TWI368974B - Ball-on-trace wire bond interconnection - Google Patents

Ball-on-trace wire bond interconnection

Info

Publication number
TWI368974B
TWI368974B TW094139959A TW94139959A TWI368974B TW I368974 B TWI368974 B TW I368974B TW 094139959 A TW094139959 A TW 094139959A TW 94139959 A TW94139959 A TW 94139959A TW I368974 B TWI368974 B TW I368974B
Authority
TW
Taiwan
Prior art keywords
ball
wire bond
trace wire
bond interconnection
interconnection
Prior art date
Application number
TW094139959A
Other languages
English (en)
Chinese (zh)
Other versions
TW200623373A (en
Inventor
Hun-Teak Lee
Jong-Kook Kim
Chulsik Kim
Ki-Youn Jang
Rajendra D Pendse
Original Assignee
Chippac Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chippac Inc filed Critical Chippac Inc
Publication of TW200623373A publication Critical patent/TW200623373A/zh
Application granted granted Critical
Publication of TWI368974B publication Critical patent/TWI368974B/zh

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/40Leadframes
    • H10W70/464Additional interconnections in combination with leadframes
    • H10W70/465Bumps or wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/68Shapes or dispositions thereof
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/401Package configurations characterised by multiple insulating or insulated package substrates, interposers or RDLs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/68Shapes or dispositions thereof
    • H10W70/682Shapes or dispositions thereof comprising holes having chips therein
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/68Shapes or dispositions thereof
    • H10W70/685Shapes or dispositions thereof comprising multiple insulating layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/0711Apparatus therefor
    • H10W72/07141Means for applying energy, e.g. ovens or lasers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • H10W72/07511Treating the bonding area before connecting, e.g. by applying flux or cleaning
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • H10W72/07531Techniques
    • H10W72/07532Compression bonding, e.g. thermocompression bonding
    • H10W72/07533Ultrasonic bonding, e.g. thermosonic bonding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • H10W72/07541Controlling the environment, e.g. atmosphere composition or temperature
    • H10W72/07552Controlling the environment, e.g. atmosphere composition or temperature changes in structures or sizes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • H10W72/07541Controlling the environment, e.g. atmosphere composition or temperature
    • H10W72/07554Controlling the environment, e.g. atmosphere composition or temperature changes in dispositions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/521Structures or relative sizes of bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/531Shapes of wire connectors
    • H10W72/536Shapes of wire connectors the connected ends being ball-shaped
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/531Shapes of wire connectors
    • H10W72/5363Shapes of wire connectors the connected ends being wedge-shaped
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/531Shapes of wire connectors
    • H10W72/5366Shapes of wire connectors the bond wires having kinks
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/5434Dispositions of bond wires the connected ends being on auxiliary connecting means on bond pads, e.g. on other bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/5445Dispositions of bond wires being orthogonal to a side surface of the chip, e.g. parallel arrangements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/547Dispositions of multiple bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/551Materials of bond wires
    • H10W72/552Materials of bond wires comprising metals or metalloids, e.g. silver
    • H10W72/5522Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/551Materials of bond wires
    • H10W72/552Materials of bond wires comprising metals or metalloids, e.g. silver
    • H10W72/5524Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/59Bond pads specially adapted therefor
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/851Dispositions of multiple connectors or interconnections
    • H10W72/874On different surfaces
    • H10W72/884Die-attach connectors and bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/931Shapes of bond pads
    • H10W72/932Plan-view shape, i.e. in top view
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/931Shapes of bond pads
    • H10W72/934Cross-sectional shape, i.e. in side view
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/951Materials of bond pads
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/951Materials of bond pads
    • H10W72/952Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/731Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
    • H10W90/734Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/754Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W99/00Subject matter not provided for in other groups of this subclass
TW094139959A 2004-11-12 2005-11-14 Ball-on-trace wire bond interconnection TWI368974B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US62765004P 2004-11-12 2004-11-12

Publications (2)

Publication Number Publication Date
TW200623373A TW200623373A (en) 2006-07-01
TWI368974B true TWI368974B (en) 2012-07-21

Family

ID=36337287

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094139959A TWI368974B (en) 2004-11-12 2005-11-14 Ball-on-trace wire bond interconnection

Country Status (5)

Country Link
US (4) US7453156B2 (https=)
JP (1) JP4964780B2 (https=)
KR (1) KR101227228B1 (https=)
TW (1) TWI368974B (https=)
WO (1) WO2006053277A2 (https=)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7868468B2 (en) * 2004-11-12 2011-01-11 Stats Chippac Ltd. Wire bonding structure and method that eliminates special wire bondable finish and reduces bonding pitch on substrates
WO2006053277A2 (en) * 2004-11-12 2006-05-18 Chippac, Inc. Wire bond interconnection
US8519517B2 (en) * 2004-11-13 2013-08-27 Stats Chippac Ltd. Semiconductor system with fine pitch lead fingers and method of manufacturing thereof
US7731078B2 (en) * 2004-11-13 2010-06-08 Stats Chippac Ltd. Semiconductor system with fine pitch lead fingers
EP3479844B1 (en) 2005-04-15 2023-11-22 MacroGenics, Inc. Covalent diabodies and uses thereof
TW200642012A (en) * 2005-05-17 2006-12-01 Advanced Semiconductor Eng Chip package and wire bonding process thereof
US20070018292A1 (en) * 2005-07-22 2007-01-25 Sehat Sutardja Packaging for high speed integrated circuits
US20070026573A1 (en) * 2005-07-28 2007-02-01 Aminuddin Ismail Method of making a stacked die package
US7863099B2 (en) * 2007-06-27 2011-01-04 Stats Chippac Ltd. Integrated circuit package system with overhanging connection stack
SG148901A1 (en) 2007-07-09 2009-01-29 Micron Technology Inc Packaged semiconductor assemblies and methods for manufacturing such assemblies
US7701049B2 (en) * 2007-08-03 2010-04-20 Stats Chippac Ltd. Integrated circuit packaging system for fine pitch substrates
US20090243051A1 (en) * 2008-03-28 2009-10-01 Micron Technology, Inc. Integrated conductive shield for microelectronic device assemblies and associated methods
US7897502B2 (en) 2008-09-10 2011-03-01 Stats Chippac, Ltd. Method of forming vertically offset bond on trace interconnects on recessed and raised bond fingers
US7973394B2 (en) * 2009-06-10 2011-07-05 Blondwich Limited Enhanced integrated circuit package
KR102293198B1 (ko) * 2009-09-16 2021-08-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
US8304921B2 (en) * 2009-11-13 2012-11-06 Stats Chippac Ltd. Integrated circuit packaging system with interconnect and method of manufacture thereof
US8039384B2 (en) 2010-03-09 2011-10-18 Stats Chippac, Ltd. Semiconductor device and method of forming vertically offset bond on trace interconnects on different height traces
US8409978B2 (en) 2010-06-24 2013-04-02 Stats Chippac, Ltd. Semiconductor device and method of forming vertically offset bond on trace interconnect structure on leadframe
US8609525B2 (en) * 2011-03-21 2013-12-17 Stats Chippac Ltd. Integrated circuit packaging system with interconnects and method of manufacture thereof
JP5990897B2 (ja) 2011-11-25 2016-09-14 ソニー株式会社 電力制御装置、送電装置、および電力制御システム
US8643159B2 (en) 2012-04-09 2014-02-04 Freescale Semiconductor, Inc. Lead frame with grooved lead finger
JP2013229368A (ja) * 2012-04-24 2013-11-07 Denso Corp 電子装置およびその製造方法
JP5894502B2 (ja) * 2012-06-04 2016-03-30 ローム株式会社 ワイヤボンディング構造および半導体装置
US9837188B2 (en) * 2012-07-06 2017-12-05 Nxp B.V. Differential return loss supporting high speed bus interfaces
CN104603943B (zh) * 2012-09-24 2017-07-04 瑞萨电子株式会社 半导体器件的制造方法以及半导体器件
US8680660B1 (en) 2013-03-12 2014-03-25 Freescale Semiconductor, Inc. Brace for bond wire
US20140312474A1 (en) * 2013-04-19 2014-10-23 Texas Instruments Incorporated Semiconductor package with wire bonding
KR101563911B1 (ko) 2013-10-24 2015-10-28 앰코 테크놀로지 코리아 주식회사 반도체 패키지
JP6279339B2 (ja) * 2014-02-07 2018-02-14 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
US9881870B2 (en) * 2015-12-30 2018-01-30 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor device and manufacturing method thereof
US10600756B1 (en) 2017-02-15 2020-03-24 United States Of America, As Represented By The Secretary Of The Navy Wire bonding technique for integrated circuit board connections
CN114222737B (zh) 2019-05-31 2024-07-26 詹森药业有限公司 NF-κB诱导激酶的小分子抑制剂
KR20230173269A (ko) 2022-06-16 2023-12-27 삼성전자주식회사 반도체 패키지
GB2621374B (en) 2022-08-10 2026-03-11 Toshiba Kk An electronic package and method of manufacturing an electronic package

Family Cites Families (56)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5933894A (ja) * 1982-08-19 1984-02-23 電気化学工業株式会社 混成集積用回路基板の製造法
US4742023A (en) * 1986-08-28 1988-05-03 Fujitsu Limited Method for producing a semiconductor device
US5007576A (en) * 1989-12-26 1991-04-16 Hughes Aircraft Company Testable ribbon bonding method and wedge bonding tool for microcircuit device fabrication
US5158647A (en) * 1991-01-10 1992-10-27 Raymond Hurley Capacitor papers of flash-spun synthetic pulp fibers
JP2601666Y2 (ja) * 1992-05-08 1999-11-29 株式会社村田製作所 積層型コイル
US5340772A (en) * 1992-07-17 1994-08-23 Lsi Logic Corporation Method of increasing the layout efficiency of dies on a wafer and increasing the ratio of I/O area to active area per die
US5340770A (en) * 1992-10-23 1994-08-23 Ncr Corporation Method of making a shallow junction by using first and second SOG layers
US5328079A (en) * 1993-03-19 1994-07-12 National Semiconductor Corporation Method of and arrangement for bond wire connecting together certain integrated circuit components
US5561086A (en) * 1993-06-18 1996-10-01 Lsi Logic Corporation Techniques for mounting semiconductor dies in die-receiving areas having support structure having notches
US5480834A (en) * 1993-12-13 1996-01-02 Micron Communications, Inc. Process of manufacturing an electrical bonding interconnect having a metal bond pad portion and having a conductive epoxy portion comprising an oxide reducing agent
KR0130534B1 (ko) * 1994-07-12 1998-04-09 김광호 세탁기용 리니어 모터
US5444303A (en) * 1994-08-10 1995-08-22 Motorola, Inc. Wire bond pad arrangement having improved pad density
JPH08102517A (ja) * 1994-09-30 1996-04-16 Nec Corp 半導体装置及びリードフレーム
US5465899A (en) * 1994-10-14 1995-11-14 Texas Instruments Incorporated Method and apparatus for fine pitch wire bonding using a shaved capillary
US5994169A (en) * 1994-10-27 1999-11-30 Texas Instruments Incorporated Lead frame for integrated circuits and process of packaging
US5842628A (en) * 1995-04-10 1998-12-01 Fujitsu Limited Wire bonding method, semiconductor device, capillary for wire bonding and ball bump forming method
JPH0982742A (ja) * 1995-09-11 1997-03-28 Fujitsu Ltd ワイヤボンディング方法
US5686762A (en) * 1995-12-21 1997-11-11 Micron Technology, Inc. Semiconductor device with improved bond pads
US5734559A (en) * 1996-03-29 1998-03-31 Intel Corporation Staggered bond finger design for fine pitch integrated circuit packages
US5904288A (en) * 1996-04-08 1999-05-18 Texas Instruments Incorporated Wire bond clamping method
US6001671A (en) * 1996-04-18 1999-12-14 Tessera, Inc. Methods for manufacturing a semiconductor package having a sacrificial layer
US5735030A (en) * 1996-06-04 1998-04-07 Texas Instruments Incorporated Low loop wire bonding
US5976964A (en) * 1997-04-22 1999-11-02 Micron Technology, Inc. Method of improving interconnect of semiconductor device by utilizing a flattened ball bond
JP3022819B2 (ja) * 1997-08-27 2000-03-21 日本電気アイシーマイコンシステム株式会社 半導体集積回路装置
EP0903780A3 (en) * 1997-09-19 1999-08-25 Texas Instruments Incorporated Method and apparatus for a wire bonded package for integrated circuits
US5960262A (en) * 1997-09-26 1999-09-28 Texas Instruments Incorporated Stitch bond enhancement for hard-to-bond materials
US6008532A (en) * 1997-10-23 1999-12-28 Lsi Logic Corporation Integrated circuit package having bond fingers with alternate bonding areas
US6064113A (en) * 1998-01-13 2000-05-16 Lsi Logic Corporation Semiconductor device package including a substrate having bonding fingers within an electrically conductive ring surrounding a die area and a combined power and ground plane to stabilize signal path impedances
JPH11312749A (ja) * 1998-02-25 1999-11-09 Fujitsu Ltd 半導体装置及びその製造方法及びリードフレームの製造方法
US6158647A (en) 1998-09-29 2000-12-12 Micron Technology, Inc. Concave face wire bond capillary
TW410446B (en) * 1999-01-21 2000-11-01 Siliconware Precision Industries Co Ltd BGA semiconductor package
US6462414B1 (en) * 1999-03-05 2002-10-08 Altera Corporation Integrated circuit package utilizing a conductive structure for interlocking a conductive ball to a ball pad
US6329278B1 (en) * 2000-01-03 2001-12-11 Lsi Logic Corporation Multiple row wire bonding with ball bonds of outer bond pads bonded on the leads
JP2001338955A (ja) * 2000-05-29 2001-12-07 Texas Instr Japan Ltd 半導体装置及びその製造方法
US6333562B1 (en) * 2000-07-13 2001-12-25 Advanced Semiconductor Engineering, Inc. Multichip module having stacked chip arrangement
US6972484B2 (en) * 2000-10-13 2005-12-06 Texas Instruments Incorporated Circuit structure integrating the power distribution functions of circuits and leadframes into the chip surface
US7135759B2 (en) * 2000-10-27 2006-11-14 Texas Instruments Incorporated Individualized low parasitic power distribution lines deposited over active integrated circuits
US6597065B1 (en) * 2000-11-03 2003-07-22 Texas Instruments Incorporated Thermally enhanced semiconductor chip having integrated bonds over active circuits
TW465064B (en) * 2000-12-22 2001-11-21 Advanced Semiconductor Eng Bonding process and the structure thereof
JP2002368176A (ja) * 2001-06-11 2002-12-20 Rohm Co Ltd 半導体電子部品のリードフレーム
TW495940B (en) * 2001-07-20 2002-07-21 Via Tech Inc Method for forming a grid array packaged integrated circuit
US6787926B2 (en) 2001-09-05 2004-09-07 Taiwan Semiconductor Manufacturing Co., Ltd Wire stitch bond on an integrated circuit bond pad and method of making the same
KR100396787B1 (ko) * 2001-11-13 2003-09-02 엘지전자 주식회사 반도체 패키지용 인쇄회로기판의 와이어 본딩패드 형성방법
US7190060B1 (en) * 2002-01-09 2007-03-13 Bridge Semiconductor Corporation Three-dimensional stacked semiconductor package device with bent and flat leads and method of making same
JP3824545B2 (ja) * 2002-02-07 2006-09-20 松下電器産業株式会社 配線基板、それを用いた半導体装置、それらの製造方法
US7229906B2 (en) * 2002-09-19 2007-06-12 Kulicke And Soffa Industries, Inc. Method and apparatus for forming bumps for semiconductor interconnections using a wire bonding machine
US6815836B2 (en) * 2003-03-24 2004-11-09 Texas Instruments Incorporated Wire bonding for thin semiconductor package
US6927479B2 (en) * 2003-06-25 2005-08-09 St Assembly Test Services Ltd Method of manufacturing a semiconductor package for a die larger than a die pad
US6956286B2 (en) * 2003-08-05 2005-10-18 International Business Machines Corporation Integrated circuit package with overlapping bond fingers
US20050133928A1 (en) * 2003-12-19 2005-06-23 Howard Gregory E. Wire loop grid array package
US7375978B2 (en) * 2003-12-23 2008-05-20 Intel Corporation Method and apparatus for trace shielding and routing on a substrate
KR100604840B1 (ko) * 2004-03-11 2006-07-28 삼성전자주식회사 미세 피치 범프에의 리버스 와이어 본딩 방법 및 이에의한 와이어 본드 구조체
TWI304238B (en) * 2004-09-07 2008-12-11 Advanced Semiconductor Eng Wire-bonding method for connecting wire-bond pads and chip and the structure formed thereby
WO2006053277A2 (en) * 2004-11-12 2006-05-18 Chippac, Inc. Wire bond interconnection
US7731078B2 (en) * 2004-11-13 2010-06-08 Stats Chippac Ltd. Semiconductor system with fine pitch lead fingers
US7358617B2 (en) * 2004-11-29 2008-04-15 Texas Instruments Incorporated Bond pad for ball grid array package

Also Published As

Publication number Publication date
KR101227228B1 (ko) 2013-01-28
JP4964780B2 (ja) 2012-07-04
US8129263B2 (en) 2012-03-06
US20100225008A1 (en) 2010-09-09
US7453156B2 (en) 2008-11-18
WO2006053277A3 (en) 2007-06-21
US20110266700A1 (en) 2011-11-03
TW200623373A (en) 2006-07-01
KR20070084060A (ko) 2007-08-24
US7986047B2 (en) 2011-07-26
US20080135997A1 (en) 2008-06-12
WO2006053277A2 (en) 2006-05-18
US7745322B2 (en) 2010-06-29
JP2008520111A (ja) 2008-06-12
US20060113665A1 (en) 2006-06-01

Similar Documents

Publication Publication Date Title
TWI368974B (en) Ball-on-trace wire bond interconnection
SG120987A1 (en) Bonding pad structure
EP2960931B8 (en) Copper bond wire
TWI365224B (en) Cored wires
GB2414204B (en) Abrasive wire sawing
IL179289A0 (en) Single wire bus interface
TWI371808B (en) Au alloy bonding wire
GB2404709B (en) Bonding anchor
SG114765A1 (en) Multiple-ball wire bonds
SG118392A1 (en) Capillary for wire bonding
SG114779A1 (en) Wire bonding apparatus having actuated flame-off wand
PL1627982T3 (pl) Profil przyłączeniowy
EP1806105A4 (en) MEDICAL WIRE
TWI350132B (en) Linear split axis wire bonder
SG115757A1 (en) Wire bond with multiple stitch bonds
GB0426321D0 (en) A brassiere wire
GB2415012B (en) Securing device for wires
GB2415838B (en) Cable connection
IL160216A0 (en) Dental assembly
EP1806104A4 (en) MEDICAL WIRE
GB0517166D0 (en) Silver wire
SG120261A1 (en) Wire bond with improved shear strength
EP1871918A4 (en) EXOTHERMIC WIRE FOR BONDING SUBSTRATES
GB0400978D0 (en) Diamond bonding
GB0415225D0 (en) Electrical interconnection system

Legal Events

Date Code Title Description
MK4A Expiration of patent term of an invention patent