DE102016005130B3 - Technik zum Prüfen einer Anzeigeeinheit - Google Patents

Technik zum Prüfen einer Anzeigeeinheit Download PDF

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Publication number
DE102016005130B3
DE102016005130B3 DE102016005130.2A DE102016005130A DE102016005130B3 DE 102016005130 B3 DE102016005130 B3 DE 102016005130B3 DE 102016005130 A DE102016005130 A DE 102016005130A DE 102016005130 B3 DE102016005130 B3 DE 102016005130B3
Authority
DE
Germany
Prior art keywords
display unit
sensor device
photodetectors
display
contraption
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE102016005130.2A
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German (de)
English (en)
Inventor
Christof Ruess
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
eSolutions GmbH
Original Assignee
eSolutions GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by eSolutions GmbH filed Critical eSolutions GmbH
Priority to DE102016005130.2A priority Critical patent/DE102016005130B3/de
Priority to KR1020170040045A priority patent/KR101989116B1/ko
Priority to TW106113940A priority patent/TWI643180B/zh
Priority to CN201710286815.4A priority patent/CN107318013A/zh
Application granted granted Critical
Publication of DE102016005130B3 publication Critical patent/DE102016005130B3/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/04—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa
    • H04N1/19—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa using multi-element arrays
    • H04N1/195—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa using multi-element arrays the array comprising a two-dimensional array or a combination of two-dimensional arrays
    • H04N1/19505—Scanning picture elements spaced apart from one another in at least one direction
    • H04N1/19521—Arrangements for moving the elements of the array relative to the scanned image or vice versa
    • H04N1/19526—Optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/04—Maintaining the quality of display appearance
    • G09G2320/041—Temperature compensation
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/06—Adjustment of display parameters
    • G09G2320/0693—Calibration of display systems
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2360/00—Aspects of the architecture of display systems
    • G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
    • G09G2360/145—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen
    • G09G2360/147—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen the originated light output being determined for each pixel
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2380/00—Specific applications
    • G09G2380/10—Automotive applications
DE102016005130.2A 2016-04-27 2016-04-27 Technik zum Prüfen einer Anzeigeeinheit Active DE102016005130B3 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE102016005130.2A DE102016005130B3 (de) 2016-04-27 2016-04-27 Technik zum Prüfen einer Anzeigeeinheit
KR1020170040045A KR101989116B1 (ko) 2016-04-27 2017-03-29 디스플레이 유닛을 검사하기 위한 방법 및 장치
TW106113940A TWI643180B (zh) 2016-04-27 2017-04-26 用於檢查顯示單元的技術
CN201710286815.4A CN107318013A (zh) 2016-04-27 2017-04-27 用于检查显示单元的技术

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102016005130.2A DE102016005130B3 (de) 2016-04-27 2016-04-27 Technik zum Prüfen einer Anzeigeeinheit

Publications (1)

Publication Number Publication Date
DE102016005130B3 true DE102016005130B3 (de) 2017-09-14

Family

ID=59700420

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102016005130.2A Active DE102016005130B3 (de) 2016-04-27 2016-04-27 Technik zum Prüfen einer Anzeigeeinheit

Country Status (4)

Country Link
KR (1) KR101989116B1 (ko)
CN (1) CN107318013A (ko)
DE (1) DE102016005130B3 (ko)
TW (1) TWI643180B (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3101419B1 (fr) * 2019-09-27 2022-02-04 Univ Savoie Mont Blanc Dispositif et procédé de contrôle de pièces
CN113014908A (zh) * 2019-12-19 2021-06-22 西安诺瓦星云科技股份有限公司 图像检测方法、装置和系统及计算机可读存储介质

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002098651A (ja) * 2000-07-19 2002-04-05 Hitachi Ltd 被検査パネルの点灯状態検査方法と装置、及びこれを用いた表示パネルの製造方法
JP2009047630A (ja) * 2007-08-22 2009-03-05 Sharp Corp 点灯検査装置、および点灯検査方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002250701A (ja) * 2001-02-26 2002-09-06 Horiba Ltd 平面表示パネルの欠陥検査装置
JP2003229262A (ja) * 2002-01-31 2003-08-15 Toyota Industries Corp 有機ｅｌ表示パネルの短絡画素検査方法及びその装置
CN1518085B (zh) * 2003-01-15 2010-05-12 内格夫技术有限公司 用于快速在线电光检测晶片缺陷的方法和系统
KR20060057581A (ko) * 2003-07-25 2006-05-26 주식회사 아도반테스토 위치 검출 장치, 위치 검출 방법, 시험 장치 및 카메라모듈 제조 장치
KR101074394B1 (ko) * 2005-02-24 2011-10-17 엘지디스플레이 주식회사 엘시디 검사장치
TWM283166U (en) * 2005-08-12 2005-12-11 Lin Yu Shiun Device of inspecting the pixel unit of a display panel
TWI321218B (en) * 2006-01-17 2010-03-01 R2D Technology Inc Device, system and method for measuring response time
JP2007248202A (ja) * 2006-03-15 2007-09-27 Micronics Japan Co Ltd 表示用基板の検査に用いるセンサ基板及びこれを用いる表示用基板の検査方法
JP2008039462A (ja) * 2006-08-02 2008-02-21 Fujitsu Ltd 表示パネル検査装置及び方法
KR100953204B1 (ko) * 2008-05-19 2010-04-15 (주)쎄미시스코 기판의 품질 검사장치 및 그 검사방법
JP5417205B2 (ja) * 2010-01-29 2014-02-12 株式会社日立ハイテクノロジーズ 欠陥検査装置及び欠陥検査方法
WO2012105055A1 (ja) * 2011-02-04 2012-08-09 株式会社日立製作所 光学フィルタリング方法とそのデバイスおよび基板上欠陥検査方法とその装置
JP2012208181A (ja) * 2011-03-29 2012-10-25 Seiko Epson Corp コントラスト検査装置
CN103955080A (zh) * 2014-04-29 2014-07-30 电子科技大学 一种采用多摄像头的液晶屏缺陷检测采图装置
CN204789391U (zh) * 2015-07-09 2015-11-18 成都天奥测控技术有限公司 液晶显示屏缺陷自动检测系统用相机运动组件
CN105259181A (zh) * 2015-10-26 2016-01-20 华为技术有限公司 显示屏的显示缺陷检测方法、装置及设备
CN105301810A (zh) * 2015-11-24 2016-02-03 上海斐讯数据通信技术有限公司 一种屏幕缺陷检测方法及装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002098651A (ja) * 2000-07-19 2002-04-05 Hitachi Ltd 被検査パネルの点灯状態検査方法と装置、及びこれを用いた表示パネルの製造方法
JP2009047630A (ja) * 2007-08-22 2009-03-05 Sharp Corp 点灯検査装置、および点灯検査方法

Also Published As

Publication number Publication date
TW201740364A (zh) 2017-11-16
KR101989116B1 (ko) 2019-06-13
TWI643180B (zh) 2018-12-01
CN107318013A (zh) 2017-11-03
KR20170122649A (ko) 2017-11-06

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