TWI492690B - Method for manufacturing circuit board - Google Patents

Method for manufacturing circuit board Download PDF

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TWI492690B
TWI492690B TW102119673A TW102119673A TWI492690B TW I492690 B TWI492690 B TW I492690B TW 102119673 A TW102119673 A TW 102119673A TW 102119673 A TW102119673 A TW 102119673A TW I492690 B TWI492690 B TW I492690B
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layer
forming
copper foil
circuit board
dielectric layer
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TW102119673A
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TW201446103A (en
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Wen Hung Hu
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Zhen Ding Technology Co Ltd
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電路板製作方法 Circuit board manufacturing method

本發明涉及電路板製作技術領域,尤其涉及一種電路板=製作方法。 The present invention relates to the field of circuit board manufacturing technology, and in particular, to a circuit board=manufacturing method.

在電路板的製作過程中,通常採用採用增層法或者半加成法,從而得到的導電線路製作於介電層的表面。即導電線路全部凸出於介電層的表面。為了保護導電線路,通常需要在導電線路的表面形成防焊層。所述防焊層通常通過印刷防焊油墨的方式形成,在印刷形成防焊層時,需要形成的防焊層覆蓋需要覆蓋的導電線路及導電線路之間的空隙。由於導電線路層本身具有厚度,這樣,需要形成的防焊層的厚度大於導電線路的厚度。當導線線路的厚度較大時,形成的防焊層的厚度也需要增加,從而不利於電路板的薄型化的要求。 In the fabrication process of the circuit board, a build-up method or a semi-additive method is usually employed, and the obtained conductive line is formed on the surface of the dielectric layer. That is, the conductive lines all protrude from the surface of the dielectric layer. In order to protect the conductive lines, it is usually necessary to form a solder resist layer on the surface of the conductive lines. The solder resist layer is usually formed by printing a solder resist ink. When the solder resist layer is formed by printing, the solder resist layer to be formed covers the gap between the conductive trace and the conductive trace to be covered. Since the conductive wiring layer itself has a thickness, the thickness of the solder resist layer to be formed is larger than the thickness of the conductive wiring. When the thickness of the wire line is large, the thickness of the formed solder resist layer also needs to be increased, which is disadvantageous for the thinning of the circuit board.

並且,現有技術中的導電線路的製作方法也不利於細線路的製作。 Moreover, the method of fabricating the conductive lines in the prior art is also disadvantageous for the fabrication of thin lines.

因此,有必要提供一種電路板的製作方法,降低電路板的防焊層的厚度,進而減小電路板的厚度。 Therefore, it is necessary to provide a method of manufacturing a circuit board, which reduces the thickness of the solder resist layer of the circuit board, thereby reducing the thickness of the circuit board.

一種電路板製作方法,包括步驟:提供金屬載板,所述金屬載板具有相對的第一表面和第二表面;在所述第一表面一側形成第一 光致抗蝕劑圖形層;將未被第一光致抗蝕劑圖形層覆蓋的部分金屬載板蝕刻去除,從而在所述金屬載板內形成與第一光致抗蝕劑圖形層相互補的凹槽圖形;在所述凹槽圖形內電鍍金屬形成第一導電線路層,所述第一導電線路層完全填充並凸出於所述凹槽圖形;去除所述第一光致抗蝕劑圖形層;在第一導電線路層一側壓合介電層,凸出於金屬載板的第一導電線路層嵌入所述介電層內;在介電層遠離第一導電線路層的一側形成第二導電線路層;以及去除所述金屬載板。 A circuit board manufacturing method comprising the steps of: providing a metal carrier board having opposite first and second surfaces; forming a first side on the first surface side a photoresist pattern layer; etching a portion of the metal carrier not covered by the first photoresist pattern layer to form a complementary to the first photoresist pattern layer in the metal carrier layer a groove pattern; plating a metal in the groove pattern to form a first conductive circuit layer, the first conductive circuit layer completely filling and protruding from the groove pattern; removing the first photoresist a patterned layer; a dielectric layer is press-bonded on one side of the first conductive wiring layer, and a first conductive wiring layer protruding from the metal carrier is embedded in the dielectric layer; and a side of the dielectric layer away from the first conductive wiring layer Forming a second conductive wiring layer; and removing the metal carrier.

與先前技術相比,本技術方案中,由於第一導電線路層部分設置於介電層內,部分凸出於介電層,這樣,在第一導電線路表面形成防焊層時,可以採用厚度較小的防焊層便可以將第一導電線路層和第二導電線路層覆蓋,從而,可以降低防焊層的厚度,進而可以降低電路板的厚度。而且,由於所述第一導電線路層部分嵌入所述介電層中,其餘部分位於防焊層中,可以增加第一導電線路層與介電層的結合能力。相比於現有技術中導電線路層凸出於介電層,可以避免電路板彎折時應力集中於介電層、導電線路層及防焊層的交點處而造成介電層、導電線路層及防焊層相互分離,從而提高電路板的品質。 Compared with the prior art, in the technical solution, since the first conductive circuit layer portion is disposed in the dielectric layer, a portion protrudes from the dielectric layer, so that when the solder resist layer is formed on the surface of the first conductive line, the thickness may be adopted. The smaller solder resist layer can cover the first conductive circuit layer and the second conductive circuit layer, thereby reducing the thickness of the solder resist layer, thereby reducing the thickness of the circuit board. Moreover, since the first conductive wiring layer is partially embedded in the dielectric layer and the remaining portion is located in the solder resist layer, the bonding ability of the first conductive wiring layer and the dielectric layer can be increased. Compared with the prior art, the conductive circuit layer protrudes from the dielectric layer, and the stress concentration on the intersection of the dielectric layer, the conductive circuit layer and the solder resist layer when the circuit board is bent can be avoided to cause the dielectric layer and the conductive circuit layer and The solder resist layers are separated from each other to improve the quality of the board.

100‧‧‧電路板 100‧‧‧ boards

110‧‧‧第一銅箔 110‧‧‧First copper foil

120‧‧‧金屬載板 120‧‧‧Metal carrier board

121‧‧‧第一表面 121‧‧‧ first surface

122‧‧‧第二表面 122‧‧‧ second surface

131‧‧‧第一光致抗蝕劑圖形層 131‧‧‧First photoresist pattern layer

132‧‧‧光致抗蝕劑層 132‧‧‧Photoresist layer

140‧‧‧第一導電線路層 140‧‧‧First conductive circuit layer

123‧‧‧凹槽圖形 123‧‧‧ Groove graphics

150‧‧‧介電層 150‧‧‧ dielectric layer

151‧‧‧盲孔 151‧‧‧Blind hole

160‧‧‧第二銅箔 160‧‧‧second copper foil

170‧‧‧第二導電線路層 170‧‧‧Second conductive circuit layer

171‧‧‧電鍍種子層 171‧‧‧Electroplating seed layer

173‧‧‧電鍍金屬圖形 173‧‧‧Electroplated metal graphics

181‧‧‧第一防焊層 181‧‧‧First solder mask

1811‧‧‧第一開口 1811‧‧‧ first opening

1401‧‧‧第一電性接觸墊 1401‧‧‧First electrical contact pads

1402‧‧‧第一保護層 1402‧‧‧First protective layer

182‧‧‧第二防焊層 182‧‧‧Second solder mask

1821‧‧‧第二開口 1821‧‧‧second opening

1701‧‧‧第二電性接觸墊 1701‧‧‧Second electrical contact pads

1702‧‧‧第二保護層 1702‧‧‧Second protective layer

圖1是本技術方案實施例提供的第一銅箔及金屬載板的剖面示意圖。 1 is a schematic cross-sectional view of a first copper foil and a metal carrier provided by an embodiment of the present technical solution.

圖2是圖1的第一銅箔及金屬載板的表面形成第一光致抗蝕劑圖形及第二光致抗蝕劑層後的剖面示意圖。 2 is a cross-sectional view showing the first photoresist pattern and the second photoresist layer formed on the surface of the first copper foil and the metal carrier of FIG. 1.

圖3是圖2的金屬載板中形成凹槽圖形並電鍍形成第一導電線路層 後的剖面示意圖。 3 is a groove pattern formed in the metal carrier of FIG. 2 and electroplated to form a first conductive circuit layer A schematic view of the rear section.

圖4是圖3的去除第一光致抗蝕劑圖形和第二光致抗蝕劑層後的剖面示意圖。 4 is a cross-sectional view of the first photoresist pattern and the second photoresist layer of FIG.

圖5是圖4的第一導電線路層一側壓合介電層和第二銅箔後的剖面示意圖。 FIG. 5 is a cross-sectional view showing the first conductive layer of FIG. 4 after the dielectric layer and the second copper foil are pressed together.

圖6是圖5的介電層的一側形成電鍍金屬圖形後的剖面示意圖。 6 is a schematic cross-sectional view showing one side of the dielectric layer of FIG. 5 after forming a plated metal pattern.

圖7是圖6去除金屬載板後的剖面示意圖。 Figure 7 is a schematic cross-sectional view of Figure 6 after removal of the metal carrier.

圖8是圖7去除第一銅箔、第二銅箔及電鍍種子層後的剖面示意圖。 FIG. 8 is a schematic cross-sectional view of FIG. 7 after removing the first copper foil, the second copper foil, and the plating seed layer.

圖9是本技術方案提供的電路板的剖面示意圖。 9 is a schematic cross-sectional view of a circuit board provided by the present technical solution.

以下,以具體實施例來說明本技術方案提供所述電路板製作方法。 Hereinafter, the technical solution provided by the present technical solution is described by using a specific embodiment.

本技術方案實施例提供的電路板製作方法包括如下步驟: The circuit board manufacturing method provided by the embodiment of the technical solution includes the following steps:

第一步,請參閱圖1,提供第一銅箔110及金屬載板120。 In the first step, referring to FIG. 1, a first copper foil 110 and a metal carrier 120 are provided.

所述第一銅箔110為薄銅箔,所述第一銅箔110的厚度為2微米至5微米。所述金屬載板120為採用與第一銅箔110材料不同的金屬材料製成。本實施例中,金屬載板120採用金屬鋁製成。可以理解的是,所述金屬載板120也可以採用其他金屬製成。 The first copper foil 110 is a thin copper foil, and the first copper foil 110 has a thickness of 2 micrometers to 5 micrometers. The metal carrier 120 is made of a metal material different from that of the first copper foil 110. In this embodiment, the metal carrier 120 is made of metal aluminum. It can be understood that the metal carrier 120 can also be made of other metals.

所述金屬載板120的厚度大於第一銅箔110的厚度,金屬載板120具有足夠的機械強度以支撐第一銅箔110。 The thickness of the metal carrier 120 is greater than the thickness of the first copper foil 110, and the metal carrier 120 has sufficient mechanical strength to support the first copper foil 110.

所述金屬載板120具有相對的第一表面121和第二表面122。所述第一銅箔110形成於金屬載板120的第一表面121。 The metal carrier 120 has opposing first and second surfaces 121, 122. The first copper foil 110 is formed on the first surface 121 of the metal carrier 120.

第二步,請參閱圖2,在所述第一銅箔110的表面形成第一光致抗蝕劑圖形層131,在金屬載板120的第二表面122形成光致抗蝕劑層132。 In the second step, referring to FIG. 2, a first photoresist pattern layer 131 is formed on the surface of the first copper foil 110, and a photoresist layer 132 is formed on the second surface 122 of the metal carrier board 120.

本步驟可以具體為:首先,在第一銅箔110的表面形成第一光致抗蝕劑層,並同時在第二表面形成光致抗蝕劑層132。所述第一光致抗蝕劑層及光致抗蝕劑層132可以採用壓合乾膜或者印刷液態感光油墨的方式形成。然後,對所述第一光致抗蝕劑層和光致抗蝕劑層132進行曝光及顯影,使得部分第一光致抗蝕劑層的材料被去除,從而得到第一光致抗蝕劑圖形層131。光致抗蝕劑層132經過曝光顯影後仍留在第二表面122。 This step may be specifically: first, a first photoresist layer is formed on the surface of the first copper foil 110, and a photoresist layer 132 is simultaneously formed on the second surface. The first photoresist layer and the photoresist layer 132 may be formed by laminating a dry film or printing a liquid photosensitive ink. Then, the first photoresist layer and the photoresist layer 132 are exposed and developed such that a portion of the material of the first photoresist layer is removed, thereby obtaining a first photoresist pattern. Layer 131. The photoresist layer 132 remains on the second surface 122 after exposure and development.

第三步,請參閱圖3,將未被第一光致抗蝕劑圖形層131覆蓋的第一銅箔110及部分金屬載板120蝕刻去除,從而在所述金屬載板120內形成與第一光致抗蝕劑圖形層131相互補的凹槽圖形123。 In the third step, referring to FIG. 3, the first copper foil 110 and the part of the metal carrier 120 not covered by the first photoresist pattern layer 131 are etched away to form and form in the metal carrier 120. A photoresist pattern layer 131 complements the groove pattern 123.

本步驟中,先採用銅蝕刻液將未被第一光致抗蝕劑圖形層131覆蓋的第一銅箔110蝕刻去除,從而使得部分金屬載板120的第一表面121露出。然後,採用與金屬載板120的金屬對應的蝕刻液將從第一表面121一側將露出的部分金屬載板120蝕刻去除,從而得到凹槽圖形123。本實施例中,金屬載板120採用鋁製成,在對金屬載板120進行蝕刻時,採用的蝕刻液為鋁蝕刻液。 In this step, the first copper foil 110 not covered by the first photoresist pattern layer 131 is first etched away by using a copper etching solution, so that the first surface 121 of the portion of the metal carrier 120 is exposed. Then, an exposed portion of the metal carrier 120 is etched away from the first surface 121 side by an etching liquid corresponding to the metal of the metal carrier 120, thereby obtaining a groove pattern 123. In the present embodiment, the metal carrier 120 is made of aluminum. When the metal carrier 120 is etched, the etching solution used is an aluminum etching solution.

第四步,在所述凹槽圖形123內部進行電鍍,形成第一導電線路層140。 In the fourth step, electroplating is performed inside the groove pattern 123 to form the first conductive wiring layer 140.

本實施例中,通過電鍍的方式在凹槽圖形123的內部填充金屬。可以通過電鍍金屬銅的方式形成第一導電線路層140。通過控制電鍍的時間,使得電鍍的金屬完全填充凹槽圖形123,並且凸出於凹槽圖形123。即第一導電線路層140的厚度大於凹槽圖形123的深度。 In the present embodiment, the inside of the groove pattern 123 is filled with metal by electroplating. The first conductive wiring layer 140 may be formed by plating metal copper. By controlling the time of plating, the plated metal completely fills the groove pattern 123 and protrudes from the groove pattern 123. That is, the thickness of the first conductive wiring layer 140 is greater than the depth of the groove pattern 123.

第五步,請一併參閱圖4,去除所述第一光致抗蝕劑圖形層131和光致抗蝕劑層132。 In the fifth step, referring to FIG. 4 together, the first photoresist pattern layer 131 and the photoresist layer 132 are removed.

本步驟中,可以採用剝膜的方式將第一光致抗蝕劑圖形層131和光致抗蝕劑層132去除。 In this step, the first photoresist pattern layer 131 and the photoresist layer 132 may be removed by stripping.

第六步,請一併參閱圖5,在第一導電線路層140一側壓合介電層150。 In the sixth step, referring to FIG. 5, the dielectric layer 150 is pressed on the side of the first conductive wiring layer 140.

通過壓合,所述第一導電線路層140凸出於第一銅箔110的部分嵌入所述介電層150內。本實施例中,在壓合介電層150時,還壓合有第二銅箔160。所述第二銅箔160形成於介電層150遠離第一導電線路層140的一側。 A portion of the first conductive wiring layer 140 protruding from the first copper foil 110 is embedded in the dielectric layer 150 by press bonding. In the present embodiment, when the dielectric layer 150 is pressed, the second copper foil 160 is also press-bonded. The second copper foil 160 is formed on a side of the dielectric layer 150 away from the first conductive wiring layer 140.

第七步,請參閱圖6,在介電層150遠離第一導電線路層140的一側形成電鍍金屬圖形173。 In the seventh step, referring to FIG. 6, a plating metal pattern 173 is formed on a side of the dielectric layer 150 away from the first conductive wiring layer 140.

所述電鍍金屬圖形173的形成可以採用半加成方法形成,具體可以包括如下步驟:首先,在所述介電層150內形成盲孔151。如果介電層150的表面形成有第二銅箔160,在形成盲孔151之前,需要對第二銅箔160的表面進行黑化處理,以便於吸收鐳射的能量,從而使得鐳射能夠貫穿第二銅箔160及介電層150,形成盲孔151。在形成盲孔之 後,還可以進一步包括去膠渣的步驟,以對盲孔151內部清理。 The formation of the electroplated metal pattern 173 may be formed by a semi-additive method, and may specifically include the following steps: First, a blind via 151 is formed in the dielectric layer 150. If the surface of the dielectric layer 150 is formed with the second copper foil 160, the surface of the second copper foil 160 needs to be blackened before the blind holes 151 are formed, so as to absorb the energy of the laser, so that the laser can penetrate the second The copper foil 160 and the dielectric layer 150 form a blind via 151. In the formation of blind holes Thereafter, the step of desmear may be further included to clean the inside of the blind hole 151.

然後,在盲孔151的內壁及介電層150的表面形成電鍍種子層171。 Then, a plating seed layer 171 is formed on the inner wall of the blind via 151 and the surface of the dielectric layer 150.

本實施例中,由於介電層150表面形成有第二銅箔160,電鍍種子層171形成於第二銅箔160表面。電鍍種子層171可以採用化學鍍銅或者濺鍍銅的方式形成。 In this embodiment, since the second copper foil 160 is formed on the surface of the dielectric layer 150, the plating seed layer 171 is formed on the surface of the second copper foil 160. The plating seed layer 171 can be formed by electroless copper plating or copper sputtering.

接著,在電鍍種子層171的表面形成第二光致抗蝕劑圖形。 Next, a second photoresist pattern is formed on the surface of the plating seed layer 171.

接著,採用電鍍的方式在為電鍍種子層171表面形成電鍍金屬圖形173。所述電鍍金屬圖形173完全填充盲孔151並且形成於第二光致抗蝕劑圖形之間的空隙內。 Next, a plating metal pattern 173 is formed on the surface of the plating seed layer 171 by electroplating. The plated metal pattern 173 completely fills the blind vias 151 and is formed in the spaces between the second photoresist patterns.

最後,將第二光致抗蝕劑圖形去除。 Finally, the second photoresist pattern is removed.

第八步,請參閱圖7,去除金屬載板120。 In the eighth step, referring to FIG. 7, the metal carrier 120 is removed.

本步驟中,採用蝕刻的方式將金屬載板120去除。 In this step, the metal carrier 120 is removed by etching.

第九步,請參閱圖8,去除第一銅箔110,並去除未被電鍍金屬圖形173覆蓋的電鍍種子層171從而得到第二導電線路層170。 In the ninth step, referring to FIG. 8, the first copper foil 110 is removed, and the plating seed layer 171 not covered by the plated metal pattern 173 is removed to obtain the second conductive wiring layer 170.

由於第一導電線路層140和電鍍金屬圖形173的厚度遠大於第一銅箔110及電鍍種子層171的厚度。通過控制蝕刻的時間,使得第一銅箔110及電鍍種子層171被蝕刻去除,而第一導電線路層140和電鍍金屬圖形173僅厚度減小。 Since the thickness of the first conductive wiring layer 140 and the plating metal pattern 173 is much larger than the thickness of the first copper foil 110 and the plating seed layer 171. By controlling the etching time, the first copper foil 110 and the plating seed layer 171 are etched away, and the first conductive wiring layer 140 and the plating metal pattern 173 are only reduced in thickness.

可以理解的是,本實施例中,由於電鍍種子層171與介電層150之間還具有第二銅箔160,在進行蝕刻時,一併將第二銅箔160蝕刻去除。 It can be understood that, in this embodiment, since the second copper foil 160 is further disposed between the plating seed layer 171 and the dielectric layer 150, the second copper foil 160 is etched away during etching.

本實施例中,第一銅箔110和第二銅箔160的作用可以用於在電鍍過程中更好的傳導電流,以保證形成的電鍍銅更加緻密。可以理解的是,由於金屬載板120具有導電性,因此,本實施例中也可以不設置有第一銅箔110,而直接將第一光致抗蝕劑圖形層131形成於金屬載板120的第一表面121。並且,在形成凹槽圖形時,也可以直接將部分金屬載板120蝕刻,以得到凹槽圖形,而不必蝕刻第一銅箔110。同樣,介電層150的表面也可以不壓合第二銅箔160,而在介電層150的表面直接形成電鍍種子層171,以進行電鍍。 In this embodiment, the functions of the first copper foil 110 and the second copper foil 160 can be used to better conduct current during the electroplating process to ensure that the formed electroplated copper is more dense. It can be understood that, because the metal carrier 120 has electrical conductivity, the first copper foil 110 may not be disposed in the embodiment, and the first photoresist pattern layer 131 may be directly formed on the metal carrier 120. The first surface 121. Moreover, when the groove pattern is formed, a part of the metal carrier 120 may be directly etched to obtain a groove pattern without etching the first copper foil 110. Similarly, the surface of the dielectric layer 150 may not be pressed against the second copper foil 160, and the plating seed layer 171 may be directly formed on the surface of the dielectric layer 150 for electroplating.

當不具有第一銅箔110和第二銅箔160時,本步驟僅將第二光致抗蝕劑圖形172露出的電鍍種子層171去除即可。 When the first copper foil 110 and the second copper foil 160 are not provided, this step only removes the plating seed layer 171 from which the second photoresist pattern 172 is exposed.

所述第二導電線路層170由第二銅箔160、電鍍種子層171及電鍍金屬圖形173共同構成。所述第二銅箔160形成於介電層150表面。所述電鍍種子層171位於電鍍金屬圖形173與第二銅箔160之間。可以理解的是,當不具有第二銅箔160時,第二導電線路層170由電鍍種子層171及電鍍金屬圖形173共同構成。 The second conductive wiring layer 170 is composed of a second copper foil 160, a plating seed layer 171, and a plating metal pattern 173. The second copper foil 160 is formed on the surface of the dielectric layer 150. The plating seed layer 171 is located between the plating metal pattern 173 and the second copper foil 160. It can be understood that when the second copper foil 160 is not provided, the second conductive wiring layer 170 is composed of the plating seed layer 171 and the plating metal pattern 173.

第十步,請參閱圖9,在第一導電線路層140一側形成第一防焊層181,在第二導電線路層170一側形成第二防焊層182,得到電路板100。 In the tenth step, referring to FIG. 9, a first solder resist layer 181 is formed on one side of the first conductive wiring layer 140, and a second solder resist layer 182 is formed on the second conductive wiring layer 170 side to obtain a circuit board 100.

所述第一防焊層181具有多個第一開口1811,部分第一導電線路層140從所述第一開口1811露出,從而得到多個第一電性接觸墊1401。所述第二防焊層182具有多個第二開口1821,部分第二導電線路層170從所述第二開口1821露出,從而得到多個第二電性接觸墊1701。 The first solder resist layer 181 has a plurality of first openings 1811 , and a portion of the first conductive trace layer 140 is exposed from the first openings 1811 , thereby obtaining a plurality of first electrical contact pads 1401 . The second solder resist layer 182 has a plurality of second openings 1821, and a portion of the second conductive trace layer 170 is exposed from the second openings 1821, thereby obtaining a plurality of second electrical contact pads 1701.

第十一步,在第一電性接觸墊1401的表面形成第一保護層1402,在第二電性接觸墊1701的表面形成第二保護層1702。 In the eleventh step, a first protective layer 1402 is formed on the surface of the first electrical contact pad 1401, and a second protective layer 1702 is formed on the surface of the second electrical contact pad 1701.

所述第一保護層1402和第二保護層1702可以為有機保焊膜(OSP),也可以為鎳鈀金層。 The first protective layer 1402 and the second protective layer 1702 may be an organic solder resist film (OSP) or a nickel palladium gold layer.

在此之後,還可以在第一保護層1402和第二保護層1702的形成焊球,以便於封裝元件。 After that, solder balls may also be formed on the first protective layer 1402 and the second protective layer 1702 to facilitate packaging of the components.

進一步地,本技術方案提供的電路板製作方法也可以用於多層電路板的製作,即在第九步之後,繼續進行增層製作,從而可以得到多層電路板。 Further, the circuit board manufacturing method provided by the technical solution can also be used for the fabrication of a multi-layer circuit board, that is, after the ninth step, the layer-by-layer fabrication is continued, so that the multilayer circuit board can be obtained.

請參閱圖9,本技術方案還提供一種電路板100,所述電路板100包括介電層150、第一導電線路層140及第二導電線路層170。 Referring to FIG. 9 , the technical solution further provides a circuit board 100 . The circuit board 100 includes a dielectric layer 150 , a first conductive circuit layer 140 , and a second conductive circuit layer 170 .

所述第一導電線路層140和第二導電線路層170分別形成與介電層150的相對兩側。所述第一導電線路層140部分嵌入所述介電層150內,其餘部分凸出於介電層150。所述第二導電線路層170凸出於所述介電層150。所述第一導電線路層140和第二導電線路層170通過導電盲孔相互導通。 The first conductive wiring layer 140 and the second conductive wiring layer 170 are respectively formed on opposite sides of the dielectric layer 150. The first conductive wiring layer 140 is partially embedded in the dielectric layer 150, and the remaining portion protrudes from the dielectric layer 150. The second conductive wiring layer 170 protrudes from the dielectric layer 150. The first conductive circuit layer 140 and the second conductive circuit layer 170 are electrically connected to each other through the conductive blind holes.

本實施例中,所述第二導電線路層170由第二銅箔160、電鍍種子層171及電鍍金屬圖形173共同構成。所述第二銅箔160形成於介電層150表面。所述電鍍種子層171位於電鍍金屬圖形173與第二銅箔160之間。 In this embodiment, the second conductive circuit layer 170 is composed of a second copper foil 160, a plating seed layer 171, and a plated metal pattern 173. The second copper foil 160 is formed on the surface of the dielectric layer 150. The plating seed layer 171 is located between the plating metal pattern 173 and the second copper foil 160.

本技術方案提供的電路板製作方法也可以應用於剛撓結合板的製作。 The circuit board manufacturing method provided by the technical solution can also be applied to the fabrication of a rigid-flex board.

本技術方案中,由於第一導電線路層140部分設置於介電層內,部分凸出於介電層,這樣,在第一導電線路表面形成防焊層時,可以採用厚度較小的防焊層便可以將第一導電線路層和第二導電線路層覆蓋,從而,可以降低防焊層的厚度,進而可以降低電路板的厚度。 In the technical solution, since the first conductive circuit layer 140 is partially disposed in the dielectric layer and partially protrudes from the dielectric layer, when the solder resist layer is formed on the surface of the first conductive line, the solder resist having a small thickness may be used. The layer can cover the first conductive circuit layer and the second conductive circuit layer, thereby reducing the thickness of the solder resist layer, thereby reducing the thickness of the circuit board.

而且,由於所述第一導電線路層140部分嵌入所述介電層150中,其餘部分位於防焊層中,可以增加第一導電線路層140與介電層150的結合能力。相比於現有技術中導電線路層凸出於介電層150,可以避免電路板彎折時應力集中於介電層、導電線路層及防焊層的交點處而造成介電層、導電線路層及防焊層相互分離,從而提高電路板的品質。 Moreover, since the first conductive wiring layer 140 is partially embedded in the dielectric layer 150 and the remaining portion is located in the solder resist layer, the bonding ability of the first conductive wiring layer 140 and the dielectric layer 150 can be increased. Compared with the prior art, the conductive circuit layer protrudes from the dielectric layer 150, and the stress concentration on the intersection of the dielectric layer, the conductive circuit layer and the solder resist layer when the circuit board is bent can be avoided to cause the dielectric layer and the conductive circuit layer. And the solder resist layers are separated from each other to improve the quality of the board.

進一步的,本技術方案提供的電路板製作過程中,在介電層表面壓合有第二銅箔160,第二銅箔160與介電層150的結合能力大於電鍍種子層171與介電層150的結合能力。因此,在進行蝕刻過程中,相比於現有技術中直接在介電層表面形成電鍍種子層,本技術方案提供的電路板製作方法不會由於蝕刻側蝕使得電鍍種子層與介電層分離而導致電鍍金屬與介電層分離。 Further, in the circuit board manufacturing process provided by the technical solution, the second copper foil 160 is press-bonded on the surface of the dielectric layer, and the bonding capability of the second copper foil 160 and the dielectric layer 150 is greater than that of the plating seed layer 171 and the dielectric layer. 150 combined ability. Therefore, in the etching process, the circuit board manufacturing method provided by the present technical solution does not separate the plating seed layer from the dielectric layer due to etching side etching, compared to the prior art forming the plating seed layer directly on the surface of the dielectric layer. This causes the plating metal to separate from the dielectric layer.

惟,以上所述者僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士爰依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。 However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

100‧‧‧電路板 100‧‧‧ boards

140‧‧‧第一導電線路層 140‧‧‧First conductive circuit layer

160‧‧‧第二銅箔 160‧‧‧second copper foil

170‧‧‧第二導電線路層 170‧‧‧Second conductive circuit layer

171‧‧‧電鍍種子層 171‧‧‧Electroplating seed layer

173‧‧‧電鍍金屬圖形 173‧‧‧Electroplated metal graphics

181‧‧‧第一防焊層 181‧‧‧First solder mask

1811‧‧‧第一開口 1811‧‧‧ first opening

1401‧‧‧第一電性接觸墊 1401‧‧‧First electrical contact pads

1402‧‧‧第一保護層 1402‧‧‧First protective layer

182‧‧‧第二防焊層 182‧‧‧Second solder mask

1821‧‧‧第二開口 1821‧‧‧second opening

1701‧‧‧第二電性接觸墊 1701‧‧‧Second electrical contact pads

1702‧‧‧第二保護層 1702‧‧‧Second protective layer

Claims (7)

一種電路板製作方法,包括步驟:提供金屬載板,所述金屬載板具有相對的第一表面和第二表面;在所述第一表面一側形成第一光致抗蝕劑圖形層;將未被第一光致抗蝕劑圖形層覆蓋的部分金屬載板蝕刻去除,從而在所述金屬載板內形成與第一光致抗蝕劑圖形層相互補的凹槽圖形;在所述凹槽圖形內電鍍金屬形成第一導電線路層,所述第一導電線路層完全填充並凸出於所述凹槽圖形;去除所述第一光致抗蝕劑圖形層;在第一導電線路層一側壓合介電層,凸出於金屬載板的第一導電線路層嵌入所述介電層內;在介電層遠離第一導電線路層的一側形成第二導電線路層;以及去除所述金屬載板。 A circuit board manufacturing method comprising the steps of: providing a metal carrier having opposite first and second surfaces; forming a first photoresist pattern layer on a side of the first surface; a portion of the metal carrier not covered by the first photoresist pattern layer is etched away to form a recess pattern complementary to the first photoresist pattern layer in the metal carrier; Electroplating metal in the groove pattern forms a first conductive circuit layer, the first conductive circuit layer is completely filled and protrudes from the groove pattern; the first photoresist pattern layer is removed; and the first conductive circuit layer is Pressing a dielectric layer on one side, a first conductive circuit layer protruding from the metal carrier is embedded in the dielectric layer; forming a second conductive circuit layer on a side of the dielectric layer away from the first conductive layer; and removing The metal carrier. 如請求項第1項所述的電路板製作方法,其中,通過化學蝕刻所述金屬載板形成所述凹槽圖形。 The circuit board manufacturing method of claim 1, wherein the groove pattern is formed by chemically etching the metal carrier. 如請求項第1項所述的電路板製作方法,其中,製作所述第二導電線路層包括步驟:在所述介電層內形成盲孔;在盲孔的內壁及介電層的表面形成電鍍種子層;在電鍍種子層的表面形成第二光致抗蝕劑圖形;採用電鍍的方式在為電鍍種子層表面形成電鍍金屬圖形;以及將第二光致抗蝕劑圖形去除。 The method of fabricating a circuit board according to claim 1, wherein the fabricating the second conductive circuit layer comprises the steps of: forming a blind via in the dielectric layer; and forming an inner wall of the blind via and a surface of the dielectric layer Forming a plating seed layer; forming a second photoresist pattern on the surface of the plating seed layer; forming a plating metal pattern on the surface of the plating seed layer by electroplating; and removing the second photoresist pattern. 如請求項第1項所述的電路板製作方法,其中,在壓合所述介電層時還在 介電層的表面形成第二銅箔,製作所述第二導電線路層包括步驟:在所述介電層及第二銅箔內形成盲孔;在盲孔的內壁及第二銅箔的表面形成電鍍種子層;在電鍍種子層的表面形成第二光致抗蝕劑圖形;採用電鍍的方式在為電鍍種子層表面形成電鍍金屬圖形;以及將第二光致抗蝕劑圖形去除。 The method of fabricating a circuit board according to Item 1, wherein the dielectric layer is still pressed Forming a second copper foil on the surface of the dielectric layer, the step of forming the second conductive circuit layer includes: forming a blind hole in the dielectric layer and the second copper foil; and forming an inner wall of the blind hole and the second copper foil Forming a plating seed layer on the surface; forming a second photoresist pattern on the surface of the plating seed layer; forming a plating metal pattern on the surface of the plating seed layer by electroplating; and removing the second photoresist pattern. 如請求項第4項所述的電路板製作方法,其中,還包括去除未被所述電鍍金屬覆蓋的電鍍種子層及第二銅箔。 The method of fabricating a circuit board according to claim 4, further comprising removing the plating seed layer and the second copper foil not covered by the plating metal. 如請求項第1項所述的電路板製作方法,其中,所述金屬載板的第一表面形成有第一銅箔,所述第一光致抗蝕劑圖形層形成於所述第一銅箔的表面,在形成所述凹槽圖形時,先將未被第一光致抗蝕劑圖形層覆蓋的第一銅箔蝕刻去除。 The circuit board manufacturing method of claim 1, wherein the first surface of the metal carrier is formed with a first copper foil, and the first photoresist pattern layer is formed on the first copper The surface of the foil, in forming the groove pattern, first etches away the first copper foil not covered by the first photoresist pattern layer. 如請求項第1項所述的電路板製作方法,其中,金屬載板的材料為鋁。 The method of fabricating a circuit board according to Item 1, wherein the material of the metal carrier is aluminum.
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CN110859022A (en) * 2018-08-24 2020-03-03 三赢科技(深圳)有限公司 Circuit board and electronic device using same
CN111194141B (en) * 2018-11-15 2023-04-18 礼鼎半导体科技秦皇岛有限公司 Circuit board and manufacturing method thereof
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JP7310599B2 (en) * 2019-12-26 2023-07-19 トヨタ自動車株式会社 Wiring board manufacturing method and wiring board
CN113163626B (en) * 2020-01-22 2022-08-23 上海美维科技有限公司 Manufacturing method of ultrathin printed circuit board
CN113973433B (en) * 2020-07-24 2023-08-18 宏启胜精密电子(秦皇岛)有限公司 Built-in circuit board and manufacturing method thereof

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200618705A (en) * 2004-09-16 2006-06-01 Tdk Corp Multilayer substrate and manufacturing method thereof
TW201316859A (en) * 2011-10-12 2013-04-16 Subtron Technology Co Ltd Circuit board structure and manufacturing method thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8555494B2 (en) * 2007-10-01 2013-10-15 Intel Corporation Method of manufacturing coreless substrate
US8188380B2 (en) * 2008-12-29 2012-05-29 Ibiden Co., Ltd. Printed wiring board and method for manufacturing printed wiring board
JP5147779B2 (en) * 2009-04-16 2013-02-20 新光電気工業株式会社 Wiring board manufacturing method and semiconductor package manufacturing method
JP5436259B2 (en) * 2010-02-16 2014-03-05 日本特殊陶業株式会社 Multilayer wiring board manufacturing method and multilayer wiring board
JP5623308B2 (en) * 2010-02-26 2014-11-12 日本特殊陶業株式会社 Multilayer wiring board and manufacturing method thereof

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200618705A (en) * 2004-09-16 2006-06-01 Tdk Corp Multilayer substrate and manufacturing method thereof
TW201316859A (en) * 2011-10-12 2013-04-16 Subtron Technology Co Ltd Circuit board structure and manufacturing method thereof

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