TWI458102B - 具有多浮閘的溝渠ｍｏｓ阻障肖特基體 - Google Patents
具有多浮閘的溝渠ｍｏｓ阻障肖特基體 Download PDFInfo
- Publication number
- TWI458102B TWI458102B TW101103247A TW101103247A TWI458102B TW I458102 B TWI458102 B TW I458102B TW 101103247 A TW101103247 A TW 101103247A TW 101103247 A TW101103247 A TW 101103247A TW I458102 B TWI458102 B TW I458102B
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- epitaxial layer
- substrate
- conductive
- floating gates
- Prior art date
Links
- 230000004888 barrier function Effects 0.000 title description 6
- 239000000758 substrate Substances 0.000 claims description 26
- 229910052751 metal Inorganic materials 0.000 claims description 25
- 239000002184 metal Substances 0.000 claims description 25
- 239000004065 semiconductor Substances 0.000 claims description 22
- 238000000034 method Methods 0.000 claims description 17
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical group [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 10
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 9
- 239000004020 conductor Substances 0.000 claims description 7
- 238000005530 etching Methods 0.000 claims description 7
- 229910052732 germanium Inorganic materials 0.000 claims description 7
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 6
- 229920005591 polysilicon Polymers 0.000 claims description 6
- 229910052759 nickel Inorganic materials 0.000 claims description 5
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 238000000151 deposition Methods 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 claims description 2
- 239000003989 dielectric material Substances 0.000 claims 2
- SCCCLDWUZODEKG-UHFFFAOYSA-N germanide Chemical compound [GeH3-] SCCCLDWUZODEKG-UHFFFAOYSA-N 0.000 claims 2
- 230000005684 electric field Effects 0.000 description 13
- 230000000903 blocking effect Effects 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 230000002441 reversible effect Effects 0.000 description 7
- 239000002019 doping agent Substances 0.000 description 5
- 238000009413 insulation Methods 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000015556 catabolic process Effects 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 239000011810 insulating material Substances 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- 230000002829 reductive effect Effects 0.000 description 3
- 238000004088 simulation Methods 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 239000000969 carrier Substances 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 229910000449 hafnium oxide Inorganic materials 0.000 description 2
- WIHZLLGSGQNAGK-UHFFFAOYSA-N hafnium(4+);oxygen(2-) Chemical compound [O-2].[O-2].[Hf+4] WIHZLLGSGQNAGK-UHFFFAOYSA-N 0.000 description 2
- 238000001465 metallisation Methods 0.000 description 2
- 230000036961 partial effect Effects 0.000 description 2
- 241000162682 Heterogen Species 0.000 description 1
- 206010067482 No adverse event Diseases 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 229910001507 metal halide Inorganic materials 0.000 description 1
- 150000005309 metal halides Chemical class 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 210000004508 polar body Anatomy 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/60—Schottky-barrier diodes
- H10D8/605—Schottky-barrier diodes of the trench conductor-insulator-semiconductor barrier type, e.g. trench MOS barrier Schottky rectifiers [TMBS]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/68—Floating-gate IGFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/111—Field plates
- H10D64/117—Recessed field plates, e.g. trench field plates or buried field plates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/64—Electrodes comprising a Schottky barrier to a semiconductor
Landscapes
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/021,078 US8461646B2 (en) | 2011-02-04 | 2011-02-04 | Trench MOS barrier schottky (TMBS) having multiple floating gates |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201251032A TW201251032A (en) | 2012-12-16 |
| TWI458102B true TWI458102B (zh) | 2014-10-21 |
Family
ID=46600075
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW101103247A TWI458102B (zh) | 2011-02-04 | 2012-02-01 | 具有多浮閘的溝渠ｍｏｓ阻障肖特基體 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8461646B2 (enExample) |
| EP (1) | EP2671254B1 (enExample) |
| JP (1) | JP6352635B2 (enExample) |
| KR (1) | KR101857022B1 (enExample) |
| CN (1) | CN103403870A (enExample) |
| TW (1) | TWI458102B (enExample) |
| WO (1) | WO2012106572A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102011087596A1 (de) * | 2011-12-01 | 2013-06-06 | Robert Bosch Gmbh | Super Trench Schottky Barrier Schottkydiode |
| CN105957884A (zh) * | 2016-06-24 | 2016-09-21 | 上海格瑞宝电子有限公司 | 一种分栅栅极沟槽结构和沟槽肖特基二极管及其制备方法 |
| US10770599B2 (en) | 2016-09-03 | 2020-09-08 | Champion Microelectronic Corp. | Deep trench MOS barrier junction all around rectifier and MOSFET |
| CN108074986A (zh) * | 2016-11-13 | 2018-05-25 | 朱江 | 一种电荷补偿肖特基半导体装置 |
| TWI703736B (zh) * | 2018-10-11 | 2020-09-01 | 朋程科技股份有限公司 | 車用整流裝置、整流器、發電裝置以及動力系統 |
| US10797101B2 (en) * | 2018-10-15 | 2020-10-06 | Semiconductor Components Industries, Llc | Time delay integration image sensors with non-destructive readout capabilities |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5455187A (en) * | 1988-11-21 | 1995-10-03 | Micro Technology Partners | Method of making a semiconductor device with a metallic layer coupled to a lower region of a substrate and metallic layer coupled to a lower region of a semiconductor device |
| US7061066B2 (en) * | 2001-10-17 | 2006-06-13 | Fairchild Semiconductor Corporation | Schottky diode using charge balance structure |
| US7132712B2 (en) * | 2002-11-05 | 2006-11-07 | Fairchild Semiconductor Corporation | Trench structure having one or more diodes embedded therein adjacent a PN junction |
| US7713822B2 (en) * | 2006-03-24 | 2010-05-11 | Fairchild Semiconductor Corporation | Method of forming high density trench FET with integrated Schottky diode |
Family Cites Families (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2590284B2 (ja) | 1990-02-28 | 1997-03-12 | 株式会社日立製作所 | 半導体装置及びその製造方法 |
| US6621121B2 (en) | 1998-10-26 | 2003-09-16 | Silicon Semiconductor Corporation | Vertical MOSFETs having trench-based gate electrodes within deeper trench-based source electrodes |
| US6252288B1 (en) | 1999-01-19 | 2001-06-26 | Rockwell Science Center, Llc | High power trench-based rectifier with improved reverse breakdown characteristic |
| US6351018B1 (en) * | 1999-02-26 | 2002-02-26 | Fairchild Semiconductor Corporation | Monolithically integrated trench MOSFET and Schottky diode |
| US7186609B2 (en) | 1999-12-30 | 2007-03-06 | Siliconix Incorporated | Method of fabricating trench junction barrier rectifier |
| JP4528460B2 (ja) * | 2000-06-30 | 2010-08-18 | 株式会社東芝 | 半導体素子 |
| US6677641B2 (en) * | 2001-10-17 | 2004-01-13 | Fairchild Semiconductor Corporation | Semiconductor structure with improved smaller forward voltage loss and higher blocking capability |
| US6846729B2 (en) | 2001-10-01 | 2005-01-25 | International Rectifier Corporation | Process for counter doping N-type silicon in Schottky device Ti silicide barrier |
| US6882573B2 (en) | 2002-08-13 | 2005-04-19 | General Semiconductor, Inc. | DMOS device with a programmable threshold voltage |
| JP4099029B2 (ja) * | 2002-10-16 | 2008-06-11 | 株式会社豊田中央研究所 | トレンチゲート型半導体装置 |
| FR2850791B1 (fr) * | 2003-01-30 | 2006-01-20 | St Microelectronics Sa | Composant unipolaire vertical |
| US7638841B2 (en) * | 2003-05-20 | 2009-12-29 | Fairchild Semiconductor Corporation | Power semiconductor devices and methods of manufacture |
| US6998694B2 (en) | 2003-08-05 | 2006-02-14 | Shye-Lin Wu | High switching speed two mask Schottky diode with high field breakdown |
| US20050199918A1 (en) | 2004-03-15 | 2005-09-15 | Daniel Calafut | Optimized trench power MOSFET with integrated schottky diode |
| US7268395B2 (en) * | 2004-06-04 | 2007-09-11 | International Rectifier Corporation | Deep trench super switch device |
| JP2006237066A (ja) * | 2005-02-22 | 2006-09-07 | Toshiba Corp | 半導体装置 |
| AT504289A2 (de) | 2005-05-26 | 2008-04-15 | Fairchild Semiconductor | Trench-gate-feldeffekttransistoren und verfahren zum bilden derselben |
| KR100881015B1 (ko) * | 2006-11-30 | 2009-01-30 | 동부일렉트로닉스 주식회사 | 반도체 소자 및 그 제조방법 |
| US7960997B2 (en) | 2007-08-08 | 2011-06-14 | Advanced Analogic Technologies, Inc. | Cascode current sensor for discrete power semiconductor devices |
| US7807576B2 (en) * | 2008-06-20 | 2010-10-05 | Fairchild Semiconductor Corporation | Structure and method for forming a thick bottom dielectric (TBD) for trench-gate devices |
| US7929321B2 (en) | 2008-08-22 | 2011-04-19 | Force-Mos Technology Corp | Depletion mode trench MOSFET for improved efficiency of DC/DC converter applications |
| JP5195357B2 (ja) * | 2008-12-01 | 2013-05-08 | トヨタ自動車株式会社 | 半導体装置 |
| US8148749B2 (en) * | 2009-02-19 | 2012-04-03 | Fairchild Semiconductor Corporation | Trench-shielded semiconductor device |
| US8653589B2 (en) * | 2009-04-15 | 2014-02-18 | Force Mos Technology Co., Ltd. | Low Qgd trench MOSFET integrated with schottky rectifier |
| JP5525940B2 (ja) * | 2009-07-21 | 2014-06-18 | ローム株式会社 | 半導体装置および半導体装置の製造方法 |
| US7952141B2 (en) * | 2009-07-24 | 2011-05-31 | Fairchild Semiconductor Corporation | Shield contacts in a shielded gate MOSFET |
| US7989887B2 (en) * | 2009-11-20 | 2011-08-02 | Force Mos Technology Co., Ltd. | Trench MOSFET with trenched floating gates as termination |
-
2011
- 2011-02-04 US US13/021,078 patent/US8461646B2/en active Active
-
2012
- 2012-02-01 TW TW101103247A patent/TWI458102B/zh active
- 2012-02-03 CN CN2012800076724A patent/CN103403870A/zh active Pending
- 2012-02-03 JP JP2013552664A patent/JP6352635B2/ja active Active
- 2012-02-03 WO PCT/US2012/023724 patent/WO2012106572A1/en not_active Ceased
- 2012-02-03 EP EP12741674.1A patent/EP2671254B1/en active Active
- 2012-02-03 KR KR1020137023370A patent/KR101857022B1/ko active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5455187A (en) * | 1988-11-21 | 1995-10-03 | Micro Technology Partners | Method of making a semiconductor device with a metallic layer coupled to a lower region of a substrate and metallic layer coupled to a lower region of a semiconductor device |
| US7061066B2 (en) * | 2001-10-17 | 2006-06-13 | Fairchild Semiconductor Corporation | Schottky diode using charge balance structure |
| US7132712B2 (en) * | 2002-11-05 | 2006-11-07 | Fairchild Semiconductor Corporation | Trench structure having one or more diodes embedded therein adjacent a PN junction |
| US7713822B2 (en) * | 2006-03-24 | 2010-05-11 | Fairchild Semiconductor Corporation | Method of forming high density trench FET with integrated Schottky diode |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2012106572A1 (en) | 2012-08-09 |
| JP6352635B2 (ja) | 2018-07-04 |
| US8461646B2 (en) | 2013-06-11 |
| EP2671254A1 (en) | 2013-12-11 |
| US20120199902A1 (en) | 2012-08-09 |
| KR101857022B1 (ko) | 2018-06-20 |
| EP2671254B1 (en) | 2016-04-20 |
| JP2014508407A (ja) | 2014-04-03 |
| EP2671254A4 (en) | 2014-05-14 |
| CN103403870A (zh) | 2013-11-20 |
| TW201251032A (en) | 2012-12-16 |
| KR20140057475A (ko) | 2014-05-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent |