TWI530761B - A positive type photosensitive composition and a hardened product thereof - Google Patents
A positive type photosensitive composition and a hardened product thereof Download PDFInfo
- Publication number
- TWI530761B TWI530761B TW101116248A TW101116248A TWI530761B TW I530761 B TWI530761 B TW I530761B TW 101116248 A TW101116248 A TW 101116248A TW 101116248 A TW101116248 A TW 101116248A TW I530761 B TWI530761 B TW I530761B
- Authority
- TW
- Taiwan
- Prior art keywords
- group
- carbon atoms
- compound
- formula
- photosensitive composition
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
- C07F7/02—Silicon compounds
- C07F7/21—Cyclic compounds having at least one ring containing silicon, but no carbon in the ring
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/04—Polysiloxanes
- C08G77/045—Polysiloxanes containing less than 25 silicon atoms
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/04—Polysiloxanes
- C08G77/12—Polysiloxanes containing silicon bound to hydrogen
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/04—Polysiloxanes
- C08G77/38—Polysiloxanes modified by chemical after-treatment
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/80—Siloxanes having aromatic substituents, e.g. phenyl side groups
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/04—Polysiloxanes
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/0226—Quinonediazides characterised by the non-macromolecular additives
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
- G03F7/0233—Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0757—Macromolecular compounds containing Si-O, Si-C or Si-N bonds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Organic Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Polymers & Plastics (AREA)
- Health & Medical Sciences (AREA)
- Medicinal Chemistry (AREA)
- Materials Engineering (AREA)
- Wood Science & Technology (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Silicon Polymers (AREA)
- Materials For Photolithography (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011106297A JP5698070B2 (ja) | 2011-05-11 | 2011-05-11 | ポジ型感光性組成物及びその硬化物 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201250390A TW201250390A (en) | 2012-12-16 |
| TWI530761B true TWI530761B (zh) | 2016-04-21 |
Family
ID=47139132
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW101116248A TWI530761B (zh) | 2011-05-11 | 2012-05-07 | A positive type photosensitive composition and a hardened product thereof |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP5698070B2 (enExample) |
| KR (1) | KR20140006855A (enExample) |
| CN (1) | CN103380400B (enExample) |
| TW (1) | TWI530761B (enExample) |
| WO (1) | WO2012153648A1 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6086739B2 (ja) * | 2013-01-21 | 2017-03-01 | 東京応化工業株式会社 | 絶縁膜形成用組成物、絶縁膜の製造方法、及び絶縁膜 |
| JP6438259B2 (ja) * | 2014-10-01 | 2018-12-12 | 旭化成株式会社 | オルガノポリシロキサン、オルガノポリシロキサン組成物、オルガノポリシロキサンの製造方法、硬化性樹脂組成物、光半導体用封止材、光半導体用ダイボンド材、及び光半導体パッケージ |
| US10066059B2 (en) * | 2014-10-21 | 2018-09-04 | Nissan Chemical Industries, Ltd. | Sealing material composition for LED |
| JP6484428B2 (ja) | 2014-10-31 | 2019-03-13 | 東京応化工業株式会社 | レジストパターン形成装置およびレジストパターン形成方法 |
| JP2016092120A (ja) * | 2014-10-31 | 2016-05-23 | 東京応化工業株式会社 | レジストパターン形成装置およびレジストパターン形成方法 |
| JP6487947B2 (ja) * | 2015-02-04 | 2019-03-20 | 堺ディスプレイプロダクト株式会社 | ポジ型感光性シロキサン組成物、アクティブマトリクス基板、表示装置、及びアクティブマトリクス基板の製造方法 |
| JP6688003B2 (ja) * | 2015-02-26 | 2020-04-28 | 旭化成株式会社 | 硬化性樹脂組成物及びその製造方法、並びに、光半導体用封止材、光半導体用ダイボンド材、及び光半導体パッケージ |
| JP6683423B2 (ja) * | 2015-02-26 | 2020-04-22 | 旭化成株式会社 | 硬化性樹脂組成物及びその製造方法、並びに、光半導体用封止材、光半導体用ダイボンド材、及び光半導体パッケージ |
| JP6518548B2 (ja) | 2015-08-10 | 2019-05-22 | 東京応化工業株式会社 | 紫外線照射装置、レジストパターン形成装置、紫外線照射方法及びレジストパターン形成方法 |
| JPWO2024150635A1 (enExample) * | 2023-01-10 | 2024-07-18 | ||
| KR20250119620A (ko) * | 2023-01-10 | 2025-08-07 | 후지필름 가부시키가이샤 | 약액, 약액 수용체, 패턴 형성 방법, 전자 디바이스의 제조 방법 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1662322B1 (en) * | 2004-11-26 | 2017-01-11 | Toray Industries, Inc. | Positive type photo-sensitive siloxane composition, curing film formed by the composition and device with the curing film |
| WO2009063887A1 (ja) * | 2007-11-13 | 2009-05-22 | Adeka Corporation | ポジ型感光性組成物、ポジ型永久レジスト及びポジ型永久レジストの製造方法 |
| JP4960330B2 (ja) * | 2008-10-21 | 2012-06-27 | 株式会社Adeka | ポジ型感光性組成物及び永久レジスト |
| JP5336161B2 (ja) * | 2008-12-11 | 2013-11-06 | 株式会社カネカ | 金属酸化物微粒子含有硬化性樹脂組成物、その硬化物、及び光拡散材 |
| JP5338532B2 (ja) * | 2009-07-13 | 2013-11-13 | Jnc株式会社 | ポジ型感光性組成物 |
-
2011
- 2011-05-11 JP JP2011106297A patent/JP5698070B2/ja not_active Expired - Fee Related
-
2012
- 2012-04-26 KR KR1020137020225A patent/KR20140006855A/ko not_active Ceased
- 2012-04-26 CN CN201280007372.6A patent/CN103380400B/zh not_active Expired - Fee Related
- 2012-04-26 WO PCT/JP2012/061246 patent/WO2012153648A1/ja not_active Ceased
- 2012-05-07 TW TW101116248A patent/TWI530761B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| WO2012153648A1 (ja) | 2012-11-15 |
| JP2012237854A (ja) | 2012-12-06 |
| CN103380400B (zh) | 2016-03-30 |
| JP5698070B2 (ja) | 2015-04-08 |
| CN103380400A (zh) | 2013-10-30 |
| TW201250390A (en) | 2012-12-16 |
| KR20140006855A (ko) | 2014-01-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI530761B (zh) | A positive type photosensitive composition and a hardened product thereof | |
| TWI437369B (zh) | A positive type photosensitive composition and a permanent resist | |
| KR101558442B1 (ko) | 포지티브형 감광성 조성물, 포지티브형 영구 레지스트 및 포지티브형 영구 레지스트의 제조 방법 | |
| TWI556062B (zh) | Positive type photosensitive composition | |
| TW201005009A (en) | Polyorganosiloxane, resin composition, and patterning process | |
| CN111148805B (zh) | 正型感光性硅氧烷组合物以及使用了其的固化膜 | |
| CN108700807A (zh) | 正型感光性硅氧烷组合物 | |
| JP5479993B2 (ja) | ポジ型感光性組成物及び永久レジスト | |
| TW201833191A (zh) | 具備保護膜之薄膜電晶體基板及其製造方法 | |
| TW201927862A (zh) | 聚矽氧烷、包含其而成之組成物、及使用其之硬化膜 | |
| CN102566279B (zh) | 正型感光性树脂组合物及永久抗蚀剂 | |
| TW201934618A (zh) | 感光性矽氧烷組成物、及使用其之圖案形成方法 | |
| TWI772411B (zh) | 正型感光性矽氧烷組成物、及使用其所形成之硬化膜 | |
| JP5666266B2 (ja) | ポジ型感光性樹脂組成物及び永久レジスト | |
| CN110546566A (zh) | 正型感光性硅氧烷组合物以及使用其而形成的固化膜 | |
| KR20120056773A (ko) | 포지티브형 감광성 수지 조성물 및 영구 레지스트 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |