CN103245670B - Defect detection device and defect detection method of optical element - Google Patents
Defect detection device and defect detection method of optical element Download PDFInfo
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- CN103245670B CN103245670B CN201310162071.7A CN201310162071A CN103245670B CN 103245670 B CN103245670 B CN 103245670B CN 201310162071 A CN201310162071 A CN 201310162071A CN 103245670 B CN103245670 B CN 103245670B
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Abstract
The invention discloses a defect detection device and a defect detection method of an optical element. The defect detection device comprises a backlight illumination board, a bearing frame, an optical lens, a digital camera, a digital image processor and a display module, wherein the bearing frame, the optical lens and the digital camera are sequentially arranged on an output light path of the backlight illumination board; the digital image processor is respectively connected with the digital camera and the display module; digital image signals corresponding to different positions of the optical element are subjected to OR operation through the digital image processor to judge whether the detected optical element has defects or not according to an operation result, and a processed result of the digital image processor is displayed on the display module, so that the detection speed is improved and the accuracy of a detected result is improved; and the defects of the optical elements can be directly displayed so as to bring about great convenience for detection personnel.
Description
Technical field
The present invention relates to optical element detection field, particularly relates to a kind of defect detecting device and defect inspection method thereof of optical element
.
Background technology
Existing optical element can also exist various defect in process of production, such as dirty, striped degree and bubble degree etc.And optical element after assembling, such as, camera lens etc., its inside may remain hair, dust and dirty etc.In optical element and optical devices, there is corresponding control overflow to these defects.Existing defect inspection, generally under the illumination of green glow, artificial naked eyes identify optical element, thus judge the defect of optical element, this detection method affects comparatively large by the subjective factor of people, and have infringement to human eye, detection speed is slow, and testing result is inaccurate, can not visual display detecting result.
Therefore, prior art has yet to be improved and developed
.
Summary of the invention
In view of above-mentioned the deficiencies in the prior art, the object of the present invention is to provide a kind of defect detecting device and defect inspection method thereof of optical element, the detection speed being intended to solve existing detecting optical component defects is slow, cannot the problem of display defect directly perceived.
Technical scheme of the present invention is as follows:
A defect detecting device for optical element, wherein, comprising:
Backlight panel, for providing an area source;
Carrier, for placing the position of the measured optical unit and adjustment the measured optical unit;
Optical lens, for gathering the optical imagery of the measured optical unit diverse location;
Digital camera, for being converted to corresponding data image signal by described optical imagery;
Digital Image Processor, for carrying out XOR to described data image signal, judges the measured optical unit whether defectiveness according to XOR result;
Display module, for showing the result of Digital Image Processor;
Described carrier, optical lens and digital camera are successively set on the output light path of described backlight panel; Described Digital Image Processor connects digital camera and display module respectively.
The defect detecting device of described optical element, wherein, described carrier comprises: position adjusting mechanism, for rotating or translation the measured optical unit.
The defect detecting device of described optical element, wherein, described Digital Image Processor comprises:
Defect size detecting unit, for the size according to XOR outcome measurement the measured optical unit defect.
The defect detecting device of described optical element, wherein, described Digital Image Processor also comprises:
Defects count detecting unit, for the quantity corresponding according to the different area defect of XOR outcome measurement the measured optical unit.
Adopt a defect inspection method for the defect detecting device of above-mentioned optical element, wherein, comprise the following steps:
A, backlight panel export an area source, and the light that this area source sends is through the measured optical unit be placed in carrier;
The measured optical unit imaging of this position to digital camera, is converted to after the first corresponding data image signal through digital camera, sends to Digital Image Processor by B, optical lens;
The position of C, adjustment the measured optical unit;
The measured optical unit imaging of adjusted position postpone to digital camera, is converted to after the second corresponding data image signal through digital camera, sends to Digital Image Processor by D, described optical lens;
E, Digital Image Processor carry out XOR to the first data image signal and the second data image signal, and judge the measured optical unit whether defectiveness according to XOR result;
F, on display module, show the result of Digital Image Processor.
The defect inspection method of the defect detecting device of described optical element, wherein, described step e also comprises:
E1, measure the size of the measured optical unit defect and the quantity of correspondence according to described operation result.
The defect inspection method of the defect detecting device of described optical element, wherein, described step F also comprises:
F1, on display module, show the size of the defect of the measured optical unit and the quantity of correspondence.
Compared to prior art, the defect detecting device of optical element provided by the invention and defect inspection method thereof, described defect detecting device comprises owing to have employed: backlight panel, carrier, optical lens, digital camera, Digital Image Processor and display module, described carrier, optical lens and digital camera are successively set on the output light path of described backlight panel, described Digital Image Processor connects digital camera and display module respectively, an area source is exported by backlight panel, the light that this area source sends is through the measured optical unit be placed in carrier, optical lens gathers the optical imagery of the measured optical unit diverse location, send it to digital camera, be converted to after corresponding data image signal through digital camera, send to Digital Image Processor, described digital figure processor carries out XOR to the data image signal of optical element corresponding to diverse location, the measured optical unit whether defectiveness is judged according to operation result, and on display module, show the result of Digital Image Processor, thus improve detection speed, improve the accuracy rate of testing result, the defect of optical element is intuitively shown, facilitate greatly for testing staff brings.
Accompanying drawing explanation
Fig. 1 is the structured flowchart of the defect detecting device of optical element provided by the invention
.
Fig. 2 is the structured flowchart of the Digital Image Processor of the defect detecting device of optical element provided by the invention.
Fig. 3 is the process flow diagram of the defect inspection method of the defect detecting device of optical element provided by the invention.
Embodiment
The invention provides a kind of defect detecting device and defect inspection method thereof of optical element, for making object of the present invention, technical scheme and effect clearly, clearly, the present invention is described in more detail below.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
Refer to Fig. 1, Fig. 1 is the structured flowchart of the defect detecting device of optical element provided by the invention, as shown in Figure 1, the defect detecting device of described optical element comprises: backlight panel 110, carrier 120, optical lens 130, digital camera 140, Digital Image Processor 150 and display module 160; Described carrier 120, optical lens 130 and digital camera 140 are successively set on the output light path of described backlight panel 110; Described Digital Image Processor 150 connects digital camera 140 and display module 160 respectively.
Specifically, described backlight panel 110, for providing an area source, can adopt LED flat lamp or other light fixture, also can be formed by light source irradiation one light guide plate.Described backlight panel 110 can send uniform white light, thus provides illumination light source for defect detecting device.
The measured optical unit for placing the position of the measured optical unit and adjustment the measured optical unit, thus is fixed on carrier 120 by described carrier 120, and the light that back lighting version 110 is sent is through this measured optical unit.Described carrier 120 can also regulate the position of the measured optical unit, and preferably, described carrier 120 comprises: position adjusting mechanism, for rotating or translation the measured optical unit.Described position adjusting mechanism makes the measured optical unit be in different location statuss.
Described optical lens 130, for gathering the optical imagery of the measured optical unit diverse location, is a kind of high-resolution optical lens, can by the measured optical unit imaging to digital camera 140.On described carrier 120 is positioned at optical lens object plane apart from the distance of optical lens 130 or field depth.
Described digital camera 140, for described optical imagery being converted to corresponding data image signal, for improving the precision detected, generally adopts high-resolution digital camera.Described digital camera 140 comprises CMOS photoelectric sensor, and wherein CMOS is array distribution, and the light intensity signal experienced is converted to data image signal, namely the optical imagery of the measured optical unit is converted to corresponding data image signal.
Described Digital Image Processor 150, for carrying out XOR to described data image signal, judges the measured optical unit whether defectiveness according to XOR result, when practical application, can adopt a computer processor unit.Described display module 160, for showing the result of Digital Image Processor 150, specifically can be various display.
The defect detecting device of optical element provided by the invention, its principle of work is as follows: backlight panel 110 exports an area source, the light that this area source sends is through the measured optical unit be placed in carrier 120, optical lens 130 gathers the optical imagery of the measured optical unit diverse location, send it to digital camera 140, be converted to after corresponding data image signal through digital camera 140, send to Digital Image Processor 150, the data image signal of described digital figure processor 150 pairs of optical elements corresponding to diverse location carries out XOR, the measured optical unit whether defectiveness is judged according to operation result, display module 160 shows the result of Digital Image Processor 150.
Specifically, backlight panel 110 provides light source, after by the measured optical unit in carrier 120, the first optical imagery under optical lens 130 gathers the measured optical unit current state, and be converted to the first corresponding data image signal through digital camera 140 and be sent in Digital Image Processor 150.Then, keep the relative position of backlight panel 110, optical lens 130 and digital camera 140 constant, carrier 120 moves the position of the measured optical unit, make its position and position was different just now, then continue same step, the second data image signal of correspondence is sent to Digital Image Processor 150.Described Digital Image Processor 150 carries out XOR to the first data image signal and the second data image signal.
As from the foregoing, if there is a defect in detected element, such as dirty or hair etc., after the measured optical unit is moved to another location, then defective locations also can be corresponding mobile, thus cause the not identical of position same on the optical imagery of this measured optical unit of collection.Described XOR, specifically, if the first data image signal is different from the signal of the second same position of data image signal in other words, then its digital operation result is 1, if signal is identical, then its digital operation result is 0.Like this, the measured optical unit whether defectiveness can be judged according to XOR result.Then, display module 160 shows.Preferably, in Digital Image Processor 150, the gray scale in places different for signal can be defined as 255 further, and the identical place of signal is defined as 0, like this, after doubt computing, in the data image signal obtained, the different place of signal is shown as white, and the place that signal is identical is shown as black.Like this, display module 160 intuitively can show the defect part of the measured optical unit.
The defect detecting device of optical element provided by the invention, compared with eye recognition in prior art, do not have the error because manual operation produces, keeping away the objective human factor of exempting from of testing result affects testing result, and do not damage human eye, detection efficiency is high; Compared with adopting the method for laser detection, detection speed is fast, and can also to defect for example dirty, hair etc. quantize, the defect of optical element intuitively shows by described defect detecting device, structure is simple, with low cost, less demanding to the operative skill of testing staff.When adopting laser as light source, the energy of laser is high, light intensity is large, be not easy to find its defect in the picture that the measured optical unit becomes after irradiating, that is in data image signal, the signal of fault location is the same with the signal at non-defective place, cause and cannot distinguish defect, particularly the identification of little defect.Irradiate with laser, because luminous energy is very strong, be easy to saturated for the signal of image ccd or cmos sensor, can not the size of real reaction defect.The present invention adopts even visible ray, and its cost is low, by the defect imaging of the measured optical unit in Digital Image Processor, and defect and non-defective can be identified in data image signal, thus facilitates follow-up process.And the present invention adopts area source, can also to high-aperture lenses, such as diameter 10mm ~ 50mm detects, and adopt point-like laser light source can only detect small-bore type camera lens.
Preferably, for improving detection efficiency, only can extract the optical imagery of two width the measured optical units, namely moving the measured optical unit once.Certainly, in order to Detection accuracy, repeatedly can move the measured optical unit, then carry out XOR, then get average.
Further, although display module 160 intuitively can show the defect part of the measured optical unit, but testing staff does not also know the concrete data of these defects, refer to Fig. 2, described Digital Image Processor 150 comprises: for the defect size detecting unit 151 of the size according to XOR outcome measurement the measured optical unit defect, thus achieves and to measure the size of defect and quantize.Described defect size detecting unit 151 can calculate the size of defect, and shows on display module 160, thus facilitates testing staff to judge its quality.And then the number percent of its defect can be calculated, thus testing staff is made to have a kind of assurance directly perceived to its quality.
Further, described Digital Image Processor 150 also comprises: defects count detecting unit 152, and described defects count detecting unit 152 is for the quantity corresponding according to the different area defect of XOR outcome measurement the measured optical unit.That is, the defect area of the measured optical unit and the defects count of correspondence thereof can be calculated, and show on display module 160, thus the further area of quantify defects and the correspondence of quantity, greatly facilitate testing staff.
Further, described Digital Image Processor 150 also comprises: storage unit 153 and quality of optical element judging unit 154; Tell storage unit 153 for storing corresponding defect size and quantity under the different quality of optical element; Described quality of optical element judging unit 154 compares for the defect size that detects according to defect size detecting unit 151 and defects count detecting unit 152 and the quantity defect size corresponding from the different qualities stored in storage unit 153 and quantity, thus judge by the quality of photometry optical element, then show on display module 160, thus further, facilitate testing staff, improve detection efficiency.Further, described storage unit 153 is also for storing the result of Digital Image Processor 150.
Based on above-mentioned defect detecting device, the present invention also provides a kind of defect inspection method adopting above-mentioned defect detecting device, and as shown in Figure 3, it comprises:
S1, backlight panel export an area source, and the light that this area source sends is through the measured optical unit be placed in carrier; As detailed above.
The measured optical unit imaging of this position to digital camera, is converted to after the first corresponding data image signal through digital camera, sends to Digital Image Processor by S2, optical lens; As detailed above.
The position of S3, adjustment the measured optical unit; As detailed above.
The measured optical unit imaging of adjusted position postpone to digital camera, is converted to after the second corresponding data image signal through digital camera, sends to Digital Image Processor by S4, described optical lens; As detailed above.
S5, Digital Image Processor carry out XOR to the first data image signal and the second data image signal, and judge the measured optical unit whether defectiveness according to XOR result; As detailed above.
S6, on display module, show the result of Digital Image Processor; As detailed above.
Further, described step S5 also comprises:
S51, measure the size of the measured optical unit defect and the quantity of correspondence according to described operation result, as detailed above.
Further, described step S6 also comprises:
S61, on display module, show the size of the defect of the measured optical unit and the quantity of correspondence, as detailed above.
In sum, the defect detecting device of optical element provided by the invention and defect inspection method thereof, described defect detecting device comprises: backlight panel, carrier, optical lens, digital camera, Digital Image Processor and display module, described carrier, optical lens and digital camera are successively set on the output light path of described backlight panel, described Digital Image Processor connects digital camera and display module respectively, an area source is exported by backlight panel, the light that this area source sends is through the measured optical unit be placed in carrier, optical lens gathers the optical imagery of the measured optical unit diverse location, send it to digital camera, be converted to after corresponding data image signal through digital camera, send to Digital Image Processor, described digital figure processor carries out XOR to the data image signal of optical element corresponding to diverse location, the measured optical unit whether defectiveness is judged according to operation result, and on display module, show the result of Digital Image Processor, thus improve detection speed, improve the accuracy rate of testing result, the defect of optical element is intuitively shown, facilitate greatly for testing staff brings.
Should be understood that, application of the present invention is not limited to above-mentioned citing, for those of ordinary skills, can be improved according to the above description or convert, and all these improve and convert the protection domain that all should belong to claims of the present invention.
Claims (2)
1. a defect detecting device for optical element, is characterized in that, comprising:
Backlight panel, for providing an area source;
Carrier, for placing the position of the measured optical unit and adjustment the measured optical unit;
Optical lens, for gathering the optical imagery of the measured optical unit diverse location;
Digital camera, for being converted to corresponding data image signal by described optical imagery;
Digital Image Processor, for carrying out XOR to described data image signal, judges the measured optical unit whether defectiveness according to XOR result;
Display module, for showing the result of Digital Image Processor;
Described carrier, optical lens and digital camera are successively set on the output light path of described backlight panel; Described Digital Image Processor connects digital camera and display module respectively;
Described carrier comprises: position adjusting mechanism, for rotating or translation the measured optical unit;
Described Digital Image Processor comprises:
Defect size detecting unit, for the size according to XOR outcome measurement the measured optical unit defect;
Described Digital Image Processor also comprises:
Defects count detecting unit, for the quantity corresponding according to the different area defect of XOR outcome measurement the measured optical unit;
Described carrier is used for fixing the measured optical unit, and the light that back lighting version is sent is through this measured optical unit;
Described display module is for showing the size of the defect of the measured optical unit and corresponding quantity;
Backlight panel provides light source, after by the measured optical unit in carrier, the first optical imagery under optical lens gathers the measured optical unit current state, and be converted to the first corresponding data image signal through digital camera and be sent in Digital Image Processor;
Keep the relative position of backlight panel, optical lens and digital camera constant, carrier moves the position of the measured optical unit, makes its position and position was different just now, and the second data image signal of correspondence is sent to Digital Image Processor;
Described Digital Image Processor carries out XOR to the first data image signal and the second data image signal;
The gray scale in places different for signal is defined as 255, and the identical place of signal is defined as 0, after XOR, in the data image signal obtained, the different place of signal is shown as white, and the place that signal is identical is shown as black.
2. adopt a defect inspection method for the defect detecting device of optical element according to claim 1, it is characterized in that, comprise the following steps:
A, backlight panel export an area source, and the light that this area source sends is through the measured optical unit be placed in carrier; Described carrier, optical lens and digital camera are successively set on the output light path of described backlight panel;
The measured optical unit imaging of this position to digital camera, is converted to after the first corresponding data image signal through digital camera, sends to Digital Image Processor by B, optical lens;
The relative position of C, maintenance backlight panel, optical lens and digital camera is constant; The position of adjustment the measured optical unit;
The measured optical unit imaging of adjusted position postpone to digital camera, is converted to after the second corresponding data image signal through digital camera, sends to Digital Image Processor by D, described optical lens;
E, Digital Image Processor carry out XOR to the first data image signal and the second data image signal, and judge the measured optical unit whether defectiveness according to XOR result;
F, on display module, show the result of Digital Image Processor;
Described step e also comprises:
E1, measure the size of the measured optical unit defect and the quantity of correspondence according to described operation result;
Described step F also comprises:
F1, on display module, show the size of the defect of the measured optical unit and the quantity of correspondence;
The gray scale in places different for signal is defined as 255, and the identical place of signal is defined as 0, after XOR, in the data image signal obtained, the different place of signal is shown as white, and the place that signal is identical is shown as black.
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| CN107024484B (en) * | 2017-02-28 | 2020-05-22 | 张家港康得新光电材料有限公司 | Display screen defect assessment device, maintenance method thereof and display screen to be detected |
| WO2018176370A1 (en) * | 2017-03-31 | 2018-10-04 | 深圳配天智能技术研究院有限公司 | Visual inspection system and method |
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| CN109342437B (en) * | 2018-09-28 | 2020-03-31 | 中国兵器工业标准化研究所 | Quantitative test method for optical material stripe |
| CN109640075B (en) * | 2018-12-24 | 2020-10-09 | 维沃移动通信有限公司 | Camera detection device and method and mobile terminal |
| CN109934811B (en) * | 2019-03-08 | 2022-12-30 | 中国科学院光电技术研究所 | Optical element surface defect detection method based on deep learning |
| CN110136148B (en) * | 2019-05-21 | 2023-05-30 | 东莞市瑞图新智科技有限公司 | Method and equipment for detecting and counting small pieces without silk-screen optical filter |
| CN110132981A (en) * | 2019-05-21 | 2019-08-16 | 东莞市瑞图新智科技有限公司 | Piece appearance and size integrated detection equipment and detection method in a kind of optical filter |
| CN112419296A (en) * | 2020-12-03 | 2021-02-26 | 嘉兴驭光光电科技有限公司 | Micro-nano optical element surface defect detection method and image segmentation method |
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