TW201118380A - Opening apparatus for test handler - Google Patents

Opening apparatus for test handler Download PDF

Info

Publication number
TW201118380A
TW201118380A TW099138377A TW99138377A TW201118380A TW 201118380 A TW201118380 A TW 201118380A TW 099138377 A TW099138377 A TW 099138377A TW 99138377 A TW99138377 A TW 99138377A TW 201118380 A TW201118380 A TW 201118380A
Authority
TW
Taiwan
Prior art keywords
plate
open
lifting
operating
state
Prior art date
Application number
TW099138377A
Other languages
Chinese (zh)
Other versions
TWI413773B (en
Inventor
Yun-Sung Na
Tae-Hung Ku
Jung-Woo Hwang
Original Assignee
Tech Wing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tech Wing Co Ltd filed Critical Tech Wing Co Ltd
Publication of TW201118380A publication Critical patent/TW201118380A/en
Application granted granted Critical
Publication of TWI413773B publication Critical patent/TWI413773B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2855Environmental, reliability or burn-in testing
    • G01R31/286External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867Handlers or transport devices, e.g. loaders, carriers, trays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor

Abstract

The present invention relates to an opening apparatus for a test handler. The opening apparatus for the test handler includes: a lift module set up for ascending and descending, and an operating unit is equipped upon the lift module; an open board, an installation unit is disposed at lower surface of the open board, and its upper surface has a plurality of open pins able to open the inserting unit of the carrier board, wherein the installation unit is disposed at the upper side of said lift module to move vertically along with the lift module. According to the operation status of the manager on the operating unit, a status of installation in the lift module is formed or to be able to uninstall; and a driving unit to provide the driving force for lifting and lowering the lift module. Accordingly, the present invention discloses an installation that allows easy desorption of the open board, making it easy to replace the open board. Also, because the carrier board and the open board are not in the same level state, an appropriate surface contact is formed between the carrier board and the open board in order to prevent damage in the inserting unit.

Description

201118380 六、發明說明: 【發明所屬之技術領域】 本發明涉及一種測却八、, u 裡幻忒分選機用開放裝置,尤其涉及一種 開放板的裝卸(desorption、4+ u ^ p 〇n )技術的測試分選機用開放裝置。 【先前技術】 為了電子部件(特別是半導體^件)的測試,需要使用 測試電氣連接的電子部件的測試機(tester)和將電子部件 電氣連接到測試機的測試分選機(test handler )。 測試分選機為了增加處理容量,使用一次性運送以行列 形式裝載的狀態的多個半導體元件的載板(以⑴以 board )。該載板設置有行列形式排列的多個插入部 (insert ),且半導體元件以插入於插入部的狀態裝載於載 板。 通常,使用測試分選機測試的半導體元件以裝載於用戶 託盤(user tray)的狀態下提供。 裝載於用戶託盤的狀態供給的半導體元件由拾放裝置 (pick and place apparatus )移動到載板,載板上完成測試 的半導體元件通過另外的拾放裝置移動到用戶託盤。而且 裝載半導體元件的載板沿著預定的迴圈路徑移動而到達測 試地點時,半導體元件以裝載於載板的狀態電氣連接到測 試機的測試插座(socket)。 如前所述,載板是以裝載半導體元件狀態沿著迴圈路徑 201118380 移動,尤其在側對接式(side docking type )測試分選機中 具備使載板垂直直立的狀態下進行移動的區間。因此,載 板的插入部需要具備防脫離裝置,以防止半導體元件的脫 離。 但是’由於載板的插入部具備防脫離裝置,所以半導體 元件從用戶託盤移動到載板或者從載板移動到用戶託盤 時,需要解除防脫離裝置的防脫離狀態而開放插入部(開 放載板),因而測試分選機需要另配開放裝置。 圖1是概略地示出現有的開放裝置100的正面。 參照圖1 ’現有的開放裝置100由升降板110、開放板 120、螺栓(bolt) 130以及氣缸140組成。 升降板110設置成直接接受氣缸140的驅動力而能夠升 降。 開放板12 0的上表面具備多個開放銷p,以開放載板的 插入部。 螺栓130作為將開放板120固定於升降板11〇的固定裝 置。 氣缸140提供升降板11〇升降所需的驅動力。 如上的開放裝置100由氣缸140的驅動力使升降板U〇 及開放板120上升,同時開放銷p操縱防脫離裝置以開放 載板的插入部,若升降板110及開放板120下降,則結束 載板的插入部的開放狀態。 另外,由測試分選機測試的半導體元件會時常更換其種 類’這時載板的插入部也需要更換成可以對應該半導體元 201118380 件物理規格的插入部。但是,若更換插入部則通常形成於 插入部的防脫離裝置的位置也將發生變化,因此開放裝置 的開放板也需要一起更換。 但是,現有的開放裝置100需在開放裝置100的上側使 用工具(螺絲刀),擰松或者擰緊螺栓13〇,以用於卸載 原有的開放板120之後安裝新的開放板。因為,開放裝置 100設置在測試分選機的内部深處,且其上側還具備其他 0裝置。 因此’現有的開放裝置100更換開放板12〇時操作很繁 瑣,而且浪費很多時間。 另外,為使開放板120的開放銷p恰當地操縱插入部的 防脫離裝置’需要開放板120與載板形成適當的面接觸, 但若開放板120與載板水平狀態不同,則開放銷p不僅無 法恰當地操縱防脫離裝置,且可能損傷插入部。 鲁【發明内容】 本發明的目的在於提供一種不使用專門的工具就可以 簡單地更換開放板的測試分選機用開放裝置。 本發明的另一個目的在於提供一種即使開放板與載板 無法形成相同的水平狀態,也可以形成恰當的面接觸的測 試分選機用開放裝置。 為了實現上述目的’根據本發明的測試分選機用開放裝 置包含:升降模組’能夠升降,且在上面具備操作部;開 201118380 放板’下表面具備安裝部且上表面具備能夠開放載板的插 入部的多個開放銷,其中所述安裝部設置於所述升降模組 的上側,並隨著所述升降模組的升降而升降,且根據管理 者對所述操作部的操作狀態,形成安裝於所述升降模組的 狀態或者能夠解除安裝狀態;及驅動部,提供升降所述升 降模組的驅動力。 所述女裝部具備向下突出的卡接突起,所述操作部包含: _操作桿,根據旋轉狀態,能夠掛接所述卡接突起或者解除 卡接突起的掛接狀態;及固定銷,能夠可旋轉地固定所述 操作桿。 所述升降模組的上面形成使所述卡接突起能夠插入預定 深度的插入凹槽,所述操作桿設置於所述插入凹槽之上。 所述卡接突起包含:向下突出的突出端;及卡接端從所 述突出端沿水平方向彎曲並延長,根據所述操作桿的操作 狀態,能夠掛接於所述操作桿或者解除掛接 接端的末端部分略微向上突出。201118380 VI. Description of the Invention: [Technical Field] The present invention relates to an open device for measuring a splaying machine, especially for an open plate loading and unloading (desorption, 4+ u ^ p 〇n ) The technical test sorter uses an open device. [Prior Art] For testing of electronic components (especially semiconductor components), it is necessary to use a tester that tests electronic components of electrical connections and a test handler that electrically connects electronic components to the tester. In order to increase the processing capacity, the test sorter uses a carrier for transporting a plurality of semiconductor elements in a state of being loaded in a row (in (1) as a board). The carrier is provided with a plurality of insertion portions arranged in a matrix, and the semiconductor element is mounted on the carrier in a state of being inserted into the insertion portion. Usually, a semiconductor element tested using a test sorter is provided in a state of being loaded on a user tray. The semiconductor element supplied in the state of being loaded on the user tray is moved to the carrier by a pick and place apparatus, and the semiconductor element on the carrier which has been tested is moved to the user tray by another pick-and-place device. Further, when the carrier on which the semiconductor element is mounted is moved along the predetermined loop path to reach the test site, the semiconductor element is electrically connected to the test socket of the tester in a state of being loaded on the carrier. As described above, the carrier is moved along the loop path 201118380 in the state in which the semiconductor element is mounted, and in particular, in the side docking type test sorter, the section in which the carrier is vertically erected is moved. Therefore, the insertion portion of the carrier plate needs to be provided with a detachment preventing means to prevent the semiconductor element from coming off. However, since the insertion portion of the carrier plate is provided with the separation preventing means, when the semiconductor element is moved from the user tray to the carrier or from the carrier to the user tray, it is necessary to release the anti-disengagement state of the separation preventing device and open the insertion portion (open carrier) Therefore, the test sorter needs to be equipped with an open device. FIG. 1 is a view schematically showing a front surface of a conventional opening device 100. Referring to Fig. 1 'the prior art opening device 100 is composed of a lifting plate 110, an opening plate 120, a bolt 130, and a cylinder 140. The lift plate 110 is provided to directly receive the driving force of the cylinder 140 and can be raised and lowered. The upper surface of the open plate 120 is provided with a plurality of open pins p to open the insertion portion of the carrier. The bolt 130 serves as a fixing means for fixing the open plate 120 to the lift plate 11A. The cylinder 140 provides the driving force required for the lifting plate 11 to be lifted and lowered. The opening device 100 as described above raises the lifting plate U and the opening plate 120 by the driving force of the air cylinder 140, and the opening pin p operates the separation preventing device to open the insertion portion of the carrier. If the lifting plate 110 and the opening plate 120 are lowered, the end is completed. The open state of the insertion portion of the carrier. In addition, the semiconductor components tested by the test sorter will change their types from time to time. At this time, the insertion portion of the carrier board needs to be replaced with an insertion portion that can correspond to the physical specifications of the semiconductor element 201118380. However, if the insertion portion is replaced, the position of the separation preventing means normally formed in the insertion portion also changes, so that the opening plate of the opening device also needs to be replaced together. However, the existing opening device 100 requires a tool (screwdriver) on the upper side of the opening device 100 to loosen or tighten the bolt 13〇 for unloading the original open plate 120 and then installing a new open plate. Because the opening device 100 is disposed deep inside the test sorter, and the other side has other 0 devices. Therefore, the operation of the existing open apparatus 100 for replacing the open panel 12 is cumbersome and wastes a lot of time. Further, in order to properly manipulate the opening pin p of the opening plate 120 to properly manipulate the insertion preventing portion, the opening plate 120 is required to form an appropriate surface contact with the carrier plate. However, if the opening plate 120 and the carrier plate are in a different horizontal state, the opening pin p is opened. Not only is it impossible to properly manipulate the detachment prevention device, and the insertion portion may be damaged. SUMMARY OF THE INVENTION An object of the present invention is to provide an open device for a test sorter that can easily replace an open plate without using a special tool. Another object of the present invention is to provide an opening device for a test sorter which can form an appropriate surface contact even if the open plate and the carrier are not formed in the same horizontal state. In order to achieve the above object, the open device for a test sorter according to the present invention includes: the lift module can be lifted and lowered, and has an operation portion thereon; the open surface of the 201118380 release plate has a mounting portion and the upper surface is provided with an open carrier a plurality of open pins of the insertion portion, wherein the mounting portion is disposed on an upper side of the lifting module, and is raised and lowered as the lifting module is raised and lowered, and according to an operation state of the operating portion by the manager, Forming a state of being attached to the lifting module or releasing the mounting state; and driving the driving unit to provide a driving force for lifting the lifting module. The wearing portion has a latching protrusion protruding downward, and the operating portion includes: an operating lever that can hook the latching protrusion or release the hooking state of the latching protrusion according to the rotating state; and a fixing pin, The lever can be rotatably fixed. The upper surface of the lifting module forms an insertion groove for inserting the engaging projection into a predetermined depth, and the operating rod is disposed above the insertion groove. The engaging protrusion includes: a protruding end protruding downward; and the engaging end is bent and extended from the protruding end in a horizontal direction, and can be hooked to the operating rod or unhang according to an operating state of the operating rod The end portion of the terminal protrudes slightly upward.

而且所述卡 所述操作桿包含:操作端, 定的旋轉中心的一側操作; 至所述旋轉中心的另一側時 接。 能夠由管理者朝㉟過固定銷設 及掛接端,所述操作端被操縱 ,掛接所述卡接端或者解除卡 所述操作部還包含對所述操作桿施加向下方向㈣性力 的波型墊圈,且所述掛接端在所述操作部與所述 觸的部分具備㈣面,⑽接所述卡接料 掛接操作。 级设田的 201118380 所述升降模組包含:升降板,直接接受所述驅動部的升降 力;安裝板,佈置於所述升降板的上側,並與所述升降板 維持預定間隔,且能夠可裝卸地安裝所述開放板;及結合 部件’用於結合所述升降板和安裝板。 所述升降模組還包含至少一個彈性部件,在所述安裝板和 升降板之間產生相互的彈性斥力,以使所述安裝板和升降 板能夠維持預定間隔’並且,所述預定間隔的最大值受限 於所述結合部件。 根據本發明的拾放裝置具有如下效果。 第一、開放板的更換容易,且減少交換時間,最終提高 測試分選機的開工率。 第一、即使在開放板與載板的沒有維持相同的水平狀態 而開放板上升時,載板和開放板接觸,並最終使開放板與 載板處於相同的水平狀態,以使開放板的開放銷恰當地操 作插入部的防脫離裝置,由此可以防止插入部的破損等。 【實施方式】 參照附圖來詳細說明本發明的較佳實施例,為了說明的 簡潔,對於重複的說明或者周知技術的說明盡可能地省略 或者壓縮。 圖2a是根據本發明的開放裝置2〇〇的立體圖,圖沘 是圖2a的開放裝置2〇〇的分解立體圖。 根據本實施例的開放裝置200包含升降模組210、開放 201118380 板220、氣缸230等而構成。 升降模組210包含升降板211、安裝板212、兩個螺栓 213以及四個彈簧214等而構成。 升降板211是矩形形狀,且直接接受氣缸23〇的驅動 力’在其兩側形成有兩個螺紋槽(thread groove ) 2 11 a。 安裝板212與升降板211是相同的矩形形狀,且佈置於 升降板211的上側’而且具備操作部212a,以可裝卸地安 裝開放板220。並且,安裝板212的兩側對應於兩個螺紋 孔211a的位置形成通孔212b,且安裝板212的上面形成 預定形狀的插入凹槽212c以及位置引導突起212d-1、 212d-2。位置引導突起212d-l、212d-2引導開放板220安 裝於安裝板212的正確位置。雖然附圖省略了其結構,但 是顯然開放板220的下面與位置引導突起212d-l、212d-2 對應的位置形成有可以插入位置引導突起212d-l、212d-2 的引導槽 兩個螺栓213作為用於結合安裝板212和升降板211 的結合部件而提供’分別通過安裝板212的通孔212b螺紋 結合於升降板211的螺紋槽211a» 四個彈簧214位於升降板211和安裝板212的之間的邊 角部分’作為在安裝板212和升降板211之間產生相互彈 性斥力’以使安裝板212和升降板2 11可以維持預定間距 s的彈性部件。在此,為限制由彈簧2 14的彈性斥力產生的 升降板211和安裝板212之間的預定間距的最大值(升降 模組不上升的狀態,即開放板不接觸於載板狀態時的間距) 201118380 和為使各個邊角部分的升降板211與安裝板212之間維持 一定的間距,螺栓213的安裝部位的上端應形成相比螺紋 槽211a更大的圓柱體形狀。顯然,各螺栓213的圓柱體部 分的長度應相同。 開放板220佈置於升降模組21〇的上側且具有矩形形 狀,具體參照作為正面圖的圖2c,其下面具備作為安裝部 的卡接突起221,以用於使開放板22〇可裝卸地安裝於升 | 降模組2 1 0。 卡接突起221是插入於插入凹槽212c的部分,呈 倒 “ L- ’, y 的 形状,且由向下突出的突出端221a和在突出端22u向水 平方向彎折而延長的卡接端221b構成。卡接端221b是根 據管理者對操作部212a的操作狀態,可變成安裝於升降模 組210 (更具體是符號212的安裝板)的狀態或者從安裝 的狀L解除的部分,在其末端部分形成向上略顯突出的突 φ 台P。 而且,開放板220的上面構成可以開放載板的插入部的 多個開放銷p。 氣缸230作為提供驅動力的驅動部,使升降模組2ι〇 升降,最終使開放板220與載板進行面接觸,以使開放板 220的開放銷p可以開放載板的插入部。 另外,佈置於安裝板212的操作部212a包含操作桿 212a-l、固定銷212a_2、以及波型墊圈212&_3等。 操作桿212a-l由管理者進行操作,包括操作端2na_ia 201118380 和掛接端212a-lb,用於根據其旋轉狀態,掛接卡接突起 221或者解除卡接突起221掛接狀態。該操作桿以以」設 置於插入凹槽212c之上並旋轉,且插入於插入凹槽2i2c 時操作桿212a-l &上側部分不突出於安裝板2i2的上側 面。因此,較佳地,插入凹槽212(^具有可使操作桿2i2a i 旋轉的範圍的寬度,卡接突起221插入的部分A對應於卡 接突起221形狀向下進-步凹陷,以使卡接突起221更容 易地定位。 操作端212a-la設置於根據固定銷212&_2設定的旋轉 中心的一側,是由管理者操作的部分。 掛接端212a-lb設置於旋轉中心的另一側,且從操作端 心七彎曲預定角度(約⑵度角)而延長。該掛接端 212a-lb在管理者旋轉操作操作端2i2a ia時,與操作端 212a-la聯動而旋#,由此掛帛卡接# 2川或者解除對卡 端22 lb的掛接。而且,如圖2d所示掛接端⑴a]b 與卡接端22ib的接觸面的兩個邊角側具有傾斜面Li, 以用於在通過旋轉而掛接卡接端mb或解除掛接時,可以 輕易跨過卡接端21的突出的突台p,實現恰當的掛接操作 或者解除掛接操作。 而且,操作桿212a-l的操作端212a_la與掛接端 2l2a-lb之間形成有可使固定銷212&_2通過的貫通孔 2l2a-lc 。 ^固W 212a·2用於可旋轉地固定操作桿212a-l,且通 過操作桿212^的貫通孔212a.le固定於插入凹槽212c 10 201118380 的底面。 波型墊圈212a-3佈置於固定銷212a_2的頭部H和操作 杯2 12a-1之間,作為對操作桿施加向下方向彈性力的 部件。 接著,對如上結構的開放裝置2〇〇的開放板22〇的裝卸 和開放操作進行說明。 由於開放板220的異常或者所要測試的半導體元件的 更換’需要將現有的開放板220更換為新開放板時,參照 如圖3的平面圖可知,管理者用手將操作桿的操作 端2l2a-la向右側推以使操作桿212a l沿著逆時針方向旋 轉操作。參照圖4,由於該操作,根據操作桿以以丨向逆 時針旋轉,掛接端212a-lb解除卡接端221b的掛接。這時, 由於掛接端212a-lb的傾斜面Sl和波型墊圈212a 3的作 用,掛接端212a-lb可以順暢地通過卡接端221b的突台p 部分。 σ 即,垂直以及水平方向的力作用於操作桿時,與操作捍 維持預定間隔且僅局部與操作桿接觸的波型墊圈212&_3受 力,使操作桿的掛接端212a_lb在水平狀態以固定銷2i2a_2 為基準向上傾斜,由此能夠通過卡接端221b的突台p部分。 掛接端212a-lb解除卡接端221b的掛接,當開放板22〇 解除安裝於安裝板212狀態時,管理者清除現有的開放板 200之後,如冑5所示,將新開放板的卡接突起221插入 於插入凹槽212c (具體地,插入於插入凹槽中進一步向下 凹陷的部分)。 11 201118380 參照圖6’在卡接突起221插入於插入凹槽2l^c的狀 態下,開放板220置於安裝板212的上側時,此次管理者 將操作桿212a-l的操作端212a-la朝左側推動,以使操作 桿212a-l沿順時針方向旋轉。在此操作下,如圖7所示, 操作桿212a-l向順時針方向旋轉,以使掛接端掛 接卡接端221b而完成開放板220的安裝。與此相同,由於 掛接端212a-lb的傾斜面I和波型墊圈212a_3的作用,掛 接端212a-lb可以順暢地通過卡接端221b的突台p的部 分。而且’波型墊圈212a_3在掛接端212a_lb掛接卡接端 221b而完成開放板22〇的安裝的狀態下,對掛接端 持續性地施加向下方向的彈性力,實現鎖定作用,以使掛 接端212a-lb在受到另施加的外力作用之前能夠維持卡接 端221b的掛接狀態。 圖3至圖7中由於圖面表示的限制,只有將開放板 的卡接突起221的部分用梳狀線表示,為了簡便,圖$至 圖7中的新開放板的掛接突起的符號與圖3及圖4的現有 的開放板的卡接突起的符號相同。 眾所周知,為了開放載板的插入部需要使開放板22〇 和載板進行面接觸’這時,會產生載板與開放板220水平 狀態不相$ (或者設置於載板的插人部的水平狀態略微不 良)的情況。 即使這樣的情況,操作氣缸23〇以使上升升降模組2 1 〇 和開放板220,如誇張的圖8所示,開放板22〇的—侧部 分(圖中左側部分)先與載板CB接觸。如圖8所示的狀 12 201118380 態下,由升降模組210和開放板220的略微而持續的上升, 先接觸於載板CB的一側部分的彈簧214被壓縮,如圖9 所示,載板CB和開放板220相互間形成完美的面接觸。 由此,開放板220的開放銷p可以恰當地開放載板CB的 插入部。 如上所述,對本發明的具體說明通過參照附圖的實施例 而進行的,但是上述實施例僅僅是本發明的較佳實施例, 鲁本發明不限於上述實施例,本發明的_利範圍應是前面敍 述的申請專利範圍以及其均等概念。 【圖式簡單說明】 圖1是現有的測試分選機用開放裝置的概略的正面圖; 圖2a是根據本發明的實施例的測試分選機用開放裝置 的立體圖; 圖2b至圖2d是為說明圖2a開放裝置而參照的分解立 體圖或者個別的零件圖; 圖3至圖9是用於說明圖2a開放裝置的特徵性動作的 參照圖。 【主要元件符號說明】 200 開放裝置 210 升降模組 211 升降板 13 201118380 212 安裝板 212a 操作部 212a-l 操作桿(lever ) 212a-la 操作端 212a-lb 掛接端 Si ' S2 傾斜面 212a-2 固定銷 212a-3 波型墊圈 212c 插入凹槽 214 彈簣 220 開放板 221 卡接突起 221a 突出端 221b 卡接端 230 氣缸 P 突台 P 開放銷 s 預定間距 14Moreover, the operating lever of the card includes: an operating end, one side of the fixed center of rotation; and the other side of the center of rotation. The operating pin can be manipulated, the operating end is manipulated, the latching end is released, or the card is released. The operating portion further includes applying a downward direction (four) force to the operating lever. a wave washer, wherein the hook end has a (four) surface at the operating portion and the touch portion, and (10) is connected to the card material hooking operation. The lifting module of 201118380 includes: a lifting plate directly receiving the lifting force of the driving portion; a mounting plate disposed on the upper side of the lifting plate and maintaining a predetermined interval with the lifting plate, and capable of being The open plate is detachably mounted; and a coupling member ' is used to join the lift plate and the mounting plate. The lifting module further includes at least one elastic member that generates mutual elastic repulsive force between the mounting plate and the lifting plate to enable the mounting plate and the lifting plate to maintain a predetermined interval 'and the maximum of the predetermined interval The value is limited by the bonding component. The pick-and-place device according to the present invention has the following effects. First, the replacement of the open board is easy, and the exchange time is reduced, and finally the operating rate of the test sorter is improved. First, even when the open plate and the carrier plate do not maintain the same horizontal state and the open plate rises, the carrier plate and the open plate contact, and finally the open plate and the carrier plate are in the same horizontal state, so that the open plate is opened. The pin appropriately operates the separation preventing device of the insertion portion, whereby damage or the like of the insertion portion can be prevented. BEST MODE FOR CARRYING OUT THE INVENTION The preferred embodiments of the present invention will be described in detail with reference to the drawings, and the description of the repeated description or the prior art is omitted or compressed as much as possible for the sake of brevity. Fig. 2a is a perspective view of an opening device 2A according to the present invention, and Fig. 2 is an exploded perspective view of the opening device 2A of Fig. 2a. The opening device 200 according to the present embodiment includes a lifting module 210, an opening 201118380 plate 220, a cylinder 230, and the like. The lifting module 210 includes a lifting plate 211, a mounting plate 212, two bolts 213, four springs 214, and the like. The lifting plate 211 has a rectangular shape, and the driving force ' directly receiving the cylinder 23' is formed with two thread grooves 2 11 a on both sides thereof. The mounting plate 212 and the lifting plate 211 have the same rectangular shape and are disposed on the upper side ' of the lifting plate 211 and are provided with an operating portion 212a for detachably mounting the opening plate 220. Further, the both sides of the mounting plate 212 are formed with the through holes 212b corresponding to the positions of the two screw holes 211a, and the upper surface of the mounting plate 212 is formed with the insertion groove 212c of a predetermined shape and the position guiding protrusions 212d-1, 212d-2. The position guiding projections 212d-1, 212d-2 guide the open plate 220 to the correct position of the mounting plate 212. Although the structure is omitted from the drawings, it is apparent that the lower surface of the open plate 220 is formed with a guide groove for inserting the position guiding projections 212d-1, 212d-2 at positions corresponding to the position guiding projections 212d-1, 212d-2, and two bolts 213. As a coupling member for combining the mounting plate 212 and the lifting plate 211, a thread groove 211a is provided which is screwed to the lifting plate 211 through the through hole 212b of the mounting plate 212, respectively. Four springs 214 are located on the lifting plate 211 and the mounting plate 212. The corner portion 'as a resilient member that creates a mutual elastic repulsion between the mounting plate 212 and the lift plate 211 to allow the mounting plate 212 and the lift plate 2 11 to maintain a predetermined spacing s. Here, in order to limit the maximum value of the predetermined distance between the lift plate 211 and the mounting plate 212 generated by the elastic repulsive force of the spring 2 14 (the state in which the lift module does not rise, that is, the gap when the open plate does not contact the state of the carrier plate) In order to maintain a certain distance between the lifting plate 211 and the mounting plate 212 of each corner portion, the upper end of the mounting portion of the bolt 213 should have a larger cylindrical shape than the thread groove 211a. Obviously, the length of the cylindrical portion of each bolt 213 should be the same. The open plate 220 is disposed on the upper side of the lift module 21A and has a rectangular shape. Referring specifically to FIG. 2c as a front view, the lower surface thereof is provided with a snap protrusion 221 as a mounting portion for detachably mounting the open plate 22 Yu Sheng | Drop module 2 1 0. The engaging projection 221 is a portion that is inserted into the insertion groove 212c, has a shape of an inverted "L-', y, and is extended by a protruding end 221a that protrudes downward and a bent end that is bent in a horizontal direction at the protruding end 22u. The card terminal 221b is a state in which it is mounted on the lift module 210 (more specifically, the mounting plate of the symbol 212) or is released from the mounted shape L according to the operation state of the operation unit 212a by the manager. The end portion of the opening plate 220 constitutes a plurality of opening pins p that can open the insertion portion of the carrier plate. The cylinder 230 serves as a driving portion for providing a driving force, and the lifting module is provided. 2 〇 lifting, finally bringing the open plate 220 into surface contact with the carrier plate, so that the open pin p of the open plate 220 can open the insertion portion of the carrier plate. In addition, the operating portion 212a disposed on the mounting plate 212 includes the operating rod 212a-l , the fixing pin 212a_2, and the wave washer 212 & _3, etc. The operating lever 212a-1 is operated by the manager, including the operating end 2na_ia 201118380 and the hooking end 212a-lb for attaching the snap protrusion according to the rotation state thereof. 221 Or the hooking projection 221 is released from the hooking state. The operating lever is disposed on the insertion groove 212c and rotated, and the upper side portion of the operating lever 212a-1 is not protruded from the mounting plate 2i2 when inserted into the insertion groove 2i2c. Upper side. Therefore, preferably, the insertion groove 212 has a width of a range in which the operation lever 2i2a i can be rotated, and the portion A into which the snap protrusion 221 is inserted corresponds to the shape of the engagement protrusion 221 to be recessed downward to make the card The engaging projections 221 are more easily positioned. The operating ends 212a-la are disposed on one side of the center of rotation set according to the fixing pins 212 &_2, and are portions operated by the manager. The hooking ends 212a-lb are disposed at the center of rotation The side is extended from the operating end seven by a predetermined angle (about (2) degree angle). The hanging end 212a-lb is interlocked with the operating end 212a-la when the manager rotates the operating end 2i2a ia The hook card is connected or the hook of the card end 22 lb is released. Moreover, as shown in Fig. 2d, the two corner sides of the contact surface of the hook end (1) a]b and the snap end 22ib have an inclined surface Li. For attaching the card terminal mb or unmounting by rotation, the protruding protrusion p of the card terminal 21 can be easily crossed to achieve an appropriate hooking operation or a hooking operation. A fixing pin 21 is formed between the operating end 212a_la of the rod 212a-1 and the hanging end 2l2a-lb. The through hole 2l2a-lc through which 2&_2 passes. The solid W 212a·2 is for rotatably fixing the operating rod 212a-1, and is fixed to the insertion groove 212c 10 201118380 by the through hole 212a.le of the operating rod 212 The wave-shaped gasket 212a-3 is disposed between the head portion H of the fixing pin 212a_2 and the operation cup 2 12a-1 as a member that applies a downward-direction elastic force to the operation lever. Next, the opening device 2 of the above configuration The handling and opening operation of the open panel 22 is described. Since the abnormality of the open panel 220 or the replacement of the semiconductor component to be tested 'need to replace the existing open panel 220 with a new open panel, reference is made to the plan view of FIG. The manager manually pushes the operating end 2l2a-la of the operating lever to the right side to rotate the operating lever 212a1 in the counterclockwise direction. Referring to FIG. 4, due to the operation, the lever is rotated counterclockwise according to the operating lever. The hooking ends 212a-lb release the hooking of the latching ends 221b. At this time, due to the action of the inclined surface S1 of the hooking ends 212a-lb and the wave-shaped washers 212a3, the hooking ends 212a-lb can smoothly pass through the carding ends. P1 of the 221b. σ When the vertical and horizontal forces act on the operating lever, the wave washers 212 & _3 which are maintained at a predetermined interval from the operation 且 and are only partially in contact with the operating lever are biased so that the hooking ends 212a_lb of the operating lever are horizontally fixed to the pin 2i2a_2 Tilting upward from the reference, thereby being able to pass through the projection p portion of the latching end 221b. The hooking ends 212a-lb release the hooking of the latching end 221b, and when the open panel 22 is released from the state of the mounting board 212, the manager After the existing open panel 200 is removed, as shown in FIG. 5, the snap-in protrusion 221 of the new open panel is inserted into the insertion groove 212c (specifically, a portion which is inserted into the insertion groove and further recessed downward). 11 201118380 Referring to FIG. 6', in a state where the engaging projection 221 is inserted into the insertion groove 2c, the open plate 220 is placed on the upper side of the mounting plate 212, the manager will operate the operating end 212a of the lever 212a-1. La is pushed to the left to rotate the operating lever 212a-1 in the clockwise direction. Under this operation, as shown in Fig. 7, the operating lever 212a-1 is rotated in the clockwise direction so that the hooking end is hooked to the engaging end 221b to complete the mounting of the opening plate 220. Similarly, due to the action of the inclined surface I of the hook ends 212a-lb and the wave washers 212a_3, the hook ends 212a-lb can smoothly pass through the portion of the land p of the snap end 221b. Moreover, in the state in which the wave-shaped washer 212a_3 is hooked to the latching end 221b to complete the mounting of the open plate 22, the elastic force of the downward direction is continuously applied to the hook end to achieve a locking effect, so that The hook ends 212a-lb can maintain the hooked state of the clip end 221b before being subjected to an externally applied external force. 3 to 7, only the portion of the snap-in protrusion 221 of the open plate is indicated by a comb line, and the symbol of the hook-up protrusion of the new open plate in FIGS. The symbols of the engaging projections of the conventional open plates of Figs. 3 and 4 are the same. It is known that in order to open the insertion portion of the carrier plate, the open plate 22A and the carrier plate need to be in surface contact. In this case, the horizontal state of the carrier plate and the open plate 220 may be different (or the horizontal state of the insertion portion of the carrier plate). Slightly bad). Even in such a case, the cylinder 23 is operated to raise the lift module 2 1 〇 and the open plate 220, as shown in an exaggerated view of FIG. 8, the side portion of the open plate 22 (the left portion in the drawing) is first and the carrier CB. contact. As shown in Fig. 8, in the state of 201118380, the spring 214 which is first contacted to one side of the carrier CB is compressed by the slight and continuous rise of the lifting module 210 and the opening plate 220, as shown in Fig. 9. The carrier CB and the open plate 220 form a perfect surface contact with each other. Thereby, the opening pin p of the opening plate 220 can appropriately open the insertion portion of the carrier CB. As described above, the specific description of the present invention is made by referring to the embodiments of the drawings, but the above embodiments are merely preferred embodiments of the present invention, and the present invention is not limited to the above embodiments, and the scope of the present invention should be It is the scope of the patent application described above and its equal concept. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic front view of an open device for a conventional test sorter; Fig. 2a is a perspective view of an open device for a test sorter according to an embodiment of the present invention; Figs. 2b to 2d are An exploded perspective view or an individual part drawing referred to in order to explain the opening device of Fig. 2a; Fig. 3 through Fig. 9 are reference views for explaining the characteristic operation of the opening device of Fig. 2a. [Main component symbol description] 200 Open device 210 Lifting module 211 Lifting plate 13 201118380 212 Mounting plate 212a Operating portion 212a-1 Operating lever (lever) 212a-la Operating end 212a-lb Mounting end Si ' S2 Inclined surface 212a- 2 fixing pin 212a-3 wave washer 212c insertion groove 214 magazine 220 open plate 221 snap protrusion 221a protruding end 221b snap end 230 cylinder P projection P open pin s predetermined spacing 14

Claims (1)

201118380 七、申請專利範圍: 1、 一種測試分選機用開放裝置,其特徵在於包含: 升降模組,設置成能夠升降,且在上面具備操作部; 開放板’下表面具備安裝部且上表面具備能夠開放載板的 插入部的多個開放銷’其中該安裝部設置於該升降模組的 上侧’並隨著該升降模組的升降而升降,且根據管理者對 該操作部的操作狀態,形成安裝於該升降模組的狀態或者 能夠解除安裝狀態;及 0 驅動部,提供升降該升降模組的驅動力。 2、 如請求項1所述的測試分選機用開放裝置,其特徵在 於該安裝部具備向下突出的卡接突起, 該操作部包含: 操作桿,根據旋轉狀態,能夠掛接該卡接突起或者解除掛 接狀態;及 固定銷,能夠可旋轉地固定該操作桿。 # 3、如請求項2所述的測試分選機用開放裝置,其特徵在 於該升降模組的上面形成使該卡接突起能夠插入預定深度 的插入凹槽, 該操作桿設置於該插入凹槽之上。 4、如請求項2所述的測試分選機用開放裝置,其特徵在 於該卡接突起包含: 突出端,向下突起;及 卡接端,從該突出端沿水平方向彎曲並延長,根據該操作 15 201118380 桿的操作狀態,能夠掛接於該操作桿或者解除掛接, 而且該卡接端的末端部分略微向上突出。 5、 如請求項4所述的測試分選機用開放裝置,其特徵在 於該操作桿包含: 操作端,能夠由管理者朝通過固定銷設定的旋轉中心的 一側操作;及 掛接端,該操作端被操縱至該旋轉中心的另一側時,掛 _ 接該卡接端或者解除卡接》 6、 如請求項5所述的測試分選機用開放裝置,其特徵在 於該操作部還包含對該操作桿施加向下方向的彈性力的波 型墊圈,且該掛接端在與該卡接端接觸的部分具備傾斜 面,以在接端掛接該卡接端時,形成恰當的掛接操作。 7、 如請求項1所述的測試分選機用開放裝置,其特徵在 於該升降模組包含: 升降板’直接接受該驅動部的升降力; • 安裝板,佈置於該升降板的上側,並與該升降板維持預定 間隔’且能夠可裝卸地安裝該開放板;及 結合部件’用於結合該升降板和安裝板。 8、 如请求項7所述的測試分選機用開放裝置,其特徵在 於該升降模組還包含至少一個彈性部件,在該安裝板和升 降板之間產生相互的彈性斥力,以使該安裝板和升降板能 夠維持預定間隔, 並且,該預定間隔的最大值受限制於該結合部件。201118380 VII. Patent application scope: 1. An open device for testing sorting machine, characterized in that: the lifting module is arranged to be capable of lifting and lowering, and has an operating portion thereon; the lower surface of the open plate has a mounting portion and an upper surface a plurality of open pins 'capable of opening the insertion portion of the carrier plate, wherein the mounting portion is disposed on the upper side of the lifting module' and ascending and descending with the lifting and lowering of the lifting module, and according to the operation of the operating portion by the manager The state is formed in a state of being attached to the lift module or can be released from the state; and the 0 drive portion provides a driving force for lifting the lift module. 2. The opening device for a test sorter according to claim 1, wherein the mounting portion has a latching protrusion that protrudes downward, and the operating portion includes: an operating lever that can be hooked according to a rotation state a protruding or unattached state; and a fixing pin capable of rotatably fixing the operating lever. #3. The opening device for a test sorting machine according to claim 2, wherein the upper surface of the lifting module is formed with an insertion groove for inserting the engaging protrusion into a predetermined depth, and the operating rod is disposed at the insertion concave Above the trough. 4. The opening device for a test sorter according to claim 2, wherein the snap protrusion comprises: a protruding end, a downward protrusion; and a snap end, which is bent and extended in the horizontal direction from the protruding end, according to The operation state of the 201118380 lever can be attached to the lever or unhooked, and the end portion of the clip protrudes slightly upward. 5. The open device for a test sorter according to claim 4, wherein the operating lever comprises: an operating end operable by a manager toward a side of a rotation center set by the fixing pin; and a hooking end, When the operation end is manipulated to the other side of the rotation center, the card connector is terminated or the card is released. 6. The test device for opening the device according to claim 5, characterized in that the operation portion is The utility model further comprises a wave washer which applies a downward force to the operating rod, and the hook end has an inclined surface at a portion in contact with the latching end, so as to form an appropriate shape when the joint end is hooked to the latching end The hook operation. 7. The opening device for a test sorter according to claim 1, wherein the lifting module comprises: the lifting plate directly accepts the lifting force of the driving portion; and the mounting plate is disposed on the upper side of the lifting plate. And maintaining the predetermined interval with the lifting plate and detachably mounting the opening plate; and the coupling member 'for combining the lifting plate and the mounting plate. 8. The open device for a test sorter according to claim 7, wherein the lift module further comprises at least one elastic member, and a mutual elastic repulsion is generated between the mounting plate and the lift plate to enable the installation. The plate and the lifting plate are capable of maintaining a predetermined interval, and the maximum value of the predetermined interval is limited to the coupling member.
TW099138377A 2009-11-17 2010-11-08 Opening apparatus for test handler TWI413773B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR20090110630 2009-11-17

Publications (2)

Publication Number Publication Date
TW201118380A true TW201118380A (en) 2011-06-01
TWI413773B TWI413773B (en) 2013-11-01

Family

ID=43994833

Family Applications (1)

Application Number Title Priority Date Filing Date
TW099138377A TWI413773B (en) 2009-11-17 2010-11-08 Opening apparatus for test handler

Country Status (3)

Country Link
KR (1) KR101505955B1 (en)
CN (1) CN102059222B (en)
TW (1) TWI413773B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI491891B (en) * 2011-11-29 2015-07-11 Techwing Co Ltd A test handler and method for operating the same

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102327772B1 (en) * 2015-09-08 2021-11-19 (주)테크윙 Opener of handler for testing semiconductor
KR20170078209A (en) * 2015-12-29 2017-07-07 (주)테크윙 Handler for testing semiconductor
KR102637464B1 (en) * 2016-11-17 2024-02-16 세메스 주식회사 Apparatus for opening latches of insert assemblies
KR102289103B1 (en) * 2017-11-21 2021-08-13 (주)테크윙 Opening apparatus for electronic device handler

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200173203Y1 (en) 1997-08-04 2000-04-01 옥순봉 Jig for pcb assay test
JP3555072B2 (en) * 1999-08-09 2004-08-18 東京エレクトロン株式会社 Head plate opening / closing reduction mechanism
CN2476373Y (en) * 2001-04-05 2002-02-13 霖城机械股份有限公司 Track-type die opening device
US6586925B2 (en) * 2001-04-09 2003-07-01 St Assembly Test Services Ltd. Method and apparatus for establishing quick and reliable connection between a semiconductor device handler plate and a semiconductor device test head plate
US6547571B2 (en) * 2001-06-21 2003-04-15 Maxim Integrated Products, Inc. Low cost, high performance flexible tester handler docking interface
KR100395925B1 (en) * 2001-08-01 2003-08-27 삼성전자주식회사 Semiconductor Device Loading Apparatus of Test Handler
KR100687676B1 (en) * 2006-02-10 2007-02-27 (주)테크윙 Test handler
CN2899976Y (en) * 2006-05-15 2007-05-16 常州市天宁天达电子设备有限公司 Electric brush lifter of thin film capacitor test sorter
KR100813235B1 (en) 2007-04-02 2008-03-13 (주)테크윙 Test handler
KR100906614B1 (en) * 2007-06-15 2009-07-10 (주)테크윙 Test handler
KR100934032B1 (en) * 2008-01-11 2009-12-28 (주)테크윙 Tester Opener
KR100958272B1 (en) * 2008-02-04 2010-05-19 에버테크노 주식회사 Loading and unloading apparatus of solid state disk test handler

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI491891B (en) * 2011-11-29 2015-07-11 Techwing Co Ltd A test handler and method for operating the same
TWI554767B (en) * 2011-11-29 2016-10-21 泰克元有限公司 Method of operating a test handler

Also Published As

Publication number Publication date
KR20110055361A (en) 2011-05-25
CN102059222A (en) 2011-05-18
KR101505955B1 (en) 2015-03-27
TWI413773B (en) 2013-11-01
CN102059222B (en) 2014-06-25

Similar Documents

Publication Publication Date Title
US8143909B2 (en) Universal test socket and semiconductor package testing apparatus using the same
US10534017B2 (en) Quick change small footprint testing system and method of use
TW201118380A (en) Opening apparatus for test handler
US7121858B2 (en) Socket for ball grid array devices
US8562367B2 (en) Socket for electrical part
US20070270014A1 (en) Socket for electrical parts
TWI469151B (en) Testing interface board specially for dram memory packages
US6644981B2 (en) Socket for electrical parts having horizontal guide portion
US7589521B2 (en) Universal cover for a burn-in socket
US7676908B2 (en) Pressing member and electronic device handling apparatus
KR20080060624A (en) Connecting apparatus for semiconductor device test system
KR100739475B1 (en) Carrier module for semiconductor test handler
KR20080004869A (en) Carrier module for semiconductor test handler
KR101053462B1 (en) Semiconductor device test socket
JP4550642B2 (en) Socket for electrical parts
KR102193725B1 (en) Test socket
KR101279019B1 (en) Socket adapter
KR100277541B1 (en) Carrier for Modular IC Handler
KR102213076B1 (en) Test socket
US9140911B2 (en) Alignment process device for display panel and conductive component thereof
KR100328346B1 (en) Carrier of Handler for Module IC
KR100290033B1 (en) method and apparatus for loading device on Burn-In board connector
JP4912080B2 (en) Electronic component handling apparatus and operation method thereof, test tray and pusher
KR20130102674A (en) Test jig for memory-module
KR20100133067A (en) Gripper of socket adaptor for programer