TWI321650B - - Google Patents

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Publication number
TWI321650B
TWI321650B TW095127418A TW95127418A TWI321650B TW I321650 B TWI321650 B TW I321650B TW 095127418 A TW095127418 A TW 095127418A TW 95127418 A TW95127418 A TW 95127418A TW I321650 B TWI321650 B TW I321650B
Authority
TW
Taiwan
Prior art keywords
liquid crystal
crystal panel
backlight
light
polarizing plate
Prior art date
Application number
TW095127418A
Other languages
English (en)
Chinese (zh)
Other versions
TW200712467A (en
Inventor
Makoto Kikuta
Kunihiro Mizuno
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200712467A publication Critical patent/TW200712467A/zh
Application granted granted Critical
Publication of TWI321650B publication Critical patent/TWI321650B/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nonlinear Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Liquid Crystal (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
TW095127418A 2005-09-26 2006-07-27 Liquid crystal panel inspection device TW200712467A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005277165A JP4884738B2 (ja) 2005-09-26 2005-09-26 液晶パネル検査装置

Publications (2)

Publication Number Publication Date
TW200712467A TW200712467A (en) 2007-04-01
TWI321650B true TWI321650B (ja) 2010-03-11

Family

ID=37973583

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095127418A TW200712467A (en) 2005-09-26 2006-07-27 Liquid crystal panel inspection device

Country Status (3)

Country Link
JP (1) JP4884738B2 (ja)
KR (1) KR100779135B1 (ja)
TW (1) TW200712467A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103217436A (zh) * 2013-03-06 2013-07-24 京东方科技集团股份有限公司 一种背光模组瑕疵的检测方法及设备
CN105486689A (zh) * 2015-12-23 2016-04-13 苏州精濑光电有限公司 光学检测机

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4842034B2 (ja) * 2006-07-12 2011-12-21 株式会社日本マイクロニクス 液晶パネルの検査方法および画像処理装置
JP5112748B2 (ja) * 2007-05-30 2013-01-09 株式会社日本マイクロニクス 液晶パネル検査方法及び装置
KR101068364B1 (ko) * 2007-07-11 2011-09-28 엘지디스플레이 주식회사 액정표시장치 검사장비 및 그 검사방법
JP5308958B2 (ja) * 2009-08-10 2013-10-09 株式会社日本マイクロニクス 表示パネルのためのワークテーブル及び試験装置
WO2011086634A1 (ja) * 2010-01-14 2011-07-21 シャープ株式会社 液晶パネル検査方法及び装置
JP6104016B2 (ja) * 2013-04-01 2017-03-29 株式会社日本マイクロニクス 液晶パネル検査装置
TWI502186B (zh) * 2014-05-08 2015-10-01 Utechzone Co Ltd A bright spot detection device for filtering foreign matter noise and its method
KR102289972B1 (ko) 2017-07-28 2021-08-18 산진 옵토일렉트로닉스 (쑤저우) 컴퍼니 리미티드 광학필름 결함 검출 장치 및 광학필름 결함 검출 방법
KR102091930B1 (ko) * 2018-07-30 2020-03-23 우순 테크놀로지 컴퍼니, 리미티드 패널 부재 경사 각도 측정 장치 및 그 방법
CN109001228B (zh) * 2018-09-18 2024-02-27 华侨大学 一种带背光照明的衬底缺陷检测用回转工作台
CN110108713A (zh) * 2019-04-26 2019-08-09 武汉精立电子技术有限公司 一种表面异物缺陷快速过滤方法及系统
CN111257335B (zh) * 2020-01-09 2023-01-24 Oppo（重庆）智能科技有限公司 电子设备内部尘点检测方法
CN113008898A (zh) * 2021-02-25 2021-06-22 四川兆纪光电科技有限公司 一种背光源模组的检测装置及检测方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07151919A (ja) * 1993-11-29 1995-06-16 Mitsutoyo Corp 画像処理型測定機の照明装置
JPH10160628A (ja) * 1996-11-29 1998-06-19 Advantest Corp Ｌｃｄパネルの画質検査装置
JPH10227721A (ja) * 1997-02-18 1998-08-25 Micronics Japan Co Ltd 液晶パネルの検査方法および装置
JPH11224515A (ja) * 1998-02-06 1999-08-17 Mitsubishi Rayon Co Ltd 照明装置及びそれを用いた欠陥検査装置
JP2955856B1 (ja) * 1998-05-21 1999-10-04 ミナトエレクトロニクス株式会社 表示素子表面欠陥抽出方法を具備した表示素子の表示画面検査方法とその実施に使用する検査装置
JP2000275596A (ja) * 1999-03-26 2000-10-06 Ricoh Co Ltd セル検査装置及びセル検査方法
JP2001305075A (ja) * 2000-04-21 2001-10-31 Sharp Corp 外観検査装置
JP2003270155A (ja) * 2002-03-15 2003-09-25 Olympus Optical Co Ltd 基板保持装置及び検査装置
JP2004170495A (ja) * 2002-11-18 2004-06-17 Micronics Japan Co Ltd 表示用基板の検査方法及び装置
JP2006078317A (ja) * 2004-09-09 2006-03-23 Seiko Epson Corp 被検査体の検査方法及びその装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103217436A (zh) * 2013-03-06 2013-07-24 京东方科技集团股份有限公司 一种背光模组瑕疵的检测方法及设备
CN103217436B (zh) * 2013-03-06 2015-05-20 京东方科技集团股份有限公司 一种背光模组瑕疵的检测方法及设备
US9330451B2 (en) 2013-03-06 2016-05-03 Boe Optical Science And Technology Co., Ltd Method and apparatus for detecting defect of backlight module
CN105486689A (zh) * 2015-12-23 2016-04-13 苏州精濑光电有限公司 光学检测机
CN105486689B (zh) * 2015-12-23 2018-01-23 苏州精濑光电有限公司 光学检测机

Also Published As

Publication number Publication date
JP2007086563A (ja) 2007-04-05
TW200712467A (en) 2007-04-01
KR20070034928A (ko) 2007-03-29
KR100779135B1 (ko) 2007-11-23
JP4884738B2 (ja) 2012-02-29

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