TWI415703B - 雷射加工裝置及基板位置檢測方法 - Google Patents
雷射加工裝置及基板位置檢測方法 Download PDFInfo
- Publication number
- TWI415703B TWI415703B TW099143916A TW99143916A TWI415703B TW I415703 B TWI415703 B TW I415703B TW 099143916 A TW099143916 A TW 099143916A TW 99143916 A TW99143916 A TW 99143916A TW I415703 B TWI415703 B TW I415703B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- unit
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- processing
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- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/083—Devices involving movement of the workpiece in at least one axial direction
- B23K26/0853—Devices involving movement of the workpiece in at least in two axial directions, e.g. in a plane
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
- B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/082—Scanning systems, i.e. devices involving movement of the laser beam relative to the laser head
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Laser Beam Processing (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2010/064948 WO2012029142A1 (ja) | 2010-09-01 | 2010-09-01 | レーザ加工装置および基板位置検出方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201210725A TW201210725A (en) | 2012-03-16 |
TWI415703B true TWI415703B (zh) | 2013-11-21 |
Family
ID=45772278
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW099143916A TWI415703B (zh) | 2010-09-01 | 2010-12-15 | 雷射加工裝置及基板位置檢測方法 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP5383920B2 (ja) |
KR (1) | KR101435352B1 (ja) |
CN (1) | CN103079746A (ja) |
TW (1) | TWI415703B (ja) |
WO (1) | WO2012029142A1 (ja) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2969373A4 (en) * | 2013-03-13 | 2016-11-16 | Applied Materials Inc | LASER DISPLAY PLATFORM FOR SOLAR CELLS |
JP6174906B2 (ja) * | 2013-05-23 | 2017-08-02 | 中村留精密工業株式会社 | 機械の自己診断及び機械精度の補正方法 |
DE102013217126B4 (de) | 2013-08-28 | 2015-09-03 | Trumpf Laser- Und Systemtechnik Gmbh | Verfahren zum Feststellen von Abweichungen einer Ist-Lage eines Laserbearbeitungskopfes von einer Soll-Lage, Laserbearbeitungsmaschine und Computerprogrammprodukt |
CN103528513B (zh) * | 2013-09-30 | 2016-08-17 | 上海大学 | Oled玻璃基板对准方法及装置 |
CN103852801A (zh) * | 2014-01-10 | 2014-06-11 | 凯迈(洛阳)电子有限公司 | 一种红外枪在位检测装置 |
CN104439726B (zh) * | 2014-11-19 | 2017-01-25 | 苏州德龙激光股份有限公司 | 激光实时纠偏装置及其纠偏方法 |
CN107003118B (zh) * | 2014-12-02 | 2019-09-24 | 三菱电机株式会社 | 位移传感器、位移检测装置及位移检测方法 |
CN104708158A (zh) * | 2015-02-13 | 2015-06-17 | 佛山市中科源自动化设备有限公司 | 一种电路板自动焊接方法 |
JP2017113788A (ja) * | 2015-12-24 | 2017-06-29 | 株式会社リコー | 光加工装置 |
TWI641933B (zh) * | 2016-01-15 | 2018-11-21 | 施教競 | Processing method of processing machine |
JP6594545B2 (ja) * | 2016-07-14 | 2019-10-23 | 三菱電機株式会社 | 基板計測装置およびレーザ加工システム |
JP6919622B2 (ja) * | 2018-04-26 | 2021-08-18 | オムロン株式会社 | 制御システム、制御方法、および制御プログラム |
JP7084227B2 (ja) * | 2018-06-22 | 2022-06-14 | 株式会社Screenホールディングス | マーク位置検出装置、描画装置およびマーク位置検出方法 |
WO2020090075A1 (ja) * | 2018-10-31 | 2020-05-07 | 株式会社ニコン | 加工システム、及び、加工方法 |
US20220176493A1 (en) * | 2019-03-20 | 2022-06-09 | Bobst Mex Sa | Characterization method and system for a laser processing machine with a moving sheet or web |
JP7344047B2 (ja) * | 2019-08-22 | 2023-09-13 | 株式会社ジェーイーエル | 基板の位置合わせ方法 |
CN113059516A (zh) * | 2021-04-30 | 2021-07-02 | 湖州铭沅科技合伙企业(有限合伙) | 一种可旋转真空吸气移动工作平台装置 |
CN113298076B (zh) * | 2021-06-18 | 2022-08-26 | 蓝思智能机器人(长沙)有限公司 | 平面加工设备的校正数据采集方法、装置、设备及介质 |
CN113532316B (zh) * | 2021-07-05 | 2023-01-20 | 深圳市先地图像科技有限公司 | 一种能同时检测多块pcb板形位偏差的装置及检测方法 |
TWI789068B (zh) * | 2021-10-22 | 2023-01-01 | 健鼎科技股份有限公司 | 電路板的漲縮值的計算方法及多層電路板的孔洞成形方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007017763A (ja) * | 2005-07-08 | 2007-01-25 | Fujifilm Holdings Corp | 画像位置計測装置及び露光装置 |
JP2010085210A (ja) * | 2008-09-30 | 2010-04-15 | Toray Ind Inc | 欠陥検査装置 |
TWI323683B (ja) * | 2004-01-16 | 2010-04-21 | Hitachi Via Mechanics Ltd | |
JP2010162559A (ja) * | 2009-01-13 | 2010-07-29 | Mitsubishi Electric Corp | レーザ加工方法および加工装置並びに被加工物 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5593877A (en) * | 1993-03-11 | 1997-01-14 | The Rockefeller University | Nucleic acid and recombinant production of vespid venom hyaluronidase |
JPH10323783A (ja) * | 1997-05-26 | 1998-12-08 | Japan Tobacco Inc | 帯状材の開孔装置 |
JP3855684B2 (ja) * | 2001-06-05 | 2006-12-13 | 松下電器産業株式会社 | レーザ加工装置およびレーザ加工方法 |
CN201076969Y (zh) * | 2007-09-28 | 2008-06-25 | 北京工业大学 | 紫外激光微加工精确定位系统 |
JP4951036B2 (ja) * | 2009-07-14 | 2012-06-13 | 株式会社ブイ・テクノロジー | 露光装置 |
-
2010
- 2010-09-01 WO PCT/JP2010/064948 patent/WO2012029142A1/ja active Application Filing
- 2010-09-01 CN CN2010800687983A patent/CN103079746A/zh active Pending
- 2010-09-01 KR KR1020137007152A patent/KR101435352B1/ko active IP Right Grant
- 2010-09-01 JP JP2012531613A patent/JP5383920B2/ja active Active
- 2010-12-15 TW TW099143916A patent/TWI415703B/zh not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI323683B (ja) * | 2004-01-16 | 2010-04-21 | Hitachi Via Mechanics Ltd | |
JP2007017763A (ja) * | 2005-07-08 | 2007-01-25 | Fujifilm Holdings Corp | 画像位置計測装置及び露光装置 |
JP2010085210A (ja) * | 2008-09-30 | 2010-04-15 | Toray Ind Inc | 欠陥検査装置 |
JP2010162559A (ja) * | 2009-01-13 | 2010-07-29 | Mitsubishi Electric Corp | レーザ加工方法および加工装置並びに被加工物 |
Also Published As
Publication number | Publication date |
---|---|
KR101435352B1 (ko) | 2014-08-28 |
KR20130042035A (ko) | 2013-04-25 |
WO2012029142A1 (ja) | 2012-03-08 |
JP5383920B2 (ja) | 2014-01-08 |
JPWO2012029142A1 (ja) | 2013-10-28 |
TW201210725A (en) | 2012-03-16 |
CN103079746A (zh) | 2013-05-01 |
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MM4A | Annulment or lapse of patent due to non-payment of fees |