CN103217436B - Backlight module group defect detection method and equipment - Google Patents
Backlight module group defect detection method and equipment Download PDFInfo
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- CN103217436B CN103217436B CN201310071403.0A CN201310071403A CN103217436B CN 103217436 B CN103217436 B CN 103217436B CN 201310071403 A CN201310071403 A CN 201310071403A CN 103217436 B CN103217436 B CN 103217436B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/08—Testing mechanical properties
- G01M11/081—Testing mechanical properties by using a contact-less detection method, i.e. with a camera
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/3406—Control of illumination source
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/10—Dealing with defective pixels
Abstract
The invention discloses a backlight module group defect detection method and equipment, which employs shooting directions of an image obtaining unit and surface of a backlight module group for forming many preset angles for obtaining images containing characteristics of each component in the backlight module group. The obtained images containing characteristics of each component in the backlight module group are analyzed for determining defect spots existed in each component of the backlight module group. Images containing characteristics of each component in the backlight module group are obtained by different preset angles, and are analyzed for determining defect spots existed in each component, thereby realizing detection of defects of the internal part and the appearance of the backlight module group. Compared with the mode of artificial backlight module group defect detection mode, the backlight module group defect detection method and equipment provide by the invention embodiment can improve the detection efficiency and the detection accuracy.
Description
Technical field
The present invention relates to Defect Detection technical field, particularly relate to a kind of detection method and equipment of backlight module group defect.
Background technology
The electronic product with Presentation Function used at present, if TV, display, digital camera, mobile phone, PDA, portable type DVD etc. are configured by liquid crystal panel to show video-audio signal, and the image display of liquid crystal panel more depends on light source design and the qualitative control of backlight module, backlight module directly can affect the effect of show image and picture contrasts quality, therefore, good backlight module will improve the quality of liquid crystal panel image display.
In the preparation process of backlight module, need to carry out apparent flaws detection to backlight module, as scratch, foreign matter, dirty, white point and light leak etc., traditional detection method is after being positioned over by backlight module and tool lighting i.e. backlight module lighting, carry out checking in artificial visual mode and indicate at flaw location, afterwards product defective for detection being delivered to repairing unit and repair.The mode of existing this manual detection backlight module group defect, inefficiency, false dismissal probability is also higher, and also cannot coordinate production in enormous quantities and form quantification detection.
In addition, if adopt existing mechanization pick-up unit to carry out Defect Detection to backlight module, only can detect the flaw of backlight module outward appearance, cannot detect the flaw of backlight unit.
Summary of the invention
Embodiments provide a kind of detection method and equipment of backlight module group defect, in order to realize the flaw that high efficient detection backlight unit and outward appearance have.
The detection method of a kind of backlight module group defect that the embodiment of the present invention provides, comprising:
To become multiple predetermined angle with the surface of backlight module, obtain the image containing each component feature in described backlight module;
To analyzing containing the image of each component feature in described backlight module of getting, determine the flaw point that in described backlight module, each parts exist.
The checkout equipment of a kind of backlight module group defect that the embodiment of the present invention provides, comprising: board; Be installed on the Defect Detection device of described board and the microscope carrier for carrying backlight module; Wherein,
Described Defect Detection device comprises:
With the image acquisition unit becoming multiple predetermined angle to obtain the image containing each component feature in described backlight module with the surface of backlight module;
And, be connected with described image acquisition unit signal, to analyzing containing the image of each component feature in described backlight module of getting, determine the image analyzing unit of the flaw point that each parts exist in described backlight module.
The beneficial effect of the embodiment of the present invention comprises:
The detection method of a kind of backlight module group defect that the embodiment of the present invention provides, to become multiple predetermined angle with the surface of backlight module, obtains the image containing each component feature in backlight module; To analyzing containing the image of each component feature in backlight module of getting, determine the flaw point that in backlight module, each parts exist.By obtaining the mode of image from different predetermined angle, the image containing component feature each in backlight module can be got, after analyzing each image, just can determine the flaw point that each parts exist, the flaw achieved backlight unit and outward appearance have detects.Further, the detection method of the backlight module group defect that the embodiment of the present invention provides, relative to the mode of manual detection backlight module group defect, can improve the accuracy rate of detection efficiency and detection.
The checkout equipment of a kind of backlight module group defect that the embodiment of the present invention provides, comprises and is installed on the Defect Detection device of board and the microscope carrier for carrying backlight module; Wherein, Defect Detection device comprises: with the image acquisition unit becoming multiple predetermined angle to obtain the image containing each component feature in backlight module with the surface of backlight module; And, to analyzing containing the image of each component feature in backlight module of getting, determine the image analyzing unit of the flaw point that each parts exist in backlight module.Because image acquisition unit can obtain the mode of image from different predetermined angle, the image containing component feature each in backlight module can be got, after image analyzing unit is analyzed each image, just can determine the flaw point that each parts exist, the flaw achieved backlight unit and outward appearance have detects.Further, the checkout equipment of the backlight module group defect that the embodiment of the present invention provides, relative to the mode of manual detection backlight module group defect, can improve the accuracy rate of detection efficiency and detection.
Accompanying drawing explanation
One of process flow diagram of the detection method of the backlight module group defect that Fig. 1 provides for the embodiment of the present invention;
The process flow diagram two of the detection method of the backlight module group defect that Fig. 2 provides for the embodiment of the present invention;
The schematic diagram of the feature pattern that Fig. 3 provides for the embodiment of the present invention;
The structural representation of the checkout equipment of the backlight module group defect that Fig. 4 provides for the embodiment of the present invention;
The structural representation of the example one that Fig. 5 provides for the embodiment of the present invention;
The structural representation of the example two that Fig. 6 provides for the embodiment of the present invention;
The structural representation of the example three that Fig. 7 provides for the embodiment of the present invention;
The structural representation of the example four that Fig. 8 provides for the embodiment of the present invention;
The structural representation of the image analyzing unit that Fig. 9 provides for the embodiment of the present invention.
Embodiment
Below in conjunction with accompanying drawing, the detection method of the backlight module group defect that the embodiment of the present invention provides and the embodiment of equipment are described in detail.
The detection method of a kind of backlight module group defect that the embodiment of the present invention provides, as shown in Figure 1, can comprise the following steps:
S101, to become multiple predetermined angle with the surface of backlight module, obtain the image containing each component feature in backlight module;
S102, to analyzing containing the image of each component feature in backlight module of getting, determine the flaw point that in backlight module, each parts exist.
Usually, backlight module is made up of the parts such as optical film of light guide plate, diffuser plate and such as reflector plate and brightening piece.Utilize different light mode and different shooting angles, the image highlighting unwanted visual characteristic on each parts in backlight module can be got.When utilizing external light source to irradiate backlight module surface, the angle on shooting direction and backlight module surface is less, more can embody the unwanted visual characteristic had on the parts on backlight module surface in the image got.The above-mentioned detection method that the embodiment of the present invention provides, by obtaining the mode of image from different predetermined angle, can get the image containing component feature each in backlight module; After analyzing each image, just can determine the flaw point that each parts exist, the flaw achieved backlight unit and outward appearance have detects.Further, the detection method of the backlight module group defect that the embodiment of the present invention provides, relative to the mode of manual detection backlight module group defect, can improve the accuracy rate of detection efficiency and detection.
Below the specific implementation of the above steps realizing the detection method that the embodiment of the present invention provides is described in detail.
Particularly, the step S101 in the said method that the embodiment of the present invention provides, to become multiple predetermined angle with the surface of backlight module, obtains the image containing each component feature in backlight module, specifically comprises as under type:
(1) when needing to obtain the image containing backlight module external appearance characteristic, embodiment can be: when external light source becomes the first predetermined angle to irradiate backlight module, to become the second predetermined angle with the surface of backlight module, obtain the image containing backlight module surface characteristics.
Preferably, in the specific implementation, external light source is the other light sources that quality white light is better than such as green glow.And external light source irradiates the first predetermined angle of backlight module be 45 degree is good.Further, the second predetermined angle of the surface image of acquisition backlight module is 90 degree is good.
(2) when needing the image of the light guide plate feature obtained containing the bottom in backlight module, embodiment can be: when backlight module lighting, to become the 3rd predetermined angle with the surface of backlight module, obtain the image containing light guide plate feature in backlight module; Now, backlight module irradiates without external light source.
Preferably, the 3rd predetermined angle of the image obtained containing light guide plate feature in backlight module is 90 degree is good.
(3) when needing to obtain the image containing miscellaneous part feature except light guide plate in backlight module, embodiment can be: when external light source becomes the first predetermined angle to irradiate described backlight module, to become the 4th predetermined angle with the surface of backlight module, obtain the image containing the diffuser plate in backlight module or optical film feature.
Preferably, in the specific implementation, external light source is the other light sources that quality white light is better than such as green glow.And external light source irradiates the first predetermined angle of backlight module be 45 degree is good.Further, the 4th predetermined angle that acquisition contains the image of diffuser plate or optical film feature in backlight module is 60 degree or 30 degree is good.
Particularly, getting in backlight module after each image of component, step S102, to analyzing containing the image of each component feature in backlight module of getting, determines the position of the flaw point that each parts exist in backlight module, as shown in Figure 2, specifically can realize as follows:
S201, carry out binary conversion treatment respectively containing the image of each component feature in backlight module obtain corresponding binary image to what get; Particularly, binary conversion treatment process belongs to prior art, is not described further at this.
S202, for often organizing adjacent N number of pixel in each binary image, determine the first average gray value of N number of pixel that this group is adjacent, and calculate the adjacent N number of pixel of this group be expert at or second average gray value of pixel of column, wherein, N is positive integer;
Particularly, can be one group with 3 pixels often adjacent in binary image, calculate its first average gray value, and, these 3 adjacent pixels can be 3 pixels adjacent in a line, also can be 3 pixels adjacent in row, not limit at this.When these 3 adjacent pixels are 3 pixels adjacent in a line, corresponding the second average gray value calculating the pixel that 3 adjacent pixels of this group are expert at; When these 3 adjacent pixels are 3 pixels adjacent in row, corresponding the second average gray value calculating the pixel of 3 adjacent pixel columns of this group.
S203, determine the contrast degree of variation of the first average gray value and the second average gray value;
Wherein, the specific formula for calculation contrasting degree of variation is: contrast degree of variation=︱ first average gray value-the second average gray value ︱/the second average gray value.
S204, judge contrast degree of variation whether be greater than setting threshold value; When judging that contrast degree of variation is greater than setting threshold value, perform step S205; When judging that contrast degree of variation is not more than setting threshold value, returning step S202, adjacent N number of pixel being organized to other and calculates;
S205, determine that N number of pixel that this group is adjacent is flaw point.
After determining that N number of pixel that this group is adjacent is flaw point, generally can record the position of this flaw point, reprocess for follow-up transplanting and prepare.
The above-mentioned detection method that the embodiment of the present invention provides, after determining the flaw point that in backlight module, each parts exist, can also comprise the step judging and add up flaw vertex type, concrete steps comprise:
Calculate the geometrical characteristic parameter of at least one feature pattern of all flaw points compositions that each parts in backlight module exist, and the flaw classification of geometrical characteristic parameter determination feature pattern according to each feature pattern calculated.
In the specific implementation, the PCNN(Pulse Coupled Neural Network of simplification can be utilized, Pulse Coupled Neural Network) model, first, to judge that each image of component of flaw point carries out binary segmentation process, such as, the pixel value of the pixel at each flaw point place place in image is labeled as 1, and the pixel value of other pixels is labeled as 0.
Then, calculate the region area of the feature pattern be made up of the multiple flaw point of continuous print, width and highly geometrical characteristic parameter such as grade, such as, as shown in Figure 3, adding up pixel value in a feature pattern is the number of the pixel of 1, is area S; In statistical nature figure, between high order end to low order end, pixel value is the number of the pixel of 1, is width W; Be topmost the number of the pixel of 1 to pixel value between bottom in statistical nature figure, be height H.
After the geometrical characteristic parameter calculating each feature pattern, the feature of each flaw classification stored in the geometrical characteristic parameter of each feature pattern and database can be compared, obtain the flaw classification of this feature pattern.
In addition, each feature of flaw classification stored in database if find and the geometrical characteristic parameter of feature pattern are not inconsistent, or when not storing corresponding flaw classification in database, can also revise or add the data of storage in a database.
Based on same inventive concept, the embodiment of the present invention additionally provides a kind of checkout equipment of backlight module group defect, the principle of dealing with problems due to this checkout equipment is similar to the detection method of aforementioned a kind of backlight module group defect, therefore the enforcement of this checkout equipment see the enforcement of method, can repeat part and repeats no more.
The checkout equipment of a kind of backlight module group defect that the embodiment of the present invention provides, as shown in Figure 4, comprising: board 01; Be installed on the Defect Detection device 02 of board 01 and the microscope carrier 03 for carrying backlight module 04; Wherein,
Defect Detection device 02 comprises:
The image acquisition unit 05 containing each component feature image in backlight module 04 is obtained to become multiple predetermined angle with the surface of backlight module 04;
And, be connected with image acquisition unit 05 signal, to analyzing containing the image of each component feature in backlight module 04 of getting, determine the image analyzing unit 06 of the flaw point that each parts exist in backlight module 04.
In the specific implementation, image acquisition unit 05 can become the predetermined angle of 90 degree, 60 degree and 30 degree with the surface of backlight module 04, to obtain the image containing component feature each in backlight module 04.
Usually, backlight module 04 is made up of the parts such as optical film of light guide plate, diffuser plate and such as reflector plate and brightening piece.
When needing to obtain the image containing backlight module 04 external appearance characteristic, image acquisition unit 05 can when external light source irradiates backlight module 04 with the first predetermined angle, to become an angle of 90 degrees with the surface of backlight module, obtain the image containing backlight module surface characteristics.Preferably, in the specific implementation, external light source is the other light sources that quality white light is better than such as green glow.And external light source irradiates the first predetermined angle of backlight module be 45 degree is good.
When needing to obtain the image containing bottom light guide plate feature in backlight module 04, image acquisition unit 05 when backlight module 04 lighting, to become an angle of 90 degrees with the surface of backlight module, can obtain the image containing light guide plate feature in backlight module; Now, backlight module irradiates without external light source.
When needing to obtain the image containing miscellaneous part feature except light guide plate in backlight module 04, image acquisition unit 05 can when external light source becomes the first predetermined angle to irradiate backlight module, to become 30 degree or 60 degree of angles with the surface of backlight module, obtain the image containing diffuser plate in backlight module 04 or optical film feature.
Defect Detection device in the above-mentioned checkout equipment that the embodiment of the present invention provides can be implemented by following several mode.
Example one: as shown in Figure 5, Defect Detection device 02 can have one and detect station;
Image acquisition unit comprises: be positioned at the CCD device 07 detecting station;
Detection station has the external light source 08 for irradiating backlight module 04; This external light source 08 generally becomes miter angle to irradiate the surface of backlight module 04;
Microscope carrier 03 is the microscope carrier that can overturn along the axis parallel with microscope carrier 03 surface, like this, when obtaining backlight module 03 each image of component with different predetermined angle, can by rotating the backlight module 04 of microscope carrier 03 and carrying, the relative angle between adjustment CCD device 07 shooting direction and backlight module 04 surface.
Example two: as shown in Figure 6, Defect Detection device 02 has one and detects station;
Detection station has the external light source 08 for irradiating backlight module 04; This external light source 08 generally becomes miter angle to irradiate the surface of backlight module 04.
Image acquisition unit comprises: be positioned at the CCD device 07 detecting station; Angle adjustable between the image taking direction of CCD device 07 and the surface of backlight module 04, like this, when obtaining backlight module 04 each image of component with different predetermined angle, can by rotating the mode of CCD device 07, the relative position between adjustment CCD device 07 and backlight module 04.
Example three: as shown in Figure 7, Defect Detection device 02 has one and detects station;
Detection station has the external light source 08 for irradiating backlight module 04; This external light source 08 generally becomes miter angle to irradiate the surface of backlight module 04.
Image acquisition unit comprises: multiple multiple CCD devices 07 being positioned at detection station, between the image taking direction of each CCD device 07 and the surface of backlight module 04, angle is different.Like this, each CCD device 07 can obtain the image of each parts of backlight module 04 simultaneously by different predetermined angle.
Example four: as shown in Figure 8, microscope carrier 03 is installed on board 01 by conveyer;
Defect Detection device has the multiple detection stations be positioned on conveyer stroke;
At least one detection station has the external light source 08 for irradiating backlight module 04; This external light source 08 generally becomes miter angle to irradiate the surface of backlight module 04.
Image acquisition unit comprises: at least one CCD device 07 that each detection station has, and between the image taking direction of each CCD device 07 and the surface of backlight module 04, angle is at least two angles.
In the specific implementation, detect in station at one and a CCD device 07 can be set, multiple CCD device 07 also can be set, not limit at this.The acquisition image angle of each CCD device 07 can be different, also can part identical, do not limit at this.
By this multistation of example four, the embodiment of many CCD device, can realizing detecting without pausing, improving detection efficiency.
Further, the CCD device 07 mentioned in example one, example two, example three and example four can be line array CCD device, can be also area array CCD device, not limit at this.
Image analyzing unit 06 in the above-mentioned checkout equipment that the embodiment of the present invention provides, as shown in Figure 9, specifically can comprise:
Binary conversion treatment subelement 061, is connected with image acquisition unit 05 signal, for carrying out containing the image of each component feature in backlight module the binary image that binary conversion treatment obtains correspondence to what get respectively;
Gray-scale value computation subunit 062, be connected with binary conversion treatment subelement 061 signal, for for often organizing adjacent N number of pixel in each binary image, determine the first average gray value of N number of pixel that this group is adjacent, and calculate the adjacent N number of pixel of this group be expert at or second average gray value of pixel of column;
Contrast degree of variation subelement 063, is connected with gray-scale value computation subunit 062 signal, for determining the contrast degree of variation of the first average gray value and the second average gray value;
Flaw judgment sub-unit 064, is connected with contrast degree of variation subelement 063 signal, for after contrast degree of variation subelement judges that contrast degree of variation is greater than setting threshold value, determines that N number of pixel that this group is adjacent is flaw point.
Further, the image analyzing unit 06 in the above-mentioned checkout equipment that the embodiment of the present invention provides, as shown in Figure 9, can also comprise:
Geometrical characteristic parameter computation subunit 065, is connected with flaw judgment sub-unit 064 signal, for calculating the geometrical characteristic parameter of at least one feature pattern of all flaw point compositions that each parts in backlight module exist;
Defect classification subelement 066, is connected with geometrical characteristic parameter computation subunit 065 signal, calculates the flaw classification of the geometrical characteristic parameter determination feature pattern of each feature pattern for basis.
By the description of above embodiment, those skilled in the art can be well understood to the embodiment of the present invention and by hardware implementing, also can realize by the mode of software and necessary general hardware platform.Based on such understanding, the technical scheme of the embodiment of the present invention can embody with the form of software product, it (can be CD-ROM that this software product can be stored in a non-volatile memory medium, USB flash disk, portable hard drive etc.) in, comprise some instructions and perform method described in each embodiment of the present invention in order to make a computer equipment (can be personal computer, server, or the network equipment etc.).
It will be appreciated by those skilled in the art that accompanying drawing is the schematic diagram of a preferred embodiment, the module in accompanying drawing or flow process might not be that enforcement the present invention is necessary.
It will be appreciated by those skilled in the art that the module in the device in embodiment can be distributed in the device of embodiment according to embodiment description, also can carry out respective change and be arranged in the one or more devices being different from the present embodiment.The module of above-described embodiment can merge into a module, also can split into multiple submodule further.
The invention described above embodiment sequence number, just to describing, does not represent the quality of embodiment.
The detection method of a kind of backlight module group defect that the embodiment of the present invention provides, to become multiple predetermined angle with the surface of backlight module, obtains the image containing each component feature in backlight module; To analyzing containing the image of each component feature in backlight module of getting, determine the flaw point that in backlight module, each parts exist.By obtaining the mode of image from different predetermined angle, the image containing each component feature in backlight module can be got, after analyzing each image, just can determine the flaw point that each parts exist, the flaw achieved backlight unit and outward appearance have detects.Further, the detection method of the backlight module group defect that the embodiment of the present invention provides, relative to the mode of manual detection backlight module group defect, can improve the accuracy rate of detection efficiency and detection.
The checkout equipment of a kind of backlight module group defect that the embodiment of the present invention provides, comprises and is installed on the Defect Detection device of board and the microscope carrier for carrying backlight module; Wherein, Defect Detection device comprises: with the image acquisition unit becoming multiple predetermined angle to obtain the image containing each component feature in backlight module with the surface of backlight module; And, to analyzing containing the image of each component feature in backlight module of getting, determine the image analyzing unit of the flaw point that each parts exist in backlight module.Because image acquisition unit adopts the mode obtaining image from different predetermined angle, the image containing component feature each in backlight module can be got, after image analyzing unit is analyzed each image, just can determine the flaw point that each parts exist, the flaw achieved backlight unit and outward appearance have detects.Further, the checkout equipment of the backlight module group defect that the embodiment of the present invention provides, relative to the mode of manual detection backlight module group defect, can improve the accuracy rate of detection efficiency and detection.
Obviously, those skilled in the art can carry out various change and modification to the present invention and not depart from the spirit and scope of the present invention.Like this, if these amendments of the present invention and modification belong within the scope of the claims in the present invention and equivalent technologies thereof, then the present invention is also intended to comprise these change and modification.
Claims (11)
1. a detection method for backlight module group defect, is characterized in that, comprising:
When external light source becomes the first predetermined angle to irradiate backlight module, to become the second predetermined angle with the surface of backlight module, obtain the image containing described backlight module surface characteristics;
When described backlight module lighting, to become the 3rd predetermined angle with the surface of backlight module, obtain the image containing light guide plate feature in described backlight module;
When external light source becomes the first predetermined angle to irradiate described backlight module, to become the 4th predetermined angle with the surface of backlight module, obtain the image containing diffuser plate in described backlight module or optical film feature;
To analyzing containing the image of each component feature in described backlight module of getting, determine the flaw point that in described backlight module, each parts exist.
2. detection method as claimed in claim 1, is characterized in that, to analyzing containing the image of each component feature in described backlight module of getting, determines the flaw point that in described backlight module, each parts exist, specifically comprises:
Carry out containing the image of each component feature in described backlight module the binary image that binary conversion treatment obtains correspondence respectively to what get;
For often organizing adjacent N number of pixel in each binary image, determine the first average gray value of N number of pixel that this group is adjacent, and calculate the adjacent N number of pixel of this group be expert at or second average gray value of pixel of column; Determine the contrast degree of variation of described first average gray value and the second average gray value, when judging that described contrast degree of variation is greater than setting threshold value, determine that N number of pixel that this group is adjacent is flaw point, wherein, N is positive integer.
3. detection method as claimed in claim 2, is characterized in that, after determining the flaw point that in described backlight module, each parts exist, also comprises:
Calculate the geometrical characteristic parameter of at least one feature pattern of all flaw point compositions that each parts in described backlight module exist, and determine the flaw classification of described feature pattern according to the geometrical characteristic parameter of each feature pattern calculated.
4. a checkout equipment for backlight module group defect, is characterized in that, comprising: board; Be installed on the Defect Detection device of described board and the microscope carrier for carrying backlight module; Wherein,
Described Defect Detection device comprises:
When external light source becomes the first predetermined angle to irradiate backlight module, to become the second predetermined angle with the surface of backlight module, obtain the image containing described backlight module surface characteristics; When described backlight module lighting, to become the 3rd predetermined angle with the surface of backlight module, obtain the image containing light guide plate feature in described backlight module; When external light source becomes the first predetermined angle to irradiate described backlight module, to become the 4th predetermined angle with the surface of backlight module, obtain the image acquisition unit of the image containing diffuser plate or optical film feature in described backlight module;
And, be connected with described image acquisition unit signal, to analyzing containing the image of each component feature in described backlight module of getting, determine the image analyzing unit of the flaw point that each parts exist in described backlight module.
5. the checkout equipment of backlight module group defect as claimed in claim 4, it is characterized in that, described second predetermined angle is 90 degree; Described 3rd predetermined angle is 90 degree; Described 4th predetermined angle is 60 degree or 30 degree.
6. the checkout equipment of backlight module group defect as claimed in claim 4, is characterized in that,
Described Defect Detection device has one and detects station;
Described image acquisition unit comprises: the CCD device being positioned at described detection station;
Described detection station has the external light source for irradiating described backlight module;
Described microscope carrier is the microscope carrier that can overturn along the axis parallel with described microscope carrier surface.
7. the checkout equipment of backlight module group defect as claimed in claim 4, is characterized in that,
Described Defect Detection device has one and detects station;
Described image acquisition unit comprises: the CCD device being positioned at described detection station, angle adjustable between the image taking direction of described CCD device and the surface of backlight module;
Described detection station has the external light source for irradiating described backlight module.
8. the checkout equipment of backlight module group defect as claimed in claim 4, is characterized in that,
Described Defect Detection device has one and detects station;
Described image acquisition unit comprises: multiple multiple CCD devices being positioned at described detection station, and between the image taking direction of each described CCD device and the surface of backlight module, angle is different;
Described detection station has the external light source for irradiating described backlight module.
9. the checkout equipment of backlight module group defect as claimed in claim 4, is characterized in that,
Described microscope carrier is installed on described board by conveyer;
Described Defect Detection device has the multiple detection stations be positioned on described conveyer stroke;
Detect station described at least one and there is external light source for irradiating described backlight module;
Described image acquisition unit comprises: at least one CCD device that each detection station has, and between the image taking direction of each CCD device and the surface of backlight module, angle is at least two angles.
10. the checkout equipment of the backlight module group defect as described in any one of claim 4-9, is characterized in that, described image analyzing unit, specifically comprises:
Binary conversion treatment subelement, is connected with described image acquisition unit signal, for carrying out containing the image of each component feature in described backlight module the binary image that binary conversion treatment obtains correspondence to what get respectively;
Gray-scale value computation subunit, be connected with described binary conversion treatment subelement signal, for for often organizing adjacent N number of pixel in each binary image, determine the first average gray value of N number of pixel that this group is adjacent, and calculate the adjacent N number of pixel of this group be expert at or second average gray value of pixel of column;
Contrast degree of variation subelement, is connected with described gray-scale value computation subunit signal, for determining the contrast degree of variation of described first average gray value and the second average gray value;
Flaw judgment sub-unit, is connected with described contrast degree of variation subelement signal, after judging that at described contrast degree of variation subelement described contrast degree of variation is greater than setting threshold value, determines that N number of pixel that this group is adjacent is flaw point.
The checkout equipment of 11. backlight module group defect as claimed in claim 10, it is characterized in that, described image analyzing unit, also comprises:
Geometrical characteristic parameter computation subunit, is connected with described flaw judgment sub-unit signal, for calculating the geometrical characteristic parameter of at least one feature pattern of all flaw point compositions that each parts in described backlight module exist;
Defect classification subelement, is connected with described geometrical characteristic parameter computation subunit signal, for determining the flaw classification of described feature pattern according to the geometrical characteristic parameter calculating each feature pattern.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310071403.0A CN103217436B (en) | 2013-03-06 | 2013-03-06 | Backlight module group defect detection method and equipment |
| PCT/CN2013/076536 WO2014134880A1 (en) | 2013-03-06 | 2013-05-31 | Detection method and device for backlight module defects |
| US14/346,868 US9330451B2 (en) | 2013-03-06 | 2013-05-31 | Method and apparatus for detecting defect of backlight module |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310071403.0A CN103217436B (en) | 2013-03-06 | 2013-03-06 | Backlight module group defect detection method and equipment |
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| Publication Number | Publication Date |
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| CN103217436A CN103217436A (en) | 2013-07-24 |
| CN103217436B true CN103217436B (en) | 2015-05-20 |
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| CN201310071403.0A Expired - Fee Related CN103217436B (en) | 2013-03-06 | 2013-03-06 | Backlight module group defect detection method and equipment |
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| US (1) | US9330451B2 (en) |
| CN (1) | CN103217436B (en) |
| WO (1) | WO2014134880A1 (en) |
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| WO2014134880A1 (en) | 2014-09-12 |
| CN103217436A (en) | 2013-07-24 |
| US9330451B2 (en) | 2016-05-03 |
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