TW200712467A - Liquid crystal panel inspection device - Google Patents

Liquid crystal panel inspection device

Info

Publication number
TW200712467A
TW200712467A TW095127418A TW95127418A TW200712467A TW 200712467 A TW200712467 A TW 200712467A TW 095127418 A TW095127418 A TW 095127418A TW 95127418 A TW95127418 A TW 95127418A TW 200712467 A TW200712467 A TW 200712467A
Authority
TW
Taiwan
Prior art keywords
liquid crystal
dust
crystal panel
turned
crystal panels
Prior art date
Application number
TW095127418A
Other languages
Chinese (zh)
Other versions
TWI321650B (en
Inventor
Makoto Kikuta
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200712467A publication Critical patent/TW200712467A/en
Application granted granted Critical
Publication of TWI321650B publication Critical patent/TWI321650B/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

Disclosed is a device for inspecting liquid crystal panels under state of no polarizers using photography devices, which is capable of distinguishing images of dust attached to surfaces of two sides of the liquid crystal panels and defects within the liquid crystal panels. A backlight switch 36 is turned ON, and an inclined lighting switch 40 is turned OFF. A shutter 32 is open to cause light of a backlight device 30 to pass through a diffusion plate 24 and a first polarizer 22 and to project onto a backside of a liquid crystal panel 12. A CCD camera 44 then take a picture of the liquid crystal panel 12. At this time, dust in the liquid crystal panel 12 and dust at the two laterial sides (exterior dust) will be reflected. Then, the shutter 32 is closed and the inclined lighting switch 40 is turned ON to take the same picture. At this time, only external dust but not the internal dust will be reflected. By comparing the two images, the internal dust can be distinguished from the external dust.
TW095127418A 2005-09-26 2006-07-27 Liquid crystal panel inspection device TW200712467A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005277165A JP4884738B2 (en) 2005-09-26 2005-09-26 LCD panel inspection equipment

Publications (2)

Publication Number Publication Date
TW200712467A true TW200712467A (en) 2007-04-01
TWI321650B TWI321650B (en) 2010-03-11

Family

ID=37973583

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095127418A TW200712467A (en) 2005-09-26 2006-07-27 Liquid crystal panel inspection device

Country Status (3)

Country Link
JP (1) JP4884738B2 (en)
KR (1) KR100779135B1 (en)
TW (1) TW200712467A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109001228A (en) * 2018-09-18 2018-12-14 华侨大学 A kind of substrate defects detection rotary table with back lighting

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4842034B2 (en) * 2006-07-12 2011-12-21 株式会社日本マイクロニクス Liquid crystal panel inspection method and image processing apparatus
JP5112748B2 (en) * 2007-05-30 2013-01-09 株式会社日本マイクロニクス Liquid crystal panel inspection method and apparatus
KR101068364B1 (en) 2007-07-11 2011-09-28 엘지디스플레이 주식회사 inspection equipment of LCD and method for inspecting the same
JP5308958B2 (en) * 2009-08-10 2013-10-09 株式会社日本マイクロニクス Work table and display device for display panel
WO2011086634A1 (en) * 2010-01-14 2011-07-21 シャープ株式会社 Liquid crystal panel inspection method and device
CN103217436B (en) 2013-03-06 2015-05-20 京东方科技集团股份有限公司 Backlight module group defect detection method and equipment
JP6104016B2 (en) * 2013-04-01 2017-03-29 株式会社日本マイクロニクス LCD panel inspection equipment
TWI502186B (en) * 2014-05-08 2015-10-01 Utechzone Co Ltd A bright spot detection device for filtering foreign matter noise and its method
CN105486689B (en) * 2015-12-23 2018-01-23 苏州精濑光电有限公司 Optical detector
KR102289972B1 (en) 2017-07-28 2021-08-18 산진 옵토일렉트로닉스 (쑤저우) 컴퍼니 리미티드 Device and method for detecting defect of optical film
KR102091930B1 (en) * 2018-07-30 2020-03-23 우순 테크놀로지 컴퍼니, 리미티드 Panel member inclination angle measuring device and method
CN110108713A (en) * 2019-04-26 2019-08-09 武汉精立电子技术有限公司 A kind of Superficial Foreign Body defect fast filtering method and system
US11340284B2 (en) * 2019-07-23 2022-05-24 Kla Corporation Combined transmitted and reflected light imaging of internal cracks in semiconductor devices
CN111257335B (en) * 2020-01-09 2023-01-24 Oppo（重庆）智能科技有限公司 Method for detecting dust points in electronic equipment
CN113008898A (en) * 2021-02-25 2021-06-22 四川兆纪光电科技有限公司 Detection device and detection method for backlight source module

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07151919A (en) * 1993-11-29 1995-06-16 Mitsutoyo Corp Illuminator for image processing type measuring machine
JPH10160628A (en) * 1996-11-29 1998-06-19 Advantest Corp Image quality inspection device for lcd panel
JPH10227721A (en) * 1997-02-18 1998-08-25 Micronics Japan Co Ltd Liquid crystal display panel inspection method and device
JPH11224515A (en) * 1998-02-06 1999-08-17 Mitsubishi Rayon Co Ltd Lighting system and defect inspecting device using it
JP2955856B1 (en) * 1998-05-21 1999-10-04 ミナトエレクトロニクス株式会社 Display element inspection screen inspection method provided with display element surface defect extraction method and inspection apparatus used for the implementation
JP2000275596A (en) * 1999-03-26 2000-10-06 Ricoh Co Ltd Cell inspection apparatus and cell inspection method
JP2001305075A (en) * 2000-04-21 2001-10-31 Sharp Corp Appearance inspecting device
JP2003270155A (en) * 2002-03-15 2003-09-25 Olympus Optical Co Ltd Substrate holding device and inspection device
JP2004170495A (en) * 2002-11-18 2004-06-17 Micronics Japan Co Ltd Method and device for inspecting substrate for display
JP2006078317A (en) * 2004-09-09 2006-03-23 Seiko Epson Corp Inspection method for body under inspection and its device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109001228A (en) * 2018-09-18 2018-12-14 华侨大学 A kind of substrate defects detection rotary table with back lighting
CN109001228B (en) * 2018-09-18 2024-02-27 华侨大学 Rotary workbench with backlight illumination for detecting substrate defects

Also Published As

Publication number Publication date
JP2007086563A (en) 2007-04-05
TWI321650B (en) 2010-03-11
KR100779135B1 (en) 2007-11-23
KR20070034928A (en) 2007-03-29
JP4884738B2 (en) 2012-02-29

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