TWI342959B - Pulsed current generator circuit with charge booster - Google Patents
Pulsed current generator circuit with charge booster Download PDFInfo
- Publication number
- TWI342959B TWI342959B TW093137793A TW93137793A TWI342959B TW I342959 B TWI342959 B TW I342959B TW 093137793 A TW093137793 A TW 093137793A TW 93137793 A TW93137793 A TW 93137793A TW I342959 B TWI342959 B TW I342959B
- Authority
- TW
- Taiwan
- Prior art keywords
- current
- voltage
- circuit
- generator circuit
- current generator
- Prior art date
Links
- 238000012360 testing method Methods 0.000 claims abstract description 21
- 230000003071 parasitic effect Effects 0.000 claims abstract description 11
- 239000003990 capacitor Substances 0.000 claims description 15
- 239000000872 buffer Substances 0.000 claims description 7
- 239000013078 crystal Substances 0.000 claims description 4
- 230000004044 response Effects 0.000 claims description 4
- 238000010079 rubber tapping Methods 0.000 claims description 3
- 230000007704 transition Effects 0.000 description 11
- 230000009471 action Effects 0.000 description 9
- 238000004364 calculation method Methods 0.000 description 5
- 230000008878 coupling Effects 0.000 description 4
- 238000010168 coupling process Methods 0.000 description 4
- 238000005859 coupling reaction Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000009849 deactivation Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000010791 quenching Methods 0.000 description 1
- 230000000171 quenching effect Effects 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 210000002784 stomach Anatomy 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
- G01R31/2841—Signal generators
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Dc-Dc Converters (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Generation Of Surge Voltage And Current (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/734,002 US7049713B2 (en) | 2003-12-10 | 2003-12-10 | Pulsed current generator circuit with charge booster |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200525162A TW200525162A (en) | 2005-08-01 |
| TWI342959B true TWI342959B (en) | 2011-06-01 |
Family
ID=34653271
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW093137793A TWI342959B (en) | 2003-12-10 | 2004-12-07 | Pulsed current generator circuit with charge booster |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7049713B2 (https=) |
| EP (1) | EP1692056B1 (https=) |
| JP (1) | JP4520998B2 (https=) |
| CN (1) | CN100550624C (https=) |
| AT (1) | ATE423324T1 (https=) |
| DE (1) | DE602004019562D1 (https=) |
| TW (1) | TWI342959B (https=) |
| WO (1) | WO2005060568A2 (https=) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7724017B2 (en) * | 2006-08-31 | 2010-05-25 | Keithley Instruments, Inc. | Multi-channel pulse tester |
| ES2335148T3 (es) | 2007-12-10 | 2010-03-22 | Mtronix Precision Measuring Instruments Gmbh | Dispositivo y procedimiento para la generacion de un umpulso de carga definido para la realizacion de una medicion de la descarga parcial. |
| TWI410642B (zh) * | 2011-03-04 | 2013-10-01 | Realtek Semiconductor Corp | 電感偵測裝置與方法 |
| US9088207B2 (en) * | 2012-06-04 | 2015-07-21 | Stangenes Industries, Inc. | Long pulse droop compensator |
| US20170131326A1 (en) * | 2015-11-10 | 2017-05-11 | Qualitau, Inc. | Pulsed current source with internal impedance matching |
| CN107493092B (zh) * | 2017-08-18 | 2020-06-19 | 河海大学常州校区 | 大脉冲电流发生装置及其控制方法 |
| US11705894B2 (en) * | 2019-08-27 | 2023-07-18 | Keithley Instruments, Llc | Pulsed high current technique for characterization of device under test |
| WO2022027438A1 (en) * | 2020-08-06 | 2022-02-10 | Innoscience (Zhuhai) Technology Co., Ltd. | Device and method for testing semiconductor devices |
| CN113109045B (zh) * | 2021-03-11 | 2024-01-05 | 东风商用车有限公司 | 一种助力器总成的耐久试验方法 |
| CN113098273B (zh) * | 2021-04-25 | 2023-06-30 | 阳光电源股份有限公司 | 一种多输入Boost电路及其故障检测方法 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4362955A (en) * | 1980-12-18 | 1982-12-07 | Tektronix, Inc. | Current boost circuit for a pulse generator output stage |
| US4434401A (en) * | 1981-05-04 | 1984-02-28 | Flight Systems, Inc. | Apparatus for testing semiconductor devices and capacitors |
| DE3702680A1 (de) * | 1986-02-18 | 1987-10-29 | Bosch Gmbh Robert | Verfahren und schaltung zur ansteuerung von elektromagnetischen verbrauchern |
| JPH0792492B2 (ja) * | 1986-11-28 | 1995-10-09 | 日立電子エンジニアリング株式会社 | 電子デバイス駆動回路 |
| JPS63187810A (ja) * | 1987-01-30 | 1988-08-03 | Hitachi Ltd | 試験信号発生回路 |
| JP2866750B2 (ja) * | 1991-01-28 | 1999-03-08 | 三菱電機株式会社 | 半導体試験装置および半導体装置の試験方法 |
| JPH102930A (ja) * | 1996-06-18 | 1998-01-06 | Hitachi Electron Eng Co Ltd | Ｉｃテスタ |
| US6348802B1 (en) * | 1998-04-10 | 2002-02-19 | Electro Scientific Industries, Inc. | Device for enhancing contact checking |
| JPH11330925A (ja) * | 1998-05-19 | 1999-11-30 | Maw:Kk | 電流パルス発生装置 |
| JP2000171493A (ja) * | 1998-12-02 | 2000-06-23 | Advantest Corp | 電流測定方法及び電流測定装置 |
| US6249137B1 (en) | 1999-10-14 | 2001-06-19 | Qualitau, Inc. | Circuit and method for pulsed reliability testing |
| IT1318238B1 (it) * | 2000-07-25 | 2003-07-28 | St Microelectronics Srl | Circuito autoelevatore nei convertitori statici dc/dc. |
| JP2002139539A (ja) * | 2000-10-30 | 2002-05-17 | Advantest Corp | 半導体デバイスの電源電流測定方法・電源電流測定装置 |
| JP2004117100A (ja) * | 2002-09-25 | 2004-04-15 | Hitachi Ltd | 半導体試験装置 |
| JP4318511B2 (ja) * | 2003-08-26 | 2009-08-26 | 三洋電機株式会社 | 昇圧回路 |
-
2003
- 2003-12-10 US US10/734,002 patent/US7049713B2/en not_active Expired - Lifetime
-
2004
- 2004-12-02 AT AT04812995T patent/ATE423324T1/de not_active IP Right Cessation
- 2004-12-02 WO PCT/US2004/040591 patent/WO2005060568A2/en not_active Ceased
- 2004-12-02 DE DE602004019562T patent/DE602004019562D1/de not_active Expired - Lifetime
- 2004-12-02 JP JP2006543900A patent/JP4520998B2/ja not_active Expired - Lifetime
- 2004-12-02 EP EP04812995A patent/EP1692056B1/en not_active Expired - Lifetime
- 2004-12-02 CN CNB2004800413013A patent/CN100550624C/zh not_active Expired - Fee Related
- 2004-12-07 TW TW093137793A patent/TWI342959B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| CN100550624C (zh) | 2009-10-14 |
| US7049713B2 (en) | 2006-05-23 |
| CN1914803A (zh) | 2007-02-14 |
| EP1692056A4 (en) | 2007-01-24 |
| JP2007523518A (ja) | 2007-08-16 |
| DE602004019562D1 (https=) | 2009-04-02 |
| EP1692056B1 (en) | 2009-02-18 |
| JP4520998B2 (ja) | 2010-08-11 |
| WO2005060568A3 (en) | 2005-12-29 |
| TW200525162A (en) | 2005-08-01 |
| US20050128655A1 (en) | 2005-06-16 |
| WO2005060568A2 (en) | 2005-07-07 |
| EP1692056A2 (en) | 2006-08-23 |
| ATE423324T1 (de) | 2009-03-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK4A | Expiration of patent term of an invention patent |