TWI413773B - 測試分選機用開放裝置 - Google Patents

測試分選機用開放裝置 Download PDF

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Publication number
TWI413773B
TWI413773B TW099138377A TW99138377A TWI413773B TW I413773 B TWI413773 B TW I413773B TW 099138377 A TW099138377 A TW 099138377A TW 99138377 A TW99138377 A TW 99138377A TW I413773 B TWI413773 B TW I413773B
Authority
TW
Taiwan
Prior art keywords
plate
lifting
opening
open
lifting module
Prior art date
Application number
TW099138377A
Other languages
English (en)
Chinese (zh)
Other versions
TW201118380A (en
Inventor
Yun-Sung Na
Tae-Hung Ku
Jung-Woo Hwang
Original Assignee
Tech Wing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tech Wing Co Ltd filed Critical Tech Wing Co Ltd
Publication of TW201118380A publication Critical patent/TW201118380A/zh
Application granted granted Critical
Publication of TWI413773B publication Critical patent/TWI413773B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Manipulator (AREA)
TW099138377A 2009-11-17 2010-11-08 測試分選機用開放裝置 TWI413773B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR20090110630 2009-11-17

Publications (2)

Publication Number Publication Date
TW201118380A TW201118380A (en) 2011-06-01
TWI413773B true TWI413773B (zh) 2013-11-01

Family

ID=43994833

Family Applications (1)

Application Number Title Priority Date Filing Date
TW099138377A TWI413773B (zh) 2009-11-17 2010-11-08 測試分選機用開放裝置

Country Status (3)

Country Link
KR (1) KR101505955B1 (ko)
CN (1) CN102059222B (ko)
TW (1) TWI413773B (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI617820B (zh) * 2015-12-29 2018-03-11 泰克元股份有限公司 用於測試半導體元件的分選機

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101664220B1 (ko) * 2011-11-29 2016-10-11 (주)테크윙 테스트핸들러 및 그 작동방법
KR102327772B1 (ko) * 2015-09-08 2021-11-19 (주)테크윙 반도체소자 테스트용 핸들러의 개방기
KR102637464B1 (ko) * 2016-11-17 2024-02-16 세메스 주식회사 인서트 조립체들의 래치들을 개방하기 위한 장치
KR102289103B1 (ko) * 2017-11-21 2021-08-13 (주)테크윙 전자부품 핸들러용 개방장치

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001053119A (ja) * 1999-08-09 2001-02-23 Tokyo Electron Ltd プローブ装置及びヘッドプレート開閉軽減機構
US6547571B2 (en) * 2001-06-21 2003-04-15 Maxim Integrated Products, Inc. Low cost, high performance flexible tester handler docking interface
TW200737387A (en) * 2006-02-10 2007-10-01 Tech Wing Co Ltd Test handler
KR20090085454A (ko) * 2008-02-04 2009-08-07 에버테크노 주식회사 에스에스디(ｓｓｄ) 테스트 핸들러의 로딩 및 언로딩장치

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200173203Y1 (ko) 1997-08-04 2000-04-01 옥순봉 인쇄회로기판 앗세이 검사용 수동식 지그
CN2476373Y (zh) * 2001-04-05 2002-02-13 霖城机械股份有限公司 轨道式开模装置
US6586925B2 (en) * 2001-04-09 2003-07-01 St Assembly Test Services Ltd. Method and apparatus for establishing quick and reliable connection between a semiconductor device handler plate and a semiconductor device test head plate
KR100395925B1 (ko) * 2001-08-01 2003-08-27 삼성전자주식회사 테스트 핸들러의 반도체 디바이스 로딩장치
CN2899976Y (zh) * 2006-05-15 2007-05-16 常州市天宁天达电子设备有限公司 薄膜电容器测试分选机的电刷升降装置
KR100813235B1 (ko) 2007-04-02 2008-03-13 (주)테크윙 테스트핸들러
KR100906614B1 (ko) * 2007-06-15 2009-07-10 (주)테크윙 테스트핸들러
KR100934032B1 (ko) * 2008-01-11 2009-12-28 (주)테크윙 테스트핸들러용 개방기

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001053119A (ja) * 1999-08-09 2001-02-23 Tokyo Electron Ltd プローブ装置及びヘッドプレート開閉軽減機構
US6547571B2 (en) * 2001-06-21 2003-04-15 Maxim Integrated Products, Inc. Low cost, high performance flexible tester handler docking interface
TW200737387A (en) * 2006-02-10 2007-10-01 Tech Wing Co Ltd Test handler
KR20090085454A (ko) * 2008-02-04 2009-08-07 에버테크노 주식회사 에스에스디(ｓｓｄ) 테스트 핸들러의 로딩 및 언로딩장치

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI617820B (zh) * 2015-12-29 2018-03-11 泰克元股份有限公司 用於測試半導體元件的分選機

Also Published As

Publication number Publication date
KR20110055361A (ko) 2011-05-25
CN102059222A (zh) 2011-05-18
CN102059222B (zh) 2014-06-25
KR101505955B1 (ko) 2015-03-27
TW201118380A (en) 2011-06-01

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