TWI390773B - 光電元件之製法及光電元件 - Google Patents
光電元件之製法及光電元件 Download PDFInfo
- Publication number
- TWI390773B TWI390773B TW098121295A TW98121295A TWI390773B TW I390773 B TWI390773 B TW I390773B TW 098121295 A TW098121295 A TW 098121295A TW 98121295 A TW98121295 A TW 98121295A TW I390773 B TWI390773 B TW I390773B
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- sequence
- layer sequence
- sub
- contact
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 43
- 239000000758 substrate Substances 0.000 claims description 72
- 239000000463 material Substances 0.000 claims description 39
- 238000000034 method Methods 0.000 claims description 34
- 238000000151 deposition Methods 0.000 claims description 30
- 230000008021 deposition Effects 0.000 claims description 30
- 239000004020 conductor Substances 0.000 claims description 14
- 230000005670 electromagnetic radiation Effects 0.000 claims description 11
- 238000005530 etching Methods 0.000 claims description 11
- 239000011810 insulating material Substances 0.000 claims description 9
- 238000009792 diffusion process Methods 0.000 claims description 8
- 230000008646 thermal stress Effects 0.000 claims description 8
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 claims description 7
- 229910052707 ruthenium Inorganic materials 0.000 claims description 7
- 239000002800 charge carrier Substances 0.000 claims description 6
- 238000003892 spreading Methods 0.000 claims description 6
- 230000007480 spreading Effects 0.000 claims description 6
- 150000004767 nitrides Chemical class 0.000 claims description 5
- 239000010410 layer Substances 0.000 description 333
- 239000004065 semiconductor Substances 0.000 description 33
- 229910002601 GaN Inorganic materials 0.000 description 19
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 15
- 150000001875 compounds Chemical class 0.000 description 13
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 12
- 230000035882 stress Effects 0.000 description 12
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 9
- 239000000126 substance Substances 0.000 description 8
- 229910052732 germanium Inorganic materials 0.000 description 7
- 239000010409 thin film Substances 0.000 description 7
- 229910052757 nitrogen Inorganic materials 0.000 description 5
- 229910052715 tantalum Inorganic materials 0.000 description 5
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 229910052738 indium Inorganic materials 0.000 description 4
- -1 nitride compound Chemical class 0.000 description 4
- 230000005693 optoelectronics Effects 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 238000007788 roughening Methods 0.000 description 4
- 235000012431 wafers Nutrition 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000000407 epitaxy Methods 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 229910021478 group 5 element Inorganic materials 0.000 description 2
- 229910021476 group 6 element Inorganic materials 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 229910052758 niobium Inorganic materials 0.000 description 2
- 239000010955 niobium Substances 0.000 description 2
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 2
- 229910017464 nitrogen compound Inorganic materials 0.000 description 2
- 150000002830 nitrogen compounds Chemical class 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 229910052594 sapphire Inorganic materials 0.000 description 2
- 239000010980 sapphire Substances 0.000 description 2
- 238000000927 vapour-phase epitaxy Methods 0.000 description 2
- 238000003631 wet chemical etching Methods 0.000 description 2
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- 206010063493 Premature ageing Diseases 0.000 description 1
- 208000032038 Premature aging Diseases 0.000 description 1
- 229910003363 ZnMgO Inorganic materials 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 238000002248 hydride vapour-phase epitaxy Methods 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 1
- NFFIWVVINABMKP-UHFFFAOYSA-N methylidynetantalum Chemical compound [Ta]#C NFFIWVVINABMKP-UHFFFAOYSA-N 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 229910003468 tantalcarbide Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/83—Electrodes
- H10H20/831—Electrodes characterised by their shape
- H10H20/8312—Electrodes characterised by their shape extending at least partially through the bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/815—Bodies having stress relaxation structures, e.g. buffer layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/814—Bodies having reflecting means, e.g. semiconductor Bragg reflectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/816—Bodies having carrier transport control structures, e.g. highly-doped semiconductor layers or current-blocking structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/819—Bodies characterised by their shape, e.g. curved or truncated substrates
- H10H20/82—Roughened surfaces, e.g. at the interface between epitaxial layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
- H10H20/0133—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials
- H10H20/01335—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials the light-emitting regions comprising nitride materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/018—Bonding of wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/857—Interconnections, e.g. lead-frames, bond wires or solder balls
Landscapes
- Led Devices (AREA)
- Photovoltaic Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102008030584A DE102008030584A1 (de) | 2008-06-27 | 2008-06-27 | Verfahren zur Herstellung eines optoelektronischen Bauelementes und optoelektronisches Bauelement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201004000A TW201004000A (en) | 2010-01-16 |
| TWI390773B true TWI390773B (zh) | 2013-03-21 |
Family
ID=41211955
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW098121295A TWI390773B (zh) | 2008-06-27 | 2009-06-25 | 光電元件之製法及光電元件 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US8283191B2 (enExample) |
| EP (1) | EP2289115B1 (enExample) |
| JP (1) | JP5520942B2 (enExample) |
| KR (1) | KR101629984B1 (enExample) |
| CN (2) | CN102067343B (enExample) |
| DE (1) | DE102008030584A1 (enExample) |
| TW (1) | TWI390773B (enExample) |
| WO (1) | WO2009155897A1 (enExample) |
Families Citing this family (58)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8471288B2 (en) * | 2009-09-15 | 2013-06-25 | Toyoda Gosei Co., Ltd. | Group III nitride semiconductor light-emitting device including an auxiliary electrode in contact with a back surface of an n-type layer |
| KR101039999B1 (ko) * | 2010-02-08 | 2011-06-09 | 엘지이노텍 주식회사 | 반도체 발광소자 및 그 제조방법 |
| KR100986560B1 (ko) * | 2010-02-11 | 2010-10-07 | 엘지이노텍 주식회사 | 발광소자 및 그 제조방법 |
| DE102010025320B4 (de) * | 2010-06-28 | 2021-11-11 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronisches Bauelement und Verfahren zu dessen Herstellung |
| KR101252032B1 (ko) | 2010-07-08 | 2013-04-10 | 삼성전자주식회사 | 반도체 발광소자 및 이의 제조방법 |
| KR101761385B1 (ko) | 2010-07-12 | 2017-08-04 | 엘지이노텍 주식회사 | 발광 소자 |
| KR101692410B1 (ko) * | 2010-07-26 | 2017-01-03 | 삼성전자 주식회사 | 발광소자 및 그 제조방법 |
| DE102010033137A1 (de) | 2010-08-03 | 2012-02-09 | Osram Opto Semiconductors Gmbh | Leuchtdiodenchip |
| DE102010044986A1 (de) * | 2010-09-10 | 2012-03-15 | Osram Opto Semiconductors Gmbh | Leuchtdiodenchip und Verfahren zur Herstellung eines Leuchtdiodenchips |
| KR101114191B1 (ko) * | 2010-09-17 | 2012-03-13 | 엘지이노텍 주식회사 | 발광소자 |
| KR101761386B1 (ko) * | 2010-10-06 | 2017-07-25 | 엘지이노텍 주식회사 | 발광 소자 |
| KR101730152B1 (ko) * | 2010-10-06 | 2017-04-25 | 엘지이노텍 주식회사 | 발광 소자 |
| TWI532214B (zh) | 2010-10-12 | 2016-05-01 | Lg伊諾特股份有限公司 | 發光元件及其封裝 |
| DE102011011140A1 (de) | 2011-02-14 | 2012-08-16 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterchip und Verfahren zur Herstellung von optoelektronischen Halbleiterchips |
| JP5050109B2 (ja) | 2011-03-14 | 2012-10-17 | 株式会社東芝 | 半導体発光素子 |
| DE102011016302A1 (de) * | 2011-04-07 | 2012-10-11 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterchip |
| TWI434405B (zh) | 2011-06-07 | 2014-04-11 | 國立交通大學 | 具有積體電路與發光二極體之異質整合結構及其製作方法 |
| KR101880445B1 (ko) * | 2011-07-14 | 2018-07-24 | 엘지이노텍 주식회사 | 발광소자, 발광소자 제조방법, 발광소자 패키지, 및 라이트 유닛 |
| CN108807626B (zh) * | 2011-09-15 | 2020-02-21 | 晶元光电股份有限公司 | 发光元件 |
| KR101827975B1 (ko) * | 2011-10-10 | 2018-03-29 | 엘지이노텍 주식회사 | 발광소자 |
| CN103050593A (zh) * | 2011-10-17 | 2013-04-17 | 大连美明外延片科技有限公司 | AlGaInP四元系发光二极管外延片及其生长方法 |
| EP2597687B1 (en) * | 2011-11-23 | 2016-02-03 | Imec | Method for producing a GaN LED device |
| KR102116152B1 (ko) * | 2012-03-19 | 2020-05-28 | 루미리즈 홀딩 비.브이. | 실리콘 기판 상에서 성장하는 발광 장치 |
| JP5740350B2 (ja) * | 2012-05-31 | 2015-06-24 | 株式会社東芝 | 半導体発光素子 |
| WO2013182980A1 (en) * | 2012-06-07 | 2013-12-12 | Koninklijke Philips N.V. | Chip scale light emitting device with metal pillars in a molding compound formed at wafer level |
| DE102012105176B4 (de) * | 2012-06-14 | 2021-08-12 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronischer Halbleiterchip |
| TW201401552A (zh) * | 2012-06-19 | 2014-01-01 | High Power Optoelectronics Inc | 發光二極體的熱應力釋放結構 |
| US8552457B1 (en) * | 2012-08-07 | 2013-10-08 | High Power Opto. Inc. | Thermal stress releasing structure of a light-emitting diode |
| JP5881560B2 (ja) * | 2012-08-30 | 2016-03-09 | 株式会社東芝 | 半導体発光装置及びその製造方法 |
| US9082692B2 (en) * | 2013-01-02 | 2015-07-14 | Micron Technology, Inc. | Engineered substrate assemblies with epitaxial templates and related systems, methods, and devices |
| DE102013103409A1 (de) * | 2013-04-05 | 2014-10-09 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterchip und optoelektronisches Modul |
| KR102188495B1 (ko) | 2014-01-21 | 2020-12-08 | 삼성전자주식회사 | 반도체 발광소자의 제조 방법 |
| JP5788046B2 (ja) * | 2014-04-03 | 2015-09-30 | 株式会社東芝 | 半導体発光素子 |
| EP3131129B1 (en) * | 2014-04-07 | 2020-07-15 | LG Innotek Co., Ltd. | Light-emitting element |
| KR102163967B1 (ko) * | 2014-04-16 | 2020-10-12 | 엘지이노텍 주식회사 | 발광소자 및 조명시스템 |
| KR102163956B1 (ko) * | 2014-04-07 | 2020-10-12 | 엘지이노텍 주식회사 | 발광소자 및 조명시스템 |
| KR102153125B1 (ko) * | 2014-06-11 | 2020-09-07 | 엘지이노텍 주식회사 | 발광소자 및 조명시스템 |
| DE102014108373A1 (de) | 2014-06-13 | 2015-12-17 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterchip |
| DE102015105509A1 (de) * | 2015-04-10 | 2016-10-13 | Osram Opto Semiconductors Gmbh | Bauelement und Verfahren zur Herstellung eines Bauelements |
| DE102015111046B9 (de) * | 2015-07-08 | 2022-09-22 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronischer Halbleiterchip |
| KR102432015B1 (ko) | 2015-11-09 | 2022-08-12 | 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 | 자외선 발광소자 및 발광소자 패키지 |
| CN105470359B (zh) * | 2015-12-31 | 2018-05-08 | 天津三安光电有限公司 | 具有内嵌式电极结构的高功率led结构及其制备方法 |
| DE102017103041B4 (de) | 2017-02-15 | 2023-12-14 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Verfahren zur Herstellung einer Vielzahl von optoelektronischen Bauelementen und optoelektronisches Bauelement |
| US10892297B2 (en) | 2017-11-27 | 2021-01-12 | Seoul Viosys Co., Ltd. | Light emitting diode (LED) stack for a display |
| US11527519B2 (en) | 2017-11-27 | 2022-12-13 | Seoul Viosys Co., Ltd. | LED unit for display and display apparatus having the same |
| US12100696B2 (en) | 2017-11-27 | 2024-09-24 | Seoul Viosys Co., Ltd. | Light emitting diode for display and display apparatus having the same |
| US10892296B2 (en) * | 2017-11-27 | 2021-01-12 | Seoul Viosys Co., Ltd. | Light emitting device having commonly connected LED sub-units |
| US11282981B2 (en) | 2017-11-27 | 2022-03-22 | Seoul Viosys Co., Ltd. | Passivation covered light emitting unit stack |
| US10748881B2 (en) | 2017-12-05 | 2020-08-18 | Seoul Viosys Co., Ltd. | Light emitting device with LED stack for display and display apparatus having the same |
| US10886327B2 (en) | 2017-12-14 | 2021-01-05 | Seoul Viosys Co., Ltd. | Light emitting stacked structure and display device having the same |
| US11552057B2 (en) | 2017-12-20 | 2023-01-10 | Seoul Viosys Co., Ltd. | LED unit for display and display apparatus having the same |
| US11522006B2 (en) | 2017-12-21 | 2022-12-06 | Seoul Viosys Co., Ltd. | Light emitting stacked structure and display device having the same |
| US11552061B2 (en) | 2017-12-22 | 2023-01-10 | Seoul Viosys Co., Ltd. | Light emitting device with LED stack for display and display apparatus having the same |
| US11114499B2 (en) | 2018-01-02 | 2021-09-07 | Seoul Viosys Co., Ltd. | Display device having light emitting stacked structure |
| US10784240B2 (en) | 2018-01-03 | 2020-09-22 | Seoul Viosys Co., Ltd. | Light emitting device with LED stack for display and display apparatus having the same |
| DE102019106521A1 (de) * | 2019-03-14 | 2020-09-17 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Aufwachsstruktur für ein Strahlung emittierendes Halbleiterbauelement und Strahlung emittierendes Halbleiterbauelement |
| US11296266B2 (en) * | 2019-11-26 | 2022-04-05 | Facebook Technologies, Llc | LED array having transparent substrate with conductive layer for enhanced current spread |
| CN120615172A (zh) * | 2022-12-30 | 2025-09-09 | 上海联影医疗科技股份有限公司 | 用于探测辐射线的光子计数探测器 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6121638A (en) * | 1995-09-12 | 2000-09-19 | Kabushiki Kaisha Toshiba | Multi-layer structured nitride-based semiconductor devices |
| US5763941A (en) * | 1995-10-24 | 1998-06-09 | Tessera, Inc. | Connection component with releasable leads |
| EP2169733B1 (de) | 1997-09-29 | 2017-07-19 | OSRAM Opto Semiconductors GmbH | Halbleiterlichtquelle |
| US6465744B2 (en) * | 1998-03-27 | 2002-10-15 | Tessera, Inc. | Graded metallic leads for connection to microelectronic elements |
| CN1292494C (zh) | 2000-04-26 | 2006-12-27 | 奥斯兰姆奥普托半导体有限责任公司 | 发光半导体元件及其制造方法 |
| DE10020464A1 (de) * | 2000-04-26 | 2001-11-08 | Osram Opto Semiconductors Gmbh | Strahlungsemittierendes Halbleiterbauelement auf GaN-Basis |
| US20020017652A1 (en) | 2000-08-08 | 2002-02-14 | Stefan Illek | Semiconductor chip for optoelectronics |
| DE10147886B4 (de) * | 2001-09-28 | 2006-07-13 | Osram Opto Semiconductors Gmbh | Lumineszenzdiode mit vergrabenem Kontakt und Herstellungsverfahren |
| US6828596B2 (en) * | 2002-06-13 | 2004-12-07 | Lumileds Lighting U.S., Llc | Contacting scheme for large and small area semiconductor light emitting flip chip devices |
| US7115896B2 (en) * | 2002-12-04 | 2006-10-03 | Emcore Corporation | Semiconductor structures for gallium nitride-based devices |
| US7230292B2 (en) * | 2003-08-05 | 2007-06-12 | Micron Technology, Inc. | Stud electrode and process for making same |
| US8835937B2 (en) | 2004-02-20 | 2014-09-16 | Osram Opto Semiconductors Gmbh | Optoelectronic component, device comprising a plurality of optoelectronic components, and method for the production of an optoelectronic component |
| US20050205883A1 (en) * | 2004-03-19 | 2005-09-22 | Wierer Jonathan J Jr | Photonic crystal light emitting device |
| DE102005016592A1 (de) | 2004-04-14 | 2005-11-24 | Osram Opto Semiconductors Gmbh | Leuchtdiodenchip |
| WO2006035664A1 (ja) * | 2004-09-27 | 2006-04-06 | Matsushita Electric Industrial Co., Ltd. | 半導体発光素子、その製造方法及びその実装方法、並びに発光装置 |
| JP4826703B2 (ja) | 2004-09-29 | 2011-11-30 | サンケン電気株式会社 | 半導体素子の形成に使用するための板状基体 |
| US20060124956A1 (en) | 2004-12-13 | 2006-06-15 | Hui Peng | Quasi group III-nitride substrates and methods of mass production of the same |
| US7413918B2 (en) * | 2005-01-11 | 2008-08-19 | Semileds Corporation | Method of making a light emitting diode |
| CN100372137C (zh) | 2005-05-27 | 2008-02-27 | 晶能光电(江西)有限公司 | 具有上下电极结构的铟镓铝氮发光器件及其制造方法 |
| US9406505B2 (en) | 2006-02-23 | 2016-08-02 | Allos Semiconductors Gmbh | Nitride semiconductor component and process for its production |
| DE102006008929A1 (de) * | 2006-02-23 | 2007-08-30 | Azzurro Semiconductors Ag | Nitridhalbleiter-Bauelement und Verfahren zu seiner Herstellung |
| EP1883141B1 (de) | 2006-07-27 | 2017-05-24 | OSRAM Opto Semiconductors GmbH | LD oder LED mit Übergitter-Mantelschicht |
| DE102006046237A1 (de) * | 2006-07-27 | 2008-01-31 | Osram Opto Semiconductors Gmbh | Halbleiter-Schichtstruktur mit Übergitter |
| DE102006043400A1 (de) * | 2006-09-15 | 2008-03-27 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterchip |
| US7697584B2 (en) * | 2006-10-02 | 2010-04-13 | Philips Lumileds Lighting Company, Llc | Light emitting device including arrayed emitters defined by a photonic crystal |
-
2008
- 2008-06-27 DE DE102008030584A patent/DE102008030584A1/de not_active Withdrawn
-
2009
- 2009-06-09 CN CN2009801239731A patent/CN102067343B/zh active Active
- 2009-06-09 JP JP2011515085A patent/JP5520942B2/ja active Active
- 2009-06-09 CN CN201310119419.4A patent/CN103280497B/zh active Active
- 2009-06-09 KR KR1020117000338A patent/KR101629984B1/ko active Active
- 2009-06-09 WO PCT/DE2009/000810 patent/WO2009155897A1/de not_active Ceased
- 2009-06-09 US US12/990,243 patent/US8283191B2/en active Active
- 2009-06-09 EP EP09768821.2A patent/EP2289115B1/de active Active
- 2009-06-25 TW TW098121295A patent/TWI390773B/zh not_active IP Right Cessation
-
2012
- 2012-08-30 US US13/598,896 patent/US8956897B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2011525708A (ja) | 2011-09-22 |
| US20110104836A1 (en) | 2011-05-05 |
| CN102067343B (zh) | 2013-05-08 |
| JP5520942B2 (ja) | 2014-06-11 |
| CN102067343A (zh) | 2011-05-18 |
| US8956897B2 (en) | 2015-02-17 |
| US8283191B2 (en) | 2012-10-09 |
| CN103280497B (zh) | 2016-08-03 |
| DE102008030584A1 (de) | 2009-12-31 |
| KR101629984B1 (ko) | 2016-06-13 |
| CN103280497A (zh) | 2013-09-04 |
| EP2289115A1 (de) | 2011-03-02 |
| EP2289115B1 (de) | 2017-08-09 |
| WO2009155897A1 (de) | 2009-12-30 |
| US20120322186A1 (en) | 2012-12-20 |
| KR20110030542A (ko) | 2011-03-23 |
| TW201004000A (en) | 2010-01-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI390773B (zh) | 光電元件之製法及光電元件 | |
| KR102681571B1 (ko) | 다이오드 매트릭스를 갖는 광전자 디바이스를 제조하기 위한 프로세스 | |
| JP5475833B2 (ja) | 垂直型発光素子 | |
| TWI452731B (zh) | 光電半導體晶片及其製造方法 | |
| US20070290224A1 (en) | Method of manufacturing nitride semiconductor light-emitting element and nitride semiconductor light-emitting element | |
| KR20100068839A (ko) | 발광 소자의 제조 방법 | |
| CN102067345A (zh) | 用于制备具有双面钝化的半导体发光器件的方法 | |
| US7772600B2 (en) | Light emitting device having zener diode therein and method of fabricating the same | |
| TWI437737B (zh) | 發光二極體結構及其製造方法 | |
| KR102255305B1 (ko) | 수직형 반도체 발광소자 및 그 제조 방법 | |
| CN101601142A (zh) | 半导体芯片和用于制造半导体芯片的方法 | |
| JP2010165983A (ja) | 発光チップ集積デバイスおよびその製造方法 | |
| KR20090112854A (ko) | 그룹 3족 질화물계 반도체 발광다이오드 소자 및 이의 제조방법 | |
| KR101189163B1 (ko) | 발광 다이오드의 제조방법 | |
| KR20210006538A (ko) | 반도체 발광소자 제조방법 | |
| TWI887590B (zh) | 發光元件 | |
| KR20130067514A (ko) | 반도체 소자 제조 방법 | |
| KR100730756B1 (ko) | 제너 다이오드를 구비하는 발광소자 및 그것을 제조하는방법 | |
| TWI493759B (zh) | 發光二極體結構及其製造方法 | |
| TWI600181B (zh) | 發光裝置及其製造方法 | |
| TWI395349B (zh) | 發光二極體晶片及其製造方法 | |
| KR20150109143A (ko) | 버퍼 구조물을 구비하는 발광 소자 및 이의 제조 방법 | |
| KR20130067515A (ko) | 반도체 소자 제조 방법 | |
| KR20150112236A (ko) | 발광 다이오드 및 그 제조 방법 | |
| KR20080002163A (ko) | 제너 다이오드를 구비하는 발광 다이오드 패키지 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |