CN113008898A - Detection device and detection method for backlight source module - Google Patents
Detection device and detection method for backlight source module Download PDFInfo
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- CN113008898A CN113008898A CN202110211950.9A CN202110211950A CN113008898A CN 113008898 A CN113008898 A CN 113008898A CN 202110211950 A CN202110211950 A CN 202110211950A CN 113008898 A CN113008898 A CN 113008898A
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- 238000001514 detection method Methods 0.000 title claims abstract description 21
- 238000004458 analytical method Methods 0.000 claims abstract description 18
- 238000005286 illumination Methods 0.000 claims description 18
- 238000007405 data analysis Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 4
- 230000005611 electricity Effects 0.000 claims description 2
- 230000008569 process Effects 0.000 claims description 2
- 230000002950 deficient Effects 0.000 abstract description 13
- 238000004519 manufacturing process Methods 0.000 abstract description 8
- 238000012545 processing Methods 0.000 abstract description 8
- 239000002699 waste material Substances 0.000 abstract description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 5
- 230000006978 adaptation Effects 0.000 description 3
- 230000008439 repair process Effects 0.000 description 3
- 230000000007 visual effect Effects 0.000 description 3
- 230000001678 irradiating effect Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
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- 241000251468 Actinopterygii Species 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
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Abstract
The invention discloses a detection device of a backlight source module, which comprises a light source, a lighting power supply, an image acquisition unit and an analysis unit, wherein the irradiation direction of the light source is along the surface direction of the backlight source module, the lighting power supply is electrically connected with the backlight source module, and the image acquisition unit acquires the surface image of the backlight source module and sends the surface image to the analysis unit for analysis processing. The detection device of the backlight module utilizes the light source to irradiate the surface of the backlight module, so that the image information obtained by the image acquisition unit can more clearly and accurately obtain the condition of the foreign matters on the surface of the backlight module, accurately distinguish the foreign matters on the surface of the backlight module from the foreign matters inside the backlight module, accurately judge whether the backlight module is a defective product needing to be repaired, avoid the phenomenon that the defective product flows out to influence the quality, avoid the phenomenon that the defective product is repaired to waste working hours, and improve the yield and the production efficiency of products.
Description
Technical Field
The invention relates to the technical field of backlight production and manufacturing, in particular to a detection device and a detection method for a backlight module.
Background
The BackLight (BackLight) is a light source located behind a liquid crystal panel (LCD), and its light emitting effect directly affects the visual effect of the liquid crystal display module (LCM). The top layer of backlight module is the diaphragm, and liquid crystal display panel lid then constitutes liquid crystal display module on the diaphragm, and the diaphragm includes prism piece, diffusion piece etc. and the diaphragm is scratch-resistant, produces the mar damage because the foreign matter easily, and the mar can seriously destroy illumination homogeneity, and under backlight module light state, see through liquid crystal display panel also can observe clear mar, seriously influences display quality. The foreign matter on the most surperficial of backlight module can be convenient and timely clear away, and the foreign matter that is located inside the backlight module then need unpack apart the backlight module and just can reprocess and clear away or change the part, the prior art is difficult to effectively distinguish the foreign matter situation on the backlight module, it is located surperficial or inside to be difficult to accurately judge the foreign matter, the situation of erroneous judgement appears easily, the existence judges the defective products that need reprocess to the situation that the yields flows, also there is the group's ang gram of increasing useless reprocessing volume for the defective products with the non-defective products judgement, can't ensure product yield and production efficiency.
Disclosure of Invention
The invention aims to solve the technical problems and the technical task of improving the prior art, and provides a detection device of a backlight source module, which solves the problems that the prior art is difficult to effectively distinguish the condition of foreign matters on the backlight source module, is easy to misjudge, and cannot ensure the product yield and the production efficiency.
In order to solve the technical problems, the technical scheme of the invention is as follows:
the utility model provides a detection apparatus for backlight module, includes the light source, lights power, image acquisition unit and analysis unit, the direction of illumination of light source is along the surface direction of backlight module, the power of lighting be connected with backlight module electricity, image acquisition unit gather the surface image of backlight module and send for analysis unit and carry out analysis processes.
Further, the light source is a parallel light source.
Furthermore, the light source comprises a light emitting component and a collimating lens component, and light rays emitted by the light emitting component form parallel light rays after passing through the collimating lens component.
Furthermore, still include positioning jig, the backlight module location place in positioning jig.
Furthermore, the positioning jig comprises a fixing part and a movable part, the fixing part comprises two mutually perpendicular limiting strips, the movable part is provided with two groups and is respectively matched with one limiting strip, and the movable part can move and is adjustable in the direction perpendicular to the limiting strips.
Further, the power of the light source is adjustable.
Further, the power of the lighting power supply is adjustable.
A detection method of a backlight module comprises the following steps:
in the unlighted state of the backlight source module, a light source is adopted to irradiate along the surface direction of the backlight source module, an image acquisition unit is used for acquiring the surface image of the backlight source module, and the surface foreign matter condition data of the backlight source module is obtained through image data analysis;
under the state that the backlight source module is lighted, the image acquisition unit is used for acquiring the surface image of the backlight source module, and the total foreign matter condition data of the backlight source module is obtained through image data analysis;
and comparing the surface foreign matter condition data with the total foreign matter condition data to obtain internal foreign matter condition data of the backlight module, and comparing the internal foreign matter condition data with a preset condition to judge whether the backlight module is a good product.
Further, the light source is a parallel light source.
Further, adjusting the illumination brightness of the light source, respectively collecting surface images of the backlight source module under different illumination brightness of the light source, and comprehensively analyzing the plurality of surface images to obtain surface foreign matter condition data of the backlight source module;
adjust the luminance of lighting up of backlight module, gather the surface image of backlight module respectively under the luminance of lighting up of different backlight modules, a plurality of surface images of integrated analysis are in order to obtain the total foreign matter situation data of backlight module.
Compared with the prior art, the invention has the advantages that:
the detection device of the backlight module utilizes the light source to irradiate the surface of the backlight module, the foreign matters can generate shadows, and the foreign matters on the surface of the backlight module are more obvious, so that the image information obtained by the image acquisition unit can more clearly and accurately obtain the condition of the foreign matters on the surface of the backlight module, the foreign matters on the surface of the backlight module are accurately distinguished from the foreign matters inside the backlight module, whether the backlight module is a defective product needing to be repaired is accurately judged, the quality is prevented from being influenced by the outflow of the defective product, the working time waste caused by the repair of the defective product is also avoided, and the product yield and the production efficiency are improved.
Drawings
FIG. 1 is a schematic view of an overall structure of a detection apparatus of a backlight module;
fig. 2 is a schematic structural view of the positioning jig.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment of the invention discloses a detection device of a backlight module, which can effectively distinguish and judge the state of foreign matters, improve the detection accuracy of the poor state of the backlight module, ensure that the defective products can be repaired, avoid the influence on the quality caused by the outflow of the defective products, avoid the waste of working hours caused by the repair of the defective products, and improve the yield and the production efficiency of products.
As shown in fig. 1 and 2, a detection device for a backlight module mainly includes a light source 1, a lighting power supply 2, an image collecting unit 3, and an analyzing unit 4, wherein an irradiation direction of the light source 1 is along a surface direction of the backlight module 5, the lighting power supply 2 is electrically connected to the backlight module 5, and the image collecting unit 3 collects a surface image of the backlight module and sends the surface image to the analyzing unit 4 for analysis.
When a light source irradiates along the surface direction of the backlight module 5, if foreign matters exist on the surface of the backlight module 5, the foreign matters can generate shadows on the rear side of the illumination direction, because the irradiation direction of the light source 1 is along the surface direction of the backlight module 5, the length of the shadows is long, and then small foreign matters can effectively appear, the surface image of the backlight module is obtained by adopting an image acquisition mode, the foreign matters and the generated shadows can be obviously shown on the image, the accurate surface foreign matter condition of the backlight module 5 can be obtained by analyzing and processing the image, then the backlight module 5 is lightened by starting the lightening power supply 2, at the moment, no matter the foreign matters on the surface of the backlight module 5 or the foreign matters inside the backlight module 5 can block the light rays on the back side of the backlight module 5, and the foreign matters on the surface of the backlight module 5 and the foreign matters inside the backlight module, at this time, the image acquisition unit 3 acquires the surface image of the backlight module to obtain the data of all the foreign matters on the backlight module 5, and the data conditions of the foreign matters inside the backlight module 5, including the quantity, size and distribution conditions of the foreign matters, can be obtained through comparison analysis processing, and finally, whether the backlight module 5 is a defective product requiring repair processing or not is comprehensively judged.
The light source 1 is preferably a parallel light source, so that the shadow generated by irradiating foreign matters can be fully generated, and the problem that the shadow is too light to be identified through image acquisition is avoided. The light source 1 consists of a light emitting component 11 and a collimating lens component 12, and light rays emitted by the light emitting component 11 form parallel light rays after passing through the collimating lens component 12, so that the light source is simple in structure, convenient to implement and low in cost.
The detection device of the backlight module is also provided with a positioning jig 6, the backlight module 5 is positioned and placed in the positioning jig 6, and the position of the backlight module 5 is ensured to be accurate and stable, so that the surface foreign matter of the backlight module 5 can be effectively displayed under the illumination condition. Positioning jig 6 include fixed part 61 and movable part 62, fixed part 61 include two mutually perpendicular's spacing, movable part 62 be provided with two sets ofly, respectively with a spacing cooperation, movable part 62 move about adjustable in the direction of the spacing of perpendicular to, simple structure, it is convenient to implement, the interval between movable part 62 and the fixed part 61 is adjustable to backlight module 5 of the different models of ability adaptation, application scope is wide, and nimble adjustability is good.
The power of the light source 1 is adjustable, and the power of the lighting power supply 2 is adjustable, so that the illumination intensity is flexible and adjustable, the visual condition that the illumination intensity is too high or too low to influence foreign matters is avoided, image acquisition is conveniently carried out under different illumination intensities, comprehensive analysis and judgment are carried out by combining image data for many times, the accuracy of analysis and processing is improved, and the occurrence of misjudgment conditions is reduced.
The detection method of the detection device adopting the backlight source module comprises the following steps:
in the state that the backlight module 5 is not lighted, the light source 1 is adopted to irradiate along the surface direction of the backlight module 5, the light source 1 is a parallel light source, the light rays emitted by the light source 1 can be completely parallel to the surface of the backlight module 5 and can also be small in angle, the angle range is 0-10 degrees, the shadow generated by irradiating foreign matters is ensured to have enough length, the visual degree of the foreign matters is enlarged, the identification degree is improved, the accuracy and the efficiency of identifying the foreign matters by adopting image analysis are improved, the surface image of the backlight module is collected by the image collection unit, and the image data analysis is carried out by the analysis unit 4 to obtain the surface foreign matter condition data of the backlight module 5;
preferably, the illumination brightness of the light source is adjusted, the surface images of the backlight module are collected once or multiple times under different illumination brightness of the light source, and then the analysis unit 4 performs comprehensive analysis processing on the obtained multiple surface images, so as to obtain the surface foreign matter condition data of the backlight module 5.
Because of the existence of the conditions such as the ambient illumination, the size of the foreign matter, the color and the like, if the illumination brightness of the light source is consistent and unchanged, the shadow generated by some foreign matters under certain illumination brightness is possibly difficult to distinguish from the surface of the backlight module 5, so that the surface images of the backlight module are respectively collected under a plurality of different illumination brightness, each surface image is respectively analyzed, and the accuracy of the finally obtained surface foreign matter condition data of the backlight module 5 is improved.
In the state that the backlight source module is lighted, the image acquisition unit is used for acquiring the surface image of the backlight source module, at the moment, the light source 1 can be opened or closed, and the total foreign matter condition data of the backlight source module 5 is obtained through image data analysis;
preferably, the lighting brightness of the backlight module 5 is adjusted, the surface images of the backlight module are collected once or multiple times respectively under different lighting brightness of the backlight module 5, and then the analysis unit 4 performs comprehensive analysis processing on the obtained multiple surface images to finally obtain the total foreign matter condition data of the backlight module 5;
similarly, the surface images of the backlight source module are respectively collected under different lighting brightness, so that the foreign matters are prevented from being difficult to effectively identify under single brightness, the judgment accuracy of the foreign matters is improved, and the occurrence of misjudgment is reduced
Compare surperficial foreign matter situation data and total foreign matter situation data in order to obtain the inside foreign matter situation data of backlight module 5, compare inside foreign matter situation data with the preset condition and judge whether backlight module 5 is the yields, the preset condition include quantity, size of a dimension, distribution situation etc. of foreign matter, only need when the inside foreign matter situation of backlight module 5 surpasss the preset condition just need take the backlight module 5 apart to reprocess, and the surperficial foreign matter of backlight module 5 only needs carry out simpler and swift processing, need not to take apart and reprocess, can effectively eliminate the risk of appearing the fish tail after clearing away the foreign matter, improves display quality, improves product production efficiency when improving the product yield.
The above is only a preferred embodiment of the present invention, and it should be noted that the above preferred embodiment should not be considered as limiting the present invention, and the protection scope of the present invention should be subject to the scope defined by the claims. It will be apparent to those skilled in the art that various modifications and adaptations can be made without departing from the spirit and scope of the invention, and these modifications and adaptations should be considered within the scope of the invention.
Claims (10)
1. The utility model provides a detection apparatus for backlight module, its characterized in that includes light source (1), lights power (2), image acquisition unit (3) and analysis unit (4), the direction of illumination of light source (1) is along the surface direction of backlight module (5), lights power (2) and backlight module (5) electricity and is connected, image acquisition unit (3) gather the surface image of backlight module and send analysis unit (4) for analysis processes.
2. The detecting device for detecting the backlight module according to claim 1, wherein the light source (1) is a parallel light source.
3. The detecting device for detecting the backlight unit according to claim 2, wherein the light source (1) comprises a light emitting component (11) and a collimating lens component (12), and the light emitted from the light emitting component (11) passes through the collimating lens component (12) to form parallel light.
4. The device for detecting the backlight module according to claim 1, further comprising a positioning fixture (6), wherein the backlight module (5) is positioned and placed in the positioning fixture (6).
5. The device for detecting the backlight module according to claim 4, wherein the positioning fixture (6) comprises a fixed portion (61) and a movable portion (62), the fixed portion (61) comprises two mutually perpendicular position-limiting strips, two sets of the movable portion (62) are provided, each of the two sets of the movable portion is matched with one of the position-limiting strips, and the movable portion (62) is movable and adjustable in a direction perpendicular to the position-limiting strips.
6. The backlight module detecting device according to claim 1, wherein the power of the light source (1) is adjustable.
7. The backlight module testing device according to claim 1, wherein the power of the lighting power supply (2) is adjustable.
8. A detection method of a backlight source module is characterized by comprising the following steps:
in the unlighted state of the backlight module (5), a light source is adopted to irradiate along the surface direction of the backlight module (5), an image acquisition unit is used for acquiring the surface image of the backlight module, and the surface foreign matter condition data of the backlight module (5) is obtained through image data analysis;
under the state that the backlight source module is lightened, the image acquisition unit is used for acquiring the surface image of the backlight source module, and the total foreign matter condition data of the backlight source module (5) is obtained through image data analysis;
comparing the surface foreign matter condition data with the total foreign matter condition data to obtain the internal foreign matter condition data of the backlight module (5), and comparing the internal foreign matter condition data with the preset conditions to judge whether the backlight module (5) is good or not.
9. The method for inspecting a backlight module of claim 8, wherein the light source is a parallel light source.
10. The method for detecting the backlight module according to claim 8, wherein the illumination brightness of the light source is adjusted, the surface images of the backlight module are respectively collected under different illumination brightness of the light source, and the plurality of surface images are comprehensively analyzed to obtain the surface foreign matter condition data of the backlight module (5);
the lighting brightness of the backlight module (5) is adjusted, the surface images of the backlight module are collected under the lighting brightness of different backlight modules (5), and the surface images are comprehensively analyzed to obtain the total foreign matter condition data of the backlight module (5).
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| CN202110211950.9A CN113008898A (en) | 2021-02-25 | 2021-02-25 | Detection device and detection method for backlight source module |
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