JP4520998B2 - 充電昇圧器を伴うパルス電流源回路 - Google Patents

充電昇圧器を伴うパルス電流源回路 Download PDF

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Publication number
JP4520998B2
JP4520998B2 JP2006543900A JP2006543900A JP4520998B2 JP 4520998 B2 JP4520998 B2 JP 4520998B2 JP 2006543900 A JP2006543900 A JP 2006543900A JP 2006543900 A JP2006543900 A JP 2006543900A JP 4520998 B2 JP4520998 B2 JP 4520998B2
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JP
Japan
Prior art keywords
pulse current
generation circuit
current generation
voltage
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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JP2006543900A
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English (en)
Japanese (ja)
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JP2007523518A (ja
JP2007523518A5 (https=
Inventor
クエバス・ピーター
クリーガー・ゲダリアフー
エバンス・モーリス
ウルマン・ジェンス
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QualiTau Inc
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QualiTau Inc
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Publication date
Application filed by QualiTau Inc filed Critical QualiTau Inc
Publication of JP2007523518A publication Critical patent/JP2007523518A/ja
Publication of JP2007523518A5 publication Critical patent/JP2007523518A5/ja
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Publication of JP4520998B2 publication Critical patent/JP4520998B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Dc-Dc Converters (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Generation Of Surge Voltage And Current (AREA)
JP2006543900A 2003-12-10 2004-12-02 充電昇圧器を伴うパルス電流源回路 Expired - Lifetime JP4520998B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/734,002 US7049713B2 (en) 2003-12-10 2003-12-10 Pulsed current generator circuit with charge booster
PCT/US2004/040591 WO2005060568A2 (en) 2003-12-10 2004-12-02 Pulsed current generator circuit with charge booster

Publications (3)

Publication Number Publication Date
JP2007523518A JP2007523518A (ja) 2007-08-16
JP2007523518A5 JP2007523518A5 (https=) 2008-01-24
JP4520998B2 true JP4520998B2 (ja) 2010-08-11

Family

ID=34653271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006543900A Expired - Lifetime JP4520998B2 (ja) 2003-12-10 2004-12-02 充電昇圧器を伴うパルス電流源回路

Country Status (8)

Country Link
US (1) US7049713B2 (https=)
EP (1) EP1692056B1 (https=)
JP (1) JP4520998B2 (https=)
CN (1) CN100550624C (https=)
AT (1) ATE423324T1 (https=)
DE (1) DE602004019562D1 (https=)
TW (1) TWI342959B (https=)
WO (1) WO2005060568A2 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7724017B2 (en) * 2006-08-31 2010-05-25 Keithley Instruments, Inc. Multi-channel pulse tester
ES2335148T3 (es) 2007-12-10 2010-03-22 Mtronix Precision Measuring Instruments Gmbh Dispositivo y procedimiento para la generacion de un umpulso de carga definido para la realizacion de una medicion de la descarga parcial.
TWI410642B (zh) * 2011-03-04 2013-10-01 Realtek Semiconductor Corp 電感偵測裝置與方法
US9088207B2 (en) * 2012-06-04 2015-07-21 Stangenes Industries, Inc. Long pulse droop compensator
US20170131326A1 (en) * 2015-11-10 2017-05-11 Qualitau, Inc. Pulsed current source with internal impedance matching
CN107493092B (zh) * 2017-08-18 2020-06-19 河海大学常州校区 大脉冲电流发生装置及其控制方法
US11705894B2 (en) * 2019-08-27 2023-07-18 Keithley Instruments, Llc Pulsed high current technique for characterization of device under test
WO2022027438A1 (en) * 2020-08-06 2022-02-10 Innoscience (Zhuhai) Technology Co., Ltd. Device and method for testing semiconductor devices
CN113109045B (zh) * 2021-03-11 2024-01-05 东风商用车有限公司 一种助力器总成的耐久试验方法
CN113098273B (zh) * 2021-04-25 2023-06-30 阳光电源股份有限公司 一种多输入Boost电路及其故障检测方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4362955A (en) * 1980-12-18 1982-12-07 Tektronix, Inc. Current boost circuit for a pulse generator output stage
US4434401A (en) * 1981-05-04 1984-02-28 Flight Systems, Inc. Apparatus for testing semiconductor devices and capacitors
DE3702680A1 (de) * 1986-02-18 1987-10-29 Bosch Gmbh Robert Verfahren und schaltung zur ansteuerung von elektromagnetischen verbrauchern
JPH0792492B2 (ja) * 1986-11-28 1995-10-09 日立電子エンジニアリング株式会社 電子デバイス駆動回路
JPS63187810A (ja) * 1987-01-30 1988-08-03 Hitachi Ltd 試験信号発生回路
JP2866750B2 (ja) * 1991-01-28 1999-03-08 三菱電機株式会社 半導体試験装置および半導体装置の試験方法
JPH102930A (ja) * 1996-06-18 1998-01-06 Hitachi Electron Eng Co Ltd Ｉｃテスタ
US6348802B1 (en) * 1998-04-10 2002-02-19 Electro Scientific Industries, Inc. Device for enhancing contact checking
JPH11330925A (ja) * 1998-05-19 1999-11-30 Maw:Kk 電流パルス発生装置
JP2000171493A (ja) * 1998-12-02 2000-06-23 Advantest Corp 電流測定方法及び電流測定装置
US6249137B1 (en) 1999-10-14 2001-06-19 Qualitau, Inc. Circuit and method for pulsed reliability testing
IT1318238B1 (it) * 2000-07-25 2003-07-28 St Microelectronics Srl Circuito autoelevatore nei convertitori statici dc/dc.
JP2002139539A (ja) * 2000-10-30 2002-05-17 Advantest Corp 半導体デバイスの電源電流測定方法・電源電流測定装置
JP2004117100A (ja) * 2002-09-25 2004-04-15 Hitachi Ltd 半導体試験装置
JP4318511B2 (ja) * 2003-08-26 2009-08-26 三洋電機株式会社 昇圧回路

Also Published As

Publication number Publication date
CN100550624C (zh) 2009-10-14
US7049713B2 (en) 2006-05-23
CN1914803A (zh) 2007-02-14
EP1692056A4 (en) 2007-01-24
JP2007523518A (ja) 2007-08-16
DE602004019562D1 (https=) 2009-04-02
EP1692056B1 (en) 2009-02-18
WO2005060568A3 (en) 2005-12-29
TWI342959B (en) 2011-06-01
TW200525162A (en) 2005-08-01
US20050128655A1 (en) 2005-06-16
WO2005060568A2 (en) 2005-07-07
EP1692056A2 (en) 2006-08-23
ATE423324T1 (de) 2009-03-15

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