TWI341461B - Programmable delay cell and a controller, a printed circuit board and a computer apparatus having the same, methods for using the same and an article holding instructions for testing timing of signals between a controller and a devices - Google Patents
Programmable delay cell and a controller, a printed circuit board and a computer apparatus having the same, methods for using the same and an article holding instructions for testing timing of signals between a controller and a devicesInfo
- Publication number
- TWI341461B TWI341461B TW093130739A TW93130739A TWI341461B TW I341461 B TWI341461 B TW I341461B TW 093130739 A TW093130739 A TW 093130739A TW 93130739 A TW93130739 A TW 93130739A TW I341461 B TWI341461 B TW I341461B
- Authority
- TW
- Taiwan
- Prior art keywords
- controller
- same
- signals
- circuit board
- printed circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
- G06F13/40—Bus structure
- G06F13/4004—Coupling between buses
- G06F13/4027—Coupling between buses using bus bridges
- G06F13/405—Coupling between buses using bus bridges where the bridge performs a synchronising function
- G06F13/4059—Coupling between buses using bus bridges where the bridge performs a synchronising function where the synchronisation uses buffers, e.g. for speed matching between buses
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Logic Circuits (AREA)
- Pulse Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- Dram (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/685,418 US20050083095A1 (en) | 2003-10-16 | 2003-10-16 | Adaptive input/output buffer and methods thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200525349A TW200525349A (en) | 2005-08-01 |
TWI341461B true TWI341461B (en) | 2011-05-01 |
Family
ID=34465468
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093130739A TWI341461B (en) | 2003-10-16 | 2004-10-11 | Programmable delay cell and a controller, a printed circuit board and a computer apparatus having the same, methods for using the same and an article holding instructions for testing timing of signals between a controller and a devices |
Country Status (6)
Country | Link |
---|---|
US (1) | US20050083095A1 (zh) |
JP (1) | JP2007509541A (zh) |
CN (3) | CN1894679B (zh) |
DE (1) | DE112004003057B4 (zh) |
TW (1) | TWI341461B (zh) |
WO (1) | WO2005038657A2 (zh) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9009698B2 (en) * | 2002-10-15 | 2015-04-14 | Rpx Corporation | System and method for providing computer upgrade information |
US7529955B2 (en) * | 2005-06-30 | 2009-05-05 | Intel Corporation | Dynamic bus parking |
US8819474B2 (en) * | 2009-04-03 | 2014-08-26 | Intel Corporation | Active training of memory command timing |
TWI489718B (zh) * | 2009-10-14 | 2015-06-21 | Inventec Appliances Corp | 儲存裝置及其運作方法 |
US8806093B2 (en) * | 2010-04-01 | 2014-08-12 | Intel Corporation | Method, apparatus, and system for enabling a deterministic interface |
US20140380000A1 (en) * | 2013-06-20 | 2014-12-25 | Silicon Motion, Inc. | Memory controller and accessing system utilizing the same |
KR102628533B1 (ko) * | 2016-08-16 | 2024-01-25 | 에스케이하이닉스 주식회사 | 반도체장치 및 반도체시스템 |
CN108009372B (zh) * | 2017-12-15 | 2020-07-31 | 中国科学院计算技术研究所 | 一种ddr内存虚拟写电平校准响应的方法 |
US11079946B2 (en) | 2018-10-26 | 2021-08-03 | Micron Technology, Inc. | Write training in memory devices |
CN109857684B (zh) * | 2019-01-04 | 2020-11-06 | 烽火通信科技股份有限公司 | 通信设备板卡槽位地址和类型识别的装置、方法和系统 |
CN112035520A (zh) * | 2019-06-03 | 2020-12-04 | 吕纪竹 | 一种实时判断流数据自身给定延迟重复性的方法 |
CN112069768B (zh) * | 2020-09-08 | 2024-07-16 | 飞腾信息技术有限公司 | 一种针对双端口sram输入输出延时优化的方法 |
Family Cites Families (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54153565A (en) * | 1978-05-24 | 1979-12-03 | Nec Corp | Semiconductor circuit using insulation gate type field effect transistor |
FR2501813B1 (fr) * | 1981-03-13 | 1986-06-13 | Amiot Expl Procedes Felix | Perfectionnements aux dispositifs pour accoupler selectivement a un arbre a entrainer deux organes entraineurs distincts |
JPS5861629A (ja) * | 1981-10-09 | 1983-04-12 | Hitachi Ltd | ビツトパタ−ン発生装置 |
US4584492A (en) * | 1984-08-06 | 1986-04-22 | Intel Corporation | Temperature and process stable MOS input buffer |
JPS61129916A (ja) * | 1984-11-29 | 1986-06-17 | Fujitsu Ltd | 遅延回路 |
JPH0681018B2 (ja) * | 1986-03-31 | 1994-10-12 | 三菱電機株式会社 | 半導体集積回路 |
JPH02195716A (ja) * | 1989-01-25 | 1990-08-02 | Nec Eng Ltd | 半導体集積回路の論理ゲート回路 |
JPH02274121A (ja) * | 1989-04-17 | 1990-11-08 | Nec Corp | Cmos遅延回路 |
JP2671516B2 (ja) * | 1989-08-02 | 1997-10-29 | 日本電気株式会社 | スキュー補正回路 |
DE69024582T2 (de) * | 1989-10-06 | 1996-05-15 | Sumitomo Metal Mining Co | Stahllegierung zum Anwenden in spritzgegossenen pulvermetallurgisch hergestellten gesinterten Formkörpern |
US5140554A (en) * | 1990-08-30 | 1992-08-18 | Texas Instruments Incorporated | Integrated circuit fuse-link tester and test method |
JPH0661810A (ja) * | 1992-08-12 | 1994-03-04 | Hitachi Ltd | 可変遅延回路、及びこれを用いた半導体集積回路装置 |
JPH07115351A (ja) * | 1993-10-19 | 1995-05-02 | Hitachi Ltd | 遅延回路およびそれを用いた信号処理回路、ならびにこの信号処理回路を内蔵した半導体集積回路装置 |
JPH08330921A (ja) * | 1995-06-02 | 1996-12-13 | Advantest Corp | 可変遅延回路 |
JP3547854B2 (ja) * | 1995-06-08 | 2004-07-28 | 株式会社ルネサステクノロジ | 駆動電流調整機能付きバッファ回路 |
JPH09172356A (ja) * | 1995-12-19 | 1997-06-30 | Fujitsu Ltd | 遅延回路及びデジタル位相ロック回路 |
US5847617A (en) * | 1996-08-12 | 1998-12-08 | Altera Corporation | Variable-path-length voltage-controlled oscillator circuit |
US5946712A (en) * | 1997-06-04 | 1999-08-31 | Oak Technology, Inc. | Apparatus and method for reading data from synchronous memory |
US6073259A (en) * | 1997-08-05 | 2000-06-06 | Teradyne, Inc. | Low cost CMOS tester with high channel density |
JPH11145800A (ja) * | 1997-11-10 | 1999-05-28 | Toshiba Corp | Cmos型可変遅延回路及びその遅延時間の制御方法並びに半導体試験装置 |
JP3348432B2 (ja) * | 1999-09-14 | 2002-11-20 | 日本電気株式会社 | 半導体装置および半導体記憶装置 |
US6731667B1 (en) * | 1999-11-18 | 2004-05-04 | Anapass Inc. | Zero-delay buffer circuit for a spread spectrum clock system and method therefor |
JP2002082830A (ja) * | 2000-02-14 | 2002-03-22 | Mitsubishi Electric Corp | インターフェイス回路 |
TW498778U (en) * | 2000-08-03 | 2002-08-11 | Paokai Electronic Entpr Co Ltd | Structure of frame for game machine |
US6868504B1 (en) * | 2000-08-31 | 2005-03-15 | Micron Technology, Inc. | Interleaved delay line for phase locked and delay locked loops |
US6665624B2 (en) * | 2001-03-02 | 2003-12-16 | Intel Corporation | Generating and using calibration information |
US7805628B2 (en) * | 2001-04-02 | 2010-09-28 | Credence Systems Corporation | High resolution clock signal generator |
US6456126B1 (en) * | 2001-05-25 | 2002-09-24 | Xilinx, Inc. | Frequency doubler with polarity control |
JP2003050738A (ja) * | 2001-08-03 | 2003-02-21 | Elpida Memory Inc | キャリブレーション方法及びメモリシステム |
EP1294205A1 (en) * | 2001-09-13 | 2003-03-19 | Alcatel | Digital signal processor multi-channel time alignment device and method |
US6954134B2 (en) * | 2001-09-28 | 2005-10-11 | Alps Automotive, Inc. | Apparatus and method for timing an output of a remote keyless entry system |
US6605969B2 (en) * | 2001-10-09 | 2003-08-12 | Micron Technology, Inc. | Method and circuit for adjusting the timing of ouput data based on an operational mode of output drivers |
KR100507877B1 (ko) * | 2002-03-28 | 2005-08-18 | 주식회사 하이닉스반도체 | 면적 축소용 알디엘엘 회로 |
JP3498741B2 (ja) * | 2002-05-07 | 2004-02-16 | 株式会社日立製作所 | 可変遅延回路 |
-
2003
- 2003-10-16 US US10/685,418 patent/US20050083095A1/en not_active Abandoned
-
2004
- 2004-10-11 TW TW093130739A patent/TWI341461B/zh not_active IP Right Cessation
- 2004-10-14 CN CN200480037752XA patent/CN1894679B/zh not_active Expired - Fee Related
- 2004-10-14 CN CN201510305117.5A patent/CN104978297B/zh not_active Expired - Fee Related
- 2004-10-14 WO PCT/US2004/033694 patent/WO2005038657A2/en active Application Filing
- 2004-10-14 DE DE112004003057T patent/DE112004003057B4/de not_active Expired - Fee Related
- 2004-10-14 JP JP2006535610A patent/JP2007509541A/ja active Pending
- 2004-10-14 CN CN201210310608.5A patent/CN102880582B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN102880582A (zh) | 2013-01-16 |
WO2005038657A2 (en) | 2005-04-28 |
CN1894679B (zh) | 2012-09-19 |
CN1894679A (zh) | 2007-01-10 |
JP2007509541A (ja) | 2007-04-12 |
US20050083095A1 (en) | 2005-04-21 |
TW200525349A (en) | 2005-08-01 |
WO2005038657A3 (en) | 2005-06-16 |
DE112004003057B4 (de) | 2011-09-15 |
DE112004003057A1 (de) | 2008-12-18 |
CN104978297A (zh) | 2015-10-14 |
CN102880582B (zh) | 2016-04-27 |
CN104978297B (zh) | 2019-06-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |