TWI313793B - Resist recycling device - Google Patents

Resist recycling device Download PDF

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TWI313793B
TWI313793B TW94123479A TW94123479A TWI313793B TW I313793 B TWI313793 B TW I313793B TW 94123479 A TW94123479 A TW 94123479A TW 94123479 A TW94123479 A TW 94123479A TW I313793 B TWI313793 B TW I313793B
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Taiwan
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resist
liquid
alkaline solution
net
bubble
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TW94123479A
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Chinese (zh)
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TW200636401A (en
Inventor
Masahiro Midorikawa
Kisaburo Niiyama
Takashi Yatabe
Kiyoshi Sugawara
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Tokyo Kakoki Co Ltd
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02WCLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO WASTEWATER TREATMENT OR WASTE MANAGEMENT
    • Y02W30/00Technologies for solid waste management
    • Y02W30/50Reuse, recycling or recovery technologies
    • Y02W30/62Plastics recycling; Rubber recycling

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  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Degasification And Air Bubble Elimination (AREA)
  • Filtration Of Liquid (AREA)
  • Separation, Recovery Or Treatment Of Waste Materials Containing Plastics (AREA)

Description

1313793 * 九、發明說明: 【發明所屬技術領域】 本發明係有關抗蝕劑的回收裝置。即,有關在電路基板 之製造製程中’附設於顯像機或剝離機,將顯像液或剝離液 等的鹼性溶液及感光性之抗蝕劑,從混合體分離、回收之抗 蝕劑的回收裝置。 【先前技術】 《技術的背景》 ® 隨著電子機器的高性能化、高功能化、小型輕量化,亦 促進印刷配線基板等之電路基板高精密度化、精巧化、極薄 化、多樣化,所形成電路顯著地高密度化、微細化。 而且’這樣的電路基板之製造製程中,在貼銅積層板也 •就是基板材的外表面’將感光性之抗蝕劑塗布或貼著成膜狀 之後’對射電路的負片’進行曝光之後,將電路形成部分以 .外的抗蝕劑’藉由顯像來溶解除去,將電路形成部分以外之 銅箔,藉由蝕刻來溶解除去之後,將電路形成部分的抗蝕 ®劑’藉由剝膜除去,在基板材之外表面以銅箱來形成電路, 因而’製造電路基板。 《先前技術》 第4圖係提供這種先前例之說明之正剖面說明圖。亦如 同圖所示’上述的顯像製程或剝膜製程,係使用顯像機1或 剝離機2 ’使電路形成部分以外之抗蝕劑A,或進行硬化剩 餘的電路形成部分之抗蝕劑A,將顯像液或剝離液等的鹼性 溶液B ’藉由進行噴射,從基板材c之外表面,來溶解除去、 1313793 w 剝離除去。 而且’這樣以顯像機1或剝離機2所使用之鹼性溶液B, 及作爲感光膜所使用之後所除去小的破片狀之抗蝕劑A,成 爲混合的混合體D,來進行往下流。 因此,將這樣之混合體D,從顯像機1或剝離機2,供 給到所附設的抗蝕劑的回收裝置3,分離鹼性溶液B及抗蝕 劑A ’顯像液或剝離液等之鹼性溶液B,係在顯像機1或剝 離機2循環供給並再使用,抗蝕劑A係被廢棄。 ® 而且,作爲這種抗蝕劑的回收裝置3,第4圖所示之過 濾器4式或網眼圓筒式係代表性地被使用。 即,這種先前例之抗鈾劑的回收裝置2,係將混合體D, ‘從顯像機1或剝離機2之室5的下部液槽6,通過泵7或配 •管8,供給到過濾器4或網眼圓筒,因此,藉由通過過濾器 4或網眼圓筒,來過濾、分離。而且,所回收之顯像液或剝 離液等之鹼性溶液B,係通過配管8供給到顯像機1或剝離 機2的噴射噴嘴9而噴射、再使用,未通過過濾器4或網眼 ®圓筒之抗蝕劑A係捕集、回收、進行廢棄。圖中符號1 〇係 顯像機1或剝離機2中,搬送基板材c的滾筒輸送帶。 《先前技術文獻資訊》 作爲這樣的先前例,譬如’可例舉以下專利文獻1之先 前技術項所示的先前例。 〔專利文獻1〕日本專利特開2004_3 25 502號公報 【發明內容】 〔發明揭示〕 1313793 ^ 〔發明所欲解決之問題〕 但是’有關這樣先前例之抗蝕劑的回收裝置3,有以下 之問題被指摘。 《第1問題點》 第1、被指摘的問題係’抗蝕劑A及鹼性溶液B之分離、 回收不確實’抗蝕劑A的回收效率不佳,鹼性溶液B之消耗 厲害。 即’電路基板係促進局精密度化 '精巧化、極薄化,所 #形成電路顯著的高密度化、微細化。因此,從這樣之電路形 成部分或電路形成部分以外所除去的抗蝕劑,亦顯著的微細 化。 ' 因此,先前之過濾器4式或網眼圓筒式之抗蝕劑的回收 - 裝置3,係從混合體D中來過濾、分離、捕集、回收抗蝕劑 A,但最近愈來愈不容易,有不確實化、困難化之傾向。 因而,經由抗蝕劑的回收裝置3所回收的顯像液或剝離 液等之鹼性溶液B中,係容易混入多量抗蝕劑A的狀態。因 鲁此,這樣的鹼性溶液B循環供給到顯像機1或剝離機2並重 複再使用時,則本來功能也就是從基板材C使抗蝕劑A溶解 除去、剝離除去功能,會形成逐漸下降。 因此,顯像機1的顯像液或剝離機2之剝離液等鹼性溶 液B之使使用壽命短,新鮮液之補充頻率或朝新鮮液的交換 頻率變高,因而使成本負擔亦變大。譬如’每週必須交換1 次的程度。 又,在顯像機1或剝離機2將混入有抗蝕劑A之鹼性溶 1313793 液B ’循環供給並重複使用時,則使抗蝕劑a白濁化、奶油 狀化、漿糊狀化’會在液槽6內壁沈澱、附著,亦會成爲配 管8其他網眼堵塞的原因。因此,雖然進行其清掃或除去作 業,但非常地麻煩需要工夫或時間。 《第2問題點》 第2、被指摘的問題係,在顯像液或剝離液等之鹼性溶 液B ’自先前技術即添加消泡劑,但該消泡劑,在基板材c 之電路形成會造成不良影響,成爲電路基板的不良原因。 即’顯像機或剝離機係從噴射噴嘴9對基板材C,來噴 射顯像液或剝離液等之鹼性溶液B。因此,在基板材C附近, 隨著噴射來產生鹼性溶液B的氣泡,但該氣泡,與混合體D 一起在抗蝕劑的回收裝置3之過濾器4或網眼圓筒流入時, 則該氣泡會使抗触劑A浮到液面,使抗触劑A的分離、回 收成爲不確實化,會使抗蝕劑A之回收效率下降。 因此作爲其對策,先前技術係預先在鹼性溶液B來加添 消泡劑,譬如乳劑型的乙醚型油質之消泡劑。 可是’這樣所添加的消泡劑,在基板材C之處理會受到 不良影響’而容易產生顯像不良、蝕刻不良、剝離不良,在 所製造電路基板,會產生不良品。 《第3問題點》 第3、被指摘的問題係,有關抗蝕劑的回收裝置3之過 濾器4或網眼圓筒,容易產生網眼堵塞,使過濾器4或網眼 圓筒的交換頻率或維修頻率變高,成本增大。 即’對前述第1問題之對應方法,亦即促進微細化將抗 1313793 - 蝕劑A的過濾、分離、回收加以確實化’使抗蝕劑A之回 收效率提高之對應方法係,有關抗蝕劑的回收裝置3,必須 採用網眼更緊密之過濾器4或網眼圓筒。可是其結果,容易 在過濾器4或網眼圓筒捕集、積蓄抗蝕劑A,形成堵塞。 順便一提,先前技術之抗鈾劑的回收裝置3,對於網眼, 係以每1吋(25 · 4mm )之網眼數爲2〇網眼程度作爲界限, 對微細的抗蝕劑A回收而言不足夠,同時容易產生堵塞。 《第4問題點》 φ 第4、被指摘的問題係,會使抗蝕劑的回收裝置3大型 化,佔取安裝空間,同時成本變高。 即,先前技術之抗蝕劑的回收裝置3,係將從顯像機1 • 或剝離機2所供給的混合體D,以過濾器4或網眼圓筒,一 . 次來進行過濾、分離,捕集抗触劑A並回收鹼性溶液b。 即,將所供給的多量混合體D,以1次處理一舉來進行 過濾、分離’所以無論如何’會使抗触劑的回收裝置3大型 化。 #《關於本發明》 本發明之抗蝕劑的回收裝置’係有鑑於這樣之實情,爲 了解決上述先前例的問題而發明。 而且’本發明係提供一種抗蝕劑的回收裝置,其目的 爲.桌1、提咼抗鈾劑的回收效率’第2、不用添加消泡劑, 第3、防止網眼堵塞,第4、使裝置小型化。 〔解決問題之手段〕 《關於申請專利範圍》 1313793 w 解決這樣的問題之本發明的技術手段,係如下所述。首 先,有關申請專利範圍第1項係如下。 申請專利範圍第1項所記載之抗蝕劑的回收裝置,係使 用在電路基板之製造製程中,從所供給的噴射後之鹼性溶液 及所除去的感光性之抗蝕劑的混合體,用來回收該抗蝕劑。 而且,其特徵爲具有:液槽、預脫液部、抗蝕劑濃縮部、抗 蝕劑回收部。該預脫液部係從該混合體分離該鹼性溶液,並 使其回收到該液槽。該抗蝕劑濃縮部係針對從該預脫液部所 Φ供給之該混合體,用來濃縮該抗蝕劑,並分離該鹼性溶液使 其回收到該液槽。該抗蝕劑回收部係針對從該抗蝕劑濃縮部 所供給的該混合體,用來捕集、回收該抗蝕劑,並將該鹼性 • 溶液分離、回收到該液槽。 . 有關申請專利範圍第2項係如下。申請專利範圍第2項 所記載之抗蝕劑的回收裝置,係如申請專利範圍第1項,其 特徵爲:該預脫液部係備有脫液網。而且,所供給之該混合 體,首先藉由流過該脫液網上,使相當多的該鹼性溶液分 #離、落下並回收到該液槽。 該抗蝕劑濃縮部係具備立設在該液槽中之略反圓錐狀 的捕集網。而且,從該預脫液部之脫液網上所供給的該混合 體,係藉由在該捕集網內朝向下方被吸引、往下流’使相當 多之該鹼性溶液流出到該捕集網外,朝向下方被吸引、往下 流而被吸引、回收到該液槽並使該抗蝕劑朝向該捕集網內下 部順序濃縮下去。 該抗蝕劑回收部係備有過濾網。而且,含有從該抗蝕劑 -10- 1313793 • 濃縮部之捕集網內下部所供給的被濃縮的該抗触劑之該混 合體,係以該過濾網捕集、回收該抗蝕劑’並使該鹼性溶液 回收到該液槽。 有關申請專利範圍第3項係如下。申請專利範圍第3項 所記載之抗蝕劑的回收裝置’係如申請專利範圍第2項’其 特徵爲··附設於電路基板之製造製程的顯像機’而該鹼性溶 液係由顯像液所構成。 有關申請專利範圍第4項係如下。申請專利範圍第4項 φ所記載之抗蝕劑的回收裝置,係如申請專利範圍第2項’其 特徵爲:附設於電路基板之製造製程的剝離機’而該鹼性溶 液係由剝離液所構成。 ' 有關申請專利範圍第5項係如下。申請專利範圍第5項 .所記載之抗鈾劑的回收裝置,係如申請專利範圍第3或4 項,其特徵爲:進而,配設有氣泡回收部,具備氣泡回收箱、 液化噴嘴、消氣泡網。 且該氣泡回收箱係在該抗蝕劑濃縮部上保持間隔而配 ®設,並使下面開放,用來吸引該混合體上部之該鹼性溶液的 氣泡。該液化噴嘴係將從該氣泡回收箱所供給之該氣泡,噴 射到該消氣泡網。該消氣泡網係使被噴射的該氣泡液化並返 回到該鹼性溶液,並使其回收到該液槽。 有關申請專利範圍第6項係如下。申請專利範圍第6項 所記載之抗蝕劑的回收裝置,係如申請專利範圍第3或4 項,其特徵爲:該預脫液部,係由具備傾斜下降所配設之該 脫液網、及在該脫液網下保持上下間隔所配設的多孔板、及 -11- 1313793 • 立設於該多孔板上之各突起的構造所構成。 而且,落下到該脫液網下之該鹼性溶液,係在該多孔板 及該突起跳躍、浮沈運動,因此將該脫液網從下搖動’並從 該多孔板上落下、回收到該液槽。 有關申請專利範圍第7項係如下。申請專利範圍第7項 所記載之抗蝕劑的回收裝置,係如申請專利範圍第3或4 項,其特徵爲:在該抗蝕劑濃縮部之捕集網的外側,保持間 隔並使多孔蓋設在周圍。而且,該液槽內之該鹼性溶液係流 • 入到該多孔蓋內,並沿著該捕集網的外面朝向下方被吸引、 往下流,因此被吸引、回收到該液。 有關申請專利範圍第8項係如下。申請專利範圍第8項 • 所記載之抗蝕劑的回收裝置,係如申請專利範圍第5或7 - 項,其特徵爲:用來吸引該混合體 '該鹼性溶液、或該氣泡 之泵,係由間歇驅動型所構成。 《作用等》 本發明之抗蝕劑的回收裝置,係由這樣的裝置所構成, ♦所以形成如下。 (1 )電路基板之製造製程中,在顯像機或剝離機噴射 使用的顯像液或剝離液等之鹼性溶液、及作爲感光膜使用而 從基板材除去之小的破片狀的感光性抗蝕劑之混合體,係被 供給到所附設的抗蝕劑的回收裝置。 (2 )而且’混合體首先係藉由流過預脫液部之脫液網 上’使相當多的量之驗性溶液,被分離' 落下而回收到液槽。 此時,落下於脫液網下的鹼性溶液,係在附有突起之多 -12- 1313793 * 孔板跳躍、浮沈運動,將脫液網從下面來搖動,所以脫液網 一直保持乾淨,來防止由於混合體中的抗蝕劑造成堵塞。 (3 )其次混合體係供給到抗蝕劑濃縮部之捕集網,在 略反圓錐狀的捕集網內,被吸引、往下流到下方。因此,使 相當多之量的鹼性溶液流出到捕集網外而被吸引、往下流到 下方並被吸引、回收到液體,而抗蝕劑係朝向捕集網下部依 順序被捕集,所濃縮下去。 (4 )在捕集網之外側,係使多孔蓋設在周圍,使液槽 β 內的鹼性溶液通過多孔蓋,沿著捕集網外面被吸引、往下流 到下方,因此與捕集網內流出之鹼性溶液一起,被吸引、回 收到液槽。 這樣一來,在捕集網內外形成同方向、同壓的流動,所 - 以防止因混合體中之抗蝕劑造成捕集網的堵塞。 (5 )且,含濃縮之抗蝕劑的混合體,隨後從捕集網下 部供給到抗鈾劑回收部,使抗蝕劑以過濾網捕集、回收,並 使鹼性溶液被回收到液槽。 ♦ ( 6 )還有,對於用來吸引混合體及鹼性溶液之泵,若 採用間歇驅動型,則捕集網或過濾網可更確實防止因混合體 中的抗蝕劑而堵塞。 (7 )但是,隨著顯像機或剝離機中之噴射,供給到抗 蝕劑的回收裝置之混合體,係帶有鹼性溶液的多量氣泡。 因此,在抗蝕劑的回收裝置,係配設有氣泡回收部。而 且氣泡被吸引到氣泡回收箱,從液化噴嘴朝向消氣泡網噴 射,因此被液化而返回到鹼性溶液,並被回收到液槽。還有, -13- 1313793 * 對於用來吸引氣泡的栗,若採用間歇驅動型’助長氣泡之液 化。 這樣一來氣泡被消除,即在混合液的液面使抗蝕劑浮 出,使抗蝕劑之分離、回收不確實化的氣泡。而且這是不必 使用在基板材之處理會造成不良影響的消泡劑而實現。 (8 )該抗蝕劑的回收裝置中,這樣一來,使抗蝕劑及 鹼性溶液確實地被分離、回收。 (9 )又,在預脫液部,預先分離、回收鹼性溶液相當 # 多的量,所以僅這部分,即可削減供給到抗蝕劑濃縮部之混 合體的量,進而,在抗蝕劑濃縮部亦分離、回收鹼性溶液, 所以僅這部分,即可削減供給到抗蝕劑回收部之混合體的 量。因此,使抗蝕劑濃縮部或抗蝕劑回收部被小型化,抗蝕 . 劑的回收裝置亦被小型化。 (1 0 )且因此,本發明之抗蝕劑的回收裝置係發揮以下 之效果。 〔發明效果〕 ®《第1效果》 第1、提高抗蝕劑的回收效率,並延長鹼性溶液之使用 壽命,清掃作業亦簡單容易化。 即,本發明之抗蝕劑的回收裝置,係對於混合體,首先 在預脫液部中’從抗蝕劑少的下部側分離、回收顯像液或剝 離液等鹼性溶液之後,其次在抗蝕劑濃縮部中,濃縮抗蝕 劑,並進而分離、回收鹼性溶液,最後在抗蝕劑回收部中, 捕集、回收濃縮的抗蝕劑,並分離、回收鹼性溶液。 1313793 * 這樣一來’使抗蝕劑及鹼性溶液順暢且確實地分離、回 收。最近被微細化之抗蝕劑,亦被確實地分離、回收。又, 從消除氣泡、或防止堵塞方面亦促進這樣分離、回收之確實 化。 因此’如過濾器式或網眼圓筒式之前述的這種先前例之 抗蝕劑的回收裝置’在所回收之鹼性溶液中會混入多量的抗 蝕劑之情形得以避免。所回收之鹼性溶液可無限次供給到顯 像機或剝離機而再使用、循環利用。 # 因此’比起這種先前例,可大幅度提高抗蝕劑的回收效 率,鹼性溶液之消耗被削減至1 /3程度,鹼性溶液的使用壽 命變長,其補充頻率或交換頻率下降,且成本負擔減輕。譬 -如,在2〜3週之間交換1次程度即可。 .又’混入於循環使用的鹼性溶液中的抗蝕劑,在顯像機 或剝離機內,亦減少白濁化、奶油狀化、漿糊狀化而沈澱、 附著,麻煩需要工夫或時間之清掃除去作業的次數,亦大幅 度地削減。 ♦《第2效果》 第2、不用添加消泡劑,因此防止要製造的電路基板產 生不良。 即,本發明之抗蝕劑的回收裝置,係藉由氣泡回收部, 形成採用使鹼性溶液之氣泡消除的系統。如前述之這種先前 例,由於並非預先在顯像液或剝離液等之鹼性溶液添加消泡 劑的系統,所以沒有消泡劑造成顯像不良、蝕刻不良、剝離 不良等之虞,不會產生消泡劑對於基板材的處理之不良影 1313793 • 響。因此,對於所製造電路基板,可回避起因於消泡劑之不 良品產生。 《第3效果》 第3、防止堵塞,亦可使網眼密度更緊密。即’本發明 之抗蝕劑的回收裝置,係藉由預脫液部中之脫液網的搖動而 利用保持乾淨,或抗蝕劑濃縮部中之捕集網內外的同方向、 同壓流動之形成,或採用間歇驅動型的泵等’對於脫液網、 捕集網、過濾網,來防止堵塞。 Φ 因此,比起前述這種先前例之抗蝕劑的回收裝置,可大 幅度來減少網等之交換頻率,維修頻率亦變少’在成本層面 極爲有利。 又,最近隨著電路之微細化,抗鈾劑亦有顯著微細化傾 .向,但因此種堵塞被防止,所以亦可採用200網眼程度之網 眼的網。對於脫液網、捕集網、過濾網等,可採用微細抗蝕 劑之對應極爲優越的每1吋(25 · 4mm)之網眼數爲200網 眼程度者。因此,與以20網眼程度作爲界限的前述這種先 @前例之抗蝕劑的回收裝置相較從這個層面而言亦可提高抗 蝕劑回收效率。 《第4效果》 第4、使裝置小型化。即,本發明之抗蝕劑的回收裝置, 係依預脫液部、抗蝕劑濃縮部、抗蝕劑回收部之順序,以順 序的階段,來進行分離、回收顯像液或剝離液等之鹼性溶液。 因此,將抗餓劑及鹼性溶液,由一次來過濾、分離、回 收的方式而成,因此比起裝置大型化之前述這種先前例的抗 1313793 • 蝕劑的回收裝置,裝置較小型化。因而,不會佔取安裝空間, 同時價格亦成爲一半程度等,在成本層面而言亦極爲優越。 這樣,可來全部解決存在於這種先前例之問題等,本發 明發揮的效果,更顯著地大增。 【實施方式】 〔實施發明之最佳形態〕 《關於圖式》 以下,將本發明之抗蝕劑的回收裝置,根據爲了實施圖 #式所示之發明的最佳形態,詳細加以說明。 第1圖、第2圖、第3圖係提供本發明之實施形態的說 明圖。而且第1圖係正剖面說明圖,第2圖係重要部分之側 _ 剖面說明圖,第3圖係全體的側剖面說明圖。 - 第5圖係基板(基板材)之模式化的平面說明圖。 《關於電路基板E》 該抗蝕劑的回收裝置11,係在電路基板E之製造製程 所使用。因此首先參考第5圖,針對電路基板E的槪略狀態 Φ來加以說明。 電路基板E係AV機器、個人電腦、行動電話' 數位相 機、其他各種電子機器中,將電連接用所使用,爲了連接零 件間的電路F圖案,形成在絕緣層之外表面或內部而構成。 而且電路基板E係分成單面基板及兩面基板之外,有多 層基板(含最近的增層(build-up)法之基板),其他各種基 板,亦可分成硬質的剛性系基板及薄膜狀之撓性系基板。 又,作爲這種電路基板E之一環,係將1C、L SI元件、 1313793 從動零件、驅動零件、電容器等等的半導體· 組裝成一體之模組基板(半導體一體型的封裝 玻璃基材一起埋入有電路F和半導體零件之赶 漿顯示器PDP用的玻璃基板或液晶LCD用之 而亦出現了 CSP、PBGA等。當然,本說明書 板E,除了由先前技術的印刷配線基板之外, 泛的基板。 而且,電路基板E係隨著電子機器之高伯 Φ 化、小型輕量化,來促進高精密度化、精巧化 撓性化、進而多層化、多樣化等,在外表面( 其中一方或雙方)所形成的電路F,進而在內 路F顯著地高密度化、微細化。 •電路基板E譬如係印刷配線基板,當製造 的切割尺寸,譬如由5 0 0 m m X 5 0 0 m m程度所精 緣層(心型材)部分,從先前技術之1 .6mm到 程度,現在係從50μηι到1 Ομηι左右,被極薄化 0 (銅箱部分)的厚度,先前技術係7 5 μ m〜3 5 μ m, 〜1 〇 μιη左右,亦被極薄化。多層基板之情況 係1 _0mm〜0.4mm程度,亦被極薄化。電路] 間空間,先前技術係3 0 μ m〜1 5 μ m程度,現7 有微細化傾向。 電路基板E係形成這樣的槪略狀態。 《關於電路基板E之製造方法的1例》 其次,關於使用該抗蝕劑的回收裝置1 1 『件,與電路F :基板),或在 复璃基板,即電 玻璃基板,進 中所謂電路基 亦包含這些廣 Ξ能化、高功能 、而且極薄化、 表面或背面之 丨部所形成的電 i時1片之縱橫 I成。厚度係絕 l-0mm 〜60μιη :。電路F部分 而現在係1 6 μ m 下,全體的厚度 F幅度或電路F 主係1 0 μ m左右1313793 * IX. Description of the Invention: [Technical Field] The present invention relates to a device for recovering a resist. In other words, in the manufacturing process of a circuit board, a resist which is attached to a developing machine or a peeling machine, and an alkaline solution such as a developing liquid or a peeling liquid and a photosensitive resist are separated and recovered from the mixture. Recycling device. [Prior Art] "Technical Background" ® The high-precision, compact, and diversified circuit boards such as printed wiring boards are promoted by the high-performance, high-performance, compact, and lightweight electronic devices. The formed circuit is remarkably high in density and fine. Moreover, in the manufacturing process of such a circuit board, after the photosensitive laminate is coated or pasted into a film shape after the copper-clad laminate is also the outer surface of the substrate, the negative film of the radiation circuit is exposed. And the circuit forming portion is dissolved and removed by developing the resist, and the copper foil other than the circuit forming portion is dissolved and removed by etching, and then the circuit is formed into a portion of the resist agent' The film is removed, and a circuit is formed in a copper box on the outer surface of the base material, thereby manufacturing a circuit substrate. "Prior Art" Fig. 4 is a front cross-sectional explanatory view showing the description of such a prior art. Also, as shown in the figure, the above-described developing process or stripping process is to use the developing device 1 or the peeling machine 2' to make the resist A other than the circuit forming portion, or to perform hardening of the remaining circuit forming portion of the resist. A. The alkaline solution B' such as a developing solution or a peeling solution is sprayed and removed from the outer surface of the base material c, and is removed by 1313793 w. Further, the alkaline solution B used in the developing machine 1 or the peeling machine 2 and the small sheet-like resist A removed as a photosensitive film are mixed and mixed to form a downward flow. . Therefore, such a mixture D is supplied from the developing machine 1 or the peeling machine 2 to the attached resist recovery device 3, and the alkaline solution B and the resist A' developing solution or the peeling liquid are separated. The alkaline solution B is circulated and supplied to the developing machine 1 or the peeling machine 2, and the resist A is discarded. Further, as the recovery device 3 of such a resist, the filter type 4 or the mesh cylinder type shown in Fig. 4 is typically used. That is, the recovery device 2 of the prior art uranium-repellent agent supplies the mixture D, 'from the lower tank 6 of the chamber 5 of the developing machine 1 or the stripping machine 2 to the pump 7 or the pipe 8 The filter 4 or the mesh cylinder is thus filtered and separated by passing through the filter 4 or the mesh cylinder. Further, the alkaline solution B such as the recovered developing solution or the peeling liquid is supplied to the jet nozzle 9 of the developing machine 1 or the peeling machine 2 through the pipe 8 to be ejected and reused, and does not pass through the filter 4 or the mesh. ® Cylinder Resin A is captured, recycled, and discarded. In the figure, reference numeral 1 denotes a roller conveyor belt for conveying the base material c in the developing machine 1 or the peeling machine 2. "Prior Art Document Information" As such a prior example, for example, the previous example shown in the prior art of Patent Document 1 can be exemplified. [Patent Document 1] Japanese Laid-Open Patent Publication No. 2004_3 25 502 SUMMARY OF THE INVENTION [DISCLOSURE OF THE INVENTION] 1313793 ^ [Problem to be Solved by the Invention] However, the recovery device 3 of the resist of the prior art has the following The problem was accused. "First Problem" The first and the problem to be referred to are that "the separation and recovery of the resist A and the alkaline solution B are not reliable." The recovery efficiency of the resist A is not good, and the consumption of the alkaline solution B is severe. In other words, the circuit board is improved in precision, and it is extremely compact and extremely thin. The # formation circuit is significantly higher in density and finer. Therefore, the resist removed from such a circuit forming portion or a circuit forming portion is also remarkably fine. Therefore, the previous filter type 4 or mesh cylinder type resist recovery device 3 filters, separates, traps, and recovers resist A from the mixture D, but more recently It is not easy, and there is a tendency to be unrealized and difficult. Therefore, in the alkaline solution B such as the developing liquid or the peeling liquid recovered by the resist recovery device 3, a large amount of the resist A is easily mixed. When the alkaline solution B is circulated and supplied to the developing machine 1 or the peeling machine 2 and reused, the original function is to dissolve and remove the resist A from the base material C, and to remove and remove the function. decreasing gradually. Therefore, the life of the alkaline solution B such as the developing solution of the developing machine 1 or the peeling liquid of the peeling machine 2 is short, and the frequency of replenishment of the fresh liquid or the frequency of exchange with the fresh liquid becomes high, so that the cost burden is also increased. . For example, the degree that must be exchanged once a week. Further, when the developer 1 or the peeling machine 2 circulates and reuses the alkaline solution 1313793 liquid B' in which the resist A is mixed, the resist a is clouded, creamy, and pasted. 'It will precipitate and adhere to the inner wall of the liquid tank 6, and it will also cause the other mesh of the piping 8 to be blocked. Therefore, although it is necessary to perform cleaning or removal work, it is very troublesome and requires time or effort. "Second problem" The second problem is that the alkaline solution B' in the developing solution or the stripping solution is added to the defoaming agent from the prior art, but the defoaming agent is in the circuit of the base plate c. Forming can cause adverse effects and become a cause of defects in the circuit board. In other words, the developing machine or the peeling machine ejects the alkaline solution B such as the developing liquid or the peeling liquid from the spray nozzle 9 to the base material C. Therefore, in the vicinity of the base material C, bubbles of the alkaline solution B are generated by the ejection, but the bubbles, together with the mixture D, flow into the filter 4 or the mesh cylinder of the resist recovery device 3, This bubble causes the anti-contact agent A to float to the liquid surface, and the separation and recovery of the anti-catalyst A are not confirmed, and the recovery efficiency of the resist A is lowered. Therefore, as a countermeasure against this, the prior art has previously added an antifoaming agent such as an emulsion type diethyl ether type defoaming agent to the alkaline solution B. However, the antifoaming agent added as described above is adversely affected by the treatment of the base material sheet C, and it is likely to cause development failure, etching failure, and peeling failure, and defective products are produced on the manufactured circuit board. "3rd problem point" 3. The problem that is referred to is that the filter 4 or the mesh cylinder of the resist recovery device 3 is liable to cause mesh clogging and exchange of the filter 4 or the mesh cylinder. The frequency or maintenance frequency becomes higher and the cost increases. In other words, the corresponding method for the first problem, that is, the corresponding method for improving the filtration efficiency of the resist A by improving the filtration, separation, and recovery of the anti-1313793-etching agent A, and improving the recovery efficiency of the resist A The recovery device 3 of the agent must use a filter 4 or a mesh cylinder with a tighter mesh. However, as a result, it is easy to trap and accumulate the resist A in the filter 4 or the mesh cylinder to form a clogging. By the way, the recovery device 3 of the prior art uranium-repellent agent is used for the mesh, and the number of meshes per 1 inch (25 · 4 mm) is 2 〇 mesh degree as a limit, and the fine resist A is recovered. It is not enough, and it is easy to cause blockage. "4th Problem" φ 4th, the problem that is referred to is that the resist recovery device 3 is increased in size, taking up the installation space, and the cost is high. That is, the prior art resist recovery device 3 filters and separates the mixture D supplied from the developer 1 or the peeling machine 2 with the filter 4 or the mesh cylinder. The anti-touching agent A is trapped and the alkaline solution b is recovered. In other words, the multi-component mixture D to be supplied is filtered and separated in one treatment, so that the anti-contact agent recovery device 3 is increased in size. # "The present invention" The resist recovery apparatus of the present invention has been invented in order to solve the above problems of the prior art in view of such circumstances. Moreover, the present invention provides a recovery device for a resist, the purpose of which is to reduce the recovery efficiency of the table 1, the antimony uranium agent, the second, without the addition of an antifoaming agent, and the third, to prevent clogging of the mesh, the fourth, Miniaturize the device. [Means for Solving the Problem] "Regarding the Patent Application Range" 1313793 w The technical means of the present invention for solving such a problem is as follows. First, the first item of the patent application scope is as follows. The apparatus for recovering a resist according to the first aspect of the invention is used in a manufacturing process of a circuit board, from a mixture of the supplied alkaline solution after spraying and the photosensitive resist removed. Used to recover the resist. Further, it is characterized in that it has a liquid tank, a pre-liquid removal unit, a resist concentration unit, and a corrosion-receiving unit. The pre-liquid removal section separates the alkaline solution from the mixture and recovers it into the liquid tank. The resist concentrating portion is for concentrating the resist from the mixture supplied from the pre-liquid removal portion Φ, and separating the alkaline solution to be recovered in the liquid tank. The resist recovery unit collects and collects the resist from the mixture supplied from the resist concentration unit, and separates and collects the alkaline solution into the liquid tank. The second item of the patent application scope is as follows. The apparatus for recovering a resist according to the second aspect of the patent application is the first item of the patent application, characterized in that the pre-liquid removal unit is provided with a liquid-repellent net. Further, the supplied mixture is first passed through the liquid removal net, and a considerable amount of the alkaline solution is separated, dropped, and recovered into the liquid tank. The resist concentrating portion has a slightly conical trapezoidal net that is erected in the liquid tank. Further, the mixture supplied from the liquid removal net of the pre-liquid removal unit is sucked downward and downward in the collection net, so that a considerable amount of the alkaline solution flows out to the collection. Outside the net, it is sucked downward and downward to be sucked, recovered into the liquid tank, and the resist is sequentially concentrated toward the lower portion of the trap. The resist recovery unit is provided with a filter. Further, the mixture containing the concentrated anti-contact agent supplied from the lower portion of the trap network of the resist-10-1313793 • enrichment unit collects and recovers the resist by the filter. The alkaline solution is recovered into the tank. The third item of the scope of patent application is as follows. The apparatus for recovering a resist according to the third aspect of the patent application is as in the second aspect of the patent application, which is characterized in that the image is attached to a manufacturing process of a circuit board, and the alkaline solution is It is composed of liquid. The fourth item of the scope of application for patents is as follows. The apparatus for recovering a resist according to the fourth aspect of the patent application is the second item of the patent application, which is characterized in that: the stripping machine attached to the manufacturing process of the circuit board, and the alkaline solution is a stripping solution Composition. 'The fifth item of the patent application scope is as follows. The apparatus for recovering an anti-uranium agent according to the fifth aspect of the patent application is the third or fourth aspect of the patent application, characterized in that: further, a bubble recovery unit is provided, and a bubble recovery tank, a liquefaction nozzle, and a bubble are provided. Bubble net. Further, the bubble collecting tank is disposed at intervals in the resist concentrating portion, and is opened to open the bubble for attracting the alkaline solution in the upper portion of the mixture. The liquefaction nozzle ejects the air bubbles supplied from the bubble collecting tank to the bubble eliminating net. The bubble-eliminating network liquefies the bubble which is ejected and returns it to the alkaline solution, and recovers it into the tank. Item 6 of the scope of application for patents is as follows. The apparatus for recovering a resist according to claim 6 is the third or fourth aspect of the patent application, characterized in that the pre-liquid removal unit is provided by the liquid-repellent net provided with the inclination drop. And a structure in which a perforated plate disposed between the upper and lower intervals is held under the liquid-repellent net, and a projection of each of the protrusions erected on the perforated plate. Further, the alkaline solution dropped under the liquid-repellent net moves in the perforated plate and the protrusion, and the floating and sinking movement, so that the liquid-repellent net is shaken from below and is dropped from the perforated plate, and the liquid is recovered. groove. Item 7 of the scope of application for patents is as follows. The apparatus for recovering a resist according to claim 7 is the third or fourth aspect of the patent application, characterized in that the space is kept outside the trapping net of the resist enrichment portion and is porous. Covered around. Further, the alkaline solution in the liquid tank flows into the porous cover, and is sucked downward and downward along the outer surface of the collecting net, so that the liquid is sucked and recovered. The eighth item of the patent application scope is as follows. Patent Application No. 8 • The resist recovery device described in the patent application is in the fifth or seventh aspect of the patent application, characterized in that: the alkaline solution or the pump for attracting the mixture It is composed of intermittent drive type. <<Operation and the like>> The apparatus for recovering a resist of the present invention is constituted by such a device, so that it is formed as follows. (1) In the manufacturing process of a circuit board, an alkaline solution such as a developing solution or a peeling liquid used for spraying on a developing machine or a peeling machine, and a small fragment-like photosensitive property removed from a base material as a photosensitive film The mixture of the resists is supplied to the recovery device of the attached resist. (2) Further, the 'mixture is firstly passed through a liquid-repellent net of the pre-desorbing section' to cause a considerable amount of the test solution to be separated and dropped to be recovered into the liquid tank. At this time, the alkaline solution dropped under the liquid-repellent net is hopped, floated and moved in the -12- 1313793* plate with the protrusion, and the liquid-repellent net is shaken from below, so the liquid-repellent net is kept clean. To prevent clogging due to the resist in the mixture. (3) The second mixing system is supplied to the trapping net of the resist enrichment unit, and is sucked and descended downward in the slightly conical trapping net. Therefore, a considerable amount of the alkaline solution flows out of the trapping net, is attracted, flows downward, and is sucked and recovered into the liquid, and the resist is sequentially collected toward the lower portion of the trapping net. Concentrate. (4) On the outside of the trapping net, the porous cover is placed around, so that the alkaline solution in the liquid tank β passes through the porous cover, is attracted along the outside of the trapping net, flows down to the lower side, and thus the trapping net The alkaline solution flowing out is sucked and recovered into the liquid tank. In this way, a flow in the same direction and at the same pressure is formed inside and outside the trapping net to prevent clogging of the trapping net due to the resist in the mixture. (5) Further, the mixture containing the concentrated resist is then supplied from the lower portion of the collecting net to the uranium recovery unit, and the resist is collected and recovered by the filter, and the alkaline solution is recovered into the liquid. groove. ♦ (6) Also, for the pump for attracting the mixture and the alkaline solution, if the intermittent drive type is used, the trapping net or the filter can more reliably prevent clogging due to the resist in the mixture. (7) However, with the ejection in the developing machine or the peeling machine, the mixture of the recovery means supplied to the resist is a large amount of bubbles with an alkaline solution. Therefore, in the resist recovery device, a bubble recovery portion is provided. Further, the bubble is sucked into the bubble recovery tank and ejected from the liquefaction nozzle toward the bubble elimination net, so that it is liquefied and returned to the alkaline solution, and is recovered into the liquid tank. Also, -13- 1313793 * For the pump used to attract air bubbles, use the intermittent drive type to promote the liquefaction of the bubbles. As a result, the bubbles are eliminated, that is, the resist is floated on the liquid surface of the mixed liquid, and the resist is separated and the bubbles which are not confirmed are recovered. Moreover, this is achieved without using an antifoaming agent which adversely affects the treatment of the base sheet. (8) In the resist recovery apparatus, the resist and the alkaline solution are surely separated and recovered. (9) Further, in the pre-desorbing section, the amount of the alkaline solution is relatively separated and recovered in advance. Therefore, the amount of the mixture supplied to the resist enrichment portion can be reduced only in this portion, and further, the resist is removed. Since the agent concentration unit also separates and recovers the alkaline solution, the amount of the mixture supplied to the resist recovery unit can be reduced only in this portion. Therefore, the resist concentrating portion or the resist collecting portion is miniaturized, and the resist recovery device is also miniaturized. (10) Therefore, the apparatus for recovering a resist of the present invention exerts the following effects. [Effect of the Invention] ® "First Effect" First, the recovery efficiency of the resist is increased, and the service life of the alkaline solution is prolonged, and the cleaning operation is also simple and easy. In other words, in the apparatus for recovering a resist according to the present invention, first, in the pre-desorbed portion, the alkaline solution such as a developing solution or a stripping solution is separated from the lower side of the resist, and then In the resist concentration unit, the resist is concentrated, and the alkaline solution is further separated and recovered. Finally, the concentrated resist is collected and recovered in the resist recovery unit, and the alkaline solution is separated and recovered. 1313793 * In this way, the resist and the alkaline solution are smoothly and surely separated and recovered. The resist which has been miniaturized recently has been reliably separated and recovered. Further, such separation and recovery are also promoted in terms of eliminating air bubbles or preventing clogging. Therefore, the case where the resist recovery means of the prior art such as the filter type or the mesh cylinder type described above is mixed with a large amount of the resist in the recovered alkaline solution can be avoided. The recovered alkaline solution can be supplied to the display machine or the stripper in an unlimited number of times for reuse and recycling. # Therefore, compared with this previous example, the recovery efficiency of the resist can be greatly improved, the consumption of the alkaline solution is reduced to 1/3, the service life of the alkaline solution becomes long, and the supplementary frequency or exchange frequency decreases. And the cost burden is reduced.譬 - For example, you can exchange 1 degree between 2 and 3 weeks. Further, the resist mixed in the alkaline solution for recycling is also reduced in whiteness, creaminess, paste formation, precipitation, and adhesion in a developing machine or a peeling machine, which requires labor or time. The number of cleaning operations and removals has also been greatly reduced. ♦ "Second effect" Second, no defoaming agent is added, so that the circuit board to be manufactured is prevented from being defective. That is, in the apparatus for recovering a resist of the present invention, a system for eliminating bubbles of an alkaline solution is formed by the bubble collecting portion. In the above-described conventional example, since the system in which the antifoaming agent is not added to the alkaline solution such as the developing solution or the stripping solution in advance, there is no defect such as development failure, etching failure, peeling failure, etc., which is not caused by the antifoaming agent. It will produce a bad shadow for the treatment of the base plate by the defoamer 1313793. Therefore, it is possible to avoid the occurrence of defective products due to the defoaming agent for the circuit board to be manufactured. "Third Effect" Third, to prevent clogging, the mesh density can be made closer. That is, the apparatus for recovering the resist of the present invention is kept clean by the shaking of the liquid-repellent net in the pre-desorbing section, or flows in the same direction and at the same pressure inside and outside the trapping net in the resist enrichment section. It is formed by using a batch-driven pump or the like to prevent clogging of the liquid-repellent net, the trapping net, and the filter. Φ Therefore, compared with the above-described conventional resist recovery device, the exchange frequency of the mesh or the like can be greatly reduced, and the maintenance frequency is also reduced, which is extremely advantageous at the cost level. Further, recently, with the miniaturization of the circuit, the anti-uranium agent has been remarkably finely smeared, but the clogging is prevented, so that a net of 200 mesh eyes can be used. For the liquid-repellent net, the trapping net, the filter net, etc., the number of meshes per 1 inch (25 · 4 mm) which is extremely superior to the fine resist can be 200 mesh. Therefore, the recovery efficiency of the resist can be improved from this level as compared with the above-described first-stage resist recovery apparatus which is limited to the extent of 20 mesh. "Fourth effect" Fourth, the device is miniaturized. In other words, in the apparatus for recovering a resist according to the present invention, the developing solution or the stripping liquid is separated and recovered in the order of the pre-desorbing unit, the resist enriching unit, and the resist collecting unit. Alkaline solution. Therefore, since the anti-hungry agent and the alkaline solution are formed by filtering, separating, and recovering at one time, the device is smaller than the above-mentioned conventional anti-1313793 etchant recovery device which is large in size. . Therefore, it does not occupy the installation space, and the price is also half the degree, etc., and is extremely superior in terms of cost. In this way, the problems existing in the prior art and the like can be all solved, and the effects exerted by the present invention are more significantly increased. [Embodiment] [Best Mode for Carrying Out the Invention] <<Related Modes>> Hereinafter, the apparatus for recovering a resist of the present invention will be described in detail based on the best mode of the invention shown in the drawings. Fig. 1, Fig. 2, and Fig. 3 are explanatory views showing an embodiment of the present invention. Further, Fig. 1 is a front cross-sectional explanatory view, and Fig. 2 is a side view of an important portion _ cross-sectional explanatory view, and Fig. 3 is a side cross-sectional explanatory view of the whole. - Fig. 5 is a schematic plan view of a substrate (base plate). <<Circuit Substrate E>> This resist recovery device 11 is used in the manufacturing process of the circuit board E. Therefore, first, referring to Fig. 5, the outline state Φ of the circuit board E will be described. The circuit board E is an AV device, a personal computer, a mobile phone, a digital camera, and various other electronic devices. It is used for electrical connection, and is formed on the outer surface or inside of the insulating layer in order to connect the circuit F pattern between the parts. Further, the circuit board E is divided into a single-sided substrate and a double-sided substrate, and has a multilayer substrate (including a substrate of a recent build-up method), and various other substrates may be divided into a rigid rigid substrate and a film-like substrate. Flexible substrate. In addition, as one of the circuits of the circuit board E, a module substrate in which a semiconductor such as a 1C, an L-IS element, a 1313793 driven component, a driving component, and a capacitor is integrated is integrated (a semiconductor-integrated package glass substrate together) CSP, PBGA, etc. are also used for a glass substrate or a liquid crystal LCD for a PDP having a circuit F and a semiconductor component. Of course, the present specification E is in addition to the printed wiring substrate of the prior art. In addition, the circuit board E is high-precision, compact, and multi-layered, and is versatile, etc., on the outer surface (one of the The circuit F formed by the both sides is remarkably high-density and finer in the internal path F. • The circuit board E is, for example, a printed wiring board, and the cut size to be manufactured is, for example, about 500 mm X 5 0 mm. The thickness of the fine edge layer (heart profile), from the previous technology of 1. 6mm to the extent, is now from 50μηι to 1 Ομηι, is extremely thinned to 0 (copper box part) thickness, prior art 7 5 μ m~3 5 μ m, ~1 〇μιη, is also extremely thinned. The case of multi-layer substrate is 1 _0mm~0.4mm, and is also extremely thin. Circuit] space, prior art system 30 μ In the case of m to 1 5 μm, there is a tendency to become finer. The circuit board E is formed in such a state of the outline. "One example of the method of manufacturing the circuit board E" Next, the recycling device 1 using the resist 1 "Parts, and circuit F: substrate", or in the glass substrate, that is, the electric glass substrate, the so-called circuit base also includes these wide-ranging, high-function, and extremely thin, surface or back side When the electric i is formed, the vertical and horizontal I of one piece are formed. The thickness is absolutely l-0mm ~ 60μιη :. Circuit F part and now the current thickness of 16 μm, the total thickness F amplitude or circuit F main system about 10 μ m

之電路基板E -18- 1313793 之製造方法,參考第5圖、第1圖等來加以說明。首先,關 於第1例的製造方法來加以陳述。該製造方法中,電路基扳 E譬如係配線印刷基板,根據以下之步驟所製造。 最先,在玻璃布製、陶瓷製、薄膜狀之聚醯亞胺製、其 他樹脂製的絕緣層(心材)之外表面,使銅箔藉由熱加壓等 而貼著,來準備貼銅積層板也就是基板材C。 而且,關於這樣所準備的基板材C,在進行粗化所貼著 之銅箱表面之表面粗化處理(軟蝕刻)之後,切斷成短形的 春加工尺寸之各片。表面粗化處理在先前技術係藉由機械硏磨 來進行,但最近係藉由處理液的噴射所進行爲多。 而且多數的情況,通孔用之穿孔加工係使用雷射等來實 施。通孔係由基板材C (電路基板E)的兩外表面間之微細 - 的貫通孔所構成,針對1片形成數百個以上極小直徑之貫通 孔,其直徑係形成0.5mm〜0.2mm程度以下爲多。而且,通 孔係使用於兩外表面的電路F (銅箔)間或多層基板之電路 F (銅箔)間的導通連接用,或安裝在電路F的半導體零件 Φ之安裝用。 還有最近,取代需要穿孔加工之通孔,形成小突起狀. 略圓錐梯形的接點也就是凸出,因此關於多層基板等,藉由 該凸出來實現與通孔同樣功能之技術也被開發。凸出係以電 路F爲準,根據顯像製程、蝕刻製程、剝離製程所製造。 然後’在基板材C之銅箔的外表面,使感光性之抗蝕劑 A來塗布或貼著成膜狀。抗蝕劑a的乾式薄膜,亦係被壓著 爲多。然後’對電路F之負片也就是預先設計了電路F的電 -19- 1313793 ' 路F照片,藉由進行曝光,使外表面之抗蝕劑A被曝光而殘 留硬化後的電路F形成部分(保護膜部分),而其他不要部 分,係藉由處理液也就是顯像液,即鹼性溶液B的噴射,% 溶解除去。 然後,這樣的基板材C之銅箱,係使抗鈾劑A硬化而殘 留被披覆的電路F形成部分(保護膜部分),藉由顯像來溶 解除去抗蝕劑A使露出後的不要部分,藉由處理液也就是倉虫 刻液(氯化第二銅、氯化第二鐵、其他腐蝕液)之噴射,所 # 溶解除去·蝕刻。然後,殘留的電路F形成部分之抗蝕劑a, 係藉由處理液也就是剝離液,即鹼性溶液B的噴射來剝離除 去,因此,以殘留之電路F形成部分的銅箔,在基板材C之 外表面,來形成預定導體圖案的電路F,並來製造電路基板 . E ° 還有,在上述之顯像製程、蝕刻製程、剝膜製程,係在 各自後處理用,或在剝膜製程之後集中後處理用,附設有用 來噴射水洗液、中和劑液、其他洗淨液的洗淨製程。洗淨製 ®程係使附著於基板材C之外表面(含通孔內等)的顯像液、 蝕刻液、剝離液等之處理液,被洗淨、除去。進而,在洗淨 製程之後,附設有乾燥製程。即,在以洗淨製程所洗淨的基 板材C之外表面(含通孔內等),係附著有水洗液及其他洗 淨液,或此等的水分,所以爲了防止氧化等應來除去此等, 事後立刻在乾燥製程中來進行乾燥處理。 第1例之製造方法係由這樣的濕式處理法所構成。第1 例之製造方法係這樣所構成。 -20 - 1313793 ' 《關於電路基板E之製造方法的其他例》 其次,關於第2例之製造方法加以陳述。電路基板E譬 如印刷配線基板的製造方法,上述之第1例的濕式處理法係 代表例,但第2例的半加成(semi additive)法亦常被使用。 半加成法首先係在預先形成通孔之基板材C的表面,施 予無電鑛銅。然後,在該無電鍍銅,將感光性抗蝕劑A塗布 或貼著成膜狀之後,對電路F薄膜也就是電路F照片曝光。 而且抗蝕劑A係被曝光而殘留硬化的部分,而其他部分也就 •是電路F形成部分,係藉由處理液也就是顯像液,即鹼性溶 液B的噴射所溶解除去。 然後’對於電路F形成部分,即藉由顯像使抗蝕劑A溶 解除去之鍍圖案部分,即無電鑛銅露出的部分,來施予電鑛 - 銅’形成電路F。還有,殘留之電路F形成部分以外的硬化 後之抗蝕劑A,係藉由處理液也就是剝離液,即鹼性溶液b 的噴射而剝離除去,露出後之無電鍍銅,係藉由處理液也就 是蝕刻液的噴射而快速蝕刻,來融解除去。還有,作爲各製 II程之後處理用,係以前述所述爲準,附設藉由洗淨液之洗淨 製程、或乾燥製程。 第2例的半加成法是這樣以電鍍銅所形成電路F,因此 來製造電路基板E。第2例之製造方法係這樣所形成。 但是,印刷配線基板及其他電路基板E的製造方法,最 近愈來愈多樣化,除了上述第1例、第2例以外,其他各種 方法亦被開發、使用。本發明當然亦適用於這樣的各種電路 基板E之製造方法。 1313793 電路基板E之製造方法係這樣所形成。 《關於抗蝕劑的回收裝置i i之槪要》 以下’關於本發明之抗蝕劑的回收裝置1 1,來參考第i 圖 '第2圖、第3圖,並加以說明。 首先作爲前提’如前述,電路基板E之製造製程中,顯 像製程或剝離製程,係對於被搬送的基板材C,來噴射顯像 液或剝離液等之鹼性溶液B,從基板材C的外表面,來除去 感光性抗蝕劑A。 即,如第1圖中所示,在顯像機1或剝離機2之室5內, 係以滾筒輸送帶10等的輸送帶對於被水平輸送之基板材 C,從對置配設於上下的各噴射噴嘴9,來噴射譬如含有3% 程度之苛性鹼的鹼性藥液,亦即由顯像液或剝離液而成的鹼 性溶液B。 因此,來除去基板材C的外表面之感光性抗蝕劑A。即, 顯像機1係來溶解除去電路F形成部分以外的抗蝕劑A,而 剝離機2係來剝膜除去電路F形成部分的抗蝕劑A。 抗鈾劑的回收裝置1 1係電路基板E之製造製程中,作 爲顯像製程或剝離製程的附帶製程,分別在顯像機1或剝離 機2所附設使用。 顯像製程之情況係從顯像機1,將噴射使用後的鹼性溶 液B也就是顯像液、及所除去後之抗蝕劑A的混合體D,來 供給到所附設之抗蝕劑的回收裝置Π。剝膜製程之情況,係 從剝離機2,使噴射使用後的鹼性溶液B也就是剝離液、及 所除去後之抗蝕劑A的混合體D,供給到所附設之抗蝕劑的 -22 - 1313793 ' 回收裝置1 1。 抗蝕劑的回收裝置1 1係從這樣所供給之鹼性溶液B及 感光性抗蝕劑A的混合體D,來分離、回收抗蝕劑A。而且, 具有液槽12、預脫液部1 3 '抗蝕劑濃縮部1 4、抗蝕劑回收 部1 5、氣泡回收部30等所構成。 抗蝕劑的回收裝置1 1,係構成這樣之槪略狀態。以下, 關於其詳細構造加以說明。 《關於預脫液部1 3》 φ 首先,參考第2圖等,對於預脫液部13來加以說明。 抗蝕劑的回收裝置1 1之預脫液部1 3,係具備脫液網1 6,所 供給的混合體D,首先藉由流過脫液網1 6上,使相當多之 •量的鹼性溶液B,被分離、落下,回收到液槽1 2。 .即預脫液部1 3係由具備下降傾斜所配設之脫液網1 6、 及在脫液網1 6下保持上下間隔所配設的多孔板1 7、及在多 孔板1 7上立設多數之突起1 8的構造所構成。 而且在脫液網16下流下、落下之鹼性溶液B,係以多 ϋ孔板17及突起18來逆轉、跳躍、浮沈運動,因此將脫液網 1 6從下搖動,同時從多孔板1 7上朝向液槽1 2落下而回收。 對於這種預脫液部1 3來更詳細加以陳述。首先混合體 D,如第1圖所示,在顯像機1或剝離機2之室5內的稍微 傾斜之間隔底面1 9上’落下之後,沿著其傾斜流動。而且, 從排出口 20通過供給管2 1,經由受入口 22朝向抗蝕劑的回 收裝置1 1來流入。 而且,這樣供給到抗蝕劑的回收裝置1 1之混合體D, -23- 1313793 ' 首先,流過在液槽1 2的液面上保持上下間隔所配設之預脫 液部1 3的脫液網1 6上。 如第2圖所示,脫液網1 6係使微細之網孔緊密地形成 多數,同時來形成略呈長板網狀,網孔之直徑係被設定成即 使微細化的抗蝕劑A亦不能通過之網眼尺寸,譬如,被設定 成數ΙΟμιη〜數μπι程度,200網眼程度。而且,是以脫液網 1 6在長度方向來稍微下降傾斜所配設。 混合體D是以在脫液網1 6上,從受入口 22下之上游側 •朝向下游側,沿著其傾斜來流動。因此,混入於混合體D的 鹼性溶液Β之相當多的部分,係在脫液網1 6之網孔來過濾、 分離,並通過下位的多孔板17,朝向下方之液槽12來落下 - 去。 -其次,預脫液部1 3之多孔板1 7係在脫液網1 6下保持 上下間隔,且並列成平行而配設,並使回收孔形成多數。 作爲多孔板1 7,譬如使用穿孔板,並具備多數小的回收 孔(孔徑係比脫液網1 6之網孔大很多),同時形成與上位 肇的脫液網1 6對稱之尺寸的長板狀,以對稱之傾斜角度來配 設、固定。 而且,是以在多孔板17上立設、固定多數突起18,作 爲液體切桿(1 i q u i d c u t b a r)來發揮功能。突起1 8係在前後 (上下游方向)相互保持間隔所配設,而其高度尺寸,係脫 液網1 6及多孔板1 7間的上下間隔譬如設定成一半程度。 因此,根據前述在脫液網16從混合體D分離、落下之 鹼性溶液B,係經由下位的多孔板1 7之回收孔,朝向下方 -24 - 1313793 的液槽1 2來進行落下’但相當多之部分在途中,在多孔板 1 7的回收孔以外之表面部分,被逆轉、所跳回。 而且鹼性溶液B係來進行跳躍 '浮沈運-動並來流過多孔 板17上。又’該鹼性溶液B之跳躍、浮沈運動,是以立設 於多孔板1 7上的各突起1 8之止流功能,大有助長。 因此’是以藉由跳躍、浮沈運動,使上位的脫液網j 6 被上下搖動’所以使流過脫液網16上之混合體〇中的抗倉虫 劑A ’被阻止沈澱、附著在脫液網16上。即,防止脫液網 φ 1 6之網眼堵塞。 預脫液部1 1係形成這樣構成。 《關於抗蝕劑濃縮部1 4》 其次’參考第2圖、第3圖說明關於抗蝕劑濃縮部14。 • 抗鈾劑的回收裝置1 1之抗触劑濃縮部1 4,係針對從預脫液 部1 3所供給的混合體D,濃縮抗蝕劑a,同時分離鹼性溶 液B而回收到液槽1 2。 即,抗蝕劑濃縮部1 4係具備立設於液槽1 2中之略反圓 ®錐狀的捕集網2 3,從預脫液部1 3之脫液網1 6上所供給的混 合體D’係於捕集網23內朝向下方被吸引、往下流。 因此混合體D係使相當多之鹼性溶液b流出到捕集網 23外’朝向下方被吸引、往下流’並被吸引、回收到液槽 12 ’所以使抗蝕劑A朝向捕集網23內的下部,依順序被濃 縮下去。 又,在抗蝕劑濃縮部1 4之捕集網2 3的外側,係使多孔 盖24設在周圍’且保持間隔。因此’液槽1 2內之鹼性溶液 -25 - 1313793 ' B,係流入到多孔蓋24內,同時沿著捕集網23的外面朝向 下方被吸引、往下流,因此,朝向液槽12被吸引、回收。 是以對於抗蝕劑濃縮部1 4,來更詳細加以陳述。在液槽 1 2之中央部,使捕集網23及多孔蓋24立設成同心狀。 即,捕集網23係使上面被開放同時愈下方愈成爲小徑, 形成略反圓錐狀,同時使微細之網孔緊密的形成多數。網孔 之直徑係被設定成即使微細化的抗蝕劑A亦不能通過之網 眼尺寸,譬如,被設定成數ΙΟμπ)〜數μιη程度,200網眼 鲁程度。 而且,是以在捕集網23之外側,保持左右間隔譬如立 設有圓筒狀的多孔蓋24,多孔蓋24是具備多數小的孔(孔 徑係比捕集網2 3之網孔大很多)。 . 捕集網23之上部係突出於液槽1 2的液面上,同時比預 脫液部13之脫液網16下游側,配置在更低一段,捕集網23 的下部係連通於液槽12下且達到在垂下附設之下箱部25 內。多孔蓋24的上部係與捕集網23 —起突出於液槽12之 ®液面上,而下部係固定在液槽12底面。 因此,從預脫液部1 3之脫液網1 6下游的混合體D,係 供給到捕集網23上之後,在捕集網23內部朝向下方往下流。 而且混合體D係於捕集網23內部自然往下流,同時以 連接於捕集網23下端之配管26的泵27吸引、往下流。混 合體D中之抗蝕劑Α亦不會浮上在液面,朝向下方被吸引、 往下流。 而且混合體D係於愈下方愈形成小徑之捕集網2 3內 -26· 1313793 ' 部,這樣被吸引、往下流,因此所混入相當多的量之鹼性溶 液B,慢慢朝向捕集網2 3外流出去。 因此混合體D係朝向愈下方愈形成小徑之捕集網2 3下 部,使殘留的抗蝕劑A逐漸被濃縮下去。而且混合體D係 通過連接於捕集網23下端之配管26、泵27,朝向抗蝕劑回 收部1 5供給。 相對地,捕集部23外係形成如下。即,液槽1 2內之鹼 性溶液B係通過多孔蓋24的孔來流入,到達捕集網23之外 鲁面,同時以連接於下箱部25的配管26之泵28吸引。因此’ 與根據前述朝向捕集網23外流出的鹼性溶液B,一起在多 孔蓋24及捕集網23間,朝向下方被吸引、往下流。 而且,是以鹼性溶液B通過配管26、泵28,朝向液槽 . 1 2循環、供給。 但是,若比較通過泵27朝向抗蝕劑回收部1 5供給之混 合體D,及通過泵28朝向液槽1 2供給的鹼性溶液B,則前 者係濃的抗蝕劑A、混入有較大的破片之抗蝕劑A,相對地, #後者係極薄的抗鈾劑A、僅混入有微小之抗蝕劑A,亦可表 現。 還有,介設於配管26的泵27、28,係由間歇驅動型所 構成,使吸引驅動及停止,由明確地依順序重複型所構成。 《關於抗蝕劑回收部1 5》 其次,參考第3圖,對於抗蝕劑回收部15來加說明。 抗蝕劑的回收裝置1 1之抗蝕劑回收部1 5,係將從抗蝕劑濃 縮部14所供給的混合體D之後,捕集抗蝕劑A,同時將鹼 -27 - 1313793 性溶液B朝向液槽12來分離 '使回收。 即抗蝕劑回收部1 5係具備形成槽狀的過濾網29,從抗 蝕劑濃縮部14之捕集網23下部通過配管26或泵27所供給 的含被濃縮的抗蝕劑A之混合體D,係使大部分的抗蝕劑a 以過濾網2 9來捕集、回收。 而且’以過濾網2 9所過濾後之鹼性溶液B,即從混合 體D來除去大部分的抗蝕劑A使所獲得之鹼性溶液B,係經 由配管2 6,朝向液槽12供給。 抗蝕劑回收部1 5係形成這樣構成。 《關於液槽1 2》 其次’對於液槽1 2來加以說明。如第1圖等所示,抗 • 蝕劑的回收裝置1 1之回收室Η的下部係形成液槽丨2,抗蝕 劑的回收馭置1 1及回收室Η,係在顯像機1或剝離機2鄰 接配設。 iaim不,從上位之預脫 而且液槽12係如第2圖The manufacturing method of the circuit board E-18-1313793 is demonstrated with reference to FIG. 5, FIG. 1, etc. First, the manufacturing method of the first example is stated. In the manufacturing method, the circuit board is manufactured by wiring the printed circuit board according to the following steps. First, the copper foil is laminated on the surface of the insulating layer (heart material) made of glass cloth, ceramic, film-like polyimide or other resin, and the copper foil is laminated by hot pressing or the like to prepare a copper laminate. The plate is also the base plate C. Then, the base material C prepared in this manner is subjected to roughening treatment (soft etching) on the surface of the copper box to which the roughening is applied, and then cut into pieces of a short spring processing size. The surface roughening treatment was carried out by mechanical honing in the prior art, but it has recently been carried out by spraying of the treatment liquid. Further, in many cases, the perforation processing for the through holes is carried out using a laser or the like. The through hole is formed by a fine through hole between the outer surfaces of the base plate C (circuit board E), and a through hole having a diameter of several hundred or more is formed for one piece, and the diameter thereof is formed to a degree of 0.5 mm to 0.2 mm. The following is more. Further, the through hole is used for the conduction connection between the circuits F (copper foil) on the outer surfaces of the two outer surfaces or the circuit F (copper foil) of the multilayer substrate, or the mounting of the semiconductor component Φ mounted on the circuit F. Further, recently, a through hole which is required to be punched is formed, and a small protrusion is formed. The contact of the slightly conical trapezoid is also convex. Therefore, with respect to the multilayer substrate or the like, the technique of realizing the same function as the through hole by the protrusion is also developed. . The bulging is based on the circuit F and is manufactured according to the developing process, the etching process, and the stripping process. Then, on the outer surface of the copper foil of the base material C, the photosensitive resist A is applied or adhered to form a film. The dry film of resist a is also pressed more. Then, the negative of the circuit F is the electric -19-1313793 'F picture of the circuit F pre-designed, and by exposure, the resist A of the outer surface is exposed and the portion F of the hardened circuit F is formed ( The protective film portion), and other unnecessary portions, are removed by the treatment liquid, that is, the developing solution, that is, the spraying of the alkaline solution B. Then, the copper box of the base material C is formed by curing the anti-uranium agent A and leaving a portion (protective film portion) of the circuit F which is covered, and dissolving and removing the resist A by development to make the exposed portion unnecessary. In part, by the treatment liquid, that is, the blasting liquid (second copper chloride, second iron chloride, other etching liquid), the solution is dissolved and removed. Then, the residual circuit F forms part of the resist a, which is peeled off by the discharge of the treatment liquid, that is, the stripping solution, that is, the alkaline solution B. Therefore, a part of the copper foil is formed by the residual circuit F. The outer surface of the sheet C is used to form a circuit F of a predetermined conductor pattern, and the circuit board is manufactured. E ° Further, in the above-mentioned developing process, etching process, and stripping process, the respective post-processing, or peeling After the membrane process, the post-treatment is concentrated, and a washing process for spraying the washing liquid, the neutralizing agent liquid, and other washing liquid is attached. In the cleaning system, the processing liquid such as a developing solution, an etching solution, or a peeling liquid adhering to the outer surface of the base material C (including the through hole) is washed and removed. Further, after the washing process, a drying process is attached. In other words, in the outer surface (including the through hole or the like) of the base material C washed by the cleaning process, the washing liquid, the other washing liquid, or the like is adhered thereto, so that it is removed in order to prevent oxidation or the like. Therefore, the drying process is carried out immediately after the drying process. The manufacturing method of the first example is constituted by such a wet processing method. The manufacturing method of the first example is constructed in this way. -20 - 1313793 'Other examples of the method of manufacturing the circuit board E>> Next, the manufacturing method of the second example will be described. Circuit board E 譬 The method of manufacturing a printed wiring board, the wet processing method of the first example described above is a representative example, but the semi-additive method of the second example is also often used. The semi-additive method is first applied to the surface of the base material C on which the through holes are formed in advance, and the electroless copper is applied. Then, after the photosensitive resist A is applied or pasted into a film shape on the electroless copper plating, the circuit F film, that is, the circuit F photo is exposed. Further, the resist A is exposed while being hardened, and the other portion is the portion where the circuit F is formed, and is dissolved and removed by the ejection of the treatment liquid, i.e., the developing solution B, that is, the alkaline solution B. Then, the electric-mineral-copper forming circuit F is applied to the portion where the circuit F is formed, i.e., the portion of the plating pattern in which the resist A is dissolved and removed, i.e., the portion where the electroless copper is exposed. Further, the cured resist A other than the portion where the residual circuit F is formed is peeled off by the spraying of the treating liquid, that is, the stripping liquid, that is, the alkaline solution b, and the exposed electroless copper is used. The treatment liquid, that is, the ejection of the etching liquid, is quickly etched to be melted and removed. Further, as a process after the second stage of the respective processes, the washing process by the cleaning liquid or the drying process is attached as described above. The semi-additive method of the second example is such that the circuit F is formed by electroplating copper, and thus the circuit board E is manufactured. The manufacturing method of the second example was formed in this manner. However, the methods for manufacturing printed wiring boards and other circuit boards E have recently become more diverse, and various other methods have been developed and used in addition to the first and second examples described above. The present invention is of course also applicable to the manufacturing method of such various circuit substrates E. 1313793 The manufacturing method of the circuit board E is formed in this way. <<Review of Resin Recycling Apparatus i i>> Hereinafter, the resist recovery apparatus 1 of the present invention will be described with reference to Fig. 2 and Fig. 3, and will be described. First, as a premise, in the manufacturing process of the circuit board E, as described above, the developing process or the peeling process is to spray the alkaline solution B such as the developing liquid or the peeling liquid to the substrate C to be conveyed, from the base material C. The outer surface is used to remove the photosensitive resist A. That is, as shown in Fig. 1, in the chamber 5 of the developing machine 1 or the peeling machine 2, a conveyor belt such as a roller conveyor belt 10 is disposed opposite to the base material C to be horizontally conveyed. Each of the spray nozzles 9 is sprayed with an alkaline solution containing, for example, a caustic alkali of 3%, that is, an alkaline solution B composed of a developing solution or a stripping solution. Therefore, the photosensitive resist A on the outer surface of the base material sheet C is removed. That is, the developing machine 1 dissolves and removes the resist A other than the portion where the circuit F is formed, and the peeling machine 2 strips the resist A of the portion where the circuit F is formed. In the manufacturing process of the circuit board E for the uranium-removing agent, the manufacturing process of the circuit board E is used as a development process of the developing process or the peeling process, and is attached to the developing machine 1 or the peeling machine 2, respectively. In the case of the developing process, the developer 1 is supplied with the alkaline solution B after the ejection, that is, the mixture of the developing liquid and the removed resist A, to the attached resist. Recycling device Π. In the case of the stripping process, the stripping machine 2 is used to supply the alkaline solution B after the spraying, that is, the stripping liquid, and the mixture D of the removed resist A, to the attached resist. 22 - 1313793 'Recycling unit 1 1. The resist recovery device 1 1 separates and recovers the resist A from the mixture D of the alkaline solution B and the photosensitive resist A thus supplied. Further, the liquid tank 12, the pre-liquid removal unit 13', the resist concentration unit 14, the resist recovery unit 15, the bubble recovery unit 30, and the like are provided. The resist recovery device 1 1 constitutes such a schematic state. Hereinafter, the detailed structure will be described. <<About Pre-Liquid Part 1 3 φ First, the pre-deliquoring unit 13 will be described with reference to Fig. 2 and the like. The pre-liquid removal unit 13 of the resist recovery device 1 1 is provided with a mixture D supplied from the liquid removal net 16 and first flows through the liquid removal network 16 to make a considerable amount. The alkaline solution B was separated, dropped, and recovered into the liquid tank 12 . That is, the pre-liquid removal unit 13 is composed of a liquid-repellent net 16 provided with a downward inclination, and a perforated plate 17 which is disposed to be vertically spaced apart from the liquid-repellent net 16 and on the perforated plate 17 It is composed of a structure in which a large number of protrusions 18 are arranged. Moreover, the alkaline solution B which flows down and falls under the liquid-repellent net 16 is reversed, jumped, and floated and moved by the multi-perforated plate 17 and the protrusions 18, so that the liquid-repellent net 16 is shaken from below while being from the perforated plate 1 7 is dropped toward the liquid tank 12 and recovered. This pre-desorbing section 13 is described in more detail. First, the mixture D, as shown in Fig. 1, falls down on the slightly inclined interval bottom surface 19 in the chamber 5 of the developing machine 1 or the peeling machine 2, and then flows obliquely therethrough. Further, the discharge port 20 passes through the supply pipe 2 1, and flows into the retracting device 1 1 of the resist via the inlet port 22. Further, the mixture D, -23-1313793', which is supplied to the recovery device 1 1 of the resist, first flows through the pre-desorbing portion 13 which is disposed at the upper and lower intervals of the liquid surface of the liquid tank 12 De-liquid network 1 6 on. As shown in Fig. 2, the liquid-repellent net 16 is such that a fine mesh is closely formed in a large number, and a slightly long-plate mesh is formed at the same time, and the diameter of the mesh is set to be even a fine resist A. The size of the mesh that cannot pass, for example, is set to a number of ΙΟμιη to several μπι, and 200 mesh. Further, it is disposed such that the liquid-repellent net 16 is slightly inclined in the longitudinal direction. The mixture D flows on the liquid-repellent net 16 from the upstream side toward the downstream side of the inlet 22 toward the downstream side. Therefore, a considerable portion of the alkaline solution mixed in the mixture D is filtered and separated in the cell of the liquid-repellent net 16 and falls through the lower perforated plate 17 toward the lower liquid tank 12 - go with. - Next, the perforated plate 17 of the pre-liquid-removing portion 13 is vertically spaced apart from the liquid-repellent net 16 and arranged in parallel, and the recovery holes are formed in a large number. As the perforated plate 17, for example, a perforated plate is used, and a plurality of small recovery holes (the pore size is much larger than the mesh of the liquid-repellent net 16) are formed, and at the same time, a length which is symmetrical with the liquid-repellent net 16 of the upper crucible is formed. The plate shape is arranged and fixed at a symmetrical inclination angle. Further, a plurality of projections 18 are erected and fixed on the perforated plate 17, and function as a liquid cutting rod (1 i q u i d c u t b a r). The projections 18 are arranged to be spaced apart from each other in the front-rear direction (upstream and downstream directions), and the height dimension thereof is set to be halfway between the liquid-repellent net 16 and the perforated plate 17 . Therefore, the alkaline solution B separated and dropped from the mixture D in the liquid-repellent net 16 is dropped through the recovery hole of the lower porous plate 17 toward the liquid tank 12 of the lower -24 - 1313793. A considerable portion is on the way, and the surface portion other than the recovery hole of the perforated plate 17 is reversed and jumped back. Further, the alkaline solution B is subjected to a jump 'floating and sinking' and flowing through the perforated plate 17. Further, the jumping and floating movement of the alkaline solution B is a function of stopping the flow of the projections 18 which are erected on the perforated plate 17, and is greatly promoted. Therefore, 'the liquid-repellent net j 6 of the upper position is shaken up and down by jumping, floating and sinking movement', so that the anti-clamicide A ' flowing in the mixed bowl of the liquid-repellent net 16 is prevented from being precipitated and adhered to On the liquid removal net 16 . That is, the mesh of the liquid-repellent net φ 16 is prevented from being clogged. The pre-liquid removal unit 11 is configured as described above. <<Resist Concentration Unit 1 4>> Next, the resist enrichment unit 14 will be described with reference to Figs. 2 and 3 . • The anti-treat agent concentration unit 14 of the uranium-removing agent recovery device 1 1 concentrates the resist a on the mixture D supplied from the pre-desorbing unit 13 while separating the alkaline solution B to recover the liquid. Slot 1 2. In other words, the resist enrichment unit 14 includes a slightly inverted-conical trapezoidal net 23 that is erected in the liquid tank 12, and is supplied from the liquid-repellent net 16 of the pre-liquid removal unit 13 The mixture D' is sucked downward in the trap net 23 and flows downward. Therefore, the mixture D causes a considerable amount of the alkaline solution b to flow out to the outside of the collecting net 23, and is sucked downward and downward, and is sucked and recovered into the liquid tank 12' so that the resist A faces the collecting net 23 The lower part of the inner part is concentrated in order. Further, on the outer side of the collecting net 23 of the resist concentrating portion 14, the porous cover 24 is provided around the periphery and maintained at intervals. Therefore, the alkaline solution -25 - 1313793 'B in the liquid tank 1 2 flows into the porous cover 24 while being sucked downward and downward along the outer surface of the collecting net 23, and therefore, is directed toward the liquid tank 12 Attraction and recycling. It is stated in more detail for the resist enrichment unit 14 . In the central portion of the liquid tank 12, the collecting net 23 and the porous cover 24 are erected in a concentric shape. That is, the collecting net 23 is formed such that the upper surface thereof is opened and becomes smaller in diameter, forming a slightly inverted conical shape, and at the same time, the fine mesh is closely formed. The diameter of the mesh is set so that even if the refining resist A cannot pass through the mesh size, for example, it is set to a degree of several ΙΟμπ) to several μm, and the degree of mesh is 200. Further, the porous cover 24 having a cylindrical shape is provided on the outer side of the collecting net 23, and the porous cover 24 is provided with a plurality of small holes (the hole diameter is much larger than the mesh of the collecting net 23). ). The upper portion of the collecting net 23 protrudes from the liquid surface of the liquid tank 12, and is disposed at a lower portion than the downstream side of the liquid-repellent net 16 of the pre-liquid removing portion 13, and the lower portion of the collecting net 23 is connected to the liquid. The groove 12 is lowered and reaches the lower portion 25 of the lower portion. The upper portion of the porous cover 24 protrudes from the trapping net 23 on the liquid surface of the liquid tank 12, and the lower portion is fixed to the bottom surface of the liquid tank 12. Therefore, the mixture D downstream of the liquid removal net 16 of the pre-liquid removal unit 13 is supplied to the collection net 23, and then flows downward in the collection net 23 downward. Further, the mixture D is naturally descended inside the collecting net 23, and is sucked and descended by the pump 27 connected to the pipe 26 at the lower end of the collecting net 23. The resist enthalpy in the mixture D does not float on the liquid surface, and is attracted downward and downward toward the bottom. In addition, the mixture D is formed in the trapping net 2 3 -26· 1313793 ' of the smaller diameter, and is attracted and flows downward, so that a considerable amount of the alkaline solution B is mixed, and the body is slowly caught. The network 2 3 outflows. Therefore, the mixture D is formed so as to form a lower portion of the trapping net 2 3 which is smaller in diameter, and the residual resist A is gradually concentrated. Further, the mixture D is supplied to the resist recovery unit 15 via a pipe 26 and a pump 27 connected to the lower end of the collecting net 23. In contrast, the outer portion of the trap portion 23 is formed as follows. That is, the alkaline solution B in the liquid tank 12 flows through the hole of the porous cover 24, reaches the outer surface of the collecting net 23, and is sucked by the pump 28 connected to the pipe 26 of the lower tank portion 25. Therefore, the porous solution B flowing out of the outside of the collecting net 23 is sucked and descended downward between the porous cover 24 and the collecting net 23. Further, the alkaline solution B is passed through the pipe 26 and the pump 28, and is circulated and supplied toward the liquid tank. However, when the mixture D supplied to the resist recovery unit 15 by the pump 27 and the alkaline solution B supplied to the liquid tank 12 by the pump 28 are compared, the former is rich in the resist A and mixed. The large fragment of the resist A, in contrast, the latter is an extremely thin anti-uranium agent A, and only a small resist A is mixed therein. Further, the pumps 27 and 28 interposed in the pipe 26 are constituted by an intermittent drive type, and are driven and stopped by suction, and are configured by a clear repeating type. <<Resist Recycling Unit 15>> Next, the resist collecting unit 15 will be described with reference to Fig. 3 . The resist recovery unit 15 of the resist recovery device 1 1 collects the resist A from the mixture D supplied from the resist concentration unit 14 while the alkali -27 - 1313793 solution is used. B is separated toward the tank 12 to 'recover. In other words, the resist recovery unit 15 includes a filter 29 having a groove shape, and a mixture containing the concentrated resist A supplied from the lower portion of the collection net 23 of the resist concentration unit 14 through the pipe 26 or the pump 27. In the body D, most of the resist a is collected and recovered by the filter 29. Further, the alkaline solution B filtered by the filter 29 removes most of the resist A from the mixture D, and the obtained alkaline solution B is supplied to the liquid tank 12 via the pipe 2-6. . The resist recovery unit 15 is configured as described above. <<About the liquid tank 1 2>> Next, the liquid tank 1 2 will be described. As shown in Fig. 1 and the like, the lower portion of the recovery chamber of the anti-corrosion agent recovery device 1 is formed with a liquid bath 2, a resist recovery device 1 and a recovery chamber, which are attached to the image forming machine 1 Or the stripping machine 2 is arranged adjacent to each other. Iaim no, pre-off from the upper position and the liquid tank 12 is as shown in Figure 2.

液部13使鹼性溶液B落下、回收、儲留。又,來自下箱部 25的鹼性溶液B,係通過配管26或泵28,來供給、回收、 儲留。進而,鹼性溶液B亦從抗蝕劑回收部15,通過配管 26或泵27’來供給、回收、儲留。又’鹼性溶液b亦從氣 泡回收部30之消氣泡網31來落下、回收、儲留。 與此同時,如第1圖所示,所儲留之驗性溶液B,係通 過配管26或栗32 ’朝向顯像機1或剝離機2爲了再使用而 循環供給,從其噴射噴嘴9噴射之後,與抗蝕齊&quot;一起成爲 混合體D,來供給到抗触劑的回收裝置&quot;的預脫液部η。 -28 - 1313793 液槽1 2係形成這樣構成。 《關於氣泡回收部3 0》 其次’參考第2圖、第3圖,對於氣泡回收部30來加 以說明。抗蝕劑的回收裝置1 1,進而配設有氣泡回收部30, 具備氣泡回收箱3 3、液化噴嘴3 4、消氣泡網3 1。 而且氣泡回收箱33係在抗鈾劑濃縮部14上保持間隔而 配設’下面係被開放,用來吸引混合體D上部之鹼性溶液B 的氣泡G。 ® 液化噴嘴34係將從該氣泡回收箱33所供給之氣泡G, 朝向消氣泡網3 1來噴射。消氣泡網3 1係來液化被噴射的氣 泡G,並返回到鹼性溶液B,朝向液槽12回收。 對於此種氣泡回收部30,來更詳細加以陳述。抗蝕劑的 回收裝置11之回收室Η的中央上部,也就是液槽12之中央 部上,係配設有氣泡回收部3 0的氣泡回收箱3 3。 該氣泡回收箱3 3係使下面被開放譬如形成圓筒箱狀, 被開放之下面係保持上下間隔而與下位的捕集網23之上面 ♦開口,位於對向位置。 又,在回收箱33之外側周設形成有氣泡回收壁35。氣 泡回收壁3 5譬如形成圓筒狀,從回收室29的頂部到液槽1 2 內垂下設置’在預脫液部1 3之脫液網1 6上從側面來面對, 形成有大的開口 36。 因此’從預脫液部1 3之脫液網1 6上所供給的混合體d 上部之氣泡G,係經由開口 3 6、氣泡回收箱3 3,以連接於 氣泡回收箱3 3頂端的配管2 6之栗3 7吸引,因此被供給到 -29 - 1313793 ' 液化噴嘴34。 而且氣泡G係從液化噴嘴34來噴射到消氣泡網3 1。消 氣泡網3 1係使多數之網孔形成緊密的多數,同時在液槽1 2 之液面上保持上下間隔而配設。 因此噴射到消泡網3 1之氣泡G,係藉由壓射及網孔的 凹凸,來崩潰破壞並液化,成爲原來之鹼性溶液B,在液槽 1 2來落下、回收、儲留。這樣一來所回收的鹼性溶液B,亦 與根據前述所儲留之鹼性溶液B —起,被再使用。 φ 氣泡回收部30,係形成這樣構成。 《關於作用等》 本發明之抗蝕劑的回收裝置1 1,係如以上說明所構成。 因此,形成如下。 (1 )電路基板E之製造製程中,從噴射使用後的鹼性 溶液B及基板材C所除去之感光膜也就是與抗蝕劑A的混 合體D,係供給到抗蝕劑的回收裝置1 1 (參考第1圖)。 即,以顯像製程之顯像機1所噴射使用的顯像液或以剝 #離製程之剝離機2所噴射使用的剝離液,即鹼性溶液B、及 從基板材C的外表面所除去之微小破片狀的感光性抗蝕劑 A,所混合之混合體D,係從顯像機1或剝離機2 ’各自供 給到所附設的抗蝕劑的回收裝置1 1。 (2 )所供給之混合體D,在上部上覆蓋氣泡G ’同時 形成比重輕的抗蝕劑A在愈上部愈多浮遊,而愈下部愈少的 狀態。因此混合體D,首先,藉由流過抗蝕劑的回收裝置1 1 之下降傾斜的預脫液部1 3之脫液網1 6上,而從混合體D的 -30 - 1313793 • 下部,過濾、分離、落下相當多之量的鹼性溶液B,朝向液 槽12被回收(參考第2圖)。 此時’預脫液部1 3係在脫液網1 6下具備由附突起18 之多孔板1 7的構造所構成,所以在脫液網丨6下往下流、落 下之鹼性溶液B,係藉由多孔板1 7之反轉及藉由突起1 8對 下部的止流,來進行跳回、跳躍,並來進行起浪、浮沈運動, 因此’將脫液網16從下在上下來搖動,同時從多孔板17上 朝向液槽1 2來落下、回收。 • 這樣脫液網1 6係一直從下方搖動保持乾淨,所以可防 止因流過其上之混合體D中的抗蝕劑A而堵塞。 (3) 且,該抗蝕劑的回收裝置11中,在預脫液部16 分離了相當多之量的鹼性溶液B之混合體D,接著,從預脫 , 液部1 3來供給到抗蝕劑濃縮部1 4,因此,濃縮抗鈾劑A, 同時分離鹼性溶液B並回收到液槽12 (參考第2圖、第3 圖)。 即,從預脫液部1 3之脫液網1 6上供給到抗蝕劑濃縮部 修14的混合體D ’係於立設於液槽1 2中之抗蝕劑濃縮部14 的略反圓錐狀之捕集網23內,朝向下方被吸引 '往下流。 因此’從混合體D中,使相當多之量的驗性溶液b,以 捕集網2 3來過濾、分離,流出到捕集網2 3外,朝向下方被 吸引、往下流,因此通過配管26或泵28,朝向液槽12被吸 引、回收。因此,使混合體D中之抗蝕劑A,朝向捕集網 2 3的內面’然後朝向下部依順序引進、捕集、而濃縮下去。 (4) 又,在此種抗蝕劑濃縮部14之略反圓錐狀的捕集 -31- 1313793 - 網2 3之外側,係使圓筒狀的多孔蓋24設在周圍。 因此,液槽12內之鹼性溶液B流入到多孔蓋2 4內之 後,沿著捕集網23的外面朝向下方被吸引、往下流’因此’ 與根據上述從捕集網2 3內流出到外面、往下流之鹼性溶液 B,一起朝向液槽12通過配管26或泵28被吸引 '回收(參 考第2圖、第3圖)。(還有,這樣經由配管26或泵28所 回收之鹼性溶液B中,係併存有稍微混入的氣泡G被崩潰所 破壞後之空氣)。 # 這樣一來,在抗蝕劑濃縮部14之捕集網23的內外,係 形成同方向且同壓之流動。即,在捕集網23的內部,係使 含被濃縮之抗蝕劑A的混合體D,形成朝下方被吸引、往下 流的流動,在外部,係使鹼性溶液B在下方來形成被吸引、 . 往下流的流動。因此,防止因混合體D中之抗蝕劑A堵塞 捕集網2 3 ^ (5 )且,含被濃縮之抗蝕劑A的混合體D,然後從抗 蝕劑濃縮部14之捕集網23下部,通過配管26或泵27,供 馨給到抗蝕劑回收部15。(還有,這樣經由配管26或泵27 所供給的混合體D中,係倂存有稍微混入的氣泡G被崩潰 所破壞後之空氣)。 而且,被供給到抗蝕劑回收部1 5之混合體D,係大部 分的抗蝕劑A在過濾網29被過濾、捕集、回收,同時使鹼 性溶液B通過配管2 6,朝向液槽1 2被回收(參考第3圖)。 (6 )還有,關於防止網眼堵塞,係對於用來吸引混合 體D或鹼性溶液B之泵27、28,藉由採用間歇驅動型,更 -32- 1313793 ‘ 確實來實現(參考第3圖)。 即,採用間歇驅動型的泵2 7、2 8,將混合體d藉由朝 向抗鈾劑回收部1 5以間歇來吸引,又,將鹼性溶液B藉由 朝向液槽1 2以間歇來吸引’使抗蝕劑濃縮部1 4之捕集網2 3 或抗蝕劑回收部1 5的過濾網2 9,來承受吸引波動、吸引衝 擊,因此,更確實地防止因混合體D中之抗蝕劑a而堵塞。 (7 )但是’顯像機1或剝離機2中’作爲顯像液或剝 離液所噴射使用之鹼性溶液B,係以鹼性且含有苛性鈉等的 φ 藥液所構成,同時被加溫。因此隨著噴射,產生多量之氣泡 也就是氣泡G ’所以從顯像機1或剝離機2供給到抗蝕劑的 回收裝置11之混合體D,亦帶來鹼性溶液b的多量氣泡G (參考第1圖)。 因此’在該抗蝕劑的回收裝置1 1配設有氣泡回收部3 0 (參考第2圖、第3圖)。而且,鹼性溶液b之氣泡G係氣 泡’所以位於混合體D上部上,在抗蝕劑濃縮部丨4上,被 氣泡回收部30之氣泡回收箱33吸引之後,通過配管26或 馨泵37供給到液化噴嘴34,從液化噴嘴34朝向消氣泡網3 1 來噴射、吹附。因此’在消氣泡網31上,使氣泡G被崩潰 所破壞並被液化,返回到鹼性溶液B,在液槽1 2落下、被 回收。 還有,對於用來吸引氣泡G之泵3 7,係藉由來採用間 歇驅動型,亦可助長氣泡G之崩潰、液化。又,混入於混合 體D並流入在抗蝕劑濃縮部1 4的氣泡G,當通過捕集網2 3 時被崩潰所破壞,並返回到鹼性溶液B,同時成爲空氣而倂 -33 - 1313793 • 存於鹼性溶液B或混合體D中。 藉由這樣的過程,會使抗蝕劑A浮出在混合體D之液 面的氣泡G ’因此會使抗蝕劑a之分離、回收不確實的氣泡 G ’被消除、消滅。而且這是不必使用有在基板材c之處理 會造成不良影響之虞的消泡劑,來實現。 (8 )且’該抗鈾劑的回收裝置i !,是採用此種預脫液 部1 3、抗触劑濃縮部14、氣泡回收部3 0等所構成。 因此’使抗蝕劑A及鹼性溶液B確實分離、被回收,因 ® 此’提高抗蝕劑A之回收效率,使鹼性溶液B的使用壽命變 長,使鹼性溶液B在顯像機1或剝離機2,成爲可重複循環 再使用(參考第1圖)。 (9 )又,在預脫液部1 3,預先將相當多之量的鹼性溶 -液B,從混合體D中分離、回收,所以事後搬運供給到抗蝕 劑濃縮部1 4之混合體D的量,僅其部分被削減。 除此之外,在抗蝕劑濃縮部1 4,亦將相當多之量的鹼性 溶液B,從混合體D中分離、回收,所以進而僅其部分,來 β搬運供給到抗蝕劑回收部1 5使必要之混合體D的量,被削 減。 因此,使抗蝕劑濃縮部14或抗蝕劑回收部1 5,可小型 化,抗鈾劑的回收裝置1 1,亦全體性的被小型化。 【圖式簡單說明】 第1圖係正剖面說明圖,對於有關本發明之抗蝕劑的回 收裝置,爲了實施發明提供最佳形態的說明。 第2圖係重要部分之側剖面說明圖’爲了實施上述發明 -34 - 1313793 ' 提供最佳形態的說明。 第3圖係全體之側剖面說明圖,爲了實施上述發明提供 最佳形態的說明。 第4圖係正剖面說明圖,提供這種先前例之說明。 第5圖係基板(基板材)之模式化的平面說明圖。 【元件符號說明】 1.. .顯像機 2.. .剝離機 φ 3…抗蝕劑的回收裝置(先前例) 4.. .過濾器 5 ..‘室 • 6...液槽(先前例) • 7...泵(先前例) 8··.配管(先前例) 9…噴射噴嘴 10.. .滾筒輸送帶 β 1 1…抗蝕劑的回收裝置(本發明) I2·.·液槽(本發明) 13.. .預脫液部 14··.抗蝕劑濃縮部 1 5…抗触劑回收部 16.. .脫液網 17.. .多孔板 18…突起 -35 - 1313793 ' 1 9…間隔底面 20.. .排出口 2 1...供給管 22···受入□ 23.. .捕集網 24.. .多孔蓋 2 5...下箱部 26··.配管(本發明) φ 27...泵(本發明) 2 8··.泵(本發明) 2 9...過瀘網 3 0...氣泡回收部 . 3 1...消氣泡網 32··.泵(本發明) 3 3...氣泡回收箱 34.. .液化噴嘴 _ 3 5...氣泡回收壁 3 6…開口 37.. .泵(本發明) A...抗蝕劑 B ...鹼性溶液 C...基板材 D ...混合體 E...電路基板 -36 - 1313793 F ...電路 G ...氣泡 Η ...回收室The liquid portion 13 drops, collects, and stores the alkaline solution B. Further, the alkaline solution B from the lower tank portion 25 is supplied, recovered, and stored by the pipe 26 or the pump 28. Further, the alkaline solution B is supplied, collected, and stored from the resist recovery unit 15 through the pipe 26 or the pump 27'. Further, the alkaline solution b is also dropped, recovered, and stored from the bubble-removing net 31 of the bubble recovery unit 30. At the same time, as shown in Fig. 1, the stored test solution B is circulated and supplied to the developing machine 1 or the peeling machine 2 through the pipe 26 or the pump 32' for reuse, and is ejected from the injection nozzle 9 thereof. Thereafter, the mixture is mixed with the resist to form a mixture D, and is supplied to the pre-desorbing portion η of the anti-contact agent recovery device. -28 - 1313793 The liquid tank 12 is formed in this manner. <<About the bubble collecting unit 30>> Next, the bubble collecting unit 30 will be described with reference to Figs. 2 and 3 . The resist recovery device 1 1 is further provided with a bubble recovery unit 30, and includes a bubble recovery tank 33, a liquefaction nozzle 34, and a bubble elimination net 31. Further, the bubble recovery tank 33 is disposed at an interval between the uranium-improving agent enrichment unit 14 to provide a bubble G which is opened to attract the alkaline solution B in the upper portion of the mixture D. The liquefaction nozzle 34 ejects the bubble G supplied from the bubble collecting tank 33 toward the bubble eliminating net 31. The bubble-removing net 3 1 is used to liquefy the injected bubble G, and returns to the alkaline solution B, and is recovered toward the liquid tank 12. This bubble recovery unit 30 will be described in more detail. In the central upper portion of the recovery chamber 抗蚀 of the resist recovery device 11, that is, at the central portion of the liquid tank 12, a bubble recovery tank 33 of the bubble recovery portion 30 is disposed. The bubble collecting tank 3 3 is opened, for example, in a cylindrical box shape, and the lower surface of the bubble collecting box 3 is opened and closed to be spaced apart from the upper surface of the lower collecting net 23, and is located at the opposite position. Further, a bubble recovery wall 35 is formed on the outer circumference of the recovery tank 33. The bubble recovery wall 3 5 is formed into a cylindrical shape, and is disposed from the top of the recovery chamber 29 to the liquid tank 1 2 and is disposed on the liquid-repellent net 16 of the pre-liquid removal portion 13 from the side surface, and is formed to have a large shape. Opening 36. Therefore, the bubble G in the upper portion of the mixture d supplied from the liquid removal net 16 of the pre-liquid removal unit 13 is connected to the pipe at the top end of the bubble recovery tank 3 through the opening 36 and the bubble recovery tank 33. 2 6 of the chest 3 7 is attracted, so it is supplied to the -29 - 1313793 ' liquefaction nozzle 34. Further, the bubble G is ejected from the liquefaction nozzle 34 to the bubble elimination net 31. The bubble net 3 1 is formed so that a large number of meshes are formed in a tight majority, and the liquid level of the liquid tank 1 2 is kept spaced apart from each other. Therefore, the bubble G which is ejected to the defoaming net 31 is collapsed and liquefied by the unevenness of the shot and the mesh, and becomes the original alkaline solution B, which is dropped, recovered, and stored in the liquid tank 12. The alkaline solution B thus recovered is also reused together with the alkaline solution B stored as described above. The φ bubble collecting unit 30 is configured as described above. <<About action and the like>> The resist recovery device 1 1 of the present invention is constituted as described above. Therefore, it is formed as follows. (1) In the manufacturing process of the circuit board E, the photosensitive film removed from the alkaline solution B and the base material C after the ejection, that is, the mixture D with the resist A, is supplied to the resist recovery device. 1 1 (refer to Figure 1). That is, the developing liquid sprayed by the developing machine 1 of the developing process or the peeling liquid sprayed by the peeling machine 2 of the peeling process, that is, the alkaline solution B, and the outer surface of the base material C are used. The finely flaky photosensitive resist A removed and the mixed mixture D are supplied from the developing machine 1 or the peeling machine 2' to the attached resist recovery device 1 1 . (2) The supplied mixture D covers the upper portion of the bubble G ′ while forming a state in which the resist A having a light specific gravity floats more and more at the upper portion, and the lower portion is less. Therefore, the mixture D, firstly, passes through the de-liquidizing net 16 of the pre-desorbed portion 13 of the falling inclined portion of the recovery device 1 1 of the resist, and from the lower portion of the mixture D -30 - 1313793 • A considerable amount of the alkaline solution B is filtered, separated, and dropped, and is recovered toward the liquid tank 12 (refer to Fig. 2). At this time, the pre-desorbing section 13 is composed of a structure in which the porous plate 17 having the projections 18 is provided under the liquid-repellent net 16 , so that the alkaline solution B flows down and falls under the liquid-repellent net 6 By reversing the perforated plate 17 and stopping the flow of the lower portion by the protrusions 18, the jumps and jumps are performed, and the wave lifting and floating movements are performed, so that the liquid removal net 16 is lowered from the bottom. While shaking, it is dropped and recovered from the perforated plate 17 toward the liquid tank 12. • The liquid-repellent net 16 is kept shaken from below until it is kept clean, so that the clogging of the resist A in the mixture D flowing therethrough can be prevented. (3) In the resist recovery device 11, a mixture D of a considerable amount of the alkaline solution B is separated in the pre-desorption portion 16, and then supplied from the pre-discharge to the liquid portion 13 Since the resist concentrate portion 14 is concentrated, the anti-uranium agent A is concentrated, and the alkaline solution B is separated and recovered into the liquid tank 12 (refer to Figs. 2 and 3). In other words, the mixture D' supplied from the liquid removal unit 16 of the pre-liquid removal unit 13 to the resist concentration unit repair 14 is slightly reversed from the resist concentration unit 14 which is erected in the liquid tank 1 2 . In the conical collecting net 23, it is sucked downward toward the lower side. Therefore, from the mixture D, a considerable amount of the test solution b is filtered and separated by the collecting net 23, and flows out of the collecting net 2, and is sucked downward and downward, so that it passes through the piping. 26 or pump 28 is sucked and recovered toward the liquid tank 12. Therefore, the resist A in the mixture D is introduced, collected, and concentrated toward the inner surface of the collecting net 23 and then toward the lower portion. (4) Further, on the outer side of the slightly conical trap-shaped trap 31- 1313793 - net 2 of the resist enrichment portion 14, a cylindrical porous cover 24 is provided around. Therefore, after the alkaline solution B in the liquid tank 12 flows into the porous cover 24, it is sucked downward and downward along the outer surface of the collecting net 23, so that it flows out from the collecting net 2 3 as described above. The alkaline solution B which flows outside and downward is sucked and recovered by the pipe 26 or the pump 28 toward the liquid tank 12 (refer to FIG. 2 and FIG. 3). (In addition, in the alkaline solution B recovered via the pipe 26 or the pump 28, the air in which the slightly mixed bubbles G are destroyed by collapse is stored). # In this way, in the inside and outside of the collecting net 23 of the resist enrichment unit 14, the flow in the same direction and at the same pressure is formed. In other words, in the inside of the collection net 23, the mixture D containing the concentrated resist A is formed to be sucked downward and downward, and the alkaline solution B is formed on the outside. Attraction, the flow of the downward flow. Therefore, the trapping net 2 3 ^ (5 ) due to the resist A in the mixture D and the mixture D containing the concentrated resist A are prevented from being trapped from the resist enrichment portion 14 The lower portion of the 23 is supplied to the resist recovery portion 15 via the pipe 26 or the pump 27. (In addition, in the mixture D supplied through the pipe 26 or the pump 27, the air in which the slightly mixed bubbles G are broken by the collapse) is stored. Further, the mixture D supplied to the resist collecting portion 15 is such that most of the resist A is filtered, collected, and recovered in the filter 29, and the alkaline solution B is passed through the pipe 2, toward the liquid. The tank 12 is recovered (refer to Fig. 3). (6) Further, regarding the prevention of clogging of the mesh, the pumps 27 and 28 for attracting the mixture D or the alkaline solution B are realized by using the intermittent driving type, more -32-1313793' (refer to 3)). That is, the intermittently driven pumps 2 7 and 28 are used to intermittently attract the mixed body d toward the uranium-removing agent recovery unit 15 and the alkaline solution B is intermittently directed toward the liquid tank 1 2 . The suction filter 2 of the resist enrichment unit 14 or the filter 2 of the resist recovery unit 15 is sucked to receive suction fluctuations and suction shocks, thereby more reliably preventing the inclusion in the mixture D. The resist a is clogged. (7) However, the alkaline solution B which is used as a developing solution or a peeling liquid in the "developing machine 1 or the peeling machine 2" is composed of a φ chemical liquid which is alkaline and contains caustic soda, etc., and is added at the same time. temperature. Therefore, as the ejection, a large amount of bubbles, that is, the bubble G', is generated, so that the mixture D supplied from the developing machine 1 or the peeling machine 2 to the resist recovery device 11 also brings a large amount of bubbles G of the alkaline solution b ( Refer to Figure 1). Therefore, the bubble recovery unit 30 is disposed in the resist recovery device 1 1 (refer to Figs. 2 and 3). In addition, the bubble G of the alkaline solution b is located on the upper portion of the mixture D, and is sucked by the bubble recovery tank 33 of the bubble recovery unit 30 on the resist concentration unit 4, and then passed through the pipe 26 or the sweet pump 37. It is supplied to the liquefaction nozzle 34, and is ejected and blown from the liquefaction nozzle 34 toward the bubble-eliminating net 3 1 . Therefore, the bubble G is broken and collapsed on the bubble-removing net 31, returns to the alkaline solution B, falls in the liquid tank 12, and is recovered. Further, the pump 3 7 for sucking the bubble G can also promote the collapse and liquefaction of the bubble G by using the intermittent driving type. Further, the bubble G which has entered the mixture D and flows into the resist enrichment unit 14 is broken by the collapse when passing through the collecting net 2, and returns to the alkaline solution B, and becomes air at the same time. 1313793 • Store in alkaline solution B or mixture D. By such a process, the resist A is caused to float on the liquid surface G' of the liquid of the mixture D, so that the separation of the resist a and the recovery of the bubbles G' which are not sure are eliminated and eliminated. Further, this is achieved without using an antifoaming agent which has an adverse effect on the treatment of the base material c. (8) The uranium-removing agent recovery device i is configured by using the pre-liquid removal unit 13 , the anti-touch agent concentration unit 14 , the bubble recovery unit 30 , and the like. Therefore, 'the resist A and the alkaline solution B are surely separated and recovered, because the 'reducing the recovery efficiency of the resist A, the service life of the alkaline solution B is prolonged, and the alkaline solution B is imaged. The machine 1 or the stripping machine 2 is recyclable and can be reused (refer to Fig. 1). (9) Further, a considerable amount of the alkaline solution-liquid B is separated and recovered from the mixture D in advance in the pre-liquid removal unit 13, so that the mixture is supplied to the resist concentration unit 14 afterwards. The amount of body D is only partially reduced. In addition, in the resist enrichment unit 14, a considerable amount of the alkaline solution B is also separated and recovered from the mixture D, so that only part of it is transported to the resist for recycling. The portion 1 5 reduces the amount of the necessary mixture D. Therefore, the resist concentrating portion 14 or the resist collecting portion 15 can be miniaturized, and the uranium-repellent recovery device 1 1 can be miniaturized as a whole. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a front cross-sectional explanatory view, and a description will be given of a best mode for carrying out the invention in the recycling apparatus of the resist according to the present invention. Fig. 2 is a side cross-sectional explanatory view of an important part. The description of the best mode is provided for carrying out the above invention -34 - 1313793'. Fig. 3 is a side cross-sectional explanatory view of the entire body, and is a description of the best mode for carrying out the above invention. Figure 4 is a front cross-sectional illustration showing the description of this prior example. Fig. 5 is a schematic plan view of a substrate (base plate). [Explanation of component symbols] 1..Developing machine 2.. . Stripping machine φ 3... Resist recovery device (previous example) 4.. Filter 5 .. 'room • 6... liquid tank ( Previous example) • 7...pump (previous example) 8··. piping (previous example) 9...jet nozzle 10.. roller conveyor belt β 1 1...resist recovery device (invention) I2·. Liquid tank (invention) 13. Pre-desorbing section 14··. Resin concentrating section 1 5...Anti-contact agent collecting section 16 . . . Deli-liquidizing net 17: Perforated plate 18...protrusion-35 - 1313793 ' 1 9... interval bottom surface 20.... discharge port 2 1... supply pipe 22··· receiving □ 23.. collecting net 24. porous cover 2 5... lower case 26· · Plumbing (Invention) φ 27... Pump (Invention) 2 8··. Pump (Invention) 2 9...Over the net 3 0... Bubble recovery unit. 3 1... Bubble net 32··. pump (invention) 3 3... bubble recovery tank 34.. liquefaction nozzle _ 3 5... bubble recovery wall 3 6... opening 37.. pump (present invention) A.. Resist B ... alkaline solution C ... base plate D ... hybrid E ... circuit substrate - 36 - 1313793 F ... circuit G ... bubble Η ... recovery room

Claims (1)

1313793 月f曰修王本 修正本 第941 23479號「抗蝕劑回收裝置」專利案 十、申請專利範圍: (2009年5月5日修正) I 一種抗蝕劑的回收裝置,係使用在電路基板之製造製程 中,從被供給的噴射後之鹼性溶液及被除去的感光性之抗 蝕劑的混合體,回收該抗蝕劑之抗蝕劑的回收裝置,其特 徵包含:1313793 曰 曰 曰 王 本 941 941 479 479 479 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " In the manufacturing process of the substrate, a resist recovery device for recovering the resist is obtained from a mixture of the supplied alkaline solution after the ejection and the removed photosensitive resist, and the feature includes: 液槽、預脫液部、抗蝕劑濃縮部、抗蝕劑回收部; 該預脫液部係從該混合體分離該鹼性溶液,並回收到該 液槽; 該抗蝕劑濃縮部係針對從該預脫液部所供給之該混合 體’用來濃縮該抗蝕劑,並分離該鹼性溶液而回收到該液 槽; 該抗蝕劑回收部係針對從該抗蝕劑濃縮部所供給的該 混合體,用來捕集、回收該抗鈾劑,並將該鹼性溶液分離、 回收到該液槽;a liquid tank, a pre-liquid removal unit, a resist concentration unit, and a resist recovery unit; the pre-liquid removal unit separates the alkaline solution from the mixture and recovers the liquid solution; the resist concentration unit The mixture for supplying the pre-desorbed portion is used to concentrate the resist, and the alkaline solution is separated and recovered into the liquid tank; the resist recovery portion is directed to the resist enrichment unit The mixture is supplied for collecting and recovering the anti-uranium agent, and separating and recovering the alkaline solution into the liquid tank; 該預脫液部係具備脫液網,而被供給之該混合體,首先 藉由流過該脫液網上,使相當多的該鹼性溶液分離、落下 並回收到該液槽; 該抗蝕劑濃縮部係具備立設在該液槽中之略反圓錐狀 的捕集網,而從該預脫液部之脫液網上所供給的該混合 體’係藉由在該捕集網內朝向下方被吸引、往下流,使相 當多之該鹼性溶液流出到該捕集網外,朝向下方所被吸 引、往下流而被吸引、回收到該液槽,並使該抗蝕劑朝向 修正本 1313793 該捕集網內下部順序濃縮; 該抗蝕劑回收部係具備過濾網,該混合體係含有從該抗 蝕劑濃縮部之捕集網內下部所供給的被濃縮的該抗蝕 劑,而該抗蝕劑係以該過濾網捕集、被回收,且該鹼性溶 液被回收到該液槽。 2 ·如申請專利範圍第1項之抗蝕劑的回收裝置,其中附設於 電路基板之製造製程的顯像機,而該鹼性溶液係由顯像液 ' 所構成。 Φ 3 .如申請專利範圍第1項之抗蝕劑的回收裝置,其中附設於 電路基板之製造製程的剝離機,而該鹼性溶液係由剝離液 所構成。 4 ·如申請專利範圍第2或3項之抗蝕劑的回收裝置,其中進 而配設有氣泡回收部,具備氣泡回收箱、液化噴嘴、消氣 泡網; 該氣泡回收箱係在該抗蝕劑濃縮部上保持間隔而配 設,並使下面開放,用來吸引該混合體上部之該鹼性溶液The pre-liquid removal unit is provided with a liquid-repellent net, and the supplied mixture first flows through the liquid-removing net, and a considerable amount of the alkaline solution is separated, dropped, and recovered into the liquid tank; The etchant enrichment unit has a slightly inverted cone-shaped collecting net standing in the liquid tank, and the mixture supplied from the liquid removal line of the pre-liquid removal unit is used in the trapping net The inside is sucked downward and downward, so that a considerable amount of the alkaline solution flows out of the trap net, is sucked downward, is sucked downward, is sucked, and is collected into the tank, and the resist is oriented. Amendment 1313793 The lower portion of the collection net is sequentially concentrated; the resist recovery portion is provided with a filter containing the concentrated resist supplied from the lower portion of the trap net of the resist enrichment portion And the resist is collected by the filter, recovered, and the alkaline solution is recovered into the liquid tank. 2. The apparatus for recovering a resist according to the first aspect of the invention, wherein the image forming machine is attached to a manufacturing process of the circuit board, and the alkaline solution is composed of a developing liquid. Φ 3. The apparatus for recovering a resist according to the first aspect of the invention, wherein the stripping machine is attached to a manufacturing process of the circuit board, and the alkaline solution is composed of a stripping liquid. 4. The apparatus for recovering a resist according to the second or third aspect of the invention, further comprising a bubble collecting portion, comprising a bubble collecting tank, a liquefaction nozzle, and a bubble eliminating net; wherein the bubble collecting tank is attached to the resist The concentrating portion is disposed at intervals, and is opened below to attract the alkaline solution in the upper portion of the mixture 該液化噴嘴係將從該氣泡回收箱所供給之該氣泡,噴射 到該消氣泡網: 該消氣泡網係使被噴射的該氣泡液化並返回到該鹼性 溶液,而回收到該液槽。 5.如申請專利範圍第2或3項之抗鈾劑的回收裝置,其中該 預脫液部係由具備傾斜下降所配設之該脫液網、及在該脫 液網下保持上下間隔所配設的多孔板、及立設於該多孔板 修正本 •1313793 上之各突起的構造所構成; 落下到該脫液網下之該鹼性溶液,係在該多孔板及該突 起跳躍、浮沈運動,因此將該脫液網從下搖動,並從該多 孔板上落下、回收到該液槽。 6·如申請專利範圍第2或3項之抗蝕劑的回收裝置,其中在 該抗蝕劑濃縮部之捕集網的外側,將多孔蓋保持間隔設在 周圍;The liquefaction nozzle ejects the bubble supplied from the bubble recovery tank to the bubble-eliminating net: the bubble-eliminating net liquefies the bubble which is ejected and returns to the alkaline solution, and recovers the liquid tank. 5. The apparatus for recovering uranium-repellent agent according to claim 2 or 3, wherein the pre-desorbing section is provided by the liquid-repellent net provided with the inclination drop, and the upper and lower intervals are maintained under the liquid-repellent net. a porous plate disposed, and a structure of the protrusions erected on the perforated plate to correct the 1313793; the alkaline solution dropped under the liquid removal mesh is jumped and floated on the porous plate and the protrusion Movement, so the liquid-repellent net is shaken from below, and is dropped from the perforated plate and recovered into the liquid tank. 6. The apparatus for recovering a resist according to claim 2, wherein the porous cover is spaced apart from the outside of the trapping net of the resist enrichment portion; 該液槽內之該鹼性溶液係流入到該多孔蓋內,並沿著該 捕集網的外面朝向下方被吸引、往下流,因此被吸引、回 收到該液槽。 7. 如申請專利範圍第4項之抗鈾劑的回收裝置,其中用來吸 引該混合體、該鹼性溶液、或該氣泡之泵,係由間歇驅動 型所構成。 8. 如申請專利範圍第6項之抗蝕劑的回收裝置,其中用來吸 引該混合體、該鹼性溶液、或該氣泡之泵,係由間歇驅動 型所構成。The alkaline solution in the liquid tank flows into the porous lid, and is sucked downward and downward along the outer surface of the collecting net, so that the liquid tank is sucked and recovered. 7. The apparatus for recovering uranium-repellent agent according to item 4 of the patent application, wherein the pump for sucking the mixture, the alkaline solution, or the bubble is constituted by an intermittent driving type. 8. The apparatus for recovering a resist according to claim 6, wherein the pump for sucking the mixture, the alkaline solution, or the bubble is constituted by an intermittent driving type.
TW94123479A 2005-04-15 2005-07-12 Resist recycling device TWI313793B (en)

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