manner.

支持片Ah在單面具備與包含多行多列的元件E的尺寸及形狀相同或稍寬的黏接區域A1,黏接區域A1內全部具有黏接力。因此,即便不使多行多列的元件E全部各自對位至接腳點,只要各元件E接觸至支持片Ah的任何區域,支持片Ah便可發揮黏接力來貼附各元件E。The supporting sheet Ah is provided with a bonding area A1 having the same size or shape as that of the element E including a plurality of rows and columns on one side, or having a slightly wider bonding area. All of the bonding areas A1 have a bonding force. Therefore, even if all the elements E in multiple rows and columns are not aligned to the pin points, as long as each element E contacts any area of the support sheet Ah, the support sheet Ah can exert an adhesive force to attach each element E.

因而,即使未如例如真空夾盤(chuck)般高精度地管理所有抽吸孔的開口位置,亦可簡便且更確實地拾取多行多列的元件E,從而可抑制元件E殘留於載體C,或者元件E在搬送中途脫落。而且,即使排列於載體C的元件E的排列有所改變,亦無須更換頭部51或支持片Ah,例如即使在多品種小批次(lot)地封裝元件E時,亦可使元件封裝裝置1連續運轉而無須使其暫停,從而生產效率提高。Therefore, even if the opening positions of all the suction holes are not managed with high accuracy, such as a vacuum chuck, the elements E in multiple rows and columns can be picked up simply and more reliably, and the elements E can be suppressed from remaining on the carrier C. , Or component E comes off during the transfer. In addition, even if the arrangement of the components E arranged on the carrier C is changed, there is no need to replace the head 51 or the supporting sheet Ah. For example, even when the components E are packaged in a variety of small lots, a component packaging device can be used. 1 Continuous operation without having to suspend it, thereby increasing production efficiency.

尤其,該元件封裝裝置1適合於下述情況,即,使一邊為10 μm以上且200 μm以下左右的尺寸的元件E排列成多行多列而統一封裝至基板S。例如,元件封裝裝置1將迷你LED或微型LED作為背光用或者構成顯示畫面的畫素用而封裝於顯示基板。若為此種微小尺寸的元件E,則例如在使用真空吸附或靜電吸附時,只要抽吸孔或凸形結構體等吸附部稍大,元件E的位置便會變得不穩定,或者只要吸附部的形成位置稍許偏離,一部分元件E便無法保持。雖可使一個元件E與一處抽吸孔對位,但要以m行n列元件E與m行n列吸附部全部可精度良好地對位的方式進行管理,則非常困難,無法各別地修正所有元件E與吸附部的位置。In particular, the element packaging device 1 is suitable for a case where elements E having a size of about 10 μm or more and about 200 μm or less are arranged in a plurality of rows and columns to be uniformly packaged to the substrate S. For example, the component packaging device 1 encapsulates a mini LED or a micro LED on a display substrate as a backlight or a pixel constituting a display screen. In the case of such a small-sized element E, for example, when vacuum adsorption or electrostatic adsorption is used, as long as the suction portion such as a suction hole or a convex structure is slightly larger, the position of the element E becomes unstable, or as long as the adsorption is performed The formation position of the part is slightly deviated, and a part of the element E cannot be held. Although it is possible to align one element E with one suction hole, it is very difficult to manage them in such a way that all of the m rows and n columns of the element E and m rows and n columns of the suction section can be accurately aligned. Correct the positions of all components E and the suction section.

然而,該元件封裝裝置1中,即便不使多行多列的元件E全部各自對位至接腳點,只要各元件E接觸至支持片Ah的黏接區域A1,支持片Ah便可發揮黏接力來貼附各元件E,因此特別適合於使一邊為10 μm以上且200 μm以下左右的尺寸的元件E排列成多行多列而統一封裝至基板S的情況。當然,即使為超過200 μm的元件E,亦可藉由該元件封裝裝置1而統一轉移至基板S。However, in this component packaging device 1, even if the components E of multiple rows and columns are not all aligned to the pin points, as long as each component E contacts the bonding area A1 of the supporting sheet Ah, the supporting sheet Ah can exhibit adhesiveness. Each element E is attached by a relay. Therefore, it is particularly suitable when the elements E having a size of about 10 μm or more and about 200 μm or less are arranged in a plurality of rows and columns to be uniformly packaged to the substrate S. Of course, even if the element E exceeds 200 μm, it can be uniformly transferred to the substrate S by the element packaging device 1.

而且,支持片Ah是設為黏接力根據規定溫度而喪失或下降的熱剝離片材。移送部5具備作為頭部51而例示的保持部與加熱器56。頭部51保持黏接片材A,加熱器56在使多行多列的元件E接觸至基板S時,將頭部51加熱至規定溫度以上。In addition, the support sheet Ah is a thermally peelable sheet whose adhesive force is lost or decreased according to a predetermined temperature. The transfer unit 5 includes a holding unit and a heater 56 exemplified as the head 51. The head 51 holds the adhesive sheet A, and the heater 56 heats the head 51 to a predetermined temperature or higher when the elements E of a plurality of rows and columns are brought into contact with the substrate S.

即,作為多行多列的元件E向基板S上的封裝方法,包括:拾取步驟S1,將與包含多行多列的元件E的區域相同或稍寬的支持片Ah按壓至元件供給體(載體C),以將多行多列的元件E貼附至支持片Ah;以及封裝步驟S2,當使多行多列的元件E接觸至基板S時,將支持片Ah加熱至支持片Ah的黏接力喪失或下降的規定溫度以上,以使多行多列的元件E從支持片Ah剝離。而且,作為在基板S上呈陣列狀地封裝有元件E的元件封裝基板的製造方法,多次反覆該拾取步驟S1與封裝步驟S2。That is, the method for packaging the components E on the substrate S in a plurality of rows and columns includes a picking step S1, and pressing a support sheet Ah, which is the same as or slightly wider than the area containing the components E in the plurality of rows and columns, onto the component supplier ( Carrier C) to attach the elements E of multiple rows and columns to the support sheet Ah; and the packaging step S2, when the elements E of the multiple rows and columns are brought into contact with the substrate S, the support sheet Ah is heated to the temperature of the support sheet Ah. The adhesive force is lost or decreased at a predetermined temperature or more so that the elements E in a plurality of rows and columns are separated from the support sheet Ah. Furthermore, as a method of manufacturing a component package substrate in which the components E are packaged in an array on the substrate S, the pick-up step S1 and the packaging step S2 are repeated several times.

藉此,即便不使多行多列的元件E全部各自對位至接腳點,只要各元件E接觸至支持片Ah的黏接區域A1,支持片Ah便可發揮黏接力來貼附各元件E,並且可更確實地使元件E脫離至基板S,因此在將元件E轉印至基板S時,可防止元件E殘存於支持片Ah側。因此,封裝元件E的基板S的良率提高。而且,產生利用元件E來填補未能封裝的部位的、封裝後的後作業的可能性變低,製品的生產效率提高。Thus, even if the components E of multiple rows and columns are not all aligned to the pin points, as long as each component E contacts the bonding area A1 of the support sheet Ah, the support sheet Ah can exert the adhesive force to attach each component. E, and the element E can be more reliably detached from the substrate S. Therefore, when the element E is transferred to the substrate S, the element E can be prevented from remaining on the support sheet Ah side. Therefore, the yield of the substrate S of the package element E is improved. In addition, the possibility that post-package post-packing operation occurs due to the use of the element E to fill the unpackaged portion is reduced, and the production efficiency of the product is improved.

進而,經加熱的頭部51依照與該材質相應的熱膨脹係數而膨脹,使統一保持的多行多列的元件E分別位移。然而,本實施形態中,使頭部51的支持片Ah的保持面51a具有矩形形狀,且一邊的長度為50 mm以下。或者,使頭部51包含熱膨脹係數為18×10-6 /K以下的原料。藉此,可避免造成元件E的電極與基板S的電極對不准的程度的、元件E的位置偏離,從而抑制元件E與基板S的接觸不良。因而,即使頭部51受到加熱,封裝有元件E的基板S的良率亦可提高。而且,本實施形態中,使頭部51的支持片Ah的保持面51a具有矩形形狀,一邊的長度為120 mm以下,且使頭部51包含熱膨脹係數為5×10-6 /K以下的原料。藉此,與所述同樣,可避免造成元件E的電極與基板S的電極對不准的程度的、元件E的位置偏離,從而抑制元件E與基板S的接觸不良。Furthermore, the heated head portion 51 expands in accordance with the thermal expansion coefficient corresponding to the material, thereby displacing the elements E of a plurality of rows and columns that are uniformly held. However, in this embodiment, the holding surface 51a of the support sheet Ah of the head 51 is made into a rectangular shape, and the length of one side is 50 mm or less. Alternatively, the head portion 51 is made of a material having a thermal expansion coefficient of 18 × 10 -6 / K or less. Thereby, the positional deviation of the element E can be avoided to the extent that the electrode of the element E and the electrode of the substrate S are misaligned, and the poor contact between the element E and the substrate S can be suppressed. Therefore, even if the head 51 is heated, the yield of the substrate S in which the element E is packaged can be improved. Furthermore, in this embodiment, the holding surface 51a of the support sheet Ah of the head 51 has a rectangular shape, the length of one side is 120 mm or less, and the head 51 includes a material having a thermal expansion coefficient of 5 × 10 -6 / K or less . Thereby, as described above, the positional deviation of the element E can be avoided to the extent that the electrode of the element E and the electrode of the substrate S are misaligned, and the contact failure between the element E and the substrate S can be suppressed.

而且,載體C具備黏接力在比頭部51的支持片Ah低的溫度下喪失或下降的另一黏接片材A即載體片材Ac。該載體C是在載體片材Ac上呈陣列狀地貼附元件E而成。並且,加熱器56在頭部51拾取元件E時,將頭部51加熱至比頭部51所保持的支持片Ah的黏接力喪失或下降的溫度低、且比載體C所具備的載體片材Ac的黏接力喪失或下降的溫度高的溫度。Further, the carrier C is provided with another adhesive sheet A, which is a carrier sheet Ac, whose adhesive force is lost or decreased at a lower temperature than the support sheet Ah of the head 51. This carrier C is obtained by attaching elements E in an array on a carrier sheet Ac. When the heater 56 picks up the element E, the heater 56 heats the head 51 to a temperature lower than the temperature at which the adhesive force of the support sheet Ah held by the head 51 is lost or decreased, and is lower than the carrier sheet provided in the carrier C. The temperature at which the adhesion of Ac is lost or dropped is high.

藉此,當支持片Ah貼附元件E時,載體C側容易分離元件E,因此在將元件E轉印至支持片Ah時,可防止元件E殘存於載體C側。因此,封裝有元件E的基板S的良率提高。而且,產生利用元件E來填補未能封裝的部位的、封裝後的後作業的可能性變低,製品的生產效率提高。進而,可對載體C分離元件E的時機(timing)進行控制,從而在載台3對載體C的移送時,元件E不會發生位置偏離,封裝時的接觸不良亦可更確實地得到防止。Thereby, when the support sheet Ah is attached to the component E, the component C is easily separated on the carrier C side. Therefore, when the component E is transferred to the support sheet Ah, the component E can be prevented from remaining on the carrier C side. Therefore, the yield of the substrate S in which the element E is packaged is improved. In addition, the possibility that post-package post-packing operation occurs due to the use of the element E to fill the unpackaged portion is reduced, and the production efficiency of the product is improved. Furthermore, the timing at which the carrier C separates the element E can be controlled, so that the position of the element E does not deviate when the carrier 3 transfers the carrier C, and contact defects during packaging can be prevented more reliably.

再者,本實施形態中,以載體片材Ac亦為熱剝離片材的形態為例進行了說明,但只要是在元件E的拾取時可使元件E的保持力喪失或下降的片材,則並不限於此。例如,作為載體片材Ac,亦可使用與黏接面的法線方向的保持力比支持片Ah低的黏接片材。利用支持片Ah來貼附元件E後,使移送部5上升以離開載體C時,藉由載體片材Ac與支持片Ah的保持力之差,元件E自載體片材Ac剝離,從而可將元件E轉印至支持片Ah。In this embodiment, the carrier sheet Ac is also described as an example of a thermally peelable sheet. However, as long as it is a sheet that can lose or lower the holding force of the element E when the element E is picked up, It is not limited to this. For example, as the carrier sheet Ac, an adhesive sheet having a lower holding force with respect to the normal direction of the adhesive surface than the support sheet Ah may be used. After the component E is attached with the support sheet Ah, the transfer part 5 is lifted to leave the carrier C, and the component E is peeled from the carrier sheet Ac due to the difference in the holding force between the carrier sheet Ac and the support sheet Ah. The element E is transferred to a support sheet Ah.

而且,如圖14所示,移送部5亦可具備傾斜機構58,該傾斜機構58沿著由Y軸與Z軸劃分形成的YZ平面來使頭部51與缸體52的列傾斜。傾斜機構58例如具備沿X軸方向延伸的旋轉軸、及使該旋轉軸進行軸旋轉的旋轉馬達。安裝有缸體52與頭部51的支架(bracket)固接於該旋轉軸。當使旋轉馬達驅動時,頭部51與缸體52沿著YZ平面來變更方向。Further, as shown in FIG. 14, the transfer unit 5 may include a tilting mechanism 58 that tilts the rows of the head 51 and the cylinder 52 along a YZ plane formed by dividing the Y axis and the Z axis. The tilt mechanism 58 includes, for example, a rotation shaft extending in the X-axis direction, and a rotation motor that rotates the rotation shaft. A bracket to which the cylinder body 52 and the head 51 are attached is fixed to the rotation shaft. When the rotary motor is driven, the head 51 and the cylinder block 52 change directions along the YZ plane.

此時,只要使用攝影機55的拍攝圖像來檢測基板S上的封裝預定位置的翹曲即可。傾斜機構58根據所檢測出的翹曲來使頭部51與缸體52的列傾斜,以使基板S上的封裝預定位置與頭部51的保持面51a變得平行。亦可取代攝影機55而具備雷射(laser)照射裝置來檢測基板S的翹曲。雷射照射裝置具備雷射照射部與雷射受光部,利用雷射來掃描基板S,根據雷射受光部的受光時機來檢測基板S的翹曲,即,檢測雷射照射部與雷射掃描位置的距離。At this time, it is only necessary to use the captured image of the camera 55 to detect warpage at a predetermined package position on the substrate S. The tilt mechanism 58 tilts the head 51 and the rows of the cylinders 52 in accordance with the detected warpage so that the predetermined package position on the substrate S and the holding surface 51 a of the head 51 become parallel. Instead of the camera 55, a laser irradiation device may be provided to detect the warpage of the substrate S. The laser irradiation device includes a laser irradiation section and a laser light receiving section, and scans the substrate S using laser light, and detects warpage of the substrate S based on the light receiving timing of the laser light receiving section, that is, detects the laser irradiation section and laser scanning. The distance of the location.

藉此,即使大型的基板S發生翹曲,亦可精度良好地封裝元件E。而且,即使基板S發生翹曲,亦可消除基板S與元件E的氣隙(air gap),使所有元件E同時接觸至基板S後,使元件E自支持片Ah剝離。因此,可降低元件E脫離基板S的可能性,提高製品的良率。再者,若進一步設置沿著XZ平面來使頭部51與缸體52的列傾斜的傾斜機構58,則可應對朝向所有方向的翹曲。Thereby, even if the large-sized substrate S is warped, the element E can be packaged with high accuracy. Moreover, even if the substrate S is warped, the air gap between the substrate S and the element E can be eliminated, and after all the elements E are brought into contact with the substrate S at the same time, the element E is peeled from the support sheet Ah. Therefore, the possibility that the element E is detached from the substrate S can be reduced, and the yield of the product can be improved. Furthermore, if further provided with a tilt mechanism 58 that tilts the rows of the head 51 and the cylinder 52 along the XZ plane, it is possible to cope with warpage in all directions.

而且,具備片材供給部7,該片材供給部7使帶狀的支持片Ah行走,以供給黏接力未喪失或下降的區域。藉此,即使將支持片Ah設為熱剝離片材,亦可效率良好地搬送元件E。而且,該片材供給部7具備在帶狀的支持片Ah的行走路徑中途沖切支持片Ah的切刀72。藉此,無須逐片地供給支持片Ah,可簡便且迅速地供給支持片Ah。In addition, a sheet supply unit 7 is provided which runs the belt-shaped support sheet Ah to supply a region in which the adhesive force is not lost or decreased. Thereby, even if the support sheet Ah is a thermally peelable sheet, the element E can be efficiently conveyed. The sheet supply unit 7 includes a cutter 72 that punches the support sheet Ah in the middle of the travel path of the belt-shaped support sheet Ah. Thereby, it is not necessary to supply the support sheet Ah one by one, and the support sheet Ah can be supplied simply and quickly.

再者,亦可如圖15所示,在移送部5中配備片材供給部7。移送部5在頭部51的兩旁具備供給捲軸73與收容捲軸74。從供給捲軸73拉出的支持片Ah的帶掛於頭部51的保持面51a,並被捲繞至收容捲軸74。當將元件E貼附於支持片Ah的帶與保持面51a一致的區域,且該元件E藉由熱而剝離時,使供給捲軸73與收容捲軸74運行,將已使用的區域送往收容捲軸74側,使新的區域位於保持面51a。Alternatively, as shown in FIG. 15, the sheet feeding unit 7 may be provided in the transfer unit 5. The transfer unit 5 includes a supply reel 73 and a storage reel 74 on both sides of the head 51. The tape of the support sheet Ah drawn from the supply reel 73 is hung on the holding surface 51 a of the head 51, and is wound around the storage reel 74. When the component E is attached to the area of the support sheet Ah that coincides with the holding surface 51a, and the component E is peeled off by heat, the supply reel 73 and the storage reel 74 are operated, and the used area is sent to the storage reel. On the 74 side, the new area is positioned on the holding surface 51a.

此時,支持片Ah的帶的寬度方向(Y軸方向)的尺寸是形成為與配置多行多列的元件E的區域的寬度方向(Y軸方向)的尺寸相同或稍寬的寬度。頭部51的保持面51a中的支持片Ah的進給方向(X軸方向)的尺寸,即,在圖15中支持片Ah平坦地受到支持的部分的X軸方向的尺寸,是形成為與配置多行多列的元件E的區域的X軸方向的尺寸相同或稍寬的寬度。而且,在保持面51a的兩端形成的支持片Ah的彎折部可設為銳角。At this time, the size in the width direction (Y-axis direction) of the band of the support sheet Ah is formed to be the same as or slightly wider than the size in the width direction (Y-axis direction) of the region where the elements E in a plurality of rows and columns are arranged. The size in the feeding direction (X-axis direction) of the support sheet Ah in the holding surface 51a of the head 51, that is, the size in the X-axis direction of the portion where the support sheet Ah is flatly supported in FIG. The area in which the elements E in a plurality of rows and columns are arranged has the same or slightly wider width in the X-axis direction. Further, the bent portions of the supporting sheet Ah formed at both ends of the holding surface 51a may be set at an acute angle.

若如此般在移送部5中配備片材供給部7,則可省去移送部5經由片材供給部7與片材排出部8的製程。因此,從新支持片Ah向頭部51的安裝開始,經過元件E的拾取與元件E的封裝,直至支持片Ah的替換為止的節拍時間(tack time)提高,製品的生產效率提高。If the sheet supply section 7 is provided in the transfer section 5 in this way, the manufacturing process of the transfer section 5 through the sheet supply section 7 and the sheet discharge section 8 can be omitted. Therefore, from the installation of the new support sheet Ah to the head 51, the tack time after picking up the component E and packaging the component E until the replacement of the support sheet Ah is increased, and the production efficiency of the product is improved.

(第2實施形態) 接下來,參照圖式來詳細說明第2實施形態的元件封裝裝置1。對於與第1實施形態相同的結構及相同的功能,標註相同的符號並省略詳細說明。(Second Embodiment) Next, a component packaging device 1 according to a second embodiment will be described in detail with reference to the drawings. The same configurations and the same functions as those of the first embodiment are denoted by the same reference numerals and detailed descriptions are omitted.

如圖16所示,該元件封裝裝置1中,在頭部51中配備的加熱器56將頭部51加熱至各元件E的配置位置適合於基板S的適合溫度段T4為止。即,加熱器56對頭部51進行加熱而使其熱膨脹,使多行多列的各元件E的配置位置發生位移,以使得各元件E位於可電性接合至基板S的容許範圍。As shown in FIG. 16, in the component packaging device 1, a heater 56 provided in the head portion 51 heats the head portion 51 to a suitable temperature range T4 where the placement position of each element E is suitable for the substrate S. That is, the heater 56 heats the head portion 51 and thermally expands it, thereby displacing the arrangement positions of the elements E in a plurality of rows and columns, so that each element E is located within an allowable range capable of being electrically bonded to the substrate S.

適合溫度段T4被設定為包含支持片Ah的黏接力喪失或下降的支持側剝離溫度T2。即,只要比封裝於基板S的元件E的間隔窄地,將各元件E排列於載體片材Ac,且根據頭部51的材質及大小來調整線膨脹係數,並調整支持側剝離溫度T2,或者複合地使用該些操作,來設定適合溫度段T4與支持剝離溫度T2即可。The suitable temperature section T4 is set to the support-side peeling temperature T2 including the loss or decrease of the adhesive force of the support sheet Ah. That is, as long as the interval between the elements E packaged on the substrate S is narrower, each element E is arranged on the carrier sheet Ac, and the linear expansion coefficient is adjusted according to the material and size of the head 51, and the support-side peeling temperature T2 is adjusted. Alternatively, these operations may be used in combination to set the appropriate temperature range T4 and the supporting peeling temperature T2.

此種元件封裝裝置1中,從載體C拾取拾取預定元件E群,並使所拾取的元件E群接觸至基板S。此時,如圖17所示,加熱器56將頭部51加熱至包含支持側剝離溫度T2的適合溫度段T4為止,藉由頭部51的熱膨脹,使元件E的間隔適合於基板S的電路圖案而擴大,並且使元件E從支持片Ah剝離以解開與頭部51側的束縛,且將元件E群移交至基板S。藉此,藉由頭部51的熱膨脹,各元件E的位置精度良好地收斂至容許範圍內的適當位置P,各元件E與基板S電性連接,因此可抑制因頭部51的熱膨脹引起的良率下降。In such a component packaging device 1, a predetermined component E group is picked up from the carrier C, and the picked-up component E group is brought into contact with the substrate S. At this time, as shown in FIG. 17, the heater 56 heats the head 51 to a suitable temperature range T4 including the support-side peeling temperature T2, and the thermal expansion of the head 51 makes the interval of the element E suitable for the circuit of the substrate S. The pattern is expanded, and the element E is peeled from the support sheet Ah to release the restraint from the head 51 side, and the element E group is transferred to the substrate S. Thereby, the positional accuracy of each element E converges well to the appropriate position P within the allowable range due to the thermal expansion of the head 51, and each element E is electrically connected to the substrate S. Therefore, the thermal expansion caused by the head 51 can be suppressed. Yield drops.

再者,加熱器56進而將頭部51加熱至針對導電性接合材料的製程溫度T3為止。當經剝離的元件E群因支持片Ah的摩擦係數,受頭部51的熱膨脹拉拽而繼續位移以擴大間隔時,只要使適合溫度段T4與製程溫度T3一致即可。Furthermore, the heater 56 further heats the head portion 51 to a process temperature T3 for the conductive bonding material. When the peeled element E group continues to be displaced by the thermal expansion of the head 51 due to the friction coefficient of the supporting sheet Ah to expand the interval, the appropriate temperature range T4 and the process temperature T3 should be consistent.

或者,當通過包含支持側剝離溫度T2的適合溫度段T4時,即,當藉由頭部51的熱膨脹而元件E的間隔適合於基板S而擴大時,頭部51暫時解除負壓,以解開支持片Ah與頭部51的束縛,且將頭部51加熱至製程溫度T3為止。即使頭部51發生熱膨脹,未被頭部51抽吸的支持片Ah的伸展亦難以追隨頭部51的熱膨脹,對於由支持片Ah與基板S夾著的元件E群而言,在從適合溫度段T4到達製程溫度T3的過程中進一步擴大間隔的可能性亦變少。Alternatively, when the temperature range T4 including the support-side peeling temperature T2 is adopted, that is, when the interval of the element E is adapted to the substrate S by the thermal expansion of the head 51, the head 51 temporarily releases the negative pressure to solve the problem. Untie the support sheet Ah from the head 51, and heat the head 51 to the process temperature T3. Even if the head 51 is thermally expanded, the expansion of the support sheet Ah that is not sucked by the head 51 is difficult to follow the thermal expansion of the head 51. For the element E group sandwiched by the support sheet Ah and the substrate S, It is also less likely that the interval will be further extended during the period when the segment T4 reaches the process temperature T3.

(第3實施形態) 接下來,參照圖式來詳細說明第3實施形態的元件封裝裝置1。對於與第1實施形態或第2實施形態相同的結構及相同的功能,標註相同的符號並省略詳細的說明。(Third Embodiment) Next, a component packaging device 1 according to a third embodiment will be described in detail with reference to the drawings. Structures and functions that are the same as those of the first embodiment or the second embodiment are denoted by the same reference numerals and detailed descriptions are omitted.

該元件封裝裝置1中,在基板S上形成有利用紫外線來固化或暫時固化的導電性接合材料。如圖18所示,封裝台4的載置面是具有比基板S小一圈的開口的甜甜圈(doughnuts)型,在封裝台4的下方,與封裝位置中心對位地配置有紫外線照射裝置59。基板S是將玻璃板設為基底,紫外線照射裝置59朝向基板S出射紫外線,透過基板S而照射至導電性接合材料。In this element packaging device 1, a conductive bonding material that is cured or temporarily cured by ultraviolet rays is formed on a substrate S. As shown in FIG. 18, the mounting surface of the packaging stage 4 is a doughnut type having an opening smaller than the substrate S, and an ultraviolet irradiation is arranged below the packaging stage 4 in a position opposite to the center of the packaging position. Device 59. The substrate S has a glass plate as a base, and the ultraviolet irradiation device 59 emits ultraviolet rays toward the substrate S, passes through the substrate S, and irradiates the conductive bonding material.

圖19是表示第3元件封裝裝置1的封裝過程的動作的流程圖。升降部9使保持有多行多列的元件E的移送部5朝向封裝台4下降,缸體52將多行多列的元件E按壓至基板S。當元件E被按壓至基板S時(步驟S11),紫外線照射裝置59將紫外線照射至導電性接合材料,使導電性接合材料固化(步驟S12)。藉此,元件E固定於基板S。當元件E接合於基板S後,加熱器56將頭部51加熱至支持側剝離溫度T2為止(步驟S13)。頭部51的熱傳導至支持片Ah,支持片Ah使黏接力喪失或下降,以使接合於基板S的元件E從支持片Ah剝離。FIG. 19 is a flowchart showing the operation of the packaging process of the third component packaging device 1. The elevating unit 9 lowers the transfer unit 5 holding the elements E in a plurality of rows and columns toward the packaging stage 4, and the cylinder 52 presses the elements E in the plurality of rows and columns to the substrate S. When the element E is pressed onto the substrate S (step S11), the ultraviolet irradiation device 59 irradiates ultraviolet rays to the conductive bonding material to cure the conductive bonding material (step S12). Thereby, the element E is fixed to the substrate S. After the element E is bonded to the substrate S, the heater 56 heats the head 51 to the support-side peeling temperature T2 (step S13). The heat of the head 51 is conducted to the supporting sheet Ah, and the supporting sheet Ah loses or decreases the adhesive force, so that the element E bonded to the substrate S is peeled from the supporting sheet Ah.

當加熱器56將頭部51加熱至支持側剝離溫度T2為止時,頭部51會發生熱膨脹,但由於貼附於支持片Ah的多行多列的元件E已被固定於基板S,因此難以追隨於頭部51的熱膨脹而發生位移。因此,各元件E的位置可維持容許範圍內,從而可抑制因頭部51的熱膨脹引起的良率下降。When the heater 56 heats the head 51 to the support-side peeling temperature T2, the head 51 thermally expands. However, since the elements E of the multiple rows and columns attached to the support sheet Ah are already fixed to the substrate S, it is difficult to The displacement follows the thermal expansion of the head 51. Therefore, the position of each element E can be maintained within an allowable range, and a decrease in the yield due to the thermal expansion of the head portion 51 can be suppressed.

(其他實施形態) 以上,對本發明的實施形態及各部的變形例進行了說明,但該實施形態或各部的變形例是作為一例而提示,並不意圖限定發明的範圍。所述的該些新穎的實施形態能以其他的各種形態來實施,在不脫離發明主旨的範圍內,可進行各種省略、置換、變更。該些實施形態或其變形包含在發明的範圍或主旨中,並且包含在申請專利範圍所記載的發明中。(Other Embodiments) Although the embodiment of the present invention and the modification examples of the respective parts have been described above, this embodiment or the modification examples of the respective parts is presented as an example, and is not intended to limit the scope of the invention. The novel embodiments described above can be implemented in various other forms, and various omissions, substitutions, and changes can be made without departing from the spirit of the invention. These embodiments or modifications thereof are included in the scope or gist of the invention, and are included in the invention described in the scope of patent application.

1‧‧‧元件封裝裝置1‧‧‧component packaging device

3‧‧‧載台3‧‧‧ carrier

4‧‧‧封裝台4‧‧‧Packing station

5‧‧‧移送部5‧‧‧Transfer Department

6‧‧‧基座6‧‧‧ base

7‧‧‧片材供給部7‧‧‧ Sheet Supply Department

8‧‧‧片材排出部8‧‧‧ Sheet discharge section

9‧‧‧升降部9‧‧‧ Lifting Department

11‧‧‧控制部件11‧‧‧Control Unit

12‧‧‧空氣壓迴路12‧‧‧air pressure circuit

21‧‧‧拾取位置21‧‧‧Pick up position

22‧‧‧封裝位置22‧‧‧Package location

31、41‧‧‧X軸驅動機構31, 41‧‧‧ X-axis drive mechanism

32、42‧‧‧Y軸驅動機構32, 42‧‧‧Y-axis drive mechanism

51‧‧‧頭部51‧‧‧Head

51a‧‧‧保持面51a‧‧‧ keep face

51b‧‧‧吸附孔51b‧‧‧ adsorption hole

52‧‧‧缸體52‧‧‧cylinder block

53‧‧‧θ旋轉部53‧‧‧θ rotation section

54‧‧‧抵接塊支承部54‧‧‧ abutment block support

55‧‧‧攝影機55‧‧‧Camera

56‧‧‧加熱器56‧‧‧heater

57‧‧‧鼓風機57‧‧‧blower

58‧‧‧傾斜機構58‧‧‧Tilt mechanism

59‧‧‧紫外線照射裝置59‧‧‧ultraviolet irradiation device

61‧‧‧增高台61‧‧‧increased platform

62‧‧‧支柱62‧‧‧ Pillar

63、66、91‧‧‧導軌63, 66, 91‧‧‧ rails

64‧‧‧支持部64‧‧‧ Support Department

65‧‧‧滾珠螺桿65‧‧‧ball screw

67、69‧‧‧延伸前端面67, 69‧‧‧ extended front surface

71‧‧‧切刀收容體71‧‧‧knife container

72‧‧‧切刀72‧‧‧ Cutter

73‧‧‧供給捲軸73‧‧‧Supply Scroll

74‧‧‧收容捲軸74‧‧‧ Containment Scroll

92‧‧‧旋轉馬達92‧‧‧Rotary motor

93‧‧‧螺桿93‧‧‧Screw

94‧‧‧抵接塊94‧‧‧ abutment block

A‧‧‧黏接片材A‧‧‧Adhesive sheet

A1‧‧‧黏接區域A1‧‧‧ Adhesive area

A2‧‧‧基材A2‧‧‧ substrate

A3‧‧‧黏接層A3‧‧‧Adhesive layer

A4‧‧‧發泡填料A4‧‧‧Foaming filler

Ac‧‧‧載體片材Ac‧‧‧ carrier sheet

Ah‧‧‧支持片Ah‧‧‧ support movie

C‧‧‧載體C‧‧‧ carrier

E‧‧‧元件E‧‧‧Element

S‧‧‧基板S‧‧‧ substrate

S01~S08、S11~S13‧‧‧步驟S01 ~ S08, S11 ~ S13‧‧‧step

S1‧‧‧拾取步驟S1‧‧‧Pickup steps

S2‧‧‧封裝步驟S2‧‧‧Packaging steps

T1‧‧‧載體側剝離溫度T1‧‧‧ Carrier side peeling temperature

Te‧‧‧溫度Te‧‧‧Temperature

T2‧‧‧支持側剝離溫度T2‧‧‧Support side peeling temperature

T3‧‧‧製程溫度T3‧‧‧Processing temperature

T4‧‧‧適合溫度段T4‧‧‧suitable for temperature

圖1是表示第1實施形態的元件封裝裝置的概略結構的立體圖。 圖2是示意性地表示被安裝於移送部的黏接片材的立體圖。 圖3(a)及圖3(b)是包含熱剝離片材的黏接片材的剖面圖,圖3(a)表示加熱前,圖3(b)表示局部加熱後。 圖4是表示溫度與黏接力的關係及頭部的溫度位移的圖表。 圖5是表示第1實施形態的元件封裝裝置的詳細結構的正面圖。 圖6是表示第1實施形態的元件封裝裝置的詳細結構的側面圖。 圖7是表示移送部的詳細結構的圖。 圖8是表示片材供給部的詳細結構的圖。 圖9是表示第1實施形態的元件封裝裝置的動作的流程圖。 圖10是表示元件拾取步驟中的、支持片(holder sheet)對載體(carrier)上的元件的壓接狀態的示意圖。 圖11是表示元件拾取步驟中的、載體上的元件的剝離狀態的示意圖。 圖12是表示元件封裝步驟中的、元件向基板的壓接與加熱狀態的示意圖。 圖13是表示元件封裝步驟中的、元件從支持片的剝離與向基板的封裝狀態的示意圖。 圖14是表示具有傾斜機構的移送部的圖。 圖15是表示具有片材供給部的移送部的圖。 圖16是有關於第2實施形態的元件封裝裝置,是表示熱膨脹與元件位置偏離的圖表。 圖17是表示藉由熱膨脹來修正元件位置偏離的過程的示意圖。 圖18是有關於第3實施形態的元件封裝裝置,是表示載台的結構的圖。 圖19是表示第3元件封裝裝置的封裝過程的動作的流程圖。FIG. 1 is a perspective view showing a schematic configuration of a component packaging device according to a first embodiment. FIG. 2 is a perspective view schematically showing an adhesive sheet attached to a transfer section. 3 (a) and 3 (b) are cross-sectional views of an adhesive sheet including a thermally peelable sheet. FIG. 3 (a) shows before heating and FIG. 3 (b) shows after partial heating. FIG. 4 is a graph showing the relationship between the temperature and the adhesive force and the temperature displacement of the head. FIG. 5 is a front view showing a detailed configuration of the component packaging device according to the first embodiment. FIG. 6 is a side view showing a detailed configuration of the component packaging device according to the first embodiment. FIG. 7 is a diagram showing a detailed configuration of a transfer unit. FIG. 8 is a diagram showing a detailed configuration of a sheet supply unit. FIG. 9 is a flowchart showing the operation of the component packaging device according to the first embodiment. FIG. 10 is a schematic diagram showing a state in which a holder sheet presses a component on a carrier in a component picking step. FIG. 11 is a schematic diagram showing a peeling state of a component on a carrier in a component picking step. FIG. 12 is a schematic diagram showing a state in which a component is pressed to a substrate and heated in a component packaging step. FIG. 13 is a schematic diagram showing a state in which a component is peeled from a support sheet and a package state to a substrate in a component packaging step. FIG. 14 is a diagram showing a transfer unit having a tilt mechanism. FIG. 15 is a diagram showing a transfer unit including a sheet supply unit. FIG. 16 is a graph showing a component packaging device according to a second embodiment, showing thermal expansion and deviation of component positions. FIG. 17 is a schematic diagram showing a process of correcting a positional deviation of a device by thermal expansion. FIG. 18 is a view showing a component packaging device according to a third embodiment and showing a configuration of a stage. FIG. 19 is a flowchart showing the operation of the packaging process of the third component packaging device.

Claims (10)

一種元件封裝裝置,其特徵在於,包括:供給台,載置呈陣列狀排列有元件的元件供給體;封裝台,載置呈陣列狀配置所述元件的基板;以及移送部,在所述供給台與所述封裝台之間多次往復移,每當返回所述供給台時,從所述元件供給體一次多行多列地拾取所述元件,每當到達所述封裝台時,將所拾取的所述多行多列的所述元件轉移至所述基板,所述移送部包括:保持部,保持黏接片材,所述黏接片材是與包含所述多行多列的元件的區域相同或稍寬的片材,且黏接力因規定溫度而喪失或下降;以及加熱器,當使所述多行多列的元件接觸至所述基板時,將所述保持部加熱至所述規定溫度以上,將所述黏接片材按壓至所述元件供給體而使所述多行多列的元件貼附於所述黏接片材,藉此,從所述元件供給體一次拾取所述多行多列的元件,藉由加熱至所述規定溫度以上,使所拾取的所述元件從所述黏接片材剝離而統一轉移至所述基板。A component packaging device is characterized by comprising: a supply table on which a component supply body in which components are arranged in an array is placed; a packaging table on which a substrate in which the components are arranged in an array is placed; and a transfer section where the supply The table and the packaging table are moved back and forth multiple times. Whenever they return to the supply table, the components are picked up from the component supply body in multiple rows and columns at a time. The picked-up elements of the plurality of rows and columns are transferred to the substrate, and the transfer section includes: a holding portion that holds an adhesive sheet, and the adhesion sheet is a component including the plurality of rows and columns Sheets with the same or slightly wider area, and the adhesive force is lost or decreased due to the specified temperature; and a heater, when the elements of the rows and columns are brought into contact with the substrate, the holding portion is heated to When the predetermined temperature is higher than the predetermined temperature, the adhesive sheet is pressed against the component supply body to attach the multiple rows and columns of components to the adhesive sheet, thereby picking up from the component supply body at a time The elements in the plurality of rows and columns are collectively transferred to the substrate by peeling the picked-up elements from the adhesive sheet by heating to the predetermined temperature or higher. 如申請專利範圍第1項所述的元件封裝裝置,其中所述保持部包含熱膨脹係數為18×10-6/K以下的原料。The element packaging device according to item 1 of the patent application range, wherein the holding portion contains a raw material having a thermal expansion coefficient of 18×10 −6 /K or less. 如申請專利範圍第1項或第2項所述的元件封裝裝置,其中所述保持部的所述黏接片材的保持面具有矩形形狀,且一邊的長度為120mm以下。The component packaging device according to claim 1 or claim 2, wherein the holding surface of the adhesive sheet of the holding portion has a rectangular shape, and the length of one side is 120 mm or less. 如申請專利範圍第1項或第2項所述的元件封裝裝置,其中所述元件供給體包括另一黏接片材,在比所述保持部的所述黏接片材的溫度低的情況下,所述另一黏接片材的黏接力喪失或下降,將所述元件呈陣列狀地貼附於所述另一黏接片材,所述加熱器將所述保持部加熱至特定溫度,所述特定溫度為在所述保持部拾取所述元件時,比使所述保持部所保持的所述黏接片材的黏接力喪失或下降的溫度低,且比使所述元件供給體所具備的所述另一黏接片材的黏接力喪失或下降的溫度高的溫度。The component packaging device according to item 1 or 2 of the patent application range, wherein the component supply body includes another adhesive sheet when the temperature of the adhesive sheet of the holding portion is lower than Next, the adhesive force of the other adhesive sheet is lost or decreased, the elements are attached to the other adhesive sheet in an array, and the heater heats the holding portion to a specific temperature The specific temperature is lower than the temperature at which the adhesive force of the adhesive sheet held by the holding portion is lost or decreased when the component is picked up by the holding portion, and is lower than the temperature at which the component supply body is made The temperature at which the adhesive strength of the other adhesive sheet is lost or decreased is high. 如申請專利範圍第1項所述的元件封裝裝置,其中所述加熱器對所述保持部進行加熱而使其熱膨脹,直至經由所述黏接片材而由所述保持部所保持的所述多行多列的元件的配置位置適合於對所述基板的配置位置為止。The component packaging device according to item 1 of the patent application range, wherein the heater heats the holding portion to thermally expand it until the holding portion holds the holding portion via the adhesive sheet The arrangement positions of the elements in rows and columns are suitable up to the arrangement positions on the substrate. 如申請專利範圍第1項所述的元件封裝裝置,其中在所述基板上,形成有藉由紫外線而固化的導電性接合材料,所述封裝台具有對所述基板的紫外線照射部,所述加熱器在所述紫外線照射部對所述基板照射紫外線,利用所述導電性接合材料將所述基板與所述多行多列的元件予以接合後,對所述頭部進行加熱。The component packaging device according to item 1 of the patent application range, wherein a conductive bonding material cured by ultraviolet rays is formed on the substrate, and the packaging table has an ultraviolet irradiation part of the substrate, the The heater irradiates the substrate with ultraviolet rays at the ultraviolet irradiation section, joins the substrate to the elements of the plurality of rows and columns with the conductive bonding material, and heats the head. 如申請專利範圍第1項或第2項所述的元件封裝裝置,其包括:片材供給部,使帶狀的所述黏接片材行走,將黏接力未喪失或下降的區域供給至所述保持部。The component packaging device according to item 1 or 2 of the scope of the patent application, which includes a sheet supplying section that runs the adhesive sheet in the form of a strip and supplies an area where the adhesive force is not lost or decreased to all Described holding part. 如申請專利範圍第7項所述的元件封裝裝置,其中所述片材供給部包括切刀,所述切刀在所述帶狀的黏接片材的行走路徑中途,對所述保持部所保持的所述黏接片材進行沖切。The component packaging device according to item 7 of the patent application range, wherein the sheet supplying section includes a cutter, which cuts the holding section in the middle of the travel path of the tape-shaped adhesive sheet The held adhesive sheet is die cut. 一種元件封裝方法,其特徵在於,是從呈陣列狀地排列有元件的元件供給體一次拾取多行多列的元件,並將所拾取的所述多行多列的元件統一轉移至基板,包括:拾取步驟,將與包含所述多行多列的元件的區域相同或稍寬的黏接片材按壓至所述元件供給體,以將所述多行多列的元件貼附至所述黏接片材;以及封裝步驟,當使所述多行多列的元件接觸至所述基板時,將所述黏接片材加熱至使所述黏接片材的黏接力喪失或下降的規定溫度以上,以使所述多行多列的元件從所述黏接片材剝離,多次重複所述拾取步驟與所述封裝步驟,從所述元件供給體逐次多行多列地拾取所述元件,並逐次多行多列地將所述元件轉移至所述基板。A component packaging method is characterized by picking up multiple rows and multiple columns of components from a component supply body in which components are arranged in an array at a time, and collectively transferring the picked up multiple rows and multiple columns of components to a substrate, including : Picking step, pressing an adhesive sheet that is the same as or slightly wider than the area containing the elements in the multiple rows and columns to the element supply body to attach the multiple rows and columns to the adhesive A bonding sheet; and a packaging step, when the elements of the rows and columns are brought into contact with the substrate, the bonding sheet is heated to a predetermined temperature that causes the bonding force of the bonding sheet to be lost or decreased In the above, in order to peel off the components in the plurality of rows and columns from the adhesive sheet, the picking step and the packaging step are repeated multiple times, and the components are picked up from the component supply body in multiple rows and columns , And transfer the elements to the substrate in multiple rows and multiple columns at a time. 一種元件封裝基板製造方法,其特徵在於,是從呈陣列狀地排列有元件的元件供給體一次拾取多行多列的元件,將所拾取的所述多行多列的元件統一封裝至基板,從而製造呈陣列狀地封裝有所述元件的元件封裝基板,包括:拾取步驟,將與包含所述多行多列的元件的區域相同或稍寬的黏接片材按壓至所述元件供給體,以將所述多行多列的元件貼附至所述黏接片材;封裝步驟,當使所述多行多列的元件接觸至所述基板時,將所述黏接片材加熱至使所述黏接片材的黏接力喪失或下降的規定溫度以上,以使所述多行多列的元件從所述黏接片材剝離;以及反覆步驟,多次重複所述拾取步驟與所述封裝步驟,從所述元件供給體逐次多行多列地拾取所述元件,並逐次多行多列地將所述元件轉移至所述基板,藉此來製造在所述基板上呈陣列狀地封裝有所述元件的元件封裝基板。A method for manufacturing a component packaging substrate is characterized by picking up multiple rows and columns of components at a time from a component supply body in which components are arranged in an array, and packaging the picked up components in multiple rows and multiple columns to a substrate in a unified manner. Thus, manufacturing an element package substrate in which the elements are packaged in an array includes: a picking step, pressing an adhesive sheet that is the same as or slightly wider than the area containing the elements in the rows and columns to the element supplier To attach the multiple rows and multiple columns of components to the adhesive sheet; in the packaging step, when the multiple rows and multiple columns of components are brought into contact with the substrate, the adhesive sheet is heated to The predetermined temperature above which the adhesive force of the adhesive sheet is lost or decreased, so that the elements of the rows and columns are peeled off from the adhesive sheet; and an iterative step, repeating the picking step and the In the packaging step, the components are picked up from the component supply body in multiple rows and columns, and the components are transferred to the substrate in multiple rows and columns, thereby manufacturing an array on the substrate An element packaging substrate on which the elements are encapsulated.
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