TWI481081B - Encapsulation material forming method - Google Patents

Encapsulation material forming method Download PDF

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TWI481081B
TWI481081B TW101100743A TW101100743A TWI481081B TW I481081 B TWI481081 B TW I481081B TW 101100743 A TW101100743 A TW 101100743A TW 101100743 A TW101100743 A TW 101100743A TW I481081 B TWI481081 B TW I481081B
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cavity
resin
block
sealing material
film
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TW101100743A
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Chinese (zh)
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TW201240157A (en
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Dong Joo Hwang
Shin Kyung Kim
Young Gyu Choi
Dae Su Seuk
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Shinhan Diamond Ind Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/565Moulds
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/02Containers; Seals
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/93Batch processes
    • H01L24/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L24/97Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12041LED
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Casting Or Compression Moulding Of Plastics Or The Like (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)

Description

封止材料形成方法Sealing material forming method

本發明是有關於半導體晶片的封止材料形成方法,且特別是有關於一種適用於形成發光二極體封裝(package)產品的封止材料的封止材料形成方法。The present invention relates to a method of forming a sealing material for a semiconductor wafer, and more particularly to a method of forming a sealing material suitable for forming a sealing material for a light-emitting diode package product.

用樹脂來形成封止材料以便將晶片封裝起來的技術被用來製造包括半導體晶片(如發光二極體晶片)的封裝產品。根據最新產品的技術水準和特性以及市場需求,諸如發光二極體封裝等半導體封裝正日趨變輕、變薄、變短、變小。鑒於此趨勢,加之為了降低原料消耗,已對封止材料的形成進行了積極的研究,以便使形成封止材料所用的樹脂的量最小化。A technique of forming a sealing material with a resin to encapsulate a wafer is used to manufacture a packaged product including a semiconductor wafer such as a light emitting diode wafer. According to the technical level and characteristics of the latest products and market demand, semiconductor packages such as light-emitting diode packages are becoming lighter, thinner, shorter, and smaller. In view of this trend, in order to reduce the consumption of raw materials, active research has been conducted on the formation of a sealing material in order to minimize the amount of resin used to form the sealing material.

作為封止材料形成技術,轉移成型(transfer molding)、射出成型(injection molding)以及二次成型(overmolding)(或壓縮成型(compression molding))是本領域中眾所周知的。As a sealing material forming technique, transfer molding, injection molding, and overmolding (or compression molding) are well known in the art.

就轉移成型而言,為了以用作原料的未固化(uncured)的樹脂來填充實施成型的空腔(cavity),首先將樹脂提供給形成在模具中的通口(port(s)),然後在上方模具和下方模具閉合的狀態下對通口施加外力,使得樹脂能夠依序經過流槽(runner)和閘(gate)而進入空腔。當空腔完全充滿樹脂後,流經閘的樹脂在預定的時間內被固化。封止材料或包括封止材料的產品從模具上被分離。此時,殘留在通口、流槽以及閘中的剩餘樹脂從產品上被分離,然後將其丟棄。In the case of transfer molding, in order to fill a cavity for performing molding with an uncured resin used as a raw material, the resin is first supplied to a port (s) formed in a mold, and then An external force is applied to the port in a state where the upper mold and the lower mold are closed, so that the resin can sequentially enter the cavity through a runner and a gate. When the cavity is completely filled with the resin, the resin flowing through the gate is cured for a predetermined time. The sealing material or the product including the sealing material is separated from the mold. At this time, the remaining resin remaining in the port, the launder, and the gate is separated from the product and then discarded.

如上所述,由於在轉移成型(或射出成型)中樹脂要轉移較長的路徑,所以必須使用較大流量的樹脂。另外,由於通口、流槽以及閘相比形成封止材料的空腔而言具有較大的容積,且通口、流槽以及閘中殘留的樹脂被丟棄,所以存在著樹脂損耗過度增大的缺點。因此,儘管轉移成型擁有眾多優點,如成型精確度佳且成型尺寸穩定性高,但它也具有內在問題,即因樹脂消耗過度而導致其經濟效益大大降低。As described above, since the resin is to be transferred in a long path in transfer molding (or injection molding), it is necessary to use a resin having a large flow rate. In addition, since the port, the launder, and the gate have a larger volume than the cavity forming the sealing material, and the resin remaining in the port, the launder, and the gate is discarded, there is excessive increase in resin loss. Shortcomings. Therefore, although transfer molding has many advantages, such as good molding accuracy and high dimensional stability, it also has an inherent problem that its economic efficiency is greatly reduced due to excessive resin consumption.

相比之下,與轉移成型不同的是,二次成型將樹脂直接提供給空腔,而不使用通口、流槽或閘,然後對樹脂進行壓縮以形成封止材料。如此一來,因為樹脂的消耗會大大減少,所以二次成型在經濟方面具有優勢。然而,在習知的二次成型中,由於在樹脂壓縮過程中空腔容積沿著成型厚度方向而減小或發生變化,所以成型厚度會隨著樹脂的供應而變化。此外,當以批量形式來為多個元件形成封止材料時,習知的二次成型具有優勢,但問題是,用習知的二次成型來生產特定的產品很困難。具體而言,當使用習知的二次成型來為具有多個通孔(through-holes)的引線框基板(lead frame substrate)上的半導體晶片形成封止材料時,樹脂會經由這些通孔而流出。因此,習知的二次成型必須進行(例如)預處理,用防漏帶之類的物品將通孔堵住,這非常不方便,非常麻煩。In contrast, unlike transfer molding, the overmolding provides the resin directly to the cavity without the use of a port, runner or gate, and then compresses the resin to form a sealing material. As a result, the secondary molding is economically advantageous because the consumption of the resin is greatly reduced. However, in the conventional overmolding, since the cavity volume is reduced or changed along the molding thickness direction during the compression of the resin, the molding thickness varies depending on the supply of the resin. Further, conventional overmolding is advantageous when forming a sealing material for a plurality of components in a batch form, but the problem is that it is difficult to produce a specific product by conventional secondary molding. Specifically, when a conventional overmolding is used to form a sealing material for a semiconductor wafer on a lead frame substrate having a plurality of through-holes, the resin passes through the through holes. Flow out. Therefore, the conventional overmolding must be performed, for example, by pretreatment, and the through hole is blocked by an article such as a leakage preventing tape, which is very inconvenient and troublesome.

就表面安裝元件(surface mounted device,SMD)式發光二極體封裝(其占發光二極體封裝產品的大部分)而言,需要一個圍繞著發光二極體晶片的反光板來增強光學效率。反光板是一種藉由射出成型和將苯丙醇胺(phenylpropanolamine,PPA)整合在引線框基板上而形成的產品,其中引線框基板是藉由將金屬圖案化而製成,且反光板具有一開口(opening),其用來容納半導體晶片。為了二次成型能夠用在此類應用中,應當形成封止材料或透鏡來覆蓋此開口。因此,若樹脂塗在下方模具的整個空腔上,則包括反光板之外周邊在內的引線框的非必要的區域也會形成封止材料。因此,裝置或封裝之間的間隙或間距(pitch)越大,所需的棄置性樹脂消耗就越大,這將在成型製程或任何後續製程中進一步造成額外的問題。此外,若為了減小棄置性樹脂消耗而形成薄薄的一層封止材料,則反光板與封止材料之間的黏附會變差,以致於在成型製程後的任何後續製程中封止材料可能會分離,從而導致其他問題。In the case of surface mounted device (SMD) type light emitting diode packages, which account for the majority of the LED package products, a retroreflective sheeting around the light emitting diode chip is required to enhance optical efficiency. The reflector is a product formed by injection molding and integrating phenylpropanolamine (PPA) on a lead frame substrate, wherein the lead frame substrate is formed by patterning a metal, and the reflector has a Opening, which is used to house a semiconductor wafer. For overmolding to be used in such applications, a sealing material or lens should be formed to cover the opening. Therefore, if the resin is applied to the entire cavity of the lower mold, an unnecessary region of the lead frame including the outer periphery of the reflector also forms a sealing material. Thus, the greater the gap or pitch between the devices or packages, the greater the consumption of the desired repellent resin, which further poses additional problems in the molding process or any subsequent process. In addition, if a thin layer of sealing material is formed in order to reduce the consumption of the repellent resin, the adhesion between the reflector and the sealing material may be deteriorated, so that the sealing material may be in any subsequent process after the molding process. Will separate, causing other problems.

同時,封止材料形成後,為了分離出產品,目前使用的是昂貴的離型膜(releasing film)。離型膜的典型實例包括氟化合物樹脂膜,如PTFE、PFA、FEP以及ETFE(由Asahi Glass公司製造,商標FluonETFE),所有這些離型膜都包含具有非粘滯性的氟成分。在現有的技術中,使用昂貴的離型膜導致經濟效益降低。此外,還存在一些問題,即多餘的固態樹脂黏附在離型膜對面的模具或塊體(block)上,也就是支撐產品的模具或塊體上,使它們不易分離。要想移除這些多餘的固態樹脂,就必須再做些麻煩的工作。此外,如果多餘的固態樹脂未完全移除的模具或塊體被再次用來壓縮和形成其他封止材料,則封止材料的成型品質會降低,因而產生更多缺陷。At the same time, after the sealing material is formed, in order to separate the product, an expensive release film is currently used. Typical examples of the release film include a fluorine compound resin film such as PTFE, PFA, FEP, and ETFE (manufactured by Asahi Glass Co., Ltd., trademark Fluon) ETFE), all of these release films contain a non-viscous fluorine component. In the prior art, the use of expensive release films results in reduced economic benefits. In addition, there are problems in that excess solid resin adheres to a mold or a block opposite the release film, that is, a mold or a block that supports the product, making them difficult to separate. To remove these extra solid resin, you have to do some more troublesome work. Further, if the mold or the block in which the excess solid resin is not completely removed is used again to compress and form other sealing materials, the molding quality of the sealing material is lowered, thereby causing more defects.

本發明是為了解決先前技術的上述問題。本發明的一個目的是提供一種改良的封止材料形成方法,此方法可在封止材料形成後容易地移除多餘的固態樹脂。The present invention has been made to solve the above problems of the prior art. It is an object of the present invention to provide an improved method of forming a sealing material which can easily remove excess solid resin after formation of the sealing material.

依照本發明為實現其目的而提出的一觀點,提供一種封止材料形成方法,此方法包括:嵌入空腔塊(insert cavity block)配置步驟,將具有樹脂入口和成型空腔的嵌入空腔塊配置在基板上;樹脂裝載空間形成步驟,用以形成樹脂裝載空間,其正對嵌入空腔塊的一側被一層薄膜圍繞著;封止材料形成步驟,使樹脂裝載空間的底部靠近嵌入空腔塊,以便使樹脂裝載空間內的樹脂經由樹脂入口來填充成型空腔;以及薄膜分離步驟,樹脂固化後,在嵌入空腔塊之表面上所殘留的多餘的固態樹脂黏附在薄膜上的狀態下,使薄膜從嵌入空腔塊上分離並將其移除。According to an aspect of the present invention which is provided for the purpose of the present invention, there is provided a method of forming a sealing material, the method comprising: an insert cavity block configuration step, an embedded cavity block having a resin inlet and a molding cavity Disposed on the substrate; a resin loading space forming step for forming a resin loading space, which is surrounded by a film on the side embedded in the cavity block; and a sealing material forming step to bring the bottom of the resin loading space close to the embedded cavity a block so that the resin in the resin loading space fills the molding cavity via the resin inlet; and the film separating step, after the resin is cured, the excess solid resin remaining on the surface of the embedded cavity block adheres to the film The film is separated from the embedded cavity block and removed.

較佳的是,在嵌入空腔塊配置步驟中,將離型劑塗在嵌入空腔塊的正對樹脂裝載空間的表面上。Preferably, in the step of embedding the cavity block, the release agent is applied to the surface of the cavity facing the resin loading space.

較佳的是,嵌入空腔塊配置步驟包括:將基板安裝在第一模具上;以及將嵌入空腔塊安裝在基板上。Preferably, the step of embedding the cavity block includes: mounting the substrate on the first mold; and mounting the embedded cavity block on the substrate.

較佳的是,在樹脂裝載空間形成步驟中,正對第一模具且具有凹面空間的第二模具被薄膜覆蓋以形成樹脂裝載空間,第二模具包括空腔壓縮塊和圍繞此空腔壓縮塊而配置的空腔固持塊,凹面空間是由空腔固持塊與空腔壓縮塊之間的高度差所形成。Preferably, in the resin loading space forming step, the second mold facing the first mold and having a concave space is covered by the film to form a resin loading space, and the second mold includes a cavity compression block and a compression block surrounding the cavity In the case of the configured cavity holding block, the concave space is formed by the difference in height between the cavity holding block and the cavity compressing block.

較佳的是,在封止材料形成步驟中,空腔固持塊上移或下移,直到空腔固持塊接觸到嵌入空腔塊為止。在空腔固持塊停止移動的狀態下,空腔壓縮塊繼續上移或下移,以便將樹脂裝載空間中的樹脂注射到成型空腔內,其中,在薄膜分離步驟中,第二模具脫離嵌入空腔塊,使得薄膜和黏附在此薄膜上的多餘的固態樹脂脫離嵌入空腔塊。Preferably, in the sealing material forming step, the cavity holding block is moved up or down until the cavity holding block contacts the embedded cavity block. In a state where the cavity holding block stops moving, the cavity compression block continues to move up or down to inject the resin in the resin loading space into the molding cavity, wherein in the film separation step, the second mold is de-embedded The cavity block causes the film and excess solid resin adhered to the film to be detached from the cavity block.

第一模具可以是上方模具或下方模具。若第一模具是上方模具,則第二模具是下方模具。相反,若第一模具是下方模具,則第二模具是上方模具。The first mold may be an upper mold or a lower mold. If the first mold is the upper mold, the second mold is the lower mold. Conversely, if the first mold is the lower mold, the second mold is the upper mold.

依照如此構造的本發明,當使用壓縮成型技術來形成用來封裝基板上的發光二極體晶片等半導體的封止材料時,無需使用昂貴的離型膜,所以可提高經濟效益。此外,依照本發明,由於多餘的固態樹脂可以容易地從嵌入空腔塊和封止材料上移除,所以製造產品所用的成本可大大降低。再者,因離型膜以及多餘的固態樹脂不易從所形成的產品的封止材料上分離的現象所導致的許多習知的品質下降問題也可得以解決。According to the present invention thus constructed, when a compression molding technique is used to form a sealing material for packaging a semiconductor such as a light-emitting diode wafer on a substrate, it is not necessary to use an expensive release film, so that economic efficiency can be improved. Further, according to the present invention, since the excess solid resin can be easily removed from the embedded cavity block and the sealing material, the cost for manufacturing the product can be greatly reduced. Further, many conventional quality deterioration problems caused by the phenomenon that the release film and the excess solid resin are not easily separated from the sealing material of the formed product can be solved.

下面將配合所附圖式來詳細闡述本發明的較佳實施例。另外,提供這些實施例是為了本領域具通常技能者能夠更好地瞭解本發明,本發明並不限於這些實施例。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, preferred embodiments of the present invention will be described in detail in conjunction with the drawings. Further, the embodiments are provided to enable those skilled in the art to better understand the present invention, and the present invention is not limited to the embodiments.

圖1至圖3是依照本發明之一實施例的一種封止材料形成裝置的橫剖面圖,它們分別對應於成型初期的第一位置、對應於成型中期的第二位置以及對應於成型末期的第三位置,且圖4是用來展示圖3所示之封止材料形成裝置的重要部分的放大橫剖面圖。圖5是用來展示封止材料完全形成後多餘的固態樹脂被分離時的狀態的橫剖面圖。1 to 3 are cross-sectional views of a sealing material forming apparatus corresponding to a first position at an initial stage of molding, a second position corresponding to a mid-molding period, and a final position corresponding to the molding stage, respectively, according to an embodiment of the present invention. The third position, and Fig. 4 is an enlarged cross-sectional view showing an important part of the sealing material forming device shown in Fig. 3. Fig. 5 is a cross-sectional view showing a state in which the excess solid resin is separated after the sealing material is completely formed.

如圖1至圖5所示,本實施例之封止材料形成裝置是一種二次成型式或擠製成型(extrusion-molding)式形成裝置,其包括上方模具20、下方模具30以及介於兩者之間的嵌入空腔塊40。為了使下方模具上移或下移來執行樹脂壓模(compression-mold),例如,可使用如壓力壓縮機(press compressor)等升降機構,但這在圖中並未繪示。As shown in FIGS. 1 to 5, the sealing material forming device of the present embodiment is a secondary molding or extrusion-molding forming device including an upper mold 20, a lower mold 30, and The cavity block 40 is embedded between the two. A resin compression-mold is performed in order to move the lower mold up or down, for example, a lifting mechanism such as a press compressor may be used, but this is not shown in the drawings.

上方模具20與下方模具30分別配置在如壓力壓縮機等升降機構的上端部位和下端部位,且位於彼此對面。上方模具20及/或下方模具30可具有加熱元件(未繪示),用來將樹脂加熱到預設的溫度。在本實施例中,封止材料形成在具有引線框11的基板10上,且基板10包括:發光二極體晶片12,其安裝在引線框11上;以及多個反光板13,其具有多個開口,分別容納各別的發光二極體晶片12。另外,封止材料形成後,基板10被切割,使其分成多個表面安裝元件(SMD)式發光二極體封裝,其中基板10具有多個通孔,這是由引線框11的圖案所導致。在整個說明書中,術語“基板”定義為包括安裝在上方模具20或下方模具30上以便形成封止材料的所有類型的物件。此外,如各圖所示,基板,其作為封止材料形成所在的物件,是藉由將發光二極體晶片安裝在引線框上而製成的,但本發明並不限於此情形。The upper mold 20 and the lower mold 30 are respectively disposed at an upper end portion and a lower end portion of a lifting mechanism such as a pressure compressor, and are located opposite to each other. The upper mold 20 and/or the lower mold 30 may have heating elements (not shown) for heating the resin to a predetermined temperature. In the present embodiment, a sealing material is formed on the substrate 10 having the lead frame 11, and the substrate 10 includes: a light emitting diode wafer 12 mounted on the lead frame 11; and a plurality of light reflecting plates 13 having a plurality of The openings respectively accommodate the respective light emitting diode chips 12. In addition, after the sealing material is formed, the substrate 10 is cut to be divided into a plurality of surface mount component (SMD) type light emitting diode packages, wherein the substrate 10 has a plurality of through holes, which is caused by the pattern of the lead frame 11. . Throughout the specification, the term "substrate" is defined to include all types of articles that are mounted on the upper mold 20 or the lower mold 30 to form a seal material. Further, as shown in the respective drawings, the substrate, which is formed as a sealing material, is produced by mounting a light-emitting diode wafer on a lead frame, but the present invention is not limited to this case.

利用單獨提供的基板供應裝置(未繪示)來將基板10提供給上方模具20,且將其安裝在上方模具20上。為了將基板10安裝在上方模具20上,可使用真空吸附法(vacuum absorption method)或夾持法(clamping method),但是也可使用任何其他方法來將基板10安裝在上方模具20上。基板供應裝置是在上方模具20與下方模具30彼此隔開預定的距離的狀態下藉由壓力驅動單元來提供基板10。安裝在上方模具20上的基板10經配置以使得基板10的用來形成封止材料的寬表面朝著下方模具30。The substrate 10 is supplied to the upper mold 20 by a separately provided substrate supply device (not shown), and is mounted on the upper mold 20. In order to mount the substrate 10 on the upper mold 20, a vacuum absorption method or a clamping method may be used, but any other method may be used to mount the substrate 10 on the upper mold 20. The substrate supply device supplies the substrate 10 by a pressure driving unit in a state where the upper mold 20 and the lower mold 30 are spaced apart from each other by a predetermined distance. The substrate 10 mounted on the upper mold 20 is configured such that the wide surface of the substrate 10 used to form the sealing material faces the lower mold 30.

此外,嵌入空腔塊40被安裝在基板10上,其中基板10被安裝在上方模具20上。再如圖4所示,嵌入空腔塊40在一個表面上具有多個成型空腔41,且在另一表面上具有多個分別連接到成型空腔41的樹脂入口(或閘)42。此外,嵌入空腔塊40被安裝在基板10上,使得多個成型空腔41朝向基板10,且多個樹脂入口42朝向位於下方模具30上的樹脂裝載空間38。Further, the embedded cavity block 40 is mounted on the substrate 10, wherein the substrate 10 is mounted on the upper mold 20. As further shown in FIG. 4, the embedded cavity block 40 has a plurality of molding cavities 41 on one surface and a plurality of resin inlets (or gates) 42 respectively connected to the molding cavities 41 on the other surface. Further, the embedded cavity block 40 is mounted on the substrate 10 such that the plurality of molding cavities 41 face the substrate 10, and the plurality of resin inlets 42 face the resin loading space 38 located on the lower mold 30.

如上所述,基板10的一個表面上包括發光二極體晶片12和反光板13,每個反光板13具有一開口,用來容納其對應的發光二極體晶片12,且反光板13的開口必須充滿封止材料。為此,反光板13要實質上嚴格地配入(fitted into)嵌入空腔塊40的對應的成型空腔41。因此,在成型空腔41中,實際上只有反光板13的開口可充滿樹脂R。為了使封止材料形成想要的形狀,成型空腔41可設計成具有凸透鏡形或其他想要的形狀。下方模具30的樹脂裝載空間內的樹脂受到空腔壓縮塊31的壓迫,以受壓方式經由樹脂入口42而流入成型空腔41,然後被固化,從而形成用來封裝反光板13之開口中的發光二極體晶片12的封止材料。若不同於本實施例,基板10不包括反光板13,則圖式中被反光板13佔據的空間也會充滿樹脂。As described above, one surface of the substrate 10 includes the light emitting diode chip 12 and the light reflecting plate 13, each of the reflecting plates 13 having an opening for accommodating its corresponding light emitting diode wafer 12, and the opening of the light reflecting plate 13 Must be filled with sealing material. To this end, the reflector 13 is to be substantially rigidly fitted into the corresponding shaped cavity 41 of the cavity block 40. Therefore, in the molding cavity 41, only the opening of the reflecting plate 13 can be filled with the resin R. In order to form the sealing material into a desired shape, the molding cavity 41 can be designed to have a convex lens shape or other desired shape. The resin in the resin loading space of the lower mold 30 is pressed by the cavity compression block 31, flows into the molding cavity 41 via the resin inlet 42 in a pressurized manner, and is then solidified, thereby forming an opening for enclosing the reflector 13 The sealing material of the LED wafer 12 . If the substrate 10 does not include the reflector 13 unlike the present embodiment, the space occupied by the reflector 13 in the drawing is also filled with resin.

請再參照圖1、圖2、圖3以及圖5,下方模具30包括配置在基底(base)3上的空腔壓縮塊31和空腔固持塊36。基底3經配置以連接到升降機構(未繪示),以便在垂直方向上被升降機構驅動。空腔壓縮塊31被固定在基底3的上表面的中心區域,且空腔固持塊36被安裝在基底3上的彈性構件37以彈性方式支撐著。若基底3經操作而上移,則空腔壓縮塊31和空腔固持塊36會一同上移。然後,若空腔固持塊36因接觸到另一構件(在本實施例中為嵌入空腔塊40)而停止上移,則只有空腔壓縮塊31會伴隨著彈性構件37的壓縮而上移預定的高度。Referring again to FIGS. 1, 2, 3, and 5, the lower mold 30 includes a cavity compression block 31 and a cavity holding block 36 disposed on a base 3. The substrate 3 is configured to be coupled to a lifting mechanism (not shown) for being driven by the lifting mechanism in a vertical direction. The cavity compression block 31 is fixed to a central portion of the upper surface of the substrate 3, and the cavity holding block 36 is elastically supported by the elastic member 37 mounted on the substrate 3. If the substrate 3 is moved up by operation, the cavity compression block 31 and the cavity holding block 36 are moved up together. Then, if the cavity holding block 36 stops moving up due to contact with another member (in this embodiment, the embedded cavity block 40), only the cavity compressing block 31 moves up with the compression of the elastic member 37. The predetermined height.

依照本實施例,由於空腔壓縮塊31的外周邊總是低於空腔固持塊36,所以在下方模具30的上方形成一個由空腔壓縮塊31和空腔固持塊36所界定的凹面空間。According to the present embodiment, since the outer periphery of the cavity compression block 31 is always lower than the cavity holding block 36, a concave space defined by the cavity compression block 31 and the cavity holding block 36 is formed above the lower mold 30. .

同時,本實施例之封止材料形成裝置包括薄膜,特別是非離型膜50,其安裝在由空腔壓縮塊31和空腔固持塊36所形成的凹面空間中。薄膜50界定了一個容量可變化的樹脂裝載空間38,其可根據凹面空間的輪廓來容納熔化的樹脂。薄膜50能夠防止熔化的樹脂直接接觸下方模具30,且能夠防止熔化的樹脂滲漏到下方模具30下。Meanwhile, the sealing material forming device of the present embodiment includes a film, particularly a non-separating film 50, which is installed in a concave space formed by the cavity compression block 31 and the cavity holding block 36. The film 50 defines a variable-capacity resin loading space 38 that accommodates the molten resin according to the contour of the concave space. The film 50 can prevent the molten resin from directly contacting the lower mold 30, and can prevent the molten resin from leaking under the lower mold 30.

薄膜50是以真空方式(透過下方模具30的空腔壓縮塊31和空腔固持塊36之間的窄間隙施加真空)進行黏附,所以在壓縮過程中能夠防止樹脂部分滲漏出去的樹脂裝載空間38可藉由上述程序而形成。預定的量的固態或液態樹脂被均等地裝入到樹脂裝載空間38中。The film 50 is adhered in a vacuum manner (a vacuum is applied through a narrow gap between the cavity compression block 31 of the lower mold 30 and the cavity holding block 36), so that the resin loading space which can prevent the resin portion from leaking out during the compression process 38 can be formed by the above procedure. A predetermined amount of solid or liquid resin is equally loaded into the resin loading space 38.

當薄膜50覆蓋下方模具30的上端部分時,薄膜50被安裝在下方模具30上的真空元件(未繪示)以真空方式來黏附在下方模具30的上端部分上。與現有的離型膜不同的是,當形成封止材料時,薄膜50是黏附在樹脂上(如圖5所示),所以,即使當封止材料形成後,多餘的固態樹脂依然會牢固地粘在薄膜50上。因此,若薄膜50被分離,則多餘的固態樹脂也會連同薄膜50一起被分離。薄膜50可以是在能夠形成封止材料的溫度範圍(例如,從130℃至200℃的溫度範圍)內可使用的習知的耐熱薄膜,且薄膜50可由(例如)聚乙烯(polyethylene,PE)、聚丙烯(polypropylene,PP)、聚對酞酸乙二酯(polyethylene terephthalate,PET)等所製成,它們比習知的離型膜便宜。尤其是,聚對酞酸乙二酯(PET)薄膜已應用于一般工業、電氣電子業、封裝業、繪圖業、顯示器產業等各種領域,因此容易以低價獲得。When the film 50 covers the upper end portion of the lower mold 30, the film 50 is vacuum-bonded to the upper end portion of the lower mold 30 by a vacuum member (not shown) mounted on the lower mold 30. Unlike the existing release film, when the sealing material is formed, the film 50 is adhered to the resin (as shown in FIG. 5), so that even when the sealing material is formed, the excess solid resin is firmly fixed. Adhered to the film 50. Therefore, if the film 50 is separated, the excess solid resin is also separated together with the film 50. The film 50 may be a conventional heat-resistant film that can be used in a temperature range capable of forming a sealing material (for example, a temperature range from 130 ° C to 200 ° C), and the film 50 may be, for example, polyethylene (PE). Polypropylene (PP), polyethylene terephthalate (PET), etc., which are cheaper than conventional release films. In particular, polyethylene terephthalate (PET) film has been used in various fields such as general industrial, electrical and electronics, packaging, graphics, and display industries, and is therefore easily available at low prices.

同時,嵌入空腔塊40的至少一表面(當形成封止材料時此嵌入空腔塊40與樹脂接觸的表面)具有介面分離特性。為了提供介面分離特性,較佳的是將離型劑401(參見圖4)塗在嵌入空腔塊40與樹脂接觸的表面上。At the same time, at least one surface of the cavity block 40 (the surface in which the cavity block 40 is in contact with the resin when the sealing material is formed) has an interface separation property. In order to provide the interface separation property, it is preferred to apply a release agent 401 (see Fig. 4) on the surface of the cavity block 40 in contact with the resin.

下面將依次參照圖1、圖2、圖3以及圖5來進一步闡述使用封止材料形成裝置在基板上形成封止材料的過程。The process of forming a sealing material on a substrate using a sealing material forming device will be further explained below with reference to Figs. 1, 2, 3 and 5, respectively.

請參照圖1,先將基板10安裝在上方模具20上,然後將嵌入空腔塊40安裝在基板10上。此時,可將離型劑塗在嵌入空腔塊40的表面的至少一部分上。Referring to FIG. 1, the substrate 10 is first mounted on the upper mold 20, and then the embedded cavity block 40 is mounted on the substrate 10. At this time, a release agent may be applied to at least a portion of the surface embedded in the cavity block 40.

另外,耐熱薄膜50以真空方式被黏附在下方模具30的上端部分,而下方模具30因空腔壓縮塊31與空腔固持塊36之間存在高度差,所以具有凹面空間,從而形成樹脂裝載空間38。此時,樹脂裝載空間38位於正對嵌入空腔塊40的一側。較佳的是,薄膜50可耐受形成封止材料所需的溫度,且當封止材料形成後,薄膜50對多餘的固態樹脂的黏附力可大於嵌入空腔塊40對多餘的固態樹脂的表面黏附力。如上所述,為了使嵌入空腔塊40對樹脂的表面黏附力相對減小,可塗上離型劑。Further, the heat-resistant film 50 is adhered to the upper end portion of the lower mold 30 in a vacuum manner, and the lower mold 30 has a concave space due to the difference in height between the cavity compression block 31 and the cavity holding block 36, thereby forming a resin loading space. 38. At this time, the resin loading space 38 is located on the side facing the cavity block 40. Preferably, the film 50 can withstand the temperature required to form the sealing material, and when the sealing material is formed, the adhesion of the film 50 to the excess solid resin can be greater than the amount of excess solid resin embedded in the cavity block 40. Surface adhesion. As described above, in order to make the adhesion force of the embedded cavity block 40 to the surface of the resin relatively small, a release agent may be applied.

在基板10上配置嵌入空腔塊40的過程和形成樹脂裝載空間38的過程可逆序進行。或者這兩個過程也可同時進行。The process of arranging the cavity block 40 on the substrate 10 and the process of forming the resin loading space 38 can be reversed. Or both processes can be performed simultaneously.

在圖1所示之第一位置,下方模具30的所有元件與上方模具20的所有元件隔開。In the first position shown in Figure 1, all of the elements of the lower mold 30 are spaced from all of the elements of the upper mold 20.

請參照圖2與圖3,當裝有液體型或凝膠型樹脂的樹脂裝載空間38靠近嵌入空腔塊40時,嵌入空腔塊40的成型空腔41被樹脂裝載空間38所裝載的液體型或凝膠型樹脂所填充。樹脂經由樹脂入口42來填充成型空腔41,因此較佳的是,多個樹脂入口42可分別連接多個對應的成型空腔41連接與一個樹脂裝載空間38。Referring to FIGS. 2 and 3, when the resin loading space 38 containing the liquid or gel type resin is placed close to the cavity block 40, the molding cavity 41 embedded in the cavity block 40 is filled with the liquid loaded by the resin loading space 38. Filled with a type or gel type resin. The resin fills the molding cavity 41 via the resin inlet 42, and therefore, it is preferable that the plurality of resin inlets 42 may be connected to a plurality of corresponding molding cavities 41 to be connected to one resin loading space 38, respectively.

如圖2所示,若基底3在升降機構的操作下上移,則下方模具30的空腔固持塊36會先接觸到嵌入空腔塊40,且停止移動。如此一來,在被薄膜50覆蓋的下方模具30與正對下方模具30的嵌入空腔塊40之間,由薄膜50所界定的樹脂裝載空間38完全閉合。As shown in FIG. 2, if the substrate 3 is moved up by the operation of the lifting mechanism, the cavity holding block 36 of the lower mold 30 first contacts the embedded cavity block 40 and stops moving. As a result, between the lower mold 30 covered by the film 50 and the embedded cavity block 40 facing the lower mold 30, the resin loading space 38 defined by the film 50 is completely closed.

如圖3所示,若基底3在升降機構的操作下繼續上移,則空腔壓縮塊31會伴隨著彈性構件37的壓縮而繼續上移,從而對樹脂裝載空間38內的樹脂造成壓迫。這種壓迫導致樹脂裝載空間38越來越小。如圖4所示,若反光板13與嵌入空腔塊40相接觸之處的壩杆(dam bar)表面43進一步被壓迫,則可能會抑制樹脂轉移到空腔區域,且密封性能可進一步改善。如上所述,隨著樹脂裝載空間38越來越小,樹脂轉為直接被壓迫,且受到壓迫的樹脂經由嵌入空腔塊40所提供的樹脂入口42而被注射到成型空腔41中。As shown in FIG. 3, if the substrate 3 continues to move up under the operation of the elevating mechanism, the cavity compression block 31 continues to move up with the compression of the elastic member 37, thereby causing compression of the resin in the resin loading space 38. This compression causes the resin loading space 38 to become smaller and smaller. As shown in FIG. 4, if the dam bar surface 43 where the reflector 13 is in contact with the cavity block 40 is further pressed, the transfer of the resin to the cavity region may be inhibited, and the sealing performance may be further improved. . As described above, as the resin loading space 38 becomes smaller and smaller, the resin is directly pressed, and the pressed resin is injected into the molding cavity 41 via the resin inlet 42 provided by the cavity block 40.

另外,為了有效地清除上述過程中遺留下來的或產生的氣泡(孔隙(voids))且提高可成形性(formability),可形成真空通道,也就是通氣孔。此通氣孔可選擇性地沿著以下表面而形成:嵌入空腔塊40與反光板13的上表面相接觸的表面以及與空腔固持塊36的構成樹脂裝載空間38之外周邊的上表面相接觸的表面。Further, in order to effectively remove the bubbles (voids) left or generated in the above process and to improve the formability, a vacuum passage, that is, a vent hole may be formed. The vent hole is selectively formed along a surface in which the cavity block 40 is in contact with the upper surface of the light reflecting plate 13 and an upper surface of the periphery of the cavity holding block 36 constituting the resin loading space 38. The surface that is in contact.

再如圖3所示,受壓迫的液體型樹脂在預定時間後固化,於是具有透鏡形(形狀由嵌入空腔塊40之成型空腔41決定)的封止材料形成在基板10上。此時,應當移除的多餘的固態樹脂經由樹脂入口42而留在嵌入空腔塊40與薄膜50之間。Further, as shown in FIG. 3, the pressed liquid type resin is cured after a predetermined time, and then a sealing material having a lens shape (shaped by the molding cavity 41 embedded in the cavity block 40) is formed on the substrate 10. At this time, the excess solid resin that should be removed remains between the embedded cavity block 40 and the film 50 via the resin inlet 42.

請參照圖5,下方模具30下移以使得上方模具20與下方模具30相互分離。安裝在上方模具20上的基板10和安裝在基板10上的嵌入空腔塊40脫離下方模具30和安裝在下方模具30之上表面的薄膜50。此時,多餘的固態樹脂R’(已在成型空腔41中固化而形成封止材料的樹脂除外)牢固地黏附在薄膜50上,將與薄膜50一起脫離嵌入空腔塊40。如此一來,多餘的固態樹脂R’可從嵌入空腔塊40的表面和封止材料的表面上被移除乾淨。Referring to FIG. 5, the lower mold 30 is moved downward to separate the upper mold 20 from the lower mold 30. The substrate 10 mounted on the upper mold 20 and the embedded cavity block 40 mounted on the substrate 10 are separated from the lower mold 30 and the film 50 mounted on the upper surface of the lower mold 30. At this time, the excess solid resin R' (except for the resin which has been solidified in the molding cavity 41 to form the sealing material) is firmly adhered to the film 50, and will be detached from the film 50 together into the cavity block 40. As a result, the excess solid resin R' can be removed from the surface embedded in the cavity block 40 and the surface of the sealing material.

如上所述,本發明是由可牢固地黏附在固態樹脂上的具有較強黏附力的耐熱薄膜所製成,而不是由離型膜所製成。另外,一種具有較強的介面分離特性的材料(例如,離型劑)塗在嵌入空腔塊40的與樹脂相接觸的表面上,如此一來,當封止材料形成後,多餘的固態樹脂R’便可連同薄膜50一起從封止材料和嵌入空腔塊40上被移除乾淨。As described above, the present invention is made of a heat-resistant film having a strong adhesive force which can be firmly adhered to a solid resin, and is not made of a release film. In addition, a material having a strong interfacial separation property (for example, a release agent) is applied to the surface of the cavity block 40 that is in contact with the resin, so that when the sealing material is formed, the excess solid resin is formed. R' can be removed from the sealing material and the embedded cavity block 40 along with the film 50.

同時,可使用材料供應裝置(未繪示)來打包(in a bundle)拆除基板10和嵌入空腔塊40,使它們以打包方式脫離模具。在其他情形下,可先拆除嵌入空腔塊40,且同時將其分離,然後再分離已形成有封止材料的基板。At the same time, a material supply device (not shown) can be used to unpack the substrate 10 and embed the cavity block 40 in a bundle so that they are detached from the mold in a packaged manner. In other cases, the embedded cavity block 40 may be removed first and simultaneously separated, and then the substrate on which the sealing material has been formed may be separated.

圖6呈現為執行完圖5所示的過程後從模具和嵌入空腔塊上分離和移除的薄膜。請參照圖6,可理解的是,薄膜連同附著在此薄膜上的多餘的固態樹脂一起被移除。此時,還可以理解的是,用來填充樹脂入口或閘的一些多餘的固態樹脂也被分離,同時它們保留了樹脂入口或閘的形狀。Figure 6 presents a film that is separated and removed from the mold and the embedded cavity block after the process illustrated in Figure 5 is performed. Referring to Figure 6, it will be appreciated that the film is removed along with the excess solid resin attached to the film. At this time, it is also understood that some of the excess solid resin used to fill the resin inlet or gate is also separated while they retain the shape of the resin inlet or gate.

圖7與圖8是依照本發明之另一實施例的一種使用封止材料形成裝置來執行的封止材料形成方法的圖式。7 and 8 are views showing a method of forming a sealing material performed using a sealing material forming device in accordance with another embodiment of the present invention.

圖7與前述實施例之封止材料形成方法實質上相同,不同之處在於基板10是以相反方向安裝。Fig. 7 is substantially the same as the sealing material forming method of the foregoing embodiment, except that the substrate 10 is mounted in the opposite direction.

請參照圖7,可移動模具300位於上部以便配置上方模具,且固定模具200位於下部以便配置下方模具。基板10安裝在下方模具(即固定模具200)上,且嵌入空腔塊400被放置在基板10上。嵌入空腔塊400的一個表面上提供成型空腔410,其中成型空腔410開口朝著安裝在下方模具(即固定模具200)上的基板10。樹脂裝載空間380以及連接樹脂裝載空間380與成型空腔的樹脂入口420形成在嵌入空腔塊400的正對可移動模具300的另一表面上。薄膜500位於可移動模具300的下方或嵌入空腔塊400的上方,以位於樹脂裝載空間380的下面。與前述實施例相似的是,薄膜500圍繞著樹脂裝載空間380。可移動模具300先下移,使得可移動模具300的空腔固持塊360接觸到嵌入空腔塊400,薄膜500介於兩者之間。此外,空腔壓縮塊310伴隨著彈性構件370的壓縮而繼續下移,從而對樹脂裝載空間380中的樹脂造成壓迫。在巨大的壓力下,樹脂從樹脂裝載空間380經由樹脂入口而被注射到成型空腔內。成型空腔中的液體型樹脂發生固化,從而在成型空腔內形成稠密且在厚度尺寸上(thick-dimensionally)穩定的封止材料。儘管未進行真空黏附,但薄膜500可保留在下方的固定模具200(即下方模具)上,因此可以不包括用來對薄膜500進行真空黏附的真空元件。Referring to FIG. 7, the movable mold 300 is located at the upper portion to configure the upper mold, and the fixed mold 200 is located at the lower portion to configure the lower mold. The substrate 10 is mounted on the lower mold (i.e., the fixed mold 200), and the embedded cavity block 400 is placed on the substrate 10. A molding cavity 410 is provided on one surface of the embedded cavity block 400, wherein the molding cavity 410 opens toward the substrate 10 mounted on the lower mold (i.e., the stationary mold 200). The resin loading space 380 and the resin inlet 420 connecting the resin loading space 380 and the molding cavity are formed on the other surface of the facing movable mold 300 that is embedded in the cavity block 400. The film 500 is located below the movable mold 300 or embedded above the cavity block 400 to be positioned below the resin loading space 380. Similar to the foregoing embodiment, the film 500 surrounds the resin loading space 380. The movable mold 300 is first moved down such that the cavity holding block 360 of the movable mold 300 contacts the embedded cavity block 400 with the film 500 interposed therebetween. Further, the cavity compression block 310 continues to move down accompanying the compression of the elastic member 370, thereby causing compression of the resin in the resin loading space 380. Under great pressure, resin is injected into the molding cavity from the resin loading space 380 via the resin inlet. The liquid type resin in the molding cavity is solidified to form a dense and thick-dimensionally stable sealing material in the molding cavity. Although vacuum adhesion is not performed, the film 500 may remain on the lower fixed mold 200 (i.e., the lower mold), and thus may not include a vacuum member for vacuum bonding the film 500.

如圖8所示,封止材料形成後,若薄膜500脫離嵌入空腔塊400,則封止材料形成後殘留在嵌入空腔塊400之表面上的多餘的固態樹脂R’也脫離嵌入空腔塊400的表面,同時多餘的固態樹脂R’仍然黏附在薄膜500上。與前述實施例相似的是,離型劑可塗在嵌入空腔塊400的表面上。圖8中未繪示上方的可移動模具。As shown in FIG. 8, after the sealing material is formed, if the film 500 is detached from the cavity block 400, the excess solid resin R' remaining on the surface of the cavity block 400 after the sealing material is formed is also separated from the embedded cavity. The surface of the block 400 while the excess solid resin R' remains adhered to the film 500. Similar to the previous embodiment, a release agent can be applied to the surface of the cavity block 400. The movable mold above is not shown in FIG.

3...基底3. . . Base

10...基板10. . . Substrate

11...引線框11. . . Lead frame

12...發光二極體晶片(或半導體晶片)12. . . Light-emitting diode chip (or semiconductor wafer)

13...反光板13. . . Reflector

20...上方模具20. . . Upper mold

30...下方模具30. . . Lower mold

31、310...空腔壓縮塊31, 310. . . Cavity compression block

36、360...空腔固持塊36, 360. . . Cavity holding block

37、370...彈性構件37,370. . . Elastic member

38、380...樹脂裝載空間38,380. . . Resin loading space

40、400...嵌入空腔塊40, 400. . . Embedded cavity block

41、410...成型空腔41, 410. . . Molded cavity

42、420...樹脂入口42,420. . . Resin inlet

43...壩欄杆表面43. . . Dam railing surface

50、500...薄膜50, 500. . . film

200‧‧‧固定模具200‧‧‧Fixed mould

300‧‧‧可移動模具300‧‧‧ movable mold

401‧‧‧離型劑401‧‧‧ Release agent

R‧‧‧樹脂R‧‧‧Resin

R’‧‧‧多餘的固態樹脂R’‧‧‧Excess solid resin

圖1至圖3是分別從第一位置、第二位置和第三位置取得的依照發明之一實施例的一種封止材料形成裝置的橫剖面圖。1 to 3 are cross-sectional views of a sealing material forming apparatus according to an embodiment of the invention taken from a first position, a second position, and a third position, respectively.

圖4是用來展示圖3所示的依照本發明之一實施例的封止材料形成裝置的一部分的放大橫剖面圖。Figure 4 is an enlarged cross-sectional view showing a portion of the sealing material forming device of Figure 3 in accordance with an embodiment of the present invention.

圖5是用來展示依照本發明之一實施例的形成封止材料且然後將多餘的固態樹脂連同薄膜一起分離並移除的過程的橫剖面圖。Figure 5 is a cross-sectional view showing a process of forming a sealing material and then separating and removing excess solid resin together with the film in accordance with an embodiment of the present invention.

圖6是在圖5所示之過程中連同多餘的固態樹脂一起被分離和移除的薄膜的照片。Figure 6 is a photograph of a film which is separated and removed together with the excess solid resin in the process shown in Figure 5.

圖7與圖8是依照本發明之另一實施例的一種封止材料形成方法的圖式。7 and 8 are views of a method of forming a sealing material in accordance with another embodiment of the present invention.

3...基底3. . . Base

10...基板10. . . Substrate

11...引線框11. . . Lead frame

12...發光二極體晶片(或半導體晶片)12. . . Light-emitting diode chip (or semiconductor wafer)

13...反光板13. . . Reflector

20...上方模具20. . . Upper mold

30...下方模具30. . . Lower mold

31...空腔壓縮塊31. . . Cavity compression block

36...空腔固持塊36. . . Cavity holding block

37...彈性構件37. . . Elastic member

38...樹脂裝載空間38. . . Resin loading space

40...嵌入空腔塊40. . . Embedded cavity block

41...成型空腔41. . . Molded cavity

42...樹脂入口42. . . Resin inlet

50...薄膜50. . . film

Claims (5)

一種封止材料形成方法,包括:嵌入空腔塊配置步驟,將嵌入空腔塊配置在基板上,所述嵌入空腔塊具有樹脂入口和成型空腔;樹脂裝載空間形成步驟,用來形成樹脂裝載空間,其正對所述嵌入空腔塊的一側被一層薄膜圍繞著;將樹脂裝入所述樹脂裝載空間的步驟;封止材料形成步驟,使所述樹脂裝載空間的底部靠近所述嵌入空腔塊,從而使被裝入所述樹脂裝載空間內的所述樹脂經由所述樹脂入口來填充所述成型空腔;以及薄膜分離步驟,當所述樹脂固化後,在殘留於所述嵌入空腔塊之表面的多餘的固態樹脂黏附在所述薄膜上的狀態下,使所述薄膜從所述嵌入空腔塊上分離並將其移除。 A sealing material forming method comprising: embedding a cavity block arranging step, disposing an embedded cavity block on a substrate, the embedded cavity block having a resin inlet and a molding cavity; and a resin loading space forming step for forming a resin a loading space that is surrounded by a film on a side of the embedded cavity block; a step of loading a resin into the resin loading space; and a sealing material forming step to bring the bottom of the resin loading space closer to the Embedding a cavity block such that the resin loaded into the resin loading space fills the molding cavity via the resin inlet; and a film separation step, after the resin is cured, remaining in the The excess solid resin embedded in the surface of the cavity block is adhered to the film, and the film is separated from the embedded cavity block and removed. 如申請專利範圍第1項所述之封止材料形成方法,其中,在所述嵌入空腔塊配置步驟中,將離型劑塗在所述嵌入空腔塊的正對所述樹脂裝載空間的表面上。 The method of forming a sealing material according to claim 1, wherein in the step of disposing the cavity block, a release agent is applied to the resin loading space of the embedded cavity block. On the surface. 如申請專利範圍第1項或第2項所述之封止材料形成方法,其中所述嵌入空腔塊配置步驟包括:將所述基板安裝在第一模具上;以及將所述嵌入空腔塊安裝在所述基板上。 The method of forming a sealing material according to claim 1 or 2, wherein the step of embedding the cavity block comprises: mounting the substrate on a first mold; and embedding the cavity block Mounted on the substrate. 如申請專利範圍第3項所述之封止材料形成方法,其中在所述樹脂裝載空間形成步驟中,正對所述第一模具且具有凹面空間的第二模具被所述薄膜覆蓋而形成所述樹脂裝載空間,所述第二模具包括空腔壓縮塊以及圍繞 著所述空腔壓縮塊而配置的空腔固持塊,所述凹面空間是由所述空腔固持塊與所述空腔壓縮塊之間的高度差所形成。 The method of forming a sealing material according to claim 3, wherein in the resin loading space forming step, a second mold facing the first mold and having a concave space is covered by the film to form a a resin loading space, the second mold comprising a cavity compression block and surrounding The cavity holding block is configured by the cavity compression block, and the concave space is formed by a height difference between the cavity holding block and the cavity compression block. 如申請專利範圍第4項所述之封止材料形成方法,其中在所述封止材料形成步驟中,所述空腔固持塊上移或下移,直到所述空腔固持塊接觸到所述嵌入空腔塊,然後在所述空腔固持塊停止移動的狀態下,所述空腔壓縮塊繼續上移或下移,以便將所述樹脂裝載空間內的所述樹脂注射到所述成型空腔中,以及其中,在所述薄膜分離步驟中,所述第二模具脫離所述嵌入空腔塊,使得所述薄膜以及黏附在所述薄膜上的所述多餘的固態樹脂脫離所述嵌入空腔塊。The method of forming a sealing material according to claim 4, wherein in the sealing material forming step, the cavity holding block is moved up or down until the cavity holding block contacts the Embedding the cavity block, and then, in a state where the cavity holding block stops moving, the cavity compression block continues to move up or down to inject the resin in the resin loading space into the molding space In the cavity, and wherein, in the film separating step, the second mold is detached from the embedded cavity block such that the film and the excess solid resin adhered to the film are detached from the embedded cavity Cavity block.
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