TWI395255B - 工作站間之移送室 - Google Patents
工作站間之移送室 Download PDFInfo
- Publication number
- TWI395255B TWI395255B TW095111131A TW95111131A TWI395255B TW I395255 B TWI395255 B TW I395255B TW 095111131 A TW095111131 A TW 095111131A TW 95111131 A TW95111131 A TW 95111131A TW I395255 B TWI395255 B TW I395255B
- Authority
- TW
- Taiwan
- Prior art keywords
- workstation
- chamber
- transport
- substrate
- manufacturing facility
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0451—Apparatus for manufacturing or treating in a plurality of work-stations
- H10P72/0464—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the construction of the transfer chamber
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0451—Apparatus for manufacturing or treating in a plurality of work-stations
- H10P72/0461—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the presence of two or more transfer chambers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0612—Production flow monitoring, e.g. for increasing throughput
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
- H10P72/3208—Changing the direction of the conveying path
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
- H10P72/3304—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber characterised by movements or sequence of movements of transfer devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/139—Associated with semiconductor wafer handling including wafer charging or discharging means for vacuum chamber
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/093,480 US9099506B2 (en) | 2005-03-30 | 2005-03-30 | Transfer chamber between workstations |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200644050A TW200644050A (en) | 2006-12-16 |
| TWI395255B true TWI395255B (zh) | 2013-05-01 |
Family
ID=37054076
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW095111131A TWI395255B (zh) | 2005-03-30 | 2006-03-30 | 工作站間之移送室 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9099506B2 (https=) |
| JP (2) | JP5751690B2 (https=) |
| KR (2) | KR101567917B1 (https=) |
| CN (1) | CN101189713B (https=) |
| TW (1) | TWI395255B (https=) |
| WO (1) | WO2006105195A2 (https=) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8531678B2 (en) * | 1999-07-09 | 2013-09-10 | Nova Measuring Instruments, Ltd. | Method and system for measuring patterned structures |
| US7891936B2 (en) | 2005-03-30 | 2011-02-22 | Brooks Automation, Inc. | High speed substrate aligner apparatus |
| US8545165B2 (en) | 2005-03-30 | 2013-10-01 | Brooks Automation, Inc. | High speed substrate aligner apparatus |
| US20080019806A1 (en) * | 2006-07-24 | 2008-01-24 | Nyi Oo Myo | Small footprint modular processing system |
| DE102008062080A1 (de) * | 2008-12-12 | 2010-06-17 | Karlsruher Institut für Technologie | Vorrichtung zum Transport atmosphärenempfindlicher Proben und Verwendung derselben |
| TW201123340A (en) * | 2009-11-12 | 2011-07-01 | Hitachi High Tech Corp | Vacuum processing system and vacuum processing method of semiconductor processing substrate |
| US8974601B2 (en) | 2011-07-29 | 2015-03-10 | Semes Co., Ltd. | Apparatuses, systems and methods for treating substrate |
| JP5923288B2 (ja) * | 2011-12-01 | 2016-05-24 | 株式会社日立ハイテクノロジーズ | 真空処理装置及び真空処理装置の運転方法 |
| SG11202009105YA (en) * | 2018-03-20 | 2020-10-29 | Tokyo Electron Ltd | Self-aware and correcting heterogenous platform incorporating integrated semiconductor processing modules and method for using same |
| SG11202009243SA (en) * | 2018-03-23 | 2020-10-29 | Brooks Automation Inc | Automated cryogenic storage and retrieval system |
| US10886155B2 (en) * | 2019-01-16 | 2021-01-05 | Applied Materials, Inc. | Optical stack deposition and on-board metrology |
| JP2024131483A (ja) * | 2023-03-16 | 2024-09-30 | キオクシア株式会社 | 半導体製造装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5695564A (en) * | 1994-08-19 | 1997-12-09 | Tokyo Electron Limited | Semiconductor processing system |
| US20040105737A1 (en) * | 1998-11-17 | 2004-06-03 | Tokyo Electron Limited | Vacuum process system |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5310410A (en) * | 1990-04-06 | 1994-05-10 | Sputtered Films, Inc. | Method for processing semi-conductor wafers in a multiple vacuum and non-vacuum chamber apparatus |
| JPH04298059A (ja) | 1991-03-27 | 1992-10-21 | Hitachi Ltd | 真空処理装置 |
| JPH06151552A (ja) * | 1992-11-10 | 1994-05-31 | Hitachi Ltd | 半導体製造装置およびそれを用いた半導体製造方法 |
| KR970011065B1 (ko) | 1992-12-21 | 1997-07-05 | 다이닛뽕 스크린 세이조오 가부시키가이샤 | 기판처리장치와 기판처리장치에 있어서 기판교환장치 및 기판교환방법 |
| JP3453223B2 (ja) | 1994-08-19 | 2003-10-06 | 東京エレクトロン株式会社 | 処理装置 |
| JPH08151552A (ja) | 1994-11-29 | 1996-06-11 | Japan Synthetic Rubber Co Ltd | ハードコートフィルム |
| JP2981844B2 (ja) | 1996-05-16 | 1999-11-22 | 住友重機械工業株式会社 | 薄膜製造装置 |
| US6280134B1 (en) * | 1997-06-17 | 2001-08-28 | Applied Materials, Inc. | Apparatus and method for automated cassette handling |
| US6235634B1 (en) * | 1997-10-08 | 2001-05-22 | Applied Komatsu Technology, Inc. | Modular substrate processing system |
| US6038490A (en) * | 1998-01-29 | 2000-03-14 | International Business Machines Corporation | Automated data storage library dual picker interference avoidance |
| KR100265287B1 (ko) | 1998-04-21 | 2000-10-02 | 윤종용 | 반도체소자 제조용 식각설비의 멀티챔버 시스템 |
| JP2000150618A (ja) | 1998-11-17 | 2000-05-30 | Tokyo Electron Ltd | 真空処理システム |
| JP4256551B2 (ja) | 1998-12-25 | 2009-04-22 | 東京エレクトロン株式会社 | 真空処理システム |
| US6662076B1 (en) * | 1999-02-10 | 2003-12-09 | Advanced Micro Devices, Inc. | Management of move requests from a factory system to an automated material handling system |
| JP2000312463A (ja) | 1999-04-27 | 2000-11-07 | Shinko Electric Co Ltd | リニアモータのレール接続構造 |
| TW504941B (en) * | 1999-07-23 | 2002-10-01 | Semiconductor Energy Lab | Method of fabricating an EL display device, and apparatus for forming a thin film |
| JP2001315960A (ja) | 2000-05-09 | 2001-11-13 | Meidensha Corp | 基板搬送装置 |
| JP4021125B2 (ja) * | 2000-06-02 | 2007-12-12 | 東京エレクトロン株式会社 | ウェハ移載装置の装置ユニット接続時に用いられるレールの真直性保持装置 |
| US6852194B2 (en) | 2001-05-21 | 2005-02-08 | Tokyo Electron Limited | Processing apparatus, transferring apparatus and transferring method |
| US6779962B2 (en) | 2002-03-22 | 2004-08-24 | Brooks Automation, Inc. | Device for handling flat panels in a vacuum |
| WO2004010476A2 (en) | 2002-07-22 | 2004-01-29 | Brooks Automation, Inc. | Substrate processing apparatus |
| US6968257B2 (en) * | 2003-11-21 | 2005-11-22 | International Business Machines Corporation | Continued execution of accessor commands on a restricted multiple accessor path of an automated data storage library |
| US8085676B2 (en) * | 2006-06-29 | 2011-12-27 | Nortel Networks Limited | Method and system for looping back traffic in QIQ ethernet rings and 1:1 protected PBT trunks |
-
2005
- 2005-03-30 US US11/093,480 patent/US9099506B2/en active Active
-
2006
- 2006-03-29 WO PCT/US2006/011461 patent/WO2006105195A2/en not_active Ceased
- 2006-03-29 KR KR1020147033479A patent/KR101567917B1/ko not_active Expired - Lifetime
- 2006-03-29 JP JP2008504312A patent/JP5751690B2/ja not_active Expired - Fee Related
- 2006-03-29 CN CN200680019260.7A patent/CN101189713B/zh not_active Expired - Fee Related
- 2006-03-29 KR KR1020077024974A patent/KR20070119057A/ko not_active Ceased
- 2006-03-30 TW TW095111131A patent/TWI395255B/zh not_active IP Right Cessation
-
2013
- 2013-10-25 JP JP2013222380A patent/JP2014060412A/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5695564A (en) * | 1994-08-19 | 1997-12-09 | Tokyo Electron Limited | Semiconductor processing system |
| US20040105737A1 (en) * | 1998-11-17 | 2004-06-03 | Tokyo Electron Limited | Vacuum process system |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101189713A (zh) | 2008-05-28 |
| US20060245847A1 (en) | 2006-11-02 |
| WO2006105195A2 (en) | 2006-10-05 |
| WO2006105195A3 (en) | 2007-11-01 |
| TW200644050A (en) | 2006-12-16 |
| KR20070119057A (ko) | 2007-12-18 |
| US9099506B2 (en) | 2015-08-04 |
| JP5751690B2 (ja) | 2015-07-22 |
| KR20150002888A (ko) | 2015-01-07 |
| CN101189713B (zh) | 2012-03-28 |
| JP2008535262A (ja) | 2008-08-28 |
| JP2014060412A (ja) | 2014-04-03 |
| KR101567917B1 (ko) | 2015-11-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7263639B2 (ja) | 基板搬送部 | |
| JP2014060412A (ja) | 半導体製造装置 | |
| TWI416651B (zh) | 基板處理裝置 | |
| US6270306B1 (en) | Wafer aligner in center of front end frame of vacuum system | |
| KR100493989B1 (ko) | 레지스트처리시스템및레지스트처리방법 | |
| US9368382B2 (en) | Elevator-based tool loading and buffering system | |
| US8313277B2 (en) | Semiconductor manufacturing process modules | |
| CN105556652B (zh) | 使传输中衬底居中的处理设备 | |
| US20100158643A1 (en) | Elevator-based tool loading and buffering system | |
| JP2004031901A (ja) | センサボックスを備えたウエハ処理装置 | |
| US10319621B2 (en) | Semiconductor processing assembly and facility | |
| US8292563B2 (en) | Nonproductive wafer buffer module for substrate processing apparatus | |
| US6364592B1 (en) | Small footprint carrier front end loader | |
| KR20170055819A (ko) | 기판 처리 장치 | |
| CN1985350A (zh) | 加工工具中晶片的处理系统 | |
| JP7110483B2 (ja) | 基板処理装置、半導体装置の製造方法及びプログラム | |
| CN118435340A (zh) | 用于混合式基板接合系统的foup或卡匣存储 | |
| EP2245656B1 (en) | Automatic handling buffer for bare stocker | |
| JP3082784B2 (ja) | 被洗浄体の洗浄方法及び洗浄装置 | |
| KR20230048610A (ko) | 기판 처리 장치 및 기판 처리 방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |