TWI389767B - Substrate grinding apparatus and substrate grinding method - Google Patents
Substrate grinding apparatus and substrate grinding method Download PDFInfo
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- TWI389767B TWI389767B TW095130466A TW95130466A TWI389767B TW I389767 B TWI389767 B TW I389767B TW 095130466 A TW095130466 A TW 095130466A TW 95130466 A TW95130466 A TW 95130466A TW I389767 B TWI389767 B TW I389767B
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- polishing
- sheet
- substrate
- film body
- film
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- 239000000758 substrate Substances 0.000 title claims abstract description 84
- 238000000034 method Methods 0.000 title claims description 12
- 238000005498 polishing Methods 0.000 claims abstract description 108
- 239000012530 fluid Substances 0.000 claims description 7
- 239000004417 polycarbonate Substances 0.000 claims description 6
- 229920000515 polycarbonate Polymers 0.000 claims description 6
- 239000010935 stainless steel Substances 0.000 claims description 4
- 229910001220 stainless steel Inorganic materials 0.000 claims description 4
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 claims description 3
- -1 acryl Chemical group 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- 229920000049 Carbon (fiber) Polymers 0.000 claims description 2
- 239000004917 carbon fiber Substances 0.000 claims description 2
- 239000003365 glass fiber Substances 0.000 claims description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 claims description 2
- 239000004033 plastic Substances 0.000 claims 1
- 229920003023 plastic Polymers 0.000 claims 1
- 239000011521 glass Substances 0.000 abstract description 40
- 230000008602 contraction Effects 0.000 abstract description 10
- 238000005096 rolling process Methods 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 18
- 238000012423 maintenance Methods 0.000 description 7
- 239000000463 material Substances 0.000 description 7
- 230000032258 transport Effects 0.000 description 7
- 230000002093 peripheral effect Effects 0.000 description 6
- 229920002430 Fibre-reinforced plastic Polymers 0.000 description 4
- XECAHXYUAAWDEL-UHFFFAOYSA-N acrylonitrile butadiene styrene Chemical compound C=CC=C.C=CC#N.C=CC1=CC=CC=C1 XECAHXYUAAWDEL-UHFFFAOYSA-N 0.000 description 4
- 239000004676 acrylonitrile butadiene styrene Substances 0.000 description 4
- 229920000122 acrylonitrile butadiene styrene Polymers 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 239000004918 carbon fiber reinforced polymer Substances 0.000 description 4
- 239000011151 fibre-reinforced plastic Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000012528 membrane Substances 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 239000000725 suspension Substances 0.000 description 3
- VZXTWGWHSMCWGA-UHFFFAOYSA-N 1,3,5-triazine-2,4-diamine Chemical compound NC1=NC=NC(N)=N1 VZXTWGWHSMCWGA-UHFFFAOYSA-N 0.000 description 2
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 2
- 239000000835 fiber Substances 0.000 description 2
- 239000011152 fibreglass Substances 0.000 description 2
- 239000005357 flat glass Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 229920001778 nylon Polymers 0.000 description 2
- 229920002635 polyurethane Polymers 0.000 description 2
- 239000004814 polyurethane Substances 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000003566 sealing material Substances 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
- 239000005977 Ethylene Substances 0.000 description 1
- 239000004677 Nylon Substances 0.000 description 1
- 238000006124 Pilkington process Methods 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000006060 molten glass Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/001—Manufacture of flexible abrasive materials
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
Abstract
Description
本發明係有關於基板研磨裝置,特別是用以將玻璃基板研磨而製造用於平面面板顯示器等的薄板玻璃基板之基板研磨裝置,以及使用有該研磨裝置的基板研磨方法。The present invention relates to a substrate polishing apparatus, in particular, a substrate polishing apparatus for polishing a glass substrate to produce a thin glass substrate for a flat panel display or the like, and a substrate polishing method using the polishing apparatus.
作為製造液晶顯示器等之平面面板顯示器用之薄板玻璃基板的其中之一的方法,係週知有使用被稱為浮製玻板法(float process)的成形法之製造方法。此製造方法,係藉由前述之浮製玻板法將熔解玻璃成形為板狀,而後經由研磨裝置,將玻璃板表面的微小凹凸或是起伏藉由研磨而去除,而製成厚度0.5~1.1mm之薄板狀的方法。As a method of manufacturing one of the thin-plate glass substrates for flat panel displays such as liquid crystal displays, a manufacturing method using a molding method called a float glass process is known. In the manufacturing method, the molten glass is formed into a plate shape by the above-described floating glass plate method, and then the fine irregularities or undulations on the surface of the glass plate are removed by grinding through a polishing device to obtain a thickness of 0.5 to 1.1. The thin plate-like method of mm.
本案申請人係於專利文獻1中,提案有特別是針對平面面板顯示器用之薄板玻璃基板作為對象的研磨裝置。此研磨裝置,係在被安裝有將基板吸著並保持的吸著薄片之膜體,和於其上安裝有此膜體的載置台之間,供給加壓流體,並藉由加壓流體之壓力,將被吸著保持於吸著薄片上之基板推壓接觸於研磨定盤,而研磨之。The applicant of the present invention is disclosed in Patent Document 1, and a polishing apparatus for a thin-plate glass substrate for a flat panel display is proposed. The polishing apparatus is configured to supply a pressurized fluid between a membrane body to which a sorption sheet for absorbing and holding a substrate is attached, and a mounting table on which the membrane body is attached, and to pressurize the fluid The pressure is pressed against the polishing plate by the substrate sucked and held on the absorbing sheet, and is ground.
又,在於專利文獻1中所揭示的膜體,係由氣密保持層、強度保持層、以及平滑層所構成的同時,吸著薄片係經由具有自己吸著力的多孔質發泡聚氨酯薄片所構成。Further, the film body disclosed in Patent Document 1 is composed of an airtight holding layer, a strength holding layer, and a smoothing layer, and the absorbing sheet is formed by a porous foamed urethane sheet having its own absorbing power. .
然而,於專利文獻1中所揭示之研磨裝置,有著在基板研磨中,吸著薄片會從膜體剝離而彎曲捲起而破損基板 的問題存在。針對在研磨中所發生的基板之破損原因,本案申請人係在經由實際機械的實驗中,銳意解析的結果,發現了其係因為以下的事態而產生。However, in the polishing apparatus disclosed in Patent Document 1, in the substrate polishing, the absorbing sheet is peeled off from the film body and is bent up and broken to break the substrate. The problem exists. Regarding the cause of the damage of the substrate which occurred during the polishing, the applicant of the present invention found that it was caused by the following state of the art in the actual mechanical experiment.
亦即是,膜體,係在基板的研磨中,由於受到基板與研磨定盤間所產生的研磨阻抗的關係,因此會從研磨定盤受到朝向拉引方向(伸展方向:面方向)的力。又,由於在研磨中載置台及研磨定盤係在回轉狀態,故膜體會因前述力而反覆受到拉引方向的伸縮力,而成為在拉引方向伸縮。In other words, in the polishing of the substrate, the film is subjected to a force in the drawing direction (stretching direction: surface direction) from the polishing platen due to the relationship between the polishing resistance generated between the substrate and the polishing platen. . Further, since the mounting table and the polishing platen are in the rotating state during polishing, the film body is repeatedly subjected to the stretching force in the drawing direction due to the above-described force, and is stretched and contracted in the drawing direction.
於此,被接著於膜體之,較該膜體更為軟質的吸著薄片,若是伴隨膜體的伸縮而一同作伸縮動作的話,則不會產生問題。但是,由於在吸著薄片上,係吸著保持有基板,亦即是吸著薄片之伸縮動作係被基板所限制住,因此吸著薄片之在拉引方向的伸縮係受到限制。因為此種現象,而使得在伸縮之膜體與不伸縮之吸著薄片之間產生相對的偏移,而藉由此偏移,吸著薄片的周圍邊緣部會從膜體而漸漸剝落。而後,當此剝落的範圍變大時,剝離之部分會在研磨中彎曲捲起。此種問題由於會造成基板的破損,因此變得有必要作維修。Here, the absorbing sheet which is adhered to the film body and is softer than the film body does not cause any problem if the stretching operation is performed together with the expansion and contraction of the film body. However, since the substrate is sucked and held by the absorbing sheet, that is, the stretching operation of the absorbing sheet is restricted by the substrate, the stretching of the absorbing sheet in the drawing direction is restricted. Because of this phenomenon, a relative offset occurs between the stretched film body and the non-stretchable absorbing sheet, and by this offset, the peripheral edge portion of the absorbing sheet gradually peels off from the film body. Then, when the range of the peeling becomes large, the peeled portion is bent and rolled up during the grinding. Such a problem is caused by damage to the substrate, so that it is necessary to perform maintenance.
[專利文獻1]日本特開2004-122351號公報[Patent Document 1] Japanese Patent Laid-Open Publication No. 2004-122351
本發明,係有鑑於前述之問題而進行,其目的為,提 供一種能將基板長時間而圓滑地研磨加工之基板研磨裝置,以及使用有該基板研磨裝置的基板研磨方法。The present invention has been made in view of the foregoing problems, and its purpose is to provide A substrate polishing apparatus capable of polishing a substrate for a long period of time and smoothly polishing, and a substrate polishing method using the substrate polishing apparatus.
為了達成上述目的,本發明,係提供一種基板研磨裝置,其係在被安裝有將基板吸著並保持之吸著薄片的膜體,與在其上被安裝有該膜體的載置台之間,供給加壓流體,並藉由前述加壓流體之壓力,將被吸著於前述吸著薄片並被保持之基板推壓接觸至研磨定盤,並加以研磨的研磨裝置,其特徵為:在前述膜體與前述吸著薄片之間,被接著有中間薄片,該中間薄片之拉引方向的剛性,係較前述吸著薄片之拉引方向的剛性為更高。In order to achieve the above object, the present invention provides a substrate polishing apparatus which is disposed between a film body to which a suction sheet for absorbing and holding a substrate is attached, and a mounting table on which the film body is mounted. a polishing device that supplies a pressurized fluid and presses the substrate sucked by the absorbing sheet and held by the pressure to the polishing plate by the pressure of the pressurized fluid, and is ground, and is characterized in that Between the film body and the absorbing sheet, an intermediate sheet is attached, and the rigidity of the intermediate sheet in the drawing direction is higher than the rigidity of the absorbing sheet in the drawing direction.
於本發明中,在膜體與吸著薄片之間,係接著有中間薄片。因此,藉由對應於研磨阻抗所產生之膜體的朝向拉引方向之伸縮動作,雖然會有在中間薄片與膜體之間產生剝離的情況,但是在中間薄片與吸著薄片之間,係不會產生相對的偏移。其原因,係因為吸著薄片會因基板之吸著而使其伸縮被限制,而中間薄片在拉引方向之剛性係較吸著薄片為更高,而在拉引方向不會產生伸縮。In the present invention, an intermediate sheet is followed between the film body and the absorbing sheet. Therefore, there is a case where peeling occurs between the intermediate sheet and the film body by the stretching operation of the film body in the drawing direction corresponding to the polishing resistance, but between the intermediate sheet and the absorbing sheet, There is no relative offset. The reason for this is that since the absorbing sheet is restricted in stretching by the suction of the substrate, the rigidity of the intermediate sheet in the drawing direction is higher than that in the absorbing sheet, and stretching does not occur in the drawing direction.
其結果,吸著薄片將不會從中間薄片上剝落,而能防止吸著薄片剝離並彎曲捲起。As a result, the absorbing sheet will not peel off from the intermediate sheet, and the absorbing sheet can be prevented from being peeled off and bent up.
於本發明之理想實施形態中,前述吸著薄片,係可使 用由發泡聚氨酯所成者,前述中間薄片,係由聚碳酸酯、丙烯、鋁、不銹鋼、玻璃又或是碳纖維強化塑膠(CFRP:Carbon Fiber Reinforced Plastics)所成者。藉由以此些材料來製造中間薄片,可以提供在基板研磨中於拉引方向不會伸縮的高剛性中間薄片。前述中間薄片,更理想係為由聚碳酸酯所成者。In a preferred embodiment of the present invention, the absorbing sheet can be The intermediate sheet is made of polycarbonate, acryl, aluminum, stainless steel, glass or carbon fiber reinforced plastic (CFRP: Carbon Fiber Reinforced Plastics). By manufacturing the intermediate sheet from such materials, it is possible to provide a highly rigid intermediate sheet which does not stretch in the drawing direction during substrate polishing. The intermediate sheet is more preferably made of polycarbonate.
又,除了此些材料之外,亦可舉例有:ABS(Acrylonitrile Butadiene Styrene)、纖維強化塑膠(FRP:Fiber Reinforced plastics)。Further, in addition to these materials, ABS (Acrylonitrile Butadiene Styrene) and Fiber Reinforced Plastics (FRP) may be exemplified.
又,本發明,係提供一種基板研磨方法,其特徵為:係使用前述研磨裝置來研磨基板。Moreover, the present invention provides a substrate polishing method characterized in that a substrate is polished using the polishing apparatus.
若藉由本發明之基板研磨裝置及基板研磨方法,則由於在膜體與吸著薄片之間,介於存在有於拉引方向其剛性較吸著薄片為更高之中間薄片,因此就算膜體在拉引方向伸縮,中間薄片亦不會在拉引方向伸縮,故在吸著薄片與中間薄片之間不會產生相對偏移,而能防止吸著薄片從中間薄片剝離而彎曲捲起。藉由此,能以研磨裝置長時間地將基板作圓滑地研磨。According to the substrate polishing apparatus and the substrate polishing method of the present invention, the film body and the absorbing sheet are interposed between the film body and the absorbing sheet, and the film is formed to have a higher rigidity than the absorbing sheet in the drawing direction. Since the intermediate sheet does not expand and contract in the drawing direction, the intermediate sheet does not have a relative offset between the absorbing sheet and the intermediate sheet, and the absorbing sheet can be prevented from being peeled off from the intermediate sheet and bent up. Thereby, the substrate can be smoothly polished by the polishing apparatus for a long time.
以下,根據圖面,對本發明之基板研磨裝置及基板研磨方法的理想實施形態作詳細說明。Hereinafter, preferred embodiments of the substrate polishing apparatus and the substrate polishing method of the present invention will be described in detail based on the drawings.
圖1所示之基板研磨裝置10,係用以將大型之玻璃基板G(舉例而言,其中一邊超過2000mm厚度為0.5mm~1.1mm)之單面研磨至液晶顯示器用之玻璃基板所必要的平坦度之研磨裝置。The substrate polishing apparatus 10 shown in FIG. 1 is used to polish a single surface of a large glass substrate G (for example, one side of which is more than 2000 mm thick and has a thickness of 0.5 mm to 1.1 mm) to a glass substrate for a liquid crystal display. Flatness grinding device.
此研磨裝置10,係以:搬送研磨前之玻璃基板G的輸送裝置12;和將玻璃基板G貼著於膜框14之平台16;和第1的研磨平台18;和第2的研磨平台20;和將研磨完畢之玻璃基板G從膜框14取出的平台22;和玻璃基板搬出輸送裝置24;和膜框洗淨平台26;和膜框乾燥平台28;以及膜框回送輸送裝置30作為主要要素而構成。The polishing apparatus 10 is a transport apparatus 12 that transports the glass substrate G before polishing, and a stage 16 that adheres the glass substrate G to the film frame 14; and the first polishing stage 18; and the second polishing stage 20 And a platform 22 for taking out the polished glass substrate G from the film frame 14; and a glass substrate carrying and conveying device 24; and a film frame cleaning platform 26; and a film frame drying platform 28; and a film frame return conveying device 30 as a main It is composed of elements.
又,於研磨裝置10,係設置有將膜框14從平台16搬送至第1的研磨平台18之搬送裝置150;和將膜框14從第1的研磨平台18搬送到第2的研磨平台20之搬送裝置152;和將膜框14從第2的研磨平台20搬送到平台22之搬送裝置154。Further, in the polishing apparatus 10, a conveying device 150 that conveys the film frame 14 from the stage 16 to the first polishing table 18 is provided, and the film frame 14 is transferred from the first polishing table 18 to the second polishing table 20 The conveying device 152; and the conveying device 154 that conveys the film frame 14 from the second polishing table 20 to the stage 22.
經由輸送裝置12而被搬送來的研磨前之玻璃基板G,係被吸著保持於設置在機器人32之機器臂33上的吸著墊片34。而後,經由機器臂33之回轉動作,從輸送裝置12被移載至輸送裝置36,並經由輸送裝置36而被向著平台16搬送。The glass substrate G before polishing which is conveyed via the conveying device 12 is sucked and held by the suction pad 34 provided on the robot arm 33 of the robot 32. Then, it is transferred from the transport device 12 to the transport device 36 via the turning operation of the robot arm 33, and is transported toward the platform 16 via the transport device 36.
於平台16中,首先,將玻璃基板G保持於膜框14。接下來,針對此保持方法作說明。膜框14係於平台16中,被保持於作為玻璃基板貼著手段的未圖示之升降裝置,膜框14,係藉由升降裝置,而下降移動至膜框14下方之玻璃基板G所在的位置,並將張貼設置於膜框14之圖2的膜體 38,推壓於玻璃基板G之上。In the stage 16, first, the glass substrate G is held by the film frame 14. Next, a description will be given of this holding method. The film frame 14 is attached to the platform 16 and held by a lifting device (not shown) as a glass substrate bonding means. The film frame 14 is lowered by the lifting device to the glass substrate G below the film frame 14. Position, and the film body of FIG. 2 disposed on the film frame 14 38, pushing on the glass substrate G.
於膜體38之下面,在被接著有將玻璃基板G自己吸著之多孔質性的發泡聚氨酯製吸著薄片200的同時,由聚碳酸酯所製的中間薄片210,係介於存在此吸著薄片200與膜體38之間,並與吸著薄片200與膜體38相互接著。On the lower surface of the film body 38, a porous foamed polyurethane absorbing sheet 200 that sucks the glass substrate G itself is attached, and the intermediate sheet 210 made of polycarbonate is present. The sheet 200 and the film 38 are sucked together, and the absorbing sheet 200 and the film 38 are adhered to each other.
玻璃基板G,係經由從前述升降裝置而來之推壓力而被推壓至吸著薄片200上,並經由吸著薄片200而被吸著保持。而後,膜框14被保持於圖1之搬送裝置150,被搬送至圖3之第1的研磨平台18,並於此被安裝至載置台52。The glass substrate G is pressed against the absorbing sheet 200 via the pressing force from the lifting device, and is sucked and held by the absorbing sheet 200. Then, the film frame 14 is held by the conveying device 150 of Fig. 1 and conveyed to the first polishing table 18 of Fig. 3, and is attached to the mounting table 52 here.
膜框14係如圖2所示,經由將膜體38張貼設置於上框40與下框42之間後,將上框40與下框42藉由未圖示之螺絲來締結而構成。另外,膜框14或膜體38係並不限定為圓形,而亦可為長方形。As shown in FIG. 2, the film frame 14 is formed by attaching the film body 38 between the upper frame 40 and the lower frame 42, and then the upper frame 40 and the lower frame 42 are joined by screws (not shown). In addition, the film frame 14 or the film body 38 is not limited to a circular shape, and may be a rectangular shape.
此膜體38,係如圖4一般,被構成為由氣密保持層44與強度保持層46所成的兩層構造。氣密保持層44係如圖2及圖5所示,其外周部係為密著於載置台52之下部外周環部53,而保持載置台52之與空氣室54之間的氣密之密封材料。作為密封材的材料,係可舉出有橡膠類、矽類、氟素樹脂、聚氯乙烯(PVC)等之乙烯系、尼龍系以及氨酯等。又,圖4之強度保持層46,係為在保持氣密保持層44的同時,具有能耐住將膜體38全體張貼設置時之張力的特定拉張強度之密封材。又,於其下面,係接著有中間薄片210。作為此接著劑,係可適當使用使用於先前技術之膜體的接著劑,例如理想係可使用聚氨酯系接著劑,又或是 環氧系接著劑。The film body 38 is configured as a two-layer structure of the airtight holding layer 44 and the strength maintaining layer 46 as shown in FIG. As shown in FIGS. 2 and 5, the airtight holding layer 44 is sealed to the outer peripheral ring portion 53 at the lower portion of the mounting table 52, and maintains a hermetic seal between the mounting table 52 and the air chamber 54. material. Examples of the material of the sealing material include ethylene, nylon, and urethane such as rubber, hydrazine, fluorocarbon resin, and polyvinyl chloride (PVC). Further, the strength holding layer 46 of Fig. 4 is a sealing material having a specific tensile strength capable of withstanding the tension when the entire film body 38 is placed, while maintaining the airtight holding layer 44. Further, below it, there is an intermediate sheet 210. As the adhesive, an adhesive used in the film body of the prior art can be suitably used. For example, a polyurethane-based adhesive can be used, or Epoxy based adhesive.
作為強度保持層46之材料,係可使用醯胺纖維、不銹鋼製金網、鋼金網、碳素纖維、玻璃纖維、尼龍纖維、金屬薄片、樹脂薄片等,醯胺纖維係由於其對於拉張力的拉伸量係極為少,故為理想。As the material of the strength maintaining layer 46, guanamine fiber, stainless steel gold mesh, steel mesh, carbon fiber, glass fiber, nylon fiber, metal foil, resin sheet, or the like can be used, and the guanamine fiber is pulled by the tension. The amount of stretch is extremely small, so it is ideal.
接下來,雖針對圖3所示之研磨頭50來作說明,但是由於第1研磨平台18之研磨頭50及第2研磨平台20之研磨頭50係為相同構造,故附加相同之符號來作說明。Next, the polishing head 50 shown in FIG. 3 will be described. However, since the polishing head 50 of the first polishing table 18 and the polishing head 50 of the second polishing table 20 have the same structure, the same symbols are attached. Description.
研磨頭50,係在本體外殼51中內藏有馬達,將此馬達之輸出軸,連結於在鉛直方向垂下的轉軸56而構成。於此轉軸56,係連結有載置台52。又,本體外殼51,係經由升降機構156而與滑動器158連結。藉由以此升降機構156來使本體外殼51相對於滑動器158來升降,在使載置台52相對於第1研磨平台18的研磨墊片58,以及第2研磨平台20的研磨墊片60進退移動的同時,能將貼著於膜框14之玻璃基板G,以特定之研磨壓力推壓於研磨墊片58、60上。In the polishing head 50, a motor is housed in the main body casing 51, and the output shaft of the motor is coupled to a rotating shaft 56 that is suspended in the vertical direction. The mounting shaft 52 is coupled to the rotating shaft 56. Further, the main body casing 51 is coupled to the slider 158 via the elevating mechanism 156. By moving the main body casing 51 relative to the slider 158 by the lifting mechanism 156, the mounting table 52 advances and retreats with respect to the polishing pad 58 of the first polishing table 18 and the polishing pad 60 of the second polishing table 20. At the same time as the movement, the glass substrate G attached to the film frame 14 can be pressed against the polishing pads 58, 60 at a specific polishing pressure.
研磨墊片58,係被貼著於研磨定盤62之上面,在研磨定盤62的下部,連結有經由未圖示之馬達而回轉的回轉軸64。又,研磨墊片60,係被貼著於研磨定盤66之上面,在研磨定盤66的下部,連結有經由未圖示之馬達而回轉的回轉軸68。The polishing pad 58 is attached to the upper surface of the polishing platen 62, and a rotary shaft 64 that is rotated by a motor (not shown) is connected to the lower portion of the polishing platen 62. Further, the polishing pad 60 is attached to the upper surface of the polishing table 66, and a rotary shaft 68 that is rotated by a motor (not shown) is connected to the lower portion of the polishing plate 66.
進而,本體外殼51,係連結於未圖示之公轉驅動機構,而亦具有以特定之公轉半徑而公轉的功能。另外,此公轉驅動機構,係在本體外殼51中內藏有行星齒輪機構,而 亦可經由將行星齒輪機構的輸出軸連結於轉軸56來構成。以上,係為各研磨平台18、20之構成,經由此些之研磨平台18、20,將玻璃基板G研磨,而將玻璃基板G之表面的微小凹凸或是隆起去除。Further, the main body casing 51 is connected to a revolving drive mechanism (not shown), and has a function of revolving with a specific revolution radius. In addition, the revolving drive mechanism has a planetary gear mechanism incorporated in the main body casing 51, and It is also possible to connect the output shaft of the planetary gear mechanism to the rotating shaft 56. The above is the configuration of each of the polishing stages 18 and 20, and the glass substrate G is polished by the polishing stages 18 and 20 to remove minute irregularities or ridges on the surface of the glass substrate G.
另一方面,在第1研磨機構18之滑動器158,係安裝有直動導引構件70、70。直動導引構件70、70係嵌合於導引軌72、72。此導引軌72、72,係如圖1所示,朝向第1研磨平台18之轉軸56或是維修載置台52的維修平台74而被配置。On the other hand, the linear motion guide members 70 and 70 are attached to the slider 158 of the first polishing mechanism 18. The linear motion guiding members 70, 70 are fitted to the guide rails 72, 72. The guide rails 72, 72 are disposed toward the rotating shaft 56 of the first polishing table 18 or the maintenance platform 74 of the maintenance mounting table 52, as shown in FIG.
又,如圖2所示,在第2研磨平台20之滑動器158,亦同樣安裝有直動導引構件70、70,直動導引構件70、70,係嵌合於導引軌160、160。此導引軌160、160,係如圖1所示,朝向第2研磨平台20之轉軸56或是維修載置台52的維修平台76而被配置。Further, as shown in FIG. 2, in the slider 158 of the second polishing table 20, the linear motion guiding members 70 and 70 are also attached, and the linear motion guiding members 70 and 70 are fitted to the guide rail 160. 160. The guide rails 160 and 160 are disposed toward the rotating shaft 56 of the second polishing table 20 or the maintenance platform 76 of the maintenance mounting table 52 as shown in FIG. 1 .
載置台52係如圖2所示,在載置台52之上部外周部,吊上環78係經由未圖示之螺絲而被固定。在吊上環78之從載置台52的外周部突出的凸緣部,係在同心圓上以等間隔形成有複數個之貫通孔80、80…,在此些之貫通孔80、80…,係被突出設置於滑動環82之上面的滑動環吊具84如圖5所示地從下方貫穿。又,滑動環吊具84,係在貫通被配置於吊上環78與吊上用盤彈簧86之間的吊上彈簧88的同時,貫通於吊上用盤彈簧86的貫通孔90,而連結於螺旋起重器92。As shown in FIG. 2, the mounting table 52 is fixed to the outer peripheral portion of the upper portion of the mounting table 52 by a screw (not shown). In the flange portion of the hanging ring 78 that protrudes from the outer peripheral portion of the mounting table 52, a plurality of through holes 80, 80, ... are formed at equal intervals on the concentric circles, and the through holes 80, 80, ... The slide ring spreader 84 that is protruded from the upper side of the slide ring 82 penetrates from below as shown in FIG. Further, the slide ring spreader 84 passes through the hanging spring 88 disposed between the hanging ring 78 and the hanging disc spring 86, and penetrates through the through hole 90 of the hanging disc spring 86 to be connected to Spiral jack 92.
因此,若使螺旋起重器92動作,將滑動環吊具84與吊 上彈簧88之推擠力相抗而拉向上方,則滑動環82會相對於載置台52而被拉上。藉由此,被裝脫自在地安裝於滑動環82上之膜框14係被拉上,而對膜體38賦予特定之張力。Therefore, if the screw jack 92 is operated, the slip ring spreader 84 and the suspension When the pushing force of the upper spring 88 is pulled upward, the sliding ring 82 is pulled up with respect to the mounting table 52. Thereby, the film frame 14 attached to the slide ring 82 is detached, and the film body 38 is given a specific tension.
在自動化賦予張力時,準備複數個膜框14與膜體38來運用。但是,考慮到對於膜框14,膜體38之初期張力係存在有個體差異,以及由於使用時間的差異,而使複數存在之膜體38、38…的初期張力產生不同,對所有具有張力個體差異的膜體38賦予同等的使用張力係為困難。又,若對膜體38施加過大張力,則會有導致膜體38或周邊機器之破損的危險。為了解決此問題,對吊上彈簧88之收縮量(吊上環78與吊上用盤彈簧86間之間隔)作監視。亦即是,不僅是螺旋起重器92之拉上量,而是實際對賦予膜體38之張力,以監視吊上彈簧88之收縮量來測定之。藉由具備有此吊上彈簧88,能夠同時解決在膜體38施加一定之張力的問題,以及防止在膜體38上施加過大張力。另外,為了施加一定的張力,雖有必要測定吊上彈簧88之收縮量,但是作為其中之一的手段,可在螺旋起重器92,從經由線性軸96所連結之未圖示的馬達之電流值,計算出轉矩,而間接取得螺旋起重器92之吊上力,並對其作管理,而能監視對膜體38所賦予的張力。線性軸96,係為將前述馬達之驅動力傳達至螺旋起重器92的軸。又,符號94,係為用以承受在吊上環78與吊上用盤彈簧86之間所產生的吊上彈簧88之反作用力的止動銷。When the tension is applied by automation, a plurality of film frames 14 and a film body 38 are prepared for use. However, considering the film frame 14, there is an individual difference in the initial tension of the film body 38, and the initial tension of the plurality of film bodies 38, 38... is different due to the difference in the use time, for all individuals having tension It is difficult for the different film body 38 to impart the same tension system. Further, if excessive tension is applied to the film body 38, there is a risk of damage to the film body 38 or peripheral equipment. In order to solve this problem, the amount of contraction of the hanging spring 88 (the distance between the hanging ring 78 and the hanging disc spring 86) is monitored. That is, not only the amount of pulling of the screw jack 92 but also the tension applied to the film body 38 is actually measured to monitor the amount of contraction of the hanging spring 88. By providing the suspension spring 88, it is possible to simultaneously solve the problem of applying a certain tension to the film body 38 and prevent excessive tension from being applied to the film body 38. Further, in order to apply a constant tension, it is necessary to measure the amount of contraction of the suspension spring 88. However, as one of the means, the screw jack 92 can be connected to a motor (not shown) connected via the linear shaft 96. The current value is used to calculate the torque, and the lifting force of the screw jack 92 is indirectly obtained and managed, and the tension imparted to the film body 38 can be monitored. The linear shaft 96 is a shaft that transmits the driving force of the motor to the screw jack 92. Further, reference numeral 94 is a stopper pin for receiving the reaction force of the hanging spring 88 generated between the hanging ring 78 and the hanging disc spring 86.
於載置台52,係複數形成有從圖5之空氣室54將壓縮 空氣(加壓流體)噴出的噴射口98、98…。此些噴射口98、98…,係經由被形成於載置台52之上面的空氣室100,與在圖3上以虛線所示的空氣供給路徑102相連通。空氣供給路徑102,係經由被安裝於研磨頭50之未圖示的旋轉接頭,延伸設置於研磨頭50之外部,並經由閥104而連接於空氣幫浦106。因此,若將閥104開放,則從空氣幫浦106而來之壓縮空氣會經由空氣供給路徑102、空氣室100、以及噴射口98而被供給至空氣室54。藉由此,壓縮空氣之壓力經由膜體38而傳達至玻璃基板G,經由此壓力,將基板G推壓至研磨頭58、60並研磨之。The mounting table 52 is formed with a plurality of compressed air chambers 54 from FIG. The injection ports 98, 98, ... which are ejected by air (pressurized fluid). The injection ports 98, 98, . . . are in communication with the air supply path 102 indicated by a broken line in FIG. 3 via the air chamber 100 formed on the upper surface of the mounting table 52. The air supply path 102 is extended outside the polishing head 50 via a rotary joint (not shown) attached to the polishing head 50, and is connected to the air pump 106 via the valve 104. Therefore, when the valve 104 is opened, the compressed air from the air pump 106 is supplied to the air chamber 54 via the air supply path 102, the air chamber 100, and the injection port 98. Thereby, the pressure of the compressed air is transmitted to the glass substrate G via the film body 38, and the substrate G is pressed against the polishing heads 58, 60 and polished by the pressure.
另一方面,如圖2所示,在膜框14之上框40,係有複數之銷108、108…在同心圓上以等間隔突出設置,而在此些銷108之上端部所形成,如圖5所示之粗口徑的頭部110,係藉由與被固定於滑動環82之下部的鈎112嵌合,將膜框14安裝於滑動環82。頭部110與鈎112的嵌合力,係經由以螺旋起重器92將膜體38拉張開時膜體38的反作用力而變的更為強固,光以研磨時從膜體38所受到的研磨阻抗,並不會使頭部110從鈎112脫離。On the other hand, as shown in FIG. 2, in the frame 40 above the film frame 14, a plurality of pins 108, 108 are provided on the concentric circles at equal intervals, and at the upper ends of the pins 108, The thick-diameter head portion 110 shown in Fig. 5 is attached to the slide ring 82 by fitting with a hook 112 fixed to the lower portion of the slide ring 82. The fitting force of the head portion 110 and the hook 112 is further enhanced by the reaction force of the film body 38 when the film body 38 is stretched by the screw jack 92, and the light is subjected to the polishing resistance from the film body 38 during polishing. The head 110 is not disengaged from the hook 112.
若是在圖1所示之第2研磨平台20,玻璃基板G之研磨結束,則於此將膜框14從載置台52取下,並藉由搬送裝置154來搬送至平台22。作為將膜框14從載置台52取下的方法,首先,使圖5所示之螺旋起重器92朝向鬆緩的方向動作,而解除膜體38的張力。接下來,使膜框14相對於載置台52回轉特定角度,將頭部110從鈎112取下。藉由此, 將膜框14從載置台52取下。When the polishing of the glass substrate G is completed in the second polishing table 20 shown in FIG. 1, the film frame 14 is removed from the mounting table 52 and transported to the stage 22 by the transfer device 154. As a method of removing the film frame 14 from the mounting table 52, first, the screw jack 92 shown in Fig. 5 is moved in a loose direction, and the tension of the film body 38 is released. Next, the film frame 14 is rotated by a specific angle with respect to the mounting table 52, and the head 110 is removed from the hook 112. By this, The film frame 14 is removed from the mounting table 52.
於圖1所示之平台22,從以搬送裝置154所搬送來之膜框14,剝下結束研磨的玻璃基板G。被剝下之玻璃基板G,係經由輸送裝置138而被搬送,而後,被吸著在安裝於機器人140之機器臂142上的吸著頭144,經由機器人140的動作,移載至玻璃基板搬出用輸送裝置24,而搬出到研磨裝置10之外部。On the stage 22 shown in FIG. 1, the glass substrate G which finished polishing is peeled off from the film frame 14 conveyed by the conveyance apparatus 154. The peeled glass substrate G is transported via the transport device 138, and then sucked onto the suction head 144 attached to the robot arm 142 of the robot 140, and transferred to the glass substrate by the operation of the robot 140. The conveying device 24 is used to carry out the outside of the polishing device 10.
將玻璃基板G剝下後之膜框14,係經由輸送裝置146而被搬送至膜框洗淨平台26,並於此被用水洗淨。結束洗淨的膜框14,係經由輸送裝置148而被搬送至膜框乾燥平台28,並於此被加熱而乾燥。而後,結束乾燥的膜框14,係經由膜框送回輸送裝置30而被搬送至平台16,並於此再度被使用於玻璃基板G的貼著。以上,係為研磨裝置10的全體構成。The film frame 14 after the glass substrate G is peeled off is conveyed to the film frame cleaning stage 26 via the conveyance device 146, and is washed with water here. The film frame 14 that has been cleaned is conveyed to the film frame drying stage 28 via the conveying device 148, and is heated and dried there. Then, the dried film frame 14 is conveyed back to the conveyance device 30 via the film frame, and is conveyed to the stage 16, and is used again for the adhesion of the glass substrate G. The above is the overall configuration of the polishing apparatus 10.
膜體38,係由於在玻璃基板G的研磨中,受到玻璃基板G與研磨墊片58、60之間所產生的研磨阻抗的關係,因此會從研磨墊片58、60受到朝向拉引方向(伸展方向:面方向)的力。又,由於在研磨中載置台52及研磨頭58、60係在回轉狀態,故膜體38會因前述力而反覆受到拉引方向的伸縮力,而成為在拉引方向伸縮。The film body 38 is subjected to the polishing resistance generated between the glass substrate G and the polishing pads 58 and 60 during polishing of the glass substrate G, and thus is received from the polishing pads 58 and 60 toward the drawing direction ( Stretching direction: the direction of the face). Further, since the mounting table 52 and the polishing heads 58 and 60 are rotated in the polishing state, the film body 38 is repeatedly subjected to the stretching force in the pulling direction due to the above-described force, and expands and contracts in the drawing direction.
於此,在先前之構造中,由於係將較膜體38更為軟質的吸著薄片200,直接接著於膜體38,因此若觀察研磨中之吸著薄片200的舉動,可以發現,若是吸著薄片200跟隨著膜體38之收縮來進行伸縮動作的話,則不會有問題,但 是由於吸著薄片200係被保持在玻璃基板G上,亦即是,由於吸著薄片200之伸縮動作係被玻璃基板G所限制,故吸著薄片200之在拉引方向的伸縮係被限制。因為此種現象,而使得在伸縮之膜體38與不伸縮之吸著薄片200之間產生相對的偏移,而藉由此偏移,吸著薄片200的周圍邊緣部會從膜體38而漸漸剝落,當此剝離部分變大時,被剝離之部分會在研磨中彎曲捲起。Here, in the prior structure, since the absorbing sheet 200 which is softer than the film body 38 is directly attached to the film body 38, if the behavior of the absorbing sheet 200 during polishing is observed, it can be found that if it is sucked If the sheet 200 follows the contraction of the film 38 to perform the expansion and contraction operation, there is no problem, but Since the absorbing sheet 200 is held on the glass substrate G, that is, since the stretching operation of the absorbing sheet 200 is restricted by the glass substrate G, the expansion and contraction of the absorbing sheet 200 in the drawing direction is restricted. . Because of this phenomenon, a relative offset is generated between the stretched film body 38 and the non-stretchable absorbing sheet 200, and by this offset, the peripheral edge portion of the absorbing sheet 200 is from the film body 38. Gradually peeling off, when the peeling portion becomes large, the peeled portion is bent and rolled up during the grinding.
於此,為了防止此種問題,於實施形態之構造中,係如圖6所示,將相較於吸著基板200,其拉引方向之剛性較高的中間薄片210,介於存在於膜體38和吸著薄片200之間而接著。Here, in order to prevent such a problem, in the structure of the embodiment, as shown in FIG. 6, the intermediate sheet 210 having a higher rigidity in the drawing direction than the absorbing substrate 200 is present in the film. The body 38 and the absorbing sheet 200 are then passed.
若藉由此構造,則因在研磨中所發生之研磨阻抗,膜體38雖然會如前述一般在拉引方向伸縮,但是由於在膜體38與吸著薄片200之間介於存在有中間薄片210,因此,由於膜體38之伸縮動作,雖然會有在中間薄片210與膜體38之間產生剝離的情況,但是在中間薄片210與吸著薄片200之間,藉由玻璃基板G之吸著而伸縮動作被限制的吸著薄片200,與相較於吸著薄片200在拉引方向之剛性更高的中間薄片210之間,由於中間薄片210在拉引方向不會伸縮,因此不會產生相對的偏移。因此,由於吸著薄片200將不會從中間薄片210上剝落,而能防止吸著薄片200剝離並彎曲捲起。According to this configuration, the film body 38 expands and contracts in the drawing direction as described above due to the polishing resistance occurring during polishing, but there is an intermediate sheet between the film body 38 and the absorbing sheet 200. 210, therefore, there is a case where peeling occurs between the intermediate sheet 210 and the film body 38 due to the expansion and contraction operation of the film body 38, but between the intermediate sheet 210 and the absorbing sheet 200, by the suction of the glass substrate G The absorbing sheet 200 whose telescopic movement is restricted, and the intermediate sheet 210 which is higher in rigidity in the drawing direction than the absorbing sheet 200, does not expand and contract in the drawing direction, and therefore does not Produces a relative offset. Therefore, since the absorbing sheet 200 will not peel off from the intermediate sheet 210, the absorbing sheet 200 can be prevented from being peeled off and bent up.
故而,若藉由實施形態之研磨裝置10,則能長時間地將玻璃基板G圓滑地研磨。Therefore, according to the polishing apparatus 10 of the embodiment, the glass substrate G can be smoothly polished for a long period of time.
另外,於實施形態中,雖以聚碳酸酯作為中間薄片210的材料,但是並不限定於此,亦可使用丙烯、鋁、不銹鋼、玻璃又或是碳纖維強化塑膠等。又,除了此些材料之外,亦可舉例有:ABS(Acrylonitrile Butadiene Styrene)、纖維強化塑膠(FRP:Fiber Reinforced plastics)。Further, in the embodiment, polycarbonate is used as the material of the intermediate sheet 210. However, the present invention is not limited thereto, and acryl, aluminum, stainless steel, glass, or carbon fiber reinforced plastic may be used. Further, in addition to these materials, ABS (Acrylonitrile Butadiene Styrene) and Fiber Reinforced Plastics (FRP) may be exemplified.
進而,由於係採用以氣密保持層44、強度保持層46而構成膜體38,並在強度保護層46處接著中間薄片210的構造,因此能去除接著於強度保持層46的平滑層,而能減少膜體38的成本。Further, since the film body 38 is formed by the airtight holding layer 44 and the strength maintaining layer 46, and the intermediate sheet 210 is attached to the strength protective layer 46, the smooth layer following the strength maintaining layer 46 can be removed. The cost of the film body 38 can be reduced.
本發明,係適合於用以製造使用在平面面板顯示器等之薄板玻璃基板的玻璃基板之研磨。The present invention is suitable for polishing a glass substrate used for a thin glass substrate used in a flat panel display or the like.
另外,在此引用於2005年8月19日所申請之日本國專利申請2005-239040號之說明書、申請專利範圍、圖面以及摘要的所有內容,並作為本發明之說明書的揭示而導入。In addition, the contents of the specification, the scope of the application, the drawings and the abstract of the Japanese Patent Application No. 2005-239040, filed on Jan. 19, 2005, are hereby incorporated by reference.
G‧‧‧玻璃基板G‧‧‧glass substrate
10‧‧‧研磨裝置10‧‧‧ grinding device
12‧‧‧輸送裝置12‧‧‧Conveyor
14‧‧‧膜框14‧‧‧ film frame
16‧‧‧平台16‧‧‧ platform
18‧‧‧第1之研磨平台18‧‧‧1st grinding platform
20‧‧‧第2之研磨平台20‧‧‧2nd grinding platform
22‧‧‧平台22‧‧‧ platform
24‧‧‧玻璃基板搬出輸送裝置24‧‧‧Glass substrate carrying out conveyor
26‧‧‧膜框洗淨平台26‧‧‧Film frame cleaning platform
28‧‧‧膜框乾燥平台28‧‧‧Film frame drying platform
30‧‧‧膜框回送輸送裝置30‧‧‧film frame return conveyor
32‧‧‧機器人32‧‧‧ Robot
33‧‧‧機器臂33‧‧‧ robot arm
34‧‧‧吸著墊片34‧‧‧Sucking gasket
36‧‧‧輸送裝置36‧‧‧Conveyor
38‧‧‧膜體38‧‧‧membrane body
40‧‧‧上框40‧‧‧上上
42‧‧‧下框42‧‧‧ Lower frame
44‧‧‧氣密保持層44‧‧‧ airtight retaining layer
46‧‧‧強度保持層46‧‧‧Strength retention layer
48‧‧‧平滑層48‧‧‧Smooth layer
50‧‧‧研磨頭50‧‧‧ polishing head
51‧‧‧本體外殼51‧‧‧ body shell
52‧‧‧載置台52‧‧‧ mounting table
53‧‧‧下部外周環部53‧‧‧ Lower outer ring
54‧‧‧空氣室54‧‧ Air Chamber
56‧‧‧轉軸56‧‧‧ shaft
58‧‧‧研磨墊片58‧‧‧ grinding gasket
60‧‧‧研磨頭60‧‧‧ polishing head
62‧‧‧研磨定盤62‧‧‧ Grinding plate
64‧‧‧回轉軸64‧‧‧Rotary axis
66‧‧‧研磨定盤66‧‧‧ Grinding plate
68‧‧‧回轉軸68‧‧‧Rotary axis
70‧‧‧直動導引構件70‧‧‧Direct motion guiding member
72‧‧‧導引軌72‧‧‧ Guide track
74‧‧‧維修平台74‧‧‧Maintenance platform
76‧‧‧維修平台76‧‧‧Maintenance platform
78‧‧‧吊上環78‧‧‧ hanging the ring
80‧‧‧貫通孔80‧‧‧through holes
82‧‧‧滑動環82‧‧‧Sliding ring
84‧‧‧滑動環吊具84‧‧‧Sliding ring spreader
86‧‧‧上彈簧86‧‧‧Up spring
88‧‧‧吊上彈簧88‧‧‧ hanging spring
90‧‧‧貫通孔90‧‧‧through hole
92‧‧‧螺旋起重器92‧‧‧Spiral jack
94‧‧‧止動銷94‧‧‧stop sales
96‧‧‧線性軸96‧‧‧linear axis
98‧‧‧噴射口98‧‧‧jet
100‧‧‧空氣室100‧‧ Air Room
102‧‧‧空氣供給路徑102‧‧‧Air supply path
104‧‧‧閥104‧‧‧Valve
106‧‧‧空氣幫浦106‧‧‧Air pump
108‧‧‧插銷108‧‧‧Latch
110‧‧‧頭部110‧‧‧ head
112‧‧‧掛鈎112‧‧‧ hook
14‧‧‧插銷14‧‧‧Tratch
116‧‧‧孔116‧‧‧ hole
118‧‧‧止動板118‧‧‧stop plate
120‧‧‧空氣流通路徑120‧‧‧Air circulation path
122‧‧‧扶持構件122‧‧‧Supporting components
124‧‧‧挾持板124‧‧‧挟板
126‧‧‧桿柱126‧‧‧ pole
128‧‧‧貫通孔128‧‧‧through holes
130‧‧‧貫通孔130‧‧‧through holes
138‧‧‧輸送裝置138‧‧‧Conveyor
140‧‧‧機器人140‧‧‧Robot
142‧‧‧機器臂142‧‧‧ robot arm
144‧‧‧吸著頭144‧‧‧Sucking head
146‧‧‧輸送裝置146‧‧‧Conveyor
150、152、154‧‧‧搬送裝置150, 152, 154‧‧‧ transport device
160‧‧‧導引軌160‧‧‧ Guide rail
170‧‧‧導引軌170‧‧‧ Guide rail
200‧‧‧吸著薄片200‧‧‧Small sheet
210‧‧‧中間薄片210‧‧‧Intermediate sheet
圖1展示第1實施形態之研磨裝置的全體構造之平面圖。Fig. 1 is a plan view showing the entire structure of a polishing apparatus according to a first embodiment.
圖2展示研磨頭及研磨平台之實施形態的側面圖。Figure 2 shows a side view of an embodiment of a polishing head and a polishing table.
圖3研磨頭之組裝立體圖。Figure 3 is an assembled perspective view of the polishing head.
圖4展示膜框之膜體的3層構造之說明圖。Fig. 4 is an explanatory view showing a three-layer structure of a film body of a film frame.
圖5展示相對於滑動環之膜框的裝脫構造之重要部分擴大剖面圖。Fig. 5 is an enlarged cross-sectional view showing an essential part of the attachment structure of the film frame with respect to the slide ring.
圖6展示膜體、中間薄片、吸著薄片之配置構成的側面圖。Fig. 6 is a side view showing the arrangement of the film body, the intermediate sheet, and the absorbing sheet.
38‧‧‧膜體38‧‧‧membrane body
200‧‧‧接著薄片200‧‧‧ followed by thin slices
210‧‧‧中間薄片210‧‧‧Intermediate sheet
G‧‧‧玻璃基板G‧‧‧glass substrate
Claims (5)
Applications Claiming Priority (1)
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JP2005239040 | 2005-08-19 |
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JP (1) | JP5013200B2 (en) |
KR (1) | KR101097074B1 (en) |
TW (1) | TWI389767B (en) |
WO (1) | WO2007020859A1 (en) |
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JP2012179680A (en) * | 2011-03-01 | 2012-09-20 | Asahi Glass Co Ltd | Method for polishing glass plate |
JP2012192470A (en) * | 2011-03-15 | 2012-10-11 | Asahi Glass Co Ltd | Plate-like body polishing apparatus |
JP2015171733A (en) * | 2012-07-13 | 2015-10-01 | 旭硝子株式会社 | Polishing device of plate-like body and polishing method of plate-like body |
JP2015171734A (en) * | 2012-07-18 | 2015-10-01 | 旭硝子株式会社 | Polishing device for plate-like body and polishing method for plate-like body |
JP2017127938A (en) * | 2016-01-21 | 2017-07-27 | 信越半導体株式会社 | Wafer polishing method, back pad manufacturing method, back pad, and polishing head having the back pad |
KR102040019B1 (en) * | 2017-11-28 | 2019-11-04 | 윤주영 | Carbon fiber reinforced plastic molded article and supporting unit for polishing glass base plate comprising the same |
CN113172539B (en) * | 2021-06-30 | 2021-08-31 | 南通环球光学仪器有限公司 | Positioning jig and positioning method for mechanical engineering casting |
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US6494774B1 (en) * | 1999-07-09 | 2002-12-17 | Applied Materials, Inc. | Carrier head with pressure transfer mechanism |
JP2001138223A (en) * | 1999-11-10 | 2001-05-22 | Sony Corp | Grinding head and grinding apparatus |
JP2003257910A (en) * | 2001-12-28 | 2003-09-12 | Fujikoshi Mach Corp | Method for polishing copper layer of substrate |
JP4207153B2 (en) * | 2002-07-31 | 2009-01-14 | 旭硝子株式会社 | Substrate polishing method and apparatus |
JP2004268157A (en) * | 2003-03-05 | 2004-09-30 | Tamagawa Machinery Co Ltd | Glass substrate polishing head, polishing device using this polishing head, glass substrate polishing method and glass substrate |
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TW200720018A (en) | 2007-06-01 |
WO2007020859A1 (en) | 2007-02-22 |
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