TWI512387B - A microlenses for micro lens manufacturing, a microlens manufacturing method using the same, and an image pickup device - Google Patents

A microlenses for micro lens manufacturing, a microlens manufacturing method using the same, and an image pickup device Download PDF

Info

Publication number
TWI512387B
TWI512387B TW100118724A TW100118724A TWI512387B TW I512387 B TWI512387 B TW I512387B TW 100118724 A TW100118724 A TW 100118724A TW 100118724 A TW100118724 A TW 100118724A TW I512387 B TWI512387 B TW I512387B
Authority
TW
Taiwan
Prior art keywords
microlens
light
layout
pattern
manufacturing
Prior art date
Application number
TW100118724A
Other languages
English (en)
Chinese (zh)
Other versions
TW201200962A (en
Inventor
Sachiko Ogawa
Original Assignee
Renesas Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Electronics Corp filed Critical Renesas Electronics Corp
Publication of TW201200962A publication Critical patent/TW201200962A/zh
Application granted granted Critical
Publication of TWI512387B publication Critical patent/TWI512387B/zh

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00Simple or compound lenses
    • G02B3/0006Arrays
    • G02B3/0012Arrays characterised by the manufacturing method
    • G02B3/0018Reflow, i.e. characterized by the step of melting microstructures to form curved surfaces, e.g. manufacturing of moulds and surfaces for transfer etching
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F99/00Subject matter not provided for in other groups of this subclass
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29DPRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
    • B29D11/00Producing optical elements, e.g. lenses or prisms
    • B29D11/00009Production of simple or compound lenses
    • B29D11/00365Production of microlenses
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00Simple or compound lenses
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00Simple or compound lenses
    • G02B3/0006Arrays
    • G02B3/0037Arrays characterized by the distribution or form of lenses
    • G02B3/0056Arrays characterized by the distribution or form of lenses arranged along two different directions in a plane, e.g. honeycomb arrangement of lenses
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/38Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0005Production of optical devices or components in so far as characterised by the lithographic processes or materials used therefor
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Optics & Photonics (AREA)
  • Mechanical Engineering (AREA)
  • Ophthalmology & Optometry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Light Receiving Elements (AREA)
TW100118724A 2010-06-17 2011-05-27 A microlenses for micro lens manufacturing, a microlens manufacturing method using the same, and an image pickup device TWI512387B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010138314A JP5565771B2 (ja) 2010-06-17 2010-06-17 マイクロレンズの製造方法および撮像素子

Publications (2)

Publication Number Publication Date
TW201200962A TW201200962A (en) 2012-01-01
TWI512387B true TWI512387B (zh) 2015-12-11

Family

ID=45328441

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100118724A TWI512387B (zh) 2010-06-17 2011-05-27 A microlenses for micro lens manufacturing, a microlens manufacturing method using the same, and an image pickup device

Country Status (4)

Country Link
US (1) US8470501B2 (https=)
JP (1) JP5565771B2 (https=)
KR (1) KR20110137725A (https=)
TW (1) TWI512387B (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105527825B (zh) * 2014-09-28 2018-02-27 联想(北京)有限公司 电子设备和显示方法
KR102938715B1 (ko) * 2020-12-03 2026-03-13 삼성전자주식회사 렌즈 어셈블리 및 이를 포함하는 전자 장치

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1074927A (ja) * 1996-05-16 1998-03-17 Lg Semicon Co Ltd マイクロレンズパターン用マスク
TW561278B (en) * 2001-10-11 2003-11-11 Nitto Denko Corp Optical sheet and display device having the optical sheet
US20040263985A1 (en) * 2003-06-26 2004-12-30 Boettiger Ulrich C. Micro-lenses and method for increasing area coverage and controlling shape of micro lenses
CN101105543A (zh) * 2006-07-10 2008-01-16 台湾积体电路制造股份有限公司 微透镜装置及其制造方法
TW200846703A (en) * 2007-05-29 2008-12-01 United Microelectronics Corp Method for manufacturing micro-lenses of image sensor

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2945440B2 (ja) 1990-05-02 1999-09-06 シャープ株式会社 固体撮像装置の製造方法
JP2002006472A (ja) * 2000-06-21 2002-01-09 Oki Electric Ind Co Ltd レジストパターンの形成方法
JP2002323747A (ja) * 2001-04-24 2002-11-08 Ricoh Co Ltd フォトマスク、および該フォトマスクを用いたマイクロレンズ作成方法、ならびに該マイクロレンズ作成方法により作成したマイクロレンズ
JP3698144B2 (ja) * 2003-02-07 2005-09-21 ヤマハ株式会社 マイクロレンズアレイの製法
JP2009507669A (ja) * 2005-08-31 2009-02-26 コリア インスティチュート オブ インダストリアル テクノロジー レンズ製造方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1074927A (ja) * 1996-05-16 1998-03-17 Lg Semicon Co Ltd マイクロレンズパターン用マスク
TW561278B (en) * 2001-10-11 2003-11-11 Nitto Denko Corp Optical sheet and display device having the optical sheet
US20040263985A1 (en) * 2003-06-26 2004-12-30 Boettiger Ulrich C. Micro-lenses and method for increasing area coverage and controlling shape of micro lenses
CN101105543A (zh) * 2006-07-10 2008-01-16 台湾积体电路制造股份有限公司 微透镜装置及其制造方法
TW200846703A (en) * 2007-05-29 2008-12-01 United Microelectronics Corp Method for manufacturing micro-lenses of image sensor

Also Published As

Publication number Publication date
US20110310492A1 (en) 2011-12-22
TW201200962A (en) 2012-01-01
JP2012004365A (ja) 2012-01-05
US8470501B2 (en) 2013-06-25
JP5565771B2 (ja) 2014-08-06
KR20110137725A (ko) 2011-12-23

Similar Documents

Publication Publication Date Title
TWI250377B (en) Exposure mask and mask pattern production method
JP4296943B2 (ja) 露光用マスクの製造方法および露光方法ならびに3次元形状の製造方法
CN100479175C (zh) 固态成像装置及其制造方法
JP2008032912A (ja) マイクロレンズの製造方法
TWI695220B (zh) 相位移光罩、無鉻的相位移光罩及積體電路的製作方法
TWI459442B (zh) 成像裝置及其形成方法及形成半導體裝置結構之方法
JP6631004B2 (ja) カラー固体撮像素子、及びその製造方法
TWI471683B (zh) An exposure mask, a manufacturing method thereof, and a method for manufacturing the semiconductor device
TWI512387B (zh) A microlenses for micro lens manufacturing, a microlens manufacturing method using the same, and an image pickup device
JP2007193243A (ja) 露光用マスク、露光方法、露光用マスクの製造方法、3次元デバイスおよび3次元デバイスの製造方法
KR100698071B1 (ko) 씨모스 이미지 센서 및 그 제조방법
JP4366121B2 (ja) 素子の製造方法
JP4696927B2 (ja) マイクロレンズアレイの製造方法
JP2011013411A (ja) マイクロレンズアレイの製造方法及びフォトマスク
TW201724484A (zh) 彩色固態攝影元件及其製造方法
JP5136288B2 (ja) 濃度分布マスク及びその製造方法
JP2002116315A (ja) 微細光学素子の製造方法
JP4595548B2 (ja) マスク基板及びマイクロレンズの製造方法
JP2010066727A (ja) マイクロレンズアレイの製造方法、及び光電変換装置の製造方法
JP2013246340A (ja) フォトマスクとその製造方法、およびパターン露光方法
JP2005031287A (ja) 投影露光装置、投影露光装置に使用されるレチクル、投影露光方法及び半導体デバイス製造方法
KR101052923B1 (ko) 더블 패터닝을 위한 포토마스크 및 이를 이용한 노광방법과그 제조방법
US8845908B2 (en) Reticles, and methods of mitigating asymmetric lens heating in photolithography
US7629090B2 (en) Reticle and method of manufacturing method the same
JP2005202170A (ja) 露光用マスクおよび露光方法

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees