TWI552865B - Metal-liquid crystal polymer composite manufacturing method and electronic parts - Google Patents
Metal-liquid crystal polymer composite manufacturing method and electronic parts Download PDFInfo
- Publication number
- TWI552865B TWI552865B TW102124351A TW102124351A TWI552865B TW I552865 B TWI552865 B TW I552865B TW 102124351 A TW102124351 A TW 102124351A TW 102124351 A TW102124351 A TW 102124351A TW I552865 B TWI552865 B TW I552865B
- Authority
- TW
- Taiwan
- Prior art keywords
- liquid crystal
- crystal polymer
- metal
- coupling agent
- metal material
- Prior art date
Links
- 229920000106 Liquid crystal polymer Polymers 0.000 title claims description 91
- 239000004977 Liquid-crystal polymers (LCPs) Substances 0.000 title claims description 91
- 239000002131 composite material Substances 0.000 title claims description 33
- 238000004519 manufacturing process Methods 0.000 title claims description 25
- 239000007769 metal material Substances 0.000 claims description 62
- 239000007822 coupling agent Substances 0.000 claims description 59
- 239000003990 capacitor Substances 0.000 claims description 29
- 238000004381 surface treatment Methods 0.000 claims description 29
- 229910052751 metal Inorganic materials 0.000 claims description 28
- 239000002184 metal Substances 0.000 claims description 28
- 238000007747 plating Methods 0.000 claims description 27
- 229910052782 aluminium Inorganic materials 0.000 claims description 21
- 239000007864 aqueous solution Substances 0.000 claims description 17
- 229910052715 tantalum Inorganic materials 0.000 claims description 17
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 17
- 229910052718 tin Inorganic materials 0.000 claims description 14
- 238000001746 injection moulding Methods 0.000 claims description 13
- 229910052710 silicon Inorganic materials 0.000 claims description 13
- 229910052719 titanium Inorganic materials 0.000 claims description 13
- 239000000243 solution Substances 0.000 claims description 12
- 239000011347 resin Substances 0.000 claims description 10
- 229920005989 resin Polymers 0.000 claims description 10
- 125000000524 functional group Chemical group 0.000 claims description 9
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 claims description 9
- 238000007789 sealing Methods 0.000 claims description 7
- 229910052709 silver Inorganic materials 0.000 claims description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 6
- 238000005452 bending Methods 0.000 claims description 6
- 229910052738 indium Inorganic materials 0.000 claims description 6
- 229910052759 nickel Inorganic materials 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 4
- 239000004973 liquid crystal related substance Substances 0.000 claims description 4
- 229910052758 niobium Inorganic materials 0.000 claims description 4
- 239000010955 niobium Substances 0.000 claims description 4
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 4
- 238000012545 processing Methods 0.000 claims description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 3
- 229910052804 chromium Inorganic materials 0.000 claims description 3
- 229910052757 nitrogen Inorganic materials 0.000 claims description 3
- 238000002788 crimping Methods 0.000 claims description 2
- 150000002739 metals Chemical class 0.000 claims description 2
- 238000003825 pressing Methods 0.000 claims description 2
- 150000001412 amines Chemical class 0.000 claims 1
- 238000000465 moulding Methods 0.000 claims 1
- 238000006116 polymerization reaction Methods 0.000 claims 1
- DIOQZVSQGTUSAI-UHFFFAOYSA-N decane Chemical compound CCCCCCCCCC DIOQZVSQGTUSAI-UHFFFAOYSA-N 0.000 description 27
- 239000010949 copper Substances 0.000 description 15
- 229910052802 copper Inorganic materials 0.000 description 14
- 239000000758 substrate Substances 0.000 description 14
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 13
- 239000010936 titanium Substances 0.000 description 11
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 11
- 238000011156 evaluation Methods 0.000 description 10
- 229910052749 magnesium Inorganic materials 0.000 description 7
- 239000011777 magnesium Substances 0.000 description 7
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 6
- 229910052684 Cerium Inorganic materials 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 6
- 229910052726 zirconium Inorganic materials 0.000 description 6
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- PEXBBTCNDBSFHT-UHFFFAOYSA-N NCCNCCCC(C(OC)(OC)OC)CCCCCCCC Chemical compound NCCNCCCC(C(OC)(OC)OC)CCCCCCCC PEXBBTCNDBSFHT-UHFFFAOYSA-N 0.000 description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 4
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 4
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 4
- 125000003277 amino group Chemical group 0.000 description 4
- 125000003118 aryl group Chemical group 0.000 description 4
- 230000008878 coupling Effects 0.000 description 4
- 238000010168 coupling process Methods 0.000 description 4
- 238000005859 coupling reaction Methods 0.000 description 4
- 239000003822 epoxy resin Substances 0.000 description 4
- 229920000647 polyepoxide Polymers 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- XFEWMFDVBLLXFE-UHFFFAOYSA-N 1-isocyanatodecane Chemical compound CCCCCCCCCCN=C=O XFEWMFDVBLLXFE-UHFFFAOYSA-N 0.000 description 3
- LBIHNTAFJVHBLJ-UHFFFAOYSA-N 3-(triethoxymethyl)undec-1-ene Chemical compound C(=C)C(C(OCC)(OCC)OCC)CCCCCCCC LBIHNTAFJVHBLJ-UHFFFAOYSA-N 0.000 description 3
- LAENUTMFTKEICI-UHFFFAOYSA-N N(=C=O)CCCC(C(OCC)(OCC)OCC)CCCCCCCC Chemical compound N(=C=O)CCCC(C(OCC)(OCC)OCC)CCCCCCCC LAENUTMFTKEICI-UHFFFAOYSA-N 0.000 description 3
- HDJGANPLOWXKTM-UHFFFAOYSA-N NC(=O)NCCCC(C(OCC)(OCC)OCC)CCCCCCCC Chemical compound NC(=O)NCCCC(C(OCC)(OCC)OCC)CCCCCCCC HDJGANPLOWXKTM-UHFFFAOYSA-N 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- IQPQWNKOIGAROB-UHFFFAOYSA-N isocyanate group Chemical group [N-]=C=O IQPQWNKOIGAROB-UHFFFAOYSA-N 0.000 description 3
- 229920000768 polyamine Polymers 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- 238000007788 roughening Methods 0.000 description 3
- 229910052717 sulfur Inorganic materials 0.000 description 3
- 239000011593 sulfur Substances 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- XSQUKJJJFZCRTK-UHFFFAOYSA-N urea group Chemical group NC(=O)N XSQUKJJJFZCRTK-UHFFFAOYSA-N 0.000 description 3
- SXPGQGNWEWPWQZ-UHFFFAOYSA-N 4-(triethoxymethyl)dodecan-1-amine Chemical compound NCCCC(C(OCC)(OCC)OCC)CCCCCCCC SXPGQGNWEWPWQZ-UHFFFAOYSA-N 0.000 description 2
- FJKROLUGYXJWQN-UHFFFAOYSA-N 4-hydroxybenzoic acid Chemical compound OC(=O)C1=CC=C(O)C=C1 FJKROLUGYXJWQN-UHFFFAOYSA-N 0.000 description 2
- 239000004956 Amodel Substances 0.000 description 2
- MTDLVDBRMBSPBJ-UHFFFAOYSA-N C(C1CO1)OCCCC(C(OCC)(OCC)OCC)CCCCCCCC Chemical compound C(C1CO1)OCCCC(C(OCC)(OCC)OCC)CCCCCCCC MTDLVDBRMBSPBJ-UHFFFAOYSA-N 0.000 description 2
- 229910000881 Cu alloy Inorganic materials 0.000 description 2
- MHZGKXUYDGKKIU-UHFFFAOYSA-N Decylamine Chemical compound CCCCCCCCCCN MHZGKXUYDGKKIU-UHFFFAOYSA-N 0.000 description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 150000004645 aluminates Chemical class 0.000 description 2
- ZCDOYSPFYFSLEW-UHFFFAOYSA-N chromate(2-) Chemical compound [O-][Cr]([O-])(=O)=O ZCDOYSPFYFSLEW-UHFFFAOYSA-N 0.000 description 2
- 238000005238 degreasing Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000005211 surface analysis Methods 0.000 description 2
- 238000004073 vulcanization Methods 0.000 description 2
- AAMHBRRZYSORSH-UHFFFAOYSA-N 2-octyloxirane Chemical compound CCCCCCCCC1CO1 AAMHBRRZYSORSH-UHFFFAOYSA-N 0.000 description 1
- 229940090248 4-hydroxybenzoic acid Drugs 0.000 description 1
- 229910001316 Ag alloy Inorganic materials 0.000 description 1
- 239000004677 Nylon Substances 0.000 description 1
- 241000282320 Panthera leo Species 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 229910001069 Ti alloy Inorganic materials 0.000 description 1
- 125000003158 alcohol group Chemical group 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 238000005275 alloying Methods 0.000 description 1
- 239000002585 base Substances 0.000 description 1
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical compound C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 230000000740 bleeding effect Effects 0.000 description 1
- 229910000420 cerium oxide Inorganic materials 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- DIOQZVSQGTUSAI-NJFSPNSNSA-N decane Chemical class CCCCCCCCC[14CH3] DIOQZVSQGTUSAI-NJFSPNSNSA-N 0.000 description 1
- LBDKAALDDAKVBS-UHFFFAOYSA-N decane urea Chemical compound NC(N)=O.CCCCCCCCCC LBDKAALDDAKVBS-UHFFFAOYSA-N 0.000 description 1
- OWEZJUPKTBEISC-UHFFFAOYSA-N decane-1,1-diamine Chemical compound CCCCCCCCCC(N)N OWEZJUPKTBEISC-UHFFFAOYSA-N 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000000921 elemental analysis Methods 0.000 description 1
- 150000002148 esters Chemical group 0.000 description 1
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000001879 gelation Methods 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000011256 inorganic filler Substances 0.000 description 1
- 229910003475 inorganic filler Inorganic materials 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 1
- 238000005554 pickling Methods 0.000 description 1
- 229920001225 polyester resin Polymers 0.000 description 1
- 239000004645 polyester resin Substances 0.000 description 1
- 239000004848 polyfunctional curative Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000001846 repelling effect Effects 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 229910001925 ruthenium oxide Inorganic materials 0.000 description 1
- WOCIAKWEIIZHES-UHFFFAOYSA-N ruthenium(iv) oxide Chemical compound O=[Ru]=O WOCIAKWEIIZHES-UHFFFAOYSA-N 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000013517 stratification Methods 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C26/00—Coating not provided for in groups C23C2/00 - C23C24/00
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/04—Electrodes or formation of dielectric layers thereon
- H01G9/042—Electrodes or formation of dielectric layers thereon characterised by the material
- H01G9/0425—Electrodes or formation of dielectric layers thereon characterised by the material specially adapted for cathode
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/08—Housing; Encapsulation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/49105—Connecting at different heights
- H01L2224/49107—Connecting at different heights on the semiconductor or solid-state body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
- H01L23/433—Auxiliary members in containers characterised by their shape, e.g. pistons
- H01L23/4334—Auxiliary members in encapsulations
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/58—Optical field-shaping elements
- H01L33/60—Reflective elements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Injection Moulding Of Plastics Or The Like (AREA)
- Led Device Packages (AREA)
- Chemically Coating (AREA)
- Other Surface Treatments For Metallic Materials (AREA)
- Lead Frames For Integrated Circuits (AREA)
Description
本發明係關於一種金屬材料與液晶聚合物以良好之密接力接合的金屬-液晶聚合物複合體之製造方法以及具備該金屬-液晶聚合物複合體之電子零件。
近年來,自節約能源、降低成本之觀點出發,LED日益普及。為了最大限度地利用自LED之發光元件射出之光,於搭載元件之電極上實施有以Ag作為主成分之白色鍍敷。自抗硫化性或降低成本之觀點出發,一種非純Ag鍍敷,而是以In或Sn為代表之合金鍍敷已被開發。
另外,為了以密封材料密封LED元件而形成之外殼係將高耐熱性之尼龍射出成型而形成。作為該外殼用之樹脂,例如有芳香族聚醯胺之Amodel(註冊商標)。
另外,以電子機器處理之訊號多為高頻帶,例如,鉭電容器被用作電源平滑用途或去除雜訊之旁路電容器。該鉭電容器係以環氧樹脂覆蓋陰極端子、陽極端子、及被Ag膏覆蓋之電容器本體而構成。鉭電容器中介電常數較高之氧化鉭被用作介電體。再者,近來以介電常數較氧化鉭高之氧化鈮作為介電體之鈮電容器受到關注。
作為此種技術,例如於專利文獻1中,揭示有反射率較高,並且製造性優異的LED用引線框架之表面處理技術。另外,專利文獻2中示出以環氧樹脂作為密封劑之鉭電容器,專利文獻3中示出鈮電容器。
[專利文獻1]日本特開2012-89638號公報
[專利文獻2]日本專利3700771號公報
[專利文獻3]日本專利4817468號公報
LED之殼體中所使用之以Amodel為代表之芳香族聚醯胺的流動性較差,殼體之射出成型存在問題。針對於此,本發明人發現若將芳香族聚醯胺替換成液晶聚合物,則流動性增加,故而殼體之射出成型變得容易。並且,由於液晶聚合物本身為白色,故而可與白色之電極配合而使LED元件之白色光更有效率地射出。
另外,用於鉭電容器之覆蓋層之環氧樹脂必須與硬化劑混合,故而需要進行樹脂之調合步驟,但若將該環氧樹脂更換為液晶聚合物,則可省略調合步驟。
另一方面,發現存在下述問題:當於經實施以鍍Ag為代表之白色鍍敷的電極上將液晶聚合物射出成型時,或許是由於電極表面與液晶聚合物之密接性較低之緣故而產生間隙,即便於此種殼體中填充密封樹脂,密封樹脂亦會自間隙滲漏。
本發明係為了解決上述課題進行研究而成者,本發明之課題在於提供
一種金屬材料與液晶聚合物以良好之密接力接合的金屬-液晶聚合物複合體之製造方法以及具備該金屬-液晶聚合物複合體之電子零件。
電極、端子之表面處理多係根據反射率、抗硫化性等各種特性而最佳化。因此,經努力研究之結果,本發明人著眼於對金屬側進行偶合劑處理,作為有效利用該等表面處理並提高與液晶聚合物之密接力之手段。
偶合劑之主成分元素有Si、Ti、Zr、Al、Sn、Ce,但就穩定性之觀點而言,較理想為Si、Ti。另發現,若分子內具有含氮官能基,則金屬材料之與液晶聚合物之密接力提高。
以上述見解為基礎而完成的本發明之一態樣係一種金屬-液晶聚合物複合體之製造方法,其對未經粗面化處理之金屬材料進行使用有具有含氮官能基之偶合劑的表面處理,並藉由壓接或射出成型使液晶聚合物接合於該處理面。
本發明之金屬-液晶聚合物複合體之製造方法之一實施形態中,上述偶合劑之主成分元素為Si、Ti及Al中之任一者。
本發明之金屬-液晶聚合物複合體之製造方法之另一實施形態中,上述含氮官能基為胺基、異氰酸基及脲基中之任一者。
本發明之金屬-液晶聚合物複合體之製造方法之進而另一實施形態中,已進行上述使用有偶合劑之表面處理的金屬材料於上述金屬材料表面之Si、Ti、Al的下方,具有Cu、Al、Cr、Ag、Ni、In、Sn中任一種以上之金屬或其氧化物的層。
本發明之金屬-液晶聚合物複合體之製造方法之進而另一
實施形態中,利用均勻地溶解有偶合劑之溶液,進行上述使用有偶合劑之表面處理。
本發明之金屬-液晶聚合物複合體之製造方法之進而另一實施形態中,利用溶解有偶合劑之pH值7~14的溶液,進行上述使用有偶合劑之表面處理。
本發明之金屬-液晶聚合物複合體之製造方法之進而另一實施形態中,於進行壓製加工或彎曲加工之後,對金屬材料實施上述表面處理,並藉由壓接或射出成型使液晶聚合物接合於該處理面。
本發明之金屬-液晶聚合物複合體之製造方法之進而另一實施形態中,對金屬材料實施上述表面處理之後進行壓製加工或彎曲加工,並藉由壓接或射出成型使液晶聚合物接合於上述表面處理面。
本發明之另一態樣係一種電子零件,其具備藉由本發明之金屬-液晶聚合物複合體之製造方法而獲得的金屬-液晶聚合物複合體。
本發明之電子零件之一實施形態係LED封裝體,於該LED封裝體中,上述金屬材料為經實施白色鍍敷之引線框架,用以與液晶聚合物接合之上述金屬材料之表面,係藉由對上述引線框架之白色鍍敷表面利用分子內具有氮之偶合劑進行處理而形成,該LED封裝體係藉由如下方式構成:以上述引線框架作為殼電極,於上述殼電極上構裝有LED晶片,上述晶片周邊被由上述液晶聚合物構成之殼體覆蓋,於上述殼體內填充有含有螢光體之密封樹脂。
本發明之電子零件之另一實施形態係鋁、鉭及鈮中任一種之電容器,於該電容器中,上述金屬材料為陰極端子、陽極端子、及最表層
被金屬膏覆蓋之電容器本體的一部分或全部,上述陰極端子、上述陽極端子及上述電容器本體被液晶聚合物覆蓋而構成該鋁、鉭及鈮中任一種之電容器。
本發明之電子零件之進而另一實施形態中,上述液晶聚合物與上述金屬材料之熱膨脹係數的差為±10ppm/℃。
根據本發明,可提供一種金屬材料與液晶聚合物以良好之密接力接合的金屬-液晶聚合物複合體之製造方法以及具備該金屬-液晶聚合物複合體之電子零件。另外,根據本發明,無須進行用以提高金屬材料與絕緣基板之密接力之粗面化處理即可確保液晶聚合物與金屬材料之密接力,故而就製造步驟之觀點而言亦有優點。
圖1係表示本發明之LED封裝體之剖面示意圖。
圖2係表示本發明之鉭電容器之剖面示意圖。
(金屬材料)
本發明之金屬材料係未經粗面化處理的具有用以與液晶聚合物接合之表面的金屬材料。本發明之金屬材料例如可為以下之(1)~(5)所示之構成中之任一種。
(1)金屬基材+金屬基材之氧化物層+偶合劑層
(2)金屬基材+鍍敷層+偶合劑層
(3)金屬基材+鍍敷層+鍍敷層之氧化物層+偶合劑層
(4)金屬基材+金屬基材之氧化物層+鍍敷層+偶合劑層
(5)金屬基材+金屬基材之氧化物層+鍍敷層+鍍敷層之氧化物層+偶合劑層
亦即,本發明之金屬材料如(1)~(5)所示之構成般,可於金屬基材上直接形成鍍敷層及/或偶合劑層,亦可於因金屬基材氧化而形成氧化物層後,形成鍍敷層及/或偶合劑層。另外,於鍍敷層上可直接形成偶合劑層,亦可於因鍍敷層氧化而形成氧化物層後,形成偶合劑層。
金屬基材並無特別限定,例如可列舉銅、鈦、銅合金或鈦合金等。其中,銅或銅合金具有導電性較高、富有延展性、及彈簧特性良好之優點。
鍍敷層並無特別限定,例如可列舉:銀層、銀與同為白色之Ni或Sn或In等之銀合金層、Ag層與其他金屬層或合金層之複層結構等。
偶合劑層係藉由利用分子內具有含氮官能基的矽烷偶合劑、鈦酸酯偶合劑、鋁酸酯偶合劑、氧化鋯偶合劑、鎂偶合劑、錫偶合劑、鈰偶合劑等對金屬材料進行表面處理而形成。
雖如上所述可使用各種偶合劑,但若偶合劑之主成分元素為Si、Ti及Al中之任一者,則生產性、保存性穩定,故而較佳。若為該等以外之偶合劑,則製成水溶液時不具有穩定性,故而有發生凝膠化而難以覆蓋金屬表面之虞。並且,由於不具有穩定性,故而有製造亦變得困難之虞。
關於分子內具有含氮官能基的矽烷偶合劑,若含氮官能基為胺基、異氰酸基及脲基中之任一者,則與金屬材料之密接力提高,故而較佳為。
若利用均勻地溶解有偶合劑之溶液進行使用有偶合劑之表面處理,則由於每1分子偶合劑均勻地分散,故而可高效率地被覆金屬材料。另一方面,於未均勻地溶解之情形時,存在與溶劑分子相互排斥之偶合劑彼此凝聚而凝膠化之虞。另外,若利用溶解有偶合劑之pH值7~14的溶液進行該表面處理,則由於為鹼性,故而偶合劑水溶液本身具有脫脂效果,因此偶合劑可吸附至新的金屬材料上,故較佳。
本發明之金屬材料具有用以與液晶聚合物接合之表面,且藉由XPS(X射線光電子光譜裝置)之全能譜(Survey)測定對上述表面進行元素分析時,檢測出Si、Ti、Al、Zr、Sn、Mg、Ce中之任一種以上為0.5at%以上,N為1.5at%以上。
利用此種構成,可確保金屬材料與LCP之密接力充分。較佳為Si、Ti、Al、Zr、Sn、Mg、Ce為偶合劑之中心元素。較佳為N為偶合劑之上述偶合材之官能基。若為偶合劑,則於金屬材料表面至多不過存在數層,因此不會對已藉由鍍敷對金屬材料賦予之高反射率、抗硫化性等特性造成損害。另外,根據本發明,無須進行用以提高銅箔與絕緣基板之密接力之粗面化處理即可確保LCP與金屬材料之密接力,故而就製造步驟之觀點而言亦有優點。
例如,於LED之引線框架材用之金屬材料之情形時,為了反射更多之光而變得明亮,亦即為了提高反射率,背景構件較理想為白色。於引線框架材中,為了提高該反射率而施有銀系之鍍敷。由於該引線框架材除反射率以外亦要求抗硫化性,故而係根據使鍍敷層合金化、或者複層化等各種觀點而使金屬材料表面最佳化。藉由對如此般已最佳化之表面進行矽烷處
理,可製作本發明之金屬材料,可於維持對金屬材料賦予之特性之狀態下,提高與液晶聚合物之密接力。
本發明之金屬材料較佳為於上述表面之Si、Ti、Al、Zr、Sn、Mg、Ce之下方,具有Cu、Al、Cr、Ag、Ni、In、Sn中任一種以上之金屬或其氧化物的層。
根據此種構成,若於以Cu、Al為代表之金屬基底,進而於該等上考慮低接觸電阻、高反射率、抗硫化性之觀點而形成之鉻酸鹽、Ag、Ni、In、Sn等之金屬鍍層或該等之合金鍍層上存在來自偶合劑之Si、Ti、Al、Zr、Sn、Mg、Ce,則即便不進行粗面化處理,亦可確保LCP與金屬材料之密接力。較佳為Si、Ti、Al、Zr、Sn、Mg、Ce係來自偶合劑。若為偶合劑,則於材料表面至多不過存在數層,故而不會失去由底層之功能鍍層所賦予之特性。
(金屬-液晶聚合物複合體之製造方法)
本發明之金屬-液晶聚合物複合體係於本發明之金屬材料之上述表面接合液晶聚合物而製作。金屬-液晶聚合物複合體可於進行壓製加工或彎曲加工之後,對金屬材料實施表面處理,並藉由壓接或射出成型使液晶聚合物接合於該處理面而製作。另外,金屬-液晶聚合物複合體亦可於對金屬材料實施表面處理之後進行壓製加工或彎曲加工,並藉由壓接或射出成型使液晶聚合物接合於表面處理面。液晶聚合物係以對羥基苯甲酸等作為基體,與各種成分酯鍵結為直鏈狀而成之芳香族聚酯系樹脂。於熔融狀態下,顯示分子之直鏈規則地排列之類液晶性質。有時為了控制諸特性、例如熱膨脹係數而分散無機填料。
液晶聚合物與金屬材料之密接性通常並不佳,但藉由與本發明之具有
特徵性之表面的金屬材料接合,則於進行破壞試驗之情形時等,令人訝異地發現液晶聚合物/金屬界面之密接力提高,為液晶聚合物/金屬界面並不破壞,而於液晶聚合物之內部產生破壞之程度。
金屬-液晶聚合物複合體可藉由下述方式製作:利用分子內具有含氮官能基的矽烷偶合劑、鈦酸酯偶合劑、鋁酸酯偶合劑、氧化鋯偶合劑、鎂偶合劑、錫偶合劑、鈰偶合劑中之任一種對本發明之對金屬材料實施表面處理,且於金屬材料之上述處理面藉由壓接或射出成型而接合液晶聚合物。
(電子零件)
本發明之電子零件只要具備本發明之金屬-液晶聚合物複合體即可,並無特別限定,可列舉LED封裝體或電容器等。
就本發明之電子零件為LED封裝體之情形進行說明。圖1中表示本發明之LED封裝體之剖面示意圖。該LED封裝體中,本發明之金屬材料為經實施白色鍍敷之引線框架,用以與液晶聚合物接合之金屬材料之表面,係對引線框架之白色鍍敷表面利用分子內具有含氮官能基的偶合劑進行處理而形成,該LED封裝體係藉由如下方式構成:以引線框架作為殼電極,於殼電極上構裝有LED晶片,晶片周邊被由液晶聚合物構成之殼體覆蓋,於殼體內填充有含有螢光體之密封樹脂。藉由此種構成,本發明之LED封裝體中,引線框架與液晶聚合物以良好之密接力接合。
本發明之電子零件亦可為鋁、鉭、鈮等之電容器。此處,就本發明之電子零件為鉭電容器之情形進行說明。圖2中表示本發明之鉭電容器之剖面示意圖。該鉭電容器中,本發明之金屬材料為陰極端子、陽極
端子、及最表層被金屬膏覆蓋之電容器本體的一部分或全部,陰極端子、陽極端子及電容器本體被液晶聚合物覆蓋而構成該鉭電容器。藉由此種構成,本發明之鉭電容器中,陰極端子、陽極端子、及電容器本體與液晶聚合物以良好之密接力接合。
本發明之電子零件中,液晶聚合物較佳為與金屬材料之熱膨脹係數的差為±10ppm/℃。藉由利用此種構成,則當金屬材料與液晶聚合物接合而成之金屬-液晶聚合物複合體被加熱時,由於兩者之熱膨脹係數的差較小,故而可良好地抑制因膨脹所致之複合體之損傷。液晶聚合物與金屬材料之熱膨脹係數的差更佳為±5ppm/℃。
以下示出本發明之實施例,但該等係為了更良好地理解本發明而提供者,並不意圖限定本發明。
[例1:實施例4~6、9、10、12]
(製備矽烷溶液)
將N-(2-胺基乙基)-3-胺基丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-異氰酸基丙基三乙氧基矽烷、3-脲基丙基三乙氧基矽烷(Momentive公司製造)分別取10mL,添加純水,分別製備1L之水溶液。使用3-異氰酸基丙基三乙氧基矽烷、3-脲基丙基三乙氧基矽烷時,矽烷與溶劑之水為分離狀態。
(對鍍敷板材之矽烷處理)
於厚度0.1mm之銅板上,實施厚度1μm之Ag、Ni、鉻酸鹽鍍敷。對該等鍍敷銅板分別進行鹼脫脂(NaOH:100g/L,30秒)、酸洗(H2SO4:
10wt%,30秒)後,於上述矽烷溶液中浸漬30秒,之後水洗、乾燥。
(與液晶聚合物之密接力)
於表面處理面層壓貼合液晶聚合物膜(Kuraray公司製造之Vecstar CT-Z)(以7℃/min升溫至295℃為止,且於295℃下保持1小時),製作金屬-樹脂積層體。將該積層體之樹脂側剝離,依據180°剝離法(JIS C 6471 8.1)測定剝離強度。使用SEM觀察剝離後之金屬側,若樹脂(LCP)殘留於金屬面,則判斷為「剝離於LCP內部」,若未殘留於金屬面,則判斷為「剝離於LCP表面」。
(鍍敷板材之表面分析[XPS全能譜])
於下述條件下,藉由XPS全能譜進行鍍敷板材之表面分析(Si及N之定量)。
裝置:ULVAC-PHI公司製造之5600MC
極限真空度:8.8×10-10Torr
激發源:單色化AlKα:
功率:210W
檢測面積:800μm
入射角:75°、取出角:15°
(紅色墨水試驗[確認是否成功地於金屬材料上無間隙地形成液晶聚合物之成型體])
使用立式射出成型機VH40(山城公司製造),於經表面處理之板材上,將液晶聚合物(JX Nippon Oil & Energy公司製造Xydar)於最高溫度340℃、模具溫度100℃、射出速度200mm/s之條件下射出成型為箱體。向由液晶
聚合物形成之成型體內部滴入紅色墨水(Lion Office Products公司製造 打印墨紅色),1日後、6日後確認墨水是否向成型體外滲漏。將墨水完全不滲漏之情形判定為「無」,若為成型體之邊緣滲出之程度則判定為「輕度滲出」,將滲漏之情形判定為「有」。
[例2:實施例1、2]
取N-(2-胺基乙基)-3-胺基丙基三甲氧基矽烷(Momentive公司製造)10mL,添加純水,使用乙酸調整pH值,製備2種pH值的1L之水溶液。使用該矽烷溶液,以例1之順序對經實施厚度1μm之鍍Ag之銅板實施表面處理,且進行各種評價。
[例3:實施例7、8]
取N-(2-胺基乙基)-3-胺基丙基三甲氧基矽烷(Momentive公司製造)10mL,添加純水,製備1L之水溶液。使用該水溶液,以例1之順序對銅板、鋁板實施表面處理,且進行各種評價。
[例4:實施例3]
取具有胺基之鈦酸酯偶合劑Plenact KR44(Ajinomoto Fine Techno公司製造)10mL,添加純水,製備1L之水溶液。以例1之順序對經實施1μm厚之鍍Ag之銅板實施表面處理,且進行各種評價。
[例5:實施例11]
製備3-異氰酸基丙基三乙氧基矽烷為10mL,純水為4mL,剩餘部分為異丙醇的1L之矽烷溶液。純水之量係對於使乙氧基水解而生成矽烷醇基充分之量。與例1之水溶液不同,可見矽烷與溶劑均勻地混合。使用該矽烷溶液,以例1之順序對經實施厚度1μm之鍍Ag之銅板實施表面處理,
且進行各種評價。
[例6:比較例1]
取3-環氧丙氧基丙基三乙氧基矽烷(Momentive公司製造)10mL,添加純水,使用乙酸將pH值調整為3,製備1L之水溶液。使用該水溶液,以例1之順序對經實施1μm厚之鍍Ag之銅板實施表面處理,且進行各種評價。
[例7:比較例2]
取乙烯基三乙氧基矽烷(Momentive公司製造)10mL,添加純水,製備1L之水溶液。使用該水溶液,以例1之順序對經實施1μm厚之鍍Ag之銅板實施表面處理,且進行各種評價。
[例8:比較例3]
取1,2,3-苯并三唑(Nacalai Tesque公司製造)10g,添加純水,製備1L之水溶液。使用該水溶液,以例1之順序對經實施1μm厚之鍍Ag之銅板實施表面處理,且進行各種評價。
[例9:比較例4]
使用經實施1μm厚之鍍Ag之銅板,以例1之順序進行各種評價。
將實施例及比較例之試驗條件及評價結果示於表1。
*:處理液成分之簡稱
二胺基矽烷:N-(2-胺基乙基)-3-胺基丙基三甲氧基矽烷
胺基矽烷:3-胺基丙基三乙氧基矽烷
環氧基矽烷:3-環氧丙氧基丙基三乙氧基矽烷
乙烯基三乙氧基矽烷:乙烯基三乙氧基矽烷
異氰酸基矽烷:3-異氰酸基丙基三乙氧基矽烷
脲基矽烷:3-脲基丙基三乙氧基矽烷
**:標示主成分。有成為氧化物之可能性。
***:異丙醇
實施例1~12中,金屬材料與液晶聚合物之密接力均良好,成功地於金屬材料上無間隙地形成液晶聚合物之成型體。
若為胺基矽烷,則矽烷水溶液之pH值偏鹼性,無論金屬材料之最表面為何種元素密接力均增大。另外,於異氰酸基矽烷偶合劑之情形時,相較於以水溶液進行處理者,以醇溶液進行處理者其液晶聚合物與金屬之密接力增大。推斷其原因在於,若為醇溶液,則異氰酸基矽烷溶解於溶劑中,故而金屬材料被矽烷無間隙地被覆。
比較例1~4中,與液晶聚合物之密接力不佳,於金屬材料與液晶聚合物之間產生間隙,發生墨水滲漏。
根據實施例1~12中所使用之偶合劑及其評價結果推斷,只要為含有胺基、異氰酸基、脲基之偶合劑,則即便不為與實施例中所使用者相同之偶合劑,亦可以足夠用來賦予同樣效果之量附著於金屬材料表面。
Claims (11)
- 一種金屬-液晶聚合物複合體之製造方法,其對未經粗面化處理之金屬材料進行使用有具有含氮官能基之含胺基偶合劑之水溶液的表面處理,並藉由壓接或射出成型使液晶聚合物接合於該處理面。
- 如申請專利範圍第1項之金屬-液晶聚合物複合體之製造方法,其中,該偶合劑之主成分元素為Si、Ti及Al中之任一者。
- 如申請專利範圍第1項之金屬-液晶聚合物複合體之製造方法,其中,已進行該使用有偶合劑之表面處理的金屬材料於該金屬材料表面之Si、Ti、Al的下方,具有Cu、Al、Cr、Ag、Ni、In、Sn中任一種以上之金屬或其氧化物的層。
- 如申請專利範圍第1項之金屬-液晶聚合物複合體之製造方法,其中,利用均勻地溶解有偶合劑之溶液,進行該使用有偶合劑之表面處理。
- 如申請專利範圍第1項之金屬-液晶聚合物複合體之製造方法,其中,利用溶解有偶合劑之pH值7~14的溶液,進行該使用有偶合劑之表面處理。
- 如申請專利範圍第1項之金屬-液晶聚合物複合體之製造方法,其中,於進行壓製加工或彎曲加工之後,對金屬材料實施該表面處理,並藉由壓接或射出成型使液晶聚合物接合於該處理面。
- 如申請專利範圍第1項之金屬-液晶聚合物複合體之製造方法,其中,對金屬材料實施該表面處理之後進行壓製加工或彎曲加工,並藉由壓接或射出成型使液晶聚合物接合於該表面處理面。
- 一種電子零件,其具備藉由申請專利範圍第6項之金屬-液晶聚合 物複合體之製造方法而獲得的金屬-液晶聚合物複合體。
- 如申請專利範圍第8項之電子零件,其為LED封裝體,該金屬材料為經實施白色鍍敷之引線框架,用以與液晶聚合物接合之該金屬材料的表面,係藉由對該引線框架之白色鍍敷表面利用分子內具有氮之偶合劑進行處理而形成,該LED封裝體係藉由如下方式構成:以該引線框架作為殼電極,於該殼電極上構裝有LED晶片,該晶片周邊被由該液晶聚合物構成之殼體覆蓋,於該殼體內填充有含有螢光體之密封樹脂。
- 如申請專利範圍第8項之電子零件,其為鋁、鉭及鈮中任一種之電容器,該金屬材料為陰極端子、陽極端子、及最表層被金屬膏覆蓋之電容器本體的一部分或全部,該陰極端子、該陽極端子及該電容器本體被液晶聚合物覆蓋而構成該鋁、鉭及鈮中任一種之電容器。
- 如申請專利範圍第8至10項中任一項之電子零件,其中,該液晶聚合物與該金屬材料之熱膨脹係數的差為±10ppm/℃。
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TW200535259A (en) * | 2004-02-06 | 2005-11-01 | Furukawa Circuit Foil | Treated copper foil and circuit board |
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