TWI643180B - 用於檢查顯示單元的技術 - Google Patents

用於檢查顯示單元的技術 Download PDF

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Publication number
TWI643180B
TWI643180B TW106113940A TW106113940A TWI643180B TW I643180 B TWI643180 B TW I643180B TW 106113940 A TW106113940 A TW 106113940A TW 106113940 A TW106113940 A TW 106113940A TW I643180 B TWI643180 B TW I643180B
Authority
TW
Taiwan
Prior art keywords
display unit
sensor device
display
sensor
photodetector
Prior art date
Application number
TW106113940A
Other languages
English (en)
Chinese (zh)
Other versions
TW201740364A (zh
Inventor
克里斯托夫 魯斯
Original Assignee
德商Ｅ．解決有限責任公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 德商Ｅ．解決有限責任公司 filed Critical 德商Ｅ．解決有限責任公司
Publication of TW201740364A publication Critical patent/TW201740364A/zh
Application granted granted Critical
Publication of TWI643180B publication Critical patent/TWI643180B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/04—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa
    • H04N1/19—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa using multi-element arrays
    • H04N1/195—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa using multi-element arrays the array comprising a two-dimensional array or a combination of two-dimensional arrays
    • H04N1/19505—Scanning picture elements spaced apart from one another in at least one direction
    • H04N1/19521—Arrangements for moving the elements of the array relative to the scanned image or vice versa
    • H04N1/19526—Optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/041—Temperature compensation
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/06—Adjustment of display parameters
    • G09G2320/0693—Calibration of display systems
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2360/00—Aspects of the architecture of display systems
    • G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
    • G09G2360/145—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen
    • G09G2360/147—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen the originated light output being determined for each pixel
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2380/00—Specific applications
    • G09G2380/10—Automotive applications
TW106113940A 2016-04-27 2017-04-26 用於檢查顯示單元的技術 TWI643180B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102016005130.2A DE102016005130B3 (de) 2016-04-27 2016-04-27 Technik zum Prüfen einer Anzeigeeinheit
??102016005130.2 2016-04-27

Publications (2)

Publication Number Publication Date
TW201740364A TW201740364A (zh) 2017-11-16
TWI643180B true TWI643180B (zh) 2018-12-01

Family

ID=59700420

Family Applications (1)

Application Number Title Priority Date Filing Date
TW106113940A TWI643180B (zh) 2016-04-27 2017-04-26 用於檢查顯示單元的技術

Country Status (4)

Country Link
KR (1) KR101989116B1 (ko)
CN (1) CN107318013A (ko)
DE (1) DE102016005130B3 (ko)
TW (1) TWI643180B (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3101419B1 (fr) * 2019-09-27 2022-02-04 Univ Savoie Mont Blanc Dispositif et procédé de contrôle de pièces
CN113014908A (zh) * 2019-12-19 2021-06-22 西安诺瓦星云科技股份有限公司 图像检测方法、装置和系统及计算机可读存储介质

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003229262A (ja) * 2002-01-31 2003-08-15 Toyota Industries Corp 有機ｅｌ表示パネルの短絡画素検査方法及びその装置
TWM283166U (en) * 2005-08-12 2005-12-11 Lin Yu Shiun Device of inspecting the pixel unit of a display panel
US7525593B2 (en) * 2003-07-25 2009-04-28 Advantest Corporation Position detection apparatus, position detection method, testing apparatus, and camera module manufacturing apparatus
TWI368208B (ko) * 2006-03-15 2012-07-11 Nihon Micronics Kk

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Publication number Priority date Publication date Assignee Title
JP2002098651A (ja) * 2000-07-19 2002-04-05 Hitachi Ltd 被検査パネルの点灯状態検査方法と装置、及びこれを用いた表示パネルの製造方法
JP2002250701A (ja) * 2001-02-26 2002-09-06 Horiba Ltd 平面表示パネルの欠陥検査装置
CN1518085B (zh) * 2003-01-15 2010-05-12 内格夫技术有限公司 用于快速在线电光检测晶片缺陷的方法和系统
KR101074394B1 (ko) * 2005-02-24 2011-10-17 엘지디스플레이 주식회사 엘시디 검사장치
TWI321218B (en) * 2006-01-17 2010-03-01 R2D Technology Inc Device, system and method for measuring response time
JP2008039462A (ja) * 2006-08-02 2008-02-21 Fujitsu Ltd 表示パネル検査装置及び方法
JP4874893B2 (ja) * 2007-08-22 2012-02-15 シャープ株式会社 点灯検査装置、および点灯検査方法
KR100953204B1 (ko) * 2008-05-19 2010-04-15 (주)쎄미시스코 기판의 품질 검사장치 및 그 검사방법
JP5417205B2 (ja) * 2010-01-29 2014-02-12 株式会社日立ハイテクノロジーズ 欠陥検査装置及び欠陥検査方法
WO2012105055A1 (ja) * 2011-02-04 2012-08-09 株式会社日立製作所 光学フィルタリング方法とそのデバイスおよび基板上欠陥検査方法とその装置
JP2012208181A (ja) * 2011-03-29 2012-10-25 Seiko Epson Corp コントラスト検査装置
CN103955080A (zh) * 2014-04-29 2014-07-30 电子科技大学 一种采用多摄像头的液晶屏缺陷检测采图装置
CN204789391U (zh) * 2015-07-09 2015-11-18 成都天奥测控技术有限公司 液晶显示屏缺陷自动检测系统用相机运动组件
CN105259181A (zh) * 2015-10-26 2016-01-20 华为技术有限公司 显示屏的显示缺陷检测方法、装置及设备
CN105301810A (zh) * 2015-11-24 2016-02-03 上海斐讯数据通信技术有限公司 一种屏幕缺陷检测方法及装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003229262A (ja) * 2002-01-31 2003-08-15 Toyota Industries Corp 有機ｅｌ表示パネルの短絡画素検査方法及びその装置
US7525593B2 (en) * 2003-07-25 2009-04-28 Advantest Corporation Position detection apparatus, position detection method, testing apparatus, and camera module manufacturing apparatus
TWM283166U (en) * 2005-08-12 2005-12-11 Lin Yu Shiun Device of inspecting the pixel unit of a display panel
TWI368208B (ko) * 2006-03-15 2012-07-11 Nihon Micronics Kk

Also Published As

Publication number Publication date
TW201740364A (zh) 2017-11-16
DE102016005130B3 (de) 2017-09-14
KR101989116B1 (ko) 2019-06-13
CN107318013A (zh) 2017-11-03
KR20170122649A (ko) 2017-11-06

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