TWI365299B - Data reception circuit, test device using said circuit, and timing adjustment circuit of a strobe signal - Google Patents
Data reception circuit, test device using said circuit, and timing adjustment circuit of a strobe signalInfo
- Publication number
- TWI365299B TWI365299B TW097109895A TW97109895A TWI365299B TW I365299 B TWI365299 B TW I365299B TW 097109895 A TW097109895 A TW 097109895A TW 97109895 A TW97109895 A TW 97109895A TW I365299 B TWI365299 B TW I365299B
- Authority
- TW
- Taiwan
- Prior art keywords
- circuit
- test device
- data reception
- strobe signal
- timing adjustment
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
- G01R31/3191—Calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Synchronisation In Digital Transmission Systems (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007074731 | 2007-03-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200900716A TW200900716A (en) | 2009-01-01 |
TWI365299B true TWI365299B (en) | 2012-06-01 |
Family
ID=39765626
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW097109895A TWI365299B (en) | 2007-03-22 | 2008-03-20 | Data reception circuit, test device using said circuit, and timing adjustment circuit of a strobe signal |
Country Status (7)
Country | Link |
---|---|
US (1) | US8270225B2 (zh) |
EP (1) | EP2136218A1 (zh) |
JP (1) | JP5153766B2 (zh) |
KR (1) | KR101265915B1 (zh) |
CN (1) | CN101641605A (zh) |
TW (1) | TWI365299B (zh) |
WO (1) | WO2008114508A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI627422B (zh) * | 2014-01-29 | 2018-06-21 | 韓商愛思開海力士有限公司 | 半導體測試裝置 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2010137058A1 (ja) * | 2009-05-25 | 2010-12-02 | 株式会社アドバンテスト | 受信装置、試験装置、受信方法および試験方法 |
JP5269701B2 (ja) * | 2009-06-12 | 2013-08-21 | 株式会社アドバンテスト | 試験装置およびストローブ信号のタイミング調整方法 |
JP4714306B1 (ja) * | 2009-11-18 | 2011-06-29 | 株式会社アドバンテスト | 受信装置、試験装置、受信方法、および試験方法 |
DE102011101179A1 (de) | 2011-05-11 | 2012-11-15 | Fachhochschule Kiel | Beschichtungen für Polymere |
JP2014109453A (ja) * | 2012-11-30 | 2014-06-12 | Renesas Electronics Corp | 半導体装置 |
US20150033062A1 (en) * | 2013-07-26 | 2015-01-29 | Mediatek Inc. | Apparatus and method for controlling controllable clock source to generate clock signal with frequency transition |
CN106026992B (zh) * | 2016-05-06 | 2018-11-06 | 武汉航空仪表有限责任公司 | 一种可变延时脉冲序列输出电路 |
CN113820612B (zh) * | 2020-06-19 | 2022-12-27 | 大唐恩智浦半导体有限公司 | 误差补偿电路和测量电池阻抗的集成电路 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2688941B2 (ja) | 1988-08-29 | 1997-12-10 | 株式会社アドバンテスト | 位相補正装置 |
JP3574728B2 (ja) * | 1996-06-14 | 2004-10-06 | 株式会社アドバンテスト | 半導体デバイス試験装置 |
JPH10319089A (ja) | 1997-05-21 | 1998-12-04 | Advantest Corp | 半導体試験装置 |
US6374388B1 (en) | 1999-09-10 | 2002-04-16 | Agilent Technologies, Inc. | Equivalent time capture scheme for bit patterns within high data rate signals |
US7401272B1 (en) * | 2001-03-09 | 2008-07-15 | Pmc-Sierra, Inc. | Apparatus and method for high speed sampling or testing of data signals using automated testing equipment |
JP2003057320A (ja) | 2001-08-10 | 2003-02-26 | Advantest Corp | タイミング測定方法及び半導体試験装置 |
CN101171790B (zh) * | 2005-05-02 | 2011-11-30 | Nxp股份有限公司 | 具有适应性选通偏移调整功能的接收机 |
US7268629B2 (en) | 2005-05-25 | 2007-09-11 | Kabushiki Kaisha Toshiba | System and method for lock detection of a phase-locked loop circuit |
JP4536610B2 (ja) | 2005-07-07 | 2010-09-01 | 株式会社アドバンテスト | 半導体試験装置 |
US7743304B2 (en) * | 2006-02-17 | 2010-06-22 | Verigy (Singapore) Pte. Ltd. | Test system and method for testing electronic devices using a pipelined testing architecture |
-
2008
- 2008-03-18 KR KR1020097021996A patent/KR101265915B1/ko not_active IP Right Cessation
- 2008-03-18 CN CN200880009189A patent/CN101641605A/zh active Pending
- 2008-03-18 EP EP08720518A patent/EP2136218A1/en not_active Withdrawn
- 2008-03-18 US US12/532,134 patent/US8270225B2/en not_active Expired - Fee Related
- 2008-03-18 JP JP2009505080A patent/JP5153766B2/ja not_active Expired - Fee Related
- 2008-03-18 WO PCT/JP2008/000633 patent/WO2008114508A1/ja active Application Filing
- 2008-03-20 TW TW097109895A patent/TWI365299B/zh not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI627422B (zh) * | 2014-01-29 | 2018-06-21 | 韓商愛思開海力士有限公司 | 半導體測試裝置 |
TWI639845B (zh) * | 2014-01-29 | 2018-11-01 | 韓商愛思開海力士有限公司 | 半導體測試裝置 |
Also Published As
Publication number | Publication date |
---|---|
KR20090130391A (ko) | 2009-12-23 |
WO2008114508A1 (ja) | 2008-09-25 |
CN101641605A (zh) | 2010-02-03 |
US8270225B2 (en) | 2012-09-18 |
US20100128538A1 (en) | 2010-05-27 |
EP2136218A1 (en) | 2009-12-23 |
TW200900716A (en) | 2009-01-01 |
JP5153766B2 (ja) | 2013-02-27 |
KR101265915B1 (ko) | 2013-05-20 |
JPWO2008114508A1 (ja) | 2010-07-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |